CN118707162B - Oscilloscope probe auxiliary test device and test method - Google Patents

Abstract

The present invention relates to the technical field of test devices, and in particular to an oscilloscope probe auxiliary test device and a test method, comprising a probe grip, a switch, a grounding wire and a pen tip, wherein the switch is arranged at the top of the probe grip, the grounding wire is clamped at the outer wall of the grounding end of the probe grip, the pen tip is arranged at the left end of the probe grip, and further comprises a grinding mechanism and an identification mechanism, wherein the grinding mechanism is embedded in the right side of the probe grip, and the identification mechanism is installed at the left end of the probe grip; a box body is embedded in the right end of the probe grip, and a slide groove is provided on the front of the box body; there are two first clamping plates, which are respectively fixedly connected to the left and right inner walls of the box body. The present invention can realize the deoxidation of the input end of the integrated circuit, improve the connection stability between the pen tip and the integrated circuit, ensure the test accuracy of the tested integrated circuit, can realize the identification of the pen tip, prevent the oscilloscope from being confused with the pen tip, avoid the oscilloscope from being debugged incorrectly, and reduce the measurement difficulty.

Description

Oscilloscope probe auxiliary test device and test method

Technical Field

The present invention relates to the technical field of testing devices, and in particular to an oscilloscope probe auxiliary testing device and a testing method.

Background Art

An oscilloscope is an electronic measuring instrument with a wide range of uses. It can transform invisible electrical signals into visible images, making it easier for people to study the changing processes of various electrical phenomena. An oscilloscope uses a narrow electron beam composed of high-speed electrons to hit a screen coated with fluorescent material to produce tiny spots of light (this is the working principle of a traditional analog oscilloscope). Under the action of the measured signal, the electron beam is like the tip of a pen, which can draw a curve of the instantaneous value of the measured signal on the screen;

An oscilloscope usually has four channels, and each channel is represented by four colors. One end of the probe is connected to the channel, and the other end is connected to the input terminal of the integrated circuit, which can realize the test of the integrated circuit under test;

In order to reduce signal interference, the invention with publication number CN109521232B discloses an oscilloscope probe auxiliary test device, including a bipolar terminal, a probe coupler and a protective shell. A cavity is provided in the probe coupler and the protective shell, and the probe coupler is accommodated in the cavity of the protective shell; the bipolar terminal includes a test section, an intermediate section and a connecting section connected in sequence; the end of the test section away from the intermediate section is provided with a first signal terminal and a first reference ground terminal. The bipolar terminal can avoid interference caused by flying wires and affect the integrity of the circuit. However, if the input wire of the integrated circuit under test is exposed to the air, an oxide layer will form on the surface of the wire. Since the integrated circuit is weak current, it will be interfered by the oxide layer, which will cause poor contact between the integrated circuit and the probe, affecting the test accuracy.

In addition, the oscilloscope has many channels and the circuits at the test site are complex. Since the probes used are the same, it is difficult to determine which oscilloscope channel the probe is applied to, which can easily cause incorrect debugging of the oscilloscope and bring difficulties to the testing work.

Summary of the invention

In order to overcome the shortcomings of the prior art that the oxide layer cannot be removed, the probe has poor contact with the circuit under test, it is inconvenient for workers to identify the oscilloscope channel to which the probe is applied, and the testing work is difficult, the technical problem to be solved by the present invention is an oscilloscope probe auxiliary testing device and a testing method.

To achieve the above-mentioned purpose, the present invention provides the following technical solutions: an oscilloscope probe auxiliary test device, comprising a probe grip, a switch, a grounding wire and a pen tip, wherein the switch is arranged at the top of the probe grip, the grounding wire is clamped on the outer wall of the grounding end of the probe grip, the pen tip is arranged at the left end of the probe grip, and also comprises a grinding mechanism and an identification mechanism, wherein the grinding mechanism is embedded in the right side of the probe grip, and the identification mechanism is installed at the left end of the probe grip.

Preferably, the purpose is to polish the input terminal wire of the integrated circuit under test, remove the oxide layer on the surface of the wire, and prevent poor contact during testing. The polishing mechanism includes a box body, a slide groove, a first clamping plate, a second clamping plate, a rack, a polishing sheet, a first rotating shaft, a first gear, a torsion spring and a shift block. The box body is embedded in the right end of the probe handle, and a slide groove is provided on the front of the box body; there are two first clamping plates, which are respectively fixedly connected to the left and right inner walls of the box body; there are two second clamping plates, which are respectively inserted into the left and right sides of the inner cavity of the box body; the rack is installed on the inner side of the second clamping plate; there are several polishing sheets, which are installed On the opposite sides of the first clamping plate and the second clamping plate, the grinding sheet is arc-shaped; the first rotating shaft is installed at the center position of the inner cavity of the box body through a bearing so as to be able to rotate around its own axis; the first gear is installed at the bottom end of the outer wall of the first rotating shaft, and the first gear is meshed with the rack; the torsion spring is sleeved on the outer wall of the first rotating shaft, and the two ends of the torsion spring are respectively connected to the top of the inner wall of the box body and the top of the first gear, and the first gear is driven to rotate clockwise under the torsion of the torsion spring; one end of the shift block is installed on the front side of the second clamping plate located on the left side, and the other end passes through the inner cavity of the slide groove, and the movement of the second clamping plate is limited by the cooperation between the shift block and the slide groove.

Preferably, the diameters of the two circular cavities formed by the two groups of the first clamping plates and the second clamping plates on the left and right sides are different.

Preferably, the two racks are rotated 180 degrees relative to the center point of the first gear to overlap.

Preferably, the purpose is to be able to change the color of the probe handle to make it consistent with the color of the oscilloscope channel to prevent errors in oscilloscope debugging. The identification mechanism includes a shell, a positioning block, a color disk, an inner gear ring, a cover plate, a second rotating shaft, a spring, a knob, a second gear and a positioning groove. The shell is installed at the left end of the probe handle, and the top of the shell is open; the positioning block is installed at the top of the right side wall of the shell; the color disk is rotatably inserted into the inner cavity of the shell; the inner gear ring is installed on the inner side of the color disk; the cover plate is connected to the left side wall of the shell by screws; the second rotating shaft is rotatable around its own axis through a bearing and is installed on the top of the outer wall of the cover plate; the spring is sleeved on the outer wall of the second rotating shaft; the knob is installed on the left end of the second rotating shaft; the second gear is sleeved on the right end of the outer wall of the second rotating shaft, and the second gear is pushed to the right under the action of the spring force. A positioning groove is provided on the right side wall of the second gear, and the positioning block is inserted into the positioning groove to position the second gear.

Preferably, the outer wall of the positioning block is semicircular in shape.

Preferably, the outer wall of the color disk is equally divided into four colors.

Preferably, the second rotating shaft is a spline shaft, allowing the second gear to slide left and right on the outer wall of the second rotating shaft.

Preferably, the transmission ratio between the second gear and the internal gear ring is 4:1.

A testing method for an oscilloscope probe auxiliary testing device comprises the following steps:

Step 1: Connect the pen tip to the input terminal of the IC under test, adjust the multiple through the switch, and detect the IC under test with the cooperation of the oscilloscope;

Step 2: When it is necessary to remove the oxide layer of the wire at the input end of the tested integrated circuit, pull the pull block to the right to move the second clamping plate on the left to the right. Under the transmission of the first gear and the rack, the two second clamping plates move inward at the same time, and the second clamping plate is away from the first clamping plate. Insert the wire into the cavity formed by the corresponding first clamping plate and the second clamping plate, release the pull block, and the first gear rotates clockwise under the torsion of the torsion spring, and the second clamping plate moves outward. The grinding sheet contacts the wire, and the probe handle is pulled to cause friction between the grinding sheet and the wire to destroy the oxide layer on the surface of the wire, thereby ensuring that the signal of the pen tip and the input end of the tested integrated circuit is stable.

Step three, when the probe handle needs to be consistent with the selected oscilloscope channel, rotate the knob according to the color of the inserted oscilloscope channel. Under the obstruction of the curved surface of the positioning block, the second gear moves left along the outer wall of the second rotating shaft. The second gear drives the inner gear ring to rotate clockwise or counterclockwise, and the color displayed on the color disk on the outer shell changes until the color displayed on the color disk is consistent with the oscilloscope channel. The spring pushes the second gear to move right under its own elastic force, and the positioning block is inserted into the positioning slot to position the second gear. The color disk adjustment is completed to prevent confusion when testing integrated circuits.

Compared with the prior art, the present invention has the following beneficial effects:

1. The present invention pulls the knob to the right, and under the transmission of the first gear and the rack, the two second clamps move inward at the same time, the distance between the second clamp and the first clamp becomes larger, the integrated circuit input end wire is inserted between the first clamp and the second clamp, and the first gear is driven to rotate clockwise under the torsion of the torsion spring, so that the two second clamps move outward at the same time, the grinding sheet clamps the wire, and the probe handle is pulled, and the grinding sheet rubs on the wire to grind off the oxide layer, thereby realizing deoxidation of the integrated circuit input end, improving the connection stability between the pen tip and the integrated circuit, and ensuring the test accuracy of the tested integrated circuit.

2. The present invention allows the second shaft to rotate through a knob, and the second gear follows the second shaft to rotate clockwise or counterclockwise, and the second gear drives the color wheel to rotate. The second gear rotates one circle, and the color wheel completes the switching of one color until the color of the color wheel visible on the housing is consistent with the oscilloscope channel used. The spring force pushes the second gear to move right, and the positioning block is inserted into the positioning groove to position the second gear, so that the pen tip can be identified, thereby preventing the oscilloscope from being confused with the pen tip, avoiding incorrect debugging of the oscilloscope, and reducing the measurement difficulty.

BRIEF DESCRIPTION OF THE DRAWINGS

Fig. 1 is a schematic diagram of the structure of the present invention;

FIG2 is a schematic diagram of the structure of the grinding mechanism of the present invention;

FIG3 is a front cross-sectional view of the grinding mechanism of the present invention;

FIG4 is a top cross-sectional view of the grinding mechanism of the present invention;

FIG5 is a schematic diagram of the first splint structure of the present invention;

FIG6 is an exploded view of the identification mechanism of the present invention;

FIG7 is a front cross-sectional view of the identification mechanism of the present invention;

FIG8 is an enlarged view of point A of the present invention.

In the figure: 1. probe handle; 2. switch; 3. ground wire; 4. pen tip; 5. grinding mechanism; 6. identification mechanism; 51. box body; 52. slide groove; 53. first clamping plate; 54. second clamping plate; 55. rack; 56. grinding sheet; 57. first rotating shaft; 58. first gear; 59. torsion spring; 510. shift block; 61. outer shell; 62. positioning block; 63. color disk; 64. inner gear ring; 65. cover plate; 66. second rotating shaft; 67. spring; 68. knob; 69. second gear; 610. positioning groove.

DETAILED DESCRIPTION

The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

The present invention provides a technical solution: an oscilloscope probe auxiliary test device, as shown in FIG1-8, comprising a probe grip 1, a switch 2, a grounding wire 3 and a pen tip 4, wherein the switch 2 is arranged at the top of the probe grip 1, and the voltage amplification factor is controlled by the switch 2, the grounding wire 3 is clamped on the outer wall of the grounding end of the probe grip 1 to prevent the probe grip 1 from being interfered, the pen tip 4 is arranged at the left end of the probe grip 1, and is connected to the input end of the circuit to be tested through the pen tip 4, a grinding mechanism 5 is embedded in the right side of the probe grip 1, and an identification mechanism 6 is installed at the left end of the probe grip 1;

Connect the pen tip 4 to the input terminal of the IC under test, adjust the multiple through the switch 2, connect the ground wire 3 to prevent signal interference, and detect the IC under test with the cooperation of the oscilloscope.

As a preferred embodiment, further, the grinding mechanism 5 includes a box body 51 embedded in the right side of the probe grip 1, a slide groove 52 is opened on the front of the box body 51, first clamps 53 are installed on the left and right inner walls of the box body 51, two second clamps 54 opposite to each other on the left and right are inserted into the inner cavity of the box body 51, a rack 55 is installed laterally on the inner side of the second clamp 54, and grinding sheets 56 are bonded to the opposite surfaces of the first clamp 53 and the second clamp 54. The grinding sheet 56 is arc-shaped, and the grinding sheet 56 is in different positions on the first clamp 53 and the second clamp 54. The circular cavity formed by the two groups of first clamps 53 and second clamps 54 on the left and right sides has different diameters, so that the grinding sheet 56 can fully contact with wires of different diameters, grind the wires, and remove the oxide layer on the surface of the wires. The center position of the inner cavity of the box body 51 is installed through a bearing There is a first rotating shaft 57 that can rotate around its own axis. A first gear 58 meshing with the rack 55 is installed at the bottom end of the outer wall of the first rotating shaft 57. The two racks 55 rotate 180 degrees corresponding to the center point of the first gear 58 to overlap. When the first gear 58 rotates clockwise or counterclockwise, the two racks 55 move in opposite directions, so that the two second clamping plates 54 move outward or inward at the same time. A torsion spring 59 is sleeved on the outer wall of the first rotating shaft 57. The two ends of the torsion spring 59 are respectively connected to the top of the inner cavity of the box body 51 and the top of the first gear 58. Under the torsion of the torsion spring 59, the first gear 58 rotates clockwise. A shift block 510 is installed on the front side of the second clamping plate 54 on the left side. The shift block 510 passes through the inner cavity of the slide groove 52, and the movement of the second clamping plate 54 is limited by the cooperation between the shift block 510 and the slide groove 52.

When it is necessary to remove the oxide layer of the wire at the input end of the tested integrated circuit, the right pull block 510 causes the second clamping plate 54 on the left to move right. Under the transmission of the first gear 58 and the rack 55, the two second clamping plates 54 move inward at the same time, and the second clamping plates 54 are separated from the first clamping plates 53. The wire is inserted into the cavity formed by the corresponding first clamping plate 53 and the second clamping plate 54. The block 510 is released. Under the torsion of the torsion spring 59, the first gear 58 rotates clockwise, and the second clamping plate 54 moves outward. The grinding sheet 56 contacts the wire, and the probe handle 1 is pulled to make the grinding sheet 56 rub against the wire to destroy the oxide layer on the surface of the wire, thereby ensuring the stability of the signal between the pen tip 4 and the input end of the tested integrated circuit.

As a preferred embodiment, further, the identification mechanism 6 includes a shell 61 installed at the left end of the probe grip 1, the top of the shell 61 is open, a positioning block 62 is installed on the top of the right inner wall of the shell 61, a rotatable color disk 63 is inserted into the inner cavity of the shell 61, the outer wall of the color disk 63 is divided into four colors, the colors on the color disk correspond to the colors of the four channels of the oscilloscope, and are used to identify which channel the probe grip 1 belongs to, an inner gear ring 64 is installed on the inner side of the color disk 63, the left side wall of the shell 61 is connected to a cover plate 65 by screws, a second rotating shaft 66 that can rotate around its own axis is installed on the top of the outer wall of the cover plate 65 through a bearing, the outer wall of the second rotating shaft 66 is sleeved with a spring 67, and the left end of the second rotating shaft 66 is installed with a rotating Button 68, the right end of the outer wall of the second rotating shaft 66 is sleeved with a second gear 69 meshing with the inner gear ring 64, and the second rotating shaft 66 is shaped like a spline shaft, ensuring that the second rotating shaft 66 drives the second gear 69 to rotate while the elastic force of the spring 67 can also allow the second gear 69 to slide to the right, and a positioning groove 610 is provided on the right side wall of the second gear 69, and the positioning block 62 is inserted into the positioning groove 610 to position the second gear 69. The positioning block 62 is semicircular in shape. When the second gear 69 rotates, the curved surface of the positioning block 62 can squeeze the second gear 69 to move left along the outer wall of the second rotating shaft 66. The transmission ratio of the second gear 69 to the inner gear ring 64 is 4:1. The second gear 69 rotates one circle, and the color on the color disk 63 is switched once.

When the probe handle 1 needs to be consistent with the selected oscilloscope channel, the knob 68 is rotated according to the color of the inserted oscilloscope channel. Under the obstruction of the curved surface of the positioning block 62, the second gear 69 moves left along the outer wall of the second rotating shaft 66, and the second gear 69 drives the inner gear ring 64 to rotate clockwise or counterclockwise, and the color displayed on the color disk 63 on the housing 61 changes until the color displayed on the color disk 63 is consistent with the oscilloscope channel. The spring 67 pushes the second gear 69 to move right under its own elastic force, and the positioning block 62 is inserted into the positioning groove 610 to position the second gear 69, completing the adjustment of the color disk 63 to prevent confusion when testing integrated circuits.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims (6)

1. The utility model provides an oscilloscope probe auxiliary test device, includes probe handle (1), switch (2), earth connection (3) and nib (4), switch (2) set up at probe handle (1) top, earth connection (3) centre gripping is at probe handle (1) earthing terminal outer wall, nib (4) set up at probe handle (1) left end, its characterized in that, oscilloscope probe auxiliary test device still includes grinding machanism (5) and recognition mechanism (6), grinding machanism (5) are embedded in probe handle (1) right side, recognition mechanism (6) are installed at probe handle (1) left end;

the grinding mechanism (5) comprises:

the box body (51) is embedded at the right end of the probe grip (1), and a chute (52) is formed in the front of the box body (51);

The number of the first clamping plates (53) is two, and the first clamping plates are respectively and fixedly connected to the left and right inner walls of the box body (51);

the number of the second clamping plates (54) is two, and the two clamping plates are respectively inserted into the left side and the right side of the inner cavity of the box body (51);

a rack (55) mounted inside the second clamping plate (54);

The polishing sheets (56) are arranged on the opposite surfaces of the first clamping plate (53) and the second clamping plate (54), and the polishing sheets (56) are arc-shaped;

The first rotating shaft (57) is rotatably arranged at the center of the inner cavity of the box body (51) around the axis through a bearing;

The first gear (58) is arranged at the bottom end of the outer wall of the first rotating shaft (57), and the first gear (58) is meshed with the rack (55);

the torsion spring (59) is sleeved on the outer wall of the first rotating shaft (57), two ends of the torsion spring (59) are respectively connected with the top of the inner wall of the box body (51) and the top of the first gear (58), and the first gear (58) is driven to rotate clockwise under the torsion action of the torsion spring (59);

one end of the shifting block (510) is arranged on the front surface of the second clamping plate (54) positioned at the left side, the other end of the shifting block penetrates through the inner cavity of the sliding groove (52), and the shifting block (510) is matched with the sliding groove (52) to limit the movement of the second clamping plate (54);

The diameters of two circular cavities formed by the first clamping plate (53) and the second clamping plate (54) at the left side and the right side are different;

The two racks (55) are rotated 180 degrees to coincide with each other relative to the center point of the first gear (58);

the identification means (6) comprises:

a shell (61) which is arranged at the left end of the probe handle (1), and the top of the shell (61) is in an opening shape;

The positioning block (62) is arranged at the top of the right side wall of the shell (61);

the color disc (63) can be rotatably inserted into the inner cavity of the shell (61);

An inner gear ring (64) mounted inside the color wheel (63);

the cover plate (65) is connected to the left side wall of the shell (61) through screws;

The second rotating shaft (66) is rotatably arranged on the top of the outer wall of the cover plate (65) around the axis of the second rotating shaft through a bearing;

the spring (67) is sleeved on the outer wall of the second rotating shaft (66);

a knob (68) mounted at the left end of the second rotating shaft (66);

the second gear (69) is sleeved at the right end of the outer wall of the second rotating shaft (66), the second gear (69) is pushed to move rightwards under the action of the elasticity of the spring (67), a positioning groove (610) is formed in the right side wall of the second gear (69), and the positioning block (62) is inserted with the positioning groove (610) to position the second gear (69).

2. The auxiliary test device for the oscilloscope probe according to claim 1, wherein the outer wall of the positioning block (62) is semicircular in shape.

3. An oscilloscope probe auxiliary testing device according to claim 2, wherein the outer wall of said color wheel (63) is equally divided by four colors.

4. An auxiliary test device for an oscilloscope probe according to claim 3, wherein the second rotating shaft (66) is a spline shaft, so that the second gear (69) can slide left and right on the outer wall of the second rotating shaft (66).

5. The auxiliary test device for the oscilloscope probe according to claim 4, wherein the transmission ratio of the second gear (69) to the inner gear ring (64) is 4:1.

6. An auxiliary test method for an oscilloscope probe, which is applied to the auxiliary test device for the oscilloscope probe according to claim 5, is characterized by comprising the following steps:

Connecting a pen point (4) with the input end of the integrated circuit to be tested, adjusting multiple through a switch (2), and detecting the integrated circuit to be tested under the cooperation of an oscilloscope;

When the oxidation layer of the lead at the input end of the integrated circuit to be tested needs to be removed, the pulling block (510) is pulled to the right to drive the second clamping plates (54) positioned at the left side to move, under the transmission of the first gear (58) and the rack (55), the two second clamping plates (54) move inwards simultaneously, the second clamping plates (54) are far away from the first clamping plates (53), the lead is inserted into a cavity formed by the corresponding first clamping plates (53) and the second clamping plates (54), the pulling block (510) is loosened, the first gear (58) rotates clockwise under the torsion force of the torsion spring (59), the second clamping plates (54) move outwards, the polishing sheet (56) is contacted with the lead, the probe handle (1) is pulled, the polishing sheet (56) rubs with the lead, the oxidation layer on the surface of the lead is destroyed, and the stability of the signal between the pen point (4) and the input end of the integrated circuit to be tested is ensured;

And thirdly, when the probe handle (1) is required to be consistent with the selected oscilloscope channel, rotating the knob (68) according to the color of the inserted oscilloscope channel, and after the second gear (69) moves leftwards along the outer wall of the second rotating shaft (66) under the blocking of the curved surface of the positioning block (62), driving the inner gear ring (64) to rotate clockwise or anticlockwise by the second gear (69), changing the color displayed on the shell (61) by the color disc (63) until the color displayed on the color disc (63) is consistent with the oscilloscope channel, and pushing the second gear (69) to move rightwards by the spring (67) under the action of self elasticity, wherein the positioning block (62) is inserted into the positioning groove (610) to position the second gear (69), so that the color disc (63) is adjusted, and confusion during testing of an integrated circuit is prevented.