CN118509052B - Integrated test system and test method for multipath interference test of optical module - Google Patents
Integrated test system and test method for multipath interference test of optical module Download PDFInfo
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- CN118509052B CN118509052B CN202410981036.6A CN202410981036A CN118509052B CN 118509052 B CN118509052 B CN 118509052B CN 202410981036 A CN202410981036 A CN 202410981036A CN 118509052 B CN118509052 B CN 118509052B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07953—Monitoring or measuring OSNR, BER or Q
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Abstract
The invention relates to an integrated test system and a test method for multipath interference test of an optical module, comprising the following steps: a light source module; an optical splitter OC1 for splitting the optical signal into a main arm and an MPI arm; the optical splitter OC3 is used for splitting the optical signal on the main arm into two paths; an adjustable loss link; the optical splitter OC4 is used for splitting the optical signal output on the adjustable loss link into two paths; an optical splitter OC2 for combining the optical signals; an attenuator for receiving and adjusting the optical signal output from the optical splitter OC 2; welding all optical fibers of the optical interfaces in the system; the advantages are that: one set of system can directly test the tolerance of multipath interference; all optical fibers of the necessary optical interfaces are welded, so that the generation of light reflection is radically stopped, and no extra multipath interference is introduced; the visual real-time display interface is designed and adopted, so that the equivalent reflectance value is directly obtained, and frequent disassembly and assembly of the optical interface are avoided.
Description
Technical Field
The invention relates to the field of optical communication, in particular to an integrated test system and a test method for multipath interference test of an optical module.
Background
In high-speed fiber optic communication network applications, complex fiber optic links include a number of fiber optic interfaces that exhibit varying degrees of optical reflection for the transmitted optical signals. Multipath interference (Multiple PATH INTERFERENCE, MPI) occurs when there are two or more strong reflections of the optical signal in the fiber link. Multipath interference can cause degradation of optical signal quality in an optical fiber link, and affect transmission performance of an optical fiber system, in particular to a high-speed optical fiber communication network such as high-speed 50G/200G/400G based on fourth-order pulse amplitude modulation (PAM 4).
The main scheme basically adopts a digital signal Processing (DIGITAL SIGNAL Processing, DSP) chip, and although each DSP manufacturer has already proposed a compensation function for multipath interference, the compensation capability for multipath interference still needs to be tested and evaluated by the optical module manufacturer.
The conventional testing system of the present optical module manufacturer is shown in fig. 1, and comprises the following equipment devices: external light source Tx module (101), 10%:90% optical splitter OC1 (102), 2km fiber (103), optical attenuator VOA (104, 107), optical polarizer PC (105), 50%:50% optical splitter OC2 (106) and the receive Rx module to be tested (108), in the test system, all optical interfaces are connected by flanges, so at least 8 flanges (C1-C8) are required.
Aiming at the test system shown in the figure 1, the test thought is as follows: and adding an equivalent reflection optical signal of an adjustable multipath interference (MPI) into the optical signal received by the receiving module (108) to be tested, adjusting different equivalent reflection coefficients (ERI), testing the receiving error rate (BER) of the receiving module (108), and determining the tolerance of the receiving module (108) to be tested to the multipath interference (MPI) by comparing with the index requirement of the receiving error rate.
The specific test method of the test system comprises the following steps:
s1, measuring the luminous power of a light source module (101) at a C1 interface, and marking as P0;
s2, measuring the output optical power of a main arm of the optical splitter OC1 (102) at a C2 interface, wherein the output optical power is recorded as P1, and the theoretical value of P1 is P0-0.46;
s3, measuring the output optical power of an MPI arm of the optical splitter OC1 (102) at a C3 interface, and recording as P2, wherein the theoretical value of P2 is P0-10;
S4, an equivalent loss link consisting of a 2km optical fiber (103), an optical attenuator VOA1 (104) and an optical polarizer PC (105) is marked as IL, and the measured value of the IL can be marked as P3 at a C6 interface, and the theoretical value of P3 is P0-10-IL;
S5, combining two paths of optical signals of a main arm and an MPI arm into one path at a C7 interface, wherein the equivalent reflection coefficient (ERI) of the MPI arm relative to the main arm is denoted as P4, and P4=P3-P1= - (9.54+IL);
S6, by adjusting the optical attenuator VOA1 (104), different effective reflection coefficients (ERI) can be obtained;
S7, adjusting the optical attenuator VOA2 (107) at different effective reflection coefficients (ERI), and testing the receiving error rate (BER) of the receiving module (108) to obtain the tolerance of the receiving module (108) to be tested to multipath interference (MPI).
In the test system, because a plurality of independent devices are adopted for construction, a plurality of optical interfaces exist, the optical interfaces are connected with each other by using the optical fiber jumper wire and the flange plate, and a plurality of optical reflection points exist objectively, so that extra multipath interference (MPI) can be introduced, and the reliability of test data is affected. In order to reduce the light reflection on the optical interface as much as possible, although the optical interface can select the APC interface, the selection difficulty and cost of all equipment devices in the test system are increased, and the construction difficulty of the test system is increased.
Meanwhile, when the testing method is adopted, real-time optical power measurement is carried out on each optical interface (C1-C8), the flange plate is required to be frequently detached, risks of pollution on the end face of the jumper wire, misplacement of the flange plate and the like are increased through the actions, and the consistency and stability of the testing result are poor.
Based on this, the present application is hereby proposed.
Disclosure of Invention
The invention aims to provide an integrated test system for multi-path interference test of an optical module, which is used for improving the accuracy and convenience of the multi-path interference tolerance test of an optical module manufacturer on a high-speed optical module.
In order to achieve the above object, the technical scheme of the present invention is as follows:
an integrated test system for optical module multipath interference testing, comprising:
the light source module is used for emitting light signals;
the optical splitter OC1 is configured to split an optical signal emitted by the optical module into a main arm and an MPI arm;
The optical splitter OC3 is used for dividing the optical signal on the main arm into two paths, and one path is used for real-time monitoring;
An adjustable loss link for adjusting the loss of the optical signal on the MPI arm;
The optical splitter OC4 is used for dividing the optical signal output on the adjustable loss link into two paths, and one path is used for real-time monitoring;
The optical splitter OC2 is configured to combine the other optical signal split by the optical splitter OC3 and the other optical signal split by the optical splitter OC 4;
the attenuator VOA2 receives the combined optical signals output by the optical splitter OC2, adjusts the optical power and outputs the optical power to a receiving optical module to be detected;
the beam splitter OC3 and the beam splitter OC4 have the same beam splitting ratio;
The optical fibers of the optical interface between the light source module and the optical splitter OC1, the optical fibers of the optical interface between the optical splitter OC1 and the adjustable loss link, the optical fibers of the optical interface between the optical splitter OC3 and the optical splitter OC2, the optical fibers of the optical interface between the optical splitter OC4 and the optical splitter OC2 and the optical fibers of the optical interface between the optical splitter OC2 and the attenuator VOA2 are all welded.
Furthermore, the optical interface of the output end of the attenuator VOA2 adopts an APC interface.
Furthermore, the light source module adopts a built-in light source and comprises a DSP chip, a microprocessor, a semiconductor refrigerator driving chip and a laser;
The microprocessor communicates and controls the DSP chip and the semiconductor refrigerator driving chip according to the upper computer signal;
the DSP chip is used for outputting a modulation signal to the laser;
the semiconductor refrigerator driving chip is used for keeping the laser to work at a stable temperature;
the laser is used for emitting optical signals.
Further, the adjustable loss link includes a fixed length fiber optic line, an attenuator VOA1, and a polarizer;
the optical fiber circuit is used for enabling the optical signal on the MPI arm to have a time delay compared with the optical signal on the main arm;
the attenuator VOA1 is used for adjusting the optical power loss on the MPI arm;
the polarizer is used for adjusting the light polarization state of the MPI arm, so that the light polarization state of the MPI arm is aligned with the main arm;
the optical fibers of the optical interface between the optical fiber circuit and the attenuator VOA1 and the optical fibers of the optical interface between the attenuator VOA1 and the polarizer are welded.
Further, a control interface is included, and the attenuator VOA1 is connected with the control interface.
Further, the device comprises a control interface, and the polarizer is connected with the control interface.
Further, a control interface is included, and the attenuator VOA2 is connected to the control interface.
Further, the optical power real-time display interface is included, wherein one path of optical signal split on the optical splitter OC3 is connected to the optical power real-time display interface.
Further, the optical power real-time display interface is included, wherein one path of optical signal split on the optical splitter OC4 is connected to the optical power real-time display interface.
The second object of the present invention is to provide a testing method for multipath interference testing of an optical module, based on the integrated testing system for multipath interference testing of an optical module, the testing method comprising the following steps:
recording the power T1 of one path of optical signals split on the main arm and the power T2 of one path of optical signals split on the MPI arm;
Calculating an equivalent reflection coefficient eri=t2-T1;
Different equivalent reflection coefficients are obtained by adjusting the optical attenuator VOA 1;
And adjusting the optical attenuator VOA2 at different effective reflection coefficients, and testing the receiving error rate of the receiving optical module to obtain the tolerance of the receiving optical module to multipath interference.
The invention has the advantages that:
1. The integrated test system for the multipath interference test integrates a plurality of discrete equipment devices, and one set of system can directly perform tolerance test of multipath interference MPI; in the design, all optical fibers of the necessary optical interfaces are welded, so that the generation of optical reflection is radically stopped, extra multipath interference MPI is not introduced, and the reliability of test data of the integrated test system is improved; the visual real-time display interface is designed and adopted to display the optical power of the main arm and the MPI arm in real time, so that the equivalent reflection coefficient ERI value can be directly obtained, the test data is stable, and the frequent disassembly and assembly of the optical interface is avoided;
2. The design adopts the built-in light source, can directly control the working speed and the working mode of the built-in light source at the control interface of the integrated system, and can adapt to the tolerance test of multipath interference (MPI) of different high-speed optical modules;
3. the design adopts real-time control interface, including attenuator VOA and optical polarizer PC, and the test is convenient.
Drawings
FIG. 1 is a schematic diagram of a conventional route test framework in the background art;
FIG. 2 is a schematic diagram of an integrated multi-path interference (MPI) test system in an embodiment;
FIG. 3 is a schematic diagram of the function of the built-in light source in the embodiment;
FIG. 4 is a schematic diagram of an MPI arm adjustable loss function block in an embodiment;
description of the reference numerals
101. A light source module; 102. a beam splitter OC1; 103. 2km of optical fiber; 104. an optical attenuator VOA1; 105. a polarizer PC; 106. a beam splitter OC2; 107. an optical attenuator VOA2; 108. a receiving optical module; 109. a beam splitter OC3; 110. a beam splitter OC4;
flanges C1, C2, C3, C4, C5, C6, C7 and C8;
the fusion points S1, S2, S3, S4, S5, S6, S7.
Detailed Description
The present invention will be described in further detail with reference to the following embodiments, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like herein indicate an orientation or a positional relationship based on the orientation or the positional relationship shown in the drawings, and are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the apparatus or element to be referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
The embodiment provides an integrated test system for multipath interference test of an optical module, as shown in fig. 2, which comprises the following components: built-in light source, optical splitter OC1, optical splitter OC2, optical splitter OC3, optical splitter OC4, adjustable loss link (also called equivalent loss link), optical attenuator VOA2, wherein the adjustable loss link is composed of 2km optical fiber, optical attenuator VOA1 and polarizer PC. The integrated system is also provided with a visual real-time display interface and a real-time control interface, so that the data in the system can be conveniently displayed and controlled in real time.
As shown in fig. 3, the built-in light source is a light source module, and mainly comprises a DSP chip (built-in Driver), a microprocessor MCU chip, a semiconductor refrigerator TEC (Thermo Electric Cooler) driving chip and a Laser. The DSP chip is used for outputting a high-speed PAM4 modulation signal to the Laser, and the highest speed can reach 200Gbps. The MCU chip of the microprocessor is used for receiving signals of a control interface at the upper computer and communicating and controlling the DSP chip and the TEC driving chip of the semiconductor refrigerator. The working mode of the DSP chip can be switched by the microprocessor MCU chip. The semiconductor refrigerator TEC driving chip is used for providing stable TEC current, so that the Laser can keep working at a stable temperature, and the specific working temperature of the Laser can be controlled by the microprocessor MCU chip. The design adopts the built-in light source, can directly control the working speed and the working mode of the built-in light source at the control interface of the integrated system, and can adapt to the tolerance test of the multipath interference MPI of different high-speed optical modules.
The spectral ratio of the optical splitter OC1 was 10%:90 for splitting the optical signal emitted by the Laser into a main arm and an MPI arm.
The optical splitter OC3 is used for dividing the optical signal on the main arm into two paths, one path is connected to the visual real-time display interface and used for real-time monitoring of optical power, so that the stability of test data is improved, and repeated disassembly and assembly of the optical interface are avoided.
And the adjustable loss link is used for adjusting the loss of the optical signal on the MPI arm. As shown in fig. 4, the 2km optical fiber selects a g.652d optical fiber, which acts as a Delay increasing function, so that the optical signal on the MPI arm has a Delay compared with the optical signal on the main arm, and the actual application state is simulated; the attenuator VOA1 adjusts the optical power loss on the MPI arm to reach the target equivalent reflection coefficient ERI, the attenuator VOA1 can be connected to a real-time control interface of the integrated test system, real-time adjustment is supported, and test convenience is improved; the polarizer PC is used for adjusting the light polarization state of the MPI arm, so that the polarization state is aligned with the main arm to achieve maximum damage, and the polarizer PC is also connected with a control knob of the polarizer PC to a real-time control interface of the integrated test, so that real-time adjustment is supported, and the test convenience is improved.
The optical splitter OC4 is used for dividing the optical signal output on the adjustable loss link into two paths, one path is connected to the visual real-time display interface and used for real-time monitoring of optical power, so that the stability of test data is improved, and repeated disassembly and assembly of the optical interface are avoided.
The effect of the optical splitter OC3 and the optical splitter OC4 is to lead out the optical power on the main arm and the MPI arm, and connect to the real-time display interface of the optical power of the integrated test system, it can be seen that T1 and T2 in fig. 2, T1 represents the power of one optical signal led out by the optical splitter OC3, T2 represents the power of one optical signal led out by the optical splitter OC4, the value of T2-T1 is the equivalent reflection coefficient ERI, and it is noted that the optical splitting ratio of the optical splitters OC3 and OC4 must be the same, in the present application, the optical splitting ratio of the optical splitter OC3 is 50%:50%, the spectral ratio of the optical splitter OC4 is 50%:50%.
And the optical splitter OC2 is configured to combine the other optical signal split by the optical splitter OC3 and the other optical signal split by the optical splitter OC 4. The beam splitter OC1 divides the light emitted by the Laser into a main arm and an MPI arm, and after loss is added to the MPI arm, the light of the main arm and the light of the MPI arm are combined in the beam splitter OC2, so that the adjustable equivalent reflection coefficient ERI can be added to the main arm optical signal to carry out tolerance test of the MPI.
The attenuator VOA2 receives the combined optical signal output by the optical splitter OC2, adjusts the optical power, and outputs the optical power to the receiving optical module to be measured. The attenuator VOA2 controls the light power entering the receiving optical module to be detected, so that the receiving optical module to be detected works near the sensitivity. The BER curve of the receiving optical module to be tested can be tested by adjusting the attenuation of the attenuator VOA2 and traversing a certain range of optical power, and the BER curve is used for evaluating the tolerance of the receiving optical module to be tested to multipath interference (MPI). The attenuator VOA2 can be connected to a real-time control interface of the integrated test system, supports real-time adjustment, and improves test convenience.
As an improvement, in the system of this embodiment, the optical fiber of the optical interface between the built-in light source and the optical splitter OC1, the optical fiber of the optical interface between the optical splitter OC1 and the optical fiber of the optical splitter 2, the optical fiber of the optical interface between the optical splitter VOA1 and the optical fiber of the optical splitter, the optical fiber of the optical interface between the optical splitter OC3 and the optical splitter OC2, the optical fiber of the optical interface between the optical splitter OC4 and the optical splitter OC2, and the optical fiber of the optical interface between the optical splitter OC2 and the optical fiber of the optical splitter VOA2 are all welded (see the welding points S1 to S7 in fig. 2 in detail), so that the generation of optical reflection is fundamentally stopped, no extra multipath interference MPI is introduced, and the reliability of the test data of the integrated test system is improved. Because the receiving optical module to be tested needs to be replaced frequently, in order to weaken the reflection of the optical interface at the output end of the attenuator VOA2, the optical interface at the output end of the attenuator VOA2 in this embodiment adopts an APC interface.
The test method of the test system comprises the following steps:
recording the power T1 of one path of optical signals split on the main arm and the power T2 of one path of optical signals split on the MPI arm;
Calculating an equivalent reflection coefficient eri=t2-T1;
Different equivalent reflection coefficients are obtained by adjusting the optical attenuator VOA 1;
And adjusting the optical attenuator VOA2 at different effective reflection coefficients, and testing the receiving error rate of the receiving optical module to obtain the tolerance of the receiving optical module to multipath interference.
The above embodiments are only for illustrating the concept of the present invention and not for limiting the protection of the claims of the present invention, and all the insubstantial modifications of the present invention using the concept shall fall within the protection scope of the present invention.
Claims (9)
1. An integrated test system for multipath interference testing of an optical module, comprising:
the light source module is used for emitting light signals;
the optical splitter OC1 is configured to split an optical signal emitted by the optical module into a main arm and an MPI arm;
the optical splitter OC3 is used for dividing the optical signal on the main arm into two paths, and one path is used for real-time monitoring of optical power;
An adjustable loss link for adjusting the loss of the optical signal on the MPI arm; the adjustable loss link comprises a fixed-length optical fiber line, an attenuator VOA1 and a polarizer; the optical fiber circuit is used for enabling the optical signal on the MPI arm to have a time delay compared with the optical signal on the main arm; the attenuator VOA1 is used for adjusting the optical power loss on the MPI arm; the polarizer is used for adjusting the light polarization state of the MPI arm, so that the light polarization state of the MPI arm is aligned with the main arm; the optical fibers of the optical interface between the optical fiber circuit and the attenuator VOA1 and the optical fibers of the optical interface between the attenuator VOA1 and the polarizer are welded;
The optical splitter OC4 is used for dividing the optical signal output on the adjustable loss link into two paths, and one path is used for real-time monitoring of optical power;
The optical splitter OC2 is configured to combine the other optical signal split by the optical splitter OC3 and the other optical signal split by the optical splitter OC 4;
the attenuator VOA2 receives the combined optical signals output by the optical splitter OC2, adjusts the optical power and outputs the optical power to a receiving optical module to be detected;
the beam splitter OC3 and the beam splitter OC4 have the same beam splitting ratio;
The optical fibers of the optical interface between the light source module and the optical splitter OC1, the optical fibers of the optical interface between the optical splitter OC1 and the adjustable loss link, the optical fibers of the optical interface between the optical splitter OC3 and the optical splitter OC2, the optical fibers of the optical interface between the optical splitter OC4 and the optical splitter OC2 and the optical fibers of the optical interface between the optical splitter OC2 and the attenuator VOA2 are all welded.
2. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, wherein the optical interface at the output of the attenuator VOA2 employs an APC interface.
3. The integrated test system for multipath interference testing of an optical module as claimed in claim 1, wherein the light source module employs a built-in light source including a DSP chip, a microprocessor, a semiconductor refrigerator driving chip and a laser;
The microprocessor communicates and controls the DSP chip and the semiconductor refrigerator driving chip according to the upper computer signal;
the DSP chip is used for outputting a modulation signal to the laser;
the semiconductor refrigerator driving chip is used for keeping the laser to work at a stable temperature;
the laser is used for emitting optical signals.
4. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, comprising a control interface, the attenuator VOA1 being connected to the control interface.
5. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, comprising a control interface, the polarizer being connected to the control interface.
6. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, comprising a control interface, the attenuator VOA2 being connected to the control interface.
7. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, comprising an optical power real-time display interface, wherein a path of optical signal split off at splitter OC3 is connected to the optical power real-time display interface.
8. An integrated test system for multipath interference testing of an optical module as claimed in claim 1, comprising an optical power real-time display interface, wherein a drop of an optical signal at splitter OC4 is connected to the optical power real-time display interface.
9. A test method for multipath interference testing of an optical module, characterized in that based on the integrated test system for multipath interference testing of an optical module according to any of claims 1 to 8, the test method comprises the following steps:
recording the power T1 of one path of optical signals split on the main arm and the power T2 of one path of optical signals split on the MPI arm;
Calculating an equivalent reflection coefficient eri=t2-T1;
Different equivalent reflection coefficients are obtained by adjusting the optical attenuator VOA 1;
And adjusting the optical attenuator VOA2 at different effective reflection coefficients, and testing the receiving error rate of the receiving optical module to obtain the tolerance of the receiving optical module to multipath interference.
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