CN118500540B - Laser parameter detection circuit, method and laser - Google Patents
Laser parameter detection circuit, method and laser Download PDFInfo
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- CN118500540B CN118500540B CN202410956084.XA CN202410956084A CN118500540B CN 118500540 B CN118500540 B CN 118500540B CN 202410956084 A CN202410956084 A CN 202410956084A CN 118500540 B CN118500540 B CN 118500540B
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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Abstract
The application relates to a laser parameter detection circuit, a method and a laser, wherein the laser parameter detection circuit comprises a first detection module and a micro control unit, and the first detection module comprises: a first photosensor for generating a leakage current when irradiated with a laser pulse; the first analog signal processing circuit is connected with the first photoelectric sensor and used for converting leakage current into a corresponding first voltage signal; the first pulse generating circuit is connected with the first analog signal processing circuit and is used for converting the first voltage signal into a corresponding first square wave pulse signal; the micro control unit is connected with the first analog signal processing circuit and the first pulse generating circuit, and is used for enabling the first analog signal processing circuit and calculating laser parameters of laser pulses according to the first voltage signal and the first square wave pulse signal. By adopting the circuit, the real-time performance of laser detection can be improved, so that the light-emitting stability of the laser is improved.
Description
Technical Field
The present application relates to the field of laser technologies, and in particular, to a laser parameter detection circuit, a laser parameter detection method, and a laser.
Background
With the development of laser technology, there is a problem in the art that whether the light emission parameters of lasers, such as laser therapeutic machines, for example, relate to therapeutic effects, such as energy and power, and thus whether the light emission parameters are accurate is a concern.
However, in the conventional technology, the integrated average value of the laser pulse in a unit time is used for detecting the power of the laser, and the integrated average value is applied to a power adjusting unit of the laser. The real-time performance of the detection mode of the light emitting parameters by the traditional technology is poor, and each laser pulse cannot be analyzed singly, so that the problems of poor light emitting stability and low treatment efficiency of the laser are often caused by untimely detection.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a laser parameter detection circuit, a laser parameter detection method, a laser device, a computer apparatus, and a storage medium, which can improve the timeliness of laser parameter detection of a laser, thereby improving the light emission stability.
In a first aspect, a laser parameter detection circuit is provided, where the laser parameter detection circuit includes a first detection module and a micro control unit: wherein, the first detection module includes:
A first photosensor for generating a leakage current when irradiated with a laser pulse;
the first analog signal processing circuit is connected with the first photoelectric sensor and used for converting leakage current into a corresponding first voltage signal;
The first pulse generating circuit is connected with the first analog signal processing circuit and is used for converting the first voltage signal into a corresponding first square wave pulse signal;
The micro control unit is connected with the first analog signal processing circuit and the first pulse generating circuit, and is used for enabling the first analog signal processing circuit and calculating laser parameters of laser pulses according to the first voltage signal and the first square wave pulse signal.
In some embodiments, the laser parameter detection circuit further comprises a second detection module comprising:
a second photosensor for generating a leakage current when irradiated with the laser light;
the second analog signal processing circuit is connected with the second photoelectric sensor and used for converting leakage current into a corresponding second voltage signal;
The second pulse generating circuit is connected with the second analog signal processing circuit and is used for converting the second voltage signal into a corresponding second square wave pulse signal;
The micro control unit is also connected with the second analog signal processing circuit and the second pulse generating circuit and is also used for calculating laser parameters of the laser pulse according to the first voltage signal, the first square wave pulse signal, the second voltage signal and the second square wave pulse signal.
In some embodiments, the laser parameter detection circuit further comprises:
The first power supply circuit is connected with the main controller, the micro control unit and the first analog signal processing circuit and is used for converting the appointed voltage into a first working voltage when the main controller provides the appointed voltage, wherein the first working voltage is the working voltage of the micro control unit and the first detection module;
a bus circuit for establishing communication between the main controller and the micro-control unit;
the second power supply circuit is connected with the main controller and the bus circuit and is used for converting the appointed voltage into a second working voltage when the main controller provides the appointed voltage, and the second working voltage is the working voltage of the bus circuit.
In some embodiments, the first power supply circuit includes a first power supply module and a second power supply module; wherein,
The first power supply module is used for converting the appointed voltage into the working voltage of the first detection module when the main controller provides the appointed voltage;
and the second power supply module is used for converting the working voltage of the first detection module into the working voltage of the micro control unit.
In some embodiments, the first analog signal processing circuit includes a first resistor, an analog switch, an in-phase proportional amplifying unit, and a voltage following unit; wherein,
The first end of the first resistor is connected with the anode of the first photoelectric sensor and the COM end of the analog switch, and the second end of the first resistor is grounded;
The EN end of the analog switch is connected with the first input and output end of the micro control unit, and the NO end of the analog switch is connected with the in-phase input end of the in-phase proportional amplifying unit;
the output end of the in-phase proportional amplifying unit is connected with the in-phase input end of the first pulse generating circuit and the voltage following unit, and the inverting input end of the in-phase proportional amplifying unit is grounded;
the output end of the voltage following unit is connected with the inverting input end of the voltage following unit and the analog-to-digital conversion end of the micro control unit.
In some embodiments, the first pulse generation circuit includes a second resistor, a third resistor, and an operational amplifier; wherein,
The first end of the second resistor is connected with the inverting input end of the operational amplifier and the first end of the third resistor, and the second end of the second resistor is configured to be connected with corresponding working voltage;
the non-inverting input end of the operational amplifier is connected with the output end of the non-inverting proportional amplifying unit, and the output end of the operational amplifier is connected with the second input and output end of the micro-control unit;
The second end of the third resistor is grounded.
In a second aspect, there is provided a laser parameter detection method applied to the micro control unit of the laser parameter detection circuit of any one of the embodiments of the first aspect, the method comprising:
receiving a work starting instruction of a laser sent by a main controller;
Enabling a first analog signal processing circuit in the first detection module according to a work starting instruction, enabling the first analog signal processing circuit to convert leakage current generated by the first photoelectric sensor under the irradiation of laser pulses into corresponding first voltage signals, wherein the first voltage signals comprise first converted voltage signals and first calculated voltage signals, and converting the first converted voltage signals into first square wave pulse signals through a first pulse generating circuit;
And acquiring a first square wave pulse signal and a first calculation voltage signal which are output by the first detection module, and calculating laser parameters of the laser pulse according to the first square wave pulse signal and/or the first calculation voltage signal.
In some embodiments, obtaining the first square wave pulse signal and the first calculated voltage signal output by the first detection module, and calculating the laser parameter of the laser pulse according to the first square wave pulse signal and/or the first calculated voltage signal includes:
Acquiring a first square wave pulse signal, triggering the acquisition of the voltage value of a first calculation voltage signal in response to the rising edge of the first square wave pulse signal, ending the acquisition of the voltage value of the first calculation voltage signal in response to the falling edge of the first square wave pulse signal, calculating the duration of the first square wave pulse signal according to the time of the rising edge and the falling edge, and calculating the laser energy of the laser pulse according to the duration and the acquired voltage value of the first calculation voltage signal.
In some embodiments, obtaining the first square wave pulse signal and the first calculated voltage signal output by the first detection module, and calculating the laser parameter of the laser pulse according to the first square wave pulse signal and/or the first calculated voltage signal includes:
And calculating the light emitting frequency of the laser according to the time of the rising edge of the first square pulse signal corresponding to the laser pulse and the time of the rising edge of the first square pulse signal corresponding to the next laser pulse of the laser pulse.
In some embodiments, obtaining the first square wave pulse signal and the first calculated voltage signal output by the first detection module, and calculating the laser parameter of the laser pulse according to the first square wave pulse signal and/or the first calculated voltage signal includes:
Acquiring a first square wave pulse signal, triggering the acquisition of the voltage value of a first calculation voltage signal in response to the rising edge of the first square wave pulse signal, stopping the acquisition of the voltage value of the first calculation voltage signal in response to the falling edge of the first square wave pulse signal, calculating the duration of the first square wave pulse signal according to the time of the rising edge and the falling edge, and calculating the laser energy of the laser pulse according to the duration and the acquired voltage value of the first calculation voltage signal; calculating the light emitting frequency of the laser according to the time of the rising edge of the first square pulse signal corresponding to the laser pulse and the time of the rising edge of the first square pulse signal corresponding to the next laser pulse of the laser pulse; and calculating the total power of the laser according to the laser energy of the laser pulses and the light-emitting frequency in a preset time period.
In some embodiments, the method further comprises:
Enabling the second detection module and acquiring laser parameters calculated based on the second detection module;
And performing weighted calculation on the laser parameters calculated based on the first detection module and the laser parameters calculated based on the second detection module according to a preset weight ratio to obtain weighted laser parameters of the laser pulse.
In some embodiments, the method further comprises:
and stopping the enabling operation of the first detection module and switching to enabling the second detection module when the first detection module is abnormal.
In some embodiments, the method further comprises:
and responding to the parameter providing instruction sent by the main controller, and sending the calculated target laser parameters corresponding to the parameter providing instruction to the main controller.
In a third aspect, there is provided a laser comprising a main controller and a laser parameter detection circuit according to any of the embodiments of the first aspect.
According to the laser parameter detection circuit, the method and the laser, the energy of the single laser pulse is accurately collected through the photoelectric sensor and is converted into the leakage current to be transmitted to the analog signal processing circuit, the analog signal processing circuit converts the leakage current of the single laser pulse into the corresponding voltage signal, the voltage signal can represent the energy state information of the laser pulse and is transmitted to the pulse generation circuit, the pulse generation circuit converts the voltage signal into the corresponding square wave pulse signal, the square wave pulse signal can represent the continuous state information of the laser pulse, the micro control unit receives the voltage signal on one hand and receives the square wave pulse signal on the other hand, and the energy state information represented by the voltage signal and the continuous state information represented by the square wave pulse signal are combined, so that relevant laser parameters of the laser can be timely and accurately calculated for the single laser pulse irradiated on the photoelectric sensor. Therefore, the real-time performance of laser detection can be improved, and the light emitting stability of the laser can be further improved.
Drawings
FIG. 1 is a schematic diagram of a laser parameter detection circuit according to some embodiments;
FIG. 2 is a schematic diagram of a laser parameter detection circuit according to other embodiments;
FIG. 3 is a schematic diagram of a first power supply circuit according to some embodiments;
FIG. 4 is a schematic diagram of a second power supply circuit according to some embodiments;
FIG. 5 is a schematic diagram of the micro-control unit in some embodiments;
FIG. 6 is a schematic diagram of a first analog signal processing circuit according to some embodiments;
FIG. 7 is a schematic diagram of a second analog signal processing circuit according to some embodiments;
FIG. 8 is a schematic diagram of a first pulse generation circuit in some embodiments;
FIG. 9 is a schematic diagram of a second pulse generation circuit in some embodiments;
Fig. 10 is a flow chart of a laser parameter detection method in some embodiments.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
In some embodiments, as shown in fig. 1, a laser parameter detection circuit 10 is provided, the laser parameter detection circuit 10 being applicable to laser devices such as lasers, and in particular,
The laser parameter detection circuit 10 may include a first detection module 110 and a micro control unit 200, wherein the first detection module 110 includes:
a first photosensor 111 for generating a leakage current when irradiated with a laser pulse;
A first analog signal processing circuit 112 connected to the first photosensor 111 for converting the leakage current into a corresponding first voltage signal;
A first pulse generating circuit 113 connected to the first analog signal processing circuit 112 for converting the first voltage signal into a corresponding first square wave pulse signal;
The micro control unit 200 is connected to the first analog signal processing circuit 112 and the first pulse generating circuit 113, and is configured to enable the first analog signal processing circuit 112 and calculate a laser parameter of the laser pulse according to the first voltage signal and the first square pulse signal.
In this embodiment, the micro control unit 200 (Microcontroller Unit, MCU) Is also called a single chip Microcomputer (SINGLE CHIP Microcomputer) or a single chip Microcomputer, and when the micro control unit 200 receives a corresponding command, the first analog signal processing circuit 112 Is enabled, and when the first photosensor 111 Is irradiated by a laser pulse, a leakage current Is corresponding to the intensity of the laser pulse Is generated inside the first photosensor 111, the first analog signal processing circuit 112 processes the leakage current Is inside the first photosensor 111, on one hand, transmits the generated first voltage signal to the first pulse generating circuit 113, on the other hand, also transmits the generated first voltage signal to the micro control unit 200, and the first pulse generating circuit 113 processes the first voltage signal output from the first analog signal processing circuit 112 to generate a first square wave pulse signal corresponding to the first voltage signal and transmits the first square wave pulse signal to the micro control unit 200. The micro control unit 200 combines the combined first voltage signal with the first square wave pulse signal for calculating laser parameters of the laser.
Illustratively, the laser parameters include, but are not limited to, the energy of an individual laser pulse, the pulse width of an individual laser pulse, the time interval between a current laser pulse and its next laser pulse, the frequency of the light exiting the laser pulse, the total power of the laser, etc.
The laser parameter detection circuit accurately collects the energy of a single laser pulse through the photoelectric sensor and converts the energy into leakage current to be transmitted to the analog signal processing circuit, the analog signal processing circuit converts the leakage current of the single laser pulse into corresponding voltage signals, the voltage signals can represent the energy state information of the laser pulse and transmit the energy state information to the pulse generation circuit, the pulse generation circuit converts the voltage signals into corresponding square wave pulse signals, the square wave pulse signals can represent the state information of the laser pulse, the micro control unit receives the voltage signals on one hand and receives the square wave pulse signals on the other hand, and the energy state information represented by the voltage signals and the state information represented by the square wave pulse signals are combined, so that relevant laser parameters of the laser can be timely and accurately calculated for the single laser pulse irradiated on the photoelectric sensor. Therefore, the real-time performance of laser detection can be improved, and the light emitting stability of the laser can be further improved.
In some embodiments, referring to fig. 2, the laser parameter detection circuit may further include a second detection module 120, where the second detection module 120 includes:
a second photosensor 121 for generating a leakage current when irradiated with laser light;
a second analog signal processing circuit 122 connected to the second photosensor 121 for converting the leakage current into a corresponding second voltage signal;
a second pulse generating circuit 123 connected to the second analog signal processing circuit 122 for converting the second voltage signal into a corresponding second square wave pulse signal;
The micro control unit 200 is further connected to the second analog signal processing circuit 122 and the second pulse generating circuit 123, and is further configured to calculate a laser parameter according to the first voltage signal, the first square wave pulse signal, the second voltage signal, and the second square wave pulse signal.
In this embodiment, after receiving the corresponding command, the micro control unit 200 may enable the second analog signal processing circuit 122, when the second photosensor 121 is irradiated by the laser pulse, the second analog signal processing circuit 122 may generate a leakage current corresponding to the intensity of the laser pulse, and the second analog signal processing circuit 122 may process the leakage current in the second photosensor 121, on one hand, transmit the generated second voltage signal to the second pulse generating circuit 123, and on the other hand, also transmit the generated second voltage signal to the micro control unit 200, and the second pulse generating circuit 130 may process the second voltage signal output from the second analog signal processing circuit 122 to generate a second square wave pulse signal corresponding to the second voltage signal and transmit the second square wave pulse signal to the micro control unit 200. The micro control unit 200 combines the second voltage signal with the second square wave pulse signal, and further, the micro control unit 200 may integrate the calculation result obtained by the first detection module 110 with the calculation result obtained by the signal of the second detection module 120, for example, by means of weighted calculation, to obtain the final weighted laser parameter.
For example, the micro control unit 200 may enable the first detection module 110 and the second detection module 120 at the same time, perform weighted calculation on the detection results of the first detection module 110 and the second detection module 120, and the weight allocation of each detection module may be adjusted according to the actual requirement, for example, the first detection module 110 may be used as a master detection module, the second detection module 120 may be used as a slave detection module, and the weight of the master detection module may be greater than that of the slave detection module, so as to obtain a more accurate detection result.
For example, the micro control unit 200 may also individually enable one of them, respectively, in different instructions or in different situations, as desired. For example, if an abnormality occurs in hardware in the first detection module 110, the micro control unit 200 may stop enabling the first detection module 100 and switch to enable the second detection module 120, and vice versa, so as to avoid the unstable laser parameter detection caused by the special abnormality of hardware, etc., ensure the validity of the laser parameter detection circuit, and avoid the stopping of the laser due to the circuit failure.
It should be noted that, in some embodiments, the number of the detection modules in the present application may be plural, and the specific number is not limited, and may be adjusted according to practical applications, and in order to more clearly illustrate the present application, the present embodiment only uses two detection modules including the first detection module 110 and the second detection module 120 as an example, but the number of the detection modules is not limited to two. In other embodiments, a third detection module, a fourth detection module, and more detection modules, etc. may also be included. In the case of including a plurality of detection modules, the number of the micro control units 200 may be adjusted accordingly according to the number of the detection modules, and any number and corresponding number relationship that can implement the inventive concept are included in the protection scope of the present application.
In some embodiments, referring to fig. 2, the laser parameter detection circuit 10 may further include the following components:
The first power supply circuit 300 is connected to the main controller 20, the micro control unit 200 and the first analog signal processing circuit 112, and is configured to convert a specified voltage into a first operating voltage (vcc_ana, vcc_mcu) when the main controller 20 provides the specified voltage, wherein the first voltage is an operating voltage of the micro control unit 200 and the first detection module 110, that is, the micro control unit 200, the first analog signal processing circuit 112, the first pulse generating circuit 113 and the first photoelectric sensor 111 provide the operating voltage; further, when the second detection module 120 or more is included, the first power supply circuit 300 may also supply the operating voltage to each component of the other detection modules.
A bus circuit 400 for establishing communication between the main controller 20 and the micro control unit 200;
The second power supply circuit 500 is connected to the main controller 20 and the BUS circuit 400, and is configured to convert the designated voltage into a second operating voltage vcc_bus when the designated voltage is provided by the main controller 20, where the second operating voltage is an operating voltage of the BUS circuit 400.
In this embodiment, the first power supply circuit 300 is provided to provide the micro control unit 200 and at least one detection module with a stable operating voltage required for operation. By providing the bus circuit 400, communication between the micro control unit 200 and at least one upper computer (e.g. a main controller of a laser quality device, etc.) can be established, so that different laser parameters can be transmitted for the micro control unit according to different correspondence of the upper computer instructions to adapt to the working requirements of different upper computers. The provision of the second power supply circuit 500 can provide the bus circuit 400 with a stable operation voltage required for operation.
In some embodiments, reference may be made to fig. 3, where fig. 3 illustrates a schematic diagram of a first power supply circuit 300 in some embodiments, where the first power supply circuit 300 may include a first power supply module 301 and a second power supply module 302; wherein,
A first power module 301, configured to convert a specified voltage VCC into an operating voltage vcc_ana of the first detection module 110 when the main controller 20 provides the specified voltage VCC;
The second power module 302 is configured to convert the operating voltage vcc_ana of the first detection module 110 into the operating voltage vcc_mcu of the micro control unit 200.
More specifically, when the main controller 20 provides a set of power supply voltages VCC that meet the requirements, the first power supply circuit 300 may generate, through the power supply unit U1, an operating voltage vcc_ana required by the first analog signal processing circuit 112, the second analog signal processing circuit 122, the first pulse generating circuit 113, the second pulse generating circuit 123, the first photosensor 111 (e.g., PH1 in fig. 6), and the second photosensor 121 (e.g., PH2 in fig. 7). Vcc_ana may in turn generate, via the power supply unit U2, an operating voltage vcc_mcu required by the micro-control unit 200.
In fig. 3, the capacitive elements C10 and C3 are polar capacitors, and the capacitive elements C19, C16 and C17 are nonpolar capacitors, and the capacitive elements may be used as stored charges to improve the stability of the power supplied by the first power supply circuit, and in practical applications, the configuration of the capacitive elements may be less or more than that shown in fig. 3.
In some embodiments, referring to fig. 4, fig. 4 illustrates a schematic diagram of a second power supply circuit 500 in some embodiments. Wherein the BUS TX and BUS RX pins are used to connect the corresponding pins of BUS circuit 400.
In some embodiments, reference may be made to fig. 5 and 6, where fig. 5 illustrates a schematic diagram of the micro control unit 200 in some embodiments, and fig. 6 illustrates a schematic diagram of the first analog signal processing circuit 112 in some embodiments.
Referring to fig. 5, the micro control unit 200 may be implemented based on an MCU chip U5, wherein the MCU chip U5 may include the following pins: input/output pins (IO 1, IO2, IO3, and IO 4), analog-to-digital conversion pins (ADC 1, ADC 2), VCC, VSS, BUS _tx, and bus_rx pins.
For example, IO1 may be the enable control pin of the chip U18 in the first analog signal processing circuit 112; IO3 may be used as an enable control pin for the chip U19 in the second analog signal processing circuit 122; IO2 may be a level signal input pin of the first pulse generation circuit 113; IO4 may be a level signal input pin of the second pulse generation circuit 123; the ADC1 may serve as a voltage signal input pin of the first analog signal processing circuit 112; ADC2 may serve as a voltage signal input pin of the second analog signal processing circuit 122, and bus_tx and bus_rx may serve as BUS input and output pins of the BUS circuit 400.
Referring to fig. 6, the first analog signal processing circuit 112 may include a first resistor R60, an analog switch U18, an in-phase proportional amplifying unit 1121, and a voltage following unit 1122; wherein,
The first end of the first resistor R60 is connected with the COM end of the analog switch U18 and the positive pole PH1+ of the first photoelectric sensor PH1, and the second end of the first resistor R60 is grounded; wherein, the first photosensor PH1 may employ a photodiode;
The EN end of the analog switch U18 is connected with the first input/output end IO1 of the micro control unit 200, and the NO end of the analog switch U18 is connected with the in-phase input end U15+ of the in-phase proportional amplifying unit 1121;
The output end of the in-phase proportional amplifying unit 1121 is connected with the first pulse generating circuit 112 and the in-phase input end U22+ of the voltage following unit 1122, and the anti-phase input end U15 of the in-phase proportional amplifying unit 1121 is grounded;
an output terminal of the voltage follower unit 1122 is connected to an inverting input terminal U22 of the voltage follower unit 1122 and an analog-to-digital conversion terminal ADC1 of the micro control unit 200.
Illustratively, the voltage follower unit 1122 may be implemented based on an operational amplifier U22.
Illustratively, the in-phase proportional amplifying unit 1121 may include an operational amplifier U15, a resistor R64, and a resistor R65, and the in-phase proportional amplifying unit 1121 is configured by adjusting a proportional relationship of the resistor R64 and the resistor R65.
Illustratively, the first analog signal processing circuit 112 may further include a capacitive element C45, where one end of the capacitive element C45 Is connected to the negative electrode of the first photosensor PH1, and the other end Is grounded for storing energy after the leakage current Is generated.
Specifically, in the first analog signal processing circuit 112, after the IO1 enable signal Is generated, the COM terminal in the analog switch U18 Is turned on to the NO terminal pin, when the first photosensor PH1 Is irradiated by the laser pulse, a leakage current Is generated in the analog switch U18, and the leakage current Is varies according to the variation of the degree of excitation of the first photosensor PH1, and due to the presence of the first resistor R60, a voltage Is generated on the NO terminal pin of the analog switch U18, and then a voltage signal V PD1_OP Is generated on the NO terminal pin of the analog switch U18, sequentially through the in-phase proportional amplifying unit 1121 formed by the operational amplifier U15, and then the voltage signal V ADC1 Is generated on the in-phase terminal U24A of the operational amplifier U24A of the first pulse generating circuit 113, and then through the voltage follower unit 1122 formed by the operational amplifier U22, and then the ADC1 pin of the chip U5 of the micro control unit 200 Is output, so as to realize that the leakage current Is converted into a corresponding first voltage signal (V PD1_OP、VADC1), and the voltage signal V PD1_OP at the input terminal thereof and the voltage signal V ADC1 at the output terminal thereof are within a preset range equal to each other due to the presence of the voltage follower unit 1122.
In some embodiments, the laser parameter detection circuit 10 may further include a second detection module 120, and the structure of the second analog signal processing circuit 122 in the second detection module 120 may be as shown with reference to fig. 7.
Specifically, after the IO3 enable signal Is generated, the second analog signal processing circuit 122 turns on the COM terminal and the NO terminal pin inside the analog switch U17, when the second photosensor PH2 Is irradiated by the laser pulse, the second photosensor PH2 generates the leakage current Is therein, the leakage current Is varies according to the variation of the degree of excitation of the photosensor PH2, and due to the resistor R62, the COM terminal pin of the analog switch U17 generates the voltage, the NO terminal pin of the analog switch U17 generates the voltage, the voltage signal V PD2_OP Is sequentially generated by the in-phase proportional amplifying unit 1221 composed of the operational amplifier U16, the voltage signal V PD2_OP Is output to the in-phase terminal u24b+ of the operational amplifier U24B of the second pulse generating circuit 123, and the voltage signal V ADC2 Is generated by the voltage follower unit 1222 composed of the operational amplifier U23 and output to the ADC2 pin of the chip U5 of the micro control unit 200. That Is, conversion of the leakage current Is into a corresponding second voltage signal (V PD1_OP、VADC1) Is achieved.
In some embodiments, referring to fig. 8, fig. 8 illustrates a schematic diagram of the first pulse generation circuit 113 in some embodiments. The first pulse generating circuit 113 includes a second resistor R73, a third resistor R74, and an operational amplifier U24A; the first end of the second resistor R73 is connected to the inverting input end U24A-of the operational amplifier U24A and the first end of the third resistor R74, and the second end of the second resistor R73 is configured to be connected to the corresponding operating voltage vcc_ana; the in-phase input end U24A+ of the operational amplifier U24A is connected with the output end of the operational amplifier U15 of the in-phase proportional amplification unit 1121, and the output end of the operational amplifier U24A is connected with the second input and output end IO2 of the micro control unit 200; the second terminal of the third resistor R74 is grounded.
Specifically, the first pulse generating circuit 113 may be a comparator constructed based on the operational amplifier U24A, and when the voltage value of the voltage signal V PD1_OP input at the non-inverting input terminal U24a+ is greater than the reference voltage V ref generated at the inverting input terminal U24A by the operating voltage vcc_ana, the resistor R73, and the resistor R74, the first square wave pulse signal V IO2 output from the output terminal of the operational amplifier U24A to the MCU chip U5 of the micro control unit 200 is at the high level 1, and conversely at the low level 0, thereby converting the first voltage signal V PD1_OP belonging to the analog signal into the first square wave pulse signal composed of 1 and 0.
In some embodiments, referring to fig. 9, fig. 9 shows a schematic diagram of the structure of the second pulse generation circuit 123 in some embodiments.
Specifically, the second pulse generating circuit 123 may be a comparator circuit configured based on the operational amplifier U24B, when the voltage value of the voltage signal V PD2_OP input at the non-inverting input terminal U24b+ of the operational amplifier U24B is greater than the reference voltage signal V ref generated at the inverting input terminal by the operating voltage vcc_ana, the first resistor R73, and the second resistor R74, the second square wave pulse signal V IO4 output from the output terminal of the operational amplifier U24B to the MCU chip U5 of the micro control unit 200 is at a high level 1, and otherwise at a low level 0, so as to convert the second voltage signal V PD2_OP, which is an analog signal, into the second square wave pulse signal configured by 1 and 0.
In some embodiments, referring to fig. 10, a laser parameter detection method is also provided, and the method may be applied to the micro control unit 200 of the laser parameter detection circuit 10 of any one or more of the embodiments described above. Wherein the method may comprise the steps of:
s1: and receiving an operation start instruction of the laser sent by the main controller.
Specifically, the micro control unit 200 may communicate with the main controller 20 through the bus circuit 400, and receive an operation start instruction of the laser sent by the main controller 20, and in other embodiments, the micro control unit 200 may also establish communication with the main controller 20 through a network and receive an instruction issued by the micro control unit.
S2: the first analog signal processing circuit in the first detection module is enabled according to the work starting instruction, so that the first analog signal processing circuit converts leakage current generated by the first photoelectric sensor under the irradiation of laser pulse into corresponding first voltage signals, the first voltage signals comprise first converted voltage signals and first calculated voltage signals, and the first converted voltage signals are converted into first square wave pulse signals through the first pulse generating circuit.
S3: and acquiring a first square wave pulse signal and a first calculation voltage signal which are output by the first detection module, and calculating laser parameters of the laser pulse according to the first square wave pulse signal and/or the first calculation voltage signal.
In some embodiments, obtaining the first square wave pulse signal and the first calculated voltage signal output by the first detection module, and calculating the laser parameter of the laser pulse according to the first square wave pulse signal and/or the first calculated voltage signal may include calculating at least one of the following laser parameters:
1. Energy calculation of individual laser pulses: acquiring a first square wave pulse signal, triggering the acquisition of the voltage value of a first calculation voltage signal in response to the rising edge of the first square wave pulse signal, ending the acquisition of the voltage value of the first calculation voltage signal in response to the falling edge of the first square wave pulse signal, calculating the duration of the first square wave pulse signal according to the time of the rising edge and the falling edge, and calculating the laser energy of the laser pulse according to the duration and the acquired voltage value of the first calculation voltage signal.
Specifically, according to the ADC detection characteristic of the MCU chip, the generated square wave pulse signal is used for timing or triggering to finish timing in a level overturning mode, so that the method is faster and more convenient, and the calculation accuracy of the laser parameters of the laser pulse can be improved. The rising edge of the square wave pulse signal triggers timing, so that the ADC detection function of the MCU chip is started, the MCU chip starts to continuously collect the calculated voltage signal V ADC1、VADC2 serving as an analog voltage signal, and the falling edge of the square wave pulse signal triggers the ADC detection to finish. In this embodiment, when the laser pulse has energy, the square wave pulse signal is generated, and at this time, the MCU chip performs ADC detection and operation of the laser energy, so that a large amount of operation resources can be saved by performing timing or triggering to end timing in a level inversion manner by the generated square wave pulse signal.
2. Calculating the light emitting frequency of the laser: and calculating the light emitting frequency of the laser according to the time of the rising edge of the first square pulse signal corresponding to the laser pulse and the time of the rising edge of the first square pulse signal corresponding to the next laser pulse of the laser pulse.
3. Calculating the total power of the laser in a preset time period: and calculating the total power of the laser according to the laser energy of the laser pulses and the light-emitting frequency in a preset time period.
The method of calculating the energy of a single laser pulse in some application examples of the present application will be described in further detail below with reference to fig. 2 to 9.
After the enabling signals are generated by IO1 and IO3 of the MCU chip U5 of the micro control unit 200, the first analog signal processing circuit 112 and the second analog signal processing circuit 122 are enabled, and when a single laser pulse arrives, the first photosensor PH1 and the second photosensor PH2 generate the respective leakage currents Is, for example, and referring to the explanation of the hardware structure in the above embodiment, the first analog signal processing circuit 112 generates the first voltage signal (V PD1_OP、VADC1), I.e., the first voltage signal may comprise the first converted voltage signal V PD1_OP and the first calculated voltage signal V ADC1, the second analog signal processing circuit 122 generates the second voltage signal (V PD2_OP、VADC2), i.e., the second voltage signal comprises the second converted voltage signal V PD2_OP and the second calculated voltage signal V ADC2, In the first pulse generation circuit 113, when V PD1_OP is greater than V ref, the first square pulse signal V IO2 is inverted to high level 1. In the second pulse generating circuit 123, when V PD2_OP is greater than V ref, the second square wave pulse signal V IO4 is inverted to high level 1, at which time the MCU chip U5 considers the laser to be lasing, its internal timer begins to count, The ADC1 pin of the MCU chip U5 and the ADC2 pin start to acquire the calculated voltage signals V ADC1 and V ADC2, when the laser pulse is ended, V PD1_OP is smaller than V ref, The first square wave pulse signal V IO2 is inverted to low level 0, and V PD2_OP is smaller than V ref, the second square wave pulse signal V IO4 is inverted to low level 0, the MCU chip U5 ends the timing and terminates the detection of the calculated voltage signals V ADC1 and V ADC2, and the MCU chip U5 reads and records the end time, thereby calculating the duration T wid1 of the single laser pulse on the first photosensor PH1 and the duration T wid2 on the second photosensor PH 2. at this time, the energy generated by the single laser pulse on the first photosensor PH1 can be obtained by the collected voltage value of the first calculation voltage signal V ADC1 and the first duration T wid1; similarly, the energy generated by the single laser pulse on the second photosensor PH2 can be obtained by the collected voltage value of the second calculation voltage signal V ADC2 and the second duration T wid2, and further, the calculation result can be stored in the MCU chip U5.
In some embodiments, the method further comprises: enabling the second detection module and acquiring laser parameters calculated based on the second detection module; and performing weighted calculation on the laser parameters calculated based on the first detection module and the laser parameters calculated based on the second detection module according to a preset weight ratio to obtain weighted laser parameters of the laser pulse.
In this embodiment, by configuring a plurality of detection modules, the first detection module may be used as a main detection module, and the first detection module may be used as an auxiliary detection module, so that the detection accuracy of a single laser pulse is improved in a weighted manner, thereby improving the accuracy of laser parameter calculation.
In some embodiments, the method further comprises: and stopping the enabling operation of the first detection module and switching to enabling the second detection module when the first detection module is abnormal.
In this embodiment, by configuring a plurality of detection modules, when one or more enabled detection modules are abnormal, the detection modules can be switched to enabled standby detection modules, so that normal operation of the laser parameter detection circuit is ensured, and stability of the laser is further improved.
In some embodiments, the method further comprises: and responding to the parameter providing instruction sent by the main controller, and sending the calculated target laser parameters corresponding to the parameter providing instruction to the main controller.
In this embodiment, various upper computers (main controllers) may be adapted through buses or the like, and laser characteristic parameters required by the upper computers may be transmitted in any manner.
In some embodiments, a laser is also provided, which may be a laser treatment device for laser treatment, and the laser may include a main control and the laser parameter detection circuit of any one or more of the above embodiments, and may further include a general structure in a general laser, and a detailed description of the laser parameter detection circuit in the laser is referred to in the description of the above embodiments and will not be repeated herein.
It should be understood that, although the steps in the flowchart of fig. 10 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in fig. 10 may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, or the order in which the sub-steps or stages are performed is not necessarily sequential, but may be performed in rotation or alternatively with at least a portion of the sub-steps or stages of other steps or steps.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
Furthermore, the term "and/or" is herein merely one kind of association relation describing the association object, meaning that three kinds of relations may exist, e.g., a and/or B may mean: a exists singly, A and B exist simultaneously, and B exists singly. In addition, the character herein generally indicates that the front-rear association object is an or relationship.
Furthermore, the terms "first," "second," and the like herein are used for descriptive convenience to distinguish between components of the same name and not to be construed as limiting in any way.
The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.
Claims (12)
1. A laser parameter detection circuit comprising a first detection module and a micro control unit: wherein, the first detection module includes:
A first photosensor for generating a leakage current when irradiated with a laser pulse;
The first analog signal processing circuit is connected with the first photoelectric sensor and is used for converting the leakage current into a corresponding first voltage signal;
The first pulse generating circuit is connected with the first analog signal processing circuit and is used for converting the first voltage signal into a corresponding first square wave pulse signal;
The micro control unit is connected with the first analog signal processing circuit and the first pulse generating circuit, and is used for enabling the first analog signal processing circuit and calculating laser parameters of the laser pulse according to the first voltage signal and the first square wave pulse signal.
2. The circuit of claim 1, wherein the laser parameter detection circuit further comprises a second detection module comprising:
a second photosensor for generating a leakage current when irradiated with the laser light;
the second analog signal processing circuit is connected with the second photoelectric sensor and is used for converting the leakage current into a corresponding second voltage signal;
the second pulse generating circuit is connected with the second analog signal processing circuit and is used for converting the second voltage signal into a corresponding second square wave pulse signal;
The micro control unit is further connected with the second analog signal processing circuit and the second pulse generating circuit, and is further used for calculating laser parameters of the laser pulse according to the first voltage signal, the first square wave pulse signal, the second voltage signal and the second square wave pulse signal.
3. The circuit of claim 1, wherein the laser parameter detection circuit further comprises:
The first power supply circuit is connected with the main controller, the micro control unit and the first analog signal processing circuit and is used for converting the appointed voltage into a first working voltage when the appointed voltage is provided by the main controller, wherein the first working voltage is the working voltage of the micro control unit and the first detection module;
a bus circuit for establishing communication between the main controller and the micro control unit;
And the second power supply circuit is connected with the main controller and the bus circuit and is used for converting the appointed voltage into a second working voltage when the main controller provides the appointed voltage, and the second working voltage is the working voltage of the bus circuit.
4. The circuit of claim 3, wherein the first power supply circuit comprises a first power supply module and a second power supply module; wherein,
The first power supply module is used for converting the specified voltage into the working voltage of the first detection module when the main controller provides the specified voltage;
The second power supply module is used for converting the working voltage of the first detection module into the working voltage of the micro control unit.
5. The circuit of claim 1, wherein the first analog signal processing circuit comprises a first resistor, an analog switch, an in-phase proportional amplifying unit, and a voltage follower unit; wherein,
The first end of the first resistor is connected with the positive electrode of the first photoelectric sensor and the COM end of the analog switch, and the second end of the first resistor is grounded;
the EN end of the analog switch is connected with the first input and output end of the micro-control unit, and the NO end of the analog switch is connected with the in-phase input end of the in-phase proportional amplifying unit;
The output end of the in-phase proportional amplifying unit is connected with the first pulse generating circuit and the in-phase input end of the voltage following unit, and the inverting input end of the in-phase proportional amplifying unit is grounded;
The output end of the voltage following unit is connected with the inverting input end of the voltage following unit and the analog-to-digital conversion end of the micro control unit.
6. The circuit of claim 5, wherein the first pulse generation circuit comprises a second resistor, a third resistor, and an operational amplifier; wherein,
The first end of the second resistor is connected with the inverting input end of the operational amplifier and the first end of the third resistor, and the second end of the second resistor is configured to be connected with a corresponding working voltage;
the non-inverting input end of the operational amplifier is connected with the output end of the non-inverting proportional amplifying unit, and the output end of the operational amplifier is connected with the second input and output end of the micro control unit;
The second end of the third resistor is grounded.
7. A laser parameter detection method applied to the micro control unit of the laser parameter detection circuit according to any one of claims 1 to 6, the method comprising:
receiving a work starting instruction of a laser sent by a main controller;
Enabling a first analog signal processing circuit in a first detection module according to the work starting instruction, enabling the first analog signal processing circuit to convert leakage current generated by a first photoelectric sensor under the irradiation of laser pulse into a corresponding first voltage signal, wherein the first voltage signal comprises a first conversion voltage signal and a first calculation voltage signal, and converting the first conversion voltage signal into a first square wave pulse signal through a first pulse generating circuit;
The first square wave pulse signal and the first calculation voltage signal output by the first detection module are obtained, and laser parameters of the laser pulse are calculated according to the first square wave pulse signal and/or the first calculation voltage signal.
8. The method according to claim 7, wherein the acquiring the first square wave pulse signal and the first calculated voltage signal output by the first detection module, and calculating the laser parameter of the laser pulse according to the first square wave pulse signal and/or the first calculated voltage signal, includes:
acquiring the first square wave pulse signal, triggering the acquisition of the voltage value of the first calculation voltage signal in response to the rising edge of the first square wave pulse signal, terminating the acquisition of the voltage value of the first calculation voltage signal in response to the falling edge of the first square wave pulse signal, calculating the duration of the first square wave pulse signal according to the time of the rising edge and the falling edge, and calculating the laser energy of the laser pulse according to the duration and the acquired voltage value of the first calculation voltage signal; and/or
Calculating the light emitting frequency of the laser according to the time of the rising edge of the first square pulse signal corresponding to the laser pulse and the time of the rising edge of the first square pulse signal corresponding to the next laser pulse of the laser pulse; and/or
And calculating the total power of the laser according to the laser energy and the light-emitting frequency of a plurality of laser pulses in a preset time period.
9. The method of claim 8, wherein the method further comprises:
enabling a second detection module and acquiring laser parameters calculated based on the second detection module;
And performing weighted calculation on the laser parameters calculated based on the first detection module and the laser parameters calculated based on the second detection module according to a preset weight ratio to obtain the weighted laser parameters of the laser pulse.
10. The method of claim 7, wherein the method further comprises:
and stopping the enabling operation of the first detection module and switching to enable the second detection module when the first detection module is abnormal.
11. The method of claim 7, wherein the method further comprises:
and responding to a parameter providing instruction sent by the main controller, and sending the calculated target laser parameters corresponding to the parameter providing instruction to the main controller.
12. A laser comprising a main controller and a laser parameter detection circuit according to any one of claims 1 to 6.
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| JP2005351909A (en) * | 1998-01-14 | 2005-12-22 | Canon Inc | Analog signal processing circuit, signal processing circuit, photodetection device, and image forming device |
| CN117191187A (en) * | 2022-05-30 | 2023-12-08 | 海思技术有限公司 | Laser sensing detection circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2005351909A (en) * | 1998-01-14 | 2005-12-22 | Canon Inc | Analog signal processing circuit, signal processing circuit, photodetection device, and image forming device |
| CN117191187A (en) * | 2022-05-30 | 2023-12-08 | 海思技术有限公司 | Laser sensing detection circuit |
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