CN118392020B - Direct-insert sediment thickness electronic calculation method, system and equipment - Google Patents
Direct-insert sediment thickness electronic calculation method, system and equipment Download PDFInfo
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- 239000013049 sediment Substances 0.000 title claims abstract description 146
- 238000004364 calculation method Methods 0.000 title claims abstract description 24
- 238000005070 sampling Methods 0.000 claims abstract description 167
- 239000011159 matrix material Substances 0.000 claims abstract description 59
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- 238000012545 processing Methods 0.000 abstract description 11
- 230000006870 function Effects 0.000 description 7
- 238000004891 communication Methods 0.000 description 4
- 239000002689 soil Substances 0.000 description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
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- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The invention belongs to the field of data processing, and provides a direct-insert sediment thickness electronic calculation method, a system and equipment, wherein on a sediment area to be monitored, resistance long-span values of sampling points are obtained by comparing resistivity vectors corresponding to the sampling points on diagonal lines of a sampling point square matrix, resistance length Zhang Juzhen is formed by resistance lengths Zhang Zhi of the sampling points, and resistance long-span characteristics of the resistance length Zhang Juzhen are calculated; and selecting a length Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines through the length Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval by the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines, and obtaining the corrected sediment thickness from the long-sheet thickness interval. Thus, the data characteristics of all positions in the sediment area can be comprehensively obtained, the distribution condition of sediment can be reflected more accurately, and the measurement accuracy is improved.
Description
Technical Field
The invention belongs to the field of data processing, and particularly relates to an electronic calculation method, system and equipment for direct-insert sediment thickness.
Background
The traditional sediment thickness measurement technology generally adopts a single-point or multi-point measurement mode, and the mode only can provide limited data, so that the distribution situation of sediment is difficult to accurately reflect, the data characteristics of all positions in a sediment area cannot be more comprehensively obtained, and the distribution situation of sediment is not sufficiently accurately reflected. The prior art also has certain limitations in measurement accuracy and data feature extraction capability, single-point measurement may not capture the overall distribution feature of sediment, and multi-point measurement may face data processing difficulties. The prior art may be time consuming in terms of data processing, especially for processing large amounts of data. For example, in CN213748253U, a sediment thickness detection device, the sediment thickness at the bottom of the pile can be obtained through test data and curves, but there are also problems of locality and reliability, that is, the area to be monitored cannot be covered sufficiently, or the accuracy and reliability of the data are to be verified.
Disclosure of Invention
The invention aims to provide an electronic calculation method, system and equipment for the thickness of direct-insert sediment, which are used for solving one or more technical problems in the prior art and at least providing a beneficial selection or creation condition.
In order to achieve the above object, according to an aspect of the present invention, there is provided an in-line sediment thickness electronic calculating method, comprising the steps of:
Selecting a plurality of sampling points to form a sampling point matrix on a sediment area to be monitored;
On each sampling point, recording the resistivity of each step distance in the process by an electric sounding method, and calculating the sediment thickness corresponding to each sampling point;
comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain the resistance length values of the sampling points, forming a resistance length Zhang Juzhen by using the resistance lengths Zhang Zhi of the sampling points, and calculating the resistance length characteristics of the resistance length Zhang Juzhen;
and selecting a length Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines through the length Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval by the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines, and obtaining the corrected sediment thickness from the long-sheet thickness interval.
Further, on the sediment area to be monitored, a rectangular area is selected, and a plurality of different sampling points are selected from the rectangular area to form a square matrix serving as the square matrix of the sampling points. By adopting the sampling point square matrix mode, the data characteristics of all positions in the sediment area can be more comprehensively obtained, so that the distribution condition of sediment is more accurately reflected.
Preferably, the geometric center point of the square matrix of sampling points may coincide with the geometric center of the sediment area to be monitored.
Further, on each sampling point, the resistivity of each step in the recording process is recorded by an electric sounding method, and the pile bottom sediment thickness corresponding to each sampling point is calculated, specifically: and respectively on each sampling point, gradually pulling up from the bottom of the sediment at preset steps according to an electric sounding method by using a resistance probe, and recording the resistivity of each step in the pulling-up process so as to detect the sediment thickness corresponding to each sampling point. Through the combination of the electric sounding method and the sampling point square matrix, the measurement accuracy can be improved, and the data characteristics can be extracted more comprehensively.
Further, the bottom of the sediment is gradually pulled upwards at equal steps, the steps used by each sampling point are kept consistent, and an array formed by the values of the resistivity of each step corresponding to each sampling point in sequence is used as a resistivity vector corresponding to the sampling point.
Through calculation of the resistor length Zhang Juzhen and extraction of the feature vector, data can be analyzed and processed more rapidly, and the data processing efficiency is improved. Moreover, the area to be monitored can be covered more comprehensively in a sampling point matrix mode, and the accuracy and the reliability of the data can be verified more rapidly through extracting the feature vectors.
Further, comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain a resistance length value of each sampling point, forming a resistance length Zhang Juzhen by using a resistance length Zhang Zhi of each sampling point, calculating a resistance length characteristic of the resistance length Zhang Juzhen, selecting a length Zhang Tezheng-dimensional sequence number from the resistance length characteristics, obtaining a length characteristic line average thickness and a length characteristic column average thickness by using the length Zhang Tezheng-dimensional sequence number, and forming a length thickness interval by using the length characteristic line average thickness and the length characteristic column average thickness, wherein the method specifically comprises the following steps:
Selecting resistivity vectors corresponding to sampling points on diagonal lines of a sampling point matrix, respectively calculating the product of the resistivity vectors corresponding to the sampling points in the sampling point matrix and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines, and taking the arithmetic average value of the product of the resistivity vector of each sampling point and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines as the resistance length Zhang Zhi of the sampling point;
In the actual measurement process, sediment at the bottom of the pile is in a state of slightly larger area and shallower depth but non-uniform distribution, the bottom of the sediment layer is not necessarily level, a single resistance probe is used for measuring one position, so that the actual sediment thickness is deviated from the measured sediment thickness, even if a plurality of resistance heads are arranged on one probe, the deviation is unavoidable due to concentration on a smaller measurement local area in the prior art, the sediment thickness at the bottom of the pile is inconsistent, the sediment is subsequently placed differently and even is placed individually and inclined, and the resistivity vector consisting of the resistivity with the same step distance corresponds to the detection data characteristics of each sampling point of the sampling point square matrix aligned with the center of the sediment area to be monitored, so that the soil distribution and the depth characteristics of each sampling point of the sediment area to be monitored can be reflected from the side better by using the resistance length Zhang Zhi, and the characteristic reflection range is more specific and comprehensive.
A matrix formed by the resistance long-sheet values of each sampling point in the sampling point matrix is used as a resistance length Zhang Juzhen,
Calculating a unit feature vector of the resistor long-sheet matrix as a resistor long-sheet feature;
The unit feature vector of the resistor long matrix is calculated to serve as the resistor long feature, linear correlation conditions among resistivity vectors of each sampling point according to steps can be obtained through statistics, and relative probability relations among all row and column positions can be rapidly counted.
Acquiring the serial number of the dimension where the element with the largest numerical value in the resistor long-sheet characteristic is positioned as a long Zhang Tezheng-dimensional serial number,
Acquiring a row with the row serial number corresponding to the long Zhang Tezheng-dimensional serial number in the sampling point square matrix as a long characteristic row,
Acquiring a column with the sequence number corresponding to the long Zhang Tezheng-dimensional sequence number in the sampling point square array as a long Zhang Tezheng column;
The serial number of the dimension where the element with the largest value in the resistor long-sheet characteristic is located represents the relative probability relation between soil layer distribution among all rows and columns of the resistor long-sheet matrix and the depth characteristic of the resistor long-sheet matrix, and the element with the largest value is the representation with the strongest relative probability relation, so that the information of the position where the most useful sediment thickness is located can be extracted.
Calculating the average value of sediment thickness corresponding to the sampling points on the long characteristic line as the average thickness of the long characteristic line,
Calculating an average value of sediment thickness corresponding to sampling points on the long characteristic column as the average thickness of the long characteristic column;
According to the information of the position of the most useful sediment thickness, the average thickness of the long characteristic row and the average thickness of the long characteristic column are calculated for the row and the column, the overall distribution characteristics of sediment thickness corresponding to sampling points on the row and the column are extracted rapidly and efficiently when the arithmetic average value of the row and the column is calculated, and the position of the corrected sediment thickness value can be positioned accurately and efficiently by comparing the mutual value intervals of the average thickness of the long characteristic row and the average thickness of the long characteristic column.
And selecting the largest numerical value from the average thickness of the long characteristic row and the average thickness of the long characteristic column as the upper limit of the long thickness, selecting the smallest numerical value as the lower limit of the long thickness, and taking the numerical range from the lower limit of the long thickness to the upper limit of the long thickness as the long thickness interval.
Further, it is preferable that the corrected sediment thickness is calculated from the long thickness section based on a probability distribution of sediment thickness corresponding to sampling points on the long characteristic line and sediment thickness corresponding to sampling points on the long characteristic line.
Further, the median of the long thickness section may be selected as the corrected sediment thickness from the long thickness section.
The invention also provides an in-line sediment thickness electronic computing system, which comprises: the method comprises the steps of a direct-insert sediment thickness electronic calculation method, wherein the direct-insert sediment thickness electronic calculation system can be operated in a desktop computer, a notebook computer, a palm computer, a cloud data center and other computing equipment, and the operable system can comprise, but is not limited to, a processor, a memory and a server cluster, and the processor executes the computer program to be operated in the following units of the system:
the sampling unit is used for selecting a plurality of sampling points to form a sampling point matrix on the sediment area to be monitored;
the measuring unit is used for recording the resistivity of each step distance in the process on each sampling point through an electric sounding method and calculating the sediment thickness corresponding to each sampling point;
the calculating unit is used for comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain the resistance long-sheet value of each sampling point, forming a resistance length Zhang Juzhen according to the resistance length Zhang Zhi of each sampling point, and calculating the resistance long-sheet characteristics of the resistance length Zhang Juzhen;
And the output unit is used for selecting a long Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic row and the average thickness of the long-sheet characteristic column according to the long Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval according to the average thickness of the long-sheet characteristic row and the average thickness of the long-sheet characteristic column, and obtaining the corrected sediment thickness from the long-sheet thickness interval.
Correspondingly, the invention also provides an electronic device, a readable storage medium and a computer program product:
An electronic device, comprising: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the one in-line sediment thickness electronic calculation method and the method of the steps therein.
A non-transitory computer-readable storage medium storing computer instructions for causing the computer to perform the one in-line sediment thickness electronic calculation method and the method of the steps therein.
A computer program product comprising a computer program which when executed by a processor implements the method of in-line sediment thickness electronic calculation and the method of the steps therein.
The beneficial effects of the invention are as follows: the invention provides an electronic calculation method, a system and equipment for the thickness of direct-insert sediment, which are used for comparing resistivity vectors corresponding to sampling points on diagonal lines of a sampling point square matrix on sediment areas to be monitored to obtain resistance long-sheet values of the sampling points, forming a resistance length Zhang Juzhen by using the resistance length Zhang Zhi of the sampling points, and calculating the resistance long-sheet characteristics of the resistance length Zhang Juzhen; and selecting a length Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines through the length Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval by the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines, and obtaining the corrected sediment thickness from the long-sheet thickness interval. Thus, the data characteristics of all positions in the sediment area can be comprehensively obtained, the distribution condition of sediment can be reflected more accurately, and the measurement accuracy is improved.
Drawings
The above and other features of the present invention will become more apparent from the detailed description of the embodiments thereof given in conjunction with the accompanying drawings, in which like reference characters designate like or similar elements, and it is apparent that the drawings in the following description are merely some examples of the present invention, and other drawings may be obtained from these drawings without inventive effort to those of ordinary skill in the art, in which:
FIG. 1 is a flow chart of an electronic calculation method of the in-line sediment thickness;
FIG. 2 is a system architecture diagram of an in-line sediment thickness electronic computing system.
Detailed Description
The conception, specific structure, and technical effects produced by the present application will be clearly and completely described below with reference to the embodiments and the drawings to fully understand the objects, aspects, and effects of the present application. It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other.
In the description of the present invention, a number means one or more, a number means two or more, and greater than, less than, exceeding, etc. are understood to not include the present number, and above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
Referring to fig. 1, a flowchart of an in-line type sediment thickness electronic calculating method according to the present invention is shown, and an in-line type sediment thickness electronic calculating method, system and apparatus according to an embodiment of the present invention are described below with reference to fig. 1.
The invention provides an electronic calculation method of direct-insert sediment thickness, which specifically comprises the following steps:
Selecting a plurality of sampling points to form a sampling point matrix on a sediment area to be monitored;
On each sampling point, recording the resistivity of each step distance in the process by an electric sounding method, and calculating the sediment thickness corresponding to each sampling point;
comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain the resistance length values of the sampling points, forming a resistance length Zhang Juzhen by using the resistance lengths Zhang Zhi of the sampling points, and calculating the resistance length characteristics of the resistance length Zhang Juzhen;
and selecting a length Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines through the length Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval by the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines, and obtaining the corrected sediment thickness from the long-sheet thickness interval.
Further, on the sediment area to be monitored, a rectangular area is selected, and a plurality of different sampling points are selected from the rectangular area to form a square matrix serving as the square matrix of the sampling points.
In some embodiments, the geometric center point of the square matrix of sampling points coincides with the geometric center of the sediment zone to be monitored.
Further, on each sampling point, the resistivity of each step in the recording process is recorded by an electric sounding method, and the pile bottom sediment thickness corresponding to each sampling point is calculated, specifically: and respectively on each sampling point, gradually pulling up from the bottom of the sediment at preset steps according to an electric sounding method by using a resistance probe, and recording the resistivity of each step in the pulling-up process so as to detect the sediment thickness corresponding to each sampling point.
In some embodiments, a plurality of telescopic resistivity probes are used for respectively lowering the resistivity probes to a preset position on a site groove section and a hole depth at each sampling point, the lowering is stopped, the resistivity probes are controlled to extend until reaching the groove bottom or the pile bottom, a resistivity measuring switch is turned on, the resistivity of the pile bottom position is recorded, then the resistivity probes are gradually pulled upwards at preset steps, and the resistivity of each step is recorded to detect the thickness of sediment.
Further, the bottom of the sediment is gradually pulled upwards at equal steps, the steps used by each sampling point are kept consistent, and an array formed by the values of the resistivity of each step corresponding to each sampling point in sequence is used as a resistivity vector corresponding to the sampling point:
In some embodiments, there are 6 steps in the process of gradually pulling up from the bottom of the sediment at equal steps, and an array of values of resistivity corresponding to each step in turn is called a resistivity vector.
Further, comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain a resistance length value of each sampling point, forming a resistance length Zhang Juzhen by using a resistance length Zhang Zhi of each sampling point, calculating a resistance length characteristic of the resistance length Zhang Juzhen, selecting a length Zhang Tezheng-dimensional sequence number from the resistance length characteristics, obtaining a length characteristic line average thickness and a length characteristic column average thickness by using the length Zhang Tezheng-dimensional sequence number, and forming a length thickness interval by using the length characteristic line average thickness and the length characteristic column average thickness, wherein the method specifically comprises the following steps:
Selecting resistivity vectors corresponding to sampling points on diagonal lines of a sampling point matrix, respectively calculating the product of the resistivity vectors corresponding to the sampling points in the sampling point matrix and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines, and taking the arithmetic average value of the product of the resistivity vector of each sampling point and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines as the resistance length Zhang Zhi of the sampling point;
In the actual measurement process, sediment at the bottom of the pile is in a state of slightly larger area and shallower depth but non-uniform distribution, the bottom of the sediment layer is not necessarily level, a single resistance probe is used for measuring one position, so that the actual sediment thickness is deviated from the measured sediment thickness, even if a plurality of resistance heads are arranged on one probe, the deviation is unavoidable due to concentration on a smaller measurement local area in the prior art, the sediment thickness at the bottom of the pile is inconsistent, the sediment is subsequently placed differently and even is placed individually and inclined, and the resistivity vector consisting of the resistivity with the same step distance corresponds to the detection data characteristics of each sampling point of the sampling point square matrix aligned with the center of the sediment area to be monitored, so that the soil distribution and the depth characteristics of each sampling point of the sediment area to be monitored can be reflected from the side better by using the resistance length Zhang Zhi, and the characteristic reflection range is more specific and comprehensive.
A matrix formed by the resistance long-sheet values of each sampling point in the sampling point matrix is used as a resistance length Zhang Juzhen,
Calculating a unit feature vector of the resistor long-sheet matrix as a resistor long-sheet feature;
The unit feature vector of the resistor long matrix is calculated to serve as the resistor long feature, linear correlation conditions among resistivity vectors of each sampling point according to steps can be obtained through statistics, and relative probability relations among all row and column positions can be rapidly counted.
Acquiring the serial number of the dimension where the element with the largest numerical value in the resistor long-sheet characteristic is positioned as a long Zhang Tezheng-dimensional serial number,
Acquiring a row with the row serial number corresponding to the long Zhang Tezheng-dimensional serial number in the sampling point square matrix as a long characteristic row,
Acquiring a column with the sequence number corresponding to the long Zhang Tezheng-dimensional sequence number in the sampling point square array as a long Zhang Tezheng column;
The serial number of the dimension where the element with the largest value in the resistor long-sheet characteristic is located represents the relative probability relation between soil layer distribution among all rows and columns of the resistor long-sheet matrix and the depth characteristic of the resistor long-sheet matrix, and the element with the largest value is the representation with the strongest relative probability relation, so that the information of the position where the most useful sediment thickness is located can be extracted.
Calculating the average value of sediment thickness corresponding to the sampling points on the long characteristic line as the average thickness of the long characteristic line,
Calculating an average value of sediment thickness corresponding to sampling points on the long characteristic column as the average thickness of the long characteristic column;
According to the information of the position of the most useful sediment thickness, the average thickness of the long characteristic row and the average thickness of the long characteristic column are calculated for the row and the column, the overall distribution characteristics of sediment thickness corresponding to sampling points on the row and the column are extracted rapidly and efficiently when the arithmetic average value of the row and the column is calculated, and the position of the corrected sediment thickness value can be positioned accurately and efficiently by comparing the mutual value intervals of the average thickness of the long characteristic row and the average thickness of the long characteristic column.
And selecting the largest numerical value from the average thickness of the long characteristic row and the average thickness of the long characteristic column as the upper limit of the long thickness, selecting the smallest numerical value as the lower limit of the long thickness, and taking the numerical range from the lower limit of the long thickness to the upper limit of the long thickness as the long thickness interval.
For example, in a square matrix of sampling points with a row number of 5, the number of dimensions in the resistor long-sheet feature is 5, if the element with the largest value in the resistor long-sheet feature falls on the 4 th dimension in the resistor long-sheet feature, the sequence number of the long Zhang Tezheng dimensions is 4, then, the sampling points on the row with the sequence number of 4 in the square matrix of sampling points are acquired to form a long-sheet feature row, the sampling points on the column with the sequence number of 4 in the square matrix of sampling points are acquired to form a long Zhang Tezheng column, the average value of the sediment thickness corresponding to the sampling points is selected from the sampling points in the 4 th row in the square matrix of sampling points and is recorded as Rdepth, the average value of the sediment thickness corresponding to the sampling points in the 4 th row in the square matrix of sampling points is recorded as Cdepth, the numerical values of Rdepth and Cdepth are compared, the lower limit of the numerical value long-sheet thickness range in the area is taken as the interval, the upper limit of the numerical value long-sheet thickness range in the sampling point square matrix is acquired, the average value of the upper limit of the large numerical value is taken as the interval, and the growing range is recorded as the numerical value of the length range in the interval is 34, if the numerical value of the upper limit is equal, and the numerical value range is equal.
Further, from the long thickness interval, a corrected sediment thickness is calculated according to the sediment thickness corresponding to the sampling point on the long characteristic row and the probability distribution of sediment thickness corresponding to the sampling point on the long characteristic row:
In some embodiments, the corrected sediment thickness may be calculated and output by including a mapping function set or SOM (self-organizing map neural network) or the like to count sediment thickness corresponding to sampling points on the long feature line and probability distribution of sediment thickness corresponding to sampling points on the long feature line, based on data of sediment thickness corresponding to sampling points on the long feature line and sediment thickness corresponding to sampling points on the long feature line as inputs.
Further, the median of the long thickness section is selected from the long thickness section as the corrected sediment thickness.
In some embodiments, an arithmetic average of the lower long sheet thickness bound to the upper long sheet thickness bound is calculated as the corrected sediment thickness.
The in-line sediment thickness electronic computing system is operated in any computing device of a desktop computer, a notebook computer, a palm computer or a cloud data center, and the computing device comprises: a processor, a memory, and a computer program stored in and running on the processor, which when executed implements the steps of the one in-line sediment thickness electronic calculation method, and the operable system may include, but is not limited to, a processor, a memory, and a server cluster.
As shown in fig. 2, an in-line sediment thickness electronic calculating system provided by an embodiment of the present invention includes: a processor, a memory, and a computer program stored in the memory and executable on the processor, the processor implementing the steps in one of the embodiments of the in-line sediment thickness electronic calculation method described above when the computer program is executed, the processor executing the computer program to be executed in a unit of the following system:
the sampling unit is used for selecting a plurality of sampling points to form a sampling point matrix on the sediment area to be monitored;
the measuring unit is used for recording the resistivity of each step distance in the process on each sampling point through an electric sounding method and calculating the sediment thickness corresponding to each sampling point;
the calculating unit is used for comparing the resistivity vectors corresponding to the sampling points on the diagonal of the sampling point square matrix to obtain the resistance long-sheet value of each sampling point, forming a resistance length Zhang Juzhen according to the resistance length Zhang Zhi of each sampling point, and calculating the resistance long-sheet characteristics of the resistance length Zhang Juzhen;
And the output unit is used for selecting a long Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic row and the average thickness of the long-sheet characteristic column according to the long Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval according to the average thickness of the long-sheet characteristic row and the average thickness of the long-sheet characteristic column, and obtaining the corrected sediment thickness from the long-sheet thickness interval.
In order to better unify the linear relation and probability relation of numerical values between physical quantities of different units, dimensionless processing can be performed on different physical quantities.
Preferably, all undefined variables in the present invention may be threshold set manually if not explicitly defined.
The direct-insert sediment thickness electronic computing system can be operated in computing equipment such as a desktop computer, a notebook computer, a palm computer, a cloud data center and the like. The in-line sediment thickness electronic calculating system comprises, but is not limited to, a processor and a memory. It will be appreciated by those skilled in the art that the examples are merely examples of an in-line sediment thickness electronic calculating method, system and apparatus, and are not limited to an in-line sediment thickness electronic calculating method, system and apparatus, and may include more or less components than examples, or may combine some components, or different components, for example, the in-line sediment thickness electronic calculating system may further include an input/output apparatus, a network access apparatus, a bus, and the like.
The invention also provides an electronic device, a readable storage medium and a computer program product:
An electronic device, comprising: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the one in-line sediment thickness electronic calculation method and the method of the steps therein.
A non-transitory computer-readable storage medium storing computer instructions for causing the computer to perform the one in-line sediment thickness electronic calculation method and the method of the steps therein.
A computer program product comprising a computer program which when executed by a processor implements the method of in-line sediment thickness electronic calculation and the method of the steps therein.
Wherein the electronic device is intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular telephones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), systems On Chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.
Program code for carrying out methods of the present invention may be written in any combination of one or more programming languages. These program code may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus such that the program code, when executed by the processor or controller, causes the functions/operations specified in the flowchart and/or block diagram to be implemented. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of the present invention, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. The machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and pointing device (e.g., a mouse or trackball) by which a user can provide input to the computer. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic input, speech input, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a background component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such background, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), and the internet.
The computer system may include a client and a server. The client and server are typically remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other.
The Processor may be a central processing unit (Central Processing Unit, CPU), other general purpose Processor, digital signal Processor (DIGITAL SIGNAL Processor, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), field-Programmable gate array (Field-Programmable GATE ARRAY, FPGA) or other Programmable logic device, discrete component gate or transistor logic device, discrete hardware components, or the like. The general processor can be a microprocessor or the processor can also be any conventional processor and the like, wherein the processor is a control center of the in-line sediment thickness electronic computing system, and various interfaces and lines are utilized to connect various subareas of the whole in-line sediment thickness electronic computing system.
The memory can be used for storing the computer program and/or the module, and the processor can realize various functions of the in-line sediment thickness electronic calculation method, system and equipment by running or executing the computer program and/or the module stored in the memory and calling the data stored in the memory. The memory may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like; the storage data area may store data (such as audio data, phonebook, etc.) created according to the use of the handset, etc. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as a hard disk, memory, plug-in hard disk, smart memory card (SMART MEDIA CARD, SMC), secure Digital (SD) card, flash memory card (FLASH CARD), at least one disk storage device, flash memory device, or other volatile solid-state storage device.
It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present disclosure may be performed in parallel, sequentially, or in a different order, so long as the desired result of the technical solution of the present disclosure is achieved, and the present disclosure is not limited herein.
The invention provides an electronic calculation method, a system and equipment for the thickness of direct-insert sediment, which are used for comparing resistivity vectors corresponding to sampling points on diagonal lines of a sampling point square matrix on sediment areas to be monitored to obtain resistance long-sheet values of the sampling points, forming a resistance length Zhang Juzhen by using the resistance length Zhang Zhi of the sampling points, and calculating the resistance long-sheet characteristics of the resistance length Zhang Juzhen; and selecting a length Zhang Tezheng-dimensional serial number from the resistor long-sheet characteristics, obtaining the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines through the length Zhang Tezheng-dimensional serial number, forming a long-sheet thickness interval by the average thickness of the long-sheet characteristic lines and the average thickness of the long-sheet characteristic lines, and obtaining the corrected sediment thickness from the long-sheet thickness interval. Thus, the data characteristics of all positions in the sediment area can be comprehensively obtained, the distribution condition of sediment can be reflected more accurately, and the measurement accuracy is improved.
The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.
Claims (7)
1. An electronic calculation method for the thickness of direct-insert sediment, which is characterized by comprising the following steps:
Selecting a plurality of sampling points to form a sampling point matrix on a sediment area to be monitored; on each sampling point, recording the resistivity of each step distance in the process by an electric sounding method, and calculating the sediment thickness corresponding to each sampling point;
Comparing the resistance long sheet values according to the resistivity vectors corresponding to the sampling points on the diagonal line of the sampling point square matrix, forming a resistance long Zhang Juzhen by using the resistance length Zhang Zhi of each sampling point, calculating the resistance long sheet characteristics of the resistance long Zhang Juzhen, selecting a long Zhang Tezheng-dimensional serial number from the resistance long sheet characteristics, obtaining the average thickness of long characteristic lines and the average thickness of long characteristic columns by using the long Zhang Tezheng-dimensional serial number, forming a long thickness interval by using the average thickness of the long characteristic lines and the average thickness of the long characteristic columns, and obtaining the corrected sediment thickness from the long thickness interval, wherein the method comprises the following steps of:
Selecting resistivity vectors corresponding to sampling points on diagonal lines of a sampling point matrix, respectively calculating the product of the resistivity vectors corresponding to the sampling points in the sampling point matrix and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines, and taking the arithmetic average value of the product of the resistivity vector of each sampling point and the cross multiplication of the resistivity vectors corresponding to the sampling points on the diagonal lines as the resistance length Zhang Zhi of the sampling point;
Taking a matrix formed by the resistance long-sheet values of each sampling point in the sampling point square matrix as a resistance length Zhang Juzhen, and calculating a unit characteristic vector of the resistance long-sheet matrix as a resistance long-sheet characteristic;
Acquiring a sequence number of a dimension where an element with the largest numerical value in the resistor long-sheet characteristic is located as a long Zhang Tezheng-dimensional sequence number, acquiring a row with a row sequence number corresponding to the long Zhang Tezheng-dimensional sequence number in a sampling point square matrix as a long-sheet characteristic row, and acquiring a column with a column sequence number corresponding to the long Zhang Tezheng-dimensional sequence number in the sampling point square matrix as a long Zhang Tezheng column;
Calculating an average value of sediment thicknesses corresponding to sampling points on the long characteristic row to be used as the average thickness of the long characteristic row, and calculating an average value of sediment thicknesses corresponding to sampling points on the long characteristic row to be used as the average thickness of the long characteristic row;
selecting the largest numerical value from the average thickness of the long characteristic row and the average thickness of the long characteristic column as the upper bound of the long thickness, selecting the smallest numerical value as the lower bound of the long thickness, and using the numerical range from the lower bound of the long thickness to the upper bound of the long thickness as the long thickness interval;
And calculating the corrected sediment thickness from the long-sheet thickness interval according to the sediment thickness corresponding to the sampling points on the long-sheet characteristic row and the probability distribution of the sediment thickness corresponding to the sampling points on the long-sheet characteristic row.
2. The method according to claim 1, wherein a rectangular area is selected on the sediment area to be monitored and a plurality of different sampling points are selected therefrom to form a square matrix as the sampling point square matrix.
3. The electronic calculation method of the direct insert type sediment thickness according to claim 1, wherein the resistivity of each step distance in the recording process is recorded on each sampling point by an electric sounding method, and the sediment thickness of the pile bottom corresponding to each sampling point is calculated specifically as follows: and respectively drawing upwards at preset steps from the bottom of the sediment by using a resistance probe on each sampling point according to an electric sounding method, and recording the resistivity of each step in the drawing process so as to detect the sediment thickness corresponding to each sampling point.
4. An in-line sediment thickness electronic calculating method according to claim 3, wherein the sediment is gradually pulled up from the bottom of sediment with equal steps, the steps used by each sampling point are kept consistent, and the array of the resistivity values of each step corresponding to each sampling point is used as the resistivity vector corresponding to the sampling point.
5. The method according to claim 1, wherein the median of the long thickness section is selected as the corrected sediment thickness from the long thickness section.
6. An in-line sediment thickness electronic computing system, wherein the in-line sediment thickness electronic computing system is operated in any computing device of a desktop computer, a notebook computer or a cloud data center, the computing device comprising: a processor, a memory and a computer program stored in the memory and running on the processor, which processor, when executing the computer program, implements the steps of an in-line sediment thickness electronic calculation method as defined in any one of claims 1 to 5.
7. An electronic device, comprising: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1 to 5.
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| CN110513105A (en) * | 2019-07-30 | 2019-11-29 | 中国石油天然气集团有限公司 | A kind of cubical array induction logging instrument data processing system and method |
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| US20190390949A1 (en) * | 2018-06-21 | 2019-12-26 | Applied Materials, Inc. | Methods, apparatuses and systems for conductive film layer thickness measurements |
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| CN113670185B (en) * | 2020-05-13 | 2024-05-17 | 南京铭创测控科技有限公司 | Resistance type sediment thickness measurement system |
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| CN110513105A (en) * | 2019-07-30 | 2019-11-29 | 中国石油天然气集团有限公司 | A kind of cubical array induction logging instrument data processing system and method |
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