[go: up one dir, main page]

CN118335583A - Air intake device and semiconductor processing equipment including the same - Google Patents

Air intake device and semiconductor processing equipment including the same Download PDF

Info

Publication number
CN118335583A
CN118335583A CN202410421487.4A CN202410421487A CN118335583A CN 118335583 A CN118335583 A CN 118335583A CN 202410421487 A CN202410421487 A CN 202410421487A CN 118335583 A CN118335583 A CN 118335583A
Authority
CN
China
Prior art keywords
channel
gas
pipe
reaction chamber
air intake
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202410421487.4A
Other languages
Chinese (zh)
Other versions
CN118335583B (en
Inventor
沈康
吴磊
涂乐义
梁洁
王兆祥
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Nippon Semiconductor Equipment Co ltd
Original Assignee
Shanghai Nippon Semiconductor Equipment Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Nippon Semiconductor Equipment Co ltd filed Critical Shanghai Nippon Semiconductor Equipment Co ltd
Priority to CN202410421487.4A priority Critical patent/CN118335583B/en
Publication of CN118335583A publication Critical patent/CN118335583A/en
Application granted granted Critical
Publication of CN118335583B publication Critical patent/CN118335583B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45574Nozzles for more than one gas
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • H01J37/32449Gas control, e.g. control of the gas flow

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)

Abstract

本申请实施例涉及半导体加工技术领域,特别涉及一种进气装置及包含该装置的半导体加工设备。其中的进气装置包括第一管道、第二管道和流通结构。第一管道具有供第一类气体流通的第一通道;第二管道,沿第一管道的轴线方向进入第一通道内、并在第一通道内同轴延伸,第二管道具有供第二类气体流通的第二通道,第二通道的末端邻近第一通道的端部设置;流通结构,设置在第二管道上并位于第一通道内,流通结构具有均匀环绕第二管道轴向设置、且朝向与第二管道轴向形成第一预设角度的多个第一气体通道。本申请实施方式提供的进气装置及包含该装置的半导体加工设备,能够在多种气体无预混的情况下,实现多路气体的均匀进气。

The embodiments of the present application relate to the field of semiconductor processing technology, and in particular to an air intake device and semiconductor processing equipment including the device. The air intake device includes a first pipe, a second pipe and a circulation structure. The first pipe has a first channel for the circulation of a first type of gas; the second pipe enters the first channel along the axial direction of the first pipe and extends coaxially in the first channel, the second pipe has a second channel for the circulation of a second type of gas, and the end of the second channel is arranged adjacent to the end of the first channel; the circulation structure is arranged on the second pipe and located in the first channel, and the circulation structure has a plurality of first gas channels that are uniformly arranged around the axial direction of the second pipe and face the axial direction of the second pipe to form a first preset angle. The air intake device and semiconductor processing equipment including the device provided in the embodiments of the present application can achieve uniform air intake of multiple gases without premixing of multiple gases.

Description

一种进气装置及包含该装置的半导体加工设备Air intake device and semiconductor processing equipment including the same

技术领域Technical Field

本申请实施例涉及半导体加工技术领域,特别涉及一种进气装置及包含该装置的半导体加工设备。The embodiments of the present application relate to the field of semiconductor processing technology, and in particular, to an air intake device and semiconductor processing equipment including the same.

背景技术Background technique

在半导体薄膜沉积、等离子刻蚀、等离子去胶等半导体加工设备的加工过程中,为了适应反应工艺需要,需要采用多类工艺气体。不同类工艺气体一起进入反应腔腔室内参与反应。而不同类工艺气体通常会预先混合形成混合气体,再通入反应腔腔室。也就是说,多类工艺气体通常会进行预混。但一些工艺气体在预混后由于长时间混合在一起,易发生反应凝结,在管道中生成颗粒物,影响加工工艺。In the processing of semiconductor processing equipment such as semiconductor thin film deposition, plasma etching, and plasma stripping, multiple types of process gases are required to meet the needs of the reaction process. Different types of process gases enter the reaction chamber together to participate in the reaction. Different types of process gases are usually pre-mixed to form a mixed gas, and then introduced into the reaction chamber. In other words, multiple types of process gases are usually pre-mixed. However, some process gases are easily reacted and condensed due to being mixed together for a long time after being pre-mixed, and particulate matter is generated in the pipeline, affecting the processing technology.

但是,不同类工艺气体在无预混的情况下通入反应腔腔室,又会产生进气不均匀的问题,从而对反应效率、产品质量和生产效率产生负面影响。因此,如何在多种气体无预混的情况下,实现多路气体的均匀进气,仍然是一个重要的问题。However, when different types of process gases are introduced into the reaction chamber without premixing, uneven gas intake will occur, which will have a negative impact on reaction efficiency, product quality and production efficiency. Therefore, how to achieve uniform gas intake of multiple gases without premixing is still an important issue.

发明内容Summary of the invention

本申请实施方式的目的在于提供一种进气装置及包含该装置的半导体加工设备,能够在多种气体无预混的情况下,实现多路气体的均匀进气。The purpose of the embodiments of the present application is to provide an air intake device and a semiconductor processing equipment comprising the device, which can achieve uniform air intake of multiple gases without premixing of multiple gases.

为解决上述技术问题,本申请的实施方式提供了一种用于向反应腔中通入工艺气体的进气装置,进气装置包括第一管道、第二管道和流通结构。第一管道具有供第一类气体流通的第一通道;第二管道,沿第一管道的轴线方向进入第一通道内、并在第一通道内同轴延伸,第二管道具有供第二类气体流通的第二通道,第二通道的末端邻近第一通道的端部设置;流通结构,设置在第二管道上并位于第一通道内,流通结构具有均匀环绕第二管道轴向设置、且朝向与第二管道轴向形成第一预设角度的多个第一气体通道,第一通道和第二通道二者中的一者的端部用于连通反应腔的进气口,且另一者内流通的气体经由流通结构沿与第二管道轴向形成第一预设角度的方向进入与反应腔的进气口连通的一者中,使二者内流通的气体共同进入反应腔的进气口,流通结构在气体的流动路径上邻近反应腔的进气口设置。In order to solve the above technical problems, the embodiment of the present application provides an air intake device for introducing process gas into a reaction chamber, the air intake device comprising a first pipeline, a second pipeline and a circulation structure. The first pipeline has a first channel for the circulation of a first type of gas; the second pipeline enters the first channel along the axial direction of the first pipeline and extends coaxially in the first channel, the second pipeline has a second channel for the circulation of a second type of gas, and the end of the second channel is arranged adjacent to the end of the first channel; the circulation structure is arranged on the second pipeline and located in the first channel, the circulation structure has a plurality of first gas channels uniformly arranged around the axial direction of the second pipeline and facing the axial direction of the second pipeline to form a first preset angle, the end of one of the first channel and the second channel is used to connect to the air inlet of the reaction chamber, and the gas circulating in the other enters the one connected to the air inlet of the reaction chamber through the circulation structure along the direction forming the first preset angle with the axial direction of the second pipeline, so that the gas circulating in the two enters the air inlet of the reaction chamber together, and the circulation structure is arranged adjacent to the air inlet of the reaction chamber on the flow path of the gas.

在一些实施方式中,第一管道设置有第一进气口,第一进气口位于第一通道远离流通结构的端部处,第一进气口用于连接供应第一类气体的第一气源;和/或第二进气口位于第二通道远离反应腔的进气口的端部处,第二进气口用于连接供应第二类气体的第二气源。In some embodiments, the first pipeline is provided with a first gas inlet, the first gas inlet is located at the end of the first channel away from the circulation structure, and the first gas inlet is used to connect to a first gas source supplying a first type of gas; and/or the second gas inlet is located at the end of the second channel away from the gas inlet of the reaction chamber, and the second gas inlet is used to connect to a second gas source supplying a second type of gas.

在一些实施方式中,第一通道与第二通道二者中与反应腔的进气口连通的一者末端设有喷头,喷头具有环绕第一管道轴向设置、且朝向与第一管道轴向形成第二预设角度的多个第二气体通道,第一通道与第二通道内流通的气体经由第二气体通道沿与第一管道轴向形成第二预设角度的方向共同进入反应腔。In some embodiments, a nozzle is provided at the end of one of the first channel and the second channel that is connected to the air inlet of the reaction chamber, and the nozzle has a plurality of second gas channels that are arranged axially around the first pipeline and face the first pipeline to form a second preset angle with the axis of the first pipeline. The gases flowing in the first channel and the second channel enter the reaction chamber together through the second gas channels in a direction that forms a second preset angle with the axis of the first pipeline.

在一些实施方式中,喷头呈中空的圆台状,喷头与第一管道同轴,喷头横截面较小的一端朝向反应腔内部,第二气体通道设置在喷头的侧面上。In some embodiments, the nozzle is in a hollow frustum shape, the nozzle is coaxial with the first pipe, the end of the nozzle with a smaller cross section faces the inside of the reaction chamber, and the second gas channel is arranged on the side of the nozzle.

在一些实施方式中,喷头横截面较小的一端端面还均匀设有朝向气体喷淋头的多个第三气体通道。In some embodiments, a plurality of third gas channels facing the gas shower head are evenly disposed on the end surface of the shower head with a smaller cross section.

在一些实施方式中,在与第二管道轴向形成第二预设角度的方向上,第一气体通道与第二气体通道错开设置。In some embodiments, the first gas channel and the second gas channel are staggered in a direction forming a second preset angle with the axial direction of the second pipe.

在一些实施方式中,第一预设角度与第二预设角度的角度大小不同。In some embodiments, the first preset angle and the second preset angle are different in size.

在一些实施方式中,多个第一气体通道分布在多个垂直于第一管道的轴线的平面上,位于相邻两个平面上的第一气体通道在第一管道的轴线方向上等距设置;和/或多个第二气体通道分布在多个垂直于第一管道的轴线的平面上,位于相邻两个平面上的第二气体通道在第一管道的轴线方向上等距设置。In some embodiments, multiple first gas channels are distributed on multiple planes perpendicular to the axis of the first pipeline, and the first gas channels located on two adjacent planes are equidistantly arranged in the axial direction of the first pipeline; and/or multiple second gas channels are distributed on multiple planes perpendicular to the axis of the first pipeline, and the second gas channels located on two adjacent planes are equidistantly arranged in the axial direction of the first pipeline.

在一些实施方式中,第一通道设置成平直状,或者第一通道设置成弯折状。In some embodiments, the first channel is configured to be straight, or the first channel is configured to be bent.

在一些实施方式中,第一通道设置成平直状,第二通道的末端位于第一通道内,流通结构设置在第二通道的末端。In some embodiments, the first channel is configured to be straight, an end of the second channel is located in the first channel, and the flow structure is disposed at the end of the second channel.

在一些实施方式中,第一通道设置成平直状,第二通道的末端位于第一通道外,流通结构设置在第二通道远离反应腔的进气口位置处。In some embodiments, the first channel is arranged to be straight, the end of the second channel is located outside the first channel, and the flow structure is arranged at a position of the second channel away from the gas inlet of the reaction chamber.

在一些实施方式中,第一通道内设有环绕第二管道、且位于第一通道进气路径上的板状结构,板状结构从第二管道的管壁外侧向第一管道的管壁内侧延伸,板状结构与第一管道的管壁内侧之间具有间隔。In some embodiments, a plate-like structure is provided in the first channel, surrounding the second pipe and located on the air intake path of the first channel. The plate-like structure extends from the outer side of the pipe wall of the second pipe to the inner side of the pipe wall of the first pipe, and there is a gap between the plate-like structure and the inner side of the pipe wall of the first pipe.

本申请的实施方式还提供了一种半导体加工设备,半导体加工设备包括具有进气口的反应腔,还包括上述的进气装置,进气装置的第一通道和第二通道二者中的一者的端部与反应腔的进气口连通。An embodiment of the present application also provides a semiconductor processing device, which includes a reaction chamber having an air inlet, and also includes the above-mentioned air inlet device, wherein an end of one of the first channel and the second channel of the air inlet device is connected to the air inlet of the reaction chamber.

本申请的实施方式提供的一种进气装置,采用中心管和外管的嵌套设计来实现两路气体的进气,两个管道同轴设置。第一类气体在中心管外的第一通道内流通,第二类气体在中间管与外管之间的通道内流动。流通结构设置在中心管上,两类气体经过邻近反应腔进气口的流通结构后在中心管或者外管中共同进入反应腔进气口。具体来说,中心管或外管中的一根管道的一端与反应腔的进气口相连接,而另一根管道中的气体则通过流通结构流入与反应腔进气口相连的管道,两类气体发生混合的同时进入反应腔的进气口。该装置对两类气体进行无预混的进气,以避免产生颗粒物。两路气体从反应腔的同一进气口进入反应腔,实现中心对称进气,使两路气体进入反应腔内时的分布量均匀。从而能够在多种气体无预混的情况下,实现多路气体的均匀进气。The embodiment of the present application provides an air intake device, which adopts a nested design of a central tube and an outer tube to realize the air intake of two gases, and the two pipes are coaxially arranged. The first type of gas circulates in the first channel outside the central tube, and the second type of gas flows in the channel between the intermediate tube and the outer tube. The circulation structure is arranged on the central tube, and the two types of gases enter the air inlet of the reaction chamber together in the central tube or the outer tube after passing through the circulation structure adjacent to the air inlet of the reaction chamber. Specifically, one end of a pipe in the central tube or the outer tube is connected to the air inlet of the reaction chamber, and the gas in the other pipe flows into the pipe connected to the air inlet of the reaction chamber through the circulation structure, and the two types of gases mix and enter the air inlet of the reaction chamber at the same time. The device performs non-premixed air intake for the two types of gases to avoid the generation of particulate matter. The two gases enter the reaction chamber from the same air inlet of the reaction chamber to achieve central symmetrical air intake, so that the distribution amount of the two gases when entering the reaction chamber is uniform. Thereby, uniform air intake of multiple gases can be achieved without premixing of multiple gases.

本申请的实施方式提供的一种半导体加工设备,采用具有嵌套管路设计的进气装置,使得多路气体能够以中心对称的形式进入反应腔,提高半导体加工过程中的气体分布均匀性,从而提升最终产品的质量。A semiconductor processing device provided in an embodiment of the present application adopts an air intake device with a nested pipeline design, so that multiple gases can enter the reaction chamber in a centrally symmetrical form, thereby improving the uniformity of gas distribution during the semiconductor processing process, thereby improving the quality of the final product.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

一个或多个实施例通过与之对应的附图中的图片进行示例性说明,这些示例性说明并不构成对实施例的限定,附图中具有相同参考数字标号的元件表示为类似的元件,除非有特别申明,附图中的图不构成比例限制。One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

图1是本申请一些实施例提供的一种进气装置的结构示意图;FIG1 is a schematic structural diagram of an air intake device provided in some embodiments of the present application;

图2是本申请一些实施例提供的另一种进气装置的结构示意图;FIG2 is a schematic structural diagram of another air intake device provided in some embodiments of the present application;

图3是本申请一些实施例提供的又一种进气装置的结构示意图;FIG3 is a schematic structural diagram of another air intake device provided in some embodiments of the present application;

图4是本申请一些实施例提供的半导体加工设备的结构示意图。FIG. 4 is a schematic diagram of the structure of semiconductor processing equipment provided in some embodiments of the present application.

具体实施方式Detailed ways

为使本申请实施例的目的、技术方案和优点更加清楚,下面将结合附图对本申请的各实施方式进行详细的阐述。然而,本领域的普通技术人员可以理解,在本申请各实施方式中,为了使读者更好地理解本申请而提出了许多技术细节。但是,即使没有这些技术细节和基于以下各实施方式的种种变化和修改,也可以实现本申请所要求保护的技术方案。以下各个实施例的划分是为了描述方便,不应对本申请的具体实现方式构成任何限定,各个实施例在不矛盾的前提下可以相互结合相互引用。To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, each embodiment of the present application will be described in detail below in conjunction with the accompanying drawings. However, it will be appreciated by those skilled in the art that in each embodiment of the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed in the present application can also be implemented. The division of the following embodiments is for convenience of description, and the specific implementation of the present application should not constitute any limitation, and the various embodiments can be combined with each other and referenced to each other under the premise of no contradiction.

除非另有定义,本文所使用的所有的技术和科学术语与属于本申请的技术领域的技术人员通常理解的含义相同;本文中所使用的术语只是为了描述具体的实施例的目的,不是旨在限制本申请;本申请的说明书和权利要求书及上述附图说明中的术语“包括”和“具有”以及它们的任何变形,意图在于覆盖不排他的包含。Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

在本申请实施例的描述中,技术术语“第一”“第二”等仅用于区别不同对象,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量、特定顺序或主次关系。在本申请实施例的描述中,“多个”的含义是两个以上,除非另有明确具体的限定。In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

在本申请实施例的描述中,术语“和/或”仅仅是一种描述关联对象的关联关系,表示可以存在三种关系,例如A和/或B,可以表示:单独存在A,同时存在A和B,单独存在B这三种情况。另外,本文中字符“/”,一般表示前后关联对象是一种“或”的关系。In the description of the embodiments of the present application, the term "and/or" is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and/or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character "/" in this article generally indicates that the associated objects before and after are in an "or" relationship.

在半导体设备加工过程中,通常需要使气体均匀进入反应腔进行化学反应。然而,在无预混情况下的多路进气往往导致不同管路的气体从反应腔的不同位置进入,多路气体无法做到同时自反应腔顶部中心的进气口进入。也就无法确保多路气体在进入反应腔时的进气均匀性,从而在反应过程中产生局部偏差,导致部分产品的性能不稳定或不符合规格要求,影响产品的均匀性和一致性。During the processing of semiconductor equipment, it is usually necessary to make the gas enter the reaction chamber evenly for chemical reaction. However, multi-channel gas intake without premixing often causes gases from different pipelines to enter the reaction chamber from different positions, and multiple gases cannot enter from the gas inlet at the top center of the reaction chamber at the same time. It is also impossible to ensure the uniformity of the gas intake when entering the reaction chamber, resulting in local deviations during the reaction process, causing the performance of some products to be unstable or not meet the specification requirements, affecting the uniformity and consistency of the products.

在现有半导体加工设备中,通常会将多种不同的工艺气体预先混合,并通过反应腔顶部中心的进气口引入反应腔内。这一过程采用了气体混合装置来确保各种气体的均匀预混。预混后的气体通过位于反应腔顶部中心的进气通道,流入反应腔腔室内,进而到达载物台的基片所在区域,参与反应。最终反应生成物被抽出反应腔腔室。在这种进气方式下,混合后的气体虽然能够从反应腔顶部中心实现均匀进气,但是一些工艺气体在预混时由于长时间混合在一起而发生反应凝结现象,会在管道中生成颗粒物,影响加工工艺。In existing semiconductor processing equipment, a variety of different process gases are usually pre-mixed and introduced into the reaction chamber through the air inlet at the top center of the reaction chamber. This process uses a gas mixing device to ensure uniform premixing of various gases. The premixed gas flows into the reaction chamber through the air inlet channel located at the top center of the reaction chamber, and then reaches the area where the substrate on the stage is located to participate in the reaction. Finally, the reaction products are extracted from the reaction chamber. Under this air intake method, although the mixed gas can be evenly inhaled from the top center of the reaction chamber, some process gases react and condense due to long-term mixing during premixing, which will generate particulate matter in the pipeline and affect the processing technology.

为此,本申请一些实施例提供了一种半导体加工设备,在进气端设计进气装置,进气装置采用中心管和外管的嵌套设计。一路气体从中心管进入,另一路气体从中心管和外管之间进入,中心管上设置有邻近反应腔进气口的流通结构,通过流通结构确保两路气体共同进入反应腔的进气口,实现中心对称进气,使两路气体进入反应腔内时的分布量均匀。从而能够在多种气体无预混的情况下,实现多路气体的均匀进气。To this end, some embodiments of the present application provide a semiconductor processing device, in which an air intake device is designed at the air intake end, and the air intake device adopts a nested design of a central tube and an outer tube. One gas enters from the central tube, and the other gas enters from between the central tube and the outer tube. The central tube is provided with a flow structure adjacent to the air inlet of the reaction chamber. The flow structure ensures that the two gases enter the air inlet of the reaction chamber together, realizing central symmetrical air intake, so that the distribution of the two gases when entering the reaction chamber is uniform. In this way, uniform air intake of multiple gases can be achieved without premixing of multiple gases.

下面结合图1至图3,说明本申请一些实施例提供的半导体加工设备中进气装置的结构,进气装置用于向反应腔中通入工艺气体。1 to 3 , the structure of a gas inlet device in a semiconductor processing device provided in some embodiments of the present application is described below. The gas inlet device is used to introduce process gas into a reaction chamber.

如图1至图3所示,本申请一些实施例提供的一种进气装置包括第一管道10、第二管道20和流通结构30。第一管道10具有供第一类气体流通的第一通道;第二管道20,沿第一管道10的轴线方向进入第一通道内、并在第一通道内同轴延伸,第二管道20具有供第二类气体流通的第二通道,第二通道的末端邻近第一通道的端部设置;流通结构30,设置在第二管道20上并位于第一通道内,流通结构30具有均匀环绕第二管道20轴向设置、且朝向与第二管道20轴向形成第一预设角度的多个第一气体通道31,第一通道和第二通道二者中的一者的端部用于连通反应腔40(图4所示)的进气口,且另一者内流通的气体经由流通结构30沿与第二管道20轴向形成第一预设角度的方向进入与反应腔40的进气口连通的一者中,使二者内流通的气体共同进入反应腔40的进气口,流通结构30在气体的流动路径上邻近反应腔40的进气口设置。As shown in FIG. 1 to FIG. 3 , some embodiments of the present application provide an air intake device including a first pipe 10 , a second pipe 20 and a flow structure 30 . The first pipe 10 has a first channel for the circulation of a first type of gas; the second pipe 20 enters the first channel along the axial direction of the first pipe 10 and extends coaxially in the first channel, the second pipe 20 has a second channel for the circulation of a second type of gas, and the end of the second channel is arranged adjacent to the end of the first channel; the circulation structure 30 is arranged on the second pipe 20 and located in the first channel, the circulation structure 30 has a plurality of first gas channels 31 that are evenly arranged around the axial direction of the second pipe 20 and face the axial direction of the second pipe 20 to form a first preset angle, the end of one of the first channel and the second channel is used to connect to the air inlet of the reaction chamber 40 (as shown in FIG. 4), and the gas circulating in the other enters the one connected to the air inlet of the reaction chamber 40 through the circulation structure 30 along the direction forming the first preset angle with the axial direction of the second pipe 20, so that the gases circulating in the two enter the air inlet of the reaction chamber 40 together, and the circulation structure 30 is arranged adjacent to the air inlet of the reaction chamber 40 on the flow path of the gas.

第一管道10与第二管道20在向反应腔40内通气时供应不同气体,流通结构30可以连通第一管道10的第一通道与第二管道20的第二通道,使二者内流通的气体能够从一处引入反应腔40内部。也就是说,在第二通道与反应腔40的进气口连通时,第一通道中的第一类气体可以通过多个第一气体通道31进入第二通道中,进而共同进入反应腔40内。或者,在第一通道与反应腔40的进气口连通时,第二通道中的第二类气体可以通过多个第一气体通道31进入第一通道中,进而共同进入反应腔40内。第一气体通道31均匀分布,气体流经多个第一气体通道31时,能够以多股气流均匀地进入另一通道。当多股气流沿与第一管道10轴向形成第一预设角度的方向进入另一通道时,会与另一类气体发生碰撞混合。The first pipe 10 and the second pipe 20 supply different gases when ventilating the reaction chamber 40. The circulation structure 30 can connect the first channel of the first pipe 10 and the second channel of the second pipe 20, so that the gases circulating in the two can be introduced into the reaction chamber 40 from one place. That is to say, when the second channel is connected to the air inlet of the reaction chamber 40, the first type of gas in the first channel can enter the second channel through the multiple first gas channels 31, and then enter the reaction chamber 40 together. Alternatively, when the first channel is connected to the air inlet of the reaction chamber 40, the second type of gas in the second channel can enter the first channel through the multiple first gas channels 31, and then enter the reaction chamber 40 together. The first gas channels 31 are evenly distributed, and when the gas flows through the multiple first gas channels 31, it can enter another channel evenly with multiple gas flows. When the multiple gas flows enter another channel along the direction forming a first preset angle with the axial direction of the first pipe 10, they will collide and mix with the other type of gas.

通过将流通结构30在气体的流动路径上邻近反应腔的进气口设置,缩短了多路气体共同进入反应腔进气口的时间和距离,进而在第一类气体和第二类气体发生混合的同时,一起从反应腔40的进气口均匀进入反应腔40。By arranging the circulation structure 30 adjacent to the air inlet of the reaction chamber on the gas flow path, the time and distance for multiple gases to enter the air inlet of the reaction chamber together are shortened, so that the first gas and the second gas are mixed and enter the reaction chamber 40 evenly from the air inlet of the reaction chamber 40 together.

两路气体在分别进入第一管道10与第二管道20后,在各自的管道通道内流动。如图1所示,在第一管道10的第一通道内流通的气体沿图1中虚线箭头所示方向流动。在第二管道20的第二通道内流通的气体沿图1中实线箭头所示方向流动,最终通过流通结构30进入第一管道10的第一通道内,与第一管道10内第一类气体在进气端发生混合。并共同自反应腔40的进气口进入而到达承载结构41的基片42所在区域,参与反应过程。After entering the first pipeline 10 and the second pipeline 20 respectively, the two gases flow in their respective pipeline channels. As shown in FIG1 , the gas flowing in the first channel of the first pipeline 10 flows in the direction indicated by the dotted arrow in FIG1 . The gas flowing in the second channel of the second pipeline 20 flows in the direction indicated by the solid arrow in FIG1 , and finally enters the first channel of the first pipeline 10 through the circulation structure 30, and mixes with the first type of gas in the first pipeline 10 at the air inlet end. They enter together from the air inlet of the reaction chamber 40 and reach the area where the substrate 42 of the supporting structure 41 is located, and participate in the reaction process.

或者如图2所示,在第一管道10的第一通道内流通的气体沿图2中虚线箭头所示方向流动。在第二管道20的第二通道内流通的气体沿图2中实线箭头所示方向流动。最终第一管道10的第一通道内流通的气体通过流通结构30进入第二管道20的第二通道内,与第二管道20内第二类气体发生混合。并共同自反应腔40的进气口进入而到达承载结构41的基片42所在区域,参与反应过程。与图1不同的是,图2中进气时的混气区域更大,混气路径更长,可以根据实际情况进行选取。Or as shown in FIG2 , the gas flowing in the first channel of the first pipe 10 flows in the direction indicated by the dotted arrow in FIG2 . The gas flowing in the second channel of the second pipe 20 flows in the direction indicated by the solid arrow in FIG2 . Finally, the gas flowing in the first channel of the first pipe 10 enters the second channel of the second pipe 20 through the circulation structure 30 and mixes with the second type of gas in the second pipe 20 . And they enter together from the air inlet of the reaction chamber 40 and reach the area where the substrate 42 of the supporting structure 41 is located to participate in the reaction process. Unlike FIG1 , the gas mixing area during air intake in FIG2 is larger and the gas mixing path is longer, which can be selected according to actual conditions.

本申请一些实施例提供的进气装置,采用第一管道10和第二管道20的嵌套设计来实现两路气体的进气,两个管道同轴设置。第一类气体在第二管道20外的第一通道内流通,第二类气体在第二管道20与第一管道10之间的通道内流动。流通结构30设置在第二管道20上,两类气体经过流通结构30后在第二管道20或者第一管道10中共同进入反应腔40的进气口。具体来说,第二管道20或第一管道10中的一根管道的一端与反应腔40的进气口相连接,而另一根管道中的气体则通过邻近反应腔40的进气口的流通结构30流入与反应腔40进气口相连的管道,两类气体共同进入反应腔40的进气口。该装置对两类气体进行无预混的进气,以避免产生颗粒物。两路气体从反应腔的同一进气口进入反应腔,实现中心对称进气,使两路气体进入反应腔内时的分布量均匀。从而能够在多种气体无预混的情况下,实现多路气体的均匀进气。The air intake device provided in some embodiments of the present application adopts a nested design of a first pipe 10 and a second pipe 20 to realize the air intake of two gases, and the two pipes are coaxially arranged. The first type of gas circulates in the first channel outside the second pipe 20, and the second type of gas flows in the channel between the second pipe 20 and the first pipe 10. The circulation structure 30 is arranged on the second pipe 20, and the two types of gases enter the air inlet of the reaction chamber 40 together in the second pipe 20 or the first pipe 10 after passing through the circulation structure 30. Specifically, one end of one of the second pipe 20 or the first pipe 10 is connected to the air inlet of the reaction chamber 40, and the gas in the other pipe flows into the pipe connected to the air inlet of the reaction chamber 40 through the circulation structure 30 adjacent to the air inlet of the reaction chamber 40, and the two types of gases enter the air inlet of the reaction chamber 40 together. The device performs non-premixed air intake for the two types of gases to avoid the generation of particulate matter. The two types of gases enter the reaction chamber from the same air inlet of the reaction chamber to achieve central symmetrical air intake, so that the distribution amount of the two types of gases when entering the reaction chamber is uniform. Therefore, uniform intake of multiple gases can be achieved without premixing of multiple gases.

可以理解的是,图1和图2中仅以两路气体的进气作为示意。在具有两路以上的气体进气时,可以在管道中嵌套更多的管道,来实现更多不同气体的均匀进气。It is understandable that only two gas intakes are used as illustrations in Figures 1 and 2. When there are more than two gas intakes, more pipes can be nested in the pipe to achieve uniform intake of more different gases.

在一些实施例中,第一管道10可以设置有第一进气口,第一进气口位于第一通道远离流通结构30的端部处,第一进气口用于连接供应第一类气体的第一气源Gas 1;和/或第二管道20可以设置有第二进气口,第二进气口位于第二通道远离反应腔40的进气口的端部处,第二进气口用于连接供应第二类气体的第二气源Gas 2。In some embodiments, the first pipeline 10 may be provided with a first gas inlet, which is located at the end of the first channel away from the circulation structure 30, and the first gas inlet is used to connect to a first gas source Gas 1 that supplies a first type of gas; and/or the second pipeline 20 may be provided with a second gas inlet, which is located at the end of the second channel away from the gas inlet of the reaction chamber 40, and the second gas inlet is used to connect to a second gas source Gas 2 that supplies a second type of gas.

第一进气口可以设在位于第一通道远离流通结构30的端部处,用于连接供应第一类气体的第一气源Gas 1。第一进气口也可以设在邻近第一通道远离流通结构30的端部处的管壁上,使第一类气体顺着第一通道的起始端流向第一通道的末端。在如图1所示情形中,也可以将第一进气口设置在靠近流通结构30的位置处,这样可以减少流动路径长度。The first gas inlet can be arranged at the end of the first channel away from the circulation structure 30, for connecting the first gas source Gas 1 that supplies the first type of gas. The first gas inlet can also be arranged on the tube wall adjacent to the end of the first channel away from the circulation structure 30, so that the first type of gas flows along the starting end of the first channel to the end of the first channel. In the case shown in FIG. 1, the first gas inlet can also be arranged at a position close to the circulation structure 30, so that the flow path length can be reduced.

第二进气口可以设在位于第二通道远离反应腔40的进气口的端部处,用于连接供应第二类气体的第二气源Gas 2。第二进气口也可以设在邻近第二通道远离反应腔40的进气口的端部处的管壁上,使第二类气体沿着第二通道的起始端流向第二通道的末端。The second gas inlet may be provided at the end of the second channel away from the gas inlet of the reaction chamber 40, for connecting to the second gas source Gas 2 for supplying the second type of gas. The second gas inlet may also be provided on the tube wall adjacent to the end of the second channel away from the gas inlet of the reaction chamber 40, so that the second type of gas flows along the starting end of the second channel to the end of the second channel.

在一些实施例中,第一通道与第二通道二者中与反应腔40的进气口连通的一者末端可以设有喷头50,喷头50具有环绕第一管道10轴向设置、且朝向与第一管道10轴向形成第二预设角度的多个第二气体通道51,第一通道与第二通道内流通的气体经由第二气体通道51沿与第一管道10轴向形成第二预设角度的方向共同进入反应腔40。In some embodiments, a nozzle 50 may be provided at the end of one of the first channel and the second channel that is connected to the gas inlet of the reaction chamber 40. The nozzle 50 has a plurality of second gas channels 51 that are arranged axially around the first pipe 10 and face the first pipe 10 to form a second preset angle with the axis. The gases flowing in the first channel and the second channel enter the reaction chamber 40 together through the second gas channels 51 along the direction forming the second preset angle with the axis of the first pipe 10.

具体来说,第一通道与第二通道中与反应腔40的进气口连通的一个,其末端可以通过喷头50向反应腔40内通入气体。喷头50具有多个第二气体通道51,这些通道环绕第一管道10的轴向设置,并且每个通道的开口都朝向与第一管道10轴向形成第二预设角度的方向。Specifically, one of the first channel and the second channel that is connected to the gas inlet of the reaction chamber 40 can have its end introduced into the reaction chamber 40 through the nozzle 50. The nozzle 50 has a plurality of second gas channels 51, which are arranged around the axial direction of the first pipe 10, and the opening of each channel faces the direction forming a second preset angle with the axial direction of the first pipe 10.

当第一通道与第二通道内的气体共同进入反应腔40进气口时会经过第二气体通道51。由于这些通道的方向与第一管道10的轴向存在第二预设角度,因此两路气体可以沿这个特定的角度进入反应腔40腔室内,有利于在反应腔内实现更均匀的气体分布,提高反应的效率。最终两路气体通过气体喷淋头43均匀喷洒到基片42所在区域,完成所需的反应过程。When the gases in the first channel and the second channel enter the gas inlet of the reaction chamber 40 together, they will pass through the second gas channel 51. Since the directions of these channels are at a second preset angle with the axial direction of the first pipe 10, the two gases can enter the reaction chamber 40 along this specific angle, which is conducive to achieving more uniform gas distribution in the reaction chamber and improving the efficiency of the reaction. Finally, the two gases are evenly sprayed to the area where the substrate 42 is located through the gas shower head 43 to complete the required reaction process.

实际情形中,喷头50可以呈中空的圆台状,喷头50与第一管道10同轴,喷头50横截面较小的一端朝向反应腔40内部,第二气体通道51设置在喷头50的侧面上。In actual situations, the nozzle 50 may be in the shape of a hollow truncated cone. The nozzle 50 is coaxial with the first pipe 10 , and the end of the nozzle 50 with a smaller cross section faces the inside of the reaction chamber 40 . The second gas channel 51 is arranged on the side of the nozzle 50 .

喷头50可以设置在反应腔40的顶部中心位置。喷头50横截面较大的一端可以与第一管道10或第二管道20的末端连接,也就是说,喷头50可以通过其中空结构从第一管道10或第二管道20中引入气体并向反应腔40供应气体。通过喷头50有助于控制反应过程中的气体分布和浓度,以满足特定的工艺要求。The nozzle 50 may be disposed at the top center of the reaction chamber 40. The end of the nozzle 50 with a larger cross section may be connected to the end of the first pipe 10 or the second pipe 20, that is, the nozzle 50 may introduce gas from the first pipe 10 or the second pipe 20 through its hollow structure and supply gas to the reaction chamber 40. The nozzle 50 helps to control the gas distribution and concentration during the reaction process to meet specific process requirements.

另外,喷头50也可以设置成圆柱形,棱柱形,或者其他形状。In addition, the nozzle 50 may also be configured to be cylindrical, prismatic, or other shapes.

在一些实施例中,喷头50横截面较小的一端端面还可以均匀设有朝向气体喷淋头43的多个第三气体通道。In some embodiments, a plurality of third gas channels facing the gas shower head 43 may be evenly disposed on the end surface of the shower head 50 with a smaller cross section.

在喷头50底部面积较大的情况下,可以在底部同时设置气体通道以便气体流通。即喷头50横截面较小的一端端面还可以均匀设有朝向反应腔40内承载结构41的多个第三气体通道。When the bottom area of the nozzle 50 is relatively large, a gas channel can be provided at the bottom for gas circulation. That is, the end surface of the nozzle 50 with a smaller cross section can also be uniformly provided with multiple third gas channels facing the supporting structure 41 in the reaction chamber 40 .

也就是说,部分到达第一通道或第二通道末端的气体可以经由第三气体通道33沿预设方向进入反应腔40。That is, part of the gas reaching the end of the first channel or the second channel can enter the reaction chamber 40 along a preset direction via the third gas channel 33 .

该预设方向可以为与第一管道10的轴线形成大于0°小于180°的方向,比如可以是沿第一管道10的轴线方向,本公开对此并不做具体限制。The preset direction may be a direction that is greater than 0° and less than 180° with the axis of the first pipe 10 , for example, it may be a direction along the axis of the first pipe 10 , and the present disclosure does not impose any specific limitation on this.

在一些实施例中,在与第二管道20轴向形成第二预设角度的方向上,第一气体通道31可以与第二气体通道51错开设置。In some embodiments, in a direction forming a second preset angle with the axial direction of the second pipe 20 , the first gas channel 31 may be staggered with the second gas channel 51 .

错开设置可以使第一气体通道31与第二气体通道51在空间中形成一种交叉错位的布局,使得第一气体通道31与第二气体通道51的轴线在某些区域相互错开,而不是在一条直线上。这种相互错开的布局可以优化进气装置的中多类气体的混合功能。The staggered arrangement can form a cross-staggered layout of the first gas channel 31 and the second gas channel 51 in space, so that the axes of the first gas channel 31 and the second gas channel 51 are staggered in certain areas instead of being in a straight line. This staggered layout can optimize the mixing function of multiple types of gases in the air intake device.

在一些实施例中,第一预设角度与第二预设角度的角度大小可以不同。In some embodiments, the first preset angle and the second preset angle may have different angle sizes.

不同的喷孔角度可以影响气体的喷洒范围、速度和分布。也就是说,流通结构30中第一气体通道31的角度与喷头50中第二气体通道51的角度不同,可以调节和优化气体的混合效果,确保反应腔40内的气体进气均匀并达到所需的反应条件。Different nozzle angles can affect the spraying range, speed and distribution of the gas. That is, the angle of the first gas channel 31 in the flow structure 30 is different from the angle of the second gas channel 51 in the nozzle 50, which can adjust and optimize the mixing effect of the gas, ensure that the gas intake in the reaction chamber 40 is uniform and achieve the required reaction conditions.

在一些实施例中,多个第一气体通道31分布在多个垂直于第一管道10的轴线的平面上,位于相邻两个平面上的第一气体通道31在第一管道10的轴线方向上等距设置;和/或多个第二气体通道51分布在多个垂直于第一管道10的轴线的平面上,位于相邻两个平面上的第二气体通道51在第一管道10的轴线方向上等距设置。In some embodiments, multiple first gas channels 31 are distributed on multiple planes perpendicular to the axis of the first pipeline 10, and the first gas channels 31 located on two adjacent planes are equidistantly arranged in the axial direction of the first pipeline 10; and/or multiple second gas channels 51 are distributed on multiple planes perpendicular to the axis of the first pipeline 10, and the second gas channels 51 located on two adjacent planes are equidistantly arranged in the axial direction of the first pipeline 10.

在第二管道20轴线方向上等距设置多个均匀分布的第一气体通道31,可以实现将第一通道或者第二通道中的一类气体等量的分成多股气流,均匀的进入另一通道中,与另一类气体发生混合,从而提高反应的效率和可控性。By equidistantly arranging a plurality of uniformly distributed first gas channels 31 in the axial direction of the second pipeline 20, it is possible to divide a type of gas in the first channel or the second channel into multiple gas streams in equal amounts, which enter the other channel uniformly and mix with the other type of gas, thereby improving the efficiency and controllability of the reaction.

在第二管道20轴线方向上等距设置多个均匀分布的第二气体通道51,可以使两类气体以更广的进气范围进入反应腔40中,同时以中心对称的方式进入反应腔40中进行反应。A plurality of evenly distributed second gas channels 51 are equidistantly arranged in the axial direction of the second pipe 20, so that the two types of gases can enter the reaction chamber 40 with a wider intake range and enter the reaction chamber 40 in a centrally symmetrical manner for reaction.

需要说明的是,可以根据所需进气范围,设计气体通道在管道轴向上的分布层数。It should be noted that the number of distribution layers of the gas channel in the axial direction of the pipeline can be designed according to the required air intake range.

同时,位于不同平面上的第二气体通道51的通道朝向可以设计为不同或者相同。如图1所示,第二气体通道51在第二管道20的轴向上可以有三层,即分布在三个不同的平面上。并且,自位于不同平面上的第二气体通道51流出的气体,可以向与第二管道20轴向形成不同角度的方向进入气体喷淋头43。同时,喷头50底部也有气体朝向气体喷淋头43流出。通过增加或减少气体通道的分布层数,可以优化气体的分布和流动,从而提高多类气体进气的均匀性和效率。At the same time, the channel directions of the second gas channels 51 located on different planes can be designed to be different or the same. As shown in FIG1 , the second gas channels 51 can have three layers in the axial direction of the second pipe 20, that is, they are distributed on three different planes. Moreover, the gas flowing out of the second gas channels 51 located on different planes can enter the gas shower head 43 in directions forming different angles with the axial direction of the second pipe 20. At the same time, there is also gas flowing out from the bottom of the shower head 50 toward the gas shower head 43. By increasing or decreasing the number of distribution layers of the gas channel, the distribution and flow of the gas can be optimized, thereby improving the uniformity and efficiency of the intake of multiple types of gases.

在一些实施例中,第一通道可以设置成平直状,也可以设置成弯折状。In some embodiments, the first channel can be configured to be straight or curved.

如图1和图2所示,第一通道可以设计为平直状延伸。气体可以在管道中以直线路径流动,最终沿着反应腔40顶部进气口朝向的平行方向进入反应腔40腔室内。设置平直状延伸的通道可以适用于在反应腔40近端引入气体,有利于减少气体通入反应腔40内的流动路径。As shown in Figures 1 and 2, the first channel can be designed to extend in a straight shape. The gas can flow in a straight path in the pipeline, and finally enter the reaction chamber 40 along a direction parallel to the direction of the gas inlet at the top of the reaction chamber 40. The straight-extending channel can be suitable for introducing gas at the proximal end of the reaction chamber 40, which is conducive to reducing the flow path of the gas into the reaction chamber 40.

图1示出了其中一种实施例,第一通道设置成平直状,且第二通道的末端位于第一通道内,流通结构30设置在第二通道的末端。这种情况下,第一类气体自第一管道10的管壁进入第一通道中,沿图1中虚线箭头方向流动。第二类气体自第二管道20远离反应腔40的进气口的端部处进入第二通道内,沿图1中实线箭头方向流动,然后通过流通结构30进入第一通道中与第一类气体共同进入喷头50。FIG1 shows one embodiment, in which the first channel is arranged in a straight shape, and the end of the second channel is located in the first channel, and the flow structure 30 is arranged at the end of the second channel. In this case, the first type of gas enters the first channel from the wall of the first pipe 10 and flows in the direction of the dotted arrow in FIG1 . The second type of gas enters the second channel from the end of the second pipe 20 away from the gas inlet of the reaction chamber 40, flows in the direction of the solid arrow in FIG1 , and then enters the first channel through the flow structure 30 and enters the nozzle 50 together with the first type of gas.

如图2示出了其中一种实施例,第一通道设置成平直状,且第二通道的末端位于第一通道外,流通结构30设置在第二通道远离反应腔40的进气口位置处。此时,第二类气体自第二管道20远离反应腔40的进气口的端部处进入第二通道内,沿图2中实线箭头方向流动。第一类气体自第一管道10的管壁进入第一通道中,沿图2中虚线箭头方向流动。第一类气体通过流通结构30进入第二通道中后与第二类气体沿实线箭头方向共同进入喷头50。As shown in FIG. 2 , one embodiment is shown, in which the first channel is arranged in a straight shape, and the end of the second channel is located outside the first channel, and the flow structure 30 is arranged at the position of the gas inlet of the second channel away from the reaction chamber 40. At this time, the second type of gas enters the second channel from the end of the second pipe 20 away from the gas inlet of the reaction chamber 40, and flows in the direction of the solid arrow in FIG. 2 . The first type of gas enters the first channel from the pipe wall of the first pipe 10, and flows in the direction of the dotted arrow in FIG. 2 . After the first type of gas enters the second channel through the flow structure 30, it enters the nozzle 50 together with the second type of gas along the direction of the solid arrow.

在实际情况中,第一通道也可以设置成弯折状。图3示出了第一通道弯折时进气装置的结构,第一类气体依次流经第一管道10的第一段、第二段和第三段。第二管道20同样呈弯折状,第二类气体在第二管道20中以弯折路径流动后与第一类气体汇合。通过使第一管道10呈现为两处弯折,可以使进气装置结构紧凑,在反应腔40远端引入气体。可以简化管道系统的布局,并减小进气装置的占地面积,方便操作人员进行气源连接,从而更好地适应实际工艺需求。In actual situations, the first channel can also be set to be bent. Figure 3 shows the structure of the air intake device when the first channel is bent, and the first type of gas flows through the first section, the second section and the third section of the first pipe 10 in sequence. The second pipe 20 is also bent, and the second type of gas flows in the second pipe 20 in a bent path and then merges with the first type of gas. By making the first pipe 10 bend in two places, the structure of the air intake device can be made compact, and the gas can be introduced at the far end of the reaction chamber 40. The layout of the pipeline system can be simplified, and the floor space of the air intake device can be reduced, which makes it easier for operators to connect the gas source, thereby better adapting to actual process requirements.

在一些实施方式中,第一通道内设有环绕第二管道20、且位于第一通道进气路径上的板状结构11,板状结构11从第二管道20的管壁外侧向第一管道10的管壁内侧延伸,板状结构11与第一管道10的管壁内侧之间具有间隔。In some embodiments, a plate-like structure 11 is provided in the first channel, surrounding the second pipe 20 and located on the air intake path of the first channel. The plate-like structure 11 extends from the outer side of the pipe wall of the second pipe 20 to the inner side of the pipe wall of the first pipe 10, and there is a gap between the plate-like structure 11 and the inner side of the pipe wall of the first pipe 10.

如图1和图2所示,板状结构11可以使第一类气体在第一通道邻近第一进气口的端部处扩散。具体而言,第一类气体在第一通道邻近第一进气口的端部处扩散后可以通过板状结构11与第一管道10内侧腔壁之间的间隔继续进入第一通道,可以提高第一类气体在第一通道中流通时的均匀性。As shown in Figures 1 and 2, the plate-like structure 11 can make the first type of gas diffuse at the end of the first channel adjacent to the first air inlet. Specifically, after diffusing at the end of the first channel adjacent to the first air inlet, the first type of gas can continue to enter the first channel through the gap between the plate-like structure 11 and the inner wall of the first pipe 10, which can improve the uniformity of the first type of gas when flowing in the first channel.

另外,图2中在第一进气口设置在靠近流通结构30的位置时,可以放弃板状结构的使用。In addition, when the first air inlet is arranged at a position close to the flow structure 30 in FIG. 2 , the use of the plate-like structure can be abandoned.

而在如图3所示第一通道呈弯折状的情形中,由于管道长度较长,通入多路气体后不易发生气体未均匀扩散就直接进入反应腔40腔室的情况。这样,可以根据实际情况和工艺要求,灵活选择是否设置挡板,以及如何设计第一通道的形状和布局。In the case where the first channel is bent as shown in FIG3 , due to the long length of the channel, it is not easy for the gas to directly enter the reaction chamber 40 without uniform diffusion after the multiple gases are introduced. In this way, it is possible to flexibly choose whether to set the baffle and how to design the shape and layout of the first channel according to the actual situation and process requirements.

本申请一些实施例还提供了一种半导体加工设备,包括具有进气口的反应腔40和上述的进气装置,进气装置的第一通道和第二通道二者中的一者的端部与反应腔40的进气口连通。Some embodiments of the present application further provide a semiconductor processing device, including a reaction chamber 40 having an air inlet and the above-mentioned air inlet device, wherein an end of one of the first channel and the second channel of the air inlet device is connected to the air inlet of the reaction chamber 40 .

反应腔40设有承载结构41和升降结构44,基片42被放置在承载结构41上,并通过升降结构44调整高度。当不同气体通过进气装置进入反应腔40的进气口时,多种气体可以中心对称的方式到达反应腔40内,最终到达基片42所在区域,参与反应。其中,图4作为一种示意,示出了采用图3所示进气装置的半导体加工设备的结构。The reaction chamber 40 is provided with a supporting structure 41 and a lifting structure 44, and the substrate 42 is placed on the supporting structure 41, and the height is adjusted by the lifting structure 44. When different gases enter the gas inlet of the reaction chamber 40 through the gas inlet device, multiple gases can reach the reaction chamber 40 in a centrally symmetrical manner, and finally reach the area where the substrate 42 is located to participate in the reaction. Among them, FIG4 is a schematic diagram showing the structure of a semiconductor processing device using the gas inlet device shown in FIG3.

上述进气装置可以应用于进行等离子薄膜沉积、等离子刻蚀、等离子去胶等工艺的半导体加工设备中。The above-mentioned air intake device can be applied to semiconductor processing equipment for plasma thin film deposition, plasma etching, plasma stripping and other processes.

以上实施例的各技术特征可以进行任意的组合,为使描述简洁,未对上述实施例中的各个技术特征所有可能的组合都进行描述,然而,只要这些技术特征的组合不存在矛盾,都应当认为是本说明书记载的范围。The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

本领域的普通技术人员可以理解,上述各实施方式是实现本申请的具体实施例,而在实际应用中,可以在形式上和细节上对其作各种改变,而不偏离本申请的精神和范围。Those skilled in the art will appreciate that the above-mentioned embodiments are specific examples for implementing the present application, and in actual applications, various changes may be made thereto in form and detail without departing from the spirit and scope of the present application.

Claims (13)

1.一种进气装置,用于向反应腔中通入工艺气体,其特征在于,包括:1. A gas inlet device for introducing a process gas into a reaction chamber, characterized in that it comprises: 第一管道,具有供第一类气体流通的第一通道;A first pipe having a first passage for the flow of a first type of gas; 第二管道,沿所述第一管道的轴线方向进入所述第一通道内、并在所述第一通道内同轴延伸,所述第二管道具有供第二类气体流通的第二通道,所述第二通道的末端邻近所述第一通道的端部设置;a second pipe, entering the first channel along the axial direction of the first pipe and extending coaxially in the first channel, the second pipe having a second channel for the flow of a second type of gas, the end of the second channel being disposed adjacent to the end of the first channel; 流通结构,设置在所述第二管道上并位于所述第一通道内,所述流通结构具有均匀环绕所述第二管道轴向设置、且朝向与所述第二管道轴向形成第一预设角度的多个第一气体通道,所述第一通道和所述第二通道二者中的一者的端部用于连通反应腔的进气口,且另一者内流通的气体经由所述流通结构沿与所述第二管道轴向形成所述第一预设角度的方向进入与反应腔的进气口连通的一者中,使二者内流通的气体共同进入反应腔的进气口,所述流通结构在气体的流动路径上邻近反应腔的进气口设置。A circulation structure is arranged on the second pipeline and located in the first channel. The circulation structure has a plurality of first gas channels which are evenly arranged around the axial direction of the second pipeline and face the axial direction of the second pipeline to form a first preset angle. An end of one of the first channel and the second channel is used to connect to the air inlet of the reaction chamber, and the gas flowing in the other enters the one connected to the air inlet of the reaction chamber through the circulation structure along the direction forming the first preset angle with the axial direction of the second pipeline, so that the gases flowing in the two enter the air inlet of the reaction chamber together. The circulation structure is arranged adjacent to the air inlet of the reaction chamber on the gas flow path. 2.根据权利要求1所述的一种进气装置,其特征在于,所述第一管道设置有第一进气口,所述第一进气口位于所述第一通道远离所述流通结构的端部处,所述第一进气口用于连接供应第一类气体的第一气源;和/或2. An air intake device according to claim 1, characterized in that the first pipeline is provided with a first air intake port, the first air intake port is located at an end of the first channel away from the flow structure, and the first air intake port is used to connect to a first gas source supplying a first type of gas; and/or 所述第二管道设置有第二进气口,所述第二进气口位于所述第二通道远离所述反应腔的进气口的端部处,所述第二进气口用于连接供应第二类气体的第二气源。The second pipeline is provided with a second gas inlet, which is located at the end of the second channel away from the gas inlet of the reaction chamber, and the second gas inlet is used to connect to a second gas source that supplies a second type of gas. 3.根据权利要求1所述的一种进气装置,其特征在于,所述第一通道与所述第二通道二者中与反应腔的进气口连通的一者末端设有喷头,所述喷头具有环绕所述第一管道轴向设置、且朝向与所述第一管道轴向形成第二预设角度的多个第二气体通道,所述第一通道与所述第二通道内流通的气体经由所述第二气体通道沿与所述第一管道轴向形成所述第二预设角度的方向共同进入所述反应腔。3. An air intake device according to claim 1, characterized in that a nozzle is provided at the end of one of the first channel and the second channel that is connected to the air inlet of the reaction chamber, and the nozzle has a plurality of second gas channels that are arranged axially around the first pipeline and face the first pipeline to form a second preset angle, and the gas flowing in the first channel and the second channel enters the reaction chamber together through the second gas channel along the direction forming the second preset angle with the first pipeline axis. 4.根据权利要求3所述的一种进气装置,其特征在于,所述喷头呈中空的圆台状,所述喷头与所述第一管道同轴,所述喷头横截面较小的一端朝向反应腔内部,所述第二气体通道设置在所述喷头的侧面上。4. An air intake device according to claim 3, characterized in that the nozzle is in the shape of a hollow truncated cone, the nozzle is coaxial with the first pipeline, the end of the nozzle with a smaller cross-section faces the inside of the reaction chamber, and the second gas channel is arranged on the side of the nozzle. 5.根据权利要求4所述的一种进气装置,其特征在于,所述喷头横截面较小的一端端面还均匀设有朝向气体喷淋头的多个第三气体通道。5 . The gas inlet device according to claim 4 , characterized in that a plurality of third gas channels facing the gas shower head are evenly arranged on the end surface of the shower head with a smaller cross section. 6.根据权利要求4所述的一种进气装置,其特征在于,在与所述第二管道轴向形成所述第二预设角度的方向上,所述第一气体通道与所述第二气体通道错开设置。6 . The air intake device according to claim 4 , characterized in that the first gas channel and the second gas channel are staggered in a direction forming the second preset angle with the axial direction of the second pipe. 7.根据权利要求4所述的一种进气装置,其特征在于,所述第一预设角度与所述第二预设角度的角度大小不同。7 . The air intake device according to claim 4 , wherein the first preset angle and the second preset angle are different in size. 8.根据权利要求4所述的一种进气装置,其特征在于,多个所述第一气体通道分布在多个垂直于所述第一管道的轴线的平面上,位于相邻两个平面上的所述第一气体通道在所述第一管道的轴线方向上等距设置;和/或8. An air intake device according to claim 4, characterized in that the plurality of first gas channels are distributed on a plurality of planes perpendicular to the axis of the first pipeline, and the first gas channels located on two adjacent planes are arranged equidistantly in the axial direction of the first pipeline; and/or 多个所述第二气体通道分布在多个垂直于所述第一管道的轴线的平面上,位于相邻两个平面上的所述第二气体通道在所述第一管道的轴线方向上等距设置。The plurality of second gas channels are distributed on a plurality of planes perpendicular to the axis of the first pipeline, and the second gas channels located on two adjacent planes are arranged equidistantly in the axial direction of the first pipeline. 9.根据权利要求1所述的一种进气装置,其特征在于,所述第一通道设置成平直状,或者所述第一通道设置成弯折状。9 . The air intake device according to claim 1 , wherein the first channel is arranged in a straight shape, or the first channel is arranged in a bent shape. 10.根据权利要求9所述的一种进气装置,其特征在于,所述第一通道设置成平直状,所述第二通道的末端位于所述第一通道内,所述流通结构设置在所述第二通道的末端。10 . An air intake device according to claim 9 , characterized in that the first channel is arranged in a straight shape, an end of the second channel is located in the first channel, and the flow structure is arranged at the end of the second channel. 11.根据权利要求9所述的一种进气装置,其特征在于,所述第一通道设置成平直状,所述第二通道的末端位于所述第一通道外,所述流通结构设置在所述第二通道远离所述反应腔的进气口位置处。11. An air intake device according to claim 9, characterized in that the first channel is arranged to be straight, the end of the second channel is located outside the first channel, and the flow structure is arranged at a position of the second channel away from the air intake of the reaction chamber. 12.根据权利要求3所述的一种进气装置,其特征在于,所述第一通道内设有环绕所述第二管道、且位于所述第一通道进气路径上的板状结构,所述板状结构从所述第二管道的管壁外侧向所述第一管道的管壁内侧延伸,所述板状结构与所述第一管道的管壁内侧之间具有间隔。12. An air intake device according to claim 3, characterized in that a plate-like structure surrounding the second pipe and located on the air intake path of the first channel is provided in the first channel, the plate-like structure extends from the outer side of the pipe wall of the second pipe to the inner side of the pipe wall of the first pipe, and there is a gap between the plate-like structure and the inner side of the pipe wall of the first pipe. 13.一种半导体加工设备,包括具有进气口的反应腔,其特征在于,还包括权利要求1至12任一项所述的进气装置,所述进气装置的所述第一通道和所述第二通道二者中的一者的端部与反应腔的进气口连通。13. A semiconductor processing equipment, comprising a reaction chamber having an air inlet, characterized in that it also comprises the air inlet device according to any one of claims 1 to 12, wherein an end of one of the first channel and the second channel of the air inlet device is connected to the air inlet of the reaction chamber.
CN202410421487.4A 2024-04-09 2024-04-09 Air inlet device and semiconductor processing equipment comprising same Active CN118335583B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410421487.4A CN118335583B (en) 2024-04-09 2024-04-09 Air inlet device and semiconductor processing equipment comprising same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202410421487.4A CN118335583B (en) 2024-04-09 2024-04-09 Air inlet device and semiconductor processing equipment comprising same

Publications (2)

Publication Number Publication Date
CN118335583A true CN118335583A (en) 2024-07-12
CN118335583B CN118335583B (en) 2025-06-24

Family

ID=91777076

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202410421487.4A Active CN118335583B (en) 2024-04-09 2024-04-09 Air inlet device and semiconductor processing equipment comprising same

Country Status (1)

Country Link
CN (1) CN118335583B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5370738A (en) * 1992-03-06 1994-12-06 Pioneer Electronic Corporation Compound semiconductor vapor phase epitaxial device
CN105448770A (en) * 2014-07-25 2016-03-30 北京北方微电子基地设备工艺研究中心有限责任公司 Air inlet unit for semiconductor device and reaction chamber applied therewith
CN117448954A (en) * 2023-11-27 2024-01-26 北京北方华创微电子装备有限公司 Air inlet device and semiconductor processing equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5370738A (en) * 1992-03-06 1994-12-06 Pioneer Electronic Corporation Compound semiconductor vapor phase epitaxial device
CN105448770A (en) * 2014-07-25 2016-03-30 北京北方微电子基地设备工艺研究中心有限责任公司 Air inlet unit for semiconductor device and reaction chamber applied therewith
CN117448954A (en) * 2023-11-27 2024-01-26 北京北方华创微电子装备有限公司 Air inlet device and semiconductor processing equipment

Also Published As

Publication number Publication date
CN118335583B (en) 2025-06-24

Similar Documents

Publication Publication Date Title
CN114768578B (en) Gas mixing device and semiconductor process equipment
CN108728820B (en) Gas mixing structure, process chamber and semiconductor processing equipment
US20200115797A1 (en) Substrate processing apparatus having manifold
KR20230122140A (en) Intake assemblies, intake devices and semiconductor processing devices in process chambers
CN111725108B (en) Semiconductor processing equipment
WO2025130628A1 (en) Process chamber and gas inlet assembly thereof
WO2023036046A1 (en) Gas injection device of semiconductor heat treatment apparatus, and semiconductor heat treatment apparatus
CN118335583A (en) Air intake device and semiconductor processing equipment including the same
CN114210217B (en) Semiconductor processing equipment and gas mixing device thereof
CN118846853A (en) A temperature-controlled gas mixing structure and semiconductor processing equipment
CN115386860A (en) Air inlet device and semiconductor process chamber
CN116180050A (en) Gas mixing device and treatment equipment
CN119673742B (en) Slit type gas supply device and coating equipment
CN211734468U (en) Chemical vapor deposition gas guide mechanism
CN112105759B (en) Gas box for CVD chamber
JPH0766130A (en) Chemical vapor deposition system
CN222550618U (en) Gas mixing device and semiconductor equipment
KR102837311B1 (en) Substrate processing apparatus having manifold
CN219689849U (en) Reaction chamber's inlet structure and reaction chamber of HDP board
CN220520621U (en) Special gas mixing device for process and PECVD (plasma enhanced chemical vapor deposition) equipment using special gas mixing device
CN220224327U (en) Processing equipment including gas mixing devices
JPH0545382Y2 (en)
CN115747767B (en) Thin film deposition equipment air intake module and thin film deposition equipment
CN222861629U (en) Air inlet structure and reaction furnace
CN222411814U (en) An air intake device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant