CN118258813A

CN118258813A - Method, device, electronic equipment and system for detecting display screen defects

Info

Publication number: CN118258813A
Application number: CN202211683685.5A
Authority: CN
Inventors: 刘昕; 程甲一; 杨城; 白绳武
Original assignee: Xian Novastar Electronic Technology Co Ltd
Current assignee: Xian Novastar Electronic Technology Co Ltd
Priority date: 2022-12-27
Filing date: 2022-12-27
Publication date: 2024-06-28

Abstract

The application is suitable for the technical field of display, and provides a display screen defect detection diagram generation method, a device, electronic equipment and a storage medium, wherein the display screen defect detection diagram generation method comprises the following steps: acquiring an acquired image of a display screen to be detected; performing defect detection on the acquired image, and determining a defect area in the acquired image; and generating and displaying a defect detection graph based on the defect area, wherein the defect detection graph comprises at least one drawn defect area, the defect area is composed of at least one pixel point, the number of the pixel points included in different defect areas is the same or different, and the optical difference between the pixel points in the defect area is smaller than the optical difference between the pixel points in the defect area and the pixel points in the non-defect area adjacent to the pixel points in position, wherein the optical difference comprises at least one of brightness difference, chromaticity difference and gray level difference. According to the scheme, the defect area is displayed in the defect detection diagram, so that the quality inspection result of the display screen can be attached to the actual human eye effect.

Description

Method, device, electronic equipment and system for detecting display screen defects

Technical Field

The application belongs to the technical field of display, and particularly relates to a display screen defect detection method, device, electronic equipment and system.

Background

With the continuous development of information display technology, the display screen has rapidly penetrated into various fields of society by virtue of the advantages of lighter and thinner screen body, self-luminescence, flexibility, wide viewing angle, simple manufacturing process and the like. However, due to the process defects generated in the production process of the display screen, different kinds of defects (Mura) may occur in the display screen, for example: point defects, line defects, scratches, dark clusters, light clusters, depressions, clouds, clusters, endless belts, and the like.

Currently, an imaging defect detection method is generally used to detect defects occurring on a display screen, for example, a luminance colorimeter is used to collect luminance information of an imaging image of the display screen to be detected, display uniformity of the display screen to be detected is determined according to the luminance information, or the imaging image of the display screen to be detected is compared with a standard sample graph to determine the display uniformity of the display screen to be detected.

However, as the requirements of people on the quality inspection of the display screen are higher and higher, the method only can provide the judgment of whether the display screen to be inspected is uniform or not, but cannot judge whether the visual impression of human eyes is truly reflected or not, and further the quality inspection result of the display screen cannot fit with the actual visual effect of human eyes.

Disclosure of Invention

The embodiment of the application provides a method, a device, electronic equipment and a system for detecting defects of a display screen, which can solve the problem that quality inspection results of the display screen in the prior art cannot fit with actual human visual effects.

A first aspect of an embodiment of the present application provides a method for detecting a display screen defect, the method including:

Acquiring an acquired image of a display screen to be detected;

generating a defect detection diagram according to the acquired image, wherein the defect detection diagram comprises at least one drawn defect area, the defect area is composed of at least one pixel point, the number of the pixel points included in different defect areas is the same or different, and the optical difference between the pixel points in the defect area is smaller than the optical difference between the pixel points in the defect area and the pixel points in the non-defect area adjacent to the pixel points in the defect area, and the optical difference comprises at least one of brightness difference, chromaticity difference and gray level difference;

and displaying the defect detection graph.

A second aspect of an embodiment of the present application provides an apparatus for detecting a display screen defect, the apparatus including:

the image acquisition module is used for acquiring an acquired image of the display screen to be detected;

The generation module is used for generating a defect detection graph according to the acquired image, wherein the defect detection graph comprises at least one drawn defect area, the defect area is composed of at least one pixel point, the number of the pixel points included in different defect areas is the same or different, the optical difference between the pixel points in the defect area is smaller than the optical difference between the pixel points in the defect area and the pixel points in the non-defect area adjacent to the pixel points in the defect area, and the optical difference comprises at least one of brightness difference, chromaticity difference and gray level difference;

and the display module is used for displaying the defect detection graph.

A third aspect of an embodiment of the present application provides a display screen defect detection system, including:

the collecting station is used for supporting and placing the display screen;

the acquisition equipment is used for acquiring images of the display screen;

A processing device comprising a display and a processor for implementing the method for display screen defect detection as described in the first aspect.

A fourth aspect of an embodiment of the present application provides an electronic device, including: the display screen defect detection method comprises a memory, a processor and a computer program stored in the memory and capable of running on the processor, wherein the processor realizes the display screen defect detection method according to the first aspect when executing the computer program.

A fifth aspect of an embodiment of the present application provides a computer readable storage medium storing a computer program, which when executed by a processor implements the method for detecting a display screen defect according to the first aspect.

A sixth aspect of an embodiment of the application provides a computer program product for, when run on an electronic device, causing the electronic device to perform the method for display screen defect detection as described in the first aspect above.

Compared with the prior art, the embodiment of the application has the beneficial effects that:

In the embodiment of the application, since the quality inspection result of the display screen in the prior art cannot be attached to the actual human eye effect, the application can acquire the acquired image of the display screen to be inspected, and generate the defect inspection image corresponding to the acquired image according to the acquired image, wherein the defect inspection image comprises at least one drawn defect area, the defect area consists of at least one pixel point, the number of the pixels included in different defect areas is the same or different, and the defect area can be understood as an area which is displayed unevenly on the display screen to be inspected, so that the optical difference between the defect area and the periphery of the defect area is larger, and the optical difference between the pixels inside the defect area is smaller, namely the optical difference between the pixels in the defect area is smaller than the optical difference between the pixels in the defect area and the pixels in the non-defect area adjacent to the position, wherein the optical difference comprises at least one of brightness difference, chromaticity difference and gray level difference. After the defect detection diagram is generated, the defect detection diagram can be displayed on the electronic equipment, so that a user can conveniently and intuitively check the defects, and the problem that the quality inspection result of the display screen in the prior art cannot fit with the actual human eye effect is solved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a flow chart of a method for detecting defects of a display screen according to an embodiment of the present application;

FIG. 2 is a schematic diagram of an image acquisition structure according to an embodiment of the present application;

FIG. 3 is a schematic flow chart of defect detection map generation according to an embodiment of the present application;

FIG. 4 is a schematic flow chart of determining defective areas according to an embodiment of the present application;

FIG. 5 is a schematic diagram of another process for determining defective areas according to an embodiment of the present application;

FIG. 6 is an interface diagram of a defect detection diagram corresponding to a display to be detected;

FIG. 7 is a schematic structural diagram of an apparatus for detecting defects of a display screen according to an embodiment of the present application;

fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It should also be understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.

As used in the present description and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".

Furthermore, the terms "first," "second," "third," and the like in the description of the present specification and in the appended claims, are used for distinguishing between descriptions and not necessarily for indicating or implying a relative importance.

Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.

At present, in the manufacturing process of the display screen, because of more manufacturing procedures and complex structure, various visual defects of the display screen inevitably exist, for example: point defects, line defects, scratches, dark clusters, light clusters, depressions, clouds, clusters, endless belts, and the like. These visual defects, beyond which the local display non-uniformity of the display screen is the most common visual defect, known as mura, affect the physiological health of the user.

Currently, mura defect detection mainly relies on human eyes or uses an imaging defect detection method, for example, a luminance colorimeter is used to collect luminance information of an imaging image of a display screen to be detected, display uniformity of the display screen to be detected is determined according to the luminance information, or the imaging image of the display screen to be detected is compared with a standard sample graph to determine the display uniformity of the display screen to be detected. However, the Mura defect has the characteristics of unfixed shape, low contrast, blurred edges, complex background and the like, and the detection result in the prior art can only provide judgment of whether the display screen to be detected is uniform or not, so that the visual impression of human eyes cannot be reflected truly.

In view of the above problems, the present application provides a method for detecting defects of a display screen, which may obtain an acquired image of the display screen to be detected, and generate a defect detection map corresponding to the acquired image according to the acquired image, where the defect detection map includes at least one drawn defect area, and the defect area includes at least one pixel, and the number of pixels included in different defect areas is the same or different, and since the defect area may be understood as an area that displays non-uniformity on the display screen to be detected, the optical difference between the pixels in the defect area and the pixels around the defect area is larger, and the optical difference between the pixels inside the defect area is smaller, that is, the optical difference between the pixels in the defect area is smaller than the optical difference between the pixels in the defect area and the pixels in the non-defect area adjacent to the position, where the optical difference includes at least one of a luminance difference, a chromaticity difference, and a gray scale difference. After the defect detection diagram is generated, the defect detection diagram can be displayed on the electronic equipment, so that a user can conveniently and intuitively check the defects, and the problem that the quality inspection result of the display screen in the prior art cannot fit with the actual human eye effect is solved.

It should be understood that, the sequence number of each step in this embodiment does not mean the execution sequence, and the execution sequence of each process should be determined by its function and internal logic, and should not limit the implementation process of the embodiment of the present application in any way.

It should also be understood that the size of the display screen is not particularly limited in the embodiment of the present application, and may be a display screen having a larger size, such as a display screen used in a scene of a mall or a concert. The display screen can be spliced by a plurality of splicing units. The splice unit may sometimes be referred to as a light box (e.g., an LED light box). For the display screen taking the lamp box as the basic unit, the display screen mentioned in the embodiment of the application can refer to the display screen corresponding to one lamp box, and also can refer to the display screen formed by splicing a plurality of lamp boxes. The display screen mentioned in the embodiment of the application can also be a display screen with smaller size, such as a lamp box, a lamp panel and the like. With the development of future display, a larger number of pixels is likely to be included on a smaller-sized display screen, and the method provided by the embodiment of the present application is also applicable.

In order to illustrate the technical scheme of the application, the following description is given by specific examples.

Referring to fig. 1, a flowchart of a method for detecting a display screen defect according to an embodiment of the present application is shown. As shown in fig. 1, the method for detecting display screen defects may include the steps of:

step 101, acquiring an acquired image of a display screen to be detected.

It should be noted that, the method for detecting a display screen defect provided by the embodiment of the present application may be executed by the apparatus for detecting a display screen defect of the embodiment of the present application, and the apparatus for detecting a display screen defect of the embodiment of the present application may be configured in any electronic device to execute the method for detecting a display screen defect of the embodiment of the present application. For example, the apparatus of the embodiment of the present application may be configured in a detection device connected to an image capturing device of a display screen to be detected, or configured in a detection device including an image capturing device of a display screen to be detected, which is not limited in the embodiment of the present application.

In the embodiment of the present application, the display screen to be detected may be a display screen indicating that quality detection is required before sales in a factory, the type of the display screen is not specifically limited in the present application, and in some embodiments, the display screen to be detected may be any one of the following display screens: LCD display screen, LED display screen, OLED display screen and QLED display screen. Taking an LED display screen as an example, the LED display screen may be a common LED display screen, or may be microLED, miniLED or a new type of LED in the future. Further, in some embodiments, the packaging manner of the display screen may be one of the following packaging manners: such as SMD, COB, COG or new packaging in the future.

The acquired image of the display screen to be detected may refer to an image obtained by performing image acquisition on the display screen to be detected by the image acquisition device, that is, an acquired image obtained by shooting the display screen to be detected by the image acquisition device. It should be noted that the image capturing device may exist separately from the detecting device or be mounted in the detecting device, which is not limited in the present application.

The image acquisition equipment can be acquisition equipment such as an industrial camera and a high-definition camera, is classified by acquisition colors, and can also be acquisition equipment such as a color camera and a black-and-white camera.

In the embodiment of the application, acquiring the acquired image of the display screen to be detected may mean that the detection device controls the acquisition device such as an industrial camera, a high-definition camera, a color camera or a black-and-white camera to shoot the display screen to be detected, so as to acquire the acquired image of the display screen to be detected.

Specifically, in one possible implementation manner, since the evaluation may be performed from multiple acquisition perspectives of the display screen to be detected when the quality of the display screen to be detected is detected, the acquisition perspectives included in different display screen quality inspection rules are the same or different, so the loading position of the image acquisition device may be variable, for example: the image acquisition equipment can be positioned right above the display screen to be detected, acquires the image of the forward direction visual angle of the display screen to be detected, and acquires a defect detection image corresponding to the acquired image of the forward direction visual angle of the display screen to be detected according to the acquired image of the forward direction visual angle. The image acquisition equipment can be further positioned in the side direction of the display screen to be detected, acquires an image of the side direction visual angle of the display screen to be detected, and the obtained defect detection image is a defect detection image corresponding to the acquired image of the side direction visual angle of the display screen to be detected according to the acquired image of the side direction visual angle.

It should be understood that when the image acquisition device performs image acquisition for different acquisition view angles, the image acquisition device performs image acquisition for a single view angle, that is, only one image acquisition device performs image acquisition for one acquisition view angle at the same time.

As a possible implementation manner, the number of the image capturing devices may be multiple, one of the multiple image capturing devices is located right above the display screen to be detected, the other image capturing devices are located in the lateral direction of the display screen to be detected, and at the same time, the multiple image capturing devices may be operated to capture images of different viewing angles on the display screen to be detected, acquire captured images corresponding to the different viewing angles, generate multiple defect detection diagrams corresponding to the different capturing viewing angles, and acquire and display the defect detection diagrams corresponding to the target viewing angles according to the needs of the user.

For example, the image capturing device may be installed according to different preset capturing positions and target viewing angles, and the different preset capturing positions and target viewing angles may be determined according to different display quality inspection rules, for example, according to requirements of a user, when the display screen to be detected is evaluated, the evaluation needs to be performed from the front 90 degrees, and then an image captured when the image capturing device is placed directly above the display screen to be detected may be obtained, and the directly above may refer to the right viewing angle of the image capturing device as shown in fig. 2. If the user needs to evaluate from the side angle, the image acquired when the image acquisition device should be placed at the side direction position of the display screen to be detected may be acquired, and the side direction may refer to the side view angle of the image acquisition device as shown in fig. 2.

It will be appreciated that each image acquisition device should be built at a preset acquisition position and the lens should be rotated to the target viewing angle before image acquisition takes place.

Step 102, generating a defect detection map according to the acquired image.

The defect detection map may be an image obtained by drawing a defect area on an acquired image. It should be noted that the defect detection map includes at least one drawn defect area, and each defect area includes at least one pixel, where a pixel in the defect area is a defective pixel, and a plurality of adjacent defective pixels may form a defect area.

The defect area may be an area different from other non-defect areas on the display screen to be detected. Since mura defects in a display screen are usually present in blocks, the display of defective pixels constituting a defective area can be considered to be substantially uniform, i.e., the display of defective pixels in the defective area has small differences.

Therefore, in the embodiment of the present application, if the display screen to be detected has a defect, the defect detection diagram corresponding to the display screen to be detected should include at least one drawn defect area, where the defect area is formed by at least one pixel, and the number of pixels included in different defect areas is the same or different. According to the characteristics of the defect area, it can be determined that the optical difference between the pixel points in the defect area is smaller than the optical difference between the pixel points in the defect area and the pixel points in the non-defect area adjacent to the position.

It should be understood that the optical difference may refer to at least one of a luminance difference, a chromaticity difference, and a gray-scale difference.

As a possible implementation manner, in the embodiment of the present application, the optical difference between the pixel points in the defect area is smaller than the first threshold, and the optical difference between the pixel points in the defect area and the pixel points in other adjacent areas is larger than the first threshold, so that the display of the defect pixel points in the defect area is substantially uniform, and the display of the defect pixel points in other areas is non-uniform.

Specifically, the first threshold value refers to a threshold value corresponding to the optical difference, that is, when the optical difference refers to the brightness difference, the first threshold value is a threshold value corresponding to the brightness difference; when the optical difference is the chromaticity difference, the first threshold value is a threshold value corresponding to the chromaticity difference; when the optical difference is a gray level difference, the first threshold is a threshold corresponding to the gray level difference. Alternatively, the first threshold may be the same or different when the type of difference referred to by the optical difference is different.

For example, when the optical difference refers to a gray level difference, assuming that the first threshold is a gray level value of 1, a defective area drawn on the defect detection map should be satisfied, the gray level difference between pixel points in the defective area is smaller than 1, and the gray level difference between pixel points in the defective area and pixel points in other areas adjacent to the position is larger than 1. Taking fig. 6 as an example, a defective area #40 (i.e., an area denoted by 40 in the drawing, and the same applies hereinafter) is adjacent to a defective area #41, the difference in gradation between pixels in the defective area #40 is less than 1, the difference in gradation between pixels in the defective area #41 is less than 1, but the difference between adjacent pixels in the defective area #40 and the defective area #41 is greater than 1, and the difference between pixels in the defective area #40 and the adjacent non-defective area is also greater than 1. In order to make the generated defect detection graph more fit to the display screen to be detected, the collected image of the display screen to be detected can be preprocessed, and then the defect detection graph is generated according to the preprocessed collected image.

Specifically, as shown in fig. 3, generating a defect detection map from the acquired image may include the following steps 301 to 303.

Step 301, acquiring an imaging image of a display screen to be detected in the acquired image.

The imaging image of the display screen to be detected may refer to an image formed by an imaging area of a display screen to be detected in the acquired image. It should be noted that, when the image acquisition device performs image acquisition on the display screen to be detected, the surrounding environment of the display screen to be detected is easily shot, so that the acquired image contains redundant images except for the display images of the display screen to be detected, and further the generated defect detection image cannot accurately reflect the defect area of the display screen to be detected, so that the imaging image of the display screen to be detected in the acquired image needs to be acquired, and the generated defect detection image is more suitable for the display screen to be detected.

In the embodiment of the application, the region of the display screen display picture to be detected in the acquired image can be obtained by cutting, image correction and the like to be an effective region, and the effective region is taken as an imaging image so as to obtain the imaging image.

In step 302, a defect region in the imaged image is determined.

In the embodiment of the present application, the defect area may refer to an area in the imaged image where unevenness is displayed. A mura defect detection method may be used to determine the defective areas in the imaged image. For example, a luminance-chrominance meter is used for collecting luminance information of an imaging image of a display screen to be detected, display uniformity of the display screen to be detected is determined according to the luminance information, then a defect area is determined according to characteristics of the defect area, or defect pixel points in the imaging image can be determined first, and then the defect area is determined according to the characteristics of the defect area.

As a possible implementation manner, the specific implementation process of determining the defective pixel point in the imaged image and then determining the defective area according to the characteristics of the defective area may be: and determining a defect area according to the optical difference between the imaging image and the background image, wherein the background image is an image which does not contain the defect area after the imaging image is processed, so that if the point-to-point optical difference between the imaging image and the background image is calculated point by point, defective pixel points in the imaging image can be determined according to a threshold method, and then the defect area is determined based on the characteristics of the defective pixel points and the defect area.

Specifically, as a possible implementation, as shown in fig. 4, determining the defect area according to the optical difference between the imaged image and the background image may include the following steps 401 to 403.

Step 401, determining the first pixel point as a defective pixel point if the point optical difference between the first pixel point in the imaging image and the first pixel point in the background image exceeds a second threshold;

Step 402, determining at least one defective pixel point forming area with image positions adjacent in sequence as a connected area, and obtaining all connected areas in an imaging image;

In step 403, a defective area is determined from all connected domains.

In the embodiment of the application, before determining the defect pixel point in the imaging image, a background image corresponding to the imaging image is required to be acquired according to the imaging image, and the background image imaging image is processed to form an image without a defect area, wherein the processing method for the imaging image can comprise the following steps: a method of discrete cosine transforming an imaged image and restoring the image is utilized.

For example, gray processing is performed on an imaging image to obtain a gray image img1 of the imaging image, discrete cosine transformation is performed on the img1 to obtain a corresponding cosine coefficient matrix dct1, the cosine coefficient matrix is processed, namely, first row and first column data in the matrix dct1 are reserved, the rest data are set to zero to obtain a matrix dct2, so that the restored background image can be ensured to retain main information (namely, other information except a defect area) in the imaging image, and finally the matrix dct2 is converted into a time domain to perform image restoration to obtain the background image img2. The background image contains main information in the imaging image and does not contain a defect area in the imaging image, so that point-to-point difference between img1 and img2 can be obtained, point-to-point gray level difference between the imaging image and the background image is obtained, img3 is generated according to the point-to-point gray level difference, and a defect pixel point is determined according to the point-to-point gray level difference of each pixel point in img3, namely, if any point-to-point gray level difference in img3 is smaller, the point in the imaging image is not the defect pixel point. Therefore, a second threshold value can be set, and if the optical difference between the pixel point in the imaging image and the corresponding pixel point in the background image exceeds the second threshold value, the pixel point is determined to be a defective pixel point, and the defective pixel point in the imaging image is sequentially obtained.

As a possible implementation manner, the position coordinates of the defective pixel point can be determined according to the point gray scale differences corresponding to all the pixel points in img3, then the display content of the defective pixel point is reserved in the imaging image according to the position coordinates, and the pixel value of the non-defective pixel point is set to 0, so that the area where the defective pixel point is located in the imaging image is observed more obviously.

After obtaining the defective pixel points in the imaging image, the connected domain extraction may be performed on the defective pixel points to determine a defective region in the imaging image, and the defective pixel points adjacent to each other in position may form one connected domain, but since the defective region is finally selected from the connected domain, the formation of the connected domain needs to be defined in the first step by the characteristics of the defective region, that is, the region formed by at least one defective pixel point whose image positions are sequentially adjacent to each other may be determined as the connected domain, and meanwhile, in the case that at least two defective pixel points are included in the connected domain, the optical difference between the defective pixel points in the connected domain is smaller than the third threshold, and the third threshold is the same as or different from the first threshold, so that even if the two defective pixel points are adjacent to each other in image position, the two defective pixel points cannot be located in one connected domain if the optical difference between the two defective pixel points is greater than or equal to the third threshold.

By the method, all connected domains in the imaging image can be obtained, all connected domains are possibly defective areas, further screening is needed, and defective areas can be determined from all connected domains according to mura characteristics corresponding to a plurality of mura defects. That is, determining defective areas from all connected domains may include:

Defective areas are determined from all connected domains based on mura conditions corresponding to each connected domain.

The mura condition may refer to a sum of specific conditions of each mura feature corresponding to a mura defect. It should be noted that, in the embodiment of the present application, the mura condition may be represented in a quantitative evaluation manner, for example, a scoring manner is adopted to represent the mura condition corresponding to each connected domain, and then a defect area is determined from all connected domains according to a threshold corresponding to the scoring.

Specifically, as shown in fig. 5, determining defect areas from all the target connected domains based on mura conditions corresponding to each connected domain may include the following steps 501 to 502.

Step 501, determining a defect score corresponding to each connected domain according to the mura feature factor set in each connected domain and the target weight coefficient of each mura feature factor.

Wherein, the mura feature factor set may refer to a set including a plurality of mura feature factor corresponding feature values. Each connected domain is provided with a group of corresponding mura characteristic factor sets, and the defect scores corresponding to the connected domains can be obtained by carrying out weighted summation calculation according to the characteristic values corresponding to each mura characteristic factor in the mura characteristic factor sets and the target weight coefficients of each mura characteristic factor.

In one possible implementation, the mura feature factors included in the mura feature factor set of the connected domain may be: at least one of gray average value in the connected domain, contrast between the connected domain and the connected domain background, area of the connected domain, SEMU value of the connected domain, circularity of the connected domain and rectangle degree of the connected domain.

The gray average value in the connected domain may be a gray average value obtained by performing average calculation on gray values of all defective pixel points in the connected domain.

The contrast ratio between the connected domain and the connected domain background may refer to an optical difference between the connected domain pixel and the non-connected domain pixel adjacent to the connected domain pixel, for example, a ratio of a difference between a gray average value of all defective pixels in the connected domain and a gray average value of pixels around the connected domain to a gray average value of pixels around the connected domain. The pixel points around the connected domain may refer to pixel points within an area region around the connected domain by a predetermined multiple, for example, pixel points within an area region around the connected domain by 1.5 times, where the area region 1.5 times refers to an area region around the connected domain by 1.5 times that of the connected domain. Of course, the gray average value of the pixels around the connected domain may refer to the gray average value of all pixels of the imaging image, and the preset multiple is not specifically limited in the application.

The area of the connected domain may refer to an area formed by all pixel points in the connected domain.

The SEMU value of the connected domain is a mura quantization index obtained according to the contrast between the connected domain and the background of the connected domain and the area of the connected domain, and specifically can be obtained according to the following formula:

Wherein, C _x is the contrast between the connected domain and the background of the connected domain, and S _x is the area of the connected domain.

It should be noted that the above feature factors are only exemplary, and should not be construed as limiting the present application. In actual use, an appropriate feature factor composition feature factor set can be selected according to actual needs and specific application scenarios, and the embodiment of the application is not limited to this.

In the embodiment of the present application, for the feature value corresponding to each mura feature factor, a defect score corresponding to each connected domain may be determined according to the target weight coefficient of each mura feature factor, for example, the gray average value in the connected domain is M, the contrast ratio between the connected domain and the background of the connected domain is C _x, the area of the connected domain is S _x, the SEMU value of the connected domain is SEUM, the circularity of the connected domain is R1, and the rectangular degree of the connected domain is R2. The defect score corresponding to the connected domain may be calculated using the following formula:

Score＝K1*M+K2*C_x+K3*S_x+K4*SEMU+K5*R1+K6*R2

wherein, K1, K2, K3, K4, K5 and K6 are respectively target weight coefficients corresponding to mura characteristic factors, represent importance degrees, generally take values between 0 and 1, and the larger the value is, the more important the value is. Score is a defect Score used to characterize the case of mura corresponding to connected domains, with larger values indicating more severe mura levels.

It should be understood that values of K1, K2, K3, K4, K5, and K6 may be respectively taken as needed, and if a defect area is to be defined from the area of the connected domain, K3 may be set to 1, and other target weight coefficients may be set to 0; if it is desired to define a defective region from the contrast between the connected domain and the connected domain background, K2 may be set to 1, and the other target weight coefficient may be set to 1. Or other considerations, a corresponding value may be set for each target weight coefficient.

Step 502, if the defect score corresponding to the connected domain exceeds the fourth threshold corresponding to the target weight coefficient, determining the connected domain as the defect region.

In the embodiment of the application, the fourth thresholds corresponding to different target weight coefficients are set to be different, for example, when a defect area is to be defined from the area of the connected domain, K3 is set to be1, other target weight coefficients are set to be 0, and at this time, the fourth threshold is an area threshold corresponding to the area of the connected domain; or when the defect region is to be defined from the contrast between the connected domain and the connected domain background, K2 is set to 1, and the other target weight coefficient is set to 0, where the fourth threshold is a contrast threshold corresponding to the contrast between the connected domain and the connected domain background, and the fourth threshold may be the same as the first threshold because the contrast between the connected domain and the connected domain background may refer to an optical difference between a pixel point in the connected domain and a pixel point in a non-connected domain adjacent to the pixel point in the position.

In the embodiment of the application, the value of the fourth threshold is related to the setting of the target weight coefficients, and each setting of the target weight coefficients has a corresponding fourth threshold, so when the defect score corresponding to the connected domain exceeds the fourth threshold corresponding to the target weight coefficient, it is indicated that the defect in the connected domain is serious, and the connected domain can be determined to be a defect region.

Step 303, generating a defect detection map according to the defect area.

In the embodiment of the application, a drawing method can be adopted to draw the defect area in an imaging image in a form of drawing edges of pixel points, so as to generate a defect detection diagram. It should be noted that when drawing the defect area, the defect area is not limited to rectangle, but may be round or irregular shaped drawing, which is not limited by the embodiment of the present application. The generated defect detection diagram can be seen in fig. 6, which shows an interface schematic diagram of the defect detection diagram corresponding to the display screen to be detected, and the block area in the interface is the defect area. The display screen defect detection method and device can be displayed in an intuitive mode, so that a user can intuitively observe the position and the shape of the defect on the display screen to be detected.

In one possible implementation, generating a defect detection map from the defect region may include:

and marking the defect area to generate a defect detection diagram.

In the embodiment of the present application, the defect areas may be marked in the form of numbers according to the size of the score, such as marking the defect areas in fig. 6, where the smaller the number is, the more serious the defect of the marked defect area is; also, in the labeling, the labeling may be performed in such a manner that the more serious the defective area is, the larger the label is, and the present application is not limited to this. It should be noted that the severity of the defect area is obtained according to the magnitude of the score, and the higher the score, the higher the severity of the defect area.

In one possible implementation manner, the labeling is not limited to labeling of numbers, and the feature values corresponding to the feature factors can be labeled on the corresponding defect areas.

Step 103, displaying a defect detection map.

In the embodiment of the application, the generated defect detection diagram can be displayed in the detection equipment for detection, so that a user can visually check the defect, and the problem that the quality inspection result of the display screen in the prior art cannot fit with the actual human eye effect can be solved.

In order to more intuitively show the quality of the display screen to be detected in the form of quantization scores, the method can also show the quality evaluation of the display screen to be detected by judging the display uniformity and classifying the product grades.

Specifically, as a possible implementation manner, the method for detecting display screen defects may further include:

and judging display uniformity and/or classifying products of the display screen to be detected according to at least one of defect scores of defect areas, the number of the defect areas and the positions of the defect areas in the defect detection diagram.

Illustratively, when judging the display uniformity of the display screen to be detected:

Firstly, display uniformity judgment is carried out according to the number of defect areas, for example, if the number of the defect areas is larger than a preset number threshold, the display uniformity is determined to be unqualified, and if the number of the defect areas is smaller than or equal to the preset number threshold, the display uniformity is determined to be qualified.

Second, a display uniformity determination is made based on the average of the defect scores for all defect regions, e.g., the average is greater than a score threshold (e.g., 75), and the display uniformity is determined to be unacceptable, and if the average is less than or equal to the score threshold, the display uniformity is determined to be acceptable.

Thirdly, display uniformity determination is performed according to the positions of the defect areas, for example, if the positions of the defect areas are mostly at the middle positions of the imaging images, the display uniformity is determined to be unqualified, and if the positions of the defect areas are mostly at the edge positions of the imaging images, the display uniformity is determined to be qualified.

It should be noted that any combination of the above three determination methods may be used to determine the uniformity of the display screen to be detected, which is not limited in the embodiment of the present application. For any combination, if any of the display uniformity is not acceptable, the final result may be determined to be unacceptable. Meanwhile, the above three determination methods are merely exemplary, and other determination methods may be adopted, which are not limited in the embodiment of the present application.

Illustratively, in scoring product grades:

First, the defective areas are classified according to the number of defective areas, and if the number of defective areas is greater than T1, the defective areas are classified into 1 type, if the number of defective areas is less than or equal to T1 and greater than T2, the defective areas are classified into 2 type, and if the number of defective areas is less than or equal to T2, the defective areas are classified into 3 type. Among them, the 3 kinds of products are best, the 2 kinds of products are inferior, and the 1 kinds of products are worst.

Secondly, grading is carried out according to the average value of the defect scores of all the defect areas, if the average value is larger than H1, the defect areas are classified into 1 class, if the average value is smaller than or equal to H1 and larger than H2, the defect areas are classified into 2 class, and if the average value is smaller than or equal to T2, the defect areas are classified into 3 class. Among them, the 3 kinds of products are best, the 2 kinds of products are inferior, and the 1 kinds of products are worst.

It should be noted that, the display screen to be detected may be classified according to any combination of the above two classification methods, and when the two classification methods have different results, the poor result is taken as the final result of the display screen to be detected. Meanwhile, the above two classification methods are only exemplary, and other classification methods may be also adopted, which is not limited in the embodiment of the present application.

As a possible implementation manner, when displaying the defect detection diagram, the embodiment of the application may display the average value of the defect scores of all defect areas of the display screen to be detected at corresponding positions such as the lower part or the upper part of the defect detection diagram, and may also display the number of defect areas and the defect score threshold value as detailed detection information at corresponding positions of the defect detection diagram together with the final score as the final score of the display screen to be detected. The method is convenient to display the detected defect area and the final scoring and detailed detection information on the imaging image in a visual display mode, corresponds to the feeling of human eyes when actually observing the screen body of the display screen to be detected, and accords with the visual effect of the human eyes.

Referring to fig. 7, a schematic structural diagram of an apparatus for detecting defects of a display screen according to an embodiment of the present application is shown, and for convenience of explanation, only a portion related to the embodiment of the present application is shown.

The device for detecting the display screen defects specifically comprises the following modules:

the image acquisition module 701 is configured to acquire an acquired image of a display screen to be detected;

A generating module 702, configured to generate a defect detection map according to the acquired image, where the defect detection map includes at least one drawn defect area, the defect area is composed of at least one pixel, and the number of pixels included in different defect areas is the same or different, and an optical difference between the pixels in the defect area is smaller than an optical difference between the pixels in the defect area and the pixels in a non-defect area adjacent to the pixel in the defect area, and the optical difference includes at least one of a brightness difference, a chromaticity difference, and a gray scale difference;

and a display module 703, configured to display the defect detection map.

In an embodiment of the present application, an optical difference between pixel points in the defect area is less than or equal to a first threshold.

In the embodiment of the application, the image acquisition equipment is used for acquiring images and transmitting the images to the electronic equipment for acquisition, and comprises a color camera or a black-and-white camera;

the image acquisition equipment is positioned right above the display screen to be detected, and the defect detection diagram is a defect detection diagram corresponding to the image acquired by the view angle in the positive direction of the display screen to be detected; or (b)

The image acquisition equipment is positioned in the side direction of the display screen to be detected, and the defect detection diagram is a defect detection diagram corresponding to the visual angle acquisition image in the side direction of the display screen to be detected; or (b)

The image acquisition devices are multiple, one of the multiple image acquisition devices is located right above the display screen to be detected, and other image acquisition devices of the multiple image acquisition devices are located in the lateral direction of the display screen to be detected respectively.

In the embodiment of the present application, the generating module 702 may specifically include the following sub-modules:

The imaging acquisition sub-module is used for acquiring an imaging image of a display screen to be detected in the acquired image;

a region determination sub-module for determining a defective region in the imaged image;

and the image generation sub-module is used for generating a defect detection graph according to the defect area.

In the embodiment of the present application, the area determining submodule may specifically include the following units:

A defect determining unit for determining a defect area according to an optical difference between the imaging image and a background image, wherein the background image is an image which does not contain the defect area after the imaging image is processed;

correspondingly, the image generation submodule may specifically comprise the following units:

The marking unit is used for marking the defect area and generating a defect detection chart.

In an embodiment of the present application, in case the optical difference comprises a point-to-point optical difference between the imaged image and the background image, the defect determining unit may specifically be adapted to:

if the point optical difference between the first pixel point in the imaging image and the first pixel point in the background image exceeds a second threshold value, determining the first pixel point as a defective pixel point;

Determining at least one defective pixel point forming area with image positions adjacent in sequence as a connected domain, and obtaining all connected domains in the imaging image, wherein the optical difference between the defective pixel points in the connected domain is smaller than a third threshold value, and the first threshold value and the third threshold value are the same or different under the condition that the connected domain comprises at least two defective pixel points;

Defective areas are determined from all connected domains.

In an embodiment of the application, the defect determining unit may be further configured to:

Determining a defect score corresponding to each connected domain according to the mura characteristic factor set in each connected domain and the target weight coefficient of each mura characteristic factor, wherein the defect score is used for representing the mura condition corresponding to the connected domain;

and if the defect score corresponding to the connected domain exceeds a fourth threshold corresponding to the target weight coefficient, determining the connected domain as a defect region.

In the embodiment of the application, the mura characteristic factor set comprises at least one of a gray average value in a connected domain, a contrast ratio of the connected domain to a connected domain background, an area of the connected domain, a SEMU value of the connected domain, a circularity of the connected domain and a rectangular degree of the connected domain; the SEMU value of the connected domain is a mura quantization index obtained according to the contrast between the connected domain and the background of the connected domain and the area of the connected domain; the contrast of the connected domain and the connected domain background includes an optical difference between the pixel points in the connected domain and the pixel points in the non-connected domain adjacent to the position.

In the embodiment of the application, the device for detecting the display screen defect specifically further comprises the following modules:

The judging module is used for judging the display uniformity and/or classifying the product grades of the display screen to be detected according to at least one of the defect scores of the defect areas, the number of the defect areas and the positions of the defect areas in the defect detection diagram.

The device for detecting display screen defects provided by the embodiment of the application can be applied to the foregoing method embodiment, and details of the device are referred to the description of the foregoing method embodiment and are not repeated herein.

The embodiment of the application also provides a display screen defect detection system, which comprises an acquisition station, acquisition equipment and processing equipment;

the collecting station is used for bearing the display screen to be detected;

the image acquisition equipment is used for acquiring images of the multi-standby detection display screen;

The processing device, including a display and a processor, is configured to implement the method for detecting a defect of a display screen, and details of the method are described in the foregoing embodiments, and are not described herein again.

Fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application. As shown in fig. 8, the electronic device 800 of this embodiment includes: at least one processor 810 (only one shown in fig. 8), a memory 820, and a computer program 821 stored in the memory 820 and executable on the at least one processor 810, the processor 810 implementing the steps in the method embodiments described above for display defect detection when executing the computer program 821.

The electronic device 800 may be a computing device such as a desktop computer, a notebook computer, a palm computer, and a cloud server. The electronic device may include, but is not limited to, a processor 810, a memory 820. It will be appreciated by those skilled in the art that fig. 8 is merely an example of an electronic device 800 and is not intended to limit the electronic device 800, and may include more or fewer components than shown, or may combine certain components, or may include different components, such as input-output devices, network access devices, etc.

The Processor 810 may be a central processing unit (Central Processing Unit, CPU), the Processor 810 may also be other general purpose processors, digital signal processors (DIGITAL SIGNAL processors, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), off-the-shelf Programmable gate array (Field-Programmable GATE ARRAY, FPGA) or other Programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 820 may be an internal storage unit of the electronic device 800 in some embodiments, such as a hard disk or a memory of the electronic device 800. The memory 820 may also be an external storage device of the electronic device 800 in other embodiments, such as a plug-in hard disk, a smart memory card (SMART MEDIA CARD, SMC), a Secure Digital (SD) card, a flash memory card (FLASH CARD), etc. that are provided on the electronic device 800. Further, the memory 820 may also include both internal storage units and external storage devices of the electronic device 800. The memory 820 is used to store an operating system, application programs, boot Loader (Boot Loader), data, and other programs, such as program code of the computer program. The memory 820 may also be used to temporarily store data that has been output or is to be output.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.

In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus/electronic device and method may be implemented in other manners. For example, the apparatus/electronic device embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions in actual implementation, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.

The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated modules/units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth. It should be noted that the computer readable medium contains content that can be appropriately scaled according to the requirements of jurisdictions in which such content is subject to legislation and patent practice, such as in certain jurisdictions in which such content is subject to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.

The present application may also be implemented as a computer program product for implementing all or part of the steps of the method embodiments described above, when the computer program product is run on an electronic device, causing the electronic device to execute the steps of the method embodiments described above.

The above embodiments are only for illustrating the technical solution of the present application, and are not limited thereto. Although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.

Claims

1. A method for display defect detection, the method comprising:

Acquiring an acquired image of a display screen to be detected;

and displaying the defect detection graph.

2. The method for display screen defect detection of claim 1, wherein an optical difference between pixel points in the defective area is less than or equal to a first threshold.

3. The method for display screen defect detection of claim 1, wherein the captured image is acquired by an image capture device comprising a color camera or a black and white camera;

the image acquisition equipment is positioned right above the display screen to be detected, and the defect detection image is a defect detection image corresponding to an image acquired from the front direction visual angle of the display screen to be detected; or (b)

The image acquisition equipment is positioned in the side direction of the display screen to be detected, and the defect detection image is a defect detection image corresponding to the visual angle acquisition image in the side direction of the display screen to be detected; or (b)

The number of the image acquisition devices is multiple, one of the image acquisition devices is located right above the display screen to be detected, and the other image acquisition devices are located in the lateral direction of the display screen to be detected.

4. The method for display screen defect detection of claim 1, wherein the generating a defect detection map from the acquired image comprises:

acquiring an imaging image of a display screen to be detected in the acquired image;

determining a defect region in the imaged image;

And generating the defect detection map according to the defect area.

5. The method for display screen defect detection of claim 4, wherein the determining a defective area in the imaged image comprises:

determining the defect area according to the optical difference between the imaging image and a background image, wherein the background image is an image which does not contain the defect area after the imaging image is processed;

The generating the defect detection map according to the defect area includes:

and marking the defect area to generate the defect detection graph.

6. The method for display screen defect detection of claim 5, wherein the optical differences comprise point-to-point optical differences between the imaged image and the background image; said determining said defect region from an optical difference between said imaged image and said background image, comprising:

Determining at least one defective pixel point forming area with image positions adjacent in sequence as a connected domain, and obtaining all connected domains in the imaging image, wherein the optical difference between the defective pixel points in the connected domain is smaller than a third threshold value, and the third threshold value and the first threshold value are the same or different under the condition that the connected domain comprises at least two defective pixel points;

the defective area is determined from the all connected domains.

7. The method for display screen defect detection of claim 6, wherein the determining the defective area from the all connected areas comprises:

And determining the defect areas from all the connected domains based on the mura conditions corresponding to each connected domain.

8. The method for display screen defect detection of claim 7, wherein the determining the defective area from all target connected areas based on a mura condition corresponding to each connected area comprises:

and if the defect score corresponding to the connected domain exceeds a fourth threshold corresponding to the target weight coefficient, determining the connected domain as the defect region.

9. The method for display screen defect detection of claim 8, wherein the mura feature factor set includes at least one of a gray-scale average within the connected domain, a contrast of the connected domain with the connected domain background, an area of the connected domain, SEMU value of the connected domain, circularity of the connected domain, and rectangular degree of the connected domain; the SEMU value of the connected domain is a mura quantization index obtained according to the contrast of the connected domain and the background of the connected domain and the area of the connected domain; the contrast of the connected domain and the connected domain background comprises the optical difference between the pixel points in the connected domain and the adjacent pixel points in the non-connected domain.

10. The method for display screen defect detection of any of claims 1-8, wherein the method further comprises:

And judging display uniformity and/or classifying product grades of the display screen to be detected according to at least one of the defect scores of the defect areas, the number of the defect areas and the positions of the defect areas in the defect detection diagram.

11. An apparatus for display defect detection, the apparatus comprising:

and the display module is used for displaying the defect detection graph.

12. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the method of any one of claims 1 to 10 when executing the computer program.

13. A display screen defect detection system, the system comprising:

the collecting station is used for bearing the display screen to be detected;

the image acquisition equipment is used for acquiring images of the display screen to be detected;

A processing device comprising a display and a processor for implementing the method of any of claims 1 to 10.