CN118219442A - Semiconductor processing cutting equipment - Google Patents
Semiconductor processing cutting equipment Download PDFInfo
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- CN118219442A CN118219442A CN202410509261.XA CN202410509261A CN118219442A CN 118219442 A CN118219442 A CN 118219442A CN 202410509261 A CN202410509261 A CN 202410509261A CN 118219442 A CN118219442 A CN 118219442A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/023—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a cutting blade mounted on a carriage
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/029—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a plurality of cutting blades
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/10—Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working
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Abstract
Description
技术领域Technical Field
本发明涉及半导体加工设备领域,更具体地说,涉及一种半导体加工用切割装置。The present invention relates to the field of semiconductor processing equipment, and more particularly to a cutting device for semiconductor processing.
背景技术Background technique
晶圆切割是芯片制造过程中不可或缺的过程,属于晶圆制造的后一个过程。晶圆切割是将芯片的整个晶圆根据芯片的大小分成单个芯片,高速旋转的金刚石刀片将晶圆切割成单独的晶圆颗粒,形成独立的单晶,为后续工艺做准备。Wafer dicing is an indispensable process in chip manufacturing and belongs to the last process of wafer manufacturing. Wafer dicing is to divide the entire wafer of the chip into individual chips according to the size of the chip. The high-speed rotating diamond blade cuts the wafer into individual wafer particles to form independent single crystals, preparing for subsequent processes.
传统的晶圆切割设备切割过程中,需要使得刀具和用来承载晶圆的承片台进行复杂的符合运动才能形成网状的切缝,对切割片运动轨迹的控制难度较大,同时由于切割片的运动轨迹复杂对切割产生的碎屑清理不方便。During the cutting process of traditional wafer cutting equipment, the tool and the wafer carrier need to perform complex matching movements to form a mesh-like cut. It is difficult to control the movement trajectory of the cutting blade. At the same time, the complex movement trajectory of the cutting blade makes it inconvenient to clean the debris generated by cutting.
本申请提供一种半导体加工用切割装置,进行分步切割同时对晶圆进行充分的冲洗清理。The present application provides a cutting device for semiconductor processing, which performs step-by-step cutting and fully rinses and cleans the wafer at the same time.
发明内容Summary of the invention
1.要解决的技术问题1. Technical issues to be solved
针对现有技术中存在的问题,本发明的目的在于提供一种半导体加工用切割装置,可以实现对晶圆的分布切割同时在切割过程中和转移过程中对晶圆表面及切缝内的碎屑进行充分的离心冲洗,保证切割质量和清理效果。In view of the problems existing in the prior art, the purpose of the present invention is to provide a cutting device for semiconductor processing, which can realize distributed cutting of wafers and at the same time fully centrifuge the debris on the wafer surface and in the cut during the cutting and transfer processes to ensure the cutting quality and cleaning effect.
为解决上述问题,本发明采用如下的技术方案。To solve the above problems, the present invention adopts the following technical solutions.
一种半导体加工用切割装置,包括底座,底座上固定连接有安装筒,安装筒上端转动连接有承载盘,承载盘连接有驱动其转动的驱动机构;承载盘上安装有用来吸附固定晶圆的承片台;承载盘左侧安装有横切机构,承载盘前侧安装有纵切机构,横切机构和纵切机构结构相同且设置方向垂直;A cutting device for semiconductor processing, comprising a base, a mounting cylinder fixedly connected to the base, a carrying plate rotatably connected to the upper end of the mounting cylinder, and a driving mechanism driving the carrying plate to rotate; a wafer stage for adsorbing and fixing a wafer is installed on the carrying plate; a cross-cutting mechanism is installed on the left side of the carrying plate, and a longitudinal cutting mechanism is installed on the front side of the carrying plate, and the cross-cutting mechanism and the longitudinal cutting mechanism have the same structure and are arranged in perpendicular directions;
横切机构包括与安装筒固定连接且延伸至承载盘上方的安装罩,安装罩内安装有分切刀辊,分切刀辊转动连接有与安装罩滑动连接的移动架,移动架连接有驱动其沿着安装罩设置方向水平移动的水平丝杆组件;分切刀辊一端延伸至移动架外侧并通过传动齿轮组连接有高速电机;安装罩上部安装有与承片台相对设置的喷淋盘,喷淋盘与外部供液机构连通,外部供液机构将去离子水注入到喷淋盘内;The cross-cutting mechanism includes a mounting cover fixedly connected to the mounting cylinder and extending above the carrier plate, a slitting knife roller is installed in the mounting cover, the slitting knife roller is rotatably connected to a moving frame slidably connected to the mounting cover, and the moving frame is connected to a horizontal screw rod assembly that drives it to move horizontally along the setting direction of the mounting cover; one end of the slitting knife roller extends to the outside of the moving frame and is connected to a high-speed motor through a transmission gear set; a spray plate arranged opposite to the wafer carrier is installed on the upper part of the mounting cover, the spray plate is connected to an external liquid supply mechanism, and the external liquid supply mechanism injects deionized water into the spray plate;
承片台下端固定连接有延伸至承载盘下方并与其转动连接的转动轴,转动轴下端固定连接有滚动齿轮,滚动齿轮啮合有与安装筒固定连接的固定齿轮环;安装筒上部开设有用来承载废液的环形槽,承载盘位于承片台外侧设有供废液下流的网孔,网孔与环形槽相对设置。The lower end of the wafer platform is fixedly connected to a rotating shaft that extends to the bottom of the carrying plate and is rotatably connected to it. The lower end of the rotating shaft is fixedly connected to a rolling gear, and the rolling gear is meshed with a fixed gear ring that is fixedly connected to the mounting cylinder. The upper part of the mounting cylinder is provided with an annular groove for carrying waste liquid, and the carrying plate is located on the outer side of the wafer platform and is provided with a mesh for waste liquid to flow down, and the mesh is arranged opposite to the annular groove.
作为本发明进一步的方案,分切刀辊包括辊轴以及等距分布在辊轴上的刀片,辊轴位于刀片两侧开设有朝向刀片的喷孔,辊轴外端通过旋转接头与外部供液机构连通。As a further solution of the present invention, the slitting roller includes a roller shaft and blades equidistantly distributed on the roller shaft. The roller shaft is provided with spray holes facing the blades on both sides of the blades, and the outer end of the roller shaft is connected to an external liquid supply mechanism through a rotating joint.
作为本发明进一步的方案:承载盘上开设有呈圆周等距分布的集屑槽,集屑槽的底板上开设有均匀分布的漏液孔,承片台安装在集屑槽内。As a further solution of the present invention: the carrier plate is provided with chip collecting grooves which are equidistantly distributed in a circumference, the bottom plate of the chip collecting groove is provided with evenly distributed liquid leakage holes, and the wafer support table is installed in the chip collecting groove.
作为本发明进一步的方案:安装罩为下端开口的矩形罩,安装罩套设在集屑槽上方,安装罩下端抵接在承载盘上并与承载盘滑动抵接。As a further solution of the present invention: the mounting cover is a rectangular cover with an opening at the lower end, the mounting cover is sleeved above the chip collecting groove, and the lower end of the mounting cover abuts against the carrying plate and slides against the carrying plate.
作为本发明进一步的方案:环形槽为上端开口的环形凹槽,漏液孔均设置在环形槽的正上方,环形槽连通有排液管。As a further solution of the present invention: the annular groove is an annular groove with an opening at the upper end, the leakage holes are all arranged directly above the annular groove, and the annular groove is connected to a drainage pipe.
作为本发明进一步的方案:固定齿轮环通过固定杆与环形槽内壁固定连接。As a further solution of the present invention: the fixed gear ring is fixedly connected to the inner wall of the annular groove through a fixed rod.
作为本发明进一步的方案:驱动机构包括与承载盘下端中心位置固定连接并延伸至安装筒内的支撑轴,支撑轴通过蜗轮蜗杆组件连接有驱动电机。As a further solution of the present invention: the driving mechanism includes a supporting shaft fixedly connected to the center position of the lower end of the carrier plate and extending into the mounting cylinder, and the supporting shaft is connected to the driving motor through a worm gear assembly.
作为本发明进一步的方案:移动架呈门字型框架结构且其下端延伸至安装罩内,安装罩两侧外壁上开设有供移动架滑动的矩形通槽。As a further solution of the present invention: the movable frame is a door-shaped frame structure and its lower end extends into the installation cover, and rectangular through grooves for the movable frame to slide are opened on the outer walls on both sides of the installation cover.
作为本发明进一步的方案:水平丝杆组件包括滑槽架、安装在滑槽架内并与移动架上部螺纹连接的丝杆以及与丝杆连接的丝杆电机。As a further solution of the present invention: the horizontal screw rod assembly includes a slide slot frame, a screw rod installed in the slide slot frame and threadedly connected to the upper part of the movable frame, and a screw rod motor connected to the screw rod.
作为本发明进一步的方案:刀片两侧设有两组呈圆周等距分布的喷孔,位于刀片两侧的喷孔相对倾斜设置。As a further solution of the present invention: two groups of spray holes are arranged on both sides of the blade and are equidistantly distributed in a circumference, and the spray holes on both sides of the blade are arranged to be inclined relative to each other.
相比于现有技术,本发明的优点在于:Compared with the prior art, the advantages of the present invention are:
(1)本发明通过设有转动的承载盘以及安装在承载盘上自转的承片台,实现晶圆的横切和纵切的分步进行,同时配合分切刀辊的往复移动,减少刀具的移动轨迹,保证切割精度同时提高切割效率,降低控制难度,并且通过设有喷淋头,在切割过程中以及在转移晶圆过程中对晶圆表面和切缝内侧进行离心冲洗,避免废液和碎屑残留在晶圆表面和切缝内侧,提高清洁效果,便于后续处理。(1) The present invention realizes the step-by-step cross-cutting and longitudinal cutting of the wafer by providing a rotating carrier plate and a wafer stage installed on the carrier plate and rotating. At the same time, the reciprocating movement of the slitting knife roller is coordinated to reduce the movement trajectory of the knife, thereby ensuring the cutting accuracy and improving the cutting efficiency, reducing the control difficulty, and providing a spray head to centrifugally rinse the wafer surface and the inner side of the slit during the cutting process and the wafer transfer process, thereby avoiding waste liquid and debris from remaining on the wafer surface and the inner side of the slit, improving the cleaning effect, and facilitating subsequent processing.
(2)本发明通过设有开设有集屑槽的承载盘、开设有环形槽的安装筒以及安装在其内侧且连接有转动轴的承片台,与安装罩配合,对废液和碎屑进行集中收集和排放,避免碎屑和废液飞溅。(2) The present invention is provided with a carrier plate with a chip collecting groove, a mounting cylinder with an annular groove, and a wafer support table installed on the inner side thereof and connected to a rotating shaft, which cooperate with the mounting cover to centrally collect and discharge waste liquid and debris to avoid splashing of debris and waste liquid.
(3)本发明通过设有固定在承片台下方的滚动齿轮以及与其配合的固定齿轮环,保证晶圆在横切机构和纵切机构之间转移后使得横向切缝与刀片垂直,保证形成网状的切缝,实现切片作业;同时,与喷淋头配合,自转承片台产生的离心力使得废液和碎屑快速脱离晶圆,具有较好的清洁效果。(3) The present invention is provided with a rolling gear fixed under the wafer stage and a fixed gear ring matched therewith, so as to ensure that the transverse cut is perpendicular to the blade after the wafer is transferred between the transverse cutting mechanism and the longitudinal cutting mechanism, thereby ensuring the formation of a mesh-like cut and realizing the slicing operation; at the same time, in cooperation with the spray head, the centrifugal force generated by the self-rotating wafer stage allows the waste liquid and debris to quickly separate from the wafer, thereby achieving a better cleaning effect.
(4)本发明通过设有空心的辊轴以及设置在刀片两侧的喷孔,使得去离子水在刀片表面快速的扩散,提高冷却和去屑的效果。(4) The present invention provides a hollow roller shaft and spray holes on both sides of the blade, so that deionized water can be quickly diffused on the surface of the blade, thereby improving the cooling and chip removal effects.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为本发明的左侧视角的立体结构示意图;FIG1 is a schematic diagram of a three-dimensional structure of the present invention from a left side perspective;
图2为本发明的右侧视角的立体结构示意图;FIG2 is a schematic diagram of the three-dimensional structure of the present invention from the right side viewing angle;
图3为本发明的横向剖视结构示意图;FIG3 is a schematic diagram of a transverse cross-sectional structure of the present invention;
图4为图3中A处的放大结构示意图;FIG4 is an enlarged schematic diagram of the structure at A in FIG3 ;
图5为本发明的纵向剖视结构示意图;FIG5 is a schematic diagram of a longitudinal cross-sectional structure of the present invention;
图6为本发明中承载盘的立体结构示意图;FIG6 is a schematic diagram of the three-dimensional structure of the carrier plate in the present invention;
图7为本发明中承片台和安装筒的装配结构示意图;FIG7 is a schematic diagram of the assembly structure of the wafer carrier and the mounting cylinder in the present invention;
图8为本发明中横切机构的立体结构示意图;FIG8 is a schematic diagram of the three-dimensional structure of the cross-cutting mechanism of the present invention;
图9为本发明中分切刀辊的装配结构示意图;FIG9 is a schematic diagram of the assembly structure of the slitting knife roller in the present invention;
图10为本发明中分切刀辊的剖视结构示意图;FIG10 is a schematic cross-sectional view of the slitting roller of the present invention;
图11为本发明中图10中B处的放大结构示意图。FIG. 11 is an enlarged structural schematic diagram of point B in FIG. 10 of the present invention.
图中标号说明:1、底座;2、安装筒;201、环形槽;3、承载盘;301、集屑槽;302、漏液孔;4、承片台;5、晶圆;6、横切机构;7、纵切机构;8、支撑轴;9、蜗轮蜗杆组件;10、驱动电机;11、安装罩;12、分切刀辊;1201、辊轴;1202、刀片;1203、喷孔;13、移动架;14、水平丝杆组件;15、喷淋盘;16、转动轴;17、滚动齿轮;18、固定齿轮环;19、固定杆;20、高速电机。Explanation of the numbers in the figure: 1. Base; 2. Mounting cylinder; 201. Annular groove; 3. Carrying plate; 301. Chip collecting groove; 302. Leakage hole; 4. Wafer table; 5. Wafer; 6. Cross-cutting mechanism; 7. Longitudinal cutting mechanism; 8. Support shaft; 9. Worm gear assembly; 10. Driving motor; 11. Mounting cover; 12. Slitting roller; 1201. Roller shaft; 1202. Blade; 1203. Spray hole; 13. Moving frame; 14. Horizontal screw assembly; 15. Spray plate; 16. Rotating shaft; 17. Rolling gear; 18. Fixed gear ring; 19. Fixed rod; 20. High-speed motor.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述;显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例,基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention; it is obvious that the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments, and all other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making creative work are within the scope of protection of the present invention.
在本发明的描述中,需要说明的是,术语“上”、“下”、“内”、“外”、“顶/底端”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本发明和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本发明的限制。此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性。In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "top/bottom" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.
在本发明的描述中,需要说明的是,除非另有明确的规定和限定,术语“安装”、“设置有”、“套设/接”、“连接”等,应做广义理解,例如“连接”,可以是固定连接,也可以是可拆卸连接,或一体地连接;可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通。对于本领域的普通技术人员而言,可以具体情况理解上述术语在本发明中的具体含义。In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "provided with", "mounted/connected", "connected", etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
请参阅图1-9,在本发明的一个实施例中,一种半导体加工用切割装置,包括底座1,底座1上固定连接有安装筒2,安装筒2上端转动连接有承载盘3,承载盘3连接有驱动其转动的驱动机构;承载盘3上安装有用来吸附固定晶圆5的承片台4;承载盘3左侧安装有横切机构6,承载盘3前侧安装有纵切机构7,横切机构6和纵切机构7结构相同且设置方向垂直;Please refer to FIGS. 1-9 . In one embodiment of the present invention, a semiconductor processing cutting device includes a base 1, a mounting cylinder 2 is fixedly connected to the base 1, a carrier plate 3 is rotatably connected to the upper end of the mounting cylinder 2, and the carrier plate 3 is connected to a driving mechanism for driving the rotation thereof; a wafer stage 4 for adsorbing and fixing a wafer 5 is installed on the carrier plate 3; a cross-cutting mechanism 6 is installed on the left side of the carrier plate 3, and a longitudinal cutting mechanism 7 is installed on the front side of the carrier plate 3, and the cross-cutting mechanism 6 and the longitudinal cutting mechanism 7 have the same structure and are arranged in perpendicular directions;
横切机构6包括与安装筒2固定连接且延伸至承载盘3上方的安装罩11,安装罩11内安装有分切刀辊12,分切刀辊12转动连接有与安装罩11滑动连接的移动架13,移动架13连接有驱动其沿着安装罩11设置方向水平移动的水平丝杆组件14;分切刀辊12一端延伸至移动架13外侧并通过传动齿轮组连接有高速电机20;安装罩11上部安装有与承片台4相对设置的喷淋盘15,喷淋盘15与外部供液机构连通,外部供液机构将去离子水注入到喷淋盘15内;The cross-cutting mechanism 6 includes a mounting cover 11 fixedly connected to the mounting cylinder 2 and extending above the carrier plate 3, a slitting knife roller 12 is installed in the mounting cover 11, the slitting knife roller 12 is rotatably connected to a moving frame 13 slidably connected to the mounting cover 11, and the moving frame 13 is connected to a horizontal screw rod assembly 14 that drives it to move horizontally along the setting direction of the mounting cover 11; one end of the slitting knife roller 12 extends to the outside of the moving frame 13 and is connected to a high-speed motor 20 through a transmission gear set; a spray plate 15 arranged opposite to the wafer carrier 4 is installed on the upper part of the mounting cover 11, and the spray plate 15 is connected to an external liquid supply mechanism, and the external liquid supply mechanism injects deionized water into the spray plate 15;
承片台4下端固定连接有延伸至承载盘3下方并与其转动连接的转动轴16,转动轴16下端固定连接有滚动齿轮17,滚动齿轮17啮合有与安装筒2固定连接的固定齿轮环18;安装筒2上部开设有用来承载废液的环形槽201,承载盘3位于承片台4外侧设有供废液下流的网孔,网孔与环形槽201相对设置。The lower end of the wafer support platform 4 is fixedly connected to a rotating shaft 16 extending to the bottom of the supporting plate 3 and rotatably connected thereto, the lower end of the rotating shaft 16 is fixedly connected to a rolling gear 17, and the rolling gear 17 is meshed with a fixed gear ring 18 fixedly connected to the mounting cylinder 2; an annular groove 201 for carrying waste liquid is provided on the upper part of the mounting cylinder 2, and the supporting plate 3 is located on the outer side of the wafer support platform 4 and is provided with a mesh for waste liquid to flow downstream, and the mesh is arranged opposite to the annular groove 201.
具体的,在进行晶圆5的切割时,第一,通过外部机械臂将贴膜后的晶圆5放置在承载盘3上的承片台4上,承片台4对贴膜后的晶圆5进行吸附;启动驱动机构,驱动机构带动承载盘3转动,承载盘3将吸附有晶圆5的承片台4转动到横切机构6的下方,关闭驱动机构;Specifically, when the wafer 5 is cut, first, the wafer 5 after film bonding is placed on the wafer table 4 on the carrier plate 3 by an external robot arm, and the wafer table 4 adsorbs the wafer 5 after film bonding; the driving mechanism is started, and the driving mechanism drives the carrier plate 3 to rotate, and the carrier plate 3 rotates the wafer table 4 adsorbing the wafer 5 to the bottom of the cross-cutting mechanism 6, and the driving mechanism is closed;
启动高速电机20、水平丝杆组件14和外部供液机构;高速电机20通过传动齿轮组带动分切刀辊12高速转动,同时,水平丝杆组件14带动移动架13及其上的分切刀辊12横向往复移动,对于晶圆5进行横向往复切割,通过分切刀辊12在晶圆5上形成等距分布的切缝;在切割的同时,外部供液机构将去离子水注入到喷淋盘15,对切割的分切刀辊12进行喷淋冷却,对切割后的堆积在晶圆5上的碎屑进行冲洗,关闭高速电机20和水平丝杆组件14;Start the high-speed motor 20, the horizontal screw assembly 14 and the external liquid supply mechanism; the high-speed motor 20 drives the slitting roller 12 to rotate at a high speed through the transmission gear set, and at the same time, the horizontal screw assembly 14 drives the moving frame 13 and the slitting roller 12 thereon to move back and forth horizontally, and performs horizontal reciprocating cutting on the wafer 5, and forms equidistantly distributed slits on the wafer 5 through the slitting roller 12; while cutting, the external liquid supply mechanism injects deionized water into the spray plate 15, sprays and cools the cut slitting roller 12, and washes the debris accumulated on the wafer 5 after cutting, and then turns off the high-speed motor 20 and the horizontal screw assembly 14;
启动驱动机构,驱动机构带动承载盘3转动九十度,使得承片台4带动横切后的晶圆5移动到纵切机构7下方,在此转移过程中,滚动齿轮17在固定齿轮环18上滚动,滚动齿轮17通过转动轴16带动承片台4做圆周转动,同时喷淋盘15喷出的去离子水持续对转动的晶圆5进行冲洗,利用离心力使得含有碎屑的废液在离心力作用下脱离晶圆5表面及横切缝,保证晶圆5在纵切时表面及横切缝处均没有碎屑,保证切割质量;另外,在转移过程中,滚动齿轮17带动承片台4转动了二百七十度,使得晶圆5的横切缝与纵切机构7的分切刀辊12平行;The driving mechanism is started, and the driving mechanism drives the carrier plate 3 to rotate ninety degrees, so that the wafer stage 4 drives the wafer 5 after cross-cutting to move to the bottom of the longitudinal cutting mechanism 7. During this transfer process, the rolling gear 17 rolls on the fixed gear ring 18, and the rolling gear 17 drives the wafer stage 4 to rotate in a circle through the rotating shaft 16. At the same time, the deionized water sprayed by the spray plate 15 continuously rinses the rotating wafer 5, and the waste liquid containing debris is separated from the surface and the cross-cut seam of the wafer 5 by the centrifugal force, so as to ensure that there is no debris on the surface and the cross-cut seam of the wafer 5 during longitudinal cutting, so as to ensure the cutting quality; in addition, during the transfer process, the rolling gear 17 drives the wafer stage 4 to rotate two hundred and seventy degrees, so that the cross-cut seam of the wafer 5 is parallel to the slitting roller 12 of the longitudinal cutting mechanism 7;
同理启动纵切机构7,对横切后的晶圆5进行纵切,在晶圆5上切割形成等距分布的纵向切缝,完成切割,关闭纵切机构7;Similarly, the longitudinal cutting mechanism 7 is started to longitudinally cut the wafer 5 after the cross-cutting, and longitudinal slits are formed on the wafer 5 with equal distances. After the cutting is completed, the longitudinal cutting mechanism 7 is closed.
再次启动驱动机构,使得承载盘3带动切割完成后的晶圆5转动九十度,脱离纵切机构7,脱离过程中通过外部供液机构进行二次离心冲洗,保证切割后的晶圆的清洁度;然后通过外部机械臂进行下料。The driving mechanism is started again, so that the carrier plate 3 drives the wafer 5 after cutting to rotate 90 degrees and separate from the longitudinal cutting mechanism 7. During the separation process, a secondary centrifugal flushing is performed through the external liquid supply mechanism to ensure the cleanliness of the cut wafer; then the material is unloaded through the external robotic arm.
传统的晶圆切割机采用刀具和承片台的复合运动实现晶圆的分片切割,刀具和承片台的运动轨迹复杂,控制难度较大,本申请提供的技术方案通过转动的承载盘3、自转的承片台4以及包括分切刀辊的横切机构6和纵切机构7,实现横切和纵切的分步进行,分切刀辊12只需横向往复移动和纵向往复移动,移动轨迹简单,同时保证切割的精度和稳定性;同时,在切割过程和切割的间隙对晶圆5进行离心冲洗,进一步保证切割精度和晶圆切割后的洁净度。Traditional wafer cutting machines use the combined movement of a tool and a wafer stage to achieve wafer slicing. The movement trajectories of the tool and the wafer stage are complex and difficult to control. The technical solution provided in the present application achieves step-by-step transverse and longitudinal cutting through a rotating carrier plate 3, a self-rotating wafer stage 4, and a transverse cutting mechanism 6 and a longitudinal cutting mechanism 7 including a slitting knife roller. The slitting knife roller 12 only needs to move back and forth horizontally and vertically, and the movement trajectory is simple, while ensuring the cutting accuracy and stability. At the same time, the wafer 5 is centrifugally rinsed during the cutting process and in the interval between cutting to further ensure the cutting accuracy and the cleanliness of the wafer after cutting.
请参阅图6和图7,在本实施例中,承载盘3上开设有呈圆周等距分布的集屑槽301,集屑槽301的底板上开设有均匀分布的漏液孔302,承片台4安装在集屑槽301内。Please refer to FIG. 6 and FIG. 7 . In this embodiment, the carrier plate 3 is provided with chip collecting grooves 301 which are evenly spaced around the circumference. The bottom plate of the chip collecting groove 301 is provided with evenly distributed liquid leakage holes 302 . The wafer support table 4 is installed in the chip collecting groove 301 .
具体的,方便收集切割后产生的废液。Specifically, it is convenient to collect the waste liquid generated after cutting.
请参阅图2、图3和图8,在本实施例中,安装罩11为下端开口的矩形罩,安装罩11套设在集屑槽301上方,安装罩11下端抵接在承载盘3上并与承载盘3滑动抵接。Please refer to Figures 2, 3 and 8. In this embodiment, the mounting cover 11 is a rectangular cover with an open lower end. The mounting cover 11 is sleeved above the chip collecting groove 301. The lower end of the mounting cover 11 abuts against the carrier plate 3 and slides against the carrier plate 3.
具体的,避免废液飞溅溢出。Specifically, avoid splashing and overflowing of waste liquid.
请参阅图5和图7,在本实施例中,环形槽201为上端开口的环形凹槽,漏液孔302均设置在环形槽201的正上方,环形槽201连通有排液管。Please refer to FIG. 5 and FIG. 7 . In the present embodiment, the annular groove 201 is an annular groove with an upper opening. The leakage holes 302 are all arranged right above the annular groove 201 . The annular groove 201 is connected to a drainage pipe.
具体的,方便收集废液并通过排液管进行集中排液。Specifically, it is convenient to collect waste liquid and drain it centrally through the drainage pipe.
请参阅图7,在本实施例中,固定齿轮环18通过固定杆19与环形槽201内壁固定连接。Please refer to FIG. 7 . In this embodiment, the fixed gear ring 18 is fixedly connected to the inner wall of the annular groove 201 via a fixing rod 19 .
具体的,保证滚动齿轮17在固定齿轮环18上滚动的稳定性。Specifically, the rolling stability of the rolling gear 17 on the fixed gear ring 18 is ensured.
请参阅图3,在本实施例中,驱动机构包括与承载盘3下端中心位置固定连接并延伸至安装筒2内的支撑轴8,支撑轴8通过蜗轮蜗杆组件9连接有驱动电机10。Please refer to FIG. 3 . In this embodiment, the driving mechanism includes a supporting shaft 8 fixedly connected to the center of the lower end of the carrier plate 3 and extending into the mounting tube 2 . The supporting shaft 8 is connected to a driving motor 10 via a worm gear assembly 9 .
具体的,驱动电机10通过蜗轮蜗杆组件9带动支撑轴8转动,支撑轴8带动承载盘3转动,实现承片台4和其上晶圆5的稳定转移。Specifically, the driving motor 10 drives the support shaft 8 to rotate through the worm gear assembly 9, and the support shaft 8 drives the carrier plate 3 to rotate, thereby achieving stable transfer of the wafer stage 4 and the wafer 5 thereon.
请参阅图8和图9,在本实施例中,移动架13呈门字型框架结构且其下端延伸至安装罩11内,安装罩11两侧外壁上开设有供移动架13滑动的矩形通槽。Please refer to FIG. 8 and FIG. 9 . In this embodiment, the movable frame 13 is a door-shaped frame structure and its lower end extends into the mounting cover 11 . The outer walls on both sides of the mounting cover 11 are provided with rectangular through grooves for the movable frame 13 to slide.
请参阅图3和图5,在本实施例中,水平丝杆组件14包括滑槽架、安装在滑槽架内并与移动架13上部螺纹连接的丝杆以及与丝杆连接的丝杆电机。Please refer to FIG. 3 and FIG. 5 . In this embodiment, the horizontal screw rod assembly 14 includes a slide slot frame, a screw rod installed in the slide slot frame and threadedly connected to the upper portion of the moving frame 13 , and a screw rod motor connected to the screw rod.
具体的,水平丝杆组件14带动移动架13沿着安装罩11稳定移动。Specifically, the horizontal screw rod assembly 14 drives the moving frame 13 to move stably along the mounting cover 11 .
请参阅图1和图9-11,在本发明的另一个实施例中,分切刀辊12包括辊轴1201以及等距分布在辊轴1201上的刀片1202,辊轴1201位于刀片1202两侧开设有朝向刀片1202的喷孔1203,辊轴1201外端通过旋转接头与外部供液机构连通。Please refer to Figures 1 and 9-11. In another embodiment of the present invention, the slitting roller 12 includes a roller shaft 1201 and blades 1202 equidistantly distributed on the roller shaft 1201. The roller shaft 1201 is located on both sides of the blades 1202 and has spray holes 1203 facing the blades 1202. The outer end of the roller shaft 1201 is connected to an external liquid supply mechanism through a rotating joint.
具体的,在进行切割时,外部供液机构将去离子水注入到风切刀辊12内并从喷孔1203喷吹,通过去离子水对辊轴1201进行冷却,同时将去离子水喷射到转动的刀片1202上,使得去离子水在离心力作用下均匀的在刀片1202表面扩散,加强刀片1202的散热,同时,刀片1202与晶圆5接触切割位置始终具有充足的去离子水,提高冷却和去屑效果。Specifically, when cutting, the external liquid supply mechanism injects deionized water into the wind cutting roller 12 and sprays it from the nozzle 1203, so that the roller shaft 1201 is cooled by the deionized water, and the deionized water is sprayed onto the rotating blade 1202, so that the deionized water is evenly diffused on the surface of the blade 1202 under the action of centrifugal force, thereby enhancing the heat dissipation of the blade 1202. At the same time, the cutting position where the blade 1202 contacts the wafer 5 always has sufficient deionized water, thereby improving the cooling and chip removal effects.
请参阅图11,在本实施例中,刀片1202两侧设有两组呈圆周等距分布的喷孔1203,位于刀片1202两侧的喷孔1203相对倾斜设置。Please refer to FIG. 11 . In this embodiment, two groups of spray holes 1203 are arranged on both sides of the blade 1202 and are equidistantly distributed in a circumference. The spray holes 1203 on both sides of the blade 1202 are arranged to be inclined relative to each other.
具体的,提高去离子水的扩散效果。Specifically, the diffusion effect of deionized water is improved.
以上所述,仅为本发明较佳的具体实施方式;但本发明的保护范围并不局限于此。任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,根据本发明的技术方案及其改进构思加以等同替换或改变,都应涵盖在本发明的保护范围内。The above is only a preferred specific implementation of the present invention; however, the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical solution and its improved conception within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.
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