CN118091523B

CN118091523B - Detection circuit, detection equipment and detection method

Info

Publication number: CN118091523B
Application number: CN202410502903.3A
Authority: CN
Inventors: 王珂; 彭克来
Original assignee: Contemporary Amperex Technology Co Ltd
Current assignee: Contemporary Amperex Technology Co Ltd
Priority date: 2024-04-25
Filing date: 2024-04-25
Publication date: 2024-08-30
Anticipated expiration: 2044-04-25
Also published as: CN118091523A

Abstract

The application discloses a detection circuit, detection equipment and a detection method, wherein the detection circuit comprises: a first connection end; a second connection end; the spot detection sub-circuit is electrically connected between the first connecting end and the second connecting end and comprises a first branch and a second branch which are connected in parallel, wherein the first branch comprises a capacitive element and a first switch unit which are electrically connected, and the second branch comprises a voltage dividing element and a second switch unit which are electrically connected; in the spot inspection stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted. The application can realize the detection of faults and/or measurement accuracy of the insulation voltage withstand test equipment.

Description

Detection circuit, detection equipment and detection method

Technical Field

The present application relates to the field of battery technologies, and in particular, to a detection circuit, a detection device, and a detection method.

Background

Along with the rapid development of energy storage industry, the energy storage electric box plays an increasingly important role on the power supply side, the power grid side and the load side of a power system. In order to improve the safety of the energy storage electric box, the electrical parameters of the energy storage electric box are usually required to be measured through insulation and voltage withstand test equipment. However, the insulation withstand voltage test apparatus itself may have a problem of malfunction or inaccurate measurement.

Disclosure of Invention

The application provides a detection circuit, a detection device and a detection method, which can detect faults and/or measurement accuracy of insulation voltage withstand test equipment.

In a first aspect, the present application provides a detection circuit comprising: a first connection end; a second connection end; the spot detection sub-circuit is electrically connected between the first connecting end and the second connecting end and comprises a first branch and a second branch which are connected in parallel, wherein the first branch comprises a capacitive element and a first switch unit which are electrically connected, and the second branch comprises a voltage dividing element and a second switch unit which are electrically connected; in the spot inspection stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted.

In the technical scheme of the embodiment of the application, the detection circuit is provided with a spot detection sub-circuit, the spot detection sub-circuit is electrically connected between the first connecting end and the second connecting end, and the spot detection sub-circuit comprises a capacitive element and a voltage dividing element which are connected in parallel and can simulate a circuit in an electric box to be detected; in the spot inspection stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted so that the insulation voltage withstand test equipment can measure the electrical parameters of the spot inspection sub-circuit; if the measured electrical parameters of the insulation voltage testing equipment are not matched with the electrical parameters of the known spot inspection sub-circuit, the insulation voltage testing equipment can be indicated to have faults or the measurement accuracy of the insulation voltage testing equipment is lower, so that the faults and/or the measurement accuracy of the insulation voltage testing equipment are detected.

In some embodiments, the detection circuit further includes a processor, where the processor is electrically connected to the insulation voltage withstanding test device, and the processor is configured to obtain a test result of the insulation voltage withstanding test device in the spot inspection stage, compare the test result with a reference result, and determine that a measurement state of the insulation voltage withstanding test device meets a requirement when a difference between the test result and the reference result is less than or equal to a first preset threshold.

In some embodiments, the spot-check sub-circuit includes a plurality of first branches connected in parallel, the capacitive elements in the plurality of first branches having different capacitance values; in the point detection stage, a first switch unit in a first target branch circuit in a plurality of first branch circuits is conducted.

In some embodiments, the point detection sub-circuit includes a plurality of second branches connected in parallel, and the resistances of the voltage dividing elements in the plurality of second branches are different; in the point detection stage, a second switch unit in a second target branch circuit in the plurality of second branch circuits is conducted.

In some embodiments, the second target branch includes at least two second branches, and in the point detection stage, the second switching units in the at least two second branches are turned on in a time-sharing manner.

In some embodiments, the detection circuit further comprises: a third connection end; a fourth connection end; the detection instrument is electrically connected between the third connecting end and the fourth connecting end; in the first measuring stage, the first connecting end is used for being electrically connected with the first end of the insulation and voltage resistance testing equipment, the third connecting end is used for being electrically connected with the second end of the insulation and voltage resistance testing equipment, the second connecting end is used for being electrically connected with the first end of the electric box to be measured, and the fourth connecting end is used for being electrically connected with the second end of the electric box to be measured.

In some embodiments, the detection circuit further includes a processor, where the processor is electrically connected to the insulation voltage withstanding test device and the detection instrument, and the processor is configured to obtain, in a first measurement stage, a first resistance value measured by the insulation voltage withstanding test device and an electrical parameter collected by the detection instrument, calculate a second resistance value according to the electrical parameter, and determine that measurement accuracy of the insulation voltage withstanding test device meets a requirement when a deviation between the first resistance value and the second resistance value is less than or equal to a second preset threshold.

In some embodiments, in the second measurement stage, the first connection terminal is used for electrically connecting with the first terminal of the insulation and voltage resistance testing device, the third connection terminal is used for electrically connecting with the second terminal of the insulation and voltage resistance testing device, the second connection terminal is used for electrically connecting with the first terminal of the resistor to be tested, and the fourth connection terminal is used for electrically connecting with the second terminal of the resistor to be tested; the processor is further configured to obtain, in the second measurement stage, an average value of third resistance values of the resistor to be measured by the withstand voltage test device for multiple times, calculate a capability factor of the test device according to the average value and the resistance reference value, and determine that measurement stability of the withstand voltage test device meets a requirement if the capability factor of the test device is greater than or equal to a third preset threshold value.

In some embodiments, the spot-check subcircuit further includes a third branch connected in parallel with the first branch and the second branch, the third branch including a third switching unit; in the spot inspection stage, the third switch unit is turned off; in the first measuring stage, the third switch unit is conducted; in the second measurement phase, the third switching unit is turned on.

In some embodiments, the detection circuit further comprises a leakage protection switch electrically connected between the first connection terminal and the spot check sub-circuit.

In some embodiments, the detection circuit further comprises a gear switch electrically connected to the second connection and the third connection; in the spot inspection stage, the gear switch is switched to the spot inspection gear, and the gear switch is used for communicating the second connecting end with the second end of the insulation voltage withstand test equipment; in the first measuring stage, the gear switch is used for communicating the third connecting end with the second end of the insulation and voltage resistance testing device.

In a second aspect, the present application provides a detection device comprising a detection circuit as provided in the first aspect.

In some embodiments, the detection device further comprises: a housing forming a receiving chamber, the housing having a first surface facing away from the receiving chamber and a second surface facing toward the receiving chamber; the first switch unit and the second switch unit are connected with the shell in an insulating mode, and the first switch unit and the second switch unit protrude out of the first surface.

In some embodiments, the detection circuit further comprises a detection instrument; the opening has been seted up to the casing, and detecting instrument passes through the opening to be connected with the casing, and detecting instrument's display screen is towards the casing one side that deviates from the accommodation chamber.

In some embodiments, the detection circuit further comprises a gear switch and a leakage protection switch; the gear switch and the leakage protection switch are connected with the shell in an insulating mode, and protrude out of the first surface.

In a third aspect, the present application provides a detection method applied to a detection circuit as provided in the first aspect or a detection apparatus as provided in the second aspect, the detection method comprising: in the spot inspection stage, the first switch unit and the second switch unit are controlled to be conducted; in the spot inspection stage, the first connecting end is electrically connected with the first end of the insulation voltage withstand test equipment, and the second connecting end is electrically connected with the second end of the insulation voltage withstand test equipment; in the spot inspection stage, obtaining a test result of insulation voltage withstand test equipment; comparing the test result with a reference result; and under the condition that the difference value between the test result and the reference result is smaller than or equal to a first preset threshold value, determining that the measurement state of the insulation voltage withstand test equipment meets the requirement.

In some embodiments, the spot-check sub-circuit includes a plurality of first branches connected in parallel, the capacitive elements in the plurality of first branches having different capacitance values; the spot detection sub-circuit comprises a plurality of second branches connected in parallel, and the resistance values of the voltage dividing elements in the plurality of second branches are different; in the point detection stage, controlling the first switch unit and the second switch unit to be conducted comprises the following steps: in the point detection stage, a first switch unit in a first target branch circuit in a plurality of first branch circuits is controlled to be conducted; and in the point detection stage, controlling the second switch units in the second target branches in the plurality of second branches to be conducted.

In some embodiments, the detection circuit further comprises: a third connection end; a fourth connection end; the detection instrument is electrically connected between the third connecting end and the fourth connecting end; the detection method further comprises the following steps: in a first measurement stage, a first resistance value measured by insulation voltage withstand test equipment and an electrical parameter acquired by a detection instrument are obtained; in the first measuring stage, the first connecting end is electrically connected with the first end of the insulation and voltage resistance testing equipment, the third connecting end is electrically connected with the second end of the insulation and voltage resistance testing equipment, the second connecting end is electrically connected with the first end of the electric box to be measured, and the fourth connecting end is electrically connected with the second end of the electric box to be measured; calculating a second resistance value according to the electrical parameter; and under the condition that the deviation between the first resistance value and the second resistance value is smaller than or equal to a second preset threshold value, determining that the measurement accuracy of the insulation voltage withstand test equipment meets the requirement.

In some embodiments, the detection method further comprises: in the second measurement stage, obtaining an average value of third resistance values of the resistor to be measured, which are measured by the insulation voltage withstanding test equipment for many times; in the second measurement stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the third connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the first end of the resistor to be measured, and the fourth connecting end is used for being electrically connected with the second end of the resistor to be measured; calculating a capability coefficient of the gauge according to the average value and the resistance reference value; and under the condition that the capability coefficient of the gauge is larger than or equal to a third preset threshold value, determining that the measurement stability of the insulation withstand voltage test equipment meets the requirement.

In some embodiments, the spot-check subcircuit further includes a third branch connected in parallel with the first branch and the second branch, the third branch including a third switching unit; the detection method further comprises the following steps: in the spot inspection stage, the third switch unit is controlled to be turned off; in the first measuring stage, the third switch unit is controlled to be conducted.

The foregoing description is only an overview of the present application, and is intended to be implemented in accordance with the teachings of the present application in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present application more readily apparent.

Drawings

In order to more clearly illustrate the technical solution of the embodiments of the present application, the drawings that are needed to be used in the embodiments of the present application will be briefly described, and it is possible for a person skilled in the art to obtain other drawings according to these drawings without inventive effort.

FIG. 1 is a schematic diagram of a detection circuit according to some embodiments of the present application;

FIG. 2 is a schematic circuit diagram of a detection circuit according to other embodiments of the present application;

FIG. 3 is a schematic circuit diagram of a detection circuit according to still other embodiments of the present application;

FIG. 4 is a schematic diagram illustrating a circuit connection of a detection circuit in a first measurement stage according to some embodiments of the present application;

FIG. 5 is a schematic diagram illustrating a circuit connection of a detection circuit in a second measurement stage according to some embodiments of the present application;

FIG. 6 is a schematic circuit diagram of a detection circuit according to still other embodiments of the present application;

FIG. 7 is a schematic circuit diagram illustrating a circuit connection of a detection circuit in a spot detection stage according to some embodiments of the present application;

FIG. 8 is a schematic structural diagram of a detection device according to some embodiments of the present application;

FIG. 9 is a schematic structural diagram of a detecting device according to other embodiments of the present application;

FIG. 10 is a flow chart of a detection method according to some embodiments of the present application;

FIG. 11 is a flow chart of a detection method according to other embodiments of the present application;

FIG. 12 is a flow chart of a detection method according to still other embodiments of the present application;

fig. 13 shows a schematic hardware structure of an electronic device according to an embodiment of the present application.

Detailed Description

Features and exemplary embodiments of various aspects of the present application will be described in detail below, and in order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described in further detail below with reference to the accompanying drawings and the detailed embodiments. It should be understood that the particular embodiments described herein are meant to be illustrative of the application only and not limiting. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the application by showing examples of the application.

It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

It should be understood that the term "and/or" as used herein is merely one relationship describing the association of the associated objects, meaning that there may be three relationships, e.g., a and/or B, may represent: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" herein generally indicates that the front and rear associated objects are an "or" relationship.

In embodiments of the present application, the term "electrically connected" may refer to two components being directly electrically connected, or may refer to two components being electrically connected via one or more other components.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Accordingly, it is intended that the present application covers the modifications and variations of this application provided they come within the scope of the appended claims (the claims) and their equivalents. The embodiments provided by the embodiments of the present application may be combined with each other without contradiction.

Before describing the technical solution provided by the embodiments of the present application, in order to facilitate understanding of the embodiments of the present application, the present application firstly specifically describes the problems existing in the related art:

Along with the rapid development of energy storage industry, the energy storage electric box plays an increasingly important role on the power supply side, the power grid side and the load side of a power system. In practical applications, for example, the energy storage electric box may store a plurality of energy storage electric cores, and a plurality of energy storage electric boxes may be used to form an energy storage system. In order to improve the safety of the energy storage electric box, the electrical parameters of the energy storage electric box are usually required to be measured through insulation and voltage withstand test equipment. For example, the electrical parameters of the tank may include insulation resistance and/or leakage current of the tank, etc. However, the insulation and voltage withstand test apparatus itself may have a problem of a fault such as a short circuit, an open circuit, or the like or inaccurate measurement.

In view of the above-mentioned research of the inventors, the embodiments of the present application provide a detection circuit, a detection apparatus, and a detection method capable of realizing detection of a failure and/or measurement accuracy of an insulation and voltage withstanding test apparatus.

The detection circuit provided by the embodiment of the application is first described below.

Fig. 1 is a schematic circuit diagram of a detection circuit according to some embodiments of the present application. As shown in fig. 1, the detection circuit 10 provided in the embodiment of the present application may include a first connection terminal X1, a second connection terminal X2, and a point detection sub-circuit 100. The spot check sub-circuit 100 may be electrically connected between the first connection terminal X1 and the second connection terminal X2. The spot check sub-circuit 100 may include a first branch 110 and a second branch 120 connected in parallel. The first branch 110 may include a capacitive element 111 and a first switching unit 112 electrically connected. In some examples, for example, the capacitive element 111 and the first switching unit 112 may be connected in series. Illustratively, the capacitive element 111 includes, but is not limited to, a capacitor. The second branch 120 may include a voltage dividing element 121 and a second switching unit 122 electrically connected. In some examples, for example, the voltage dividing element 121 and the second switching unit 122 may be connected in series. Illustratively, the voltage dividing element 121 includes, but is not limited to, a resistor. The parameters such as the precision, the power, the withstand voltage value, and the like of the voltage dividing element 121 can be flexibly adjusted according to the actual situation, and the present application is not limited thereto.

It should be noted that, the spot detection sub-circuit 100 may include one first branch 110 or a plurality of first branches 110 connected in parallel, the spot detection sub-circuit 100 may include one second branch 120 or a plurality of second branches 120 connected in parallel, and the number of the first branches 110 and the number of the second branches 120 may be flexibly adjusted according to practical situations, which is not limited in the present application. Fig. 1 illustrates an example of a spot check sub-circuit 100 comprising a first branch 110 and a second branch 120.

In the spot inspection stage, the first connection terminal X1 may be used to electrically connect with the first terminal of the insulation and voltage test apparatus 01, and the second connection terminal X2 may be used to electrically connect with the second terminal of the insulation and voltage test apparatus 01, and the first and second switching units 112 and 122 are turned on. The insulation withstand voltage test apparatus 01 can measure the electrical parameters of the capacitive element 111 and the voltage dividing element 121 in the spot check sub-circuit 100. Illustratively, the electrical parameters of the capacitive element 111 and the voltage dividing element 121 include, but are not limited to, an insulation resistance value. The insulation voltage test apparatus 01 includes, but is not limited to, an insulation voltage tester.

Since the spot detection sub-circuit 100 includes not only the voltage dividing element 121 but also the capacitive element 111, the spot detection sub-circuit 100 can simulate a circuit (or capacitive load environment) inside the electric box to be detected, which is equivalent to detecting faults and/or measurement accuracy of the insulation voltage withstanding test device based on an equivalent circuit similar to the circuit inside the electric box to be detected, thereby being beneficial to improving the detection accuracy.

The detection circuit provided by the embodiment of the application is provided with the spot detection sub-circuit, the spot detection sub-circuit is electrically connected between the first connecting end and the second connecting end, and the spot detection sub-circuit comprises a capacitive element and a voltage dividing element which are connected in parallel and can simulate the circuit in the electric box to be detected; in the spot inspection stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted so that the insulation voltage withstand test equipment can measure the electrical parameters of the spot inspection sub-circuit; if the measured electrical parameters of the insulation voltage testing equipment are not matched with the electrical parameters of the known spot inspection sub-circuit, the insulation voltage testing equipment can be indicated to have faults or the measurement accuracy of the insulation voltage testing equipment is lower, so that the faults and/or the measurement accuracy of the insulation voltage testing equipment are detected.

Fig. 2 is a schematic circuit diagram of a detection circuit according to other embodiments of the present application. In order to improve the detection efficiency, as shown in fig. 2, according to some embodiments of the present application, optionally, the detection circuit 10 provided in the embodiment of the present application may further include a processor 200, where the processor 200 may be electrically connected to the insulation voltage withstanding test device 01. The processor 200 may be configured to obtain a test result of the insulation and voltage withstand test apparatus 01 during the spot inspection stage, and compare the test result with a reference result. For example, in some examples, the test result may be an insulation resistance value measured by the insulation withstand voltage test apparatus 01. The resistance value of the voltage dividing element 121 in the second branch 120 being turned on is known, and the reference result may be the known resistance value of the voltage dividing element 121 in the second branch 120 being turned on. The turned-on second branch 120 may refer to the second branch 120 in which the second switching unit 122 is turned on. The processor 200 may be configured to compare the insulation resistance value measured by the insulation voltage withstand test apparatus 01 with a resistance value known to the voltage dividing element 121 in the second branch 120 being turned on.

The processor 200 may be further configured to determine that the measurement status of the insulation voltage test device 01 meets the requirement in a case where the difference between the test result and the reference result is less than or equal to the first preset threshold. The magnitude of the first preset threshold value can be flexibly adjusted according to practical situations, and the application is not limited to this. For example, the measurement state of the withstand voltage test apparatus may include whether the withstand voltage test apparatus has a fault and/or the measurement accuracy of the withstand voltage test apparatus. For example, in the case where the difference between the test result and the reference result is less than or equal to the first preset threshold, it may be determined that the insulation voltage test apparatus has no fault such as a circuit break, and/or that the measurement accuracy of the insulation voltage test apparatus meets the requirement.

In some embodiments, the processor 200 may be further configured to determine that the measurement status of the insulation voltage test apparatus 01 is not satisfactory in a case where a difference between the test result and the reference result is greater than a first preset threshold. For example, in the case where the difference between the test result and the reference result is greater than the first preset threshold, it is determined that the insulation voltage test device has a fault such as a circuit break, and/or the measurement accuracy of the insulation voltage test device is not satisfactory.

In this way, by setting the processor 200 to compare the test result of the insulation and voltage withstand test device 01 with the reference result and determining whether the measurement state of the insulation and voltage withstand test device 01 meets the requirement according to the comparison result, the automatic detection of the fault and/or measurement accuracy of the insulation and voltage withstand test device can be realized, and the detection efficiency is improved.

Fig. 3 is a schematic circuit diagram of a detection circuit according to still other embodiments of the present application. As shown in fig. 3, the spot check sub-circuit 100 may optionally include a plurality of first branches 110 connected in parallel, and the capacitance values of the capacitive elements 111 in the plurality of first branches 110 may be different according to some embodiments of the present application. The capacitance value of the capacitive element 111 in each first branch 110 can be flexibly adjusted according to practical situations, which is not limited by the present application.

In the spot-check phase, the first switch unit 112 in the first target branch of the plurality of first branches 110 is turned on. The first switching units 112 in the other first branches 110 except the first target branch may be turned off. Illustratively, the first target leg may be any one or more first legs 110 of the plurality of first legs 110.

In this way, the spot inspection sub-circuit 100 includes a plurality of first branches 110 connected in parallel, and the capacitive elements 111 in the plurality of first branches 110 have different capacitance values, so that the detection range of the insulation voltage withstand test device can be enlarged, and the capacitive elements 111 with suitable capacitance values can be flexibly selected for detection according to the needs, thereby meeting different detection requirements.

As shown in fig. 3, according to some embodiments of the present application, optionally, the spot check sub-circuit 100 may include a plurality of second branches 120 connected in parallel, and resistance values of the voltage dividing elements 121 in the plurality of second branches 120 may be different. The resistance of the voltage dividing element 121 in each second branch 120 can be flexibly adjusted according to practical situations, which is not limited in the present application.

In the spot-check phase, the second switching unit 122 in the second target branch of the plurality of second branches 120 is turned on. The second switching units 122 in the other second branches 120 except the second target branch may be turned off. Illustratively, the second target leg may be any one or more of the plurality of second legs 120, 120.

In this way, the spot inspection sub-circuit 100 includes a plurality of second branches 120 connected in parallel, and the voltage dividing elements 121 in the plurality of second branches 120 have different resistance values, so that the detection range of the insulation voltage withstand test device can be enlarged, and the voltage dividing elements 121 with suitable resistance values can be flexibly selected for detection according to the needs, thereby meeting different detection requirements.

According to some embodiments of the application, the second target leg may optionally comprise at least two second legs 120. In the spot inspection stage, the second switch units 122 in the at least two second branches 120 may be turned on in a time-sharing manner. When the second switching units 122 in one second leg 120 are turned on, the second switching units 122 in the other second legs 120 may be turned off.

Taking the second target branch including N second branches 120 as an example, N is greater than or equal to 2, where N is an integer, when the second switch unit 122 of the 1 st second branch 120 in the second target branch is turned on, the first switch unit 112 in at least one first branch 110 is turned on, and the processor 200 may obtain a test result of the insulation voltage withstand test device 01, and compare the test result with a reference result. For example, when the second switching unit 122 of the 1 st second branch 120 of the second target branches is turned on, the processor 200 may acquire the insulation resistance value of the 1 st second branch 120 measured by the insulation and voltage resistance test apparatus 01 and compare it with the previously known resistance value of the voltage dividing element 121 in the 1 st second branch 120. By analogy, when the second switch unit 122 of the nth second branch 120 in the second target branch is turned on, the first switch unit 112 in at least one first branch 110 is turned on, and the processor 200 may obtain a test result of the insulation and voltage withstand test device 01 and compare the test result with a reference result. For example, when the second switching unit 122 of the nth second leg 120 of the second target legs is turned on, the processor 200 may acquire the insulation resistance value of the nth second leg 120 measured by the insulation and voltage resistance test apparatus 01 and compare it with the previously known resistance value of the voltage dividing element 121 of the nth second leg 120. It should be noted that the reference result varies with the first branch 110.

The processor 200 may be configured to determine that the measurement status of the insulation voltage withstanding test apparatus 01 meets the requirement when the difference between the test result obtained multiple times and the reference result is less than or equal to the first preset threshold.

In this way, by switching the second branches 120, the test results obtained by the insulation and voltage resistance test device 01 for many times are compared with the reference results, and whether the measurement state of the insulation and voltage resistance test device 01 meets the requirement is determined according to the comparison results for many times, so that the accuracy of detecting the measurement state of the insulation and voltage resistance test device 01 can be improved, and erroneous judgment is reduced. In addition, according to the comparison result of a plurality of times, the insulation resistance value test section suitable for the insulation voltage withstand test equipment and/or the detection circuit, namely the insulation resistance value test section with higher measurement precision, can be determined.

When the insulation voltage testing equipment measures the electrical parameters of the to-be-measured electric box, the insulation voltage testing equipment may not accurately measure the electrical parameters of the to-be-measured electric box due to the fact that the structure of the to-be-measured electric box is complex and/or the influence of inconsistent reading period of the insulation voltage testing equipment.

In view of this, the detection circuit 10 can also detect the measurement accuracy of the withstand voltage test apparatus during the actual measurement of the withstand voltage test apparatus.

Fig. 4 is a schematic circuit connection diagram of a detection circuit in a first measurement stage according to some embodiments of the present application. As shown in fig. 4, according to some embodiments of the present application, the detection circuit 10 may optionally further include a third connection terminal X3, a fourth connection terminal X4, and a detection instrument 400, and the detection instrument 400 may be electrically connected between the third connection terminal X3 and the fourth connection terminal X4. The third connection terminal X3 may be a ground terminal, for example. In some examples, the detection instrument 400 may include a voltmeter. The voltmeter can have internal resistance with preset resistance value, and the magnitude of the preset resistance value can be flexibly adjusted according to actual conditions, so that the application is not limited. For example, in some examples, the internal resistance of the voltmeter may be 10mΩ, for example. In other embodiments, the detecting instrument 400 may also be an ammeter or multimeter, etc.

In the first measurement stage, the first connection terminal X1 may be used to electrically connect with the first terminal of the insulation and voltage test apparatus 01, and the third connection terminal X3 may be used to electrically connect with the second terminal of the insulation and voltage test apparatus 01. Illustratively, the first end of the withstand voltage test apparatus 01 may be a positive connection end of the withstand voltage test apparatus 01, and the second end of the withstand voltage test apparatus 01 may be a negative connection end of the withstand voltage test apparatus 01. The second connection terminal X2 may be used to electrically connect with a first terminal of the electric box 02 to be tested, and the fourth connection terminal X4 may be used to electrically connect with a second terminal of the electric box 02 to be tested.

In some examples, during the first measurement phase, the current provided at the first end of the insulation and voltage resistance test device 01 may be transmitted to the electrical box 02 to be tested through the spot check sub-circuit 100, and then returned to the second end of the insulation and voltage resistance test device 01 through the detection instrument 400, where the insulation and voltage resistance test device 01 may measure the insulation resistance value of the electrical box 02 to be tested. The insulation resistance value measured by the insulation voltage testing equipment 01 can be verified based on the electrical parameters acquired by the detection instrument 400, so that the detection of the measurement accuracy of the insulation voltage testing equipment is realized in the actual measurement process of the insulation voltage testing equipment.

Optionally, according to some embodiments of the present application, the detection circuit 10 may further include a processor 200, and the processor 200 may be electrically connected to the insulation and voltage withstand test device 01 and the detection instrument 400. The processor 200 may be configured to obtain, in a first measurement stage, a first resistance value measured by the withstand voltage test device 01 and an electrical parameter acquired by the detecting instrument 400, calculate a second resistance value according to the electrical parameter, and determine that the measurement accuracy of the withstand voltage test device meets a requirement if a deviation between the first resistance value and the second resistance value is less than or equal to a second preset threshold. The size of the second preset threshold can be flexibly adjusted according to practical situations, and the application is not limited to this.

The processor 200 may be further configured to determine that the measurement accuracy of the insulation voltage test device is not satisfactory in a case where a deviation between the first resistance value and the second resistance value is greater than a second preset threshold value.

According to some embodiments of the present application, optionally, in a case where a deviation between the first resistance value and the second resistance value is greater than a second preset threshold value, the insulation resistance value of the electric box 02 to be tested may be determined based on the second resistance value.

For example, in some examples, taking the detection instrument 400 as a voltmeter as an example, the second resistance value may be calculated by the following expression in consideration of the internal resistance of the voltmeter:

（1）

（2）

Wherein R2 represents a second resistance value, R21 represents an insulation resistance value of the electric box to be tested, R22 represents a resistance value of the internal resistance of the voltmeter, U1 represents an output voltage of the insulation withstand voltage test equipment, and U2 represents a voltage collected by the voltmeter. Accordingly, in consideration of the internal resistance of the voltmeter, the first resistance value may be a sum of the insulation resistance value of the electric box to be tested measured by the insulation withstand voltage test apparatus 01 and the resistance value of the internal resistance of the voltmeter.

For example, in some examples, the processor 200 may be configured to calculate an absolute value of a difference between the first resistance value and the second resistance value, and determine that the measurement accuracy of the insulation-voltage testing apparatus meets the requirement if a ratio of the absolute value to the second resistance value is less than or equal to a second preset threshold.

For example, in some specific examples, it may be determined that the measurement accuracy of the withstand voltage test apparatus meets the requirement according to the following expression:

（3）

Wherein R1 represents a first resistance value, R2 represents a second resistance value, Representing a second preset threshold.

As shown in fig. 4, the spot-detecting sub-circuit 100 may optionally further include a third branch 130, the third branch 130 may be connected in parallel with the first branch 110 and the second branch 120, and the third branch 130 may include a third switching unit 131, according to some embodiments of the present application.

In the spot inspection stage, the third switching unit 131 may be turned off.

In this way, in the spot inspection phase, by the capacitive element in the first branch 110 and the voltage dividing element in the second branch 120, detection of faults and/or measurement accuracy of the insulation and voltage withstand test apparatus can be achieved.

In the first measurement phase, the third switching unit 131 may be turned on.

In this way, since the third switching unit 131 is turned on, the first branch 110 and the second branch 120 can be short-circuited, the influence of the capacitive element in the first branch 110 and the voltage dividing element in the second branch 120 on the first resistance value measured by the insulation voltage withstand test device can be reduced, and the detection accuracy can be improved.

In some embodiments, during the first measurement phase, the first switching unit 112 in the first branch 110 and the second switching unit 122 in the second branch 120 may be turned off.

Fig. 5 is a schematic circuit connection diagram of a detection circuit in a second measurement stage according to some embodiments of the present application. As shown in fig. 5, optionally, in the second measurement phase, the first connection terminal X1 may be used to electrically connect with a first terminal of the insulation and voltage test apparatus 01, and the third connection terminal X3 may be used to electrically connect with a second terminal of the insulation and voltage test apparatus 01. The second connection terminal X2 may be used for electrically connecting with a first terminal of the resistor 03 to be tested, and the fourth connection terminal X4 may be used for electrically connecting with a second terminal of the resistor 03 to be tested.

The processor 200 may be further configured to obtain an average value of the third resistance values of the resistor 03 to be tested measured by the withstand voltage test apparatus 01 for multiple times in the second measurement stage, and calculate a gauge capability coefficient (Capability Gage Index, CGK) of the withstand voltage test apparatus 01 according to the average value of the third resistance values of the resistor 03 to be tested measured by the withstand voltage test apparatus 01 for multiple times and the resistance reference value.

For example, in some examples, the gauge capability factor of the insulation withstand voltage test apparatus may be calculated without considering the internal resistance of the voltmeter according to the following expression:

（4）

Wherein CGK represents the gauge capacity coefficient of the insulation and voltage withstand test equipment, USL represents the upper specification limit, LSL represents the lower specification limit, s represents the standard deviation of a sample, Represents an average value of third resistance values of the resistance to be measured by the withstand voltage test apparatus a plurality of times, x represents a resistance reference value,And k represents a coefficient which can be flexibly adjusted according to actual conditions. For example, in some examples,K=6. It should be noted that, the resistance value of the resistor to be measured is known, and the resistance reference value may be a known resistance value of the resistor to be measured. In consideration of the internal resistance of the voltmeter,The average value of the sum of the resistance values of the resistor to be tested and the internal resistance of the voltmeter, which are measured by the insulation voltage resistance test equipment for many times, can be represented, and the resistance reference value can be the sum of the resistance value of the resistor to be tested and the resistance value of the internal resistance of the voltmeter.

The processor 200 may be further configured to determine that the measurement stability of the insulation voltage withstand test apparatus meets the requirement when the gauge capability factor of the insulation voltage withstand test apparatus 01 is greater than or equal to a third preset threshold. The size of the third preset threshold can be flexibly adjusted according to practical situations, and the application is not limited to this. For example, in some examples, the third preset threshold may be equal to 2.

In this way, detection of measurement stability of the insulation withstand voltage test apparatus can be achieved.

As shown in fig. 5, the third switching unit 131 may be turned on optionally during the second measurement phase according to some embodiments of the present application.

In this way, since the third switching unit 131 is turned on, the first branch 110 and the second branch 120 can be short-circuited, the influence of the capacitive element in the first branch 110 and the voltage dividing element in the second branch 120 on the third resistance value measured by the insulation voltage withstand test apparatus can be reduced, and the detection accuracy can be improved.

In some embodiments, during the second measurement phase, the first switching unit 112 in the first branch 110 and the second switching unit 122 in the second branch 120 may be turned off.

Fig. 6 is a schematic circuit diagram of a detection circuit according to still other embodiments of the present application. As shown in fig. 6, according to some embodiments of the present application, the detection circuit 10 may optionally further include a leakage protection switch 60, and the leakage protection switch 60 may be electrically connected between the first connection terminal X1 and the point detection sub-circuit 100. The leakage protection switch 60 may be turned off when a detection circuit leaks.

Thus, by providing the leakage protection switch 60, leakage protection of the detection circuit can be realized.

In some examples, the earth leakage protection switch 60 may include a circuit breaker (QF) switch.

Fig. 7 is a schematic circuit connection diagram of a detection circuit in a point detection stage according to some embodiments of the present application. As shown in fig. 7, the detection circuit 10 may optionally further include a gear switch 70, and the gear switch 70 may be electrically connected to the second connection terminal X2 and the third connection terminal X3 according to some embodiments of the present application.

In the spot check phase, the gear switch 70 may be switched to the spot check gear, and the gear switch 70 may be used to communicate the second connection terminal X2 with the second terminal of the insulation and voltage withstand test apparatus 01.

In the first measurement phase, the gear switch 70 may be switched to a measurement gear, and the gear switch 70 may be used to communicate the third connection terminal X3 with the second terminal of the insulation and voltage withstand test apparatus 01. In the second measurement phase, the gear switch 70 may be switched to the measurement gear, and the gear switch 70 may be used to communicate the third connection terminal X3 with the second terminal of the insulation and voltage withstand test apparatus 01. Fig. 7 shows an example of the spot inspection stage.

Based on the detection circuit 10 provided in the above embodiment, correspondingly, the application further provides a specific implementation manner of the detection device. Please refer to the following examples.

The detection apparatus provided by the embodiment of the present application may include the detection circuit 10 provided by the above-described embodiment.

The detection equipment provided by the embodiment of the application comprises a detection circuit, wherein the detection circuit is provided with a spot detection sub-circuit, the spot detection sub-circuit is electrically connected between a first connecting end and a second connecting end and comprises a capacitive element and a voltage dividing element which are connected in parallel, and the circuit inside an electric box to be detected can be simulated; in the spot inspection stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted so that the insulation voltage withstand test equipment can measure the electrical parameters of the spot inspection sub-circuit; if the measured electrical parameters of the insulation voltage testing equipment are not matched with the electrical parameters of the known spot inspection sub-circuit, the insulation voltage testing equipment can be indicated to have faults or the measurement accuracy of the insulation voltage testing equipment is lower, so that the faults and/or the measurement accuracy of the insulation voltage testing equipment are detected.

Fig. 8 is a schematic structural diagram of a detection apparatus according to some embodiments of the present application. As shown in fig. 8, the detection device 80 may optionally further comprise a housing 810, the housing 810 forming a receiving chamber 820, the housing 810 having a first surface a facing away from the receiving chamber 820 and a second surface b facing toward the receiving chamber 820, according to some embodiments of the application. As shown in connection with fig. 1 and 8, the connection lines and parts of the components of the detection circuit 10 (such as the capacitive element 111 and the voltage dividing element 121) may be located in the accommodating chamber 820.

The first and second switching units 112 and 122 may be connected with the housing 810 in an insulating manner. For example, in some examples, the material of the housing 810 may be an insulating material. The first and second switching units 112 and 122 may protrude from the first surface a.

In this way, the first switch unit 112 and the second switch unit 122 are connected with the housing 810 in an insulating manner, so that the possibility of short-circuiting the first switch unit 112 and the second switch unit 122 can be reduced, and in addition, the first switch unit 112 and the second switch unit 122 protrude out of the first surface a, so that an operator can conveniently control the first switch unit 112 and the second switch unit 122.

As shown in fig. 8, the detection circuit (not shown in fig. 8) may optionally further comprise a detection instrument 400, according to some embodiments of the application. The circuit connection manner of the detecting apparatus 400 is referred to above, and will not be described herein. The housing 810 may be provided with an opening k through which the detection instrument 400 may be connected to the housing 810, and a display screen of the detection instrument 400 may face a side of the housing 810 facing away from the receiving chamber 820.

Fig. 9 is a schematic structural diagram of a detection apparatus according to other embodiments of the present application. As shown in fig. 9, the detection circuit may optionally further include a leakage protection switch 60 and a gear switch 70, according to some embodiments of the application. The circuit connection manner of the leakage protection switch 60 and the gear switch 70 is referred to above, and will not be described herein.

The earth leakage protection switch 60 and the gear switch 70 may be connected with the housing 810 in an insulating manner, and the earth leakage protection switch 60 and the gear switch 70 may protrude from the first surface a.

Based on the detection circuit 10 or the detection device 80 provided in the foregoing embodiments, the present application correspondingly provides a specific implementation manner of the detection method. The detection method may be applied to the detection circuit 10 or the detection device 80 provided in the above-described embodiment. Please refer to the following examples.

Fig. 10 is a flow chart of a detection method according to some embodiments of the application. As shown in fig. 10, the detection method provided by the embodiment of the present application may include the following steps:

s1001, in a spot inspection stage, controlling the first switch unit and the second switch unit to be conducted; in the spot inspection stage, the first connecting end is electrically connected with the first end of the insulation voltage withstand test equipment, and the second connecting end is electrically connected with the second end of the insulation voltage withstand test equipment;

S1002, in a spot inspection stage, obtaining a test result of insulation voltage withstand test equipment;

s1003, comparing the test result with a reference result;

S1004, determining that the measurement state of the insulation voltage withstand test equipment meets the requirement under the condition that the difference value between the test result and the reference result is smaller than or equal to a first preset threshold value.

The specific implementation process of the steps S1001 to S1004 is described in detail when introducing the detection circuit, and will not be described herein.

In this way, in the spot inspection stage, the test result of the insulation voltage withstand test equipment is compared with the reference result, and whether the measurement state of the insulation voltage withstand test equipment meets the requirement is determined according to the comparison result, so that the automatic detection of faults and/or measurement accuracy of the insulation voltage withstand test equipment can be realized, and the detection efficiency is improved.

According to some embodiments of the application, optionally, the spot-detecting subcircuit includes a plurality of first branches connected in parallel, the capacitive elements in the plurality of first branches being different in capacitance; the spot detection sub-circuit comprises a plurality of second branches connected in parallel, and the resistance values of the voltage dividing elements in the plurality of second branches are different.

Accordingly, in the step of checking, the step of controlling the first switch unit and the second switch unit to be turned on may include the following steps:

Step one, in a spot inspection stage, controlling a first switch unit in a first target branch circuit in a plurality of first branch circuits to be conducted;

And step two, in the spot inspection stage, controlling second switch units in a second target branch circuit in a plurality of second branch circuits to be conducted.

According to some embodiments of the application, optionally, the detection circuit may further include a third connection terminal, a fourth connection terminal, and a detection instrument electrically connected between the third connection terminal and the fourth connection terminal.

Fig. 11 is a flow chart of a detection method according to another embodiment of the application. As shown in fig. 11, according to some embodiments of the present application, optionally, the detection method may further include the steps of:

S1101, in a first measurement stage, acquiring a first resistance value measured by insulation voltage resistance test equipment and electrical parameters acquired by a detection instrument; in the first measuring stage, the first connecting end is electrically connected with the first end of the insulation and voltage resistance testing equipment, the third connecting end is electrically connected with the second end of the insulation and voltage resistance testing equipment, the second connecting end is electrically connected with the first end of the electric box to be measured, and the fourth connecting end is electrically connected with the second end of the electric box to be measured;

S1102, calculating a second resistance value according to the electrical parameter;

S1103, determining that the measurement precision of the insulation voltage withstand test equipment meets the requirement under the condition that the deviation between the first resistance value and the second resistance value is smaller than or equal to a second preset threshold value.

The specific implementation process of the steps S1101 to S1103 is described in detail when the detection circuit is introduced, and will not be described herein.

Fig. 12 is a flow chart of a detection method according to still other embodiments of the present application. As shown in fig. 12, according to some embodiments of the present application, optionally, the detection method may further include the steps of:

S1201, in a second measurement stage, acquiring an average value of third resistance values of the resistor to be measured, which are measured by the insulation voltage withstand test equipment for a plurality of times; in the second measurement stage, the first connecting end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the third connecting end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with the first end of the resistor to be measured, and the fourth connecting end is used for being electrically connected with the second end of the resistor to be measured;

S1202, calculating a capability coefficient of the gauge according to the average value and the resistance reference value;

And S1203, determining that the measurement stability of the insulation withstand voltage test equipment meets the requirement under the condition that the capability coefficient of the gauge is larger than or equal to a third preset threshold value.

The specific implementation process of the steps S1201 to S1203 is described in detail when the detection circuit is introduced, and will not be described here again.

According to some embodiments of the application, optionally, the spot-check subcircuit further comprises a third branch connected in parallel with the first branch and the second branch, the third branch comprising a third switching unit.

Accordingly, the detection method may further include the steps of:

step three, in the point detection stage, controlling the third switch unit to be turned off;

and fourth, in the first measuring stage, controlling the third switch unit to be turned on.

According to some embodiments of the application, optionally, the detection method may further comprise the steps of:

And fifthly, in the second measurement stage, controlling the third switch unit to be turned on.

Based on the detection method provided by the embodiment, correspondingly, the application further provides a specific implementation mode of the electronic equipment. Please refer to the following examples.

The electronic device 1300 may include a processor 200 and a memory 300 storing computer program instructions.

In particular, the processor 200 may include a central processing unit (Central Processing Unit, CPU), or an Application SPECIFIC INTEGRATED Circuit (ASIC), or may be configured as one or more integrated circuits that implement embodiments of the present application.

Memory 300 may include mass storage for data or instructions. By way of example, and not limitation, memory 300 may comprise a hard disk drive (HARD DISK DRIVE, HDD), a floppy disk drive, flash memory, optical disk, magneto-optical disk, magnetic tape, or a universal serial bus (Universal Serial Bus, USB) drive, or a combination of two or more of the foregoing. In one example, memory 300 may include removable or non-removable (or fixed) media, or memory 300 is a non-volatile solid state memory. The memory 300 may be internal or external to the electronic device.

In one example, memory 300 may be Read Only Memory (ROM). In one example, the ROM may be mask-programmed ROM, programmable ROM (PROM), erasable PROM (EPROM), electrically Erasable PROM (EEPROM), electrically rewritable ROM (EAROM), or flash memory, or a combination of two or more of these.

Memory 300 may include Read Only Memory (ROM), random Access Memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical, or other physical/tangible memory storage devices. Thus, in general, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software comprising computer-executable instructions and when the software is executed (e.g., by one or more processors) it is operable to perform the operations described with reference to a method in accordance with an aspect of the application.

The processor 200 reads and executes the computer program instructions stored in the memory 300 to implement the methods/steps in the above-mentioned method embodiments, and achieve the corresponding technical effects achieved by the method embodiments executing the methods/steps, which are not described herein for brevity.

In one example, the electronic device may also include a communication interface 400 and a bus 500. As shown in fig. 13, the processor 200, the memory 300, and the communication interface 400 are connected to each other via a bus 500 and perform communication with each other.

The communication interface 400 is mainly used for implementing communication between each module, device, unit and/or apparatus in the embodiment of the present application.

Bus 500 includes hardware, software, or both, that couple components of an electronic device to each other. By way of example, and not limitation, the buses may include an accelerated graphics Port (ACCELERATED GRAPHICS Port, AGP) or other graphics Bus, an enhanced industry Standard architecture (Extended Industry Standard Architecture, EISA) Bus, a Front Side Bus (FSB), a HyperTransport (HT) interconnect, an industry Standard architecture (Industry Standard Architecture, ISA) Bus, an Infiniband interconnect, a Low Pin Count (LPC) Bus, a memory Bus, a Micro Channel Architecture (MCA) Bus, a Peripheral Component Interconnect (PCI) Bus, a PCI-Express (PCI-X) Bus, a Serial Advanced Technology Attachment (SATA) Bus, a video electronics standards Association local (VLB) Bus, or other suitable Bus, or a combination of two or more of these. Bus 500 may include one or more buses, where appropriate. Although embodiments of the application have been described and illustrated with respect to a particular bus, the application contemplates any suitable bus or interconnect.

In addition, in combination with the detection method in the above embodiment, the embodiment of the present application may be implemented by providing a computer readable storage medium. The computer readable storage medium has stored thereon computer program instructions; the computer program instructions, when executed by a processor, implement any of the detection methods of the above embodiments. Examples of computer readable storage media include non-transitory computer readable storage media such as electronic circuits, semiconductor memory devices, ROMs, random access memories, flash memories, erasable ROMs (EROM), floppy disks, CD-ROMs, optical disks, hard disks.

It should be understood that the application is not limited to the particular arrangements and instrumentality described above and shown in the drawings. For the sake of brevity, a detailed description of known methods is omitted here. In the above embodiments, several specific steps are described and shown as examples. The method processes of the present application are not limited to the specific steps described and shown, but various changes, modifications and additions, or the order between steps may be made by those skilled in the art after appreciating the spirit of the present application.

The functional blocks shown in the above-described structural block diagrams may be implemented in hardware, software, firmware, or a combination thereof. When implemented in hardware, it may be, for example, an electronic Circuit, application SPECIFIC INTEGRATED Circuit (ASIC), appropriate firmware, plug-in, function card, or the like. When implemented in software, the elements of the application are the programs or code segments used to perform the required tasks. The program or code segments may be stored in a machine readable medium or transmitted over transmission media or communication links by a data signal carried in a carrier wave. A "machine-readable medium" may include any medium that can store or transfer information. Examples of machine-readable media include electronic circuitry, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, radio Frequency (RF) links, and the like. The code segments may be downloaded via computer networks such as the internet, intranets, etc.

It should also be noted that the exemplary embodiments mentioned in this disclosure describe some methods or systems based on a series of steps or devices. The present application is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, or may be performed in a different order from the order in the embodiments, or several steps may be performed simultaneously.

Aspects of the present application are described above with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions/acts specified in the flowchart and/or block diagram block or blocks. Such a processor may be, but is not limited to being, a general purpose processor, a special purpose processor, an application specific processor, or a field programmable logic circuit. It will also be understood that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware which performs the specified functions or acts, or combinations of special purpose hardware and computer instructions.

In the foregoing, only the specific embodiments of the present application are described, and it will be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the systems, modules and units described above may refer to the corresponding processes in the foregoing method embodiments, which are not repeated herein. It should be understood that the scope of the present application is not limited thereto, and any equivalent modifications or substitutions can be easily made by those skilled in the art within the technical scope of the present application, and they should be included in the scope of the present application.

Claims

1. A detection circuit, comprising:

A first connection end;

A second connection end;

The point detection sub-circuit is electrically connected between the first connecting end and the second connecting end, and comprises a first branch and a second branch which are connected in parallel, wherein the first branch comprises a capacitive element and a first switch unit which are electrically connected, and the second branch comprises a voltage dividing element and a second switch unit which are electrically connected;

In the spot inspection stage, the first connecting end is used for being electrically connected with a first end of the insulation voltage withstand test equipment, the second connecting end is used for being electrically connected with a second end of the insulation voltage withstand test equipment, and the first switch unit and the second switch unit are conducted; the insulation voltage withstand test equipment is used for measuring electrical parameters of the capacitive element and the voltage dividing element, wherein the electrical parameters comprise insulation resistance values;

The processor is electrically connected with the insulation and voltage resistance testing equipment, and is used for acquiring a testing result of the insulation and voltage resistance testing equipment in the spot inspection stage, comparing the testing result with a reference result and determining that the measurement state of the insulation and voltage resistance testing equipment meets the requirement under the condition that the difference value between the testing result and the reference result is smaller than or equal to a first preset threshold value.

2. The detection circuit according to claim 1, wherein the spot detection sub-circuit includes a plurality of the first branches connected in parallel, the capacitive elements in the plurality of the first branches being different in capacitance;

in the point detection stage, the first switch units in a first target branch circuit in a plurality of first branch circuits are conducted.

3. The detection circuit according to claim 1 or 2, wherein the spot detection sub-circuit includes a plurality of the second branches connected in parallel, the resistances of the voltage dividing elements in the plurality of the second branches are different;

In the point detection stage, the second switch units in a second target branch circuit in a plurality of second branch circuits are conducted.

4. A detection circuit according to claim 3, wherein the second target branch comprises at least two of the second branches, the second switching elements in at least two of the second branches being time-sharing conductive during the spot-check phase.

5. The detection circuit of claim 1, wherein the detection circuit further comprises:

a third connection end;

a fourth connection end;

the detection instrument is electrically connected between the third connecting end and the fourth connecting end;

In the first measurement stage, the first connection end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the third connection end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, the second connection end is used for being electrically connected with the first end of the electric box to be measured, and the fourth connection end is used for being electrically connected with the second end of the electric box to be measured.

6. The detection circuit according to claim 5, further comprising a processor electrically connected to the insulation and voltage test device and the detection instrument, wherein the processor is configured to obtain, in the first measurement stage, a first resistance value measured by the insulation and voltage test device and an electrical parameter acquired by the detection instrument, calculate a second resistance value according to the electrical parameter, and determine that measurement accuracy of the insulation and voltage test device meets a requirement if a deviation between the first resistance value and the second resistance value is less than or equal to a second preset threshold value.

7. The detection circuit of claim 6, wherein the detection circuit comprises a logic circuit,

In a second measurement stage, the first connection end is used for being electrically connected with a first end of the insulation and voltage resistance testing device, the third connection end is used for being electrically connected with a second end of the insulation and voltage resistance testing device, the second connection end is used for being electrically connected with a first end of a resistor to be tested, and the fourth connection end is used for being electrically connected with a second end of the resistor to be tested;

The processor is further configured to obtain, in the second measurement stage, an average value of third resistance values of the to-be-measured resistor measured by the insulation voltage withstanding test device for multiple times, calculate a capability coefficient of the gauge according to the average value and a resistance reference value, and determine that measurement stability of the insulation voltage withstanding test device meets a requirement when the capability coefficient of the gauge is greater than or equal to a third preset threshold value.

8. The detection circuit according to any one of claims 5 to 7, wherein the spot-detecting sub-circuit further comprises a third branch connected in parallel with the first branch and the second branch, the third branch comprising a third switching unit;

In the spot inspection stage, the third switch unit is turned off;

in the first measurement phase, the third switch unit is turned on;

In a second measurement phase, the third switching unit is turned on.

9. The detection circuit according to claim 1 or 2, further comprising a leakage protection switch electrically connected between the first connection terminal and the spot-check sub-circuit.

10. The detection circuit according to any one of claims 5 to 7, further comprising a gear switch electrically connected to the second connection terminal and the third connection terminal;

In the spot inspection stage, the gear switch is switched to a spot inspection gear, and the gear switch is used for communicating the second connecting end with the second end of the insulation voltage withstand test equipment;

In the first measurement stage, the gear switch is used for communicating the third connection end with the second end of the insulation voltage withstand test equipment.

11. A detection apparatus comprising a detection circuit as claimed in any one of claims 1 to 10.

12. The detection apparatus according to claim 11, characterized in that the detection apparatus further comprises:

A housing forming a receiving chamber, the housing having a first surface facing away from the receiving chamber and a second surface facing toward the receiving chamber;

The first switch unit and the second switch unit are connected with the shell in an insulating mode, and the first switch unit and the second switch unit protrude out of the first surface.

13. The detection apparatus of claim 12, wherein the detection circuit further comprises a detection instrument;

The shell is provided with an opening, the detecting instrument is connected with the shell through the opening, and a display screen of the detecting instrument faces towards one side of the shell, which faces away from the accommodating cavity.

14. The detection apparatus according to claim 12 or 13, wherein the detection circuit further comprises a gear switch and a leakage protection switch;

the gear switch and the leakage protection switch are connected with the shell in an insulating mode, and the gear switch and the leakage protection switch protrude out of the first surface.

15. A detection method applied to the detection circuit according to any one of claims 1 to 10 or the detection apparatus according to any one of claims 11 to 14, the detection method comprising:

In the spot inspection stage, the first switch unit and the second switch unit are controlled to be conducted; in the spot inspection stage, the first connecting end is electrically connected with a first end of the insulation voltage withstand test equipment, and the second connecting end is electrically connected with a second end of the insulation voltage withstand test equipment;

in the spot inspection stage, obtaining a test result of the insulation voltage withstand test equipment;

comparing the test result with a reference result;

And under the condition that the difference value between the test result and the reference result is smaller than or equal to a first preset threshold value, determining that the measurement state of the insulation voltage withstand test equipment meets the requirement.

16. The method according to claim 15, wherein the spot detection sub-circuit includes a plurality of the first branches connected in parallel, the capacitive elements in the plurality of the first branches being different in capacitance; the spot detection subcircuit comprises a plurality of second branches connected in parallel, and the resistance values of the voltage dividing elements in the second branches are different;

In the point detection stage, controlling the first switch unit and the second switch unit to be conducted comprises the following steps:

in the point detection stage, controlling the first switch units in a first target branch circuit in a plurality of first branch circuits to be conducted;

And in the point detection stage, controlling the second switch units in a second target branch circuit in a plurality of second branch circuits to be conducted.

17. The detection method according to claim 15, wherein the detection circuit further comprises:

a third connection end;

a fourth connection end;

The detection method further comprises the following steps:

In a first measurement stage, acquiring a first resistance value measured by the insulation voltage resistance test equipment and an electrical parameter acquired by the detection instrument; in the first measurement stage, the first connection end is electrically connected with a first end of the insulation and voltage withstand test equipment, the third connection end is electrically connected with a second end of the insulation and voltage withstand test equipment, the second connection end is electrically connected with a first end of an electric box to be measured, and the fourth connection end is electrically connected with a second end of the electric box to be measured;

calculating a second resistance value according to the electrical parameter;

And under the condition that the deviation between the first resistance value and the second resistance value is smaller than or equal to a second preset threshold value, determining that the measurement precision of the insulation withstand voltage test equipment meets the requirement.

18. The method of detecting according to claim 17, further comprising:

In the second measurement stage, obtaining an average value of third resistance values of the resistor to be measured, which are measured by the insulation voltage withstand test equipment for many times; in the second measurement stage, the first connection end is used for being electrically connected with the first end of the insulation voltage withstand test equipment, the third connection end is used for being electrically connected with the second end of the insulation voltage withstand test equipment, the second connection end is used for being electrically connected with the first end of the resistor to be measured, and the fourth connection end is used for being electrically connected with the second end of the resistor to be measured;

calculating a gauge capacity coefficient according to the average value and the resistance reference value;

and under the condition that the capability coefficient of the gauge is larger than or equal to a third preset threshold value, determining that the measurement stability of the insulation voltage withstand test equipment meets the requirement.

19. The detection method according to claim 17 or 18, wherein the spot-detecting subcircuit further comprises a third branch, said third branch being connected in parallel with the first branch and the second branch, said third branch comprising a third switching unit;

The detection method further comprises the following steps:

in the spot inspection stage, the third switch unit is controlled to be turned off;

and in the first measuring stage, controlling the third switch unit to be conducted.