CN118033228A - Microcurrent detection device and microcurrent detection method - Google Patents
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Abstract
Description
技术领域Technical Field
本申请属于电子技术领域,特别是涉及一种微电流检测装置及微电流检测方法。The present application belongs to the field of electronic technology, and in particular relates to a micro-current detection device and a micro-current detection method.
背景技术Background technique
DNA 测序技术(也称基因测序技术)是用于检测物种 DNA 序列的一种技术。相比于传统的DNA测序技术,基于纳米孔的第四代 DNA 测序技术在时间、成本和操作复杂度上有着天然的优势,其原理是检测DNA穿过纳米孔时产生的微弱特征电流信号来判定其碱基序列。因此精确测量该特征电流是实现高准确性基因测序的关键技术之一。DNA sequencing technology (also known as gene sequencing technology) is a technology used to detect the DNA sequence of species. Compared with traditional DNA sequencing technology, the fourth-generation DNA sequencing technology based on nanopores has natural advantages in time, cost and operational complexity. Its principle is to detect the weak characteristic current signal generated when DNA passes through the nanopore to determine its base sequence. Therefore, accurately measuring this characteristic current is one of the key technologies to achieve high-accuracy gene sequencing.
当前针对纳米孔DNA测序电流检测装置的研究主要集中在单通道和阵列化两种技术路线上。然而,单通道的架构面临功耗和面积消耗大的挑战,而阵列化的架构则受限于电路噪声,无法实现对pA(皮安)级别电流的准确检测。At present, the research on nanopore DNA sequencing current detection devices mainly focuses on two technical routes: single channel and array. However, the single channel architecture faces the challenge of high power consumption and area consumption, while the array architecture is limited by circuit noise and cannot achieve accurate detection of pA (picoampere) level current.
因此,如何设计出一种功耗低、面积小且准确率高的DNA测序装置成为目前亟待解决的问题。Therefore, how to design a DNA sequencing device with low power consumption, small area and high accuracy has become a problem that needs to be solved urgently.
发明内容Summary of the invention
本申请的目的在于提供一种微电流检测装置及微电流检测方法,能够满足实现纳米孔测序电流检测装置的微型化、低成本和高准确率的需要。The purpose of the present application is to provide a microcurrent detection device and a microcurrent detection method, which can meet the needs of miniaturization, low cost and high accuracy of nanopore sequencing current detection devices.
第一方面,本申请实施例提供了一种微电流检测装置,该装置包括:电流积分模块、相关双采样模块、差分放大模块和模数转换器;In a first aspect, an embodiment of the present application provides a micro-current detection device, the device comprising: a current integration module, a correlated double sampling module, a differential amplification module and an analog-to-digital converter;
电流积分模块包括多个电流输入接口和多个共用同一输入端的运算放大器,每个电流输入接口均对应一个运算放大器,且与该运算放大器的非共用输入端相连;每个电流输入接口用于接收一个纳米孔测序时产生的微电流信号并传输给对应的运算放大器处理,每个运算放大器用于对接收到的微电流信号进行积分放大,转换为电压信号;The current integration module includes multiple current input interfaces and multiple operational amplifiers sharing the same input terminal, each current input interface corresponds to an operational amplifier and is connected to the non-shared input terminal of the operational amplifier; each current input interface is used to receive a microcurrent signal generated during nanopore sequencing and transmit it to the corresponding operational amplifier for processing, and each operational amplifier is used to integrate and amplify the received microcurrent signal and convert it into a voltage signal;
相关双采样模块包括多个相关双采样电路,每个相关双采样电路均对应一个运算放大器,且与该运算放大器的输出端相连,用于采样该运算放大器在电流积分初始阶段输出的第一电压信号,以及采样该运算放大器在电流积分结束阶段对输出的第二电压信号;The correlated double sampling module includes a plurality of correlated double sampling circuits, each of which corresponds to an operational amplifier and is connected to the output end of the operational amplifier, and is used to sample a first voltage signal output by the operational amplifier at the initial stage of current integration, and to sample a second voltage signal output by the operational amplifier at the end stage of current integration;
差分放大模块用于根据第一电压信号和第二电压信号确定微电流信号对应的全差分电压信号;The differential amplifier module is used to determine a fully differential voltage signal corresponding to the micro-current signal according to the first voltage signal and the second voltage signal;
模数转换器用于根据全差分电压信号生成微电流的特征数据并输出。The analog-to-digital converter is used to generate and output characteristic data of micro-current according to the fully differential voltage signal.
在第一方面的一种可能的实现方式中,该微电流检测装置还包括寻址模块和通道选择器,通道选择器的一端与多个相关双采样电路相连,通道选择器的另一端与差分放大模块相连;寻址模块用于控制通道选择器遍历选择多个相关双采样电路中的每个相关双采样电路,并将被选择的相关双采样电路中存储的第一电压信号和第二电压信号传输给差分放大模块进行处理。In a possible implementation of the first aspect, the microcurrent detection device also includes an addressing module and a channel selector, one end of the channel selector is connected to a plurality of correlated double sampling circuits, and the other end of the channel selector is connected to a differential amplifier module; the addressing module is used to control the channel selector to traverse and select each correlated double sampling circuit in the plurality of correlated double sampling circuits, and transmit the first voltage signal and the second voltage signal stored in the selected correlated double sampling circuit to the differential amplifier module for processing.
在第一方面的一种可能的实现方式中,差分放大模块包括全差分开关电容放大器,全差分开关电容放大器用于,在采样态,采样被选择的相关双采样电路中存储的第一电压信号和第二电压信号,以及,在放大态,将第一电压信号和第二电压信号放大为全差分电压信号。In a possible implementation of the first aspect, the differential amplification module includes a fully differential switched capacitor amplifier, which is used to, in a sampling state, sample a first voltage signal and a second voltage signal stored in a selected correlated double sampling circuit, and, in an amplification state, amplify the first voltage signal and the second voltage signal into a fully differential voltage signal.
在第一方面的一种可能的实现方式中,微电流信号对应的全差分电压信号是利用以下公式得到的:In a possible implementation of the first aspect, the fully differential voltage signal corresponding to the micro-current signal is obtained using the following formula:
, ,
其中,为所述全差分电压信号,/>为全差分开关电容放大器的放大倍数,/>为所述第一电压信号,/>为所述第二电压信号。in, is the fully differential voltage signal, /> is the gain of the fully differential switched capacitor amplifier, /> is the first voltage signal,/> is the second voltage signal.
在第一方面的一种可能的实现方式中,模数转换器包括至少一个虚拟电容,至少一个虚拟电容用于调整模数转换器中桥接电容的大小,且位于模数转换器的低位部分。In a possible implementation manner of the first aspect, the analog-to-digital converter includes at least one virtual capacitor, which is used to adjust the size of a bridge capacitor in the analog-to-digital converter and is located in a low-order portion of the analog-to-digital converter.
在第一方面的一种可能的实现方式中,模数转换器为带有N个冗余位的逐次逼近型模数转换器;其中,N≥1,且为正整数。In a possible implementation manner of the first aspect, the analog-to-digital converter is a successive approximation analog-to-digital converter with N redundant bits; wherein N≥1 and is a positive integer.
在第一方面的一种可能的实现方式中,运算放大器为电容反馈跨导放大器。In a possible implementation manner of the first aspect, the operational amplifier is a capacitive feedback transconductance amplifier.
在第一方面的一种可能的实现方式中,每个相关双采样电路均包括至少一个模拟缓存器,至少一个模拟缓存器用于缓存第一电压信号和第二电压信号。In a possible implementation manner of the first aspect, each correlated double sampling circuit includes at least one analog buffer, and the at least one analog buffer is used to buffer the first voltage signal and the second voltage signal.
第二方面,本申请实施例提供了一种微电流检测方法,该方法包括:In a second aspect, an embodiment of the present application provides a microcurrent detection method, the method comprising:
利用电流积分模块分别采集多个纳米孔测序时产生的微电流信号,并将微电流进行积分放大,转换为电压信号;The current integration module is used to collect the microcurrent signals generated by multiple nanopore sequencing, integrate and amplify the microcurrent, and convert it into a voltage signal;
利用相关双采样模块采样电流积分模块在电流积分初始阶段输出的第一电压信号,以及采样电流积分模块在电流积分结束阶段输出的第二电压信号;Using a correlated double sampling module to sample a first voltage signal output by the current integration module at an initial stage of current integration, and a second voltage signal output by the current integration module at an end stage of current integration;
利用差分放大模块根据第一电压信号和第二电压信号确定微电流信号对应的全差分电压信号;Determine a fully differential voltage signal corresponding to the micro-current signal according to the first voltage signal and the second voltage signal using a differential amplifier module;
利用模数转换器根据全差分电压信号生成微电流的特征数据并输出。An analog-to-digital converter is used to generate characteristic data of micro-current based on the fully differential voltage signal and output it.
第三方面,本申请实施例提供了一种计算机设备,包括存储器、处理器以及存储在所述存储器中并可在所述处理器上运行的计算机程序,当处理器执行所述计算机程序时使得计算机设备实现如上述第一方面和第二方面中任一实现方式。In a third aspect, an embodiment of the present application provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the computer device implements any one of the implementation methods of the first and second aspects described above.
第四方面,本申请实施例提供了一种计算机可读存储介质,该计算机可读存储介质存储有计算机程序,当计算机程序被计算机设备执行时实现如上述第一方面和第二方面中任一实现方式。In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a computer device, it implements any implementation method of the first aspect and the second aspect mentioned above.
第五方面,本申请实施例提供了一种计算机程序产品,当计算机程序产品在计算机设备上运行时,使得计算机设备执行上述第一方面中任一项所述的实现方式。In a fifth aspect, an embodiment of the present application provides a computer program product, which, when executed on a computer device, enables the computer device to execute any one of the implementation methods described in the first aspect above.
本申请实施例与现有技术相比存在的有益效果是:Compared with the prior art, the embodiments of the present invention have the following beneficial effects:
本申请装置,通过多个电流输入接口和对应的运算放大器,以及相关双采样电路的并行设计,能够并行处理来自多个纳米孔测序通道的微电流信号,有效提高了电流检测效率、实时性,使其能够满足高通量的纳米孔测序需求。在此基础上,采用共享半边运放的设计有效减少系统整体的面积和功耗。此外,相关双采样和差分放大电路的设计,有助于降低噪声对结果的影响,进而保证了数据的准确性和可靠性。总的来说,本方案通过设置多电流检测通道、共享半边运放、进行相关双采样及差分放大等技术手段,实现了对纳米孔测序电流的高效读出,满足了高通量测序的需求,具有较好的技术效果。The device of the present application, through multiple current input interfaces and corresponding operational amplifiers, and the parallel design of the correlated double sampling circuit, can process microcurrent signals from multiple nanopore sequencing channels in parallel, effectively improving the current detection efficiency and real-time performance, so that it can meet the needs of high-throughput nanopore sequencing. On this basis, the design of the shared half-side operational amplifier effectively reduces the overall area and power consumption of the system. In addition, the design of the correlated double sampling and differential amplifier circuit helps to reduce the impact of noise on the results, thereby ensuring the accuracy and reliability of the data. In general, this scheme realizes efficient readout of nanopore sequencing current by setting multiple current detection channels, sharing half-side operational amplifiers, performing correlated double sampling and differential amplification and other technical means, meets the needs of high-throughput sequencing, and has good technical effects.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为本申请一实施例提供的电流检测装置的应用场景示意图;FIG1 is a schematic diagram of an application scenario of a current detection device provided by an embodiment of the present application;
图2为本申请一实施例提供的电流检测装置的结构示意图;FIG2 is a schematic diagram of the structure of a current detection device provided in an embodiment of the present application;
图3为本申请一实施例提供的运算放大器的电路示意图;FIG3 is a circuit diagram of an operational amplifier provided in an embodiment of the present application;
图4为本申请另一实施例提供的电流检测单元的电路示意图;FIG4 is a circuit diagram of a current detection unit provided in another embodiment of the present application;
图5为本申请另一实施例提供的电流检测装置的工作时序示意图;FIG5 is a schematic diagram of the working timing of a current detection device provided by another embodiment of the present application;
图6为本申请另一实施例提供的模数转换器的结构示意图;FIG6 is a schematic diagram of the structure of an analog-to-digital converter provided in another embodiment of the present application;
图7为本申请一实施例提供的电流检测芯片的系统框架图;FIG7 is a system framework diagram of a current detection chip provided in an embodiment of the present application;
图8为本申请一实施例提供的共享半边运放的结构示意图;FIG8 is a schematic diagram of the structure of a shared half-side operational amplifier provided in an embodiment of the present application;
图9为本申请另一实施例提供的电流检测方法的流程示意图;FIG9 is a schematic flow chart of a current detection method provided in another embodiment of the present application;
图10为本申请一实施例提供的计算机设备的结构示意图。FIG. 10 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application.
具体实施方式Detailed ways
为了使本申请的目的、技术方案及优点更加清楚明白,以下结合附图及实施例,对本申请进行进一步详细说明。应当理解,此处描述的具体实施例仅仅用以解释本申请,并不用于限定本申请。In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.
图1示出了本申请实施例提供的一种微电流检测装置的应用场景示意图。FIG1 shows a schematic diagram of an application scenario of a microcurrent detection device provided in an embodiment of the present application.
从图1可以看出,本申请提供的微电流检测装置可用于纳米孔测序过程产生的微电流的检测和读出。As can be seen from FIG. 1 , the microcurrent detection device provided in the present application can be used to detect and read out the microcurrent generated during the nanopore sequencing process.
纳米孔测序是指利用纳米孔检测DNA或RNA基因序列的技术。如图1,其原理是将核酸分子1引导通过纳米孔2时,核酸分子1具有的不同的碱基序列会产生微弱电流信号(pA级别),电流检测装置3测量并分析该微弱电流信号即可确定核酸分子的碱基序列。Nanopore sequencing refers to the technology of using nanopores to detect DNA or RNA gene sequences. As shown in Figure 1, the principle is that when a nucleic acid molecule 1 is guided through a nanopore 2, different base sequences of the nucleic acid molecule 1 will generate a weak current signal (pA level), and the current detection device 3 measures and analyzes the weak current signal to determine the base sequence of the nucleic acid molecule.
可以理解的是,电流检测装置3可以为集成有相应电路的纳米孔测序电流检测芯片。It is understandable that the current detection device 3 may be a nanopore sequencing current detection chip integrated with a corresponding circuit.
基于通道数量及处理能力,可将纳米孔测序电流检测装置分为单通道型和阵列型(多通道型)。其区别在于:单通道型只有一个纳米孔通道,因此每次只能读取一个核酸分子的序列信息并依次进行处理,功耗低、面积小、处理能力较低、处理时间较长;而阵列型包含多个纳米孔通道,可以同时读取、并行处理多个核酸分子的序列信息,功耗高、面积大、处理能力更强。Based on the number of channels and processing power, nanopore sequencing current detection devices can be divided into single-channel type and array type (multi-channel type). The difference is that the single-channel type has only one nanopore channel, so it can only read the sequence information of one nucleic acid molecule at a time and process it in sequence, with low power consumption, small area, low processing power and long processing time; while the array type contains multiple nanopore channels, which can read and process the sequence information of multiple nucleic acid molecules at the same time, with high power consumption, large area and stronger processing power.
针对上述两种类型的纳米孔测序电流检测装置存在的问题,本申请提出了一种新的电流检测架构,旨在综合单通道型和阵列型的优点,实现纳米孔测序装置的微型化、低成本和高准确率。In response to the problems existing in the above two types of nanopore sequencing current detection devices, the present application proposes a new current detection architecture, which aims to combine the advantages of single-channel and array types to achieve miniaturization, low cost and high accuracy of nanopore sequencing devices.
图2示出了本申请实施例提供的一种微电流检测装置的结构示意图。FIG2 shows a schematic structural diagram of a microcurrent detection device provided in an embodiment of the present application.
下面结合图2,阐述微电流检测装置200的一种结构。A structure of a micro-current detection device 200 is described below in conjunction with FIG. 2 .
微电流检测装置200可以包括电流积分模块210、相关双采样模块220、差分放大模块230和模数转换器240。The micro-current detection device 200 may include a current integration module 210 , a correlated double sampling module 220 , a differential amplification module 230 and an analog-to-digital converter 240 .
从图2可以看出,电流积分模块210、相关双采样模块220、差分放大模块230和模数转换器240依次连接。It can be seen from FIG. 2 that the current integration module 210 , the correlated double sampling module 220 , the differential amplification module 230 and the analog-to-digital converter 240 are connected in sequence.
电流积分模块210用于接收来自纳米孔测序的微电流信号,并进行积分运算将其转换为相应的电压信号。The current integration module 210 is used to receive the microcurrent signal from the nanopore sequencing and perform integration operation to convert it into a corresponding voltage signal.
相关双采样模块220用于对电流积分模块210生成的电压信号进行两次采样,获得两次电压采样结果。The correlated double sampling module 220 is used to sample the voltage signal generated by the current integration module 210 twice to obtain two voltage sampling results.
差分放大模块230用于对相关双采样模块220生成的两次电压采样结果进行差分放大处理,得到全差分电压信号。The differential amplifier module 230 is used to perform differential amplification processing on the two voltage sampling results generated by the correlated double sampling module 220 to obtain a fully differential voltage signal.
模数转换器240用于根据差分放大模块230生成的全差分电压信号,将其转换为微电流的特征数据,并输出。The analog-to-digital converter 240 is used to convert the fully differential voltage signal generated by the differential amplifier module 230 into characteristic data of micro-current and output it.
示例性的,模数转换器240生成的微电流对应的特征数据可以为15比特数字量。Exemplarily, the characteristic data corresponding to the microcurrent generated by the analog-to-digital converter 240 may be a 15-bit digital quantity.
下面对电流积分模块210的内部结构进行说明。The internal structure of the current integration module 210 is described below.
电流积分模块210包括多个电流输入接口211和多个运算放大器212,且多个电流输入接口211和多个运算放大器212间存在一一对应连接的关系。The current integration module 210 includes a plurality of current input interfaces 211 and a plurality of operational amplifiers 212 , and there is a one-to-one corresponding connection relationship between the plurality of current input interfaces 211 and the plurality of operational amplifiers 212 .
电流输入接口211用于接收纳米孔测序产生的微电流信号并传输给对应的运算放大器212处理。The current input interface 211 is used to receive the microcurrent signal generated by the nanopore sequencing and transmit it to the corresponding operational amplifier 212 for processing.
运算放大器212用于对接收到的来自对应电流输入接口211的微电流信号进行积分放大,转换为电压信号。The operational amplifier 212 is used to integrate and amplify the micro-current signal received from the corresponding current input interface 211 and convert it into a voltage signal.
需要说明的是,电流积分模块210中的多个运算放大器212采用共享半边运放的设计。也就是说,所有运算放大器212均不具有完全独立的电路,而是共同使用同一部分的电路元件,即共享同一输入端。It should be noted that the multiple operational amplifiers 212 in the current integration module 210 adopt a shared half-side operational amplifier design. That is, all operational amplifiers 212 do not have completely independent circuits, but share the same circuit elements, that is, share the same input terminal.
应理解,共享的部分可以为反相输入端或非反相输入端,本申请对此不作限定。It should be understood that the shared part may be an inverting input terminal or a non-inverting input terminal, and this application does not limit this.
还应理解,电流输入接口211与运算放大器212剩余的独立的输入端相连。It should also be understood that the current input interface 211 is connected to the remaining independent input terminals of the operational amplifier 212 .
本申请采用共享半边运放的设计,在多个运算放大器之间共享一些电路元件,其好处在于:可使电流检测电路整体更加紧凑、占据的空间更小,并减少电流检测电路中的器件数量和功耗,从而降低系统的能耗和制造成本;此外,共享部分可以使得共享的电路元件更加匹配,减小了失调和噪声的影响,提高了整个电流检测系统的性能和稳定性。The present application adopts a shared half-side operational amplifier design to share some circuit elements between multiple operational amplifiers. The advantages are: it can make the current detection circuit more compact as a whole, occupy less space, and reduce the number of devices and power consumption in the current detection circuit, thereby reducing the energy consumption and manufacturing cost of the system; in addition, the shared part can make the shared circuit elements more matched, reduce the impact of offset and noise, and improve the performance and stability of the entire current detection system.
可选的,运算放大器212的类型为电容反馈跨导放大器(CapacitiveTransimpedance Amplifie,CTIA)。相比于其他运算放大器,电容反馈跨导放大器在保证放大器性能的同时,具有高增益、宽带宽、低噪声和较好的稳定性等特点,适用于对纳米孔测序产生的低电流信号进行放大且对噪声要求较高的应用场景。Optionally, the operational amplifier 212 is a capacitive feedback transconductance amplifier (CTIA). Compared with other operational amplifiers, the capacitive feedback transconductance amplifier has the characteristics of high gain, wide bandwidth, low noise and good stability while ensuring the amplifier performance. It is suitable for amplifying the low current signal generated by nanopore sequencing and has high noise requirements.
图3为本申请一实施例给出的基于共享半边运放的电容反馈跨导放大器的电路示意例图。从图中可以看出,m个电容反馈跨导放大器共用同一非反相输入端。每个电容反馈跨导放大器均包括一个共用的非反相输入端、一个独立的反相输入端和一个输出端。其中,电容反馈跨导放大器通过反相输入端接收来自对应电流输入接口发送的微电流信号,进行积分放大处理得到微电流信号对应的电压信号,再通过输出端输出。FIG3 is a circuit diagram of a capacitive feedback transconductance amplifier based on a shared half-side op amp according to an embodiment of the present application. As can be seen from the figure, m capacitive feedback transconductance amplifiers share the same non-inverting input terminal. Each capacitive feedback transconductance amplifier includes a common non-inverting input terminal, an independent inverting input terminal and an output terminal. Among them, the capacitive feedback transconductance amplifier receives a micro-current signal sent from a corresponding current input interface through an inverting input terminal, performs integral amplification processing to obtain a voltage signal corresponding to the micro-current signal, and then outputs it through the output terminal.
下面对相关双采样模块220的内部结构进行说明。The internal structure of the correlated double sampling module 220 is described below.
相关双采样模块220包括多个相同的相关双采样电路221。The correlated double sampling module 220 includes a plurality of identical correlated double sampling circuits 221 .
每个相关双采样电路221与电流积分模块210中的每个运算放大器也存在一一对应连接的关系。There is also a one-to-one connection relationship between each correlated double sampling circuit 221 and each operational amplifier in the current integration module 210 .
相关双采样电路221用于对来自对应运算放大器的电压信号进行两次采样,获得两次电压采样结果。即分别在积分初始阶段和积分结束阶段进行电压采样,对应得到第一电压信号和第二电压信号。The correlated double sampling circuit 221 is used to sample the voltage signal from the corresponding operational amplifier twice to obtain two voltage sampling results, that is, to sample the voltage at the initial stage of integration and the final stage of integration respectively, and to obtain the first voltage signal and the second voltage signal accordingly.
可选的,相关双采样模块220还可以包括一个或多个模拟缓存器(Buffer)。这些缓存器用于暂时存储电压采样结果,以便后续的处理或转换。Optionally, the correlated double sampling module 220 may further include one or more analog buffers, which are used to temporarily store the voltage sampling results for subsequent processing or conversion.
需要说明的是,电流积分模块210中的电流输入接口211、放大器212以及相关双采样模块220中的相关双采样电路221是一一对应连接的,简单来说,就是每个电流输入接口211、放大器212和相关双采样电路221都是互相配对连接的。每组这样的连接(电流输入接口211、放大器212和相关双采样电路221)构成一个电流检测单元。而每个电流检测单元都有一个特定的用途,即用于检测一个纳米孔测序微电流检测通道的电流。It should be noted that the current input interface 211, the amplifier 212 in the current integration module 210 and the correlated double sampling circuit 221 in the correlated double sampling module 220 are connected one by one. In simple terms, each current input interface 211, the amplifier 212 and the correlated double sampling circuit 221 are connected in pairs with each other. Each group of such connections (current input interface 211, amplifier 212 and correlated double sampling circuit 221) constitutes a current detection unit. Each current detection unit has a specific purpose, that is, it is used to detect the current of a nanopore sequencing microcurrent detection channel.
图4为本申请一实施例给出的电流检测单元的电路示意例图。图中左侧电路结构一为电流输入接口211和放大器212的示例,右侧电路结构二为相关双采样电路221的示例。从图中可以看出,在此例中,第一电压信号被保存在一个缓存器中,第二电压信号被保存在另一个缓存器中,以便进一步的分析或数字化处理。FIG4 is a circuit diagram of a current detection unit according to an embodiment of the present application. The circuit structure 1 on the left side of the figure is an example of a current input interface 211 and an amplifier 212, and the circuit structure 2 on the right side is an example of a correlated double sampling circuit 221. As can be seen from the figure, in this example, the first voltage signal is stored in a buffer and the second voltage signal is stored in another buffer for further analysis or digital processing.
图5为本申请一实施例给出的电流检测装置工作时序的示意例图。FIG. 5 is a schematic diagram of an example of a working sequence of a current detection device according to an embodiment of the present application.
下面结合图4和图5介绍相关双采样电路的工作原理及采样过程。The working principle and sampling process of the correlated double sampling circuit are described below in conjunction with FIG. 4 and FIG. 5 .
在电流积分初始阶段,相关双采样电路对积分输出的电压信号进行第一次采样,即获取积分开始时刻的电压值,称为第一电压信号(记为或/>)。At the initial stage of current integration, the correlated double sampling circuit samples the voltage signal output by the integration for the first time, that is, obtains the voltage value at the beginning of the integration, which is called the first voltage signal (denoted as or/> ).
在电流积分结束阶段,相关双采样电路再次对积分输出的电压信号进行第二次采样,获取积分结束时刻的电压值,称为第二电压信号(记为或/>)。At the end of the current integration, the correlated double sampling circuit samples the voltage signal output by the integration for the second time to obtain the voltage value at the end of the integration, which is called the second voltage signal (denoted as or/> ).
通过两次采样,相关双采样电路可以获取到在积分过程中起始和结束时刻的电压值,从而可以计算出电压信号的变化量,即积分的结果。By sampling twice, the correlated double sampling circuit can obtain the voltage values at the start and end of the integration process, so that the change of the voltage signal, that is, the result of the integration, can be calculated.
本申请采用的模拟相关双采样方法及电路设计对固定失调电压1/f噪声和低频噪声的抑制效果较好,对热噪声和KT/C噪声有一定的抑制,从而可以减少消除由于电路漂移、噪声等因素引起的误差,提高了积分的准确性和可靠性。The analog correlated double sampling method and circuit design adopted in this application have a good suppression effect on fixed offset voltage 1/f noise and low-frequency noise, and have a certain suppression effect on thermal noise and KT/C noise, thereby reducing and eliminating errors caused by factors such as circuit drift and noise, and improving the accuracy and reliability of integration.
下面对差分放大模块230的内部结构进行说明。The internal structure of the differential amplifier module 230 is described below.
差分放大模块230包括全差分开关电容放大器。The differential amplifier module 230 includes a fully differential switched capacitor amplifier.
可选的,该全差分开关电容放大器带有失调电压消除功能。Optionally, the fully differential switched capacitor amplifier has an offset voltage cancellation function.
全差分开关电容放大器用于电压采样和差分放大。具体地,在采样态,全差分开关电容放大器将采样相关双采样模块中存储的第一电压信号和第二电压信号;以及,在放大态,全差分开关电容放大器将第一电压信号和第二电压信号的差值放大为全差分电压信号。The fully differential switched capacitor amplifier is used for voltage sampling and differential amplification. Specifically, in the sampling state, the fully differential switched capacitor amplifier samples the first voltage signal and the second voltage signal stored in the correlated double sampling module; and, in the amplification state, the fully differential switched capacitor amplifier amplifies the difference between the first voltage signal and the second voltage signal into a fully differential voltage signal.
可以理解的是,经相关双采样模块220采样得到的第一电压信号和第二电压信号是由同一微电流信号转换得到的伪差分信号。在差分放大模块230中,将一个信号与另一个信号进行相减,并通过放大器来增加差异,由此实现了将第一电压信号和第二电压信号这两个伪差分信号转成全差分信号,此方法可以获得更大的动态范围和增益,有助于提高信号的可测量性和可靠性。It can be understood that the first voltage signal and the second voltage signal sampled by the correlated double sampling module 220 are pseudo differential signals converted from the same micro-current signal. In the differential amplifier module 230, one signal is subtracted from the other signal, and the difference is increased by an amplifier, thereby realizing the conversion of the two pseudo differential signals of the first voltage signal and the second voltage signal into a full differential signal. This method can obtain a larger dynamic range and gain, which helps to improve the measurability and reliability of the signal.
应理解,不同于电流积分模块210中的运算放大器212,差分放大模块230中的开关电容放大器232是复用的,因而可以极大地降低单个检测通道的功耗,经此在低功耗和低噪声的约束下完成了将pA级别的纳米孔微弱电流放大成mV级别的电压信号。It should be understood that, unlike the operational amplifier 212 in the current integration module 210, the switched capacitor amplifier 232 in the differential amplifier module 230 is multiplexed, thereby greatly reducing the power consumption of a single detection channel, thereby completing the amplification of the pA-level nanopore weak current into an mV-level voltage signal under the constraints of low power consumption and low noise.
基于上述描述可以得知,相关双采样模块220输出的第一电压信号和第二电压信号进入到伪差分转全差分模块231后,经其差分处理后再由得到开关电容放大器232放大得到全差分电压信号。Based on the above description, it can be known that after the first voltage signal and the second voltage signal output by the correlated double sampling module 220 enter the pseudo differential to full differential module 231, they are differentially processed and then amplified by the switched capacitor amplifier 232 to obtain a full differential voltage signal. .
全差分电压信号的计算公式如下:Fully differential voltage signal The calculation formula is as follows:
, ,
其中,为全差分输出电压,/>为全差分开关电容放大器的正向输出端电压,为全差分开关电容放大器的负向输出端电压,/>为二级全差分开关电容放大器的放大倍数。in, is the fully differential output voltage,/> is the positive output voltage of the fully differential switched capacitor amplifier, is the negative output voltage of the fully differential switched capacitor amplifier, /> is the gain of the two-stage fully differential switched capacitor amplifier.
需要说明的是,在电流积分的初始阶段采样到的电压仅仅包含了电路噪声和运放的失调电压/>,而在电流积分结束阶段采样到的电压/>包括电路噪声、失调电压/>和积分得到的电压信号/>。可以理解的是,这两次采样得到的电压信号差异的核心部分是积分得到的电压信号,其包含了纳米孔测序电流的信息。It should be noted that the voltage sampled at the initial stage of current integration is Only circuit noise is included and the offset voltage of the op amp/> , and the voltage sampled at the end of the current integration phase/> Including circuit noise , offset voltage/> And the voltage signal obtained by integration/> It can be understood that the core part of the difference between the voltage signals obtained by the two samplings is the voltage signal obtained by integration, which contains the information of the nanopore sequencing current.
在考虑噪声和失调的情况下,两次采样的噪声越相关,则经过相关双采样之后对噪声的抑制效果越好,经过伪差分转全差分模块后输出的电压为实际为:Considering the noise and offset, the more correlated the noise of the two samples is, the better the noise suppression effect will be after the correlated double sampling. The output voltage after the pseudo-differential to full differential module is The actual value is:
, ,
这样的处理方式能够在一定程度上抵消电路噪声和失调对最终输出结果的影响,提高了信号的准确性和可靠性。此外,全差分信号对于工频干扰、时钟串扰等共模噪声具有较好的抑制能力,可以进一步提高信号的质量。This processing method can offset the impact of circuit noise and offset on the final output to a certain extent, improving the accuracy and reliability of the signal. In addition, the fully differential signal has a good suppression ability for common mode noise such as power frequency interference and clock crosstalk, which can further improve the signal quality.
本申请揭示的装置,通过多个电流输入接口和对应的运算放大器,以及相关双采样电路的并行设计,能够并行处理来自多个纳米孔测序通道的微电流信号,有效提高了电流检测效率、实时性,使其能够满足高通量的纳米孔测序需求。在此基础上,采用共享半边运放的设计有效减少系统整体的面积和功耗。此外,相关双采样和差分放大电路的设计,有助于降低噪声对结果的影响,进而保证了数据的准确性和可靠性。The device disclosed in this application, through multiple current input interfaces and corresponding operational amplifiers, and the parallel design of correlated double sampling circuits, can process microcurrent signals from multiple nanopore sequencing channels in parallel, effectively improving the efficiency and real-time performance of current detection, so that it can meet the needs of high-throughput nanopore sequencing. On this basis, the design of shared half-side operational amplifiers effectively reduces the overall area and power consumption of the system. In addition, the design of correlated double sampling and differential amplifier circuits helps to reduce the impact of noise on the results, thereby ensuring the accuracy and reliability of the data.
综上所述,本方案通过设置多电流检测通道、共享半边运放、进行相关双采样及差分放大等技术手段,实现了对纳米孔测序电流的高效读出,满足了高通量测序的需求,具有较好的技术效果。In summary, this scheme achieves efficient readout of nanopore sequencing current by setting up multiple current detection channels, sharing half-edge op amps, performing correlated double sampling and differential amplification, meeting the needs of high-throughput sequencing and having good technical effects.
在一个实施例中,微电流检测装置200还可以包括数字编码模块250。数字编码模块250用于将模数转换器240输出的数字量进行编码,将其转换为特定的数字格式或编码方式,以便于后续的数字信号处理或传输。In one embodiment, the microcurrent detection device 200 may further include a digital encoding module 250. The digital encoding module 250 is used to encode the digital quantity output by the analog-to-digital converter 240 and convert it into a specific digital format or encoding method to facilitate subsequent digital signal processing or transmission.
在一个例子中,模数转换器240将微电流对应的特征数据量化为15比特数字量,数字编码模块250将15比特的非二进制数字量转换成12比特的二进制数字量再与增益码、地址码一块输出。In one example, the analog-to-digital converter 240 quantizes the characteristic data corresponding to the microcurrent into a 15-bit digital quantity, and the digital encoding module 250 converts the 15-bit non-binary digital quantity into a 12-bit binary digital quantity and outputs it together with the gain code and the address code.
在一个实施例中,微电流检测装置200还包括寻址模块260和通道选择器。In one embodiment, the micro-current detection device 200 further includes an addressing module 260 and a channel selector.
通道选择器的一端同时连接由多个相关双采样电路,另一端与差分放大模块相连。One end of the channel selector is simultaneously connected to a plurality of correlated double sampling circuits, and the other end is connected to a differential amplifier module.
寻址模块260用于控制通道选择器遍历选择多个相关双采样电路中的每个相关双采样电路,并将被选择的相关双采样电路中存储的所述第一电压信号和所述第二电压信号传输给差分放大模块230进行处理。The addressing module 260 is used to control the channel selector to traverse and select each correlated double sampling circuit among the multiple correlated double sampling circuits, and transmit the first voltage signal and the second voltage signal stored in the selected correlated double sampling circuit to the differential amplification module 230 for processing.
在一个实施例中,微电流检测装置200还可以包括时钟产生模块270。时钟产生模块270用于同步微电流检测装置200中各模块的工作,确保它们按照预定的时间序列进行操作。In one embodiment, the micro-current detection device 200 may further include a clock generation module 270. The clock generation module 270 is used to synchronize the operation of each module in the micro-current detection device 200 to ensure that they operate according to a predetermined time sequence.
在模数转换器240中,针对分段电容中的桥接电容是分数倍单位电容,在实际制造过程中很难做到匹配的问题,本申请装置提出在低位增加虚拟(dummy)电容主动引入失配,从而使桥接电容为整数倍的单位电容,减小了电容失配对ADC性能的影响。In the analog-to-digital converter 240, the bridge capacitance in the segmented capacitance is a fractional multiple of the unit capacitance, which is difficult to match in the actual manufacturing process. The device of the present application proposes to add a dummy capacitance at a low position to actively introduce a mismatch, so that the bridge capacitance is an integer multiple of the unit capacitance, thereby reducing the impact of the capacitance mismatch on the ADC performance.
即,可选的,模数转换器240可以包括至少一个虚拟电容。虚拟电容用于调整所述模数转换器中桥接电容的大小,且位于模数转换器240的低位部分。That is, optionally, the analog-to-digital converter 240 may include at least one virtual capacitor. The virtual capacitor is used to adjust the size of the bridge capacitor in the analog-to-digital converter and is located at the lower part of the analog-to-digital converter 240.
可选的,模数转换器240可以为逐次逼近型模数转换器(SuccessiveApproximation Register Analog-to-Digital Converter,SAR ADC)。逐次逼近型模数转换器的工作原理是通过逐步逼近来确定模拟信号的数字表示。相较于其他类型的模数转换器,逐次逼近型模数转换器高速、低功耗和适用于宽范围的应用等优点。Optionally, the analog-to-digital converter 240 may be a successive approximation register analog-to-digital converter (SAR ADC). The working principle of the SAR ADC is to determine the digital representation of the analog signal by stepwise approximation. Compared with other types of SAR converters, the SAR ADC has the advantages of high speed, low power consumption and applicability to a wide range of applications.
为了纠正逐次逼近模数转换器(SAR ADC)在某次转换过程中由于比较器的噪声或者外部的干扰导致的比较器比较出错,本申请在逐次逼近模数转换器中引入了N(N≥1,正整数)位冗余,用以逐次逼近模数转换器的自纠错。In order to correct comparator comparison errors caused by comparator noise or external interference in a successive approximation analog-to-digital converter (SAR ADC) during a conversion process, the present application introduces N (N≥1, a positive integer) bits of redundancy in the successive approximation analog-to-digital converter for self-error correction of the successive approximation analog-to-digital converter.
在DAC的设计中,通常会有一系列电容用于表示不同的比特位。通过调整这些电容的值,可以控制每一位的输出,包括冗余位。In the design of DAC, there is usually a series of capacitors used to represent different bits. By adjusting the value of these capacitors, the output of each bit can be controlled, including the redundant bits.
在图6所示的一个例子中,本申请提出了一种新型的带三位冗余的CDAC,通过将高位部分和低位部分的电容进行拆分和重新分配的方式来实现三位冗余。其设计方式如下:In an example shown in FIG6 , the present application proposes a novel CDAC with three-bit redundancy, which realizes three-bit redundancy by splitting and redistributing the capacitors of the high-order part and the low-order part. The design method is as follows:
首先,通过将高位部分(MSB段)的最高位和次高位的电容数分别拆成24*Cu(用Cu代表一个单位电容,24*Cu代表24倍的单位电容)+8*Cu和12*Cu+4*Cu。在最高位放置电容数为24*Cu,次高位放置电容数为12*Cu,将拆出来的8*Cu和4*Cu放置在较低位形成2位冗余。First, the capacitance of the highest and second highest bits of the high-order part (MSB segment) is split into 24*Cu (Cu represents a unit capacitance, 24*Cu represents 24 times the unit capacitance) + 8*Cu and 12*Cu + 4*Cu respectively. The capacitance of the highest bit is 24*Cu, the capacitance of the second highest bit is 12*Cu, and the split 8*Cu and 4*Cu are placed in the lower bits to form 2-bit redundancy.
同理,将低位部分(LSB段)的最高位的电容数拆成12*Cu+4*Cu,原来LSB段最高位的位置上放置12*Cu,4*Cu放置于较低位形成一位冗余位。Similarly, the capacitance of the highest bit of the low-order part (LSB segment) is split into 12*Cu+4*Cu, 12*Cu is placed at the highest bit of the original LSB segment, and 4*Cu is placed at the lower bit to form a redundant bit.
因此,MSB段两位冗余加上LSB段的一位冗余一共形成三位冗余。这些冗余位可以提高系统的容错性和精确度,从而改善模数转换器的性能。Therefore, the two redundancy bits in the MSB segment plus the one redundancy bit in the LSB segment form a total of three redundancy bits. These redundant bits can improve the fault tolerance and accuracy of the system, thereby improving the performance of the analog-to-digital converter.
在另一个例子中,在上述设计的基础上,可以在CDAC的低位引入31*Cu的虚拟(dummy)电容,使得分段电容CDAC的桥接电容为整数倍单位电容2*Cu,可以极大地减小桥接电容的失配,减小工艺失配对SAR ADC性能的影响。In another example, based on the above design, a dummy capacitor of 31*Cu can be introduced at the low position of CDAC, so that the bridge capacitance of the segmented capacitor CDAC is an integer multiple of the unit capacitance 2*Cu, which can greatly reduce the mismatch of the bridge capacitance and reduce the impact of process mismatch on the performance of SAR ADC.
对上述例子中带3位冗余CDAC的SAR ADC进行仿真,结果为:在5MHz的采样率下,输入信号为2.01MHz时,其有效位数(ENOB)为11.61bit,可以验证此新型分段冗余CDAC可以实现很好的性能。The SAR ADC with 3-bit redundant CDAC in the above example is simulated, and the result is: at a sampling rate of 5MHz, when the input signal is 2.01MHz, its effective number of bits (ENOB) is 11.61bit, which verifies that this new segmented redundant CDAC can achieve good performance.
图7示出了本申请一实施例提供的纳米孔测序微弱电流检测芯片的系统框架图。FIG. 7 shows a system framework diagram of a nanopore sequencing weak current detection chip provided in an embodiment of the present application.
可以理解的是,该实施例中的纳米孔测序微弱电流检测芯片为图2电流检测装置的一个示例。It can be understood that the nanopore sequencing weak current detection chip in this embodiment is an example of the current detection device in FIG. 2 .
该芯片包括7个模块:电流积分模块710(图2中电流积分模块210的一例)、相关双采样模块720(图2中相关双采样模块220的一例)、差分放大模块730(图2中差分放大模块230的一例)、模数转换模块740(图2中模数转换器240的一例)、数字编码模块750、寻址模块760、时钟产生模块770。The chip includes 7 modules: a current integration module 710 (an example of the current integration module 210 in Figure 2), a correlated double sampling module 720 (an example of the correlated double sampling module 220 in Figure 2), a differential amplifier module 730 (an example of the differential amplifier module 230 in Figure 2), an analog-to-digital conversion module 740 (an example of the analog-to-digital converter 240 in Figure 2), a digital encoding module 750, an addressing module 760, and a clock generation module 770.
每个模块采用图中所示的电路结构实现其功能。其中,需要强调的是,电流积分模块710采用基于共享半边运放的32通道电流积分电路;模数转换模块740包括基于新型分段带3位冗余的模数转换器。Each module uses the circuit structure shown in the figure to realize its function. It should be emphasized that the current integration module 710 uses a 32-channel current integration circuit based on a shared half-edge operational amplifier; the analog-to-digital conversion module 740 includes an analog-to-digital converter based on a new segmented 3-bit redundant.
基于上述设计,该芯片可以同时对32个通道的纳米孔测序电流进行检测并且量化成数字量进行输出。Based on the above design, the chip can simultaneously detect the nanopore sequencing currents of 32 channels and quantify them into digital quantities for output.
如图7的系统框架图所示,该芯片最前端是4组基于8个共享半边运放的电容反馈跨导放大器(CTIA),用于对纳米孔电流进行积分转换成电压信号,以实现GΩ级别的高跨导增益。这种全新的共享半边运放,可以让8个CTIA共享一个半边运放,可以将单个检测单元的功耗、失调和噪声均降低近一半,实现了功耗与噪声这对矛盾的均衡。As shown in the system framework diagram in Figure 7, the front end of the chip is 4 groups of capacitive feedback transconductance amplifiers (CTIA) based on 8 shared half-side op amps, which are used to integrate the nanopore current and convert it into a voltage signal to achieve a high transconductance gain of GΩ level. This new shared half-side op amp allows 8 CTIAs to share one half-side op amp, which can reduce the power consumption, offset and noise of a single detection unit by nearly half, achieving a balance between power consumption and noise.
共享8个半边运放的具体晶体管级实现如图8,共享半边电路(即第一级)由 M0、M1、M3、M5、M6和M7组成, 在第一级的公共节点VCOM中添加了8 个独立的半边电路。第n个独立半边电路(即第n 级)包括 M2_n,M4_n,M8_n,M9_n,M10_n,其中n的范围是从1到8,偏置电压VBP1、VBP2、Vcn、Vbn1由偏置电路独立产生。共享的半边电路包含一个负反馈环路,该环路将公共节点电压VCOM维持在仅高于同相输入电压Vip的水平,因此晶体管M0可以自动调节流过一个共享半边电路和8个独立半边电路的电流之和。通过考虑第一级共享的半边电路和独立的第n级半边电路来描述单个放大器的工作。如果第n级的反向输入端电压等于共享级同向输入端电压/>,那么和M1管相同的M2_n管也将流过Ib的电流,此时共享运放的所有管子均处于饱和区。如果/>稍微低/>,则晶体管M2_n 将流过比Ib大得多的电流,从而减少M10_n中的电流,Vout<n>升高,直到M8_n 处于线性区。反之,如果/>稍微高于,则晶体管M2_n将流过比Ib小得多的电流,从而增加了 M10_n 中的电流,/>下降,直到M10_n 处于线性区。The specific transistor-level implementation of sharing 8 half-side op amps is shown in Figure 8. The shared half-side circuit (i.e., the first stage) consists of M0, M1, M3, M5, M6, and M7. Eight independent half-side circuits are added to the common node VCOM of the first stage. The nth independent half-side circuit (i.e., the nth stage) includes M2_n, M4_n, M8_n, M9_n, and M10_n, where n ranges from 1 to 8, and the bias voltages VBP1, VBP2, Vcn, and Vbn1 are independently generated by the bias circuit. The shared half-side circuit contains a negative feedback loop that maintains the common node voltage VCOM at a level just above the in-phase input voltage Vip, so that transistor M0 can automatically adjust the sum of the currents flowing through a shared half-side circuit and the eight independent half-side circuits. The operation of a single amplifier is described by considering the first-stage shared half-side circuit and the independent nth-stage half-side circuit. If the voltage at the reverse input terminal of the nth stage Equal to the voltage at the same-direction input terminal of the shared stage/> , then the M2_n tube, which is the same as the M1 tube, will also flow through the current of Ib, and at this time all the tubes of the shared op amp are in the saturation region. If/> Slightly lower/> , then transistor M2_n will flow a current much larger than Ib, thereby reducing the current in M10_n, and Vout<n> increases until M8_n is in the linear region. Conversely, if/> Slightly above , then transistor M2_n will flow a current much smaller than Ib, thereby increasing the current in M10_n,/> Decrease until M10_n is in the linear region.
在≈/>的条件下,共享半边运算放大器的增量输出电压由以下公式得到:exist ≈/> Under the condition of , the incremental output voltage of the shared half operational amplifier is obtained by the following formula:
, ,
而and
, ,
其中,是放大器的低频增益,/>是晶体管的跨导,/>是晶体管的输出电阻。in, is the low frequency gain of the amplifier, /> is the transconductance of the transistor, /> is the output resistance of the transistor.
此外,经过模拟相关双采样将第一级的CTIA中共享运放的失调和纳米孔自身的空间噪声存储在电容中,同时相关双采样(CDS)还可以极大地降低对纳米孔电流信号干扰很大的低频电路闪烁噪声。第一级的CTIA和CDS就组成了一个微弱电流检测单元,单个检测单元最主要的失调、噪声和功耗均来自第一级CTIA中的运算放大器,经测试,未经过相关双采样的电流积分输出电压的噪声频域曲线对应的噪底为62.5uV/√Hz,而经过相关双采样的电流积分输出电压的噪声频域曲线对应的噪底降低为38.03uV/√Hz,可以看到经过基于共享半边运放和相关双采样后,输出电压的噪声被抑制了超过1/3。In addition, the offset of the shared op amp in the first-stage CTIA and the spatial noise of the nanopore itself are stored in the capacitor through analog correlated double sampling. At the same time, correlated double sampling (CDS) can also greatly reduce the low-frequency circuit flicker noise that greatly interferes with the nanopore current signal. The first-stage CTIA and CDS form a weak current detection unit. The main offset, noise and power consumption of a single detection unit all come from the operational amplifier in the first-stage CTIA. After testing, the noise frequency domain curve of the current integration output voltage without correlated double sampling corresponds to a noise floor of 62.5uV/√Hz, while the noise frequency domain curve of the current integration output voltage after correlated double sampling corresponds to a noise floor of 38.03uV/√Hz. It can be seen that after the shared half-side op amp and correlated double sampling, the noise of the output voltage is suppressed by more than 1/3.
然后,单个检测单元在寻址电路的控制下通过模拟通道选择器的选择进入第二级8×4个单元复用的开关电容放大器,对放大的电压信号进一步的放大,以提高信噪比,同时开关电容放大器是复用的,所以可以极大地降低单个检测通道的功耗,经此在低功耗和低噪声的约束下完成了将pA级别的纳米孔微弱电流放大成mV级别的电压信号。Then, under the control of the addressing circuit, a single detection unit enters the second-stage 8×4 unit multiplexed switched capacitor amplifier through the selection of the analog channel selector, and further amplifies the amplified voltage signal to improve the signal-to-noise ratio. At the same time, the switched capacitor amplifier is multiplexed, so the power consumption of a single detection channel can be greatly reduced. In this way, the weak current of the nanopore at the pA level is amplified into a voltage signal at the mV level under the constraints of low power consumption and low noise.
在多通道复用的数模转换器(ADC)部分,针对分段电容中的桥接电容是分数倍单位电容,在实际制造过程中很难做到匹配的问题,本芯片提出在低位增加虚拟(dummy)电容主动引入失配,从而使桥接电容为整数倍的单位电容,减小了电容失配对ADC性能的影响。并且为了纠正逐次逼近模数转换器(SAR ADC)在某次转换过程中由于比较器的噪声或者外部的干扰导致的比较器比较出错,引入了三位冗余,用以ADC的自纠错。本芯片中的基于新型分段带3位冗余CDAC的12bit SAR ADC在5MHz的采样率下,输入信号为2.01MHz的时候,前仿真得其有效位数(ENOB)为11.61bit,可以验证此新型分段冗余CDAC可以实现很好的性能。In the multi-channel multiplexed digital-to-analog converter (ADC) part, the bridge capacitor in the segmented capacitor is a fractional multiple of the unit capacitor, which is difficult to match in the actual manufacturing process. This chip proposes to add a dummy capacitor at the low position to actively introduce mismatch, so that the bridge capacitor is an integer multiple of the unit capacitor, reducing the impact of the capacitor mismatch on the ADC performance. In addition, in order to correct the comparator comparison error caused by the noise of the comparator or external interference during a certain conversion process of the successive approximation analog-to-digital converter (SAR ADC), three-bit redundancy is introduced for ADC self-correction. The 12-bit SAR ADC based on the new segmented 3-bit redundant CDAC in this chip has an effective number of bits (ENOB) of 11.61 bits when the input signal is 2.01MHz at a sampling rate of 5MHz. It can be verified that this new segmented redundant CDAC can achieve good performance.
芯片工作时序以图2为参照,该芯片工作流程如下:首先32路的DNA(图1中核酸分子1的一例)经过纳米孔产生的微弱电流会分别经过32通道的电流积分模块710,电流积分模块710在时钟的控制下以固定20kHz的频率对纳米孔电流进行积分转换成电压,在电流积分的初始阶段对积分电压采样一次,在电流积分的最末尾阶段对积分电压采样一次,并缓存在模拟缓存器(buffer)中。在紧接着的后一个电流积分周期中,寻址模块控制通道选择器,将32通道电流积分模块710缓存的积分初始电压和积分结束电压分时选通到伪差分转全差分模块做相减并再次放大,经过采样后通过多路复用的模数转换器量化成15比特数字量,在经过数字编码模块750,将15比特的非二进制量转换成12比特的二进制数字量再与增益码、地址码一块输出。The chip working sequence is referenced to FIG2 . The working process of the chip is as follows: First, the weak current generated by 32 channels of DNA (an example of nucleic acid molecule 1 in FIG1 ) passing through the nanopore will pass through the 32-channel current integration module 710 respectively. The current integration module 710 integrates the nanopore current at a fixed frequency of 20kHz under the control of the clock and converts it into voltage. The integrated voltage is sampled once in the initial stage of the current integration and once in the final stage of the current integration, and is cached in the analog buffer. In the next current integration cycle, the addressing module controls the channel selector to time-select the initial integration voltage and the end integration voltage cached by the 32-channel current integration module 710 to the pseudo-differential to full differential module for subtraction and amplification again. After sampling, it is quantized into a 15-bit digital quantity through a multiplexed analog-to-digital converter. After passing through the digital encoding module 750, the 15-bit non-binary quantity is converted into a 12-bit binary digital quantity and then output together with the gain code and address code.
表1Table 1
本芯片指标参见上表1。The chip indicators are shown in Table 1 above.
所属领域的技术人员可以清楚地了解到,为了描述的方便和简洁,仅以上述各功能单元、模块的划分进行举例说明,实际应用中,可以根据需要而将上述功能分配由不同的功能单元、模块完成,即将所述装置的内部结构划分成不同的功能单元或模块,以完成以上描述的全部或者部分功能。实施例中的各功能单元、模块可以集成在一个处理单元中,也可以是各个单元单独物理存在,也可以两个或两个以上单元集成在一个单元中,上述集成的单元既可以采用硬件的形式实现,也可以采用软件功能单元的形式实现。另外,各功能单元、模块的具体名称也只是为了便于相互区分,并不用于限制本申请的保护范围。上述系统中单元、模块的具体工作过程,可以参考前述方法实施例中的对应过程,在此不再赘述。The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.
图9为本申请实施例提供的一种电路检测方法的流程示意图。FIG. 9 is a flow chart of a circuit detection method provided in an embodiment of the present application.
如图9所示,电路检测方法可以包括以下步骤。As shown in FIG. 9 , the circuit detection method may include the following steps.
S1、利用电流积分模块分别采集多个纳米孔测序时产生的微电流信号,并将微电流进行积分放大,转换为电压信号;S1, using a current integration module to collect microcurrent signals generated by multiple nanopore sequencing, integrate and amplify the microcurrent, and convert it into a voltage signal;
S2、利用相关双采样模块采样电流积分模块在电流积分初始阶段输出的第一电压信号,以及采样电流积分模块在电流积分结束阶段输出的第二电压信号;S2, using a correlated double sampling module to sample a first voltage signal output by the current integration module at an initial stage of current integration, and a second voltage signal output by the current integration module at an end stage of current integration;
S3、利用差分放大模块根据第一电压信号和第二电压信号确定微电流信号对应的全差分输出电压;S3, using a differential amplifier module to determine a fully differential output voltage corresponding to the micro-current signal according to the first voltage signal and the second voltage signal;
S4、利用模数转换器根据全差分输出电压生成微电流的特征数据并输出。S4. Generate characteristic data of the micro-current according to the fully differential output voltage using an analog-to-digital converter and output it.
应理解,虽然如上所述的实施例所涉及的流程图中的各个步骤依次显示,但是这些步骤并不是必然按照图中所示的顺序依次执行。除非本文中有明确的说明,这些步骤的执行并没有严格的顺序限制,这些步骤可以以其它的顺序执行。而且,如上所述的各实施例所涉及的流程图中的至少一部分步骤可以包括多个步骤或者多个阶段,这些步骤或者阶段并不必然是在同一时刻执行完成,而是可以在不同的时刻执行,这些步骤或者阶段的执行顺序也不必然是依次进行,而是可以与其它步骤或者其它步骤中的步骤或者阶段的至少一部分轮流或者交替地执行。It should be understood that, although the various steps in the flow chart involved in the above-mentioned embodiment are shown in sequence, these steps are not necessarily performed in sequence according to the order shown in the figure. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be performed in other orders. Moreover, at least a portion of the steps in the flow chart involved in each embodiment as described above may include multiple steps or multiple stages, and these steps or stages are not necessarily performed at the same time, but can be performed at different times, and the execution order of these steps or stages is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of the steps or stages in other steps or other steps.
图10为本申请一实施例提供的计算机设备的结构示意图。如图10所示,该计算机设备1000包括:至少一个处理器1003(图10中仅示出一个)、存储器1001以及存储在所述存储器1001中、可在所述处理器1003上运行的计算机程序1002。 所述处理器1003执行所述计算机程序1002时实现上述图9方法实施例中的步骤S1至S4;或者,所述处理器1003执行所述计算机程序1002时实现上述图2装置实施例中模块210至240的功能。FIG10 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application. As shown in FIG10 , the computer device 1000 includes: at least one processor 1003 (only one is shown in FIG10 ), a memory 1001, and a computer program 1002 stored in the memory 1001 and executable on the processor 1003. When the processor 1003 executes the computer program 1002, steps S1 to S4 in the method embodiment of FIG9 are implemented; or, when the processor 1003 executes the computer program 1002, the functions of modules 210 to 240 in the device embodiment of FIG2 are implemented.
所称处理器1003可以是中央处理单元(Central Processing Unit,CPU),该处理器1003还可以是其他通用处理器、数字信号处理器 (Digital Signal Processor,DSP)、专用集成电路 (Application Specific Integrated Circuit,ASIC)、现成可编程门阵列(Field-Programmable Gate Array,FPGA) 或者其他可编程逻辑器件、分立门或者晶体管逻辑器件、分立硬件组件等。通用处理器可以是微处理器或者该处理器也可以是任何常规的处理器等。The processor 1003 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.
所述存储器1001在一些实施例中可以是所述计算机设备1000的内部存储单元,例如计算机设备1000的硬盘或内存。所述存储器1001在另一些实施例中也可以是所述计算机设备1000的外部存储设备,例如所述计算机设备1000上配备的插接式硬盘,智能存储卡(Smart Media Card,SMC),安全数字(Secure Digital,SD)卡,闪存卡(Flash Card)等。进一步地,所述存储器1001还可以既包括所述计算机设备1000的内部存储单元也包括外部存储设备。所述存储器1001用于存储操作系统、应用程序、引导装载程序(Boot Loader)、数据以及其他程序等,例如所述计算机程序的程序代码等。所述存储器1001还可以用于暂时地存储已经输出或者将要输出的数据。In some embodiments, the memory 1001 may be an internal storage unit of the computer device 1000, such as a hard disk or memory of the computer device 1000. In other embodiments, the memory 1001 may also be an external storage device of the computer device 1000, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the computer device 1000. Further, the memory 1001 may also include both an internal storage unit of the computer device 1000 and an external storage device. The memory 1001 is used to store an operating system, an application program, a boot loader, data, and other programs, such as the program code of the computer program. The memory 1001 may also be used to temporarily store data that has been output or is to be output.
本申请实施例还提供了一种计算机可读存储介质,所述计算机可读存储介质存储有计算机程序,所述计算机程序被电子设备执行时可实现上述各个方法实施例中的步骤。An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by an electronic device, the steps in the above-mentioned method embodiments can be implemented.
所述计算机可读介质至少可以包括:能够将计算机程序代码携带到拍照装置/电子设备的任何实体或装置、记录介质、计算机存储器、只读存储器(read-only memory,ROM)、随机存取存储器(random access memory,RAM)、电载波信号、电信信号以及软件分发介质。例如U盘、移动硬盘、磁碟或者光盘等。在某些司法管辖区,根据立法和专利实践,计算机可读介质不可以是电载波信号和电信信号。The computer-readable medium may include at least: any entity or device capable of carrying computer program codes to a camera/electronic device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electric carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk, or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.
本申请实施例提供了一种计算机程序产品,该计算机程序产品包括计算机程序,当计算机程序被电子设备执行时可实现上述各个方法实施例中的步骤。所述计算机程序包括计算机程序代码,所述计算机程序代码可以为源代码形式、对象代码形式、可执行文件或某些中间形式等。The embodiment of the present application provides a computer program product, which includes a computer program, and when the computer program is executed by an electronic device, the steps in the above-mentioned various method embodiments can be implemented. The computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form.
在上述实施例中,对各个实施例的描述都各有侧重,某个实施例中没有详述或记载的部分,可以参见其它实施例的相关描述。In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
本领域普通技术人员可以意识到,结合本文中所公开的实施例描述的各示例的单元及算法步骤,能够以电子硬件、或者计算机软件和电子硬件的结合来实现。这些功能究竟以硬件还是软件方式来执行,取决于技术方案的特定应用和设计约束条件。专业技术人员可以对每个特定的应用来使用不同方法来实现所描述的功能,但是这种实现不应认为超出本申请的范围。Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.
在本申请所提供的实施例中,应该理解到,所揭露的装置/网络设备和方法,可以通过其它的方式实现。例如,以上所描述的装置/网络设备实施例仅仅是示意性的,例如,所述模块或单元的划分,仅仅为一种逻辑功能划分,实际实现时可以有另外的划分方式,例如多个单元或组件可以结合或者可以集成到另一个系统,或一些特征可以忽略,或不执行。另一点,所显示或讨论的相互之间的耦合或直接耦合或通讯连接可以是通过一些接口,装置或单元的间接耦合或通讯连接,可以是电性,机械或其它的形式。In the embodiments provided in the present application, it should be understood that the disclosed devices/network equipment and methods can be implemented in other ways. For example, the device/network equipment embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.
所述作为分离部件说明的单元可以是或者也可以不是物理上分开的,作为单元显示的部件可以是或者也可以不是物理单元,即可以位于一个地方,或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本实施例方案的目的。The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
以上描述中,为了说明而不是为了限定,提出了诸如特定系统结构、技术之类的具体细节,以便透彻理解本申请实施例。然而,本领域的技术人员应当清楚,在没有这些具体细节的其它实施例中也可以实现本申请。在其它情况中,省略对众所周知的系统、装置、电路以及方法的详细说明,以免不必要的细节妨碍本申请的描述。In the above description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.
应当理解,当在本申请说明书和所附权利要求书中使用时,术语“包括”指示所描述特征、整体、步骤、操作、元素和/或组件的存在,但并不排除一个或多个其它特征、整体、步骤、操作、元素、组件和/或其集合的存在或添加。It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and/or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and/or combinations thereof.
还应当理解,在本申请说明书和所附权利要求书中使用的术语“和/或”是指相关联列出的项中的一个或多个的任何组合以及所有可能组合,并且包括这些组合。It should also be understood that the term “and/or” used in the specification and appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
如在本申请说明书和所附权利要求书中所使用的那样,术语“如果”可以依据上下文被解释为“当...时”或“一旦”或“响应于确定”或“响应于检测到”。类似地,短语“如果确定”或“如果检测到[所描述条件或事件]”可以依据上下文被解释为意指“一旦确定”或“响应于确定”或“一旦检测到[所描述条件或事件]”或“响应于检测到[所描述条件或事件]”。As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.
另外,在本申请说明书和所附权利要求书的描述中,术语“第一”、“第二”、“第三”等仅用于区分描述,而不能理解为指示或暗示相对重要性。In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.
在本申请说明书中描述的参考“一个实施例”或“一些实施例”等意味着在本申请的一个或多个实施例中包括结合该实施例描述的特定特征、结构或特点。由此,在本说明书中的不同之处出现的语句“在一个实施例中”、“在一些实施例中”、“在其他一些实施例中”、“在另外一些实施例中”等不是必然都参考相同的实施例,而是意味着“一个或多个但不是所有的实施例”,除非是以其他方式另外特别强调。术语“包括”、“包含”、“具有”及它们的变形都意味着“包括但不限于”,除非是以其他方式另外特别强调。References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.
以上所述实施例仅用以说明本申请的技术方案,而非对其限制;尽管参照前述实施例对本申请进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围,均应包含在本申请的保护范围之内。The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.
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