CN117979563A - A high-precision circuit processing method - Google Patents
A high-precision circuit processing method Download PDFInfo
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- CN117979563A CN117979563A CN202410222836.XA CN202410222836A CN117979563A CN 117979563 A CN117979563 A CN 117979563A CN 202410222836 A CN202410222836 A CN 202410222836A CN 117979563 A CN117979563 A CN 117979563A
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/027—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed by irradiation, e.g. by photons, alpha or beta particles
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
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Abstract
Description
技术领域Technical Field
本发明为PCB板或载板中线路成型的领域,尤其涉及一种高精密度线路的加工方法。The present invention relates to the field of circuit molding in a PCB board or a carrier board, and in particular to a processing method for a high-precision circuit.
背景技术Background technique
现有技术中在PCB芯板中形成线路图形的方法,先形成全局的电镀铜层,再在铜层上贴干膜或者湿膜,再依次经过曝光和显影,形成线路图形的掩膜层;蚀刻去除暴露出来的铜层之后,再去除干膜,被干膜覆盖的部分蚀刻退膜之后形成线路图形。In the prior art, a method for forming a circuit pattern in a PCB core board is to first form a global electroplated copper layer, then attach a dry film or a wet film to the copper layer, and then sequentially expose and develop to form a mask layer of the circuit pattern; after etching away the exposed copper layer, the dry film is removed, and the portion covered by the dry film is etched away to form a circuit pattern.
现有的线路图形成型工艺所使用的能够感光的干膜或湿膜需要采用特定的涂膜压膜设备来形成,涂膜压膜设备的成本也需要计算在线路图形形成工艺中,造成成本提升。受限于涂膜压膜设置的操作精度,涂覆的干膜或湿膜厚度在15um以上,当线路图形为小间距小尺寸图形时,干膜间存在盲槽,蚀刻液不易进入,影响蚀刻速度和效果,表现为侧蚀量大,蚀刻因子较小,影响线路图形的精度。蚀刻液在蚀刻过程中,不仅向下而且对左右各方向都产生蚀刻作用,侧蚀是不可避免的。蚀刻深度与侧蚀宽度之比称之为蚀刻因子。The photosensitive dry film or wet film used in the existing circuit pattern forming process needs to be formed by a specific coating and laminating equipment. The cost of the coating and laminating equipment also needs to be calculated in the circuit pattern forming process, resulting in increased costs. Limited by the operating accuracy of the coating and laminating settings, the thickness of the applied dry film or wet film is above 15um. When the circuit pattern is a small-pitch and small-size pattern, there are blind grooves between the dry films, and the etching liquid is not easy to enter, which affects the etching speed and effect, and manifests as a large amount of side etching and a small etching factor, which affects the accuracy of the circuit pattern. During the etching process, the etching liquid not only etches downward but also in all directions to the left and right, so side etching is inevitable. The ratio of etching depth to side etching width is called the etching factor.
现有的线路图形成型工艺采用曝光工艺,环境影响大,环境中的尘埃会遮挡光路,直接带来感光材料光固化不良,带来线路缺口或开路缺陷。为了避免环境影响,需要使用无尘室进行曝光操作,且无尘室也无法杜绝空气中尘埃等杂质存在,不仅提升成本,还无法完全杜绝环境对感光膜曝光的影响。现有的线路图形成型工艺在去除干膜的时候需要采用有机液进行去除干膜,且去除干膜之后的有机液无法回收,增加了有机液的排放量以及处理难度。The existing circuit pattern forming process uses an exposure process, which has a great impact on the environment. Dust in the environment will block the light path, directly leading to poor photocuring of the photosensitive material, resulting in circuit gaps or open circuit defects. In order to avoid environmental impact, a clean room is required for exposure operations, and a clean room cannot eliminate the presence of impurities such as dust in the air, which not only increases costs, but also cannot completely eliminate the impact of the environment on the exposure of the photosensitive film. The existing circuit pattern forming process requires the use of organic liquid to remove the dry film, and the organic liquid after the dry film is removed cannot be recycled, which increases the discharge of organic liquid and the difficulty of treatment.
专利CN202111002461.9中公开了在覆有铜箔的工件表面涂覆有机掩蔽材料,经过钻孔沉铜之后,通过激光去除非线路区域高聚物薄膜层,将非线路区域的铜面裸露在外,再通过化学刻蚀制备出导电图案。在该技术方案中,有机掩蔽材料的硬度较小,耐磨性较差,在后续钻孔沉铜以及沉积金属保护层的时候,容易导致掩膜材料磨损、破损等现象,无法确保在制备导电图形时,掩蔽材料层还能保持完好。同时,激光去除有机掩蔽层时,由于有机掩蔽层的导热性能较差,无法及时将激光能量进行传导,也无法将激光产生的热量及时散除,可能导致有机掩蔽层或者下层的铜箔在高温下变形,造成线路图形的精度偏差。Patent CN202111002461.9 discloses coating an organic masking material on the surface of a workpiece covered with copper foil, and after drilling and copper deposition, removing the polymer film layer in the non-circuit area by laser, exposing the copper surface in the non-circuit area, and then preparing a conductive pattern by chemical etching. In this technical solution, the hardness of the organic masking material is relatively small and the wear resistance is relatively poor. During the subsequent drilling and copper deposition and deposition of the metal protective layer, the mask material is easily worn and damaged, and it is impossible to ensure that the masking material layer remains intact when preparing the conductive pattern. At the same time, when the organic masking layer is removed by laser, due to the poor thermal conductivity of the organic masking layer, the laser energy cannot be conducted in time, and the heat generated by the laser cannot be dissipated in time, which may cause the organic masking layer or the underlying copper foil to deform at high temperature, resulting in accuracy deviation of the circuit pattern.
发明内容Summary of the invention
本发明旨在至少在一定程度上解决相关技术中的问题之一。为此,本发明的目的在于提供一种高精密度线路的加工方法,采用金属膜作为掩蔽层,金属膜为合金层,具有良好的导热性,可以将激光产生的热量及时散出,避免金属膜以及铜层高温下变形,同时金属膜具有较大的硬度和抗氧化性,可以同时作为铜层的保护层使用,提高了线路图形制备的精准度和效率。The present invention aims to solve at least one of the problems in the related art to a certain extent. To this end, the purpose of the present invention is to provide a method for processing a high-precision circuit, using a metal film as a masking layer, the metal film is an alloy layer, has good thermal conductivity, can dissipate the heat generated by the laser in time, avoid deformation of the metal film and the copper layer at high temperature, and at the same time, the metal film has greater hardness and oxidation resistance, and can be used as a protective layer for the copper layer, thereby improving the accuracy and efficiency of circuit pattern preparation.
为了实现上述目的,本申请采用如下技术方案:In order to achieve the above purpose, this application adopts the following technical solutions:
一种高精密度线路的加工方法,包括:A high-precision circuit processing method, comprising:
在芯板上沉铜电镀;Copper electroplating on the core board;
在铜层上沉积金属膜;所述金属膜包括如下重量比的组分:锡99份,金0.02-0.05份,铜0.7-0.9份;Depositing a metal film on the copper layer; the metal film comprises the following components in weight ratio: 99 parts of tin, 0.02-0.05 parts of gold, and 0.7-0.9 parts of copper;
激光刻蚀金属膜形成金属图形,所述金属图形的形状与线路图形的形状相适配;Laser etching the metal film to form a metal pattern, the shape of the metal pattern being matched to the shape of the circuit pattern;
对金属图形之外的铜层进行蚀刻,形成被金属图形覆盖的线路图形;Etching the copper layer outside the metal pattern to form a circuit pattern covered by the metal pattern;
去除金属膜。Remove the metal film.
本申请采用金属膜代替传统工艺中的干膜或湿膜,且通过激光蚀刻方法对金属膜进行图形化,在激光蚀刻金属膜过程中,环境中尘埃直接被激光击穿,避免开口或缺口等缺陷。本申请中金属膜的致密度较高,孔隙率<0.1%,本申请中金属膜具有良好的热导率,约为210W/(m·k),具有良好的导热性。在后续激光蚀刻金属膜过程中,良好的导热性可以使激光加工过程中的热能通过金属膜自身快速传递至其他部位,同时通过对流方式散发到空气中,从而有效防止聚热导致的材料形变等异常发生。The present application uses a metal film to replace the dry film or wet film in the traditional process, and patterns the metal film by a laser etching method. During the laser etching of the metal film, the dust in the environment is directly penetrated by the laser to avoid defects such as openings or gaps. The density of the metal film in the present application is relatively high, and the porosity is less than 0.1%. The metal film in the present application has good thermal conductivity, which is about 210W/(m·k), and has good thermal conductivity. In the subsequent laser etching of the metal film, the good thermal conductivity can enable the heat energy in the laser processing process to be quickly transferred to other parts through the metal film itself, and at the same time dissipated into the air by convection, thereby effectively preventing abnormalities such as material deformation caused by heat accumulation.
进一步地,所述金属膜的厚度小于等于1微米。Furthermore, the thickness of the metal film is less than or equal to 1 micron.
金属膜的厚度相比干膜或湿膜较薄,对暴露出来的铜层进行蚀刻时,蚀刻药水容易进入铜层中,使得蚀刻过程具有更高的蚀刻因子和更小的侧蚀量,进而获得精度更好的线路图形;尤其适用于小尺寸线路图形。The thickness of the metal film is thinner than that of the dry film or the wet film. When etching the exposed copper layer, the etching solution can easily enter the copper layer, making the etching process have a higher etching factor and a smaller side etching amount, thereby obtaining a circuit pattern with better precision; it is especially suitable for small-size circuit patterns.
进一步地,在铜层上沉积金属膜包括:将成膜液涂覆在铜层上,通过化学沉积方式形成金属膜;所述成膜液包括金离子络合剂、锡离子络合剂、锡抗氧化剂、铜离子络合剂、含二价锡化合物、含金化合物和含铜化合物和添加剂。Furthermore, depositing a metal film on the copper layer includes: coating a film-forming liquid on the copper layer to form a metal film by chemical deposition; the film-forming liquid includes a gold ion complexing agent, a tin ion complexing agent, a tin antioxidant, a copper ion complexing agent, a divalent tin compound, a gold compound, a copper compound and an additive.
进一步地,所述添加剂包括金稳定剂、掩蔽剂、光亮剂、晶粒细化剂和pH缓冲剂。Furthermore, the additives include a gold stabilizer, a masking agent, a brightener, a grain refiner and a pH buffer.
进一步地,所述化学沉积法的成膜温度为60-70℃;在成膜过程中将铜层所在芯板浸泡在成膜液中,并往成膜液中充入惰性气体。Furthermore, the film-forming temperature of the chemical deposition method is 60-70° C. During the film-forming process, the core board where the copper layer is located is immersed in a film-forming liquid, and an inert gas is filled into the film-forming liquid.
化学沉积法在成膜过程中加热温度一般选择在50C-80℃之间。优选的加热温度以60C-70℃为最优。溶剂挥发过程中的温度值会影响最终形成的金属膜成分。太高的温度会使得金属膜的热应力增加,在后续蚀刻铜层过程中可能影响蚀刻效果。温度过低又变相地限制了金属膜的生长速度。本申请可以往成膜液中充入惰性气体,并搅拌成膜液来提高金属膜的形成速度、提高金属膜与铜层之间的结合力、降低金属膜孔隙率等。当含铜层芯板浸泡在成膜液中时,可以往成膜液中充入惰性气体,并搅拌成膜液。The heating temperature in the film-forming process of the chemical deposition method is generally selected between 50C-80°C. The preferred heating temperature is 60C-70°C. The temperature value during the solvent volatilization process will affect the composition of the metal film finally formed. Too high a temperature will increase the thermal stress of the metal film, which may affect the etching effect during the subsequent etching of the copper layer. Too low a temperature will limit the growth rate of the metal film in disguise. The present application can fill the film-forming liquid with an inert gas and stir the film-forming liquid to increase the formation speed of the metal film, increase the bonding force between the metal film and the copper layer, and reduce the porosity of the metal film. When the copper-containing core board is immersed in the film-forming liquid, an inert gas can be filled into the film-forming liquid and the film-forming liquid can be stirred.
进一步地,所述金属膜的硬度大于等于92HRA。Furthermore, the hardness of the metal film is greater than or equal to 92HRA.
本申请金属膜的表面硬度较大,具有耐磨、耐氧化等特性。金属膜的硬度较高,可以防止搬运过程中对金属膜的划伤和擦花。The surface hardness of the metal film of the present application is relatively high, and it has the characteristics of wear resistance, oxidation resistance, etc. The high hardness of the metal film can prevent scratches and abrasions on the metal film during transportation.
进一步地,激光刻蚀金属膜形成金属图形时,激光过蚀刻金属膜。Furthermore, when the metal film is laser-etched to form a metal pattern, the laser over-etches the metal film.
本申请中金属膜位于铜层的上方,在激光刻蚀过程中,可以通过激光反射时间差异的方式实时监控加工深度。本申请中金属膜的厚度为1微米左右,激光刻蚀过程中需要确保刻蚀深度大于等于金属膜的厚度。例如,金属膜的厚度为1微米的时候,通过激光反射时间差异的方式监测激光刻蚀深度为2微米时,激光光斑再朝着下一个位置进行移动。这样就使得激光刻蚀过程存在过刻蚀现象。由于暴露出来的铜层在后续还需要被蚀刻掉,因此这里的过蚀刻并不会影响后续对于铜层的蚀刻,且由于激光刻蚀速度远大于蚀刻液的刻蚀速度,本申请还能够加速铜层的蚀刻。同时过蚀刻也能够确保金属膜被完全去除,避免影响后续铜层蚀刻工艺。激光蚀刻的速度较快,通过过蚀刻去除金属膜,既能确保线路图形上方的金属膜被完全去除,还能加快线路图形的蚀刻速度。In the present application, the metal film is located above the copper layer. During the laser etching process, the processing depth can be monitored in real time by the difference in laser reflection time. In the present application, the thickness of the metal film is about 1 micron. During the laser etching process, it is necessary to ensure that the etching depth is greater than or equal to the thickness of the metal film. For example, when the thickness of the metal film is 1 micron, when the laser etching depth is 2 microns monitored by the difference in laser reflection time, the laser spot moves toward the next position. This causes over-etching in the laser etching process. Since the exposed copper layer needs to be etched away later, the over-etching here does not affect the subsequent etching of the copper layer, and since the laser etching speed is much greater than the etching speed of the etching solution, the present application can also accelerate the etching of the copper layer. At the same time, over-etching can also ensure that the metal film is completely removed to avoid affecting the subsequent copper layer etching process. The speed of laser etching is fast. By removing the metal film through over-etching, it can not only ensure that the metal film above the circuit pattern is completely removed, but also speed up the etching speed of the circuit pattern.
进一步地,所述激光的波段为230-260nm。Furthermore, the wavelength band of the laser is 230-260nm.
本申请激光采用圆形或矩阵光斑,光斑大小在10-50um范围内,具体可通过区域制定进行设计。锡对220-286nm的紫波具有极好的吸收性,故而激光波段选用230-260nm的光束刻蚀金属膜。本申请采用纳秒激光(10ns一发)进行金属膜刻蚀,刻蚀过程中激光光斑叠充率为1/2。The laser in this application uses a circular or matrix spot, and the spot size is in the range of 10-50um, which can be specifically designed through regional formulation. Tin has excellent absorption of 220-286nm violet waves, so the laser band uses a beam of 230-260nm to etch metal films. This application uses nanosecond laser (10ns per shot) to etch metal films, and the laser spot overlap rate during the etching process is 1/2.
进一步地,采用退膜液去除金属膜;所述退膜液包括如下重量份的组分:硼酸1-9份,氢氟酸45-55份,硝酸8-12份;去离子水30-35份。Furthermore, a stripping solution is used to remove the metal film; the stripping solution comprises the following components in parts by weight: 1-9 parts of boric acid, 45-55 parts of hydrofluoric acid, 8-12 parts of nitric acid; and 30-35 parts of deionized water.
室温下,将刻蚀形成线路图形之后的芯板浸泡在退膜液一段时间,取出后擦拭即可去除金属膜。或者直接将退膜液涂覆在金属膜表面浸润一段时间,擦拭去除金属膜。去除方法不会产生有机废液,避免了后续废液处理工艺。At room temperature, soak the core board after etching to form the circuit pattern in the stripping liquid for a period of time, take it out and wipe it to remove the metal film. Or directly apply the stripping liquid on the surface of the metal film and soak it for a period of time, then wipe it to remove the metal film. The removal method does not produce organic waste liquid, avoiding the subsequent waste liquid treatment process.
本申请实施例提供的上述技术方案与现有技术相比具有如下优点:本申请线路图形的制备方法,包括:在芯板上沉铜电镀;在铜层上沉积金属膜,金属膜包括如下重量比的组分:锡99份,金0.02-0.05份,铜0.7-0.9份;激光刻蚀金属膜形成金属图形,所述金属图形的形状与线路图形的形状相适配;对金属图形之外的铜层进行蚀刻,形成被金属图形覆盖的线路图形;去除金属膜。本申请金属膜作为一种合金,具有较大的表面硬度和较好的抗氧化性,可以作为芯板搬运过程中的保护层,为铜层提供保护屏蔽作用,确保在芯板搬运移动过程中,即使中间经过多个工艺的加工,铜层和金属膜仍然具有较好的保形性,确保后续线路图形制备的精准度。The above technical solution provided by the embodiment of the present application has the following advantages compared with the prior art: the method for preparing the circuit pattern of the present application comprises: copper electroplating on the core board; depositing a metal film on the copper layer, the metal film comprising the following components in weight ratio: 99 parts of tin, 0.02-0.05 parts of gold, and 0.7-0.9 parts of copper; laser etching the metal film to form a metal pattern, the shape of the metal pattern being adapted to the shape of the circuit pattern; etching the copper layer outside the metal pattern to form a circuit pattern covered by the metal pattern; removing the metal film. As an alloy, the metal film of the present application has a large surface hardness and good oxidation resistance, and can be used as a protective layer during the transportation of the core board, providing a protective shielding effect for the copper layer, ensuring that during the transportation and movement of the core board, even if it undergoes multiple processes in the middle, the copper layer and the metal film still have good conformality, ensuring the accuracy of subsequent circuit pattern preparation.
同时本申请金属膜具有良好的导热率,在后续激光刻蚀金属膜的时候,良好的导热性可以使激光加工过程中的热能通过金属膜自身快速传递至其他部位,同时通过对流方式散发到空气中,从而有效防止聚热导致的材料形变等异常发生,避免现有技术中激光加工导致的掩蔽层或者铜层变形,确保金属图形和线路图形的尺寸和形状精准。At the same time, the metal film of the present application has good thermal conductivity. When the metal film is subsequently laser-etched, the good thermal conductivity can enable the heat energy in the laser processing process to be quickly transferred to other parts through the metal film itself, and dissipated into the air by convection, thereby effectively preventing abnormalities such as material deformation caused by heat accumulation, avoiding deformation of the masking layer or copper layer caused by laser processing in the prior art, and ensuring the accuracy of the size and shape of the metal graphics and circuit graphics.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
此处的附图被并入说明书中并构成本说明书的一部分,示出了符合本发明的实施例,并与说明书一起用于解释本发明的原理。The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,对于本领域普通技术人员而言,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.
附图中:In the attached figure:
图1为实施例2中小尺寸线路的制备流程图。FIG1 is a flow chart of the preparation of small-sized circuits in Example 2.
具体实施方式Detailed ways
为了对本发明的技术特征、目的和效果有更加清楚的理解,现对照附图详细说明本发明的具体实施方式。以下描述中,需要理解的是,“前”、“后”、“上”、“下”、“左”、“右”、“纵”、“横”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“头”、“尾”等指示的方位或位置关系为基于附图所示的方位或位置关系、以特定的方位构造和操作,仅是为了便于描述本技术方案,而不是指示所指的机构或元件必须具有特定的方位,因此不能理解为对本发明的限制。In order to have a clearer understanding of the technical features, purposes and effects of the present invention, the specific embodiments of the present invention are now described in detail with reference to the accompanying drawings. In the following description, it should be understood that the directions or positional relationships indicated by "front", "back", "up", "down", "left", "right", "longitudinal", "horizontal", "vertical", "horizontal", "top", "bottom", "inside", "outside", "head", "tail", etc. are based on the directions or positional relationships shown in the accompanying drawings, are constructed and operated in a specific direction, and are only for the convenience of describing the present technical solution, rather than indicating that the mechanism or element referred to must have a specific direction, and therefore cannot be understood as a limitation to the present invention.
还需要说明的是,除非另有明确的规定和限定,“安装”、“相连”、“连接”、“固定”、“设置”等术语应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或成一体;可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系。当一个元件被称为在另一元件“上”或“下”时,该元件能够“直接地”或“间接地”位于另一元件之上,或者也可能存在一个或更多个居间元件。术语“第一”、“第二”、“第三”等仅是为了便于描述本技术方案,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量,由此,限定有“第一”、“第二”、“第三”等的特征可以明示或者隐含地包括一个或者更多个该特征。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本发明中的具体含义。It should also be noted that, unless otherwise clearly specified and limited, the terms such as "installed", "connected", "connected", "fixed", "set" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. When an element is referred to as being "on" or "under" another element, the element can be "directly" or "indirectly" located on the other element, or there may be one or more intermediate elements. The terms "first", "second", "third", etc. are only for the convenience of describing the present technical solution, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first", "second", "third", etc. can explicitly or implicitly include one or more of the features. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.
以下描述中,为了说明而不是为了限定,提出了诸如特定系统结构、技术之类的具体细节,以便透彻理解本发明实施例。然而,本领域的技术人员应当清楚,在没有这些具体细节的其它实施例中也可以实现本发明。在其它情况中,省略对众所周知的系统、机构、电路以及方法的详细说明,以免不必要的细节妨碍本发明的描述。In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, mechanisms, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.
实施例1Example 1
一种高精密度线路的加工方法,包括:A high-precision circuit processing method, comprising:
在芯板上沉铜电镀;Copper electroplating on the core board;
在铜层上沉积金属膜;depositing a metal film on the copper layer;
激光刻蚀金属膜形成金属图形,所述金属图形的形状与线路图形的形状相适配;Laser etching the metal film to form a metal pattern, the shape of the metal pattern being matched to the shape of the circuit pattern;
对金属图形之外的铜层进行蚀刻,形成被金属图形覆盖的线路图形;Etching the copper layer outside the metal pattern to form a circuit pattern covered by the metal pattern;
去除金属膜。Remove the metal film.
本申请金属膜包括如下重量比的组分:锡99份,金0.02-0.05份,铜0.7-0.9份;激光刻蚀金属膜形成金属图形,所述金属图形的形状与线路图形的形状相适配;对金属图形之外的铜层进行蚀刻,形成被金属图形覆盖的线路图形;去除金属膜。本申请金属膜作为一种合金,具有较大的表面硬度和较好的抗氧化性,可以作为芯板搬运过程中的保护层,为铜层提供保护屏蔽作用,确保在芯板搬运移动过程中,即使中间经过多个工艺的加工,铜层和金属膜仍然具有较好的保形性,确保后续线路图形制备的精准度。The metal film of the present application includes the following components in weight ratio: 99 parts of tin, 0.02-0.05 parts of gold, and 0.7-0.9 parts of copper; laser etching the metal film to form a metal pattern, the shape of the metal pattern is adapted to the shape of the circuit pattern; etching the copper layer outside the metal pattern to form a circuit pattern covered by the metal pattern; removing the metal film. As an alloy, the metal film of the present application has a large surface hardness and good oxidation resistance. It can be used as a protective layer during the transportation of the core board, providing a protective shielding effect for the copper layer, ensuring that during the transportation and movement of the core board, even if it undergoes multiple processes in the middle, the copper layer and the metal film still have good conformality, ensuring the accuracy of subsequent circuit pattern preparation.
同时本申请金属膜具有良好的导热率,在后续激光刻蚀金属膜的时候,良好的导热性可以使激光加工过程中的热能通过金属膜自身快速传递至其他部位,同时通过对流方式散发到空气中,从而有效防止聚热导致的材料形变等异常发生,避免现有技术中激光加工导致的掩蔽层或者铜层变形,确保金属图形和线路图形的尺寸和形状精准。At the same time, the metal film of the present application has good thermal conductivity. When the metal film is subsequently laser-etched, the good thermal conductivity can enable the heat energy in the laser processing process to be quickly transferred to other parts through the metal film itself, and dissipated into the air by convection, thereby effectively preventing abnormalities such as material deformation caused by heat accumulation, avoiding deformation of the masking layer or copper layer caused by laser processing in the prior art, and ensuring the accuracy of the size and shape of the metal graphics and circuit graphics.
实施例2Example 2
如图1所示,本申请提供的一种高精密度线路的加工方法,包括:As shown in FIG1 , the present application provides a high-precision circuit processing method, comprising:
S1:在芯板上沉铜电镀。S1: Copper electroplating on the core board.
这里的芯板指的是需要形成线路图形的芯板表面;具体可以采用电镀沉铜的方式形成铜层。The core board here refers to the surface of the core board where a circuit pattern needs to be formed; specifically, the copper layer can be formed by electroplating copper.
具体的,沉铜时先水平沉积初始铜层,初始铜层可以采用化学沉积等方法形成,目的在于与芯板表面具有较好的结合力;再在初始铜层上电镀形成完整的铜层,此时的电镀铜层能够更好地与初始铜层接合。两步沉铜法即能确保铜层与芯板表面的具有较好的结合力,确保铜层的牢固性;还能提高铜层的沉积速率,提高线路图形的制备效率。Specifically, when copper is deposited, the initial copper layer is first deposited horizontally. The initial copper layer can be formed by chemical deposition and other methods, and the purpose is to have a good bonding force with the surface of the core board; then the initial copper layer is electroplated to form a complete copper layer, and the electroplated copper layer at this time can better bond with the initial copper layer. The two-step copper deposition method can ensure that the copper layer has a good bonding force with the surface of the core board and ensure the firmness of the copper layer; it can also increase the deposition rate of the copper layer and improve the efficiency of circuit pattern preparation.
本申请中形成的铜层厚度可以根据线路图形的应用场景以及设计要求进行限定。铜层中无需形成线路图形的部分被刻蚀之后,剩余的铜层部分形成线路图形。The thickness of the copper layer formed in the present application can be limited according to the application scenario and design requirements of the circuit pattern. After the portion of the copper layer that does not need to form the circuit pattern is etched, the remaining copper layer portion forms the circuit pattern.
S2:在铜层上沉积金属膜。所述金属膜包括如下重量比的组分:锡99份,金0.02-0.05份,铜0.7-0.9份。金属膜的材质为含铜的金锡合金,金属膜作为一种特殊合金层,具有抗强酸抗弱碱等特性。S2: depositing a metal film on the copper layer. The metal film comprises the following components in weight ratio: 99 parts of tin, 0.02-0.05 parts of gold, and 0.7-0.9 parts of copper. The material of the metal film is a gold-tin alloy containing copper. As a special alloy layer, the metal film has the characteristics of strong acid and weak alkali resistance.
需要说明的是,本申请中金属膜通过化学沉积法、电镀成膜等方式形成,最终形成的合金层并不是混合物,而是晶格堆积形式发生变化的合金单质。本申请中金属膜厚度较薄,能够提高金属膜的沉积效率,同时还能提高后续激光去除效率和精准度。It should be noted that the metal film in this application is formed by chemical deposition, electroplating, etc., and the alloy layer finally formed is not a mixture, but an alloy element with a changed lattice stacking form. The metal film in this application is relatively thin, which can improve the deposition efficiency of the metal film and also improve the subsequent laser removal efficiency and accuracy.
相比非金属掩蔽膜,本申请中金属膜可以作为线路图形的掩蔽层,还能同时作为芯板在搬运过程中的保护层。相比高分子掩蔽膜中碳链连接结构,本申请中金属膜通过金属晶格堆积而成,具有较大的硬度和耐磨性。Compared with non-metallic masking films, the metal film in this application can be used as a masking layer for circuit patterns and as a protective layer for the core board during transportation. Compared with the carbon chain connection structure in the polymer masking film, the metal film in this application is formed by metal lattice stacking and has greater hardness and wear resistance.
本申请中金属膜作为一种合金,包含化学活泼性较差的铜和金,金和铜填充在锡晶格中,可以大大改善金属膜的抗氧化性,使得金属膜在芯板搬运过程中对铜层以及芯板起到保护作用。In the present application, the metal film is an alloy containing copper and gold with poor chemical activity. The gold and copper are filled in the tin lattice, which can greatly improve the oxidation resistance of the metal film, so that the metal film can protect the copper layer and the core board during the core board transportation process.
本申请中金属膜的厚度小于等于1微米,只需要在蚀刻铜层过程中起到保护剩余铜层的目的即可。且本申请沉积的金属膜厚度较小,在该厚度条件下,当金属膜被激光去除之后,由于其厚度较小,蚀刻药水容易进入铜层进行蚀刻,使得铜层的蚀刻过程具有更高的蚀刻因子和更小的侧蚀量,进而获得精度更好的线路图形。同时,金属膜的厚度较小,就会使得金属膜均匀性较好,在较薄的金属膜中,各处厚度的极差较小,使得均匀性公差较小。在后续激光加工去除金属膜过程中,采用固定参数的激光参数即可一次性均匀去除金属膜,避免由于金属膜均匀性公差较大造成不同位置处激光刻蚀效果不同的缺陷,也避免针对均匀性不同的金属膜需要频繁改变激光参数,甚至一次激光刻蚀之后返工的缺陷。The thickness of the metal film in the present application is less than or equal to 1 micron, and it only needs to protect the remaining copper layer during the etching process of the copper layer. And the thickness of the metal film deposited in the present application is relatively small. Under this thickness condition, after the metal film is removed by laser, due to its small thickness, the etching solution can easily enter the copper layer for etching, so that the etching process of the copper layer has a higher etching factor and a smaller amount of side etching, thereby obtaining a circuit pattern with better precision. At the same time, the thickness of the metal film is relatively small, which will make the metal film more uniform. In a thinner metal film, the extreme difference in thickness at various locations is smaller, so that the uniformity tolerance is smaller. In the subsequent laser processing to remove the metal film, the laser parameters with fixed parameters can be used to uniformly remove the metal film at one time, avoiding the defect of different laser etching effects at different positions due to the large uniformity tolerance of the metal film, and also avoiding the need to frequently change the laser parameters for metal films with different uniformity, or even the defect of rework after one laser etching.
本申请中金属膜的致密度较高,孔隙率<0.1%,表面硬度大于等于92HRA,具有耐磨、耐氧化等特性。金属膜的硬度较高,可以防止搬运过程中对金属膜的划伤和擦花。The metal film in the present application has a high density, a porosity of <0.1%, a surface hardness of greater than or equal to 92HRA, and has the characteristics of wear resistance and oxidation resistance. The high hardness of the metal film can prevent scratches and abrasions on the metal film during transportation.
本申请中金属膜作为一种合金,包含热导率较高的铜和金,金和铜填充在锡晶格中,可以大大提高金属膜的热导率。因此,本申请中金属膜具有良好的热导率,约为210W/(m·k),具有良好的导热性。在后续激光蚀刻金属膜过程中,良好的导热性可以使激光加工过程中的热能通过金属膜自身快速传递至其他部位,同时通过对流方式散发到空气中,从而有效防止聚热导致的材料形变等异常发生。In this application, the metal film is an alloy containing copper and gold with high thermal conductivity. Gold and copper are filled in the tin lattice, which can greatly improve the thermal conductivity of the metal film. Therefore, the metal film in this application has good thermal conductivity, which is about 210W/(m·k), and has good thermal conductivity. In the subsequent laser etching of the metal film, the good thermal conductivity can make the heat energy in the laser processing process quickly transferred to other parts through the metal film itself, and dissipated into the air by convection, thereby effectively preventing abnormalities such as material deformation caused by heat accumulation.
本申请中金属膜包括如下重量比的组分:锡99份,金0.02-0.05份,铜0.7-0.9份,以及0.1份的其他杂质,这里的其他杂质指的是其他导电金属或半导体掺杂杂质等。The metal film in the present application includes the following components in weight ratio: 99 parts of tin, 0.02-0.05 parts of gold, 0.7-0.9 parts of copper, and 0.1 parts of other impurities, where other impurities refer to other conductive metals or semiconductor doping impurities, etc.
本申请中金属膜的沉积方法可以通过化学沉积法、电镀成膜等方式来形成。化学沉积法具体指的是CBD(化学水浴沉积),是利用化学反应或电化学原理在基底材料表面沉积成膜的一种技术。The metal film deposition method in this application can be formed by chemical deposition, electroplating, etc. Chemical deposition specifically refers to CBD (chemical bath deposition), which is a technology that deposits a film on the surface of a substrate material using chemical reactions or electrochemical principles.
作为一种具体的实施例,化学沉积法形成金属膜具体包括:将沉积铜层之后的芯板浸泡在成膜液中,将盛装有成膜液的容器进行水浴加热,使得成膜液在铜层表面生长析出,形成金属膜。As a specific embodiment, the chemical deposition method for forming a metal film specifically includes: immersing the core board after the copper layer is deposited in a film-forming liquid, and heating the container containing the film-forming liquid in a water bath so that the film-forming liquid grows and precipitates on the surface of the copper layer to form a metal film.
具体的,化学沉积法在成膜过程中加热温度一般选择在50C-80℃之间。优选的加热温度以60C-70℃为最优。溶剂挥发过程中的温度值会影响最终形成的金属膜成分。太高的温度会使得金属膜的热应力增加,在后续蚀刻铜层过程中可能影响蚀刻效果。温度过低又变相地限制了金属膜的生长速度。Specifically, the heating temperature during the film formation process of the chemical deposition method is generally selected between 50°C and 80°C. The preferred heating temperature is 60°C-70°C. The temperature value during the solvent volatilization process will affect the composition of the metal film finally formed. Too high a temperature will increase the thermal stress of the metal film, which may affect the etching effect in the subsequent etching of the copper layer. Too low a temperature will in turn limit the growth rate of the metal film.
本申请可以往成膜液中充入惰性气体,并搅拌成膜液来提高金属膜的形成速度、提高金属膜与铜层之间的结合力、降低金属膜孔隙率等。当含铜层芯板浸泡在成膜液中时,可以往成膜液中充入惰性气体,并搅拌成膜液。The present application can fill the film-forming liquid with inert gas and stir the film-forming liquid to increase the formation speed of the metal film, increase the bonding force between the metal film and the copper layer, reduce the porosity of the metal film, etc. When the copper-containing core board is immersed in the film-forming liquid, the film-forming liquid can be filled with inert gas and stirred.
本申请中成膜液包括金离子络合剂、锡离子络合剂、锡抗氧化剂、铜离子络合剂、含二价锡化合物、含金化合物和含铜化合物和添加剂。在该成膜液组分的基础上,选择50C-80℃的化学沉积温度,同时在化学沉积过程中往成膜液中充入惰性气体,并搅拌成膜液。在上述成膜液组分以及成膜条件作用下,才能提高金属膜与铜层之间的结合力、降低金属膜孔隙率;最终形成具有较高致密度,孔隙率<0.1%,表面硬度大于等于92HRA,且具有耐磨、耐氧化等特性的金属膜。The film-forming liquid in the present application includes a gold ion complexing agent, a tin ion complexing agent, a tin antioxidant, a copper ion complexing agent, a divalent tin compound, a gold compound, a copper compound and an additive. Based on the components of the film-forming liquid, a chemical deposition temperature of 50°C-80°C is selected, and an inert gas is filled into the film-forming liquid during the chemical deposition process, and the film-forming liquid is stirred. Under the action of the above-mentioned film-forming liquid components and film-forming conditions, the bonding force between the metal film and the copper layer can be improved and the porosity of the metal film can be reduced; finally, a metal film with a high density, a porosity of less than 0.1%, a surface hardness greater than or equal to 92HRA, and wear resistance, oxidation resistance and other characteristics is formed.
作为另外一种具体的实施例,还可以通过电镀成膜液的方法在铜层上形成金属膜。具体的将沉积铜层的芯板作为阴极,使得成膜液中金属离子电镀在铜层外侧。在电镀过程中,可以通过多个导电夹持件夹持铜层的各个位置,使得各个位置处的电位相等,进而使得金属膜被均匀电镀在铜层表面的各个位置,形成厚度均匀的金属膜层。As another specific embodiment, a metal film can also be formed on the copper layer by electroplating a film-forming liquid. Specifically, the core board on which the copper layer is deposited is used as a cathode, so that the metal ions in the film-forming liquid are electroplated on the outside of the copper layer. During the electroplating process, the copper layer can be clamped at various positions by multiple conductive clamps, so that the potential at each position is equal, and the metal film is uniformly electroplated at various positions on the surface of the copper layer to form a metal film layer with uniform thickness.
本申请中成膜液包括金离子络合剂、锡离子络合剂、锡抗氧化剂、铜离子络合剂、含二价锡化合物、含金化合物和含铜化合物和添加剂。The film-forming liquid in the present application comprises a gold ion complexing agent, a tin ion complexing agent, a tin antioxidant, a copper ion complexing agent, a divalent tin-containing compound, a gold-containing compound, a copper-containing compound and an additive.
金离子络合剂:可以选择亚硫酸、硫代硫酸、焦磷酸、柠檬酸和它们的钾、钠、氨、碱土金属盐作为金离子络合剂。金离子络合剂不但可提高成膜液的稳定性,同时还能起到缓冲pH值、增加金属膜层光亮度,以提高金属与铜层之间附着力的作用。Gold ion complexing agent: Sulfurous acid, thiosulfate, pyrophosphoric acid, citric acid and their potassium, sodium, ammonia and alkaline earth metal salts can be selected as gold ion complexing agents. Gold ion complexing agents can not only improve the stability of the film-forming solution, but also buffer the pH value, increase the brightness of the metal film layer, and improve the adhesion between the metal and the copper layer.
锡离子络合剂:单质锡的两性的酸或碱都可以与锡发生络合反应,具体可以选用草酸、柠檬酸、抗坏血酸、葡萄糖、丙二酸、亚氨基二乙酸等作为二价锡离子的络合剂。在酸性溶液中,二价锡与水发生水合反应,四价锡不稳定;在碱性条件下,四价锡稳定,二价锡容易发生歧化反应。锡的络合物在中性溶液中相对稳定,因此,本申请可以调节成膜液的pH值在7左右。Tin ion complexing agent: The amphoteric acid or base of elemental tin can react with tin to form a complexing reaction. Specifically, oxalic acid, citric acid, ascorbic acid, glucose, malonic acid, and iminodiacetic acid can be selected as complexing agents for divalent tin ions. In an acidic solution, divalent tin reacts with water to form a hydration reaction, while tetravalent tin is unstable. Under alkaline conditions, tetravalent tin is stable, while divalent tin is prone to undergo a disproportionation reaction. Tin complexes are relatively stable in neutral solutions. Therefore, the present application can adjust the pH value of the film-forming solution to about 7.
锡抗氧化剂:由于二价锡在溶液中存在被氧化成四价锡而导致锡不能沉积的问题,所以需要向溶液中添加抗氧化剂或还原剂提高二价锡的稳定性,本申请选用的锡抗氧化剂为羟基苯化合物。Tin antioxidant: Since divalent tin is oxidized to tetravalent tin in the solution, which causes the problem that tin cannot be deposited, an antioxidant or a reducing agent needs to be added to the solution to improve the stability of divalent tin. The tin antioxidant selected in this application is a hydroxybenzene compound.
铜离子络合剂:可以选择硫酸作为铜离子络合剂,形成硫酸铜稳定存在。Copper ion complexing agent: Sulfuric acid can be selected as a copper ion complexing agent to form copper sulfate for stable existence.
添加剂:成膜液中还应适当加入其他添加剂来保证镀液的电镀性能以及镀层质量,包括合金稳定剂、掩蔽剂、光亮剂、晶粒细化剂、pH缓冲剂、导电盐和氮掺杂氧化石墨烯等。Additives: Other additives should be appropriately added to the film-forming solution to ensure the electroplating performance of the plating solution and the quality of the coating, including alloy stabilizers, masking agents, brighteners, grain refiners, pH buffers, conductive salts and nitrogen-doped graphene oxide.
本申请成膜液中包含氮掺杂氧化石墨烯,氮掺杂氧化石墨烯作为催化剂,可以使得锡、金、铜离子在成膜液中电位相近,结合成膜液中各个金属离子的含量,确保各个金属离子以一定比例均匀沉积,确保金属膜为晶格一致的合金形态,进而确保金属膜具有特定的导热性能、均匀性、硬度和抗氧化性。The film-forming liquid of the present application contains nitrogen-doped graphene oxide. Nitrogen-doped graphene oxide serves as a catalyst, which can make the potentials of tin, gold, and copper ions in the film-forming liquid similar. Combined with the content of each metal ion in the film-forming liquid, it is ensured that each metal ion is uniformly deposited in a certain proportion, ensuring that the metal film is in the form of an alloy with a consistent lattice, thereby ensuring that the metal film has specific thermal conductivity, uniformity, hardness, and oxidation resistance.
本申请成膜液组分可以确保在成膜过程中锡离子、铜离子和金离子的电位相差较小,三种金属离子可以按照一定的比例均匀沉积在铜层表面,最终形成本申请中厚度较薄、导热性能良好、均匀性良好、硬度较大,抗氧化性较好的金属膜层。The components of the film-forming liquid of the present application can ensure that the potential difference of tin ions, copper ions and gold ions is small during the film-forming process, and the three metal ions can be evenly deposited on the surface of the copper layer in a certain proportion, finally forming a metal film layer with thin thickness, good thermal conductivity, good uniformity, high hardness and good oxidation resistance in the present application.
S3:激光刻蚀金属膜形成金属凹槽,所述金属凹槽的形状与线路图形的形状相适配,所述金属凹槽使得铜层暴露出来。可以在激光刻蚀机台的控制器中输入线路图形的形状以及铜层尺寸,控制器自动计算出激光刻蚀过程中激光光束的移动路径;将沉积了铜层和金属膜的芯板固定在激光刻蚀机台中,激光光束沿着预设的移动路径进行金属膜刻蚀,使得无需形成线路图形的铜层被暴露出来。S3: Laser etching the metal film to form a metal groove, the shape of which matches the shape of the circuit pattern, and the metal groove exposes the copper layer. The shape of the circuit pattern and the size of the copper layer can be input into the controller of the laser etching machine, and the controller automatically calculates the moving path of the laser beam during the laser etching process; the core board with the copper layer and the metal film deposited is fixed in the laser etching machine, and the laser beam etches the metal film along the preset moving path, so that the copper layer without forming a circuit pattern is exposed.
本申请所采用的激光参数如下:激光采用圆形或矩阵光斑,光斑大小在10-50um范围内,具体可通过区域制定进行设计。锡对220-286nm的紫波具有极好的吸收性,故而激光波段选用230-260nm的光束刻蚀金属膜。The laser parameters used in this application are as follows: the laser uses a circular or matrix spot, and the spot size is in the range of 10-50um, which can be specifically designed through regional formulation. Tin has excellent absorption of 220-286nm violet waves, so the laser band uses a beam of 230-260nm to etch the metal film.
本申请采用纳秒激光(10ns一发)进行金属膜刻蚀,刻蚀过程中激光光斑叠充率为1/2。The present application uses nanosecond laser (10ns per shot) to etch the metal film, and the laser spot overlap rate is 1/2 during the etching process.
本申请中金属膜的厚度在1微米左右,纳秒激光一次性即可完成对金属膜的刻蚀,避免激光多次刻蚀导致激光能量多次向周围扩散,一次性激光可刻蚀的方法可以确保暴漏出来铜层的均匀性,有助于形成均匀性和精度较好的线路图形。In this application, the thickness of the metal film is about 1 micron, and the nanosecond laser can complete the etching of the metal film in one time, avoiding multiple laser etchings that cause the laser energy to diffuse to the surroundings multiple times. The one-time laser etching method can ensure the uniformity of the exposed copper layer, which helps to form a circuit pattern with better uniformity and precision.
本申请中金属膜位于铜层的上方,在激光刻蚀过程中,可以通过激光反射时间差异的方式实时监控加工深度。本申请中金属膜的厚度为1微米左右,激光刻蚀过程中需要确保刻蚀深度大于等于金属膜的厚度。例如,金属膜的厚度为1微米的时候,通过激光反射时间差异的方式监测激光刻蚀深度为2微米(也可以是小于等于金属膜和铜层厚度的其他任意值)时,激光光斑再朝着下一个位置进行移动。这样就使得激光刻蚀过程存在过刻蚀现象。In the present application, the metal film is located above the copper layer. During the laser etching process, the processing depth can be monitored in real time by means of the difference in laser reflection time. The thickness of the metal film in the present application is about 1 micron, and it is necessary to ensure that the etching depth is greater than or equal to the thickness of the metal film during the laser etching process. For example, when the thickness of the metal film is 1 micron, when the laser etching depth is monitored to be 2 microns (or any other value less than or equal to the thickness of the metal film and the copper layer) by means of the difference in laser reflection time, the laser spot moves toward the next position. This causes over-etching during the laser etching process.
由于暴露出来的铜层在后续还需要被蚀刻掉,因此这里的过蚀刻并不会影响后续对于铜层的蚀刻,且由于激光刻蚀速度远大于蚀刻液的刻蚀速度,本申请还能够加速铜层的蚀刻。同时过蚀刻也能够确保金属膜被完全去除,避免影响后续铜层蚀刻工艺。激光蚀刻的速度较快,通过过蚀刻去除金属膜,既能确保线路图形上方的金属膜被完全去除,还能加快线路图形的蚀刻速度。Since the exposed copper layer needs to be etched away later, the over-etching here will not affect the subsequent etching of the copper layer, and since the laser etching speed is much greater than the etching speed of the etching solution, the present application can also accelerate the etching of the copper layer. At the same time, over-etching can also ensure that the metal film is completely removed to avoid affecting the subsequent copper layer etching process. The speed of laser etching is relatively fast, and removing the metal film by over-etching can not only ensure that the metal film above the circuit pattern is completely removed, but also speed up the etching speed of the circuit pattern.
S4:对金属图形之外的铜层进行蚀刻,形成被金属图形覆盖的线路图形。具体可以采用针对铜层的蚀刻液对暴露出来的铜层进行蚀刻。S4: etching the copper layer outside the metal pattern to form a circuit pattern covered by the metal pattern. Specifically, an etching solution for the copper layer may be used to etch the exposed copper layer.
本申请中金属膜具有耐酸等特性,致密性比干膜要好,可以最大程度避免蚀刻液对金属膜的渗透刻蚀作用,确保较薄的金属膜也能实现良好的掩膜效果。The metal film in the present application has properties such as acid resistance, and its density is better than that of a dry film. It can avoid the penetration and etching effect of the etching solution on the metal film to the greatest extent, ensuring that a thinner metal film can also achieve a good masking effect.
采用化学蚀刻法,保证蚀刻过程中的均匀性。蚀刻线速根据铜层厚度进行设计。当铜层厚度为10um铜厚,可以设定刻蚀线速为6m/min。Chemical etching is used to ensure uniformity during etching. The etching line speed is designed according to the thickness of the copper layer. When the copper layer thickness is 10um, the etching line speed can be set to 6m/min.
本申请中线路图形可以在芯板的一侧形成,也可以铜层在芯板的两侧形成线路图形。当芯板的两侧均需要形成线路图形时,可以在芯板的两侧同时沉积铜层以及金属膜,并分别激光去除线路图形以外的铜层。再采用化学蚀刻法去除线路图形以外的铜层,形成位于芯板两侧的线路图形。In the present application, the circuit pattern can be formed on one side of the core board, or the copper layer can form the circuit pattern on both sides of the core board. When the circuit pattern needs to be formed on both sides of the core board, the copper layer and the metal film can be deposited on both sides of the core board at the same time, and the copper layer outside the circuit pattern can be removed by laser respectively. Then, the copper layer outside the circuit pattern is removed by chemical etching to form the circuit pattern on both sides of the core board.
为了确保芯板两侧多余的铜层被同时蚀刻,本申请所采用的蚀刻机中芯板的放置方向垂直于传输芯板的传输线。当传输线为水平传输线时,在水平传输线的两侧分别设置喷头,芯板垂直放置在水平传输线上。即芯板中需要形成线路图形的上表面和下表面竖直放置,正对水平传输线两侧的喷头,两侧的喷头用于向芯板两侧喷射蚀刻液。In order to ensure that the redundant copper layers on both sides of the core board are etched at the same time, the placement direction of the core board in the etching machine used in this application is perpendicular to the transmission line of the transmission core board. When the transmission line is a horizontal transmission line, nozzles are respectively arranged on both sides of the horizontal transmission line, and the core board is placed vertically on the horizontal transmission line. That is, the upper surface and the lower surface of the core board where the circuit pattern needs to be formed are placed vertically, facing the nozzles on both sides of the horizontal transmission line, and the nozzles on both sides are used to spray etching liquid to both sides of the core board.
具体的,本申请可以设置位于同一竖直线上的喷头自上而下喷射流量逐渐增大,喷射在芯板上方的多余蚀刻液会在重量作用下下落,这样可以确保各个位置铜层蚀刻的均匀一致性。Specifically, the present application can set the nozzles located on the same vertical line to gradually increase the spray flow rate from top to bottom, and the excess etching liquid sprayed above the core board will fall under the action of weight, thus ensuring the uniformity of copper layer etching at various positions.
S5:去除金属膜。S5: removing the metal film.
本申请采用退膜液去除金属膜。退膜液指的是能够与金属膜发生反应生成可溶性盐类的溶液。且退膜液不会溶解铜层,不会影响线路图形的尺寸和精度。The present application uses a stripping liquid to remove the metal film. The stripping liquid refers to a solution that can react with the metal film to generate soluble salts. The stripping liquid will not dissolve the copper layer and will not affect the size and accuracy of the circuit pattern.
作为一种具体的实施例,本申请退膜液的主要成分是含氯化物和氧化剂的溶液。当脱锡水与金属锡接触时,氯离子会与金属锡反应生成可溶性的氯化亚锡,并释放出电子。As a specific embodiment, the main component of the stripping solution of the present application is a solution containing chloride and an oxidant. When the stripping water comes into contact with metallic tin, the chloride ions react with the metallic tin to generate soluble stannous chloride and release electrons.
作为另外一种具体的实施例,本申请退膜液包括如下重量份的组分:硼酸1-9份,氢氟酸45-55份,硝酸8-12份;去离子水30-35份。As another specific embodiment, the film stripping solution of the present application includes the following components in parts by weight: 1-9 parts of boric acid, 45-55 parts of hydrofluoric acid, 8-12 parts of nitric acid; and 30-35 parts of deionized water.
室温下,将刻蚀形成线路图形之后的芯板浸泡在退膜液一段时间,取出后擦拭即可去除金属膜。或者直接将退膜液涂覆在金属膜表面浸润一段时间,擦拭去除金属膜。At room temperature, soak the core board after etching to form the circuit pattern in the film stripping liquid for a period of time, take it out and wipe it to remove the metal film. Or directly apply the film stripping liquid on the surface of the metal film and soak it for a period of time, then wipe it to remove the metal film.
本申请采用金属膜代替传统工艺中的干膜或湿膜,且通过激光蚀刻方法对金属膜进行图形化,在激光蚀刻金属膜过程中,环境中尘埃直接被激光击穿,避免开口或缺口等缺陷。The present application uses a metal film to replace the dry film or wet film in the traditional process, and patterns the metal film through a laser etching method. During the laser etching of the metal film, dust in the environment is directly penetrated by the laser, avoiding defects such as openings or gaps.
本申请金属膜的厚度相比干膜或湿膜较薄,对暴露出来的铜层进行蚀刻时,蚀刻药水容易进入铜层中,使得蚀刻过程具有更高的蚀刻因子和更小的侧蚀量,进而获得精度更好的线路图形;尤其适用于小尺寸线路图形。The thickness of the metal film of the present application is thinner than that of a dry film or a wet film. When etching the exposed copper layer, the etching solution can easily enter the copper layer, so that the etching process has a higher etching factor and a smaller side etching amount, thereby obtaining a circuit pattern with better precision; it is especially suitable for small-size circuit patterns.
本申请中金属膜采用电镀或者化学沉积法形成,无需传统工艺中涂膜压膜设备,无需使用无尘室进行曝光,简化了线路图形形成工艺的步骤,降低了设备成本,提高了线路图形的形成速度。In the present application, the metal film is formed by electroplating or chemical deposition, which does not require the coating and laminating equipment in the traditional process, and does not require the use of a clean room for exposure, thereby simplifying the steps of the circuit pattern formation process, reducing equipment costs, and increasing the speed of circuit pattern formation.
本申请中金属膜可以在室温下通过退膜液擦拭去除,去除方法不会产生有机废液,避免了后续废液处理工艺。In the present application, the metal film can be removed by wiping with a film stripping solution at room temperature. The removal method does not generate organic waste liquid, thus avoiding subsequent waste liquid treatment processes.
可以理解的,以上实施例仅表达了本发明的优选实施方式,其描述较为具体和详细,但并不能因此而理解为对本发明专利范围的限制;应当指出的是,对于本领域的普通技术人员来说,在不脱离本发明构思的前提下,可以对上述技术特点进行自由组合,还可以做出若干变形和改进,这些都属于本发明的保护范围;因此,凡跟本发明权利要求范围所做的等同变换与修饰,均应属于本发明权利要求的涵盖范围。It can be understood that the above embodiments only express the preferred implementation modes of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the patent scope of the present invention. It should be pointed out that, for ordinary technicians in this field, without departing from the concept of the present invention, the above technical features can be freely combined, and several deformations and improvements can be made, which all belong to the protection scope of the present invention. Therefore, all equivalent changes and modifications made to the scope of the claims of the present invention should belong to the scope covered by the claims of the present invention.
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