CN117911365B - Workpiece quality detection method and system based on image processing technology - Google Patents

Abstract

The invention is applicable to the technical field of workpiece quality inspection, and provides a workpiece quality detection method and system based on an image processing technology, wherein whether a first workpiece image of a workpiece to be inspected is defective or not is judged based on the image processing technology; when determining that the first workpiece image is defective, acquiring various objective environmental parameter difference values, and generating a plurality of normalization adjustment commands according to the various objective environmental parameter difference values so as to obtain a regularized quality inspection environment; in the environment of regulating and controlling quality inspection. When the image processing and recognition technology is used for quality inspection of the workpiece, the workpiece can be intelligently detected in a proper quality inspection environment, and deviation between the actual appearance and the real appearance of the workpiece to be inspected due to the influence of objective environmental factors when the image processing technology is used for recognizing the image of the workpiece to be inspected is avoided, so that the accuracy of the workpiece quality inspection based on the image processing technology is improved.

Description

A workpiece quality detection method and system based on image processing technology

Technical Field

The present invention belongs to the technical field of workpiece quality inspection, and in particular relates to a workpiece quality inspection method and system based on image processing technology.

Background Art

In the production and processing of various workpieces such as mechanical parts and plastic mold products, after many processes are completed, it is necessary to conduct quality inspection on the finished or semi-finished workpieces to ensure that they meet the standard processing requirements.

At present, the method of using image processing and recognition technology to inspect the quality of workpieces has gradually replaced the manual inspection method of using the eyes for observation. The above-mentioned workpiece quality inspection method based on image processing technology has technical advantages such as high efficiency and low error. However, in the prior art, there are many workpieces whose images captured will deviate from the actual appearance under the influence of different environmental factors. This leads to certain errors in the judgment of whether there are defects in the workpiece in the image when using image processing technology to analyze the above-mentioned images, resulting in lower accuracy of quality inspection.

Summary of the invention

The purpose of the present invention is to provide a workpiece quality detection method and system based on image processing technology, aiming to solve the problems raised in the background technology.

The present invention is implemented as follows: a workpiece quality detection method based on image processing technology, the method comprising:

Based on image processing technology, determining whether the first workpiece image of the workpiece to be inspected has defects;

When determining whether the first workpiece image has defects, obtaining various objective environmental parameter difference values, and generating a plurality of standardization adjustment commands according to the various objective environmental parameter difference values, so as to obtain a regulated quality inspection environment;

In a controlled quality inspection environment, determining whether a second workpiece image of the workpiece to be inspected has defects;

If it is determined that the second workpiece image has defects, the workpiece to be inspected is classified as a defective workpiece, and simulated adjustment measures are taken on the regulated quality inspection environment.

As a further limitation of the technical solution of the embodiment of the present invention, based on the image processing technology, the step of determining whether the first workpiece image of the workpiece to be inspected has defects includes:

Acquire standard part image data of the workpiece to be inspected and a first workpiece image;

Acquire a standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected;

Based on the image processing technology, the first workpiece image of the workpiece to be inspected is compared with the standard part image for similarity to determine whether the first workpiece image of the workpiece to be inspected has defects.

As a further limitation of the technical solution of the embodiment of the present invention, when determining whether the first workpiece image has defects, obtaining the difference values of various objective environmental parameters, and generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a standard quality inspection environment includes:

According to the image data of standard parts, various objective environmental parameters of the preset standard quality inspection environment are obtained;

Obtain various environmental parameters of the initial quality inspection environment, and compare the initial quality inspection environment with various objective environmental parameters of the preset standard quality inspection environment one by one to obtain the difference values of various objective environmental parameters;

According to the difference values of various objective environmental parameters, multiple standardized adjustment commands are generated to obtain a regulated quality inspection environment.

As a further limitation of the technical solution of the embodiment of the present invention, the steps of generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment include:

Generate multiple standardization adjustment commands according to the difference values of various objective environmental parameters, wherein the objective environmental parameters include temperature parameters, humidity parameters, and light intensity parameters;

Multiple standardization adjustment commands are respectively issued to their corresponding control elements to obtain a regulated quality inspection environment.

As a further limitation of the technical solution of the embodiment of the present invention, in the regulated quality inspection environment, the step of determining whether the second workpiece image of the workpiece to be inspected has defects includes:

Acquiring a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment;

Based on image processing technology, a second workpiece image of the workpiece to be inspected is compared with a standard part image of the workpiece to be inspected for similarity;

It is determined whether the second workpiece image of the workpiece to be inspected in the regulated quality inspection environment has defects.

As a further limitation of the technical solution of the embodiment of the present invention, if it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and the steps of simulating adjustment measures for the regulated quality inspection environment include:

If it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and defective workpiece prompt information is generated;

Adjust various objective environmental parameters of the controlled quality inspection environment by a preset amount, and obtain a third workpiece image each time the objective environmental parameters are adjusted;

Based on image processing technology, the third workpiece image is compared with the standard part image of the workpiece to be inspected for similarity, and it is determined whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is higher than the similarity between the second workpiece image and the standard part image of the workpiece to be inspected;

When it is determined that the similarity increases, the sum of the adjusted objective environment parameters and the adjusted preset amount is obtained.

A workpiece quality inspection system based on image processing technology, the system comprises: a first image judgment module, a standardization adjustment command generation module, a second image judgment module and a defective workpiece determination module, wherein:

A first image judgment module, used for judging whether the first workpiece image of the workpiece to be inspected has defects based on image processing technology;

A module for generating a standardization adjustment command, for obtaining the difference values of various objective environmental parameters when determining that the first workpiece image has defects, and generating a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment;

A second image judgment module is used to judge whether the second workpiece image of the workpiece to be inspected has defects in a controlled quality inspection environment;

The defective workpiece determination module is used to classify the workpiece to be inspected as a defective workpiece if it is determined that the second workpiece image has defects, and to perform simulated adjustment measures on the regulated quality inspection environment.

As a further limitation of the technical solution of the embodiment of the present invention, the first image determination module specifically includes:

A data acquisition unit, used to acquire standard part image data of the workpiece to be inspected and a first workpiece image;

A standard part image acquisition unit, used for acquiring a standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected;

The first workpiece image judging unit is used to compare the first workpiece image of the workpiece to be inspected with the standard part image for similarity based on image processing technology to judge whether the first workpiece image of the workpiece to be inspected has defects.

As a further limitation of the technical solution of the embodiment of the present invention, the standardization adjustment command generation module specifically includes:

A relevant environmental parameter acquisition unit is used to acquire various objective environmental parameters of a preset standard quality inspection environment according to the standard component image data;

The objective environment parameter difference value obtaining unit is used to obtain various environmental parameters of the initial quality inspection environment, and compare the initial quality inspection environment with various objective environment parameters of the preset standard quality inspection environment one by one to obtain various objective environment parameter difference values;

The standardization adjustment command generating unit is used to generate a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment.

As a further limitation of the technical solution of the embodiment of the present invention, the second image determination module specifically includes:

A second workpiece image acquisition unit, used to acquire a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment;

A second workpiece image analysis unit, used for comparing the second workpiece image of the workpiece to be inspected with the standard part image of the workpiece to be inspected for similarity based on image processing technology;

The second workpiece image judging unit is used to judge whether the second workpiece image of the workpiece to be inspected in the regulated quality inspection environment has defects.

Compared with the prior art, the present invention determines whether the first workpiece image of the workpiece to be inspected has defects based on image processing technology; when it is determined that the first workpiece image has defects, the difference values of various objective environmental parameters are obtained, and multiple standardized adjustment commands are generated according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment; in the regulated quality inspection environment, it is determined whether the second workpiece image of the workpiece to be inspected has defects; if it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and simulated adjustment measures are taken for the regulated quality inspection environment. When the workpiece is inspected by using image processing and recognition technology, the workpiece can be intelligently inspected in an appropriate quality inspection environment, avoiding the deviation between the actual appearance of the workpiece to be inspected and the true appearance due to the influence of objective environmental factors when the image processing technology is used to identify the image of the workpiece to be inspected, thereby improving the accuracy of the workpiece quality inspection method based on image processing technology.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG1 is a flow chart of a method provided by an embodiment of the present invention;

2 is a flow chart of determining whether a first workpiece image of a workpiece to be inspected has defects in a method provided by an embodiment of the present invention;

3 is a flow chart of generating multiple standardization adjustment commands and obtaining a standard quality inspection environment in a method provided by an embodiment of the present invention;

FIG4 is a flow chart of generating a standardization adjustment command in a method provided by an embodiment of the present invention;

5 is a flow chart of determining whether a second workpiece image of a workpiece to be inspected has defects in a method provided by an embodiment of the present invention;

6 is a flow chart of classifying a workpiece to be inspected as a defective workpiece in a method provided by an embodiment of the present invention;

FIG7 is an application architecture diagram of a system provided by an embodiment of the present invention;

FIG8 is a structural block diagram of a first image determination module in a system provided by an embodiment of the present invention;

9 is a structural block diagram of a standardization adjustment command generation module in a system provided by an embodiment of the present invention;

FIG. 10 is a structural block diagram of a second image determination module in the system provided in an embodiment of the present invention.

DETAILED DESCRIPTION

In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

It is understood that the terms "first", "second", etc. used in this application may be used herein to describe various elements, but unless otherwise specified, these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, without departing from the scope of this application, a first xx script may be referred to as a second xx script, and similarly, a second xx script may be referred to as a first xx script.

FIG1 shows a flow chart of a method provided by an embodiment of the present invention.

Specifically, a workpiece quality detection method based on image processing technology comprises the following steps:

Step S100: Based on image processing technology, determine whether a first workpiece image of the workpiece to be inspected has defects.

Specifically, FIG2 shows a flow chart of determining whether a first workpiece image of a workpiece to be inspected has defects.

Wherein, based on the image processing technology, determining whether the first workpiece image of the workpiece to be inspected has defects specifically includes the following steps:

Step S101, acquiring standard part image data of a workpiece to be inspected and a first workpiece image;

Step S102, obtaining a standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected;

Step S103 : Based on image processing technology, the first workpiece image of the workpiece to be inspected is compared with the standard part image for similarity to determine whether the first workpiece image of the workpiece to be inspected has defects.

In the embodiment of the present invention, a dedicated workpiece quality inspection area is independently set up in the quality inspection workshop, and the workpiece quality inspection area is used to check whether the appearance of the workpiece to be inspected is the same as the standard appearance of the workpiece, and to judge whether there is a quality problem with the workpiece to be inspected based on the inspection result;

At least one high-definition camera is installed in the workpiece quality inspection area, and the high-definition camera is connected to the background processing cloud through a wireless network or a data cable. The background processing cloud is preset with a data model, and the data model stores the standard parts image data of various workpieces;

After the workpiece to be inspected is sent into the workpiece quality inspection area, the high-definition camera starts shooting, and then obtains the first workpiece image of the workpiece to be inspected. Then the backend processing cloud analyzes the first workpiece image and determines the type of the workpiece to be inspected through image processing technology. Then the backend processing cloud searches for the corresponding standard part image data in the data model according to the type of the workpiece to be inspected, and then obtains the standard part image data of the workpiece to be inspected.

It can be understood that after the standard part image and the first workpiece image of the workpiece to be inspected are obtained in the background processing cloud, the mature image processing technology in the current prior art is used to compare the first workpiece image of the workpiece to be inspected with the standard part image, and obtain the similarity value. When the similarity value is lower than the similarity threshold preset in the background processing cloud, it means that the first workpiece image has defects. When the similarity value is not lower than the similarity threshold preset in the background processing cloud, it means that the first workpiece image has no defects.

Furthermore, the workpiece quality detection method based on image processing technology also includes the following steps:

Step S200, when determining that the first workpiece image has defects, obtaining various objective environmental parameter difference values, and generating a plurality of standardization adjustment commands according to the various objective environmental parameter difference values, so as to obtain a regulated quality inspection environment.

Specifically, FIG3 shows a flow chart of generating multiple standardization adjustment commands and obtaining a standard quality inspection environment.

Among them, when determining whether the first workpiece image has defects, obtaining the difference values of various objective environmental parameters, and generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment specifically includes the following steps:

Step S201, obtaining various objective environmental parameters of a preset standard quality inspection environment according to the standard component image data;

Step S202, obtaining various environmental parameters of the initial quality inspection environment, and comparing the initial quality inspection environment with various objective environmental parameters of the preset standard quality inspection environment one by one to obtain difference values of various objective environmental parameters;

Step S203, generating a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment.

In the embodiment of the present invention, when the backend processing cloud determines that the first workpiece image of the workpiece to be inspected entering the workpiece quality inspection area has defects, it does not mean that the workpiece to be inspected must have defects, because the initial quality inspection environment of the workpiece quality inspection area may change the actual appearance of the workpiece to be inspected, resulting in the first workpiece image captured by the high-definition camera not being the true appearance of the workpiece to be inspected. For example, the light intensity in the workpiece quality inspection area is weaker than that under normal conditions, which causes the actual appearance of the workpiece to be inspected in the workpiece quality inspection area to change due to the weak light intensity;

It can be understood that in order to further improve the authenticity of the image of the workpiece to be inspected that can be captured by the high-definition camera, a light sensor element, a temperature sensor element and a humidity sensor element are pre-installed in the workpiece quality inspection area, and a light intensity regulator, a temperature regulator and a humidity regulator are also installed, and the light sensor element, the temperature sensor element and the humidity sensor element are all wirelessly connected to the background processing cloud. The background processing cloud can obtain the light intensity parameters, humidity parameters and temperature parameters in the workpiece quality inspection area in real time through the light sensor element, the temperature sensor element and the humidity sensor element. The data model of the background processing cloud also stores various objective environmental parameters of the preset standard quality inspection environment of different types of workpieces;

When the background processing cloud determines that the first workpiece image of the workpiece to be inspected entering the workpiece quality inspection area has defects, the difference between the initial quality inspection environment of the workpiece quality inspection area and the preset standard quality inspection environment should be reduced as much as possible. The specific operation method is that the background processing cloud first obtains various objective environmental parameters of the preset standard quality inspection environment based on the standard part image data, and then obtains various environmental parameters in the initial quality inspection environment through light sensing elements, temperature sensing elements and humidity sensing elements. After that, the background processing cloud compares the initial quality inspection environment with various objective environmental parameters of the preset standard quality inspection environment corresponding to the workpiece to be inspected, and obtains the difference values of various objective environmental parameters;

For example, the light intensity parameters of the initial quality inspection environment obtained by the backend processing cloud through light sensors, temperature sensors and humidity sensors are 500 lux, 25 degrees Celsius and 30% relative humidity, while the various objective environmental parameters of the preset standard quality inspection environment are 1000 lux, 25 degrees Celsius and 20% relative humidity. There is a light intensity difference of -500 lux and a humidity difference of 10% between the initial quality inspection environment and the preset standard quality inspection environment corresponding to the workpiece to be inspected.

Specifically, FIG4 shows a flow chart of generating a normalization adjustment command.

Among them, generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment specifically includes the following steps:

Step S2031, generating a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters, wherein the objective environmental parameters include temperature parameters, humidity parameters, and light intensity parameters;

Step S2032: Send multiple standardization adjustment commands to their corresponding control elements respectively to obtain a regulated quality inspection environment.

In the embodiment of the present invention, after the difference values of various objective environmental parameters are determined in the background processing cloud, a standardization adjustment command can be generated according to the difference values of various objective environmental parameters, and the standardization adjustment command can be issued to the corresponding control element;

For example, after the background processing cloud determines that the initial quality inspection environment has objective environmental parameter difference values of -500 lux and 10% relative humidity, two standardized adjustment commands can be generated based on the above objective environmental parameter difference values and sent to the light intensity regulator and humidity regulator respectively, so that the light intensity regulator and humidity regulator can perform compensation work to obtain a regulated quality inspection environment, and the regulated quality inspection environment is close to the preset standard quality inspection environment corresponding to the workpiece to be inspected.

Furthermore, the workpiece quality detection method based on image processing technology also includes the following steps:

Step S300: determining whether a second workpiece image of the workpiece to be inspected has defects in a controlled quality inspection environment.

Specifically, FIG5 shows a flow chart of determining whether the second workpiece image of the workpiece to be inspected has defects.

Wherein, in the controlled quality inspection environment, determining whether the second workpiece image of the workpiece to be inspected has defects specifically includes the following steps:

Step S301, obtaining a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment;

Step S302, based on image processing technology, a second workpiece image of the workpiece to be inspected is compared with a standard part image of the workpiece to be inspected for similarity;

Step S303, determining whether the second workpiece image of the workpiece to be inspected under the controlled quality inspection environment has any defects.

Furthermore, the workpiece quality detection method based on image processing technology also includes the following steps:

Step S400: If it is determined that the second workpiece image has defects, the workpiece to be inspected is classified as a defective workpiece, and simulated adjustment measures are performed on the controlled quality inspection environment.

Specifically, FIG6 shows a flow chart of classifying a workpiece to be inspected as a defective workpiece.

If it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and simulation adjustment measures are performed on the controlled quality inspection environment. Specifically, the following steps are included:

Step S601, if it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and defective workpiece prompt information is generated;

Step S602, adjusting various objective environmental parameters of the regulated quality inspection environment by a preset amount, and acquiring a third workpiece image each time the objective environmental parameters are adjusted;

Step S603, based on image processing technology, the third workpiece image is compared with the standard part image of the workpiece to be inspected for similarity, and it is determined whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is higher than the similarity between the second workpiece image and the standard part image of the workpiece to be inspected;

Step S604, when it is determined that the similarity is increased, the sum of the adjusted objective environment parameters and the adjusted preset amount is obtained.

In an embodiment of the present invention, if the backend processing cloud analyzes the second workpiece image taken by the high-definition camera in the controlled quality inspection environment through image processing technology and determines that the second workpiece image still has defects, it can be determined that the workpiece to be inspected has defects. At this time, the backend processing cloud defines the workpiece to be inspected as a defective workpiece, generates defective workpiece prompt information, and can send the defective workpiece prompt information to the quality inspector terminal. Preferably, the backend processing cloud can also mark the defective area on the second workpiece image through image processing technology;

Through the above technical solution, when the workpiece is inspected by using image processing and recognition technology, the workpiece can be intelligently inspected in an appropriate quality inspection environment, avoiding the deviation between the actual appearance of the workpiece to be inspected and the true appearance due to the influence of objective environmental factors when the image processing technology is used to identify the image of the workpiece to be inspected, thereby improving the accuracy of the workpiece quality inspection method based on image processing technology;

When it is determined that the second workpiece image still has defects, various objective environmental parameters of the controlled quality inspection environment can also be adjusted by preset amounts, and each time the objective environmental parameters are adjusted, a third workpiece image is obtained, and the background processing cloud also compares the third workpiece image with the standard part image of the workpiece to be inspected based on image processing technology, and determines whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is increased compared to the similarity between the second workpiece image and the standard part image of the workpiece to be inspected. When it is determined that the similarity is increased, the sum of the adjusted objective environmental parameters and the preset amounts of adjustment is obtained. The purpose of the above steps is to determine whether the quality cause of the workpiece is related to environmental factors;

For example, the background processing cloud performs an upward adjustment on the workpiece quality inspection area, and after the adjustment, the similarity between the acquired third workpiece image and the standard part image of the workpiece to be inspected is in an increased state compared to the similarity between the second workpiece image and the standard part image of the workpiece to be inspected. This indirectly indicates that the quality reason of the workpiece to be inspected may be caused by insufficient processing temperature, thereby improving the intelligence level of the workpiece quality detection method based on image processing technology.

Furthermore, FIG7 shows an application architecture diagram of the system provided by an embodiment of the present invention.

Among them, in another preferred embodiment provided by the present invention, a workpiece quality detection system based on image processing technology includes:

The first image determination module 100 is used to determine whether the first workpiece image of the workpiece to be inspected has defects based on image processing technology.

Specifically, FIG8 shows a structural block diagram of the first image determination module 100 in the system provided in an embodiment of the present invention.

Among them, in the preferred embodiment provided by the present invention, the first image determination module 100 specifically includes:

A data acquisition unit 101 is used to acquire standard part image data of the workpiece to be inspected and a first workpiece image;

The standard part image acquisition unit 102 is used to acquire the standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected;

The first workpiece image judging unit 103 is used to compare the first workpiece image of the workpiece to be inspected with the standard part image for similarity based on image processing technology to judge whether the first workpiece image of the workpiece to be inspected has defects.

In the embodiment of the present invention, a dedicated workpiece quality inspection area is independently set up in the quality inspection workshop, and the workpiece quality inspection area is used to check whether the appearance of the workpiece to be inspected is the same as the standard appearance of the workpiece, and to judge whether there is a quality problem with the workpiece to be inspected based on the inspection result;

At least one high-definition camera is installed in the workpiece quality inspection area, and the high-definition camera is connected to the background processing cloud through a wireless network or a data cable. The background processing cloud is preset with a data model, and the data model stores the standard parts image data of various workpieces;

After the workpiece to be inspected is sent into the workpiece quality inspection area, the high-definition camera starts shooting, and then the data acquisition unit 101 acquires the first workpiece image of the workpiece to be inspected. Then the data acquisition unit 101 analyzes the first workpiece image and determines the type of the workpiece to be inspected through image processing technology. Then the data acquisition unit 101 searches for the corresponding standard part image data in the data model according to the type of the workpiece to be inspected, and then obtains the standard part image data of the workpiece to be inspected;

It can be understood that after the data acquisition unit 101 obtains the standard part image and the first workpiece image of the workpiece to be inspected, the mature image processing technology in the current prior art is used to compare the first workpiece image of the workpiece to be inspected with the standard part image, and obtain the similarity value. When the similarity value is lower than the similarity threshold preset in the background processing cloud, it means that the first workpiece image has defects. When the similarity value is not lower than the similarity threshold preset in the background processing cloud, it means that the first workpiece image has no defects.

Furthermore, the workpiece quality detection system based on image processing technology also includes:

The module 200 for generating the standardization adjustment command is used to obtain the difference values of various objective environmental parameters when determining that the first workpiece image has defects, and to generate a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment.

Specifically, FIG. 9 shows a structural block diagram of a standardization adjustment command generating module 200 in a system provided by an embodiment of the present invention.

Among them, in the preferred embodiment provided by the present invention, the standardization adjustment command generation module 200 specifically includes:

The relevant environment parameter acquisition unit 201 is used to acquire various objective environment parameters of a preset standard quality inspection environment according to the standard component image data;

The objective environment parameter difference value obtaining unit 202 is used to obtain various environmental parameters of the initial quality inspection environment, and compare the initial quality inspection environment with various objective environment parameters of the preset standard quality inspection environment one by one to obtain various objective environment parameter difference values;

The standardization adjustment command generating unit 203 is used to generate a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment.

In the embodiment of the present invention, when the first image judgment module 100 determines that the first workpiece image of the workpiece to be inspected entering the workpiece quality inspection area has defects, it does not mean that the workpiece to be inspected must have defects, because the initial quality inspection environment of the workpiece quality inspection area may change the actual appearance of the workpiece to be inspected, resulting in the first workpiece image captured by the high-definition camera not being the true appearance of the workpiece to be inspected. For example, the light intensity in the workpiece quality inspection area is weaker than that under normal conditions, which causes the actual appearance of the workpiece to be inspected in the workpiece quality inspection area to change due to the weak light intensity;

It can be understood that, in order to further improve the authenticity of the image of the workpiece to be inspected that can be captured by the high-definition camera, a light sensor element, a temperature sensor element and a humidity sensor element are pre-installed in the workpiece quality inspection area, and a light intensity regulator, a temperature regulator and a humidity regulator are also installed, and the light sensor element, the temperature sensor element and the humidity sensor element are all wirelessly connected to the background processing cloud. The relevant environmental parameter acquisition unit 201 can obtain the light intensity parameter, humidity parameter and temperature parameter in the workpiece quality inspection area in real time through the light sensor element, the temperature sensor element and the humidity sensor element. The data model of the background processing cloud also stores various objective environmental parameters of the preset standard quality inspection environment of different types of workpieces;

When the first image judgment module 100 determines that the first workpiece image of the workpiece to be inspected entering the workpiece quality inspection area has defects, the difference between the initial quality inspection environment of the workpiece quality inspection area and the preset standard quality inspection environment should be reduced as much as possible. The specific operation method is that the relevant environmental parameter acquisition unit 201 first obtains various objective environmental parameters of the preset standard quality inspection environment according to the standard part image data, and then obtains various environmental parameters in the initial quality inspection environment through the light sensor element, the temperature sensor element and the humidity sensor element. After that, the objective environmental parameter difference value acquisition unit 202 compares the initial quality inspection environment with various objective environmental parameters of the preset standard quality inspection environment corresponding to the workpiece to be inspected, and obtains various objective environmental parameter difference values;

For example, the light intensity parameter in the initial quality inspection environment obtained by the relevant environmental parameter acquisition unit 201 through the light sensor element, the temperature sensor element and the humidity sensor element is 500 lux, the temperature parameter is 25 degrees Celsius, and the humidity parameter is 30% relative humidity, while the various objective environmental parameters of the preset standard quality inspection environment are respectively 1000 lux, 25 degrees Celsius, and 20% relative humidity. There is a -500 lux light intensity difference and a 10% humidity difference between the initial quality inspection environment and the preset standard quality inspection environment corresponding to the workpiece to be inspected;

After the standardization adjustment command generation unit 203 determines the difference values of various objective environmental parameters, it can generate standardization adjustment commands according to the difference values of various objective environmental parameters, and send the standardization adjustment commands to the corresponding control elements;

For example, after the background processing cloud determines that the initial quality inspection environment has objective environmental parameter difference values of -500 lux and 10% relative humidity, two standardized adjustment commands can be generated based on the above objective environmental parameter difference values and sent to the light intensity regulator and humidity regulator respectively, so that the light intensity regulator and humidity regulator can perform compensation work to obtain a regulated quality inspection environment, and the regulated quality inspection environment is close to the preset standard quality inspection environment corresponding to the workpiece to be inspected.

Furthermore, the workpiece quality detection system based on image processing technology also includes:

The second image determination module 300 is used to determine whether the second workpiece image of the workpiece to be inspected has defects in a controlled quality inspection environment.

Specifically, FIG10 shows a structural block diagram of the second image determination module 300 in the system provided in an embodiment of the present invention.

Among them, in the preferred embodiment provided by the present invention, the second image determination module 300 specifically includes:

The second workpiece image acquisition unit 301 is used to acquire a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment;

The second workpiece image analysis unit 302 is used to compare the second workpiece image of the workpiece to be inspected with the standard part image of the workpiece to be inspected based on image processing technology for similarity;

The second workpiece image judging unit 303 is used to judge whether the second workpiece image of the workpiece to be inspected in the controlled quality inspection environment has defects.

Furthermore, the workpiece quality detection system based on image processing technology also includes:

The defective workpiece determination module 400 is used to classify the workpiece to be inspected as a defective workpiece if it is determined that the second workpiece image has defects, and to perform simulated adjustment measures on the regulated quality inspection environment.

In the embodiment of the present invention, if the second image judgment module 300 analyzes the second workpiece image of the workpiece to be inspected taken by the high-definition camera in the regulated quality inspection environment through image processing technology and determines that the second workpiece image still has defects, it can be determined that the workpiece to be inspected has defects. At this time, the defective workpiece determination module 400 demarcates the workpiece to be inspected as a defective workpiece, generates defective workpiece prompt information, and can send the defective workpiece prompt information to the quality inspector terminal. Preferably, the second image judgment module 300 can also mark the defective area on the second workpiece image through image processing technology;

Through the above technical solution, when the workpiece is inspected by using image processing and recognition technology, the workpiece can be intelligently inspected in an appropriate quality inspection environment, avoiding the deviation between the actual appearance of the workpiece to be inspected and the true appearance due to the influence of objective environmental factors when the image processing technology is used to identify the image of the workpiece to be inspected, thereby improving the accuracy of the workpiece quality inspection method based on image processing technology;

When it is determined that the second workpiece image still has defects, various objective environmental parameters of the controlled quality inspection environment can also be adjusted by preset amounts, and each time the objective environmental parameters are adjusted, a third workpiece image is obtained, and the defective workpiece determination module 400 also compares the third workpiece image with the standard part image of the workpiece to be inspected based on image processing technology, and determines whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is increased compared with the similarity between the second workpiece image and the standard part image of the workpiece to be inspected. When it is determined that the similarity is increased, the sum of the adjusted objective environmental parameters and the preset amounts of adjustment is obtained. The purpose of the above steps is to determine whether the quality cause of the workpiece is related to environmental factors;

For example, the defective workpiece determination module 400 performs an upward adjustment on the workpiece quality inspection area, and after the adjustment, the similarity between the acquired third workpiece image and the standard part image of the workpiece to be inspected is in an increased state compared to the similarity between the second workpiece image and the standard part image of the workpiece to be inspected, which indirectly indicates that the quality reason of the workpiece to be inspected may be caused by insufficient processing temperature, thereby improving the intelligence level of the workpiece quality detection method based on image processing technology.

It should be understood that, although each step in the flow chart of each embodiment of the present invention is shown in sequence according to the indication of the arrow, these steps are not necessarily performed in sequence according to the order indicated by the arrow. Unless there is a clear explanation in this article, the execution of these steps does not have strict order restrictions, and these steps can be performed in other orders. Moreover, at least a portion of the steps in each embodiment may include a plurality of sub-steps or a plurality of stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and the execution order of these sub-steps or stages is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of other steps or sub-steps or stages of other steps.

A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and/or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the patent of the present invention. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims (7)

1. A workpiece quality detection method based on image processing technology, characterized in that the method comprises: Based on image processing technology, determining whether the first workpiece image of the workpiece to be inspected has defects; Based on the image processing technology, the step of determining whether the first workpiece image of the workpiece to be inspected has defects includes: Acquire standard part image data of the workpiece to be inspected and a first workpiece image; Acquire a standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected; Based on image processing technology, the first workpiece image of the workpiece to be inspected is compared with the standard part image for similarity to determine whether the first workpiece image of the workpiece to be inspected has defects; When determining whether the first workpiece image has defects, obtaining various objective environmental parameter difference values, and generating a plurality of standardization adjustment commands according to the various objective environmental parameter difference values, so as to obtain a regulated quality inspection environment; In a controlled quality inspection environment, determining whether a second workpiece image of the workpiece to be inspected has defects; If it is determined that the second workpiece image has defects, the workpiece to be inspected is classified as a defective workpiece, and simulated adjustment measures are taken on the controlled quality inspection environment; If it is determined that the second workpiece image has defects, the workpiece to be inspected is classified as a defective workpiece, and the steps of simulating adjustment measures for the controlled quality inspection environment include: If it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and defective workpiece prompt information is generated; Adjust various objective environmental parameters of the controlled quality inspection environment by a preset amount, and obtain a third workpiece image each time the objective environmental parameters are adjusted; Based on image processing technology, the third workpiece image is compared with the standard part image of the workpiece to be inspected for similarity, and it is determined whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is higher than the similarity between the second workpiece image and the standard part image of the workpiece to be inspected; When it is determined that the similarity increases, the sum of the adjusted objective environment parameters and the adjusted preset amount is obtained. 2. The workpiece quality inspection method based on image processing technology according to claim 1 is characterized in that when determining whether the first workpiece image has defects, obtaining the difference values of various objective environmental parameters, and generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a standard quality inspection environment comprises: According to the image data of standard parts, various objective environmental parameters of the preset standard quality inspection environment are obtained; Obtain various environmental parameters of the initial quality inspection environment, and compare the initial quality inspection environment with various objective environmental parameters of the preset standard quality inspection environment one by one to obtain the difference values of various objective environmental parameters; According to the difference values of various objective environmental parameters, multiple standardized adjustment commands are generated to obtain a regulated quality inspection environment. 3. The workpiece quality inspection method based on image processing technology according to claim 2 is characterized in that the step of generating multiple standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment comprises: Generate multiple standardization adjustment commands according to the difference values of various objective environmental parameters, wherein the objective environmental parameters include temperature parameters, humidity parameters, and light intensity parameters; Multiple standardization adjustment commands are respectively issued to their corresponding control elements to obtain a regulated quality inspection environment. 4. The workpiece quality inspection method based on image processing technology according to claim 1 is characterized in that, in a controlled quality inspection environment, the step of determining whether the second workpiece image of the workpiece to be inspected has defects comprises: Acquiring a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment; Based on image processing technology, a second workpiece image of the workpiece to be inspected is compared with a standard part image of the workpiece to be inspected for similarity; It is determined whether the second workpiece image of the workpiece to be inspected in the regulated quality inspection environment has defects. 5. A workpiece quality inspection system based on image processing technology, characterized in that the system comprises: a first image judgment module, a standardization adjustment command generation module, a second image judgment module and a defective workpiece determination module, wherein: A first image judgment module, used for judging whether the first workpiece image of the workpiece to be inspected has defects based on image processing technology; The first image judgment module specifically includes: A data acquisition unit, used to acquire standard part image data of the workpiece to be inspected and a first workpiece image; A standard part image acquisition unit, used for acquiring a standard part image of the workpiece to be inspected according to the standard part image data of the workpiece to be inspected; A first workpiece image judgment unit is used to compare the first workpiece image of the workpiece to be inspected with the standard part image for similarity based on image processing technology to judge whether the first workpiece image of the workpiece to be inspected has defects; A module for generating a standardization adjustment command, for obtaining the difference values of various objective environmental parameters when determining that the first workpiece image has defects, and generating a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment; A second image judgment module is used to judge whether the second workpiece image of the workpiece to be inspected has defects in a controlled quality inspection environment; The defective workpiece determination module is used to classify the workpiece to be inspected as a defective workpiece if it is determined that the second workpiece image has defects, and to simulate adjustment measures for the controlled quality inspection environment: If it is determined that the second workpiece image has defects, the workpiece to be inspected is defined as a defective workpiece, and defective workpiece prompt information is generated; Adjust various objective environmental parameters of the controlled quality inspection environment by a preset amount, and obtain a third workpiece image each time the objective environmental parameters are adjusted; Based on image processing technology, the third workpiece image is compared with the standard part image of the workpiece to be inspected for similarity, and it is determined whether the similarity between the third workpiece image and the standard part image of the workpiece to be inspected is higher than the similarity between the second workpiece image and the standard part image of the workpiece to be inspected; When it is determined that the similarity increases, the sum of the adjusted objective environment parameters and the adjusted preset amount is obtained. 6. The workpiece quality inspection system based on image processing technology according to claim 5, characterized in that the standardization adjustment command generation module specifically comprises: A relevant environmental parameter acquisition unit is used to acquire various objective environmental parameters of a preset standard quality inspection environment according to the standard component image data; The objective environment parameter difference value obtaining unit is used to obtain various environmental parameters of the initial quality inspection environment, and compare the initial quality inspection environment with various objective environment parameters of the preset standard quality inspection environment one by one to obtain various objective environment parameter difference values; The standardization adjustment command generating unit is used to generate a plurality of standardization adjustment commands according to the difference values of various objective environmental parameters to obtain a regulated quality inspection environment. 7. The workpiece quality inspection system based on image processing technology according to claim 6, characterized in that the second image judgment module specifically comprises: A second workpiece image acquisition unit, used to acquire a second workpiece image of the workpiece to be inspected in a controlled quality inspection environment; A second workpiece image analysis unit, used for comparing the second workpiece image of the workpiece to be inspected with the standard part image of the workpiece to be inspected for similarity based on image processing technology; The second workpiece image judging unit is used to judge whether the second workpiece image of the workpiece to be inspected in the regulated quality inspection environment has defects.