CN117832404A - Lithium ion battery silicon nitride negative electrode film and preparation method thereof - Google Patents
Lithium ion battery silicon nitride negative electrode film and preparation method thereof Download PDFInfo
- Publication number
- CN117832404A CN117832404A CN202311782876.1A CN202311782876A CN117832404A CN 117832404 A CN117832404 A CN 117832404A CN 202311782876 A CN202311782876 A CN 202311782876A CN 117832404 A CN117832404 A CN 117832404A
- Authority
- CN
- China
- Prior art keywords
- silicon nitride
- negative electrode
- current collector
- collector substrate
- electrode film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910052581 Si3N4 Inorganic materials 0.000 title claims abstract description 51
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 title claims abstract description 50
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 title claims abstract description 25
- 229910001416 lithium ion Inorganic materials 0.000 title claims abstract description 25
- 238000002360 preparation method Methods 0.000 title claims abstract description 11
- 238000000034 method Methods 0.000 claims abstract description 32
- 238000000151 deposition Methods 0.000 claims abstract description 22
- 230000008021 deposition Effects 0.000 claims abstract description 12
- 238000001755 magnetron sputter deposition Methods 0.000 claims abstract description 10
- 239000000758 substrate Substances 0.000 claims description 47
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 30
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 26
- 239000010949 copper Substances 0.000 claims description 26
- 238000004544 sputter deposition Methods 0.000 claims description 24
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 20
- 229910052802 copper Inorganic materials 0.000 claims description 20
- 229910052786 argon Inorganic materials 0.000 claims description 15
- 238000004140 cleaning Methods 0.000 claims description 15
- 230000008569 process Effects 0.000 claims description 15
- 239000007789 gas Substances 0.000 claims description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims description 9
- 229910052710 silicon Inorganic materials 0.000 claims description 9
- 239000010703 silicon Substances 0.000 claims description 9
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- 239000011889 copper foil Substances 0.000 claims description 6
- 230000007704 transition Effects 0.000 claims description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 239000013077 target material Substances 0.000 claims description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000008367 deionised water Substances 0.000 claims description 3
- 229910021641 deionized water Inorganic materials 0.000 claims description 3
- 238000001035 drying Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000004506 ultrasonic cleaning Methods 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 claims description 2
- 238000005265 energy consumption Methods 0.000 abstract description 4
- 230000014759 maintenance of location Effects 0.000 abstract description 2
- 230000002349 favourable effect Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 32
- 239000007773 negative electrode material Substances 0.000 description 7
- 239000010409 thin film Substances 0.000 description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910002804 graphite Inorganic materials 0.000 description 4
- 239000010439 graphite Substances 0.000 description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- 238000000498 ball milling Methods 0.000 description 2
- -1 compound silicon nitride Chemical class 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 238000004549 pulsed laser deposition Methods 0.000 description 2
- 239000002210 silicon-based material Substances 0.000 description 2
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- 102100023591 Polyphosphoinositide phosphatase Human genes 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 1
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 1
- 229910007991 Si-N Inorganic materials 0.000 description 1
- 229910006294 Si—N Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000003487 electrochemical reaction Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000004146 energy storage Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 238000010301 surface-oxidation reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/13—Electrodes for accumulators with non-aqueous electrolyte, e.g. for lithium-accumulators; Processes of manufacture thereof
- H01M4/139—Processes of manufacture
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
- C23C14/0652—Silicon nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3485—Sputtering using pulsed power to the target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/05—Accumulators with non-aqueous electrolyte
- H01M10/052—Li-accumulators
- H01M10/0525—Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodes; Lithium-ion batteries
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/04—Processes of manufacture in general
- H01M4/0402—Methods of deposition of the material
- H01M4/0421—Methods of deposition of the material involving vapour deposition
- H01M4/0423—Physical vapour deposition
- H01M4/0426—Sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/13—Electrodes for accumulators with non-aqueous electrolyte, e.g. for lithium-accumulators; Processes of manufacture thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M2004/026—Electrodes composed of, or comprising, active material characterised by the polarity
- H01M2004/027—Negative electrodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Battery Electrode And Active Subsutance (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
技术领域Technical Field
本发明属于锂离子薄膜电池技术领域,具体涉及一种锂离子电池氮化硅负极薄膜及其制备方法。The invention belongs to the technical field of lithium ion thin film batteries, and in particular relates to a lithium ion battery silicon nitride negative electrode film and a preparation method thereof.
背景技术Background technique
随着锂离子电池的迅猛发展以及在诸多领域的广泛应用,高比容量、长循环寿命锂电池是电池发展的重要方向。目前商业锂离子电池采用石墨负极材料,其理论比容量仅为372mAh/g,限制了锂离子电池性能的进一步提升。硅基负极材料由于具有高比容量、低放电电位、高性价比等特点,被认为是可以替代石墨的负极材料。然而,纯硅材料在充放电过程中的体积变化巨大,由此产生的应力若无法得到及时的抑制或释放,会引起硅负极的破裂,继而导致容量骤减,对电池的循环性能产生极大的负面影响。氮化硅是一种常见的硅基化合物,其中的Si-N键可以缓解和释放电化学反应中产生的应力,对电池充放电过程中的体积膨胀具有良好的缓冲作用,从而获得高循环稳定性能。此外,氮化硅材料具有高比容量、高强度、抗氧化性、抗冲击性等优势,因而被认为是一种极具前景的锂离子电池负极材料。With the rapid development of lithium-ion batteries and their wide application in many fields, high specific capacity and long cycle life lithium batteries are an important direction for battery development. At present, commercial lithium-ion batteries use graphite negative electrode materials, and their theoretical specific capacity is only 372mAh/g, which limits the further improvement of lithium-ion battery performance. Silicon-based negative electrode materials are considered to be negative electrode materials that can replace graphite due to their high specific capacity, low discharge potential, and high cost performance. However, the volume change of pure silicon materials during the charging and discharging process is huge. If the stress generated by this cannot be suppressed or released in time, it will cause the rupture of the silicon negative electrode, which will lead to a sudden decrease in capacity and have a great negative impact on the battery's cycle performance. Silicon nitride is a common silicon-based compound, in which the Si-N bond can relieve and release the stress generated in the electrochemical reaction, and has a good buffering effect on the volume expansion during the battery charging and discharging process, thereby obtaining high cycle stability performance. In addition, silicon nitride materials have the advantages of high specific capacity, high strength, oxidation resistance, and impact resistance, and are therefore considered to be a very promising negative electrode material for lithium-ion batteries.
现有制备氮化硅负极材料的方法主要采用球磨法和脉冲激光沉积法。例如,CN114335520A公开了一种氮化物高储能密度负极材料极其制备方法,采用球磨工艺将氮化硅粉体和氧化石墨进行复合,利用氧化石墨包覆氮化硅解决了氮化硅粉体在循环过程中体积膨胀的问题,减缓氮化物的表面氧化和溶解带来的容量衰减,进而改善电池的循环性能。Suzuki等(JournalofPower Sources,2013,231,186.)利用脉冲激光沉积法制备了氮化硅薄膜,并将其作为锂离子电池负极,发现氮化硅薄膜负极的首次充放电比容量可达1800mAhg-1。然而,上述制备氮化硅薄膜负极方法存在工艺复杂、能耗大、难以大规模制备等问题,限制了氮化硅薄膜负极材料的产业化推广应用。The existing methods for preparing silicon nitride negative electrode materials mainly use ball milling and pulsed laser deposition. For example, CN114335520A discloses a nitride high energy storage density negative electrode material and its preparation method, which uses ball milling process to compound silicon nitride powder and graphite oxide, and uses graphite oxide to coat silicon nitride to solve the problem of volume expansion of silicon nitride powder during the cycle, slow down the capacity decay caused by surface oxidation and dissolution of nitride, and thus improve the cycle performance of the battery. Suzuki et al. (Journal of Power Sources, 2013, 231, 186.) prepared silicon nitride film by pulsed laser deposition, and used it as the negative electrode of lithium ion battery, and found that the first charge and discharge specific capacity of silicon nitride film negative electrode can reach 1800 mAh g -1 . However, the above-mentioned method for preparing silicon nitride film negative electrode has problems such as complex process, high energy consumption, and difficulty in large-scale preparation, which limits the industrialization and promotion of silicon nitride film negative electrode materials.
发明内容Summary of the invention
解决的技术问题:为了克服现有技术中存在的不足,本申请提出一种锂离子电池氮化硅负极薄膜及其制备方法,以解决现有技术中工艺复杂、能耗大、难以大规模制备等技术问题。Technical problem to be solved: In order to overcome the deficiencies in the prior art, the present application proposes a lithium-ion battery silicon nitride negative electrode film and a preparation method thereof, so as to solve the technical problems in the prior art such as complex process, high energy consumption, and difficulty in large-scale preparation.
技术方案Technical solutions
一种锂离子电池氮化硅负极薄膜的制备方法,制备方法具体步骤为:A method for preparing a lithium-ion battery silicon nitride negative electrode film, the specific steps of the preparation method are:
步骤a,集流体基片清洗处理:将集流体基片依次放入异丙醇、去离子水、无水乙醇中进行超声清洗,150℃下烘干;将清洗烘干后的集流体基片放入镀膜设备真空腔室内的基片台上,开启抽真空至1×10-4Pa,以氩气为工作气体,打开离子源,对集流体基片表面进行等离体子清理处理;Step a, cleaning treatment of the current collector substrate: placing the current collector substrate in isopropanol, deionized water, and anhydrous ethanol in turn for ultrasonic cleaning, and drying at 150°C; placing the cleaned and dried current collector substrate on a substrate table in a vacuum chamber of a coating equipment, vacuuming to 1×10 -4 Pa, using argon as the working gas, turning on the ion source, and performing plasma cleaning treatment on the surface of the current collector substrate;
步骤b,沉积铜薄膜层:以平面铜靶为靶材,氩气为工作气体,采用直流磁控溅射工艺在清理处理后的集流体基片表面沉积铜薄膜层;Step b, depositing a copper thin film layer: using a planar copper target as a target material and argon as a working gas, a DC magnetron sputtering process is used to deposit a copper thin film layer on the surface of the cleaned current collector substrate;
步骤c,沉积氮化硅负极薄膜:以平面硅靶为靶材,氩气和氮气为工作气体,采用射频磁控溅射工艺在沉积铜薄膜层的集流体基片表面沉积氮化硅负极薄膜。Step c, depositing a silicon nitride negative electrode film: using a planar silicon target as the target material, argon and nitrogen as the working gas, and adopting a radio frequency magnetron sputtering process to deposit a silicon nitride negative electrode film on the surface of the current collector substrate on which the copper film layer is deposited.
作为本申请的一种优选技术方案:所述步骤a中的集流体基片表面进行等离体子清理处理的条件为:氩气流量为100sccm,等离体子清理处理溅射功率为400W,清理时间为30s;集流体基片为铜箔集流体基片,对铜箔集流体基片表面进行Ar+等离子体清理。As a preferred technical solution of the present application: the conditions for plasma cleaning treatment on the surface of the current collector substrate in step a are: argon gas flow rate is 100 sccm, plasma cleaning treatment sputtering power is 400 W, and cleaning time is 30 s; the current collector substrate is a copper foil current collector substrate, and Ar+ plasma cleaning is performed on the surface of the copper foil current collector substrate.
作为本申请的一种优选技术方案:所述步骤b中的集流体基片表面沉积的铜薄膜层厚度为20-30nm,采用的直流磁控溅射工艺条件为:氩气流量为30sccm,腔室工作气压为0.1-0.5Pa,溅射功率180-250W,溅射沉积时间为2-4min,集流体基片温度为100-150℃。As a preferred technical solution of the present application: the thickness of the copper thin film layer deposited on the surface of the current collector substrate in the step b is 20-30nm, and the DC magnetron sputtering process conditions adopted are: argon gas flow rate is 30sccm, chamber working gas pressure is 0.1-0.5Pa, sputtering power is 180-250W, sputtering deposition time is 2-4min, and current collector substrate temperature is 100-150℃.
作为本申请的一种优选技术方案:所述步骤c中制备的氮化硅负极薄膜厚度为100-200nm,Si/N元素比例为1:0.8-1:0.9;采用的射频磁控溅射工艺条件为:氩气流量为40-60sccm,氮气流量为6-10sccm,腔室工作气压为0.5-2Pa,溅射功率为100-200W,溅射沉积时间为30-60min,沉积铜薄膜层的集流体基片温度为100-150℃。As a preferred technical solution of the present application: the thickness of the silicon nitride negative electrode film prepared in the step c is 100-200nm, and the Si/N element ratio is 1:0.8-1:0.9; the RF magnetron sputtering process conditions adopted are: the argon flow rate is 40-60sccm, the nitrogen flow rate is 6-10sccm, the chamber working gas pressure is 0.5-2Pa, the sputtering power is 100-200W, the sputtering deposition time is 30-60min, and the collector substrate temperature for depositing the copper thin film layer is 100-150°C.
作为本申请的一种优选技术方案:所述步骤b具体为:将平面铜靶固定在直流靶位,调整靶材与集流体基片相对位置,使靶基距为10cm,启动循环水和电源,将集流体基片温度加热至100℃,抽真空至真空度于1.6×10-3Pa时,以30sccm的流量流速充入纯度为99.99%的Ar,腔室工作气压为0.35Pa,开始溅射Cu过渡层,铜靶直流(DC)溅射电流为0.5A,占空比为50%,基片台转速4rpm,溅射沉积时间3min得到厚度为20nm的Cu过渡层。As a preferred technical solution of the present application: the step b is specifically as follows: fixing the planar copper target at the DC target position, adjusting the relative position of the target and the current collector substrate so that the target-substrate distance is 10 cm, starting the circulating water and power supply, heating the current collector substrate temperature to 100°C, evacuating to a vacuum degree of 1.6×10 -3 Pa, filling with 99.99% pure Ar at a flow rate of 30 sccm, the chamber working pressure is 0.35 Pa, and starting sputtering of the Cu transition layer. The copper target DC sputtering current is 0.5 A, the duty cycle is 50%, the substrate stage speed is 4 rpm, and the sputtering deposition time is 3 min to obtain a Cu transition layer with a thickness of 20 nm.
作为本申请的一种优选技术方案:所述步骤c参数具体设置为:向真空腔室通入流量为40sccm的氮气和8sccm的氮气,打开硅靶射频电源,调整靶源功率到100W,在0.5Pa下溅射沉积40min,获得表面形貌均匀、结构致密的氮化硅负极薄膜。As a preferred technical solution of the present application: the parameters of step c are specifically set as: introducing 40 sccm of nitrogen and 8 sccm of nitrogen into the vacuum chamber, turning on the silicon target RF power supply, adjusting the target source power to 100 W, and sputtering deposition at 0.5 Pa for 40 minutes to obtain a silicon nitride negative electrode film with uniform surface morphology and dense structure.
本申请还公开了上述任一锂离子电池氮化硅负极薄膜的制备方法制得的锂离子电池氮化硅负极薄膜。The present application also discloses a lithium ion battery silicon nitride negative electrode film prepared by any of the above-mentioned methods for preparing the lithium ion battery silicon nitride negative electrode film.
本申请原理解释:本发明采用工业成熟度高的磁控溅射工艺高效、低温制备氮化硅负极薄膜,以硅靶材为硅源、氩气为溅射气体、氮气为反应气体,通过调节溅射功率、工作气压、气氛比率、沉积时间等参数优化氮化硅负极薄膜的结构和成分,制备高性能锂离子电池负极薄膜材料。Explanation of the principle of this application: The present invention adopts an industrially mature magnetron sputtering process to efficiently and low-temperature prepare silicon nitride negative electrode film, using silicon target as silicon source, argon as sputtering gas, and nitrogen as reaction gas. By adjusting parameters such as sputtering power, working gas pressure, atmosphere ratio, and deposition time, the structure and composition of the silicon nitride negative electrode film are optimized to prepare high-performance lithium-ion battery negative electrode film materials.
有益效果:本发明制备的氮化硅负极薄膜具有高比容量、高循环稳定性的优势,其制备工艺具有沉积效率高、成本低、能耗低、绿色无污染等特点,有利于工业化推广应用。Beneficial effects: The silicon nitride negative electrode film prepared by the present invention has the advantages of high specific capacity and high cycle stability. Its preparation process has the characteristics of high deposition efficiency, low cost, low energy consumption, green and pollution-free, etc., which is conducive to industrial promotion and application.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1是本申请的一种锂离子电池氮化硅负极薄膜的SEM图;FIG1 is a SEM image of a lithium-ion battery silicon nitride negative electrode film of the present application;
图2是本申请氮化硅负极薄膜的Si 2p XPS图;FIG2 is a Si 2p XPS graph of the silicon nitride negative electrode film of the present application;
图3是本申请氮化硅负极薄膜的N1s XPS图;FIG3 is an N1s XPS graph of the silicon nitride negative electrode film of the present application;
图4是本申请氮化硅负极薄膜0.5C条件下的充放电曲线图;FIG4 is a charge and discharge curve diagram of the silicon nitride negative electrode film of the present application under 0.5C condition;
图5是本申请氮化硅负极薄膜的循环稳定性图。FIG. 5 is a graph showing the cycle stability of the silicon nitride negative electrode film of the present application.
具体实施方式Detailed ways
下面结合附图对本发明的技术方案做进一步的详细说明:本实施例在以本发明技术方案为前提下进行实施,给出了详细的实施方式和具体的操作过程,但本发明的保护权限不限于下述的实施例。The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings: This embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation method and specific operation process are given, but the protection authority of the present invention is not limited to the following embodiments.
实施例1:Embodiment 1:
一种锂离子电池氮化硅负极薄膜的制备方法,具体步骤为:A method for preparing a lithium-ion battery silicon nitride negative electrode film, the specific steps are:
步骤a,集流体基片清洗处理:将集流体基片依次放入异丙醇、去离子水、无水乙醇中进行超声清洗,150℃下烘干;将清洗烘干后的集流体基片放入镀膜设备真空腔室内的基片台上,开启抽真空至1×10-4Pa,以氩气为工作气体,氩气流量为100sccm,等离体子清理处理溅射功率为400W,清理时间为30s;集流体基片为铜箔集流体基片,对铜箔集流体基片表面进行Ar+等离子体清理;Step a, cleaning treatment of the current collector substrate: placing the current collector substrate in isopropanol, deionized water, and anhydrous ethanol in turn for ultrasonic cleaning, and drying at 150°C; placing the cleaned and dried current collector substrate on a substrate table in a vacuum chamber of a coating device, vacuuming to 1×10 -4 Pa, using argon as the working gas, the argon flow rate is 100 sccm, the plasma cleaning treatment sputtering power is 400 W, and the cleaning time is 30 s; the current collector substrate is a copper foil current collector substrate, and the surface of the copper foil current collector substrate is cleaned by Ar+ plasma;
步骤b,沉积铜薄膜层:将平面铜靶固定在直流靶位,调整靶材与集流体基片相对位置,使靶基距为10cm,启动循环水和电源,将集流体基片温度加热至100℃,抽真空至真空度于1.6×10-3Pa时,以30sccm的流量流速充入纯度为99.99%的Ar,腔室工作气压为0.35Pa,开始溅射Cu过渡层,铜靶直流(DC)溅射电流为0.5A,占空比为50%,基片台转速4rpm,溅射沉积时间3min得到厚度为20nm的Cu过渡层;Step b, depositing a copper thin film layer: fixing a planar copper target at a DC target position, adjusting the relative position between the target and the current collector substrate so that the target-substrate distance is 10 cm, starting circulating water and power, heating the current collector substrate to 100°C, evacuating to a vacuum degree of 1.6×10 -3 Pa, and then charging Ar with a purity of 99.99% at a flow rate of 30 sccm. The chamber working pressure is 0.35 Pa, and sputtering of a Cu transition layer is started. The copper target DC sputtering current is 0.5 A, the duty cycle is 50%, the substrate stage speed is 4 rpm, and the sputtering deposition time is 3 min to obtain a Cu transition layer with a thickness of 20 nm.
步骤c,沉积氮化硅负极薄膜:Si/N元素比例为1:0.8-1:0.9,沉积铜薄膜层的集流体基片温度为100-150℃;向真空腔室通入流量为40sccm的氮气和8sccm的氮气,打开硅靶射频电源,调整靶源功率到100W,在0.5Pa下溅射沉积40min,氮化硅负极薄膜厚度为100-200nm,获得表面形貌均匀、结构致密的氮化硅负极薄膜,如图1所示。Step c, depositing a silicon nitride negative electrode film: the Si/N element ratio is 1:0.8-1:0.9, and the temperature of the current collector substrate for depositing the copper thin film layer is 100-150°C; nitrogen gas with a flow rate of 40sccm and nitrogen gas of 8sccm are introduced into the vacuum chamber, the silicon target RF power supply is turned on, the target source power is adjusted to 100W, and sputtering deposition is performed at 0.5Pa for 40min. The thickness of the silicon nitride negative electrode film is 100-200nm, and a silicon nitride negative electrode film with uniform surface morphology and dense structure is obtained, as shown in Figure 1.
实施例2:Embodiment 2:
采用XPS表征检测获得氮化硅负极薄膜中Si/N元素比例为1:0.8-1:0.9(图2、图3)。将氮化硅负极薄膜裁剪为12mm直径的圆片工作电极,以金属锂片为对电极,采用1mol/LLiPF6+EC/DMC/EMC(体积比为1:1:1)为电解液和聚丙烯薄膜为隔膜,组装制备扣式电池。测试获得0.5C条件下的氮化硅负极薄膜的放电比容量为1121mAh·g-1(图4),循环100圈后电池的容量保持率为82%(图5),表明制备的氮化硅负极薄膜具有较高的比容量和良好的循环稳定性。XPS characterization test shows that the Si/N element ratio in the silicon nitride negative electrode film is 1:0.8-1:0.9 (Figure 2, Figure 3). The silicon nitride negative electrode film was cut into a 12mm diameter disc working electrode, a metal lithium sheet was used as the counter electrode, 1mol/LLiPF 6 +EC/DMC/EMC (volume ratio of 1:1:1) was used as the electrolyte and a polypropylene film was used as the diaphragm to assemble and prepare a button cell. The test showed that the discharge specific capacity of the silicon nitride negative electrode film under 0.5C conditions was 1121mAh·g -1 (Figure 4), and the capacity retention rate of the battery after 100 cycles was 82% (Figure 5), indicating that the prepared silicon nitride negative electrode film has a high specific capacity and good cycle stability.
此外,应当理解,虽然本说明书按照实施方式加以描述,但并非每个实施方式仅包含一个独立的技术方案,说明书的这种叙述方式仅仅是为清楚起见,本领域技术人员应当将说明书作为一个整体,各实施例中的技术方案也可以经适当组合,形成本领域技术人员可以理解的其他实施方式。In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202311782876.1A CN117832404A (en) | 2023-12-22 | 2023-12-22 | Lithium ion battery silicon nitride negative electrode film and preparation method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202311782876.1A CN117832404A (en) | 2023-12-22 | 2023-12-22 | Lithium ion battery silicon nitride negative electrode film and preparation method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
CN117832404A true CN117832404A (en) | 2024-04-05 |
Family
ID=90522222
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202311782876.1A Pending CN117832404A (en) | 2023-12-22 | 2023-12-22 | Lithium ion battery silicon nitride negative electrode film and preparation method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN117832404A (en) |
-
2023
- 2023-12-22 CN CN202311782876.1A patent/CN117832404A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN105226258B (en) | A kind of negative electrode of lithium ion battery composite film material and preparation method thereof | |
CN108807883A (en) | Silicon carbon film negative material and preparation method thereof | |
CN110444751B (en) | Li-Si-N nano composite film, preparation method thereof, negative electrode structure and lithium battery | |
CN103144393B (en) | Silicon-based thin film material with sandwich structure and preparation method and application thereof | |
CN112968146B (en) | Preparation method of long-cycle secondary zinc battery cathode titanium nitride coating | |
CN108923037A (en) | Silicon-rich SiOx-C material and preparation method and application thereof | |
CN115394956A (en) | An integrated anode material composed of 3D current collector-carbon layer-silicon layer | |
CN116344750A (en) | A kind of lithium-ion battery silicon carbon thin film negative electrode material and preparation method thereof | |
CN110148729A (en) | Preparation method and application of carbon-coated silicon monoxide material | |
CN101339989A (en) | Aluminum-tin alloy thin film for negative electrode of lithium ion battery and preparation method thereof | |
CN110380056B (en) | Surface modified current collector, and preparation method and application thereof | |
CN111916680A (en) | Preparation method of fluorinated polymer modified battery electrode and application in battery field | |
CN110649234A (en) | Preparation method of silicon-based negative electrode material with high coulombic efficiency | |
CN114300733A (en) | A kind of all-solid-state thin-film lithium battery and preparation method thereof | |
CN101174687A (en) | Preparation method of nickel oxide anode film for all-solid-state thin-film lithium-ion battery | |
CN113410445A (en) | Silicon-carbon composite negative electrode material for secondary battery and preparation method thereof | |
JP7655990B2 (en) | Manganese-based sodium-ion battery positive electrode material that suppresses the Jahn-Teller effect and its manufacturing method | |
CN105810889B (en) | A kind of adhesive-free porous silicon/carbon composite electrode and its application | |
CN115747760B (en) | Composite coating coated silicon-based material, preparation method and application thereof | |
CN117832404A (en) | Lithium ion battery silicon nitride negative electrode film and preparation method thereof | |
CN108110222B (en) | Preparation method of multilayer metal-carbon cathode based on lithium battery | |
CN116995219A (en) | A porous silicon-carbon composite negative electrode material and its preparation method and application | |
CN115663162A (en) | A preparation method of defect-rich core-shell structure lithium manganese oxide cathode material | |
CN114843586A (en) | Pre-lithiation method of all-solid-state thin film lithium battery | |
CN110783557A (en) | A kind of preparation method of high-performance silicon-based thin film and its application |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |