CN117704957A - Measuring system for object to be measured - Google Patents
Measuring system for object to be measured Download PDFInfo
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- CN117704957A CN117704957A CN202311633983.8A CN202311633983A CN117704957A CN 117704957 A CN117704957 A CN 117704957A CN 202311633983 A CN202311633983 A CN 202311633983A CN 117704957 A CN117704957 A CN 117704957A
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- G—PHYSICS
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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Abstract
Description
技术领域Technical field
本公开实施例涉及激光测量技术领域,更具体地,涉及一种待测物体的测量系统。The embodiments of the present disclosure relate to the technical field of laser measurement, and more specifically, to a measurement system for an object to be measured.
背景技术Background technique
激光干涉仪是以激光波长为已知长度,利用迈克耳逊干涉系统测量位移的通用长度测量。Laser interferometer is a universal length measurement that uses the laser wavelength as a known length and uses the Michelson interference system to measure displacement.
相关技术中,为了提高激光干涉仪的测量准确性,通常都是人工根据激光干涉仪输出的画面,手动将待测物体例如镜片调整至合适的位置后,基于激光干涉仪对镜片进行测量。然而,由于镜片面型多样性,每种面型的调整方式也不相同,人工判定并调整的方式不仅耗时且浪费了人力,并且不能保证每次测量都能将镜片调整至合适的位置,影响了测量准确性。In the related art, in order to improve the measurement accuracy of the laser interferometer, the object to be measured, such as the lens, is usually manually adjusted to a suitable position based on the image output by the laser interferometer, and then the lens is measured based on the laser interferometer. However, due to the diversity of lens surface types, the adjustment methods for each surface type are also different. The manual judgment and adjustment method is not only time-consuming and wasteful of manpower, but also cannot guarantee that the lens can be adjusted to the appropriate position for every measurement. affects the measurement accuracy.
发明内容Contents of the invention
本公开实施例的一个目的是提供一种待测物体的测量系统的新的技术方案。One purpose of the embodiments of the present disclosure is to provide a new technical solution for a measurement system for an object to be measured.
本公开提供了一种待测物体的测量系统,包括工装装置、处理装置、激光干涉仪和运动装置,所述运动装置设置在所述工装装置上,The present disclosure provides a measurement system for an object to be measured, including a tooling device, a processing device, a laser interferometer and a motion device, and the motion device is provided on the tooling device,
所述激光干涉仪,用于在所述待测物体放置于所述工装装置的情况下,输出第一条纹图像;The laser interferometer is used to output a first fringe image when the object to be measured is placed on the tooling device;
所述处理装置,用于根据所述第一条纹图像,确定所述待测物体所处的位置;以及,The processing device is used to determine the position of the object to be measured based on the first stripe image; and,
在所述待测物体所处的位置偏离最佳测量位置的情况下,控制所述运动装置转动以将所述待测物体所处的位置调整至所述最佳测量位置;When the position of the object to be measured deviates from the optimal measurement position, control the rotation of the motion device to adjust the position of the object to be measured to the optimal measurement position;
所述激光干涉仪,用于在所述待测物体所处的位置为所述最佳测量位置的情况下,对所述待测物体进行测量获得所述待测物体的测量结果。The laser interferometer is used to measure the object to be measured to obtain a measurement result of the object to be measured when the position of the object to be measured is the optimal measurement position.
可选地,所述处理装置,还用于接收用户输入的模式选择指令;以及,Optionally, the processing device is also configured to receive a mode selection instruction input by the user; and,
响应于所述模式选择指令,控制所述激光干涉仪进入对应的工作模式;In response to the mode selection instruction, control the laser interferometer to enter the corresponding working mode;
其中,所述工作模式包括条纹图模式和点图模式。Wherein, the working mode includes stripe pattern mode and dot pattern mode.
可选地,所述激光干涉仪,用于在所述待测物体放置于所述工装装置的情况下,输出第一条纹图像,具体包括:Optionally, the laser interferometer is used to output a first fringe image when the object to be measured is placed on the tooling device, specifically including:
在所述待测物体放置于所述工装装置的情况下,若所述激光干涉仪处于所述条纹图模式,输出所述第一条纹图像。When the object to be measured is placed on the tooling device, if the laser interferometer is in the fringe pattern mode, the first fringe image is output.
可选地,所述激光干涉仪,还用于在所述待测物体未放置于所述工装装置的情况下,若所述激光干涉仪处于所述点图模式,输出标准点图图像;以及,Optionally, the laser interferometer is also configured to output a standard spot diagram image if the laser interferometer is in the spot diagram mode when the object to be measured is not placed on the tooling device; and ,
在所述待测物体放置于所述工装装置的情况下,若所述激光干涉仪处于所述点图模式,输出当前点图图像;When the object to be measured is placed on the tooling device, if the laser interferometer is in the spot diagram mode, output the current spot diagram image;
所述处理模块,还用于根据所述标准点图图像和所述当前点图图像,控制所述运动装置转动。The processing module is also used to control the rotation of the motion device according to the standard dot map image and the current dot map image.
可选地,所述处理模块,用于根据所述标准点图图像和所述当前点图图像,控制所述运动装置,具体包括:Optionally, the processing module is used to control the motion device according to the standard point map image and the current point map image, specifically including:
比较所述标准点图图像和所述当前点图图像;Compare the standard dot map image and the current dot map image;
在所述标准点图图像和所述当前点图图像之间的偏差位于预设偏差范围之外的情况下,控制所述运动装置转动以使所述标准点图图像和所述当前点图图像之间的偏差位于所述预设偏差范围之内。When the deviation between the standard dot map image and the current dot map image is outside the preset deviation range, the movement device is controlled to rotate so that the standard dot map image and the current dot map image The deviation between them is within the preset deviation range.
可选地,所述处理装置,还用于在样本模组放置于所述工装装置的情况下,若所述激光干涉仪处于所述条纹图模式,控制所述运动装置转动以使所述激光干涉仪输出第二条纹图像。Optionally, the processing device is also configured to control the rotation of the movement device to cause the laser if the laser interferometer is in the fringe pattern mode when the sample module is placed on the tooling device. The interferometer outputs a second fringe image.
可选地,所述最佳测量位置为满足设定测量条件的位置;Optionally, the optimal measurement position is a position that satisfies the set measurement conditions;
其中,所述设定测量条件至少包括所述第一条纹图像中包括的条纹数量小于或等于设定条纹数量。Wherein, the set measurement condition at least includes that the number of stripes included in the first stripe image is less than or equal to the set number of stripes.
可选地,所述待测物体为镜片,所述待测物体的测量结果至少包括所述镜片的平面度。Optionally, the object to be measured is a lens, and the measurement result of the object to be measured at least includes the flatness of the lens.
可选地,所述处理装置,还用于存储所述待测物体的测量结果。Optionally, the processing device is also used to store the measurement results of the object to be measured.
可选地,所述运动装置为六轴电机。Optionally, the motion device is a six-axis motor.
本公开实施例的一个有益效果在于,激光干涉仪在待测物体放置于工装装置的情况下会输出第一条纹图像,处理装置根据第一条纹图像便可确定出待测物体所处的位置,并在待测物体所处的位置偏离最佳测量位置的情况下,控制运动装置转动以将待测物体所处的位置调整至最佳测量位置,激光干涉仪在待测物体所处的位置为最佳测量位置的情况下,会对待测物体进行测量。通过本公开实施例提供的待测物体的测量系统,其能够将待测物体自动调整至最佳测量位置后,由激光干涉仪对待测物体进行测量,无需人工干预,且保证了测量准确性。One beneficial effect of the embodiments of the present disclosure is that the laser interferometer will output a first fringe image when the object to be measured is placed on the tooling device, and the processing device can determine the location of the object to be measured based on the first fringe image. And when the position of the object to be measured deviates from the best measurement position, the movement device is controlled to rotate to adjust the position of the object to be measured to the best measurement position. The position of the laser interferometer at the object to be measured is: The object to be measured is measured in the best measuring position. Through the measurement system for the object to be measured provided by the embodiments of the present disclosure, it can automatically adjust the object to be measured to the optimal measurement position, and then measure the object to be measured by a laser interferometer without manual intervention, while ensuring measurement accuracy.
通过以下参照附图对本说明书的示例性实施例的详细描述,本说明书的其它特征及其优点将会变得清楚。Other features of the present specification and its advantages will become apparent from the following detailed description of exemplary embodiments of the present specification with reference to the accompanying drawings.
附图说明Description of the drawings
被结合在说明书中并构成说明书的一部分的附图示出了本说明书的实施例,并且连同其说明一起用于解释本说明书的原理。The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the specification and together with the description, serve to explain the principles of the specification.
图1是根据本公开实施例的待测物体的测量系统的示意图;Figure 1 is a schematic diagram of a measurement system for an object to be measured according to an embodiment of the present disclosure;
图2是根据本公开实施例的第二条纹图像的示意图;Figure 2 is a schematic diagram of a second stripe image according to an embodiment of the present disclosure;
图3是根据本公开实施例的标准点图图像的示意图;Figure 3 is a schematic diagram of a standard dot plot image according to an embodiment of the present disclosure;
图4是根据本公开实施例的对运动装置的倾斜X轴和倾斜Y轴进行转动的示意图;Figure 4 is a schematic diagram of rotating the tilted X-axis and tilted Y-axis of the motion device according to an embodiment of the present disclosure;
图5是根据本公开实施例的第一条纹图像的示意图。FIG. 5 is a schematic diagram of a first stripe image according to an embodiment of the present disclosure.
具体实施方式Detailed ways
现在将参照附图来详细描述本公开的各种示例性实施例。应注意到:除非另外具体说明,否则在这些实施例中阐述的部件和步骤的相对布置、数字表达式和数值不限制本公开实施例的范围。Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the disclosed embodiments unless otherwise specifically stated.
以下对至少一个示例性实施例的描述实际上仅仅是说明性的,决不作为对本公开及其应用或使用的任何限制。The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the disclosure, its application or uses.
对于相关领域普通技术人员已知的技术、方法和设备可能不作详细讨论,但在适当情况下,所述技术、方法和设备应当被视为说明书的一部分。。Techniques, methods and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such techniques, methods and devices should be considered a part of the specification. .
在这里示出和讨论的所有例子中,任何具体值应被解释为仅仅是示例性的,而不是作为限制。因此,示例性实施例的其它例子可以具有不同的值。In all examples shown and discussed herein, any specific values are to be construed as illustrative only and not as limiting. Accordingly, other examples of the exemplary embodiments may have different values.
应注意到:相似的标号和字母在下面的附图中表示类似项,因此,一旦某一项在一个附图中被定义,则在随后的附图中不需要对其进行进一步讨论。It should be noted that similar reference numerals and letters refer to similar items in the following figures, so that once an item is defined in one figure, it does not need further discussion in subsequent figures.
<系统实施例><System Embodiment>
本公开实施例提供一种待测物体的测量系统,图1是根据本公开实施例提供的一种待测物体的测量系统的硬件示意图。参见图1所示,该待测物体的测量系统1包括工装装置11、处理装置12、激光干涉仪13和运动装置14,运动装置14设置在工装装置11上,以便在运动装置14转动的情况下可带动工装装置11转动,进而调整该工装装置11上所放置的待测物体的位置。An embodiment of the disclosure provides a measurement system for an object to be measured. FIG. 1 is a hardware schematic diagram of a measurement system for an object to be measured according to an embodiment of the disclosure. As shown in Figure 1, the measurement system 1 of the object to be measured includes a tooling device 11, a processing device 12, a laser interferometer 13 and a movement device 14. The movement device 14 is provided on the tooling device 11 so that when the movement device 14 rotates The tooling device 11 can be driven to rotate, thereby adjusting the position of the object to be tested placed on the tooling device 11 .
在本实施例中,工装装置11用于放置待测物体。其中,待测物体可以是VR(VirtualReality)设备中的镜片,该镜片通常为平面镜片,通过本公开实施例待测物体的测试系统可以对镜片的平面度进行测量。示例性地,通常由测量人员将镜片放置于工装装置11。In this embodiment, the tooling device 11 is used to place the object to be tested. The object to be tested may be a lens in a VR (Virtual Reality) device. The lens is usually a flat lens. The flatness of the lens can be measured through the testing system of the object to be tested according to the embodiment of the present disclosure. For example, the lens is usually placed on the tooling device 11 by a surveyor.
在本实施例中,激光干涉仪13用于在所述待测物体放置于所述工装装置11的情况下,输出第一条纹图像。In this embodiment, the laser interferometer 13 is used to output a first fringe image when the object to be measured is placed on the tooling device 11 .
在一个可选地实施例中,激光干涉仪13用于在所述待测物体放置于所述工装装置11的情况下,输出第一条纹图像,具体包括:在所述待测物体放置于所述工装装置11的情况下,若所述激光干涉仪13处于条纹图模式,输出所述第一条纹图像。In an optional embodiment, the laser interferometer 13 is used to output the first fringe image when the object to be measured is placed on the tooling device 11, specifically including: when the object to be measured is placed on the tooling device 11 In the case of the tooling device 11, if the laser interferometer 13 is in the fringe pattern mode, the first fringe image is output.
其中,在激光干涉仪13处于条纹图模式的情况下,激光干涉仪13才会输出条纹图像。通常,是由处理装置12控制激光干涉仪13进入条纹图模式。Among them, the laser interferometer 13 will output a fringe image only when the laser interferometer 13 is in the fringe pattern mode. Usually, the processing device 12 controls the laser interferometer 13 to enter the fringe pattern mode.
继续上述示例,在测量人员将镜片放置于工装装置11的情况下,若激光干涉仪13处于条纹图模式,激光干涉仪13会输出图5所示的第一条纹图像4。当然,图5所示的第一条纹图像4也可能是在镜片所处位置为最佳测量位置的情况下,激光干涉仪13输出的条纹图像。Continuing the above example, when the measuring personnel places the lens on the tooling device 11, if the laser interferometer 13 is in the fringe pattern mode, the laser interferometer 13 will output the first fringe image 4 shown in Figure 5. Of course, the first fringe image 4 shown in FIG. 5 may also be the fringe image output by the laser interferometer 13 when the position of the lens is the optimal measurement position.
在本实施例中,处理装置12用于根据所述第一条纹图像,确定所述待测物体所处的位置;以及,在所述待测物体所处的位置偏离最佳测量位置的情况下,控制所述运动装置14转动以将所述待测物体所处的位置调整至所述最佳测量位置。In this embodiment, the processing device 12 is configured to determine the position of the object to be measured based on the first stripe image; and, when the position of the object to be measured deviates from the optimal measurement position , controlling the rotation of the motion device 14 to adjust the position of the object to be measured to the optimal measurement position.
其中,所述最佳测量位置为满足设定测量条件的位置。其中,所述设定测量条件至少包括所述第一条纹图像中包括的条纹数量小于或等于设定条纹数量。该设定条纹数量可以根据待测物体的产品需求进行设置,本实施例对此不做限定。Wherein, the optimal measurement position is a position that satisfies the set measurement conditions. Wherein, the set measurement condition at least includes that the number of stripes included in the first stripe image is less than or equal to the set number of stripes. The set number of stripes can be set according to the product requirements of the object to be measured, and is not limited in this embodiment.
需要说明的是,由于待测物体例如镜片的面型通常不一致,可根据镜片的面型预先设置与其匹配的测量条件存储至处理装置12中,也就是说,本实施例对该设定测量条件不进行具体限定。It should be noted that since the surface shape of the object to be measured, such as a lens, is usually inconsistent, measurement conditions matching the surface shape of the lens can be preset and stored in the processing device 12 . That is to say, in this embodiment, the set measurement conditions Not specifically limited.
可以理解的是,在待测物体所处的位置为最佳测量位置的情况下,此时,激光干涉仪13输出的第一条纹图像中包括的条纹数量小于或等于设定条纹数量,也可简单理解为,此时激光干涉仪13输出的第一条纹图像中包括的条纹数量相对最少,测量准确性更高。It can be understood that when the position of the object to be measured is the optimal measurement position, at this time, the number of fringes included in the first fringe image output by the laser interferometer 13 is less than or equal to the set number of fringes, or it can be Simply understood, at this time, the number of fringes included in the first fringe image output by the laser interferometer 13 is relatively minimal, and the measurement accuracy is higher.
其中,运动装置14可以是六轴电机,本步骤所提及的对运动装置14进行转动通常是指对运动装置14进行微调,具体可以是对运动装置14的倾斜X轴(简称Tilt_X轴)和倾斜Y轴(简称Tilt_Y)进行转动。The motion device 14 may be a six-axis motor. The rotation of the motion device 14 mentioned in this step usually refers to the fine adjustment of the motion device 14. Specifically, it may be the tilt X axis (Tilt_X axis for short) and Tilt the Y axis (Tilt_Y for short) to rotate.
具体地,处理装置12会根据第一条纹图像确定待测物体所处的位置,并在待测物体所处的位置偏离最佳测量位置的情况下,会控制运动装置的Tilt_X轴和Tilt_Y轴转动,在运动装置Tilt_X轴和Tilt_Y轴转动的情况下,会带动放置该待测物体的工装装置11的转动,以便将待测物体所处的位置进行调整。需要说明的是,这个过程中,处理装置12需要每间隔设定时间段获取激光干涉仪13所输出的第一条纹图像,以便根据第一条纹图像确定是否已经将镜片所处的位置调整至最佳测量位置。Specifically, the processing device 12 will determine the position of the object to be measured based on the first stripe image, and when the position of the object to be measured deviates from the optimal measurement position, it will control the rotation of the Tilt_X axis and Tilt_Y axis of the motion device. , when the Tilt_X axis and Tilt_Y axis of the motion device rotate, the tooling device 11 on which the object to be measured is placed will be driven to rotate, so that the position of the object to be measured is adjusted. It should be noted that during this process, the processing device 12 needs to obtain the first fringe image output by the laser interferometer 13 every set time period, in order to determine whether the position of the lens has been adjusted to the optimal position based on the first fringe image. Best measurement position.
继续上述示例,激光干涉仪13输出第一条纹图像之后,处理装置12会根据第一条纹图像确定镜片所处的位置,参照图4,若镜片所处的位置偏离最佳测量位置,便会控制运动装置14的Tilt_X轴和Tilt_Y轴转动,以便带动放置该镜片的工装装置11转动,进而将镜片所处的位置进行调整。在调整过程中,处理装置12会获取激光干涉仪13输出的第一条纹图像,若获取到图5所示的第一条纹图像4,表明已经将镜片的位置调整至最佳测量位置。Continuing the above example, after the laser interferometer 13 outputs the first fringe image, the processing device 12 will determine the position of the lens based on the first fringe image. Referring to Figure 4, if the position of the lens deviates from the optimal measurement position, it will control The Tilt_X axis and Tilt_Y axis of the motion device 14 rotate to drive the tooling device 11 on which the lens is placed to rotate, thereby adjusting the position of the lens. During the adjustment process, the processing device 12 will acquire the first fringe image output by the laser interferometer 13. If the first fringe image 4 shown in Figure 5 is acquired, it indicates that the position of the lens has been adjusted to the optimal measurement position.
在本实施例中,所述激光干涉仪13用于在所述待测物体所处的位置为所述最佳测量位置的情况下,对所述待测物体进行测量获得所述待测物体的测量结果。In this embodiment, the laser interferometer 13 is used to measure the object to be measured to obtain the measured value of the object to be measured when the position of the object to be measured is the optimal measurement position. Measurement results.
其中,在所述待测物体为镜片的情况下,所述待测物体的测量结果至少包括所述平面镜片的平面度。Wherein, when the object to be measured is a lens, the measurement result of the object to be measured at least includes the flatness of the flat lens.
继续上述示例,在镜片位于最佳测量位置的情况下,即,激光干涉仪13输出图5所示的第一条纹图像4的情况下,激光干涉仪13会对镜片进行测量,以便获得镜片的平面度。Continuing the above example, when the lens is at the optimal measurement position, that is, when the laser interferometer 13 outputs the first fringe image 4 shown in FIG. 5 , the laser interferometer 13 will measure the lens to obtain the value of the lens. Flatness.
在一个可选地实施例中,所述处理装置12还用于存储所述待测物体的测量结果。In an optional embodiment, the processing device 12 is also used to store the measurement results of the object to be measured.
继续上述示例,激光干涉仪13获得镜片的平面度之后,处理装置12会将镜片的平面度进行存储,以便测量人员基于镜片的平面度进行后续工艺操作。Continuing with the above example, after the laser interferometer 13 obtains the flatness of the lens, the processing device 12 will store the flatness of the lens so that the measuring personnel can perform subsequent process operations based on the flatness of the lens.
根据本公开实施例的待测物体的测量系统,激光干涉仪在待测物体放置于工装装置的情况下会输出第一条纹图像,处理装置根据第一条纹图像便可确定出待测物体所处的位置,并在待测物体所处的位置偏离最佳测量位置的情况下,控制运动装置转动以将待测物体所处的位置调整至最佳测量位置,激光干涉仪在待测物体所处的位置为最佳测量位置的情况下,会对待测物体进行测量。通过本公开实施例提供的待测物体的测量系统,其能够将待测物体自动调整至最佳测量位置后,由激光干涉仪对待测物体进行测量,无需人工干预,且保证了测量准确性。According to the measurement system of the object to be measured according to the embodiment of the present disclosure, the laser interferometer will output a first fringe image when the object to be measured is placed on the tooling device, and the processing device can determine the location of the object to be measured based on the first fringe image. position, and when the position of the object to be measured deviates from the best measurement position, the movement device is controlled to rotate to adjust the position of the object to be measured to the best measurement position. The laser interferometer is at the position of the object to be measured. When the position is the best measurement position, the object to be measured will be measured. Through the measurement system for the object to be measured provided by the embodiments of the present disclosure, it can automatically adjust the object to be measured to the optimal measurement position, and then measure the object to be measured by a laser interferometer without manual intervention, while ensuring measurement accuracy.
在一个实施例中,在将待测物体放置于工装装置11之前,通常还需要基于样本模组对运动装置14进行校准,具体可以是将运动装置14的X轴和Y轴进行转动,以使得激光干涉仪13可出现正常条纹图像。In one embodiment, before placing the object to be measured on the tooling device 11, it is usually necessary to calibrate the motion device 14 based on the sample module. Specifically, the X-axis and Y-axis of the motion device 14 can be rotated so that The laser interferometer 13 can produce normal fringe images.
在本实施例中,处理装置11还用于在所述样本模组放置于所述工装装置的情况下,若所述激光干涉仪13处于所述条纹图模式,控制所述运动装置转动以使所述激光干涉仪13输出第二条纹图像。In this embodiment, the processing device 11 is also used to control the rotation of the motion device so that the laser interferometer 13 is in the fringe pattern mode when the sample module is placed on the tooling device. The laser interferometer 13 outputs a second fringe image.
其中,样本模组可以是Golden模组。Among them, the sample module can be a Golden module.
其中,第二条纹图像可以简单理解为正常的条纹图像。Among them, the second stripe image can be simply understood as a normal stripe image.
继续上述示例,在未将镜片放置于工装装置11之前,先在工装装置11上安装Golden模组,若激光干涉仪13处于条纹图模式,处理装置11会控制运动装置14的X轴和Y轴进行转动,以使激光干涉仪13出现图2所示的第二条纹图像2。Continuing the above example, before placing the lens on the tooling device 11, first install the Golden module on the tooling device 11. If the laser interferometer 13 is in the fringe pattern mode, the processing device 11 will control the X-axis and Y-axis of the motion device 14 Rotate so that the second fringe image 2 shown in FIG. 2 appears on the laser interferometer 13 .
在一个实施例中,在将待测物体放置于工装装置11之前,通常还需要对运动装置14进行粗调,具体可以是将运动装置14的Tilt_X轴和Tilt_Y轴进行转动,以便于在将待测物体放置于工装装置11之后,激光干涉仪13能够输出有效的第一条纹图像。In one embodiment, before placing the object to be measured on the tooling device 11, it is usually necessary to make a rough adjustment to the motion device 14. Specifically, this may be to rotate the Tilt_X axis and the Tilt_Y axis of the motion device 14 so that the object to be measured can be placed on the tooling device 11. After the measuring object is placed on the tooling device 11, the laser interferometer 13 can output a valid first fringe image.
在本实施例中,所述激光干涉仪13还用于在所述待测物体未放置于所述工装装置的情况下,若所述激光干涉仪13进入点图模式,输出标准点图图像。In this embodiment, the laser interferometer 13 is also used to output a standard spot diagram image if the laser interferometer 13 enters the spot diagram mode when the object to be measured is not placed on the tooling device.
其中,在激光干涉仪13处于点图模式的情况下,激光干涉仪13才会输出点图图像。通常,是由处理装置12控制激光干涉仪13进入点图模式。Among them, the laser interferometer 13 will output a dot pattern image only when the laser interferometer 13 is in the dot pattern mode. Usually, the processing device 12 controls the laser interferometer 13 to enter the spot diagram mode.
其中,标准点图图像可以理解为是,在工装装置11未放置任何待测物体的情况下,激光干涉仪13输出的点图图像。The standard spot diagram image can be understood as the spot diagram image output by the laser interferometer 13 when no object to be measured is placed on the tooling device 11 .
继续上述示例,工装装置11上未放置任何待测物体,若激光干涉仪13处于点图模式,激光干涉仪13会输出图3所示的标准点图图像3。Continuing the above example, no object to be measured is placed on the tooling device 11. If the laser interferometer 13 is in the spot diagram mode, the laser interferometer 13 will output the standard spot diagram image 3 shown in Figure 3.
在本实施例中,所述激光干涉仪13还用于在所述待测物体放置于所述工装装置的情况下,若所述激光干涉仪进入所述点图模式,输出当前点图图像。In this embodiment, the laser interferometer 13 is also used to output the current point map image if the laser interferometer enters the spot map mode when the object to be measured is placed on the tooling device.
其中,当前点图图像可以理解为是,工装装置11上放置待测物体时,激光干涉仪13输出的点图图像。The current point map image can be understood as the point map image output by the laser interferometer 13 when the object to be measured is placed on the tooling device 11 .
继续上述示例,将镜片放置于工装装置11,若激光干涉仪13进入点图模式,激光干涉仪13会输出当前点图图像。Continuing the above example, the lens is placed on the tooling device 11. If the laser interferometer 13 enters the spot map mode, the laser interferometer 13 will output the current spot map image.
在本实施例中,所述处理模块12还用于根据所述标准点图图像和所述当前点图图像,控制所述运动装置14转动。In this embodiment, the processing module 12 is also used to control the rotation of the motion device 14 according to the standard dot map image and the current dot map image.
在一个可选地实施例中,所述处理模块12,用于根据所述标准点图图像和所述当前点图图像,控制所述运动装置14转动,具体包括:比较所述标准点图图像和所述当前点图图像;在所述标准点图图像和所述当前点图图像之间的偏差位于预设偏差范围之外的情况下,控制所述运动装置14转动以使所述标准点图图像和所述当前点图图像之间的偏差位于所述预设偏差范围之内。In an optional embodiment, the processing module 12 is configured to control the rotation of the motion device 14 according to the standard dot map image and the current dot map image, specifically including: comparing the standard dot map image. and the current point diagram image; when the deviation between the standard point diagram image and the current point diagram image is outside the preset deviation range, control the movement device 14 to rotate so that the standard point The deviation between the map image and the current point map image is within the preset deviation range.
其中,预设偏差范围可以是根据实际场景和实际产品需求设置的数值,本实施例对此不做限定。The preset deviation range may be a value set according to actual scenarios and actual product requirements, which is not limited in this embodiment.
继续上述示例,处理模块12识别图3所示的标准点图图像中的中心光点的第一坐标信息,以及当前点图图像中的中心光点的第二坐标信息,比较第一坐标信息和第二坐标信息,若第一坐标信息和第二坐标信息之间的偏差位于预设偏差范围之外,便控制运动装置14的Tilt_X轴和Tilt_Y轴进行转动,以使得第一坐标信息和第二坐标信息之间的偏差位于预设偏差范围之内。Continuing with the above example, the processing module 12 identifies the first coordinate information of the central light point in the standard point diagram image shown in FIG. 3 and the second coordinate information of the central light point in the current point diagram image, and compares the first coordinate information and For the second coordinate information, if the deviation between the first coordinate information and the second coordinate information is outside the preset deviation range, the Tilt_X axis and Tilt_Y axis of the motion device 14 are controlled to rotate, so that the first coordinate information and the second coordinate information are The deviation between coordinate information is within the preset deviation range.
需要说明的是,这个过程中,处理装置12需要每间隔设定时间段获取激光干涉仪13所输出的当前点图图像,以便根据标准点图图像和当前点图图像确定是否已经将二者之间的偏差调整至预设偏差范围内。It should be noted that during this process, the processing device 12 needs to obtain the current dot map image output by the laser interferometer 13 every set time period, so as to determine whether the standard dot map image and the current dot map image have been combined. The deviation between them is adjusted to the preset deviation range.
在一个实施例中,处理装置12还用于接收用户输入的模式选择指令;响应于所述模式选择指令,控制所述激光干涉仪13进入对应的工作模式。In one embodiment, the processing device 12 is also configured to receive a mode selection instruction input by the user; in response to the mode selection instruction, control the laser interferometer 13 to enter a corresponding working mode.
其中,所述工作模式包括条纹图模式和点图模式。Wherein, the working mode includes stripe pattern mode and dot pattern mode.
需要说明的是,模式选择指令可以是语音指令,也可以是文本指令,本实施例对此不做限定。通过本实施例,处理装置12便可控制激光干涉仪13进入条纹图模式或者点图模式,以便激光干涉仪13根据需要输出条纹图像或者点图图像。It should be noted that the mode selection instruction may be a voice instruction or a text instruction, which is not limited in this embodiment. Through this embodiment, the processing device 12 can control the laser interferometer 13 to enter the fringe pattern mode or the dot pattern mode, so that the laser interferometer 13 outputs a fringe image or a dot pattern image as required.
本实施例提供人机交互接口,以支持测量人员根据当前的实际需要选择所需要的工作模式。This embodiment provides a human-computer interaction interface to support the measurement personnel to select the required working mode according to the current actual needs.
<例子><Example>
接下来以待测物体为镜片为例,结合图1至图5,示出一个例子的基于该待测物体的测量系统的测量方法,该例子中,该测量方法包括:Next, taking the object to be measured as a lens as an example, and combining Figures 1 to 5, an example of a measurement method based on the measurement system of the object to be measured is shown. In this example, the measurement method includes:
步骤201,测量人员将Golden模组放置于工装装置11。In step 201, the surveyor places the Golden module on the tooling device 11.
步骤202,在Golden模组放置于工装装置11的情况下,处理装置12控制激光干涉仪13进入条纹图模式,在激光干涉仪13处于条纹图模式的情况下,处理装置12控制运动装置14的X轴和Y轴转动,以使激光干涉仪13输出图2所示的第二条纹图像2。Step 202: When the Golden module is placed on the tooling device 11, the processing device 12 controls the laser interferometer 13 to enter the fringe pattern mode. When the laser interferometer 13 is in the fringe pattern mode, the processing device 12 controls the motion device 14. The X-axis and Y-axis rotate so that the laser interferometer 13 outputs the second fringe image 2 shown in FIG. 2 .
步骤203,在工装装置11上不放置任何待测物体的情况下,处理装置12控制激光干涉仪13进入点图模式,在激光干涉仪13处于点图模式的情况下,激光干涉仪13输出图3所示的标准点图图像3。Step 203: When no object to be measured is placed on the tooling device 11, the processing device 12 controls the laser interferometer 13 to enter the spot pattern mode. When the laser interferometer 13 is in the spot pattern mode, the laser interferometer 13 outputs a pattern. Standard dot plot image shown in 3.
步骤204,测试人员将镜片放置于工装装置11。In step 204, the tester places the lens on the tooling device 11.
步骤205,在镜片放置于工装装置11的情况下,激光干涉仪13输出当前点图图像。Step 205: When the lens is placed on the tooling device 11, the laser interferometer 13 outputs the current spot map image.
步骤206,处理装置12识别图3所示的标准点图图像中的中心光点的第一坐标信息,以及当前点图图像中的中心光点的第二坐标信息,比较第一坐标信息和第二坐标信息,若第一坐标信息和第二坐标信息之间的偏差位于预设偏差范围之外,便控制运动装置14的Tilt_X轴和Tilt_Y轴进行转动,以使得第一坐标信息和第二坐标信息之间的偏差位于预设偏差范围之内。Step 206: The processing device 12 identifies the first coordinate information of the central light point in the standard point diagram image shown in Figure 3 and the second coordinate information of the central light point in the current point diagram image, and compares the first coordinate information with the second coordinate information. Two coordinate information, if the deviation between the first coordinate information and the second coordinate information is outside the preset deviation range, the Tilt_X axis and Tilt_Y axis of the motion device 14 are controlled to rotate, so that the first coordinate information and the second coordinate information The deviation between the information lies within the preset deviation range.
步骤207,处理装置12控制激光干涉仪13进入条纹图模式,在激光干涉仪13处于条纹图模式的情况下,激光干涉仪13输出第一条纹图像。Step 207, the processing device 12 controls the laser interferometer 13 to enter the fringe pattern mode. When the laser interferometer 13 is in the fringe pattern mode, the laser interferometer 13 outputs the first fringe image.
步骤208,处理装置12根据第一条纹图像,确定镜片所处的位置,并在镜片所处的位置偏离最佳测量位置的情况下,控制运动装置14的Tilt_X轴和Tilt_Y轴进行转动,以便带动放置该镜片的工装装置11转动,进而调整镜片所处的位置。Step 208, the processing device 12 determines the position of the lens based on the first fringe image, and when the position of the lens deviates from the optimal measurement position, controls the Tilt_X axis and Tilt_Y axis of the motion device 14 to rotate in order to drive The tooling device 11 on which the lens is placed rotates to adjust the position of the lens.
本步骤208中,在对镜片所处的位置进行调整的过程中,处理装置12可以每间隔设定时间段获取激光干涉仪13输出的第一条纹图像,并在激光干涉仪13输出的第一条纹图像为图5所示的第一条纹图像4的情况下,即,第一条纹图像中的条纹数量小于或等于设定条纹数量的情况下,表明镜片所处的位置已经调整至最佳测量位置。In this step 208, during the process of adjusting the position of the lens, the processing device 12 can obtain the first fringe image output by the laser interferometer 13 at every set time period, and obtain the first fringe image output by the laser interferometer 13 after the first fringe image output by the laser interferometer 13. When the fringe image is the first fringe image 4 shown in Figure 5, that is, when the number of fringes in the first fringe image is less than or equal to the set number of fringes, it indicates that the position of the lens has been adjusted to the optimal measurement. Location.
步骤209,在镜片所处的位置为最佳测量位置的情况下,激光干涉仪13对镜片进行测量,获得镜片的平面度。Step 209: When the position of the lens is the optimal measurement position, the laser interferometer 13 measures the lens to obtain the flatness of the lens.
步骤210,处理装置12存储该镜片的平面度。Step 210, the processing device 12 stores the flatness of the lens.
根据本例子,其能够将镜片自动调整至最佳测量位置后,由激光干涉仪对镜片进行测量,无需人工干预,且保证了测量准确性。According to this example, it can automatically adjust the lens to the optimal measurement position, and then measure the lens with a laser interferometer without manual intervention and ensuring measurement accuracy.
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示意性实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本申请的至少一个实施例或示例中。在本说明书中,对上述术语的示意性表述不一定指的是相同的实施例或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施例或示例中以合适的方式结合。In the description of this specification, reference to the description of the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" or the like is intended to be in conjunction with the implementation. An example or example describes a specific feature, structure, material, or characteristic that is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
尽管已经示出和描述了本申请的实施例,本领域的普通技术人员可以理解:在不脱离本申请的原理和宗旨的情况下可以对这些实施例进行多种变化、修改、替换和变型,本申请的范围由权利要求及其等同物限定。Although the embodiments of the present application have been shown and described, those of ordinary skill in the art will understand that various changes, modifications, substitutions and modifications can be made to these embodiments without departing from the principles and purposes of the present application. The scope of the application is defined by the claims and their equivalents.
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