CN117652696A - Comprehensive test bench comparison test method and device, electronic equipment and storage medium - Google Patents

Abstract

The disclosure relates to a comprehensive test bench comparison test method, a comprehensive test bench comparison test device, electronic equipment and a storage medium. Wherein the method comprises the following steps: calibrating the comprehensive test bench based on a preset calibration standard; based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values; and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value. The method and the system can reduce the number of manual measurement per calibration, reduce the influence of abnormal data and manual data input on the evaluation result, and comprehensively evaluate each comprehensive test bench through En values and errors.

Description

Comprehensive test bench comparison test methods, devices, electronic equipment and storage media

Technical field

The present disclosure relates to the field of cigarette testing equipment testing, specifically, to comprehensive test bench comparison testing methods, devices, electronic equipment and storage media.

Background technique

To measure the physical properties of cigarettes and filter rods, a comprehensive test bench is mainly used for detection and statistical analysis (mean, standard deviation, maximum value, minimum value, CPK, etc.). Due to the equipment manufacturer, equipment model, standard rod accuracy, and subjective error and other differences, the stability of the quality indicators of each comprehensive test bench is different. The factory faces China Tobacco Yunnan random inspection, group cross-inspection, technical supervision department factory inspection, process quality department process supervision and inspection, workshop process control inspection, among which the technical supervision department and Yunnan China Tobacco Technology Center, process quality department and technical supervision department, roll packaging The workshop and the process quality department are compared with the comprehensive test bench. Since the measurement data of the physical properties of cigarettes and filter rods from the technical supervision department and the process quality department are used as external statistical data sources, they are also the basis for various special awards to the wrapping workshop. Data, such as absolute offset of physical indicators, comprehensive process score achievement award, process precision control level award, etc.

Therefore, it is an important responsibility of process quality management personnel to ensure that the indication error of the comprehensive test bench in the roll wrapping workshop and the comprehensive test bench in the process quality department and technical supervision department meets the control standards, and to guide the calibration of the comprehensive test bench in the workshop, to avoid normal workshop testing data and random inspections. Paradoxical phenomena of data anomalies.

Among the existing technologies, factories currently mainly use the cigarette and filter rod measuring tool comparison method and the traceability rod measuring tool comparison method. The measuring tool comparison method requires the technical supervision department to conduct stability verification of the cigarettes and filter rods, and then distribute them to the process quality department for verification. For comparison, if the error of the detection unit (mass, suction resistance (pressure drop), circumference, etc.) is within the specified control standards, the workshop will compare with the process quality department. Otherwise, the process quality department needs to calibrate again until the control index requirements are met. . Since the stability of the measuring tool is random and even occasionally outliers appear, which affects the measurement results, we can only evaluate that each comprehensive test bench meets the control standards, and cannot guide the workshop to perform micro-calibration of the comprehensive test bench. The traceability rod measuring tool comparison method uses 15 high rods and 15 low rods each according to the different numbers on each rod, and measures them in sequence, and determines whether the control standards are met through the range. Through comparison with traceable measuring tools, the stability of each comprehensive test bench and the fluctuation of indication error can be clearly analyzed. However, each rod is relatively expensive and requires 30 measurements each time. If one of the rods continues to be abnormal, it may be compared. Test evaluation makes an impact.

Therefore, one or more methods are needed to solve the above problems.

It should be noted that the information disclosed in the above background section is only used to enhance understanding of the background of the present disclosure, and therefore may include information that does not constitute prior art known to those of ordinary skill in the art.

Contents of the invention

The purpose of the present disclosure is to provide a comprehensive test bench comparison test method, device, electronic equipment and storage medium, thereby overcoming, at least to a certain extent, one or more problems caused by limitations and defects of related technologies.

According to one aspect of the present disclosure, a comprehensive test bench comparison test method is provided, including:

Calibrate the comprehensive test bench based on preset calibration standards;

Based on the calibrated comprehensive test bench, the high-rod traceability rod and the low-rod traceability rod are measured repeatedly for a preset number of times, and measurement data are generated and abnormal values are eliminated;

The En value is calculated based on the preset parameters and measurement data of the high rod traceability rod and the low rod traceability rod, and the comprehensive test bench is compared and tested based on the En value.

In an exemplary embodiment of the present disclosure, the method further includes:

In a standard temperature and humidity environment, after balancing for a preset period of time, the high-rod traceability rod and the low-rod traceability rod are measured repeatedly for a preset number of times based on the calibrated comprehensive test bench to generate measurement data and eliminate outliers.

In an exemplary embodiment of the present disclosure, the method further includes:

In a standard temperature and humidity environment, after balancing for a preset period of time, the high-rod traceability rod and the low-rod traceability rod are measured repeatedly for a preset number of times based on the calibrated comprehensive test bench to generate measurement data;

Based on the Grubbs criterion, outliers are determined and eliminated.

In an exemplary embodiment of the present disclosure, the method further includes:

Based on the Grubbs criterion, outliers are determined and outliers are eliminated and then outliers are determined again. If there are still outliers, the comprehensive test bench is recalibrated.

In an exemplary embodiment of the present disclosure, the method further includes:

Based on the calibrated comprehensive test bench, the Technical Supervision Section conducts repeated measurements of the high-rod traceability rod and low-rod traceability rod a preset number of times, generates measurement data and eliminates outliers;

The process quality department and the wrapping workshop conduct repeated measurements of high-rod traceability rods and low-rod traceability rods for a preset number of times based on the calibrated comprehensive test bench, generate measurement data and eliminate outliers.

In an exemplary embodiment of the present disclosure, the method further includes:

Based on the preset parameters and measurement data of the high rod traceability rod and low rod traceability rod, the En value is calculated as:

Among them: X _comparison - the average measurement value of a single test item on the participating comparison comprehensive test bench,

X _{traceability rod} - the traceability rod measures the average value of a single test item,

U _{traceability rod} - traceability rod expanded uncertainty,

U _Contrast - Contrast expanded uncertainty.

In an exemplary embodiment of the present disclosure, the method further includes:

If the comprehensive test bench │En│≥1.0, timely inspection, maintenance, adjustment, and retesting should be carried out;

If the comprehensive test bench 0.5≤│En│<1.0, the test mean value is compared with the reference value of the superior department, and the test mean value is within the comparison control requirements, then it is determined that the test result error meets the control requirements;

If the comprehensive test bench │En│<0.5, the comprehensive test bench will be calibrated with the mean value of the traceable rods.

In one aspect of the present disclosure, a comprehensive test bench comparison test device is provided, including:

The test bench calibration module is used to calibrate the comprehensive test bench based on the preset calibration standard room;

The measurement data generation module is used to perform a preset number of repeated measurements on the high-rod traceability rod and the low-rod traceability rod based on the calibrated comprehensive test bench, generate measurement data and eliminate outliers;

The comparison test module is used to calculate the En value based on the preset parameters and measurement data of the high-rod traceability rod and the low-rod traceability rod, and perform comparison testing on the comprehensive test bench based on the En value.

In one aspect of the present disclosure, an electronic device is provided, including:

processor; and

A memory, computer-readable instructions are stored on the memory, and when the computer-readable instructions are executed by the processor, the method according to any one of the above is implemented.

In one aspect of the present disclosure, a computer-readable storage medium is provided, a computer program is stored thereon, and when the computer program is executed by a processor, the method according to any one of the above is implemented.

A comprehensive test bench comparison test method in an exemplary embodiment of the present disclosure, the method includes: calibrating the comprehensive test bench based on preset calibration standards; based on the calibrated comprehensive test bench, respectively calibrating the high rod traceability rod, The low-rod traceability rod performs a preset number of repeated measurements to generate measurement data and eliminate outliers; the En value is calculated based on the preset parameters and measurement data of the high-rod traceability rod and the low-rod traceability rod, and the En value is calculated based on the En value Comprehensive test bench comparison testing. This disclosure can reduce the number of manual measurements for each calibration, reduce the impact of abnormal data and manual data entry on the evaluation results, and comprehensively evaluate each comprehensive test bench through the En value and error.

It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only, and do not limit the present disclosure.

Description of drawings

The above and other features and advantages of the present disclosure will become more apparent by describing in detail example embodiments thereof with reference to the accompanying drawings.

Figure 1 shows a flow chart of a comprehensive test bench comparison test method according to an exemplary embodiment of the present disclosure;

Figure 2 shows a logic flow diagram of a comprehensive test bench comparison test method according to an exemplary embodiment of the present disclosure;

Figure 3 shows a schematic block diagram of a comprehensive test bench comparison test device according to an exemplary embodiment of the present disclosure;

Figure 4 schematically shows a block diagram of an electronic device according to an exemplary embodiment of the present disclosure;

FIG. 5 schematically illustrates a computer-readable storage medium according to an exemplary embodiment of the present disclosure.

Detailed ways

Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in various forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concepts of the example embodiments. To those skilled in the art. The same reference numerals in the drawings represent the same or similar parts, and thus their repeated description will be omitted.

Furthermore, the described features, structures or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to provide a thorough understanding of embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or more of the specific details described, or other methods, components, materials, devices, steps, etc. may be employed. In other instances, well-known structures, methods, devices, implementations, materials, or operations have not been shown or described in detail to avoid obscuring aspects of the present disclosure.

The block diagrams shown in the figures are functional entities only and do not necessarily correspond to physically separate entities. That is, these functional entities may be implemented in the form of software, or implemented in one or more software-hardened modules, or part of the functional entities, or in different networks and/or processor devices and/or microcontroller devices. implement these functional entities.

In this example embodiment, a comprehensive test bench comparison test method is first provided; with reference to Figure 1, the comprehensive test bench comparison test method may include the following steps:

Step S110, calibrate the comprehensive test bench based on the preset calibration standard room;

Step S120, based on the calibrated comprehensive test bench, perform a preset number of repeated measurements on the high-rod traceability rod and the low-rod traceability rod respectively, generate measurement data and eliminate outliers;

Step S130: Calculate the En value based on the preset parameters and measurement data of the high rod traceability rod and the low rod traceability rod, and compare and test the comprehensive test bench based on the En value.

A comprehensive test bench comparison test method in an exemplary embodiment of the present disclosure, the method includes: calibrating the comprehensive test bench based on preset calibration standards; based on the calibrated comprehensive test bench, respectively calibrating the high rod traceability rod, The low-rod traceability rod performs a preset number of repeated measurements to generate measurement data and eliminate outliers; the En value is calculated based on the preset parameters and measurement data of the high-rod traceability rod and the low-rod traceability rod, and the En value is calculated based on the En value Comprehensive test bench comparison testing. This disclosure can reduce the number of manual measurements for each calibration, reduce the impact of abnormal data and manual data entry on the evaluation results, and comprehensively evaluate each comprehensive test bench through the En value and error.

Below, a comprehensive test bench comparison test method in this exemplary embodiment will be further described.

Example 1:

In step S110, the comprehensive test bench can be calibrated based on a preset calibration standard room.

In step S120, a preset number of repeated measurements can be performed on the high-rod traceability rod and the low-rod traceability rod based on the calibrated comprehensive test bench to generate measurement data and eliminate outliers.

In this example embodiment, the method further includes:

In a standard temperature and humidity environment, after balancing for a preset period of time, the high-rod traceability rod and the low-rod traceability rod are measured repeatedly for a preset number of times based on the calibrated comprehensive test bench to generate measurement data and eliminate outliers.

In this example embodiment, the method further includes:

In a standard temperature and humidity environment, after balancing for a preset period of time, the high-rod traceability rod and the low-rod traceability rod are measured repeatedly for a preset number of times based on the calibrated comprehensive test bench to generate measurement data;

Based on the Grubbs criterion, outliers are determined and eliminated.

In this example embodiment, the method further includes:

Based on the Grubbs criterion, outliers are determined and outliers are eliminated and then outliers are determined again. If there are still outliers, the comprehensive test bench is recalibrated.

In this example embodiment, the method further includes:

Based on the calibrated comprehensive test bench, the Technical Supervision Section conducts repeated measurements of the high-rod traceability rod and low-rod traceability rod a preset number of times, generates measurement data and eliminates outliers;

The process quality department and the wrapping workshop conduct repeated measurements of high-rod traceability rods and low-rod traceability rods for a preset number of times based on the calibrated comprehensive test bench, generate measurement data and eliminate outliers.

In step S130, the En value can be calculated based on the preset parameters and measurement data of the high rod traceability rod and the low rod traceability rod, and the comprehensive test bench can be compared and tested based on the En value.

In this example embodiment, the method further includes:

Based on the preset parameters and measurement data of the high rod traceability rod and low rod traceability rod, the En value is calculated as:

Among them: X _comparison - the average measurement value of a single test item on the participating comparison comprehensive test bench,

X _{traceability rod} - the traceability rod measures the average value of a single test item,

U _{traceability rod} - traceability rod expanded uncertainty,

U _Contrast - Contrast expanded uncertainty.

In this example embodiment, the method further includes:

If the comprehensive test bench │En│≥1.0, timely inspection, maintenance, adjustment, and retesting should be carried out;

If the comprehensive test bench 0.5≤│En│<1.0, the test mean value is compared with the reference value of the superior department, and the test mean value is within the comparison control requirements, then it is determined that the test result error meets the control requirements;

If the comprehensive test bench │En│<0.5, the comprehensive test bench will be calibrated with the mean value of the traceable rods.

Example 2:

In the embodiment of this example, as shown in Figure 2, the comprehensive test bench comparison test method of the present disclosure mainly includes traceability rods, standard libraries, detection data of each comprehensive test bench, and statistical analysis platforms. The traceability rods are The monitoring comparison rods include 15 high rods and 15 low rods. The standard library contains statistical data of the test results of the 15 rods. The comprehensive test bench test data is distinguished according to the specific IP interface number, and each set of comparison data is numbered. : Department (department) + traceability rod comparison + comprehensive test number + test time. After the retest, the data can be actively uploaded to the statistical analysis platform. The statistical analysis platform calculates and analyzes the data of each test bench and the standard library data. , and draw machine comparison data: average value, maximum value, minimum value.

In the embodiment of this example, the standard library is established: after the technical supervision department and Yunnan China Tobacco Technology Center conduct comparisons every quarter to detect compliance with the control standards, the standard library data is updated every six months: according to the cigarette specifications (China Tobacco Yunnan) , conventional) classification (high stick, low stick), based on the stick number: cigarette specification + classification + number, measure each high stick and low stick 6 times one by one, and use the Grubbs criterion to determine whether there are abnormal values. Does the range meet the stability requirements? If the relevant indicators meet the requirements, the average value of each item is calculated as the reference value, range value, and standard deviation. After 180 measurements, the range is sorted according to the range of each item. The smaller the range value. , the further forward, the better the stability. Then the test items of each traceability rod are calculated according to the weighted formula: extremely poor suction resistance*1+extremely poor quality

*0.2+circumferential range*0.5+length range*0.2+total ventilation rate*02, the weighted results are sorted, the lower the score, the higher the ranking.

In this example embodiment, the logic flow includes:

1. Comprehensive test bench calibration: The department and workshop comprehensive test benches use the calibration standard parts (standard rods) of each comprehensive test bench to perform comprehensive test bench calibration. When the comprehensive test bench calibration control requirements are met, the comparison process will be entered. Otherwise, it is necessary to Recalibration.

2. Comparison test:

a. The technical supervision department selects a certain high rod or low rod traceability rod, equilibrates it in a standard temperature and humidity environment (15-20) minutes, selects the filter rod number and the number of repeated measurements (usually 5 times) on the comprehensive test bench, and the measurement is completed. Finally, the comprehensive test bench transmits data to the statistical analysis and evaluation through the MES data acquisition program. The comprehensive test bench first performs outlier determination G(a,n) (Note: Grubbs criterion). If there are outliers, the outlier single values are eliminated. Carry out the second round of abnormal value judgment. If there is no abnormality in the second round, calculate whether it meets the comparison control requirements. If there are still abnormal values in the second round, terminate the technical supervision section comprehensive test bench comparison test and perform a recalibration process.

b. After the technical supervision department meets the comparison control requirements, the process quality department and the comprehensive test bench of the wrapping workshop will follow the same steps as the technical supervision department.

c. The statistical analysis platform forms a line chart based on the test data of the department and the wrapping workshop and measures the items in the order of measurement. The deleted abnormal single value data retains the order of measurement.

Through statistical analysis of En value (based on the requirement of 95% confidence level):

Among them: X _comparison - the average measurement value of a single test item on the participating comparison comprehensive test bench,

X _{traceability rod} - the traceability rod measures the average value of a single test item,

U _{traceability rod} - traceability rod expanded uncertainty,

U _Contrast - Contrast expanded uncertainty.

If the comprehensive test bench │En│≥1.0, timely inspection, maintenance, adjustment, and retesting should be carried out;

If the comprehensive test bench 0.5≤│En│<1.0, the test mean value is compared with the reference value of the superior department, and the test mean value is within the comparison control requirements, then it is determined that the test result error meets the control requirements;

If the comprehensive test bench │En│<0.5, the comprehensive test bench will be calibrated with the mean value of the traceable rods.

In the embodiment of this example, through the comprehensive test bench comparison test, the number of traceability rod tests and the probability of abnormal values that may affect the measurement results are reduced, and the stability of a certain comprehensive test bench can be quantitatively analyzed to form a traceability rod pair. All comprehensive test benches, instead of the technical supervision department-process quality department-workshop, reduce the increase in uncertainty in the standard transfer process.

It should be noted that although the various steps of the method in the present disclosure are described in a specific order in the drawings, this does not require or imply that these steps must be performed in this specific order, or that all of the steps shown must be performed. Achieve desired results. Additionally or alternatively, certain steps may be omitted, multiple steps may be combined into one step for execution, and/or one step may be decomposed into multiple steps for execution, etc.

In addition, in this example embodiment, a comprehensive test bench comparison test device is also provided. Referring to FIG. 3 , the comprehensive test bench comparison and testing device 400 may include: a test bench calibration module 410 , a measurement data generation module 420 and a comparison test module 430 . in:

The test bench calibration module 410 is used to calibrate the comprehensive test bench based on the preset calibration standard room;

The measurement data generation module 420 is used to perform a preset number of repeated measurements on the high-rod traceability rod and the low-rod traceability rod based on the calibrated comprehensive test bench, generate measurement data and eliminate outliers;

The comparison test module 430 is used to calculate the En value based on the preset parameters and measurement data of the high rod traceability rod and the low rod traceability rod, and conduct a comparison test on the comprehensive test bench based on the En value.

The specific details of each of the above comprehensive test bench comparison test device modules have been described in detail in the corresponding comprehensive test bench comparison test method, so they will not be described again here.

It should be noted that although several modules or units of a comprehensive test bench comparison test device 400 are mentioned in the above detailed description, this division is not mandatory. In fact, according to embodiments of the present disclosure, the features and functions of two or more modules or units described above may be embodied in one module or unit. Conversely, the features and functions of one module or unit described above may be further divided into being embodied by multiple modules or units.

Furthermore, in an exemplary embodiment of the present disclosure, an electronic device capable of implementing the above method is also provided.

Those skilled in the art will understand that various aspects of the present invention may be implemented as systems, methods or program products. Therefore, various aspects of the present invention may be embodied in the following forms, namely: complete hardware embodiments, complete software embodiments (including firmware, microcode, etc.), or embodiments combining hardware and software aspects, which may be collectively referred to herein as "Circuit", "Module" or "System".

An electronic device 500 according to such an embodiment of the invention is described below with reference to FIG. 4 . The electronic device 500 shown in FIG. 4 is only an example and should not impose any limitations on the functions and usage scope of the embodiments of the present invention.

As shown in Figure 4, electronic device 500 is embodied in the form of a general-purpose computing device. The components of the electronic device 500 may include, but are not limited to: the above-mentioned at least one processing unit 510, the above-mentioned at least one storage unit 520, a bus 530 connecting different system components (including the storage unit 520 and the processing unit 510), and the display unit 540.

Wherein, the storage unit stores program code, and the program code can be executed by the processing unit 510, so that the processing unit 510 performs various exemplary methods according to the present invention described in the above-mentioned "Example Method" section of this specification. Example steps. For example, the processing unit 510 may perform steps S110 to S130 as shown in FIG. 1 .

The storage unit 520 may include a readable medium in the form of a volatile storage unit, such as a random access storage unit (RAM) 5201 and/or a cache storage unit 5202, and may further include a read-only storage unit (ROM) 5203.

Storage unit 520 may also include a program/utility 5204 having a set of (at least one) program modules 5205 including, but not limited to: an operating system, one or more application programs, other program modules, and program data, Each of these examples, or some combination, may include the implementation of a network environment.

Bus 530 may be a local area representing one or more of several types of bus structures, including a memory unit bus or memory unit controller, a peripheral bus, a graphics acceleration port, a processing unit, or using any of a variety of bus structures. bus.

Electronic device 500 may also communicate with one or more external devices 570 (e.g., keyboard, pointing device, Bluetooth device, etc.), may also communicate with one or more devices that enable a user to interact with electronic device 500, and/or with Any device that enables the electronic device 500 to communicate with one or more other computing devices (eg, router, modem, etc.). This communication may occur through input/output (I/O) interface 550. Furthermore, the electronic device 500 may also communicate with one or more networks (eg, a local area network (LAN), a wide area network (WAN), and/or a public network, such as the Internet) through the network adapter 560. As shown, network adapter 560 communicates with other modules of electronic device 500 via bus 530. It should be understood that, although not shown in the figures, other hardware and/or software modules may be used in conjunction with electronic device 500, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives And data backup storage system, etc.

Through the description of the above embodiments, those skilled in the art can easily understand that the example embodiments described here can be implemented by software, or can be implemented by software combined with necessary hardware. Therefore, the technical solution according to the embodiment of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, U disk, mobile hard disk, etc.) or on the network , including several instructions to cause a computing device (which may be a personal computer, a server, a terminal device, a network device, etc.) to execute a method according to an embodiment of the present disclosure.

In an exemplary embodiment of the present disclosure, a computer-readable storage medium is also provided, on which a program product capable of implementing the method described above in this specification is stored. In some possible embodiments, various aspects of the present invention can also be implemented in the form of a program product, which includes program code. When the program product is run on a terminal device, the program code is used to cause the The terminal device performs the steps according to various exemplary embodiments of the present invention described in the "Exemplary Method" section above in this specification.

Referring to FIG. 5 , a program product 600 for implementing the above method according to an embodiment of the present invention is described, which can adopt a portable compact disk read-only memory (CD-ROM) and include program code, and can be used on a terminal device, For example, run on a personal computer. However, the program product of the present invention is not limited thereto. In this document, a readable storage medium may be any tangible medium containing or storing a program that may be used by or in combination with an instruction execution system, apparatus or device.

The program product may take the form of any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination thereof. More specific examples (non-exhaustive list) of readable storage media include: electrical connection with one or more conductors, portable disk, hard disk, random access memory (RAM), read only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the above.

A computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave carrying readable program code therein. Such propagated data signals may take many forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. A readable signal medium may also be any readable medium other than a readable storage medium that can send, propagate, or transport the program for use by or in connection with an instruction execution system, apparatus, or device.

Program code embodied on a readable medium may be transmitted using any suitable medium, including but not limited to wireless, wireline, optical cable, RF, etc., or any suitable combination of the foregoing.

Program code for performing the operations of the present invention may be written in any combination of one or more programming languages, including object-oriented programming languages such as Java, C++, etc., as well as conventional procedural Programming language—such as "C" or a similar programming language. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server execute on. In situations involving remote computing devices, the remote computing device may be connected to the user computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device, such as provided by an Internet service. (business comes via Internet connection).

Furthermore, the above-mentioned drawings are only schematic illustrations of processes included in methods according to exemplary embodiments of the present invention, and are not intended to be limiting. It is readily understood that the processes shown in the above figures do not indicate or limit the temporal sequence of these processes. In addition, it is also easy to understand that these processes may be executed synchronously or asynchronously in multiple modules, for example.

Other embodiments of the disclosure will be readily apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure that follow the general principles of the disclosure and include common knowledge or customary technical means in the technical field that are not disclosed in the disclosure. . It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.

It is to be understood that the present disclosure is not limited to the precise structures described above and illustrated in the accompanying drawings, and various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims (10)

1. The comprehensive test bench comparison test method is characterized by comprising the following steps:

calibrating the comprehensive test bench based on a preset calibration standard;

based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values;

and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.

2. The integrated test bench alignment test method of claim 1, wherein the method further comprises:

and (3) in a standard temperature and humidity environment, after balancing for a preset time period, respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values.

3. The integrated test bench alignment test method of claim 2, wherein the method further comprises:

in a standard temperature and humidity environment, after balancing for a preset period of time, respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench to generate measurement data;

and judging the abnormal value based on the Grabbs criterion and eliminating the abnormal value.

4. The integrated test bench alignment test method of claim 3, wherein the method further comprises:

and carrying out outlier judgment based on the Grabbs criterion, removing outliers, carrying out outlier judgment again, and if outliers still exist, carrying out recalibration on the comprehensive test table.

5. The integrated test bench alignment test method of claim 2, wherein the method further comprises:

the technical supervision department carries out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench respectively, generates measurement data and eliminates abnormal values;

and (3) respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench in the process quality department and the wrapping workshop, generating measurement data and eliminating abnormal values.

6. The integrated test bench alignment test method of claim 1, wherein the method further comprises:

and calculating an En value based on preset parameters and measured data of the high rod tracing rod and the low rod tracing rod, wherein the En value is as follows:

wherein: x is X _Comparison The mean of the measured values of the individual test items of the test-bed involved in the comparison,

X _{tracing rod} The tracing bar determines the mean value of the individual test items,

U _{tracing rod} The trace-out wand expands the uncertainty,

U _comparison -contrast spread uncertainty.

7. The integrated test bench alignment test method of claim 6, wherein the method further comprises:

if the comprehensive test bench I and En I are not less than 1.0, checking maintenance, adjusting and retesting in time;

if the comprehensive test bench is not more than 0.5-En-is not more than 1.0, the test average value is within the comparison control requirement with the reference value of the upper department, and the test result error is judged to meet the control requirement;

if the integrated test bench I < En I <0.5, the integrated test bench is calibrated with the trace-source bar average.

8. An integrated test stand comparison test device, the device comprising:

the test bench calibration module is used for calibrating the comprehensive test bench based on a preset calibration standard;

the measurement data generation module is used for respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values;

and the comparison test module is used for calculating an En value based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.

9. An electronic device, comprising

A processor; and

a memory having stored thereon computer readable instructions which, when executed by the processor, implement the method according to any of claims 1 to 7.

10. A computer-readable storage medium, characterized in that a computer program is stored thereon, which computer program, when being executed by a processor, implements the method according to any of claims 1 to 7.