CN117631060B - Non-contact measurement and calculation method and system for ultra-low resistivity - Google Patents
Non-contact measurement and calculation method and system for ultra-low resistivity Download PDFInfo
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Abstract
本发明公开了一种超低电阻率的无接触式测量计算方法，包括确定已知电阻率的测试材料；采用测试材料制备标准规格形状的测试标本；在环境电磁干扰小于设定阈值的条件下测量并记录环境和测量仪器噪声；测量制备的测试标本的涡流二次垂直磁场响应；选定信号窗口；计算测试标本的涡流二次垂直磁场响应曲线在信号窗口内的面积值；拟合面积值与测试材料的电阻率之间的数学表达式并得到电阻率计算式；采用电阻率计算式直接计算得到待测试目标材料的电阻率，完成超低电阻率的无接触式测量计算。本发明还公开了一种实现所述超低电阻率的无接触式测量计算方法的系统。本发明克服了常规标本电阻率由于接触式测量所带来的缺点，可靠性更高，精确性更好。
The present invention discloses a non-contact measurement and calculation method for ultra-low resistivity, including determining a test material of known resistivity; using the test material to prepare a test specimen of standard specification and shape; measuring and recording the environmental and measuring instrument noise under the condition that the environmental electromagnetic interference is less than a set threshold; measuring the eddy current secondary vertical magnetic field response of the prepared test specimen; selecting a signal window; calculating the area value of the eddy current secondary vertical magnetic field response curve of the test specimen within the signal window; fitting the mathematical expression between the area value and the resistivity of the test material and obtaining a resistivity calculation formula; using the resistivity calculation formula to directly calculate the resistivity of the target material to be tested, and completing the non-contact measurement and calculation of ultra-low resistivity. The present invention also discloses a system for realizing the non-contact measurement and calculation method for ultra-low resistivity. The present invention overcomes the shortcomings of conventional specimen resistivity due to contact measurement, and has higher reliability and better accuracy.
Description
Technical Field
The invention belongs to the field of geological exploration, and particularly relates to a non-contact measurement calculation method and system for ultralow resistivity.
Background
The equivalent inverse magnetic flux transient electromagnetic method (Opposing-coils transient electromagnetic method, OCTEM for short) adopts an inductive excitation mode, so that a primary changing electromagnetic field is emitted into the ground without a grounding loop, and a receiving coil receives a secondary changing electromagnetic field generated by the underground vortex. The method adopts an upper coil and a lower coil which are the same in size and parallel and coaxial, currents with the same size and opposite directions are respectively led to the coils as emission sources, an underground secondary field is received on a plane of zero magnetic flux of a primary field synthesized by a double-coil source, and a pure secondary field coupled to the ground center is measured. Because the receiving coil is positioned on the equivalent anti-magnetic flux plane of the double transmitting coils, the primary field magnetic flux is always zero, when the transmitting current is turned off, the magnetic fluxes generated by the upper coil and the lower coil are mutually counteracted, the primary field magnetic flux of the receiving coil is zero, which is equivalent to eliminating the dead zone of the conventional transient electromagnetic method, and the attenuation rule of the early secondary field along with time can be received, so that the ground electric information of the shallow underground medium is obtained. Unlike conventional transient electromagnetic method, which adopts single coil transmission and single coil receiving mode, the equivalent inverse magnetic flux transient electromagnetic method adopts double coil transmission, single coil receiving and certain space structure, eliminates mutual inductance effect between receiving and transmitting coils, and is a new transient electromagnetic detection method for measuring pure secondary electromagnetic field coupled in ground, and can also be used for measuring transient electromagnetic response of ultralow resistivity specimen.
There are many measuring methods of the resistivity of the specimen, so that the measuring method of the resistivity of the specimen is divided into contact type measurement and non-contact type measurement by whether the measuring electrode is contacted with the specimen or not when the resistivity of the specimen is measured. The contact-type measuring method comprises a bridge method, a volt-ampere method, a diode method, a quadrupole method, a four-probe method and the like, and the non-contact-type measuring method comprises an eddy current method, a plasma resonance infrared method, a microwave scanning microscope probe testing method and the like.
However, in both the contact measurement method and the noncontact measurement method, there are problems that the measurement accuracy is not high and the measurement reliability is poor when the resistivity of the ultralow resistivity sample is measured.
Disclosure of Invention
One of the purposes of the invention is to provide a non-contact measurement calculation method of ultralow resistivity, which has high reliability and good accuracy.
It is a second object of the present invention to provide a system for implementing the method for calculating a contactless measurement of an ultra-low resistivity.
The invention provides a non-contact measurement calculation method of ultralow resistivity, which comprises the following steps:
s1, determining a test material with known resistivity;
s2, preparing a test specimen in a standard specification shape by adopting a test material;
S3, under the condition that the environmental electromagnetic interference is smaller than a set threshold value, measuring and recording the noise of the environment and a measuring instrument;
s4, measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2;
S5, selecting a signal window;
s6, calculating the area value of the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 in the signal window selected in the step S5 by adopting a mathematical integration summation method;
s7, adopting a mathematical fitting method, and obtaining a mathematical expression between the area value and the resistivity of the test material in the fitting step S6 to obtain a resistivity calculation formula;
S8, directly calculating the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step S7, and completing the non-contact measurement calculation of the ultralow resistivity.
The test material for determining the known resistivity in the step S1 specifically includes the following steps:
The determined test materials of known resistivity include aluminum, iron and copper.
The step S2 of preparing a test specimen with a standard specification shape by using a test material specifically comprises the following steps:
Test specimens of standard specification shape are prepared by adopting a test material, wherein the standard specification shape is cuboid of 30 multiplied by 15 mm.
Under the condition that the environmental electromagnetic interference is smaller than the set threshold, the noise of the environment and the measuring instrument is measured and recorded in the step S3, and the method specifically comprises the following steps:
And under the condition that the environmental electromagnetic interference is smaller than a set threshold value, measuring and recording the environmental and measuring instrument noise by adopting a transient electromagnetic system.
The step S4 of measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2 specifically comprises the following steps:
measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2 by adopting a transient electromagnetic system;
when in measurement, the antenna is horizontally placed on the specimen, the distance between the antenna and the host computer of the transient electromagnetic system is more than 4m and as far as possible, the distance between the antenna and the operating computer of the transient electromagnetic system is more than 5m, the distance between the operating computer and the host computer in a horizontal through state is not more than 30m, the test site is as far as possible from the tester and other animals, and the transmission cable of the transient electromagnetic system is not wound or coiled;
Subtracting the noise of the environment and the measuring instrument obtained by measuring in the step S3 from the measured data, and performing data fitting to obtain an eddy current secondary vertical magnetic field response curve of the test specimen;
the selected signal window in step S5 specifically includes the following steps:
In an eddy current secondary vertical magnetic field response curve graph of a test specimen, a signal window is composed of a first ray and a second ray which take an origin as an endpoint and are positioned in a first quadrant of a coordinate axis, wherein an included angle between the first ray and the positive direction of an X axis is 30 degrees, and an included angle between the second ray and the positive direction of the X axis is 75 degrees.
The mathematical integration and summation method adopted in the step S6 is used for calculating the area value of the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 in the signal window selected in the step S5, and specifically comprises the following steps:
The area surrounded by the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 and the signal window selected in the step S5 is the area to be calculated;
The area value S to be calculated is calculated using the following equation:
wherein X 1 is the abscissa value of the intersection point of the first ray and the eddy current secondary vertical magnetic field response curve of the test specimen, X 2 is the abscissa value of the intersection point of the second ray and the eddy current secondary vertical magnetic field response curve of the test specimen, and f (X) is a functional expression of the eddy current secondary vertical magnetic field response curve of the test specimen.
The mathematical fitting method is adopted in the step S7, and the mathematical expression between the area value and the resistivity of the test material is obtained in the fitting step S6, so as to obtain a resistivity calculation formula, which specifically comprises the following steps:
Adopting a mathematical fitting method, taking a Gaussian function as a basic function, and obtaining a mathematical expression between an area value and the resistivity of the test material in a fitting step S6;
Finally, the fitting yields the following resistivity calculations:
Where f ρ is the resistivity calculated by fitting.
The resistivity calculation formula obtained in the step S7 is adopted in the step S8, and the resistivity of the target material to be tested is directly calculated, which specifically includes the following steps:
determining a target material to be tested;
Taking a target material to be tested as a test material;
calculating to obtain an area value of the target material to be tested by adopting the steps S2-S6;
And (3) according to the obtained area value, calculating to obtain the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step (S7).
The invention also provides a system for realizing the non-contact measurement calculation method of the ultralow resistivity, which comprises a material determining module, a specimen preparation module, a noise measuring module, a response measuring module, a window selecting module, an area calculating module, a resistivity fitting module and a resistivity calculating module, wherein the material determining module, the specimen preparation module, the noise measuring module, the response measuring module, the window selecting module, the area calculating module, the resistivity fitting module and the resistivity calculating module are sequentially connected in series, the material determining module is used for determining test materials with known resistivity and uploading data information to the specimen preparation module, the specimen preparation module is used for preparing test specimens with standard specification shapes according to received data information, adopting the test materials and uploading the data information to the noise measuring module, the noise measuring module is used for measuring and recording noises of the environment and the measuring instruments under the condition that the environmental electromagnetic interference is smaller than a set threshold and uploading the data information to the response measuring module, the response measuring module is used for measuring eddy current secondary vertical magnetic field responses of the prepared test specimens according to the received data information and uploading the window selecting module, the window selecting module is used for determining test materials with known resistivity and uploading the data information to the sample preparation module, the sample preparation module is used for obtaining the data information according to the received signal of the data information, the window selecting module is used for calculating the area of the data fitting curve, the data fitting module is used for calculating the area of the selected curve according to the received data information, the data fitting signal is used for calculating the area of the data fitting curve, the selected signal is used for obtaining the mathematical fitting information, and the resistivity calculation module is used for directly calculating the resistivity of the target material to be tested by adopting the obtained resistivity calculation formula according to the received data information, so as to complete the non-contact measurement calculation of the ultralow resistivity.
The non-contact measurement calculation method and system for the ultralow resistivity provided by the invention are based on an equivalent anti-magnetic flux transient electromagnetic method, an approximation function between the specimen area and the specimen resistivity is obtained by utilizing a mathematical method, and the resistivity of the material is calculated according to the function, so that the non-contact measurement calculation for the ultralow resistivity can be realized, the defect caused by contact measurement for the conventional specimen resistivity is overcome, the reliability is higher, and the accuracy is better.
Drawings
FIG. 1 is a schematic flow chart of the method of the present invention.
Fig. 2 is a schematic diagram of environmental noise collected by a transient electromagnetic system in the method of the present invention.
FIG. 3 is a schematic diagram of data acquisition of copper specimens in the method of the present invention.
FIG. 4 is a schematic diagram of data acquisition of iron specimens in the method of the present invention.
FIG. 5 is a schematic diagram of data collection of an aluminum specimen in the method of the present invention.
FIG. 6 is a graph showing the response curve of a copper specimen and the signal window in the method of the present invention.
FIG. 7 is a graph showing the response curve and signal window of an iron sample in the method of the present invention.
FIG. 8 is a graph showing the response curve of an aluminum specimen and the signal window in the method of the present invention.
FIG. 9 is a graph showing the area versus resistivity curve fit in the method of the present invention.
FIG. 10 is a schematic diagram of data acquisition of a first alloy in an embodiment of the method of the present invention.
FIG. 11 is a schematic diagram of data acquisition of a second alloy in an embodiment of the method of the present invention.
FIG. 12 is a graph showing the response curve and the area to be calculated for the first alloy in an embodiment of the method of the present invention.
FIG. 13 is a graph showing the response curve and the area to be calculated for the second alloy in an embodiment of the method of the present invention.
FIG. 14 is a graph showing the relationship between the resistivity of the first alloy and the resistivity of the second alloy measured by the conventional method and the approximation curve of the resistivity of the method according to the present invention.
Fig. 15 is a schematic diagram of functional modules of the system of the present invention.
Detailed Description
The method flow diagram of the method of the invention is shown in fig. 1, the method for calculating the non-contact measurement of the ultralow resistivity comprises the following steps:
S1, determining a test material with known resistivity, wherein the method specifically comprises the following steps:
The determined test materials with known resistivity comprise copper, iron and aluminum, and the corresponding resistivity at normal temperature (20 ℃) is 1.7X -8Ω·m、10×10-8 Ω & m and 2.82X -8 Ω & m respectively;
S2, preparing a test specimen with a standard specification shape by adopting a test material, wherein the method specifically comprises the following steps:
preparing a test specimen with a standard specification shape by adopting a test material, wherein the standard specification shape is a cuboid with the size of 30 multiplied by 15 mm;
s3, under the condition that the environmental electromagnetic interference is smaller than a set threshold, measuring and recording noise of the environment and a measuring instrument, wherein the method specifically comprises the following steps:
under the condition that the environmental electromagnetic interference is smaller than a set threshold value, measuring and recording noise of the environment and a measuring instrument by adopting a transient electromagnetic system;
As shown in fig. 2, which shows the noise of the environment and the instrument collected by the high-precision transient electromagnetic system, it can be seen that the sending current is 3.3A, the off is 12.0 μs, the collected noise data points are relatively scattered, and the response amplitude is continuously reduced with the increase of time;
S4, measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2, wherein the method specifically comprises the following steps:
measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2 by adopting a transient electromagnetic system;
During measurement, the antenna is horizontally placed on a specimen so as to ensure the effectiveness of data, the distance between the antenna and a host computer of the transient electromagnetic system is larger than 4m, and the situation that a connecting line is long enough is ensured, the distance between the antenna and an operating computer of the transient electromagnetic system is larger than 5m, so that the interference of PC on the data is avoided, the distance between the operating computer and the host computer in a horizontal viewing state is not more than 30m, and a test site is as far as possible from the antenna by a tester and other animals, and a transmission cable of the transient electromagnetic system is not wound or coiled;
subtracting the measured data from the environmental and measuring instrument noise obtained in the step S3, and performing data fitting (preferably cubic spline interpolation fitting) to obtain an eddy current secondary vertical magnetic field response curve of the test specimen, wherein the data is shown in FIG. 3, the data is shown in FIG. 4, and the data is shown in FIG. 5;
s5, selecting a signal window, wherein the method specifically comprises the following steps of:
In an eddy current secondary vertical magnetic field response curve graph of a test specimen, a signal window is a first ray and a second ray which take an origin as an endpoint and are positioned in a first quadrant of a coordinate axis, wherein an included angle between the first ray and the positive direction of an X axis is 30 degrees, and an included angle between the second ray and the positive direction of the X axis is 75 degrees;
S6, calculating the area value of the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 in the signal window selected in the step S5 by adopting a mathematical integration summation method, wherein the method specifically comprises the following steps:
The area surrounded by the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 and the signal window selected in the step S5 is the area to be calculated;
The area value S to be calculated is calculated using the following equation:
Wherein X 1 is the abscissa value of the intersection point of the first ray and the eddy current secondary vertical magnetic field response curve of the test specimen, X 2 is the abscissa value of the intersection point of the second ray and the eddy current secondary vertical magnetic field response curve of the test specimen, f (X) is a functional expression of the eddy current secondary vertical magnetic field response curve of the test specimen;
Fig. 6 is a schematic diagram of a copper (Cu) specimen response curve and an area to be calculated, fig. 7 is a schematic diagram of an iron (Fe) specimen response curve and an area to be calculated, and fig. 8 is a schematic diagram of an aluminum (Al) specimen response curve and an area to be calculated;
s7, adopting a mathematical fitting method, and obtaining a mathematical expression between the area value and the resistivity of the test material in the fitting step S6 to obtain a resistivity calculation formula, wherein the method specifically comprises the following steps:
FIG. 9 is a schematic diagram of an approximation curve of area and resistivity, wherein a mathematical fitting method is adopted, a Gaussian function is used as a basis function, and a mathematical expression between an area value and the resistivity of a test material is obtained in a fitting step S6;
Finally, the fitting yields the following resistivity calculations:
wherein f ρ is the resistivity obtained by fitting calculation;
S8, directly calculating the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step S7 to finish the non-contact measurement calculation of the ultralow resistivity, and specifically comprising the following steps:
determining a target material to be tested;
Taking a target material to be tested as a test material;
calculating to obtain an area value of the target material to be tested by adopting the steps S2-S6;
And (3) according to the obtained area value, calculating to obtain the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step (S7).
The effect of the method of the invention is further illustrated in the following in connection with one example:
Randomly selecting the existing first alloy and second alloy, wherein the resistivity of the first alloy is 11.95X10 -8 Ω & m, and the resistivity of the second alloy is 6.90X10 -8 Ω & m;
then, by adopting the method, a data acquisition diagram of the first alloy is shown in fig. 10, and a data acquisition diagram of the second alloy is shown in fig. 11;
Next, by adopting the method of the invention, a response curve of the first alloy and an area to be calculated are measured and shown in fig. 12, and a response curve of the second alloy and an area to be calculated are measured and shown in fig. 13;
Finally, the relation between the resistivity of the first alloy and the resistivity of the second alloy measured by the prior method and the approximation curve of the resistivity obtained by the method is shown in figure 14, and as can be seen from figure 14, the resistivity measured by the prior method is very consistent with the approximation curve of the resistivity of the method, which shows that the method has better reliability and accuracy.
Finally, through calculation, SSE (sum of squares error) index of the method is 5.223 X10: 10 -6,R2 (determination coefficient) index is 1, modified R 2 index is 1, RMSE (root mean square error) index is 0.001616, and the method has better reliability and accuracy.
The system for realizing the non-contact measurement calculation method of the ultralow resistivity is shown in fig. 15, and comprises a material determining module, a specimen preparation module, a noise measuring module, a response measuring module, a window selection module, an area calculating module, a resistivity fitting module and a resistivity calculating module, wherein the material determining module, the specimen preparation module, the noise measuring module, the response measuring module, the window selection module, the area calculating module, the resistivity fitting module and the resistivity calculating module are sequentially connected in series, the material determining module is used for determining test materials with known resistivity and uploading data information to the specimen preparation module, the specimen preparation module is used for preparing test specimens with standard specification shapes according to the received data information, and uploading the data information to the noise measuring module, the noise measuring module is used for measuring and recording environmental and measuring instrument noise under the condition that the environmental electromagnetic interference is smaller than a set threshold value, and uploading the data information to the response measuring module, the response measuring module is used for measuring the eddy current secondary vertical response of the prepared test specimens according to the received data information, and uploading the data information to the window selection module is used for calculating the area of the window selection signal according to the received data information, the sample preparation module is used for calculating the selected area of the window of the selected signal, the eddy current is used for calculating the window area of the selected signal according to the received data information, the method comprises the steps of receiving data information, uploading the data information to a resistivity fitting module, using a mathematical fitting method to obtain a mathematical expression between an area value and the resistivity of a test material by fitting according to the received data information to obtain a resistivity calculation formula, uploading the data information to the resistivity calculation module, and using the obtained resistivity calculation formula to directly calculate the resistivity of the target material to be tested according to the received data information to complete the non-contact measurement calculation of the ultralow resistivity.
Claims (9)
1. A non-contact measurement calculation method of ultralow resistivity comprises the following steps:
s1, determining a test material with known resistivity;
s2, preparing a test specimen in a standard specification shape by adopting a test material;
S3, under the condition that the environmental electromagnetic interference is smaller than a set threshold value, measuring and recording the noise of the environment and a measuring instrument;
s4, measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2;
s5, selecting a signal window, wherein the method specifically comprises the following steps of:
selecting a first ray and a second ray which take an origin as an endpoint and are positioned in a first quadrant of a coordinate axis as a signal window in an eddy current secondary vertical magnetic field response curve graph of a test specimen, wherein an included angle between the first ray and the positive direction of an X axis is 30 degrees, and an included angle between the second ray and the positive direction of the X axis is 75 degrees;
s6, calculating the area value of the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 in the signal window selected in the step S5 by adopting a mathematical integration summation method;
S7, fitting a mathematical expression between the area value obtained in the step S6 and the resistivity of the test material by adopting a mathematical fitting method to obtain a resistivity calculation formula;
S8, directly calculating the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step S7, and completing the non-contact measurement calculation of the ultralow resistivity.
2. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 1, wherein the step S1 of determining the test material with the known resistivity comprises the following steps:
The determined test materials of known resistivity include aluminum, iron and copper.
3. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 2, wherein the step S2 of preparing the test specimen in the standard specification shape by using the test material comprises the following steps:
Test specimens of standard specification shape are prepared by adopting a test material, wherein the standard specification shape is cuboid of 30 multiplied by 15 mm.
4. The method of calculating the non-contact measurement of ultra-low resistivity according to claim 3, wherein in step S3, under the condition that the electromagnetic interference of the environment is less than the set threshold, the noise of the environment and the measuring instrument is measured and recorded, and the method specifically comprises the following steps:
And under the condition that the environmental electromagnetic interference is smaller than a set threshold value, measuring and recording the environmental and measuring instrument noise by adopting a transient electromagnetic system.
5. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 4, wherein the step S4 of measuring the eddy current secondary perpendicular magnetic field response of the test specimen prepared in the step S2 comprises the following steps:
measuring the eddy current secondary vertical magnetic field response of the test specimen prepared in the step S2 by adopting a transient electromagnetic system;
when in measurement, the antenna is horizontally placed on the specimen, the distance between the antenna and the host computer of the transient electromagnetic system is more than 4m and as far as possible, the distance between the antenna and the operating computer of the transient electromagnetic system is more than 5m, the distance between the operating computer and the host computer in a horizontal through state is not more than 30m, the test site is as far as possible from the tester and other animals, and the transmission cable of the transient electromagnetic system is not wound or coiled;
and (3) subtracting the environmental and measuring instrument noise obtained by measuring in the step (S3) from the measured data, and performing data fitting to obtain an eddy current secondary perpendicular magnetic field response curve of the test specimen.
6. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 5, wherein the calculating the area value of the eddy current secondary perpendicular magnetic field response curve of the test specimen obtained in step S4 in the signal window selected in step S5 by using the mathematical integration and summation method in step S6 specifically comprises the following steps:
The area surrounded by the eddy current secondary vertical magnetic field response curve of the test specimen obtained in the step S4 and the signal window selected in the step S5 is the area to be calculated;
The area value S to be calculated is calculated using the following equation:
wherein X 1 is the abscissa value of the intersection point of the first ray and the eddy current secondary vertical magnetic field response curve of the test specimen, X 2 is the abscissa value of the intersection point of the second ray and the eddy current secondary vertical magnetic field response curve of the test specimen, and f (X) is a functional expression of the eddy current secondary vertical magnetic field response curve of the test specimen.
7. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 6, wherein the mathematical fitting method is adopted in the step S7, and the mathematical expression between the area value obtained in the step S6 and the resistivity of the test material is fitted to obtain a resistivity calculation formula, and specifically comprises the following steps:
Adopting a mathematical fitting method, taking a Gaussian function as a basic function, and obtaining a mathematical expression between an area value and the resistivity of the test material in a fitting step S6;
Finally, the fitting yields the following resistivity calculations:
Where f ρ is the resistivity calculated by fitting.
8. The method for calculating the non-contact measurement of the ultralow resistivity according to claim 7, wherein the calculation formula of the resistivity obtained in step S7 in step S8 is adopted to directly calculate the resistivity of the target material to be tested, and specifically comprises the following steps:
determining a target material to be tested;
Taking a target material to be tested as a test material;
calculating to obtain an area value of the target material to be tested by adopting the steps S2-S6;
And (3) according to the obtained area value, calculating to obtain the resistivity of the target material to be tested by adopting the resistivity calculation formula obtained in the step (S7).
9. A system for realizing the non-contact measurement and calculation method of the ultralow resistivity according to one of claims 1 to 8, which is characterized by comprising a material determination module, a specimen preparation module, a noise measurement module, a response measurement module, a window selection module, an area calculation module, a resistivity fitting module and a resistivity calculation module; the system comprises a material determining module, a specimen preparation module, a noise measuring module, a response measuring module, a window selecting module, an area calculating module, a resistivity fitting module and a resistivity calculating module which are sequentially connected in series, wherein the material determining module is used for determining test materials with known resistivity and uploading data information to the specimen preparation module, the specimen preparation module is used for preparing test specimens with standard specification shapes according to the received data information, and uploading the data information to the noise measuring module, the noise measuring module is used for measuring and recording environmental and measuring instrument noise according to the received data information under the condition that the environmental electromagnetic interference is smaller than a set threshold value, and uploading the data information to the response measuring module, the response measuring module is used for measuring the eddy current secondary vertical magnetic field response of the prepared test specimens according to the received data information and uploading the data information to the window selecting module, the window selecting module is used for selecting a signal window according to the received data information and uploading the data information to the area calculating module, the area calculating module is used for calculating the area value of the obtained eddy current secondary vertical magnetic field response curve of the test specimens in the selected signal window according to the received data information and adopting an integral summation method, the area calculating module is used for fitting the data resistivity module according to the received data information, and the resistivity calculation module is used for directly calculating the resistivity of the target material to be tested according to the received data information by adopting the obtained resistivity calculation formula to finish the non-contact measurement calculation of the ultralow resistivity.
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| CN108776359A (en) * | 2018-07-13 | 2018-11-09 | 中南大学 | The measurement bearing calibration of the small loop line transient electromagnetic system of transceiver |
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