CN117612925A - Composite tandem mass spectrometer - Google Patents
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- CN117612925A CN117612925A CN202311676793.4A CN202311676793A CN117612925A CN 117612925 A CN117612925 A CN 117612925A CN 202311676793 A CN202311676793 A CN 202311676793A CN 117612925 A CN117612925 A CN 117612925A
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- 239000002131 composite material Substances 0.000 title claims abstract description 19
- 150000002500 ions Chemical class 0.000 claims abstract description 236
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 45
- 238000000605 extraction Methods 0.000 claims abstract description 28
- 239000002904 solvent Substances 0.000 claims abstract description 10
- 210000005056 cell body Anatomy 0.000 claims abstract description 9
- 238000005336 cracking Methods 0.000 claims abstract description 6
- 238000001816 cooling Methods 0.000 claims abstract description 4
- 230000001133 acceleration Effects 0.000 claims description 8
- 230000033001 locomotion Effects 0.000 claims description 8
- 239000007921 spray Substances 0.000 claims description 8
- 238000012216 screening Methods 0.000 claims description 6
- 210000004027 cell Anatomy 0.000 claims description 5
- 238000005173 quadrupole mass spectroscopy Methods 0.000 claims description 4
- 238000004885 tandem mass spectrometry Methods 0.000 claims description 3
- 238000009966 trimming Methods 0.000 claims description 3
- 150000001875 compounds Chemical group 0.000 description 15
- 238000004451 qualitative analysis Methods 0.000 description 11
- 230000005540 biological transmission Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 230000005684 electric field Effects 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000004445 quantitative analysis Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 239000012634 fragment Substances 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000011002 quantification Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000001269 time-of-flight mass spectrometry Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 230000037427 ion transport Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 1
- 238000000451 chemical ionisation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
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Abstract
The embodiment of the invention provides a composite tandem mass spectrometer, which comprises: the ion source, the ion extraction structure, the ion guiding device, the mass analyzer, the collision reaction tank and the lens group are sequentially connected along a preset direction; the ion extraction structure removes sample solvent from ions generated by the ion source, the ion guide device transmits the ions from which the sample solvent is removed and provides initial kinetic energy, the mass analyzer screens the ions with the initial kinetic energy, the collision reaction tank carries out cooling focusing or collision cracking on the screened ions, and the lens group enables ion beams passing through the collision tank to move along a preset direction or along a vertical preset direction; further comprises: a quadrupole mass analyzer and a time-of-flight mass analyzer, each disposed in series with the collision cell body; wherein an ion beam enters the quadrupole mass analyzer at one time sequence and an ion beam enters the time-of-flight mass analyzer at another time sequence.
Description
Technical Field
The embodiment of the invention relates to the technical field of mass spectrometers, in particular to a composite tandem mass spectrometer.
Background
Mass spectrometers are also known as mass spectrometers. An apparatus for separating and detecting ions of different mass to charge ratios. Namely, according to the principle that the motion paths or the motion speeds of charged particles in an electromagnetic field are different, the separation and detection of the composition of substances are carried out according to the mass difference of atoms, molecules or fragments of the substances. Mass spectrometers are instruments that use various combinations of magnetic and electric fields to achieve separation of charged particles of different mass to charge ratios, and are important tools for substance component characterization and isotope studies.
The triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer are typical tandem mass spectrometers, after the excimer ion peak of a stronger object to be detected is obtained under the condition of a primary mass analyzer, the excimer ion is subjected to collision and cracking, and the compound fragment information is obtained by analysis of a secondary mass analyzer, so that the compound structure is judged, and the qualitative and quantitative analysis of the target compound is realized.
The triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer have obvious differences in working principles and application ranges, and how to fully develop the advantages of the triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer becomes the key of breakthrough of the prior art.
Disclosure of Invention
The embodiment of the invention provides a composite tandem mass spectrometer which is used for realizing the combination of a triple quadrupole mass spectrometer and a quadrupole-time-of-flight mass spectrometer, fully exerts the advantages of the triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer, and has the advantages of high sensitivity, wide dynamic range, high resolution, high mass accuracy and the like.
The embodiment of the invention provides a composite tandem mass spectrometer, which comprises:
the ion source, the ion extraction structure, the ion guiding device, the primary mass analyzer, the collision reaction tank and the lens group are sequentially connected along a preset direction; the ion extraction structure removes sample solvent from ions generated by the ion source, the ion guide device transmits ions from which the sample solvent is removed and provides initial kinetic energy, the mass analyzer performs mass screening on the ions with the initial kinetic energy, the collision reaction tank performs cooling focusing and collision cracking on the screened ions, and the lens group introduces the focused or collision cracked ion beam into the secondary mass analyzer along a preset direction or a vertical direction of the preset direction according to a certain time sequence;
further comprises: the secondary mass analyzers respectively arranged in series with the collision cell body are a quadrupole mass analyzer and a time-of-flight mass analyzer; the ion beam enters the quadrupole mass analyzer in a certain time sequence to realize a triple quadrupole mass spectrometry function, and enters the flight time mass analyzer in another time sequence to realize a quadrupole-flight time tandem mass spectrometry function.
The ion source generates ions, the ions can be positive ions or negative ions, and the positive ions or the negative ions generated by ionization enter the ion optical system through the ion extraction structure under the action of an electric field or air flow. The ion extraction structure aims at an ion source, gas back blowing or heating can be used for removing a sample solvent, or rough vacuum is pumped for guaranteeing vacuum gradient, multi-stage differential vacuum is formed for guaranteeing that ions are correctly introduced into an ion guide device, the ion guide device realizes focused transmission of the ions in a rough vacuum or low vacuum environment, controls initial kinetic energy of the ions entering a mass analyzer, and realizes screening of parent ions or allows transmission control of ions with a certain mass window in different working modes by applying special alternating voltage in the mass analyzer, the screened ions enter a collision reaction tank, and active gas or inert gas with a certain flow velocity is introduced into the collision reaction tank, so that the interior of the tank body keeps certain pressure, and the functions of parent ion splitting, ion/interfering ion kinetic energy distinction, mass number distinction after ion/interfering ion reaction to be tested and the like can be realized; then the ions passing through the collision reaction tank enter a lens group, and the lens group enables the ions to enter a quadrupole mass analyzer or a time-of-flight mass analyzer in a time-sharing way after being transmitted or deflected by 90 degrees along a straight line by setting a direct current voltage combination. The analysis functions of a triple quadrupole mass spectrometer and a quadrupole-time-of-flight mass spectrometer can be respectively realized through special ion optical design, and the quadrupole mass analyzer and the time-of-flight mass analyzer are respectively used as secondary mass analyzers, wherein the quadrupole mass analyzer has high sensitivity, high quantitative precision and wide dynamic range, is suitable for compound quantification and qualitative analysis of certain low-concentration compounds, and the time-of-flight mass analyzer has high mass resolution and high mass precision, and is more suitable for qualitative analysis of complex mixtures and unknown compounds; the advantages of the two are fully exerted, and the single-needle sample injection possibility of completing qualitative and quantitative analysis is provided by controlling the electrical parameter time sequence of the ion lens, so that the application of the instrument can be greatly expanded.
Optionally, the movement directions of the two ion beams are vertical;
or the movement directions of the two ion beams are collinear and opposite.
Optionally, the ion source comprises: an ion source housing having an ion source cavity and an ion source spray needle;
at least the ejection port of the ion source spray needle is positioned in the ion source cavity.
Optionally, the ion extraction structure comprises: the first cone electrode is provided with a first through hole, and the axial lead direction of the first through hole is parallel to the preset direction.
Optionally, the ion extraction structure further comprises: the second cone electrode is provided with a second through hole, and the axial lead of the second through hole is collinear with the axial lead of the first through hole.
Optionally, the ion guide device comprises a primary ion guide assembly, the primary ion guide assembly having a first channel;
when the ion extraction structure is a cone electrode, the first channel is communicated with the first through hole;
when the ion extraction structure is two cone electrodes, the first channel is communicated with the second through hole.
Optionally, the collision reaction cell includes: the collision cell comprises a main structure and a collision cell body with a reaction cavity, wherein the mass analyzer is communicated with the reaction cavity through the main structure.
Optionally, the time-of-flight mass analyzer comprises an ion modulation region, an ion acceleration region, a field-free flight region, an ion reflector, and an ion detector connected in sequence;
the ion modulation region, the ion acceleration region, the field-free flight region, the ion reflector, and the ion detector are all at 1x10 -7 Torr-8x10 -7 In a vacuum environment of Torr.
Optionally, the lens group includes an ion beam direction fine tuning lens, an ion deflection lens, and an ion beam shape adjusting lens;
the ion beam direction fine adjustment lens is positioned on a first side surface of the ion deflection lens, the ion beam shape adjustment lens is positioned on a second side surface of the ion deflection lens, and the first side surface is perpendicular to the second side surface.
Optionally, the ion beam direction fine tuning lens includes: a round flat pole piece and a quadrupole electrostatic lens which are arranged along the preset direction;
the ion beam shape adjusting lens comprises slits and a group of single lenses which are arranged along the direction vertical to the preset direction.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of a composite tandem mass spectrometer according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a composite tandem mass spectrometer according to a second embodiment of the present invention;
fig. 3 is a schematic structural diagram of a lens assembly according to an embodiment of the invention;
fig. 4 is a schematic diagram of a second structure of the lens assembly according to the embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating ion transmission in a lens assembly according to an embodiment of the present invention;
fig. 6 is a schematic diagram of ion transmission in a lens assembly according to an embodiment of the invention.
Icon: a-ions transported in a straight line; b-deflecting the transported ions; 1-an ion source chamber; 2-ion source spray needle; 3-a first cone electrode; 4-a second cone electrode; 5-a primary ion guide assembly; a 6-secondary ion guide assembly; 7-a mass analyzer; 8-a main body structure; 9-a collision cell body; 10-a lens group; 10A-ion beam direction trimming lens; 10B-ion deflection lenses; 10C-ion beam shaping lens; 11-secondary quadrupole mass analyzer inlet pre-quadrupole; a 12-secondary quadrupole mass analyzer; 13-ion modulation region; a 14-ion acceleration region; 15-field-free flight zone; a 16-ion reflector; 17-quadrupole mass spectrometry ion detector; 18-time-of-flight mass spectrometry ion detector; 21-a first stage vacuum chamber; 22-a second stage vacuum chamber; 23-third stage vacuum chamber; 24-fourth stage vacuum chamber; 25-circular flat pole pieces; 26-quadrupole electrostatic lens; 27-slit; 28-single lens.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer are typical tandem mass spectrometers, after the excimer ion peak of a stronger object to be detected is obtained under the condition of a primary mass analyzer, the excimer ion is subjected to collision and cracking, and the compound fragment information is obtained by analysis of a secondary mass analyzer, so that the compound structure is judged, and the qualitative and quantitative analysis of the target compound is realized. The quadrupole mass analyzer and the time-of-flight mass analyzer can be used as secondary mass analyzers, wherein the quadrupole mass analyzer has high sensitivity, high quantitative accuracy and wide dynamic range, and is suitable for compound quantification and qualitative analysis of certain low-concentration compounds, and the quadrupole-time-of-flight mass analyzer has high mass resolution and high mass accuracy, and is more suitable for qualitative analysis of complex mixtures and unknown compounds.
By means of special ion optical design, the triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer are combined, advantages of the triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer are fully exerted, and the single-needle sample injection possibility of completing qualitative and quantitative analysis is achieved through time sequence control of the electrical parameters of the ion lens, so that the application of the instrument can be greatly expanded.
In order to solve the above problems, as shown in fig. 1 and 2, an embodiment of the present invention provides a composite tandem mass spectrometer, including:
the ion source, the ion extraction structure, the ion guiding device, the primary mass analyzer 7, the collision reaction tank and the lens group 10 are sequentially connected along a preset direction; the ion extraction structure removes sample solvent from ions generated by the ion source, the ion guide device transmits the ions from which the sample solvent is removed and provides initial kinetic energy, the mass analyzer 7 performs mass screening on the ions with the initial kinetic energy, the collision reaction tank performs cooling focusing and collision cracking on the screened ions, and the lens group 10 introduces the focused or collision cracked ion beam into the secondary mass analyzer along a preset direction or a vertical direction of the preset direction according to a certain time sequence;
further comprises: the secondary mass analyzers respectively arranged in series with the collision cell body 9 are a quadrupole mass analyzer and a time-of-flight mass analyzer; the ion beam enters the quadrupole mass analyzer in a certain time sequence, so that a triple quadrupole mass spectrometry function is realized, and the ion beam enters the flight time mass analyzer in another time sequence, so that a quadrupole-flight time tandem mass spectrometry function is realized.
It should be noted that, the ion source generates ions, which may be positive ions or negative ions, and the positive ions or negative ions generated by ionization enter the ion optical system through the ion extraction structure under the action of an electric field or air flow. The ion extraction structure aims at an ion source, gas back blowing or heating can be used for removing a sample solvent, or rough vacuum is pumped for guaranteeing vacuum gradient, multi-stage differential vacuum is formed for guaranteeing that ions are correctly introduced into an ion guiding device, the ion guiding device realizes focused transmission of the ions in a rough vacuum or low vacuum environment and controls initial kinetic energy of the ions entering a mass analyzer 7, screening of parent ions or transmission control of ions with a certain mass window is realized in the mass analyzer 7 by applying special alternating voltage in different working modes, the screened ions enter a collision reaction tank, active gas or inert gas with a certain flow velocity is introduced into the collision reaction tank, so that the internal part of the tank keeps certain pressure, and the functions of parent ion splitting, ion/interference ion kinetic energy distinguishing to be tested, mass number distinguishing after ion/interference ion reaction to be tested and the like can be realized; then the ions passing through the collision reaction tank enter a lens group, and the lens group enables the ions to enter a quadrupole mass analyzer or a time-of-flight mass analyzer in a time-sharing way after being transmitted or deflected by 90 degrees along a straight line by setting a direct current voltage combination. The triple quadrupole mass spectrometer and the quadrupole-time-of-flight mass spectrometer can be respectively realized through special ion optical design, and the quadrupole mass analyzer and the time-of-flight mass analyzer are respectively used as secondary mass analyzers, wherein the quadrupole mass analyzer has high sensitivity, wide dynamic range and high quantitative precision, is suitable for compound quantification and qualitative analysis of certain low-concentration compounds, and the time-of-flight mass analyzer has high mass resolution and high mass precision, and is more suitable for qualitative analysis of complex mixtures and unknown compounds; the advantages of the two are fully exerted, and the single-needle sample injection possibility of completing qualitative and quantitative analysis is provided by controlling the electrical parameter time sequence of the ion lens, so that the application of the instrument can be greatly expanded.
As shown in fig. 1, the movement directions of the two ion beams are perpendicular; alternatively, as shown in fig. 2, the directions of movement of the two ion beams are collinear and opposite.
The ion source can be an electrospray ion source, a chemical ionization source, an inductively coupled plasma ion source, a matrix-assisted laser desorption ionization source, an electron bombardment source, a secondary ion source and the like. Taking an electrospray ion source as an example, with continued reference to fig. 1 and 2, the ion source comprises: an ion source housing having an ion source chamber 1, and an ion source spray needle 2, at least the ejection orifice of the ion source spray needle 2 being located within the ion source chamber 1, the ion source spray needle 2 ionizing to produce positive or negative ions in the ion source chamber 1.
Positive or negative ions generated by ionization enter an ion extraction structure under the influence of an electric field or an air flow, for example, the ion extraction structure includes: the first cone electrode 3, the first cone electrode 3 has first through hole, and the axial lead direction of first through hole is parallel with the default direction. The ion extraction structure further comprises: and the second cone electrode 4 is provided with a second through hole, and the axial lead of the second through hole is collinear with the axial lead of the first through hole. As an example, the ion extraction structure in fig. 1 and 2 comprises two electrodes, namely a first cone electrode 3 and a second cone electrode 4. Of course, the ion extraction structure may be one or more tapered perforated metal electrodes, i.e. the ion extraction structure may comprise one tapered perforated electrode, i.e. the first tapered electrode 3; two cone-shaped apertured electrodes, namely a first cone electrode 3 and a second cone electrode 4; three tapered apertured electrodes may also be included.
For example, the ion guide device includes a primary ion guide assembly 5, the primary ion guide assembly 5 having a first passageway; when the ion extraction structure is a cone electrode, the first channel is communicated with the first through hole; when the ion extraction structure is two cone electrodes, the first channel is communicated with the second through hole. The ion guide device is in the form of a quadrupole, a hexapole, an octapole, an ion funnel and the like, can be in a single or multiple ion guide structure, realizes focused transmission of ions in a rough vacuum or low vacuum environment, controls initial kinetic energy of the ions entering the mass analyzer 7, takes fig. 1 and 2 as an example, and is in a double ion guide structure, namely the ion guide device comprises a primary ion guide component 5 and a secondary ion guide component 6, and respectively applies specific alternating voltages.
In fig. 1 and 2, the mass analyzer 7 is a primary quadrupole mass analyzer 7, and the mass analyzer 7 includes a set of four poles distributed in a specific size and a supporting electronics unit. The screening of parent ions or the transmission control of ions with a certain mass window is realized under different working modes by applying special alternating voltages on the rods.
In fig. 1 and 2, the collision reaction cell includes: a main structure 8 and a collision cell body 9 having a reaction chamber, the mass analyzer 7 is made to communicate with the reaction chamber through the main structure 8. The collision reaction tank is a semi-closed tank body, the main structure 8 can be a quadrupole rod, a hexapole rod, an octapole rod or a multipole-like rod metal sheet and the like, the influence of a fringe field on ion transmission is restrained, active gas or inert gas with a certain flow rate is introduced, a reaction cavity in the collision reaction tank body 9 is kept at a certain pressure, and the functions of parent ion splitting, ion/interference ion kinetic energy distinguishing to be detected, ion/interference ion reaction mass number distinguishing and the like can be realized.
In some embodiments, the lens assembly 10 is configured to direct the ion beam through a linear or 90 ° deflection by providing each current-direct voltage combination to enter a quadrupole mass analyzer or a time-of-flight mass analyzer, respectively, corresponding to triple quadrupole mass spectrometer and quadrupole-time-of-flight mass spectrometer modes of operation.
For example, a triple quadrupole mass spectrometer operating mode includes a secondary quadrupole mass analyzer inlet pre-quadrupole 11, a secondary quadrupole mass analyzer 12, and a quadrupole mass spectrometer ion detector, the secondary quadrupole mass analyzer 12 comprising a set of four poles distributed in a specific size and associated electronics. Wherein the secondary quadrupole mass analyzer entrance pre-quadrupole 11 suppresses the influence of fringing fields on ion transport. The quadrupole mass spectrometer ion detector 17 is a channel electron multiplier or a discrete dynode electron multiplier.
In some specific embodiments, the time-of-flight mass analyzer comprises an ion modulation zone 13, an ion acceleration zone 14, a field-free flight zone 15, an ion reflector 16, and an ion detector, connected in sequence; the ion modulation region 13 extracts ions instantaneously by applying a pulse voltage, enters the ion acceleration region 14, accelerates under a uniform electric field of a certain intensity, and enters the field-free flight region 15. The ion reflector 16 can compensate the dispersion of the initial position of the ion beam, and improve the mass resolution. After flying, the low mass number ions first reach the ion detector and the high mass number ions reach the ion detector. The time-of-flight mass spectrometry ion detector 18 can be a microchannel plate or a discrete dynode electron multiplier.
In fig. 1 and 2, the primary ion guide assembly 5 is positioned in the first-stage vacuum cavity 21, the vacuum pressure of the first-stage vacuum cavity 21 is about 2 to 3Torr, the secondary ion guide assembly 6 is positioned in the second-stage vacuum cavity 22, and the vacuum pressure of the second-stage vacuum cavity 22 is generally better than 5x10 -3 The Torr pressure, the mass analyzer 7, the main structure 8 and the collision cell body 9 are all located in the third stage vacuum chamber 23, and the vacuum pressure of the third stage vacuum chamber 23 is generally 2×10 -5 Around Torr, the time-of-flight mass analyzer is located in the fourth stage vacuum chamber 24, that is, the ion modulation region 13, the ion acceleration region 14, the field-free flight region 15, the ion reflector 16, and the ion detector are all at 1×10 - 7 Torr-8x10 -7 In a Torr vacuum environment, for example, the pressure in the fourth stage vacuum chamber 24 is generally better than 6x10 -7 Torr。
Referring to fig. 1 and 2 together, as shown in fig. 3 and 4, the ion beam may pass through the lens assembly 10 in a straight line to the secondary quadrupole mass analyzer 12; the ion beam is deflected downward 90 deg., to reach the time-of-flight mass spectrometry ion detector 18. The secondary quadrupole mass analyzer 12 can also be placed over the lens (as shown in fig. 2) and can be deflected up to 90 deg.. In addition to both, other forms of mass analyser 7 may be connected.
For example, the lens group 10 includes an ion beam direction fine adjustment lens 10A, an ion deflection lens 10B, and an ion beam shape adjustment lens 10C; the ion beam direction fine adjustment lens 10A is located on a first side of the ion deflection lens 10B, and the ion beam shape adjustment lens 10C is located on a second side of the ion deflection lens 10B, the first side being perpendicular to the second side.
The ion beam direction fine adjustment lens 10A includes: a circular flat pole piece 25 and a quadrupole electrostatic lens 26 arranged along a preset direction; when the ion beam energy is set relatively high, the mass discrimination effect of the ion deflection lens 10B can be effectively suppressed by adjusting the ion kinetic energy and fine-tuning the ion beam direction.
The ion deflection lens 10B may be an electrostatic quadrupole lens, and ions are incident from the radial direction, and the ions can be transferred in a straight line or deflected by 90 ° by adjusting the dc voltage combination on the quadrupole. The ion beam deflection lens can be an electrostatic quadrupole rod, a plurality of groups of annular pole pieces or other forms of electrostatic deflection lenses.
The ion beam shape adjusting lens 10C includes slits 27 arranged in a vertical preset direction, the slits 27 being used to control the spatial dispersion of the ion beam entering the ion modulation region 13, and a set of single lenses 28, the single lenses 28 reducing the angular dispersion of the ion beam.
As shown in fig. 5 and 6, the ion transport of the lens set was simulated using ion simulation software, and fig. 5 is a set of dc voltage combinations where the ions were transported along a straight line, resulting in the straight line transported ions of fig. 5. Fig. 6 is a diagram of ions deflected at 90 deg. at another dc voltage combination setting to form the deflected ion of fig. 6.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (10)
1. A composite tandem mass spectrometer, comprising:
the ion source, the ion extraction structure, the ion guiding device, the primary mass analyzer, the collision reaction tank and the lens group are sequentially connected along a preset direction; the ion extraction structure removes sample solvent from ions generated by the ion source, the ion guide device transmits ions from which the sample solvent is removed and provides initial kinetic energy, the mass analyzer performs mass screening on the ions with the initial kinetic energy, the collision reaction tank performs cooling focusing and collision cracking on the screened ions, and the lens group introduces the focused or collision cracked ion beam into the secondary mass analyzer along a preset direction or a vertical direction of the preset direction according to a certain time sequence;
further comprises: the secondary mass analyzers respectively arranged in series with the collision cell body are a quadrupole mass analyzer and a time-of-flight mass analyzer; the ion beam enters the quadrupole mass analyzer in a certain time sequence to realize a triple quadrupole mass spectrometry function, and enters the flight time mass analyzer in another time sequence to realize a quadrupole-flight time tandem mass spectrometry function.
2. The composite tandem mass spectrometer of claim 1, wherein the direction of motion of the two ion beams is perpendicular;
or the movement directions of the two ion beams are collinear and opposite.
3. The composite tandem mass spectrometer of claim 1, wherein the ion source comprises: an ion source housing having an ion source cavity and an ion source spray needle;
at least the ejection port of the ion source spray needle is positioned in the ion source cavity.
4. The composite tandem mass spectrometer of claim 1, wherein the ion extraction structure comprises: the first cone electrode is provided with a first through hole, and the axial lead direction of the first through hole is parallel to the preset direction.
5. The composite tandem mass spectrometer of claim 4, wherein the ion extraction structure further comprises: the second cone electrode is provided with a second through hole, and the axial lead of the second through hole is collinear with the axial lead of the first through hole.
6. The composite tandem mass spectrometer of claim 5, wherein the ion guide device comprises a primary ion guide assembly having a first channel;
when the ion extraction structure is a cone electrode, the first channel is communicated with the first through hole;
when the ion extraction structure is two cone electrodes, the first channel is communicated with the second through hole.
7. The composite tandem mass spectrometer of claim 1, wherein the collision cell comprises: the collision cell comprises a main structure and a collision cell body with a reaction cavity, wherein the mass analyzer is communicated with the reaction cavity through the main structure.
8. The composite tandem mass spectrometer of claim 1, wherein the time-of-flight mass analyzer comprises an ion modulation region, an ion acceleration region, a field-free flight region, an ion reflector, and an ion detector, connected in sequence;
the ion modulation region, the ion acceleration region, the field-free flight region, the ion reflector, and the ion detector are all at 1x10 -7 Torr～8x10 -7 In a vacuum environment of Torr.
9. The composite tandem mass spectrometer of claim 1, wherein the lens group comprises an ion beam direction trimming lens, an ion deflection lens, and an ion beam shape adjustment lens;
the ion beam direction fine adjustment lens is positioned on a first side surface of the ion deflection lens, the ion beam shape adjustment lens is positioned on a second side surface of the ion deflection lens, and the first side surface is perpendicular to the second side surface.
10. The composite tandem mass spectrometer of claim 9, wherein the ion beam direction trimming lens comprises: a round flat pole piece and a quadrupole electrostatic lens which are arranged along the preset direction;
the ion beam shape adjusting lens comprises slits and a group of single lenses which are arranged along the direction vertical to the preset direction.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311676793.4A CN117612925A (en) | 2023-12-08 | 2023-12-08 | Composite tandem mass spectrometer |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311676793.4A CN117612925A (en) | 2023-12-08 | 2023-12-08 | Composite tandem mass spectrometer |
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| CN117612925A true CN117612925A (en) | 2024-02-27 |
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| CN202311676793.4A Pending CN117612925A (en) | 2023-12-08 | 2023-12-08 | Composite tandem mass spectrometer |
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|---|---|
| CN (1) | CN117612925A (en) |
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2023
- 2023-12-08 CN CN202311676793.4A patent/CN117612925A/en active Pending
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