CN117516408B - Curved surface detection device and magnetic flux detection device - Google Patents
Curved surface detection device and magnetic flux detection device Download PDFInfo
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- CN117516408B CN117516408B CN202311258659.2A CN202311258659A CN117516408B CN 117516408 B CN117516408 B CN 117516408B CN 202311258659 A CN202311258659 A CN 202311258659A CN 117516408 B CN117516408 B CN 117516408B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25H—WORKSHOP EQUIPMENT, e.g. FOR MARKING-OUT WORK; STORAGE MEANS FOR WORKSHOPS
- B25H1/00—Work benches; Portable stands or supports for positioning portable tools or work to be operated on thereby
- B25H1/10—Work benches; Portable stands or supports for positioning portable tools or work to be operated on thereby with provision for adjusting holders for tool or work
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0004—Supports
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
The application relates to a curved surface detection device and a magnetic flux detection device, wherein the curved surface detection device comprises a jig mechanism and a detection mechanism; the jig mechanism comprises a supporting mechanism and a rotating mechanism; the supporting mechanism and the rotating mechanism are adjacently arranged in parallel along the X direction of the jig mechanism; the supporting mechanism is used for placing an object to be measured, and the rotating mechanism is used for adjusting the posture of the object to be measured; the detection mechanism comprises a line laser module and a moving module; the line laser module is used for acquiring a point coordinate set corresponding to the surface of the object to be detected, and the moving module is used for driving the line laser module to move relative to the position of the object to be detected. In the embodiment of the application, the gesture of the object to be measured is adjusted through the rotating mechanism, and the line laser module is used for acquiring the point coordinate set of the surface of the object to be measured to determine the surface shape, so that the difficulty of confirming the curved surface shape can be solved.
Description
Technical Field
The invention relates to the field of curved surface detection devices, in particular to a magnetic curved surface detection device.
Background
The magnetic component is included in the electronic, motor and other objects, the magnetic size of the component is measured by magnetic flux, and the magnetic flux is one of the quantifiable acceptance criteria of the magnet. In different objects, the magnetic flux needs to meet different criteria, so the magnetic flux of the object is measured. Hall elements are a type of magnetic sensor based on the hall effect that can be used to measure magnetic flux. The coordinates of the surface detection points need to be clarified when the Hall element is used for measuring the magnetic flux, but the magnetic flux detection equipment for detecting the magnetic flux by using the Hall element at present aims at a plane object, so that the curved object is difficult to accurately position and measure, and measurement errors exist. In order to improve the accuracy of curved magnetic flux detection, it is necessary to solve the problem of curved shape confirmation.
Disclosure of Invention
The embodiment of the application provides a curved surface detection device and a magnetic flux detection device.
In a first aspect, an embodiment of the application discloses a curved surface detection device, which comprises a jig mechanism and a detection mechanism;
the jig mechanism comprises a supporting mechanism and a rotating mechanism; the supporting mechanism and the rotating mechanism are adjacently arranged in parallel along the X direction of the jig mechanism; the supporting mechanism is used for placing an object to be tested; the rotating mechanism is used for adjusting the gesture of the object to be measured;
The detection mechanism comprises a line laser module and a moving module; the line laser module is used for acquiring a point coordinate set corresponding to the surface of the object to be detected; the moving module is used for driving the line laser module to move relative to the position of the object to be detected.
In some of the possible embodiments of the present invention,
The mobile module is a Z-direction module;
The Z-direction module is used for driving the line laser module to move relative to the position of the object to be detected in the Z direction.
In some of the possible embodiments of the present invention,
The detection mechanism comprises a first sliding table;
the first sliding table is used for adjusting the position of the line laser module relative to the object to be measured.
In some of the possible embodiments of the present invention,
The supporting mechanism comprises a first supporting part and a second supporting part; the first support part comprises a first rubber coating support wheel, and the second support part comprises a second rubber coating support wheel;
the first rubber coating supporting wheel supports the first end of the object to be measured, and the second rubber coating supporting wheel supports the second end of the object to be measured.
In some of the possible embodiments of the present invention,
The supporting mechanism comprises a second sliding table and a third sliding table;
The second sliding table is used for adjusting the position of the first rubber coating supporting wheel in the Y direction or the Z direction; the third sliding table is used for adjusting the position of the second coating supporting wheel in the Y direction or the Z direction.
In some of the possible embodiments of the present invention,
The rotating mechanism comprises a main rotating mechanism; the main rotating mechanism is provided with a three-jaw cylinder;
the three-jaw cylinder is close to the first rubber coating supporting wheel; the three-jaw cylinder is used for clamping a first end of an object to be tested.
In some of the possible embodiments of the present invention,
The main rotating mechanism also comprises a hollow rotating platform;
The hollow rotating platform is used for driving the three-jaw air cylinder to drive the object to be tested to rotate.
In some of the possible embodiments of the present invention,
The rotating mechanism also comprises an auxiliary rotating mechanism;
The auxiliary rotating mechanism is used for abutting against the second end of the object to be measured.
In some of the possible embodiments of the present invention,
The auxiliary rotating mechanism comprises an X/Y/Z direction adjusting mechanism;
The X/Y/Z direction adjusting mechanism is used for adjusting the position of the auxiliary rotating mechanism relative to the main rotating mechanism in the X direction or the Y direction or the Z direction.
In some of the possible embodiments of the present invention,
The auxiliary rotating mechanism also comprises a buffer mechanism;
The buffer mechanism is used for adjusting the position of the auxiliary rotating mechanism relative to the object to be measured in the X direction, and further enables the auxiliary rotating mechanism to move along with the position of the first end of the object to be measured in the X direction when abutting against the second end of the object to be measured.
In some of the possible embodiments of the present invention,
The jig mechanism further comprises a sliding table cylinder;
The sliding table cylinder is used for adjusting the position of the rotating mechanism in the X direction.
In some possible embodiments, the detection mechanism is located above the jig mechanism, and the detection mechanism and the jig mechanism are free of surface contact.
In a second aspect, an embodiment of the present application provides a magnetic flux detection apparatus, including any one of the curved surface detection apparatuses described above; wherein, the detection mechanism also comprises a Hall probe;
the Hall probe is used for detecting the magnetic flux density of the object to be detected.
The technical scheme provided by the embodiment of the application has the following technical effects:
The curved surface detection device comprises a jig mechanism and a detection mechanism; the jig mechanism comprises a supporting mechanism and a rotating mechanism; the supporting mechanism and the rotating mechanism are adjacently arranged in parallel along the X direction of the jig mechanism; the supporting mechanism is used for placing an object to be measured, and the rotating mechanism is used for adjusting the posture of the object to be measured; the detection mechanism comprises a line laser module and a moving module; the line laser module is used for acquiring a point coordinate set corresponding to the surface of the object to be detected, and the moving module is used for driving the line laser module to move relative to the position of the object to be detected. In the embodiment of the application, the gesture of the object to be measured is adjusted through the rotating mechanism, and the line laser module is used for acquiring the point coordinate set of the surface of the object to be measured to determine the surface shape, so that the difficulty of confirming the curved surface shape can be solved.
Drawings
In order to more clearly illustrate the embodiments of the application or the technical solutions and advantages of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are only some embodiments of the application, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a curved surface detecting device according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a detection mechanism according to an embodiment of the present application;
Fig. 3 is a schematic diagram of a fixture mechanism according to an embodiment of the present application;
fig. 4 is a schematic diagram two of a fixture mechanism according to an embodiment of the present application;
fig. 5 is a schematic diagram III of a fixture mechanism according to an embodiment of the present application;
FIG. 6 is a schematic illustration of a primary rotation mechanism provided by an embodiment of the present application;
Fig. 7 is a schematic diagram of a fixture mechanism according to an embodiment of the present application;
fig. 8 is a schematic diagram fifth of a fixture mechanism according to an embodiment of the present application;
FIG. 9 is a schematic diagram of an auxiliary rotating mechanism according to an embodiment of the present application;
fig. 10 is a schematic diagram sixth of a fixture mechanism according to an embodiment of the present application;
Fig. 11 is a schematic diagram of a magnetic flux detection device according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
It should be noted that reference throughout this specification to "one embodiment" or "an embodiment" of an embodiment of the present application means that a particular feature, structure, or characteristic may be included in at least one implementation of the present application. It is to be understood that in the description of embodiments of the present application and in the claims and the above-described drawings, the terms "upper", "lower", "top", "bottom", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present application. The terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may include one or more of the feature, either explicitly or implicitly. Moreover, the terms "first," "second," and the like, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the application described herein may be implemented in sequences other than those illustrated or otherwise described herein. In addition, in the description of the present embodiment, unless otherwise specified, the meaning of "a plurality" is two or more. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, or article that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or article.
It will be understood that when an apparatus or component is referred to as being "on … …," "adjacent to … …," "connected to" another apparatus or component, it can be directly on, adjacent to, connected to the other apparatus or component, or intervening apparatus or components may be present. In contrast, when a device or component is referred to as being "directly on … …," "directly adjacent to … …," "directly connected to" another device or component, there is no intervening device or component. It will be understood that, although the terms first, second, third, etc. may be used to describe various elements, regions, layers and/or sections, these elements, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, region, layer or section from another element, region, layer or section. Thus, a first element, region, layer or section discussed below could be termed a second element, region, layer or section without departing from the teachings of the present application. When a second element, region, layer or section is discussed, it does not necessarily mean that the first element, region, layer or section is present.
In order to make the objects, technical solutions and advantages of the embodiments of the present application more apparent, the embodiments of the present application will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the detailed description and specific examples, while indicating the embodiment of the application, are intended for purposes of illustration only and are not intended to limit the scope of the application.
The embodiment of the application provides a curved surface detection device. Fig. 1 is a schematic diagram of a curved surface detecting device according to an embodiment of the present application, as shown in fig. 1, the curved surface detecting device includes a jig mechanism 1 and a detecting mechanism 2.
Optionally, the detecting mechanism 2 is located above the jig mechanism 1, and the detecting mechanism 2 and the jig mechanism 2 have no surface contact.
As shown in fig. 1, the jig mechanism 1 includes a supporting mechanism 11 and a rotating mechanism 12. The jig mechanism 1 is of a rotary design, and rotates an object to be tested so as to acquire a point coordinate set corresponding to the surface.
Alternatively, the supporting mechanism 11 and the rotating mechanism 12 are placed adjacently side by side in the X direction of the jig mechanism 1. Wherein the supporting mechanism 11 is used for placing an object to be measured. Specifically, the object to be measured is placed on the supporting mechanism 11 in the whole process from feeding to discharging, and the supporting mechanism 11 plays a role in supporting and stabilizing the object to be measured.
Optionally, the rotating mechanism 12 is configured to adjust the gesture of the object to be measured, so as to obtain the point coordinate set of the surface of the object to be measured.
In the embodiment of the application, the surface of the object to be measured is in a curved surface shape, and can be a regular curved surface such as a spherical surface, a cylindrical surface and the like or an irregular curved surface.
In the embodiment of the application, the surface of the object to be detected is easy to deform, the position of the detection point is easy to move, the accurate coordinate of the surface is difficult to determine, and the detection requirement is high, so that a device capable of enabling the object to be detected to be in a stable state and determining the coordinate value is needed. Optionally, the object to be measured is fragile, easy to damage and scratch, and special treatment is needed during clamping, so that damage is avoided.
The detection mechanism 2 includes a line laser module 21 and a moving module 22. The line laser module 21 is a core detection element for acquiring a point coordinate set corresponding to the surface of the object to be detected, thereby determining the surface shape. In a specific operation of curved surface detection, the line laser module 21 emits a line laser signal, and a certain coordinate point where the line laser signal contacts the surface of the object to be detected is reflected back to a line laser signal. The distance between the line laser module 21 and a coordinate point of the object to be measured can be calculated by the time difference between the two line laser signals. The point coordinates of a certain coordinate point of the object to be measured can be calculated from the position of the line laser module 21 and the emission direction of the line laser. And detecting a plurality of coordinate points of the object to be detected to obtain a point coordinate set corresponding to the surface of the object to be detected. The moving module 22 is used for driving the line laser module 21 to move relative to the position of the object to be measured.
Alternatively, the position of the line laser module 21 relative to the supporting mechanism 11 may be various, and the direction in which the moving module 22 moves relative to the object to be measured may be various.
In some possible embodiments, the mobile module 22 is a Z-direction module. At this time, the line laser module 21 is located above the supporting mechanism 11, and the Z-direction module drives the line laser module 21 to move in the Z-direction relative to the position of the object to be measured.
Fig. 2 is a schematic diagram of a detection mechanism 2 according to an embodiment of the present application, as shown in fig. 2, the detection mechanism 2 further includes a first sliding table 23. Before the position of the line laser module 21 relative to the object to be measured is precisely adjusted by the moving module 22, the position of the line laser module 21 relative to the object to be measured is roughly adjusted by the first sliding table 23.
Alternatively, the first sliding table 23 may be manually adjusted or may be automatically adjusted.
Fig. 3 is a schematic diagram of a jig mechanism 1 according to an embodiment of the present application, as shown in fig. 3, a supporting mechanism 11 includes a first supporting portion and a second supporting portion, the first supporting portion includes a first encapsulating supporting wheel 111, and the second supporting portion includes a second encapsulating supporting wheel 112. When the surface shape of the object to be measured is detected by using the curved surface detection device, the object to be measured is manually placed on the supporting mechanism 11, the first end of the object to be measured is placed on the first encapsulation supporting wheel 111, and the second end of the object to be measured is placed on the second encapsulation supporting wheel 112. The first and second encapsulation supporting wheels 111 and 112 are in contact with both ends of the object to be measured, and play a role in preventing scratch and supporting the object to be measured.
In the embodiment of the present application, the first encapsulating support wheel 111 and the second encapsulating support wheel 112 have a circular structure with a void in the middle, and the first end and the second end of the object to be measured include protruding portions. The two tangential surfaces of the first rubber coating supporting wheel 111 and the second rubber coating supporting wheel 112 clamp the two ends of the object to be tested together, and the protruding portions at the two ends of the object to be tested are respectively clamped into the empty spaces between the first rubber coating supporting wheel 111 and the second rubber coating supporting wheel 112.
Optionally, the size of the first encapsulating support wheel 111 may be adjusted according to the contact area between the tangential plane and the first end of the object to be tested, and the size of the second encapsulating support wheel 112 may also be adjusted according to the contact area between the tangential plane and the second end of the object to be tested.
Fig. 4 is a schematic diagram two of a jig mechanism 1 according to an embodiment of the present application, as shown in fig. 4, the supporting mechanism 11 includes a second sliding table 113 and a third sliding table 114. Optionally, the second sliding table 113 is used for adjusting the position of the first encapsulation supporting wheel 111 in the Y direction or the Z direction, and correspondingly, the third sliding table 114 is used for adjusting the position of the second encapsulation supporting wheel 112 in the Y direction or the Z direction. The second slide table 113 and the third slide table 114 adjust the position of the object to be measured in the Y direction or the Z direction by adjusting the positions of the first encapsulating support wheel 111 and the second encapsulating support wheel 112 in the Y direction or the Z direction. In order to maintain the stability of the object to be measured, the adjustment directions of the second slide table 113 and the third slide table 114 are identical.
Fig. 5 is a schematic diagram III of a fixture mechanism 1 according to an embodiment of the present application, and as shown in fig. 5, a rotating mechanism 12 includes a main rotating mechanism 121. The main rotation mechanism 121 is used for adjusting the gesture of the object to be measured, so that the line laser can acquire the point coordinate set corresponding to the surface of the object to be measured. The main rotation mechanism 121 is provided with a three-jaw cylinder 1211. The three-jaw cylinder 1211 is adjacent to the first encapsulation supporting wheel 111, and the three-jaw cylinder 1211 is used to clamp a first end of an object to be measured.
In an alternative embodiment, the first encapsulating support wheel 111 has a circular structure with a void in the middle, and the first end of the object to be tested comprises a protruding portion that snaps into the void in the middle of the first encapsulating support wheel 111 and is held by the three-jaw cylinder 1211. Alternatively, the protruding portion of the first end of the object to be measured does not protrude beyond the first rubber coating supporting wheel 111, and at this time, the three-jaw cylinder 1211 is also clamped into the empty space in the middle of the first rubber coating supporting wheel 111 to clamp the object to be measured. Alternatively, the protruding portion of the first end of the object to be measured protrudes beyond the first encapsulation supporting wheel 111, and the three-jaw cylinder 1211 clamps the portion of the object to be measured protruding beyond the first encapsulation supporting wheel 111.
Fig. 6 is a schematic diagram of a main rotation mechanism 121 according to an embodiment of the present application, and as shown in fig. 6, the main rotation mechanism 121 further includes a hollow rotation platform 1212. The hollow rotary platform 1212 is used to drive the three-jaw cylinder 1211 to rotate the object to be measured.
Fig. 7 is a schematic diagram of a jig mechanism 1 according to an embodiment of the present application, as shown in fig. 7, the rotating mechanism 12 further includes an auxiliary rotating mechanism 122. The auxiliary rotating mechanism 122 is disposed adjacent to the supporting mechanism 11 in the X direction, and the auxiliary rotating mechanism 122 is used for abutting against the second end of the object to be measured. In the rotation operation, the first end of the object to be measured is clamped by the three-jaw cylinder 1211, and at this time, the second end of the object to be measured is liable to jump, so the auxiliary rotation mechanism 122 which can abut against the second end of the object to be measured is provided to maintain the stability of the object to be measured.
Fig. 8 is a fifth schematic diagram of the fixture mechanism 1 according to the embodiment of the present application, as shown in fig. 8, the auxiliary rotating mechanism 122 further includes an X/Y/Z direction adjusting mechanism 1221. The X/Y/Z direction adjustment mechanism is used to adjust the position of the auxiliary rotation mechanism 122 in the X direction or the Y direction or the Z direction relative to the main rotation mechanism 121. Specifically, when the main rotation mechanism 121 clamps the first end of the object to be measured, the X/Y/Z direction adjustment mechanism 1221 adjusts the position of the auxiliary rotation mechanism 122 in the X direction, the Y direction, or the Z direction according to the position of the main rotation mechanism 121, so that the auxiliary rotation mechanism 122 can abut against the second end of the object to be measured, thereby maintaining the stability of the object to be measured.
Fig. 9 is a schematic diagram of an auxiliary rotating mechanism 122 according to an embodiment of the present application, and as shown in fig. 9, the auxiliary rotating mechanism 122 includes a buffer mechanism 1222. The buffer mechanism 1222 is used for adjusting the position of the auxiliary rotating mechanism 122 in the X direction relative to the object to be measured, so that the auxiliary rotating mechanism 122 moves along with the position of the first end of the object to be measured in the X direction when abutting against the second end of the object to be measured, thereby maintaining the stability of the object to be measured and preventing the object to be measured from being pinched.
Fig. 10 is a sixth schematic diagram of a fixture mechanism 1 according to an embodiment of the present application, as shown in fig. 10, the fixture mechanism 1 further includes a sliding table cylinder 13. The sliding table cylinder 13 is used for adjusting the positions of the main rotating mechanism 121 and the auxiliary rotating mechanism 122 in the X direction, so that the feeding and discharging of personnel are facilitated.
Alternatively, the slide table cylinder 13 is located below the main rotation mechanism 121 and the auxiliary rotation mechanism 122.
Alternatively, the slide cylinder 13 is in an automatic adjustment mode or a manual adjustment mode.
Fig. 11 is a schematic view of a magnetic flux detecting device according to an embodiment of the present application, and as shown in fig. 11, the magnetic flux detecting device includes any one of the curved surface detecting devices described above. Wherein the detection mechanism 2 further comprises a hall probe 24. After the line laser module 21 measures the point coordinate set of the surface of the object to be measured, the shape of the surface of the object to be measured can be known. And selecting certain coordinate points, and detecting the magnetic flux density by using the Hall probe 24 to obtain the magnetic flux data of the object to be detected.
The embodiment of the specification also provides a curved surface detection method, which comprises the following steps:
Manually placing the object to be tested on a first rubber coating supporting wheel 111 and a second rubber coating supporting wheel 112, wherein the first rubber coating supporting wheel 111 supports a first end of the object to be tested, and the second rubber coating supporting wheel 112 supports a second end of the object to be tested;
The second sliding table 113 and the third sliding table 114 respectively adjust the positions of the first rubber coating supporting wheel 111 and the second rubber coating supporting wheel 112 in the Y direction and the Z direction;
The slide cylinder 13 extends, and the main rotation mechanism 121 and the auxiliary rotation mechanism 122 move in the X direction;
The three-jaw cylinder 1211 clamps a first end of the object to be measured, and the auxiliary rotating mechanism 122 abuts a second end of the object to be measured;
the moving module 22 drives the line laser module 21 to move relative to the position of the object to be detected;
The hollow rotary platform 1212 drives the three-jaw cylinder 1211 to drive the object to be tested to rotate;
the line laser module 21 scans the object to be measured in the X direction to obtain X/Y/Z accurate coordinates of a plurality of position points of the object to be measured, and then the surface shape of the object to be measured can be determined.
The embodiment of the specification also provides a magnetic flux detection method, which is based on the curved surface detection method. After the coordinate data of the curved surface is obtained by the curved surface detection method, the hall probe 24 can detect the magnetic flux density of the object to be detected according to the coordinate data.
It should be noted that: the sequence of the embodiments of the present application is only for description, and does not represent the advantages and disadvantages of the embodiments. And the foregoing description has been directed to specific embodiments of this specification. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for the apparatus embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments in part.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program for instructing relevant hardware, where the program may be stored in a computer readable storage medium, and the storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
The foregoing description of the preferred embodiments of the application is not intended to limit the application to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the application are intended to be included within the scope of the application.
Claims (11)
1. The curved surface detection device is characterized by comprising a jig mechanism and a detection mechanism;
the jig mechanism comprises a supporting mechanism and a rotating mechanism; the supporting mechanism and the rotating mechanism are adjacently arranged in parallel along the X direction of the jig mechanism; the supporting mechanism is used for placing an object to be tested; the rotating mechanism is used for adjusting the gesture of the object to be detected;
The supporting mechanism comprises a first supporting part, a second sliding table and a third sliding table; the first supporting part comprises a first rubber coating supporting wheel, and the first rubber coating supporting wheel supports a first end of the object to be detected; the second supporting part comprises a second coating supporting wheel, and the second coating supporting wheel supports a second end of the object to be detected; the second sliding table is used for adjusting the position of the first rubber coating supporting wheel in the Y direction or the Z direction, and the third sliding table is used for adjusting the position of the second rubber coating supporting wheel in the Y direction or the Z direction;
The detection mechanism comprises a line laser module and a moving module; the line laser module is used for acquiring a point coordinate set corresponding to the surface of the object to be detected; the moving module is used for driving the line laser module to move relative to the position of the object to be detected.
2. The curved surface detection device of claim 1, wherein said mobile module is a Z-direction module;
the Z-direction module is used for driving the line laser module to move relative to the position of the object to be detected in the Z direction.
3. The curved surface detection device of claim 1, wherein said detection mechanism comprises a first slide;
The first sliding table is used for adjusting the position of the line laser module relative to the object to be measured.
4. The surface inspection apparatus of claim 1 wherein the rotation mechanism comprises a main rotation mechanism; the main rotating mechanism is provided with a three-jaw cylinder;
The three-jaw cylinder is close to the first rubber coating supporting wheel; the three-jaw cylinder is used for clamping the first end of the object to be tested.
5. The surface inspection apparatus of claim 4 wherein the main rotation mechanism further comprises a hollow rotation platform;
the hollow rotating platform is used for driving the three-jaw air cylinder to drive the object to be tested to rotate.
6. The surface inspection apparatus of claim 4 wherein the rotation mechanism further comprises an auxiliary rotation mechanism;
the auxiliary rotating mechanism is used for abutting against the second end of the object to be detected.
7. The surface inspection apparatus according to claim 6, wherein the auxiliary rotating mechanism comprises an X/Y/Z direction adjusting mechanism;
the X/Y/Z direction adjusting mechanism is used for adjusting the position of the auxiliary rotating mechanism relative to the main rotating mechanism in the X direction or the Y direction or the Z direction.
8. The surface inspection apparatus according to claim 6, wherein the auxiliary rotating mechanism further comprises a buffer mechanism;
The buffer mechanism is used for adjusting the position of the auxiliary rotating mechanism relative to the object to be measured in the X direction, so that the auxiliary rotating mechanism moves along with the position of the first end of the object to be measured in the X direction when abutting against the second end of the object to be measured.
9. The curved surface detection device of claim 1, wherein said jig mechanism further comprises a slipway cylinder;
The sliding table cylinder is used for adjusting the position of the rotating mechanism in the X direction.
10. The curved surface inspection device of claim 1, wherein said inspection mechanism is positioned above said jig mechanism and wherein said inspection mechanism and said jig mechanism are free of surface contact.
11. A magnetic flux detecting device, characterized by comprising the curved surface detecting device according to any one of claims 1 to 10; wherein, the detection mechanism also comprises a Hall probe;
the Hall probe is used for detecting the magnetic flux density of the object to be detected.
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