CN1172337C - chip type multi-connection electronic device - Google Patents
chip type multi-connection electronic device Download PDFInfo
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- CN1172337C CN1172337C CNB011187875A CN01118787A CN1172337C CN 1172337 C CN1172337 C CN 1172337C CN B011187875 A CNB011187875 A CN B011187875A CN 01118787 A CN01118787 A CN 01118787A CN 1172337 C CN1172337 C CN 1172337C
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/40—Structural combinations of fixed capacitors with other electric elements, the structure mainly consisting of a capacitor, e.g. RC combinations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/228—Terminals
- H01G4/252—Terminals the terminals being coated on the capacitive element
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/38—Multiple capacitors, i.e. structural combinations of fixed capacitors
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- Ceramic Capacitors (AREA)
Abstract
Description
技术领域technical field
本发明涉及一种芯片型多联电子器件、特别是一种在陶瓷制的单元体中内藏了多个电容、电感、电阻等电子元件的芯片型多联电子器件。The invention relates to a chip-type multi-connection electronic device, in particular to a chip-type multi-connection electronic device in which a plurality of capacitors, inductors, resistors and other electronic components are built in a unit body made of ceramics.
背景技术Background technique
以往,如图4所示,在由叠层薄片组成的单元体1上设置内部电极构成多个电容、电感、电阻等电子元件(在图4中未表示,但内藏有4个元件),有各种各样的在单元体1的表面上以一定间隔形成与各元件导电连接的外部电极2的芯片型多联电子器件。In the past, as shown in FIG. 4, internal electrodes are arranged on the unit body 1 composed of laminated sheets to form a plurality of electronic components such as capacitors, inductors, and resistors (not shown in FIG. 4, but 4 components are built in), There are various chip-type multiple electronic devices in which external electrodes 2 electrically connected to elements are formed on the surface of unit body 1 at regular intervals.
单元体1是由电介体、磁性体、非磁性体或绝缘体的陶瓷薄片叠层而成的。外部电极2是由在涂抹或复制了导电胶后在烘烤了的基底层上电镀了Cu、Ni、Sn等镀层组成。各电极2的宽度a、b相同。The unit body 1 is formed by stacking ceramic sheets of dielectric, magnetic, non-magnetic or insulator. The external electrode 2 is formed by electroplating Cu, Ni, Sn and other plating layers on the baked base layer after smearing or copying the conductive glue. The width a, b of each electrode 2 is the same.
但是,在图4所示的以往的芯片型多联电子器件中,在形成外部电极2的镀层时,如图5所示,把形成了基底层后的单元体1和钢球等导电性媒体3放入电镀装置(未图示)并混合,通过媒体3进行电镀。However, in the conventional chip-type multi-connected electronic device shown in FIG. 4, when forming the plating layer of the external electrode 2, as shown in FIG. 3 Put into the electroplating apparatus (not shown) and mix, and electroplate through the medium 3.
但是,媒体3的直径相对较大,因此,与两端的电极2相比,内侧的电极2与媒体3之间的接触性更差,内侧的电极2的镀层厚度总是相对较薄,焊锡的焊接性变差,从而导致安装不良的问题。特别是近年来,随着电子线路的小型化,也要求电子器件小型化,外部电极2的配设间隔变小。于是,为了防止电极2的短路、抑制电镀层的生长,倾向于抑制电镀时间和电流密度,使镀层厚度整体变薄。在这样的倾向下,内侧的电极2的镀层厚度变薄的问题更加显著。However, the diameter of the medium 3 is relatively large, so the contact between the inner electrode 2 and the medium 3 is worse than that of the electrodes 2 at both ends, and the thickness of the plating layer of the inner electrode 2 is always relatively thin. Solderability deteriorates, leading to poor mounting problems. Especially in recent years, along with the miniaturization of electronic circuits, miniaturization of electronic devices has also been demanded, and the arrangement intervals of the external electrodes 2 have become smaller. Therefore, in order to prevent the short circuit of the electrode 2 and suppress the growth of the plating layer, the plating time and current density tend to be suppressed, and the overall thickness of the plating layer tends to be reduced. In such a tendency, the problem that the plating thickness of the inner electrode 2 becomes thinner becomes more prominent.
发明内容Contents of the invention
本发明的目的在于提供可以改正外部电极的镀层厚度不均,特别是可以防止被配设在内侧的外部电极的镀层厚度变薄并消除往基板的安装不良问题的芯片型多联电子器件。An object of the present invention is to provide a chip-type multi-circuit electronic device capable of correcting uneven plating thickness of external electrodes, particularly preventing thinning of plating thickness of external electrodes arranged inside and eliminating poor mounting on a substrate.
为了达到以上目的,本发明的特征在于在具备有由叠层薄片组成的单元体、内藏于该单元体中的3个以上的电子元件和连接在该电子元件上且被排列在上述单元体的表面上的外部电极的芯片型多联电子器件中,位于排列方向两端以内的内侧上的外部电极的宽度比位于两端的外部电极的宽度宽。In order to achieve the above object, the present invention is characterized in that it comprises a unit body composed of laminated sheets, three or more electronic components contained in the unit body, and a unit connected to the electronic component and arranged on the unit body. In a chip-type multi-junction electronic device with external electrodes on the surface of the array, the width of the external electrodes located on the inner side within both ends in the arrangement direction is wider than the width of the external electrodes located at both ends.
外部电极是在基底层上形成电镀层而成的。在形成此电镀层时,位于内侧的外部电极的宽度比位于两端的外部电极的宽度宽,因此,位于内侧的外部电极与导电性媒体之间的接触概率增大,从而几乎与位于两端的外部电极的接触概率相同。因此,可以防止位于两端及内侧的外部电极的镀层厚度之不整齐。The external electrodes are formed by forming a plating layer on the base layer. When forming this plating layer, the width of the external electrodes located on the inner side is wider than that of the external electrodes located on both ends, so the probability of contact between the external electrodes located on the inner side and the conductive medium increases, thereby almost contacting the external electrodes located on both ends. The electrodes have the same probability of contact. Therefore, it is possible to prevent uneven plating thicknesses of the external electrodes located at both ends and inside.
附图说明Description of drawings
下面对附图进行简单说明。The accompanying drawings are briefly described below.
图1为表示本发明的一实施例的芯片型多联电容器的外观的立体图。FIG. 1 is a perspective view showing the appearance of a chip-type multi-connected capacitor according to an embodiment of the present invention.
图2为把上述电容器的薄片分解后的状态的立体图。Fig. 2 is a perspective view of a disassembled state of the capacitor sheet.
图3为表示安装上述电容器的基板的连接盘的俯视图。Fig. 3 is a plan view showing lands of the substrate on which the capacitor is mounted.
图4为表示以往的芯片型多联电子器件的外观的立体图。FIG. 4 is a perspective view showing the appearance of a conventional chip-type multiple electronic device.
图5为表示上述电子器件和电镀时使用的媒体之间的关系的说明图。FIG. 5 is an explanatory view showing the relationship between the above-mentioned electronic device and a medium used in plating.
图中,10:陶瓷制的单元体,11:陶瓷薄片,12:内部电极,13a、13b:外部电极,a、b:电极宽度。In the figure, 10: ceramic unit body, 11: ceramic sheet, 12: internal electrode, 13a, 13b: external electrode, a, b: electrode width.
具体实施方式Detailed ways
下面,参照附图对与本发明相关的芯片型多联电子器件的实施例进行说明。Next, embodiments of chip-type multi-connected electronic devices related to the present invention will be described with reference to the accompanying drawings.
图1为表示本发明的一实施例的芯片型多联电容器的外观的立体图。还有,图2表示其分解状态。FIG. 1 is a perspective view showing the appearance of a chip-type multi-connected capacitor according to an embodiment of the present invention. Also, Fig. 2 shows its disassembled state.
在图1、2中,在由介电体组成的陶瓷薄片11上形成规定形状的内部电极12,把这些薄片11和上下由相同的材料构成的多片保护用薄片11重叠、干燥并烧结后切出图1、2所示的1个个单元,从而形成芯片型多联电容器。借助于上下重叠的内部电极12形成4联的电容器阵列。In Figures 1 and 2,
在叠层薄片11而成的单元体10的表面上与各电容元件对应着形成有4对外部电极13a、13b。首先,这些外部电极13a、13b作为基底层在涂抹或复制了Ag、Ag-Pd、Cu等导电胶后进行烘烤,然后,用众所周知的滚镀法等电镀Cu、Ni、Sn等并形成电镀层。Four pairs of
在本实施例中的特征是位于内侧的外部电极13b的宽度b被设定为宽于位于两端的外部电极13a的宽度a。The feature in this embodiment is that the width b of the
通常,滚镀法所使用的导电性媒体的直径比外部电极的间隔还要大,往位于内侧的外部电极13b的接触概率总是低,但如本实施例那样,通过加宽位于内侧的外部电极13b的宽度b可以提高到几乎与位于两端的外部电极13a相同的接触概率。Usually, the diameter of the conductive medium used in the barrel plating method is larger than the interval of the external electrodes, and the contact probability to the internal
因此,在本实施例中,可以在位于内侧的电极13b的镀层厚度与位于两端的外部电极13a的镀层厚度几乎相同的条件下成膜,在往基板安装时的连接不良等问题可以消除。Therefore, in this embodiment, it is possible to form a film under the condition that the plating thickness of the
在尺寸上顺便举一例说明,单元体10的大小为长2.0mm、宽1.0mm、高0.5mm,外部电极13a的宽度a为0.23mm,外部电极13b的宽度b为0.25mm,电极间隔为0.5mm。还有,滚镀法所使用的导电性媒体的直径为0.8mm。In terms of size, by the way, as an example, the size of the
另一方面,如图3所示,有可能在装有芯片型多联电子器件的基板20上形成有与两端的电极13a对应的连接盘21a,该连接盘比与内侧的电极13b对应的连接盘21b大。在使用这样的基板20的情况下,与连接盘21a相比,连接盘21b其焊锡量减少。但是,在本实施例中,与连接盘21b对应的外部电极13b的宽度被加大设定,因此,可以确保与焊锡量少的连接盘21b之间的焊接性。On the other hand, as shown in FIG. 3 , it is possible to form lands 21a corresponding to the
另外的实施例Another example
还有,与本实施例相关的芯片型多联电子器件并不限于上述实施例,在其要旨的范围内可以进行各种各样的变更。In addition, the chip-type multi-connection electronic device related to this embodiment is not limited to the above-described embodiment, and various changes can be made within the scope of the gist thereof.
特别是作为电子元件除了上述电容器之外还可以有电感和电阻等各种各样的元件,陶瓷薄片的材料除了电介体之外也可以根据元件的种类使用磁性体、绝缘体等各种各样的材料。还有,对于外部电极也可以采用除上述实施例所说明的之外的材料和方法,也可以是3层构造。In particular, as electronic components, various components such as inductors and resistors can be used in addition to the above-mentioned capacitors, and various materials such as magnetic materials, insulators, etc. can be used for ceramic sheets in addition to dielectrics depending on the type of components s material. Also, materials and methods other than those described in the above-mentioned embodiments may be used for the external electrodes, and a three-layer structure may also be used.
由以上的说明可知,根据本发明,加宽了位于除两端之外的内侧上的外部电极的宽度,因此,可以防止该电极的镀层变薄,并可以得到与位于两端的电极的镀层几乎同样的厚度,还可以消除往基板的安装不良等问题。还有,对于面积小的连接盘也可以确保足够的焊接性。As can be seen from the above description, according to the present invention, the width of the external electrode located on the inner side except both ends is widened, so that the plating layer of this electrode can be prevented from becoming thinner, and the plating layer of the electrode positioned at both ends can be obtained. The same thickness can also eliminate problems such as poor mounting to the substrate. In addition, sufficient solderability can be ensured even for small-area lands.
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2000178289A JP3765225B2 (en) | 2000-06-14 | 2000-06-14 | Chip-type multiple electronic components |
JP178289/2000 | 2000-06-14 |
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CN1329342A CN1329342A (en) | 2002-01-02 |
CN1172337C true CN1172337C (en) | 2004-10-20 |
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CNB011187875A Expired - Lifetime CN1172337C (en) | 2000-06-14 | 2001-06-13 | chip type multi-connection electronic device |
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JP (1) | JP3765225B2 (en) |
KR (1) | KR100418602B1 (en) |
CN (1) | CN1172337C (en) |
TW (1) | TW508602B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
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US6950300B2 (en) * | 2003-05-06 | 2005-09-27 | Marvell World Trade Ltd. | Ultra low inductance multi layer ceramic capacitor |
JP4091054B2 (en) * | 2004-07-20 | 2008-05-28 | 三星電機株式会社 | Multilayer ceramic capacitor |
JP4276649B2 (en) * | 2005-09-27 | 2009-06-10 | Tdk株式会社 | Feedthrough multilayer capacitor array and mounting structure of feedthrough multilayer capacitor array |
DE102007046607A1 (en) | 2007-09-28 | 2009-04-02 | Epcos Ag | Electrical multilayer component and method for producing an electrical multilayer component |
KR101228688B1 (en) | 2010-11-25 | 2013-02-01 | 삼성전기주식회사 | Multi-layered ceramic capacitor |
KR101499716B1 (en) * | 2013-06-05 | 2015-03-09 | 삼성전기주식회사 | The array type chip resister and method for manufacture thereof |
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JP3401338B2 (en) * | 1994-10-27 | 2003-04-28 | ローム株式会社 | Multilayer ceramic capacitor array |
JPH1116777A (en) * | 1997-06-20 | 1999-01-22 | Taiyo Yuden Co Ltd | Chip array electronic component |
JP3336954B2 (en) * | 1998-05-21 | 2002-10-21 | 株式会社村田製作所 | Multilayer capacitors |
JP2000114100A (en) * | 1998-09-30 | 2000-04-21 | Matsushita Electric Ind Co Ltd | Multiple electronic components |
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2000
- 2000-06-14 JP JP2000178289A patent/JP3765225B2/en not_active Expired - Lifetime
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2001
- 2001-06-12 KR KR10-2001-0032848A patent/KR100418602B1/en not_active Expired - Lifetime
- 2001-06-12 TW TW090114127A patent/TW508602B/en not_active IP Right Cessation
- 2001-06-13 CN CNB011187875A patent/CN1172337C/en not_active Expired - Lifetime
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Publication number | Publication date |
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KR100418602B1 (en) | 2004-02-11 |
CN1329342A (en) | 2002-01-02 |
TW508602B (en) | 2002-11-01 |
KR20010112629A (en) | 2001-12-20 |
JP3765225B2 (en) | 2006-04-12 |
JP2001358034A (en) | 2001-12-26 |
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