CN117176077A - Transient IV test equipment and method for perovskite crystal silicon laminated battery - Google Patents

Abstract

The invention discloses a transient IV test device of a perovskite crystal silicon laminated battery, which comprises a rack, a lamp box and a test platform, wherein the lamp box and the test platform are arranged on the rack; a power supply system for supplying power to the lamp box and the test platform is arranged in the rack; a sunlight simulator and a concave-convex mirror component are arranged in the lamp box; the sunlight simulator comprises an arc xenon lamp and an LED lamp array, and the arc xenon lamp is positioned in the middle of the LED lamp array; the LED lamp array is used as an auxiliary light source, and steady-state light soaking irradiation is carried out on a sample to be tested before IV test; the arc xenon lamp is used as a transient light source for testing an IV characteristic curve of a sample to be tested; the concave-convex mirror component is positioned below the sunlight simulator and is used for converting the light rays of the point light source emitted by the sunlight simulator into parallel light with equal intensity, and the lower part of the concave-convex mirror component is used as the light emitting side of the lamp box; the test platform is located the below of lamp house, and is provided with the anchor clamps that are used for fixed sample to be tested and the probe that is used for being connected with the sample to be tested on the test platform.

Description

A transient IV test equipment and method for perovskite crystalline silicon stacked cells

Technical field

The invention relates to the technical field of photovoltaic module product testing, and in particular to a transient IV testing equipment and method for perovskite crystalline silicon stacked cells.

Background technique

After long-term development, crystalline silicon solar cells have reached their efficiency bottleneck. In order to achieve grid parity for crystalline silicon cells, the photovoltaic industry needs to be iteratively upgraded. As the most promising next-generation photovoltaic products, perovskite and crystalline silicon stacked cells have attracted R&D investment from all crystalline silicon manufacturers. Accurate and rapid maximum power point calibration and current-voltage (IV) curve testing of perovskite crystalline silicon stacked cells are an inevitable and important part of the industrial production process with high yield and high tempo.

In the production process of traditional crystalline silicon cells and modules, solar transient simulators and fast-scanning electronic loads are often used to obtain IV curves in a standard test environment (25°C, 1000W/m ² , AM 1.5). The entire IV curve scan time No more than 100ms. Perovskite solar cells will rearrange themselves under different device voltages due to the intrinsic free-moving ions within their crystal structure. Every time the operating voltage is changed, the operating current of the perovskite solar cell often needs to be adjusted at a new voltage and constant It takes a long time (>10s) under light conditions to reach a stable state. Before the free ions are rearranged to reach a stable state, the IV test results are affected by the built-in electric field caused by the movement of free ions, causing serious distortion in the transient test IV curve. The hysteresis effect and inaccurate results, and the array of point light sources cannot guarantee the intensity distribution of the light source on the light-receiving surface of the component, making it difficult to meet the test requirements.

Therefore, in order to achieve accurate testing of perovskite crystalline silicon stacked cells and ensure irradiation uniformity and stability, it is crucial to develop and design equipment suitable for IV testing of perovskite crystalline silicon stacked cells.

Contents of the invention

In order to solve the problems raised in the above background technology, the technical solution adopted by the present invention is:

A transient IV test equipment for perovskite crystalline silicon stacked cells, including a rack, a light box and a test platform installed on the rack;

The rack is equipped with a power supply system for supplying power to the light box and test platform;

A solar simulator and a concave-convex mirror assembly are installed in the light box;

The solar simulator includes an arc xenon lamp and an LED lamp array, and the arc xenon lamp is located in the middle of the LED lamp array;

The LED lamp array is used as an auxiliary light source to perform steady-state light immersion irradiation on the sample to be tested before the IV test;

The arc xenon lamp is used as a transient light source to test the IV characteristic curve of the sample to be tested;

The concave-convex mirror assembly is located below the solar simulator and is used to convert the light from the point light source emitted by the solar simulator into parallel light of equal intensity, and the lower part of the concave-convex mirror assembly serves as the light-emitting side of the light box;

The test platform is located below the light box, and the test platform is provided with a clamp for fixing the sample to be tested and a probe for connecting to the sample to be tested.

In some embodiments, the number of the arc xenon lamps is two, and the two arc xenon lamps are symmetrically arranged and both are located in the middle of the LED lamp array;

There is a filter directly below each arc xenon lamp, and one of the arc xenon lamps is used to match the spectrum of the perovskite cell, and the other arc xenon lamp is used to match the spectrum of the crystalline silicon cell.

In some embodiments, the constant light time of the LED lamp array is between 0-30s, the spectral range is between 400-800nm, and the irradiance range is between 200-1200W/ ^m2 .

In some embodiments, the constant light time of the arc xenon lamp is between 10-200ms, the spectral range is between 300-1200nm, the irradiance range is between 200-1000W/ ^m2 , and the spectrum can be provided in compliance with AM1 .5 Simulated sunlight required by standards.

In some embodiments, the meniscus mirror assembly includes a layer of Fresnel lenses, a layer of fly-eye lenses and another layer of Fresnel lenses in sequence from top to bottom.

In some embodiments, in the light box, a ceramic reflective layer is further provided on the inner wall of the area between the solar simulator and the concave-convex mirror assembly.

In some embodiments, a cooling aluminum plate is also provided on the back of the LED light array.

In some embodiments, a cooling water tank is further included. A cooling water pipe network is provided in the frame and the light box, and the cooling water tank and the cooling water pipe network are connected through pipelines.

In some embodiments, the testing platform is also equipped with an electronic temperature control device and a temperature sensor to maintain the temperature of the sample under test at a preset value during the testing process.

On the other hand, the present invention provides a transient IV testing method for perovskite crystalline silicon stacked cells, which adopts the above-mentioned transient IV testing equipment for perovskite crystalline silicon stacked cells and includes the following steps:

S1. Place the battery to be tested on the test platform, fix the solar cell with the clamp, and press the probe accurately on the electrode of the battery to be tested;

S2. Set the temperature control temperature on the host computer to 25°C. The electronic temperature control devices and temperature sensors installed on the test platform work to stabilize the temperature of the battery under test at 25°C;

S3. Turn on the LED light array, continuously illuminate the battery to be tested for 30 seconds, and set the irradiation intensity to 1000W/m ² ;

S4. Turn off the LED light array, start the arc xenon lamp, set the irradiation intensity to 1000W/m ² , and set the constant light time to 100ms. At the same time, scan the IV curve of the battery to be tested, and adjust the driving current of the arc xenon lamp so that One of the arc xenon lamps matches the spectrum of the perovskite cell, and the other arc xenon lamp matches the spectrum of the crystalline silicon cell;

S5. After the test is completed, the IV curve is drawn in the host computer software and the relevant test results are obtained.

Compared with the prior art, the beneficial effects of the present invention are:

The transient IV testing equipment and method of the perovskite crystalline silicon stacked battery provided by the present invention uses an LED lamp array as an auxiliary light source for steady-state exposure. Before the transient IV scan, the LED lamp array is irradiated to make the calcium The ion movement of the titanium crystalline silicon stacked battery reaches a balance; using an arc xenon lamp as a transient test light source can achieve accurate and rapid collection of IV scanning curves of the perovskite crystalline silicon stacked battery; and parallel convex and concave mirror components are obtained light to ensure that the irradiation uniformity of the light-receiving area is within the controllable error range to ensure irradiation uniformity and stability; two arc xenon lamps are used to match the perovskite cell spectrum and the crystalline silicon cell spectrum, which can meet the requirements of perovskite cells. The IV testing requirements of mineral-crystalline silicon stacked cells solve the problem that the spectrum cannot respond simultaneously; the invention takes into account the inherent characteristics of perovskite cell and crystalline silicon cell testing, can realize industrialized and efficient applications, and meets the needs of high-precision monitoring.

Description of drawings

Figure 1 is a schematic diagram of the transient IV testing equipment of the perovskite crystalline silicon stacked battery provided by the present invention;

Figure 2 is a schematic diagram of the interior of the light box.

Explanation of reference signs: 1. Rack; 2. Light box; 3. Test platform; 4. Cooling water tank; 5. Pipeline; 6. Fixture; 7. Probe; 21. Arc xenon lamp; 22. LED light array; 23. Fresnel lens; 24. Compound eye lens; 25. Ceramic reflective layer; 26. Cooling aluminum plate.

Detailed ways

In order to make it easy to understand the technical means, creative features, objectives and effects of the present invention, how the present invention is implemented will be further explained below in conjunction with the accompanying drawings and specific implementation modes.

Referring to Figures 1 and 2, the present invention provides a transient IV test equipment for perovskite crystalline silicon stacked cells, including a frame 1, a light box 2 and a test platform 3 installed on the frame 1; The rack 1 is provided with a power supply system for powering the light box 2 and the test platform 3; the light box 2 is equipped with a solar simulator and a concave and convex mirror assembly; the solar simulator includes an arc xenon lamp 21 and an LED light array 22, and the arc The xenon lamp 21 is located in the middle of the LED lamp array 22; the LED lamp array 22 is used as an auxiliary light source to perform steady-state light immersion irradiation on the sample to be tested before the IV test; the arc xenon lamp 21 is used as a transient light source to perform IV on the sample to be tested. Test of the characteristic curve; the concave-convex mirror assembly is located below the solar simulator and is used to convert the light from the point light source emitted by the solar simulator into parallel light of equal intensity, and the lower part of the concave-convex mirror assembly serves as the luminous side of the light box 2; The test platform 3 is located below the light box 2, and is provided with a clamp 6 for fixing the sample to be tested and a probe 7 for connecting to the sample to be tested.

Preferably, the number of arc xenon lamps 21 is two, and the two arc xenon lamps 21 are symmetrically arranged and both are located in the middle of the LED lamp array 22; a filter is provided directly below each arc xenon lamp 21, and wherein One arc xenon lamp 21 is used to match the spectrum of the perovskite cell, and the other arc xenon lamp 21 is used to match the spectrum of the crystalline silicon cell.

Perovskite crystalline silicon stacked batteries are composed of perovskite battery materials and crystalline silicon battery materials. However, perovskite battery materials are very different from crystalline silicon battery materials, making the batteries of the two materials different. Different light absorption peaks appear at different wavelengths. In reality, the spectral matching degree of the solar simulator cannot be completely consistent with the standard spectrum. Therefore, the ordinary solar simulator spectrum cannot meet the spectral response requirements of perovskite cells and crystalline silicon cells at the same time. The present invention uses two arc xenon lamps 21, and each is equipped with a special filter. Combined with the adjustment of the driving current of the arc xenon lamp 21, the overall spectrum is adjustable, so that the two arc xenon lamps 21 can match the perovskite battery respectively. The spectrum and matching crystalline silicon cell spectrum can meet the IV testing requirements of perovskite crystalline silicon stacked cells and solve the problem that the spectrum cannot respond at the same time.

Preferably, the constant light time of the LED lamp array 22 is between 0-30s, the spectrum range is between 400-800nm, and the irradiance range is between 200-1200W/ ^m2 .

Preferably, the constant light time of the arc xenon lamp 21 is between 10-200ms, the spectrum range is between 300-1200nm, the irradiance range is between 200-1000W/ ^m2 , and it can provide a spectrum that meets the requirements of the AM1.5 standard of simulated sunlight.

The present invention uses the LED lamp array as the auxiliary light source for steady-state exposure. Before the transient IV scan, the ion movement of the perovskite crystalline silicon stacked battery can be balanced through the LED lamp array irradiation; the arc xenon lamp is used as the instantaneous IV scan. The state test light source can realize accurate and fast collection of IV scanning curves of perovskite crystalline silicon stack cells.

Preferably, the meniscus mirror assembly includes a layer of Fresnel lenses 23, a layer of fly-eye lenses 24 and another layer of Fresnel lenses 23 in sequence from top to bottom. The invention obtains parallel light through the concave and convex mirror assembly, ensuring that the irradiation uniformity of the light-receiving area is within a controllable error range, and ensuring the irradiation uniformity and stability.

Preferably, in the light box 2 , a ceramic reflective layer 25 is also provided on the inner wall of the area between the solar simulator and the meniscus mirror assembly.

Preferably, a cooling aluminum plate 26 is also provided on the back of the LED lamp array 22 .

Preferably, the transient IV test equipment of the perovskite crystalline silicon stacked battery also includes a cooling water tank 4. A cooling water pipe network is provided in the frame 1 and the light box 2. The cooling water tank 4 and the cooling water pipe network are connected by a pipeline 5. Connected. Through the cooling water tank 4 and the corresponding cooling water pipe network, the temperature of the LED lamp array can be controlled at about 30°C.

Preferably, the test platform 3 is also equipped with an electronic temperature control device and a temperature sensor, which are used to maintain the temperature of the sample under test at a preset value during the test, such as the standard test temperature of 25°C.

In addition, it can be understood that a main control unit can also be installed in the rack 1 to realize various control functions, and the main control unit can be connected to an external host computer through Ethernet. Users can set various module parameters, test plans, etc. on the host computer, and control the start of testing, collect test data, display test IV curves, calculate and display test results, and store relevant test data and results in the database. The main control unit can be used to receive all instructions from the host computer and forward them to each unit, control the relevant operating logic and timing of the xenon light source and LED light source, test the tested sample, collect the original data of current and voltage, and then upload it to the host computer.

On the other hand, the present invention provides a transient IV testing method for perovskite crystalline silicon stacked cells, which adopts the above-mentioned transient IV testing equipment for perovskite crystalline silicon stacked cells and includes the following steps:

S1. Place the battery to be tested on the test platform 3, fix the solar cell with the clamp 6, and press the probe 7 accurately on the electrode of the battery to be tested;

S2. Set the temperature control temperature on the host computer to 25°C. The electronic temperature control device and temperature sensor installed on the test platform 3 work to stabilize the temperature of the battery to be tested at 25°C;

S3. Turn on the LED light array 22, continuously illuminate the battery to be tested for 30 seconds, and set the irradiation intensity to 1000W/ ^m2 ;

S4. Turn off the LED light array 22, start the arc xenon lamp 21, set the irradiation intensity to 1000W/ ^m2 , and set the constant light time to 100ms. At the same time, scan the IV curve of the battery to be tested, and adjust the drive of the arc xenon lamp 21. current, so that one of the arc xenon lamps 21 matches the spectrum of the perovskite cell, and the other arc xenon lamp 21 matches the spectrum of the crystalline silicon cell;

S5. After the test is completed, the IV curve is drawn in the host computer software and the relevant test results are obtained.

In summary, the transient IV test equipment for perovskite crystalline silicon stacked cells provided by the present invention uses an LED lamp array as an auxiliary light source for steady-state exposure. Before the transient IV scan, the LED lamp array is irradiated to enable The ion movement of the perovskite crystalline silicon stacked cell reaches a balance; using an arc xenon lamp as a transient test light source can achieve accurate and fast collection of IV scanning curves of the perovskite crystalline silicon stacked cell; and obtain it through the concave and convex mirror assembly Parallel light ensures that the irradiation uniformity of the light-receiving area is within the controllable error range and ensures irradiation uniformity and stability; two arc xenon lamps are used to match the perovskite cell spectrum and the crystalline silicon cell spectrum respectively, which can meet the requirements of calcium The IV testing requirements of titanium crystalline silicon stacked cells solve the problem that the spectrum cannot respond simultaneously; the invention takes into account the inherent characteristics of perovskite cell and crystalline silicon cell testing, can realize industrialized and efficient application, and meets the needs of high-precision monitoring .

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not limiting. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be modified. Modifications or equivalent substitutions without departing from the spirit and scope of the technical solution of the present invention shall be included in the scope of the claims of the present invention.

Claims (10)

1. A transient IV test equipment for perovskite crystalline silicon stacked cells, which is characterized in that it includes a rack (1), a light box (2) and a test platform (3) installed on the rack (1); The rack (1) is provided with a power supply system for supplying power to the light box (2) and the test platform (3); A solar simulator and a concave-convex mirror assembly are installed in the light box (2); The solar simulator includes an arc xenon lamp (21) and an LED lamp array (22), and the arc xenon lamp (21) is located in the middle of the LED lamp array (22); The LED lamp array (22) is used as an auxiliary light source to perform steady-state light immersion irradiation on the sample to be tested before the IV test; The arc xenon lamp (21) is used as a transient light source to test the IV characteristic curve of the sample to be tested; The concave-convex mirror assembly is located below the solar simulator and is used to convert the light from the point light source emitted by the solar simulator into parallel light of equal intensity, and the lower part of the concave-convex mirror assembly serves as the light-emitting side of the light box (2) ; The test platform (3) is located below the light box (2), and the test platform (3) is provided with a clamp (6) for fixing the sample to be tested and a probe (7) for connecting to the sample to be tested. 2. A transient IV testing method for perovskite crystalline silicon stacked cells, characterized in that the number of the arc xenon lamps (21) is two, and the two arc xenon lamps (21) are symmetrically arranged and evenly spaced. Located in the middle of the LED light array (22); A filter is provided directly below each arc xenon lamp (21), and one of the arc xenon lamps (21) is used to match the spectrum of the perovskite cell, and the other arc xenon lamp (21) is used to match the crystalline silicon cell. spectrum. 3. The transient IV test equipment of the perovskite crystalline silicon stacked battery according to claim 1, characterized in that the constant light time of the LED lamp array (22) is between 0-30s, and the spectral range is 400 -800nm, and the irradiance range is between 200-1200W/ ^m2 . 4. The transient IV test equipment of the perovskite crystalline silicon stacked battery according to claim 1, characterized in that the constant light time of the arc xenon lamp (21) is between 10-200ms, and the spectral range is 300 -1200nm, the irradiance range is between 200-1000W/ ^m2 , and can provide simulated sunlight with a spectrum that meets the requirements of the AM1.5 standard. 5. The transient IV test equipment for the perovskite crystalline silicon stacked battery according to claim 1, characterized in that the concave and convex mirror assembly sequentially includes a layer of Fresnel lens (23), a layer of Fresnel lens (23) from top to bottom. A layer of fly eye lens (24) and another layer of Fresnel lens (23). 6. The transient IV test equipment for perovskite crystalline silicon stacked cells according to claim 1, characterized in that, in the light box (2), the area between the solar simulator and the concave-convex mirror assembly A ceramic reflective layer (25) is also provided on the inner wall. 7. The transient IV test equipment for perovskite crystalline silicon stacked cells according to claim 1, characterized in that a cooling aluminum plate (26) is also provided on the back of the LED lamp array (22). 8. The transient IV test equipment for perovskite crystalline silicon stacked cells according to claim 1, characterized in that it also includes a cooling water tank (4), which is provided in the frame (1) and the light box (2). There is a cooling water pipe network, and the cooling water tank (4) and the cooling water pipe network are connected through a pipeline (5). 9. The transient IV test equipment for perovskite crystalline silicon stacked cells according to claim 1, characterized in that the test platform (3) is also equipped with an electronic temperature control device and a temperature sensor for use in During the test, the temperature of the sample being tested is maintained at the preset value. 10. A transient IV testing method for a perovskite crystalline silicon stacked battery, characterized in that the transient IV testing equipment for a perovskite crystalline silicon stacked battery according to any one of claims 2 to 9 is used, And includes the following steps: S1. Place the battery to be tested on the test platform (3), fix the solar cell with the clamp (6), and press the probe (7) accurately on the electrode of the battery to be tested; S2. Set the temperature control temperature in the host computer to 25°C, and the electronic temperature control device and temperature sensor installed on the test platform (3) work to stabilize the temperature of the battery to be tested at 25°C; S3. Turn on the LED light array (22), continuously illuminate the battery to be tested for 30 seconds, and set the irradiation intensity to 1000W/m ² ; S4. Turn off the LED light array (22), start the arc xenon lamp (21), set the irradiation intensity to 1000W/m ² , and set the constant light time to 100ms. At the same time, scan the IV curve of the battery to be tested, and adjust the arc The driving current of the xenon lamps (21) is such that one of the arc xenon lamps (21) matches the perovskite cell spectrum, and the other arc xenon lamp (21) matches the crystalline silicon cell spectrum; S5. After the test is completed, the IV curve is drawn in the host computer software and the relevant test results are obtained.