CN116990555B - Test bench base and testing device thereof - Google Patents
Test bench base and testing device thereof Download PDFInfo
- Publication number
- CN116990555B CN116990555B CN202311033670.9A CN202311033670A CN116990555B CN 116990555 B CN116990555 B CN 116990555B CN 202311033670 A CN202311033670 A CN 202311033670A CN 116990555 B CN116990555 B CN 116990555B
- Authority
- CN
- China
- Prior art keywords
- test
- adjusting
- module
- cavity
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 115
- 238000001816 cooling Methods 0.000 claims abstract description 22
- 238000010438 heat treatment Methods 0.000 claims abstract description 18
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 26
- 229910052739 hydrogen Inorganic materials 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 9
- 230000009286 beneficial effect Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 238000011056 performance test Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The application discloses a test bench base and a test device thereof, which relate to the technical field of detection, wherein the test bench base comprises: a bottom plate; the testing cavity is arranged on the bottom plate, and an opening is arranged above the testing cavity; the electric plugboard is arranged on the bottom plate, and the plug-in port of the electric plugboard faces the test cavity; the adjusting component is arranged at the bottom of the test cavity; the adjusting bracket is arranged in the test cavity, is matched with the adjusting component and moves up and down under the drive of the adjusting component; the cooling module is arranged on the adjusting bracket; the heating module is arranged on the cooling module; the heat conduction block is arranged on the heating module. The application also discloses a testing device which comprises the testing table base, and solves the technical problem that the testing cannot be completed stably when the existing TO-type products are tested.
Description
Technical Field
The invention relates to the technical field of testing devices, in particular to a test bench base and a testing device thereof.
Background
After the optical device is produced, electrical and optical properties of the optical device are typically tested, wherein the electrical properties include: power, current, voltage and curve testing, while optical properties include spectral coupling testing and the like,
Therefore, the corresponding optical device needs to be placed in a corresponding testing device to be electrified, and then the performance test is completed.
The existing test mode generally adopts a test fixture to directly clamp a product to be tested, specifically, the product is contacted with the heat conducting block through a screw or buckle mode, but after long-time use, the screw needs to be periodically replaced, and when the heat conducting block deforms, the heat conducting block cannot be well adapted to fit after deformation.
Disclosure of Invention
The invention aims TO provide a test board base and a test device thereof, which solve the technical problem that the test cannot be stably completed when TO products in the prior art are tested.
The embodiment of the application discloses a test bench base, which comprises:
A bottom plate;
the testing cavity is arranged on the bottom plate, and an opening is arranged above the testing cavity;
the electric plugboard is arranged on the bottom plate, and a plughole of the electric plugboard faces the test cavity;
The adjusting component is arranged at the bottom of the test cavity;
The adjusting bracket is arranged in the test cavity, is matched with the adjusting component and moves up and down under the drive of the adjusting component;
The cooling module is arranged on the adjusting bracket;
The heating module is arranged on the cooling module;
And the heat conducting block is arranged on the heating module.
The application is provided with the cooling module and the heating module, is used for providing a detectable environment, and is also provided with the adjusting bracket and the adjusting component, so that the product to be detected can be ensured to be stably positioned on the testing cavity, and the subsequent detection is facilitated.
Based on the technical scheme, the embodiment of the application can be further improved as follows:
Further, the test cavity is a closed cavity with an upper opening formed by connecting a plurality of shielding plates, and the beneficial effect of the adoption of the method is that a stable detection environment can be provided through the closed cavity.
Further, the upside of test chamber is provided with two test guide rails, test guide rail set up in the both sides that the opening is relative, just test guide rail's inboard is provided with spacing, adopts the beneficial effect of this step to guarantee the stability when follow-up product cartridge of waiting to detect through spacing.
Furthermore, a gap is reserved between the bottom side of the limiting strip and the upper surface of the opening, and the beneficial effects of the method are that the inserting is convenient through the gap, and the clamping is convenient after the subsequent adjusting assembly is adjusted.
Further, the adjustment assembly includes:
The adjusting cylinder is horizontally arranged at the bottom of the test cavity, and the piston rod end of the adjusting cylinder moves along the horizontal direction;
the adjusting block is arranged at the piston rod end of the adjusting cylinder;
the limiting columns are arranged on two sides of the adjusting block;
the side of adjusting the support is provided with the adjustment tank, the adjustment tank with spacing post cooperatees, adopts the beneficial effect of this step to be through adjusting the horizontal movement of cylinder can change into up-and-down motion.
Further, springs are arranged at the bottoms of the periphery of the adjusting bracket;
The adjustment tank includes:
A first adjustment section;
The second adjusting section, the second adjusting section with first adjusting section intercommunication, just the second adjusting section tilt up extends, adopts the beneficial effect of this step to realize the reduction through the spring, and the stable up-and-down motion of adjusting the support can be realized to the adjustment tank simultaneously.
Further, the height of the first adjusting section is H, and the width of the second adjusting section is D, H > D;
The bottom interval of test chamber is provided with many vertical guide posts, the guide post with adjust the bottom swing joint of support.
Further, the cooling module includes:
The cold water cavity is arranged in the adjusting bracket;
the water inlet is communicated with one side of the cold water cavity;
the water outlet is communicated with the other side of the cold water cavity, and the water inlet and the water outlet are arranged opposite to each other;
the heating module includes:
The module bracket is arranged on the cold water cavity and is provided with a plurality of clamping grooves;
At least one TEC module is arranged inside the clamping groove, and the beneficial effects of the method are that different requirements can be met through the cooling module and the heating module.
The application also discloses a testing device, which comprises:
A housing;
the mounting seat is mounted in the shell;
The test board base is arranged on the mounting base;
The first movement module is arranged on the mounting seat;
The second motion module is arranged on the motion end of the first motion module;
The integrating sphere testing component is arranged on the moving end of the second moving module, and the testing end of the integrating sphere testing component faces downwards;
And the device performance testing assembly is arranged on the moving end of the first moving module.
Based on the technical scheme, the embodiment of the application can be further improved as follows:
further, the movement direction of the first movement module is a horizontal direction, and the movement direction of the second movement module is a vertical direction.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1. The application is provided with the cooling module and the heating module, can provide different detection environments, ensures the diversity of the test result, and can better obtain the quality of the product.
2. The application is provided with the adjusting component and the adjusting bracket, and realizes the stable up-and-down movement of the adjusting bracket through the back-and-forth movement of the adjusting component, thereby supporting the product to be detected and ensuring the stability of the subsequent detection.
3. The application is provided with the corresponding movement module, and can realize the adjustment of the position of the detection assembly, thereby improving the detection efficiency.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic view of a test bench base according to an embodiment of the invention;
FIG. 2 is a schematic view of the structure of the interior of FIG. 1;
FIG. 3 is a schematic view of another angle of FIG. 1;
FIG. 4 is a schematic structural diagram of a testing device according to an embodiment of the present invention;
specific reference numerals are as follows:
1-a bottom plate; 2-a test chamber; 3-an electrical card; 4-an adjustment assembly; 5-adjusting the bracket; 6-a cooling module; 7-a heating module; 8-a heat conduction block; 9-testing the guide rail; 10-limiting strips; 11-a guide post; 12-a housing; 13-a mounting base; 14-a test bench base; 15-a first motion module; 16-a second motion module; 17-integrating sphere test assembly; 18-a device performance test assembly;
201-opening;
401-adjusting a cylinder; 402-an adjustment block; 403-a limit column;
501-an adjustment tank; 502-a spring; 503-a first adjustment segment; 504-a second adjustment section;
601-a cooling chamber; 602-a water inlet; 603-a water outlet;
701-module rack; 702-a clamping groove; 703-TEC module.
Detailed Description
Embodiments of the technical scheme of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are only for more clearly illustrating the technical aspects of the present invention, and thus are merely examples, and are not intended to limit the scope of the present invention.
It is noted that unless otherwise indicated, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this application belongs.
In the present application, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; may be a mechanical connection; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art according to the specific circumstances.
In order to better understand the above technical solutions, the following detailed description will refer to the accompanying drawings and specific embodiments.
Examples:
1-3, the embodiment of the application discloses a test board base, which is compatible with TO56, TO46, TO90, vcselTO and a plurality of different types of products by clamping TO products, so that the follow-up completion of current, voltage, power and other parameter tests is facilitated;
The concrete structure comprises:
a base plate 1, wherein the base plate 1 is a flat plate and is used for installing subsequent related components;
The testing cavity 2 is arranged on the bottom plate 1, an opening 201 is formed above the testing cavity 2, and other parts of the testing cavity 2 except the top opening are sealed, so that the temperature can be stored, the subsequent testing is convenient, and the testing environment is 10-100 ℃;
The electric plugboard 3 is arranged on the bottom plate 1, a plug-in port of the electric plugboard 3 faces the test cavity 2, and the electric plugboard 3 is used for providing power and is communicated with a product to be tested so as to facilitate subsequent electric performance test;
the adjusting component 4 is arranged at the bottom of the testing cavity 2, and the adjusting component 4 is used for adjusting subsequent components to prop against the bottom of a product to be tested, so that the stability in subsequent testing is facilitated;
The adjusting bracket 5 is arranged in the test cavity 2, the adjusting bracket 5 is matched with the adjusting component 4 and moves up and down under the drive of the adjusting component 4, and the adjusting bracket 5 can move up and down;
The cooling module 6 is arranged on the adjusting bracket 5, and the cooling module 6 is used for cooling;
a heating module 7 mounted on the cooling module 6, where the heat conducting module 7 may be an existing TEC module, or other heating modules;
And a heat conducting block 8, which is arranged on the heating module 7, wherein the heat conducting block 8 is used for conducting heat and transferring heat, the heat conducting block 8 is arranged inside the test cavity 2, and the upper surface of the heat conducting block 8 is flush with the upper surface of the opening 201.
Specifically, the test cavity 2 is a closed cavity with an upper opening formed by connecting a plurality of shielding plates, and specifically, the shielding plates are connected by bolts.
In an embodiment, two test guide rails 9 are disposed on the upper side of the test chamber 2, the test guide rails 9 are disposed on two opposite sides of the opening 201, and a limit bar 10 is disposed on the inner side of the test guide rails 9; the test guide rail 9 is convenient for inserting the product to be detected, and the side surface of the product to be detected is provided with a groove which is matched with the limit strip 10, so that the product to be detected is convenient for disassembly and assembly.
The clearance is reserved between the bottom side of the limit bar 10 and the upper surface of the opening 201, so that after the subsequent adjusting component 4 moves, the heating module and the cooling module can be pushed to move upwards, the heat conducting block 8 can prop against the bottom of a product to be detected, stability is guaranteed, floating clamping is realized, and the subsequent heat conducting block can be attached better.
In a further embodiment, the adjustment assembly 4 comprises:
the adjusting cylinder 401 is horizontally arranged at the bottom of the test cavity 2, and the piston rod end of the adjusting cylinder 401 moves along the horizontal direction;
An adjusting block 402 mounted on a rod end of the adjusting cylinder 401;
a plurality of limit posts 403 mounted on both sides of the adjustment block 402;
The side of the adjusting bracket 5 is provided with an adjusting groove 501, the adjusting groove 501 is matched with the limiting post 403, the moving mode of the adjusting bracket 5 is that the adjusting cylinder 401 pushes the adjusting block 402 to move back and forth, and at the moment, the limiting post 403 moves back and forth in the adjusting groove 501, so that the adjusting bracket 5 is pulled to move, and the adjusting bracket 5 is driven to move up and down.
The springs 502 are arranged at the bottoms of the periphery of the adjusting bracket 5, the springs 502 can reset, follow-up floating clamping is convenient, if the heat conducting blocks deform, bonding can be achieved through the floating clamping of the springs, and the test result is ensured;
The adjustment tank 501 includes:
A first adjustment section 503;
a second adjustment section 504, the second adjustment section 504 is in communication with the first adjustment section 503, and the second adjustment section 504 extends obliquely upward, and the limit post 403 moves inside the first adjustment section 503 and the second adjustment section 504.
Wherein the height of the first adjusting section 503 is H, and the width of the second adjusting section 504 is D, H > D; since the adjusting bracket 5 needs to move up and down during the adjustment, the specific shape and structure of the adjusting groove 501 needs to be designed;
The bottom interval of test chamber 2 is provided with many vertical guide post 11, guide post 11 with adjust the bottom swing joint of support 5, when can guaranteeing to adjust support 5 motion like this, can stabilize from top to bottom, specifically adjust support 5 the bottom offered with guide post 11 matched with guide slot.
In a further embodiment, the cooling module 6 comprises:
the cooling cavity 601 is arranged in the adjusting bracket 5, and the cooling cavity 601 is used for introducing cold water so as to facilitate subsequent cooling;
A water inlet 602, which is communicated with one side of the cold water cavity 601;
A water outlet 603, which is communicated with the other side of the cold water cavity 601, wherein the water inlet 602 is opposite to the water outlet 603;
the heating module 7 comprises:
A module bracket 701, which is mounted on the cold water cavity 601, and a plurality of clamping grooves 702 are arranged on the module bracket 701;
At least one TEC module 703 is disposed inside the card slot 702, i.e. the corresponding module is used to facilitate subsequent heating.
As shown in fig. 4, the present application further discloses a testing device, including:
a housing 12, the housing 12 being provided with a fitting chamber inside for mounting corresponding components, such as a control unit, a detection unit, etc.;
A mounting base 13 mounted inside the housing 12, the mounting base 13 being used for assembling subsequent components;
The aforementioned test board base 14 is disposed on the mounting base 13, and the test board base 14 is used for clamping related test products and providing a corresponding test environment;
the first movement module 15 is arranged on the mounting seat 13, and the first movement module 15 is an existing movement module and is used for providing power for transverse movement;
The second motion module 16 is installed on the motion end of the first motion module 15, and the second motion module 16 is an existing motion module and is used for providing power for vertical motion;
the integrating sphere testing assembly 17 is arranged on the moving end of the second moving module 16, and the testing end of the integrating sphere testing assembly 17 faces downwards;
The device performance testing component 18 is mounted on the moving end of the first moving module 15, where the device performance testing component 18 is used for performing optical performance testing, electrical performance testing such as spectrum coupling testing and PIV curve testing, and the integrating sphere testing component 17 and the device performance testing component 18 in the present application are all existing components, which are not described herein again.
Wherein, the movement direction of the first movement module 15 is a horizontal direction, and the movement direction of the second movement module 16 is a vertical direction; the first moving module 15 and the second moving module 16 are mutually perpendicular, so that the detection component can reach the position to be detected.
In the description of the present invention, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention, and are intended to be included within the scope of the appended claims and description.
Claims (6)
1. A test stand base, comprising:
A bottom plate;
the testing cavity is arranged on the bottom plate, and an opening is arranged above the testing cavity and is used for completing testing in an environment of 10-100 ℃;
the electric plugboard is arranged on the bottom plate, and a plughole of the electric plugboard faces the test cavity;
The adjusting component is arranged at the bottom of the test cavity;
The adjusting bracket is arranged in the test cavity, is matched with the adjusting component and moves up and down under the drive of the adjusting component;
The cooling module is arranged on the adjusting bracket;
The heating module is arranged on the cooling module;
The heat conducting block is arranged on the heating module;
two test guide rails are arranged on the upper side of the test cavity, the test guide rails are arranged on two opposite sides of the opening, and a limit strip is arranged on the inner side of the test guide rails; a gap is reserved between the bottom side of the limit strip and the upper surface of the opening; the test guide rail is convenient for inserting the product to be detected;
The adjustment assembly includes:
The adjusting cylinder is horizontally arranged at the bottom of the test cavity, and the piston rod end of the adjusting cylinder moves along the horizontal direction;
the adjusting block is arranged at the piston rod end of the adjusting cylinder;
the limiting columns are arranged on two sides of the adjusting block;
an adjusting groove is formed in the side face of the adjusting bracket and matched with the limiting column;
springs are arranged at the bottoms of the periphery of the adjusting bracket;
The adjustment tank includes:
A first adjustment section;
the second adjusting section is communicated with the first adjusting section, and the second adjusting section extends obliquely upwards.
2. The test bench base of claim 1, wherein the test chamber is an open-top closed chamber formed by a plurality of shields connected together.
3. The test bench base of claim 2, wherein the first adjustment section has a height H and the second adjustment section has a width D, H > D;
The bottom interval of test chamber is provided with many vertical guide posts, the guide post with adjust the bottom swing joint of support.
4. The test stand base of claim 1, wherein the cooling module comprises:
The cold water cavity is arranged in the adjusting bracket;
the water inlet is communicated with one side of the cold water cavity;
the water outlet is communicated with the other side of the cold water cavity, and the water inlet and the water outlet are arranged opposite to each other;
the heating module includes:
The module bracket is arranged on the cold water cavity and is provided with a plurality of clamping grooves;
and the TEC module is arranged in the clamping groove.
5. A test device, comprising:
A housing;
the mounting seat is mounted in the shell;
the test stand base of any one of claims 1-4 disposed on the mount;
The first movement module is arranged on the mounting seat;
The second motion module is arranged on the motion end of the first motion module;
The integrating sphere testing component is arranged on the moving end of the second moving module, and the testing end of the integrating sphere testing component faces downwards;
And the device performance testing assembly is arranged on the moving end of the first moving module.
6. The test device of claim 5, wherein the direction of movement of the first movement module is a horizontal direction and the direction of movement of the second movement module is a vertical direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311033670.9A CN116990555B (en) | 2023-08-17 | 2023-08-17 | Test bench base and testing device thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311033670.9A CN116990555B (en) | 2023-08-17 | 2023-08-17 | Test bench base and testing device thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116990555A CN116990555A (en) | 2023-11-03 |
| CN116990555B true CN116990555B (en) | 2024-06-21 |
Family
ID=88533831
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311033670.9A Active CN116990555B (en) | 2023-08-17 | 2023-08-17 | Test bench base and testing device thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116990555B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834910A (en) * | 2020-12-31 | 2021-05-25 | 成都海光集成电路设计有限公司 | Semi-automatic chip test system |
| CN114910776A (en) * | 2022-04-27 | 2022-08-16 | 珠海市精实测控技术有限公司 | Intensive testing arrangement of PCB board components and parts |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1958302B1 (en) * | 2005-12-06 | 2019-02-20 | Google LLC | Passive phase control in an external cavity laser |
| JP2008196920A (en) * | 2007-02-09 | 2008-08-28 | Sharp Corp | Burn-in apparatus, burn-in test method, and contact state detection method |
| KR101258570B1 (en) * | 2010-12-07 | 2013-05-02 | (주)제이콥스 | LED device test system |
| CN213275862U (en) * | 2020-08-28 | 2021-05-25 | 苏州联讯仪器有限公司 | Low, normal and high temperature test system for TO optical communication device |
| CN214409144U (en) * | 2020-12-28 | 2021-10-15 | 苏州联讯仪器有限公司 | High-low temperature test bench for laser chip |
| CN214427533U (en) * | 2020-12-30 | 2021-10-19 | 中国科学院紫金山天文台 | A temperature and space adjustable component performance test box |
| CN216696507U (en) * | 2021-12-28 | 2022-06-07 | 无锡菲光科技有限公司 | Aging detection device of low-power laser |
| CN217846379U (en) * | 2022-04-27 | 2022-11-18 | 苏州华兴源创科技股份有限公司 | Chip testing system |
| CN219392206U (en) * | 2023-03-23 | 2023-07-21 | 北京康特电子股份有限公司 | High-low temperature test board for semiconductor laser |
-
2023
- 2023-08-17 CN CN202311033670.9A patent/CN116990555B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834910A (en) * | 2020-12-31 | 2021-05-25 | 成都海光集成电路设计有限公司 | Semi-automatic chip test system |
| CN114910776A (en) * | 2022-04-27 | 2022-08-16 | 珠海市精实测控技术有限公司 | Intensive testing arrangement of PCB board components and parts |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116990555A (en) | 2023-11-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116990555B (en) | Test bench base and testing device thereof | |
| CN105424123B (en) | Flag assembly equipment before and after core of membrane type gas meter | |
| CN110491637B (en) | Power transformer | |
| CN111068994A (en) | Heating curing equipment for installing battery pack radiating support | |
| CN110000561B (en) | Rail mounting device for automobile sliding window | |
| CN210136974U (en) | Soft-packaged battery cell packaging equipment | |
| CN208224433U (en) | A kind of device for testing circuit board function | |
| CN213103873U (en) | Leveling device | |
| CN215699347U (en) | Battery module stacks welding frock structure | |
| CN114337807B (en) | Multi-temperature test system of optical communication module | |
| CN214659076U (en) | Easy dismounting's support frame for water and electricity construction | |
| CN208608112U (en) | A kind of mounting rack convenient for exchange output contactor installation | |
| CN222582835U (en) | Radiator for controller with high diversion flow rate | |
| CN216215910U (en) | Reactive compensation controller with voltage warning and lockout output | |
| CN215065749U (en) | Detection equipment for tensile experiment of automobile fastener | |
| CN222027664U (en) | Stand bending moment testing arrangement | |
| CN218995432U (en) | Down-pressure type high-power test fixture | |
| CN219611187U (en) | Drawer seat body support frame | |
| CN220894694U (en) | LCD liquid crystal display testing device | |
| CN220372600U (en) | Terminal press mounting equipment | |
| CN215867484U (en) | Attached while with frame counterpoint mechanism | |
| CN221058659U (en) | Circuit board for ventilator | |
| CN219164677U (en) | Switch installation device for internet communication | |
| CN219497279U (en) | Super narrow limit liquid crystal concatenation screen | |
| CN221186283U (en) | Assembling jig for lens and base |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |