CN116908652A - Board card implementation method and system suitable for automatic single board test - Google Patents
Board card implementation method and system suitable for automatic single board test Download PDFInfo
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- CN116908652A CN116908652A CN202310904344.4A CN202310904344A CN116908652A CN 116908652 A CN116908652 A CN 116908652A CN 202310904344 A CN202310904344 A CN 202310904344A CN 116908652 A CN116908652 A CN 116908652A
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- 238000012360 testing method Methods 0.000 title claims abstract description 171
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000010586 diagram Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The embodiment of the specification provides a board card implementation method and a system suitable for automatic single board testing, wherein the method comprises the following steps: according to the requirements of products and tests, connecting test points on UUT of the product board card as test signals to a backboard connector of the product board card through spare pins of the backboard connector; according to the point location deployment of UUTs, a test backboard is designed, test points of a plurality of UUTs are connected to a backboard connector of a board card of Automatic Test Equipment (ATE) through the test backboard, wherein the test backboard is provided with the plurality of UUTs and the board card of the Automatic Test Equipment (ATE); and receiving and executing an instruction of the upper computer through the ATE, testing each UUT through the testing backboard, and sending measured data to the upper computer through the Ethernet.
Description
Technical Field
The present document relates to the field of electrical technologies, and in particular, to a board card implementation method and system suitable for automatic board testing.
Background
In the current single board generation, after the board generation is finished, each board needs to be detected according to a detection rule, such as interface test, and key points arranged on the board need to be measured, such as power supply voltage.
The test mode has the following defects:
1. the single board has large testing workload, on one hand, each point needs to be manually measured and data is manually recorded, and on the other hand, parameters such as the range precision of various instruments and the like need to be manually adjusted.
2. High voltages may be present on portions of the board card, such as the power board 110VDC or 220VAC inputs, and manual operation may be dangerous.
3. It is not suitable for large-scale automated testing because each single point requires manual measurement and cannot be measured simultaneously by multiple plates.
Disclosure of Invention
The invention aims to provide a board card implementation method and system suitable for automatic single board testing, and aims to solve the problems in the prior art.
The invention provides a board card implementation method suitable for automatic single board test, which comprises the following steps:
according to the requirements of products and tests, connecting test points on UUT of the product board card as test signals to a backboard connector of the product board card through spare pins of the backboard connector;
according to the point location deployment of UUTs, a test backboard is designed, test points of a plurality of UUTs are connected to a backboard connector of a board card of Automatic Test Equipment (ATE) through the test backboard, wherein the test backboard is provided with the plurality of UUTs and the board card of the Automatic Test Equipment (ATE);
and receiving and executing an instruction of the upper computer through the ATE, testing each UUT through the testing backboard, and sending measured data to the upper computer through the Ethernet.
The invention provides a board card implementation system suitable for automatic single board test, which comprises:
the product board card UUT is used for connecting the test point serving as a test signal to the backboard connector through the spare pin of the backboard connector according to the requirements of products and tests, receiving a test instruction of Automatic Test Equipment (ATE), and feeding back the test signal to the ATE;
the test backboard is used for installing a plurality of UUTs and automatic test equipment ATE, and connecting test points of the plurality of UUTs to a backboard connector of a board card of the ATE according to the point location arrangement of the UUTs;
and the ATE is used for receiving and executing the instruction of the upper computer, testing each UUT through the testing backboard and sending the measured data to the upper computer through the Ethernet.
By adopting the embodiment of the invention, various test points are connected to the backboard connector, and the problem that the large-batch automatic test cannot be realized in the prior art is solved by designing the test backboard and the automatic test equipment, the data to be detected can be automatically measured, the test report is generated, the automatic test and the data record of the board cards in batches of the production line can be realized, and the test efficiency is improved.
Drawings
For a clearer description of one or more embodiments of the present description or of the solutions of the prior art, the drawings that are necessary for the description of the embodiments or of the prior art will be briefly described, it being apparent that the drawings in the description that follow are only some of the embodiments described in the description, from which, for a person skilled in the art, other drawings can be obtained without inventive faculty.
FIG. 1 is a schematic diagram of a board implementation method suitable for automated single board testing in accordance with an embodiment of the present invention;
FIG. 2 is a schematic diagram of a board card implementation system suitable for automated single board testing in accordance with an embodiment of the present invention;
FIG. 3 is a schematic diagram of a backplane connector for introducing voltage values to a board card according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a backplane connector of an ATE according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a board card architecture of an ATE according to an embodiment of the invention.
Detailed Description
In order to solve the problems in the prior art, the embodiment of the invention realizes the large-batch automatic test of the board card by modifying the form of the test point on the board card, connecting the test point to the backboard connector and designing a special test backboard and a test fixture aiming at the specific board card.
In order to enable a person skilled in the art to better understand the technical solutions in one or more embodiments of the present specification, the technical solutions in one or more embodiments of the present specification will be clearly and completely described below with reference to the drawings in one or more embodiments of the present specification, and it is obvious that the described embodiments are only some embodiments of the present specification, not all embodiments. All other embodiments, which can be made by one or more embodiments of the present disclosure without inventive faculty, are intended to be within the scope of the present disclosure.
Method embodiment
According to an embodiment of the present invention, there is provided a board card implementation method suitable for automatic board testing, and fig. 1 is a schematic diagram of a board card implementation method suitable for automatic board testing according to an embodiment of the present invention, as shown in fig. 1, where the board card implementation method suitable for automatic board testing according to an embodiment of the present invention specifically includes:
step S101, according to the requirements of products and tests, connecting test points on UUT of a product board card to a backboard connector of the product board card through spare pins of the backboard connector as test signals; the spare pins specifically comprise: the A-row pins of the F-type 96-pin connector J4A/B/C conform to DIN 41612. The A calandria pins of the F-type 96-pin connector conforming to DIN41612 standard on the backboard connector are largely vacant, and the utilization rate of the backboard connector can be improved while receiving test signals by utilizing the vacant A calandria pins.
Step S102, designing a test backboard according to the point location arrangement of UUTs, and connecting test points of a plurality of UUTs to a backboard connector of a board card of Automatic Test Equipment (ATE) through the test backboard, wherein the test backboard is provided with the plurality of UUTs and the board card of the Automatic Test Equipment (ATE); specifically, a plurality of UUTs and board cards of automatic test equipment ATE are connected to the test back board through back board connectors. The test board card is automatically tested in batches by connecting various test points to the backboard connector and then connecting the test points to the test backboard through the backboard connector.
Step S103, receiving and executing an instruction of the upper computer through the ATE, testing each UUT through the testing backboard, and sending measured data to the upper computer through the Ethernet. The method specifically comprises the following steps:
and receiving and executing an instruction of the upper computer through the ATE, and acquiring test signals of each UUT through 30 acquisition channels by adopting an ADC of the ATE, wherein the 30 acquisition channels comprise two CAN FD test signals. Test signals of the UUTs are collected through the 30-path collection channel according to the test requirements, and reasonable test precision can be obtained when the test backboard tests the UUTs.
The method further comprises the steps of: and binding the point positions acquired by the ATE with the slot positions of the test backboard. That is, the point location that 2 ATE gathered binds with the slot position of test backplate, like first, two, three routes acquisition point, just gather the data of first piece UUT, and fourth, five, six routes acquisition point are the data of gathering the second piece UUT, just so need not to dispose, reduced the degree of difficulty of software operation.
The above technical solutions of the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
As shown in fig. 2, the whole includes the following parts:
the upper computer is provided with automatic test software, the automatic test software is used for fiercely issuing the test to the ATE test board card, receiving data from the ATE, judging whether the test passes or not after analyzing, and recording the data;
the ATE automatic testing equipment receives and executes instructions of the upper computer, tests all tested equipment through the back plate and receives data sent by all UUTs;
the special test backboard is used for installing UUT of a tested piece and a board card of Automatic Test Equipment (ATE), and signals of some columns are arranged on the special test backboard, and test points of all UUT are directly connected with the ATE;
the UUT of the tested device is a board card to be tested.
The whole implementation procedure is described as follows:
and (3) modifying the test points on the product board card, and transferring the test points required to be arranged on the board card to the backboard connector according to the product requirements and the inspection rules. Because the back board connector has more pins and a plurality of spare pins, the spare pins are used for bearing the function of the test points;
for example, a single board has several power supplies of 5V,3.3V and 12V, and the test rule requires that the test is to measure the voltage values of the key points, and then the voltage values can be led to the back board connector of the board card, as shown in fig. 3: J4A/B/C is an F-type 96-pin connector conforming to DIN41612, and a row A of pins of the F-type 96-pin connector are largely empty, and the test points are deployed in row A, namely P12V_T, P5V_T and P3V3_T in the figure;
and designing a test board card according to the point location deployment of the UUT. If a test backplane is designed to test 10 boards simultaneously according to the first step, then the p12v_t, p5v_t, p3v3_t test signals of 10 UUTs need to be connected to the backplane connector of the ATE.
And designing a special ATE test tool according to the test requirement. All test point data CAN be collected, for example, according to the test requirement of 10 UUTs, p12v_t, p5v_t, p3v3_t and CAN FD signals of 10 boards need to be measured, and then a backplane connector of the ATE is designed as shown in fig. 4, and a board card function architecture of the ATE is as shown in fig. 5:
in fig. 5, the ATE has 30 ADCs for collecting 30 test voltages and two CAN FD test signals, and the measured data is directly sent to the upper computer through the ethernet. The ADC design of ATE should set reasonable test accuracy according to the test requirements.
Therefore, through the framework and three implementation steps, batch test of the board card can be realized, the test efficiency is improved, and the accuracy of data of all test points is ensured.
System embodiment
According to an embodiment of the present invention, there is provided a board card implementation system suitable for automated board testing, as shown in fig. 2, including:
the product board card UUT is used for connecting the test point serving as a test signal to the backboard connector through the spare pin of the backboard connector according to the requirements of products and tests, receiving a test instruction of Automatic Test Equipment (ATE), and feeding back the test signal to the ATE; the spare pins specifically comprise: the A-row pins of the F-type 96-pin connector J4A/B/C conform to DIN 41612.
A test back board (i.e. a special test back board shown in fig. 2) for installing a plurality of UUTs and automatic test equipment ATE, and connecting test points of the plurality of UUTs to a back board connector of a board card of the ATE according to the point placement of the UUTs; a plurality of UUTs and board cards of the ATE are connected to the test backplane through backplane connectors.
And the ATE is used for receiving and executing the instruction of the upper computer, testing each UUT through the testing backboard and sending the measured data to the upper computer through the Ethernet. The ATE is specifically used for:
and receiving and executing an instruction of the upper computer, and acquiring test signals of all UUTs through 30 acquisition channels by adopting an ADC, wherein the 30 acquisition channels comprise two CAN FD test signals.
The point positions acquired by the ATE are bound with the slot positions of the test backboard.
The embodiment of the present invention is a system embodiment corresponding to the above method embodiment, and specific operations of each module may be understood by referring to the description of the method embodiment, which is not repeated herein.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.
Claims (10)
1. The board card implementation method suitable for automatic single board test is characterized by comprising the following steps:
according to the requirements of products and tests, connecting test points on UUT of the product board card as test signals to a backboard connector of the product board card through spare pins of the backboard connector;
according to the point location deployment of UUTs, a test backboard is designed, test points of a plurality of UUTs are connected to a backboard connector of a board card of Automatic Test Equipment (ATE) through the test backboard, wherein the test backboard is provided with the plurality of UUTs and the board card of the Automatic Test Equipment (ATE);
and receiving and executing an instruction of the upper computer through the ATE, testing each UUT through the testing backboard, and sending measured data to the upper computer through the Ethernet.
2. The method according to claim 1, wherein the method further comprises:
and binding the point positions acquired by the ATE with the slot positions of the test backboard.
3. The method of claim 1, wherein receiving and executing the instructions of the host computer via the ATE and testing each UUT via the test back plane specifically comprises:
and receiving and executing an instruction of the upper computer through the ATE, and acquiring test signals of each UUT through 30 acquisition channels by adopting an ADC of the ATE, wherein the 30 acquisition channels comprise two CAN FD test signals.
4. The method of claim 1, wherein the board fixture with the test back plate mounted with a plurality of UUTs and automatic test equipment ATE comprises:
a plurality of UUTs and board cards of automatic test equipment ATE are connected with the test backboard through backboard connectors.
5. The method according to claim 1, wherein the spare pins specifically comprise: the A-row pins of the F-type 96-pin connector J4A/B/C conform to DIN 41612.
6. A board card implementation system suitable for automated single board testing, comprising:
the product board card UUT is used for connecting the test point serving as a test signal to the backboard connector through the spare pin of the backboard connector according to the requirements of products and tests, receiving a test instruction of Automatic Test Equipment (ATE), and feeding back the test signal to the ATE;
the test backboard is used for installing a plurality of UUTs and automatic test equipment ATE, and connecting test points of the plurality of UUTs to a backboard connector of a board card of the ATE according to the point location arrangement of the UUTs;
and the ATE is used for receiving and executing the instruction of the upper computer, testing each UUT through the testing backboard and sending the measured data to the upper computer through the Ethernet.
7. The system of claim 6, wherein the ATE-collected sites are tied to slot sites of a test backplate.
8. The system of claim 6, wherein the ATE is specifically configured to:
and receiving and executing an instruction of the upper computer, and acquiring test signals of all UUTs through 30 acquisition channels by adopting an ADC, wherein the 30 acquisition channels comprise two CAN FD test signals.
9. The system of claim 6, wherein board cards of a plurality of UUTs and ATE are connected to the test backplane by backplane connectors.
10. The system of claim 6, wherein the spare pins specifically comprise: the A-row pins of the F-type 96-pin connector J4A/B/C conform to DIN 41612.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310904344.4A CN116908652A (en) | 2023-07-21 | 2023-07-21 | Board card implementation method and system suitable for automatic single board test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310904344.4A CN116908652A (en) | 2023-07-21 | 2023-07-21 | Board card implementation method and system suitable for automatic single board test |
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| Publication Number | Publication Date |
|---|---|
| CN116908652A true CN116908652A (en) | 2023-10-20 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310904344.4A Pending CN116908652A (en) | 2023-07-21 | 2023-07-21 | Board card implementation method and system suitable for automatic single board test |
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| Country | Link |
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| CN (1) | CN116908652A (en) |
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- 2023-07-21 CN CN202310904344.4A patent/CN116908652A/en active Pending
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