CN116718447A - Universal sample stage for microscopic analysis and nano mechanical test samples and use method - Google Patents
Universal sample stage for microscopic analysis and nano mechanical test samples and use method Download PDFInfo
- Publication number
- CN116718447A CN116718447A CN202310648050.XA CN202310648050A CN116718447A CN 116718447 A CN116718447 A CN 116718447A CN 202310648050 A CN202310648050 A CN 202310648050A CN 116718447 A CN116718447 A CN 116718447A
- Authority
- CN
- China
- Prior art keywords
- scanning electron
- electron microscope
- fixing
- sample
- microscopic analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 20
- 238000007431 microscopic evaluation Methods 0.000 title claims abstract description 17
- 238000000034 method Methods 0.000 title claims abstract description 12
- 239000000523 sample Substances 0.000 claims abstract description 110
- 238000007373 indentation Methods 0.000 claims abstract description 21
- 238000005498 polishing Methods 0.000 claims abstract description 17
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 15
- 238000000227 grinding Methods 0.000 claims abstract description 13
- 238000002474 experimental method Methods 0.000 claims description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000012943 hotmelt Substances 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims description 2
- 230000001070 adhesive effect Effects 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 229910001220 stainless steel Inorganic materials 0.000 claims description 2
- 239000010935 stainless steel Substances 0.000 claims description 2
- 230000006978 adaptation Effects 0.000 claims 2
- 238000012512 characterization method Methods 0.000 abstract description 6
- 238000004458 analytical method Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000003758 nuclear fuel Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000002285 radioactive effect Effects 0.000 description 2
- 235000001674 Agaricus brunnescens Nutrition 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
- G01N3/46—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid the indentors performing a scratching movement
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/10—Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
A universal sample stage for microscopic analysis and nano mechanical test samples and a use method thereof comprise a nano indentation sample stage, a fixed clamping stage for grinding and polishing of a lapping integrated machine, an electronic probe and a fixed pedestal for characterization of a scanning electron microscope; the bottom of the nano indentation sample table is provided with a cylindrical bump for fixing, and the top of one side of the electronic probe and the scanning electron microscope fixing seat, which is close to the grinding and polishing fixing clamp table of the lapping integrated machine, is provided with a cylindrical groove; the fixed clamping table of the lapping all-in-one machine is provided with a cylindrical groove near the top of one side of the nano indentation sample table, a cylindrical projection matched with the cylindrical groove is arranged at the bottom of one side of the fixed clamping table of the lapping all-in-one machine near the electronic probe and the scanning electron microscope fixing seat, a fixed screw hole matched with a fixed bolt is formed in one side of the top of the electronic probe and the scanning electron microscope fixing seat, and a fixed screw hole matched with the fixed bolt is formed in one side of the top of the fixed clamping table of the lapping all-in-one machine.
Description
Technical Field
The invention relates to the technical field of micro-nano materials, in particular to a universal sample table for microscopic analysis and nano mechanical test samples and a use method thereof.
Background
The microscopic morphology, structure and macroscopic properties of the nuclear fuel and the in-reactor structural material sample can be greatly changed after the nuclear fuel and the in-reactor structural material sample are irradiated by reactor neutrons, and the nuclear fuel and the in-reactor structural material sample have strong induced radioactivity. Thus, great difficulty is added to the experimenter who subsequently performs the work of micro-morphology and performance characterization.
The change of the mechanical properties of the nuclear fuel and the reactor internal structural material samples after neutron irradiation is mainly represented by the increase of strength and hardness and the decrease of toughness. In order to reduce the irradiated dose of experimenters, the irradiated samples in the reactor are usually smaller in size, and the main current mechanical property test mode is nanoindentation. Because the surface of the sample after the stack-out irradiation is corroded and oxidized, a lapping integrated machine is required to be used for polishing and polishing the sample before the mechanical property test so as to meet the test requirement.
A large number of irradiation defects can be generated in the sample after neutron irradiation, so that the grain size, the surface morphology, the microstructure and the component distribution of the sample are changed. It can be analyzed and tested using scanning electron microscopy and electronic probes. The observation surface of the sample is required to be flat and smooth and free of scratches in the process. For radioactive samples, the sample is required to be easy to operate during sample loading, the universality of the sample fixing pedestal is high, and the portability is high. Therefore, the lapping integrated machine is required to rapidly transfer the sample to the electron microscope after finishing the surface polishing and grinding of the sample after the irradiation of the centering. Meanwhile, when the electron probe performs micro-area component analysis on the surface of the sample, the tiny movement of the fixing seat can also cause deviation between the detection area of the instrument and the target observation area, so that the image drift is caused.
In order to improve and solve the above problems, studies have been made to specially apply to a scanning electron microscope or an electronic probe fixing base. The transfer and installation in the shielded glove box are simple and convenient, the irradiated dose of experimental operators can be effectively reduced, and the accuracy of the analysis of the micro-area components on the surface of the sample is greatly improved.
Disclosure of Invention
The invention aims at: the preparation of the nano indentation sample and the subsequent experiments and microscopic characterization of the nano indentation, the scanning electron microscope and the electronic probe can be satisfied through assembly. The working efficiency is greatly improved, the sample loading time is shortened, the irradiated dose of operators is reduced, and the accuracy of micro-area analysis of the surface of the sample is improved.
The technical scheme of the invention is as follows: a universal sample stage for microscopic analysis and nano mechanical test samples comprises a nano indentation sample stage, a fixed clamping stage for grinding and polishing of a lapping integrated machine, an electronic probe and a fixed pedestal for characterization of a scanning electron microscope;
the bottom of the nano indentation sample table is provided with a cylindrical bump for fixing, and the top of one side of the electronic probe and the scanning electron microscope fixing seat, which is close to the grinding and polishing fixing clamp table of the lapping integrated machine, is provided with a cylindrical groove;
the fixed clamping table of the lapping all-in-one machine is provided with a cylindrical groove near the top of one side of the nano indentation sample table, a cylindrical projection matched with the cylindrical groove is arranged at the bottom of one side of the fixed clamping table of the lapping all-in-one machine near the electronic probe and the scanning electron microscope fixing seat, a fixed screw hole matched with a fixed bolt is formed in one side of the top of the electronic probe and the scanning electron microscope fixing seat, and a fixed screw hole matched with the fixed bolt is formed in one side of the top of the fixed clamping table of the lapping all-in-one machine.
The electronic probe is connected with the fixed screw hole on the bottom surface of the scanning electron microscope fixing seat.
The devices described above are all made of stainless steel.
The application method of the universal sample stage for microscopic analysis and nano mechanical test samples comprises the following steps:
s1: smearing hot melt wax on a nano indentation sample stage, and fixing the sample on the sample stage;
s2: after the bonding is firm, unscrewing the bolts, taking the fixing clamping table of the lapping integrated machine off the fixing table seat represented by the electronic probe and the scanning electron microscope, and carrying out sample polishing work;
s3: and (3) mounting the fixed clamping table of the lapping integrated machine subjected to S2 grinding and polishing back to the electronic probe and the fixed pedestal characterized by the scanning electron microscope, screwing down the bolts, and transferring the whole device into the scanning electron microscope by using a special transportation container for subsequent experiments.
And coating conductive silver adhesive on the nano indentation sample table.
The half-thread screw rod and the electronic probe are connected with the bottom surface of the scanning electron microscope fixing seat through the fixing screw hole.
The S1 is performed in a radiation-shielding glove box.
The S2 is performed in a radiation-shielding glove box.
The invention has the remarkable effects that:
the device can meet the requirements of preparation treatment of the surface of the nanoindentation sample after neutron irradiation, subsequent nanoindentation experiments, scanning electron microscope and electron probe microcosmic morphology and tissue structure characterization. Each part in the device is independent, the structure and the connection mode are simple, the installation and the use are convenient, the work continuity and the work efficiency of experimental operators can be greatly improved, the irradiated dose and the sample loading time are reduced, and the accuracy of micro-area analysis on the surface of a sample is improved.
Drawings
Fig. 1 is a diagram showing the splitting effect of the present invention.
Fig. 2 is a top view of the present invention.
FIG. 3 is a schematic cross-sectional view of A-A in FIG. 2.
In the figure: 1. a nano indentation sample stage; 2. grinding and polishing fixed clamping table of lapping integrated machine; 3. an electronic probe and a scanning electron microscope fixing seat; 4. a fixing bolt; 5. a half-flight screw; 11. cylindrical bumps at the bottom of the nano indentation sample table; 21. fixing screw holes are formed in the side face of the fixing clamping table of the lapping integrated machine; 22. a bottom cylindrical bump; 23. a top cylindrical recess; 31. the electronic probe and the bottom surface of the scanning electron microscope fixing seat are fixed with screw holes; 32. a side fixing screw hole; 33. a top cylindrical recess; .
Detailed Description
In order to more clearly describe the embodiments of the present invention, the present invention will be described with reference to the accompanying drawings and detailed description, and the description of the novel exemplary embodiments and the description thereof are only for the purpose of illustrating the present invention and are not to be construed as limiting the present invention.
As can be seen from fig. 1 and 2, the universal sample stage for microscopic analysis and nanomechanical test samples in this embodiment includes: a nano indentation sample stage 1; the lapping and grinding integrated machine grinds and throws the fixed clamping table 2; an electronic probe and scanning electron microscope fixing seat 3; a fixing bolt 4; a half-flight screw 5; a cylindrical bump 11 at the bottom of the nano indentation sample stage; the side surface of the fixing clamping table of the lapping integrated machine is provided with a fixing screw hole 21, a bottom cylindrical lug 22 and a top cylindrical groove 23; the electronic probe and the scanning electron microscope fixing seat are provided with a bottom fixing screw hole 31, a side fixing screw hole 32 and a top cylindrical groove 33;
the universal sample stage for microscopic analysis and nanomechanical test sample comprises a nanoindentation sample stage 1, a fixing clamp stage 2 polished by a lapping machine, an electronic probe and a fixing pedestal 3 for scanning electron microscope characterization, wherein the nanoindentation sample stage 1 is a standard part and is in a mushroom shape, a cylindrical bump 11 for fixing is arranged at the bottom of the fixing clamp stage, the electronic probe and the scanning electron microscope fixing pedestal 3 are provided with a cylindrical groove 33 at the top of one side close to the polishing fixing clamp stage 2 of the lapping machine, the fixing clamp stage 2 of the lapping machine is in a cylindrical shape, a cylindrical groove 23 is arranged at the top of one side close to the nanoindentation sample stage 1, a cylindrical bump 22 which is mutually matched with the cylindrical groove 33 of the electronic probe and the scanning electron microscope fixing pedestal 3 is arranged at the bottom of one side close to the electronic probe and the scanning electron microscope fixing pedestal 3, a fixing screw hole 32 which is used for being matched with a fixing bolt 4 is arranged at one side of the corresponding bump which is matched with the groove at the top of the scanning electron probe and the scanning electron microscope fixing pedestal 3, a fixing screw hole 21 which is used for being matched with a fixing bolt 4 is arranged at one side of the corresponding bump which is matched with the groove at the top of the polishing fixing clamp stage 2,
example 1:
as shown in fig. 1 and 2, all the components except the half-threaded screw 5 are assembled into one body and are placed in a radiation shielding glove box together with a lapping machine; and (3) coating hot melt wax or conductive silver paste on the nano indentation sample stage 1, and fixing the sample transferred into the radioactive shielding glove box on the sample stage 1. After the electronic probe and the scanning electron microscope fixing seat 3 are firmly adhered, the bolt 4 on the fixed nano indentation sample table 1 is unscrewed, the fixed clamping table 2 of the lapping integrated machine is taken down and is arranged on the clamp of the lapping integrated machine, and then the sample polishing work is carried out.
Example 2:
as shown in fig. 1 and 2, in this embodiment, based on embodiment 1, a fixing clamping table 2 polished by a lapping integrated machine is taken down, a bolt 4 is mounted on an electronic probe and a scanning electron microscope fixing seat 3, and a special transport container is used to transport the electronic probe and the scanning electron microscope to carry out subsequent experiments.
Example 3:
as shown in fig. 1 and 2, the present embodiment is based on embodiment 1 and embodiment 2, in which the half-threaded screw 5 and the electronic probe are connected to the fixing screw hole 31 on the bottom surface of the fixing base 3 of the scanning electron microscope. And taking down the fixed clamping table 2 polished by the lapping integrated machine, and mounting the fixed clamping table on the electronic probe and scanning electron microscope fixing seat 3. The device is placed and installed in a sample loading clamping groove seat of an electronic probe, and the purpose is to reduce image drift caused by deviation between an instrument detection area and a target observation area due to small movement of the fixing seat 3. After the sample is loaded, a subsequent experiment can be performed.
Claims (8)
1. A universal sample stage for microscopic analysis and nanomechanical test samples, characterized in that: comprises a nano indentation sample stage (1), a fixed clamping stage (2) for polishing by a lapping integrated machine, an electronic probe and a fixed pedestal (3) for representing a scanning electron microscope,
the bottom of the nano indentation sample table 1 is provided with a cylindrical bump (11) for fixing, and the top of one side, close to the grinding and polishing fixing clamping table (2) of the lapping integrated machine, of the electronic probe and the scanning electron microscope fixing seat (3) is provided with a cylindrical groove (33);
the utility model provides a finish grinding all-in-one fixed card platform (2) is close to and has seted up cylindrical recess (23) with one side top of nanometer indentation sample platform (1), and finish grinding all-in-one fixed card (2) be close to electron probe and scanning electron microscope fixing base (3) one side bottom be equipped with cylindrical lug (22) of cylindrical recess (33) mutually supporting, electron probe and scanning electron microscope fixing base (3) one side at top have been seted up be used for with fixing bolt (4) looks adaptation fixed screw (32), finish grinding all-in-one grinds and throws fixed screw (21) that are used for with fixing bolt (4) looks adaptation one side at fixed card platform (2) top.
2. The universal stage for microscopic analysis and nanomechanical test samples according to claim 1, wherein: the electronic probe is characterized by further comprising a half-thread screw (5), wherein the half-thread screw (5) and the electronic probe are connected with a fixed screw hole (31) on the bottom surface of the scanning electron microscope fixing seat (3).
3. The universal stage for microscopic analysis and nanomechanical test samples according to claim 1, wherein: the devices described above are all made of stainless steel.
4. A method for using a universal sample stage for microscopic analysis and nanomechanical test samples, the universal sample stage for microscopic analysis and nanomechanical test samples according to claim 2, characterized in that: the method comprises the following steps:
s1: coating hot melt wax on a nano indentation sample table (1) and fixing a sample on the sample table (1);
s2: after the bonding is carried out, the bolts (4) are unscrewed, the fixing clamping table (2) of the lapping integrated machine is taken down from the fixing pedestal (3) characterized by the electronic probe and the scanning electron microscope, and the sample polishing work is carried out;
s3: and (3) mounting the fixed clamping table 2 of the lapping integrated machine subjected to S2 grinding and polishing back to a fixed pedestal (3) characterized by an electronic probe and a scanning electron microscope, screwing down a bolt (4), and transferring the whole device into the scanning electron microscope by using a special transport container to carry out subsequent experiments.
5. The method of using a universal sample stage for microscopic analysis and nanomechanical testing of samples according to claim 4, wherein: and (3) smearing conductive silver adhesive on the nano indentation sample table (1).
6. The method of claim 4, wherein the step of using a universal sample stage for microscopic analysis and nanomechanical test samples comprises the steps of: in the step S3, the half-threaded screw rod (5) and the electronic probe are connected with the bottom surface of the scanning electron microscope fixing seat (3) through the fixing screw hole (31).
7. The method of claim 4, wherein the step of using a universal sample stage for microscopic analysis and nanomechanical test samples comprises the steps of: the S1 is performed in a radiation-shielding glove box.
8. The method of claim 4, wherein the step of using a universal sample stage for microscopic analysis and nanomechanical test samples comprises the steps of: the S2 is performed in a radiation-shielding glove box.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310648050.XA CN116718447A (en) | 2023-06-02 | 2023-06-02 | Universal sample stage for microscopic analysis and nano mechanical test samples and use method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310648050.XA CN116718447A (en) | 2023-06-02 | 2023-06-02 | Universal sample stage for microscopic analysis and nano mechanical test samples and use method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116718447A true CN116718447A (en) | 2023-09-08 |
Family
ID=87869036
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310648050.XA Pending CN116718447A (en) | 2023-06-02 | 2023-06-02 | Universal sample stage for microscopic analysis and nano mechanical test samples and use method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116718447A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117929109A (en) * | 2024-03-21 | 2024-04-26 | 北京科技大学 | In-situ nano indentation probe clamping system and sample mounting device |
-
2023
- 2023-06-02 CN CN202310648050.XA patent/CN116718447A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117929109A (en) * | 2024-03-21 | 2024-04-26 | 北京科技大学 | In-situ nano indentation probe clamping system and sample mounting device |
| CN117929109B (en) * | 2024-03-21 | 2024-05-24 | 北京科技大学 | An in-situ nanoindentation probe clamping system and sample mounting device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Ayache et al. | Sample preparation handbook for transmission electron microscopy: techniques | |
| CN116718447A (en) | Universal sample stage for microscopic analysis and nano mechanical test samples and use method | |
| CN102393341B (en) | Indentation method for testing hardness, fracture toughness and residual stress of brittle material | |
| CN112782198B (en) | Universal interface device for 3D atom probe samples with multi-device | |
| CN102539200B (en) | Preparation technology for irradiated nuclear fuel core electron microscope sample | |
| CN109932262B (en) | Method for measuring mechanical properties of materials at different depths | |
| CN111665112A (en) | Auxiliary device for metallographic sample preparation of plastic packaged chip and sample preparation method | |
| Prabhakaran et al. | U-10mo sample preparation and examination using optical and scanning electron microscopy | |
| CN208902761U (en) | AFM probe holder | |
| CN111077014A (en) | Micro-CT in-situ loading device and test method for micro-damage of ceramic matrix composites | |
| CN112285141B (en) | Preparation method of irradiated reactor structural material SEM sample and sample box | |
| US7479399B1 (en) | System and method for providing automated sample preparation for plan view transmission electron microscopy | |
| CN118650238A (en) | A precision assembly device and assembly method for a hemispherical resonant gyroscope resonator | |
| CN108241165A (en) | 3 d water tank measuring apparatus method of adjustment | |
| KR100348447B1 (en) | Polishing machine | |
| CN217890633U (en) | Grinding and polishing machine is with definite value application of force fixing device | |
| CN201464332U (en) | High security SEM sample stage | |
| CN201697835U (en) | Connecting structure of circular specimen tensile test device | |
| CN222627122U (en) | A non-magnetic U-shaped sample stage | |
| CN221416424U (en) | Material fixing device of nondestructive flaw detection equipment | |
| CN115266795A (en) | Method for representing diffusion behavior of fission gas product of strong radioactive fuel element | |
| CN108508048B (en) | Array magnet combined sample injection device | |
| CN116046825B (en) | Nanometer indentation sample of irradiated dispersion fuel and preparation method thereof | |
| CN223091992U (en) | Integrated circuit probe card fixture | |
| CN220994080U (en) | Metallographic sample wafer clamp holder for automatic grinding and polishing machine |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |