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CN116404027A - Micro-LED Micro display and preparation method thereof - Google Patents

Micro-LED Micro display and preparation method thereof Download PDF

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CN116404027A
CN116404027A CN202310475901.5A CN202310475901A CN116404027A CN 116404027 A CN116404027 A CN 116404027A CN 202310475901 A CN202310475901 A CN 202310475901A CN 116404027 A CN116404027 A CN 116404027A
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led
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王立
刘海荣
胡武民
徐龙权
丁杰
刘苾雨
全知觉
吴小明
王光绪
张建立
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    • HELECTRICITY
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    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
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Abstract

The invention discloses a Micro-LED Micro display and a preparation method thereof. The redistribution layer RDL includes an anode, a cathode, and a metal casing: the anodes are metal lattices which are distributed independently, the cathodes are a series of metal strips with the same row number or column number as that of the anode metal lattices, and all the cathode metal strips are connected to a metal outer frame outside the pixel array to form common cathode connection; the p-type ohmic electrodes of the Micro-LED chips and the anode metal lattices of the RDL form bonding connection in a one-to-one correspondence mode, and the n-type ohmic electrodes of the Micro-LED chips and the cathode metal strips of the RDL form bonding connection. According to the invention, the redistribution layer RDL is designed on the CMOS driving substrate, and the Micro-LED chip array is integrated on the CMOS driving substrate, so that a Micro-display is formed, and the Micro-display structure can reduce the difficulty of passivation and electrode wiring process after the n-GaN layer is carved in the manufacturing process of the Micro-LED chip.

Description

一种Micro-LED微显示器及其制备方法A kind of Micro-LED microdisplay and preparation method thereof

技术领域technical field

本发明涉及半导体显示器件领域,尤其是涉及一种Micro-LED微显示器及其制备方法。The invention relates to the field of semiconductor display devices, in particular to a Micro-LED microdisplay and a preparation method thereof.

背景技术Background technique

微显示器是制备VR/AR等新型智能设备必不可少的部件,现有的基于硅上液晶(LCoS)、有机发光二极管(OLED)等技术制备的微显示器在亮度、功耗、可靠性等方面还不能满足应用需求。Micro-LED具有发光效率高、耐大电流工作、稳定可靠等优点,是制备VR/AR微显示器的理想方案。然而由于Micro-LED的像素尺寸非常小,要将LED制备成均匀可靠的像素阵列并与CMOS驱动基板实现高可靠性的集成具有很大难度,制造良率低、成本高,而且难以实现彩色化。Microdisplay is an essential component for the preparation of new smart devices such as VR/AR. Existing microdisplays based on technologies such as liquid crystal on silicon (LCoS) and organic light-emitting diodes (OLED) have poor performance in terms of brightness, power consumption, and reliability. It still cannot meet the application requirements. Micro-LED has the advantages of high luminous efficiency, high current resistance, stability and reliability, and is an ideal solution for preparing VR/AR microdisplays. However, due to the very small pixel size of the Micro-LED, it is very difficult to prepare the LED into a uniform and reliable pixel array and achieve high reliability integration with the CMOS driver substrate, the manufacturing yield is low, the cost is high, and it is difficult to achieve colorization .

为了降低制造难度,一种常见的工艺路线为:采用透明的蓝宝石衬底生长蓝色GaN基LED外延结构,通过刻蚀形成Micro-LED的台面阵列,但让n-GaN保持连续。在每个Micro-LED芯片上制备一个p型欧姆电极并通过对位键合于CMOS驱动基板的像素形成连接,n-GaN作为公共阴极连接到CMOS驱动基板的阴极上。这样就可以实现每个Micro-LED芯片的寻址控制从而生成显示图像。这种方案实现起来较为简单,但它的一个缺点是,蓝宝石衬底是透明的,具有很强的光波导效应,从而带来严重的光串扰问题。为了减少光串扰,一种改进的方案是:仍然保持n-GaN连续,但在对位键合后采用激光剥离的方案去除蓝宝石衬底。这种方案虽可以减小光串扰,但因为n-GaN仍然是连续的一层,光波导效应仍然存在。而且,由于该层只有几微米厚而宽度在几毫米甚至在厘米量级,在激光剥离等工艺中很容易出现裂纹而导致制造良率很低。为了解决上述问题,需要将n-GaN层刻断,制作出一个个独立的Micro-LED芯片,但是将n-GaN层刻断后会导致相邻Micro-LED芯片之间出现高低不平的情况,进而造成Micro-LED芯片的钝化和电极布线工艺极其困难。In order to reduce manufacturing difficulty, a common process route is: use a transparent sapphire substrate to grow a blue GaN-based LED epitaxial structure, form a Micro-LED mesa array by etching, but keep n-GaN continuous. A p-type ohmic electrode is prepared on each Micro-LED chip and connected to the pixel of the CMOS driving substrate by parasite bonding, and n-GaN is connected to the cathode of the CMOS driving substrate as a common cathode. In this way, the addressing control of each Micro-LED chip can be realized to generate a display image. This solution is relatively simple to implement, but one of its disadvantages is that the sapphire substrate is transparent and has a strong optical waveguide effect, which brings serious optical crosstalk problems. In order to reduce optical crosstalk, an improved solution is to keep n-GaN continuous, but use laser lift-off to remove the sapphire substrate after para-bonding. Although this solution can reduce optical crosstalk, because n-GaN is still a continuous layer, the optical waveguide effect still exists. Moreover, since the layer is only a few microns thick and the width is on the order of several millimeters or even centimeters, cracks are prone to occur in processes such as laser lift-off, resulting in low manufacturing yield. In order to solve the above problems, it is necessary to cut off the n-GaN layer to produce individual Micro-LED chips, but cutting off the n-GaN layer will cause unevenness between adjacent Micro-LED chips, and then The passivation and electrode wiring processes of Micro-LED chips are extremely difficult.

发明内容Contents of the invention

本发明的第一个目的在于提供一种Micro-LED微显示器,该微显示器采取独立n-GaN台面的结构来避免光串扰和n-GaN层裂开的问题。The first object of the present invention is to provide a Micro-LED microdisplay, which adopts an independent n-GaN mesa structure to avoid the problems of optical crosstalk and n-GaN layer cracking.

本发明的第二个目的在于提供一种Micro-LED微显示器的制备方法,该制备方法通过在CMOS驱动基板上设计重新分布层RDL,并借助重新分布层RDL将Micro-LED芯片阵列与CMOS驱动基板连通起来,从而实现Micro-LED的显示功能,并降低Micro-LED芯片制造过程中将n-GaN层刻断后钝化工艺及电极布线工艺的难度。The second object of the present invention is to provide a method for preparing a Micro-LED microdisplay. The preparation method designs a redistribution layer RDL on a CMOS drive substrate, and uses the redistribution layer RDL to connect the Micro-LED chip array with the CMOS driver. The substrates are connected to realize the display function of the Micro-LED, and reduce the difficulty of the passivation process and the electrode wiring process after cutting the n-GaN layer during the manufacturing process of the Micro-LED chip.

本发明的第一个目的是这样实现的:First purpose of the present invention is achieved like this:

一种Micro-LED微显示器,包括:A Micro-LED microdisplay comprising:

(1)一块CMOS驱动基板,其中包括可独立寻址控制的像素阵列,以及分布在像素区之外的公共电极;(1) A CMOS drive substrate, including an array of pixels that can be independently addressed and controlled, and common electrodes distributed outside the pixel area;

(2)形成在CMOS驱动基板上的重新分布层RDL(Re-distributed Layer);(2) The redistribution layer RDL (Re-distributed Layer) formed on the CMOS drive substrate;

(3)通过重新分布层RDL与CMOS驱动基板上的像素阵列相连接的Micro-LED芯片阵列;(3) A Micro-LED chip array connected to the pixel array on the CMOS drive substrate through the redistribution layer RDL;

特征是:Features are:

CMOS驱动基板表面有一层绝缘层,绝缘层上开有一系列通孔,从而暴露出CMOS驱动基板中像素阵列的金属电极;There is an insulating layer on the surface of the CMOS driving substrate, and a series of through holes are opened on the insulating layer, thereby exposing the metal electrodes of the pixel array in the CMOS driving substrate;

重新分布层RDL包括阳极、阴极以及像素阵列外的金属外框,其中:阳极为一个个独立分布的金属点阵,金属点阵分别通过所述绝缘层上的通孔与CMOS电路形成电连接;所述的阴极为一系列金属条,阴极的行数或列数与阳极金属点阵的行数或列数相同,且所有的阴极金属条全部连接到像素区外的金属外框;所述的金属外框有两个作用,一是将所有的阴极金属条连接起来,形成共阴连接;二是保证Micro-LED芯片阵列与CMOS驱动基板的像素阵列的对位精度;The redistribution layer RDL includes an anode, a cathode, and a metal frame outside the pixel array, wherein: the anode is an independently distributed metal lattice, and the metal lattice is electrically connected to the CMOS circuit through the through holes on the insulating layer; The cathode is a series of metal strips, the number of rows or columns of the cathode is the same as the number of rows or columns of the anode metal lattice, and all the cathode metal strips are connected to the metal frame outside the pixel area; the said The metal frame has two functions, one is to connect all the cathode metal strips to form a common cathode connection; the other is to ensure the alignment accuracy of the Micro-LED chip array and the pixel array of the CMOS drive substrate;

其中,Micro-LED芯片阵列是GaN基半导体材料制备的,且每颗芯片的GaN基半导体层均相互独立,互不相连。Among them, the Micro-LED chip array is made of GaN-based semiconductor materials, and the GaN-based semiconductor layers of each chip are independent of each other and not connected to each other.

优选的,重新分布层RDL中的阳极材料优选使用Cr、Pt、In、Sn、Au中的几种组合,阴极材料也优选使用Cr、Pt、In、Sn、Au中的几种组合;为了保证阳极、阴极易于形成键合连接,阳极、阴极的最表层优选为无氧化层及易软化的金属Au,且Au层的厚度不小于500nm。进一步的,所述阳极、阴极和金属外框的表面高度相差不大于100nm。Preferably, the anode material in the redistribution layer RDL preferably uses several combinations of Cr, Pt, In, Sn, Au, and the cathode material also preferably uses several combinations of Cr, Pt, In, Sn, Au; in order to ensure The anode and the cathode are easy to form a bonding connection, and the outermost layer of the anode and the cathode is preferably metal Au without an oxide layer and easy to soften, and the thickness of the Au layer is not less than 500nm. Further, the surface height difference between the anode, the cathode and the metal frame is not more than 100 nm.

进一步的,在CMOS驱动基板的绝缘层表面还设有一层保护层,以保护CMOS驱动基板不受后续工艺的损坏,从而提高器件的可靠性;为使该保护层具备良好的工艺耐受能力,该保护层为有机固化材料,优选为聚酰亚胺光刻胶或SU-8光刻胶。Further, a protective layer is also provided on the surface of the insulating layer of the CMOS driving substrate to protect the CMOS driving substrate from being damaged by the subsequent process, thereby improving the reliability of the device; in order to make the protective layer have good process tolerance, The protective layer is an organic curable material, preferably polyimide photoresist or SU-8 photoresist.

进一步的,Micro-LED芯片阵列中每颗芯片依次包括n-GaN层、p-GaN层以及夹在n-GaN层、p-GaN层之间的InGaN/GaN量子阱发光层。Further, each chip in the Micro-LED chip array sequentially includes an n-GaN layer, a p-GaN layer, and an InGaN/GaN quantum well light-emitting layer sandwiched between the n-GaN layer and the p-GaN layer.

进一步的,在每颗Micro-LED芯片的n-GaN层上设置有n型欧姆电极,在p-GaN层上设置有p型欧姆电极;其中,n型欧姆电极、p型欧姆电极分布在Micro-LED芯片同一侧;优选的,Micro-LED芯片的n型欧姆电极和p型欧姆电极表面层为厚度不小于500nm的Au层,且所述n型欧姆接触和p型欧姆电极的表面高度相差不大于200nm;Further, an n-type ohmic electrode is provided on the n-GaN layer of each Micro-LED chip, and a p-type ohmic electrode is provided on the p-GaN layer; wherein, the n-type ohmic electrode and the p-type ohmic electrode are distributed on the Micro-LED chip. - LED chip on the same side; preferably, the surface layer of the n-type ohmic electrode and the p-type ohmic electrode of the Micro-LED chip is an Au layer with a thickness not less than 500nm, and the surface heights of the n-type ohmic contact and the p-type ohmic electrode are different Not greater than 200nm;

进一步的,每个Micro-LED芯片的n型欧姆电极、p型欧姆电极上还制备有一层金属粘结叠层,且n型欧姆电极、p型欧姆电极之间的表面高度相差不大于200nm;金属粘结叠层的作用是使Micro-LED芯片阵列与重新分布层RDL相连接形成电流通道,并使Micro-LED芯片固定在CMOS驱动基板上。为了使这层金属粘结叠层在后续加工工艺过程中不容易遭受破坏,它们优选使用Cr、Pt、In、Sn、Au等耐化学腐蚀的金属;而为了保证这些金属易于形成键合连接,应选择熔点高于键合温度的金属,且金属粘结叠层的最表层优选为无氧化层及易软化的金属Au,其中Au层厚度不小于500nm。同时,为了保证Micro-LED芯片阵列与CMOS驱动基板的像素阵列的对位精度,在Micro-LED芯片阵列的外围还制备有金属内框,金属内框的高度与所述金属粘结叠层的高度相差不大于200nm,且金属内框的宽度应不小于金属粘结叠层宽度的三倍。Further, a layer of metal bonding laminate is also prepared on the n-type ohmic electrode and the p-type ohmic electrode of each Micro-LED chip, and the difference in surface height between the n-type ohmic electrode and the p-type ohmic electrode is not more than 200nm; The role of the metal bonding stack is to connect the Micro-LED chip array with the redistribution layer RDL to form a current channel, and to fix the Micro-LED chip on the CMOS drive substrate. In order to make this layer of metal bonded laminates not easily damaged during subsequent processing, they preferably use chemically resistant metals such as Cr, Pt, In, Sn, Au; and in order to ensure that these metals are easy to form bonding connections, The metal whose melting point is higher than the bonding temperature should be selected, and the outermost layer of the metal bonding laminate is preferably the metal Au which has no oxide layer and is easy to soften, and the thickness of the Au layer is not less than 500nm. At the same time, in order to ensure the alignment accuracy between the Micro-LED chip array and the pixel array of the CMOS drive substrate, a metal inner frame is prepared around the Micro-LED chip array, and the height of the metal inner frame is the same as the height of the metal bonded laminate. The height difference is not greater than 200nm, and the width of the metal inner frame should not be less than three times the width of the metal bonded laminate.

进一步的,Micro-LED芯片的p型欧姆电极与重新分布层RDL的阳极金属点阵一一对应形成键合连接,而Micro-LED芯片的n型欧姆电极与重新分布层RDL的阴极金属条形成键合连接。Further, the p-type ohmic electrode of the Micro-LED chip and the anode metal lattice of the redistribution layer RDL form a one-to-one correspondence to form a bonding connection, while the n-type ohmic electrode of the Micro-LED chip forms a bond connection with the cathode metal strip of the redistribution layer RDL. bonded connection.

进一步的,Micro-LED芯片阵列包括红光、绿光、蓝光Micro-LED芯片。Further, the Micro-LED chip array includes red, green and blue Micro-LED chips.

本发明的第二个目的是这样实现的:Second purpose of the present invention is achieved like this:

一种Micro-LED微显示器的制备方法,包括以下步骤:A method for preparing a Micro-LED microdisplay, comprising the following steps:

(1)在硅衬底上生长GaN基红/绿/蓝光LED外延结构;其中,LED外延结构包括n-GaN层、p-GaN层及夹在n-GaN层、p-GaN层之间的InGaN/GaN量子阱发光层;(1) Grow GaN-based red/green/blue LED epitaxial structures on silicon substrates; wherein, LED epitaxial structures include n-GaN layers, p-GaN layers, and n-GaN layers, p-GaN layers sandwiched between InGaN/GaN quantum well light-emitting layer;

(2)将一种颜色的LED外延结构制作成多个Micro-LED芯片,具体步骤是:先利用干法刻蚀工艺将LED外延结构部分区域的p-GaN层和InGaN/GaN量子阱层刻蚀去除至暴露出n-GaN层,形成p-GaN台面结构;然后利用干法刻蚀工艺将p-GaN台面结构之间的n-GaN层刻断,形成裸露出硅衬底的沟槽、LED外延框以及一个个相互独立的Micro-LED芯片;所述沟槽间的宽度不小于所述Micro-LED芯片的p-GaN台面结构宽度;(2) Make a LED epitaxial structure of one color into multiple Micro-LED chips. The specific steps are: first use the dry etching process to etch the p-GaN layer and the InGaN/GaN quantum well layer in some areas of the LED epitaxial structure. The n-GaN layer is etched and removed to expose the n-GaN layer to form a p-GaN mesa structure; then the n-GaN layer between the p-GaN mesa structures is etched by dry etching to form a trench exposing the silicon substrate, LED epitaxial frame and each independent Micro-LED chip; the width between the grooves is not less than the width of the p-GaN mesa structure of the Micro-LED chip;

(3)在每个p-GaN台面结构上制备p型欧姆电极,在每个p-GaN台面结构旁边的n-GaN层制备n型欧姆电极;(3) Prepare a p-type ohmic electrode on each p-GaN mesa structure, and prepare an n-type ohmic electrode on the n-GaN layer next to each p-GaN mesa structure;

(4)在n型欧姆电极、p型欧姆电极以及LED外延框上制备金属粘结叠层;(4) Preparing metal bonding laminates on n-type ohmic electrodes, p-type ohmic electrodes and LED epitaxial frames;

(5)刻蚀步骤(2)所述硅衬底的沟槽至深度大于GaN基LED外延结构的厚度;(5) In the etching step (2), the depth of the groove of the silicon substrate is greater than the thickness of the GaN-based LED epitaxial structure;

(6)对Micro-LED芯片阵列进行钝化处理,钝化层的材料是含Si、Al的氮化物或者氧化物;或者钝化层的材料是可固化的光刻胶,如聚酰亚胺光刻胶、SU-8光刻胶;(6) Passivate the Micro-LED chip array, the material of the passivation layer is nitride or oxide containing Si, Al; or the material of the passivation layer is curable photoresist, such as polyimide Photoresist, SU-8 photoresist;

(7)将一块表面覆盖有绝缘层的CMOS驱动基板进行刻蚀,形成通孔阵列;(7) Etching a CMOS drive substrate covered with an insulating layer to form a through-hole array;

(8)在所述开孔后的CMOS驱动基板上制备重新分布层RDL,所述的重新分布层RDL包括阳极、阴极以及像素阵列外的金属外框,其中阳极为一个个独立分布的金属点阵,金属点阵分别通过所述绝缘层上的通孔与CMOS驱动基板形成电连接;所述的阴极为一系列金属条,阴极的行数或列数与阳极点阵的行数或列数相同,且所有的阴极金属条全部连接到像素阵列外的金属外框;(8) Prepare a redistribution layer RDL on the CMOS drive substrate after the hole is opened. The redistribution layer RDL includes an anode, a cathode, and a metal frame outside the pixel array, where the anode is an independently distributed metal point The metal lattice is electrically connected to the CMOS drive substrate through the through holes on the insulating layer; the cathode is a series of metal strips, the number of rows or columns of the cathode is the same as the number of rows or columns of the anode lattice The same, and all cathode metal strips are connected to the metal frame outside the pixel array;

(9)在制备有重新分布层RDL的CMOS驱动基板表面旋涂一层可固化的光刻胶,通过光刻技术去除重新分布层RDL表面及CMOS驱动基板上的焊盘区域表面的光刻胶,然后将光刻胶固化,以保护CMOS驱动基板在后续工艺中不被破坏;可固化的光刻胶是聚酰亚胺光刻胶、SU-8光刻胶;(9) Spin-coat a layer of curable photoresist on the surface of the CMOS drive substrate with the redistribution layer RDL prepared, and remove the photoresist on the surface of the redistribution layer RDL and the surface of the pad area on the CMOS drive substrate by photolithography , and then cure the photoresist to protect the CMOS drive substrate from being damaged in the subsequent process; the curable photoresist is polyimide photoresist, SU-8 photoresist;

(10)将步骤(1)-(6)获得的一种颜色的Micro-LED芯片阵列与步骤(7)-(9)获得的带有重新分布层RDL的CMOS驱动基板进行对位键合,使Micro-LED芯片阵列中每个Micro-LED芯片的p型欧姆电极与重新分布层RDL的阳极金属点相连,每个Micro-LED芯片的n型欧姆电极与重新分布层RDL的阴极金属条相连;(10) Parasite-bond the Micro-LED chip array of one color obtained in steps (1)-(6) with the CMOS driver substrate with redistribution layer RDL obtained in steps (7)-(9), Connect the p-type ohmic electrode of each Micro-LED chip in the Micro-LED chip array to the anode metal point of the redistribution layer RDL, and connect the n-type ohmic electrode of each Micro-LED chip to the cathode metal strip of the redistribution layer RDL ;

(11)去除Micro-LED 芯片外延生长所用的硅衬底;得到一种单色Micro-LED微显示器;(11) Remove the silicon substrate used for the epitaxial growth of Micro-LED chips; obtain a monochrome Micro-LED microdisplay;

(12)用步骤(1)-(6)获得的第二种颜色的Micro-LED芯片阵列重复进行步骤(10)和(11),并保证键合的点位与第一次键合点位错开;(12) Repeat steps (10) and (11) with the second color Micro-LED chip array obtained in steps (1)-(6), and ensure that the bonding point is staggered from the first bonding point ;

(13)用步骤(1)-(6)获得的第三种颜色的Micro-LED芯片阵列重复进行步骤(10)和(11),并保证键合的点位与第一次和第二次键合点位错开;得到一种全彩Micro-LED微显示器。(13) Repeat steps (10) and (11) with the third color Micro-LED chip array obtained in steps (1)-(6), and ensure that the bonding points are the same as the first and second times The bonding points are staggered; a full-color Micro-LED microdisplay is obtained.

进一步的,Micro-LED芯片阵列与制备有重新分布层RDL的CMOS驱动基板的连接,是通过对准邦定的办法热压键合实现的,其中Micro-LED芯片的n型欧姆电极与重新分布层RDL的阴极连接,p型欧姆电极与重新分布层RDL的阳极连接,键合界面是Au/Au;同时,Micro-LED芯片阵列外围的金属内框与重新分布层RDL中的金属外框相连接,以保证Micro-LED芯片阵列与CMOS驱动基板的像素阵列的对位精度。Furthermore, the connection between the Micro-LED chip array and the CMOS drive substrate prepared with the redistribution layer RDL is realized by thermocompression bonding by alignment bonding, in which the n-type ohmic electrode of the Micro-LED chip is connected to the redistribution layer. The cathode of the RDL layer is connected, the p-type ohmic electrode is connected to the anode of the redistribution layer RDL, and the bonding interface is Au/Au; at the same time, the metal inner frame around the Micro-LED chip array is in contact with the metal outer frame in the redistribution layer RDL To ensure the alignment accuracy of the Micro-LED chip array and the pixel array of the CMOS drive substrate.

本发明通过在CMOS驱动基板上设计重新分布层RDL,使得Micro-LED芯片阵列集成于CMOS驱动基板,从而形成一个微显示器;这种微显示器结构的可以降低Micro-LED芯片制造过程中将n-GaN层刻断后钝化及电极布线工艺的难度,且Micro-LED芯片的硅衬底相较于蓝宝石衬底更容易去除,又无需使用复杂且困难的巨量转移技术,使得本发明实现全彩显示的方式更加简单可靠。In the present invention, by designing the redistribution layer RDL on the CMOS driving substrate, the Micro-LED chip array is integrated on the CMOS driving substrate, thereby forming a microdisplay; the structure of this microdisplay can reduce the n- The difficulty of passivation and electrode wiring process after the GaN layer is cut, and the silicon substrate of the Micro-LED chip is easier to remove than the sapphire substrate, and there is no need to use complex and difficult mass transfer technology, so that the present invention can achieve full-color The display method is simpler and more reliable.

附图说明Description of drawings

图1为本发明实施例提供的单色Micro-LED芯片阵列的制备流程示意图;Figure 1 is a schematic diagram of the preparation process of the monochrome Micro-LED chip array provided by the embodiment of the present invention;

图2为本发明实施例提供的在CMOS驱动基板上制备重新分布层RDL的流程示意图;FIG. 2 is a schematic flow diagram of preparing a redistribution layer RDL on a CMOS drive substrate provided by an embodiment of the present invention;

图3为本发明实施例提供的制备重新分布层RDL的立体流程示意图;Fig. 3 is a three-dimensional schematic flow chart for preparing a redistribution layer RDL provided by an embodiment of the present invention;

图4为本发明实施例提供的将单色Micro-LED芯片阵列集成于CMOS驱动基板的流程示意图;Fig. 4 is a schematic flow diagram of integrating a single-color Micro-LED chip array into a CMOS drive substrate provided by an embodiment of the present invention;

图5为本发明实施例提供的红光Micro-LED芯片阵列的制备流程示意图;Fig. 5 is a schematic diagram of the preparation process of the red Micro-LED chip array provided by the embodiment of the present invention;

图6为本发明实施例提供的绿光Micro-LED芯片阵列的制备流程示意图;Fig. 6 is a schematic diagram of the preparation process of the green Micro-LED chip array provided by the embodiment of the present invention;

图7为本发明实施例提供的蓝光Micro-LED芯片阵列的制备流程示意图;Fig. 7 is a schematic diagram of the preparation process of the blue light Micro-LED chip array provided by the embodiment of the present invention;

图8为本发明实施例提供的在CMOS驱动基板上制备重新分布层RDL的流程示意图;FIG. 8 is a schematic flow diagram of preparing a redistribution layer RDL on a CMOS drive substrate according to an embodiment of the present invention;

图9为本发明实施例提供的分别将红/绿/蓝光Micro-LED芯片阵列集成于CMOS驱动基板的流程示意图;FIG. 9 is a schematic flow diagram of integrating red/green/blue Micro-LED chip arrays into a CMOS drive substrate provided by an embodiment of the present invention;

图10为本发明实施例提供的一种不同尺寸芯片的全彩Micro-LED微显示器的结构示意图;FIG. 10 is a schematic structural diagram of a full-color Micro-LED microdisplay with chips of different sizes provided by an embodiment of the present invention;

图11为本发明实施例提供的另一种不同尺寸芯片的全彩Micro-LED微显示器的结构示意图。FIG. 11 is a schematic structural diagram of another full-color Micro-LED microdisplay with chips of different sizes provided by an embodiment of the present invention.

具体实施方式Detailed ways

为了便于本领域普通技术人员理解和实施本发明,下面结合附图对本发明作进一步的详细描述。In order to facilitate those of ordinary skill in the art to understand and implement the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings.

实施例1:Example 1:

一种单色Micro-LED微显示器的制备方法,包括以下三个内容:A method for preparing a monochrome Micro-LED microdisplay, comprising the following three contents:

A,如图1所示,一种单色Micro-LED芯片阵列的制备方法,包括以下步骤:A, as shown in Figure 1, a method for preparing a single-color Micro-LED chip array, comprising the following steps:

步骤S1,在硅衬底101表面生长LED外延结构110。其中,LED外延结构110包括n-GaN层111、p-GaN层113及夹在n-GaN层111、p-GaN层113之间的InGaN/GaN量子阱发光层112;Step S1 , growing an LED epitaxial structure 110 on the surface of the silicon substrate 101 . Wherein, the LED epitaxial structure 110 includes an n-GaN layer 111, a p-GaN layer 113, and an InGaN/GaN quantum well light-emitting layer 112 sandwiched between the n-GaN layer 111 and the p-GaN layer 113;

步骤S2,利用标准半导体制程将LED外延结构110制作成多个Micro-LED芯片115。具体步骤如下,通过刻蚀或者其他去除材料技术去除LED外延结构110的多余部分,从而暴露出部分n-GaN层111、p-GaN层113以及一个LED外延框114,使得剩余的LED外延结构110在硅衬底101之上形成多个尺寸约为10微米且呈间隔排布的独立结构;然后在n-GaN层111上制备n型欧姆电极150,在p-GaN层113和LED外延框114上制备p型欧姆电极160;这样就可以构成完整的Micro-LED芯片115,每个独立结构最终都会构成一个Micro-LED芯片115;In step S2 , the LED epitaxial structure 110 is fabricated into a plurality of Micro-LED chips 115 by standard semiconductor manufacturing process. The specific steps are as follows: remove the redundant part of the LED epitaxial structure 110 by etching or other material removal techniques, thereby exposing part of the n-GaN layer 111, the p-GaN layer 113 and an LED epitaxial frame 114, so that the remaining LED epitaxial structure 110 On the silicon substrate 101, a plurality of independent structures with a size of about 10 microns and arranged at intervals are formed; then an n-type ohmic electrode 150 is prepared on the n-GaN layer 111, and an n-type ohmic electrode 150 is prepared on the p-GaN layer 113 and the LED epitaxial frame 114 Prepare a p-type ohmic electrode 160 on it; in this way, a complete Micro-LED chip 115 can be formed, and each independent structure will eventually form a Micro-LED chip 115;

步骤S3,通过金属沉积技术在Micro-LED芯片115的n型欧姆电极150和p型欧姆电极160上制备金属粘结叠层170;Step S3, preparing a metal bonding laminate 170 on the n-type ohmic electrode 150 and the p-type ohmic electrode 160 of the Micro-LED chip 115 by metal deposition technology;

步骤S4,通过薄膜制备技术将Micro-LED芯片115进行钝化处理,钝化层为180。In step S4 , the Micro-LED chip 115 is passivated by thin film preparation technology, and the passivation layer is 180 .

B,如图2和图3所示,一种制备有重新分布层RDL的CMOS驱动基板的方法,包括以下步骤:B, as shown in Figure 2 and Figure 3, a method for preparing a CMOS drive substrate with a redistribution layer RDL, comprising the following steps:

步骤S1,利用标准半导体制程对CMOS驱动基板200进行绝缘层201开孔处理,暴露出CMOS驱动基板200的像素区域210的金属点阵202和非像素区域220的金属外框203;Step S1, using a standard semiconductor process to open the insulating layer 201 of the CMOS driving substrate 200, exposing the metal lattice 202 of the pixel area 210 and the metal frame 203 of the non-pixel area 220 of the CMOS driving substrate 200;

步骤S2,在开孔后的CMOS驱动基板200上制备重新分布层RDL。具体步骤如下,通过金属沉积技术在CMOS驱动基板200上制备一个个独立分布的阳极金属点阵231、一系列行数或列数与阳极金属点阵231的行数或列数相同的阴极金属条232以及金属外框233。其中,阳极金属点阵231与CMOS驱动基板200的金属点阵202形成电连接,且所有的阴极金属条232全部连接到像素区外部的金属外框233;In step S2, a redistribution layer RDL is prepared on the CMOS driving substrate 200 after the hole is opened. The specific steps are as follows. Prepare independently distributed anode metal lattices 231 and a series of cathode metal strips with the same number of rows or columns as the number of rows or columns of the anode metal lattice 231 on the CMOS drive substrate 200 by metal deposition technology. 232 and metal frame 233. Wherein, the anode metal lattice 231 is electrically connected to the metal lattice 202 of the CMOS driving substrate 200, and all the cathode metal strips 232 are connected to the metal frame 233 outside the pixel area;

步骤S3,对制备有重新分布层RDL的CMOS驱动基板200进行钝化保护处理,在CMOS驱动基板200除重新分布层RDL区域和I/O焊盘204区域外制备一层保护层240,这样就可以得到制备有重新分布层RDL的CMOS驱动基板200。In step S3, passivation protection is performed on the CMOS drive substrate 200 prepared with the redistribution layer RDL, and a layer of protection layer 240 is prepared on the CMOS drive substrate 200 except for the redistribution layer RDL region and the I/O pad 204 region, so that A CMOS driving substrate 200 prepared with a redistribution layer RDL can be obtained.

C、如图4所示,一种将单色Micro-LED芯片阵列集成于制备有重新分布层RDL的CMOS驱动基板的方法,包括以下步骤:C. As shown in Figure 4, a method for integrating a monochromatic Micro-LED chip array into a CMOS drive substrate prepared with a redistribution layer RDL, comprising the following steps:

步骤S1,使用对准邦定机将Micro-LED芯片115集成到制备有重新分布层RDL的CMOS驱动基板200上。其中,Micro-LED芯片115的n型欧姆电极150与重新分布层RDL的阴极金属条232连接,p型欧姆电极160与重新分布层RDL 的阳极金属点阵231连接;Step S1, using an alignment bonding machine to integrate the Micro-LED chip 115 onto the CMOS drive substrate 200 prepared with the redistribution layer RDL. Wherein, the n-type ohmic electrode 150 of the Micro-LED chip 115 is connected to the cathode metal strip 232 of the redistribution layer RDL, and the p-type ohmic electrode 160 is connected to the anode metal lattice 231 of the redistribution layer RDL;

步骤S2,去除Micro-LED芯片115的硅衬底101,得到一种单色Micro-LED微显示器。Step S2, removing the silicon substrate 101 of the Micro-LED chip 115 to obtain a single-color Micro-LED microdisplay.

实施例2:Example 2:

一种全彩Micro-LED微显示器的制备方法,包括以下步骤:A method for preparing a full-color Micro-LED microdisplay, comprising the following steps:

A、如图5、图6和图7所示,一种红/绿/蓝光Micro-LED芯片阵列的制备方法,包括但不限于以下步骤:A. As shown in Figure 5, Figure 6 and Figure 7, a method for preparing a red/green/blue Micro-LED chip array includes but is not limited to the following steps:

步骤S1,在硅衬底101表面生长LED外延结构110。其中,LED外延结构110包括n-GaN层111、p-GaN层113及夹在n-GaN层111、p-GaN层113之间的红/绿/蓝光InGaN/GaN量子阱发光层122/132/142;Step S1 , growing an LED epitaxial structure 110 on the surface of the silicon substrate 101 . Wherein, the LED epitaxial structure 110 includes an n-GaN layer 111, a p-GaN layer 113, and red/green/blue InGaN/GaN quantum well light-emitting layers 122/132 sandwiched between the n-GaN layer 111 and the p-GaN layer 113. /142;

步骤S2,利用标准半导体制程将LED外延结构120/130/140制作成多个红/绿/蓝光Micro-LED芯片125/135/145。具体实现中,可以通过刻蚀或者其他去除材料技术去除LED外延结构120/130/140的多余部分,从而暴露出部分n-GaN层111、p-GaN层113以及一个红/绿/蓝光LED外延框124/134/144,使得剩余的外延结构120/130/140在硅衬底101之上形成多个尺寸约为10微米且呈间隔排布的独立结构,即把n-GaN层111刻断;然后在n-GaN层111上制备n型欧姆电极150,在p-GaN层113和LED外延框124/134/144上制备p型欧姆电极160;这样就可以构成完整的红/绿/蓝光Micro-LED芯片125/135/145,每个独立结构最终都会构成一个红/绿/蓝光Micro-LED芯片125/135/145;In step S2, the LED epitaxial structure 120/130/140 is fabricated into a plurality of red/green/blue Micro-LED chips 125/135/145 by using standard semiconductor manufacturing process. In a specific implementation, the excess part of the LED epitaxial structure 120/130/140 can be removed by etching or other material removal techniques, thereby exposing part of the n-GaN layer 111, the p-GaN layer 113 and a red/green/blue LED epitaxial structure. Block 124/134/144, so that the remaining epitaxial structure 120/130/140 forms a plurality of independent structures with a size of about 10 microns and arranged at intervals on the silicon substrate 101, that is, the n-GaN layer 111 is cut off ; Then prepare an n-type ohmic electrode 150 on the n-GaN layer 111, and prepare a p-type ohmic electrode 160 on the p-GaN layer 113 and the LED epitaxial frame 124/134/144; in this way, a complete red/green/blue light can be formed Micro-LED chip 125/135/145, each independent structure will eventually form a red/green/blue Micro-LED chip 125/135/145;

步骤S3,通过金属沉积技术在红/绿/蓝光Micro-LED芯片125/135/145的n型欧姆电极150和p型欧姆电极160上制备金属粘结叠层170;Step S3, preparing a metal bonding stack 170 on the n-type ohmic electrode 150 and the p-type ohmic electrode 160 of the red/green/blue Micro-LED chip 125/135/145 by metal deposition technology;

步骤S4,通过刻蚀或者其他去除硅材料技术去除红/绿/蓝光Micro-LED芯片125/135/145的硅衬底101的多余部分,保证沟槽的深度大于GaN基红/绿/蓝光LED外延结构的厚度,从而得到硅沟槽190;Step S4, remove the excess part of the silicon substrate 101 of the red/green/blue Micro-LED chips 125/135/145 by etching or other silicon material removal techniques, ensuring that the depth of the groove is greater than that of the GaN-based red/green/blue LED The thickness of the epitaxial structure, thereby obtaining the silicon trench 190;

步骤S5,通过薄膜制备技术将红/绿/蓝光Micro-LED芯片125/135/145进行钝化处理,钝化层为180。In step S5, the red/green/blue Micro-LED chips 125/135/145 are passivated by thin film preparation technology, and the passivation layer is 180.

B、如图8所示,一种制备有重新分布层RDL的CMOS驱动基板的方法,包括以下步骤:B. As shown in Figure 8, a method for preparing a CMOS drive substrate with a redistribution layer RDL, comprising the following steps:

步骤S1,利用标准半导体制程对CMOS驱动基板200进行绝缘层201开孔处理,暴露出CMOS驱动基板200的像素区域210的金属点阵202和非像素区域220的金属外框203;Step S1, using a standard semiconductor process to open the insulating layer 201 of the CMOS driving substrate 200, exposing the metal lattice 202 of the pixel area 210 and the metal frame 203 of the non-pixel area 220 of the CMOS driving substrate 200;

步骤S2,在开孔后的CMOS驱动基板200上制备重新分布层RDL。具体步骤如下,通过金属沉积技术在CMOS驱动基板200上制备一个个独立分布的阳极金属点阵231和一系列行数或列数与阳极金属点阵231的行数或列数相同的阴极金属条232。其中,阳极金属点阵231与CMOS驱动基板200的金属点阵202形成电连接,且所有的阴极金属条232全部连接到像素区外部的金属外框233;In step S2, a redistribution layer RDL is prepared on the CMOS driving substrate 200 after the hole is opened. The specific steps are as follows. Prepare independently distributed anode metal lattices 231 and a series of cathode metal strips with the same number of rows or columns as the number of rows or columns of the anode metal lattice 231 on the CMOS drive substrate 200 by metal deposition technology. 232. Wherein, the anode metal lattice 231 is electrically connected to the metal lattice 202 of the CMOS driving substrate 200, and all the cathode metal strips 232 are connected to the metal frame 233 outside the pixel area;

步骤S3,对制备有重新分布层RDL的CMOS驱动基板200进行钝化保护处理,在CMOS驱动基板200除重新分布层RDL区域和I/O焊盘204区域外制备一层保护层240。这样就可以得到制备有重新分布层RDL的CMOS驱动基板200。In step S3 , passivation protection is performed on the CMOS driving substrate 200 prepared with the redistribution layer RDL, and a protective layer 240 is prepared on the CMOS driving substrate 200 except for the RDL region and the I/O pad 204 region. In this way, the CMOS driving substrate 200 prepared with the redistribution layer RDL can be obtained.

C、如图9所示,一种将红/绿/蓝光Micro-LED芯片阵列集成于制备有重新分布层RDL的CMOS驱动基板的方法,包括以下步骤:C, as shown in Figure 9, a method for integrating red/green/blue Micro-LED chip arrays on a CMOS drive substrate prepared with a redistribution layer RDL, comprising the following steps:

步骤S1,使用对准邦定机将红光Micro-LED芯片125集成到制备有重新分布层RDL的CMOS驱动基板200上。其中,红光Micro-LED芯片125的n型欧姆电极150与重新分布层RDL的阴极金属条232连接,p型欧姆电极160与重新分布层RDL的阳极金属点阵231连接;Step S1, using an alignment bonding machine to integrate the red Micro-LED chip 125 onto the CMOS drive substrate 200 prepared with the redistribution layer RDL. Wherein, the n-type ohmic electrode 150 of the red Micro-LED chip 125 is connected to the cathode metal strip 232 of the redistribution layer RDL, and the p-type ohmic electrode 160 is connected to the anode metal lattice 231 of the redistribution layer RDL;

步骤S2,去除红光Micro-LED芯片125的硅衬底101;Step S2, removing the silicon substrate 101 of the red Micro-LED chip 125;

步骤S3,使用对准邦定机将绿光Micro-LED芯片135集成到制备有重新分布层RDL的CMOS驱动基板200上。其中,绿光Micro-LED芯片135的n型欧姆电极150与重新分布层RDL的阴极金属条232连接,p型欧姆电极160与重新分布层RDL的阳极金属点阵231连接;Step S3, using an alignment bonding machine to integrate the green Micro-LED chip 135 onto the CMOS drive substrate 200 prepared with the redistribution layer RDL. Wherein, the n-type ohmic electrode 150 of the green Micro-LED chip 135 is connected to the cathode metal strip 232 of the redistribution layer RDL, and the p-type ohmic electrode 160 is connected to the anode metal lattice 231 of the redistribution layer RDL;

步骤S4,去除绿光Micro-LED芯片135的硅衬底101;Step S4, removing the silicon substrate 101 of the green Micro-LED chip 135;

步骤S5,使用对准邦定机将蓝光Micro-LED芯片145集成到制备有重新分布层RDL的CMOS驱动基板200上。其中,蓝光Micro-LED芯片145的n型欧姆电极150与重新分布层RDL的阴极金属条232连接,p型欧姆电极160与重新分布层RDL的阳极金属点阵231连接;Step S5 , using an alignment bonding machine to integrate the blue Micro-LED chip 145 onto the CMOS drive substrate 200 prepared with the redistribution layer RDL. Wherein, the n-type ohmic electrode 150 of the blue Micro-LED chip 145 is connected to the cathode metal strip 232 of the redistribution layer RDL, and the p-type ohmic electrode 160 is connected to the anode metal lattice 231 of the redistribution layer RDL;

步骤S6,去除蓝光Micro-LED芯片145的硅衬底101。Step S6 , removing the silicon substrate 101 of the blue Micro-LED chip 145 .

如图10、图11所示,这样就得到一种全彩Micro-LED微显示器。As shown in Figure 10 and Figure 11, a full-color Micro-LED microdisplay is thus obtained.

需要说明的是,上述本发明的单色或者全彩Micro-LED微显示器的制备方法,所述的步骤并不要求完全按所列的顺序完成,可以根据采用的设备等条件适当地调节其顺序。本发明对GaN生长和刻蚀条件也没有特别的限制,邦定的温度、压力也可以根据具体设备条件,或者本领域技术人员通常具备的经验加以适当调整。这些调整也属于本发明的技术方案保护的范围。It should be noted that, the above-mentioned method for preparing a single-color or full-color Micro-LED microdisplay of the present invention does not require the steps to be completed in the order listed, and the order can be appropriately adjusted according to the conditions of the equipment used. . The present invention has no special limitation on GaN growth and etching conditions, and the bonding temperature and pressure can also be appropriately adjusted according to specific equipment conditions or the experience usually possessed by those skilled in the art. These adjustments also belong to the protection scope of the technical solution of the present invention.

进一步,本发明实施例中的Micro-LED芯片尺寸约为“10微米”仅作为示例尺寸,不构成对Micro-LED芯片尺寸的具体限定。一般说来,Micro-LED芯片的尺寸可以达到1~50μm之间,本领域技术人员可以根据Micro-LED芯片常见的尺寸范围确定相应的半导体制程,本申请对此不做限定。Further, the size of the Micro-LED chip in the embodiment of the present invention is about "10 microns" only as an example size, and does not constitute a specific limitation on the size of the Micro-LED chip. Generally speaking, the size of Micro-LED chips can reach between 1 and 50 μm. Those skilled in the art can determine the corresponding semiconductor manufacturing process according to the common size range of Micro-LED chips, which is not limited in this application.

以上实施例仅用于说明本发明的设计思想和特点,其目的在于使本领域内的技术人员能够了解本发明的内容并据以实施,本发明的保护范围不限于上述实施例。所以,凡依据本发明所揭示的原理、设计思路所作的等同变化或修饰,均在本发明的保护范围之内。The above embodiments are only used to illustrate the design concept and characteristics of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly. The protection scope of the present invention is not limited to the above embodiments. Therefore, all equivalent changes or modifications based on the principles and design ideas disclosed in the present invention are within the protection scope of the present invention.

Claims (9)

1.一种Micro-LED微显示器,包括:1. A Micro-LED microdisplay, comprising: (1)一块CMOS驱动基板,其中包括可独立寻址控制的像素阵列,以及分布在像素区之外的公共电极;(1) A CMOS drive substrate, including an independently addressable and controllable pixel array, and common electrodes distributed outside the pixel area; (2)形成在CMOS驱动基板上的重新分布层RDL;(2) The redistribution layer RDL formed on the CMOS drive substrate; (3)通过RDL与CMOS驱动基板上的像素阵列相连接的Micro-LED芯片阵列;(3) Micro-LED chip array connected to the pixel array on the CMOS drive substrate through RDL; 其特征在于:It is characterized by: CMOS驱动基板表面有一层绝缘层,绝缘层上开有一系列通孔;There is an insulating layer on the surface of the CMOS drive substrate, and a series of through holes are opened on the insulating layer; 所述重新分布层RDL包括阳极、阴极以及金属外框,其中阳极为一个个独立分布的金属点阵,金属点阵分别通过所述绝缘层上的小孔与CMOS电路形成电连接;所述的阴极为金属条,其行数或列数与阳极金属点阵的行数或列数相同,且所有的阴极金属条全部连接到像素区外的金属外框;The redistribution layer RDL includes an anode, a cathode, and a metal frame, wherein the anode is an independently distributed metal lattice, and the metal lattice is electrically connected to the CMOS circuit through the holes on the insulating layer; the The cathode is a metal strip, the number of rows or columns is the same as the number of rows or columns of the anode metal lattice, and all the cathode metal strips are connected to the metal frame outside the pixel area; 其中,所述的Micro-LED芯片阵列是GaN基半导体材料制备的,且每颗芯片的GaN基半导体层均相互独立,互不相连。Wherein, the Micro-LED chip array is made of GaN-based semiconductor materials, and the GaN-based semiconductor layers of each chip are independent of each other and not connected to each other. 2.根据权利要求1所述的Micro-LED微显示器,其特征在于:所述重新分布层RDL的表面层为厚度不小于500nm的Au层,且所述阳极、阴极和金属外框的表面高度相差不大于100nm。2. The Micro-LED microdisplay according to claim 1, characterized in that: the surface layer of the redistribution layer RDL is an Au layer with a thickness not less than 500 nm, and the surface height of the anode, cathode and metal frame The difference is not more than 100nm. 3.根据权利要求1或2所述的Micro-LED微显示器,其特征在于:所述的每颗Micro-LED芯片的n型欧姆电极和p欧姆电极分布在Micro-LED芯片同一侧;所述的Micro-LED芯片的n型欧姆电极和p型欧姆电极表面层为厚度不小于500nm的Au层,且所述n型欧姆接触和p型欧姆电极的表面高度相差不大于200nm;其中Micro-LED芯片的p型欧姆电极与RDL的阳极金属点阵一一对应形成键合连接,而Micro-LED芯片的n型欧姆电极与RDL的阴极金属条形成键合连接。3. The Micro-LED microdisplay according to claim 1 or 2, characterized in that: the n-type ohmic electrode and the p-ohmic electrode of each Micro-LED chip are distributed on the same side of the Micro-LED chip; The surface layer of the n-type ohmic electrode and the p-type ohmic electrode of the Micro-LED chip is an Au layer with a thickness of not less than 500nm, and the difference between the surface heights of the n-type ohmic contact and the p-type ohmic electrode is not more than 200nm; wherein the Micro-LED The p-type ohmic electrode of the chip forms a one-to-one bond connection with the anode metal lattice of the RDL, while the n-type ohmic electrode of the Micro-LED chip forms a bond connection with the cathode metal strip of the RDL. 4.根据权利要求1所述的Micro-LED微显示器,其特征在于:所述的Micro-LED芯片阵列包括红光、绿光、蓝光Micro-LED芯片。4. The Micro-LED microdisplay according to claim 1, wherein the Micro-LED chip array includes red, green and blue Micro-LED chips. 5.一种Micro-LED微显示器的制备方法,包括以下步骤:5. A preparation method for a Micro-LED microdisplay, comprising the following steps: (1)在硅衬底上生长GaN基红/绿/蓝光LED外延结构;其中,LED外延结构包括n-GaN层、p-GaN层及夹在n-GaN层、p-GaN层之间的InGaN/GaN量子阱发光层;(1) Grow GaN-based red/green/blue LED epitaxial structures on silicon substrates; wherein, LED epitaxial structures include n-GaN layers, p-GaN layers, and n-GaN layers, p-GaN layers sandwiched between InGaN/GaN quantum well light-emitting layer; (2)将一种颜色的LED外延结构制作成多个Micro-LED芯片,具体步骤是:先利用干法刻蚀工艺将LED外延结构部分区域的p-GaN层和InGaN/GaN量子阱层刻蚀去除至暴露出n-GaN层,形成p-GaN台面结构;然后利用干法刻蚀工艺将p-GaN台面结构之间的n-GaN层刻断,形成裸露出硅衬底的沟槽、LED外延框以及一个个相互独立的Micro-LED芯片;所述沟槽间的宽度不小于所述Micro-LED芯片的p-GaN台面结构宽度;(2) Make a LED epitaxial structure of one color into multiple Micro-LED chips. The specific steps are: first use the dry etching process to etch the p-GaN layer and the InGaN/GaN quantum well layer in some areas of the LED epitaxial structure. The n-GaN layer is etched and removed to expose the n-GaN layer to form a p-GaN mesa structure; then the n-GaN layer between the p-GaN mesa structures is etched by dry etching to form a trench exposing the silicon substrate, LED epitaxial frame and each independent Micro-LED chip; the width between the grooves is not less than the width of the p-GaN mesa structure of the Micro-LED chip; (3)在每个p-GaN台面结构上制备p型欧姆电极,在每个p-GaN台面结构旁边的n-GaN层制备n型欧姆电极;(3) Prepare a p-type ohmic electrode on each p-GaN mesa structure, and prepare an n-type ohmic electrode on the n-GaN layer next to each p-GaN mesa structure; (4)在n型欧姆电极、p型欧姆电极以及LED外延框上制备金属粘结叠层;(4) Preparing metal bonding laminates on n-type ohmic electrodes, p-type ohmic electrodes and LED epitaxial frames; (5)对Micro-LED芯片阵列进行钝化处理,得到钝化层;(5) Passivate the Micro-LED chip array to obtain a passivation layer; (6)将一块表面覆盖有绝缘层的CMOS驱动基板进行刻蚀,形成通孔阵列;(6) Etching a CMOS drive substrate covered with an insulating layer to form a through-hole array; (7)在所述开孔后的CMOS驱动基板上制备重新分布层RDL,所述的重新分布层RDL包括阳极、阴极以及像素阵列外的金属外框,其中阳极为一个个独立分布的金属点阵,金属点阵分别通过所述绝缘层上的通孔与CMOS驱动基板形成电连接;所述的阴极为一系列金属条,阴极的行数或列数与阳极点阵的行数或列数相同,且所有的阴极金属条全部连接到像素阵列外的金属外框;(7) Prepare a redistribution layer RDL on the CMOS drive substrate after the hole is opened. The redistribution layer RDL includes an anode, a cathode, and a metal frame outside the pixel array, where the anode is an independently distributed metal point The metal lattice is electrically connected to the CMOS drive substrate through the through holes on the insulating layer; the cathode is a series of metal strips, the number of rows or columns of the cathode is the same as the number of rows or columns of the anode lattice The same, and all cathode metal strips are connected to the metal frame outside the pixel array; (8)在制备有重新分布层RDL的CMOS驱动基板表面旋涂一层可固化的光刻胶,通过光刻技术去除重新分布层RDL表面及CMOS驱动基板上的焊盘区域表面的光刻胶,然后将光刻胶固化,以保护CMOS驱动基板在后续工艺中不被破坏;(8) Spin-coat a layer of curable photoresist on the surface of the CMOS drive substrate with the redistribution layer RDL prepared, and remove the photoresist on the surface of the redistribution layer RDL and the surface of the pad area on the CMOS drive substrate by photolithography , and then cure the photoresist to protect the CMOS drive substrate from damage in subsequent processes; (9)将步骤(1)-(5)获得的一种颜色的Micro-LED芯片阵列与步骤(6)-(8)获得的制备有重新分布层RDL的CMOS驱动基板进行对位键合,使Micro-LED芯片阵列中每个Micro-LED芯片的p型欧姆电极与重新分布层RDL的阳极金属点相连,每个Micro-LED芯片的n型欧姆电极与重新分布层RDL的阴极金属条相连;(9) Parasite bonding the Micro-LED chip array of one color obtained in steps (1)-(5) and the CMOS drive substrate prepared with the redistribution layer RDL obtained in steps (6)-(8), Connect the p-type ohmic electrode of each Micro-LED chip in the Micro-LED chip array to the anode metal point of the redistribution layer RDL, and connect the n-type ohmic electrode of each Micro-LED chip to the cathode metal strip of the redistribution layer RDL ; (10)去除Micro-LED 芯片外延生长所用的硅衬底;得到一种单色Micro-LED微显示器。(10) Remove the silicon substrate used for the epitaxial growth of the Micro-LED chip; obtain a monochrome Micro-LED microdisplay. 6.根据权利要求5所述的Micro-LED微显示器的制备方法,其特征在于:包括以下步骤来制备全彩Micro-LED微显示器:6. The method for preparing a Micro-LED microdisplay according to claim 5, characterized in that: it comprises the following steps to prepare a full-color Micro-LED microdisplay: 重复步骤(1)-(5)三次,分别制备三种不同颜色的Micro-LED阵列;Repeat steps (1)-(5) three times to prepare Micro-LED arrays of three different colors; 重复步骤(9)-(10)三次,分别将三种不同颜色的Micro-LED阵列与步骤(6)-(8)获得的带有重新分布层RDL的CMOS驱动基板进行对位键合并去除硅衬底,并保证每次键合的点位与前面的键合点位错开。Repeat steps (9)-(10) three times, respectively perform alignment bonding of three different color Micro-LED arrays with the CMOS driver substrate with redistribution layer RDL obtained in steps (6)-(8) and remove the silicon substrate, and ensure that each bonding point is staggered from the previous bonding point. 7.根据权利要求6所述的Micro-LED微显示器的制备方法,其特征在于:制备第二种和第三种颜色的Micro-LED芯片阵列时,在步骤(5)钝化处理前对硅衬底的沟槽进行刻蚀,刻蚀深度大于GaN基LED外延结构的厚度。7. The method for preparing Micro-LED microdisplays according to claim 6, characterized in that: when preparing the Micro-LED chip arrays of the second and third colors, before the passivation treatment in step (5), silicon The groove of the substrate is etched, and the etching depth is greater than the thickness of the GaN-based LED epitaxial structure. 8.根据权利要求5所述的Micro-LED微显示器的制备方法,其特征在于:步骤(5)中,钝化层的材料是含Si、Al的氮化物或者氧化物;或者钝化层的材料是可固化的光刻胶,如聚酰亚胺光刻胶、SU-8光刻胶。8. The method for preparing a Micro-LED microdisplay according to claim 5, characterized in that: in step (5), the material of the passivation layer is a nitride or oxide containing Si and Al; or the material of the passivation layer The material is curable photoresist, such as polyimide photoresist, SU-8 photoresist. 9.根据权利要求5所述的Micro-LED微显示器的制备方法,其特征在于:步骤(8)中,可固化的光刻胶是聚酰亚胺光刻胶、SU-8光刻胶。9 . The method for preparing a Micro-LED microdisplay according to claim 5 , wherein in step (8), the curable photoresist is polyimide photoresist or SU-8 photoresist.
CN202310475901.5A 2023-04-28 2023-04-28 Micro-LED Micro display and preparation method thereof Pending CN116404027A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116722094A (en) * 2023-08-07 2023-09-08 季华实验室 Display panel and manufacturing method thereof
CN117038695A (en) * 2023-08-07 2023-11-10 星钥(珠海)半导体有限公司 Tunneling junction RGB miniature light-emitting diode and manufacturing method thereof
CN117219715A (en) * 2023-11-08 2023-12-12 华引芯(武汉)科技有限公司 Preparation method of micro LED matrix light source and micro LED matrix light source

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116722094A (en) * 2023-08-07 2023-09-08 季华实验室 Display panel and manufacturing method thereof
CN117038695A (en) * 2023-08-07 2023-11-10 星钥(珠海)半导体有限公司 Tunneling junction RGB miniature light-emitting diode and manufacturing method thereof
CN117219715A (en) * 2023-11-08 2023-12-12 华引芯(武汉)科技有限公司 Preparation method of micro LED matrix light source and micro LED matrix light source
CN117219715B (en) * 2023-11-08 2024-03-01 华引芯(武汉)科技有限公司 Preparation method of micro LED matrix light source and micro LED matrix light source

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