CN116403943A - A heating plate and its manufacturing method, a semiconductor device - Google Patents
A heating plate and its manufacturing method, a semiconductor device Download PDFInfo
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- 238000010438 heat treatment Methods 0.000 title claims abstract description 161
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 23
- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 229910052751 metal Inorganic materials 0.000 claims abstract description 81
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- 239000000463 material Substances 0.000 claims description 29
- 238000009413 insulation Methods 0.000 claims description 25
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- 238000001816 cooling Methods 0.000 claims description 23
- 230000001105 regulatory effect Effects 0.000 claims description 22
- 239000007769 metal material Substances 0.000 claims description 12
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 12
- 238000010926 purge Methods 0.000 claims description 11
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical group Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 10
- 239000002002 slurry Substances 0.000 claims description 8
- 238000005260 corrosion Methods 0.000 claims description 7
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 238000005219 brazing Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 6
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- 229920006362 Teflon® Polymers 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 238000005476 soldering Methods 0.000 claims description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical group [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 5
- 229910052721 tungsten Inorganic materials 0.000 claims description 5
- 239000010937 tungsten Substances 0.000 claims description 5
- 238000003825 pressing Methods 0.000 claims description 4
- 239000000498 cooling water Substances 0.000 claims description 3
- 238000010304 firing Methods 0.000 claims description 3
- 238000005507 spraying Methods 0.000 claims description 3
- 238000005553 drilling Methods 0.000 claims description 2
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- 238000001514 detection method Methods 0.000 description 2
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- 229910052757 nitrogen Inorganic materials 0.000 description 2
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- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
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- H01L21/67103—Apparatus for thermal treatment mainly by conduction
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Abstract
Description
技术领域technical field
本发明涉及半导体领域,特别涉及一种加热盘及其制造方法、一种半导体设备。The invention relates to the field of semiconductors, in particular to a heating plate, a manufacturing method thereof, and a semiconductor device.
背景技术Background technique
随着半导体相关技术的发展,半导体器件以及芯片的制造工艺也在快速发展。With the development of semiconductor-related technologies, the manufacturing process of semiconductor devices and chips is also developing rapidly.
在半导体器件的制造过程中,通常会用到加热盘,将待制造器件放置到加热盘上,利用加热盘对待制造器件进行均匀加热,以实现在制造半导体器件的工艺过程中的温度要求。In the manufacturing process of semiconductor devices, a heating plate is usually used. Place the device to be manufactured on the heating plate, and use the heating plate to uniformly heat the device to be manufactured to meet the temperature requirements in the process of manufacturing semiconductor devices.
但是当前的加热盘存在不同区域的温差较大,加热盘存在温度不均匀的现象。However, the current heating plate has a large temperature difference between different regions, and the heating plate has a phenomenon of uneven temperature.
发明内容Contents of the invention
有鉴于此,本申请的目的在于提供一种加热盘及其制造方法、一种半导体设备,能够降低加热盘不同区域的温差,提高加热盘的温度均匀性。In view of this, the object of the present application is to provide a heating plate and its manufacturing method, and a semiconductor device, which can reduce the temperature difference between different regions of the heating plate and improve the temperature uniformity of the heating plate.
本申请实施例提供了一种加热盘,所述加热盘包括:温度调节层;所述温度调节层包括多个调温区域,多个所述调温区域之间的面积差值小于目标阈值;An embodiment of the present application provides a heating plate, the heating plate includes: a temperature adjustment layer; the temperature adjustment layer includes a plurality of temperature adjustment regions, and the area difference between the plurality of temperature adjustment regions is smaller than a target threshold;
所述调温区域设置有至少一个金属回路,利用所述金属回路对所述调温区域的温度进行调节,以便所述温度调节层包括的多个所述调温区域之间的温度相同。The temperature adjustment area is provided with at least one metal circuit, and the temperature of the temperature adjustment area is adjusted by using the metal circuit, so that the temperature among the plurality of temperature adjustment areas included in the temperature adjustment layer is the same.
可选地,所述温度调节层包括多个同心圆环区域,每个所述同心圆环包括至少一个调温区域。Optionally, the temperature regulation layer includes a plurality of concentric ring regions, each of which includes at least one temperature regulation region.
可选地,温度调节层的材料为氮化铝,所述金属回路的材料为钨或铂。Optionally, the material of the temperature regulation layer is aluminum nitride, and the material of the metal circuit is tungsten or platinum.
可选地,还包括电阻温度检测器,所述电阻温度检测器和所述金属回路连接;Optionally, a resistance temperature detector is also included, the resistance temperature detector is connected to the metal loop;
所述电阻温度检测器用于获取所述金属回路的阻抗,以便根据所述金属回路的阻抗确定所述调温区域的实际温度变化值。The resistance temperature detector is used to obtain the impedance of the metal loop, so as to determine the actual temperature change value of the temperature adjustment area according to the impedance of the metal loop.
可选地,还包括接地电极层,所述接地电极层包括返回电极,所述返回电极和所述金属回路连接。Optionally, a ground electrode layer is further included, the ground electrode layer includes a return electrode, and the return electrode is connected to the metal loop.
可选地,所述加热盘包括放置待加热物的加热侧,所述加热盘还包括升温层,所述升温层设置于所述温度调节层远离所述加热侧的一侧。Optionally, the heating plate includes a heating side where the object to be heated is placed, and the heating plate further includes a temperature raising layer, and the temperature raising layer is disposed on a side of the temperature regulating layer away from the heating side.
可选地,所述升温层包括加热回路,所述升温层和所述温度调节层为一体结构,所述一体结构是在氮化铝材料形成的叠层结构上分别印刷加热回路和金属回路而后将叠层结构堆叠烧结形成的。Optionally, the temperature raising layer includes a heating circuit, and the temperature raising layer and the temperature regulating layer are integrally structured, and the integrated structure is to print a heating circuit and a metal circuit on a laminated structure formed of an aluminum nitride material respectively and then It is formed by stacking and sintering the laminated structure.
可选地,还包括隔热层,所述隔热层设置于所述升温层远离所述加热侧的一侧。Optionally, a heat insulation layer is also included, and the heat insulation layer is arranged on a side of the heating layer away from the heating side.
可选地,所述隔热层的材料包括不透明石英或氧化铝。Optionally, the material of the thermal insulation layer includes opaque quartz or aluminum oxide.
可选地,还包括陶瓷层,所述陶瓷层设置于所述隔热层远离所述加热侧的一侧。Optionally, a ceramic layer is further included, and the ceramic layer is disposed on a side of the heat insulation layer away from the heating side.
可选地,所述陶瓷层的材料包括氧化铝。Optionally, the material of the ceramic layer includes alumina.
可选地,所述隔热层和所述陶瓷层包括连接线,所述连接线用于连接所述金属回路和电源;Optionally, the heat insulation layer and the ceramic layer include connecting wires, and the connecting wires are used to connect the metal circuit and a power supply;
所述连接线包括依次连接的第一金属线、第二金属线以及端子,所述第一金属线设置于所述隔热层,所述第二金属线设置于所述隔热层和所述陶瓷层的界面,所述端子设置于所述陶瓷层。The connecting wire includes a first metal wire, a second metal wire and a terminal connected in sequence, the first metal wire is arranged on the heat insulation layer, and the second metal wire is arranged on the heat insulation layer and the heat insulation layer. The interface of the ceramic layer, the terminal is arranged on the ceramic layer.
可选地,所述端子利用钎焊或铜焊工艺形成,所述第二金属线利用印刷工艺形成。Optionally, the terminals are formed by a soldering or brazing process, and the second metal lines are formed by a printing process.
可选地,还包括侧壁隔热层,所述侧壁隔热层设置在所述温度调节层、升温层以及陶瓷层的侧壁。Optionally, a side wall heat insulating layer is also included, and the side wall heat insulating layer is arranged on the side walls of the temperature regulating layer, the temperature raising layer and the ceramic layer.
可选地,所述侧壁隔热层的侧壁设置有防腐蚀涂层。Optionally, the side wall of the side wall heat insulation layer is provided with an anti-corrosion coating.
可选地,所述防腐蚀涂层的材料为利用铝溶射工艺形成的氧化铝。Optionally, the material of the anti-corrosion coating is aluminum oxide formed by aluminum spraying process.
可选地,还包括吹扫管路,所述吹扫管路设置于所述加热盘内部,用于对不同层之间的界面进行吹扫。Optionally, a purge pipeline is also included, and the purge pipeline is arranged inside the heating plate for purging the interface between different layers.
可选地,还包括管道结构,所述管道结构被特氟龙覆盖,所述管道结构用于至少设置调温线路,所述调温线路和金属回路连接。Optionally, a pipeline structure is also included, the pipeline structure is covered by Teflon, and the pipeline structure is used to set at least a temperature regulation circuit, and the temperature regulation circuit is connected to the metal loop.
可选地,还包括冷却板,所述冷却板设置于所述陶瓷层远离加热侧的一侧;Optionally, a cooling plate is also included, the cooling plate is arranged on the side of the ceramic layer away from the heating side;
所述冷却板中有设置冷却管路,所述冷却管路中设置有冷却水。A cooling pipeline is arranged in the cooling plate, and cooling water is arranged in the cooling pipeline.
可选地,所述目标阈值包括目标比例,所述目标比例小于或等于5%。Optionally, the target threshold includes a target ratio, and the target ratio is less than or equal to 5%.
可选地,所述调温区域的数量大于20。Optionally, the number of the temperature regulation areas is greater than 20.
本申请实施例提供了一种加热盘的制造方法,所述方法包括:An embodiment of the present application provides a method for manufacturing a heating plate, the method comprising:
将目标浆料压制形成多个薄层结构,所述目标浆料至少包括氮化铝;pressing a target slurry to form a plurality of thin layer structures, the target slurry including at least aluminum nitride;
在每一薄层结构上印刷线路;Printing lines on each thin layer structure;
将所述多个薄层结构层叠设置并且进行烧制,层叠设置的所述多个薄层结构包括多层堆叠的线路;stacking and firing the multiple thin-layer structures, the multiple thin-layer structures include multi-layer stacked circuits;
对所述多个薄层结构进行打孔并在孔中填充金属材料,利用所述金属材料连接所述多层堆叠的线路。Drilling holes in the plurality of thin-layer structures and filling the holes with metal materials, using the metal materials to connect the multilayer stacked circuits.
本申请实施例提供了一种半导体设备,所述半导体设备包括上述实施例所述的加热盘。An embodiment of the present application provides a semiconductor device, and the semiconductor device includes the heating plate described in the above embodiment.
本申请实施例提供了一种加热盘,加热盘包括:温度调节层,温度调节层包括多个调温区域,多个调温区域之间的面积差值小于目标阈值,也就是多个调温区域之间的面积基本相等,调温区域设置有至少一个金属回路,利用金属回路对调温区域的温度进行调节,降低加热盘不同调温区域之间的温差,以便多个调温区域之间的温度相同,即利用对应于某一个调温区域的金属回路对该调温区域的温度进行微调,实现不同调温区域之间温度的均衡,进而提高加热盘的温度均匀性。An embodiment of the present application provides a heating plate, the heating plate includes: a temperature regulation layer, the temperature regulation layer includes a plurality of temperature regulation areas, the area difference between the plurality of temperature regulation regions is less than the target threshold, that is, a plurality of temperature regulation regions The areas between the areas are basically equal, and at least one metal circuit is provided in the temperature adjustment area, and the temperature of the temperature adjustment area is adjusted by using the metal circuit, so as to reduce the temperature difference between different temperature adjustment areas of the heating plate, so that the temperature difference between multiple temperature adjustment areas The temperature is the same, that is, the metal circuit corresponding to a certain temperature adjustment area is used to fine-tune the temperature of the temperature adjustment area to achieve temperature balance between different temperature adjustment areas, thereby improving the temperature uniformity of the heating plate.
附图说明Description of drawings
为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其它的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings that need to be used in the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are some embodiments of the present application. For Those of ordinary skill in the art can also obtain other drawings based on these drawings without making creative efforts.
图1示出了本申请实施例提供的一种加热盘的俯视结构示意图;FIG. 1 shows a schematic top view of a heating plate provided in an embodiment of the present application;
图2示出了本申请实施例提供的另一种加热盘的俯视结构示意图;Figure 2 shows a schematic top view of another heating plate provided in the embodiment of the present application;
图3示出了本申请实施例提供的一种加热盘的剖面结构示意图;Fig. 3 shows a schematic cross-sectional structure diagram of a heating plate provided by an embodiment of the present application;
图4示出了本申请实施例提供的一种加热盘的制造方法的流程示意图。Fig. 4 shows a schematic flowchart of a method for manufacturing a heating plate provided in an embodiment of the present application.
具体实施方式Detailed ways
为了使本技术领域的人员更好地理解本申请方案,下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。In order to enable those skilled in the art to better understand the solution of the application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
在下面的描述中阐述了很多具体细节以便于充分理解本申请,但是本申请还可以采用其它不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本申请内涵的情况下做类似推广,因此本申请不受下面公开的具体实施例的限制。In the following description, a lot of specific details are set forth in order to fully understand the application, but the application can also be implemented in other ways different from those described here, and those skilled in the art can do it without violating the content of the application. By analogy, the present application is therefore not limited by the specific embodiments disclosed below.
本申请结合示意图进行详细描述,在详述本申请实施例时,为便于说明,表示结构的剖面图会不依一般比例作局部放大,而且所述示意图只是示例,其在此不应限制本申请保护的范围。此外,在实际制作中应包含长度、宽度及深度的三维空间尺寸。The present application is described in detail in combination with schematic diagrams. When describing the embodiments of the present application in detail, for the convenience of explanation, the cross-sectional view showing the structure will not be partially enlarged according to the general scale, and the schematic diagram is only an example, which should not limit the protection of the present application. range. In addition, the three-dimensional space dimensions of length, width and depth should be included in actual production.
随着半导体相关技术的发展,半导体器件以及芯片的制造工艺也在快速发展。With the development of semiconductor-related technologies, the manufacturing process of semiconductor devices and chips is also developing rapidly.
在半导体器件的制造过程中,通常会用到加热盘,将待制造器件放置到加热盘上,利用加热盘对待制造器件进行均匀加热,以提高待制造器件的性能。In the manufacturing process of semiconductor devices, a heating plate is usually used, and the device to be manufactured is placed on the heating plate, and the device to be manufactured is uniformly heated by the heating plate, so as to improve the performance of the device to be manufactured.
当前加热盘在进行加热时,温度控制为2区控制并且不同区域的温度差值在3℃左右,存在不同区域的温差较大,加热盘温度不均匀的现象。但是当前加热盘的温度均匀性对制造半导体器件的工艺来说至关重要,因此,现在亟需一种具有较高温度均匀性的加热盘。When the front heating plate is heating, the temperature control is 2-zone control and the temperature difference between different areas is about 3°C. There is a phenomenon that the temperature difference between different areas is large and the temperature of the heating plate is uneven. However, the temperature uniformity of the current heating plate is very important to the process of manufacturing semiconductor devices. Therefore, there is an urgent need for a heating plate with higher temperature uniformity.
基于此,本申请实施例提供了一种加热盘,加热盘包括:温度调节层,温度调节层包括多个调温区域,多个调温区域之间的面积差值小于目标阈值,也就是多个调温区域之间的面积基本相等,调温区域设置有至少一个金属回路,利用金属回路对调温区域的温度进行调节,降低加热盘不同调温区域之间的温差,以便多个调温区域之间的温度相同,即利用对应于某一个调温区域的金属回路对该调温区域的温度进行微调,实现不同调温区域之间温度的均衡,进而提高加热盘的温度均匀性。Based on this, an embodiment of the present application provides a heating plate, the heating plate includes: a temperature regulation layer, the temperature regulation layer includes a plurality of temperature regulation regions, and the area difference between the plurality of temperature regulation regions is smaller than the target threshold value, that is, more The areas between the temperature adjustment areas are basically equal, and the temperature adjustment area is provided with at least one metal circuit, and the temperature of the temperature adjustment area is adjusted by using the metal circuit, so as to reduce the temperature difference between different temperature adjustment areas of the heating plate, so that multiple temperature adjustment areas The temperature between them is the same, that is, the metal circuit corresponding to a certain temperature adjustment area is used to fine-tune the temperature of the temperature adjustment area, so as to realize the temperature balance between different temperature adjustment areas, and then improve the temperature uniformity of the heating plate.
为了更好地理解本申请的技术方案和技术效果,以下将结合附图对具体的实施例进行详细的描述。In order to better understand the technical solutions and technical effects of the present application, specific embodiments will be described in detail below in conjunction with the accompanying drawings.
参见图1,该图为本申请实施例提供的一种加热盘的结构示意图。Referring to FIG. 1 , this figure is a schematic structural diagram of a heating plate provided in an embodiment of the present application.
本申请实施例提供的加热盘可以应用于半导体器件的制造工艺中,利用加热盘进行均匀加热。The heating plate provided in the embodiment of the present application can be applied in the manufacturing process of semiconductor devices, and the heating plate can be used for uniform heating.
本实施例提供的加热盘包括:温度调节层100。The heating plate provided in this embodiment includes: a
在本申请的实施例中,温度调节层100包括多个调温区域110,多个调温区域110之间的面积差值小于目标阈值。其中目标阈值可以是实际面积差值,也可以是比例关系,例如多个调温区域之间的面积相差目标比例。目标比例可以为5%。也就是说,多个调温区域110之间的面积基本相等,即将温度调节层100划分为多个面积基本相等的多个调温区域110,这样后续就能够对存在较大温差的某个调温区域110进行单独调温处理。In the embodiment of the present application, the
在本申请的实施例中,每个调温区域110设置有至少一个金属回路111。具体的,金属回路111可以设置在温度调节层100中,这样可以利用金属回路111对温度调节层100中对应的调温区域110进行温度调节,降低加热盘不同调温区域110之间的温差,以便多个调温区域110之间的温度相同,即利用对应于某一个调温区域110的金属回路111对该调温区域的温度进行微调,实现不同调温区域之间温度的均衡,进而提高加热盘的温度均匀性。In the embodiment of the present application, each
作为一种可能的实现方式,可以通过调整流过金属回路111的电流实现对于某个调温区域110的温度调节。As a possible implementation manner, the temperature adjustment of a certain
例如,增大金属回路111的电流,金属回路111的热量增大,该金属回路111对应的调温区域110的温度升高。For example, increasing the current of the
在实际应用中,加热盘多为圆形,相应地,温度调节层100也为圆形。在本申请的实施例中,可以将温度调节层100划分为多个同心圆环区域,每个同心圆环区域都包括至少一个调温区域110,也就是说,每个调温区域110可以是同心圆环区域中的一部分。In practical applications, the heating plate is mostly circular, and accordingly, the
参考图1所示,将温度调节层100分为1个中心圆形区域和4个同心圆环区域,每个同心圆环区域都被分割为多个调温区域110。Referring to FIG. 1 , the
在实际应用中,温度调节层100包括的调温区域110的数量可以根据温度调节精细度及温度调节层100的面积进行确定。具体的,调温区域110的数量可以至少大于20。调温区域110的数量越多,相同温度调节层100面积下,每个调温区域110的面积越小,温度调节精细度越细微,可以更加精细的对温度调节层100的每个区域进行温度调节,进一步增大了加热盘的温度均匀性。In practical applications, the number of
参考图2所示,温度调节层100包括81个调温区域110,每个调温区域110都可以单独进行温度调节。As shown in FIG. 2 , the
在本申请的实施例中,温度调节层100的材料可以是氮化铝(AlN),金属回路111的材料可以是钨(W)或铂(Pt)。In the embodiment of the present application, the material of the
在本申请的实施例中,每个调温区域110都设置有金属回路111,金属回路111包括多层线路,其中,多层线路可以层叠设置,也就是说,通过层叠设置的多层线路进行上下连接,构成一整个对调温区域110进行温度调节的金属回路111。In the embodiment of the present application, each
在实际工艺中,可以将包括氮化铝材料的目标浆料压制形成薄层结构,并在每一薄层结构上印刷上线路,将多个薄层结构层叠设置并且进行烧制,相应地多层线路也层叠设置,可以利用打孔填充金属材料的方式实现多层连通。In the actual process, the target paste including aluminum nitride material can be pressed to form a thin-layer structure, and a circuit is printed on each thin-layer structure, and multiple thin-layer structures are stacked and fired. Layer lines are also stacked, and multi-layer connectivity can be achieved by punching holes and filling metal materials.
在本申请的实施例中,加热盘还可以包括电阻温度检测器(ResistanceTemperature Detector,RTD),电阻温度检测器可以和金属回路111连接。每个调温区域110都可以连接一个电阻温度检测器,以便对每个调温区域110的温度进行检测。In the embodiment of the present application, the heating plate may further include a resistance temperature detector (Resistance Temperature Detector, RTD), and the resistance temperature detector may be connected to the
具体的,通过调整流经金属回路111的电流可以实现对于调温区域110的温度调整,此时获取该金属回路111的电压,结合流经金属回路111的电流,就可以得知该金属回路111的阻抗,进而就可以利用该金属回路111的阻抗得知调温区域110的实际温度变化值。因此在调温区域110的温度进行调整后,电阻温度检测器可以获取金属回路111的阻抗,以便根据金属回路111的阻抗确定调温区域110的实际温度变化值。也就是说,可以建立金属回路111的阻抗和调温区域110的实际温度变化值的对应关系,这样当电阻温度检测器获取得到金属回路111的阻抗之后,就能够直接利用对应关系,获取得到调温区域110的实际温度变化值,这样就能够实现对于调温区域110的温度控制以及温度检测,进一步为提高加热盘温度均匀性提供有力保障。Specifically, by adjusting the current flowing through the
在本申请的实施例中,加热盘可以包括放置待加热物的加热侧,加热盘还包括升温层120,升温层120设置于温度调节层100远离加热侧的一侧。也就是说,升温层120设置在温度调节层100的下方,参考图3所示。升温层120的材料为氮化铝。升温层120用于将加热盘整体上升到某一具体温度,而后继续利用温度调节层100进行某个调温区域110的温度调节。In the embodiment of the present application, the heating plate may include a heating side where the object to be heated is placed, and the heating plate further includes a
升温层120中也可以包括加热回路121,加热回路121的材料可以是金属材料,例如钨或铂。加热回路121呈多个同心圆环形设置,这样当温度调节层100中多个调温区域110也呈同心圆环形状设置时,对温度调节会更加方便,能够对升温层120中温度不均匀的区域进行补足。也就是说,升温层120和温度调节层100在垂直于加热盘表面的方向上交叠,升温层120中每个区域都有温度调节层100中的调温区域110进行一一对应,这样当升温层120某个区域的温度和其他区域的温度不同时,就可以利用该区域对应调温区域110对温度进行调整,使得对于整个加热盘而言,不同区域的温度是均匀的。The
在本申请的实施例中,加热回路121呈多个同心圆环设置,多个调温区域110也呈同心圆环设置,加热回路121构成的同心圆环可以和多个调温区域110构成的同心圆环一一对应,这样每个圆环内的加热回路121都具有同样处于该圆环内的调温区域110进行温度调节,提高最终加热盘的温度均匀性。此外,在升温层120的基础上将多个调温区域110也呈同心圆环形状设置,能够降低加热盘的制造难度,实现在较低的加热盘改造成本的基础上最大化的实现加热盘的温度均匀。In the embodiment of the present application, the
在本申请的实施例中,升温层120和温度调节层100可以为一体结构,具体可以利用包括氮化铝材料的目标浆料形成叠层结构,并且在叠层结构上分别印刷加热回路121的线路和金属回路111的线路,而后将叠层结构堆叠进行烧结形成一体结构。这样可以利用一次制造工艺就形成升温层120和温度调节层100,缩短制造加热盘的工艺进度。In the embodiment of the present application, the
在本申请的实施例中,加热盘还包括接地电极层101,接地电极层101设置于温度调节层100靠近加热侧的一侧。也就是说,接地电极层101设置于温度调节层110层上方,参考图3所示。接地电极层101用于和金属回路111以及设置于升温层120中的加热回路进行连接,提供接地信号。In the embodiment of the present application, the heating plate further includes a
具体的,接地电极层101中包括返回(return)电极,返回电极和金属回路111连接,以便金属回路111形成电路回路。相应地,升温层120中加热回路121也具有对应的返回电极,该返回电极和加热回路121连接,以便加热回路121也形成电路回路。Specifically, the
在本申请的实施例中,加热盘还包括隔热层130,隔热层130设置于升温层120远离加热侧的一侧。也就是说,隔热层130设置于升温层120下方,参考图3所示。具体的,隔热层130的材料可以是不透明石英(opaque quartz)或者氧化铝材料。In the embodiment of the present application, the heating plate further includes a
隔热层130中还可以设置将电源和金属回路111进行连接的连接线。连接线可以包括第一金属线(contact pin)102和接触式插头(contact plug)103,其中,第一金属线102可以利用金属材料形成。Connection wires for connecting the power supply and the
在本申请的实施例中,加热盘还包括陶瓷层140,陶瓷层140设置于隔热层130远离加热侧的一侧,也就是说,陶瓷层140设置于隔热层130下方,参考图3所示。In the embodiment of the present application, the heating plate further includes a
具体的,陶瓷层140的材料可以是氧化铝。Specifically, the material of the
陶瓷层140中还可以设置将电源和金属回路111以及将电源和加热回路121进行连接的连接线。下面介绍将电源和金属回路111进行连接的连接线,该连接线还可以包括第二金属线104以及端子105,其中,第二金属线104设置于隔热层130和陶瓷层140之间的界面,端子105设置于陶瓷层140,端子105贯穿陶瓷层140。第二金属线104的材料可以是铝,利用印刷工艺形成。端子105可以利用钎焊或铜焊工艺形成。端子105设置在陶瓷层140的中心区域,和设置于陶瓷层140上表面的第二金属线104进行连接。第二金属线104和第一金属线102连接。The
在实际应用中,需要利用钎焊或铜焊工艺形成连接线中的端子105,以便实现金属回路111和电源的连接,由于隔热层130的材料原因,无法利用钎焊或铜焊工艺形成端子105,因此设置陶瓷层140,陶瓷层140的材料能够实现利用铜焊工艺形成端子105。In practical applications, it is necessary to use soldering or brazing process to form the terminal 105 in the connection line, so as to realize the connection between the
在本申请的实施例中,加热盘还包括冷却板150,冷却板150设置于陶瓷层140远离加热侧的一侧,也就是说,冷却板150设置于陶瓷层140下方,参考图3所示。具体的,冷却板150的材料可以是铝或不锈钢材料。可以在冷却板150中设置冷却管路151,向冷却管路151中通入冷却水,实现对加热盘的散热。In the embodiment of the present application, the heating plate also includes a
在本申请的实施例中,加热盘还可以包括侧壁隔热层131,侧壁隔热层131设置在温度调节层100、升温层120以及陶瓷层140的侧壁,用于对其他层的侧壁进行保护。侧壁隔热层131设置在冷却板150上方,参考图3所示。侧壁隔热层131的侧壁设置有防腐蚀涂层,以便避免被腐蚀。In the embodiment of the present application, the heating plate can also include a side wall
具体的,侧壁隔热层131的材料可以是不透明石英(opaque quartz)或者发泡铝材料。防腐蚀涂层的材料可以是利用铝溶射工艺形成的氧化铝(Al2O3),用于防止被氟离子腐蚀。Specifically, the material of the
在本申请的实施例中,加热盘还包括吹扫管路160,参考图3所示。吹扫管路160可以设置于加热盘内部,具体吹扫管路160可以贯穿冷却板150、陶瓷层140和隔热层130,用于对冷却板150、陶瓷层140和隔热层130之间的界面进行吹扫。In the embodiment of the present application, the heating plate further includes a
向吹扫管路160中通入的气体可以是惰性气体或氮气。利用氮气吹扫界面,可以清除侵入加热盘缝隙中的氟离子,避免氟离子腐蚀加热盘。界面中的氮气通过加热盘中的缝隙流出,经过制造半导体器件的工艺腔室进行排出。The gas fed into the
在本申请的实施例中,加热盘还包括管道结构170,管道结构170可以至少设置调温线路171以及电阻温度检测器的检测线路。管道结构170还可以设置其他线路,也就是说,加热盘的多种线路都可以利用管道结构170进行设置。调温线路171和金属回路111连接,具体的,调温线路171的一端可以和连接线中的端子105连接,调温线路171的另一端可以和设置于管道结构170底部的连接端子173连接。In the embodiment of the present application, the heating plate further includes a
管道结构170可以被特氟龙172覆盖,具体特氟龙172覆盖管道结构170的内部表面,参考图3所示。特氟龙172是为了防止内部的调温线路171等产生多余的寄生容量。The
在本申请的实施例中,加热盘还包括冷却块(cooling block)180,冷却块180围绕管道结构170的底部设置。冷却块180中可以设置吹扫管路160和冷却管路151。In the embodiment of the present application, the heating plate further includes a
在实际应用中,加热盘还可以包括支撑结构(Lifter pin)106,支撑结构106贯穿加热盘至加热侧的表面,用于支撑待加热衬底,待加热衬底可以是晶圆。In practical applications, the heating plate may further include a support structure (Lifter pin) 106 , the
由此可见,本申请实施例提供了一种加热盘,加热盘包括:温度调节层,温度调节层包括多个调温区域,多个调温区域之间的面积差值小于目标阈值,也就是多个调温区域之间的面积基本相等,调温区域设置有至少一个金属回路,利用金属回路对调温区域的温度进行调节,降低加热盘不同调温区域之间的温差,以便多个调温区域之间的温度相同,即利用对应于某一个调温区域的金属回路对该调温区域的温度进行微调,实现不同调温区域之间温度的均衡,进而提高加热盘的温度均匀性。It can be seen that the embodiment of the present application provides a heating plate, the heating plate includes: a temperature regulation layer, the temperature regulation layer includes a plurality of temperature regulation regions, and the area difference between the plurality of temperature regulation regions is smaller than the target threshold value, that is, The areas between multiple temperature adjustment areas are basically equal, and at least one metal circuit is set in the temperature adjustment area, and the temperature of the temperature adjustment area is adjusted by using the metal circuit, so as to reduce the temperature difference between different temperature adjustment areas of the heating plate, so that multiple temperature adjustment areas The temperature between the areas is the same, that is, the metal circuit corresponding to a certain temperature adjustment area is used to fine-tune the temperature of the temperature adjustment area, so as to realize the temperature balance between different temperature adjustment areas, and then improve the temperature uniformity of the heating plate.
基于以上实施例提供的一种加热盘,本申请实施例还提供了一种加热盘的制造方法,下面结合附图来详细说明其工作原理。Based on the heating plate provided in the above embodiments, the embodiment of the present application also provides a manufacturing method of the heating plate, and its working principle will be described in detail below with reference to the accompanying drawings.
参见图4,该图为本申请实施例提供的一种加热盘的制造方法的流程示意图。Referring to FIG. 4 , this figure is a schematic flowchart of a method for manufacturing a heating plate provided in an embodiment of the present application.
本申请实施例提供的加热盘的制造方法包括以下步骤:The manufacturing method of the heating plate provided in the embodiment of the present application comprises the following steps:
S101,将目标浆料压制形成多个薄层结构。S101, pressing the target slurry to form multiple thin layer structures.
在本申请的实施例中,可以利用目标浆料制造形成加热盘中包括的温度调节层和升温层,目标浆料至少包括氮化铝材料。具体可以将目标浆料压制形成多个薄层结构。In the embodiment of the present application, the temperature regulating layer and the temperature raising layer included in the heating plate can be manufactured and formed by using the target slurry, where the target slurry includes at least aluminum nitride material. Specifically, the target slurry can be pressed to form a plurality of thin layer structures.
S102,在每一薄层结构上印刷线路。S102, printing a circuit on each thin layer structure.
在本申请的实施例中,在压制形成每一个薄层结构时,可以在该薄层结构上印刷线路,该线路为金属材料,例如钨(W)或铂(Pt)。In the embodiment of the present application, when forming each thin-layer structure by pressing, wiring can be printed on the thin-layer structure, and the wiring is a metal material, such as tungsten (W) or platinum (Pt).
在实际应用中,升温层中也包括加热回路,因此可以在薄层结构中也印刷加热回路的线路。In practical application, the heating circuit is also included in the heating layer, so the circuit of the heating circuit can also be printed in the thin layer structure.
S103,将多个薄层结构层叠设置并且进行烧制。S103, stacking and firing multiple thin-layer structures.
在本申请的实施例中,将多个薄层结构层叠设置并且进行烧制,以最终形成包括温度调节层和升温层的一体结构,其中升温层设置于温度调节层下方。In the embodiment of the present application, multiple thin layer structures are laminated and fired to finally form an integrated structure including a temperature regulating layer and a temperature raising layer, wherein the temperature raising layer is disposed below the temperature regulating layer.
由于多个薄层结构层叠设置,相应地,薄层结构中包括的线路也层叠设置,即线路形成多层堆叠的结构。Since multiple thin-layer structures are stacked, correspondingly, the lines included in the thin-layer structures are also stacked, that is, the lines form a multi-layer stacked structure.
S104,对多个薄层结构进行打孔并在孔中填充金属材料,利用金属材料连接多层堆叠的线路。S104, punching holes in multiple thin-layer structures and filling the holes with metal materials, and using the metal materials to connect multilayer stacked circuits.
在本申请的实施例中,可以对多个薄层结构进行打孔并填充金属材料,利用金属材料连接多层堆叠的线路,以最终形成温度调节层中的温度调节层。In the embodiment of the present application, multiple thin layer structures may be drilled and filled with metal material, and the metal material may be used to connect the lines of the multilayer stack, so as to finally form the temperature regulation layer in the temperature regulation layer.
基于以上实施例提供的一种加热盘,本申请实施例还提供了一种半导体设备,该半导体设备包括上述实施例所述的加热盘,以利用该加热盘对放置在所述半导体设备中的待加热物进行加热。Based on the heating plate provided in the above embodiment, the embodiment of the present application also provides a semiconductor device, the semiconductor device includes the heating plate described in the above embodiment, so that the heating plate placed in the semiconductor device The object to be heated is heated.
本说明书中的各个实施例均采用递进的方式描述,各个实施例之间相同相似的部分互相参见即可,每个实施例重点说明的都是与其他实施例的不同之处。尤其,对于制造方法实施例而言,由于其基本相似于结构实施例,所以描述得比较简单,相关之处参见结构实施例的部分说明即可。以上所描述的结构实施例仅仅是示意性的,其中所述作为分离部件说明的单元及模块可以是或者也可以不是物理上分开的。另外,还可以根据实际的需要选择其中的部分或者全部单元和模块来实现本实施例方案的目的。本领域普通技术人员在不付出创造性劳动的情况下,即可以理解并实施。Each embodiment in this specification is described in a progressive manner, the same and similar parts of each embodiment can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the manufacturing method embodiment, since it is basically similar to the structural embodiment, the description is relatively simple, and for the related parts, please refer to the part of the description of the structural embodiment. The structural embodiments described above are only illustrative, and the units and modules described as separate components may or may not be physically separated. In addition, some or all of the units and modules can also be selected according to actual needs to achieve the purpose of the solution of this embodiment. It can be understood and implemented by those skilled in the art without creative effort.
以上所述仅是本申请的优选实施方式,虽然本申请已以较佳实施例披露如上,然而并非用以限定本申请。任何熟悉本领域的技术人员,在不脱离本申请技术方案范围情况下,都可利用上述揭示的方法和技术内容对本申请技术方案做出许多可能的变动和修饰,或修改为等同变化的等效实施例。因此,凡是未脱离本申请技术方案的内容,依据本申请的技术实质对以上实施例所做的任何的简单修改、等同变化及修饰,均仍属于本申请技术方案保护的范围内。The above descriptions are only the preferred embodiments of the present application. Although the present application has been disclosed as above with preferred embodiments, it is not intended to limit the present application. Any person familiar with the art, without departing from the scope of the technical solution of the application, can use the methods and technical content disclosed above to make many possible changes and modifications to the technical solution of the application, or modify the equivalent of equivalent changes Example. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present application that do not deviate from the content of the technical solution of the present application still fall within the protection scope of the technical solution of the present application.
Claims (23)
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PCT/CN2023/092705 WO2024216676A1 (en) | 2023-04-21 | 2023-05-08 | Heating disc and manufacturing method therefor, and semiconductor device |
TW112119186A TW202444138A (en) | 2023-04-21 | 2023-05-23 | Heating plate and method for manufacturing the same, and semiconductor device |
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