[go: up one dir, main page]

CN116364678B - Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof - Google Patents

Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof Download PDF

Info

Publication number
CN116364678B
CN116364678B CN202310623833.2A CN202310623833A CN116364678B CN 116364678 B CN116364678 B CN 116364678B CN 202310623833 A CN202310623833 A CN 202310623833A CN 116364678 B CN116364678 B CN 116364678B
Authority
CN
China
Prior art keywords
liquid
array
silicon
bottom plate
heat sink
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202310623833.2A
Other languages
Chinese (zh)
Other versions
CN116364678A (en
Inventor
索曌君
郭芬
苏康
李拓
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Inspur Intelligent Technology Co Ltd
Original Assignee
Suzhou Inspur Intelligent Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Inspur Intelligent Technology Co Ltd filed Critical Suzhou Inspur Intelligent Technology Co Ltd
Priority to CN202310623833.2A priority Critical patent/CN116364678B/en
Publication of CN116364678A publication Critical patent/CN116364678A/en
Application granted granted Critical
Publication of CN116364678B publication Critical patent/CN116364678B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/473Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

The invention relates to the field of heat dissipation. The invention provides a heat dissipation structure and a device compatible with a liquid through silicon via and an embedded micro-channel and a manufacturing method thereof, wherein the heat dissipation structure comprises: the substrate comprises a first outer bottom plate and a first inner bottom plate, and a first turbulent flow column array is etched in the substrate; the heat sink comprises a second outer bottom plate and a second inner bottom plate, and a second turbulent flow column array is etched in the heat sink; and the multilayer integrated circuit chip is vertically stacked and arranged between the substrate and the heat sink, the multilayer integrated circuit chip is etched with a signal through silicon via array and a liquid through silicon via array, the signal through silicon via array is connected with the substrate through the convex points, and the liquid through silicon via array is respectively connected with the heat sink and the substrate through the liquid micro convex points. The heat radiation structure of the invention is composed of the liquid silicon through hole, the micro-channel heat sink embedded with the turbulent flow column and the base plate, thereby improving the heat radiation performance and the system reliability of the integrated circuit.

Description

液体硅通孔兼容嵌入式微流道的散热结构和装置及其制法Liquid through-silicon via compatible heat dissipation structure and device of embedded micro-channel and its manufacturing method

技术领域technical field

本发明涉及散热领域,更具体地,特别是指一种液体硅通孔兼容嵌入式微流道的散热结构、包括其的主板、液冷主板、液冷服务器和制作其的方法。The present invention relates to the field of heat dissipation, and more specifically refers to a heat dissipation structure compatible with embedded micro-channels through liquid silicon vias, a motherboard including the same, a liquid-cooled motherboard, a liquid-cooled server, and a method for making the same.

背景技术Background technique

为了进一步提高集成度降低功耗,基于TSV(Through Si Via,硅通孔)的3D集成受到广泛关注。在有限的芯片面积上,3D集成提高了集成密度,硅通孔的垂直互连降低了互连长度,但同时3D堆叠导致更高的热密度,这为芯片的散热性能带来挑战。In order to further improve integration and reduce power consumption, 3D integration based on TSV (Through Si Via) has attracted extensive attention. In the limited chip area, 3D integration increases the integration density, and the vertical interconnection of through-silicon vias reduces the interconnection length, but at the same time, 3D stacking leads to higher thermal density, which poses challenges to the heat dissipation performance of the chip.

目前,常规方式是在3D IC(Integrated Circuit,集成电路)芯片的顶部添加散热片和热沉,或在3D IC芯片内部添加TTSV(Thermal Through Si Via,热传导硅通孔),或在芯片衬底上刻蚀百微米宽度的微流道,引入冷却液体,随着冷却液体在微流道内部的循环而将芯片的热量带走,从而实现降温,但是,微流道的散热效率依赖于其尺寸,尺寸越大高度越高则散热性能越好,但同时增加了芯片厚度将加剧热累积,同时,微流道和硅通孔阵列的混合布局存在空间竞争,需要精密的芯片布局和规划,更需要很高的工艺以防止微流道与硅通孔的交叉。此外,硅通孔在垂直方向上传输电信号,硅通孔阵列间的电热耦合效应显著,因此热量沿着垂直方向分布。然而,微流道仅刻蚀在衬底中对同一层芯片进行传热,不同层的芯片间存在绝缘层,这将导致垂直方向上热量分布不均匀,甚至有可能出现热点,对芯片的热稳定性造成影响。At present, the conventional way is to add a heat sink and a heat sink on the top of the 3D IC (Integrated Circuit, integrated circuit) chip, or add a TTSV (Thermal Through Si Via, thermal conduction silicon via) inside the 3D IC chip, or add a heat sink on the chip substrate A microchannel with a width of 100 microns is etched on the top, and a cooling liquid is introduced. As the cooling liquid circulates inside the microchannel, the heat of the chip is taken away, thereby achieving cooling. However, the heat dissipation efficiency of the microchannel depends on its size. , the larger the size and the higher the height, the better the heat dissipation performance, but at the same time increasing the thickness of the chip will intensify the heat accumulation. At the same time, there is space competition in the mixed layout of the microchannel and the through-silicon via array, which requires precise chip layout and planning. A very high process is required to prevent the crossing of microchannels and TSVs. In addition, TSVs transmit electrical signals in the vertical direction, and the electrothermal coupling effect between TSV arrays is significant, so heat is distributed along the vertical direction. However, microchannels are only etched in the substrate to conduct heat transfer to the same layer of chips, and there is an insulating layer between chips of different layers, which will lead to uneven heat distribution in the vertical direction, and may even cause hot spots, which will affect the heat dissipation of the chip. affect stability.

发明内容Contents of the invention

有鉴于此,本发明实施例的目的在于提出一种液体硅通孔兼容嵌入式微流道的散热结构、包括其的主板、液冷主板、液冷服务器和制作其的方法,本发明由液体硅通孔和内嵌扰流柱的微流道热沉和基板共同构成散热结构,同时提供一种基于该散热方法的三维主动散热结构及其制作工艺,通过多维度、多尺度的均衡性主动散热来提高3D集成电路芯片的散热效率,可提高3D集成电路芯片的散热性能和系统可靠性,并且由于热沉和衬底均为硅,内部微流道结构保持一致,从而降低了结构整体的工艺复杂度,可以提高芯片良率。In view of this, the purpose of the embodiment of the present invention is to propose a liquid through-silicon via compatible embedded micro-channel heat dissipation structure, a motherboard including it, a liquid-cooled motherboard, a liquid-cooled server, and a method for making the same. Through-holes, microfluidic heat sinks embedded with spoilers, and substrates together constitute a heat dissipation structure, and at the same time provide a three-dimensional active heat dissipation structure and its manufacturing process based on this heat dissipation method, through multi-dimensional, multi-scale balanced active heat dissipation To improve the heat dissipation efficiency of 3D integrated circuit chips, it can improve the heat dissipation performance and system reliability of 3D integrated circuit chips, and because the heat sink and substrate are both silicon, the internal microchannel structure remains consistent, thereby reducing the overall process of the structure. Complexity can improve chip yield.

基于上述目的,本发明实施例的一方面提供了一种液体硅通孔兼容嵌入式微流道的散热结构,包括如下部件:基底,所述基底包括第一外底板和第一内底板,所述基底内刻蚀有第一扰流柱阵列;热沉,所述热沉包括第二外底板和第二内底板,所述热沉内刻蚀有第二扰流柱阵列;以及多层集成电路芯片,所述多层集成电路芯片垂直堆叠,设置在所述基底和所述热沉中间,所述多层集成电路芯片中刻蚀有信号硅通孔阵列和液体硅通孔阵列,所述信号硅通孔阵列通过凸点与所述基底连接,所述液体硅通孔阵列通过液体微凸点分别与所述热沉和所述基底连接。Based on the above purpose, an aspect of the embodiments of the present invention provides a liquid through silicon via compatible embedded micro-channel heat dissipation structure, including the following components: a base, the base includes a first outer bottom plate and a first inner bottom plate, the A first spoiler column array is etched in the substrate; a heat sink includes a second outer bottom plate and a second inner bottom plate, and a second spoiler column array is etched in the heat sink; and a multilayer integrated circuit chip, the multi-layer integrated circuit chip is vertically stacked and arranged between the base and the heat sink, the multi-layer integrated circuit chip is etched with a signal through-silicon via array and a liquid through-silicon via array, the signal The TSV array is connected to the base through bumps, and the liquid TSV array is respectively connected to the heat sink and the base through liquid micro bumps.

在一些实施方式中,所述第二扰流柱阵列刻蚀在所述第二内底板上,所述第二扰流柱阵列包括第一扰流柱和第二扰流柱,所述第二扰流柱高于所述第一扰流柱。In some implementations, the second array of spoiler posts is etched on the second inner bottom plate, the second array of spoiler posts includes first spoiler posts and second spoiler posts, the second The spoiler post is higher than the first spoiler post.

在一些实施方式中,所述第一扰流柱与所述第二扰流柱的形状相同。In some embodiments, the shape of the first spoiler post is the same as that of the second spoiler post.

在一些实施方式中,所述第一扰流柱的形状为圆柱形或正六边形柱。In some embodiments, the shape of the first spoiler column is a cylinder or a regular hexagonal column.

在一些实施方式中,所述热沉配置用于容纳冷却液体,所述冷却液体为具有高热导率的液体。In some embodiments, the heat sink is configured to hold a cooling liquid, which is a liquid with high thermal conductivity.

在一些实施方式中,所述热沉与所述多层集成电路芯片通过焊点连接。In some embodiments, the heat sink is connected to the multilayer integrated circuit chip through solder joints.

在一些实施方式中,所述第二外底板和所述第二内底板的材质相同,所述第二外底板材质为硅、金刚石、导热陶瓷或有机树脂。In some embodiments, the second outer bottom plate and the second inner bottom plate are made of the same material, and the second outer bottom plate is made of silicon, diamond, thermally conductive ceramics or organic resin.

在一些实施方式中,所述第二外底板和所述第二内底板的材质不同。In some embodiments, the materials of the second outer bottom plate and the second inner bottom plate are different.

在一些实施方式中,所述第二外底板材质为玻璃。In some embodiments, the material of the second outer bottom plate is glass.

在一些实施方式中,所述第一扰流柱阵列的布局方式与所述第二扰流柱阵列的布局方式相同。In some embodiments, the layout of the first array of spoiler posts is the same as that of the second array of spoiler posts.

在一些实施方式中,所述第二扰流柱阵列的布局方式与所述信号硅通孔阵列和液体硅通孔阵列的布局方式相同。In some embodiments, the layout of the second spoiler column array is the same as that of the signal TSV array and the liquid TSV array.

在一些实施方式中,在所述信号硅通孔阵列和所述液体硅通孔阵列外表面均填充一层绝缘层。In some embodiments, an insulating layer is filled on the outer surfaces of the signal TSV array and the liquid TSV array.

在一些实施方式中,在所述第二外底板对角线一端设置有液体入口,在所述第一外底板对角线一端设置有液体出口。In some embodiments, a liquid inlet is arranged at one end of the diagonal line of the second outer bottom plate, and a liquid outlet is arranged at one end of the diagonal line of the first outer bottom plate.

本发明实施例的另一方面,提供了一种主板,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。Another aspect of the embodiments of the present invention provides a motherboard, including the liquid through-silicon via compatible embedded micro-channel heat dissipation structure described in any one of the above.

本发明实施例的另一方面,提供了一种液冷主板,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。Another aspect of the embodiments of the present invention provides a liquid-cooled motherboard, including the liquid through-silicon via-compatible embedded micro-channel heat dissipation structure described in any one of the above items.

本发明实施例的又一方面,提供了一种液冷服务器,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。Still another aspect of the embodiments of the present invention provides a liquid-cooled server, including the heat dissipation structure of the liquid through-silicon vias compatible with embedded micro-channels described in any one of the above.

本发明实施例的再一方面,提供了一种液体硅通孔兼容嵌入式微流道的散热结构的制作方法,包括如下步骤:在热沉的第二内底板上表面刻蚀第二扰流柱阵列构成微流道,在热沉的第二外底板刻蚀液体硅通孔阵列接口,将微流道密封,并在所述热沉上设置液体入口;将多层集成芯片进行垂直堆叠,对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列;在基底的第一外底板下表面刻蚀第一扰流柱阵列构成第二微流道,将所述第二微流道密封,并在所述基底上设置液体出口;以及将所述信号硅通孔阵列与所述基底互连,并将所述液体硅通孔阵列分别与所述基底和所述热沉互连。In yet another aspect of the embodiments of the present invention, a method for manufacturing a liquid through-silicon via compatible embedded micro-channel heat dissipation structure is provided, including the following steps: etching a second spoiler column on the surface of the second inner bottom plate of the heat sink The array constitutes a micro-channel, and the liquid through-silicon hole array interface is etched on the second outer bottom plate of the heat sink to seal the micro-channel, and a liquid inlet is set on the heat sink; the multi-layer integrated chips are vertically stacked, and the The multi-layer integrated chip etches the signal TSV array and the liquid TSV array; etches the first spoiler column array on the lower surface of the first outer bottom plate of the substrate to form a second micro-channel, and the second micro-channel sealing, and setting a liquid outlet on the substrate; and interconnecting the signal TSV array with the substrate, and interconnecting the liquid TSV array with the substrate and the heat sink respectively.

在一些实施方式中,所述将微流道密封包括:通过晶圆级键合工艺将所述第二外底板与微流道结构键合。In some embodiments, the sealing the micro-channel includes: bonding the second outer bottom plate to the micro-channel structure through a wafer-level bonding process.

在一些实施方式中,所述对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列包括:将所述信号硅通孔阵列和所述液体硅通孔阵列嵌套分布设置。In some embodiments, the etching the signal TSV array and the liquid TSV array on the multi-layer integrated chip includes: nesting and distributing the signal TSV array and the liquid TSV array.

在一些实施方式中,所述对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列包括:采用硅通孔深刻工艺在多层集成芯片内部刻蚀信号硅通孔阵列和液体硅通孔阵列。In some embodiments, the etching the signal TSV array and the liquid TSV array on the multilayer integrated chip includes: using the TSV deep process to etch the signal TSV array and the liquid silicon via array inside the multilayer integrated chip. via array.

在一些实施方式中,所述将所述液体硅通孔阵列分别与所述基底和所述热沉互连包括:通过液体微凸点工艺将所述液体硅通孔阵列分别与所述热沉和所述基底互连。In some embodiments, the interconnecting the liquid TSV arrays with the substrate and the heat sink respectively includes: respectively interconnecting the liquid TSV arrays with the heat sink through a liquid micro-bump process. interconnected with the substrate.

在一些实施方式中,所述制作方法还包括:通过焊接连接所述热沉和所述多层集成芯片。In some embodiments, the manufacturing method further includes: connecting the heat sink and the multilayer integrated chip by soldering.

本发明具有以下有益技术效果:由液体硅通孔和内嵌扰流柱的微流道热沉和基板共同构成散热结构,同时提供一种基于该散热方法的三维主动散热结构及其制作工艺,通过多维度、多尺度的均衡性主动散热来提高3D集成电路芯片的散热效率,可提高3D集成电路芯片的散热性能和系统可靠性,并且由于热沉和衬底均为硅,内部微流道结构保持一致,从而降低了结构整体的工艺复杂度,可以提高芯片良率。The present invention has the following beneficial technical effects: the heat dissipation structure is composed of the liquid through-silicon hole, the micro-channel heat sink embedded with the spoiler column, and the substrate, and a three-dimensional active heat dissipation structure based on the heat dissipation method and its manufacturing process are provided at the same time. Improving the heat dissipation efficiency of 3D integrated circuit chips through multi-dimensional and multi-scale balanced active heat dissipation can improve the heat dissipation performance and system reliability of 3D integrated circuit chips. The structure remains consistent, thereby reducing the overall process complexity of the structure and improving the chip yield.

附图说明Description of drawings

为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的实施例。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention, and those skilled in the art can obtain other embodiments according to these drawings without any creative effort.

图1为本发明提供的液体硅通孔兼容嵌入式微流道的散热结构的实施例的示意图;FIG. 1 is a schematic diagram of an embodiment of a liquid through-silicon via compatible embedded micro-channel heat dissipation structure provided by the present invention;

图2为本发明实施例提供的顶部热沉及其下方凸点的示意图;Fig. 2 is a schematic diagram of the top heat sink and the bumps below it provided by the embodiment of the present invention;

图3为本发明实施例提供的顶部热沉中的扰流柱阵列的示意图;3 is a schematic diagram of a spoiler column array in a top heat sink provided by an embodiment of the present invention;

图4为本发明实施例提供的顶部热沉下方的凸点阵列的示意图;4 is a schematic diagram of a bump array under the top heat sink provided by an embodiment of the present invention;

图5为本发明提供的液体硅通孔兼容嵌入式微流道的散热结构的制作方法的实施例的示意图。FIG. 5 is a schematic diagram of an embodiment of a manufacturing method of a liquid through silicon via compatible embedded microfluidic channel heat dissipation structure provided by the present invention.

具体实施方式Detailed ways

为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明实施例进一步详细说明。In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

需要说明的是,本发明实施例中所有使用“第一”和“第二”的表述均是为了区分两个相同名称非相同的实体或者非相同的参量,可见“第一”“第二”仅为了表述的方便,不应理解为对本发明实施例的限定,后续实施例对此不再一一说明。It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

本发明实施例的第一个方面,提出了一种液体硅通孔兼容嵌入式微流道的散热结构的实施例。图1示出的是本发明提供的液体硅通孔兼容嵌入式微流道的散热结构的实施例的示意图。如图1所示,本发明实施例包括如下部件:According to the first aspect of the embodiments of the present invention, an embodiment of a liquid through-silicon via compatible embedded micro-channel heat dissipation structure is proposed. FIG. 1 is a schematic diagram of an embodiment of a liquid through-silicon via compatible embedded micro-channel heat dissipation structure provided by the present invention. As shown in Figure 1, the embodiment of the present invention includes the following components:

基底1,所述基底1包括第一外底板11和第一内底板12,所述基底1内刻蚀有第一扰流柱阵列(包括13和14);A base 1, the base 1 includes a first outer bottom plate 11 and a first inner bottom plate 12, and a first spoiler column array (including 13 and 14) is etched in the base 1;

热沉2,所述热沉2包括第二外底板21和第二内底板22,所述热沉2内刻蚀有第二扰流柱阵列(包括23和24);以及A heat sink 2, the heat sink 2 includes a second outer bottom plate 21 and a second inner bottom plate 22, and a second spoiler column array (including 23 and 24) is etched in the heat sink 2; and

多层集成电路芯片3,所述多层集成电路芯片3垂直堆叠,设置在所述基底1和所述热沉2中间,所述多层集成电路芯片3中刻蚀有信号硅通孔阵列31和液体硅通孔阵列32,所述信号硅通孔阵列31通过凸点4与所述基底1连接,所述液体硅通孔阵列32通过液体微凸点5分别与所述热沉2和所述基底1连接。A multi-layer integrated circuit chip 3, the multi-layer integrated circuit chip 3 is vertically stacked and arranged between the substrate 1 and the heat sink 2, and a signal through-silicon via array 31 is etched in the multi-layer integrated circuit chip 3 and a liquid TSV array 32, the signal TSV array 31 is connected to the substrate 1 through bumps 4, and the liquid TSV array 32 is respectively connected to the heat sink 2 and the heat sink 2 through liquid micro bumps 5. The substrate 1 is connected.

也即是,本发明实施例在液体硅通孔兼容嵌入式微流道的散热结构的顶层设有内部可容纳冷却液体的热沉2,本发明实施例的热沉2内刻蚀第二扰流柱阵列(由23和24组成);本发明实施例的热沉2下方是垂直堆叠的多层集成电路芯片3;堆叠的多层集成电路芯片3中刻蚀有信号硅通孔阵列31与液体硅通孔阵列32;本发明实施例中信号硅通孔阵列31通过金属凸点4与基底1相连;本发明实施例中液体硅通孔阵列32通过液体微凸点5与顶部热沉2和底部基底1相连,连通冷却液体通道;本发明实施例中底部基底1内嵌与顶部热沉2对应的第一扰流柱阵列(由13和14组成)。That is to say, in the embodiment of the present invention, a heat sink 2 that can accommodate a cooling liquid is provided on the top layer of the liquid through-silicon via compatible embedded micro-channel heat sink, and the second spoiler is etched in the heat sink 2 of the embodiment of the present invention. Column array (composed of 23 and 24); under the heat sink 2 of the embodiment of the present invention is a vertically stacked multilayer integrated circuit chip 3; a signal through-silicon via array 31 and liquid are etched in the stacked multilayer integrated circuit chip 3 Through-silicon via array 32; in the embodiment of the present invention, the signal through-silicon via array 31 is connected to the substrate 1 through the metal bump 4; in the embodiment of the present invention, the liquid through-silicon via array 32 is connected to the top heat sink 2 and the top heat sink through the liquid micro-bump 5 The bottom base 1 is connected to communicate with the cooling liquid channel; in the embodiment of the present invention, the bottom base 1 is embedded with a first spoiler column array (composed of 13 and 14 ) corresponding to the top heat sink 2 .

在多层集成电路芯片3和基底1之间制作第一填充层,在多层集成电路芯片3和热沉2之间制作第二填充层。A first filling layer is made between the multilayer integrated circuit chip 3 and the substrate 1 , and a second filling layer is made between the multilayer integrated circuit chip 3 and the heat sink 2 .

在一些实施方式中,所述第二扰流柱阵列刻蚀在所述第二内底板22上,所述第二扰流柱阵列包括第一扰流柱23和第二扰流柱24,所述第二扰流柱24高于所述第一扰流柱23。In some embodiments, the second spoiler post array is etched on the second inner bottom plate 22, the second spoiler post array includes a first spoiler post 23 and a second spoiler post 24, so The second spoiler post 24 is higher than the first spoiler post 23 .

在一些实施方式中,所述第一扰流柱阵列刻蚀在所述第一内底板12上,所述第二扰流柱阵列包括第三扰流柱13和第四扰流柱14,所述第四扰流柱14高于所述第三扰流柱13。In some embodiments, the first spoiler column array is etched on the first inner bottom plate 12, the second spoiler column array includes a third spoiler column 13 and a fourth spoiler column 14, so The fourth spoiler post 14 is higher than the third spoiler post 13 .

在一些实施方式中,在所述第二外底板21对角线一端设置有液体入口,在所述第一外底板11对角线一端设置有液体出口。本发明实施例中的液体入口和液体出口仅仅是示例性的,在其他实施例中,液体入口和液体出口的位置可以改变,仅需要满足液体从顶部热沉2中流入再从底部基底1中流出即可。In some embodiments, a liquid inlet is provided at one diagonal end of the second outer bottom plate 21 , and a liquid outlet is arranged at one diagonal end of the first outer bottom plate 11 . The liquid inlet and liquid outlet in the embodiment of the present invention are only exemplary. In other embodiments, the positions of the liquid inlet and the liquid outlet can be changed, and it is only necessary to meet the requirement that the liquid flows from the top heat sink 2 and then from the bottom substrate 1 Just flow out.

在一些实施方式中,所述热沉2与所述多层集成电路芯片3通过焊点6连接。In some implementations, the heat sink 2 is connected to the multilayer integrated circuit chip 3 through solder joints 6 .

图2为本发明实施例提供的顶部热沉及其下方凸点的示意图。如图2所示,第一扰流柱(图中未示出)和第二扰流柱24交替排布组成了热沉2中的第二扰流柱阵列,顶部的液体微凸点5用来连接液体硅通孔阵列32与顶部热沉2,焊点6用来连接多层集成电路芯片3与顶部热沉2。FIG. 2 is a schematic diagram of the top heat sink and the bumps below it provided by the embodiment of the present invention. As shown in Figure 2, the first spoiler column (not shown in the figure) and the second spoiler column 24 are alternately arranged to form the second spoiler column array in the heat sink 2, and the liquid micro-bump 5 on the top is used to connect the liquid TSV array 32 and the top heat sink 2 , and the solder joints 6 are used to connect the multilayer integrated circuit chip 3 and the top heat sink 2 .

图3为本发明实施例提供的顶部热沉中的扰流柱阵列的示意图,图4为本发明实施例提供的顶部热沉下方的凸点阵列的示意图。图3和图4中的虚线为辅助虚线,仅仅为了更加直观的看出第二扰流柱阵列的排布,并没有其他的含义。图3是从热沉2顶部往下的垂直视图,如图3所示,圈中有交叉实线的点表示的是第二扰流柱24,其均匀排布在热沉2上,用于支撑热沉2中第二外底板21和第二内底板22之间的空间,空心点表示的是第一扰流柱23,其均匀排布在热沉2上。图4是从热沉2底部往上的垂直视图,如图4所示,用来连接液体硅通孔阵列32与顶部热沉2的液体微凸点5均匀排布在热沉2的底部,连接多层集成电路芯片3与顶部热沉2的焊点6均匀排布在液体微凸点5周围。FIG. 3 is a schematic diagram of a spoiler array in a top heat sink provided by an embodiment of the present invention, and FIG. 4 is a schematic diagram of a bump array under a top heat sink provided by an embodiment of the present invention. The dotted lines in FIG. 3 and FIG. 4 are auxiliary dotted lines, which are only used to see the arrangement of the second spoiler array more intuitively, and have no other meanings. Fig. 3 is a vertical view from the top of the heat sink 2. As shown in Fig. 3, the dots with crossed solid lines in the circle represent the second spoiler columns 24, which are evenly arranged on the heat sink 2 for Supporting the space between the second outer bottom plate 21 and the second inner bottom plate 22 in the heat sink 2 , the hollow dots indicate the first spoiler columns 23 , which are evenly arranged on the heat sink 2 . Fig. 4 is a vertical view from the bottom of the heat sink 2 upwards. As shown in Fig. 4, the liquid micro-bumps 5 used to connect the liquid TSV array 32 and the top heat sink 2 are evenly arranged on the bottom of the heat sink 2, The solder joints 6 connecting the multilayer integrated circuit chip 3 and the top heat sink 2 are evenly arranged around the liquid micro bumps 5 .

在一些实施方式中,所述第一扰流柱23与所述第二扰流柱24的形状相同。在一些实施方式中,所述第一扰流柱23的形状为圆柱形或正六边形柱。In some embodiments, the first spoiler column 23 and the second spoiler column 24 have the same shape. In some embodiments, the shape of the first spoiler column 23 is a cylinder or a regular hexagon.

在一些实施方式中,所述第一扰流柱23与所述第二扰流柱24的形状不同。例如,所述第一扰流柱23的形状为圆柱形,所述第二扰流柱24的形状为正六边形柱;或者,所述第一扰流柱23的形状为正六边形柱,所述第二扰流柱24的形状为圆柱形。本发明实施例中的第一扰流柱23和第二扰流柱24的形状仅仅是示例性的,在其他实施例中,可以将第一扰流柱23和第二扰流柱24设置成其他形状。In some embodiments, the shape of the first spoiler column 23 is different from that of the second spoiler column 24 . For example, the shape of the first spoiler post 23 is cylindrical, and the shape of the second spoiler post 24 is a regular hexagonal post; or, the shape of the first spoiler post 23 is a regular hexagonal post, The shape of the second spoiler column 24 is cylindrical. The shapes of the first spoiler post 23 and the second spoiler post 24 in the embodiment of the present invention are only exemplary. In other embodiments, the first spoiler post 23 and the second spoiler post 24 can be set as other shapes.

在一些实施方式中,所述热沉2配置用于容纳冷却液体,所述冷却液体为具有高热导率的液体。本发明实施例中的高热导率为本领域的一般理解,高热导率的液体例如水、EGW(乙二醇和水溶液)、PGW(丙二醇和水溶液)等。In some embodiments, the heat sink 2 is configured to accommodate a cooling liquid, which is a liquid with high thermal conductivity. The high thermal conductivity in the embodiment of the present invention is a general understanding in the art, and liquids with high thermal conductivity are water, EGW (ethylene glycol and aqueous solution), PGW (propylene glycol and aqueous solution) and the like.

在一些实施方式中,所述第二外底板21和所述第二内底板22的材质相同,所述第二外底板21材质为硅、金刚石、导热陶瓷或有机树脂。In some embodiments, the second outer bottom plate 21 and the second inner bottom plate 22 are made of the same material, and the second outer bottom plate 21 is made of silicon, diamond, thermally conductive ceramics or organic resin.

在一些实施方式中,所述第二外底板21和所述第二内底板22的材质不同。在一些实施方式中,所述第二外底板21材质为玻璃。本发明实施例中的第二外底板21和第二内底板22的材质仅仅是示例性的,在其他实施例中,可以将第二外底板21和第二内底板22设置成其他材质。In some embodiments, the materials of the second outer bottom plate 21 and the second inner bottom plate 22 are different. In some embodiments, the material of the second outer bottom plate 21 is glass. The materials of the second outer bottom plate 21 and the second inner bottom plate 22 in the embodiment of the present invention are only exemplary. In other embodiments, the second outer bottom plate 21 and the second inner bottom plate 22 can be made of other materials.

在一些实施方式中,所述第一扰流柱阵列的布局方式与所述第二扰流柱阵列的布局方式相同。也即是,本发明实施例中底部基底1的内嵌第一扰流柱阵列与顶部热沉2的第二扰流柱阵列的面内分布保持一致。In some embodiments, the layout of the first array of spoiler posts is the same as that of the second array of spoiler posts. That is to say, in the embodiment of the present invention, the in-plane distribution of the first spoiler array embedded in the bottom substrate 1 and the second spoiler array of the top heat sink 2 are consistent.

在一些实施方式中,所述第二扰流柱阵列的布局方式与所述信号硅通孔阵列和液体硅通孔阵列的布局方式相同。也即是,本发明实施例中第二扰流柱阵列与多层集成电路芯片3内部的信号硅通孔阵列31、液体硅通孔阵列32的面内分布保持一致。In some embodiments, the layout of the second spoiler column array is the same as that of the signal TSV array and the liquid TSV array. That is to say, in the embodiment of the present invention, the in-plane distribution of the second spoiler column array is consistent with the signal TSV array 31 and the liquid TSV array 32 inside the multilayer integrated circuit chip 3 .

在一些实施方式中,在所述信号硅通孔阵列和所述液体硅通孔阵列外表面均填充一层绝缘层。本发明实施例中的信号硅通孔阵列31、液体硅通孔阵列32在刻蚀后,均填充一层绝缘层,如二氧化硅。In some embodiments, an insulating layer is filled on the outer surfaces of the signal TSV array and the liquid TSV array. The signal TSV array 31 and the liquid TSV array 32 in the embodiment of the present invention are all filled with an insulating layer, such as silicon dioxide, after etching.

冷却液体经过热沉2的第二外底板21的入口进入热沉2,经由液体硅通孔阵列32的通道进入内嵌微流道的基底1,最终由基底1的出口流出并带走芯片热量,附图中未标注出口。The cooling liquid enters the heat sink 2 through the entrance of the second outer bottom plate 21 of the heat sink 2, enters the substrate 1 embedded with micro-channels through the channel of the liquid TSV array 32, and finally flows out from the outlet of the substrate 1 to take away the chip heat , the exit is not marked in the drawings.

本发明实施例由液体硅通孔和内嵌扰流柱的微流道热沉和基板共同构成散热结构,同时提供一种基于该散热方法的三维主动散热结构及其制作工艺,通过多维度、多尺度的均衡性主动散热来提高3D集成电路芯片的散热效率,可提高3D集成电路芯片的散热性能和系统可靠性,并且由于热沉和衬底均为硅,内部微流道结构保持一致,从而降低了结构整体的工艺复杂度,可以提高芯片良率。The embodiment of the present invention consists of a liquid through-silicon via, a micro-channel heat sink embedded with a spoiler column, and a substrate to form a heat dissipation structure. At the same time, a three-dimensional active heat dissipation structure and its manufacturing process based on the heat dissipation method are provided. Through multi-dimensional, Multi-scale balanced active heat dissipation to improve the heat dissipation efficiency of 3D integrated circuit chips can improve the heat dissipation performance and system reliability of 3D integrated circuit chips, and because the heat sink and substrate are both silicon, the internal microfluidic structure remains consistent, Therefore, the process complexity of the overall structure is reduced, and the chip yield rate can be improved.

基于上述目的,本发明实施例的第二个方面,提出了一种主板,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。Based on the above purpose, the second aspect of the embodiments of the present invention proposes a motherboard, including the heat dissipation structure of liquid through silicon vias compatible with embedded micro-channels as described in any one of the above items.

液体硅通孔兼容嵌入式微流道的散热结构包括如下部件:The heat dissipation structure of liquid through-silicon vias compatible with embedded micro-channels includes the following components:

基底1,所述基底1包括第一外底板11和第一内底板12,所述基底1内刻蚀有第一扰流柱阵列(包括13和14);A base 1, the base 1 includes a first outer bottom plate 11 and a first inner bottom plate 12, and a first spoiler column array (including 13 and 14) is etched in the base 1;

热沉2,所述热沉2包括第二外底板21和第二内底板22,所述热沉2内刻蚀有第二扰流柱阵列(包括23和24);以及A heat sink 2, the heat sink 2 includes a second outer bottom plate 21 and a second inner bottom plate 22, and a second spoiler column array (including 23 and 24) is etched in the heat sink 2; and

多层集成电路芯片3,所述多层集成电路芯片3垂直堆叠,设置在所述基底1和所述热沉2中间,所述多层集成电路芯片3中刻蚀有信号硅通孔阵列31和液体硅通孔阵列32,所述信号硅通孔阵列31通过凸点4与所述基底1连接,所述液体硅通孔阵列32通过液体微凸点5分别与所述热沉2和所述基底1连接。A multi-layer integrated circuit chip 3, the multi-layer integrated circuit chip 3 is vertically stacked and arranged between the substrate 1 and the heat sink 2, and a signal through-silicon via array 31 is etched in the multi-layer integrated circuit chip 3 and a liquid TSV array 32, the signal TSV array 31 is connected to the substrate 1 through bumps 4, and the liquid TSV array 32 is respectively connected to the heat sink 2 and the heat sink 2 through liquid micro bumps 5. The substrate 1 is connected.

也即是,本发明实施例在液体硅通孔兼容嵌入式微流道的散热结构的顶层设有内部可容纳冷却液体的热沉2,本发明实施例的热沉2内刻蚀第二扰流柱阵列(由23和24组成);本发明实施例的热沉2下方是垂直堆叠的多层集成电路芯片3;堆叠的多层集成电路芯片3中刻蚀有信号硅通孔阵列31与液体硅通孔阵列32;本发明实施例中信号硅通孔阵列31通过金属凸点4与基底1相连;本发明实施例中液体硅通孔阵列32通过液体微凸点5与顶部热沉2和底部基底1相连,连通冷却液体通道;本发明实施例中底部基底1内嵌与顶部热沉2对应的第一扰流柱阵列(由13和14组成)。That is to say, in the embodiment of the present invention, a heat sink 2 that can accommodate a cooling liquid is provided on the top layer of the liquid through-silicon via compatible embedded micro-channel heat sink, and the second spoiler is etched in the heat sink 2 of the embodiment of the present invention. Column array (composed of 23 and 24); under the heat sink 2 of the embodiment of the present invention is a vertically stacked multilayer integrated circuit chip 3; a signal through-silicon via array 31 and liquid are etched in the stacked multilayer integrated circuit chip 3 Through-silicon via array 32; in the embodiment of the present invention, the signal through-silicon via array 31 is connected to the substrate 1 through the metal bump 4; in the embodiment of the present invention, the liquid through-silicon via array 32 is connected to the top heat sink 2 and the top heat sink through the liquid micro-bump 5 The bottom base 1 is connected to communicate with the cooling liquid channel; in the embodiment of the present invention, the bottom base 1 is embedded with a first spoiler column array (composed of 13 and 14 ) corresponding to the top heat sink 2 .

在一些实施方式中,所述第二扰流柱阵列刻蚀在所述第二内底板22上,所述第二扰流柱阵列包括第一扰流柱23和第二扰流柱24,所述第二扰流柱24高于所述第一扰流柱23。In some embodiments, the second spoiler post array is etched on the second inner bottom plate 22, the second spoiler post array includes a first spoiler post 23 and a second spoiler post 24, so The second spoiler post 24 is higher than the first spoiler post 23 .

在一些实施方式中,所述第一扰流柱阵列刻蚀在所述第一内底板12上,所述第二扰流柱阵列包括第三扰流柱13和第四扰流柱14,所述第四扰流柱14高于所述第三扰流柱13。In some embodiments, the first spoiler column array is etched on the first inner bottom plate 12, the second spoiler column array includes a third spoiler column 13 and a fourth spoiler column 14, so The fourth spoiler post 14 is higher than the third spoiler post 13 .

在一些实施方式中,在所述第二外底板21对角线一端设置有液体入口,在所述第一外底板11对角线一端设置有液体出口。本发明实施例中的液体入口和液体出口仅仅是示例性的,在其他实施例中,液体入口和液体出口的位置可以改变,仅需要满足液体从顶部热沉2中流入再从底部基底1中流出即可。In some embodiments, a liquid inlet is provided at one diagonal end of the second outer bottom plate 21 , and a liquid outlet is arranged at one diagonal end of the first outer bottom plate 11 . The liquid inlet and liquid outlet in the embodiment of the present invention are only exemplary. In other embodiments, the positions of the liquid inlet and the liquid outlet can be changed, and it is only necessary to meet the requirement that the liquid flows from the top heat sink 2 and then from the bottom substrate 1 Just flow out.

在一些实施方式中,所述热沉2与所述多层集成电路芯片3通过焊点6连接。In some implementations, the heat sink 2 is connected to the multilayer integrated circuit chip 3 through solder joints 6 .

图2为本发明实施例提供的顶部热沉及其下方凸点的示意图。如图2所示,第一扰流柱(图中未示出)和第二扰流柱24交替排布组成了热沉2中的第二扰流柱阵列,顶部的液体微凸点5用来连接液体硅通孔阵列32与顶部热沉2,焊点6用来连接多层集成电路芯片3与顶部热沉2。FIG. 2 is a schematic diagram of the top heat sink and the bumps below it provided by the embodiment of the present invention. As shown in Figure 2, the first spoiler column (not shown in the figure) and the second spoiler column 24 are alternately arranged to form the second spoiler column array in the heat sink 2, and the liquid micro-bump 5 on the top is used to connect the liquid TSV array 32 and the top heat sink 2 , and the solder joints 6 are used to connect the multilayer integrated circuit chip 3 and the top heat sink 2 .

图3为本发明实施例提供的顶部热沉中的扰流柱阵列的示意图,图4为本发明实施例提供的顶部热沉下方的凸点阵列的示意图。图3和图4中的虚线为辅助虚线,仅仅为了更加直观的看出第二扰流柱阵列的排布,并没有其他的含义。图3是从热沉2顶部往下的垂直视图,如图3所示,圈中有交叉实线的点表示的是第二扰流柱24,其均匀排布在热沉2上,用于支撑热沉2中第二外底板21和第二内底板22之间的空间,空心点表示的是第一扰流柱23,其均匀排布在热沉2上。图4是从热沉2底部往上的垂直视图,如图4所示,用来连接液体硅通孔阵列32与顶部热沉2的液体微凸点5均匀排布在热沉2的底部,连接多层集成电路芯片3与顶部热沉2的焊点6均匀排布在液体微凸点5周围。FIG. 3 is a schematic diagram of a spoiler array in a top heat sink provided by an embodiment of the present invention, and FIG. 4 is a schematic diagram of a bump array under a top heat sink provided by an embodiment of the present invention. The dotted lines in FIG. 3 and FIG. 4 are auxiliary dotted lines, which are only used to see the arrangement of the second spoiler array more intuitively, and have no other meanings. Fig. 3 is a vertical view from the top of the heat sink 2. As shown in Fig. 3, the dots with crossed solid lines in the circle represent the second spoiler columns 24, which are evenly arranged on the heat sink 2 for Supporting the space between the second outer bottom plate 21 and the second inner bottom plate 22 in the heat sink 2 , the hollow dots indicate the first spoiler columns 23 , which are evenly arranged on the heat sink 2 . Fig. 4 is a vertical view from the bottom of the heat sink 2 upwards. As shown in Fig. 4, the liquid micro-bumps 5 used to connect the liquid TSV array 32 and the top heat sink 2 are evenly arranged on the bottom of the heat sink 2, The solder joints 6 connecting the multilayer integrated circuit chip 3 and the top heat sink 2 are evenly arranged around the liquid micro bumps 5 .

在一些实施方式中,所述第一扰流柱23与所述第二扰流柱24的形状相同。在一些实施方式中,所述第一扰流柱23的形状为圆柱形或正六边形柱。In some embodiments, the first spoiler column 23 and the second spoiler column 24 have the same shape. In some embodiments, the shape of the first spoiler column 23 is a cylinder or a regular hexagon.

在一些实施方式中,所述第一扰流柱23与所述第二扰流柱24的形状不同。例如,所述第一扰流柱23的形状为圆柱形,所述第二扰流柱24的形状为正六边形柱;或者,所述第一扰流柱23的形状为正六边形柱,所述第二扰流柱24的形状为圆柱形。本发明实施例中的第一扰流柱23和第二扰流柱24的形状仅仅是示例性的,在其他实施例中,可以将第一扰流柱23和第二扰流柱24设置成其他形状。In some embodiments, the shape of the first spoiler column 23 is different from that of the second spoiler column 24 . For example, the shape of the first spoiler post 23 is cylindrical, and the shape of the second spoiler post 24 is a regular hexagonal post; or, the shape of the first spoiler post 23 is a regular hexagonal post, The shape of the second spoiler column 24 is cylindrical. The shapes of the first spoiler post 23 and the second spoiler post 24 in the embodiment of the present invention are only exemplary. In other embodiments, the first spoiler post 23 and the second spoiler post 24 can be set as other shapes.

在一些实施方式中,所述热沉2配置用于容纳冷却液体,所述冷却液体为具有高热导率的液体。本发明实施例中的高热导率为本领域的一般理解,高热导率的液体例如水、EGW(乙二醇和水溶液)、PGW(丙二醇和水溶液)等。In some embodiments, the heat sink 2 is configured to accommodate a cooling liquid, which is a liquid with high thermal conductivity. The high thermal conductivity in the embodiment of the present invention is a general understanding in the art, and liquids with high thermal conductivity are water, EGW (ethylene glycol and aqueous solution), PGW (propylene glycol and aqueous solution) and the like.

在一些实施方式中,所述第二外底板21和所述第二内底板22的材质相同,所述第二外底板21材质为硅、金刚石、导热陶瓷或有机树脂。In some embodiments, the second outer bottom plate 21 and the second inner bottom plate 22 are made of the same material, and the second outer bottom plate 21 is made of silicon, diamond, thermally conductive ceramics or organic resin.

在一些实施方式中,所述第二外底板21和所述第二内底板22的材质不同。在一些实施方式中,所述第二外底板21材质为玻璃。本发明实施例中的第二外底板21和第二内底板22的材质仅仅是示例性的,在其他实施例中,可以将第二外底板21和第二内底板22设置成其他材质。In some embodiments, the materials of the second outer bottom plate 21 and the second inner bottom plate 22 are different. In some embodiments, the material of the second outer bottom plate 21 is glass. The materials of the second outer bottom plate 21 and the second inner bottom plate 22 in the embodiment of the present invention are only exemplary. In other embodiments, the second outer bottom plate 21 and the second inner bottom plate 22 can be made of other materials.

在一些实施方式中,所述第一扰流柱阵列的布局方式与所述第二扰流柱阵列的布局方式相同。也即是,本发明实施例中底部基底1的内嵌第一扰流柱阵列与顶部热沉2的第二扰流柱阵列的面内分布保持一致。In some embodiments, the layout of the first array of spoiler posts is the same as that of the second array of spoiler posts. That is to say, in the embodiment of the present invention, the in-plane distribution of the first spoiler array embedded in the bottom substrate 1 and the second spoiler array of the top heat sink 2 are consistent.

在一些实施方式中,所述第二扰流柱阵列的布局方式与所述信号硅通孔阵列和液体硅通孔阵列的布局方式相同。也即是,本发明实施例中第二扰流柱阵列与多层集成电路芯片3内部的信号硅通孔阵列31、液体硅通孔阵列32的面内分布保持一致。In some embodiments, the layout of the second spoiler column array is the same as that of the signal TSV array and the liquid TSV array. That is to say, in the embodiment of the present invention, the in-plane distribution of the second spoiler column array is consistent with the signal TSV array 31 and the liquid TSV array 32 inside the multilayer integrated circuit chip 3 .

在一些实施方式中,在所述信号硅通孔阵列和所述液体硅通孔阵列外表面均填充一层绝缘层。本发明实施例中的信号硅通孔阵列31、液体硅通孔阵列32在刻蚀后,均填充一层绝缘层,如SiO2(二氧化硅)。In some embodiments, an insulating layer is filled on the outer surfaces of the signal TSV array and the liquid TSV array. The signal TSV array 31 and the liquid TSV array 32 in the embodiment of the present invention are all filled with an insulating layer, such as SiO2 (silicon dioxide), after etching.

冷却液体经过热沉2的第二外底板21的入口进入热沉2,经由液体硅通孔阵列32的通道进入内嵌微流道的基底1,最终由基底1的出口流出并带走芯片热量,附图中未标注出口。The cooling liquid enters the heat sink 2 through the entrance of the second outer bottom plate 21 of the heat sink 2, enters the substrate 1 embedded with micro-channels through the channel of the liquid TSV array 32, and finally flows out from the outlet of the substrate 1 to take away the chip heat , the exit is not marked in the drawings.

本发明实施例由液体硅通孔和内嵌扰流柱的微流道热沉和基板共同构成散热结构,同时提供一种基于该散热方法的三维主动散热结构及其制作工艺,通过多维度、多尺度的均衡性主动散热来提高3D集成电路芯片的散热效率,可提高3D集成电路芯片的散热性能和系统可靠性,并且由于热沉和衬底均为硅,内部微流道结构保持一致,从而降低了结构整体的工艺复杂度,可以提高芯片良率。The embodiment of the present invention consists of a liquid through-silicon via, a micro-channel heat sink embedded with a spoiler column, and a substrate to form a heat dissipation structure. At the same time, a three-dimensional active heat dissipation structure and its manufacturing process based on the heat dissipation method are provided. Through multi-dimensional, Multi-scale balanced active heat dissipation to improve the heat dissipation efficiency of 3D integrated circuit chips can improve the heat dissipation performance and system reliability of 3D integrated circuit chips, and because the heat sink and substrate are both silicon, the internal microfluidic structure remains consistent, Therefore, the process complexity of the overall structure is reduced, and the chip yield rate can be improved.

本发明实施例可用于激光器芯片、汽车内部电路散热、服务器液冷散热等。The embodiments of the present invention can be used for heat dissipation of laser chips, internal circuits of automobiles, liquid cooling of servers, and the like.

基于上述目的,本发明实施例的第三个方面,提出了一种液冷主板,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。本领域技术人员可知,液冷服务器包括上述描述液体硅通孔兼容嵌入式微流道的散热结构的所有技术特征和技术效果,为了描述的简洁,在此不再赘述。Based on the above purpose, the third aspect of the embodiments of the present invention proposes a liquid-cooled motherboard, including the heat dissipation structure of the liquid through-silicon vias compatible with embedded micro-channels as described in any one of the above items. Those skilled in the art know that the liquid-cooled server includes all the technical features and technical effects described above for the heat dissipation structure of liquid through-silicon vias compatible with embedded micro-channels. For the sake of brevity, details are not repeated here.

基于上述目的,本发明实施例的第四个方面,提出了一种液冷服务器,包括如上任一项所述的液体硅通孔兼容嵌入式微流道的散热结构。本领域技术人员可知,液冷服务器包括上述描述液体硅通孔兼容嵌入式微流道的散热结构的所有技术特征和技术效果,为了描述的简洁,在此不再赘述。Based on the above purpose, the fourth aspect of the embodiments of the present invention provides a liquid-cooled server, including the liquid through-silicon via compatible embedded micro-channel heat dissipation structure described in any one of the above items. Those skilled in the art know that the liquid-cooled server includes all the technical features and technical effects described above for the heat dissipation structure of liquid through-silicon vias compatible with embedded micro-channels. For the sake of brevity, details are not repeated here.

基于上述目的,本发明实施例的第五个方面,提出了一种液体硅通孔兼容嵌入式微流道的散热结构的制作方法。图5为本发明提供的液体硅通孔兼容嵌入式微流道的散热结构的制作方法的实施例的示意图,如图5所示,本发明实施例中的制作方法包括如下步骤:S1、在热沉的第二内底板上表面刻蚀第二扰流柱阵列构成微流道,在热沉的第二外底板刻蚀液体硅通孔阵列接口,将微流道密封,并在所述热沉上设置液体入口;S2、将多层集成芯片进行垂直堆叠,对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列;S3、在基底的第一外底板下表面刻蚀第一扰流柱阵列构成第二微流道,将所述第二微流道密封,并在所述基底上设置液体出口;以及S4、将所述信号硅通孔阵列与所述基底互连,并将所述液体硅通孔阵列分别与所述基底和所述热沉互连。Based on the above purpose, the fifth aspect of the embodiments of the present invention proposes a method for manufacturing a liquid through silicon via compatible embedded micro-channel heat dissipation structure. Fig. 5 is a schematic diagram of an embodiment of a manufacturing method of a liquid through-silicon via compatible embedded micro-channel heat dissipation structure provided by the present invention. As shown in Fig. 5, the manufacturing method in the embodiment of the present invention includes the following steps: S1. The surface of the second inner bottom plate of the sink is etched with a second spoiler column array to form a micro flow channel, and the liquid through-silicon hole array interface is etched on the second outer bottom plate of the heat sink to seal the micro flow channel, and the micro flow channel is sealed in the heat sink A liquid inlet is provided on the top; S2, vertically stack the multilayer integrated chips, and etch the signal through-silicon via array and the liquid through-silicon via array on the multi-layer integrated chip; S3, etch the first The spoiler column array constitutes a second micro-channel, sealing the second micro-channel, and setting a liquid outlet on the substrate; and S4, interconnecting the signal TSV array with the substrate, and The liquid TSV arrays are respectively interconnected with the substrate and the heat sink.

在一些实施方式中,所述将微流道密封包括:通过晶圆级键合工艺将所述第二外底板与微流道结构键合。In some embodiments, the sealing the micro-channel includes: bonding the second outer bottom plate to the micro-channel structure through a wafer-level bonding process.

在一些实施方式中,所述对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列包括:将所述信号硅通孔阵列和所述液体硅通孔阵列嵌套分布设置。In some embodiments, the etching the signal TSV array and the liquid TSV array on the multi-layer integrated chip includes: nesting and distributing the signal TSV array and the liquid TSV array.

在一些实施方式中,所述对多层集成芯片刻蚀信号硅通孔阵列和液体硅通孔阵列包括:采用硅通孔深刻工艺在多层集成芯片内部刻蚀信号硅通孔阵列和液体硅通孔阵列。In some embodiments, the etching the signal TSV array and the liquid TSV array on the multilayer integrated chip includes: using the TSV deep process to etch the signal TSV array and the liquid silicon via array inside the multilayer integrated chip. via array.

在一些实施方式中,所述将所述液体硅通孔阵列分别与所述基底和所述热沉互连包括:通过液体微凸点工艺将所述液体硅通孔阵列分别与所述热沉和所述基底互连。In some embodiments, the interconnecting the liquid TSV arrays with the substrate and the heat sink respectively includes: respectively interconnecting the liquid TSV arrays with the heat sink through a liquid micro-bump process. interconnected with the substrate.

在一些实施方式中,所述制作方法还包括:通过焊接连接所述热沉和所述多层集成芯片。In some embodiments, the manufacturing method further includes: connecting the heat sink and the multilayer integrated chip by soldering.

本发明实施例中制作方法可以如下:In the embodiment of the present invention, the production method can be as follows:

采用二次深反应离子刻蚀技术,在热沉2的第二内底板22上表面刻第二蚀扰流柱阵列,构成内部微流道;在第二内底板22刻蚀液体硅通孔阵列接口;在第二内底板和第二外底板对位接触的位置制作金属焊接层,采用热压键合工艺将热沉2的第二外底板21与微流道结构键合,密封微流道;在第二外底板21对角线一端留有液体入口,得到内含第二扰流柱阵列的微流道热沉。Secondary deep reactive ion etching technology is used to etch the second spoiler column array on the upper surface of the second inner bottom plate 22 of the heat sink 2 to form an internal micro flow channel; the second inner bottom plate 22 is etched with a liquid through-silicon hole array Interface; make a metal welding layer at the position where the second inner bottom plate and the second outer bottom plate are in contact with each other, and use a thermocompression bonding process to bond the second outer bottom plate 21 of the heat sink 2 to the micro-channel structure to seal the micro-channel ; A liquid inlet is left at one end of the diagonal line of the second outer bottom plate 21 to obtain a microchannel heat sink containing a second spoiler array.

将热沉2与多层集成电路芯片3通过焊点6连接,液体硅通孔阵列32接口处由液体微凸点5进行连通。将多层集成电路芯片3进行垂直堆叠以形成3D集成。The heat sink 2 and the multi-layer integrated circuit chip 3 are connected through solder joints 6 , and the interface of the liquid through-silicon via array 32 is communicated by the liquid micro-bump 5 . Multi-layer integrated circuit chips 3 are vertically stacked to form 3D integration.

采用常规硅通孔深刻工艺在多层芯片内部刻蚀信号硅通孔阵列31和液体硅通孔阵列32。对多层集成电路芯片3刻蚀信号硅通孔阵列31,以实现信号互连和冷却通道互连;信号硅通孔阵列31中心为液体硅通孔阵列32,面内分布呈现信号硅通孔阵列31与液体硅通孔阵列32嵌套分布的特点。The signal TSV array 31 and the liquid TSV array 32 are etched inside the multi-layer chip by using a conventional TSV deep process. The signal TSV array 31 is etched on the multilayer integrated circuit chip 3 to realize signal interconnection and cooling channel interconnection; the center of the signal TSV array 31 is a liquid TSV array 32, and the in-plane distribution presents signal TSVs The feature of the nested distribution of the array 31 and the liquid TSV array 32 .

采用二次深反应离子刻蚀技术,在基底1第一外底板11下表面刻蚀第一扰流柱阵列,构成内部微流道;在第一外底板11刻蚀液体硅通孔32接口;在第一外底板11对角线另一端留有液体出口;在第一外底板和第一内底板对位接触的位置制作金属焊接层,采用热压键合工艺将第一内底板12与第一外底板11键合,密封微流道。Using secondary deep reactive ion etching technology, etch the first spoiler column array on the lower surface of the first outer bottom plate 11 of the substrate 1 to form an internal micro flow channel; etch the interface of the liquid through-silicon hole 32 on the first outer bottom plate 11; A liquid outlet is left at the other end of the diagonal line of the first outer bottom plate 11; a metal welding layer is made at the position where the first outer bottom plate and the first inner bottom plate are in contact with each other, and the first inner bottom plate 12 is bonded to the second inner bottom plate by using a thermocompression bonding process. An outer bottom plate 11 is bonded to seal the micro-channel.

通过液体微凸点工艺将液体硅通孔阵列32与热沉2互连,在多层集成电路芯片3和热沉2之间制作第二填充层;将上述3D集成电路芯片的信号硅通孔阵列31通过金属凸点4与基底1互连;通过液体微凸点工艺将液体硅通孔阵列32分别与基底1和热沉2互连,在多层集成电路芯片3和基底1之间制作第一填充层,制得所述液体硅通孔兼容嵌入式微流道基板的散热结构。凸点互连工艺包括热压焊、回流焊等工艺。The liquid through-silicon via array 32 is interconnected with the heat sink 2 through a liquid micro-bump process, and a second filling layer is made between the multilayer integrated circuit chip 3 and the heat sink 2; the signal through-silicon via of the above-mentioned 3D integrated circuit chip The array 31 is interconnected with the substrate 1 through metal bumps 4; the liquid through-silicon via array 32 is interconnected with the substrate 1 and the heat sink 2 respectively through the liquid micro-bump process, and is fabricated between the multilayer integrated circuit chip 3 and the substrate 1 The first filling layer is used to prepare the heat dissipation structure of the liquid through-silicon via compatible with the embedded micro-channel substrate. The bump interconnection process includes thermocompression welding, reflow soldering and other processes.

冷却液体经过热沉2的第二外底板21的入口进入热沉2,经由液体硅通孔阵列32的通道进入内嵌微流道的基底1,最终由基底1的出口流出并带走芯片热量,附图中未标注出口。The cooling liquid enters the heat sink 2 through the entrance of the second outer bottom plate 21 of the heat sink 2, enters the substrate 1 embedded with micro-channels through the channel of the liquid TSV array 32, and finally flows out from the outlet of the substrate 1 to take away the chip heat , the exit is not marked in the drawings.

本发明实施例由液体硅通孔和内嵌扰流柱的微流道热沉和基板共同构成散热结构,同时提供一种基于该散热方法的三维主动散热结构及其制作工艺,在传统顶部热沉的基础上构建微流道,构成了液冷散热循环通路,通过主动散热提高了散热效率。兼容液体硅通孔阵列,可以平衡垂直方向的热量分布,减少信号电热耦合造成的热量集中。信号硅通孔阵列和液体硅通孔阵列均纵向分布,不存在面内交叉设计困难。并且由于热沉和衬底均为硅,内部微流道结构保持一致,从而降低了结构整体的工艺复杂度,可以提高芯片良率。The embodiment of the present invention consists of liquid through-silicon vias, a microchannel heat sink embedded with spoiler columns, and a substrate to form a heat dissipation structure, and at the same time provides a three-dimensional active heat dissipation structure based on the heat dissipation method and its manufacturing process. On the basis of sinking, micro-channels are built to form a liquid-cooled heat dissipation circulation path, and the heat dissipation efficiency is improved through active heat dissipation. Compatible with liquid TSV arrays, it can balance heat distribution in the vertical direction and reduce heat concentration caused by signal electrothermal coupling. Both the signal TSV array and the liquid TSV array are distributed vertically, so there is no difficulty in in-plane crossover design. And because the heat sink and the substrate are both silicon, the internal micro-channel structure remains consistent, thereby reducing the overall process complexity of the structure and improving the chip yield.

需要特别指出的是,上述液体硅通孔兼容嵌入式微流道的散热结构的制作方法的各个实施例中的各个步骤均可以相互交叉、替换、增加、删减,因此,这些合理的排列组合变换之于液体硅通孔兼容嵌入式微流道的散热结构的制作方法也应当属于本发明的保护范围,并且不应将本发明的保护范围局限在实施例之上。It should be pointed out that the various steps in the various embodiments of the above-mentioned method for manufacturing the heat dissipation structure of liquid through silicon vias compatible with embedded microchannels can be mutually intersected, replaced, added, and deleted. Therefore, these reasonable permutations and combinations of transformations The manufacturing method of the liquid TSV-compatible heat dissipation structure with embedded micro-channels should also belong to the protection scope of the present invention, and the protection scope of the present invention should not be limited to the embodiments.

最后需要说明的是,本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程,可以通过计算机程序来指令相关硬件来完成,液体硅通孔兼容嵌入式微流道的散热结构的制作方法的程序可存储于一计算机可读取存储介质中,该程序在执行时,可包括如上述各方法的实施例的流程。其中,程序的存储介质可为磁碟、光盘、只读存储记忆体(ROM)或随机存储记忆体(RAM)等。上述计算机程序的实施例,可以达到与之对应的前述任意方法实施例相同或者相类似的效果。Finally, it should be noted that those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be realized through computer programs to instruct relevant hardware to complete, and the liquid through-silicon vias are compatible with the fabrication of embedded micro-channel heat dissipation structures The program of the method can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Wherein, the storage medium of the program may be a magnetic disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM). The foregoing computer program embodiments can achieve the same or similar effects as any of the foregoing method embodiments corresponding thereto.

以上是本发明公开的示例性实施例,但是应当注意,在不背离权利要求限定的本发明实施例公开的范围的前提下,可以进行多种改变和修改。根据这里描述的公开实施例的方法权利要求的功能、步骤和/或动作不需以任何特定顺序执行。此外,尽管本发明实施例公开的元素可以以个体形式描述或要求,但除非明确限制为单数,也可以理解为多个。The above are the exemplary embodiments disclosed in the present invention, but it should be noted that various changes and modifications can be made without departing from the scope of the disclosed embodiments of the present invention defined in the claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. In addition, although the elements disclosed in the embodiments of the present invention may be described or required in an individual form, they may also be understood as a plurality unless explicitly limited to a singular number.

应当理解的是,在本文中使用的,除非上下文清楚地支持例外情况,单数形式“一个”旨在也包括复数形式。还应当理解的是,在本文中使用的“和/或”是指包括一个或者一个以上相关联地列出的项目的任意和所有可能组合。It should be understood that as used herein, the singular form "a" and "an" are intended to include the plural forms as well, unless the context clearly supports an exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.

上述本发明实施例公开实施例序号仅仅为了描述,不代表实施例的优劣。The serial numbers of the embodiments disclosed in the above-mentioned embodiments of the present invention are only for description, and do not represent the advantages and disadvantages of the embodiments.

本领域普通技术人员可以理解实现上述实施例的全部或部分步骤可以通过硬件来完成,也可以通过程序来指令相关的硬件完成,程序可以存储于一种计算机可读存储介质中,上述提到的存储介质可以是只读存储器,磁盘或光盘等。Those of ordinary skill in the art can understand that all or part of the steps for implementing the above-mentioned embodiments can be completed by hardware, or can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. The above-mentioned The storage medium may be a read-only memory, a magnetic disk or an optical disk, and the like.

所属领域的普通技术人员应当理解:以上任何实施例的讨论仅为示例性的,并非旨在暗示本发明实施例公开的范围(包括权利要求)被限于这些例子;在本发明实施例的思路下,以上实施例或者不同实施例中的技术特征之间也可以进行组合,并存在如上的本发明实施例的不同方面的许多其它变化,为了简明它们没有在细节中提供。因此,凡在本发明实施例的精神和原则之内,所做的任何省略、修改、等同替换、改进等,均应包含在本发明实施例的保护范围之内。Those of ordinary skill in the art should understand that: the discussion of any of the above embodiments is exemplary only, and is not intended to imply that the disclosed scope (including claims) of the embodiments of the present invention is limited to these examples; under the idea of the embodiments of the present invention , the technical features in the above embodiments or different embodiments can also be combined, and there are many other changes in different aspects of the above embodiments of the present invention, which are not provided in details for the sake of brevity. Therefore, within the spirit and principle of the embodiments of the present invention, any omissions, modifications, equivalent replacements, improvements, etc., shall be included in the protection scope of the embodiments of the present invention.

Claims (22)

1. The heat dissipation structure compatible with the embedded micro-channel by the liquid through silicon vias is characterized by comprising the following components:
the substrate comprises a first outer bottom plate and a first inner bottom plate, and a first turbulent flow column array is etched in the substrate;
the heat sink comprises a second outer bottom plate and a second inner bottom plate, and a second turbulent flow column array is etched in the heat sink; and
the multi-layer integrated circuit chip is vertically stacked and arranged between the substrate and the heat sink, a signal through silicon hole array and a liquid through silicon hole array are etched in the multi-layer integrated circuit chip, the signal through silicon hole array is connected with the substrate through bumps, and the liquid through silicon hole array is respectively connected with the heat sink and the substrate through liquid micro bumps.
2. The heat dissipation structure of the embedded micro-fluidic channel compatible with the through-silicon-via of claim 1, wherein the second turbulence post array is etched on the second inner bottom plate, the second turbulence post array comprises a first turbulence post and a second turbulence post, and the second turbulence post is higher than the first turbulence post.
3. The heat dissipation structure of the embedded micro flow channel compatible with the through silicon via of claim 2, wherein the first turbulence column and the second turbulence column have the same shape.
4. The heat dissipation structure of the embedded micro flow channel compatible with the through silicon via of claim 3, wherein the shape of the first turbulence column is a cylindrical column or a regular hexagonal column.
5. The thermal dissipation structure of a liquid through silicon via compatible embedded micro-fluidic channel of claim 1, wherein the heat sink is configured to hold a cooling liquid, the cooling liquid being a liquid having a high thermal conductivity.
6. The thermal dissipation structure of a liquid through silicon via compatible embedded micro-fluidic channel of claim 1, wherein the heat sink is connected to the multi-layer integrated circuit die by solder joints.
7. The heat dissipation structure of the embedded micro-fluidic channel compatible with the liquid through silicon vias according to claim 1, wherein the second outer bottom plate and the second inner bottom plate are made of the same material, and the second outer bottom plate is made of silicon, diamond, heat-conducting ceramic or organic resin.
8. The heat dissipation structure of a liquid through silicon via compatible embedded micro-fluidic channel of claim 1, wherein the second outer bottom plate and the second inner bottom plate are different in material.
9. The heat dissipation structure of a liquid through silicon via compatible embedded micro-fluidic channel of claim 8, wherein the second outer bottom plate is glass.
10. The heat dissipation structure of a liquid through silicon via compatible embedded micro flow channel according to claim 1, wherein a layout mode of the first turbulence column array is the same as a layout mode of the second turbulence column array.
11. The heat dissipation structure of a liquid through silicon via compatible embedded micro flow channel according to claim 1, wherein a layout manner of the second turbulence column array is the same as a layout manner of the signal through silicon via array and the liquid through silicon via array.
12. The heat dissipation structure of a liquid through silicon via compatible embedded micro flow channel of claim 1, wherein an insulating layer is filled on the outer surfaces of the signal through silicon via array and the liquid through silicon via array.
13. The heat dissipation structure of a liquid through silicon via compatible embedded micro flow channel according to claim 1, wherein a liquid inlet is provided at one end of a diagonal of the second outer bottom plate, and a liquid outlet is provided at one end of a diagonal of the first outer bottom plate.
14. A motherboard comprising a heat dissipation structure of any one of claims 1-13, wherein the liquid through silicon vias are compatible with embedded micro-fluidic channels.
15. A liquid-cooled motherboard comprising the heat dissipation structure of any one of claims 1-13, wherein the liquid through silicon vias are compatible with embedded micro-fluidic channels.
16. A liquid cooling server comprising the heat dissipation structure of any one of claims 1-13, wherein the liquid through silicon vias are compatible with embedded micro-fluidic channels.
17. The manufacturing method of the heat dissipation structure compatible with the embedded micro-channel by the liquid through silicon vias is characterized by comprising the following steps of:
etching a second turbulent column array on the upper surface of a second inner bottom plate of the heat sink to form a micro-channel, etching a liquid silicon through hole array interface on a second outer bottom plate of the heat sink, sealing the micro-channel, and arranging a liquid inlet on the heat sink;
vertically stacking the multi-layer integrated chips, and etching the signal through silicon via array and the liquid through silicon via array on the multi-layer integrated chips;
etching a first turbulent flow column array on the lower surface of a first outer bottom plate of a substrate to form a second micro-channel, sealing the second micro-channel, and arranging a liquid outlet on the substrate; and
interconnecting the array of signal through-silicon vias with the substrate and interconnecting the array of liquid through-silicon vias with the substrate and the heat sink, respectively.
18. The method for manufacturing the heat dissipation structure of the embedded micro-fluidic channel compatible with the through-silicon-via of claim 17, wherein the sealing the micro-fluidic channel comprises:
and bonding the second outer bottom plate with the micro-channel structure through a wafer-level bonding process.
19. The method for manufacturing the heat dissipation structure of the embedded micro-fluidic channel compatible with the liquid through silicon vias according to claim 17, wherein the etching the signal through silicon via array and the liquid through silicon via array on the multilayer integrated chip comprises:
and embedding and distributing the signal through silicon via array and the liquid through silicon via array.
20. The method for manufacturing the heat dissipation structure of the embedded micro-fluidic channel compatible with the liquid through silicon vias according to claim 17, wherein the etching the signal through silicon via array and the liquid through silicon via array on the multilayer integrated chip comprises:
and etching the signal through-silicon via array and the liquid through-silicon via array inside the multilayer integrated chip by adopting a through-silicon via deep process.
21. The method of fabricating a thermal dissipation structure for a liquid through silicon via compatible embedded micro-fluidic channel of claim 17, wherein interconnecting the liquid through silicon via array with the substrate and the heat sink, respectively, comprises:
and interconnecting the liquid through silicon via array with the heat sink and the substrate respectively through a liquid micro bump process.
22. The method for manufacturing the heat dissipation structure of the embedded micro-fluidic channel compatible with the through-silicon-via of claim 17, further comprising:
and connecting the heat sink and the multilayer integrated chip through welding.
CN202310623833.2A 2023-05-30 2023-05-30 Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof Active CN116364678B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310623833.2A CN116364678B (en) 2023-05-30 2023-05-30 Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310623833.2A CN116364678B (en) 2023-05-30 2023-05-30 Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof

Publications (2)

Publication Number Publication Date
CN116364678A CN116364678A (en) 2023-06-30
CN116364678B true CN116364678B (en) 2023-08-04

Family

ID=86922437

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310623833.2A Active CN116364678B (en) 2023-05-30 2023-05-30 Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof

Country Status (1)

Country Link
CN (1) CN116364678B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101803019A (en) * 2007-09-17 2010-08-11 国际商业机器公司 Integrated circuit stack and its thermal management
CN114551385A (en) * 2022-04-28 2022-05-27 之江实验室 Three-dimensional stacked packaging structure containing micro-channel heat dissipation structure and packaging method thereof

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8563365B2 (en) * 2011-03-09 2013-10-22 Georgia Tech Research Corporation Air-gap C4 fluidic I/O interconnects and methods of fabricating same
US8367478B2 (en) * 2011-06-02 2013-02-05 International Business Machines Corporation Method and system for internal layer-layer thermal enhancement
US9313921B2 (en) * 2012-08-30 2016-04-12 International Business Machines Corporation Chip stack structures that implement two-phase cooling with radial flow
US8921992B2 (en) * 2013-03-14 2014-12-30 Raytheon Company Stacked wafer with coolant channels

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101803019A (en) * 2007-09-17 2010-08-11 国际商业机器公司 Integrated circuit stack and its thermal management
CN114551385A (en) * 2022-04-28 2022-05-27 之江实验室 Three-dimensional stacked packaging structure containing micro-channel heat dissipation structure and packaging method thereof

Also Published As

Publication number Publication date
CN116364678A (en) 2023-06-30

Similar Documents

Publication Publication Date Title
CN109524373B (en) Three-dimensional active heat dissipation packaging structure of embedded micro-channel and manufacturing process thereof
CN113257757B (en) A kind of silicon-based fan-out package structure and preparation method thereof
US7888786B2 (en) Electronic module comprising memory and integrated circuit processor chips formed on a microchannel cooling device
US7990711B1 (en) Double-face heat removal of vertically integrated chip-stacks utilizing combined symmetric silicon carrier fluid cavity and micro-channel cold plate
TWI332270B (en) Apparatus and methods for microchannel cooling of semiconductor integrated circuit packages
CN108766897A (en) Realize the packaging method of the 3-D heterojunction structure of high-power GaN device layer heat dissipation
US20170186728A1 (en) Chip stack cooling structure
US20100187682A1 (en) Electronic package and method of assembling the same
CN114551385B (en) Three-dimensional stacked packaging structure containing micro-channel heat dissipation structure and packaging method thereof
CN114300428A (en) A microfluidic package structure capable of dissipating heat from six sides and a manufacturing method thereof
CN114171414A (en) Multilayer stack memory packaging method and packaging structure
CN114975318B (en) A three-dimensional integrated silicon-based inertial microsystem with embedded microfluidic channel and its manufacturing method
CN116364678B (en) Heat dissipation structure and device compatible with embedded micro-channel by liquid through silicon vias and manufacturing method thereof
CN113035784B (en) Method for preparing three-dimensional packaging structure
CN113035799B (en) Three-dimensional packaging structure
CN213366584U (en) Integrated heat dissipation packaging structure based on array micro-spraying structure
CN116002609A (en) Micro-channel structure based on three-dimensional integrated TSV adapter plate and preparation method
CN115188724A (en) An integrated self-heat dissipation structure for multi-chip packaging based on liquid phase change material
CN115148688A (en) A micro-channel module package structure and its forming method
CN114914213B (en) A three-dimensional chip integrated structure and processing method thereof
CN117219518B (en) Micro-channel substrate and manufacturing method thereof, on-chip packaging structure and manufacturing method thereof
CN116613122A (en) Heat sink compatible with micro-channel embedded in liquid silicon through hole communication hole and manufacturing method thereof
CN112201636B (en) Integrated heat dissipation packaging structure based on array micro-spray structure and manufacturing method thereof
CN119230496A (en) A dual-channel heat dissipation device for 3D multi-core chips based on TSV adapter flip-chip
CN109872987B (en) System package board structure with heat dissipation structure and manufacturing method thereof

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant