CN116263416A - Data processing method and device and X-ray crystal orientation instrument - Google Patents

Abstract

The embodiment of the application provides a data processing method and device and an X-ray crystal orientation instrument, and relates to the technical field of data processing. The method comprises the steps of obtaining target data to be detected; controlling the direction finder to move based on the target data to be detected so as to adjust the incidence parameters of the X-rays emitted by the X-ray source in the direction finder on the target to be detected; obtaining at least two groups of diffraction data by carrying out data detection in the incident parameter adjustment process; analyzing the two groups of diffraction data, and generating an image to be analyzed according to one group of diffraction data when the difference value of analysis results of the two groups of diffraction data meets a set condition; and carrying out spot recognition and analysis processing on the image to be analyzed to obtain a data analysis result. The embodiment of the application solves the problem that human intervention cannot be reduced in the process of analyzing and processing the X-ray diffraction image.

Description

Data processing method, device and X-ray crystal orientation instrument

technical field

The present application relates to the technical field of data processing, and in particular, the present application relates to a data processing method, device and X-ray crystal orientation instrument.

Background technique

The X-ray diffraction image is a grayscale image, which is composed of multiple spots. The position and gray value of each spot contain the position information of the crystal as the target to be measured. Based on the position information, the type of crystal and the orientation of the crystal axis can be obtained. and other crystal information. The crystal information of the target to be measured can be obtained by obtaining the X-ray diffraction image of the target to be measured and comparing it with the X-ray diffraction image of a reference crystal whose crystal information is known.

At present, the comparison between the X-ray diffraction image of the target to be measured and the X-ray diffraction image of the reference crystal is carried out by visually identifying the position and gray value of the spots. However, the naked eye has limitations in identifying spots with different gray values, and cannot identify spots with all gray values. Therefore, some position information will be ignored, and the crystal information of the target to be measured cannot be accurately judged.

Therefore, there is an urgent need for a data processing method, device and X-ray crystal orientation instrument to solve the problem that human intervention cannot be reduced in the process of X-ray diffraction image analysis and processing.

Contents of the invention

Various embodiments of the present application provide a data processing method, device and X-ray crystal orientation instrument, which can solve the problem that human intervention cannot be reduced in the process of X-ray diffraction image analysis and processing in the related art. Described technical scheme is as follows:

According to an embodiment of the present invention, a data processing method is applied to an X-ray crystal orientation instrument, and the method includes:

Obtain the target data to be tested;

Controlling the movement of the orientation instrument based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation instrument incident on the target to be measured;

Obtain at least two sets of diffraction data by performing data detection during the incident parameter adjustment process;

Analyzing and processing the two sets of diffraction data, when the difference between the analysis results of the two sets of diffraction data satisfies a set condition, generating an image to be analyzed according to one set of diffraction data;

Spot recognition and analysis processing are performed on the image to be analyzed to obtain a data analysis result.

Further, controlling the movement of the orientation finder based on the data of the target to be measured includes at least one of the following:

Adjusting the absolute positions of the X-ray source, the sample holder and the detector in the orientation instrument in three-dimensional space;

Adjust the pitch angle of the X-ray source, the sample holder and the detector in the three-dimensional space in the orientation instrument;

Adjusting the pose of the target to be measured on the sample holder in the orientation instrument.

Further, at least two sets of diffraction data are obtained by performing data detection during the incident parameter adjustment process, including:

Obtaining an initial detection angle and an initial pose of the target to be measured from the data of the target to be measured, and obtaining a set of diffraction data based on the initial detection angle and the initial pose of the target to be measured;

After the incident parameters are adjusted, reacquire the data of the target to be measured;

From the newly acquired data of the target to be measured, an updated detection angle and an updated pose of the target to be measured are obtained, and another set of diffraction data is obtained based on the updated detection angle and the updated pose of the target to be measured.

Further, before analyzing and processing the two sets of diffraction data, the diffraction data is preprocessed, and the preprocessing includes:

Extracting a diffraction intensity parameter from the diffraction data, and extracting a shift processing parameter from the target data to be measured, the shift processing parameter includes a decimal point shift direction and a decimal point shift number;

performing decimal point shift processing on the diffraction intensity parameter based on the shift processing parameters to obtain preprocessed diffraction data;

The analysis and processing of the two groups of diffraction data includes:

Analyze and process the two sets of diffraction data after preprocessing.

Further, the generating the image to be analyzed according to one set of diffraction data includes:

performing image segmentation on the diffraction image formed by one set of diffraction data, and determining the non-target area and the target area in the diffraction image;

An image to be analyzed including the target area is obtained from the diffraction image.

Further, spot recognition is performed on the image to be analyzed, including:

performing grayscale processing on the image to be analyzed to obtain a grayscale image;

performing threshold statistics on the grayscaled image to obtain a threshold statistical result, and determining a speckled area and a non-spotted area in the grayscaled image based on the threshold statistical result;

Spot recognition is performed on the speckled area to obtain the spot recognition result.

Further, performing spot recognition on the speckled region to obtain the spot recognition result includes:

The identified spots in the spot recognition result are screened, and the spots that do not meet the set threshold are eliminated, so as to obtain the filtered spot recognition result.

Further, grayscale processing is performed on the image to be analyzed to obtain a grayscale image, including:

Determining the image color feature of the image to be analyzed, and performing image segmentation on the image to be analyzed based on the image color feature to obtain several image areas, each image area corresponding to an image color feature;

Using different image color features, grayscale processing is performed on several image regions to obtain the grayscale image.

In another embodiment of the present invention, a data processing device is applied to an X-ray crystal orientation instrument, and the device includes:

An acquisition module, configured to acquire target data to be tested;

An adjustment module, configured to control the movement of the orientation gauge based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation gauge incident on the target to be measured;

A diffraction data acquisition module, configured to obtain at least two sets of diffraction data by performing data detection during the adjustment process of the incident parameters;

An image generation module, configured to analyze and process the two sets of diffraction data, and generate an image to be analyzed according to one set of diffraction data when the difference between the analysis results of the two sets of diffraction data satisfies a set condition;

The image recognition module is configured to perform speckle recognition and analysis processing on the image to be analyzed to obtain a data analysis result.

In another implementation of the present invention, an X-ray crystal orientation instrument, the orientation instrument includes:

processor; and

A memory, where computer-readable instructions are stored on the memory, and when the computer-readable instructions are executed by the processor, any one of the data processing methods described above is implemented.

The beneficial effects brought by the technical solution provided by the application are:

The above technical solution reduces human intervention in the process of X-ray diffraction image analysis and processing.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings that need to be used in the description of the embodiments of the present application.

FIG. 1 is a schematic diagram based on the implementation environment involved in this application.

Fig. 2 is a flow chart showing a data processing method based on an exemplary embodiment.

Fig. 3 is a flow chart showing a data processing method based on another exemplary embodiment.

Fig. 4 is a block diagram of a data processing device based on another exemplary embodiment.

Fig. 5 is a block diagram of an X-ray crystal orientation instrument based on another exemplary embodiment.

Detailed ways

In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

FIG. 1 is a schematic diagram of the implementation environment involved in the data processing method. The implementation environment includes an X-ray crystal orientation instrument and a target to be measured. The X-ray crystal orientation instrument includes a central control module 1, a target data acquisition module 2 to be detected, a detection angle acquisition module 3, a motion control module 4, a pose adjustment module 5, a data acquisition module 6, a diffraction data processing module 7, an image Processing module 8 , spot recognition module 9 , diffraction data analysis module 10 , data processing and analysis module 11 , adjustment module 12 and output module 13 . Among them, the central control module 1, together with the data acquisition module 2 of the target to be detected, the detection angle determination module 3, the motion control module 4, the pose adjustment module 5, the data acquisition module 6, the diffraction data processing module 7, the image processing module 8, the speckle The identification module 9, the diffraction data analysis module 10, the data processing and analysis module 11, the adjustment module 12 and the output module 13 are connected, and are used to control each module to work normally by using a single-chip microcomputer or a controller.

The data acquisition module 2 of the target to be detected is connected with the central control module 1 for obtaining the data of the target to be detected; the detection determination module 3 is connected with the central control module 1 for determining the detection angle and position based on the acquired data of the target to be detected pose; motion control module 4, connected with the central control module 1, for controlling the movement of the orientation instrument platform based on the initial detection angle, and updating the detection angle; the pose adjustment module 5, connected with the central control module 1, for based on the initial pose and The platform control results adjust the initial pose to obtain an updated pose; the data extraction module 6 is connected to the central control module 1 to extract diffraction data from the target data to be detected; the diffraction data processing module 7 is connected to the central control module 1 for The diffraction data is preprocessed; the image processing module 8 is connected with the central control module 1 for preprocessing the image data to be analyzed; the speckle recognition module 9 is connected with the central control module 1 for based on the preprocessed image data Carry out spot recognition; Diffraction data analysis module 10, is connected with central control module 1, is used for analyzing and processing the diffraction data after preprocessing, obtains diffraction data analysis result; Image analysis processing module 11, is connected with central control module 1, uses For analyzing and processing the image to be analyzed; the adjustment module 12 is connected with the central control module 1 to control the motion control module 4 and the pose adjustment module 5; the output module 13 is connected with the central control module 1 and is used to update the detection angle by using the display output , target data to be detected, spot recognition results, diffraction data analysis results, and image analysis results to be analyzed.

Through the above-mentioned directional device, the acquisition of target data to be measured, the movement of the directional device, the acquisition and comparison of diffraction data, and the generation, identification and analysis of images to be analyzed are realized, which effectively solves the problem of not being able to identify all brightness in related technologies. Spot defects are not conducive to making accurate judgments on the crystal information of the target to be measured.

Fig. 2 shows a data processing method according to an embodiment. This method is applicable to the X-ray crystal orientation instrument shown in Fig. 1 .

A data processing method 100 may include the following steps:

S11: Acquiring target data to be tested.

Among them, the target data to be measured includes detection angle, pose, displacement processing parameters and diffraction data. The diffraction data includes diffraction angle, number of diffraction satellite peaks and diffraction intensity. The above parameters are obtained by the detector of the X-ray orientation instrument.

The target to be measured refers to crystals formed by minerals, alloys, vitamins, drugs, or proteins or crystals in solids. Information such as the length of chemical bonds between atoms, lattice mismatches, or defects can be obtained through the data method provided by the present invention.

Regarding the acquisition of the target data to be measured, the first detection image can be derived from the first detection image collected in real time by the image acquisition device, or it can be the first detection image captured and collected by the image acquisition device in a historical time period pre-stored in the server . That is to say, after the image acquisition device collects the first detection image, it can perform real-time processing on the first detection image, for example, recognize the target in the first detection image in real time; it can also pre-store and then process, for example, The target recognition processing of the first detection image is performed when the processing tasks of the server are less, or the target recognition processing of the first detection image is performed according to the designated time of the operator.

S12: Control the movement of the orientation finder based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation finder incident on the target to be measured.

In one embodiment, the movement of the orientation instrument includes but is not limited to: adjusting the absolute position and pitch angle of the X-ray source in the orientation instrument, the sample holder and the detector in three-dimensional space, and adjusting the sample holder of the target to be measured in the orientation instrument pose on .

In one embodiment, the incident parameters include incident angle and incident position where the X-rays incident on the target to be measured.

S13: Obtain at least two sets of diffraction data by performing data detection during the incident parameter adjustment process.

In one embodiment, at least two sets of diffraction data are obtained by data detection before and after incident parameter adjustment, that is, data detection is performed before incident parameter adjustment to obtain a set of diffraction data, and data detection is performed after incident parameter adjustment to obtain another set of diffraction parameters .

S14: Analyzing and processing the two sets of diffraction data, and generating an image to be analyzed according to one set of diffraction data when the difference between the analysis results of the two sets of diffraction data satisfies a set condition.

In one embodiment, there is a standard value of the diffraction angle for the target to be measured, and the setting condition refers to satisfying three aspects at the same time: First, the difference between the diffraction angle and the standard value of the diffraction angle is small, and the small difference means that the diffraction angle The value of one digit before and after the decimal point is the same as the standard value of the diffraction angle; second: the value of the diffraction intensity is at least an order of magnitude different; third, the number of diffraction satellite peaks is more. Generate the image to be analyzed from the diffraction data satisfying the set conditions. In one embodiment, the diffraction data used to generate the image to be analyzed can be randomly selected from two groups of diffraction data. In another embodiment, the image to be analyzed is generated by using the diffraction data with a large value, so that the image to be analyzed is closer to an ideal state, so as to eliminate the influence of the background noise of the target to be measured by the experimental method and the operation method.

S15: Perform spot recognition and analysis processing on the image to be analyzed to obtain a data analysis result.

In one embodiment, the speckle identification is realized by counting the number of speckles in the speckle identification.

Through the above process, human intervention in the X-ray diffraction image analysis and processing process is reduced. The entire data processing process is carried out automatically, which breaks the limitation of human operation, enhances the accuracy of spot recognition, and is conducive to obtaining accurate crystal information of the target to be measured.

In one embodiment, before spot recognition and analysis processing of the image to be analyzed, the image to be analyzed is preprocessed, and the preprocessing includes but not limited to denoising and filtering the image to be analyzed by using a Gaussian filter model. The Gaussian filtering model is as follows:

k_max表示最大频率，/>

V表示尺度参数，μ表示方向参数，z＝(x，y)||z||＝(x²+y²)，x，y表示二维Gabor滤波器的坐标，i表示虚单位，r为引进的参数，用于控制Gabor滤波器的形状。in,

k _max indicates the maximum frequency, />

V represents the scale parameter, μ represents the direction parameter, z=(x, y)||z||=(x ² +y ² ), x, y represent the coordinates of the two-dimensional Gabor filter, i represents the imaginary unit, and r is Introduced parameters for controlling the shape of the Gabor filter.

The purpose of denoising and filtering the image to be analyzed is to remove the background noise. The background noise is caused by the interaction between the sample holder and other components or barriers and X-rays, and other interaction effects between the object to be measured and X-rays except the diffraction effect produced by the object to be measured on X-rays are displayed in the diffraction image The generated image background noise affects the correct identification of spots in the image to be analyzed.

Fig. 3 is a data processing method shown according to another embodiment. This method is applicable to another embodiment. Before spot recognition and analysis processing of the image to be analyzed, the image to be analyzed is preprocessed. The image is analyzed for denoising filtering. The X-ray crystal orientation instrument shown in Figure 1.

A data processing method 200 may include the following steps:

S21: Acquiring target data to be tested.

Among them, the target data to be measured includes detection angle, pose, diffraction data and displacement processing parameters.

S22: Control the movement of the orientation instrument based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation instrument and incident on the target to be measured.

Wherein, the incident parameters include the incident angle and incident position where the X-rays incident on the target to be measured.

Wherein, controlling the movement of the orientation instrument based on the target data to be measured includes at least one of the following:

S221: Adjusting the absolute positions of the X-ray source, the sample holder and the detector in the orientation instrument in three-dimensional space.

S222: Adjust the pitch angles of the X-ray source, the sample holder and the detector in the orientation instrument in three-dimensional space.

S223: Adjust the pose of the target to be measured on the sample holder in the orientation instrument.

S23: Obtain at least two sets of diffraction data by performing data detection during the incident parameter adjustment process, including:

Specifically, S231: Obtain an initial detection angle and an initial pose of the target to be measured from the data of the target to be measured, and obtain a set of diffraction data based on the initial detection angle and the initial pose of the target to be measured.

S232: Re-acquire data of the target to be measured after the incident parameters are adjusted.

S233: Obtain an updated detection angle and an updated pose of the target to be measured from the reacquired data of the target to be measured, and obtain another set of diffraction data based on the updated detection angle and the updated pose of the target to be measured.

S24: Preprocessing the diffraction data, the preprocessing process includes:

Specifically, S241: extracting a diffraction intensity parameter from the diffraction data, and extracting a shift processing parameter from the target data to be measured. Wherein, the shifting processing parameters include the shifting direction of the decimal point and the number of digits of shifting the decimal point.

S242: Perform decimal point shift processing on the diffraction intensity parameters based on the shift processing parameters to obtain preprocessed diffraction data.

S25: Analyzing and processing two sets of diffraction data, and generating an image to be analyzed according to one set of diffraction data when the difference between the analysis results of the two sets of diffraction data satisfies a set condition.

In one embodiment, the target to be measured is known, and the setting conditions refer to satisfying three aspects at the same time: First, the difference between the diffraction angle and the standard value of the diffraction angle is small, and the small difference means that the diffraction angle is before the decimal point. The value of one digit after the decimal point is the same as the standard value of the diffraction angle; second: the value obtained by taking the logarithm of the diffraction intensity to the base 10 is at least an order of magnitude different; third, the number of diffraction peaks is more. Generate the image to be analyzed from the diffraction data satisfying the set conditions.

Wherein, the generation of the image to be analyzed according to one set of diffraction data includes:

S251: Carry out image segmentation on the diffraction image formed by one set of diffraction data, and determine non-target areas and target areas in the diffraction image.

S252: Obtain an image to be analyzed including the target area from the diffraction image.

The non-target area is caused by the interaction between the sample holder and other components or barriers and X-rays, and other interaction effects between the target to be measured and X-rays except the diffraction effect produced by the target to be measured on X-rays are included in the diffraction image. The image background noise generated in the image affects the correct recognition of spots in the image to be analyzed.

S26: Perform spot recognition and analysis processing on the image to be analyzed to obtain a data analysis result.

Among them, performing spot recognition on the image to be analyzed includes:

S261: Perform grayscale processing on the image to be analyzed to obtain a grayscale image, including:

S2611: Determine the image color feature of the image to be analyzed, and perform image segmentation on the image to be analyzed based on the image color feature to obtain several image areas, each image area corresponding to an image color feature.

In this embodiment, image color features are expressed by grayscale values. The image to be analyzed is segmented based on the size of the gray value, and each image region corresponds to a gray value.

S2612: Using different image color features, perform grayscale processing on several image regions to obtain the grayscale image.

S262: Perform threshold statistics on the gray-scaled image to obtain a threshold statistical result, and determine a speckled area and a speckle-free area in the gray-scaled image based on the threshold statistical result.

S263: Perform spot recognition on the speckle area to obtain the spot recognition result.

S264: Screen the identified spots in the spot recognition results, and eliminate spots that do not meet the set threshold, to obtain a filtered spot recognition result.

In one embodiment, the threshold is set to a diffraction intensity equal to 100a.u arbitrary unit/or 200 counts per second (cps), and spots with a diffraction intensity less than 100a.u arbitrary unit/or 200 counts per second (cps) are eliminated.

In one embodiment, before spot recognition and analysis processing of the image to be analyzed, the image to be analyzed is preprocessed, and the preprocessing includes but not limited to denoising and filtering the image to be analyzed by using a Gaussian filter model. The Gaussian filtering model is as follows:

k_max表示最大频率，/>

V表示尺度参数，μ表示方向参数，z＝(x，y)||z||＝(x²+y²)，x，y表示二维Gabor滤波器的坐标，i表示虚单位，r为引进的参数，用于控制Gabor滤波器的形状。in,

k _max indicates the maximum frequency, />

V represents the scale parameter, μ represents the direction parameter, z=(x, y)||z||=(x ² +y ² ), x, y represent the coordinates of the two-dimensional Gabor filter, i represents the imaginary unit, and r is Introduced parameters for controlling the shape of the Gabor filter.

The purpose of denoising and filtering the image to be analyzed is to remove background noise. The background noise is caused by the interaction between the sample holder and other components or barriers and X-rays, and other interaction effects between the object to be measured and X-rays except the diffraction effect produced by the object to be measured on X-rays are displayed in the diffraction image The generated image background noise affects the correct identification of spots in the image to be analyzed.

In another embodiment, before spot recognition and analysis of the image to be analyzed, the image to be analyzed is preprocessed, and the preprocessing includes using algorithms such as Gaussian filter model, median filter, histogram homogenization and edge enhancement to process the image to be analyzed. Denoising filter processing.

Figure 4 is a data processing device shown according to another embodiment, the device 300 is applied to an X-ray crystal orientation instrument, including an acquisition module 31, an adjustment module 32, a diffraction data acquisition module 33, an image generation module 34 and an image recognition module 35.

Wherein, the obtaining module 31 is used for obtaining the target data to be measured.

The adjustment module 32 is used for controlling the movement of the direction finder based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the direction finder incident on the target to be measured.

The diffraction data acquisition module 33 is configured to obtain at least two sets of diffraction data by performing data detection during the incident parameter adjustment process.

The image generation module 34 is used to analyze and process the two sets of diffraction data, and generate an image to be analyzed according to one set of diffraction data when the difference between the analysis results of the two sets of diffraction data satisfies a set condition.

The image recognition module 35 is used to perform speckle recognition and analysis processing on the image to be analyzed to obtain data analysis results.

FIG. 5 shows an X-ray crystal orientation instrument according to another embodiment. The orientation instrument 400 includes a processor 41 and a memory 42 .

Wherein, the memory 42 stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, any one of the data processing methods described above is implemented.

The technical scheme provided by the invention reduces human intervention in the process of X-ray diffraction image analysis and processing. The entire data processing process is carried out automatically, which breaks the limitation of human operation, enhances the accuracy of spot recognition, and is conducive to obtaining accurate crystal information of the target to be tested.

The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the protection of the present invention. within range.

Claims (10)

1. a data processing method, applied to X-ray crystal orientation instrument, is characterized in that, described method comprises: Obtain the target data to be tested; Controlling the movement of the orientation instrument based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation instrument incident on the target to be measured; Obtain at least two sets of diffraction data by performing data detection during the incident parameter adjustment process; Analyzing and processing the two sets of diffraction data, when the difference between the analysis results of the two sets of diffraction data satisfies a set condition, generating an image to be analyzed according to one set of diffraction data; Spot recognition and analysis processing are performed on the image to be analyzed to obtain a data analysis result. 2. The data processing method according to claim 1, wherein controlling the motion of the orientation finder based on the target data to be measured comprises at least one of the following: Adjusting the absolute positions of the X-ray source, the sample holder and the detector in the orientation instrument in three-dimensional space; Adjust the pitch angle of the X-ray source, the sample holder and the detector in the three-dimensional space in the orientation instrument; Adjusting the pose of the target to be measured on the sample holder in the orientation instrument. 3. The data processing method according to claim 1, wherein said data detection is performed during said incident parameter adjustment process to obtain at least two groups of diffraction data, including: Obtaining an initial detection angle and an initial pose of the target to be measured from the data of the target to be measured, and obtaining a set of diffraction data based on the initial detection angle and the initial pose of the target to be measured; After the incident parameters are adjusted, reacquire the data of the target to be measured; From the newly acquired data of the target to be measured, an updated detection angle and an updated pose of the target to be measured are obtained, and another set of diffraction data is obtained based on the updated detection angle and the updated pose of the target to be measured. 4. The data processing method according to claim 1, wherein, before the analysis and processing of the two groups of diffraction data, the diffraction data is preprocessed, and the preprocessing comprises: Extracting a diffraction intensity parameter from the diffraction data, and extracting a shift processing parameter from the target data to be measured, the shift processing parameter includes a decimal point shift direction and a decimal point shift number; performing decimal point shift processing on the diffraction intensity parameter based on the shift processing parameters to obtain preprocessed diffraction data; The analysis and processing of the two groups of diffraction data includes: Analyze and process the two sets of diffraction data after preprocessing. 5. The data processing method according to claim 1, wherein said generating an image to be analyzed according to one set of diffraction data comprises: performing image segmentation on the diffraction image formed by one set of diffraction data, and determining the non-target area and the target area in the diffraction image; An image to be analyzed including the target area is obtained from the diffraction image. 6. The data processing method according to claim 1, wherein performing spot recognition on the image to be analyzed comprises: performing grayscale processing on the image to be analyzed to obtain a grayscale image; performing threshold statistics on the grayscaled image to obtain a threshold statistical result, and determining a speckled area and a non-spotted area in the grayscaled image based on the threshold statistical result; Spot recognition is performed on the speckled area to obtain the speckle recognition result. 7. The data processing method according to claim 6, wherein said spot recognition is carried out to said speckled region to obtain said spot recognition result, comprising: The identified spots in the spot recognition result are screened, and the spots that do not meet the set threshold are eliminated to obtain the filtered spot recognition result. 8. The data processing method according to claim 6, wherein the grayscale processing is performed on the image to be analyzed to obtain a grayscale image, comprising: Determining the image color feature of the image to be analyzed, and performing image segmentation on the image to be analyzed based on the image color feature to obtain several image areas, each image area corresponding to an image color feature; Using different image color features, grayscale processing is performed on several image regions to obtain the grayscale image. 9. A data processing device applied to an X-ray crystal orientation instrument, characterized in that the device comprises: An acquisition module, configured to acquire target data to be tested; An adjustment module, configured to control the movement of the orientation gauge based on the data of the target to be measured, so as to adjust the incident parameters of the X-rays emitted by the X-ray source in the orientation gauge incident on the target to be measured; A diffraction data acquisition module, configured to obtain at least two sets of diffraction data by performing data detection during the adjustment process of the incident parameters; An image generation module, configured to analyze and process the two sets of diffraction data, and generate an image to be analyzed according to one set of diffraction data when the difference between the analysis results of the two sets of diffraction data satisfies a set condition; The image recognition module is configured to perform speckle recognition and analysis processing on the image to be analyzed to obtain a data analysis result. 10. An X-ray crystal orientation instrument, characterized in that it comprises: processor; and A memory, where computer-readable instructions are stored on the memory, and when the computer-readable instructions are executed by the processor, the data processing method according to any one of claims 1 to 8 is realized.

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