CN116244131A - Server interface testing method and device, electronic equipment and medium - Google Patents

Abstract

The embodiment of the application discloses a server interface testing method, a device, electronic equipment and a medium, which are applied to the technical field of servers. The method comprises the following steps: after receiving a test instruction, acquiring basic parameters indicated by the test instruction; obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links; performing curve fitting on the historical test result to obtain a curve fitting result; controlling the oscilloscope to test the target interface link to obtain target test data; predicting predicted test data of the current link test based on the curve fitting result; and when the comparison gap between the predicted test data and the target test data meets the test requirement, storing the target test data into the database.

Description

Server interface testing method, device, electronic equipment and medium

technical field

The invention relates to the technical field of servers, in particular to a server interface testing method, device, electronic equipment and media.

Background technique

With the rapid development of cloud computing and big data industries, the scale of server clusters is getting larger and larger. In order to ensure the stable operation of the server and the normal operation of each interface and each component of the server, measuring whether the signal integrity of each interface of the server meets the standard has become an indispensable and important process in the server development process.

Server interface testing generally includes verification of signals in both directions, namely receiving and sending. Among them, the transmission direction test generally needs to rely on high-speed oscilloscopes, interface supporting test fixtures and cables, and the physical connection is very complicated. At the same time, there are many types of interfaces and the number of interfaces of the same type. In the existing server interface test, in order to obtain all link test results of the server interface, all interfaces need to be tested. If the test resources are not enough, it is necessary to delete the tested links according to the simulation results, and only test the links with higher risks, which makes the test coverage insufficient and the overall accuracy is questionable.

Contents of the invention

In order to solve the above problems, embodiments of the present application provide a server interface testing method, device, electronic equipment, and media.

Some embodiments of the present application disclose a server interface testing method, the method comprising:

After receiving the test instruction, obtain the basic parameters indicated by the test instruction;

Obtain historical test results matching the basic parameters from the database; wherein, the database pre-stores test results obtained by testing various interface links;

Carry out curve fitting to described historical test result, obtain curve fitting result;

Control the oscilloscope to test the target interface link to obtain the target test data;

Predicting the predicted test data of this link test based on the curve fitting result;

When the comparison gap between the predicted test data and the target test data reaches the test requirement, the target test data is stored in the database.

Optionally, after receiving the test instruction, acquiring the basic parameters indicated by the test instruction includes:

After receiving the test instruction, configure different test parameters for the target interface link as the basic parameters; wherein, the test parameters include the tested mainboard plate, mainboard trace length, external cable wire, cable length, turn At least one of the riser board material and riser card routing length.

Optionally, the obtaining historical test results matching the basic parameters from the database includes:

Use the basic parameters and their corresponding attributes as specific key-value conditions;

Get matching test results for the same key-value condition in the database.

Optionally, performing curve fitting on the historical test results to obtain a curve fitting result includes:

A curve fitting algorithm is used to perform curve fitting on the historical test results by using discrete points to obtain a curve fitting result.

Optionally, before the control oscilloscope tests the target interface link to obtain target test data, the method includes:

Set communication parameters corresponding to the physical connection between the oscilloscope and the target interface link; wherein, the communication parameters include at least one of an IP address and a port number.

Optionally, after storing the target test data in the database when the comparison gap between the predicted test data and the target test data reaches the test requirement, the method further includes:

Using a preset statistical analysis tool to analyze the target test results to obtain server performance indicators;

Recording the server performance index to a system log; wherein, the server performance index includes response time, throughput, CPU utilization, and network bandwidth.

Optionally, after storing the target test data in the database when the comparison gap between the predicted test data and the target test data reaches the test requirement, the method further includes:

Performing visual processing on the target test data and comparison results to obtain visual processing results; wherein, the visual processing includes creating charts and reports;

Send the visualization processing result to the client interface.

Some embodiments of the present application provide a server interface testing device, the device comprising:

The transmission module is used to obtain the basic parameters indicated by the test instructions after receiving the test instructions; obtain the historical test results matching the basic parameters from the database; The test results obtained by testing the interface link;

A processing module, configured to perform curve fitting on the historical test results to obtain a curve fitting result; control the oscilloscope to test the target interface link to obtain target test data; predict the link test result based on the curve fitting result predictive test data;

The storage module is used for storing the target test data into the database when the comparison gap between the predicted test data and the target test data reaches the test requirement.

Optionally, the transmission module is also used for:

After receiving the test instruction, configure different test parameters for the target interface link as the basic parameters; wherein, the test parameters include the tested mainboard plate, mainboard trace length, external cable wire, cable length, turn At least one of the riser board material and riser card routing length.

Optionally, the transmission module is also used for:

Use the basic parameters and their corresponding attributes as specific key-value conditions;

Get matching test results for the same key-value condition in the database.

Optionally, the processing module is also used for:

The discrete points are used to perform a curve fitting algorithm to perform curve fitting on the matching test results to obtain a curve fitting result.

Optionally, the processing module is also used for:

Set communication parameters corresponding to the physical connection between the oscilloscope and the target interface link; wherein, the communication parameters include at least one of an IP address and a port number.

Optionally, the processing module is also used for:

Using a preset statistical analysis tool to analyze the target test results to obtain server performance indicators;

Recording the server performance index to a system log; wherein, the server performance index includes response time, throughput, CPU utilization, and network bandwidth.

Optionally, the processing module is also used for:

Performing visual processing on the target test data and comparison results to obtain visual processing results; wherein, the visual processing includes creating charts and reports;

Send the visualization processing result to the client interface.

The embodiment of the present application also provides an electronic device, including a memory, a processor, and a computer program stored on the memory and operable on the processor. When the processor executes the program, it implements any one of the above-mentioned server The steps of the interface test method.

The embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of any one of the server interface testing methods described above are implemented.

The server interface testing method, system, electronic equipment, and medium provided in the embodiments of the present application obtain the specified basic parameters after receiving the test instructions, filter out the historical test results that match the parameters, and perform curve fitting on these results. Together, more accurate predictive test data can be obtained. By comparing these predicted data with the target test data, it is possible to more quickly and accurately evaluate whether the test results meet the requirements. It can effectively balance the relationship between the number of tests and data accuracy, improve test coverage and ensure accuracy, thereby reducing the time and labor costs required for testing. In addition, the model can also use historical test results to make predictions, reducing the testing workload, while ensuring the accuracy of judgment, and improving testing efficiency and reliability. In addition, this method also saves the target test data meeting the requirements into the database to facilitate subsequent testing and analysis.

The above description is only an overview of the technical solution of the present application. In order to better understand the technical means of the present application, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of the present application more obvious and understandable , the following specifically cites the specific implementation manner of the present application.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are some embodiments of the present application. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 schematically shows a schematic flowchart of a server interface testing method provided by some embodiments of the present application;

FIG. 2 schematically shows a schematic flowchart of another server interface testing method provided by some embodiments of the present application;

FIG. 3 schematically shows a system composition diagram of another server interface testing method provided by some embodiments of the present application;

Fig. 4 schematically shows a schematic diagram of a tested signal composition module of another server interface testing method provided by some embodiments of the present application;

Fig. 5 schematically shows a schematic diagram of a condition parameter table of another server interface testing method provided by some embodiments of the present application;

FIG. 6 schematically shows a schematic workflow diagram of another server interface testing method provided by some embodiments of the present application;

Fig. 7 schematically shows a schematic diagram of a fitting curve of another server interface testing method provided by some embodiments of the present application;

Fig. 8 schematically shows a schematic structural diagram of a server interface testing device provided by some embodiments of the present application;

Figure 9 schematically shows a block diagram of a computing processing device for performing a method according to some embodiments of the present application;

Fig. 10 schematically shows a storage unit for holding or carrying program codes for implementing methods according to some embodiments of the present application.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

Fig. 1 schematically shows a schematic flowchart of a server interface testing method provided by some embodiments of the present application, the method comprising:

Step 101, after receiving a test instruction, obtain the basic parameters indicated by the test instruction.

In the embodiment of the present application, "test instruction" refers to an instruction for server interface testing, which includes the target interface to be tested and related parameters required for the test. After receiving the test instruction, the model needs to extract the "basic parameters" that need to be used for testing according to the information in the instruction, that is, the key attributes used to identify different interface links, such as external cables and wires, length, etc. This is a prerequisite for subsequent testing and data processing.

Step 102, obtaining historical test results matching the basic parameters from the database; wherein, the database pre-stores test results obtained from testing various interface links.

In the embodiment of the present application, the matching historical test results are searched in the database according to the specified basic parameters, and these historical test results are pre-stored in the database. Exemplarily, if the test instruction requires to test the response time of a certain interface, when searching for matching historical test results in the database, it is necessary to specify the name of the interface and the response time as basic parameters. If the database already contains test results of previous response time tests for this interface, then these matching historical test results can be obtained.

Step 103, performing curve fitting on the historical test results to obtain a curve fitting result.

In the embodiment of the present application, for the historical test results obtained from the database, curve fitting processing is required to obtain accurate curve fitting results. Curve fitting refers to performing statistical analysis on a set of discrete data points and finding a mathematical model that can represent this set of data points. Curve fitting is often used to perform operations such as smoothing, predicting, and classifying data. The purpose of curve fitting is to predict the trend and data distribution of the current test results, so as to provide a reference for subsequent test work. Common curve fitting methods include least squares method, polynomial fitting, exponential fitting and so on. Exemplarily, if we want to test the transmission rate of a certain interface link, we first need to obtain the previous historical test results of the interface link from the database. Assume that we have obtained the first ten test results of the interface link, and each test result includes two attributes of test time and transmission rate. We can use the curve fitting method to process these test results to obtain a mathematical model that can represent the changing trend of the transmission rate. For example, we can use the least squares method to fit a quadratic function curve that is closest to the test data. In this way, we get an accurate curve fitting result, which can provide a reference for subsequent testing work.

Step 104, controlling the oscilloscope to test the target interface link to obtain target test data.

In this embodiment of the present application, the control oscilloscope is an instrument for measuring electronic signals, and is used for detecting and measuring electronic signals in an interface link. The control oscilloscope will send a test signal to the target interface chain according to the test command, and receive the returned signal data. The oscilloscope converts the signal data into digital signals and stores them in the computer for subsequent data processing and analysis. Exemplarily, if the test command requires testing the transmission rate of a network interface, the control oscilloscope will send a test signal to the network interface, then receive the data transmitted by the interface, and store it as a digital signal. Digital signals can be represented as waveform diagrams or other forms for subsequent data processing and analysis.

Step 105, predicting the predicted test data of this link test based on the curve fitting result.

In the embodiment of the present application, the curve fitting results obtained based on the historical test results can be used to predict the predicted test data of this link test. Specifically, a curve model can be obtained through a curve fitting algorithm, which can describe the changing trend of historical test results. Then, use this curve model to predict the future test data, so as to obtain the predicted test data of this link test. For example, assuming that the historical test results show that the amplitude of the test results increases linearly with the increase of the length of the external cable, you can use the curve fitting algorithm to obtain a straight line as a model, and then predict the Amplitude change data for this test.

Step 106, when the comparison gap between the predicted test data and the target test data meets the test requirement, store the target test data into the database.

In the embodiment of the present application, by comparing the predicted test data with the target test data, it is judged whether the gap between them meets the test requirements, and if so, the target test data is stored in the database. The purpose of this is to predict the target test data by predicting the test data during the test, thereby reducing the test time and labor costs, while ensuring the accuracy of the test results. For example, when testing a certain interface, the predicted test data is 100ms, the target test data is 98ms, and the test requirement allows an error of 2ms, so the comparison gap between the two is smaller than the test requirement, and the target test data will be stored in database as historical test results. When testing a certain interface, the predicted test data is 100ms, and the target test data is 105ms. The comparison gap between the two is greater than the test requirement, which means that there is a large gap between the test result and the expected result, which exceeds the test limit. Require. This may indicate a problem or malfunction and further investigation and analysis is required to determine the cause and take necessary actions to correct the problem. In addition, for example, if the design stipulates that only test results that meet specific standards will be stored in the database, the target test data may not be stored in the database; on the contrary, if the design specifies that all test results will be is stored in the database, the target test data will still be stored in the database. Indicates possible causes as error results.

In the embodiment of the present application, after receiving the test instruction, by obtaining the specified basic parameters, filtering out the historical test results matching the parameters, and performing curve fitting on these results, more accurate predictive test data can be obtained. By comparing these predicted data with the target test data, it is possible to more quickly and accurately evaluate whether the test results meet the requirements. It can effectively balance the relationship between the number of tests and data accuracy, improve test coverage and ensure accuracy, thereby reducing the time and labor costs required for testing. In addition, the model can also use historical test results to make predictions, reducing the testing workload, while ensuring the accuracy of judgment, and improving testing efficiency and reliability. In addition, this method also saves the target test data meeting the requirements into the database to facilitate subsequent testing and analysis.

Optionally, the step 101 includes: after receiving the test instruction, configuring different test parameters for the target interface link as the basic parameters; wherein, the test parameters include the tested main board plate, main board trace length , at least one of external cable wires, cable length, riser board material, and riser card routing length.

In the embodiment of this application, after receiving the test instruction, the server needs to test the target interface link according to the test parameters indicated in the instruction. , cable length, board material of the riser card, and at least one of the cable length of the riser card. Exemplarily, if the test instruction indicates that a motherboard needs to be tested, the server will obtain parameters such as board material and trace length of the motherboard to be tested according to the test instruction, and use these parameters as basic parameters to test the target interface link. In addition, if the test instruction indicates that an external device needs to be tested, the server will obtain parameters such as the cable type and length of the external device, and use these parameters as basic parameters to test the target interface link.

In the embodiment of this application, by configuring different test parameters as basic parameters, the stability and reliability of the interface link can be tested more comprehensively by testing different test parameters while keeping the interface link unchanged . For example, when testing different cable lengths, you can observe the performance of the link at different lengths, so as to find out the impact of link length on link performance, which helps to optimize and improve the link. This improves test accuracy and coverage, which in turn increases product stability and reliability.

Optionally, as shown in Figure 2, step 102 includes:

Step 201, using the basic parameters and their corresponding attributes as specific key-value conditions.

The basic parameter refers to at least one of the different test parameters (for example, one of the board material under test, the length of the main board trace, the external cable wire, the length of the cable, the board material of the riser card, the length of the trace of the riser card or multiple). The attribute refers to the specific values of different test parameters. For example, the tested motherboard board can be FR4, RO4350B, RO4003C, etc. Using basic parameters and their corresponding attributes as specific key-value conditions refers to combining different test parameters and their attributes as a unique key value for searching the corresponding historical test results in the database. Exemplarily, if the test instruction requires testing parameters such as FR4 for the main board to be tested, 20cm for the wiring length of the main board, and PI for the riser board, then these parameters and their attributes (FR4, 20cm, PI) are combined together, as a specific key-value condition. By matching these key-value conditions, historical test results matching these parameters and their attributes can be retrieved from the database.

Step 202, obtaining matching test results of the same key-value condition in the database.

In the embodiment of this application, obtaining the matching test results of the same key-value conditions in the database refers to retrieving from the database the key-value conditions that match the key-value conditions required by the current test according to the key-value conditions and corresponding test results obtained in the previous test. Historical test results. Exemplarily, during the testing process of an electronic product, the tester needs to test the connection performance of different models of motherboards and riser cards. In order to obtain matching test results, testers need to set test parameters such as board material of the main board under test, main board trace length, external cable wire, cable length, riser card board material, riser card trace length, etc. before each test as a key-value condition. When testers need to obtain test results under the same conditions that have been tested before in the subsequent test process, the system will search in the database according to these key-value conditions to obtain matching historical test results.

In the embodiment of the present application, using specific key-value conditions to obtain matching test results with the same key-value conditions in the database can help testers quickly obtain historical test results similar to current test parameters. It is possible to understand the performance of previous test results and the trend of data changes more quickly, and conduct a more targeted test for this test. It can avoid repeated testing of test parameter combinations that have been covered, and improve test efficiency. It can provide more comprehensive and accurate test data for product development, so as to better optimize product design and performance.

Optionally, step 103 includes: performing curve fitting on the historical test results with a curve fitting algorithm using discrete points to obtain a curve fitting result.

In the embodiment of the present application, the curve fitting algorithm using discrete points is a kind of curve fitting method, which performs mathematical model fitting through the coordinate values of discrete points. A discrete point refers to a set of coordinate values, such as (x1,y1),(x2,y2),...,(xn,yn). The fitting algorithm finds the optimal mathematical model so that the model can pass through this set of discrete points, thereby predicting the values of other data points. Exemplarily, suppose there is a function y=f(x), we need to fit this function through a set of discrete points (x1,y1),(x2,y2),...,(xn,yn). If we assume that f(x) is a quadratic function, then the quadratic fitting algorithm can be used to calculate the coefficients a, b, and c of the function to obtain the curve fitting result.

In the embodiment of the present application, the curve fitting result can be obtained according to the historical test data, and used to predict the current test data, thereby reducing the workload of the actual test. Compared with the traditional test method, using the curve fitting algorithm can predict the test data more accurately, and can cover various conditions of the interface link more efficiently during the test.

Optionally, before step 104, the method includes: setting communication parameters corresponding to the physical connection between the oscilloscope and the target interface link; wherein the communication parameters include at least one of an IP address and a port number.

In the embodiment of the present application, when performing the server interface test, it is necessary to physically connect the oscilloscope to the target interface link, and set corresponding communication parameters so that data transmission and communication can be performed between the two. Exemplarily, if an interface test of a network server is to be performed, it is necessary to connect the oscilloscope to the server, and set a corresponding IP address and port number, so that the oscilloscope can send a test request to the server and receive a test result from the server. Usually, the communication parameter setting between the oscilloscope and the target interface link is carried out according to the specific test requirements and environmental conditions.

In the embodiment of the present application, on the premise of ensuring that the physical connection between the oscilloscope and the target interface link is normal, a communication connection is established by setting appropriate communication parameters to realize data transmission and reception. This is a very important step in the entire testing process to ensure the reliability and accuracy of the data. For example, by setting the correct IP address and port number, the oscilloscope can send correct test instructions to the target interface link and receive target test data, thereby ensuring the accuracy of test results.

Optionally, after step 106, the method further includes:

Step A1, using a preset statistical analysis tool to analyze the target test results to obtain server performance indicators.

In the embodiment of the present application, the target test result can be analyzed by using a preset statistical analysis tool, and the server performance index can be extracted therefrom. These statistical analysis tools may include various types of software and algorithms for calculating and summarizing key metrics of server performance, such as response time, throughput, CPU usage, memory usage, and more. Exemplarily, when testing the performance of a web server, the obtained target test results include data on response time and throughput when different users access the server concurrently, these data can be analyzed by a preset statistical analysis tool, and Key performance metrics are extracted from it, such as maximum response time, average response time, peak throughput, and more. Through the analysis and comparison of these indicators, the performance of the server can be evaluated, and feedback can be provided to guide further optimization and improvement.

Step A2, recording the server performance index to a system log; wherein, the server performance index includes response time, throughput, CPU utilization, and network bandwidth.

In the embodiment of the present application, recording the server performance index to the system log is to record the obtained performance index in the log file of the system, so as to facilitate subsequent viewing, analysis and processing. These performance indicators include but are not limited to response time, throughput, CPU utilization, network bandwidth, etc. Exemplarily, it is assumed that a certain system needs to test the performance of its server and record performance indicators. During the testing process, the system will collect different performance index data, such as server response time, throughput, CPU utilization and network bandwidth data within a certain period of time. These data will be recorded in the log files of the system, so that system administrators or developers can analyze and process these data, so as to evaluate and improve the performance of the system.

In the embodiment of the present application, parsing and recording the performance indicators of the server can help diagnose possible performance problems in the system, analyze and optimize the performance of the system, and improve the stability and performance of the system. At the same time, recording these performance indicators is also helpful to understand the performance of the system under different load conditions and provide reference for future system design. Exemplarily, if a preset statistical analysis tool is used to analyze the response time of the server, it may be found that the response time of the system is relatively long in some cases, and the problem can be further analyzed and optimized. Another example is that recording the CPU utilization of the system can help understand the load of the system and determine whether expansion or optimization is required.

Optionally, after step 106, the method further includes:

Step S1, performing visual processing on the target test data and comparison results to obtain a visual processing result; wherein, the visual processing includes creating charts and reports.

In the embodiment of the present application, the obtained target test data and comparison results are visualized so as to observe the test results intuitively. This process often involves the creation of charts and reports, which can be achieved using a variety of data visualization tools. For example, using the Matplotlib library in Python or Tableau software, various types of charts and reports can be created, such as line charts, column charts, scatter plots, etc. These visualization tools can effectively help testers understand test results and quickly discover potential problems.

Step S2, sending the visualization processing result to the client interface.

In this embodiment of the present application, sending the visualization processing results to the client interface refers to displaying the processed charts, reports, etc. on the client interface used by the user for viewing, analysis and operation by the user. This can be done by transferring the results to the client in the form of images, files, etc., or by presenting them using web pages or applications, etc. For example, a network monitoring system collects network data, processes and generates reports, and sends the reports to the client in the form of charts and tables, and the client displays these results in the form of web pages, and users can access the web pages through browsers to view data. viewing and analysis.

In the embodiment of the present application, the test results are presented to the user through visual processing, which helps the user to understand the test results and performance more intuitively, so as to better evaluate the performance and bottleneck of the system. At the same time, the processing results are sent to the client interface, so that users can view the test results conveniently, which improves the ease of use and efficiency of the system, and has a good effect.

As shown in Figure 3, in the embodiment of this application, the control module is composed of a control computer and human-computer interaction software, which are used to issue operation instructions, control the oscilloscope, save test data, and analyze data. It includes database and data analysis module. Database: The data sources in the database are various test results. The more test results are accumulated, the more accurate the test judgment will be. All test results are entered into the database after being judged as part of the subsequent test judgment criteria. Data analysis module: use various parameters that affect the test results as screening conditions, and use the test results in the database as the test standard to judge the new data received by the database. Test module: mainly composed of an oscilloscope, which cooperates with the human-computer interaction interface of the console to realize the automatic collection of test data by the oscilloscope and save it to the corresponding database.

As shown in FIG. 4 , the components of the signal to be tested include a main board, an adapter card, cables and corresponding parameters. Main board parameters include board material and length; riser card parameters include board material and length; cable parameters include wire material and length.

As shown in Figure 5, the conditional parameters mainly include: the board material to be tested, the length of the main board wiring, the external cable wire, the length of the cable, the board material of the adapter card, and the length of the wiring of the adapter card. The above are the main parameters that currently affect the test results. According to the accumulation of test data, other key influencing factors may also be found, and parameter definitions can be added at any time. The variable distinguishing key values include Key1: the board material of the main board under test, Key2: the board material of the adapter card, and Key3: the external cable wire material. The corresponding parameters of Key1/Key2/Key3 are their corresponding lengths. The test result analysis uses each key-value combination as a filter condition to filter out the test results of different wiring or cable lengths.

As shown in FIG. 6 , in the embodiment of the present application, for example, S1 starts the test and opens the human-computer interaction interface in the control module.

S2, configure the basic parameters of the link under test in the interface for saving the test results in the database.

S3, after the parameter setting is completed, the test results of the same key value conditions in the database are automatically obtained, and the background performs curve fitting on these test results to obtain the basic test reference standard. Since the accuracy of the fitting curve is related to the amount of test data, with the increase of the amount of data in the database, the accuracy of the curve is getting higher and higher, and the corresponding judgment standard is getting more and more accurate. As shown in Figure 7.

则测试结果PASS；如果/>

则测试结果FAIL。Among them, when fitting discrete data, all sample points are fitted with a 3-degree polynomial curve to obtain the relationship y(x)=a*x ³ +b*x ² +c*x+d, and the current test results (X, Y ) error Δe=|Yy(X)|, according to engineering error 3% as the evaluation standard, if

Then the test result is PASS; if />

Then the test result is FAIL.

S4, controlling the oscilloscope to collect and save test data.

S5, judging the test result according to the judging method of S3.

S6, saving data.

S7, the test is completed.

Through the accumulation of the above test data, the fitting curve is getting closer to the ideal value. At the same time, because the test inevitably has objective errors, with the accumulation of data, the direction of the test results under specific conditions can be judged, combined with the simulation theoretical value, the results of some links can be indirectly judged, so as to reduce the actual measurement and achieve the purpose of improving efficiency and saving costs .

As shown in Figure 8, some embodiments of the present application provide a server interface testing device 30, the device 30 comprising:

The transmission module 301 is configured to obtain the basic parameters indicated by the test instructions after receiving the test instructions; obtain historical test results matching the basic parameters from the database; The test results obtained by testing the interface link;

The processing module 302 is used to perform curve fitting on the historical test results to obtain a curve fitting result; control the oscilloscope to test the target interface link to obtain target test data; predict this link test based on the curve fitting result predictive test data;

The storage module 303 is configured to store the target test data into the database when the comparison gap between the predicted test data and the target test data reaches the test requirement.

Optionally, the transmission module 301 is also used for:

After receiving the test instruction, configure different test parameters for the target interface link as the basic parameters; wherein, the test parameters include the tested mainboard plate, mainboard trace length, external cable wire, cable length, turn At least one of the riser board material and riser card routing length.

Optionally, the transmission module 301 is also used for:

Use the basic parameters and their corresponding attributes as specific key-value conditions;

Get matching test results for the same key-value condition in the database.

Optionally, the processing module 302 is further configured to:

The discrete points are used to perform a curve fitting algorithm to perform curve fitting on the matching test results to obtain a curve fitting result.

Optionally, the processing module 302 is further configured to:

Set communication parameters corresponding to the physical connection between the oscilloscope and the target interface link; wherein, the communication parameters include at least one of an IP address and a port number.

Optionally, the processing module 302 is further configured to:

Using a preset statistical analysis tool to analyze the target test results to obtain server performance indicators;

Recording the server performance index to a system log; wherein, the server performance index includes response time, throughput, CPU utilization, and network bandwidth.

Optionally, the processing module 302 is further configured to:

Performing visual processing on the target test data and comparison results to obtain visual processing results; wherein, the visual processing includes creating charts and reports;

Send the visualization processing result to the client interface.

In the embodiment of the present application, after receiving the test instruction, the designated basic parameters are obtained, the historical test results matching the parameters are filtered out, and curve fitting is performed on these results, so that more accurate predictive test data can be obtained. By comparing these predicted data with the target test data, it is possible to more quickly and accurately evaluate whether the test results meet the requirements. It can effectively balance the relationship between the number of tests and data accuracy, improve test coverage and ensure accuracy, thereby reducing the time and labor costs required for testing. In addition, the model can also use historical test results to make predictions, reducing the testing workload, while ensuring the accuracy of judgment, and improving testing efficiency and reliability. In addition, this method also saves the target test data meeting the requirements into the database to facilitate subsequent testing and analysis.

The device embodiments described above are only illustrative, and the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in One place, or it can be distributed to multiple network elements. Part or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. It can be understood and implemented by those skilled in the art without any creative efforts.

The various component embodiments of the present application may be realized in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art should understand that a microprocessor or a digital signal processor (DSP) may be used in practice to implement some or all functions of some or all components in the computing processing device according to the embodiments of the present application. The present application can also be implemented as an apparatus or apparatus program (eg, computer program and computer program product) for performing a part or all of the methods described herein. Such a program implementing the present application may be stored on a non-transitory computer-readable medium, or may be in the form of one or more signals. Such a signal may be downloaded from an Internet site, or provided on a carrier signal, or provided in any other form.

For example, FIG. 9 illustrates a computing processing device that may implement methods according to the present application. The computing processing device conventionally includes a processor 410 and a computer program product in the form of memory 420 or non-transitory computer readable media. Memory 420 may be electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read Only Memory), EPROM, hard disk, or ROM. The memory 420 has a storage space 430 for program code 431 for performing any method step in the method described above. For example, the storage space 430 for program codes may include respective program codes 431 for respectively implementing various steps in the above methods. These program codes can be read from or written into one or more computer program products. These computer program products comprise program code carriers such as hard disks, compact disks (CDs), memory cards or floppy disks. Such a computer program product is typically a portable or fixed storage unit as described with reference to FIG. 10 . The storage unit may have storage segments, storage spaces, etc. arranged similarly to the memory 420 in the computing processing device of FIG. 9 . The program code can eg be compressed in a suitable form. Typically, the storage unit includes computer readable code 431', i.e. code readable by, for example, a processor such as 410, which code, when executed by a computing processing device, causes the computing processing device to perform the above-described methods. each step.

It should be understood that although the various steps in the flow chart of the accompanying drawings are displayed sequentially according to the arrows, these steps are not necessarily executed sequentially in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some of the steps in the flowcharts of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages may not necessarily be executed at the same time, but may be executed at different times, and the order of execution is also It is not necessarily performed sequentially, but may be performed alternately or alternately with at least a part of other steps or sub-steps or stages of other steps.

Reference herein to "one embodiment," "an embodiment," or "one or more embodiments" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Additionally, please note that examples of the word "in one embodiment" herein do not necessarily all refer to the same embodiment.

In the description provided herein, numerous specific details are set forth. However, it is understood that the embodiments of the application may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure the understanding of this description.

In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application can be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In a unit claim enumerating several means, several of these means can be embodied by one and the same item of hardware. The use of the words first, second, and third, etc. does not indicate any order. These words can be interpreted as names.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, rather than limiting them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: it can still Modifications are made to the technical solutions described in the foregoing embodiments, or equivalent replacements are made to some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present application.

Claims (10)

1. A method for testing a server interface, the method comprising:

after receiving a test instruction, acquiring basic parameters indicated by the test instruction;

obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links;

performing curve fitting on the historical test result to obtain a curve fitting result;

controlling the oscilloscope to test the target interface link to obtain target test data;

predicting predicted test data of the current link test based on the curve fitting result;

and when the comparison gap between the predicted test data and the target test data meets the test requirement, storing the target test data into the database.

2. The method according to claim 1, wherein after receiving the test instruction, obtaining the basic parameters indicated by the test instruction includes:

after receiving the test instruction, configuring different test parameters for the target interface link as the basic parameters; the test parameters comprise at least one of a tested main board plate, a main board wiring length, an external cable wire, a cable length, a transfer card plate and a transfer card wiring length.

3. The method of claim 1, wherein the retrieving from a database historical test results that match the base parameter comprises:

using the basic parameters and the corresponding attributes thereof as specific key value conditions;

and obtaining a matching test result of the same key value condition in the database.

4. The method of claim 1, wherein curve fitting the historical test results to obtain curve fitting results comprises:

and performing curve fitting on the historical test result by using a discrete point curve fitting algorithm to obtain a curve fitting result.

5. The method of claim 1, wherein prior to the control oscilloscope testing the target interface link for target test data, the method comprises:

setting corresponding communication parameters of physical connection between the oscilloscope and the target interface link; wherein the communication parameters include at least one of an IP address and a port number.

6. The method of claim 1, wherein after storing the target test data in the database when the comparison gap between the predicted test data and the target test data meets a test requirement, the method further comprises:

Analyzing the target test result by using a preset statistical analysis tool to obtain a server performance index;

recording the server performance index to a system log; wherein the server performance index comprises response time, throughput, CPU utilization and network bandwidth.

7. The method of claim 1, wherein after storing the target test data in the database when the comparison gap between the predicted test data and the target test data meets a test requirement, the method further comprises:

performing visual processing on the target test data and the comparison result to obtain a visual processing result; wherein the visualization process includes creating a chart, report;

and sending the visualization processing result to a client interface.

8. A server interface testing apparatus, the apparatus comprising:

the transmission module is used for acquiring basic parameters indicated by the test instruction after receiving the test instruction; obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links;

The processing module is used for performing curve fitting on the historical test results to obtain curve fitting results; controlling the oscilloscope to test the target interface link to obtain target test data; predicting predicted test data of the current link test based on the curve fitting result;

and the storage module is used for storing the target test data into the database when the comparison gap between the predicted test data and the target test data meets the test requirement.

9. An electronic device, the device comprising a processor and a memory:

the memory is used for storing a computer program;

the processor is configured to perform the server interface testing method of any one of claims 1-7 according to the computer program.

10. A computer readable storage medium, characterized in that the computer readable storage medium is for storing a computer program for executing the server interface testing method of any one of claims 1-7.

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