CN116222358A - Measuring part and automatic replacement system thereof - Google Patents
Measuring part and automatic replacement system thereof Download PDFInfo
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- CN116222358A CN116222358A CN202310358574.5A CN202310358574A CN116222358A CN 116222358 A CN116222358 A CN 116222358A CN 202310358574 A CN202310358574 A CN 202310358574A CN 116222358 A CN116222358 A CN 116222358A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
- G01B7/012—Contact-making feeler heads therefor
- G01B7/016—Constructional details of contacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
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- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
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Abstract
Description
技术领域technical field
本公开大体涉及智能测量设备领域,具体涉及一种测量部件及其自动更换系统。The present disclosure generally relates to the field of intelligent measuring equipment, and in particular to a measuring component and an automatic replacement system thereof.
背景技术Background technique
在工业生产中,为了能够生产符合设计需要的产品,对生产中的各个零部件或者产品(待测物体)的尺寸、外形和位置等多个参数都需要测量设备进行量测而获得。而随着科技进步,测量设备也越来越智能化,不仅能够精确获得待测物体的尺寸、外形和位置等多个参数,还能够适应产品需求调节测量设备自身进行量测,例如,三坐标测量机可以通过调节测头实现对待测物体的尺寸和外形的量测,同时根据不同的待测物体可对自身的测量部件(如测量探头)进行更换。In industrial production, in order to produce products that meet the design requirements, multiple parameters such as the size, shape and position of each component or product (object to be measured) in production need to be measured by measuring equipment. With the advancement of science and technology, measuring equipment is becoming more and more intelligent, not only can accurately obtain multiple parameters such as the size, shape and position of the object to be measured, but also can adjust the measuring equipment itself to measure according to product needs, for example, three coordinates The measuring machine can measure the size and shape of the object to be measured by adjusting the probe, and at the same time, it can replace its own measuring parts (such as the measuring probe) according to different objects to be measured.
在接触式(即电子开关触发的测量方式)的测量设备中,例如三坐标测量机,通过从原点移动测量探头到待测物体的表面,在测量探头接触待测物体的表面时发送触发信号,此时测量设备可获得当前测量探头相对于原点的坐标,通过多次在待测物体的表面重复前述操作获得多个坐标值,由此再计算出待测物体的具体尺寸或建模获得外形,因此,接触式测量探头大多采用类似常闭式的电子开关作为触发部件。目前,较为智能的测量设备通常为了提高测量探头的安装精度来保证原有的测量精度,在测量探头进行更换时通常配备了测量探头的自动更换装置或系统。然而,由于测量探头的工作机理类似常闭式的电子开关,在测量探头进行更换时,测量探头与安装测量探头的部位断开也会被测量系统错误地认为测量探头在进行探测,进而可能会导致测量错误或系统崩溃。现有技术中,通常采用软件控制方式,即在测量系统和自动更换系统中增加优化算法,来解决该问题,例如专利CN109313019A中公开了一种用于识别并确认触针的CMM(即三坐标测量机)设备,在更换测量探头时执行一定指令或准则(例如使测量探头断电或被认为处于断电状态)使安装适当测量探头的确认被内置到CMM测量过程的自动化部分,从而确保执行确认步骤,并且结果正确。In the measuring equipment of the contact type (that is, the measurement method triggered by the electronic switch), such as a coordinate measuring machine, by moving the measuring probe from the origin to the surface of the object to be measured, a trigger signal is sent when the measuring probe touches the surface of the object to be measured, At this time, the measuring equipment can obtain the coordinates of the current measuring probe relative to the origin, and obtain multiple coordinate values by repeating the above-mentioned operations on the surface of the object to be measured multiple times, and then calculate the specific size of the object to be measured or obtain the shape by modeling. Therefore, most of the contact measuring probes use a normally closed electronic switch as the trigger component. At present, relatively intelligent measuring equipment is usually equipped with an automatic replacement device or system for measuring probes when the measuring probes are replaced in order to improve the installation accuracy of the measuring probes to ensure the original measuring accuracy. However, since the working mechanism of the measuring probe is similar to a normally closed electronic switch, when the measuring probe is replaced, if the measuring probe is disconnected from the part where the measuring probe is installed, the measuring system will mistakenly think that the measuring probe is probing, which may cause cause measurement errors or system crashes. In the prior art, software control is usually adopted, that is, an optimization algorithm is added to the measurement system and the automatic replacement system to solve this problem. For example, the patent CN109313019A discloses a CMM for identifying and confirming the stylus (ie three coordinates Measuring machine) equipment that implements certain instructions or guidelines when changing measuring probes (such as de-energizing the measuring probe or is considered to be in a de-energized state) so that the confirmation of the installation of the appropriate measuring probe is built into the automated part of the CMM measurement process, thus ensuring the implementation of Confirm the steps, and the result is correct.
然而,软件控制方式相较于硬件控制方式,容错率较低,在例如三坐标测量机中,测量系统和自动更换系统会经常性地发生干涉,可能导致系统错误增加,进而导致测量探头更换失败,并影响后续测量设备进行测量。However, compared with the hardware control method, the software control method has a lower fault tolerance rate. For example, in a three-dimensional coordinate measuring machine, the measurement system and the automatic replacement system will frequently interfere, which may lead to an increase in system errors, which in turn leads to the failure of the replacement of the measurement probe. , and affect subsequent measurement equipment to measure.
发明内容Contents of the invention
本公开有鉴于上述现有技术的状况而完成,其目的在于提供一种测量部件及其自动更换系统,能够通过硬件控制方式解决测量部件由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。The present disclosure is completed in view of the above-mentioned state of the art, and its purpose is to provide a measurement component and its automatic replacement system, which can solve the problem of replacement failure of the measurement component due to the structural limitation of the trigger component itself through hardware control. This can improve the intelligence of the measuring equipment.
为此,本公开的第一方面首先描述一种测量部件,是基于电子开关触发的测量方式的测量部件,包括安装组件和可拆卸地安装于所述安装组件并用于接触待测物体表面同时输出触发信号的探测组件,所述探测组件包括用于接触所述待测物体表面的探针、与所述探针连接的第一触发件、以及与所述第一触发件配合形成所述电子开关的第二触发件,所述探测组件配置为在所述第一触发件与所述第二触发件接触时输出通路信号,且在所述探针接触所述待测物体表面时所述第一触发件与所述第二触发件的不接触并输出所述触发信号;所述安装组件包括与所述电子开关并联且具有开关作用的磁控件,所述安装组件配置为在所述磁控件响应于磁场变化时所述磁控件导通并输出所述通路信号。To this end, the first aspect of the present disclosure first describes a measurement component, which is a measurement component based on an electronic switch triggering measurement method, including a mounting assembly and a mounting assembly that is detachably mounted on the mounting assembly and is used to contact the surface of the object to be measured and simultaneously output A detection component for a trigger signal, the detection component includes a probe for contacting the surface of the object to be measured, a first trigger connected to the probe, and the electronic switch formed in cooperation with the first trigger a second trigger, the detection assembly is configured to output a channel signal when the first trigger is in contact with the second trigger, and when the probe touches the surface of the object to be measured, the first The trigger is not in contact with the second trigger and outputs the trigger signal; the installation assembly includes a magnetic control that is connected in parallel with the electronic switch and has a switch function, and the installation assembly is configured to respond when the magnetic control When the magnetic field changes, the magnetic control is turned on and outputs the pass signal.
在本公开的第一方面中,探测组件可拆卸地安装于安装组件,能够便于测量部件根据不同的待测物体对探测组件进行更换;探测组件通过第一触发件和第二触发件配合形成电子开关,且第一触发件连接探针,在探针不接触待测物体的表面时第一触发件和第二触发件相互接触,即电子开关处于闭合状态,探测组件能够输出通路信号,在探针接触待测物体的表面时第一触发件和第二触发件断开接触,即电子开关通过与第一触发件连接的探针打开,探测组件能够输出触发信号,由此能够便于测量设备通过探测组件利用接触式测量方式进行探测以获得待测物体的尺寸、外形或位置等信息;安装组件中的磁控件具有开关作用且与探测组件中的电子开关电路并联,在响应于磁场变化时安装组件能够替代电子开关输出通路信号,进而能够在探测组件进行更换时使测量系统认为探测组件不处于触发的测量状态,由此能够减少测量系统的错误率,也即能够通过硬件控制方式解决测量部件由于自身触发部件的结构限制导致的更换不准确的问题,由此能够提升设备的精度。In the first aspect of the present disclosure, the detection assembly is detachably installed on the installation assembly, which can facilitate the measurement part to replace the detection assembly according to different objects to be measured; the detection assembly forms an electronic switch, and the first trigger is connected to the probe. When the probe does not touch the surface of the object to be measured, the first trigger and the second trigger are in contact with each other, that is, the electronic switch is in the closed state, and the detection component can output the channel signal. When the needle touches the surface of the object to be measured, the first trigger and the second trigger are disconnected, that is, the electronic switch is opened by the probe connected to the first trigger, and the detection component can output a trigger signal, which can facilitate the measurement equipment to pass through The detection component uses the contact measurement method to detect the size, shape or position of the object to be measured; the magnetic control in the installation component has a switch function and is connected in parallel with the electronic switch circuit in the detection component, and is installed in response to the change of the magnetic field. The component can replace the electronic switch output channel signal, and then the measurement system can think that the detection component is not in the triggered measurement state when the detection component is replaced, thereby reducing the error rate of the measurement system, that is, the measurement component can be solved by hardware control Due to the problem of inaccurate replacement caused by the structural limitations of the self-triggering components, the accuracy of the device can be improved.
另外,根据本公开所涉及的测量部件,可选地,所述第二触发件包括第一触发部和第二触发部,所述探测组件还配置为在所述第一触发部与所述第一触发件接触且所述第二触发部与所述第一触发件接触时输出所述通路信号,在所述第一触发部断开与所述第一触发件的接触或在所述第二触发部断开与所述第一触发件的接触时输出所述触发信号。在这种情况下,可以通过第一触发部和第二触发部配合第一触发件形成电子开关,能够在探针接触待测物体的表面时通过与探针连接的第一触发件打开电子开关,即第一触发部断开与第一触发件的接触或第二触发件断开与第一触发件的接触,由此能够使探测组件输出触发信号以便于测量部件完成测量;另外,通过第一触发部和第二触发部配合第一触发件形成电子开关,还能够减少在第一触发件上设置导线的不便。In addition, according to the measurement component involved in the present disclosure, optionally, the second trigger includes a first trigger part and a second trigger part, and the detection assembly is further configured to When a trigger part is in contact and the second trigger part is in contact with the first trigger part, the pass signal is output, and when the first trigger part breaks contact with the first trigger part or the second The trigger part outputs the trigger signal when the contact with the first trigger part is broken. In this case, the first trigger part and the second trigger part can cooperate with the first trigger to form an electronic switch, and the electronic switch can be turned on by the first trigger connected to the probe when the probe touches the surface of the object to be measured , that is, the first trigger part breaks contact with the first trigger piece or the second trigger piece breaks contact with the first trigger piece, so that the detection component can output a trigger signal so that the measurement component can complete the measurement; in addition, through the second The first trigger part and the second trigger part cooperate with the first trigger part to form an electronic switch, which can also reduce the inconvenience of arranging wires on the first trigger part.
另外,根据本公开所涉及的测量部件,可选地,所述磁控件包括第一开关部和第二开关部,所述安装组件还配置为靠近预设磁场时所述第一开关部接触所述第二开关部并输出所述通路信号,且远离所述预设磁场时所述第一开关部不接触所述第二开关部。在这种情况下,通过第一开关部和第二开关部,磁控件能够具有开关的作用,并且通过与第一触发件、第二触发件所形成的电子开关电路并联,能够在更换测量部件的探测组件时替代电子开关并在磁场作用下输出通路信号,也即能够在探测组件进行更换时通过磁场控制电路通路使测量系统认为探测组件不处于触发的测量状态,进而能够减少测量系统的错误率。In addition, according to the measurement component of the present disclosure, optionally, the magnetic control includes a first switch part and a second switch part, and the installation assembly is further configured such that the first switch part contacts the The second switch part and output the pass signal, and the first switch part does not contact the second switch part when it is away from the preset magnetic field. In this case, through the first switch part and the second switch part, the magnetic control can have the function of a switch, and by connecting in parallel with the electronic switch circuit formed by the first trigger part and the second trigger part, the measuring part can be replaced The detection component replaces the electronic switch and outputs the channel signal under the action of the magnetic field, that is, when the detection component is replaced, the magnetic field control circuit path can be used to make the measurement system think that the detection component is not in the triggered measurement state, thereby reducing the error of the measurement system Rate.
另外,根据本公开所涉及的测量部件,可选地,多个所述第一触发件和多个所述第二触发件配合形成为多个所述电子开关,且多个所述电子开关相互串联或并联。在这种情况下,通过多个电子开关触发能够提升测量部件的探测组件在进行探测时接触待测物体的表面的灵敏度,由此能够提升测量精度。In addition, according to the measurement component involved in the present disclosure, optionally, a plurality of the first trigger elements and a plurality of the second trigger elements cooperate to form a plurality of the electronic switches, and the plurality of electronic switches are mutually series or parallel. In this case, triggering by multiple electronic switches can improve the sensitivity of the detection component of the measurement component when it contacts the surface of the object to be measured, thereby improving the measurement accuracy.
另外,根据本公开所涉及的测量部件,可选地,所述磁控件的电阻值等于多个所述电子开关相互串联或并联后的等效电阻值。在这种情况下,多个电子开关相互串联或并联后再与磁控件电路并联,并且磁控件的电阻值等于多个电子开关相互串联或并联后的等效电阻值,在更换测量部件的探测组件时磁控件在磁场作用下能够输出的通路信号与多个电子开关相互串联或并联后的通路信号相同,提升输出的通路信号的一致性,由此能够替代多个电子开关,在探测组件进行更换时通过磁场控制电路通路使测量系统认为探测组件不处于触发的测量状态,进而能够减少测量系统的错误率。In addition, according to the measurement component of the present disclosure, optionally, the resistance value of the magnetic control is equal to the equivalent resistance value of a plurality of electronic switches connected in series or in parallel. In this case, multiple electronic switches are connected in series or parallel with each other and then connected in parallel with the magnetic control circuit, and the resistance value of the magnetic control is equal to the equivalent resistance value of multiple electronic switches connected in series or parallel. The path signal that the magnetic control can output under the action of the magnetic field is the same as the path signal after multiple electronic switches are connected in series or in parallel, which improves the consistency of the output path signal, thereby replacing multiple electronic switches. During the replacement, the measurement system is made to believe that the detection component is not in the triggered measurement state through the magnetic field control circuit path, thereby reducing the error rate of the measurement system.
另外,根据本公开所涉及的测量部件,可选地,所述探测组件与所述安装组件通过螺纹、磁吸或卡接中的至少一种方式进行安装拆卸。在这种情况下,能够便于探测组件可拆卸地安装于安装组件,并能够通过调整螺纹精度、磁吸精度或卡接精度来提升安装的精度,由此能够提升测量部件的测量精度。In addition, according to the measurement component involved in the present disclosure, optionally, the detection assembly and the installation assembly are installed and detached through at least one of screw thread, magnetic attraction, or clamping. In this case, the detachable installation of the detection component on the installation component can be facilitated, and the precision of the installation can be improved by adjusting the precision of the thread, the precision of the magnetic attraction or the precision of the clamping, thereby improving the measurement precision of the measuring component.
本公开的第二方面描述一种测量部件的自动更换系统,包括:基于电子开关触发的测量方式的测量部件、用于驱动所述测量部件移动的驱动装置、以及形成有预设磁场的放置装置,所述测量部件包括安装组件和可拆卸地安装于所述安装组件并用于接触待测物体表面同时输出触发信号的探测组件,所述探测组件包括用于接触所述待测物体表面的探针、与所述探针连接的第一触发件、以及与所述第一触发件配合形成所述电子开关的第二触发件,所述探测组件配置为在所述第一触发件与所述第二触发件接触时输出通路信号,且在所述探针接触所述待测物体表面时所述第一触发件与所述第二触发件的不接触并输出所述触发信号;所述安装组件包括与所述电子开关并联且具有开关作用的磁控件,所述安装组件配置为在所述磁控件响应于所述预设磁场时所述磁控件导通并输出所述通路信号;所述驱动装置配置为驱动所述测量部件移动至所述放置装置且位于所述预设磁场中;所述放置装置配置为用于放置并更换所述探测组件。The second aspect of the present disclosure describes an automatic replacement system for measuring components, including: a measuring component based on a measurement method triggered by an electronic switch, a driving device for driving the measuring component to move, and a placement device formed with a preset magnetic field , the measuring component includes a mounting assembly and a detection assembly detachably mounted on the mounting assembly and used to contact the surface of the object to be measured and output a trigger signal at the same time, the detection assembly includes a probe for contacting the surface of the object to be measured , a first trigger connected to the probe, and a second trigger that cooperates with the first trigger to form the electronic switch, and the detection assembly is configured to be connected between the first trigger and the second trigger When the two trigger parts are in contact, a channel signal is output, and when the probe contacts the surface of the object to be measured, the first trigger part is not in contact with the second trigger part and the trigger signal is output; the installation component It includes a magnetic control connected in parallel with the electronic switch and has a switching function, and the installation assembly is configured such that when the magnetic control responds to the preset magnetic field, the magnetic control conducts and outputs the pass signal; the drive The device is configured to drive the measuring component to move to the placement device and be located in the preset magnetic field; the placement device is configured to place and replace the detection assembly.
在本公开的第二方面中,通过驱动装置驱动测量部件移动至具有预设磁场的放置装置中,能够在放置装置中对测量部件中的可拆卸地安装于安装组件的探测组件进行更换;探测组件通过第一触发件和第二触发件配合形成电子开关,且第一触发件连接探针,在探针不接触待测物体的表面时第一触发件和第二触发件相互接触,即电子开关处于闭合状态,探测组件能够输出通路信号,在探针接触待测物体的表面时第一触发件和第二触发件断开接触,即电子开关通过与第一触发件连接的探针打开,探测组件能够输出触发信号,由此能够便于测量设备通过探测组件利用接触式测量方式进行探测以获得待测物体的尺寸、外形或位置等信息;安装组件中的磁控件具有开关作用且与探测组件中的电子开关电路并联,在响应于放置装置的预设磁场时安装组件能够替代电子开关输出通路信号,进而能够在探测组件进行更换也即移动至放置装置时使测量系统认为探测组件不处于触发的测量状态,由此能够减少测量系统识别的错误率,也即能够通过硬件控制方式解决测量部件由于自身触发部件的结构限制导致的更换不准确的问题,由此能够提升设备的精度。In the second aspect of the present disclosure, the measuring component is driven by the driving device to move into the placement device with a preset magnetic field, and the detection assembly detachably mounted on the mounting assembly in the measuring component can be replaced in the placement device; The assembly forms an electronic switch through the cooperation of the first trigger and the second trigger, and the first trigger is connected to the probe. When the probe does not touch the surface of the object to be measured, the first trigger and the second trigger contact each other, that is, the electronic The switch is in the closed state, and the detection component can output a channel signal. When the probe touches the surface of the object to be measured, the first trigger and the second trigger are disconnected, that is, the electronic switch is opened by the probe connected to the first trigger, The detection component can output a trigger signal, which can facilitate the measurement equipment to detect the size, shape or position of the object to be measured through the detection component by means of contact measurement; the magnetic control in the installation component has a switch function and is connected to the detection component The electronic switch circuit in the device is connected in parallel, and the installation component can replace the electronic switch output channel signal when responding to the preset magnetic field of the placement device, so that the measurement system can think that the detection component is not in the trigger when the detection component is replaced, that is, when it is moved to the placement device The measurement status can reduce the error rate of measurement system identification, that is, the problem of inaccurate replacement of measurement components due to the structural limitations of their own trigger components can be solved through hardware control, thereby improving the accuracy of the equipment.
另外,根据本公开所涉及的自动更换系统,可选地,所述磁控件包括第一开关部和第二开关部,所述安装组件还配置为靠近预设磁场时所述第一开关部接触所述第二开关部并输出所述通路信号,且远离所述预设磁场时所述第一开关部不接触所述第二开关部。在这种情况下,通过第一开关部和第二开关部,磁控件能够具有开关的作用,并且通过与第一触发件、第二触发件所形成的电子开关电路并联,能够在更换测量部件的探测组件时替代电子开关并在磁场作用下输出通路信号,也即能够在探测组件进行更换时通过磁场控制电路通路使测量系统认为探测组件不处于触发的测量状态,进而能够减少测量系统的错误率。In addition, according to the automatic replacement system of the present disclosure, optionally, the magnetic control includes a first switch part and a second switch part, and the installation component is further configured such that the first switch part contacts The second switch part outputs the pass signal, and the first switch part does not contact the second switch part when it is away from the preset magnetic field. In this case, through the first switch part and the second switch part, the magnetic control can have the function of a switch, and by connecting in parallel with the electronic switch circuit formed by the first trigger part and the second trigger part, the measuring part can be replaced The detection component replaces the electronic switch and outputs the channel signal under the action of the magnetic field, that is, when the detection component is replaced, the magnetic field control circuit path can be used to make the measurement system think that the detection component is not in the triggered measurement state, thereby reducing the error of the measurement system Rate.
另外,根据本公开所涉及的自动更换系统,可选地,多个所述第一触发件和多个所述第二触发件配合形成为多个所述电子开关,且多个所述电子开关相互串联或并联。在这种情况下,通过多个电子开关触发能够提升测量部件的探测组件在进行探测时接触待测物体的表面的灵敏度,由此能够提升测量精度。In addition, according to the automatic replacement system involved in the present disclosure, optionally, a plurality of the first triggering pieces and a plurality of the second triggering pieces cooperate to form a plurality of the electronic switches, and the plurality of the electronic switches connected in series or parallel with each other. In this case, triggering by multiple electronic switches can improve the sensitivity of the detection component of the measurement component when it contacts the surface of the object to be measured, thereby improving the measurement accuracy.
另外,根据本公开所涉及的自动更换系统,可选地,所述磁控件的电阻值等于多个所述电子开关相互串联或并联后的等效电阻值。在这种情况下,多个电子开关相互串联或并联后再与磁控件电路并联,并且磁控件的电阻值等于多个电子开关相互串联或并联后的等效电阻值,在更换测量部件的探测组件时磁控件在磁场作用下能够输出的通路信号与多个电子开关相互串联或并联后的通路信号相同,提升输出的通路信号的一致性,由此能够替代多个电子开关,在探测组件进行更换时通过磁场控制电路通路使测量系统认为探测组件不处于触发的测量状态,进而能够减少测量系统的错误率。In addition, according to the automatic replacement system of the present disclosure, optionally, the resistance value of the magnetic control is equal to the equivalent resistance value of a plurality of electronic switches connected in series or in parallel. In this case, multiple electronic switches are connected in series or parallel with each other and then connected in parallel with the magnetic control circuit, and the resistance value of the magnetic control is equal to the equivalent resistance value of multiple electronic switches connected in series or parallel. The path signal that the magnetic control can output under the action of the magnetic field is the same as the path signal after multiple electronic switches are connected in series or in parallel, which improves the consistency of the output path signal, thereby replacing multiple electronic switches. During the replacement, the measurement system is made to believe that the detection component is not in the triggered measurement state through the magnetic field control circuit path, thereby reducing the error rate of the measurement system.
根据本公开,能够提供一种测量部件及其自动更换系统,能够通过硬件控制方式解决测量部件由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。According to the present disclosure, a measurement component and its automatic replacement system can be provided, which can solve the problem of replacement failure of the measurement component due to the structural limitation of the trigger component itself through hardware control, thereby improving the intelligence of the measurement equipment.
附图说明Description of drawings
现在将仅通过参考附图的例子进一步详细地解释本公开,其中:The present disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings, in which:
图1是示出了本公开示例所涉及的测量部件的结构示意图。FIG. 1 is a schematic diagram showing a configuration of a measurement part involved in an example of the present disclosure.
图2是示出了本公开示例所涉及的测量部件中探测组件和安装组件的可拆分地安装的示意图。FIG. 2 is a schematic diagram illustrating detachable installation of a detection assembly and a mounting assembly in a measurement component related to an example of the present disclosure.
图3是示出了本公开示例所涉及的探测组件进行简化处理后的结构示意图。Fig. 3 is a schematic diagram showing a simplified processing of a detection component involved in an example of the present disclosure.
图4是示出了本公开图1或图2示例所涉及的探测组件的内部结构的俯视图。FIG. 4 is a plan view showing the internal structure of the detection assembly involved in the example of FIG. 1 or FIG. 2 of the present disclosure.
图5是示出了本公开示例所涉及的电子开关的工作原理的示意图。FIG. 5 is a schematic diagram showing the working principle of the electronic switch involved in the example of the present disclosure.
图6是示出了本公开图5示例所涉及的电子开关的第一种打开情况的示意图。FIG. 6 is a schematic diagram showing a first opening state of the electronic switch involved in the example of FIG. 5 of the present disclosure.
图7是示出了本公开图5示例所涉及的电子开关的第二种打开情况的示意图。FIG. 7 is a schematic diagram showing a second opening state of the electronic switch involved in the example of FIG. 5 of the present disclosure.
图8是示出了本公开图5示例所涉及的电子开关的第三种打开情况的示意图。FIG. 8 is a schematic diagram showing a third opening state of the electronic switch involved in the example of FIG. 5 of the present disclosure.
图9是示出了本公开示例所涉及的安装组件的结构示意图。FIG. 9 is a schematic structural view showing a mounting assembly related to an example of the present disclosure.
图10是示出了本公开示例所涉及的安装组件中的磁控件的结构及工作原理示意图。Fig. 10 is a schematic diagram showing the structure and working principle of the magnetic control in the installation assembly involved in the example of the present disclosure.
图11是示出了本公开示例所涉及的安装组件中的磁控件在预设磁场作用下的工作状态的示意图。Fig. 11 is a schematic diagram showing the working state of the magnetic control in the installation assembly according to the example of the present disclosure under the action of a preset magnetic field.
图12是示出了本公开示例所涉及的探测组件中的电子开关与安装组件中的磁控件电路并联的电路图。FIG. 12 is a circuit diagram showing the parallel connection of the electronic switch in the detection assembly and the magnetic control circuit in the installation assembly related to the example of the present disclosure.
图13是示出了本公开所涉及的测量部件的自动更换系统的结构框图。FIG. 13 is a block diagram showing the configuration of an automatic replacement system for measuring components according to the present disclosure.
附图标记说明:Explanation of reference signs:
1…自动更换系统,11…测量部件,12…驱动装置,13…放置装置,20…电子开关,30…磁控件,111…安装组件,112…探测组件,1121…第一触发件,1122…第二触发件,1122a…第一触发部,1122b…第二触发部,1123…探针,301…第一开关部,302…第二开关部,A…拆分处,B…预设磁场。1...Automatic replacement system, 11...Measuring components, 12...Driver, 13...Placing device, 20...Electronic switch, 30...Magnetic control, 111...Installation assembly, 112...Detection assembly, 1121...First trigger, 1122... The second trigger, 1122a...the first trigger part, 1122b...the second trigger part, 1123...the probe, 301...the first switch part, 302...the second switch part, A...the splitting part, B...the preset magnetic field.
具体实施方式Detailed ways
下面将结合本公开实施例中的附图,对本公开实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本公开一部分实施例,而不是全部的实施例。基于本公开中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所填充的所有其他实施例,都属于本公开保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present disclosure with reference to the accompanying drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only some of the embodiments of the present disclosure, not all of them. Based on the embodiments in the present disclosure, all other embodiments filled by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present disclosure.
需要说明的是,本公开的说明书和权利要求书及上述附图中的术语“第一”、“第二”、“第三”和“第四”等是用于区别不同对象,而不是用于描述特定顺序。此外,术语“包括”和“具有”以及它们任何变形,意图在于覆盖不排他的包含。例如包含了一系列步骤或单元的过程、方法、系统、产品或装置没有限定于已列出的步骤或单元,而是可选地还包括没有列出的步骤或单元,或可选地还包括对于这些过程、方法、产品或装置固有的其他步骤或单元。在下面的说明中,对于相同的部件赋予相同的符号,省略重复的说明。另外,附图只是示意性的图,部件相互之间的尺寸的比例或者部件的形状等可以与实际的不同。It should be noted that the terms "first", "second", "third" and "fourth" in the specification and claims of the present disclosure and the above drawings are used to distinguish different objects, rather than using to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units not listed, or optionally further includes For other steps or units inherent in these processes, methods, products or devices. In the following description, the same reference numerals are given to the same components, and repeated descriptions are omitted. In addition, the drawings are only schematic diagrams, and the ratio of dimensions between components, the shape of components, and the like may be different from the actual ones.
本公开描述一种测量部件及其自动更换系统。其中,本公开所涉及的测量部件可以是测量设备中用于进行测量的机构,例如探针模组、测头模组等。在一些示例中,测量设备可以是三坐标测量机,测量部件可以是三坐标测量机的探针模组或测头模组。特别地,在一些示例中,测量部件可以是基于电子开关触发的测量方式的测量部件。在一些示例中,电子开关触发的测量方式可以是指通过特定部件或机构接触待测物体的表面时发送接触触发信号并基于触发信号获取当前特定部件或机构相对原点的坐标,再通过计算获得待测物体的尺寸、外形等参数的测量方式。The present disclosure describes a measurement component and its automatic replacement system. Wherein, the measurement component involved in the present disclosure may be a mechanism for performing measurement in a measurement device, such as a probe module, a probe module, and the like. In some examples, the measuring device may be a three-coordinate measuring machine, and the measuring component may be a probe module or a probe module of the three-coordinate measuring machine. In particular, in some examples, the measurement component may be a measurement component based on an electronic switch triggered measurement. In some examples, the measurement method triggered by an electronic switch can refer to sending a contact trigger signal when a specific component or mechanism touches the surface of the object to be measured, and obtaining the coordinates of the current specific component or mechanism relative to the origin based on the trigger signal, and then obtaining the target by calculation. Measure the size, shape and other parameters of the object.
如背景技术所提及的,由于测量探头(即测量部件)的工作机理类似常闭式的电子开关,在测量探头进行更换时,测量探头与安装测量探头的部位断开也会被测量系统错误地认为测量探头在进行探测,进而可能会导致测量错误或系统崩溃。现有技术中,通常采用软件控制方式,即在测量系统和自动更换系统中增加优化算法,来解决该问题。然而,软件控制方式相较于硬件控制方式,容错率较低,在例如三坐标测量机中,测量系统和自动更换系统会经常性地发生干涉,可能导致系统错误增加,进而导致测量探头更换不精准,并影响后续测量设备进行测量时的测量精度。As mentioned in the background technology, since the working mechanism of the measuring probe (that is, the measuring part) is similar to a normally closed electronic switch, when the measuring probe is replaced, the disconnection between the measuring probe and the part where the measuring probe is installed will also be caused by the error of the measuring system. falsely believe that the measurement probe is probing, which could lead to measurement errors or system crashes. In the prior art, software control is usually adopted, that is, an optimization algorithm is added to the measurement system and the automatic replacement system to solve this problem. However, compared with the hardware control method, the software control method has a lower fault tolerance rate. For example, in a three-dimensional coordinate measuring machine, the measurement system and the automatic replacement system will often interfere, which may lead to increased system errors, which in turn will lead to incorrect replacement of the measurement probe. Accurate, and affect the measurement accuracy of subsequent measurement equipment.
因此,本公开提供以下两方面的内容,具体地,本公开提供一种测量部件及其自动更换系统,能够通过硬件控制方式解决测量部件由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。在一些示例中,本公开所涉及的测量部件及其自动更换系统也可以称为“接触式测量部件及其自动更换系统”、“接触式测头及其更换系统”、“基于电子开关触发测量的测头及其更换系统”或“三坐标测量机的接触式测头及其自动更换系统”等。Therefore, the present disclosure provides the following two aspects. Specifically, the present disclosure provides a measurement component and its automatic replacement system, which can solve the problem of replacement failure of the measurement component due to the structural limitation of the trigger component itself through hardware control. This can improve the intelligence of the measuring equipment. In some examples, the measuring component and its automatic replacement system involved in the present disclosure may also be referred to as "contact measuring component and its automatic replacement system", "contact probe and its replacement system", "triggered measurement based on electronic switch The probe and its replacement system of the three-coordinate measuring machine and its automatic replacement system, etc.
以下结合附图首先对本公开的第一方面进行详细描述。图1是示出了本公开示例所涉及的测量部件11的结构示意图。图2是示出了本公开示例所涉及的测量部件11中探测组件112和安装组件111的可拆分地安装的示意图。The first aspect of the present disclosure will be described in detail below with reference to the accompanying drawings. FIG. 1 is a schematic diagram showing a configuration of a measuring
本公开的第一方面描述一种测量部件11,如图1所示,测量部件11可以包括安装组件111和探测组件112。在一些示例中,探测组件112可以用于接触待测物体表面同时输出触发信号,安装组件111可以用于安装探测组件112,且可以使探测组件112能够电路连接至测量设备的主机。在这种情况下,能够通过探测组件112和安装组件111形成测量部件11以对待测物体进行接触式测量。The first aspect of the present disclosure describes a
在一些示例中,触发信号可以是指利用检测装置对探测组件112进行检测时无电流或电压不在预设值范围的检测信号。另外,本公开中所涉及的通路信号可以是指利用检测装置对探测组件112或安装组件111进行检测时有电流或电压为预定值的检测信号。In some examples, the trigger signal may refer to a detection signal that there is no current or the voltage is not within a preset value range when the detection device detects the
在一些示例中,如图2所示,探测组件112可以可拆卸地安装于安装组件111。在这种情况下,探测组件112可拆卸地安装于安装组件111,能够便于测量部件11根据不同的待测物体对探测组件112进行更换。In some examples, as shown in FIG. 2 , the
图3是示出了本公开示例所涉及的探测组件112进行简化处理后的结构示意图。图4是示出了本公开图1或图2示例所涉及的探测组件112的内部结构的俯视图。图5是示出了本公开示例所涉及的电子开关20的工作原理的示意图。图6是示出了本公开图5示例所涉及的电子开关20的第一种打开情况的示意图。图7是示出了本公开图5示例所涉及的电子开关20的第二种打开情况的示意图。图8是示出了本公开图5示例所涉及的电子开关20的第三种打开情况的示意图。其中,图4相同部件仅通过一组标记进行标识,也即可以理解为其中相同部件的数量可以是多个,例如2个、3个、4个或更多。FIG. 3 is a schematic diagram showing a simplified structure of the
在一些示例中,如图3所示,探测组件112可以包括探针1123、第一触发件1121和第二触发件1122。在一些示例中,探针1123可以用于接触待测物体表面的探针1123,第一触发件1121可以与探针1123连接,第二触发件1122可以与第一触发件1121配合形成电子开关20。In some examples, as shown in FIG. 3 , the
在本公开中,探测组件112可以配置为在第一触发件1121与第二触发件1122接触时输出通路信号,且在探针1123接触待测物体表面时第一触发件1121与第二触发件1122的不接触并输出触发信号。在这种情况下,探测组件112通过第一触发件1121和第二触发件1122配合形成电子开关20,且第一触发件1121连接探针1123,在探针1123不接触待测物体的表面时第一触发件1121和第二触发件1122相互接触,即电子开关20处于闭合状态,探测组件112能够输出通路信号,在探针1123接触待测物体的表面时第一触发件1121和第二触发件1122断开接触,即电子开关20通过与第一触发件1121连接的探针1123打开,探测组件112能够输出触发信号,由此能够便于测量设备通过探测组件112利用接触式测量方式进行探测以获得待测物体的尺寸、外形或位置等信息。In the present disclosure, the
在一些示例中,如图4所示,第二触发件1122可以包括第一触发部1122a和第二触发部1122b。In some examples, as shown in FIG. 4 , the
在一些示例中,探测组件112还可以配置为在第一触发部1122a与第一触发件1121接触且第二触发部1122b与第一触发件1121接触时输出通路信号(参见图5),在第一触发部1122a断开与第一触发件1121的接触或在第二触发部1122b断开与第一触发件1121的接触时输出触发信号(参见图6、图7或图8)。在这种情况下,可以通过第一触发部1122a和第二触发部1122b配合第一触发件1121形成电子开关20,能够在探针1123接触待测物体的表面时通过与探针1123连接的第一触发件1121打开电子开关20,即第一触发部1122a断开与第一触发件1121的接触或第二触发件1122断开与第一触发件1121的接触,由此能够使探测组件112输出触发信号以便于测量部件11完成测量;另外,通过第一触发部1122a和第二触发部1122b配合第一触发件1121形成电子开关20,还能够减少在第一触发件1121上设置导线的不便。In some examples, the
在一些示例中,在第一触发部1122a与第一触发件1121接触且第二触发部1122b与第一触发件1121接触时探测组件112可以输出通路信号,即参见图5所示的情形,第一触发部1122a与第一触发件1121接触且第二触发部1122b与第一触发件1121接触才可以形成闭合的电子开关20,由此电流可以从第一触发部1122a经第一触发件1121至第二触发部1122b流出。In some examples, when the
在一些示例中,在第一触发部1122a断开与第一触发件1121的接触或在第二触发部1122b断开与第一触发件1121的接触时探测组件112可以输出触发信号,即参见图6、图7或图8所示的情形,包括:第一触发件1121与第一触发部1122a接触且与第二触发部1122b断开,第一触发件1121与第一触发部1122a断开且与第二触发部1122b接触,以及第一触发件1121与第一触发部1122a、第二触发部1122b均断开的情形。In some examples, the
在一些示例中,第一触发件1121和第二触发件1122可以是导体,材质可以包括但不限于金属、石墨或复合导电材料等。In some examples, the
在一些示例中,多个第一触发件1121和多个第二触发件1122可以配合形成为多个电子开关20(参见图4)。在一些示例中,多个第一触发件1121和多个第二触发件1122可以配合形成为多个电子开关20,且多个电子开关20可以相互串联或并联。在这种情况下,通过多个电子开关20触发能够提升测量部件11的探测组件112在进行探测时接触待测物体的表面的灵敏度,由此能够提升测量精度。In some examples, the plurality of
图9是示出了本公开示例所涉及的安装组件111的结构示意图。图10是示出了本公开示例所涉及的安装组件111中的磁控件30的结构及工作原理示意图。图11是示出了本公开示例所涉及的安装组件111中的磁控件30在预设磁场B作用下的工作状态的示意图。图12是示出了本公开示例所涉及的探测组件112中的电子开关20与安装组件111中的磁控件30电路并联的电路图。其中,图12中电子开关20和磁控件30均已作简化和等效处理,例如电子开关20可以简化并等效为开关和电阻,磁控件30也可以简化并等效为开关和电阻,另外,图中A表示安装组件111与探测组件112的拆分处A,即安装组件111与探测组件112可以进行拆分。FIG. 9 is a schematic diagram showing the structure of the mounting
在一些示例中,如图9所示,安装组件111可以包括磁控件30,具体地,安装组件111可以包括与电子开关20电路并联且具有开关作用的磁控件30。例如,如图12所示,磁控件30可以和第一触发件1121、第二触发件1122所形成的电子开关20并联在电源的两极。In some examples, as shown in FIG. 9 , the mounting
在本公开中,安装组件111可以配置为在磁控件30响应于磁场变化时磁控件30导通并输出通路信号。在这种情况下,安装组件111中的磁控件30具有开关作用且与探测组件112中的电子开关20电路并联,在响应于磁场变化时安装组件111能够替代电子开关20输出通路信号,进而能够在探测组件112进行更换时使测量系统认为探测组件112不处于触发的测量状态(也即图12中示意的拆分处A断开的情形),由此能够减少测量系统的错误率,也即能够通过硬件控制方式解决测量部件11由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。In the present disclosure, the mounting
在一些示例中,如图10所示,磁控件30可以包括第一开关部301和第二开关部302。在一些示例中,第一开关部301和第二开关部302可以连通电源并可以响应于磁场变化闭合导通。In some examples, as shown in FIG. 10 , the
在一些示例中,安装组件111还可以配置为靠近预设磁场B时第一开关部301接触第二开关部302并输出通路信号,且远离预设磁场B时第一开关部301不接触第二开关部302。例如,如图10和11所示,当安装组件111远离预设磁场B时,即如图10所示的情形,磁控件30不受预设磁场B影响或不存在于预设磁场B中时第一开关部301和第二开关部302断开或不接触的情形;当安装组件111靠近预设磁场B时,即如图11所示的情形,磁控件30受到预设磁场B影响或存在于预设磁场B中时第一开关部301和第二开关部302接触或闭合的情形。在这种情况下,通过第一开关部301和第二开关部302,磁控件30能够具有开关的作用,并且通过与第一触发件1121、第二触发件1122所形成的电子开关20电路并联,能够在更换测量部件11的探测组件112时替代电子开关20并在磁场作用下输出通路信号,也即能够在探测组件112进行更换时通过磁场控制电路通路使测量系统认为探测组件112不处于触发的测量状态,进而能够减少测量系统的错误率。In some examples, the mounting
在一些示例中,磁控件30可以是干簧管构成的磁控开关。在这种情况下,能够利用干簧管的开关作用并在预设磁场B下控制其闭合以在测量部件11进行更换时替代由第一触发件1121和第二触发件1122所形成的电子开关20,由此能够通过硬件控制方式解决测量部件11由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。In some examples, the
在一些示例中,磁控件30的电阻值可以等于多个电子开关20相互串联或并联后的等效电阻值,例如,如图12所示,多个电子开关20可以等效为一个开关和电阻,磁控件30也可以等效为一个开关和电阻时,多个电子开关20的等效电阻值可以与磁控件30的等效电阻值相同。在这种情况下,多个电子开关20相互串联或并联后再与磁控件30电路并联,并且磁控件30的电阻值等于多个电子开关20相互串联或并联后的等效电阻值,在更换测量部件11的探测组件112时磁控件30在磁场作用下能够输出的通路信号与多个电子开关20相互串联或并联后的通路信号相同,提升输出的通路信号的一致性,由此能够替代多个电子开关20,在探测组件112进行更换时通过磁场控制电路通路使测量系统认为探测组件112不处于触发的测量状态,进而能够减少测量系统的错误率。In some examples, the resistance value of the
在一些示例中,探测组件112与安装组件111可以通过螺纹、磁吸或卡接中的至少一种方式进行安装拆卸。在这种情况下,能够便于探测组件112可拆卸地安装于安装组件111,并能够通过调整螺纹精度、磁吸精度或卡接精度来提升安装的精度,由此能够提升测量部件11的测量精度。In some examples, the
以下结合附图继续对本公开的第二方面进行详细描述。图13是示出了本公开所涉及的测量部件11的自动更换系统1的结构框图。The second aspect of the present disclosure will be described in detail below in conjunction with the accompanying drawings. FIG. 13 is a block diagram showing the configuration of the automatic exchange system 1 for the
本公开的第二方面描述一种测量部件11的自动更换系统1。在一些示例中,如图13所示,自动更换系统1可以包括测量部件11、驱动装置12和放置装置13。特别地,本公开第二方面所涉及的测量部件11可以是指本公开的第一方面的任一实施方式所涉及的测量部件11。A second aspect of the disclosure describes an automatic exchange system 1 of measuring
在一些示例中,驱动装置12可以用于驱动测量部件11移动。具体地,驱动装置12可以用于驱动测量部件11移动至放置装置13,并可以使测量部件11在放置装置13中进行放置并更换。In some examples, the drive device 12 may be used to drive the
在一些示例中,驱动装置12可以是测量设备的驱动机构,例如可以是三坐标测量机的主轴和副轴等驱动机构。在另一些示例中,驱动装置12也可以是其他自动化测量设备的机械臂,例如多轴测量设备。In some examples, the driving device 12 may be a driving mechanism of a measuring device, for example, it may be a driving mechanism such as a main shaft and an auxiliary shaft of a three-dimensional coordinate measuring machine. In some other examples, the driving device 12 may also be a mechanical arm of other automated measuring equipment, such as multi-axis measuring equipment.
在一些示例中,驱动装置12可以配置为驱动测量部件11移动至放置装置13且位于预设磁场B中。In some examples, the driving device 12 may be configured to drive the measuring
在一些示例中,放置装置13可以形成有预设磁场B。在一些示例中,预设磁场B可以由放置装置13中的永磁体或电流装置产生。In some examples, the placing device 13 may be formed with a preset magnetic field B. In some examples, the preset magnetic field B can be generated by a permanent magnet or an electric current device in the placement device 13 .
在一些示例中,放置装置13可以配置为用于放置并更换探测组件112。在一些示例中,放置装置13可以是存放多个探测组件112。在一些示例中,放置装置13可以自动识别多个探测组件112。在这种情况下,能够根据测量需求选择适当的探测组件112并更换至测量部件11,由此能够提高测量设备的智能化程度。In some examples, placement device 13 may be configured for placement and replacement of
在一些示例中,放置装置13可以是设置于测量设备的用于更换测量部件11的探测组件112的更换机构,例如放置装置13可以是三坐标测量机的测头自动更换机构。在另一些示例中,放置装置13也可以是独立于测量设备的用于更换测量部件11的探测组件112的更换设备。In some examples, the placing device 13 may be a replacement mechanism provided on the measuring equipment for replacing the
在一些示例中,测量部件11可以是基于电子开关20触发的测量方式的部件。在一些示例中,测量部件11可以包括安装组件111和探测组件112。具体地,测量部件11可以包括安装组件111和可拆卸地安装于安装组件111并用于接触待测物体表面同时输出触发信号的探测组件112。In some examples, the
在一些示例中,探测组件112可以包括探针1123、第一触发件1121和第二触发件1122。具体地,探测组件112可以包括用于接触待测物体表面的探针1123、与探针1123连接的第一触发件1121、以及与第一触发件1121配合形成电子开关20的第二触发件1122。In some examples, the
在一些示例中,探测组件112可以配置为在第一触发件1121与第二触发件1122接触时输出通路信号,且在探针1123接触待测物体表面时第一触发件1121与第二触发件1122不接触并输出触发信号。在这种情况下,探测组件112通过第一触发件1121和第二触发件1122配合形成电子开关20,且第一触发件1121连接探针1123,在探针1123不接触待测物体的表面时第一触发件1121和第二触发件1122相互接触,即电子开关20处于闭合状态,探测组件112能够输出通路信号,在探针1123接触待测物体的表面时第一触发件1121和第二触发件1122断开接触,即电子开关20通过与第一触发件1121连接的探针1123打开,探测组件112能够输出触发信号,由此能够便于测量设备通过探测组件112利用接触式测量方式进行探测以获得待测物体的尺寸、外形或位置等信息。In some examples, the
在一些示例中,安装组件111可以包括与电子开关20电路并联且具有开关作用的磁控件30。In some examples, the mounting
在一些示例中,安装组件111可以配置为在磁控件30响应于预设磁场B时磁控件30导通并输出通路信号。在这种情况下,安装组件111中的磁控件30具有开关作用且与探测组件112中的电子开关20电路并联,在响应于放置装置13的预设磁场B时安装组件111能够替代电子开关20输出通路信号,进而能够在探测组件112进行更换也即移动至放置装置13时使测量系统认为探测组件112不处于触发的测量状态,由此能够减少测量系统识别的错误率。In some examples, the
在本公开的第二方面中,通过驱动装置12驱动测量部件11移动至具有预设磁场B的放置装置13中,能够在放置装置13中对测量部件11中的可拆卸地安装于安装组件111的探测组件112进行更换,由于安装组件111中的磁控件30具有开关作用且与探测组件112中的电子开关20电路并联,在响应于放置装置13的预设磁场B时安装组件111能够替代电子开关20输出通路信号,进而能够在探测组件112进行更换也即移动至放置装置13时使测量系统认为探测组件112不处于触发的测量状态,由此能够减少测量系统识别的错误率,也即能够通过硬件控制方式解决测量部件11由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。In the second aspect of the present disclosure, the
在一些示例中,磁控件30可以包括第一开关部301和第二开关部302。In some examples, the
在一些示例中,安装组件111还可以配置为靠近预设磁场B时第一开关部301接触第二开关部302并输出通路信号,且远离预设磁场B时第一开关部301不接触第二开关部302。在这种情况下,通过第一开关部301和第二开关部302,磁控件30能够具有开关的作用,并且通过与第一触发件1121、第二触发件1122所形成的电子开关20电路并联,能够在更换测量部件11的探测组件112时替代电子开关20并在磁场作用下输出通路信号,也即能够在探测组件112进行更换时通过磁场控制电路通路使测量系统认为探测组件112不处于触发的测量状态,进而能够减少测量系统的错误率。In some examples, the mounting
在一些示例中,多个第一触发件1121和多个第二触发件1122可以配合形成为多个电子开关20,且多个电子开关20可以相互串联或并联。在这种情况下,通过多个电子开关20触发能够提升测量部件11的探测组件112在进行探测时接触待测物体的表面的灵敏度,由此能够提升测量精度。In some examples, the plurality of first triggering
在一些示例中,磁控件30的电阻值可以等于多个电子开关20相互串联或并联后的等效电阻值。在这种情况下,多个电子开关20相互串联或并联后再与磁控件30电路并联,并且磁控件30的电阻值等于多个电子开关20相互串联或并联后的等效电阻值,在更换测量部件11的探测组件112时磁控件30在磁场作用下能够输出的通路信号与多个电子开关20相互串联或并联后的通路信号相同,提升输出的通路信号的一致性,由此能够替代多个电子开关20,在探测组件112进行更换时通过磁场控制电路通路使测量系统认为探测组件112不处于触发的测量状态,进而能够减少测量系统的错误率。In some examples, the resistance value of the
根据本公开,能够提供一种测量部件11及其自动更换系统1,能够通过硬件控制方式解决测量部件11由于自身触发部件的结构限制导致的更换失败的问题,由此能够提升测量设备的智能化程度。According to the present disclosure, a
虽然以上结合附图和示例对本公开进行了具体说明,但是可以理解,上述说明不以任何形式限制本公开。本领域技术人员在不偏离本公开的实质精神和范围的情况下可以根据需要对本公开进行变形和变,这些变形和变均落入本公开的范围内。Although the present disclosure has been described in detail with reference to the drawings and examples, it should be understood that the above description does not limit the present disclosure in any form. Those skilled in the art can make modifications and changes to the present disclosure as needed without departing from the true spirit and scope of the present disclosure, and these modifications and changes all fall within the scope of the present disclosure.
Claims (10)
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JP2002243538A (en) * | 2001-02-14 | 2002-08-28 | Mitsutoyo Corp | Vibration detection system of elastic material |
CN105408724A (en) * | 2013-08-01 | 2016-03-16 | 马波斯S.P.A.公司 | Touch probe and relative circuits and methods for signal processing |
JP2019023652A (en) * | 2018-09-25 | 2019-02-14 | 株式会社東京精密 | Measuring system |
CN112815901A (en) * | 2014-12-19 | 2021-05-18 | 赫克斯冈技术中心 | Coordinate measuring machine, probe system and method of compensating for forces at a probe element |
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JP2002243538A (en) * | 2001-02-14 | 2002-08-28 | Mitsutoyo Corp | Vibration detection system of elastic material |
CN105408724A (en) * | 2013-08-01 | 2016-03-16 | 马波斯S.P.A.公司 | Touch probe and relative circuits and methods for signal processing |
CN112815901A (en) * | 2014-12-19 | 2021-05-18 | 赫克斯冈技术中心 | Coordinate measuring machine, probe system and method of compensating for forces at a probe element |
JP2019023652A (en) * | 2018-09-25 | 2019-02-14 | 株式会社東京精密 | Measuring system |
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