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CN116190346A - Power supply structure for integrated chip system - Google Patents

Power supply structure for integrated chip system Download PDF

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CN116190346A
CN116190346A CN202310194235.8A CN202310194235A CN116190346A CN 116190346 A CN116190346 A CN 116190346A CN 202310194235 A CN202310194235 A CN 202310194235A CN 116190346 A CN116190346 A CN 116190346A
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integrated chip
power supply
chip
power management
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邹卓
唐懿雯
曹程伟
郑立荣
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Fudan University
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
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    • H01L23/5225Shielding layers formed together with wiring layers

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Abstract

本发明涉及半导体技术领域,具体是一种面向集成化芯片系统的供电结构,包括电源管理系统、中介层和集成化芯片系统,所述中介层包括基板层、RDL层和可垂直贯穿所述中介层的垂直连接结构,所述垂直连接结构的上下两端分别设置有互连件,所述电源管理系统通过所述互连件与所述垂直连接结构的上端连接,所述集成化芯片系统通过所述互连件与所述垂直连接结构的下端连接。本结构通过2.5D中介层技术能够实现电源管理系统与集成化芯片系统的高密度互连,满足了集成化芯片系统对供电电压的需求,并且能够实现封装体积小、电信号传输质量高的效果。

Figure 202310194235

The present invention relates to the field of semiconductor technology, in particular to a power supply structure for integrated chip systems, including a power management system, an intermediary layer and an integrated chip system, the intermediary layer includes a substrate layer, an RDL layer, and can vertically penetrate through the intermediary The vertical connection structure of the layer, the upper and lower ends of the vertical connection structure are respectively provided with interconnectors, the power management system is connected to the upper end of the vertical connection structure through the interconnectors, and the integrated chip system is connected through The interconnector is connected to the lower end of the vertical connection structure. This structure can realize the high-density interconnection between the power management system and the integrated chip system through the 2.5D interposer technology, which meets the demand of the integrated chip system for the power supply voltage, and can achieve the effect of small package size and high quality of electrical signal transmission .

Figure 202310194235

Description

一种面向集成化芯片系统的供电结构A Power Supply Structure Oriented to Integrated Chip System

技术领域technical field

本发明涉及半导体技术领域,尤其涉及一种面向集成化芯片系统的供电结构。The invention relates to the technical field of semiconductors, in particular to a power supply structure oriented to an integrated chip system.

背景技术Background technique

目前,随着人工智能对运算速度的要求不断提升,集成化芯片已经成为提高芯片算力的有效方案。芯片工艺中,先进光刻机单次曝光所能支持的最大区域面积(Reticlesize)为3.3cm×2.6cm,这样一次最大面积曝光将形成至少一个器件设计(Die)。面积大于3.3cm×2.6cm的芯片包含多个Die,因此称这样的芯片为集成化芯片。集成化芯片能够同时实现多个Die的功能,并减少Die间通信带宽的限制,从而获得带宽提升。At present, with the continuous improvement of artificial intelligence's requirements for computing speed, integrated chips have become an effective solution to improve chip computing power. In the chip process, the maximum area (Reticlesize) that an advanced lithography machine can support for a single exposure is 3.3cm×2.6cm, so that one maximum area exposure will form at least one device design (Die). A chip with an area larger than 3.3cm×2.6cm contains multiple Dies, so such a chip is called an integrated chip. The integrated chip can realize the functions of multiple Dies at the same time, and reduce the limitation of communication bandwidth between Dies, so as to obtain bandwidth improvement.

多个封装在同一基板上的逻辑芯片组成的芯片集合与以上所述集成化芯片呈现类似的结构与功能,故本发明称这两种结构为集成化芯片系统,如图1所示;为了表达方便,本发明将集成化芯片系统的重复性单元称为Tile。对于集成化芯片而言,芯片中的一个Die就是一个Tile;对于芯片集合而言,集合中的一个芯片就是一个Tile。A chip set composed of a plurality of logic chips packaged on the same substrate has a similar structure and function to the above-mentioned integrated chip, so the present invention refers to these two structures as an integrated chip system, as shown in Figure 1; in order to express For convenience, the present invention refers to the repetitive unit of the integrated chip system as Tile. For an integrated chip, a Die in the chip is a Tile; for a chip collection, a chip in the collection is a Tile.

参考文献Designing a 2048-Chiplet,14336-Core Waferscale ProcesSor,集成化芯片系统主要有横向供电和垂直供电两种供电方案。其中横向供电方案选用DC-DC降压转换器作为电源管理模块,并将其设置在集成化芯片系统的水平相邻位置,电信号通过集成化芯片系统四周的电源管脚进入,再通过片上电源走线传输至芯片系统上的各个Tile;垂直供电方案选用基于LDO电路的电源管理模块,并将其设置在集成化芯片系统上,电信号直接垂直进入各个Tile的电源管脚。垂直供电方法相比横向供电方法的优点包括:References Designing a 2048-Chiplet, 14336-Core Waferscale ProcesSor, the integrated chip system mainly has two power supply schemes: horizontal power supply and vertical power supply. Among them, the horizontal power supply scheme uses a DC-DC step-down converter as the power management module, and sets it at the horizontal adjacent position of the integrated chip system. The electrical signal enters through the power pins around the integrated chip system, and then passes through the on-chip power supply. The wires are transmitted to each Tile on the chip system; the vertical power supply scheme selects a power management module based on an LDO circuit and sets it on the integrated chip system, and the electrical signal directly vertically enters the power pins of each Tile. Advantages of the vertical power delivery method over the horizontal power delivery method include:

(1)避免使用DC-DC降压转换器中的大面积片外器件,如电感和电容,节约了封装的面积;(1) Avoid using large-area off-chip devices in the DC-DC step-down converter, such as inductors and capacitors, which saves the package area;

(2)片上电源走线产生的PDN阻抗会导致位于芯片系统边缘的Tile与位于中心的Tile形成IR-Drop的较大差别,可能引发多Tile系统的时序问题和信号完整性问题,而垂直供电可以避免这一点。因此,采用片上LDO芯片为集成化芯片系统垂直供电已成为主流的供电方案。(2) The PDN impedance generated by the on-chip power supply wiring will cause a large difference in IR-Drop between the Tile at the edge of the chip system and the Tile at the center, which may cause timing problems and signal integrity problems in the multi-Tile system. Vertical power supply This can be avoided. Therefore, using an on-chip LDO chip to provide vertical power supply for an integrated chip system has become a mainstream power supply solution.

如图2所示,利用硅通孔技术(Through Silicon Via,TSV)完成多个LDO芯片向集成化芯片系统供电是可选方案之一。然而,TSV的制作工艺复杂,将会大幅提高芯片封装的工艺成本。2.5DIC设计中的中介层技术可以避免采用TSV。如图3所示,中介层技术将LDO芯片102、103、104并排水平放置在中介层109顶部,而集成化芯片105位于中介层底部。各个LDO芯片与集成化芯片105通过中介层109中的垂直结构107互连,从而分别对集成化芯片中各个Tile进行供电。所述中介层可以选用硅以外的材料制作,因此能够避免TSV的使用,显著减少成本。As shown in FIG. 2 , using a through silicon via (TSV) technology (Through Silicon Via, TSV) to complete multiple LDO chips to supply power to the integrated chip system is one of the options. However, the manufacturing process of TSV is complicated, which will greatly increase the process cost of chip packaging. Interposer technology in 2.5DIC design can avoid TSV. As shown in FIG. 3 , the interposer technology places the LDO chips 102 , 103 , 104 side by side horizontally on the top of the interposer 109 , and the integrated chip 105 is located at the bottom of the interposer. Each LDO chip is interconnected with the integrated chip 105 through the vertical structure 107 in the interposer 109 , so as to supply power to each Tile in the integrated chip. The interposer can be made of materials other than silicon, so the use of TSVs can be avoided and the cost can be significantly reduced.

目前,集成化芯片借助中介层技术完成PDN设计的困难主要体现为LDO芯片的设计复杂性。如图3所示,中介层109中包含重布线层(RDL层),所述RDL层用于将直流电源提供的电压和接地信号从中介层两边传递至各个LDO芯片,形成结构的全局PDN。全局PDN中各个LDO芯片的金属走线长度不同,因此产生不同的走线压降,导致各个LDO芯片输入电压的差异。然而同构的集成化芯片场景要求各Tile有相同的电压输入,则各个LDO芯片需要在输入电压差异较大的情况下输出相同的电压,这提高了LDO设计的难度。在此基础上,如何设计与控制全局PDN从而降低LDO芯片的设计复杂性已经成为集成化芯片系统PDN设计的关键。At present, the difficulty in completing the PDN design of an integrated chip with the help of interposer technology is mainly reflected in the design complexity of the LDO chip. As shown in FIG. 3 , the interposer 109 includes a redistribution layer (RDL layer), and the RDL layer is used to transmit the voltage and ground signals provided by the DC power supply to each LDO chip from both sides of the interposer to form a global PDN of the structure. The lengths of metal wires of each LDO chip in the global PDN are different, so different wire voltage drops are generated, resulting in differences in input voltages of each LDO chip. However, the homogeneous integrated chip scenario requires that each tile has the same voltage input, and each LDO chip needs to output the same voltage when the input voltage differs greatly, which increases the difficulty of LDO design. On this basis, how to design and control the global PDN so as to reduce the design complexity of the LDO chip has become the key to the PDN design of the integrated chip system.

发明内容Contents of the invention

本发明的目的在于克服上述现有技术的问题,提供了一种面向集成化芯片系统的供电结构,本供电结构不仅能够有效降低集成化芯片系统场景的供电成本,而且能够实现结构中电源管理系统中各个电源管理模块的同一压降,从而降低电源管理系统的设计复杂度。The purpose of the present invention is to overcome the above-mentioned problems in the prior art and provide a power supply structure for integrated chip systems. The same voltage drop of each power management module in the power management system, thereby reducing the design complexity of the power management system.

上述目的是通过以下技术方案来实现:Above-mentioned purpose is to realize through following technical scheme:

一种面向集成化芯片系统的供电结构,包括电源管理系统、中介层和集成化芯片系统,所述中介层包括基板层、RDL层和可垂直贯穿所述中介层的垂直连接结构,所述垂直连接结构的上下两端分别设置有互连件,所述电源管理系统通过所述互连件与所述垂直连接结构的上端连接,所述集成化芯片系统通过所述互连件与所述垂直连接结构的下端连接。A power supply structure oriented to an integrated chip system, including a power management system, an intermediary layer and an integrated chip system, the intermediary layer including a substrate layer, an RDL layer and a vertical connection structure that can vertically penetrate through the intermediary layer, the vertical The upper and lower ends of the connection structure are respectively provided with interconnectors, the power management system is connected to the upper end of the vertical connection structure through the interconnectors, and the integrated chip system is connected to the vertical Connect the lower end of the structure.

进一步地,所述RDL层由多层金属层以及相邻所述金属层之间的绝缘介质层依次铺设而成,构成“金属-介质-金属”的典型电容器结构;在所述金属层上设置有金属走线,在所述绝缘介质层中设置有导电通孔,所述导电通孔连接相邻金属层上的所述金属走线;Further, the RDL layer is formed by successively laying multiple layers of metal layers and insulating dielectric layers between adjacent metal layers, forming a typical capacitor structure of "metal-dielectric-metal"; setting on the metal layer There are metal traces, and conductive vias are provided in the insulating medium layer, and the conductive vias are connected to the metal traces on adjacent metal layers;

所述基板层设置于所述RDL层下方,用于承载所述RDL层及实现所述RDL层与所述集成化芯片系统的连接。The substrate layer is arranged under the RDL layer, and is used for carrying the RDL layer and realizing the connection between the RDL layer and the integrated chip system.

进一步地,所述电源管理系统中执行电压变换的电路为LDO电路,所述LDO电路能够提供稳定的电压输出;Further, the circuit performing voltage conversion in the power management system is an LDO circuit, and the LDO circuit can provide a stable voltage output;

所述电源管理系统为由多个所述LDO电路组成的分布式电源管理芯片,或者是由多个所述分布式电源管理芯片组成的芯片集合。The power management system is a distributed power management chip composed of multiple LDO circuits, or a chip set composed of multiple distributed power management chips.

进一步地,还包括可提供直流电源的全局电源,所述全局电源将直流电源沿所述中介层的边沿输入;所述RDL层中的所述金属走线及所述导电通孔将所述全局电源供给的电压和接地信号连接至所述电源管理系统,形成本结构的全局PDN;所述电源管理系统的输出电压分别通过所述中介层中的所述垂直连接件传递给所述集成化芯片系统,形成局部PDN。Further, it also includes a global power supply that can provide a DC power supply, and the global power supply inputs the DC power supply along the edge of the interposer layer; the metal traces and the conductive vias in the RDL layer connect the global power supply The voltage and ground signal of the power supply are connected to the power management system to form the global PDN of this structure; the output voltage of the power management system is transmitted to the integrated chip through the vertical connectors in the interposer respectively system to form a local PDN.

进一步地,在所述RDL层顶部所述的金属层上设置有若干导电衬垫,所述导电衬垫用于承载设置于所述电源管理系统下方的所述互连件,并构成电气连接。Further, a plurality of conductive pads are disposed on the metal layer on the top of the RDL layer, and the conductive pads are used to carry the interconnection element disposed under the power management system and form an electrical connection.

进一步地,所述互连件为微凸块,所述微凸块为铜柱、焊球、可控坍塌芯片连接结构中的一种或多种的组合。Further, the interconnection is a micro-bump, and the micro-bump is a combination of one or more of copper pillars, solder balls, and controllable collapse chip connection structures.

进一步地,所述集成化芯片系统指尺寸大于3.3cm×2.6cm的逻辑芯片,或者是由多个封装在同一基板上的所述逻辑芯片组成的芯片集合。Further, the integrated chip system refers to a logic chip with a size larger than 3.3cm×2.6cm, or a chip assembly composed of multiple logic chips packaged on the same substrate.

进一步地,所述基板层为玻璃基板、或陶瓷基板、或绝缘复合层。Further, the substrate layer is a glass substrate, or a ceramic substrate, or an insulating composite layer.

进一步地,所述RDL层中的所述金属层的层数至少为两层,所述绝缘介质层的层数至少为一层,且所述RDL层的顶部和底部必须为所述金属层。Further, the number of the metal layer in the RDL layer is at least two, the number of the insulating medium layer is at least one, and the top and bottom of the RDL layer must be the metal layer.

进一步地,所述绝缘介质的材料包括但不限于聚酰亚胺、二氧化硅。Further, the material of the insulating medium includes but not limited to polyimide and silicon dioxide.

有益效果Beneficial effect

本发明所提供的一种面向集成化芯片系统的供电结构,通过2.5D中介层技术能够实现电源管理系统与集成化芯片系统的高密度互连,满足了集成化芯片系统对供电电压的需求,并且能够实现封装体积小、电信号传输质量高的效果。The power supply structure oriented to the integrated chip system provided by the present invention can realize the high-density interconnection between the power management system and the integrated chip system through the 2.5D interposer technology, and meets the demand of the integrated chip system for the power supply voltage. In addition, the effects of small packaging volume and high electrical signal transmission quality can be achieved.

附图说明Description of drawings

图1为本发明所述一种面向集成化芯片系统的供电结构的系统示意图,其中(a)为集成化芯片;(b)为芯片集合;Fig. 1 is a system schematic diagram of a power supply structure oriented to an integrated chip system according to the present invention, wherein (a) is an integrated chip; (b) is a chip set;

图2为相关技术提供的一种堆叠芯片的供电结构示意图;FIG. 2 is a schematic diagram of a power supply structure of a stacked chip provided by the related art;

图3为本发明所述一种面向集成化芯片系统的供电结构的第一种封装结构示意图;3 is a schematic diagram of a first packaging structure of a power supply structure oriented to an integrated chip system according to the present invention;

图4为本发明所述一种面向集成化芯片系统的供电结构的第二种封装结构示意图;4 is a schematic diagram of a second package structure of a power supply structure oriented to an integrated chip system according to the present invention;

图5为本发明所述一种面向集成化芯片系统的供电结构的第三种封装结构示意图;5 is a schematic diagram of a third package structure of a power supply structure oriented to an integrated chip system according to the present invention;

图6为本发明所述一种面向集成化芯片系统的供电结构的第四种封装结构示意图;6 is a schematic diagram of a fourth package structure of a power supply structure oriented to an integrated chip system according to the present invention;

图7为本发明所述一种面向集成化芯片系统的供电结构的第一种封装结构对应的俯视图;7 is a top view corresponding to the first packaging structure of a power supply structure oriented to an integrated chip system according to the present invention;

图8为本发明所述一种面向集成化芯片系统的供电结构中中介层的第一种结构示意图;8 is a schematic diagram of a first structure of an intermediary layer in a power supply structure oriented to an integrated chip system according to the present invention;

图9为本发明所述一种面向集成化芯片系统的供电结构中中介层的第二种结构示意图。FIG. 9 is a schematic diagram of a second structure of an intermediary layer in a power supply structure oriented to an integrated chip system according to the present invention.

图示标记说明Icon mark description

101-第一种封装结构、102-第一电源管理芯片、103-第二电源管理芯片、104-第三电源管理芯片、105集成化芯片、106-第一微凸块、107-垂直连接结构、108-第二微凸块、109-中介层、110-RDL层、111-第一走线结构、112-第二走线结构、113-第三走线结构、121-导电衬垫、123-导电通孔、124-基板层、201-第二种封装结构、202-分布式电源芯片、301-第三种封装结构、302-逻辑芯片、401-第四种封装结构。101-first package structure, 102-first power management chip, 103-second power management chip, 104-third power management chip, 105 integrated chip, 106-first micro bump, 107-vertical connection structure , 108-second microbump, 109-intermediate layer, 110-RDL layer, 111-first wiring structure, 112-second wiring structure, 113-third wiring structure, 121-conductive pad, 123 - Conductive vias, 124 - Substrate layer, 201 - Second packaging structure, 202 - Distributed power chip, 301 - Third packaging structure, 302 - Logic chip, 401 - Fourth packaging structure.

具体实施方式Detailed ways

下面根据附图和实施例对本发明作进一步详细说明。所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其它实施例,都属于本发明保护的范围。The present invention will be described in further detail below according to the drawings and embodiments. The described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

如图3~6所示,一种面向集成化芯片系统的供电结构,包括电源管理系统、中介层109和集成化芯片系统,所述中介层109包括基板层124、RDL层110和可垂直贯穿所述中介层109的垂直连接结构107,所述垂直连接结构107的上下两端分别设置有互连件,所述电源管理系统通过所述互连件与所述垂直连接结构107的上端连接,所述集成化芯片系统通过所述互连件与所述垂直连接结构107的下端连接。As shown in Figures 3 to 6, a power supply structure for an integrated chip system includes a power management system, an interposer 109, and an integrated chip system. The interposer 109 includes a substrate layer 124, an RDL layer 110, and a The vertical connection structure 107 of the intermediary layer 109, the upper and lower ends of the vertical connection structure 107 are respectively provided with interconnectors, the power management system is connected to the upper end of the vertical connection structure 107 through the interconnectors, The integrated chip system is connected to the lower end of the vertical connection structure 107 through the interconnection.

其中,所述RDL层110由多层金属层以及相邻所述金属层之间的绝缘介质层依次铺设而成,构成“金属-介质-金属”的典型电容器结构;在所述金属层上设置有金属走线,在所述绝缘介质层中设置有导电通孔123,所述导电通孔123连接相邻金属层上的所述金属走线;Wherein, the RDL layer 110 is formed by sequentially laying multiple metal layers and insulating dielectric layers between adjacent metal layers, forming a typical capacitor structure of "metal-dielectric-metal"; There are metal traces, and conductive vias 123 are provided in the insulating medium layer, and the conductive vias 123 are connected to the metal traces on adjacent metal layers;

所述基板层124设置于所述RDL层110的下方,用于承载所述RDL层110及实现所述RDL层110与所述集成化芯片系统的连接。The substrate layer 124 is disposed under the RDL layer 110 for carrying the RDL layer 110 and realizing the connection between the RDL layer 110 and the integrated chip system.

所述互连件为微凸块,所述微凸块为铜柱、焊球、可控坍塌芯片连接结构中的一种或多种的组合。The interconnection is a micro-bump, and the micro-bump is a combination of one or more of copper pillars, solder balls, and controllable collapse chip connection structures.

所述电源管理系统中执行电压变换的电路是低压降线性电压变换器(Low Drop-Out Voltage Regulator,LDO),所述LD0电路能够提供稳定的电压输出;The circuit performing voltage conversion in the power management system is a low drop-out linear voltage converter (Low Drop-Out Voltage Regulator, LDO), and the LDO circuit can provide a stable voltage output;

所述电源管理芯片系统指的是由多个LDO电路组成的分布式电源管理芯片,或者是由多个电源管理芯片组成的芯片集合;为了表达方便,本发明将电源管理系统的重复性单元称为模块。对于分布式电源管理芯片而言,芯片中的一个LDO电路就是一个模块;对于芯片集合而言,集合中的一个芯片就是一个模块。The power management chip system refers to a distributed power management chip composed of multiple LDO circuits, or a chip set composed of multiple power management chips; for the convenience of expression, the present invention refers to the repetitive unit of the power management system as for the module. For a distributed power management chip, an LDO circuit in the chip is a module; for a chip set, a chip in the set is a module.

本供电结构的全局电源由所述中介层的边沿输入;所述RDL层中的金属走线及通孔将直流电源供给的电压和接地信号连接至电源管理系统中的各个模块,形成本结构的全局PDN;所述电源管理系统中各个模块的输出电压分别通过所述中介层中的垂直连接件传递给所述集成化芯片系统中的各个Tile,形成各个Tile的局部PDN。The global power supply of this power supply structure is input from the edge of the intermediary layer; the metal traces and through holes in the RDL layer connect the voltage supplied by the DC power supply and the ground signal to each module in the power management system, forming the structure of this structure Global PDN: the output voltage of each module in the power management system is transmitted to each Tile in the integrated chip system through the vertical connectors in the interposer, forming a local PDN of each Tile.

具体的,如图3所示,本实例提供了第一种封装结构101,其中集成化芯片系统是单颗集成化芯片105,电源管理系统为三个电源管理芯片,包括第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104组成的芯片集合。所述第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104水平设置于中介层109的上表面,集成化芯片105作为供电负载芯片设置于中介层109的下表面。所述第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104分别经由第一微凸块106连接至所述中介层109;所述集成化芯片105通过第二微凸块108连接至所述中介层109。图7为第一种封装结构101的俯视图。Specifically, as shown in FIG. 3 , this example provides a first package structure 101, wherein the integrated chip system is a single integrated chip 105, and the power management system is three power management chips, including the first power management chip 102 , a chip set composed of the second power management chip 103 and the third power management chip 104 . The first power management chip 102 , the second power management chip 103 , and the third power management chip 104 are horizontally arranged on the upper surface of the interposer 109 , and the integrated chip 105 is arranged on the lower surface of the interposer 109 as a power supply load chip. The first power management chip 102, the second power management chip 103, and the third power management chip 104 are respectively connected to the interposer 109 via the first micro-bump 106; 108 is connected to the interposer 109 . FIG. 7 is a top view of the first package structure 101 .

本实例设置所述集成化芯片105为同构的多Tile系统,即集成化芯片105包括三个完全相同Tile。所述第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104为电源管理系统的模块,则本结构中电源管理系统的三个模块分别向集成化芯片的三个Tile供给相同电压。In this example, the integrated chip 105 is set as an isomorphic multi-Tile system, that is, the integrated chip 105 includes three identical tiles. The first power management chip 102, the second power management chip 103, and the third power management chip 104 are modules of the power management system, and the three modules of the power management system in this structure supply the three tiles of the integrated chip respectively. same voltage.

本发明所述各个电源管理芯片指的是能够将源电压转换为目标芯片所需电压的芯片。电源管理芯片的主要电路是DC-DC变换电路,其中LDO和DC-DC降压转换器是最常见的DC-DC变换器。相比DC-DC降压转换器,LDO能够避免外围元器件对面积的过度占用,因此本发明实例第一种封装结构101中的第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104正是基于LDO类型电路的电源管理芯片。Each power management chip mentioned in the present invention refers to a chip capable of converting a source voltage into a voltage required by a target chip. The main circuit of the power management chip is the DC-DC conversion circuit, among which LDO and DC-DC step-down converter are the most common DC-DC converters. Compared with the DC-DC step-down converter, the LDO can avoid excessive occupation of the area by peripheral components, so the first power management chip 102, the second power management chip 103, and the third power management chip 103 in the first package structure 101 of the example of the present invention The power management chip 104 is exactly a power management chip based on an LDO type circuit.

在一个具体的实施例中,如图4所示,第二种封装结构201中,电源管理系统不是多个LDO芯片的集合,而是由多个LDO电路组成的单个分布式电源芯片202。所述分布式电源芯片202中的各个LDO电路结构被称为电源管理系统的模块。与第一种封装结构101类似,电源管理系统中的各个模块分别向集成化芯片的各个Tile供给相同电压。In a specific embodiment, as shown in FIG. 4 , in the second package structure 201 , the power management system is not a collection of multiple LDO chips, but a single distributed power chip 202 composed of multiple LDO circuits. Each LDO circuit structure in the distributed power supply chip 202 is called a module of the power management system. Similar to the first packaging structure 101 , each module in the power management system supplies the same voltage to each Tile of the integrated chip respectively.

在一个具体的实施例中,如图5所示,第三种封装结构301中,集成化芯片系统不是单个集成化芯片,而是由多个封装在同一基板上的逻辑芯片302组成的芯片集合。所述逻辑芯片302是集成化芯片系统的Tile,电源管理系统中的第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104分别为各个Tile供给相同电压。In a specific embodiment, as shown in FIG. 5, in the third package structure 301, the integrated chip system is not a single integrated chip, but a chip set composed of multiple logic chips 302 packaged on the same substrate. . The logic chip 302 is a Tile of the integrated chip system, and the first power management chip 102 , the second power management chip 103 , and the third power management chip 104 in the power management system respectively supply the same voltage to each Tile.

在一个具体的实施例中,如图6所示,第四种封装结构401中,集成化芯片是由多个封装在同一基板上的逻辑芯片302组成的芯片集合,电源管理系统是由多个LDO电路组成的单个分布式电源芯片202。所述逻辑芯片302是集成化芯片系统的Tile,所述电源芯片202中的各个LDO电路结构被是电源管理系统的各个模块,各个模块分别向各个Tile供给相同电压。In a specific embodiment, as shown in FIG. 6, in the fourth packaging structure 401, the integrated chip is a chip set composed of multiple logic chips 302 packaged on the same substrate, and the power management system is composed of multiple A single distributed power supply chip 202 composed of LDO circuits. The logic chip 302 is a Tile of the integrated chip system, and each LDO circuit structure in the power chip 202 is each module of the power management system, and each module supplies the same voltage to each Tile.

应理解,本发明并不对集成化芯片系统中Tile的数量和电源管理系统中模块的数量加以限制,在工艺能够做到且满足物理约束和基础功能的情况下,本发明中集成化芯片系统中Tile的数量和电源管理系统中模块的数量可以为大于一的任何合理数字。It should be understood that the present invention does not limit the number of tiles in the integrated chip system and the number of modules in the power management system. If the process can be achieved and the physical constraints and basic functions are satisfied, the integrated chip system in the present invention The number of tiles and the number of modules in the power management system can be any reasonable number greater than one.

本发明将对图3所示结构101进行详细说明。图中第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104的部分管脚通过中介层109中的垂直连接结构107和第一微凸块106、第二微凸块108与所述集成化芯片105连接,从而形成各个所述电源管理芯片分别向所述集成化芯片105中各个Tile供给电压的电气路径,即本结构的局部PDN。The present invention will describe the structure 101 shown in FIG. 3 in detail. In the figure, some pins of the first power management chip 102, the second power management chip 103, and the third power management chip 104 pass through the vertical connection structure 107 in the intermediary layer 109 and the first micro-bump 106 and the second micro-bump 108 It is connected with the integrated chip 105 to form an electrical path for each of the power management chips to supply voltage to each Tile in the integrated chip 105 , that is, the local PDN of this structure.

全局电源向所述第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104的供电通过所述中介层109中的RDL层110进完成,因此RDL层110中的导电结构又称为全局PDN。The power supply from the global power supply to the first power management chip 102, the second power management chip 103, and the third power management chip 104 is completed through the RDL layer 110 in the intermediary layer 109, so the conductive structure in the RDL layer 110 is It is called global PDN.

如图7所示,RDL层110中的导电结构包括第一走线结构111、第二走线结构112、第三走线结构113以及相关的导电通孔,其中第一走线结构111、第二走线结构112、第三走线结构113分别连接至电源管理芯片(第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104)。所述第一走线结构111、第二走线结构112、第三走线结构113均包括多条金属走线,所述金属走线将电压或接地信号由直流电源传递给各个所述电源芯片。As shown in FIG. 7, the conductive structure in the RDL layer 110 includes a first wiring structure 111, a second wiring structure 112, a third wiring structure 113 and related conductive vias, wherein the first wiring structure 111, the second wiring structure The second wiring structure 112 and the third wiring structure 113 are respectively connected to power management chips (the first power management chip 102 , the second power management chip 103 , and the third power management chip 104 ). The first wiring structure 111, the second wiring structure 112, and the third wiring structure 113 each include a plurality of metal wirings, and the metal wirings transmit voltage or ground signals from the DC power supply to each of the power chips .

应理解,图中各走线的数量和布线情况只起示范作用,表明连接关系,并不代表实际的走线。It should be understood that the number and wiring situation of each trace in the figure is only for demonstration, indicating the connection relationship, and does not represent the actual trace.

以上,本发明实例所提出的第一种封装结构101借助2.5D中介层技术和RDL技术为所述集成化芯片105提供的PDN为:各个所述第一电源管理芯片102、第二电源管理芯片103、第三电源管理芯片104分别通过RDL层110中的第一走线结构111、第二走线结构112、第三走线结构113从全局电源获得源电压信号后,输出相同的稳定电压,并通过中介层109中的垂直连接结构107将电压分别传递给目标集成化芯片105中的各个Tile。Above, the first package structure 101 proposed in the example of the present invention provides the PDN for the integrated chip 105 by means of 2.5D interposer technology and RDL technology: each of the first power management chip 102 and the second power management chip 103. After the third power management chip 104 obtains the source voltage signal from the global power supply through the first wiring structure 111, the second wiring structure 112, and the third wiring structure 113 in the RDL layer 110, output the same stable voltage, And the voltage is transmitted to each Tile in the target integrated chip 105 through the vertical connection structure 107 in the interposer 109 .

如图8所示,展示了所述第一种封装结构101中介层的细节示意图。As shown in FIG. 8 , a detailed schematic diagram of the interposer of the first packaging structure 101 is shown.

在本实例中,RDL层110包括两层金属层ML1和ML2,两层金属间填充着绝缘介质,形成绝缘介质层DL。所述金属层ML1和ML2上刻蚀的金属走线构成所述第一走线结构111、第二走线结构112、第三走线结构113,因此金属层ML1和金属层ML2也可称为第一布线层和第二布线层。所述布线层之间的垂直连接由绝缘介质层DL中的导电通孔123完成。所述第二布线层ML2顶部设置有多个导电衬垫121,所述导电衬垫121用于承载各个电源管理芯片的第一微凸块106,并实现所述第一微凸块106与第二布线层ML2中走线结构的电气连接。所述第二布线层ML2底部设置有基板层124,第二微凸块108设置在基板层124与集成化芯片105之间。In this example, the RDL layer 110 includes two metal layers ML1 and ML2, and an insulating medium is filled between the two metal layers to form an insulating medium layer DL. The metal traces etched on the metal layers ML1 and ML2 constitute the first trace structure 111, the second trace structure 112, and the third trace structure 113, so the metal layer ML1 and the metal layer ML2 can also be referred to as The first wiring layer and the second wiring layer. The vertical connection between the wiring layers is completed by the conductive via 123 in the insulating dielectric layer DL. The top of the second wiring layer ML2 is provided with a plurality of conductive pads 121, and the conductive pads 121 are used to carry the first micro-bumps 106 of each power management chip, and realize the connection between the first micro-bumps 106 and the first micro-bumps 106. The electrical connection of the wiring structure in the second wiring layer ML2. A substrate layer 124 is disposed at the bottom of the second wiring layer ML2 , and the second micro-bump 108 is disposed between the substrate layer 124 and the integrated chip 105 .

如图3、7和8所示,所述走线结构111将直流电源提供的电压和接地信号传递给某个导电衬垫121,导电衬垫121连接至某个第一微凸块106,所述第一微凸块106连接至所述电源管理芯片102的一个电源引脚,如此形成对所述电源管理芯片102供电的PDN;所述电源管理芯片102通过第一微凸块106、中介层中的垂直连接结构107、第二微凸块108将电压信号传递至集成化芯片105,如此实现对所述集成化芯片105供电的PDN。其余电源管理芯片同理。As shown in Figures 3, 7 and 8, the wiring structure 111 transmits the voltage and the ground signal provided by the DC power supply to a certain conductive pad 121, and the conductive pad 121 is connected to a certain first micro-bump 106, so The first micro-bump 106 is connected to a power supply pin of the power management chip 102, thus forming a PDN for supplying power to the power management chip 102; The vertical connection structure 107 and the second micro-bump 108 transmit the voltage signal to the integrated chip 105 , thus realizing the PDN for supplying power to the integrated chip 105 . The rest of the power management chips are the same.

应理解,只要保证相邻的金属层由绝缘介质间隔,本发明并不对RDL层的层叠结构作限制。例如,在一些实例中,本发明的RDL层110可以由四层金属层和三层绝缘介质层组成,如图9所示。It should be understood that the present invention is not limited to the stacked structure of the RDL layers as long as adjacent metal layers are separated by an insulating medium. For example, in some examples, the RDL layer 110 of the present invention may consist of four metal layers and three insulating dielectric layers, as shown in FIG. 9 .

本实施例中,各个所述电源管理芯片采用倒装芯片(FlipChip)技术进行封装,但在一些可能的实施例中也可以通过引线键合或其他等效技术封装。同时,各个芯片与中介层之间的互连结构并无限制,例如第一微凸块106和第二微凸块108可以更改为铜柱、焊球、可控坍塌芯片连接结构中的一种或多种的组合。In this embodiment, each of the power management chips is packaged by flip chip (FlipChip) technology, but in some possible embodiments, it may also be packaged by wire bonding or other equivalent technology. At the same time, the interconnection structure between each chip and the interposer is not limited. For example, the first micro-bump 106 and the second micro-bump 108 can be changed to one of copper pillars, solder balls, and controllable collapse chip connection structures. or a combination of several.

在结构材料的选择上,本发明采用玻璃基板、陶瓷基板或相似的的复合层作为基板层;所述RDL层110,导电结构的组成材料包括但不限于铜、金,绝缘介质的材料包括但不限于聚酰亚胺、二氧化硅。In the selection of structural materials, the present invention uses glass substrates, ceramic substrates or similar composite layers as the substrate layer; the RDL layer 110, the constituent materials of the conductive structure include but not limited to copper and gold, and the materials of the insulating medium include but Not limited to polyimide, silica.

本发明利用2.5D中介层技术和RDL技术,实现了电源管理系统与集成化芯片系统的高密度互连,满足了所述集成化芯片系统对供电电压的需求,并且有封装体积小、电信号传输质量高的优点。The present invention utilizes 2.5D interposer technology and RDL technology to realize the high-density interconnection between the power management system and the integrated chip system, which meets the demand of the integrated chip system for the power supply voltage, and has small packaging volume, high electrical signal The advantage of high transmission quality.

以上所述仅为说明本发明的实施方式,并不用于限制本发明,对于本领域的技术人员来说,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above description is only to illustrate the implementation of the present invention, and is not intended to limit the present invention. For those skilled in the art, any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention, All should be included within the protection scope of the present invention.

Claims (10)

1.一种面向集成化芯片系统的供电结构,其特征在于,包括电源管理系统、中介层和集成化芯片系统,所述中介层包括基板层、RDL层和可垂直贯穿所述中介层的垂直连接结构,所述垂直连接结构的上下两端分别设置有互连件,所述电源管理系统通过所述互连件与所述垂直连接结构的上端连接,所述集成化芯片系统通过所述互连件与所述垂直连接结构的下端连接。1. A power supply structure for an integrated system-on-a-chip, characterized in that it includes a power management system, an interposer and an integrated system-on-a-chip, and the interposer includes a substrate layer, an RDL layer, and a vertical layer that can vertically penetrate through the intermediary layer connection structure, the upper and lower ends of the vertical connection structure are respectively provided with interconnectors, the power management system is connected to the upper end of the vertical connection structure through the interconnectors, and the integrated chip system is connected to the upper end of the vertical connection structure through the interconnection The connecting piece is connected with the lower end of the vertical connection structure. 2.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述RDL层由多层金属层以及相邻所述金属层之间的绝缘介质层依次铺设而成,构成“金属-介质-金属”的典型电容器结构;在所述金属层上设置有金属走线,在所述绝缘介质层中设置有导电通孔,所述导电通孔连接相邻金属层上的所述金属走线;2. The power supply structure for integrated chip systems according to claim 1, wherein the RDL layer is formed by sequentially laying multiple layers of metal layers and insulating dielectric layers between adjacent metal layers , constituting a typical capacitor structure of "metal-dielectric-metal"; metal traces are arranged on the metal layer, conductive vias are provided in the insulating dielectric layer, and the conductive vias are connected to adjacent metal layers The metal traces of the 所述基板层设置于所述RDL层下方,用于承载所述RDL层及实现所述RDL层与所述集成化芯片系统的连接。The substrate layer is arranged under the RDL layer, and is used for carrying the RDL layer and realizing the connection between the RDL layer and the integrated chip system. 3.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述电源管理系统中执行电压变换的电路为LDO电路,所述LDO电路能够提供稳定的电压输出;3. The power supply structure for an integrated chip system according to claim 1, wherein the circuit performing voltage conversion in the power management system is an LDO circuit, and the LDO circuit can provide a stable voltage output; 所述电源管理系统为由多个所述LDO电路组成的分布式电源管理芯片,或者是由多个所述分布式电源管理芯片组成的芯片集合。The power management system is a distributed power management chip composed of multiple LDO circuits, or a chip set composed of multiple distributed power management chips. 4.根据权利要求2所述的一种面向集成化芯片系统的供电结构,其特征在于,还包括可提供直流电源的全局电源,所述全局电源将直流电源沿所述中介层的边沿输入;所述RDL层中的所述金属走线及所述导电通孔将所述全局电源供给的电压和接地信号连接至所述电源管理系统,形成本结构的全局PDN;所述电源管理系统的输出电压分别通过所述中介层中的所述垂直连接件传递给所述集成化芯片系统,形成局部PDN。4. The power supply structure for an integrated chip system according to claim 2, further comprising a global power supply capable of providing DC power, and the global power supply inputs DC power along the edge of the intermediary layer; The metal traces and the conductive vias in the RDL layer connect the voltage and ground signal supplied by the global power supply to the power management system to form the global PDN of this structure; the output of the power management system The voltages are respectively transmitted to the integrated chip system through the vertical connections in the interposer to form a local PDN. 5.根据权利要求4所述的一种面向集成化芯片系统的供电结构,其特征在于,在所述RDL层顶部所述的金属层上设置有若干导电衬垫,所述导电衬垫用于承载设置于所述电源管理系统下方的所述互连件,并构成电气连接。5. The power supply structure for an integrated chip system according to claim 4, wherein a plurality of conductive pads are arranged on the metal layer on the top of the RDL layer, and the conductive pads are used for Carrying the interconnection element disposed under the power management system and forming an electrical connection. 6.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述互连件为微凸块,所述微凸块为铜柱、焊球、可控坍塌芯片连接结构中的一种或多种的组合。6. The power supply structure for an integrated chip system according to claim 1, wherein the interconnection is a micro-bump, and the micro-bump is a copper column, a solder ball, a controllable collapse chip One or more combinations of connection structures. 7.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述集成化芯片系统指尺寸大于3.3cm×2.6cm的逻辑芯片,或者是由多个封装在同一基板上的所述逻辑芯片组成的芯片集合。7. A power supply structure oriented to an integrated chip system according to claim 1, characterized in that, the integrated chip system refers to a logic chip with a size greater than 3.3cm×2.6cm, or a plurality of chips packaged in the same A chip assembly composed of the logic chips on the substrate. 8.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述基板层为玻璃基板、或陶瓷基板、或绝缘复合层。8 . The power supply structure for an integrated chip system according to claim 1 , wherein the substrate layer is a glass substrate, or a ceramic substrate, or an insulating composite layer. 9.根据权利要求1所述的一种面向集成化芯片系统的供电结构,其特征在于,所述RDL层中的所述金属层的层数至少为两层,所述绝缘介质层的层数至少为一层,且所述RDL层的顶部和底部必须为所述金属层。9. The power supply structure for an integrated chip system according to claim 1, wherein the metal layer in the RDL layer has at least two layers, and the insulating medium layer has two layers. At least one layer, and the top and bottom of the RDL layer must be the metal layer. 10.根据权利要求9所述的一种面向集成化芯片系统的供电结构,其特征在于,所述绝缘介质的材料包括但不限于聚酰亚胺、二氧化硅。10 . The power supply structure for an integrated chip system according to claim 9 , wherein the material of the insulating medium includes but not limited to polyimide and silicon dioxide. 11 .
CN202310194235.8A 2023-03-02 2023-03-02 Power supply structure for integrated chip system Pending CN116190346A (en)

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