CN116189403B - Method and device for testing limit parameters of alarm sensor and electronic equipment - Google Patents
Method and device for testing limit parameters of alarm sensor and electronic equipment Download PDFInfo
- Publication number
- CN116189403B CN116189403B CN202211640000.9A CN202211640000A CN116189403B CN 116189403 B CN116189403 B CN 116189403B CN 202211640000 A CN202211640000 A CN 202211640000A CN 116189403 B CN116189403 B CN 116189403B
- Authority
- CN
- China
- Prior art keywords
- test
- gear
- alarm sensor
- parameter
- parameters
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B29/00—Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
- G08B29/18—Prevention or correction of operating errors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
Abstract
The application relates to the technical field of alarm sensor testing, and discloses a method for testing limit parameters of an alarm sensor, which comprises the steps of obtaining gear distribution of the alarm sensor; the method comprises the steps of calculating first test parameters of the alarm sensor according to gear distribution, wherein the first test parameters are test parameters in an abnormal working parameter range of the alarm sensor, which are not easy to trigger, and performing traversal test on limit parameters of the alarm sensor based on the first test parameters. The first test parameters are the test parameters determined according to the gear distribution of the alarm sensor, so that the abnormal working parameter range of the alarm sensor is not easy to trigger, the occurrence of the test failure condition of the alarm sensor caused by the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved. The application also discloses a device for testing the limit parameters of the alarm sensor and electronic equipment.
Description
Technical Field
The application relates to the technical field of alarm sensor testing, in particular to a method and a device for testing limit parameters of an alarm sensor and electronic equipment.
Background
The chip alarm sensor is used for protecting the chip to work under normal external conditions. Under the condition that the normal working condition is exceeded, the corresponding chip alarm sensor is triggered, and the chip starts self-protection and stops working. For example, when the externally applied voltage of the chip is too low, the functions of the internal part of the chip may be abnormal, thereby causing abnormal operation of the chip. If the externally applied voltage of the chip is lower than the gear value configured by the low-voltage alarm sensor, the low-voltage alarm sensor is triggered at the moment, so that the chip starts self-protection and stops working.
In the process of testing limit parameters (such as low-voltage alarm parameters of each gear of a low-voltage alarm sensor) of the chip alarm sensor, expected non-alarm limit parameters and alarm limit parameters are applied to the alarm sensor, traversal test is carried out according to the mode that the gears are from large to small or from small to large, and whether each distribution gear of the alarm sensor meets alarm requirements is verified by judging alarm and non-alarm performance of the alarm sensor.
In the process of implementing the embodiments of the present disclosure, it is found that at least the following problems exist in the related art:
in the process of testing the limit parameters of the chip alarm sensor, the expected non-alarm limit parameters and the alarm limit parameters are directly applied to test. When the applied desired non-alarm/alarm parameters exceed the normal operating range of the chip alarm sensor, the chip alarm sensor is susceptible to test failure.
It should be noted that the information disclosed in the above background section is only for enhancing understanding of the background of the application and thus may include information that does not form the prior art that is already known to those of ordinary skill in the art.
Disclosure of Invention
The following presents a simplified summary in order to provide a basic understanding of some aspects of the disclosed embodiments. This summary is not an extensive overview, and is intended to neither identify key/critical elements nor delineate the scope of such embodiments, but is intended as a prelude to the more detailed description that follows.
The embodiment of the disclosure provides a method and a device for testing limit parameters of an alarm sensor and electronic equipment, so as to improve the test yield of the chip alarm sensor.
In some embodiments, a method for testing limit parameters of an alarm sensor includes obtaining a gear distribution of the alarm sensor, calculating a first test parameter of the alarm sensor according to the gear distribution, wherein the first test parameter is a test parameter of an abnormal operating parameter range of the alarm sensor that is not prone to triggering, and performing a traversal test on the limit parameters of the alarm sensor based on the first test parameter.
In some embodiments, an apparatus for testing alarm sensor limit parameters includes a processor and a memory storing program instructions, the processor being configured to perform the aforementioned method for testing alarm sensor limit parameters when the program instructions are executed.
In some embodiments, an electronic device includes an electronic device body, and the aforementioned means for testing alarm sensor limit parameters is mounted to the electronic device body.
The method and the device for testing the limit parameters of the alarm sensor and the electronic equipment provided by the embodiment of the disclosure can realize the following technical effects:
In the technical scheme, when the limit parameters of the alarm sensor are tested, first test parameters are calculated according to gear distribution of the alarm sensor, and then traversal test is conducted on the limit parameters of the alarm sensor based on the first test parameters. The first test parameters are the test parameters determined according to the gear distribution of the alarm sensor, so that the abnormal working parameter range of the alarm sensor is not easy to trigger, the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameters, the occurrence of the condition that the alarm sensor fails in test due to the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved.
The foregoing general description and the following description are exemplary and explanatory only and are not restrictive of the application.
Drawings
One or more embodiments are illustrated by way of example and not limitation in the figures of the accompanying drawings, in which like references indicate similar elements, and in which like reference numerals refer to similar elements, and in which:
FIG. 1 is a flow chart of a method for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;
FIG. 2 is a flow chart of another method for testing alarm sensor limit parameters provided by embodiments of the present disclosure;
FIG. 3 is a flow chart of another method for testing alarm sensor limit parameters provided by embodiments of the present disclosure;
FIG. 4 is a schematic diagram of a traversal of an alarm sensor provided by an embodiment of the present disclosure;
FIG. 5 is a schematic structural view of an apparatus for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure.
Detailed Description
So that the manner in which the features and techniques of the disclosed embodiments can be understood in more detail, a more particular description of the embodiments of the disclosure, briefly summarized below, may be had by reference to the appended drawings, which are not intended to be limiting of the embodiments of the disclosure. In the following description of the technology, for purposes of explanation, numerous details are set forth in order to provide a thorough understanding of the disclosed embodiments. However, one or more embodiments may still be practiced without these details. In other instances, well-known structures and devices may be shown simplified in order to simplify the drawing.
The terms first, second and the like in the description and in the claims of the embodiments of the disclosure and in the above-described figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate in order to describe embodiments of the present disclosure. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion.
The term "plurality" means two or more, unless otherwise indicated. In the embodiment of the present disclosure, the character "/" indicates that the front and rear objects are an or relationship. For example, A/B represents A or B. The term "and/or" is an associative relationship that describes an object, meaning that there may be three relationships. For example, A and/or B, represent A or B, or three relationships of A and B. The term "corresponding" may refer to an association or binding relationship, and the correspondence between a and B refers to an association or binding relationship between a and B.
Wafer testing is a very important test after wafer fabrication is complete. This test is a transcript of the wafer manufacturing process. During the test, the electrical capabilities and circuit functions of each chip are detected. Wafer testing is also known as die testing (die sort) or wafer sort. The test was for the following three purposes. First, the qualified chips are identified before the wafer is sent to the packaging factory. Second, the electrical parameters of the device/circuit are evaluated for characteristics. Engineers need to monitor the distribution of parameters to maintain the quality level of the process. Third, accounting of the pass and fail of the chip provides overall performance feedback to the wafer producer.
Referring to fig. 1, an embodiment of the disclosure provides a method for testing limit parameters of an alarm sensor in wafer testing, including the following steps:
s101, gear distribution of the alarm sensor is obtained.
The alarm sensor is a device for performing an alarm operation by sensing an applied parameter (e.g., voltage, current, temperature, etc.), such as a low-voltage alarm sensor/high-voltage alarm sensor, a high-current alarm sensor/low-current alarm sensor, a low-temperature alarm sensor/high-temperature alarm sensor, etc., without limitation.
The gear distribution of the alarm sensor is used for indicating the corresponding relation between each gear of the alarm sensor and the corresponding limit parameter.
Table 1 below shows a gear position distribution of an alternative low-voltage alarm sensor in which the design voltages of the respective gears are equally spaced apart by 0.05V between each two adjacent gears.
TABLE 1 Gear position distribution of Low pressure alarm sensor
The gear position distribution of the low-pressure alarm sensor shows the corresponding relation between each gear position of the low-pressure alarm sensor and the corresponding limit parameter.
Table 2 below shows a gear position distribution of an alternative high voltage alarm sensor in which the design voltages of the respective gears are non-equally arranged, the difference between every two adjacent gears not necessarily being the same.
TABLE 2 Gear distribution of high pressure alarm sensor
The gear position distribution of the high-pressure alarm sensor shows the corresponding relation between each gear position of the high-pressure alarm sensor and the corresponding limit parameter.
S102, calculating a first test parameter of the alarm sensor according to gear distribution, wherein the first test parameter is a test parameter which is not easy to trigger an abnormal working parameter range of the alarm sensor.
Here, the abnormal operating range parameter of the alarm sensor is an operating parameter range in which the chip of the alarm sensor is likely to function abnormally, resulting in test failure. For example, for a low voltage alarm sensor, if the test parameter that is expected to be applied is that the alarm voltage is not 1.13V, the alarm voltage is 1.08V, and 1.08V is too low, in the abnormal operating voltage range of the alarm sensor, exceeding the normal operating voltage may cause abnormal operation of the on-chip module of the alarm sensor, resulting in test failure. Therefore, the test parameters which are not easy to trigger the abnormal working parameter range of the alarm sensor are selected as the first test parameters to carry out the traversal test of the limit parameters of the alarm sensor.
S103, performing traversal test on the limit parameters of the alarm sensor based on the first test parameters.
Here, the limiting parameter is a boundary alarm threshold of the alarm sensor. The limit parameters of the alarm sensor include an upper limit parameter and a lower limit parameter. The upper limit parameter is the upper boundary alarm threshold of the alarm sensor, and the lower limit parameter is the lower boundary alarm threshold of the alarm sensor. For example, the limit parameter of the high-voltage alarm sensor is an upper limit parameter, and the limit parameter of the low-voltage alarm sensor is a lower limit parameter, and the limit parameter of the high-voltage alarm sensor is a high-voltage alarm threshold of the high-voltage alarm sensor.
Optionally, performing the traversal test on the limit parameter of the alarm sensor based on the first test parameter includes performing the traversal test on the upper limit parameter in order from the upper limit gear to the lower limit gear based on the first test parameter if the limit parameter of the alarm sensor is the upper limit parameter.
Optionally, performing the traversal test on the limit parameter of the alarm sensor based on the first test parameter includes performing the traversal test on the lower limit parameter in order from the lower limit gear to the upper limit gear based on the first test parameter if the limit parameter of the alarm sensor is the lower limit parameter.
For example, as shown in connection with fig. 4, for a four-byte gear high-pressure warning sensor, the traversal test is performed in order from the upper limit gear (high-pressure gear 0001) to the lower limit gear (low-pressure gear 1111) based on the first test parameter. For the low-pressure warning sensor of the four-byte range, the traversal test is performed in order from the lower limit range (low-pressure range 0001) to the upper limit range (high-pressure range 1111) based on the first test parameter.
According to different types of limit parameters of the alarm sensor, performing traversal tests according to different sequences, and determining a target test gear which meets expected results in a plurality of test gears by completing the traversal tests for a small number of times.
When the method for testing the limit parameters of the alarm sensor is adopted, when the limit parameters of the alarm sensor are tested, first test parameters are calculated according to gear distribution of the alarm sensor, and then traversal test is conducted on the limit parameters of the alarm sensor based on the first test parameters. The first test parameters are the test parameters determined according to the gear distribution of the alarm sensor, so that the abnormal working parameter range of the alarm sensor is not easy to trigger, the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameters, the occurrence of the condition that the alarm sensor fails in test due to the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved.
As shown in connection with fig. 2, an embodiment of the present disclosure provides a method for testing limit parameters of an alarm sensor, which calculates a first test parameter of the alarm sensor according to a gear distribution, comprising the steps of:
s201, obtaining limit alarm parameters of an alarm sensor.
The limit alarm parameter of the alarm sensor is the limit alarm design parameter value of the chip in the alarm sensor. For example, for a low-voltage alarm sensor, the limit alarm design parameter of a chip in the low-voltage alarm sensor is 1.1V, and when the externally applied voltage is lower than 1.1V, the low-voltage alarm sensor alarms.
S202, obtaining a gear distribution difference value of the gear distribution.
Optionally, obtaining a gear profile difference value of the gear profile includes calculating the gear profile difference value according to the following formula:
Wherein, Δp is the gear distribution difference, Δp 1 is the first gear distribution difference, Δp n is the nth gear distribution difference, n is the number of the gear distribution differences, and n is not less than 2.
For example, when n=2:
wherein Δp is a gear distribution difference, Δp 1 is a first gear distribution difference, and Δp 2 is a second gear distribution difference.
When n=4:
Wherein Δp is a gear distribution difference, Δp 1 is a first gear distribution difference, Δp 2 is a second gear distribution difference, Δp 3 is a third gear distribution difference, and Δp 4 is a fourth gear distribution difference.
In practical applications, Δp 1 may be the first gear distribution difference value of the plurality of gear distribution difference values, where the difference value between the first gear distribution difference value and the average gear distribution difference value is smaller than the preset difference value, Δp n is the nth gear distribution difference value of the plurality of gear distribution difference values, where the difference value between the first gear distribution difference value and the average gear distribution difference value is smaller than the preset difference value, and n is the number of gear distribution difference values of the plurality of gear distribution difference values, where the difference value between the first gear distribution difference value and the average gear distribution difference value is smaller than the preset difference value.
The first test parameter is further determined by calculating the average value of the gear distribution differences or the average value of the gear distribution differences, which is smaller than the preset difference, among the gear distribution differences, so that the condition that the alarm sensor runs off due to abnormal working parameter test can be better avoided, and the production test yield is more effectively improved.
S203, calculating a first test parameter according to the gear distribution difference value based on the limit alarm parameter.
Here, the first test parameter includes a first test parameter upper limit value and a first test parameter lower limit value.
In practical application, the upper limit value of the first test parameter may be an alarm test parameter, the lower limit value of the first test parameter may be a non-alarm test parameter, or the upper limit value of the first test parameter may be a non-alarm test parameter, and the lower limit value of the first test parameter may be an alarm test parameter. For example, for a low voltage alarm sensor, the upper voltage limit may be a non-alarm test parameter and the lower voltage limit may be an alarm test parameter, and for a high voltage alarm sensor, the upper voltage limit may be an alarm test parameter and the lower voltage limit may be a non-alarm test parameter.
Optionally, calculating the first test parameter according to the gear distribution difference value based on the limit alarm parameter includes calculating a first test parameter upper limit value and a first test parameter lower limit value according to the following formula:
Wherein, P up1 is the upper limit value of the first test parameter, P down1 is the lower limit value of the first test parameter, P goal is the limit alarm parameter, deltaP is the gear distribution difference value, and N is the dividing coefficient.
The partition coefficient N is inversely related to the gear distribution difference Δp. The larger the gear distribution difference value delta P is, the smaller the partition coefficient N is, and the smaller the gear distribution difference value delta P is, the larger the partition coefficient N is.
For example, for a low pressure alarm sensor, determining that the limit alarm parameter P goal is 1.1V, the gear distribution difference Δp is 0.05V, and the partition coefficient N is 2, then:
Upper limit value of first test parameter
First test parameter lower limit value
According to the method and the device for detecting the chip working abnormality of the alarm sensor, based on the limit alarm parameters, the first test parameters are calculated according to the gear distribution difference values, and the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameters, so that the occurrence of the condition that the alarm sensor is in test failure due to the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, the risk that the chip working abnormality of the alarm sensor is in test failure is avoided, the test yield of the alarm sensor is effectively improved, and the mass production capacity is improved.
As shown in connection with fig. 3, an embodiment of the present disclosure provides a method for testing alarm sensor limit parameters, comprising the steps of:
S301, gear distribution of the alarm sensor is obtained.
S302, calculating a first test parameter of the alarm sensor according to gear distribution, wherein the first test parameter is a test parameter which is not easy to trigger an abnormal working parameter range of the alarm sensor.
S303, performing traversal test on the limit parameters of the alarm sensor based on the first test parameters.
S304, after traversing the limit parameters of the alarm sensor, determining a target test gear which accords with an expected result in a plurality of test gears.
Optionally, determining the target test gear meeting the expected result in the plurality of test gears comprises determining the test gear which alarms according to the first test parameter in the plurality of test gears, and taking the test gear which alarms according to the first test parameter as the target test gear.
For a low-voltage alarm sensor, applying a desired non-alarm voltage to (a test chip of) the alarm sensor, testing whether the alarm sensor alarms, if not, proving that the test gear of the alarm sensor meets the non-alarm requirement, and applying a desired alarm voltage to the alarm sensor, testing whether the alarm sensor alarms, if so, proving that the test gear of the alarm sensor meets the alarm requirement.
The test results at different test gears are respectively:
the test gear 1 is not provided with an alarm voltage of 1.8V and an alarm voltage of 1.7V;
the test gear 2 is not provided with an alarm voltage of 1.8V and an alarm voltage of 1.7V;
the test gear 3 is not provided with an alarm voltage of 1.8V and an alarm voltage of 1.7V;
the test gear 4 is not alarmed at the alarm voltage of 1.8V and alarmed at the alarm voltage of 1.7V;
the test gear 5 is not alarmed at the alarm voltage of 1.8V and not alarmed at the alarm voltage of 1.7V;
And the test gear 6 is not alarmed at the alarm voltage of 1.8V and not alarmed at the alarm voltage of 1.7V.
Then test gear 4 is the test gear that meets the expectations and test gears 1-3, 5-6 are the test gears that do not meet the expectations.
S305, determining second test parameters of other test gears except the target test gear in the plurality of test gears.
Optionally, the plurality of test gears are arranged in an arithmetic arrangement, and determining second test parameters of other test gears except the target test gear in the plurality of test gears comprises calculating according to the following formula to obtain the second test parameters:
Wherein, P 1 is a first test parameter, P 21 is a second test parameter of a test gear which is lower than a target test gear and is spaced apart from the target test gear by m 1 intervals, P 22 is a second test parameter of a test gear which is higher than the target test gear and is spaced apart from the target test gear by m 2 intervals, and DeltaP is a gear distribution difference value.
For example, for a low pressure alarm sensor, after determining that test gear 4 is a test gear that meets expectations, when the gear profile difference Δp is 0.05V:
The non-warning voltage V 21＝V1-m1 x Δv=1.8-2 x 0.05=1.7 for the test gear 6, the warning voltage V 21＝V1-m1 x Δv=1.7-2 x 0.05=1.6.
The non-alarm voltage V 22＝V1+m1 ×Δv=1.8+3×0.05=1.95 for test gear 1, the alarm voltage V 22＝V1+m1 ×Δv=1.7+3×0.05=1.85.
S306, testing limit parameters of other test gears based on the second test parameters.
After determining the second test parameters, testing and verifying the corresponding limit parameters of the test gear by using the second test parameters corresponding to each other test gear.
In the embodiment of the disclosure, when testing the limit parameters of the alarm sensor, first calculating the first test parameters according to the gear distribution of the alarm sensor, and then performing traversal test on the limit parameters of the alarm sensor based on the first test parameters to determine a target test gear meeting expected results in a plurality of test gears. And then, after determining second test parameters of other test gears except the target test gear in the plurality of test gears, testing limit parameters of the other test gears based on the second test parameters. Because the first test parameter and the second test parameter are the test parameters determined according to the gear distribution of the alarm sensor, the abnormal working parameter range of the alarm sensor is not easy to trigger, so that the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameter and the second test parameter, the occurrence of the condition that the alarm sensor is in test failure due to the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved.
In the process of testing the limit parameters of the chip alarm sensor, a traditional testing mode is adopted, the expected non-alarm limit parameters and the alarm limit parameters are directly applied to test, and the applied expected non-alarm parameters/alarm parameters exceed the normal working range of the chip alarm sensor, so that the failure rate of the chip alarm sensor in test failure is up to 1.5% -2%. By adopting the testing method provided by the embodiment of the disclosure, the testing parameters are calculated according to the gear distribution of the alarm sensor, then the testing is performed based on the testing parameters obtained by calculation, the situation that the testing process exceeds the normal working range of the alarm sensor (chip) can be well avoided, the failure rate of the chip alarm sensor in the testing process is reduced to 0.2% -0.5%, and the effect is quite obvious.
The disclosed embodiment, shown in connection with fig. 5, provides an apparatus for testing alarm sensor limit parameters, including a processor (processor) 50 and a memory (memory) 51, and may also include a communication interface (Communication Interface) 52 and a bus 53. The processor 50, the communication interface 52, and the memory 51 may communicate with each other via a bus 53. Communication interface 52 may be used for information transfer. Processor 50 may invoke logic instructions in memory 51 to perform the method of the above-described embodiments for testing alarm sensor limit parameters.
Further, the logic instructions in the memory 51 described above may be implemented in the form of software functional units and may be stored in a computer readable storage medium when sold or used as a stand alone product.
The memory 51 is a computer readable storage medium that can be used to store a software program, a computer executable program, such as program instructions/modules corresponding to the methods in the embodiments of the present disclosure. The processor 50 executes the functional applications and data processing by running the program instructions/modules stored in the memory 51, i.e. implements the method for testing alarm sensor limit parameters in the method embodiments described above.
The memory 51 may include a storage program area that may store an operating system, application programs required for at least one function, and a storage data area that may store data created according to the use of the terminal device, etc. In addition, the memory 51 may include a high-speed random access memory, and may also include a nonvolatile memory.
When the device for testing the limit parameters of the alarm sensor is adopted, when the limit parameters of the alarm sensor are tested, the first test parameters are calculated according to the gear distribution of the alarm sensor, and then the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameters. The first test parameters are the test parameters determined according to the gear distribution of the alarm sensor, so that the abnormal working parameter range of the alarm sensor is not easy to trigger, the limit parameters of the alarm sensor are subjected to traversal test based on the first test parameters, the occurrence of the condition that the alarm sensor fails in test due to the fact that the applied test parameters exceed the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved.
Referring to fig. 6, an embodiment of the present disclosure provides an electronic device (e.g., a computer, a server, etc.) including an electronic device main body 60, and the above-described apparatus 500 for testing alarm sensor limit parameters, which is mounted to the electronic device main body 60.
Embodiments of the present disclosure provide a computer readable storage medium storing computer executable instructions configured to perform the above-described method for testing alarm sensor limit parameters.
The disclosed embodiments provide a computer program product comprising a computer program stored on a computer readable storage medium, the computer program comprising program instructions which, when executed by a computer, cause the computer to perform the above-described method for testing alarm sensor limit parameters.
The computer readable storage medium may be a transitory computer readable storage medium or a non-transitory computer readable storage medium.
Embodiments of the present disclosure may be embodied in a software product stored on a storage medium, including one or more instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of a method according to embodiments of the present disclosure. The storage medium may be a non-transitory storage medium, including a usb disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or may be a transitory storage medium.
The above description and the drawings illustrate embodiments of the disclosure sufficiently to enable those skilled in the art to practice them. Other embodiments may involve structural, logical, electrical, process, and other changes. The embodiments represent only possible variations. Individual components and functions are optional unless explicitly required, and the sequence of operations may vary. Portions and features of some embodiments may be included in, or substituted for, those of others. The scope of the embodiments of the present disclosure encompasses the full ambit of the claims, as well as all available equivalents of the claims. When used in the present application, although the terms "first," "second," etc. may be used in the present application to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without changing the meaning of the description, so long as all occurrences of the "first element" are renamed consistently and all occurrences of the "second element" are renamed consistently. The first element and the second element are both elements, but may not be the same element. Moreover, the terminology used in the present application is for the purpose of describing embodiments only and is not intended to limit the claims. As used in the description of the embodiments and the claims, the singular forms "a," "an," and "the" (the) are intended to include the plural forms as well, unless the context clearly indicates otherwise. Similarly, the term "and/or" as used in this disclosure is meant to encompass any and all possible combinations of one or more of the associated listed. Furthermore, when used in the present disclosure, the terms "comprises," "comprising," and/or variations thereof, mean that the recited features, integers, steps, operations, elements, and/or components are present, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. Without further limitation, an element defined by the phrase "comprising one does not exclude the presence of other like elements in a process, method or apparatus comprising such elements. In this context, each embodiment may be described with emphasis on the differences from the other embodiments, and the same similar parts between the various embodiments may be referred to each other. For the methods, products, etc. disclosed in the embodiments, if they correspond to the method sections disclosed in the embodiments, the description of the method sections may be referred to for relevance.
Those of skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. The skilled artisan may use different methods for each particular application to achieve the described functionality, but such implementation should not be considered to be beyond the scope of the embodiments of the present disclosure. It will be clearly understood by those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, which are not repeated herein.
In the embodiments disclosed herein, the disclosed methods, articles of manufacture (including but not limited to devices, apparatuses, etc.) may be practiced in other ways. For example, the apparatus embodiments described above are merely illustrative, and for example, the division of the units may be merely a logical function division, and there may be additional divisions when actually implemented, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. In addition, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interface, device or unit indirect coupling or communication connection, which may be in electrical, mechanical or other form. The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to implement the present embodiment. In addition, each functional unit in the embodiments of the present disclosure may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. In the description corresponding to the flowcharts and block diagrams in the figures, operations or steps corresponding to different blocks may also occur in different orders than that disclosed in the description, and sometimes no specific order exists between different operations or steps. For example, two consecutive operations or steps may actually be performed substantially in parallel, they may sometimes be performed in reverse order, which may be dependent on the functions involved. Each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
Claims (7)
1. A method for testing an alarm sensor limit parameter, comprising:
Obtaining gear distribution of an alarm sensor;
Calculating a first test parameter of the alarm sensor according to the gear distribution, wherein the first test parameter is a test parameter which is not easy to trigger an abnormal working parameter range of the alarm sensor;
Performing a traversal test on the limit parameters of the alarm sensor based on the first test parameters;
The method comprises the steps of calculating a first test parameter of the alarm sensor according to the gear distribution, wherein the first test parameter comprises obtaining a limit alarm parameter of the alarm sensor, obtaining a gear distribution difference value of the gear distribution, and calculating the first test parameter according to the gear distribution difference value based on the limit alarm parameter;
the step of obtaining the step distribution difference value of the step distribution comprises the step of calculating the step distribution difference value according to the following formula:
Wherein, deltaP is the gear distribution difference value, deltaP 1 is the first gear distribution difference value, deltaP n is the nth gear distribution difference value, n is the number of the gear distribution difference values, and n is more than or equal to 2;
the first test parameter comprises a first test parameter upper limit value and a first test parameter lower limit value, and the calculating of the first test parameter according to the gear distribution difference value based on the limit alarm parameter comprises the steps of calculating the first test parameter upper limit value and the first test parameter lower limit value according to the following formula:
Wherein, P up1 is the upper limit value of the first test parameter, P down1 is the lower limit value of the first test parameter, P goal is the limit alarm parameter, deltaP is the gear distribution difference value, and N is the dividing coefficient.
2. The method of claim 1, wherein the limit parameters of the alarm sensor include an upper limit parameter and a lower limit parameter;
the step of performing traversal test on the limit parameters of the alarm sensor based on the first test parameters includes:
Performing traversal tests on the upper limit parameters according to the sequence from the upper limit gear to the lower limit gear based on the first test parameters under the condition that the limit parameters of the alarm sensor are the upper limit parameters;
And under the condition that the limit parameter of the alarm sensor is a lower limit parameter, performing traversal test on the lower limit parameter according to the sequence from the lower limit gear to the upper limit gear based on the first test parameter.
3. The method of claim 1 or 2, wherein the alarm sensor comprises a plurality of test gear positions, the method further comprising:
After traversing the limit parameters of the alarm sensor, determining a target test gear which accords with an expected result in the plurality of test gears;
Determining second test parameters of other test gears except the target test gear in the plurality of test gears;
and testing the limit parameters of the other test gears based on the second test parameters.
4. A method according to claim 3, wherein the plurality of test gear positions are arranged in an arithmetic progression;
The determining the second test parameters of the test gear except the target test gear in the plurality of test gears comprises calculating according to the following formula to obtain the second test parameters:
Wherein, P 1 is a first test parameter, P 21 is a second test parameter of a test gear which is lower than a target test gear and is spaced apart from the target test gear by m 1 intervals, P 22 is a second test parameter of a test gear which is higher than the target test gear and is spaced apart from the target test gear by m 2 intervals, and DeltaP is a gear distribution difference value.
5. The method of claim 3, wherein the determining a target test gear of the plurality of test gears that meets an expected result comprises:
determining a test gear which alarms according to the first test parameter in the plurality of test gears;
and taking the test gear which alarms according to the first test parameters as the target test gear.
6. An apparatus for testing alarm sensor limit parameters comprising a processor and a memory storing program instructions, wherein the processor is configured, when executing the program instructions, to perform the method for testing alarm sensor limit parameters of any one of claims 1 to 5.
7. An electronic device, comprising:
An electronic device main body;
The apparatus for testing alarm sensor limit parameters of claim 6, mounted to the electronic device body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211640000.9A CN116189403B (en) | 2022-12-20 | 2022-12-20 | Method and device for testing limit parameters of alarm sensor and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211640000.9A CN116189403B (en) | 2022-12-20 | 2022-12-20 | Method and device for testing limit parameters of alarm sensor and electronic equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116189403A CN116189403A (en) | 2023-05-30 |
| CN116189403B true CN116189403B (en) | 2025-01-07 |
Family
ID=86439369
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211640000.9A Active CN116189403B (en) | 2022-12-20 | 2022-12-20 | Method and device for testing limit parameters of alarm sensor and electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116189403B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510688A (en) * | 2016-01-25 | 2016-04-20 | 大唐微电子技术有限公司 | Voltage detector for CP testing |
| CN110441667A (en) * | 2019-07-08 | 2019-11-12 | 中国科学院微电子研究所 | Chip detecting method, device and electronic equipment |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4977530A (en) * | 1988-05-02 | 1990-12-11 | Mitel Corporation | Voltage monitor for in-circuit testing |
| JP2860794B2 (en) * | 1989-03-14 | 1999-02-24 | 日立電子エンジニアリング株式会社 | IC monitor current monitor |
| AU4035997A (en) * | 1996-08-20 | 1998-03-06 | Robert James Mcbride-Wilson | Improvements relating to event detection and recordal |
| JP2001268775A (en) * | 2000-03-23 | 2001-09-28 | Kawamura Electric Inc | Testing method for installation of overcurrent alarm device |
| CN102243605B (en) * | 2010-05-14 | 2014-04-30 | 鸿富锦精密工业（深圳）有限公司 | Detection device and detection method thereof |
| US10020649B2 (en) * | 2015-07-23 | 2018-07-10 | Pass & Seymour, Inc. | Protective device with self-test |
| CN109212372A (en) * | 2018-11-06 | 2019-01-15 | 格力电器（武汉）有限公司 | Automatic testing method, system and device for overcurrent protector |
-
2022
- 2022-12-20 CN CN202211640000.9A patent/CN116189403B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510688A (en) * | 2016-01-25 | 2016-04-20 | 大唐微电子技术有限公司 | Voltage detector for CP testing |
| CN110441667A (en) * | 2019-07-08 | 2019-11-12 | 中国科学院微电子研究所 | Chip detecting method, device and electronic equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116189403A (en) | 2023-05-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8587318B2 (en) | Sensor arrangement for an energy storage device and a method of using the same | |
| CN107271921B (en) | Current acquisition method and device, battery management system and electric automobile | |
| CN117909906B (en) | Power line fault prediction system and method based on prediction model | |
| JP2004150439A (en) | Method for determining failure phenomenon | |
| CN108226693A (en) | Method and apparatus for detecting short circuit in battery in real time, and computer-readable storage medium | |
| CN109239489A (en) | A kind of health status on-line analysis, device and medium for energy-storage system | |
| CN110568358A (en) | Markov model based motor system reliability quantitative evaluation method | |
| US20230305050A1 (en) | State estimation method for multi-stage voltage sag | |
| CN116189403B (en) | Method and device for testing limit parameters of alarm sensor and electronic equipment | |
| CN113866641A (en) | Fault detection method and device for lithium ion battery | |
| CN110878983B (en) | Air conditioner fault determination method and device | |
| CN109587145B (en) | A method, device and device for false data intrusion detection in power network | |
| CN113339970B (en) | Method, device and smart air conditioner for detecting indoor temperature | |
| CN109765460B (en) | Power distribution network fault line selection method based on self-adaptive scale Symlets wavelet | |
| CN114333254A (en) | Monitoring method and system based on abnormal conditions of continuous batches of semiconductor products | |
| CN114083987A (en) | Battery monitoring parameter correction method and device and computer equipment | |
| CN116430252A (en) | Method for detecting short circuit in battery pack, charging device and readable storage medium | |
| CN117747462A (en) | Chip detection method and device | |
| KR20220050094A (en) | Instantaneous voltage drop detection circuit and vehicle-mounted diagnostic system | |
| DE102019102258B3 (en) | SMOKE EMISSION CONTROL METHOD IN A BATTERY AND A BATTERY SYSTEM | |
| CN113779926B (en) | Circuit detection method and device, electronic equipment and readable storage medium | |
| CN108899595B (en) | Temperature detection method, device and equipment for battery | |
| CN117196251A (en) | Monitoring method, system, equipment and medium for park power distribution facility | |
| CN106325227A (en) | Manufacturing process management and control line generating method and device, and manufacturing process management and control system | |
| WO2022227523A1 (en) | Method and apparatus for measuring indoor temperature, and smart air conditioner |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |