CN116047569A - Method, device, equipment and storage medium for processing scintillation pulse - Google Patents
Method, device, equipment and storage medium for processing scintillation pulse Download PDFInfo
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Abstract
The application discloses a method, a device, equipment and a storage medium for processing scintillation pulses. The method comprises the following steps: obtaining an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined; converting the objective function model to obtain a first corresponding relation between a variable of the objective function model and one or more intermediate parameters and a second corresponding relation between the intermediate parameters and parameters to be determined; digitally sampling the scintillation pulse to obtain sampling data; determining an intermediate parameter based on the first correspondence using the sampled data as a variable; and transmitting the intermediate parameter and the second corresponding relation to the external device, so that the external device determines the parameter to be determined based on the intermediate parameter and by utilizing the second corresponding relation. The method and the device can process the original sampling data to realize data compression and then transmit the data, can reduce the load of a data transmission network and reduce the consumption of computing resources of a server.
Description
Technical Field
The present invention relates to the field of data processing, and in particular, to a method, apparatus, device, and storage medium for processing scintillation pulses.
Background
In Positron Emission Tomography (PET) applications, gamma rays are converted by a scintillation crystal into a visible light signal, which is further converted by a photoelectric conversion device into a scintillation pulse signal, which is then sampled and processed to obtain a series of application images or energy spectrum information. Among these, sampling of scintillation pulses and processing of sampled data are two very critical processes. High quality sampling can provide accurate raw data for subsequent processing, while fast, efficient and stable processing is a guarantee of excellent presentation of the final results.
Currently, after sampling the scintillation pulse, the sampled data is packaged and sent from the detection device to a processing device, such as a server, via a network. The server processes the received sampled data to obtain relevant energy information. But in general the amount of sampled data is very large. For example, during a PET scan, the detection device continuously detects a large number of scintillation pulses and outputs sampled data. Despite the compression method adopted in the data transmission process, a large amount of bandwidth is still required for data transmission. The server also needs to consume a large amount of computing resources for output processing after receiving the sampled data. This inevitably increases the load of the network transmission, affecting the computing power of the server processor.
Disclosure of Invention
The technical problem to be solved by the embodiments of the present application is how to reduce the network transmission load of data transmission in the pulse sampling process and reduce the computing resource consumption of the server.
In order to solve the problems, the application discloses a method, a device, equipment and a storage medium for processing scintillation pulses.
According to a first aspect of the present application, a method of processing scintillation pulses is provided. The processing method comprises the following steps: obtaining an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined; converting the objective function model to obtain a first corresponding relation between a variable of the objective function model and one or more intermediate parameters and a second corresponding relation between the intermediate parameters and the parameters to be determined; digitally sampling the scintillation pulse to obtain sampling data; utilizing the sampling data as the variable, and determining the intermediate parameter based on the first correspondence; and transmitting the intermediate parameter and the second corresponding relation to external equipment so that the external equipment can determine the parameter to be determined based on the intermediate parameter and by utilizing the second corresponding relation.
According to some embodiments of the present application, the obtaining an objective function model corresponding to the scintillation pulse includes: acquiring an original function model, wherein the original function model accords with a Gaussian function; and carrying out normalization processing on the original function model, and determining the objective function model.
According to some embodiments of the present application, the determining the first correspondence and the second correspondence includes: performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
According to some embodiments of the present application, the digitally sampling the scintillation pulse includes performing an ADC sampling or a multi-threshold sampling on the scintillation pulse.
According to some embodiments of the present application, when performing multi-threshold sampling, the acquiring sampled data includes: presetting a plurality of thresholds; for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair; a plurality of threshold-time pairs are specified to form the sample data.
According to some embodiments of the application, the intervals between the plurality of thresholds are equal.
According to some embodiments of the application, the determining the intermediate parameter includes: performing reference transformation on the sampling data to obtain transformation data; designating the transformation data as the variable, and solving the intermediate parameter by using the first corresponding relation.
According to a second aspect of the present application, a method of processing scintillation pulses is provided. The processing method comprises the following steps: acquiring an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined; acquiring a first corresponding relation between a variable of the objective function model and one or more intermediate parameters; digitally sampling the scintillation pulse to obtain sampling data; utilizing the sampling data as the variable, and determining the intermediate parameter based on the first correspondence; and transmitting the intermediate parameter to an external device so that the external device can determine the parameter to be determined based on the intermediate parameter and by utilizing a second corresponding relation between the intermediate parameter and the parameter to be determined.
According to some embodiments of the present application, the obtaining an objective function model corresponding to the scintillation pulse includes: acquiring an original function model, wherein the original function model accords with a Gaussian function; and carrying out normalization processing on the original function model, and determining the objective function model.
According to some embodiments of the present application, the first correspondence and the second correspondence are determined based on the following operations, including: performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
According to some embodiments of the present application, the digitally sampling the scintillation pulse includes: ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
According to some embodiments of the present application, when performing multi-threshold sampling, the acquiring sampled data includes: presetting a plurality of thresholds; for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair; a plurality of threshold-time pairs are specified to form the sample data.
According to some embodiments of the application, the intervals between the plurality of thresholds are equal.
According to some embodiments of the application, the determining the intermediate parameter includes: performing reference transformation on the sampling data to obtain transformation data; designating the transformation data as the variable, and solving the intermediate parameter by using the first corresponding relation.
According to a third aspect of the present application, a processing device for scintillation pulses is provided. The device comprises: the first acquisition module is configured to acquire an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined; the conversion module is configured to convert the objective function model to obtain a first corresponding relation between a variable of the objective function model and one or more intermediate parameters and a second corresponding relation between the intermediate parameters and the parameters to be determined; the first sampling module is configured to digitally sample the scintillation pulse to obtain sampling data; a first determining module configured to use the sampled data as the variable and determine the intermediate parameter based on the first correspondence; the first transmission module is configured to transmit the intermediate parameter and the second corresponding relation to external equipment, so that the external equipment can determine the parameter to be determined based on the intermediate parameter and by utilizing the second corresponding relation.
According to some embodiments of the present application, to obtain an objective function model corresponding to the scintillation pulse, the first obtaining module is configured to: acquiring an original function model, wherein the original function model accords with a Gaussian function; and carrying out normalization processing on the original function model, and determining the objective function model.
According to some embodiments of the present application, to obtain the first correspondence and the second correspondence, the conversion module is configured to: performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
According to some embodiments of the present application, to digitally sample the scintillation pulse, the first sampling module is configured to: ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
According to some embodiments of the present application, when performing multi-threshold sampling, to obtain sampling data, the first sampling module is configured to: presetting a plurality of thresholds; for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair; a plurality of threshold-time pairs are specified to form the sample data.
According to some embodiments of the application, the intervals between the plurality of thresholds are equal.
According to some embodiments of the application, to determine the intermediate parameter, the first determining module is configured to: performing reference transformation on the sampling data to obtain transformation data; designating the transformation data as the variable, and solving the first intermediate parameter by using the first corresponding relation.
According to a fourth aspect of the present application, there is provided a processing device for scintillation pulses. The device comprises: the second acquisition module is configured to acquire an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined; the receiving module is configured to acquire a first corresponding relation between a variable of the objective function model and one or more intermediate parameters; the second sampling module is configured to digitally sample the scintillation pulse to obtain sampling data; the second determining module is configured to use the sampling data as the variable and determine the intermediate parameter based on the first corresponding relation; the second transmission module is configured to transmit the intermediate parameter to an external device, so that the external device can determine the parameter to be determined based on the intermediate parameter and by using a second corresponding relation between the intermediate parameter and the parameter to be determined.
According to some embodiments of the present application, to obtain an objective function model corresponding to the scintillation pulse, the second obtaining module is configured to: acquiring an original function model, wherein the original function model accords with a Gaussian function; and carrying out normalization processing on the original function model, and determining the objective function model.
According to some embodiments of the present application, the first correspondence and the second correspondence are determined based on the following operations, including: performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
According to some embodiments of the present application, to digitally sample the scintillation pulse, the second sampling module is configured to: ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
According to some embodiments of the present application, when performing multi-threshold sampling, to obtain sampled data, the second sampling module is configured to: presetting a plurality of thresholds; for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair; a plurality of threshold-time pairs are specified to form the sample data.
According to some embodiments of the application, the intervals between the plurality of thresholds are equal.
According to some embodiments of the application, to determine the one or more intermediate parameters, the second determining module is configured to: performing reference transformation on the sampling data to obtain transformation data; designating the transformation data as the variable, and solving the intermediate parameter by using the first corresponding relation.
According to a fifth aspect of the present application, a processing apparatus is provided. The processing device comprises a memory, a processor and a computer program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the method as described above.
According to a sixth aspect of the present application, a computer readable storage medium is provided. The storage medium has stored thereon a computer program which, when executed by a processor, implements the steps of the method as described above.
The processing method of the scintillation pulse can process the original sampling data to realize data compression and then transmit the data, can reduce the load of a data transmission network and lighten the consumption of computing resources of a server.
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The present application will be further illustrated by way of example embodiments, which will be described in detail with reference to the accompanying drawings. The embodiments are not limiting, in which like numerals represent like structures, wherein:
FIG. 1 is an exemplary flow chart of a method of processing scintillation pulses shown in accordance with some embodiments of the present application;
FIG. 2 is an exemplary flow chart of another method of processing scintillation pulses shown in accordance with some embodiments of the present application;
FIG. 3 is an exemplary schematic diagram of a scintillation pulse waveform shown in accordance with some embodiments of the present application;
FIG. 4 is an exemplary schematic diagram of sampling of scintillation pulses shown in accordance with some embodiments of the present application;
FIG. 5 is an exemplary schematic diagram of another sampling of scintillation pulses shown in accordance with some embodiments of the present application;
FIG. 6 is an exemplary block diagram of a data processing system for scintillation pulse processing shown in accordance with some embodiments of the present application;
FIG. 7 is an exemplary block diagram of another data processing system for scintillation pulse sampling shown in accordance with some embodiments of the present application;
FIG. 8 is an exemplary functional block diagram of a data processing system for scintillation pulse processing shown in accordance with some embodiments of the present application.
Detailed Description
In order to make the above objects, features and advantages of the present application more comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is, however, susceptible of embodiment in many other forms than those described herein and similar modifications can be made by those skilled in the art without departing from the spirit of the application, and therefore the application is not to be limited to the specific embodiments disclosed below.
It will be understood that when an element is referred to as being "mounted" to another element, it can be directly mounted to the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and/or" and/or "as used herein includes any and all combinations of one or more of the associated listed items.
Some preferred embodiments of the present application are described below with reference to the accompanying drawings. It should be noted that the following description is for illustrative purposes and is not intended to limit the scope of the present application.
Fig. 1 is an exemplary flow chart of a method of processing scintillation pulses shown in accordance with some embodiments of the present application. In some embodiments, the method 100 of processing scintillation pulses may be performed by the first data processing system 600. For example, the method 100 of processing a scintillation pulse may be stored in a storage device (e.g., a self-contained memory unit or an external memory device of the first data processing system 600) in the form of a program or instructions that, when executed, implement the method 100 of processing a scintillation pulse. As shown in fig. 1, the method 100 of processing scintillation pulses may include the following steps.
Step 110, obtaining an objective function model corresponding to the scintillation pulse.
In some embodiments, the scintillation pulse may be acquired by a radiation detection device. The radiation detection device may include a semiconductor detector, such as a P-N junction semiconductor detector, a lithium drift semiconductor detector, a high purity germanium semiconductor detector, a germanium lithium semiconductor detector, a silicon microstrip semiconductor detector, a metal surface barrier semiconductor detector, or the like. The radiation detection device may further comprise a scintillation detector. The scintillation detector may include scintillation crystals coupled to each other and a photoelectric conversion device. Scintillation crystals (e.g. BGO, PWO, LYSO: ce, GAGG: ce, naI: TI, csI: TI, laBr3: ce, baF) 2 Etc.) for converting detected high-energy rays (such as gamma rays, neutron rays, etc.) into visible light signals, and a photoelectric conversion device (e.g., photomultiplier tube PMT, silicon photomultiplier SiPM, etc.) for converting the visible light signals into electrical signals that are output in the form of scintillation pulses through electronics coupled to the photoelectric conversion device.
In some embodiments, the output scintillation pulse may be passed into a shaping circuit for shaping. The shaping circuit can transform the waveform of the scintillation pulse to enable the waveform to be highly compounded with a function model of a Gaussian function. For example, the shaping circuit may include a pre-filter amplification circuit incorporating a multi-stage gaussian shaping circuit, such as a gaussian shaping circuit of greater than 4 stages. The waveform of the scintillation pulse after being subjected to Gaussian shaping for a plurality of times can be similar to the shape described by a Gaussian function. As shown in fig. 3, fig. 3 is an exemplary schematic diagram of a scintillation pulse waveform shown in accordance with some embodiments of the present application. The shape of the scintillation pulse 300 conforms to the symmetrical bell shape described by the gaussian function. Including rising edges where the pulse amplitude increases over time and falling edges where the pulse amplitude decreases over time after reaching a peak. The functional model describing the shape of the scintillation pulse 300 can then be a gaussian function model as shown in equation 1 below:
Where y represents the amplitude of the scintillation pulse, x represents the time corresponding to the amplitude of the scintillation pulse, a represents the maximum amplitude of the scintillation pulse (i.e., the peak value of the scintillation pulse), b represents the symmetry axis of the scintillation pulse (in terms of time), c represents the standard deviation (i.e., the gaussian RMS width value)Multiple times. In some embodiments, equation 1 above may also be referred to as the original functional model of the scintillation pulse.
It will be appreciated that the amplitude of the scintillation pulse can be determined based on its manifestation. The pulse signal may be in the form of an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc., and when the pulse signal is an electrical pulse signal, the corresponding characteristic may be voltage, current, or energy of the electrical pulse signal. Thus, the amplitude of the scintillation pulse can be voltage, current, energy; when the pulse signal is an acoustic pulse signal, the corresponding characteristic may be the intensity of the acoustic pulse signal. Thus, the amplitude of the scintillation pulse can be the sound intensity. When the pulse signal is a pressure wave signal, its corresponding characteristic may be the pressure of the pressure wave signal. Thus, the amplitude of the scintillation pulse can be pressure. And so on, they are not described in detail herein. In addition, the scintillation pulse signal in the present application may be expanded into a continuous signal, and the continuous signal is generally only required to be regarded as a pulse signal arranged according to a certain period, which is not particularly limited in the present application.
In some embodiments, the raw function model of the scintillation pulse may be normalized to determine the objective function model. Illustratively, since horizontal translation of the scintillation pulse does not cause a change in energy information, for equation 1, let x=x-b, y=y, the symmetry axis of the scintillation pulse is moved to the Y axis. Equation 1 may be converted into equation 2 as shown below:
wherein Y represents the normalized amplitude of the scintillation pulse, and X represents the normalized time corresponding to the normalized amplitude of the scintillation pulse. In some embodiments, equation 2 may be determined as an objective function model corresponding to the scintillation pulse, and a and c may be one or more parameters to be determined included in the objective function model.
In some embodiments, the variables of the objective function model may be X and Y in equation 2 as described above. X is an independent variable of the objective function model, and Y is an independent variable of the objective function model. The objective function model may be subjected to data processing operations to determine the correspondence. The mathematical processing operations may include at least taking logarithms, parametric transformations, derivatives, and matrixing.
Illustratively, equation 2, which represents the objective function model, may be logarithmically taken to obtain equation 3 as shown below:
the parameters in equation 3 are varied to make z= lnY, k 0 =lna,Then equation 3 may be converted to equation 4 as shown below:
Z=k 0 +k 2 *X 2 (4)
in order to enable one or more parameters to be determined of the objective function model to be determined, the indicated curve and the wave of the scintillation pulseThe error between the shapes is minimized, i.e. Z- (k) 0 +k 2 *X 2 ) The value of (2) is the smallest. Let r=z- (k) 0 +k 2 *X 2 ) Then R is 2 =[Z-(k 0 +k 2 *X 2 )] 2 . The source of the variables of the objective function model may be sampling data obtained by sampling the scintillation pulse. For example, the amplitude of the scintillation pulse at a certain instant (or called sampling instant) is acquired. Exemplary sample data may use (x) i ,y i ) I=1, 2,3, …, n. Wherein x is i Representing the sampling instant, y i Indicated at sampling time x i The corresponding amplitude of the scintillation pulse. n represents the number of sampling data and may be regarded as the number of sampling times. Likewise, for (x i ,y i ) Performing time normalization to let X i =x i -b,Y i =y i Substituting the above error calculation formula can obtain the following formula 5:
it can be seen that when R 2 The closer to 0, the smaller the interpretation error. Let f=r 2 =0, and respectively to k 0 And k 2 Deriving can result in formulas 6 and 7 as shown below:
the above formulas 6 and 7 are arranged to obtain formulas 8 and 9 shown below:
the above equations 8 and 9 are subjected to matrix conversion to obtain equation 10 shown below:
order theDesignating KK, RR, QQ, and YY as the one or more intermediate parameters, the above-described relationship may be determined as a first correspondence relationship between the one or more intermediate parameters and variables of the objective function model.
Based on the above data specification, equation 10 can be converted to equation 11 as shown below:
the matrix operation is performed on equation 11, and equations 12 and 13 shown below can be obtained:
n*k 0 +KK*k 2 =YY(12)
KK*k 0 +RR*k 2 =QQ(13)
solving the system of equations 12 and 13 yields equations 14 and 15 as shown below:
and k is 0 =lna,Then a second correspondence between the one or more intermediate parameters and the one or more parameters to be determined may be represented by equations 16 and 17 as shown below:
and 130, digitally sampling the scintillation pulse to obtain sampling data.
In some embodiments, the digitized samples may include ADC samples (or oscilloscope samples). The exemplary ADC samples, the scintillation pulse may be sampled at every other time interval depending on the sampling rate. The higher the sampling rate, the smaller the time interval, and the more sampled data is obtained. For example, a sampling rate of 1GS/s represents a time interval of 1ns and a sampling rate of 2.5GS/s represents a time interval of 0.4ns. Fig. 4 illustrates an exemplary schematic diagram of sampling of scintillation pulses shown in accordance with some embodiments of the present application. The samples are ADC samples. For ease of illustration, two sampling instants are used for example description. As shown in fig. 4, at a sampling time t 1 Sampling the scintillation pulse to obtain the scintillation pulse at t 1 Corresponding amplitude A 1 . Likewise, at sampling time t 2 Sampling the scintillation pulse to obtain the scintillation pulse at t 2 Corresponding amplitude A 2 . Accordingly, assuming that there are m sampling times, the sampled data obtained after ADC sampling can be (t m ,A m ) And (3) representing. Wherein t is m Represents the sampling time, A m Indicated at t m And m represents the sampling times and is determined according to the sampling rate.
In some embodiments, the digitized samples may include multi-threshold samples. When multi-threshold sampling is adopted, a plurality of thresholds can be preset, and the pulse flash pulse is generated through the preset thresholdsThe comparison is made to obtain the time when the scintillation pulse crosses the threshold and forms a threshold-time pair with the corresponding threshold to form the sampled data. Fig. 5 illustrates an exemplary schematic diagram of another sampling of scintillation pulses shown in accordance with some embodiments of the present application. The samples are multi-threshold samples. For ease of illustration, two thresholds are used for example description. The working device for multi-threshold sampling may include a comparator and a digitizer. The comparator may be configured to perform a comparison between the scintillation pulse and a threshold value, and to output a state change signal at a time when the scintillation pulse crosses the threshold value. The time-to-digital converter can be used for performing digital time sampling and digital sampling on the state change signal output by the comparator, and acquiring the time of the scintillation pulse crossing the threshold value. The resulting threshold-time pairs constitute the sampled data. As shown in fig. 5, the amplitude of the scintillation pulse is gradually increased over time. At this time, the comparator can compare the scintillation pulse with the threshold A 3 . When the flicker pulse crosses the threshold A from bottom to top 3 The comparator may generate a state change signal. The time-to-digital converter can digitally sample the state change information to obtain corresponding jump time t 3 . Subsequently, the amplitude of the scintillation pulse continues to increase. The comparator can compare the scintillation pulse with the threshold A 4 . When the flicker pulse crosses the threshold A from bottom to top 4 When the comparator may generate another state change signal. The time-to-digital converter can digitally sample the state change information to obtain corresponding jump time t 4 . The scintillation pulse will gradually decrease over time after reaching its peak. At this time, the comparator can continue to compare the scintillation pulse with the threshold A 4 . When the scintillation pulse crosses the threshold A from top to bottom 4 The comparator may generate a state change signal. The time-to-digital converter can digitally sample the state change information to obtain corresponding jump time t 5 . If the amplitude of the scintillation pulse continues to decrease, the comparator will cross the threshold A from top to bottom 3 A state change message is generated. The time-to-digital converter can digitize the state change information for time Sampling to obtain corresponding jump time t 6 . At this point the whole sampling procedure is completed. In multi-threshold sampling, one threshold may correspond to two threshold-time pairs. When the set threshold number is n, sampling data containing 2n threshold-time pairs will be obtained.
In some embodiments, the working device implementing the sampling process of the scintillation pulse may also include a scintillation pulse acquisition circuit board. The comparator and time-to-digital converter mentioned in the foregoing may be integrated in the scintillation pulse acquisition circuit board. The scintillation pulse acquisition circuit board may also include other components. For example, a Digital-to-time Converter (DAC) for setting a threshold, a chip for providing logic resources for a time-to-Digital Converter (e.g., an FPGA chip, which may be implemented with a carry chain inside the FPGA), and so on. Thus, the scintillation pulse acquisition circuit board may also be referred to as a chip board. These elements can be electrically connected on the scintillation pulse acquisition circuit board to realize data transmission.
It should be understood that in actual sampling, the pulse waveform is not smooth as shown in fig. 4 or 5, but rather has more fluctuation, and actually appears as fluctuation rising or fluctuation falling within the range of the waveform shown in fig. 4 or 5. The smooth waveforms shown in fig. 4 or 5 are for convenience of illustration. Therefore, during actual sampling, the waveform may cross the same threshold multiple times in a very short time, and the average time of crossing the threshold multiple times in a certain time window or period may be taken as the time of crossing the threshold during actual sampling, which belongs to the technical field, and is easily implemented by those skilled in the art according to the teachings of the present application, and is not described herein.
In some embodiments, the type of the preset plurality of thresholds for performing the multi-threshold sampling may be determined according to the behavior of the scintillation pulse. By way of example, the scintillation pulse may be an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc. The energy index for representing the scintillation pulse is voltage, current, sound intensity, heat, pressure, etc. The threshold may be a voltage threshold, a current threshold, a sound intensity threshold, a heat threshold, a pressure threshold, etc.
In some embodiments, the spacing between the plurality of thresholds may be equal. That is, the plurality of thresholds may constitute an arithmetic progression. Taking the voltage threshold as an example, the spacing between the multiple thresholds may be 10mV, 20mV, 30mV, etc. The intervals between the plurality of thresholds may also be unequal. For example, the plurality of thresholds may form an array of geometric figures having a common ratio of 2.
In some embodiments, the plurality of thresholds may be determined based on empirical data and/or a priori information of the scintillation pulse. For example, taking the electrical pulse as an example, summary data for a large number of electrical pulses shows that the peak value of the associated noise is typically below 60mV. Then the lowest threshold of the plurality of thresholds may be set to 60mV. For another example, the a priori information of the scintillation pulse may yield the magnitude of the pulse peak. At this time, a plurality of thresholds within the peak of the scintillation pulse may be set so that each threshold can collect relevant data. Of course, the plurality of thresholds may not all be within the peak of the scintillation pulse. For example, a certain number of thresholds may be set, based on which threshold data the scintillation pulse actually crosses during the comparison. Taking the voltage threshold as an example, assume that 8 thresholds are set at 60mV, 80mV,100mV,120mV,140mV,160mV,180mV,200mV, respectively. If the peak value of the scintillation pulse is high (e.g., 220 mV), the scintillation pulse may cross more thresholds, such as all 8 thresholds. If the peak value of the scintillation pulse is low (e.g., 150 mV), the scintillation pulse may cross fewer thresholds, such as the first 5 thresholds.
It will be appreciated that the sampled data typically requires a standard reference, such as the zero time of a time reference, for indicating the start time of the sampling. However, the sampling process always results in inconsistent sampling references and standard references due to various factors. Thus, the sampled data may be transformed to obtainSampling data under the standard is obtained, so that calculation is convenient, and the calculation efficiency is improved. With (x) n ,y n ) Describing the sampled data, wherein x n Represents the sampling time, y n Represented at x n The amplitude of the scintillation pulse. When the digital sampling is ADC sampling, n represents the sampling times and also can represent the number of times of sampling point data. When the digitized samples are multi-threshold samples, n represents the number of threshold-time pairs acquired. For example, when the scintillation pulse crosses 8 thresholds, 16 threshold-time pairs can be obtained, then n=16. While at the same time the horizontal translation does not affect the energy information of the scintillation pulse, the reference transformation may be a time reference transformation of the sampled data. The sampled data after reference transformation may be referred to as transformed data, and the time reference value used may be x 1 I.e. the sampling time obtained at the first sampling point. Let pp i =x i -x 1 If i is 1.ltoreq.n, the transformed data obtained by the reference transformation can be expressed as (pp) n ,y n ). The transformation data may be specified as variables of the objective function model, and the one or more intermediate parameters may be determined in conjunction with a first correspondence between the one or more intermediate parameters and the variables. According to the first correspondence mentioned in the foregoing:
andX i =x i -b,Y i =y i The transformation data (pp) may be first transformed n ,y n ) And (X) n ,Y n ) And performing corresponding. Then X is i =pp i -b,Y i =y i . And b represents the symmetry axis (in time) of the scintillation pulse. In sampling, if sampling is performed by the ADC, the sampling rate defines that the interval between any two adjacent sampling times is the same. It is also believed that the average of these sampling times may be approximately equal to or greater than b. In the case of multi-threshold sampling, since the scintillation pulse is symmetrically bell-shaped, the scintillation pulse is symmetrical about the symmetry axis of the scintillation pulse at the time of two passes over the same threshold. That is, the average of the times that the scintillation pulses cross all thresholds is equal to b. Thus, b may be determined based on the following equation 18:
then, in conjunction with z= lnY, the one or more intermediate parameters can be determined as:
The one or more intermediate parameters may be determined by substituting the transformed data into the above formula.
And step 150, transmitting the one or more intermediate parameters and the second corresponding relation to an external device, so that the external device can determine one or more parameters to be determined of the objective function model by utilizing the corresponding relation based on the one or more intermediate parameters.
It will be appreciated that the processing of a closed loop scintillation pulse may include pulse acquisition, sampling, and data processing. The front end component comprises a radiation detection device, pulse acquisition can be achieved, the scintillation pulse acquisition board can achieve pulse sampling, and the back end component comprises processing equipment such as a computer, a server and the like, and can achieve data processing. While the front-end component may transmit sampled data to the back-end component, a large amount of data during transmission would result in a very heavy network load. And the computer or server receives a large amount of data for processing also consumes a large amount of computing resources. In step 150, the sampled data for the scintillation pulse is processed for transmission. That is, the transmission may be of the one or more intermediate parameters. In this way, the amount of data transmitted is greatly reduced, and the network load can be greatly reduced. The external device, such as a computer, a server, etc., may directly utilize the second correspondence, that is, the second correspondence between the one or more intermediate parameters and one or more parameters to be determined of the objective function model of the scintillation pulse, based on the received one or more intermediate parameters, so that a specific expression of the objective function model of the scintillation pulse may be determined by consuming a small amount of computing resources. And integrating the energy values of the scintillation pulses. The energy values may be used for image reconstruction (e.g., PET image reconstruction) or material validation (e.g., validation of geologic formation elements in geologic exploration).
In some embodiments, the processing method 100 may be performed by a chip board. Such as the scintillation pulse acquisition plate described previously. The chip on the chip board may comprise PLD, CPLD, FPGA or ASIC chips. The chip board can sample the scintillation pulse, and utilize the limited computing resource of self to carry out partial processing to the sampling data, reduce the size that the sampling data occupy. This process may be considered another form of "data compression".
The transmitted data is described below in one example.
Taking the example of multi-threshold sampling of scintillation pulses, assuming 8 thresholds are set, 16 threshold-time pairs (i.e., sample data) can be acquired to determine the energy value of the scintillation pulse. That is, 16 time data are required to determine the energy value of one scintillation pulse. And 1 part of time data has a size of 6 bytes (wherein 5 bytes are coarse time and 1 byte is fine time). The size of 16 parts of time data is 96 bytes in total. At the same time, the total data size may exceed 96 bytes, along with other information that needs to be transmitted with the time data, such as event type (i.e., time event) and channel information identification (i.e., which detection channel of the scintillation pulse detector received the high energy particle generated the scintillation pulse). By T 0 -T 15 Representing the 16 pieces of time data, the size of the 16 pieces of time data may be reduced to 20 bytes through the processing of the foregoing steps of the processing method 100. Exemplary event type, channel information identification, and T 0 No processing will be done. T (T) 0 Still occupying 6 bytes. The next 15 times may be replaced with the one or more intermediate parameters. The encapsulation format of all data to be transmitted can be as follows:
where EF is used to distinguish event types, CC represents the number of channels, taking up a total of 2 bytes. T (T) 0 Occupy 6 bytes, encoded as T0[47:40 ], respectively],T0[39:32],T0[31:24],T0[23:16],T0[15:8]T0[7:0 ]]. The one or more intermediate parameters, along with other information, occupy the remaining 12 bytes. Comprises KK-23bits (KK is smaller than 23bits, and occupies 23bits at most according to prior information, occupies 3 bytes), QQ-24bits (QQ is smaller than 24bits, and occupies 3 bytes at most according to prior information), dynamic_len-5bits (threshold related storage occupies 5bits at most, less than 1 byte and shares one byte with RR), RR-42bits (RR is smaller than 42bits, and occupies 42 at most according to prior information)Bits occupy 6 bytes). In the above example, dynamic_len-5bits is 5 bits. The example summary sets 8 thresholds corresponding to 16 sampling time points. There are 16 sampling time points corresponding to the amplitude of the scintillation pulse. 16 < 25=32, and therefore, it is sufficient that the correlation data of the sampling amplitude can be stored with 5 bits. The 5-bit memory cell is arranged to store the sampling point data corresponding to the threshold value number actually crossed by the flicker pulse. Meanwhile, the number of parts n of the sampling point data can be used for subsequent calculation.
By way of the above example, the sample data of one scintillation pulse sample is reduced from greater than 96 bytes to 20 bytes, and the data volume is greatly reduced. The transmitted data volume is reduced, the network transmission load can be reduced, and the transmission efficiency is improved. In another aspect, the computing resource consumption of the server is reduced, and the data processing speed is improved.
It should be noted that the above description of the steps in fig. 1 is only for illustration and description, and does not limit the application scope of the present specification. Various modifications and changes to the steps of fig. 1 may be made by those skilled in the art under the guidance of this specification. However, such modifications and variations are still within the scope of the present description.
The processing method of the scintillation pulse can process the original sampling data to realize data compression and then transmit the data, can reduce the load of a data transmission network and lighten the consumption of computing resources of a server.
Fig. 2 is an exemplary flow chart of another method of processing scintillation pulses according to some embodiments of the present application in which the method 200 of processing scintillation pulses may be performed by a second data processing system 700. For example, the method 200 of processing a scintillation pulse may be stored in a storage device (e.g., a self-contained memory unit or an external memory device of the second data processing system 700) in the form of a program or instructions that, when executed, implement the method 200 of processing a scintillation pulse. As shown in fig. 2, the method 200 of processing scintillation pulses may include the following steps.
Step 210, obtaining an objective function model corresponding to the scintillation pulse.
And 230, digitally sampling the scintillation pulse to obtain sampling data.
In some embodiments, the process 200 may be the same as or similar to some of the steps of the process 100. For example, the processing method 200 may equally be performed by a chip board to determine one or more intermediate parameters by processing the sampled data of the scintillation pulse. And transmitting one or more intermediate parameters to an external device to determine a specific expression of the objective function model corresponding to the scintillation pulse. The processing method 200 is different from the processing method 100 in that the first correspondence between the variable of the objective function model corresponding to the scintillation pulse and one or more intermediate parameters may be transmitted by an external device, instead of the chip board performing function conversion by using its own computing resource. The process of determining the first correspondence by the external device may be the same as described in the relevant part of the processing method 100. By means of the external equipment for parameter conversion, the computing resource of the chip board can be saved, and the computing amount of the chip board is further reduced, so that the parameter conversion is faster.
It should be noted that the above description of the steps in fig. 2 is only for illustration and description, and does not limit the application scope of the present specification. Various modifications and changes to the individual steps of fig. 2 may be made by those skilled in the art under the guidance of this specification. However, such modifications and variations are still within the scope of the present description.
FIG. 6 is an exemplary block diagram of a data processing system according to some embodiments of the present description. The data processing system can realize sampling data processing of the scintillation pulse. As shown in fig. 6, the first data processing system 600 may include a first acquisition module 610, a conversion module 620, a first sampling module 630, a first determination module 640, and a first transmission module 650.
The first obtaining module 610 may be configured to obtain an objective function model corresponding to the scintillation pulse according to step 110 as shown above. The scintillation pulse may be acquired by a radiation detection device, such as a scintillation detector. The photoelectric conversion device of the scintillation detector may convert the visible light signal into an electrical signal that is output in the form of scintillation pulses through electronics connected to the photoelectric conversion device. The output scintillation pulse can enter a shaping circuit for shaping to obtain a waveform conforming to a Gaussian function model. The function model representing the waveform may be designated as the original function model of the scintillation pulse. The first obtaining module 610 may normalize the original function model to determine the objective function model.
The conversion module 620 may be configured to convert the objective function model according to step 120 as described above to obtain a correspondence between a variable of the objective function model and one or more intermediate parameters. The transformation module 620 may perform data processing operations on the objective function model to determine the correspondence. The mathematical processing operations may include at least taking logarithms, parametric transformations, derivatives, and matrixing.
The first sampling module 630 may be configured to digitally sample the scintillation pulse according to step 130 as described above to obtain sampled data. The digitized samples may include ADC samples (or oscilloscope samples). The digitized samples may include multi-threshold samples. When multi-threshold sampling is adopted, a plurality of thresholds can be preset, the preset thresholds are compared with the scintillation pulse to obtain the time when the scintillation pulse passes the threshold, and a threshold-time pair is formed with the corresponding threshold to form the sampling data. The intervals between the plurality of thresholds may be equal and may be determined based on empirical data and/or a priori information of the scintillation pulse.
The first determining module 640 may be configured to use the sampled data as the variable according to step 140 as described above, and determine the intermediate parameter based on the first correspondence. The first determining module 640 may transform the sampled data to obtain sampled data under the standard, so as to facilitate calculation and improve calculation efficiency. The sample data subjected to the reference transformation may be referred to as transformation data. The transformation data may be designated as variables of the objective function model, and the first determining module 640 may determine the intermediate parameter in combination with a first correspondence between the intermediate parameter and the variables. The first determining module 640 may substitute the transformed data into a formula for expressing the first correspondence to determine the intermediate parameter.
The first transmission module 650 may be configured to transmit the one or more intermediate parameters and the second correspondence to an external device according to step 150 as shown above, so that the external device determines the parameter to be determined based on the intermediate parameters and using the correspondence. The intermediate parameters transmitted by the first transmission module 650 may greatly reduce the amount of data transmitted, and may greatly reduce the network load. The external device, such as a computer, a server, etc., can directly utilize the second correspondence relationship, that is, the second correspondence relationship between the intermediate parameter and the parameter to be determined of the objective function model of the scintillation pulse, based on the received intermediate parameter, so that a specific expression of the objective function model of the scintillation pulse can be determined by consuming a small amount of computing resources.
Additional description of the above modules may be found in the flow chart section of the present application, as in fig. 1.
FIG. 7 is an exemplary block diagram of another data processing system according to some embodiments of the present description. The data processing system can realize sampling data processing of the scintillation pulse. As shown in fig. 7, the second data processing system 700 may include a second acquisition module 710, a receiving module 720, a second sampling module 730, a second determination module 740, and a second transmission module 750.
The second obtaining module 710 may be configured to obtain an objective function model corresponding to the scintillation pulse according to step 210 described above.
The receiving module 720 may be configured to obtain a first correspondence between the variable of the objective function model and one or more intermediate parameters according to step 220 as described above.
The second sampling module 730 may be configured to digitally sample the scintillation pulse according to step 230 described above to obtain sampled data.
The second determining module 740 may be configured to use the sampled data as the variable according to step 240 as described above, and determine the one or more intermediate parameters based on the first correspondence.
The second transmission module 750 may be configured to transmit the one or more intermediate parameters to an external device according to step 250 above, so that the external device determines one or more parameters to be determined of the objective function model using a second correspondence relationship based on the intermediate parameters; the second correspondence reflects a transformation between the intermediate parameter and the parameter to be determined.
The second acquisition module 710, the second sampling module 730, the second determination module 740, and the second transmission module 750 may perform the same or similar operations as the first acquisition module 610, the first sampling module 630, the first determination module 640, and the first transmission module 650. The receiving module 720 may accept a first correspondence between a variable of an objective function model corresponding to the scintillation pulse transmitted by an external device and one or more intermediate parameters.
Additional description of the above modules may be found in the flow chart section of the present application, e.g., fig. 1-2.
It should be understood that the systems and modules thereof shown in fig. 6 and 7 may be implemented in a variety of ways. For example, in some embodiments, the system and its modules may be implemented in hardware, software, or a combination of software and hardware. Wherein the hardware portion may be implemented using dedicated logic; the software portions may then be stored in a memory and executed by a suitable instruction execution system, such as a microprocessor or special purpose design hardware. Those skilled in the art will appreciate that the methods and systems described above may be implemented using computer executable instructions and/or embodied in processor control code, such as provided on a carrier medium such as a magnetic disk, CD or DVD-ROM, a programmable memory such as read only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The system of the present specification and its modules may be implemented not only with hardware circuits such as very large scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, etc., or programmable hardware devices such as field programmable gate arrays, programmable logic devices, etc., but also with software executed by various types of processors, for example, and with a combination of the above hardware circuits and software (e.g., firmware).
It should be noted that the above description of the modules is for convenience of description only and is not intended to limit the present description to the scope of the illustrated embodiments. It will be appreciated by those skilled in the art that, given the principles of the system, various modules may be combined arbitrarily or a subsystem may be constructed in connection with other modules without departing from such principles. For example, each module may share one memory module, or each module may have a respective memory module. Such variations are within the scope of the present description.
Fig. 8 is an exemplary block diagram of a processing device, shown in accordance with some embodiments of the present application. Processing device 800 may include any of the components used to implement the systems described in embodiments of the present application. For example, processing device 800 may be implemented in hardware, software programs, firmware, or a combination thereof. For example, processing device 800 may implement a first data processing system 600 and a second data processing system 700. For convenience, only one processing device is depicted, but implementing the computing functions described in embodiments of the present application may be implemented in a distributed manner by a set of similar platforms to distribute the processing load of the system.
In some embodiments, processing device 800 may include a processor 810, a memory 820, input/output components 830, and communication ports 840. In some embodiments, a processor (e.g., CPU) 810 may execute program instructions in the form of one or more processors. In some embodiments, memory 820 includes different forms of program memory and data memory, such as a hard disk, read-only memory (ROM), random Access Memory (RAM), etc., for storing a wide variety of data files for processing and/or transmission by a computer. In some embodiments, input/output component 830 may be used to support input/output between processing device 800 and other components. In some embodiments, communication port 840 may be connected to a network for enabling data communication. An exemplary processing device may include program instructions stored in read-only memory (ROM), random Access Memory (RAM), and/or other types of non-transitory storage media for execution by processor 810. The methods and/or processes of the embodiments of the present description may be implemented in the form of program instructions. The processing device 800 may also receive the programs and data disclosed in the present application through network communication.
For ease of understanding, only one processor is schematically depicted in fig. 8. It should be noted, however, that the processing device 800 in the embodiments of the present description may include multiple processors, and thus the operations and/or methods described in the embodiments of the present description as being implemented by one processor may also be implemented by multiple processors collectively or independently. For example, in this description, the processors of processing device 800 perform steps 110 and 120, it should be understood that steps 110 and 120 may also be performed jointly or independently by two different processors of processing device 800 (e.g., a first processor performing step 110, a second processor performing step 120, or both first and second processors jointly performing steps 110 and 120).
The processing method of the scintillation pulse provided by the application can be particularly used in photon detection, and can be applied to various fields, such as medical imaging technology, high-energy physics, laser radar, autopilot, precise analysis, optical communication and the like. In a specific example, the method and apparatus for processing scintillation pulses, the detector, the electronic device, and the storage medium provided in the present application may be applied to positron emission computed tomography (PET), where the method and apparatus for processing scintillation pulses may be used to acquire photon data and then reconstruct an image in a PET system. In other specific examples of the present application, the method and apparatus for processing scintillation pulses, the detector, the electronic device, and the storage medium provided herein may be applied to a variety of digitizing devices, such as one of CT devices, MRI devices, radiation detection devices, petroleum detection devices, dim light detection devices, SPECT devices, security inspection devices, gamma cameras, X-ray devices, DR devices, and the like, or a combination of the foregoing devices that utilize the principle of high-energy ray conversion.
Having described the basic concepts herein, it will be apparent to those skilled in the art that the foregoing detailed disclosure is by way of example only and is not intended to be limiting. Although not explicitly described herein, various modifications, improvements, and adaptations to the present disclosure may occur to one skilled in the art. Such modifications, improvements, and modifications are intended to be suggested within this specification, and therefore, such modifications, improvements, and modifications are intended to be included within the spirit and scope of the exemplary embodiments of the present invention.
Meanwhile, the specification uses specific words to describe the embodiments of the specification. Reference to "one embodiment," "an embodiment," and/or "some embodiments" means that a particular feature, structure, or characteristic is associated with at least one embodiment of the present description. Thus, it should be emphasized and should be appreciated that two or more references to "an embodiment" or "one embodiment" or "an alternative embodiment" in various positions in this specification are not necessarily referring to the same embodiment. Furthermore, certain features, structures, or characteristics of one or more embodiments of the present description may be combined as suitable.
Furthermore, those skilled in the art will appreciate that the various aspects of the specification can be illustrated and described in terms of several patentable categories or circumstances, including any novel and useful procedures, machines, products, or materials, or any novel and useful modifications thereof. Accordingly, aspects of the present description may be performed entirely by hardware, entirely by software (including firmware, resident software, micro-code, etc.), or by a combination of hardware and software. The above hardware or software may be referred to as a "data block," module, "" engine, "" unit, "" component, "or" system. Furthermore, aspects of the specification may take the form of a computer product, comprising computer-readable program code, embodied in one or more computer-readable media.
The computer storage medium may contain a propagated data signal with the computer program code embodied therein, for example, on a baseband or as part of a carrier wave. The propagated signal may take on a variety of forms, including electro-magnetic, optical, etc., or any suitable combination thereof. A computer storage medium may be any computer readable medium that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code located on a computer storage medium may be propagated through any suitable medium, including radio, cable, fiber optic cable, RF, or the like, or a combination of any of the foregoing.
The computer program code necessary for operation of portions of the present description may be written in any one or more programming languages, including an object oriented programming language such as Java, scala, smalltalk, eiffel, JADE, emerald, C ++, c#, vb net, python, and the like, a conventional programming language such as C language, visual Basic, fortran 3003, perl, COBOL 3002, PHP, ABAP, a dynamic programming language such as Python, ruby, and Groovy, or the like. The program code may execute entirely on the user's computer or as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer may be connected to the user's computer through any form of network, such as a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet), or the use of services such as software as a service (SaaS) in a cloud computing environment.
Furthermore, the order in which the elements and sequences are processed, the use of numerical letters, or other designations in the description are not intended to limit the order in which the processes and methods of the description are performed unless explicitly recited in the claims. While certain presently useful inventive embodiments have been discussed in the foregoing disclosure, by way of various examples, it is to be understood that such details are merely illustrative and that the appended claims are not limited to the disclosed embodiments, but, on the contrary, are intended to cover all modifications and equivalent arrangements included within the spirit and scope of the embodiments of the present disclosure. For example, while the system components described above may be implemented by hardware devices, they may also be implemented solely by software solutions, such as installing the described system on an existing server or mobile device.
Likewise, it should be noted that in order to simplify the presentation disclosed in this specification and thereby aid in understanding one or more inventive embodiments, various features are sometimes grouped together in a single embodiment, figure, or description thereof. This method of disclosure, however, is not intended to imply that more features than are presented in the claims are required for the present description. Indeed, less than all of the features of a single embodiment disclosed above.
In some embodiments, numbers describing the components, number of attributes are used, it being understood that such numbers being used in the description of embodiments are modified in some examples by the modifier "about," approximately, "or" substantially. Unless otherwise indicated, "about," "approximately," or "substantially" indicate that the number allows for a 20% variation. Accordingly, in some embodiments, numerical parameters set forth in the specification and claims are approximations that may vary depending upon the desired properties sought to be obtained by the individual embodiments. In some embodiments, the numerical parameters should take into account the specified significant digits and employ a method for preserving the general number of digits. Although the numerical ranges and parameters set forth herein are approximations that may be employed in some embodiments to confirm the breadth of the range, in particular embodiments, the setting of such numerical values is as precise as possible.
Each patent, patent application publication, and other material, such as articles, books, specifications, publications, documents, etc., referred to in this specification is incorporated herein by reference in its entirety. Except for application history documents that are inconsistent or conflicting with the content of this specification, documents that are currently or later attached to this specification in which the broadest scope of the claims to this specification is limited are also. It is noted that, if the description, definition, and/or use of a term in an attached material in this specification does not conform to or conflict with what is described in this specification, the description, definition, and/or use of the term in this specification controls.
Finally, it should be understood that the embodiments described in this specification are merely illustrative of the principles of the embodiments of this specification. Other variations are possible within the scope of this description. Thus, by way of example, and not limitation, alternative configurations of embodiments of the present specification may be considered as consistent with the teachings of the present specification. Accordingly, the embodiments of the present specification are not limited to only the embodiments explicitly described and depicted in the present specification.
Claims (30)
1. A method of processing a scintillation pulse, the method comprising:
obtaining an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined;
converting the objective function model to obtain a first corresponding relation between a variable of the objective function model and one or more intermediate parameters and a second corresponding relation between the intermediate parameters and the parameters to be determined;
digitally sampling the scintillation pulse to obtain sampling data;
utilizing the sampling data as the variable, and determining the intermediate parameter based on the first correspondence;
and transmitting the intermediate parameter and the second corresponding relation to external equipment so that the external equipment can determine the parameter to be determined based on the intermediate parameter and by utilizing the second corresponding relation.
2. The method for processing scintillation pulse according to claim 1, wherein the obtaining the objective function model corresponding to scintillation pulse comprises:
acquiring an original function model, wherein the original function model accords with a Gaussian function;
and carrying out normalization processing on the original function model, and determining the objective function model.
3. The method for processing scintillation pulse according to claim 1, wherein the acquiring the first correspondence and the second correspondence includes:
performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
4. The method of processing the scintillation pulse of claim 1, wherein digitally sampling the scintillation pulse comprises:
ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
5. The method of processing a scintillation pulse of claim 4, wherein the acquiring sample data when performing multi-threshold sampling comprises:
presetting a plurality of thresholds;
for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair;
A plurality of threshold-time pairs are specified to form the sample data.
6. The method of processing a scintillation pulse of claim 5, wherein the spacing between the plurality of thresholds is equal.
7. The method of processing scintillation pulses of claim 1, wherein the determining an intermediate parameter comprises:
performing reference transformation on the sampling data to obtain transformation data;
designating the transformation data as the variable, and solving the intermediate parameter by using the first corresponding relation.
8. A method of processing a scintillation pulse, the method comprising:
obtaining an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined;
acquiring a first corresponding relation between a variable of the objective function model and one or more intermediate parameters;
digitally sampling the scintillation pulse to obtain sampling data;
utilizing the sampling data as the variable, and determining the intermediate parameter based on the first correspondence;
and transmitting the intermediate parameter to an external device so that the external device can determine the parameter to be determined based on the intermediate parameter and by utilizing a second corresponding relation between the intermediate parameter and the parameter to be determined.
9. The method for processing scintillation pulse according to claim 8, wherein the obtaining the objective function model corresponding to scintillation pulse comprises:
acquiring an original function model, wherein the original function model accords with a Gaussian function;
and carrying out normalization processing on the original function model, and determining the objective function model.
10. The method of processing a scintillation pulse of claim 8, wherein the first correspondence and the second correspondence are determined based on operations comprising:
performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
11. The method of processing the scintillation pulse of claim 8, wherein digitally sampling the scintillation pulse comprises:
ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
12. The method of processing a scintillation pulse of claim 11, wherein the acquiring sample data when performing multi-threshold sampling comprises:
presetting a plurality of thresholds;
for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair;
A plurality of threshold-time pairs are specified to form the sample data.
13. The method of processing scintillation pulses of claim 12, wherein the spacing between the plurality of thresholds is equal.
14. The method of processing scintillation pulses as recited in claim 8, wherein the determining the intermediate parameter includes:
performing reference transformation on the sampling data to obtain transformation data;
designating the transformation data as the variable, and solving the first intermediate parameter by using the first corresponding relation.
15. A processing device for scintillation pulses, the processing device comprising:
the first acquisition module is configured to acquire an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined;
the conversion module is configured to convert the objective function model to obtain a first corresponding relation between a variable of the objective function model and one or more intermediate parameters and a second corresponding relation between the intermediate parameters and the parameters to be determined;
the first sampling module is configured to digitally sample the scintillation pulse to obtain sampling data;
A first determining module configured to use the sampled data as the variable and determine the intermediate parameter based on the first correspondence;
the first transmission module is configured to transmit the intermediate parameter and the second corresponding relation to external equipment, so that the external equipment can determine the parameter to be determined based on the intermediate parameter and by utilizing the second corresponding relation.
16. The apparatus for processing scintillation pulse of claim 15, wherein to obtain the objective function model corresponding to the scintillation pulse, the first obtaining module is configured to:
acquiring an original function model, wherein the original function model accords with a Gaussian function;
and carrying out normalization processing on the original function model, and determining the objective function model.
17. The apparatus according to claim 15, wherein to obtain the first correspondence and the second correspondence, the conversion module is configured to:
performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
18. The scintillation pulse processing apparatus of claim 15, wherein to digitally sample the scintillation pulse, the first sampling module is configured to:
ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
19. The scintillation pulse processing apparatus of claim 18, wherein, when performing multi-threshold sampling, the first sampling module is configured to, to obtain sample data:
presetting a plurality of thresholds;
for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair;
a plurality of threshold-time pairs are specified to form the sample data.
20. The apparatus for processing scintillation pulses of claim 19, wherein the spacing between the plurality of thresholds is equal.
21. The apparatus for processing scintillation pulses of claim 15, wherein to determine the intermediate parameter, the first determination module is configured to:
performing reference transformation on the sampling data to obtain transformation data;
Designating the transformation data as the variable, and solving the first intermediate parameter by using the first corresponding relation.
22. A scintillation pulse processing apparatus, the apparatus comprising:
the second acquisition module is configured to acquire an objective function model corresponding to the scintillation pulse, wherein the objective function model comprises one or more parameters to be determined;
the receiving module is configured to acquire a first corresponding relation between the variable of the objective function model and one or more intermediate parameters;
the second sampling module is configured to digitally sample the scintillation pulse to obtain sampling data;
a second determining module configured to use the sampled data as the variable and determine the intermediate parameter based on the first correspondence;
and the second transmission module is configured to transmit the intermediate parameter to external equipment so that the external equipment can determine the parameter to be determined based on the intermediate parameter and by utilizing a second corresponding relation between the intermediate parameter and the parameter to be determined.
23. The apparatus for processing scintillation pulse of claim 22, wherein to obtain the objective function model corresponding to the scintillation pulse, the second obtaining module is configured to:
Acquiring an original function model, wherein the original function model accords with a Gaussian function;
and carrying out normalization processing on the original function model, and determining the objective function model.
24. The apparatus according to claim 22, wherein the first correspondence and the second correspondence are determined based on:
performing mathematical processing operation on the objective function model to determine the correspondence; wherein the mathematical processing operation includes at least taking a logarithm, transforming a parameter, deriving, and matrixing.
25. The scintillation pulse processing apparatus of claim 22, wherein to digitally sample the scintillation pulse, the second sampling module is configured to:
ADC sampling or multi-threshold sampling is performed on the scintillation pulse.
26. The scintillation pulse processing apparatus of claim 25, wherein, when performing multi-threshold sampling, the second sampling module is configured to, to obtain sample data:
presetting a plurality of thresholds;
for each threshold, comparing the scintillation pulse with the threshold, determining a state change signal when the scintillation pulse crosses the threshold; performing digital time sampling on the state change signal to obtain a corresponding threshold-time pair;
A plurality of threshold-time pairs are specified to form the sample data.
27. The scintillation pulse processing apparatus of claim 26, wherein the spacing between the plurality of thresholds is equal.
28. The scintillation pulse processing apparatus of claim 22, wherein to determine the intermediate parameter, the second determination module is configured to:
performing reference transformation on the sampling data to obtain transformation data;
designating the transformation data as the variable, and solving the first intermediate parameter by using the first corresponding relation.
29. A processing apparatus, comprising: memory, a processor and a computer program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the processing method according to any of claims 1-14.
30. A computer readable storage medium, characterized in that the storage medium has stored thereon a computer program which, when executed by a processor, implements the steps of the method according to any of claims 1-14.
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