CN115961314A - Preparation method of composite mask - Google Patents
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- CN115961314A CN115961314A CN202211030975.XA CN202211030975A CN115961314A CN 115961314 A CN115961314 A CN 115961314A CN 202211030975 A CN202211030975 A CN 202211030975A CN 115961314 A CN115961314 A CN 115961314A
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- 239000002131 composite material Substances 0.000 title claims abstract description 16
- 238000002360 preparation method Methods 0.000 title claims abstract description 12
- 229920006254 polymer film Polymers 0.000 claims abstract description 22
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 15
- 239000000463 material Substances 0.000 claims abstract description 10
- 238000004140 cleaning Methods 0.000 claims abstract description 9
- 238000005553 drilling Methods 0.000 claims abstract description 6
- 238000001035 drying Methods 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 14
- -1 polypropylene Polymers 0.000 claims description 6
- 239000004642 Polyimide Substances 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- 239000004743 Polypropylene Substances 0.000 claims description 4
- 238000000206 photolithography Methods 0.000 claims description 4
- 229920001155 polypropylene Polymers 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- 229910021389 graphene Inorganic materials 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 229920001688 coating polymer Polymers 0.000 claims description 2
- 229920002521 macromolecule Polymers 0.000 claims 2
- LLLVZDVNHNWSDS-UHFFFAOYSA-N 4-methylidene-3,5-dioxabicyclo[5.2.2]undeca-1(9),7,10-triene-2,6-dione Chemical compound C1(C2=CC=C(C(=O)OC(=C)O1)C=C2)=O LLLVZDVNHNWSDS-UHFFFAOYSA-N 0.000 claims 1
- 238000005323 electroforming Methods 0.000 abstract description 13
- 229910052751 metal Inorganic materials 0.000 abstract description 12
- 239000002184 metal Substances 0.000 abstract description 12
- 229920000642 polymer Polymers 0.000 abstract description 5
- 239000011248 coating agent Substances 0.000 abstract description 2
- 238000000576 coating method Methods 0.000 abstract description 2
- 238000001259 photo etching Methods 0.000 abstract 2
- 238000000465 moulding Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 9
- 238000005530 etching Methods 0.000 description 5
- 150000002739 metals Chemical class 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 229910001374 Invar Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910002056 binary alloy Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
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Abstract
Description
技术领域technical field
本发明涉及电子设备加工领域,具体涉及一种复合掩膜版的制备方法。The invention relates to the field of electronic equipment processing, in particular to a method for preparing a composite mask.
背景技术Background technique
FMM(fine metal mask,精密掩膜版)是制备OLED器件的关键治具。多采用低膨胀系数的金属或合金作为基材。目前主流的FMM生产工艺技术分为两种,一是蚀刻,二是电铸。FMM (fine metal mask, precision mask plate) is the key fixture for preparing OLED devices. Metals or alloys with low expansion coefficients are often used as substrates. At present, the mainstream FMM production technology is divided into two types, one is etching, and the other is electroforming.
采用蚀刻法的缺陷在于蚀刻液蚀刻作用各向同性的特性,开孔尺寸与厚度接近,再加之蚀刻所用的Invar合金厚度较厚30um左右,故开孔尺寸较大,无法达到高PPI的目标。The disadvantage of using the etching method is that the etching effect of the etching solution is isotropic, and the opening size is close to the thickness. In addition, the thickness of the Invar alloy used for etching is about 30um, so the opening size is relatively large, and the goal of high PPI cannot be achieved.
电铸法能有效控制掩膜版的厚度。,由于电铸二元合金存在较大难度,大多厂商多采用Ni等单一磁性金属作为基材。但Ni本身热膨胀系数达到1.3*10-5/K,这远远无法满足OLED蒸镀对于低热膨胀系数的要求(3*10-6/K)。且电铸在控制基板厚度的同时,很难控制Taper角。The electroforming method can effectively control the thickness of the mask. , due to the difficulty of electroforming binary alloys, most manufacturers use single magnetic metals such as Ni as the base material. However, the thermal expansion coefficient of Ni itself reaches 1.3*10 -5 /K, which is far from meeting the requirement of low thermal expansion coefficient (3*10 -6 /K) for OLED evaporation. Moreover, it is difficult to control the Taper angle while controlling the thickness of the substrate by electroforming.
故现行电铸工艺很难满足OLED蒸镀要求,急需一种新的掩膜版制备方法。Therefore, the current electroforming process is difficult to meet the requirements of OLED evaporation, and a new mask preparation method is urgently needed.
发明内容Contents of the invention
本发明目的在于,在掩膜版制备工艺中有效克服电铸基板导致的热膨胀和精确控制开孔角度的难题。The purpose of the present invention is to effectively overcome the thermal expansion caused by the electroformed substrate and the difficulties of precisely controlling the opening angle in the mask plate preparation process.
因此,提出一种复合掩膜版的制备方法,具体技术方案如下:Therefore, a method for preparing a composite mask is proposed, and the specific technical scheme is as follows:
一种复合掩膜版的制备方法,其特征在于:A method for preparing a composite mask, characterized in that:
包括如下步骤:Including the following steps:
S1:在掩膜版上设置有光刻图;S1: a photolithography pattern is set on the mask;
S2:通过光刻图去除部分光阻;S2: removing part of the photoresist through the photolithography pattern;
S3:电铸掩膜版,在掩膜版上均匀涂布高分子膜层;S3: Electroformed mask plate, evenly coating polymer film on the mask plate;
S4:将高分子膜层固化成型;S4: curing the polymer film layer;
S5:对固化后的高分子膜层进行脉冲钻孔,开出带锥角的类圆锥台孔洞,该孔洞的进口比出口孔径大,锥角范围控制在30°-120°;S5: Perform pulse drilling on the cured polymer film, and open a frustum-like hole with a cone angle. The entrance of the hole is larger than the exit aperture, and the cone angle is controlled within 30°-120°;
S6:用清洗液去掉剩下的光阻;S6: removing the remaining photoresist with a cleaning solution;
S7:对激光开孔残留进行清洗,将掩膜版烘干后,完成制备。S7: cleaning the laser opening residue, drying the mask, and completing the preparation.
为更好的实现本发明,可进一步地:For realizing the present invention better, can further:
所述S4中,高分子膜层通过激光热处理或烘烤固化成型。In S4, the polymer film layer is cured and formed by laser heat treatment or baking.
进一步地:所述高分子采用低热膨胀系数材料,所述高分子膜层的材料选用聚酰亚胺、聚丙烯、聚对苯二甲酸乙二醇酯或石墨烯。Further: the polymer is made of a material with a low thermal expansion coefficient, and the material of the polymer film layer is selected from polyimide, polypropylene, polyethylene terephthalate or graphene.
进一步地:所述S5中,通过采用Yb:KGW飞秒激光器的飞秒激光脉冲进行钻孔。Further: in said S5, drilling is performed by using femtosecond laser pulses of a Yb:KGW femtosecond laser.
进一步地:所述Yb:KGW飞秒激光器采用的参数为,中心波长1024nm,平均功率6W,脉冲持续时间190fs,脉冲重复频Yb:KGW飞秒激光器率200KHz,脉冲最大能量1mJ,通过变换脉冲振幅1um-100um调节taper角,taper角为锥度角。Further: the parameter that described Yb:KGW femtosecond laser adopts is, center wavelength 1024nm, average power 6W, pulse duration 190fs, pulse repetition frequency Yb:KGW femtosecond laser rate 200KHz, pulse maximum energy 1mJ, by transforming pulse amplitude 1um-100um to adjust the taper angle, the taper angle is the taper angle.
进一步地:所述孔洞的进口孔径大小1-40um。Further: the inlet diameter of the hole is 1-40um.
进一步地:所述高分子膜层的厚度控制在5um-100um之间。Further: the thickness of the polymer film layer is controlled between 5um-100um.
进一步地:所述清洗液采用氢氟醚。Further: the cleaning solution uses hydrofluoroether.
进一步地:所述高分子膜层采用聚酰亚胺。Further: the polymer film layer adopts polyimide.
进一步地:所述掩膜版采用Ni,Fe,Co。Further: the mask uses Ni, Fe, Co.
本发明的有益效果为:The beneficial effects of the present invention are:
第一,本发明通过在电铸掩膜版上增加一层与金属贴合的高分子低热膨胀系数材料,由于增加层的附着力作用可以有效的减弱电铸掩膜版的热膨胀,解决了电铸掩膜版的热膨胀问题。First, the present invention adds a layer of high molecular low thermal expansion coefficient material bonded to the metal on the electroformed mask, which can effectively weaken the thermal expansion of the electroformed mask due to the increased adhesion of the layer, and solves the problem of electroforming. Thermal expansion of cast mask.
第二,本发明在增加的材料层进行对位激光开孔,通过飞秒激光的作用开出带有一定taper角的通孔,解决了电铸在薄化过程中,难以有效控制taper角的难点。Second, the invention performs alignment laser opening on the increased material layer, and opens a through hole with a certain taper angle through the action of femtosecond laser, which solves the problem that it is difficult to effectively control the taper angle during the thinning process of electroforming difficulty.
附图说明Description of drawings
图1为本发明的工作具体流程图;Fig. 1 is the concrete flow chart of work of the present invention;
图2为涂光阻示意图;Figure 2 is a schematic diagram of photoresist coating;
图3为制作孔洞示意图;Figure 3 is a schematic diagram of making holes;
图4为孔洞完成示意图;Figure 4 is a schematic diagram of hole completion;
图5电铸示意图;Figure 5 schematic diagram of electroforming;
图6电铸完成示意图;Figure 6 is a schematic diagram of the completion of electroforming;
图7涂高分子层示意图;Fig. 7 is coated with polymer layer schematic diagram;
图8高分子和金属连接的示意图;Figure 8 is a schematic diagram of the connection between polymers and metals;
图9激光开孔示意图;Figure 9 schematic diagram of laser opening;
图10开孔完成后的示意图;Figure 10 is a schematic diagram after the opening is completed;
图中附图说明为,阴极板1、光阻2、UV光3、mask4、电镀液5、金属块6、阳极板7、高分子膜8、激光9。The drawings in the figure are illustrated as
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
如图1所示:As shown in Figure 1:
一种复合掩膜版的制备方法,包括如下步骤:A method for preparing a composite mask, comprising the steps of:
S1:如图2所示,在阴极板上设置有光阻,光阻的厚度为3-30um,S1: As shown in Figure 2, a photoresist is provided on the cathode plate, and the thickness of the photoresist is 3-30um.
S2:如图3和图4所示,在光阻表面设置有掩膜版孔洞图,通过UV光照射显影,去除多余光阻;S2: As shown in Fig. 3 and Fig. 4, a mask hole pattern is arranged on the surface of the photoresist, and the excess photoresist is removed by UV light irradiation and development;
S3:如图5所示,在阴极板上方相对设置有阳极板,在阴极板和阳极板之间设置有电镀液,得到电铸金属层。如图6所示,该电铸金属层的厚度与光阻厚度一致。在本实施例中,金属层为Ni.金属层也可采用Fe,Co或者与其他元素的组合;S3: As shown in FIG. 5 , an anode plate is arranged opposite to the cathode plate, and an electroplating solution is arranged between the cathode plate and the anode plate to obtain an electroformed metal layer. As shown in FIG. 6, the thickness of the electroformed metal layer is consistent with the thickness of the photoresist. In this embodiment, the metal layer is Ni. The metal layer can also use Fe, Co or a combination with other elements;
S4:如图7所示,在金属层和光阻层的表面均匀涂布高分子膜层,高分子膜层的厚度控制在3-50um之间。该高分子采用低热膨胀系数材料,所述高分子膜层的材料选用聚酰亚胺、聚丙烯、聚对苯二甲酸乙二醇酯或石墨烯。S4: As shown in FIG. 7 , uniformly coat a polymer film layer on the surface of the metal layer and the photoresist layer, and control the thickness of the polymer film layer between 3-50 um. The polymer adopts a material with a low thermal expansion coefficient, and the material of the polymer film layer is selected from polyimide, polypropylene, polyethylene terephthalate or graphene.
将高分子膜层固化成型,具体为,高分子膜层通过激光热处理或烘烤固化成型。The polymer film layer is cured and formed, specifically, the polymer film layer is cured and formed by laser heat treatment or baking.
S5:如图8所示,去除阴极板和光阻,得到下表面带金属块的高分子膜层。S5: As shown in FIG. 8 , remove the cathode plate and the photoresist to obtain a polymer film layer with a metal block on the lower surface.
S6:如图9所示,采用Yb:KGW飞秒激光器通过飞秒激光脉冲对固化后的高分子膜层进行脉冲钻孔,开出带锥角的类圆锥台孔洞,该孔洞的进口比出口孔径大,孔径的进口大小1-40um,锥角范围控制在30°-120°,具体结构如图10所示。S6: As shown in Figure 9, a Yb:KGW femtosecond laser is used to perform pulse drilling on the cured polymer film layer through a femtosecond laser pulse, and a frustum-like hole with a cone angle is opened. The entrance of the hole is larger than the exit. The pore diameter is large, the inlet size of the pore diameter is 1-40um, and the cone angle range is controlled at 30°-120°. The specific structure is shown in Figure 10.
该飞秒激光器的中心波长1024nm,平均功率6W,脉冲持续时间190fs,脉冲重复频率200KHz,脉冲最大能量1mJ,通过变换脉冲振幅1um-100um调节taper角。The central wavelength of the femtosecond laser is 1024nm, the average power is 6W, the pulse duration is 190fs, the pulse repetition frequency is 200KHz, the maximum pulse energy is 1mJ, and the taper angle is adjusted by changing the pulse amplitude from 1um to 100um.
S7:用氢氟醚清洗,激光开孔残留,烘干,完成。S7: Cleaning with hydrofluoroether, laser opening remains, and drying, complete.
对于本领域技术人员而言,显然本发明不限于上述示范性实施例的细节,而且在不背离本发明的精神或基本特征的情况下,能够以其他的具体形式实现本发明。因此,无论从哪一点来看,均应将实施例看作是示范性的,而且是非限制性的,本发明的范围由所附权利要求而不是上述说明限定,因此旨在将落在权利要求的等同要件的含义和范围内的所有变化囊括在本发明内。不应将权利要求中的任何附图标记视为限制所涉及的权利要求。It will be apparent to those skilled in the art that the invention is not limited to the details of the above-described exemplary embodiments, but that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Accordingly, the embodiments should be regarded in all points of view as exemplary and not restrictive, the scope of the invention being defined by the appended claims rather than the foregoing description, and it is therefore intended that the scope of the invention be defined by the appended claims rather than by the foregoing description. All changes within the meaning and range of equivalents of the elements are embraced in the present invention. Any reference sign in a claim should not be construed as limiting the claim concerned.
此外,应当理解,虽然本说明书按照实施方式加以描述,但并非每个实施方式仅包含一个独立的技术方案,说明书的这种叙述方式仅仅是为清楚起见,本领域技术人员应当将说明书作为一个整体,各实施例中的技术方案也可以经适当组合,形成本领域技术人员可以理解的其他实施方式。In addition, it should be understood that although this specification is described according to implementation modes, not each implementation mode only contains an independent technical solution, and this description in the specification is only for clarity, and those skilled in the art should take the specification as a whole , the technical solutions in the various embodiments can also be properly combined to form other implementations that can be understood by those skilled in the art.
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