CN115931937A - Backscatter inspection apparatus - Google Patents
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- CN115931937A CN115931937A CN202110943624.7A CN202110943624A CN115931937A CN 115931937 A CN115931937 A CN 115931937A CN 202110943624 A CN202110943624 A CN 202110943624A CN 115931937 A CN115931937 A CN 115931937A
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Abstract
The present disclosure provides a backscatter inspection apparatus for performing radiation inspection on an object to be inspected, comprising: a box body with a beam outlet side surface; a ray generating device arranged on the box body and configured to emit pencil-shaped ray beams towards the beam-outgoing side surface of the box body so as to scan the detected object positioned outside the beam-outgoing side surface; and the detection device is configured to receive the backscattered rays scattered by the detected object and comprises a first detection part and more than one second detection part, the first detection part is positioned at the beam-outgoing side and provided with a first detection surface used for receiving the backscattered rays, the second detection part is provided with a second detection surface used for receiving the backscattered rays, and at least one second detection part is positioned at the top or the bottom of the box body. The backscatter inspection apparatus is advantageous in improving the effect of scanning an image of a portion of the object outside the top or bottom end of the probe portion on the beam-exiting side.
Description
Technical Field
The present disclosure relates to the field of radiation inspection equipment, and more particularly, to a backscatter inspection equipment.
Background
In the field of radiation inspection equipment, a backscatter inspection apparatus is used to perform radiation inspection on an object 1 to be inspected. A schematic structural diagram of a backscatter inspection apparatus of the related art is shown in fig. 1 and 2, and mainly includes a housing 2 and a backscatter imaging system. The backscatter imaging system includes a radiation generating device 4 and a detecting device 3, and includes a power supply, a signal processing device, an electric control device, a computer, and the like, which are not illustrated. Fig. 1 only shows the box 2 of the backscatter inspection apparatus, and the radiation generating device 4 and the detecting device 3 located inside the box 2, and the chassis of the backscatter inspection apparatus for carrying the box 2 and other components of the backscatter imaging system except the radiation generating device 4 and the detecting device 3 are omitted.
As shown in fig. 1, in the backscatter imaging system of the backscatter inspection apparatus, the radiation generating device 4 is capable of generating a pencil beam 7 and of changing the direction of the pencil beam 7, and the two dotted lines indicated by reference numeral 5 in fig. 1 indicate the exit angle range of the pencil beam 7. The detection device 3 is used for receiving the back scattered ray 6 scattered after the pencil beam 7 is irradiated to the object 1 to be detected. Wherein, the detection device 3 and the ray generating device 4 are positioned in the box body 2, and the detection device 3 is positioned on the beam-outgoing side surface of the pencil-shaped ray beam 7 of the box body 2. Other components of the backscatter imaging system of the radiation backscatter inspection apparatus may be located wholly or partially within the housing 2.
When the backscatter inspection apparatus performs radiation inspection on the object 1, at a certain moment, the pencil beam 7 is emitted from the ray generating device 4 and is scattered on the object 1, wherein part of the backscatter rays 6 enter the detecting device 3 to generate an output signal, and the signal is processed by the signal processing and data acquisition system of the signal processing device and the magnitude of the signal at the moment is recorded. The exit direction of the pencil beam 7 is changed and the signal of the backscattered radiation 6 of the next location is acquired at the next instant. And so on to scan the first part of the object 1. The relative position of the object 1 and the box 2 is changed, the scanning process is executed on the object 1, and the scanning of the second part of the object 1 is realized. Until the whole scanning process of the object 1 is completed.
As shown in fig. 1 and 2, when the backscatter inspection apparatus performs inspection on an object 1, if the height of the object 1 exceeds the tip of the detection device 3, when the pencil beam 7 irradiates a certain position (as shown in fig. 2) of a portion (as indicated by a dashed-dotted frame 8 in fig. 1) of the object 1 located above the tip of the detection device 3, only a small portion of the backscatter radiation 6 can enter the detection device 3 because the opening angle (as indicated by 600 in fig. 2) of the detection device 3 for the position, resulting in poor imaging quality of the backscatter imaging system for a portion of the object 1 higher than the tip of the detection device 3. If the detection effect of the portion of the object 1 located outside the top end of the detection device 3 is to be improved, the length of the detection device 3 needs to be extended upward, which increases the size of the backscatter imaging system. A similar problem also exists when the height of the bottom end of the object 1 is lower than the bottom end of the detecting device 3.
Disclosure of Invention
The purpose of the present disclosure is to provide a backscatter inspection apparatus, which aims to improve the effect of scanning an image of a portion of an object to be inspected, which is located outside the top end or the bottom end of a probe portion on the beam-outgoing side.
A first aspect of the present disclosure provides a backscatter inspection apparatus for performing radiation inspection on an object to be inspected, including:
a box body with a beam outlet side surface;
the ray generating device is arranged on the box body and is configured to emit pencil-shaped ray beams towards the beam outlet side face of the box body so as to scan the detected object positioned outside the beam outlet side face; and
the detection device is configured to receive the backscattered rays scattered by the detected object and comprises a first detection part and more than one second detection part, the first detection part is positioned at the beam-outgoing side and provided with a first detection surface used for receiving the backscattered rays, the second detection part is provided with a second detection surface used for receiving the backscattered rays, and at least one second detection part is positioned at the top or the bottom of the box body.
In some embodiments of the backscatter inspection apparatus,
the first detection part is fixedly arranged or movably arranged relative to the box body; and/or
At least one second detection part is fixedly arranged relative to the box body, and/or at least one second detection part is movably arranged relative to the box body.
In some embodiments of the backscatter inspection apparatus,
the first detection part is positioned inside or outside the box body; and/or
At least one of the second detectors is located inside the case, and/or at least one of the second detectors is located outside the case.
In the backscatter inspection apparatus of some embodiments, at least one of the second detection parts is located at a top of the box body, and a top wall of the box body includes an openable and closable part having a closed position in which the top of the box body is closed and an open position in which the top of the box body is open and the second detection part is exposed.
In the backscatter inspection apparatus of some embodiments, the second detection surface of at least one of the second detection members has a plurality of operative positions.
In some embodiments of the backscatter inspection apparatus, at least one of the second detection members is translatably and/or rotatably arranged to change the operative position of its second detection surface.
In the backscatter inspection apparatus of some embodiments, the second detection surface of at least one of the second detection parts has a first working position perpendicular to the first detection surface and/or has a second working position inclined with respect to both a horizontal plane and the first detection surface and/or has a third working position parallel or coplanar with the first detection surface.
In the backscatter inspection apparatus of some embodiments, the second detection surface of at least one of the second detection parts includes a plurality of detection regions, and a relative position of at least one of the detection regions to the other detection regions is variably set among the plurality of detection regions.
In the backscatter inspection apparatus of some embodiments, an area of the second detection surface of at least one of the second detection parts is variably set.
In the backscatter inspection apparatus of some embodiments, the second detection surface of variable area is retractable and/or foldable, and/or at least part of the detection region is shielded, and/or the output signal of at least part of the detection region is switched off.
In some embodiments, the backscatter inspection apparatus is a backscatter inspection vehicle.
Based on the backscatter inspection equipment that this disclosure provided, compared with the backscatter inspection equipment of the related art, the second detection part has been add, and at least one second detection part is located the top or the bottom of box 2. In related art backscatter inspection apparatuses, a detection device is generally disposed on a side of the backscatter inspection apparatus facing an object to be inspected, that is, a side on which a beam exit side is located, to receive backscattered rays incident from the beam exit side. For the radiation scattered back by the part of the object located outside the top end or the bottom end of the related art detection device (corresponding to the first detection part in the embodiment of the present disclosure), the related art detection device has a small receiving angle, can receive less backscattered radiation, and has a large influence on the imaging quality of the part of the object located outside the top end or the bottom end of the detection device. According to the backscatter inspection equipment, the second detection part is additionally arranged at the top or the bottom of the box body of the backscatter inspection equipment, the receiving angle range of the rays scattered back by the part, outside the top end or the bottom end of the detection device in the related technology, of the detected object is enlarged, more backscatter rays can be received, the signal-to-noise ratio of the output signal of the detector is improved, and the effect of scanning images of the part, outside the top end or the bottom end of the detection part, of the detected object, positioned on the beam-outgoing side is improved. Other features of the present disclosure and advantages thereof will become apparent from the following detailed description of exemplary embodiments thereof, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the disclosure and together with the description serve to explain the disclosure and not to limit the disclosure. In the drawings:
fig. 1 is a schematic diagram of a principle structure of a pencil beam output by a ray generation device of a backscatter inspection apparatus of the related art when inspecting an object under inspection at a certain beam-out angle, in which a box body of the backscatter inspection apparatus, the ray generation device, a detector, and the object under inspection are shown.
Fig. 2 is a schematic diagram of a schematic structure of the back scattering inspection apparatus shown in fig. 1, which shows a box, a ray generating device, a detector and an object to be inspected, when a pencil beam output by the ray generating device is at another beam-outgoing angle.
Fig. 3 is a schematic structural diagram of a pencil beam output by a ray generation device of a backscatter inspection apparatus according to an embodiment of the disclosure, which is used for inspecting an object under inspection at a certain beam-out angle, and shows a box body of the backscatter inspection apparatus, the ray generation device, a detector and the object under inspection, and a top detection unit is in a horizontal state.
Fig. 4 is a schematic structural diagram of the object under inspection when the pencil-shaped ray beam output by the ray generating device of the backscatter inspection apparatus of the embodiment shown in fig. 3 is at another beam-outgoing angle, wherein the ray generating device and the detector of the backscatter inspection apparatus and the object are shown, and the top detecting unit is in a horizontal state.
Fig. 5 is a schematic diagram of a principle structure of the back scattering inspection apparatus shown in fig. 1 when a pencil-shaped ray beam outputted from the ray generation device is at another beam-outgoing angle to inspect an object, wherein the ray generation device, the detector and the object are shown, and the top detection unit is in an inclined state.
Detailed Description
The technical solutions in the embodiments of the present disclosure will be described clearly and completely with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the embodiments described are only some embodiments of the present disclosure, rather than all embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the disclosure, its application, or uses. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
The relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present disclosure unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
In the description of the present disclosure, it should be understood that the terms "first," "second," and the like are used for limiting the components, and are used only for the convenience of distinguishing the corresponding components, and if not otherwise stated, the above terms do not have special meanings, and therefore, should not be construed as limiting the scope of the present disclosure.
In the description of the present disclosure, it is to be understood that the orientation or positional relationship indicated by the directional terms such as "front, rear, upper, lower, left, right", "lateral, vertical, horizontal" and "top, bottom", etc., are generally based on the orientation or positional relationship shown in the drawings, and are presented only for the convenience of describing and simplifying the disclosure, and in the absence of a contrary indication, these directional terms are not intended to indicate and imply that the device or element being referred to must have a particular orientation or be constructed and operated in a particular orientation, and therefore, should not be taken as limiting the scope of the disclosure; the terms "inner and outer" refer to the inner and outer relative to the profile of the respective component itself.
Fig. 3-5 illustrate a backscatter inspection device, such as a backscatter inspection vehicle, according to an embodiment of the disclosure.
The backscatter inspection apparatus of the embodiment of the present disclosure is used for radiation inspection of an object 1 to be inspected, and includes a case 2, a radiation generating device 4, and a detecting device. The housing 2 has a beam exit side 21. The radiation generating device 4 is provided on the housing 2, and is configured to emit the pencil-shaped radiation beam 7 toward the beam exit side surface 21 of the housing 2 to scan the object 1 located outside the beam exit side surface 21. The detection apparatus is configured to receive backscattered radiation scattered by the object 1.
As shown in fig. 3 to 5, in the embodiment of the present disclosure, the detecting device includes a first detecting portion 31 and one or more second detecting portions 32. The first detection portion 31 is located at the beam exit side 21 and has a first detection surface 311 for receiving the backscattered radiation. The second detection portion 32 has a second detection surface 321 for receiving the backscattered radiation. Wherein at least one second detection part 32 is located at the top or bottom of the case 2.
The backscatter inspection apparatus of the embodiment of the present disclosure, compared to the backscatter inspection apparatus of the related art, adds the second detection part 32, and at least one second detection part 32 is located at the top or bottom of the box body 2. In the related art backscatter inspection apparatus, the detection device 3 is generally disposed on a side of the backscatter inspection apparatus facing the object to be inspected, i.e., a side on which a beam exit side is located, to receive the backscatter radiation incident from the beam exit side. For the radiation scattered back by the part of the object located outside the top end or the bottom end of the related art detecting device 3 (corresponding to the first detecting part 31 of the embodiment of the present disclosure), the related art detecting device 3 has a small receiving angle, can receive less backscattered radiation, and has a large influence on the imaging quality of the part of the object located outside the top end or the bottom end of the detecting device. The backscatter inspection equipment of the embodiment of the disclosure adds the second detection part at the top or the bottom of the box body of the backscatter inspection equipment, increases the receiving angle range of the rays scattered back by the part of the inspected object positioned outside the top end or the bottom end of the detection device in the related art, and can receive more backscatter rays, thereby improving the signal-to-noise ratio of the output signal of the detector and improving the effect of scanning images of the part of the inspected object positioned outside the top end or the bottom end of the detection part positioned on the beam-outgoing side.
The first detecting part 31 and the second detecting part 32 may be independent detectors, or may be components of a single detector, or may be a shape of an integrated detector formed by combining the first detecting part 31 and the second detecting part 32. If the second sensing part 32 is fixed, it is not necessarily perpendicular to the first sensing part 31.
The first detecting part 31 and the second detecting part 32 may be a detector group, a split type detector, or the like.
The radiation generating device 4 may be any of various radiation generating devices known in the art capable of emitting a pencil beam and may for example comprise an X-ray source and a modulation wheel.
In some embodiments of the backscatter inspection apparatus, the first detection part 31 may be fixedly disposed with respect to the housing 2 or may be movably disposed.
In some embodiments of the backscatter inspection apparatus, the at least one second detection member 32 is fixedly disposed relative to the housing 2 and/or the at least one second detection member 32 is movably disposed relative to the housing 2.
The first detecting part 31 or the second detecting part 32 is fixed relative to the box body 2, which is beneficial to the stability of the detection result. The first detecting part 31 or the second detecting part 32 is movable relative to the box body 2, which is beneficial for the first detecting part 31 and the second detecting part 32 to better adapt to the detection requirements, such as the shape and size change of different detected objects 1, the change of suspicious degree, and the like.
In the backscatter inspection apparatus of some embodiments, the first detection part 31 may be located inside the housing 2 or outside the housing 2.
In some embodiments of the backscatter inspection apparatus, the at least one second detector 32 is located inside the housing 2 and/or the at least one second detector 32 is located outside the housing 2.
For example, in some embodiments, the detection device includes only the second detection part 32 located at the top of the box 2, and the positions of the first detection part 31 and the second detection part 32 on the box 2 may be: the first probe 31 is located inside the case 2, while the second probe 32 is located outside the top of the case 2 (in the embodiment shown in fig. 3); alternatively, the first detecting part 31 is positioned inside the box body 2, and the second detecting part 32 is positioned inside the top of the box body 2; alternatively, the first detecting part 31 is positioned outside the box body 2, and the second detecting part 32 is positioned outside the top of the box body 2; alternatively, the first detector 31 is located outside the housing 2 and the second detector 32 is located inside the top of the housing 2. When first detection portion 31 or second detection portion 32 are located the box 2 outside, when it is for the movable detection portion of box 2, have bigger activity space, its operating position can be more changeable, and because of no lateral wall or the roof of box 2 shelter from the ray, more scattered ray can be received to the detection portion, easier accord with the scanning demand, improve and scan image quality. When the first detecting part 31 or the second detecting part 32 is located inside the box body 2, the protection of the detecting part is facilitated, the service life of the detecting device is prolonged, and the influence of local damage on the quality of the scanned image by the detecting part can be prevented.
In the backscatter inspection apparatus of some embodiments, the at least one second detection part is located at a top of the box, the top wall of the box including an openable part having a closed position where the top of the box is closed and an open position where the top of the box is open and the second detection part is exposed. For example, when the detection device only includes the second detection part 32 located at the top of the box body 2, the top wall of the box body 2 may include an opening and closing part, when the second detection part 32 located at the top of the box body 2 does not perform scanning inspection, the opening and closing part is in a closed position, the top of the box body 2 is closed, and the second detection part 32 is located inside the box body 2, so that the top wall of the box body 2 may play a role in protecting the second detection part 32, when the second detection part 32 located at the top of the box body 2 performs scanning inspection, the opening and closing part is in an open position, the top of the box body 2 is open, the second detection part 32 is exposed, the second detection part 32 may be fixed, after the opening and closing part is in the open position, the second detection part 32 may receive more scattered rays, and the second detection part 32 may also be movable or deformable, so as to better meet scanning requirements.
The backscatter inspection apparatus may comprise a drive means, such as a hydraulic cylinder or an electric push rod or a rotating motor or the like, which drives the switch between its closed and open positions. The driving device can be in signal connection with the control device so as to automatically control the driving device to act according to the control requirement through the control device. Of course, the position of the opening/closing portion may be switched by manual operation.
The first detecting part 31 or the second detecting part 32 is located inside the box body 2, which is beneficial to protecting the detecting parts. The first detecting part 31 or the second detecting part 32 is located outside the box body 2, which is beneficial to improving the detection quality, and is beneficial to enlarging the moving range under the condition that the first detecting part 31 or the second detecting part 32 is movable so as to better adapt to the change of the detected object 1.
In some embodiments of the backscatter inspection apparatus, the second detection surface 321 of the at least one second detection part 32 has a plurality of operating positions. Wherein at least one second detection member 32 is translatably and/or rotatably arranged to change the working position of its second detection surface 321.
For convenience of explanation, the second detection part 32 in which the second detection surface 321 has a plurality of operation positions will be referred to as a movable detection part hereinafter. In order to realize the switching of the working position of the second detection surface 321 of the movable detection part, the backscatter inspection apparatus may comprise a first driving part in driving connection with the movable detection part for driving the movable detection part 32 to act to change the working position of its second detection surface 321.
For example, the first drive portion may drive the movable detection portion 32 to translate and/or rotate with respect to the casing 2 to change the working position of the second detection surface 321 thereof.
The first drive unit may include, for example, a first actuator, and if necessary, a first transmission mechanism connected between the first actuator and the movable detection unit 32. The first actuator includes, for example, a hydraulic push rod, an electric push rod, a motor, and the like. The first transmission mechanism may comprise, for example, a linkage mechanism, a cam ram mechanism, a gear rack and pinion mechanism, a gear transmission mechanism, a belt transmission mechanism, a chain transmission mechanism, or the like.
The backscatter inspection apparatus may include a first limit mechanism for defining a path or range of motion of the movable probe 32. The first limiting mechanism may include, for example, a scissor mechanism, a rail-slider mechanism, or a rotating shaft.
In the backscatter inspection apparatus of some embodiments, the second detection surface 321 of the at least one second detection part 32 has a first operative position perpendicular to the first detection surface 311 and/or has a second operative position inclined with respect to a horizontal plane and the first detection surface 311 and/or has a third operative position parallel or coplanar with the first detection surface 311. The second detection surface 321 having the first operative position, the second detection portion 32 may be arranged such that the inspection quality of the backscatter inspection apparatus is improved without increasing or without significantly increasing the size of the backscatter inspection apparatus. The second detection surface 321 having the second working position and/or the third working position may further improve the inspection quality.
In the backscatter inspection apparatus of some embodiments, the second detection surface 321 of the at least one second detection part 32 includes a plurality of detection areas, and a relative position of at least one detection area to the other detection areas among the plurality of detection areas is variably set. This arrangement facilitates the second detection surface 321 to change the relative placement between its various portions according to detection requirements, facilitating better adaptation to scanning requirements.
For convenience of explanation, the second detection section 32 in which the second detection surface 321 has a plurality of detection regions and at least one detection region has a variable relative position with respect to the other detection regions will be referred to as a deformable detection section, and the detection region having a variable position will be referred to as a movable detection region. In order to achieve a variable relative position of the different detection regions of the second detection surface 321 of the deformable detection portion, the backscatter inspection device may comprise a second drive portion in driving connection with the movable detection region for driving the movable detection region to act to change the relative position of the different detection regions.
Similarly to the first driving portion, the second driving portion may include, for example, a second actuator, and may include a second transmission mechanism connected between the second actuator and the movable detection region, if necessary, or may further include a second limit mechanism for limiting a movement path or range of the movable detection region. The second actuator includes, for example, a hydraulic push rod, an electric push rod, a motor, and the like. The second transmission mechanism may comprise, for example, a linkage mechanism, a cam ram mechanism, a gear rack and pinion mechanism, a gear transmission mechanism, a belt transmission mechanism, a chain transmission mechanism, or the like.
The backscatter inspection apparatus may include a second limiting mechanism for defining a path or range of motion of the movable detection region. The second limiting mechanism may comprise, for example, a scissor mechanism, a rail-slider mechanism, or a rotating shaft, etc.
In the backscatter inspection apparatus of some embodiments, the area of the second detection surface 321 of the at least one second detection part 32 is variably set. This arrangement makes it possible to change the entire detection area of the detection device according to the detection demand of the object 1. For example, when a large object 1 needs to be detected and/or the object 1 is suspected to be large (for example, after only the first detecting part participates in the examination, or after the first detecting part is preliminarily detected by other means, suspicious contents are found in the object 1, or the procedure of the object is suspected), the overall detection area can be increased by increasing the area of the second detecting surface 321, so as to obtain a better detection result; on the contrary, when the small object 1 needs to be detected or the object 1 is not suspicious after being preliminarily detected, the overall detection area can be reduced by reducing the area of the second detection surface 321, so as to save calculation power, improve the detection speed and the like.
In order to realize the area of the second detecting part 32 being variable, the second detecting surface 321 with variable area can be provided in one of a plurality of ways or any two or more combinations, wherein the second detecting surface is retractable or foldable, or at least part of the detecting area can be shielded, or at least part of the output signal of the detecting area can be cut off. In order to realize that the second detection surface 321 can be provided with a retractable, foldable or at least a portion of the detection area can be shielded, a corresponding driving portion can be correspondingly provided to drive the corresponding detection portion or the shielding portion for shielding, and the manner of the driving portion can refer to the related contents of the first driving portion and the second driving portion. In order to achieve that the output signal of at least some of the detection regions can be switched off, a corresponding switch can be provided on the line for the output signal.
In order to control the working position and/or shape and/or area of the second detection surface 321 more accurately, the backscatter inspection apparatus may further comprise a control device, wherein the aforementioned driving parts and switches are in signal connection with the control device, and the driving parts and switches realize their respective actions through control commands sent by the control device. The control device may be, for example, in signal connection with a detection device for detecting a state and parameters of the object, and may form the control command based on detection information of the object detected by the detection device.
The control device may be implemented as a general purpose Processor, a Programmable Logic Controller (PLC), a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable Logic device, discrete Gate or transistor Logic, discrete hardware components, or any suitable combination thereof for performing the functions described in this disclosure.
The backscatter inspection equipment of the embodiment of the disclosure is a backscatter inspection vehicle, and the backscatter imaging system including the box body 2 and the ray generating device 4 and the detecting device is placed on a vehicle chassis capable of running on a road, so that the scanning inspection of the object 1 can be realized in the moving process of the vehicle. More generally, however, the backscatter imaging apparatus of the present disclosure may not include a walking device itself, but may be placed on a transport vehicle to move, and the scanning inspection of the object to be inspected is realized through the movement of the transport vehicle.
The backscatter inspection apparatus of embodiments of the present disclosure is further described below in conjunction with fig. 3-5.
As shown in fig. 3 to 5, the backscatter inspection apparatus of the embodiment of the present disclosure mainly includes a housing 2 and a backscatter imaging system. The backscatter imaging system mainly comprises a radiation generating means 4 and a detection means. The backscatter imaging system may also include a power supply, signal processing means, electrical control means, a computer, and the like, which are not shown. The backscatter inspection apparatus of the disclosed embodiment is a backscatter inspection vehicle, wherein the box 2 is a compartment of the backscatter inspection vehicle.
As shown in fig. 3, in the present embodiment, the radiation generating device 4 emits the pencil-shaped radiation beam 7 toward the left side surface of the box body 2, so the left side surface is the beam exit side surface 21 of the box body 2.
The detection device comprises a first detection part 31 arranged on the beam-outgoing side surface of the box body 2 and a second detection part 32 arranged on the top of the box body 2. The first detection part 31 comprises a first detection surface 311 facing to the left, and the second detection part 32 comprises a second detection surface 321. In fig. 3 and 4, the second detection surface 321 faces upward, and as shown in fig. 5, the second detection surface 321 faces upward and leftward. The technical scheme adopted by the disclosure is shown in fig. 3. With respect to the related art backscatter inspection apparatus shown in fig. 1 and 2, the embodiment of the present disclosure adds a second detection part 32 located at the top of the case 2.
In this embodiment, the first detecting portion 31 is fixedly disposed inside the box body 2, the first detecting portion 31 is fixedly disposed to facilitate the relative stability of the detection result of the first detecting portion 31, and the first detecting portion 31 is disposed inside the box body 2 to facilitate the prevention of the first detecting portion 31 from being damaged. The second detection part 32 is a movable detection part, and is rotatably connected to the top of the case 2 with respect to the case 2. The rotation axis of the second detection part 32 is located at the top of the beam exit side 21 of the housing 2, i.e., the upper left corner in fig. 3. In this embodiment, the first driving part for driving the second detecting part 32 to rotate includes a rotating motor, and the rotating motor may be a stepping motor in order to accurately control the rotation angle of the second detecting part 32 to determine an accurate working position.
As shown in fig. 3 to 5, in the backscatter inspection apparatus of the present embodiment, the second detection surface 321 of the second detection part 32 has a first operating position perpendicular to the first detection surface 311 and has a second operating position inclined with respect to both the horizontal plane and the first detection surface 311. The second detection member 32 may have a third operation position, not shown, parallel to or coplanar with the first detection surface 311.
In this embodiment, since the second detecting portion 32 can rotate by itself to realize the switching of the working position of the second detecting surface 321, the backscatter inspection apparatus can reduce the overall height of the backscatter inspection apparatus by rotating the second detecting portion 32 to be attached to the top of the box 2 in the non-working state, and in the working state, the angle between the second detecting portion 32 and the beam-exiting side surface 21 of the box 2 can be adjusted to make the second detecting surface 321 achieve a better state for receiving the backscatter radiation under the condition of adapting to the surrounding environment.
As shown in fig. 4, when the backscatter inspection apparatus of the embodiment of the present disclosure inspects the object 1, when the pencil beam 7 irradiates a point on a portion of the object 1 outside the tip of the detecting device, a portion of the backscatter radiation indicated by a mark 600 enters the first detecting surface 311 of the first detecting part 31, and its angular range is small. After the second detecting part 32 is added, the second detecting surface 321 is in the first working position, and part of the backscattered radiation indicated by the mark 601 will be detected by the second detecting surface 321 of the second detecting part 32, that is, the receiving capability of the backscattered radiation of the part of the object 1 outside the top end of the detecting device is increased, so as to improve the imaging effect of the part of the object 1 outside the top end or the bottom end of the detecting part of the beam-outgoing side of the object. The addition of the second detector portion 32 allows for comparable detection capabilities at smaller backscatter inspection device sizes than if the first detector portion were extended directly.
The second detector part 32 is designed to be rotatable, i.e. in a non-operating state of the backscatter inspection device, in the state shown in fig. 4. The backscatter inspection device may be in the state shown in fig. 4 when in an operating state, that is, the second detection surface 321 is in its first operating position, or may be in the state shown in fig. 5 according to the detection requirement, that is, the second detection surface 321 is in its second operating position, or may be in its third operating position according to the detection requirement, so as to further improve the detection efficiency. Referring to fig. 4 and 5, in the state shown in fig. 5, the second detection surface 321 is able to receive more backscattered radiation (i.e. the portion of backscattered radiation shown at 611 in fig. 5) than the second detection surface 321 in the state shown in fig. 4 is able to receive (i.e. the portion of backscattered radiation shown at 601 in fig. 4).
The reduction in size of the backscatter inspection apparatus when the backscatter inspection apparatus is in a non-operating state is of great significance to the transportation of the backscatter inspection apparatus, and the passage ability can be improved because of less restriction by the height of a road and the height of a passageway, and the stability can be improved because of the lowered center of gravity.
The size reduction of the backscatter inspection equipment in a working state can also enable the backscatter inspection equipment to enter a narrower space for inspection, and the concealment of the inspection work can also be improved.
The backscatter inspection apparatus of the related art has better image quality and detection capability for the upper part of a higher object to be inspected higher than the top end of the first detection part 31 under the same or similar size of the backscatter inspection apparatus.
In the present embodiment, the first detection part 31 and the second detection part 32 are a single planar detector. In the illustrated embodiment, the first detector 31 and the second detector 32 may also each be designed to include a plurality of detector combinations, split detectors, combined planar detectors, single or combined dog-leg detectors, single or combined arc detectors, and the like.
As can be seen from the above description, the backscatter inspection apparatus of the embodiment of the present disclosure adopts a new detection device structure and arrangement, and the second detection portion is added to the top of the box of the backscatter inspection apparatus in the embodiment of the present disclosure, so as to increase the receiving angle range of the radiation scattered back by the part of the object located outside the top end of the detection device in the related art, and receive more backscatter radiation, thereby improving the signal-to-noise ratio of the output signal of the detector, improving the effect of scanning the image of the part of the object located outside the top end or the bottom end of the detection portion located on the beam-outgoing side, and at the same time, not increasing or not significantly increasing the size of the backscatter inspection apparatus.
Finally, it should be noted that: the above examples are intended only to illustrate the technical solution of the present disclosure and not to limit it; although the present disclosure has been described in detail with reference to preferred embodiments, those of ordinary skill in the art will understand that: modifications to the embodiments of the disclosure or equivalent replacements of parts of the technical features may be made, which are all covered by the technical solution claimed by the disclosure.
Claims (11)
1. A backscatter inspection apparatus for radiation inspection of an object (1) to be inspected, characterized by comprising:
a box body (2) having a beam-exiting side surface (21);
a ray generating device (4) which is arranged on the box body (2) and is configured to emit a pencil-shaped ray beam (7) towards the beam-outgoing side surface (21) of the box body (2) so as to scan the detected object (1) which is positioned at the outer side of the beam-outgoing side surface (21); and
the detection device is configured to receive the backscattered rays scattered by the detected object (1), and comprises a first detection part (31) and more than one second detection parts (32), wherein the first detection part (31) is positioned at the beam-outgoing side (21) and is provided with a first detection surface (311) used for receiving the backscattered rays, the second detection parts (32) are provided with second detection surfaces (321) used for receiving the backscattered rays, and at least one second detection part (32) is positioned at the top or the bottom of the box body (2).
2. Backscatter inspection apparatus as recited in claim 1,
the first detection part (31) is fixedly arranged or movably arranged relative to the box body (2); and/or
At least one of the second detection parts (32) is fixedly arranged relative to the housing (2) and/or at least one of the second detection parts (32) is movably arranged relative to the housing (2).
3. Backscatter inspection apparatus as recited in claim 1,
the first detection part (31) is positioned inside or outside the box body (2); and/or
At least one of the second probes (32) is located inside the tank (2) and/or at least one of the second probes (32) is located outside the tank (2).
4. Backscatter inspection apparatus according to claim 1, characterized in that at least one of the second detection parts (32) is located at the top of the box (2), the top wall of the box (2) comprising an openable part having a closed position in which the top of the box (2) is closed and an open position in which the top of the box (2) is open and the second detection part (32) is located inside the box (2).
5. Backscatter inspection apparatus according to claim 1, characterized in that the second detection surface (321) of at least one of the second detection parts (32) has a plurality of working positions.
6. Backscatter inspection apparatus according to claim 5, characterized in that at least one of the second detection parts (32) is arranged translatably and/or rotatably to change the working position of its second detection surface (321).
7. Backscatter inspection apparatus according to claim 1, characterized in that the second detection surface (321) of at least one of the second detection parts (32) has a first operating position perpendicular to the first detection surface (311) and/or has a second operating position inclined with respect to both the horizontal plane and the first detection surface (311) and/or has a third operating position parallel or coplanar to the first detection surface (311).
8. Backscatter inspection apparatus according to claim 1, characterized in that the second detection surface (321) of at least one of the second detection parts (32) comprises a plurality of detection regions, at least one of which is variably arranged in relation to the other detection regions.
9. Backscatter inspection apparatus according to claim 1, characterized in that the area of the second detection surface (321) of at least one of the second detection parts (32) is variably arranged.
10. Backscatter inspection device according to claim 9, characterized in that the second detection surface (321) of variable area is retractable and/or foldable and/or at least part of the detection region is screened and/or at least part of the output signal of the detection region is switched off.
11. A backscatter inspection apparatus as recited in any of claims 1-10, wherein the backscatter inspection apparatus is a backscatter inspection vehicle.
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