CN115712202B - A method for compensating image quality degradation caused by temperature based on Zernike polynomials - Google Patents
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Abstract
本发明公开了一种基于Zernike多项式的补偿温度带来像质退化的方法,包括:理想成像系统仿真模块,温度导致像质退化分析模块,反卷积像质校正模块。理想成像系统仿真模块作为成像模块进行仿真成像;温度导致像质退化分析模块是在Zemax里面用多重组态模式分析出不同温度下对应的Zernike多项式并做成序列表;反卷积像质校正模块用实际温度传感器测得温度对应已有序列表用对应Zernike多项式进行反卷积达到校正温度带来像差变化的结果,可以达到处理温度带来像质退化的效果,不需要额外增加调焦组件,简化了系统,提高了系统可靠性,降低了系统成本。
The present invention discloses a method for compensating for image quality degradation caused by temperature based on Zernike polynomials, comprising: an ideal imaging system simulation module, an image quality degradation analysis module caused by temperature, and a deconvolution image quality correction module. The ideal imaging system simulation module is used as an imaging module to perform simulation imaging; the image quality degradation analysis module caused by temperature uses multiple configuration modes in Zemax to analyze the corresponding Zernike polynomials at different temperatures and make a sequence list; the deconvolution image quality correction module uses an actual temperature sensor to measure the temperature corresponding to the ordered list and uses the corresponding Zernike polynomial to perform deconvolution to achieve the result of correcting the aberration change caused by temperature, which can achieve the effect of processing the image quality degradation caused by temperature, does not need to add an additional focusing component, simplifies the system, improves the system reliability, and reduces the system cost.
Description
技术领域Technical Field
本发明涉及光学系统成像技术领域,特别是涉及一种基于Zernike多项式补偿光学系统像差的方法,主要是通过Zemax热分析得到不同温度下光学系统Zernike多项式对实际系统进行像差校正。The present invention relates to the technical field of optical system imaging, and in particular to a method for compensating optical system aberrations based on Zernike polynomials, which mainly uses Zemax thermal analysis to obtain Zernike polynomials of optical systems at different temperatures to correct aberrations of actual systems.
背景技术Background Art
随着现代技术的发展,对光电跟踪测量系统的观测和跟踪能力的要求越来越高,从而光学系统设计的越来越复杂,光学系统的探测精度高、结构复杂特别是长焦系统,焦距长,易受温度影响。因此对光学系统进行温度分析及补偿有利于改善成像质量,补偿温度效应,提高系统的温度稳定性。With the development of modern technology, the requirements for the observation and tracking capabilities of photoelectric tracking and measurement systems are getting higher and higher, so the design of optical systems is becoming more and more complex. The optical system has high detection accuracy and complex structure, especially the telephoto system, which has a long focal length and is easily affected by temperature. Therefore, temperature analysis and compensation of the optical system is conducive to improving imaging quality, compensating for temperature effects, and improving the temperature stability of the system.
传统对成像系统温度补偿方法主要是对系统进行消热差设计,目前常用的消热差技术主要有三类,即机械被动式、机电主动式和光学被动式,前两种只补偿像面位移而不补偿焦距,并且两种方法都会使系统更加复杂,增大体积和重量,降低系统的可靠性。光学被动消热差技术的原理是在温度变化时,光学元件产生的离焦和机械结构产生的变化量相互补偿,使整个系统的离焦量控制在允许的范围内,以保持像面的稳定,但是这样光学镜片材料往往较难加工、生产批次少导致系统成本高。The traditional method of temperature compensation for imaging systems is to design the system to athermalize. There are three main types of athermalization technologies currently used, namely mechanical passive, electromechanical active, and optical passive. The first two only compensate for image displacement but not focal length, and both methods will make the system more complex, increase volume and weight, and reduce system reliability. The principle of optical passive athermalization technology is that when the temperature changes, the defocus produced by the optical element and the change produced by the mechanical structure compensate each other, so that the defocus of the entire system is controlled within the allowable range to maintain the stability of the image plane. However, the optical lens materials are often difficult to process and the production batches are small, resulting in high system costs.
针对上述问题本发明提出一种基于Zernike多项式反卷积温度补偿方法,首先利用Zemax获得不同温度下对应Zernike多项式再反卷积补偿,避免了在设计之初对光学材料有过高的要求,其次在序列表完成后,在实际系统使用时可以保证实时性。In view of the above problems, the present invention proposes a temperature compensation method based on Zernike polynomial deconvolution. Firstly, Zemax is used to obtain the corresponding Zernike polynomials at different temperatures and then deconvolute compensation, thereby avoiding excessively high requirements on optical materials at the beginning of the design. Secondly, after the sequence table is completed, real-time performance can be guaranteed when used in the actual system.
发明内容Summary of the invention
为了克服上述现有技术的不足,本发明提供了一种基于Zemax分析得到不同温度对应Zernike多项式进行反卷积补偿温度带来像质退化。In order to overcome the above-mentioned deficiencies of the prior art, the present invention provides a method for obtaining Zernike polynomials corresponding to different temperatures based on Zemax analysis to perform deconvolution to compensate for image quality degradation caused by temperature.
本发明采用的技术方案为:一种基于Zernike多项式的补偿温度带来像质退化的方法,该方法利用的系统包括:理想成像系统仿真模块1,温度导致像质退化分析模块2和反卷积像质校正模块3,该方法包括以下步骤:The technical solution adopted by the present invention is: a method for compensating image quality degradation caused by temperature based on Zernike polynomials, the system used by the method includes: an ideal imaging system simulation module 1, a temperature-induced image quality degradation analysis module 2 and a deconvolution image quality correction module 3, and the method includes the following steps:
步骤1:利用理想成像系统仿真模块1得到理想情况下光学系统成像质量;Step 1: Use the ideal imaging system simulation module 1 to obtain the imaging quality of the optical system under ideal conditions;
步骤2:利用温度导致像质退化分析模块2多重组态温度分析,得到不同温度下像质退化情况,也就是对应Zernike多项式体现出的波像差并对应温度做成序列表;Step 2: Utilize the temperature-induced image quality degradation analysis module 2 to perform multiple configuration temperature analysis to obtain the image quality degradation at different temperatures, that is, the wave aberration reflected by the corresponding Zernike polynomial and the corresponding temperature to make a sequence table;
步骤3:实际温度传感器下测得温度并得到实际温度下对应图像;Step 3: Measure the temperature under the actual temperature sensor and obtain the corresponding image under the actual temperature;
步骤4:利用反卷积像质校正模块3将对应温度下将得到的图像对应Zernike多项式温度序列表,将对于Zernike系数代入光瞳函数相位进行反卷积得到像质恢复后图像。Step 4: Use the deconvolution image quality correction module 3 to correspond the image obtained at the corresponding temperature to the Zernike polynomial temperature sequence table, substitute the Zernike coefficient into the pupil function phase for deconvolution to obtain the image after image quality restoration.
进一步地,建立理想成像系统仿真模块1包括:对实际需求建立完整的理想成像系仿真模型1,根据物距、视场大小和分辨率得到实际的靶面大小以及焦距,在Zemax里建立光学系统模型,得到20℃下理想成像结果以调制传递函数(MTF)在截止频率处大于0.3认为成像质量达到要求,并利用Zemax图像模拟得到理想成像将此结果作为像质校正的标准,作为温度校正图像的对照图像。Furthermore, establishing an ideal imaging system simulation module 1 includes: establishing a complete ideal imaging system simulation model 1 according to actual needs, obtaining the actual target surface size and focal length according to the object distance, field of view size and resolution, establishing an optical system model in Zemax, obtaining the ideal imaging result at 20°C, and considering that the imaging quality meets the requirements when the modulation transfer function (MTF) is greater than 0.3 at the cutoff frequency, and using Zemax image simulation to obtain the ideal imaging result as the standard for image quality correction and as a reference image for the temperature correction image.
进一步地,建立温度导致像质退化分析模块2包括:根据20℃下理想成像结果,从-30℃~60℃每隔1℃建立一个组态,并输入对应外壳以及隔圈材料的热膨胀系数进行温度分析,得到温度与成像质量对应关系,以1-37阶泽尼克多项式作为评判标准,得到不同温度对应不同Zernike多项式序列表。Furthermore, establishing a temperature-induced image quality degradation analysis module 2 includes: based on the ideal imaging result at 20°C, establishing a configuration at intervals of 1°C from -30°C to 60°C, and inputting the thermal expansion coefficients of the corresponding shell and spacer materials for temperature analysis to obtain the corresponding relationship between temperature and imaging quality, using 1-37 order Zernike polynomials as the evaluation criteria, and obtaining a sequence table of different Zernike polynomials corresponding to different temperatures.
进一步地,实际温度传感器下测得温度并得到实际温度下对应图像,根据得到的Zernike多项式序列表反卷积补偿温度带来像质退化。Furthermore, the temperature is measured by an actual temperature sensor and a corresponding image at the actual temperature is obtained, and deconvolution is performed according to the obtained Zernike polynomial sequence table to compensate for image quality degradation caused by the temperature.
本发明原理在于:从对光学系统分析来看,光学系统受温度影响较大,在-30℃~60℃温度范围内偏离常温越大,系统的光学性能改变就越多,因此,提出一种新的温度补偿思路,光学设计时就把定量分析出光学系统在环境温度条件下的Zernike多项式变化趋势并做成序列表,使用时根据环境温度查表,获得光瞳函数相位对图像反卷积,对实时图像进行修正补偿,可以改善成像质量,这样,可以去掉系统中复杂的调焦机构,简化系统,提高系统可靠性。具体的,一种基于Zernike多项式的补偿温度带来像质退化的方法,该方法包括如下步骤:步骤1:Zemax中建立对应成像系统并得到理想情况下光学系统成像质量;步骤2:建立多重组态并进行热分析,得到不同温度下,成像系统的像质退化情况,并用列出Zernike多项式对应温度序列表;步骤3:用温度传感器测得实际环境温度并得到对应图像;步骤4:将步骤2中得到的Zernike多项式代入到光瞳函数相位并对实际测得温度图像反卷积,实现对温度带来像差的校正。The principle of the present invention is that: from the analysis of the optical system, the optical system is greatly affected by temperature. The greater the deviation from the normal temperature within the temperature range of -30°C to 60°C, the more the optical performance of the system changes. Therefore, a new temperature compensation idea is proposed. During the optical design, the Zernike polynomial change trend of the optical system under ambient temperature conditions is quantitatively analyzed and made into a sequence table. When used, the table is looked up according to the ambient temperature to obtain the pupil function phase for image deconvolution, and the real-time image is corrected and compensated, which can improve the imaging quality. In this way, the complex focusing mechanism in the system can be removed, the system can be simplified, and the system reliability can be improved. Specifically, a method for compensating for image quality degradation caused by temperature based on Zernike polynomials includes the following steps: Step 1: Establishing a corresponding imaging system in Zemax and obtaining the imaging quality of the optical system under ideal conditions; Step 2: Establishing multiple configurations and performing thermal analysis to obtain the image quality degradation of the imaging system at different temperatures, and listing a temperature sequence table corresponding to the Zernike polynomials; Step 3: Using a temperature sensor to measure the actual ambient temperature and obtain a corresponding image; Step 4: Substituting the Zernike polynomial obtained in step 2 into the phase of the pupil function and deconvolving the actually measured temperature image to achieve correction of the aberration caused by temperature.
本发明与现有方法相比具有如下优点:Compared with the existing method, the present invention has the following advantages:
(1)同传统机械被动式、机电主动式的温度像差补偿方法相比,简化了系统,提高系统可靠性。(1) Compared with the traditional mechanical passive and electromechanical active temperature aberration compensation methods, the system is simplified and the system reliability is improved.
(2)同光学无热化的温度像差补偿方法相比,提高了系统公差容忍度,减少了加工成本。(2) Compared with the temperature aberration compensation method of optical athermalization, the system tolerance is improved and the processing cost is reduced.
(3)该发明结构简单,易于实现。(3) The invention has a simple structure and is easy to implement.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1是本发明的基于Zernike多项式的补偿温度带来像质退化方法原理图;图1中1是理想成像系统仿真模块;2是温度导致像质退化分析模块;3是反卷积像质校正模块。FIG1 is a schematic diagram of a method for compensating for image quality degradation caused by temperature based on Zernike polynomials according to the present invention; in FIG1 , 1 is an ideal imaging system simulation module; 2 is an image quality degradation analysis module caused by temperature; and 3 is a deconvolution image quality correction module.
图2是本发明的基于Zernike多项式的补偿温度带来像质退化方法流程图。FIG. 2 is a flow chart of a method for compensating for image quality degradation caused by temperature based on Zernike polynomials according to the present invention.
图3是本发明的-30℃时图像和反卷积校正之后的图像。FIG. 3 is an image at -30° C. and an image after deconvolution correction according to the present invention.
具体实施方式DETAILED DESCRIPTION
以下结合附图对本发明的具体实施方式做详细说明:The specific implementation of the present invention is described in detail below with reference to the accompanying drawings:
如图1所示,基于Zernike多项式的补偿温度带来像质退化方法,利用的系统包括:理想成像系统仿真模块1,温度导致像质退化分析模块2,反卷积像质校正模块3。As shown in FIG1 , the method for compensating for image quality degradation caused by temperature based on Zernike polynomials uses a system comprising: an ideal imaging system simulation module 1 , a temperature-induced image quality degradation analysis module 2 , and a deconvolution image quality correction module 3 .
首先,根据现有参数视场、分辨率、相机靶面等建立理想成像系统,以20℃时系统成像作为理想成像标准,当调制传递函数(MTF)在空间截止频率处大于0.3时认为系统成像质量符合要求,并且利用Zemax图像模拟功能得到此时图像通过系统在20℃下图像作为对照图像,参见图1中理想成像系统仿真模块1。之后利用Zemax建立多重组态,在-30℃~60℃中每隔1℃建立一个组态,通过输入光学系统外壳以及隔圈材料热膨胀系数进行热分析得到不同温度对应前37阶Zernike多项式序列表1。First, an ideal imaging system is established based on existing parameters such as field of view, resolution, and camera target surface. The system imaging at 20°C is used as the ideal imaging standard. When the modulation transfer function (MTF) is greater than 0.3 at the spatial cutoff frequency, the system imaging quality is considered to meet the requirements, and the Zemax image simulation function is used to obtain the image at 20°C through the system as a control image, see the ideal imaging system simulation module 1 in Figure 1. Then, multiple configurations are established using Zemax, and a configuration is established every 1°C from -30°C to 60°C. By inputting the thermal expansion coefficients of the optical system housing and the spacer material for thermal analysis, the first 37-order Zernike polynomial sequence table 1 corresponding to different temperatures is obtained.
表1Table 1
其中:T1~T101对应-30℃~60℃,对应温度Ti下前37阶Zernike多项式的系数,ρ和θ为单位圆内部是连续正交的两个变量,ρ*cos(θ),ρ*sin(θ),…,924ρ12-2772ρ10+3150ρ8-1680ρ6+420ρ4-42ρ2+1分别为第1,2,…,37阶Zernike多项式。Among them: T 1 ~ T 101 corresponds to -30℃ ~ 60℃, Corresponding to the coefficients of the first 37th order Zernike polynomials at temperature T i , ρ and θ are two continuous orthogonal variables inside the unit circle, ρ*cos(θ), ρ*sin(θ),…,924ρ 12 -2772ρ 10 +3150ρ 8 -1680ρ 6 +420ρ 4 -42ρ 2 +1 are the 1st, 2nd,…, 37th order Zernike polynomials respectively.
之后根据光学系统成像原理:像平面光强分布等于物平面光强分布和系统点扩散函数的卷积,i(x,y)=o(x,y)*h(x,y),式中,(x,y)代表图像平面上点,i(x,y)代表可通过CCD获得的像平面光强分布,o(x,y)代表未知的物平面光强信息,h(x,y)代表系统的点扩散函数,具体公式为:Then, according to the imaging principle of the optical system: the image plane intensity distribution is equal to the convolution of the object plane intensity distribution and the system point spread function, i(x,y) = o(x,y)*h(x,y), where (x,y) represents the point on the image plane, i(x,y) represents the image plane intensity distribution that can be obtained through the CCD, o(x,y) represents the unknown object plane intensity information, and h(x,y) represents the point spread function of the system. The specific formula is:
式中,A(u,v)代表孔径函数,代表波像差通常用Zernike多项式表示:Where A(u,v) represents the aperture function, The wave aberration is usually represented by Zernike polynomials:
式中,μi为Zernike多项式每一项的多项式系数,Zi(u,v)为分解的不同项波前模式。Where μ i is the polynomial coefficient of each term of the Zernike polynomial, and Zi (u, v) is the wavefront mode of different terms decomposed.
通过Zemax可以得到不同温度下的1-37阶Zernike多项式系数,进一步得到光瞳函数相位因子,可以计算出点扩散函数,对测得的模糊图像反卷积即可得到像质恢复后图像,参见图1反卷积像质校正模块3所示。Through Zemax, the coefficients of the 1-37th order Zernike polynomials at different temperatures can be obtained, and the phase factor of the pupil function can be further obtained. The point spread function can be calculated, and the image after image quality restoration can be obtained by deconvolving the measured blurred image, as shown in the deconvolution image quality correction module 3 in Figure 1.
如图2所示,基于Zernike多项式的补偿温度带来像质退化方法具体流程为,建立理想成像系统模型,得到理想情况下系统成像情况作为对照。在Zemax利用多种组态模式对系统热分析得到不同温度下Zernike多项式序列表。在实际环境温度下系统成像得到不同温度实际像质退化结果。最后对照已有Zernike序列表反卷积校正像差。As shown in Figure 2, the specific process of the method for compensating image quality degradation caused by temperature based on Zernike polynomials is to establish an ideal imaging system model and obtain the system imaging situation under ideal conditions as a control. In Zemax, a variety of configuration modes are used to perform thermal analysis on the system to obtain a Zernike polynomial sequence table at different temperatures. The system is imaged at the actual ambient temperature to obtain the actual image quality degradation results at different temperatures. Finally, the aberration is corrected by deconvolution by comparing the existing Zernike sequence table.
如图3所示,(a)为-30℃时Zemax模拟图像和(b)为反卷积校正之后的图像。As shown in Figure 3, (a) is the Zemax simulation image at -30°C and (b) is the image after deconvolution correction.
本发明公开了一种基于Zernike多项式的补偿温度带来像质退化方法,具体实现该技术方案的方法和途径很多,以上所述仅是本发明的优选实施方式,本实施例中未明确的各组成部分均可用现有技术加以实现。The present invention discloses a method for compensating for image quality degradation caused by temperature based on Zernike polynomials. There are many methods and approaches to implement the technical solution. The above is only a preferred implementation of the present invention. All components not specified in this embodiment can be implemented using existing technologies.
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