CN115542134A - High-precision testing device for integrated circuit - Google Patents
High-precision testing device for integrated circuit Download PDFInfo
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- CN115542134A CN115542134A CN202211518789.0A CN202211518789A CN115542134A CN 115542134 A CN115542134 A CN 115542134A CN 202211518789 A CN202211518789 A CN 202211518789A CN 115542134 A CN115542134 A CN 115542134A
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- 239000000758 substrate Substances 0.000 claims description 13
- 230000005611 electricity Effects 0.000 claims description 6
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- 238000003466 welding Methods 0.000 abstract description 4
- 238000009434 installation Methods 0.000 description 5
- 229910000831 Steel Inorganic materials 0.000 description 4
- 239000010959 steel Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a high-precision testing device for an integrated circuit, which comprises a main base, wherein a lifting rod is connected to the top of the main base in a sliding manner, a handle is movably mounted at the top of the lifting rod through a hinge, a testing assembly is arranged in the main base, the bottom of the lifting rod is connected with an upper base plate in a welding manner, an upper fixing disc is fixed to the bottom of the upper base plate through a bolt, a lower fixing disc is fixed to the bottom of the main base in a welding manner, a sliding rod is mounted on the inner wall of the upper base plate in a sliding manner, the bottom end of the sliding rod is fixedly welded to the inner wall of the bottom of the main base, the testing assembly comprises a fixing cylinder, through holes are correspondingly formed in two sides of the fixing cylinder, the cross section of each through hole is square, a dismounting head is sleeved in one end of the fixing cylinder, and a conductive contact is fixedly welded to one side of a clamping block.
Description
Technical Field
The invention belongs to the technical field of integrated circuit production, and particularly relates to a high-precision testing device for an integrated circuit.
Background
The integrated circuit board is made by using semiconductor manufacturing process, and many transistors, resistors, capacitors and other components are manufactured on a small single crystal silicon chip, and the components are combined into a complete electronic circuit by using a multilayer wiring or tunnel wiring method.
The integrated circuit board generally has a plurality of pins, including input pins and output pins, and whether an index for judging whether an integrated circuit board is qualified is to see whether the input and output voltages are correct, but because the internal circuit of the integrated circuit board is very complicated, one input pin may be matched with a plurality of output pins, one output pin may be matched with a plurality of input pins, and the voltages matched by different approaches are also different, but the existing test mode cannot selectively determine which input and output pins are accessed, so that the test result is incomplete, and the practicability is poor. This phenomenon becomes an urgent problem to be solved by those skilled in the art.
Disclosure of Invention
The present invention is directed to a high-precision testing apparatus for integrated circuits, which is a conventional material collecting apparatus, to solve the above-mentioned problems.
In order to solve the technical problems, the invention provides the following technical scheme: the utility model provides an integrated circuit high accuracy testing arrangement, includes main base, the top sliding connection of main base has the lifter, there is the handle at the top of lifter through hinge movable mounting, the inside of main base is provided with the test component, the bottom welded connection of lifter has the upper base plate, the bottom of upper base plate has the upper fixed disk through the bolt fastening, the inside welded fastening in bottom of main base has the lower fixed disk, the inner wall slidable mounting of upper base plate has the slide bar, the bottom welded fastening of slide bar is at the bottom inner wall of main base.
The invention further discloses that the test assembly comprises a fixed cylinder, through holes are correspondingly formed in two sides of the fixed cylinder, the cross section of each through hole is square, a dismounting head is sleeved in one end of the fixed cylinder, a clamping block is movably hinged to one side of the dismounting head correspondingly, and a conductive contact is fixedly welded to one side of the clamping block.
The invention further discloses that an insulating tightening block is fixed on one side of the dismounting head through a bolt, square concave parts are correspondingly formed in two sides of the insulating tightening block, springs are correspondingly welded and fixed on the inner walls of the square concave parts, an inclined block is installed at one end of each spring, the inclined blocks penetrate through the through holes, the number of the springs is two, and the springs are correspondingly distributed at the long end and the short end of each inclined block.
The invention further discloses that one side of the clamping block is hinged with a lateral block, the lateral block is electrically connected with the clamping block, one end of the clamping block is hinged with a first conductive wire, one end of the first conductive wire is provided with a second conductive wire, and the first conductive wire is connected with the second conductive wire.
The invention further discloses that one end of the first conductive wire is connected with a first connecting sleeve, one end of the second conductive wire is connected with a second connecting sleeve, and the first connecting sleeve and the second connecting sleeve are in a matching structure.
The invention further discloses that a threaded rod is movably mounted on one side of the upper substrate through a bearing, a spiral threaded groove is formed in the threaded rod, a second conductive wire is wound outside the threaded groove, one end of the threaded rod extends out of the side wall of the upper substrate, one end of the threaded rod is connected with a knob, one end of the second conductive wire penetrates through the inner wall of the upper substrate in a sliding mode, one end of the second conductive wire is electrically connected with a current sensor, one end of the current sensor and one end of the second conductive wire located above the current sensor are both electrically connected with electrode tips, and the electrode tips are electrically connected with a power supply.
The invention further discloses that the outer wall of the sliding rod is sleeved with a pressure spring, and two ends of the pressure spring are respectively contacted with the inner wall of the bottom of the main base and the upper base plate.
The invention further discloses that one side of the first connecting sleeve is provided with an inner arc part, the inner wall of the inner arc part extends inwards to form a large arc part, one side of the second connecting sleeve is provided with a large ring-shaped body, one side of the large ring-shaped body is correspondingly fixedly welded with a semi-arc block, the semi-arc block protrudes out of the outer wall of the large ring-shaped body, the turning radius of the semi-arc block is the same as that of the large arc part, and the radius of the inner arc part is the same as the outer diameter of the large ring-shaped body.
Compared with the prior art, the invention has the following beneficial effects: according to the invention, the current flows to the clamping block through the electrode tip and finally flows to the pins, the current sensor can display numbers, the test of the power-on performance is convenient to carry out, the threaded rod is rotated by rotating the knob, the conductive wire can move upwards for two times, the lateral block clamps the threaded rod, the pin is conveniently electrified to the end, the personalized test effect is formed, and the test result is comprehensive.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is an overall side view schematic of the present invention;
FIG. 3 is a schematic diagram of the working principle of the present invention;
FIG. 4 is a schematic diagram of the circuit configuration of the present invention;
FIG. 5 is a schematic view of a partial structure of an upper substrate according to the present invention;
FIG. 6 is a schematic view of the clamping block installation of the present invention;
FIG. 7 is a schematic view of the installation of the first connecting sleeve and the second connecting sleeve of the present invention;
FIG. 8 is an installation cross-sectional view of the first connecting sleeve and the second connecting sleeve of the present invention;
in the figure: 2. testing the component; 8. an integrated circuit board; 81. a pin; 20. an electrode tip; 21. a clamping block; 211. a conductive contact; 22. a lateral block; 23. disassembling the head; 24. conducting wire I; 241. a first connecting sleeve; 25. a second conductive wire; 251. a second connecting sleeve; 26. an insulating upper tightening block; 27. a bevel block; 28. a square recess; 281. a spring; 29. a fixed cylinder; 2411. an inner arc portion; 2412. a large arc portion; 2511. a macrocyclic form; 2512. a semi-arc block; 1. a main base; 11. a lifting rod; 12. a handle; 13. an upper fixed disc; 14. a lower fixed disc; 15. an upper substrate; 151. a knob; 152. a threaded rod; 16. a slide bar; 17. a pressure spring; 5. a power source; 51. a current sensor; 1511. a baffle plate; 1512. an elastic element; 1513. and (5) steel balls.
Detailed Description
The following detailed description of the present invention, taken in conjunction with the preferred embodiments and the accompanying drawings, further illustrates the present invention without limitation. It should be apparent that the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
Referring to fig. 1 to 8, the present invention provides a technical solution: a high-precision testing device for an integrated circuit comprises a main base 1, wherein a lifting rod 11 is connected to the top of the main base 1 in a sliding mode, a handle 12 is movably mounted at the top of the lifting rod 11 through a hinge, a testing component 2 is arranged inside the main base 1, an upper base plate 15 is connected to the bottom of the lifting rod 11 in a welding mode, an upper fixing plate 13 is fixed to the bottom of the upper base plate 15 through a bolt, a lower fixing plate 14 is fixed to the bottom of the main base 1 in a welding mode, a sliding rod 16 is mounted on the inner wall of the upper base plate 15 in a sliding mode, the bottom end of the sliding rod 16 is fixedly welded to the inner wall of the bottom of the main base 1, the circuit board is clamped through the upper fixing plate 13 and the lower fixing plate 14, the testing component 2 can test the conductivity of the integrated circuit board 8 conveniently, the lifting rod 11 can move by pressing the handle 12, the whole upper fixing plate 13 can be driven to move conveniently, whether the integrated circuit board 8 is clamped or not can be determined, and testing is convenient;
the testing component 2 comprises a fixed cylinder 29, through holes are correspondingly formed in two sides of the fixed cylinder 29, the cross section of each through hole is square, a dismounting head 23 is sleeved inside one end of the fixed cylinder 29, a clamping block 21 is movably hinged to one side of the dismounting head 23 correspondingly, a conductive contact 211 is fixedly welded to one side of the clamping block 21, and when the integrated circuit boards 8 of different models are tested, the clamping blocks 21 of different models are replaced by mounting and dismounting the dismounting heads 23, so that the tests of different models are conveniently carried out;
an insulating tightening block 26 is fixed on one side of the dismounting head 23 through a bolt, square concave parts 28 are correspondingly formed in two sides of the insulating tightening block 26, springs 281 are correspondingly welded and fixed on the inner walls of the square concave parts 28, an inclined plane block 27 is installed at one end of each spring 281, the inclined plane blocks 27 penetrate through holes, the number of the springs 281 is two, the springs 281 are correspondingly distributed at the long end and the short end of each inclined plane block 27, when the dismounting is carried out, the inclined plane blocks 27 are pressed to enter the square concave parts 28, the mounting and the dismounting are further carried out, the fast mounting and the dismounting are convenient, and the mounting and the dismounting are convenient due to the insulating effect;
one side of the clamping block 21 is hinged with a lateral block 22, the lateral block 22 is electrically connected with the clamping block 21, one end of the clamping block 21 is hinged with a first conductive wire 24, one end of the first conductive wire 24 is provided with a second conductive wire 25, the first conductive wire 24 is connected with the second conductive wire 25, the first conductive wire 24 and the second conductive wire 25 can be tightened and loosened when the clamping block is mounted and dismounted, the connection and the loosening are convenient, and the conduction is realized through the first conductive wire 24 and the second conductive wire 25;
one end of the first conductive wire 24 is connected with a first connecting sleeve 241, one end of the second conductive wire 25 is connected with a second connecting sleeve 251, the first connecting sleeve 241 and the second connecting sleeve 251 are in a matching structure, and the first connecting sleeve 241 and the second connecting sleeve 251 are matched with each other, so that the first connecting sleeve 241 can have a corresponding structure to conduct and break when being installed and disassembled;
a threaded rod 152 is movably mounted on one side of the upper substrate 15 through a bearing, a spiral threaded groove is formed in the threaded rod 152, a second conductive wire 25 is wound on the outer portion of the threaded groove, one end of the threaded rod 152 extends out of the side wall of the upper substrate 15, a knob 151 is connected to one end of the threaded rod 152, one end of the second conductive wire 25 slides through the inner wall of the upper substrate 15, one end of the second conductive wire 25 is electrically connected with a current sensor 51, one end of the current sensor 51 and one end of the second conductive wire 25 located above are both electrically connected with an electrode tip 20, the electrode tip 20 is electrically connected with a power supply 5, the power supply 5 is powered on during testing, current flows to the second conductive wire 25 through the electrode tip 20 and flows to a clamping block 21 to clamp the pin 81, and finally flows to an output pin 81 corresponding to the other side through an internal circuit of an integrated circuit, if the pins are switched on, a complete current path is formed, the current sensor 51 has a number indicating number, the testing of the power-on performance is facilitated, the threaded rod 152 is rotated through the knob 151, and the number of the threaded rod 25 is changed in the threaded groove, so that the side direction of the clamping block 22 is determined, and the power-on pin is convenient for testing;
a pressure spring 17 is sleeved on the outer wall of the sliding rod 16, two ends of the pressure spring 17 are respectively contacted with the inner wall of the bottom of the main base 1 and the upper base plate 15, the upper base plate 15 is enabled to store energy when being pressed downwards through the pressure spring 17, the upper base plate 15 can return to the original position when the handle 12 is loosened, the next work is convenient, and the safety of non-test time is ensured;
an inner arc portion 2411 is formed in one side of the first connecting sleeve 241, a large arc portion 2412 is formed in the inner wall of the inner arc portion 2411 in an inward extending mode, a large ring-shaped body 2511 is formed in one side of the second connecting sleeve 251, a half arc-shaped block 2512 is fixedly welded to one side of the large ring-shaped body 2511 correspondingly, the half arc-shaped block 2512 protrudes out of the outer wall of the large ring-shaped body 2511, the turning radius of the half arc-shaped block 2512 is the same as that of the large arc portion 2412, the radius of the inner arc portion 2411 is the same as that of the large ring-shaped body 2511, when the turning radius of the half arc-shaped block 2512 and the large arc portion 2412 turn to the coincident position, connection between the two portions can be kept and cannot be disconnected, the two portions can conduct electricity, when the half arc portion rotates to the half position, electricity cannot be conducted due to an excessively small contact point, the effective connection between the two portions can be kept, the resistance for electrifying can be flexibly adjusted, when the full rotation is conducted, appropriate testing resistance can be guaranteed to be incapable of each pair of pins, the appropriate testing resistance can be selected instead of unified current, the unified current cannot be burnt off due to the circuit board because of the circuit inside of the circuit board because of the circuit board cannot be caused by excessively large current.
The angle of the clamping block 21 can be changed by pulling the rear part, so that clamping and loosening are realized, the operation is simple and convenient, the integrated circuit board 83 does not need to be approached, and the safety of operators is ensured;
the insulating tightening block 26 can realize high-lubricity connection due to softness, sparks cannot be generated due to friction static in installation, the insulating tightening block can extend into the through hole by extruding the inclined block 27 inwards, the rear fixed cylinder 29 is convenient to replace, integral disassembly is not needed, and disassembly is convenient and repeated installation is not needed;
example 1: the working process of the invention comprises the following specific steps:
s1, clamping the end head of the integrated circuit board 83 by the clamping block 21, and enabling the conductive contact 211 to be connected electrically;
s2, mounting the disassembling head 23 on the fixed cylinder 29 during assembly, and aligning the first connecting sleeve 241 with the second connecting sleeve 251;
s3, rotating the half-arc-shaped block 2512 to be attached to the inner arc portion 2411 during measurement, and conducting electricity at the moment;
s4, when the measurement is finished, the semi-arc rotating block 2512 is aligned to a half position of the large arc portion 2412, and at the moment, the electric conduction cannot be achieved, but the semi-arc rotating block and the large arc portion are still connected;
s5, the inclined block 27 is inwards squeezed during disassembly, the first conductive wire 25 is rotated by ninety degrees, the first connecting sleeve 241 is separated from the second connecting sleeve 251, the second conductive wire 25 is pulled rightwards, and then the electric wire is disassembled;
s6, when the clamping block 241 is replaced, the inclined plane block 27 is pressed inwards, and the fixing cylinder 29 can be pulled out.
Example 2: the cylinder hole has been seted up to one side of knob 151, and the downthehole elastic element 1512 that installs of cylinder, a plurality of circular arc groove has evenly been seted up to one side of upper substrate 15 is the circumference, and be provided with steel ball 1513 in the circular arc inslot, steel ball 1513 contacts with elastic element 1512, separation blade 1511 is installed in the inner wall rotation of upper substrate 15, separation blade 1511 all has magnetism with knob 151, and both magnetic poles are the same, carry out flexibility spacing through steel ball 1513 and elastic element 1512 to the position of knob 151, can fix arbitrary angle when rotating, make two 25 of conducting wire also can stretch into in different positions, the tight angle of clamp that can cause clamp block 21 of the length difference of stretching into of two 25 of conducting wire, it is electrically conductive to conveniently carry out the centre gripping to the pin 81 of different models and size, only need outwards pull out knob 151 when needs quick adjustment, can manual rotation knob 151 come quick adjustment conducting wire two 25 stretch into length.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description of the present invention, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.
Finally, it should be pointed out that: the above examples are only for illustrating the technical solutions of the present invention, and are not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: it is to be understood that modifications may be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions may be made in some technical features thereof, without departing from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (8)
1. An integrated circuit high accuracy testing arrangement, includes main base (1), its characterized in that: the top sliding connection of main base (1) has lifter (11), there is handle (12) at the top of lifter (11) through hinge movable mounting, the inside of main base (1) is provided with test component (2), the bottom welded connection of lifter (11) has upper substrate (15), the bottom of upper substrate (15) has last fixed disk (13) through the bolt fastening, the bottom internal weld of main base (1) is fixed with lower fixed disk (14), the inner wall slidable mounting of upper substrate (15) has slide bar (16), the bottom welded fastening of slide bar (16) is at the bottom inner wall of main base (1).
2. A high precision test apparatus for integrated circuits according to claim 1, wherein: the test assembly (2) comprises a fixed barrel (29), through holes are correspondingly formed in two sides of the fixed barrel (29), the cross section of each through hole is square, a dismounting head (23) is sleeved inside one end of the fixed barrel (29), one side of the dismounting head (23) is movably hinged to a clamping block (21) correspondingly, and a conductive contact (211) is welded and fixed to one side of the clamping block (21).
3. A high precision test apparatus for integrated circuits according to claim 2, wherein: dismantle one side of head (23) and have insulating tight piece (26) of going up through the bolt fastening, the both sides correspondence of insulating tight piece (26) has seted up square recess (28), the inner wall of square recess (28) corresponds welded fastening has spring (281), inclined plane piece (27) are installed to the one end of spring (281), the through-hole is passed to inclined plane piece (27), the quantity of spring (281) is two, and spring (281) correspond the long end and the short end that distribute at inclined plane piece (27).
4. A high precision test apparatus for integrated circuits according to claim 3, wherein: one side of the clamping block (21) is hinged with a lateral block (22), the lateral block (22) is electrically connected with the clamping block (21), one end of the clamping block (21) is hinged with a first conductive wire (24), one end of the first conductive wire (24) is provided with a second conductive wire (25), and the first conductive wire (24) is connected with the second conductive wire (25).
5. A high precision test device for integrated circuits according to claim 4, characterized in that: one end of the first conductive wire (24) is connected with a first connecting sleeve (241), one end of the second conductive wire (25) is connected with a second connecting sleeve (251), and the first connecting sleeve (241) and the second connecting sleeve (251) are of a matching structure.
6. The apparatus for high precision testing of integrated circuits of claim 5, wherein: go up one side of base plate (15) and pass through bearing movable mounting have threaded rod (152), set up spiral helicine thread groove on threaded rod (152), and two (25) of conductive wire twine in the outside of thread groove, the lateral wall of going up base plate (15) is stretched out to the one end of threaded rod (152), and the one end of threaded rod (152) is connected with knob (151), the inner wall of going up base plate (15) is passed in the one end slip of two (25) of conductive wire, and the one end electricity of two (25) of conductive wire is connected with current sensor (51), the one end of current sensor (51) and the equal electricity in one end of two (25) of conductive wire that are located the top are connected with electrode tip (20), electrode tip (20) electricity is connected with power (5).
7. The integrated circuit high accuracy testing apparatus of claim 6, wherein: the outer wall of the sliding rod (16) is sleeved with a pressure spring (17), and two ends of the pressure spring (17) are respectively contacted with the inner wall of the bottom of the main base (1) and the upper base plate (15).
8. The integrated circuit high accuracy testing apparatus of claim 7, wherein: an inner arc portion (2411) is formed in one side of the first connecting sleeve (241), a large arc portion (2412) is formed in the inner wall of the inner arc portion (2411) in an inward extending mode, a large ring-shaped body (2511) is formed in one side of the second connecting sleeve (251), a half arc-shaped block (2512) is correspondingly welded and fixed to one side of the large ring-shaped body (2511), the half arc-shaped block (2512) protrudes out of the outer wall of the large ring-shaped body (2511), the turning radius of the half arc-shaped block (2512) is the same as that of the large arc portion (2412), and the radius of the inner arc portion (2411) is the same as the outer diameter of the large ring-shaped body (2511).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211518789.0A CN115542134A (en) | 2022-11-30 | 2022-11-30 | High-precision testing device for integrated circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211518789.0A CN115542134A (en) | 2022-11-30 | 2022-11-30 | High-precision testing device for integrated circuit |
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| CN115542134A true CN115542134A (en) | 2022-12-30 |
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| CN202211518789.0A Pending CN115542134A (en) | 2022-11-30 | 2022-11-30 | High-precision testing device for integrated circuit |
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