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CN115494659A - Liquid crystal panel detection method and system - Google Patents

Liquid crystal panel detection method and system Download PDF

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CN115494659A
CN115494659A CN202210955792.2A CN202210955792A CN115494659A CN 115494659 A CN115494659 A CN 115494659A CN 202210955792 A CN202210955792 A CN 202210955792A CN 115494659 A CN115494659 A CN 115494659A
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CN115494659B (en
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张莲莲
李伟
靳松
陈永超
陈晨
李韦辰
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Beijing C&W Electronics Group Co Ltd
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
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    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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    • G01MEASURING; TESTING
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    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract

本发明涉及一种液晶面板的检测方法及系统,检测方法用于实现液晶面板的边缘检测或/和缺陷检测;其中,边缘检测包括如下步骤:获取待测液晶面板的测量结果图像;提取测量结果图像的感兴趣区域;获取测量结果图像的感兴趣区域中的角坐标点和/或边缘轮廓;根据边缘轮廓测量待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,根据边缘轮廓测量待测液晶面板的切割精度,得到切割精度检测结果;和/或,根据角坐标点以及边缘轮廓测量待测液晶面板的倒角精度,得到倒角精度检测结果;输出并存储研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果;本发明提高了边缘检测与缺陷检测的效率和检测结果的稳定性。

Figure 202210955792

The invention relates to a liquid crystal panel detection method and system, the detection method is used to realize the edge detection or/and defect detection of the liquid crystal panel; wherein, the edge detection includes the following steps: acquiring the measurement result image of the liquid crystal panel to be tested; extracting the measurement result An area of interest in the image; obtaining angular coordinate points and/or edge profiles in the area of interest of the measurement result image; measuring the grinding accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a grinding accuracy detection result; and/or, according to the edge profile Measure the cutting accuracy of the liquid crystal panel to be tested to obtain the cutting accuracy detection result; and/or measure the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile to obtain the chamfering accuracy detection result; output and store the grinding precision detection result And/or cutting accuracy detection results and/or chamfering accuracy detection results; the present invention improves the efficiency of edge detection and defect detection and the stability of detection results.

Figure 202210955792

Description

一种液晶面板的检测方法及系统Method and system for detecting a liquid crystal panel

技术领域technical field

本发明涉及液晶面板检测技术领域,具体涉及一种液晶面板的检测方法及系统。The invention relates to the technical field of liquid crystal panel detection, in particular to a liquid crystal panel detection method and system.

背景技术Background technique

目前液晶面板的检测包括边缘测量与缺陷检测两部分内容,主要依靠人工,对屏幕边缘进行相应的尺寸测量,然后依靠人眼进行缺陷判断。边缘测量主要包括:研磨测量,切割测量与倒角测量三部分内容。目前工厂采用的人工测量方式,主要是在显微镜下面,进行测量。研磨测量,是在屏幕的研磨区域,指定位置或随机位置取多个点,然后对研磨区进行宽度测量;切割测量,是对屏幕边缘距上下mark点的距离进行测量;倒角测量,是对屏幕左上角、左下角、右上角、右下角的倒角进行测量。其检测耗时耗力,并且人工检测的检测结果的准确性与检测人员的经验有关,影响最终的检测结果准确性。At present, the detection of LCD panels includes two parts: edge measurement and defect detection. It mainly relies on manual measurement of the corresponding size of the edge of the screen, and then relies on human eyes to judge defects. Edge measurement mainly includes three parts: grinding measurement, cutting measurement and chamfering measurement. At present, the manual measurement method adopted by the factory is mainly to measure under the microscope. Grinding measurement is to take multiple points in the grinding area of the screen at a specified position or a random position, and then measure the width of the grinding area; cutting measurement is to measure the distance from the edge of the screen to the upper and lower mark points; chamfering measurement is to measure the width of the grinding area. Measure the chamfers of the upper left corner, lower left corner, upper right corner, and lower right corner of the screen. The detection is time-consuming and labor-intensive, and the accuracy of the detection results of manual detection is related to the experience of the detection personnel, which affects the accuracy of the final detection results.

缺陷检测,主要是对缺口、破损、裂纹以及凸起等四类缺陷进行检测。目前工厂采用的缺陷检测方式,主要是利用人眼观察,依次找出屏幕上是否存在这四类缺陷。这种人工测量与缺陷检测的方式,费时费力,效率较低,过程繁琐,主观性较强,受人员情绪、视力好坏、环境光线、不同人眼判断标准不统一等影响。Defect detection is mainly to detect four types of defects such as gaps, breakages, cracks and protrusions. At present, the defect detection method adopted by the factory mainly uses human eye observation to find out whether these four types of defects exist on the screen in turn. This method of manual measurement and defect detection is time-consuming, labor-intensive, inefficient, cumbersome, highly subjective, and affected by personnel emotions, vision, ambient light, and inconsistent judgment standards of different human eyes.

发明内容Contents of the invention

为了解决现有技术中,利用人工对液晶面板的边缘测量与缺陷检测存储在检测结果稳定性差以及结果不统一的技术问题,本发明提供一种液晶面板的检测方法及系统。In order to solve the technical problem of poor stability and inconsistency in detection results of edge measurement and defect detection and storage of liquid crystal panels in the prior art, the present invention provides a liquid crystal panel detection method and system.

本发明解决上述技术问题的技术方案如下:The technical scheme that the present invention solves the problems of the technologies described above is as follows:

一种液晶面板的检测方法,所述检测方法用于实现液晶面板的边缘检测或/和缺陷检测;其中,所述边缘检测包括如下步骤:A detection method of a liquid crystal panel, the detection method is used to realize the edge detection or/and defect detection of the liquid crystal panel; wherein, the edge detection comprises the following steps:

获取待测液晶面板的测量结果图像;Obtain a measurement result image of the liquid crystal panel to be tested;

提取所述测量结果图像的感兴趣区域;extracting the region of interest of the measurement result image;

获取所述测量结果图像的感兴趣区域中的角坐标点和/或边缘轮廓;Obtaining corner coordinate points and/or edge contours in the region of interest of the measurement result image;

根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,根据所述角坐标点以及所述边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;Measuring the grinding accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a grinding accuracy detection result; and/or measuring the cutting accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a cutting accuracy detection result; and/or Or, measuring the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile to obtain a chamfering accuracy detection result;

输出并存储所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果。Outputting and storing the grinding accuracy inspection result and/or the cutting accuracy inspection result and/or the chamfering accuracy inspection result.

本发明的有益效果是:通过确定待测液晶面板的测量结果图像中边缘以及角坐标点的确定,测量待测液晶面板的边缘尺寸等参数,便于提高了边缘检测的效率以及检测结果的稳定性。The beneficial effects of the present invention are: by determining the edge and corner coordinate points in the measurement result image of the liquid crystal panel to be tested, measuring the parameters such as the edge size of the liquid crystal panel to be tested, it is convenient to improve the efficiency of edge detection and the stability of the detection result .

在上述技术方案的基础上,本发明还可以做如下改进。On the basis of the above technical solutions, the present invention can also be improved as follows.

进一步,所述缺陷检测包括如下步骤:Further, the defect detection includes the following steps:

提取所述测量结果图像中所述待测液晶面板边缘缺陷图像;Extracting the edge defect image of the liquid crystal panel to be tested in the measurement result image;

通过将所述待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对所述待测液晶面板边缘缺陷图像进行分类;其中,所述缺陷对比模型为计算机视觉识别模型;Classifying the edge defect image of the liquid crystal panel to be tested by comparing the edge defect image of the liquid crystal panel to be tested with a defect comparison model; wherein, the defect comparison model is a computer vision recognition model;

输出并存储经分类的所述待测液晶面板边缘缺陷图像。Outputting and storing the classified edge defect images of the liquid crystal panel to be tested.

进一步,通过将所述待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对所述待测液晶面板边缘缺陷图像进行分类;具体包括如下步骤:Further, by comparing the image of the edge defect of the liquid crystal panel to be tested with a defect comparison model, the image of the edge defect of the liquid crystal panel to be tested is classified; specifically, the steps are as follows:

建立计算机视觉模型;Build computer vision models;

利用多种类型的液晶面板边缘缺陷样本数据对所述计算机视觉模型进行模型训练,得到多种所述缺陷对比模型;Using various types of liquid crystal panel edge defect sample data to perform model training on the computer vision model to obtain a variety of defect comparison models;

将所述待测液晶面板边缘缺陷图像分别与多种所述缺陷对比模型进行对比,得到多种与所述缺陷对比模型对应的待测液晶面板边缘缺陷图像;Comparing the image of the edge defect of the liquid crystal panel to be tested with a variety of defect comparison models to obtain a variety of edge defect images of the liquid crystal panel to be tested corresponding to the defect comparison model;

对所有的所述待测液晶面板边缘缺陷图像进行分类。Classifying all the edge defect images of the liquid crystal panel to be tested.

采用上述进一步方案的有益效果是,通过将待测液晶面板边缘缺陷图像与缺陷对比模型进行对比识别出模型中预设的缺陷,实现通过计算机视觉识别法自动识别出边缘缺陷,提高了识别效率,同时也统一了识别标准,提高液晶面板的检测结果的稳定性。The beneficial effect of adopting the above further solution is that by comparing the edge defect image of the liquid crystal panel to be tested with the defect comparison model, the preset defects in the model can be identified, and the edge defects can be automatically identified through the computer vision recognition method, which improves the identification efficiency. At the same time, the recognition standard is also unified, and the stability of the detection result of the liquid crystal panel is improved.

进一步,存储所述边缘检测结果以及经分类的所述待测液晶面板边缘缺陷图像,具体包括如下步骤:Further, storing the edge detection result and the classified image of the edge defect of the liquid crystal panel to be tested specifically includes the following steps:

存储所述边缘检测结果;storing the edge detection result;

将经分类的所述待测液晶面板边缘缺陷图像按类别分别存储。The classified edge defect images of the liquid crystal panel to be tested are respectively stored by category.

进一步,提取所述测量结果图像的感兴趣区域,具体包括如下步骤:Further, extracting the region of interest of the measurement result image specifically includes the following steps:

获取所述测量结果图像中所述待测液晶面板的边界;Obtaining the boundary of the liquid crystal panel to be tested in the measurement result image;

通过对所述测量结果图像中所述待测液晶面板的边界进行筛选,确定所述测量结果图像中所述待测液晶面板的外边框;determining the outer frame of the liquid crystal panel to be tested in the measurement result image by screening the boundary of the liquid crystal panel to be tested in the measurement result image;

根据所述待测液晶面板的外边框确定所述感兴趣区域;determining the region of interest according to the outer frame of the liquid crystal panel to be tested;

或者,提取所述测量结果图像的感兴趣区域,具体包括如下步骤:Or, extracting the region of interest of the measurement result image specifically includes the following steps:

提取所述测量结果图像的背景区域;extracting the background area of the measurement result image;

利用预设背景区域面积、预设背景区域宽度值以及预设背景区域高度值对所述测量结果图像的进行区域筛选,确定所述感兴趣区域。The region of interest is determined by performing region screening on the measurement result image by using the preset background region area, the preset background region width value and the preset background region height value.

采用上述进一步方案的有益效果是,通过筛选待测液晶面板的边界确定测量结果图像的感兴趣区能够在液晶面板的尺寸大小不一的情况下,提高液晶面板的检测通用性;通过利用预设背景区域面积、预设背景区域宽度值以及预设背景区域高度值对所述测量结果图像的进行区域筛选,能够对批量生产的同一型号的液晶面板进行统一处理,提高检测效率。The beneficial effect of adopting the above-mentioned further scheme is that the region of interest of the measurement result image can be determined by screening the boundary of the liquid crystal panel to be tested to improve the detection versatility of the liquid crystal panel when the size of the liquid crystal panel is different; The area of the background area, the preset background area width value and the preset background area height value perform area screening on the measurement result image, so that batch-produced liquid crystal panels of the same type can be uniformly processed to improve detection efficiency.

进一步,根据所述待测液晶面板的边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果,具体包括如下步骤:Further, measuring the grinding precision of the liquid crystal panel to be tested according to the edge profile of the liquid crystal panel to be tested to obtain a grinding precision detection result, specifically comprising the following steps:

基于阈值分割法,获取所述测量结果图像的二值图像;Obtaining a binary image of the measurement result image based on a threshold segmentation method;

基于直线拟合法,根据所述待测液晶面板的边缘轮廓获取所述测量结果图像的二值图像中所述待测液晶面板的研磨区两侧边界线;Based on the straight line fitting method, according to the edge profile of the liquid crystal panel to be tested, the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested in the binary image of the measurement result image are obtained;

计算所述待测液晶面板的研磨区两侧边界线之间的距离,得到研磨宽度值;Calculate the distance between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding width value;

计算所述待测液晶面板的研磨区两侧边界线之间的面积,得到研磨面积值;Calculate the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding area value;

计算所述待测液晶面板的研磨区两侧边界线所对应的矩形区域的矩形度,得到研磨矩形度值;Calculating the rectangularity of the rectangular area corresponding to the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested, to obtain the grinding rectangularity value;

计算所述待测液晶面板的研磨区两侧边界线之间区域的高度,得到研磨高度值;Calculate the height of the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding height value;

其中,所述研磨精度检测结果包括所述研磨宽度值、所述研磨面积值、所述研磨矩形度值以及所述研磨高度值。Wherein, the grinding accuracy detection result includes the grinding width value, the grinding area value, the grinding squareness value and the grinding height value.

采用上述进一步方案的有益效果是,通过直线拟合法获取待测液晶面板的研磨区两侧边界线,能够提高检测计算的数据量同时其检测结果能够更加接近实际边界线,提高了检测精度。The beneficial effect of adopting the above further solution is that the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested are obtained by the straight line fitting method, which can increase the amount of data for detection and calculation, and the detection result can be closer to the actual boundary line, which improves the detection accuracy.

进一步,计算所述待测液晶面板的研磨区两侧的边界线之间的距离,得到研磨宽度值,具体包括如下步骤:Further, calculating the distance between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested, to obtain the grinding width value, specifically includes the following steps:

对所述二值图像中所述待测液晶面板的研磨区进行分段,得到多个分段研磨区域;Segmenting the grinding area of the liquid crystal panel to be tested in the binary image to obtain a plurality of segmented grinding areas;

分别计算各个分段研磨区域中的所述研磨区两侧边界线的宽度值;Calculating the width values of the boundary lines on both sides of the grinding area in each segmented grinding area;

将所有的分段研磨区域中的所述研磨区两侧边界线的宽度值取平均,得到所述研磨宽度值。The value of the grinding width is obtained by averaging the width values of the boundary lines on both sides of the grinding area in all segmented grinding areas.

采用上述进一步方案的有益效果是,通过分段检测并取平均的方法能够提高其检测结果的准确性。The beneficial effect of adopting the above further solution is that the accuracy of the detection result can be improved by segment detection and averaging.

进一步,根据所述待测液晶面板的边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果,包括如下步骤:Further, measuring the cutting precision of the liquid crystal panel to be tested according to the edge profile of the liquid crystal panel to be tested, and obtaining a cutting precision detection result, comprises the following steps:

当所述测量结果图上有上、下十字Mark点时,将上、下两个十字Mark点连线,计算所述边缘轮廓上任意一点到所述连线的距离,得到切割精度值;当所述测量结果图上无十字Mark点或者只有一个十字Mark点时,确定所述边缘轮廓上任意目标点,识别所述测量结果图上所述边缘轮廓上任意目标点所对应的标记位,计算所述边缘轮廓上任意目标点到对应的标记位的距离,得到切割精度值;When there are upper and lower cross Mark points on the measurement result figure, connect the upper and lower cross Mark points, calculate the distance from any point on the edge contour to the connection line, and obtain the cutting accuracy value; When there is no cross mark point or only one cross mark point on the measurement result map, determine any target point on the edge contour, identify the corresponding mark position of any target point on the edge contour on the measurement result map, and calculate The distance from any target point on the edge profile to the corresponding mark position is used to obtain the cutting accuracy value;

其中,所述切割精度检测结果包括所述切割精度值。Wherein, the cutting accuracy detection result includes the cutting accuracy value.

进一步,根据所述待测液晶面板的角坐标点以及边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果,包括如下步骤:Further, measuring the chamfering precision of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile of the liquid crystal panel to be tested, to obtain a chamfering precision detection result, comprising the following steps:

利用自适应阈值算法,获取所述测量结果图像的感兴趣区域中倒角特征标志位,确定倒角检测区域;Using an adaptive threshold algorithm to obtain the chamfering feature flag in the region of interest of the measurement result image, and determine the chamfering detection area;

对所述倒角检测区域进行分割提取,得到倒角区域图像;Segmenting and extracting the chamfering detection area to obtain an image of the chamfering area;

根据预设倒角面积特征值、预设倒角宽度特征值以及预设倒角高度特征值,筛选出所述倒角区域图像中的最终倒角图像;According to the preset chamfer area characteristic value, the preset chamfer width characteristic value and the preset chamfer height characteristic value, filter out the final chamfer image in the chamfer area image;

根据所述角坐标点以及所述边缘轮廓确定所述最终倒角的最小外接矩形;determining the minimum circumscribed rectangle of the final chamfer according to the corner coordinate points and the edge profile;

根据所述最终倒角的最小外接矩形,计算所述最终倒角的最终倒角宽度值以及最终倒角高度值;calculating a final chamfer width value and a final chamfer height value of the final chamfer according to the minimum circumscribed rectangle of the final chamfer;

其中,所述倒角精度检测结果包括所述最终倒角宽度值以及所述最终倒角高度值Wherein, the chamfering accuracy detection result includes the final chamfering width value and the final chamfering height value

为了解决上述技术问题,本发明还提供如下技术方案:In order to solve the above technical problems, the present invention also provides the following technical solutions:

一种液晶面板的检测系统,所述检测系统用于对液晶面板进行边缘检测或/和缺陷检测;其中,所述边缘检测系统包括,A detection system for a liquid crystal panel, the detection system is used to perform edge detection or/and defect detection on the liquid crystal panel; wherein, the edge detection system includes,

数据获取模块,用于获取待测液晶面板的测量结果图像;A data acquisition module, configured to acquire a measurement result image of the liquid crystal panel to be tested;

数据处理模块,用于提取所述测量结果图像的感兴趣区域,获取所述测量结果图像中的角坐标点和/或边缘轮廓;A data processing module, configured to extract the region of interest of the measurement result image, and obtain corner coordinate points and/or edge contours in the measurement result image;

精度检测模块,用于根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,用于根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,用于根据所述角坐标点以及边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;an accuracy detection module, configured to measure the grinding accuracy of the liquid crystal panel to be tested according to the edge profile, and obtain a grinding accuracy detection result; and/or, used to measure the cutting accuracy of the liquid crystal panel to be tested according to the edge profile, Obtaining a cutting accuracy detection result; and/or, measuring the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile to obtain a chamfering accuracy detection result;

输出模块,用于输出所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果;An output module, configured to output the testing results of the grinding accuracy and/or the testing results of the cutting accuracy and/or the testing results of the chamfering accuracy;

存储模块,用于存储所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果。The storage module is used for storing the grinding accuracy detection result and/or the cutting accuracy detection result and/or the chamfering accuracy detection result.

附图说明Description of drawings

图1为本发明实施例中一种液晶面板的检测方法的流程图。FIG. 1 is a flow chart of a detection method for a liquid crystal panel in an embodiment of the present invention.

具体实施方式detailed description

以下结合附图对本发明的原理和特征进行描述,所举实例只用于解释本发明,并非用于限定本发明的范围。The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

实施例1Example 1

如图1所示,本实施例提供一种液晶面板的检测方法,其检测方法用于实现液晶面板的边缘检测或/和缺陷检测;其中,边缘检测包括如下步骤:As shown in FIG. 1, the present embodiment provides a detection method of a liquid crystal panel, and the detection method is used to realize edge detection or/and defect detection of the liquid crystal panel; wherein, the edge detection includes the following steps:

S1.获取待测液晶面板的测量结果图像;S1. Obtain the measurement result image of the liquid crystal panel to be tested;

S2.提取测量结果图像的感兴趣区域;具体步骤为:获取测量结果图像中待测液晶面板的边界;S2. Extracting the region of interest of the measurement result image; the specific steps are: obtaining the boundary of the liquid crystal panel to be tested in the measurement result image;

通过对测量结果图像中待测液晶面板的边界进行筛选,确定测量结果图像中待测液晶面板的外边框;Determining the outer frame of the liquid crystal panel to be tested in the measurement result image by screening the boundary of the liquid crystal panel to be tested in the measurement result image;

根据待测液晶面板的外边框确定感兴趣区域;Determine the region of interest according to the outer frame of the liquid crystal panel to be tested;

或者,具体步骤为:Alternatively, the specific steps are:

利用预设背景区域面积、预设背景区域宽度值以及预设背景区域高度值对测量结果图像的进行区域筛选,确定感兴趣区域。若出现感兴趣区域不准确,可通过提高阈值参数解决问题。Using the area of the preset background area, the width value of the preset background area and the height value of the preset background area to filter the area of the measurement result image to determine the area of interest. If the region of interest is inaccurate, the problem can be solved by increasing the threshold parameter.

S3.获取所述测量结果图像的感兴趣区域中的角坐标点和/或边缘轮廓。S3. Acquire corner coordinate points and/or edge contours in the region of interest of the measurement result image.

S4.根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,根据角坐标点以及边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;具体地,根据待测液晶面板的边缘轮廓测量待测液晶面板的研磨精度,得到研磨精度检测结果,包括如下步骤:S4. Measure the grinding accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a grinding accuracy detection result; and/or measure the cutting accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a cutting accuracy detection result; And/or, measure the chamfering precision of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile, and obtain the chamfering precision detection result; specifically, measure the grinding precision of the liquid crystal panel to be tested according to the edge profile of the liquid crystal panel to be tested, Obtaining the grinding accuracy detection result includes the following steps:

基于阈值分割法,获取测量结果图像的二值图像;Based on the threshold segmentation method, the binary image of the measurement result image is obtained;

基于直线拟合法,获取测量结果图像的二值图像中待测液晶面板的研磨区两侧边界线;Based on the straight line fitting method, the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested in the binary image of the measurement result image are obtained;

计算待测液晶面板的研磨区两侧边界线之间的距离,得到研磨宽度值;Calculate the distance between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding width value;

计算待测液晶面板的研磨区两侧边界线之间的面积,得到研磨面积值;Calculate the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding area value;

计算待测液晶面板的研磨区两侧边界线所对应的矩形区域的矩形度,得到研磨矩形度值;Calculate the rectangularity of the rectangular area corresponding to the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested, to obtain the grinding rectangularity value;

计算待测液晶面板的研磨区两侧边界线之间区域的高度,得到研磨高度值。Calculate the height of the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding height value.

计算待测液晶面板的研磨区两侧的边界线之间的距离,得到研磨宽度值,包括如下步骤:Calculate the distance between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding width value, including the following steps:

对二值图像中待测液晶面板的研磨区进行分段,得到多个分段研磨区域;Segmenting the grinding area of the liquid crystal panel to be tested in the binary image to obtain a plurality of segmented grinding areas;

分别计算各个分段研磨区域中的研磨区两侧边界线的宽度值;Calculating the width values of the boundary lines on both sides of the grinding area in each segmented grinding area;

将所有的分段研磨区域中的研磨区两侧边界线的宽度值取平均,得到研磨宽度值。Average the width values of the boundary lines on both sides of the grinding area in all segmented grinding areas to obtain the grinding width value.

其中,所述研磨精度检测结果包括所述研磨宽度值、所述研磨面积值、所述研磨矩形度值以及所述研磨高度值。Wherein, the grinding accuracy detection result includes the grinding width value, the grinding area value, the grinding squareness value and the grinding height value.

根据待测液晶面板的边缘轮廓测量待测液晶面板的切割精度,得到切割精度检测结果,包括如下步骤:Measuring the cutting precision of the liquid crystal panel to be tested according to the edge profile of the liquid crystal panel to be tested to obtain a cutting precision test result, including the following steps:

当测量结果图上有上、下十字Mark点时,将上、下十字Mark点进行连线,计算边缘轮廓上任意一点到其连线的距离,得到切割精度值;当测量结果图上无十字Mark点或者只有一个十字Mark点时,确定边缘轮廓上任意目标点,识别测量结果图上边缘轮廓上任意目标点所对应的标记位,计算边缘轮廓上任意目标点到对应的标记位的距离,得到切割精度值。其中,所述切割精度检测结果包括所述切割精度值。When there are upper and lower cross Mark points on the measurement result graph, connect the upper and lower cross Mark points, calculate the distance from any point on the edge contour to the connecting line, and obtain the cutting accuracy value; when there is no cross mark on the measurement result graph When there is only one Mark point or only one cross Mark point, determine any target point on the edge contour, identify the mark position corresponding to any target point on the edge contour on the measurement result map, and calculate the distance from any target point on the edge contour to the corresponding mark position, Get the cutting precision value. Wherein, the cutting accuracy detection result includes the cutting accuracy value.

根据待测液晶面板的角坐标点以及边缘轮廓测量待测液晶面板的倒角精度,包括如下步骤:Measuring the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile of the liquid crystal panel to be tested includes the following steps:

利用自适应阈值算法,获取所述测量结果图像的感兴趣区域中倒角特征标志位,确定倒角检测区域;Using an adaptive threshold algorithm to obtain the chamfering feature flag in the region of interest of the measurement result image, and determine the chamfering detection area;

对所述倒角检测区域进行分割提取,得到倒角区域图像;Segmenting and extracting the chamfering detection area to obtain an image of the chamfering area;

根据预设倒角面积特征值、预设倒角宽度特征值以及预设倒角高度特征值,筛选出所述倒角区域图像中的最终倒角图像;According to the preset chamfer area characteristic value, the preset chamfer width characteristic value and the preset chamfer height characteristic value, filter out the final chamfer image in the chamfer area image;

根据所述角坐标点以及所述边缘轮廓确定所述最终倒角的最小外接矩形;determining the minimum circumscribed rectangle of the final chamfer according to the corner coordinate points and the edge profile;

根据所述最终倒角的最小外接矩形,计算所述最终倒角的最终倒角宽度值以及最终倒角高度值;calculating a final chamfer width value and a final chamfer height value of the final chamfer according to the minimum circumscribed rectangle of the final chamfer;

其中,所述倒角精度检测结果包括所述最终倒角宽度值以及所述最终倒角高度值。Wherein, the chamfering accuracy detection result includes the final chamfering width value and the final chamfering height value.

S5、输出并存储所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果。S5. Output and store the grinding accuracy detection result and/or cutting accuracy detection result and/or chamfering accuracy detection result.

实施例2Example 2

基于实施例1,本实施例提供一种液晶面板的检测方法,其检测方法用于实现液晶面板的边缘检测或/和缺陷检测;其中,缺陷检测包括如下步骤:Based on Embodiment 1, this embodiment provides a detection method of a liquid crystal panel, and the detection method is used to realize edge detection or/and defect detection of the liquid crystal panel; wherein, the defect detection includes the following steps:

S10.提取测量结果图像中待测液晶面板边缘缺陷图像;S10. Extracting the edge defect image of the liquid crystal panel to be tested in the measurement result image;

S11.通过将待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对待测液晶面板边缘缺陷图像进行分类;其中,缺陷对比模型为计算机视觉识别模型;具体包括如下步骤:S11. By comparing the edge defect image of the liquid crystal panel to be tested with the defect comparison model, classify the edge defect image of the liquid crystal panel to be tested; wherein, the defect comparison model is a computer vision recognition model; specifically includes the following steps:

建立计算机视觉模型;Build computer vision models;

利用多种类型的液晶面板边缘缺陷样本数据对计算机视觉模型进行模型训练,得到多种缺陷对比模型;其中,多种类型的液晶面板边缘缺陷样本数据至少包括缺口样本数据、破损样本数据、裂纹样本数据以及凸起样本数据;Use various types of liquid crystal panel edge defect sample data to train the computer vision model to obtain a variety of defect comparison models; among them, the various types of liquid crystal panel edge defect sample data include at least gap sample data, damaged sample data, and crack samples data and bump sample data;

将待测液晶面板边缘缺陷图像分别与多种缺陷对比模型进行对比,得到多种与缺陷对比模型对应的待测液晶面板边缘缺陷图像;Comparing the edge defect images of the liquid crystal panel to be tested with various defect comparison models respectively, and obtaining various edge defect images of the liquid crystal panel to be tested corresponding to the defect comparison models;

对所有的待测液晶面板边缘缺陷图像进行分类。Classify all the edge defect images of the liquid crystal panel to be tested.

其中,获取待测液晶面板边缘缺陷图像的方法为自适应阈值法;自适应阈值的思想不是计算全局图像的阈值,而是根据图像不同区域亮度分布,计算其局部阈值,所以对于图像不同区域,能够自适应计算不同的阈值,因此被称为自适应阈值法,其适用于灰度不均匀图像的缺陷分割;算法假设图像像素能够根据阈值,被分成背景和目标两部分。然后,计算该最佳阈值来区分这两类像素,使得两类像素区分度最大。其具体计算公式如下:Among them, the method of obtaining the image of the edge defect of the liquid crystal panel to be tested is the adaptive threshold method; the idea of the adaptive threshold is not to calculate the threshold of the global image, but to calculate the local threshold according to the brightness distribution of different regions of the image, so for different regions of the image, It can adaptively calculate different thresholds, so it is called the adaptive threshold method, which is suitable for defect segmentation of images with uneven gray levels; the algorithm assumes that image pixels can be divided into background and target according to the threshold. Then, the optimal threshold is calculated to distinguish the two types of pixels, so that the two types of pixels have the greatest degree of discrimination. Its specific calculation formula is as follows:

Figure BDA0003791294100000101
Figure BDA0003791294100000101

Figure BDA0003791294100000102
Figure BDA0003791294100000102

N1+N2=M×NN 1 +N 2 =M×N

ω12=1ω 12 =1

μ=μ1×ω12×ω2 μ=μ 1 ×ω 12 ×ω 2

g=ω1×(μ-μ1)22×(μ-μ2)2 g=ω 1 ×(μ-μ 1 ) 22 ×(μ-μ 2 ) 2

N1表示像素灰度大于目标和背景的分割阈值的像素个数;N2表示像素灰度小于目标和背景的分割阈值的像素个数;M×N表示图像的大小;ω1表示目标像素点数占整幅图像的比例;ω2表示背景像素点数占整幅图像的比例;μ1表示目标像素平均灰度;μ2表示背景像素平均灰度;μ表示图像的总平均灰度;g表示类间方差。N 1 represents the number of pixels whose grayscale is greater than the segmentation threshold of the target and background; N 2 represents the number of pixels whose grayscale is smaller than the segmentation threshold of the target and background; M×N represents the size of the image; ω 1 represents the number of target pixels The proportion of the entire image; ω2 represents the proportion of the background pixel points to the entire image; μ1 represents the average gray level of the target pixel; μ2 represents the average gray level of the background pixel; μ represents the total average gray value of the image; g represents the class Variance between.

S12.输出经分类的待测液晶面板边缘缺陷图像;。S12. Outputting the classified images of edge defects of the liquid crystal panel to be tested;

S13.存储边经分类的待测液晶面板边缘缺陷图像;具体包括如下步骤:将经分类的待测液晶面板边缘缺陷图像按类别分别存储。S13. Storing the classified edge defect images of the liquid crystal panel to be tested; specifically including the following steps: storing the classified edge defect images of the liquid crystal panel to be tested by category.

本实施例通过将待测液晶面板边缘缺陷图像与缺陷对比模型进行对比识别出模型中预设的缺陷,实现通过计算机视觉识别法自动识别出边缘缺陷,提高了识别效率,同时也统一了识别标准,提高液晶面板的检测结果的稳定性。In this embodiment, by comparing the edge defect image of the liquid crystal panel to be tested with the defect comparison model, the preset defects in the model are identified, and the edge defects are automatically identified through the computer vision recognition method, which improves the recognition efficiency and unifies the recognition standards. , improving the stability of the detection result of the liquid crystal panel.

实施例3Example 3

基于实施例1,本实施例提供一种液晶面板的检测系统,包括数据获取模块、数据处理模块、精度检测模块、缺陷检测模块、输出模块以及存储模块。Based on Embodiment 1, this embodiment provides a detection system for a liquid crystal panel, including a data acquisition module, a data processing module, an accuracy detection module, a defect detection module, an output module, and a storage module.

数据获取模块,用于获取待测液晶面板的测量结果图像;A data acquisition module, configured to acquire a measurement result image of the liquid crystal panel to be tested;

数据处理模块,用于提取所述测量结果图像的感兴趣区域,获取所述测量结果图像中所述待测液晶面板的角坐标点和/或边缘轮廓;A data processing module, configured to extract the region of interest of the measurement result image, and obtain the corner coordinate points and/or edge contours of the liquid crystal panel to be tested in the measurement result image;

精度检测模块,用于根据所述待测液晶面板的边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,用于根据所述待测液晶面板的边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,用于根据所述待测液晶面板的角坐标点以及边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;A precision detection module, configured to measure the grinding precision of the liquid crystal panel to be tested according to the edge profile of the liquid crystal panel to be tested, to obtain a grinding precision detection result; and/or, to measure according to the edge profile of the liquid crystal panel to be tested The cutting accuracy of the liquid crystal panel to be measured is obtained to obtain a cutting accuracy detection result; and/or, it is used to measure the chamfering accuracy of the liquid crystal panel to be measured according to the corner coordinate points and edge contours of the liquid crystal panel to be measured to obtain the chamfering accuracy of the liquid crystal panel to be measured. Angular accuracy test results;

缺陷检测模块,用于提取所述测量结果图像中所述待测液晶面板边缘缺陷图像;通过将所述待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对所述待测液晶面板边缘缺陷图像进行分类;其中,所述缺陷对比模型为计算机视觉识别模型;The defect detection module is used to extract the edge defect image of the liquid crystal panel to be tested in the measurement result image; by comparing the edge defect image of the liquid crystal panel to be tested with the defect comparison model, the edge defect of the liquid crystal panel to be tested The images are classified; wherein, the defect comparison model is a computer vision recognition model;

输出模块,用于输出研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果和/或经分类的待测液晶面板边缘缺陷图像;An output module, configured to output a grinding accuracy test result and/or a cutting accuracy test result and/or a chamfering accuracy test result and/or a classified edge defect image of the liquid crystal panel to be tested;

存储模块,用于存储研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果和/或经分类的待测液晶面板边缘缺陷图像。The storage module is used for storing the grinding accuracy detection result and/or the cutting accuracy detection result and/or the chamfering accuracy detection result and/or the classified edge defect images of the liquid crystal panel to be tested.

具体地,上述数据获取模块、数据处理模块、精度检测模块、缺陷检测模块以及输出模块均为计算机程序或计算机程序中的功能代码的集合;存储模块可以是计算机的存储器、内存、闪存以及外部存储设备等。Specifically, the above-mentioned data acquisition module, data processing module, accuracy detection module, defect detection module and output module are all computer programs or a collection of function codes in computer programs; the storage module can be computer memory, internal memory, flash memory and external storage equipment etc.

本发明实施例通过利用计算机程序获取待测液晶面板的测量结果图像,并对待测液晶面板的测量结果图像中边缘以及角坐标点的确定,测量待测液晶面板的边缘尺寸等参数,相对于人工检测而言提高了边缘检测的效率以及检测结果的稳定性;通过将待测液晶面板边缘缺陷图像与缺陷对比模型进行对比识别出模型中预设的缺陷,实现通过计算机视觉识别法自动识别出边缘缺陷,提高了识别效率,同时也统一了识别标准,提高液晶面板的检测结果的稳定性。The embodiment of the present invention obtains the measurement result image of the liquid crystal panel to be tested by using a computer program, and determines the edges and corner coordinate points in the measurement result image of the liquid crystal panel to be tested, and measures parameters such as the edge size of the liquid crystal panel to be tested. In terms of detection, the efficiency of edge detection and the stability of detection results are improved; by comparing the image of the edge defect of the liquid crystal panel to be tested with the defect comparison model, the preset defects in the model are identified, and the edge is automatically recognized by the computer vision recognition method. Defects improve the identification efficiency, and at the same time unify the identification standards and improve the stability of the detection results of the liquid crystal panel.

以上所述仅为本发明的较佳实施例,并不用以限制本发明,凡在本发明的构思和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the concept and principles of the present invention shall be included in the protection of the present invention. within range.

Claims (10)

1.一种液晶面板的检测方法,其特征在于,所述检测方法用于实现液晶面板的边缘检测或/和缺陷检测;其中,所述边缘检测包括如下步骤:1. a detection method of liquid crystal panel, it is characterized in that, described detection method is used for realizing the edge detection of liquid crystal panel or/and defect detection; Wherein, described edge detection comprises the steps: 获取待测液晶面板的测量结果图像;Obtain a measurement result image of the liquid crystal panel to be tested; 提取所述测量结果图像的感兴趣区域;extracting the region of interest of the measurement result image; 获取所述测量结果图像的感兴趣区域中的角坐标点和/或边缘轮廓;Obtaining corner coordinate points and/or edge contours in the region of interest of the measurement result image; 根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,根据所述角坐标点以及所述边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;Measuring the grinding accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a grinding accuracy detection result; and/or measuring the cutting accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a cutting accuracy detection result; and/or Or, measuring the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate points and the edge profile to obtain a chamfering accuracy detection result; 输出并存储所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果。Outputting and storing the grinding accuracy inspection result and/or the cutting accuracy inspection result and/or the chamfering accuracy inspection result. 2.根据权利要求1所述的液晶面板的检测方法,其特征在于,所述缺陷检测包括如下步骤:2. the detection method of liquid crystal panel according to claim 1, is characterized in that, described defect detection comprises the steps: 提取所述测量结果图像中所述待测液晶面板边缘缺陷图像;Extracting the edge defect image of the liquid crystal panel to be tested in the measurement result image; 通过将所述待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对所述待测液晶面板边缘缺陷图像进行分类;其中,所述缺陷对比模型为计算机视觉识别模型;Classifying the edge defect image of the liquid crystal panel to be tested by comparing the edge defect image of the liquid crystal panel to be tested with a defect comparison model; wherein, the defect comparison model is a computer vision recognition model; 输出并存储经分类的所述待测液晶面板边缘缺陷图像。Outputting and storing the classified edge defect images of the liquid crystal panel to be tested. 3.根据权利要求2所述的液晶面板的检测方法,其特征在于,通过将所述待测液晶面板边缘缺陷图像与缺陷对比模型进行对比,对所述待测液晶面板边缘缺陷图像进行分类,具体包括如下步骤:3. the detection method of liquid crystal panel according to claim 2, it is characterized in that, by comparing the edge defect image of described liquid crystal panel to be tested with defect comparison model, the edge defect image of described liquid crystal panel to be tested is classified, Specifically include the following steps: 建立计算机视觉模型;Build computer vision models; 利用多种类型的液晶面板边缘缺陷样本数据对所述计算机视觉模型进行模型训练,得到多种所述缺陷对比模型;Using various types of liquid crystal panel edge defect sample data to perform model training on the computer vision model to obtain a variety of defect comparison models; 将所述待测液晶面板边缘缺陷图像分别与多种所述缺陷对比模型进行对比,得到多种与所述缺陷对比模型对应的待测液晶面板边缘缺陷图像;Comparing the image of the edge defect of the liquid crystal panel to be tested with a variety of defect comparison models to obtain a variety of edge defect images of the liquid crystal panel to be tested corresponding to the defect comparison model; 对所有的所述待测液晶面板边缘缺陷图像进行分类。Classifying all the edge defect images of the liquid crystal panel to be tested. 4.根据权利要求3所述的液晶面板的检测方法,其特征在于,存储经分类的所述待测液晶面板边缘缺陷图像,具体包括如下步骤:4. the detection method of liquid crystal panel according to claim 3, is characterized in that, stores the edge defect image of described liquid crystal panel to be tested through classification, specifically comprises the steps: 将经分类的所述待测液晶面板边缘缺陷图像按类别分别存储。The classified edge defect images of the liquid crystal panel to be tested are respectively stored by category. 5.根据权利要求1所述的液晶面板的检测方法,其特征在于,提取所述测量结果图像的感兴趣区域,具体包括如下步骤:5. the detection method of liquid crystal panel according to claim 1, is characterized in that, extracting the region of interest of described measurement result image, specifically comprises the steps: 获取所述测量结果图像中所述待测液晶面板的边界;Obtaining the boundary of the liquid crystal panel to be tested in the measurement result image; 通过对所述测量结果图像中所述待测液晶面板的边界进行筛选,确定所述测量结果图像中所述待测液晶面板的外边框;determining the outer frame of the liquid crystal panel to be tested in the measurement result image by screening the boundary of the liquid crystal panel to be tested in the measurement result image; 根据所述待测液晶面板的外边框确定所述感兴趣区域;determining the region of interest according to the outer frame of the liquid crystal panel to be tested; 或者,提取所述测量结果图像的感兴趣区域,具体包括如下步骤:Or, extracting the region of interest of the measurement result image specifically includes the following steps: 提取所述测量结果图像的背景区域;extracting the background area of the measurement result image; 利用预设背景区域面积、预设背景区域宽度值以及预设背景区域高度值对所述测量结果图像的进行区域筛选,确定所述感兴趣区域。The region of interest is determined by performing region screening on the measurement result image by using the preset background region area, the preset background region width value and the preset background region height value. 6.根据权利要求1或5所述的液晶面板的检测方法,其特征在于,根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果,具体包括如下步骤:6. The detection method of the liquid crystal panel according to claim 1 or 5, characterized in that, measuring the grinding accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a grinding accuracy detection result, specifically comprising the following steps: 基于阈值分割法,获取所述测量结果图像的二值图像;Obtaining a binary image of the measurement result image based on a threshold segmentation method; 基于直线拟合法,根据所述待测液晶面板的边缘轮廓获取所述测量结果图像的二值图像中所述待测液晶面板的研磨区两侧边界线;Based on the straight line fitting method, according to the edge profile of the liquid crystal panel to be tested, the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested in the binary image of the measurement result image are obtained; 计算所述待测液晶面板的研磨区两侧边界线之间的距离,得到研磨宽度值;Calculate the distance between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding width value; 计算所述待测液晶面板的研磨区两侧边界线之间的面积,得到研磨面积值;Calculate the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding area value; 计算所述待测液晶面板的研磨区两侧边界线所对应的矩形区域的矩形度,得到研磨矩形度值;Calculating the rectangularity of the rectangular area corresponding to the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested, to obtain the grinding rectangularity value; 计算所述待测液晶面板的研磨区两侧边界线之间区域的高度,得到研磨高度值;Calculate the height of the area between the boundary lines on both sides of the grinding area of the liquid crystal panel to be tested to obtain the grinding height value; 其中,所述研磨精度检测结果包括所述研磨宽度值、所述研磨面积值、所述研磨矩形度值以及所述研磨高度值。Wherein, the grinding accuracy detection result includes the grinding width value, the grinding area value, the grinding squareness value and the grinding height value. 7.根据权利要求6所述的液晶面板的检测方法,其特征在于,计算所述待测液晶面板的研磨区两侧的边界线之间的距离,得到研磨宽度值,具体包括如下步骤:7. the detection method of liquid crystal panel according to claim 6, is characterized in that, calculates the distance between the boundary lines on both sides of the grinding area of said liquid crystal panel to be measured, obtains the grinding width value, specifically comprises the steps: 对所述二值图像中所述待测液晶面板的研磨区进行分段,得到多个分段研磨区域;Segmenting the grinding area of the liquid crystal panel to be tested in the binary image to obtain a plurality of segmented grinding areas; 分别计算各个分段研磨区域中的所述研磨区两侧边界线的宽度值;Calculating the width values of the boundary lines on both sides of the grinding area in each segmented grinding area; 将所有的分段研磨区域中的所述研磨区两侧边界线的宽度值取平均,得到所述研磨宽度值。The value of the grinding width is obtained by averaging the width values of the boundary lines on both sides of the grinding area in all segmented grinding areas. 8.根据权利要求1或5所述的液晶面板的检测方法,其特征在于,根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果,具体包括如下步骤:8. The detection method of the liquid crystal panel according to claim 1 or 5, wherein measuring the cutting accuracy of the liquid crystal panel to be tested according to the edge profile to obtain a cutting accuracy detection result, specifically comprises the following steps: 当所述测量结果图上有上、下两个十字Mark点时,将上、下两个十字Mark点连线,计算所述边缘轮廓上任意一点到所述连线的距离,得到切割精度值;当所述测量结果图上无十字Mark点或者只有一个十字Mark点时,确定所述边缘轮廓上任意目标点,识别所述测量结果图上所述边缘轮廓上任意目标点所对应的标记位,计算所述边缘轮廓上任意目标点到对应的标记位的距离,得到切割精度值;When there are upper and lower two cross Mark points on the measurement result map, connect the upper and lower cross Mark points, calculate the distance from any point on the edge contour to the connection line, and obtain the cutting accuracy value ; When there is no cross Mark point on the measurement result map or when there is only one cross Mark point, determine any target point on the edge profile, and identify the corresponding mark position of any target point on the edge profile on the measurement result map , calculating the distance from any target point on the edge contour to the corresponding mark position to obtain the cutting accuracy value; 其中,所述切割精度检测结果包括所述切割精度值。Wherein, the cutting accuracy detection result includes the cutting accuracy value. 9.根据权利要求1或5所述的液晶面板的检测方法,其特征在于,根据所述角坐标点以及边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果,具体包括如下步骤:9. The detection method of the liquid crystal panel according to claim 1 or 5, wherein the chamfering accuracy of the liquid crystal panel to be tested is measured according to the corner coordinate point and the edge profile to obtain the detection result of the chamfering accuracy, specifically Including the following steps: 利用自适应阈值算法,获取所述测量结果图像的感兴趣区域中倒角特征标志位,确定倒角检测区域;Using an adaptive threshold algorithm to obtain the chamfering feature flag in the region of interest of the measurement result image, and determine the chamfering detection area; 对所述倒角检测区域进行分割提取,得到倒角区域图像;Segmenting and extracting the chamfering detection area to obtain an image of the chamfering area; 根据预设倒角面积特征值、预设倒角宽度特征值以及预设倒角高度特征值,筛选出所述倒角区域图像中的最终倒角图像;According to the preset chamfer area characteristic value, the preset chamfer width characteristic value and the preset chamfer height characteristic value, filter out the final chamfer image in the chamfer area image; 根据所述角坐标点以及所述边缘轮廓确定所述最终倒角的最小外接矩形;determining the minimum circumscribed rectangle of the final chamfer according to the corner coordinate points and the edge profile; 根据所述最终倒角的最小外接矩形,计算所述最终倒角的最终倒角宽度值以及最终倒角高度值;calculating a final chamfer width value and a final chamfer height value of the final chamfer according to the minimum circumscribed rectangle of the final chamfer; 其中,所述倒角精度检测结果包括所述最终倒角宽度值以及所述最终倒角高度值。Wherein, the chamfering accuracy detection result includes the final chamfering width value and the final chamfering height value. 10.一种液晶面板的检测系统,其特征在于,所述检测系统用于对液晶面板进行边缘检测或/和缺陷检测;其中,所述边缘检测系统包括,数据获取模块,用于获取待测液晶面板的测量结果图像;10. A detection system for a liquid crystal panel, characterized in that, the detection system is used for edge detection or/and defect detection of the liquid crystal panel; wherein, the edge detection system includes a data acquisition module for obtaining the The image of the measurement result of the LCD panel; 数据处理模块,用于提取所述测量结果图像的感兴趣区域,获取所述测量结果图像中的角坐标点和/或边缘轮廓;A data processing module, configured to extract the region of interest of the measurement result image, and obtain corner coordinate points and/or edge contours in the measurement result image; 精度检测模块,用于根据所述边缘轮廓测量所述待测液晶面板的研磨精度,得到研磨精度检测结果;和/或,用于根据所述边缘轮廓测量所述待测液晶面板的切割精度,得到切割精度检测结果;和/或,用于根据所述角坐标点以及所述边缘轮廓测量所述待测液晶面板的倒角精度,得到倒角精度检测结果;an accuracy detection module, configured to measure the grinding accuracy of the liquid crystal panel to be tested according to the edge profile, and obtain a grinding accuracy detection result; and/or, used to measure the cutting accuracy of the liquid crystal panel to be tested according to the edge profile, Obtain a cutting accuracy detection result; and/or, measure the chamfering accuracy of the liquid crystal panel to be tested according to the corner coordinate point and the edge profile, and obtain a chamfering accuracy detection result; 输出模块,用于输出所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果;An output module, configured to output the testing results of the grinding accuracy and/or the testing results of the cutting accuracy and/or the testing results of the chamfering accuracy; 存储模块,用于存储所述研磨精度检测结果和/或切割精度检测结果和/或倒角精度检测结果。The storage module is used for storing the grinding accuracy detection result and/or the cutting accuracy detection result and/or the chamfering accuracy detection result.
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