CN115395312B - Connector assembly, display panel, detection equipment and alignment test method - Google Patents
Connector assembly, display panel, detection equipment and alignment test method Download PDFInfo
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- CN115395312B CN115395312B CN202210999915.2A CN202210999915A CN115395312B CN 115395312 B CN115395312 B CN 115395312B CN 202210999915 A CN202210999915 A CN 202210999915A CN 115395312 B CN115395312 B CN 115395312B
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- 238000001514 detection method Methods 0.000 title claims abstract description 205
- 238000010998 test method Methods 0.000 title abstract description 12
- 238000012360 testing method Methods 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 17
- 238000007689 inspection Methods 0.000 claims description 3
- 238000002788 crimping Methods 0.000 abstract description 10
- 101000702132 Homo sapiens Protein spinster homolog 1 Proteins 0.000 description 2
- 101000629319 Homo sapiens Spindlin-1 Proteins 0.000 description 2
- 102100027005 Spindlin-1 Human genes 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 2
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/64—Means for preventing incorrect coupling
- H01R13/641—Means for preventing incorrect coupling by indicating incorrect coupling; by indicating correct or full engagement
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R27/00—Coupling parts adapted for co-operation with two or more dissimilar counterparts
- H01R27/02—Coupling parts adapted for co-operation with two or more dissimilar counterparts for simultaneous co-operation with two or more dissimilar counterparts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/26—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for engaging or disengaging the two parts of a coupling device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
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- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Abstract
The embodiment of the disclosure provides a connector assembly, a display panel, detection equipment and an alignment test method. The scheme of this connector assembly is: a plurality of detection pins and signal wires are respectively arranged in two connectors which are aligned, and if the signal wires are connected between the two detection pins on one connector, the signal wires are not connected between the two detection pins which are aligned on the other connector, so that when the first connector and the second connector are aligned correctly in a crimping way, each detection pin which is aligned in a crimping way forms a serial connection passage, and whether the passage is open or not is detected by inputting an alignment signal into the serial connection passage, so that whether the connector is aligned correctly or not is determined. According to the embodiment of the disclosure, the alignment detection between connectors can be realized, and the damage to products due to misconnection or virtual connection after power-on is avoided.
Description
Technical Field
The disclosure relates to the technical field of display, and in particular relates to a connector assembly, a display panel, detection equipment and an alignment test method.
Background
Before the display panel leaves the factory, a lighting test is generally performed on the display panel by a plurality of lighting inspection stations. Therefore, the stability of the lighting detection device is particularly important. In the process of testing the display panel by adopting the lighting detection equipment, even if a tester is properly trained, the testing process is normal, the phenomenon of IC burn or screen burn of the display panel can also exist, and the product is scrapped. The main reason is that, when the lighting detection device is in pressure contact with the display panel, the tester and the lighting detection device cannot accurately determine whether the pin pressure contact between the connector of the lighting detection device and the connector of the display panel is correct. If there is a pin loose joint or misalignment, the lighting device directly supplies a power-on signal to the display panel, and IC burn-in or burn-in of the display panel may occur.
Disclosure of Invention
Embodiments of the present disclosure provide a connector assembly, a display panel, a detection device, and a para-position testing method, so as to solve or alleviate one or more technical problems in the prior art.
As a first aspect of the disclosed embodiments, the disclosed embodiments provide a connector assembly comprising:
A first connector, comprising:
A plurality of first signal connection pins arranged in parallel side by side; and
The first alignment detection pins are arranged in parallel with the first signal connection pins, and part of the first alignment detection pins are connected with signal wires;
A second connector, comprising:
A plurality of second signal connection pins arranged in parallel and side by side, and aligned with the plurality of first signal connection pins; and
The second alignment detection pins are aligned with the first alignment detection pins, and part of the second alignment detection pins are connected with signal wires;
The first connector is connected with a signal wire, the two first alignment detection pins connected with the signal wire are aligned between the two second alignment detection pins in the second connector, and the two second alignment detection pins connected with the signal wire in the second connector are aligned between the two first alignment detection pins in the first connector;
And under the condition that the first connector is in pressure connection with the second connector and the alignment is correct, the first alignment detection pin and the second alignment detection pin of each pair of pressure connection are taken as a node, and each node forms a serial path through the connection of the signal wires.
In some possible implementations, at least one side of at least one first alignment detection pin in the first connector is provided with a first ground pin, and the first ground pin and the first alignment detection pin are arranged in parallel side by side;
The second connector is provided with a second ground pin aligned with the first ground pin.
In some possible implementations, the first alignment detection pin has a width that is less than a width of the first signal connection pin, and the second alignment detection pin has a width that is less than a width of the second signal connection pin.
In some possible implementations, the second alignment detection pin corresponding to the start node in the serial path is used as the alignment signal input end, and the second alignment detection pin corresponding to the end node in the serial path is used as the alignment signal detection end.
In some possible implementations, at least one first signal connection pin is spaced between two adjacent first alignment detection pins.
As a second aspect of the embodiments of the present disclosure, the embodiments of the present disclosure provide a display panel including a first connector in the connection assembly of any one of the embodiments of the present disclosure.
As a third aspect of embodiments of the present disclosure, embodiments of the present disclosure provide a detection apparatus comprising a second connector in any of the embodiments of the present disclosure connection assembly.
In some possible implementations, the detection device further includes:
the alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector;
The alignment signal input end is a second alignment detection pin corresponding to a start node in the serial path, and the alignment signal detection end is a second alignment detection pin corresponding to a stop node in the serial path.
In some possible implementations, the detection device further includes:
The test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector.
As a fourth aspect of the embodiments of the present disclosure, the embodiments of the present disclosure provide a para-position testing method, which is applied to the detection apparatus of any one embodiment of the present disclosure, where a second connector in the detection apparatus is connected to a first connector in the display panel provided by any one embodiment of the present disclosure, and the testing method includes:
Before inputting signals to second signal connection pins in the second connector, providing alignment signals to any one second alignment detection pin in the second connector, and detecting whether the alignment signals exist in other second alignment detection pins in the second connector;
And under the condition that the alignment signals are detected in the other second alignment detection pins, generating a first alignment detection result, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In some possible implementations, the alignment test method further includes:
And generating a second alignment detection result when the second alignment detection pin does not detect the alignment signal in the second alignment detection pins, wherein the second alignment detection result is used for indicating that the first connector and the second connector are incorrectly aligned.
In some possible implementations, the second alignment detection result includes an identification of a second alignment detection pin that did not detect the alignment signal.
As a fifth aspect of the embodiments of the present disclosure, the embodiments of the present disclosure provide a para-position testing method, which is applied to the detection apparatus of any one embodiment of the present disclosure, where a second connector in the detection apparatus is connected to a first connector in the display panel provided by any one embodiment of the present disclosure, and the testing method includes:
Before inputting signals to a second signal connection pin in the second connector, providing alignment signals to an alignment signal input end in the second connector, and detecting whether the alignment signals exist or not aiming at an alignment signal detection end in the second connector;
and under the condition that the alignment signal exists at the alignment signal detection end, generating a first alignment detection result, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In some possible implementations, the alignment test method further includes:
And generating a second alignment detection result when the alignment signal detection end cannot detect that the alignment signal exists, wherein the second alignment detection result is used for indicating the alignment error of the first connector and the second connector.
In some possible implementations, the alignment signal in the alignment test method is a dc signal.
According to the technical scheme provided by the embodiment of the disclosure, a plurality of alignment detection pins and signal wires are respectively arranged in two aligned connectors, the signal wires are connected between the two detection pins on one connector, no signal wires are connected between the two detection pins on the other connector, and when the first connector and the second connector are in crimping alignment correctly, the alignment detection pins in crimping alignment form a serial passage. Thus, by detecting whether the series path is open or not before power-up after crimping, it is determined whether the two connectors are properly aligned.
The foregoing summary is for the purpose of the specification only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features of the present disclosure will become apparent by reference to the drawings and the following detailed description.
Drawings
In the drawings, the same reference numerals refer to the same or similar parts or elements throughout the several views unless otherwise specified. The figures are not necessarily drawn to scale. It is appreciated that these drawings depict only some embodiments according to the disclosure and are not to be considered limiting of its scope.
FIG. 1A is a schematic illustration of a connector crimp of an embodiment of the present disclosure;
FIG. 1B is a schematic illustration of a connector crimp of another embodiment of the present disclosure;
FIG. 1C is a schematic illustration of a connector crimp of another embodiment of the present disclosure;
FIG. 2 is a flow chart of lighting test for a display panel according to an embodiment of the present disclosure;
FIG. 3 is a flow chart of a lighting test for a display panel according to another embodiment of the present disclosure;
FIG. 4 is a schematic view of a connector assembly of an embodiment of the present disclosure;
FIG. 5 is a schematic view of a connector of an embodiment of the present disclosure;
FIG. 6 is a schematic view of a connector of another embodiment of the present disclosure;
FIG. 7 is a schematic illustration of a connector assembly crimp of an embodiment of the present disclosure;
FIG. 8 is a schematic illustration of a connector assembly crimp of another embodiment of the present disclosure;
FIG. 9 is a flow chart of a method of alignment testing according to an embodiment of the disclosure;
fig. 10 is a flowchart of a method of alignment testing according to another embodiment of the present disclosure.
Detailed Description
Hereinafter, only certain exemplary embodiments are briefly described. As will be recognized by those of skill in the pertinent art, the described embodiments may be modified in various different ways without departing from the spirit or scope of the present disclosure. Accordingly, the drawings and description are to be regarded as illustrative in nature and not as restrictive.
Fig. 1A, 1B, and 1C are schematic diagrams of connector crimping of an embodiment of the present disclosure. As shown in fig. 1A, the left image is a connector of the lighting test device, and the middle image is a connector of the display panel. When the connector of the lighting test device is crimped with the connector of the display panel, an image observable from the appearance after the crimping thereof is the right image in fig. 1A. From this, when a tester connects two connectors of the display panel and the lighting test device, it is subjectively impossible to determine whether the connectors of the display panel and the lighting test device are normally aligned and connected. If there are dummy or misconnected pins on the two connectors, the lighting test device directly powers on the display panel, and thus the IC of the display panel may be damaged.
Fig. 2 is a flowchart of a lighting test for a display panel according to an embodiment of the present disclosure. As shown in fig. 2, in order to solve the above-described problem, a conventional solution is to perform clamping control of avdd_en (power off) and clamping control of a power-on current on a display panel after crimping a connector. But both of these clamping processes make decisions in the event that the IC is already powered up. At this time, the virtual connection or the misconnection may already cause the abnormality of the large current, and the clamping control can only reduce the influence of the abnormality. Powering up in such an abnormal state may also cause damage to the poorly protected IC, eventually leading to burn-in and burn-out.
Fig. 3 is a flowchart of lighting test for a display panel according to another embodiment of the present disclosure. As shown in fig. 3, in this embodiment, after the display panel is crimped with the two connectors of the lighting detection device, and before the lighting detection device is powered on, the connectors are subjected to the alignment test. If the two connectors are determined to be correctly aligned, the lighting detection device may normally power up the display panel. If the two connectors are determined to be incorrectly aligned, the two connectors are reconnected until the alignment is correct. After the subsequent power-on, the clamping control (power-off) of the AVDD_EN and the clamping control of the power-on current can be still performed, so that the burn and screen burning of the display panel can be avoided, and the yield of products is improved.
Fig. 4 is a schematic view of a connector assembly of an embodiment of the present disclosure.
As shown in fig. 4, the presently disclosed embodiments provide a connector assembly that includes a first connector 410 and a second connector 420. Both connectors in fig. 4 are provided with alignment detection pins arranged in alignment and signal lines connecting part of the alignment detection pins. As shown in fig. 5, the connector is a connector provided with no alignment detection pins. As shown in fig. 6, the connector is provided with alignment detection pins and signal lines connecting the partial alignment detection pins. Ground pins may also be provided on one or both sides of the alignment sense pins of the connector in some embodiments. The pins of the connector of the above example are two columns, which is only an example, and does not mean that all connectors are arranged in two columns of pins. In the case of a connector with fewer pins, it may be a row of pins arranged side-by-side in parallel. In the case of more pins of the connector, two or three columns of pins may be arranged in parallel, and each column of pins includes a plurality of pins arranged in parallel side by side.
The connector assembly provided by the embodiments of the present disclosure will be described below with reference to fig. 4. The connector assembly includes a first connector 410 and a second connector 420.
The first connector 410 includes: a plurality of first signal connection pins and a plurality of first alignment detection pins that are arranged side by side in parallel. Which may be arranged in one or two or three columns, etc. Each column of pins comprises a plurality of first signal connection pins and a plurality of first alignment detection pins. Taking fig. 4 as an example, it includes two columns of pins. In each column of pins, a plurality of first alignment detection pins are arranged in parallel with the first signal connection pins in the column. In the first connector 410, only a part of the first alignment detection pins are connected with signal lines, and the other part of the second alignment detection pins are not connected with signal lines. For example, a signal is connected between the first alignment detection pins TPIN and TPIN 2 in fig. 4, and no signal line is connected between TPIN and TPIN 3.
Pins of the second connector 420 are aligned with pins of the first connector 410. The second connector 420 includes a plurality of second signal connection pins and a plurality of second alignment detection pins arranged in parallel side by side. Wherein each second signal connection pin is aligned with a corresponding first signal connection pin in the first connector 410, respectively; each of the second alignment detection pins is aligned with a corresponding one of the first alignment detection pins in the first connector 410. And a signal line is connected between a part of the second alignment detection pins, and a signal line is not connected between the other part of the second alignment detection pins. For example, no signal is connected between the second alignment detection pins TPIN-1 and TPIN-1 in FIG. 4, and a signal line is connected between TPIN-1 and TPIN 3-1. Wherein the first alignment detection pin TPIN and the second alignment detection pin TPIN-1 are aligned. The first alignment detection pin TPIN and the second alignment detection pin TPIN-1 are aligned. The first alignment detection pin TPIN and the second alignment detection pin TPIN-1 are aligned. The alignment detection pins of other alignments are also aligned in this way, and so on.
The two first alignment detection pins of the first connector 410, to which the signal lines are connected, are located between the two second alignment detection pins of the second connector 420, to which the signal lines are connected, and the signal lines are not connected between the two first alignment detection pins of the first connector 410, to which the signal lines are connected, in the second connector 420. For example, in FIG. 4, signals are connected between the first alignment detection pins TPIN and TPIN, while no signals are connected between the second alignment detection pins TPIN-1 and TPIN-1. A signal line is connected between the second pair of sense pins TPIN-1 and TPIN-1, while no signal line is connected between the first pair of sense pins TPIN 2 and TPIN 4.
The connections between the alignment detection pins and the signal lines described above in fig. 4 are only examples, and more or fewer alignment detection pins may be provided. The routing rules in fig. 4 are included within the scope of the embodiments of the present disclosure as long as they meet the requirements of the examples of the present disclosure.
As shown in fig. 7 and 8, when the first connector 410 and the second connector 420 are crimped and aligned correctly, the first alignment detection pin and the second alignment detection pin of each pair of crimping serve as one node, and each node forms a series path through connection of signal lines.
In this example, since the alignment detection pins are arranged in the above manner, when the first connector 410 is crimped with the second connector 420 and the alignment is correct, the first alignment detection pin and the second alignment detection pin of each pair of crimping are used as one node, each node forms a serial path through connection of the signal lines, and an alignment signal is input to the start point of the serial path, so that the alignment signal can be received from each node, thereby proving that the alignment of the two connectors is correct. If a bit signal is input to the start point or other nodes in the serial path, but there is a pin that the node cannot receive, it proves that there is a virtual or misconnection, and the two connectors need to be reconnected.
In the above example, the first signal connection pins in the first connector 410 are arranged in one-to-one alignment with the second signal connection pins in the second connector 420. As shown in fig. 5, the signal connection pins include various signal pins, such as ELVDD signal, MIPI signal, etc. Illustratively, the pin SPIN1 of the first connector 410 is aligned with the pin SPIN1-1 of the second connector 420 in fig. 4, and when the two connectors are connected and aligned correctly, the pin SPIN1 is attached and connected to the pin SPIN 1-1.
Illustratively, the routing of signal lines between the various alignment detection pins in the first connector 410 may be interchanged with the routing of signal lines between the various alignment detection pins in the second connector 420.
Illustratively, as shown in fig. 4, the wiring pattern in the first connector 410 may be:
A signal line is connected between pin TPIN and pin TPIN 2, a signal line is connected between pin TPIN 3 and pin TPIN4, a signal line is connected between pin TPIN and pin TPIN 6, and no signal line is connected between the other two-by-two combined pins of the 6 pins.
The wiring pattern of the second connector 420 may be:
Signal lines are connected between pin TPIN-1 and pin TPIN-1, signal lines are connected between pin TPIN-1 and pin TPIN-1, and no signal lines are connected between the other two-by-two combined pins of the 6 alignment-detecting pins in the second connector 420.
In some possible implementations, at least one side of at least one first alignment detection pin in the first connector 410 is provided with a first ground pin, which is arranged parallel side by side with the first alignment detection pin. The second connector 420 is provided with a second ground pin aligned with the first ground pin.
Illustratively, as shown in FIG. 4, one side of pins TPIN, TPIN 2, and TPIN 3 are each provided with a ground pin, and both sides of pin TPIN are each provided with a ground pin. Since each pin in the first connector 410 is aligned with a corresponding pin in the second connector 420, the pins in the second connector 420 to which the pins of the above example are aligned are also provided with ground pins as well. For example, pins TPIN-1, TPIN 2-1, and TPIN 3-1 are provided with ground pins on one side and pins TPIN-1 are provided with ground pins on both sides.
In this example, by providing ground pins on one or both sides of the alignment detection pins, when the alignment detection pins are misaligned, the alignment detection pins will be connected to the next ground pins, and a short circuit will occur. When an alignment signal is input to one of the alignment detection pins, but the other alignment detection pins cannot detect the signal, the short circuit is indicated to occur, namely, the situation of misconnection is indicated. Thereby improving the detection efficiency of the misconnection pins.
In some possible implementations, the width of the first alignment detection pin is smaller than the width of the first signal connection pin, and the width of the second alignment detection pin is smaller than the width of the second signal connection pin.
In this example, since the width of the alignment detection pin is smaller than the width of the signal connection pin, the detection efficiency of the alignment test can be improved.
In some possible implementations, the second alignment detection pin corresponding to the start node in the serial path is used as the alignment signal input terminal, and the second alignment detection pin corresponding to the end node in the serial path is used as the alignment signal detection terminal.
Illustratively, as shown in fig. 4, assuming that the second connector 420 is a connector of the detecting device, in the second connector 420, the alignment signal input terminal is a pin TPIN-1, and the alignment signal detecting terminal is a pin TPIN-1. Assuming that the first connector 410 is a connector of the detecting device, in the first connector 410, the alignment signal input terminal is a pin TPIN, and the alignment signal detecting terminal is a pin TPIN.
In some possible implementations, at least one first signal connection pin is spaced between two adjacent first pair of detection pins. One or more signal connection pins can be spaced between two alignment detection pins adjacent side by side.
In the above example, the first connector 410 is a connector of the display panel, and the second connector 420 is a connector of the detection device. The two connectors may be interchanged, for example, the first connector 410 being a connector of the detection device and the second connector 420 being a connector of the display panel.
The embodiment will be described below with the second connector 420 as a connector of the detection device by way of example only:
Embodiments of the present disclosure provide a display panel including a first connector 410 in a connection assembly of any embodiment of the present disclosure.
Embodiments of the present disclosure provide a detection apparatus including a second connector 420 in any of the embodiments of the present disclosure connection assembly.
In some possible implementations, the detection device further includes:
The alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector. The alignment signal input end is a second alignment detection pin corresponding to a starting point node in the serial path, and the alignment signal detection end is a second alignment detection pin corresponding to a termination node in the serial path.
In this example, two connectors are docked to effect connection of the detection device to the display panel. Before power-up, a counterpoint signal is input to the starting point node, and whether the counterpoint signal is received at the ending point node is detected to detect whether the connection of the two connectors is counterpoint correct. If the termination node detects the alignment signal, it is determined that the connection of the two connectors is aligned correctly. If the termination node does not detect the pair of signals, it is determined that the connection of the two connectors is a pair of errors. The alignment errors include pin misconnection and pin misconnection.
In some possible implementations, the detection device further includes:
The test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector 420.
In this example, after determining that the connection of the two connectors is proper, the test circuit may input a power-on signal to the display panel to detect the respective functions of the display panel.
Fig. 9 is a flowchart of a method for detecting alignment according to an embodiment of the disclosure.
As shown in fig. 9, an embodiment of the present disclosure provides a method for testing alignment, which is applied to a detection device of any embodiment of the present disclosure, where a second connector in the detection device is connected to a first connector in a display panel provided by any embodiment of the present disclosure, and the method includes:
S910, before inputting signals to the second signal connection pins in the second connector, providing alignment signals to any one of the second alignment detection pins in the second connector, and detecting whether the alignment signals exist in other second alignment detection pins in the second connector;
And S920, under the condition that the alignment signals are detected in other second alignment detection pins, generating a first alignment detection result, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In this example, since each of the second alignment detection pins in the second connector constitutes one serial circuit after the first connector is connected with the second connector, if an alignment signal is input to a certain node in the serial circuit, if the serial circuit is open, the other nodes in the serial circuit can detect the alignment signal, and if the serial circuit is short-circuited or open, the other nodes in the serial circuit cannot detect the alignment signal. Therefore, under the condition that other nodes in the series circuit can detect the alignment signals, the series circuit is determined to be open-circuited, the pins are aligned correctly, and a first alignment detection result is generated to indicate that the alignment is correct, so that whether power-on test is performed or not is conveniently determined subsequently.
In some possible implementations, the alignment test method further includes:
And generating a second alignment detection result when the second alignment detection pins detect no alignment signal in the second alignment detection pins, wherein the second alignment detection result is used for indicating that the first connector and the second connector are incorrectly aligned.
In this example, when the other nodes in the series circuit can detect the alignment signal, it is determined that the series circuit is open (there is a pin virtual connection) or short (there is a pin misalignment), and a second alignment detection result is generated to indicate an alignment error, so as to facilitate a subsequent decision on whether to power up the test.
In some possible implementations, the second alignment detection result includes an identification of a second alignment detection pin that did not detect the alignment signal.
In this example, the detection result indicates the identifications of the second alignment detection pins of the undetected alignment signals, so that a tester can conveniently determine which part of pins have an alignment error, and the efficiency of subsequent alignment is improved.
Fig. 10 is a flowchart of a method for detecting alignment according to an embodiment of the disclosure.
As shown in fig. 10, an embodiment of the present disclosure provides an alignment testing method, which is applied to the detection device of any one embodiment of the present disclosure, where the second connector in the detection device is provided with the above-mentioned alignment signal input end and the alignment signal detection end. The second connector in the detection device is connected with the first connector in the display panel provided by any embodiment of the present disclosure. The test method comprises the following steps:
S110, before inputting signals to a second signal connection pin in the second connector, providing alignment signals to an alignment signal input end in the second connector, and detecting whether the alignment signals exist or not aiming at an alignment signal detection end in the second connector;
s120, under the condition that the alignment signal detection end detects that an alignment signal exists, a first alignment detection result is generated, and the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In this example, only the start point of the series circuit is input with the alignment signal, and whether the alignment signal is received is detected at the end point of the series circuit, so that whether the two connectors are aligned correctly can be quickly determined, and the efficiency of alignment detection is improved.
In some possible implementations, the alignment test method further includes:
And under the condition that the alignment signal is not detected to exist at the alignment signal detection end, generating a second alignment detection result, wherein the second alignment detection result is used for indicating the alignment error of the first connector and the second connector.
In some possible implementations, the alignment signal in the alignment test method is a dc signal.
In some possible implementations, the alignment signal in the alignment test method is an ac signal.
The form of the alignment signal is merely an example, and other types of signals, such as pulse signals, may be used as the alignment signal.
The embodiment of the disclosure also provides electronic equipment, which comprises the display panel of any one of the embodiments of the disclosure. The electronic equipment can be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital camera, a navigator and the like.
In this disclosure, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present disclosure, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the present disclosure, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; the device can be mechanically connected, electrically connected and communicated; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the terms in this disclosure will be understood by those of ordinary skill in the art as the case may be.
In this disclosure, unless expressly stated or limited otherwise, a first feature being "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other by way of additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is less level than the second feature.
The above disclosure provides many different embodiments or examples for implementing different structures of the disclosure. The components and arrangements of specific examples are described above in order to simplify the present disclosure. Of course, they are merely examples and are not intended to limit the present disclosure. Furthermore, the present disclosure may repeat reference numerals and/or letters in the various examples, which are for the purpose of brevity and clarity, and which do not themselves indicate the relationship between the various embodiments and/or arrangements discussed.
The above is merely a specific embodiment of the disclosure, but the protection scope of the disclosure is not limited thereto, and any person skilled in the art can easily think of various changes or substitutions within the technical scope of the disclosure, which should be covered in the protection scope of the disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.
Claims (15)
1. A connector assembly, comprising:
A first connector, comprising:
A plurality of first signal connection pins arranged in parallel side by side; and
The first alignment detection pins are arranged in parallel with the first signal connection pins, and part of the first alignment detection pins are connected with signal wires;
A second connector, comprising:
A plurality of second signal connection pins arranged in parallel and side by side, and aligned with the plurality of first signal connection pins; and
The second alignment detection pins are aligned with the first alignment detection pins, and part of the second alignment detection pins are connected with signal wires;
The first connector is connected with a signal wire, the two first alignment detection pins connected with the signal wire are aligned between the two second alignment detection pins in the second connector, and the two second alignment detection pins connected with the signal wire in the second connector are aligned between the two first alignment detection pins in the first connector;
And under the condition that the first connector is in pressure connection with the second connector and the alignment is correct, the first alignment detection pin and the second alignment detection pin of each pair of pressure connection are taken as a node, and each node forms a serial path through the connection of the signal wires.
2. The connector assembly of claim 1, wherein at least one side of at least one first alignment sensing pin in the first connector is provided with a first ground pin, the first ground pin being arranged side-by-side parallel to the first alignment sensing pin;
The second connector is provided with a second ground pin aligned with the first ground pin.
3. The connector assembly of claim 1, wherein the first alignment detection pin has a width that is less than a width of the first signal connection pin and the second alignment detection pin has a width that is less than a width of the second signal connection pin.
4. A connector assembly according to any one of claims 1 to 3, wherein a second alignment detection pin corresponding to a start node in the serial path is used as an alignment signal input terminal, and a second alignment detection pin corresponding to a stop node in the serial path is used as an alignment signal detection terminal.
5. The connector assembly of any one of claims 1 to 4, wherein at least one of the first signal connection pins is spaced between two adjacent first alignment detection pins.
6. A display panel comprising a first connector in the connection assembly of any one of claims 1 to 5.
7. A test device comprising a second connector in the connection assembly of any one of claims 1 to 5.
8. The apparatus as recited in claim 7, further comprising:
the alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector;
The alignment signal input end is a second alignment detection pin corresponding to a start node in the serial path, and the alignment signal detection end is a second alignment detection pin corresponding to a stop node in the serial path.
9. The apparatus according to claim 7 or 8, further comprising:
The test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector.
10. A method of alignment testing applied to the inspection apparatus of any one of claims 7 to 9, the second connector in the inspection apparatus being connected to the first connector in the display panel of claim 6, the method comprising:
Before inputting signals to second signal connection pins in the second connector, providing alignment signals to any one second alignment detection pin in the second connector, and detecting whether the alignment signals exist in other second alignment detection pins in the second connector;
And under the condition that the alignment signals are detected in the other second alignment detection pins, generating a first alignment detection result, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
11. The method as recited in claim 10, further comprising:
And generating a second alignment detection result when the alignment signal cannot be detected in the second alignment detection pins in the other second alignment detection pins, wherein the second alignment detection result is used for indicating the first connector and the second connector to be in an alignment error.
12. The method of claim 11, wherein the second alignment detection result includes an identification of a second alignment detection pin that did not detect the alignment signal.
13. A method for alignment testing, applied to the test apparatus of claim 8, wherein the second connector of the test apparatus is connected to the first connector of the display panel of claim 6, the method comprising:
Before inputting signals to a second signal connection pin in the second connector, providing alignment signals to an alignment signal input end in the second connector, and detecting whether the alignment signals exist or not aiming at an alignment signal detection end in the second connector;
and under the condition that the alignment signal exists at the alignment signal detection end, generating a first alignment detection result, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
14. The method as recited in claim 13, further comprising:
And generating a second alignment detection result when the alignment signal detection end cannot detect that the alignment signal exists, wherein the second alignment detection result is used for indicating the alignment error of the first connector and the second connector.
15. The method according to any one of claims 10 to 14, wherein the alignment signal is a direct current signal.
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