CN115272348B - Encoding detection method based on grid line defects of photovoltaic cell - Google Patents
Encoding detection method based on grid line defects of photovoltaic cell Download PDFInfo
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Abstract
The invention relates to the technical field of image processing, in particular to a coding detection method based on grid line defects of a photovoltaic cell, which comprises the following steps: the method comprises the steps of obtaining a binary image of surface images of a plurality of photovoltaic cell panels, coding the binary image to obtain a coding number sequence, obtaining a coefficient matrix according to the coding number sequence, determining sub-grid line element rows and background element rows in the binary image according to the coefficient matrix, obtaining standard line numbers of two background pixel rows of the sub-grid line element rows in the binary image, calculating a difference value between the standard line numbers and the line numbers of the pixel rows corresponding to continuous adjacent background elements according to the standard line numbers, determining the types of defects according to the line numbers of the sub-grid line element rows of the continuous adjacent background element rows corresponding to the difference value and a preset standard line number of the sub-grid line element rows, and accurately adjusting production processes or equipment according to the types, accurate positions and defect reasons of each grid line defect.
Description
Technical Field
The invention relates to the technical field of image processing, in particular to a coding detection method based on grid line defects of a photovoltaic cell.
Background
At present, the photovoltaic cell industry in China has huge potential in the market in China, however, in the production process of the photovoltaic cell, various defects such as: broken grid, thick grid, thin grid, thick section and other grid line quality defects.
Because the grid line is the bus bar of the photovoltaic cell and is mainly used for a first-stage conducting wire for bearing the current of the photovoltaic cell, the grid line collects the current on the bus bar belt, then is connected with the junction box, and finally is led out by a cable of the junction box for power supply, the quality defect of the grid line can cause a series of problems such as power loss of the photovoltaic cell, and the defect detection of the grid line is very important.
The current detection methods of grid line defects are mainly two types: manual inspection and machine vision inspection, the following problems mainly exist in manual inspection: the efficiency is not high, the accuracy is not enough due to subjective factors, and the labor cost is high; for machine vision inspection, a template matching method is basically used for determining defects, but the accurate types of the defects are not determined, so that the reasons for generating the defects cannot be determined, production equipment or processes cannot be accurately adjusted, and the efficiency and quality of subsequent production are influenced.
Therefore, it is desirable to provide a method for detecting a grid line defect based on a photovoltaic cell, so as to solve the above problems.
Disclosure of Invention
The invention provides a coding detection method based on grid line defects of a photovoltaic cell, and aims to solve the existing problems.
The invention relates to a coding detection method based on grid line defects of a photovoltaic cell, which adopts the following technical scheme: the method comprises the following steps:
acquiring binary images of surface images of a plurality of photovoltaic cell panels;
run-length coding is carried out on pixels of each row of the binary image according to gray values of pixels in the binary image to obtain a multi-row coding number sequence, a coefficient matrix is obtained according to coding coefficients of pixels of each row in the binary image and the maximum value of the number of the coding coefficients in all the row coding number sequences, and elements of vacant positions in the coefficient matrix are marked as 0;
determining sub-grid line element rows and background element rows in the binary image according to the number of non-0 elements in the element rows in the coefficient matrix and the number of the main grid lines;
acquiring the actual line number of each continuous and adjacent background element line, calculating the standard line number of background pixels between two adjacent sub-grid lines according to the actual line number of the continuous and adjacent background element lines and the total number of the continuous and adjacent background element lines, and calculating the difference value between the standard line number and each actual line number;
and determining the accurate position of each grid line defect on the binary image according to the coding number sequence corresponding to the element row, the sub-grid line element row and the background element row of each grid line defect, and accurately adjusting the production process or equipment according to the type of each grid line defect, the accurate position corresponding to the grid line defect and the defect reason.
Preferably, a locator for locating the pixel row is set after the run-length coding of each row of pixels, and the locator does not participate in the coding.
Preferably, whether the codes of the binary image are qualified or not is determined according to the number of the pixel points in the binary image and the number of the coding coefficients in all the row code number sequences, unqualified codes are fed back for recoding until the codes are qualified, and then the coefficient matrix of the binary image corresponding to the qualified codes is obtained.
Preferably, the coding coefficient of each row of pixels in the binary image is taken as each row element in the matrix, the maximum value of the number of coding coefficients in all row coding number sequences in the binary image is taken as the number of each row element in the coefficient matrix, and the element of the vacant position in the matrix is taken as 0 to establish the coefficient matrix.
Preferably, the step of determining the sub-gate line element row and the background element row in the binary image according to the number of the non-0 elements in the element row in the coefficient matrix and the number of the main gate lines includes:
when the number of non-0 elements in the element row in the coefficient matrix is equal to 1, the element row is a sub-grid line element row where the sub-grid line is located;
and if the number of the main grid lines is q, and when the number of elements, which are not 0, in the element row in the coefficient matrix is equal to 2q-1, the element row is taken as a background element row in which the background is positioned.
Preferably, the step of determining the type of the gate line defect according to the row number of the adjacent row of the continuous adjacent background element row and the preset standard row number of the sub-gate line element row corresponding to the difference includes:
the types of the grid line defects comprise coarse grid defects, coarse node defects, fine grid defects and broken grid defects;
when the difference value is less than 0, and the row number of the adjacent row of the adjacent background element row is larger than the preset standard row number of the sub-grid line element row, the defect on the sub-grid line is a coarse grid defect;
when the difference value is less than 0, and the row number of the adjacent row of the adjacent background element row is less than the preset standard row number of the sub-grid line element row, and the adjacent row is not the background element row, the defect on the sub-grid line is a coarse defect;
when the difference is equal to 0 continuously and the row number of the adjacent row of the adjacent background element row is larger than 0, the defect on the sub-grid line is a fine grid defect;
and when the difference value is equal to 0, the row number of the adjacent row of the adjacent background element row is equal to 0, and the adjacent row is not the background element row, the defect on the sub-grid line is a broken grid defect.
Preferably, the step of determining the accurate position of each gate line defect on the binary image according to the code sequence corresponding to the element row of each gate line defect, the sub-gate line element row and the background element row includes:
determining the accurate positions of the fine grid defect and the broken grid defect in the sub grid line pixel row in the binary image according to the difference of the coding number sequence corresponding to the sub grid line element row and the element row of the fine grid defect and the element row of the broken grid defect;
and determining the accurate positions of the coarse grid defect, the fine grid defect and the broken grid defect in the background pixel row of the binary image according to the difference between the code number sequence corresponding to the element row of the coarse grid defect and the code number sequence corresponding to the background element row.
Preferably, the step of accurately adjusting the production process or equipment according to the type of each grid line defect, the corresponding accurate position and the defect reason thereof comprises the following steps:
the defects of fine grid defects and broken grid defects are caused by insufficient screen printing plate slurry or poor contact between the screen printing plate and a battery plate in the printing process, and silver paste needs to be added or the position of the screen printing plate needs to be adjusted;
the reason for the generation of the coarse grid defect and the coarse knot defect is that the screen printing plate needs to be cleaned in combination with the accurate position of the coarse knot defect because the last slurry on the screen printing plate in the printing process is not cleaned.
The invention has the beneficial effects that: according to the coding detection method based on the grid line defects of the photovoltaic cells, the types of the grid line defects are analyzed, then the binary images of the photovoltaic cells are coded through a coding technology, the types and the accurate positions of the defects in the binary images of each photovoltaic cell are determined by using the characteristics and the codes of the types of the grid line defects, and therefore the reasons of the defects are determined according to the types and the accurate positions of the defects, reference is provided for accurately and quickly adjusting production equipment or processes, and production efficiency and production quality are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a flowchart illustrating the general steps of an embodiment of a method for detecting a grid line defect of a photovoltaic cell according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
An embodiment of the invention relates to a method for detecting a grid line defect of a photovoltaic cell, which comprises the following steps:
the method includes the steps that S1, binary images of surface images of a plurality of photovoltaic cells are obtained, specifically, a camera is arranged on a production conveying belt of a photovoltaic cell panel, the camera head faces the conveying belt, when the photovoltaic cell panel on the conveying belt passes through the position right below the camera, the camera shoots the photovoltaic cell panel to be detected, the obtained surface images of the photovoltaic cells possibly cause data errors of the collected surface images of the photovoltaic cells in subsequent processing due to the influence of uncertainty of a factory lighting environment, misjudgment is caused, white balance processing is conducted on the collected surface images of the photovoltaic cells, binarization is conducted on the surface images subjected to the white balance processing to obtain the binary images, and the size of the binary images is set to be the size of the binary images
M represents the number of pixel points of the long edge of the binary image,
and the number of the pixel points of the short edge of the binary image is represented.
S2, carrying out run-length coding on each row of pixels of the binary image according to the gray value of the pixel point in the binary image to obtain a multi-row coding sequence, obtaining a coefficient matrix according to the coding coefficient of each row of pixels in the binary image and the maximum value of the number of the coding coefficients in all the row coding sequences, and marking the element of the vacant position in the coefficient matrix as 0.
Specifically, in this embodiment, when performing run-length coding on each line of pixels of a binary image according to a gray value of a pixel point in the binary image to obtain a multi-line coding sequence, a locator for locating a pixel line is set after the run-length coding is performed on each line of pixels, and the locator does not participate in coding, specifically, coding is performed according to the following formula (1):
wherein,
a symbol representing a code sequence;
for representing gray values
The number of the pixel points of (a),
for representing gray values
The pixel points of (2);
expressing the gray value of a pixel point in the binary image;
representing the gray value of continuous and adjacent pixel points in the binary image asNumber of 0, i.e. grey scale value
The first coding coefficient of (1);
representing the number of continuous and adjacent pixel points in the binary image with the gray value of 255, namely the gray value
The second coding coefficient of (1).
For example, when a row in a binary image has m =42 gray values, the gray values are:
Specifically, when the gray value of the gate line is 255 and the gray value of the background is 0, and when the number of the main gate lines is 1, one row in the binary image has m =42 gray values and 42 rows of pixels, and if the binary image has no defect, the code number sequence formed by the sub-gate line pixels of each row of the binary image is 42B0; the code number of each row of background pixels is column
。
Specifically, for
Size of binary imageCoding, namely coding gray value in a coding sequence of each line of pixels in the binary image
Second coding coefficient of
Its coded grey value
First coding coefficient of
Extracting to obtain the first coding coefficient in the coding sequence of each row of pixels
The second coding coefficient
Taking the maximum number of the coding coefficients in all the row coding number sequences in the binary image as the elements in the matrix and recording the maximum number as
，
Maximizing the number of coding coefficients
And as the number of each row element in the coefficient matrix, marking the element of the vacant position in other row elements in the matrix as 0 to establish the coefficient matrix.
Specifically, in this embodiment, whether the coding of the binary image is qualified is determined according to the number of the pixel points in the binary image and the number of the coding coefficients in all the row coding number sequences, the unqualified coding is fed back and re-coded until the coding is qualified, and then the coefficient matrix of the binary image corresponding to the qualified coding is obtained.
And S3, determining a sub-grid line element row and a background element row in the binary image according to the number of non-0 elements in the element row in the coefficient matrix and the number of the main grid lines.
Specifically, when the number of the main grid lines is set to be q according to the distribution condition of the grid lines of the photovoltaic cell panel, and when the number of elements, which are not 0, in an element row in the coefficient matrix is equal to 1, the element row is a sub-grid line element row in which the sub-grid line is located; when the number of non-0 elements in the element row in the coefficient matrix is equal to 2q-1, the element row is a background element row where the background is located, that is, if the binary image has no defects in the step S2, the code sequence formed by the sub-grid line pixels of each row of the binary image is 42B0; the code number of each row of background pixels is column
The number of non-0 elements in the element row in the coefficient matrix corresponding to the background pixel row is greater than 1, and the number of non-0 elements in the element row in the coefficient matrix corresponding to the sub-gate line pixel row is equal to 1, so that the corresponding sub-gate line element row and the background element row in the coefficient matrix are found out first.
S4, because the distance between the sub-grid lines of the normal photovoltaic cell panel is a fixed value, namely, the area between the sub-grid lines is a background area, and the coefficient values and the coefficient numbers in the background element rows in the coefficient matrix corresponding to the pixel rows of the background area are the same, the actual row number of each continuous and adjacent background element row is obtained first, the standard row number of the background pixels between two adjacent sub-grid lines is calculated according to the actual row number of the continuous and adjacent background element rows and the total number of the continuous and adjacent background element rows, and the difference value between the standard row number and each actual row number is obtained.
Specifically, the standard row number of the background pixels between two adjacent sub-gate lines is calculated according to the following formula (1):
wherein,
is the first in the coefficient matrix
Actual number of rows of consecutive and adjacent background element rows;
representing the total number of consecutive and adjacent background element rows in the coefficient matrix,
the standard line number represents the background pixel between two adjacent sub-grid lines in the binary image; standard number of lines of background pixels
The difference from the actual number of rows for each successive and adjacent background element row is recorded as
。
And S5, determining the type of the grid line defect according to the line number of the continuous adjacent lines of the adjacent background element lines corresponding to the difference value and the standard line number of the preset sub-grid line element lines.
Specifically, the types of the gate line defects include a coarse gate defect, a coarse pitch defect, a fine gate defect and a broken gate defect; when the difference is
When the number of rows of the adjacent row of the adjacent background element rows is less than 0 and is larger than the preset standard number of rows of the sub-grid line element rows, the defect on the sub-grid line is a coarse grid defect; when difference value
When the number of the continuous lines less than 0 and the number of the lines of the adjacent background element lines is less than the preset standard number of the lines of the sub-grid line elements, and the adjacent lines are not background element lines, the defect on the sub-grid line is a coarse defect, specifically, when the difference value is less than
When the row number of the continuous row of the background element row is equal to 0 and the row number of the adjacent row of the adjacent background element row is greater than 0, the defect on the sub-grid line is a fine grid defect; when difference value
And when the row number of the continuous row which is equal to 0 and the row number of the sub-grid line element row which is adjacent to the background element row are equal to 0 and the adjacent row is not the background element row, the defect on the sub-grid line is a broken grid defect.
S6, determining the accurate position of each grid line defect on the binary image according to the coding sequence corresponding to the element row, the sub-grid line element row and the background element row of each grid line defect, and accurately adjusting the production process or equipment according to the type of each grid line defect, the accurate position corresponding to the grid line defect and the defect reason.
Specifically, because the fine grid defect and the broken grid defect are generated on the sub-grid line, the specific positions of the fine grid defect and the broken grid defect on the sub-grid line in the binary image can be determined according to the difference between the element line of the sub-grid line and the element line of the fine grid defect and the coding sequence corresponding to the element line of the broken grid defect; because the coarse grid defect and the coarse grid defect are the parts which are excessive on the sub grid lines and mainly occupy the background pixel row, the accurate positions of the coarse grid defect, the fine grid defect and the broken grid defect on the background pixel row of the binary image can be determined according to the difference between the code number sequence corresponding to the element row of the coarse grid defect and the code number sequence corresponding to the background element row.
Secondly, in this embodiment, the binary image of each photovoltaic cell panel may also be numbered, then the number of each row of the coded sequence in the binary image is marked in the order from top to bottom, the number of the binary image where the coarse grid defect, the coarse knot defect, the fine grid defect, and the broken grid defect are located, and the number of the pixel row in the number are obtained, and the number of the binary image where each defect is located, the number of the pixel row, and the accurate position thereof are stored, so that the photovoltaic cell with the grid line defect can be conveniently searched in the subsequent process.
Specifically, the defect of the fine grid defect and the broken grid defect is caused by insufficient slurry of the screen printing plate or poor contact between the screen printing plate and the battery panel in the printing process, and silver paste needs to be added or the position of the screen printing plate needs to be adjusted; the reason for the generation of the coarse grid defect and the coarse knot defect is that the screen printing plate needs to be cleaned in combination with the accurate position of the coarse knot defect because the last slurry on the screen printing plate in the printing process is not cleaned.
In summary, the invention provides a coding detection method based on grid line defects of photovoltaic cells, which analyzes the types of the grid line defects, codes binary images of the photovoltaic cells by a coding technology, and determines the types and accurate positions of the defects in the binary images of each photovoltaic cell by using the characteristics and codes of the types of the grid line defects, so as to determine the causes of the defects according to the types and accurate positions of the defects, thereby providing references for accurately and quickly adjusting production equipment or processes, and further improving the production efficiency and the production quality.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (8)
1. A coding detection method based on grid line defects of a photovoltaic cell is characterized by comprising the following steps:
acquiring binary images of surface images of a plurality of photovoltaic cell panels;
run-length coding is carried out on pixels of each row of the binary image according to gray values of pixels in the binary image to obtain a multi-row coding number sequence, a coefficient matrix is obtained according to coding coefficients of pixels of each row in the binary image and the maximum value of the number of the coding coefficients in all the row coding number sequences, and elements of vacant positions in the coefficient matrix are marked as 0;
determining sub-grid line element rows and background element rows in the binary image according to the number of non-0 elements in the element rows in the coefficient matrix and the number of the main grid lines;
acquiring the actual line number of each continuous and adjacent background element line, calculating the standard line number of background pixels between two adjacent sub-grid lines according to the actual line number of the continuous and adjacent background element lines and the total number of the continuous and adjacent background element lines, and calculating the difference value between the standard line number and each actual line number;
determining the type of the grid line defect according to the line number of the continuous adjacent line of the adjacent background element line corresponding to the difference value and the standard line number of the preset sub-grid line element line;
and determining the accurate position of each grid line defect on the binary image according to the coding number sequence corresponding to the element row, the sub-grid line element row and the background element row of each grid line defect, and accurately adjusting the production process or equipment according to the type of each grid line defect, the accurate position corresponding to the grid line defect and the defect reason.
2. The method as claimed in claim 1, wherein a locator for locating the pixel row is set after the run-length coding of each row of pixels, and the locator does not participate in the coding.
3. The coding detection method based on the grid line defect of the photovoltaic cell as claimed in claim 1, characterized in that whether the coding of the binary image is qualified or not is determined according to the number of the pixel points in the binary image and the number of the coding coefficients in the coding sequence of all rows, the unqualified coding is fed back for recoding until the coding is qualified, and then the coefficient matrix of the binary image corresponding to the qualified coding is obtained.
4. The coding detection method based on grid line defects of photovoltaic cells according to claim 1, characterized in that a coding coefficient of each row of pixels in a binary image is taken as an element of each row in a matrix, the maximum value of the number of the coding coefficients in all row coding number columns in the binary image is taken as the number of the elements of each row in the coefficient matrix, and the element of a vacant position in the matrix is recorded as 0 to establish the coefficient matrix.
5. The encoding detection method based on the grid line defect of the photovoltaic cell as claimed in claim 1, wherein the step of determining the sub-grid line element row and the background element row in the binary image according to the number of the non-0 elements in the element row in the coefficient matrix and the number of the main grid lines comprises:
when the number of non-0 elements in the element row in the coefficient matrix is equal to 1, the element row is a sub-grid line element row where the sub-grid line is located;
and if the number of the main grid lines is q, and when the number of elements, which are not 0, in the element row in the coefficient matrix is equal to 2q-1, the element row is a background element row in which the background is located.
6. The encoding detection method based on the grid line defect of the photovoltaic cell as claimed in claim 1, wherein the step of determining the type of the grid line defect according to the row number of the sub-grid line element row of the adjacent row of the continuous and adjacent background element row corresponding to the difference value and the preset standard row number of the sub-grid line element row comprises:
the types of the grid line defects comprise coarse grid defects, coarse node defects, fine grid defects and broken grid defects;
when the difference value is less than 0, and the row number of the adjacent row of the adjacent background element row is larger than the preset standard row number of the sub-grid line element row, the defect on the sub-grid line is a coarse grid defect;
when the difference value is less than 0, and the row number of the adjacent row of the adjacent background element row is less than the preset standard row number of the sub-grid line element row, and the adjacent row is not the background element row, the defect on the sub-grid line is a coarse defect;
when the difference is equal to 0 continuously and the row number of the adjacent row of the adjacent background element row is larger than 0, the defect on the sub-grid line is a fine grid defect;
and when the difference value is equal to 0, the row number of the adjacent row of the adjacent background element row and the row number of the sub-grid line element row are equal to 0, and the adjacent row is not the background element row, the defect on the sub-grid line is a grid breaking defect.
7. The encoding detection method based on the grid line defects of the photovoltaic cell according to claim 1, wherein the step of determining the accurate position of each grid line defect on the binary image according to the encoding number sequence corresponding to the element row, the sub-grid line element row and the background element row of each grid line defect comprises:
determining the accurate positions of the fine grid defect and the broken grid defect in the sub-grid line pixel rows in the binary image according to the difference of the coding sequence corresponding to the sub-grid line element rows and the element rows of the fine grid defect and the element rows of the broken grid defect;
and determining the accurate positions of the coarse grid defect, the fine grid defect and the broken grid defect in the background pixel row of the binary image according to the difference between the code number sequence corresponding to the element row of the coarse grid defect and the code number sequence corresponding to the background element row.
8. The encoding detection method based on the grid line defects of the photovoltaic cell as claimed in claim 1, wherein the step of accurately adjusting the production process or equipment according to the type of each grid line defect, the corresponding accurate position and the defect reason comprises:
the defects of fine grid defects and broken grid defects are caused by insufficient screen printing plate slurry or poor contact between the screen printing plate and a battery plate in the printing process, and silver paste needs to be added or the position of the screen printing plate needs to be adjusted;
the defects of the coarse grid and the coarse knot are caused because the last slurry on the screen printing plate in the printing process is not cleaned up and the accurate position of the coarse knot needs to be combined to clean the screen printing plate.
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