CN115248246A - High-sensitivity aerosol single-particle laser ionization device and mass spectrometer - Google Patents

Abstract

The invention discloses a high-sensitivity aerosol single particle laser ionization device and a mass spectrometer. High-sensitivity aerosol single-particle laser ionization devices include pulsed lasers, UV laser mirrors, focusing lenses, re-reflective mirrors, and concave mirrors; pulsed lasers, UV laser mirrors, focusing lenses, re-reflective mirrors, and concave mirrors along the optical path The forward direction is distributed sequentially, the pulsed laser is used to generate pulsed laser ionized aerosol single particles, the ultraviolet laser mirror is used to reflect the pulsed laser generated by the pulsed laser to the focusing lens, and the focusing lens is used to focus the pulsed laser to the front surface of the aerosol single particle , the re-reflecting lens is used to reflect the re-amplified amplified laser light after focusing on the aerosol single particle to the concave reflector, and the concave reflector is used to reflect and re-focus the amplified laser light to the rear surface of the aerosol single particle. The high-sensitivity aerosol single-particle laser ionization device can improve the ionization sensitivity.

Description

High-sensitivity aerosol single-particle laser ionization device and mass spectrometer

technical field

The invention relates to the technical field of mass spectrometry detection, in particular to a high-sensitivity aerosol single-particle laser ionization device and a mass spectrometer.

Background technique

As we all know, atmospheric aerosols have a huge impact on the environment and human health, so people pay more and more attention to and in-depth research on them. Due to the complex origin and evolution of atmospheric aerosols, it is difficult to study the origin, physical and chemical properties and evolution mechanism of atmospheric aerosols in depth. As a new type of aerosol analysis instrument, the single particle aerosol mass spectrometer can measure the particle size and chemical composition from a single particle level. effect.

The single particle aerosol mass spectrometer consists of a sampling system, a vacuum system, a laser caliper system, an ionization system, a mass analyzer, an electronic control system, and a software analysis system. When the instrument is working normally, the sample to be tested first passes through the sampling system, and the aerosol particles in the sample are collected into a particle beam that passes through the center of the aerodynamic lens, and the particles of different particle sizes have different velocities. increases the smaller the speed. After the collected particles pass through the multi-stage vacuum system, they are detected by the laser caliper system, and information such as particle size and velocity of the particles is obtained by calculation, and the moment T1 when the pulse trigger signal is generated when the particles pass through the caliper system is recorded. According to the above information, the time T2 when the ionization laser is triggered to emit light is calculated, and the ionization system runs while the ions fly to the ionization position of the ionization laser, ionizes the particles, and the ionized band

The electric particles are analyzed in the mass analyzer, and the composition information of the particles is obtained. From the working principle of the instrument, the laser ionization system is an important part of the single particle aerosol mass spectrometer, and the laser ionization system determines the particle ionization effect. Commonly used aerosol particle ionization methods include chemical ionization, electron bombardment, ultraviolet photoionization and laser desorption ionization. Laser desorption ionization can efficiently ionize aerosol particles of different chemical compositions, including low volatility aerosol particles such as soot, dust, sea salt, etc., which is a necessary means for the instrument to realize real-time online all-round detection. However, the traditional laser ionization method is to reflect the pulsed laser emitted by the laser and focus the optical lens to the center of the ionization zone through a three-dimensional adjustment device. This ionization can only ionize one side of the aerosol particles (close to the laser emission direction), and the ionization efficiency Insufficient, the ionization sensitivity is low, and it is difficult to adapt to the existing detection requirements.

SUMMARY OF THE INVENTION

Based on this, it is necessary to provide a high-sensitivity aerosol single-particle laser ionization device that can recover the laser spot and re-reflect and focus it on the aerosol particles for ionization to improve the ionization sensitivity.

A high-sensitivity aerosol single-particle laser ionization device includes a pulsed laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens and a concave reflecting mirror; the pulsed laser, the ultraviolet laser reflecting lens, the focusing lens, the The re-reflection mirror and the concave mirror are sequentially distributed along the advancing direction of the optical path, the pulsed laser is used to generate pulsed laser light to ionize a single aerosol particle, and the ultraviolet laser mirror is used to reflect the pulsed laser The generated pulsed laser light is directed to the focusing lens, which is used for focusing the pulsed laser light to the front surface of the aerosol single particle, and the re-reflection mirror is used to reflect the re-magnified amplified laser light after focusing on the aerosol single particle Reflection to a concave mirror used to reflect and refocus the amplified laser light onto the rear surface of the aerosol single particle.

In one embodiment, the re-reflection lens forms an angle of 45° with the plane where the focusing lens is located, the concave reflector forms an angle of 45° with the plane where the focusing lens is located, and the re-reflection lens forms an angle of 45°. The reflective surface of the concave mirror is arranged opposite to the reflective surface of the concave mirror.

In one embodiment, the high-sensitivity aerosol single-particle laser ionization device further includes a lens adjustment component, the lens adjustment component is connected to the focusing lens, and the lens adjustment component is used to adjust the position of the focusing lens .

In one embodiment, the lens adjustment assembly can drive the focusing lens to move in a first direction, a second direction and a third direction, wherein the first direction, the second direction and the third direction are perpendicular to each other.

In one embodiment, the lens adjustment assembly includes a lens XY moving platform and a lens Y-axis lifting platform, the focusing lens is connected to the lens XY moving platform, and the lens XY moving platform is mounted on the lens Y-axis On the lifting platform, the lens XY moving platform is used to drive the focusing lens to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting platform is used to drive the lens XY moving platform and the focusing lens along the move in the Y-axis direction.

In one embodiment, the high-sensitivity aerosol single-particle laser ionization device further includes a bracket assembly, and the ultraviolet laser mirror is mounted on the bracket assembly.

In one embodiment, the position of the ultraviolet laser reflecting sheet on the bracket assembly is adjustable.

In one of the embodiments, the pulsed laser is a 266 nm ultraviolet pulsed laser.

In one embodiment, the ultraviolet laser reflective sheet is at an angle of 45° with the outgoing direction of the pulsed laser and the plane on which the focusing lens is located, and the ultraviolet laser reflective sheet can convert the light generated by the pulsed laser to an angle of 45°. The pulsed laser is reflected to the focusing lens at an angle of 90°.

Another object of the present invention is to provide a mass spectrometer.

A mass spectrometer includes the high-sensitivity aerosol single-particle laser ionization device.

The above-mentioned high-sensitivity aerosol single-particle laser ionization device can recover the laser spot and re-reflect and focus it on the aerosol particles for ionization, thereby improving the ionization sensitivity of the high-sensitivity aerosol single-particle laser ionization device. The traditional ionization structure is that a 266nm ultraviolet pulsed laser reflects the emitted pulsed laser and then focuses it on a single aerosol particle through a focusing lens, but this structure can only focus the focused spot on one side of a single aerosol particle, and the aerosol single The backside of the particle cannot be ionized by the laser, which greatly affects the ionization efficiency of single-particle aerosol, which in turn affects the sensitivity of ionization; and the above-mentioned high-sensitivity aerosol single-particle laser ionization device adds a re-reflecting mirror and a concave mirror. , because the concave mirror not only reflects the laser light, but also refocuses the reflected light spot on the back of the single aerosol particle. In this way, when the pulsed laser emitted by the pulsed laser reaches the front of the single aerosol particle, the gas The backside of the aerosol single particle is also ionized by the laser focus, which will greatly improve the ionization efficiency and ionization sensitivity of the aerosol single particle.

When the above-mentioned high-sensitivity aerosol single-particle laser ionization device is in use, the pulsed laser is used to generate a pulsed laser to ionize a single aerosol particle; the bracket assembly is used to fix the ultraviolet laser reflecting lens; the ultraviolet laser reflecting lens is used to reflect the pulsed laser. The laser light is sent to the focusing lens; the lens Y-axis lifting platform and the lens XY moving platform are used to fix the focusing lens and adjust the movement of the focusing lens in the X-axis direction, the Y-axis direction, and the Z-axis direction; the re-reflection lens The purpose is to focus the pulsed laser light emitted by the pulsed laser to a single aerosol particle and then re-amplify the amplified laser light to reflect it on the concave mirror; On a single aerosol particle, the above-mentioned pulsed laser, ultraviolet laser reflecting lens, focusing lens, re-reflecting lens and concave reflecting mirror cooperate with each other to realize the ionization of the front surface and the rear surface of the single aerosol particle at the same time, which improves the aerosol single particle. Particle ionization efficiency and ionization sensitivity.

The above-mentioned high-sensitivity aerosol single-particle laser ionization device drives the focusing lens to move in the first direction, the second direction and the third direction by setting the lens adjustment component, and the focusing lens can move in the first direction, the second direction and the third direction according to actual needs. Move up to adjust position and angle.

The above-mentioned high-sensitivity aerosol single-particle laser ionization device realizes the movement of the focusing lens in the X-axis direction, the Y-axis direction and the Z-axis direction by setting the lens XY moving platform and the lens Y-axis lifting platform, the lens XY moving platform and the lens. The Y-axis lifting platform is simple in structure, easy to set up, easy to obtain materials, and low cost.

The above-mentioned high-sensitivity aerosol single-particle laser ionization device is provided with a bracket assembly for installing the ultraviolet laser reflecting lens, and realizes that the position of the ultraviolet laser reflecting lens on the bracket assembly can be adjusted, and the ultraviolet laser can be carried out according to actual needs. The adjustment of the angle and position of the reflector is easy to operate.

The mass spectrometer using the above-mentioned high-sensitivity aerosol single particle laser ionization device can greatly improve the ionization efficiency and ionization sensitivity of aerosol single particles, and also improve the detection efficiency and sensitivity of the mass spectrometer.

Description of drawings

1 is a schematic diagram of a high-sensitivity aerosol single-particle laser ionization device according to an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a high-sensitivity aerosol single-particle laser ionization device according to an embodiment of the present invention.

Description of reference numerals

10. High-sensitivity aerosol single-particle laser ionization device; 100, pulsed laser; 200, ultraviolet laser mirror; 300, focusing lens; 400, re-reflection mirror; 500, concave mirror; 600, lens adjustment component; 610, lens XY mobile platform; 620, lens Y-axis lifting platform; 700, bracket assembly; 20, optical path.

Detailed ways

In order to make the above objects, features and advantages of the present invention more clearly understood, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present invention. Therefore, the present invention is not limited by the specific embodiments disclosed below.

In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", " Back, Left, Right, Vertical, Horizontal, Top, Bottom, Inner, Outer, Clockwise, Counterclockwise, Axial , "radial", "circumferential" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the indicated device or Elements must have a particular orientation, be constructed and operate in a particular orientation and are therefore not to be construed as limitations of the invention.

In addition, the terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature delimited with "first", "second" may expressly or implicitly include at least one of that feature. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless otherwise expressly and specifically defined.

In the present invention, unless otherwise expressly specified and limited, the terms "installed", "connected", "connected", "fixed" and other terms should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection , or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between the two elements, unless otherwise specified limit. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

In the present invention, unless otherwise expressly specified and limited, a first feature "on" or "under" a second feature may be in direct contact between the first and second features, or the first and second features indirectly through an intermediary touch. Also, the first feature being "above", "over" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is level higher than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature has a lower level than the second feature.

It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or an intervening element may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for the purpose of illustration only and do not represent the only embodiment.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Referring to FIG. 1 and FIG. 2 , an embodiment of the present invention provides a high-sensitivity aerosol single-particle laser ionization device 10 .

A high-sensitivity aerosol single-particle laser ionization device 10 includes a pulsed laser 100 , an ultraviolet laser reflecting lens 200 , a focusing lens 300 , a re-reflecting lens 400 and a concave reflecting mirror 500 .

Referring to FIG. 1 , the pulsed laser 100 , the ultraviolet laser mirror 200 , the focusing lens 300 , the re-reflection mirror 400 and the concave mirror 500 are sequentially distributed along the advancing direction of the optical path 20 .

The pulsed laser 100 is used to generate a pulsed laser to ionize a single aerosol particle, and the ultraviolet laser mirror 200 is used to reflect the pulsed laser generated by the pulsed laser 100 to a focusing lens 300, and the focusing lens 300 is used to focus the pulsed laser to a single aerosol particle On the front surface, the re-reflection mirror 400 is used to reflect the re-amplified amplified laser light after focusing on the aerosol single particle and reflected to the concave mirror 500, and the concave mirror 500 is used to reflect and re-focus the amplified laser light to the aerosol single particle the rear surface.

In one embodiment, please refer to FIG. 1 , the re-reflection mirror 400 forms an angle of 45° with the plane where the focusing lens 300 is located, the concave mirror 500 forms an angle of 45° with the plane where the focusing lens 300 is located, and the re-reflection mirror 500 forms an angle of 45° with the plane where the focusing lens 300 is located. The reflective surface of the mirror 400 and the reflective surface of the concave mirror 500 are disposed opposite to each other.

In one embodiment, please refer to FIG. 1 , the high-sensitivity aerosol single-particle laser ionization device 10 further includes a lens adjustment assembly 600 , the lens adjustment assembly 600 is connected to the focusing lens 300 , and the lens adjustment assembly 600 is used to adjust the focusing lens 300 position.

In one embodiment, the lens adjustment assembly 600 can drive the focusing lens 300 to move in a first direction, a second direction and a third direction, wherein the first direction, the second direction and the third direction are perpendicular to each other. The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 drives the focusing lens 300 to move in the first direction, the second direction and the third direction by setting the lens adjustment assembly 600. Orientation and third direction movements occur to adjust position and angle.

In one embodiment, please refer to FIG. 1 , the lens adjustment assembly 600 includes a lens XY moving platform 610 and a lens Y axis lifting platform 620 . The focusing lens 300 is connected to the lens XY moving platform 610, and the lens XY moving platform 610 is mounted on the lens Y-axis lifting platform 620. The lens XY moving platform 610 is used to drive the focusing lens 300 to move along the X-axis direction or the Y-axis direction, and the lens Y The axis lifting platform 620 is used to drive the lens XY moving platform 610 and the focusing lens 300 to move along the Y axis direction. The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 realizes the movement of the focusing lens 300 in the X-axis direction, the Y-axis direction, and the Z-axis direction by setting the lens XY moving platform 610 and the lens Y-axis lifting platform 620, and the lens XY direction. The moving platform 610 and the lens Y-axis lifting platform 620 are simple in structure, easy to set up, easy to obtain materials, and low cost.

In one embodiment, please refer to FIG. 1 , the high-sensitivity aerosol single-particle laser ionization device 10 further includes a bracket assembly 700 , and the ultraviolet laser mirror 200 is mounted on the bracket assembly 700 .

In one of the embodiments, the position of the ultraviolet laser mirror 200 on the bracket assembly 700 is adjustable. The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is provided with a bracket assembly 700 for installing the ultraviolet laser reflecting lens 200, and the position of the ultraviolet laser reflecting lens 200 on the bracket assembly 700 can be adjusted, and the ultraviolet laser reflecting lens 200 can be adjusted according to actual needs. The adjustment of the angle and position of the laser mirror 200 is easy to operate.

In one embodiment, the pulsed laser 100 is a 266 nm ultraviolet pulsed laser 100 . It can be understood that in other embodiments, the pulsed laser 100 is not limited to the above, and the pulsed laser 100 can also select other lasers as required.

In one of the embodiments, as shown in FIG. 2 , the ultraviolet laser reflecting sheet 200 forms an angle of 45° with the output direction of the pulsed laser 100 and the plane where the focusing lens 300 is located. The generated pulsed laser light is reflected to the focusing lens 300 at an angle of 90°.

When the above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is in use, the pulsed laser 100 is used to generate a pulsed laser to ionize a single aerosol particle; the bracket assembly 700 is for fixing the ultraviolet laser mirror 200; the ultraviolet laser mirror 200 is for The laser light emitted by the pulsed laser 100 is reflected to the focusing lens 300; the lens Y-axis lifting platform 620 and the lens XY moving platform 610 are used to fix the focusing lens 300 and adjust the focusing lens 300 in the X-axis direction, the Y-axis direction, and the Z-axis direction. Move; the re-reflecting mirror 400 is to focus the pulsed laser emitted by the pulsed laser 100 on the single aerosol particle and then reflect the magnified laser after re-amplification to the concave mirror 500; The subsequent light spot is reflected and focused on the single aerosol particle. The above-mentioned pulsed laser 100, ultraviolet laser reflecting lens 200, focusing lens 300, re-reflecting lens 400 and concave reflecting mirror 500 cooperate with each other to realize the front surface of the single aerosol particle. And the rear surface is ionized at the same time, which improves the ionization efficiency and ionization sensitivity of the aerosol single particle.

This embodiment also provides a mass spectrometer.

A mass spectrometer includes the above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 . The mass spectrometer using the above-mentioned high-sensitivity aerosol single particle laser ionization device 10 can greatly improve the ionization efficiency and ionization sensitivity of aerosol single particles, and also improve the detection efficiency and sensitivity of the mass spectrometer.

The above-mentioned mass spectrometer can be a commonly used mass spectrometer, such as gas chromatography-mass spectrometer, liquid chromatography-mass spectrometer, liquid chromatography-quadrupole mass spectrometer, liquid chromatography-ion trap mass spectrometer, liquid chromatography-ion trap mass spectrometer, Chromatography-time-of-flight mass spectrometer, liquid chromatography-mass spectrometry-mass spectrometer, matrix-assisted laser desorption time-of-flight mass spectrometer and Fourier transform mass spectrometer, etc.

The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is a high-sensitivity aerosol single-particle laser ionization device 10 that can recover the laser spot and re-reflect and focus it on the aerosol particles for ionization, thereby improving the ionization sensitivity. The traditional ionization structure is that the 266nm ultraviolet pulsed laser 100 reflects the emitted pulsed laser and then focuses it on the single aerosol particle through the focusing lens 300, but this structure can only focus the focusing spot on the single side of the aerosol single particle, and the gas The backside of a single sol particle cannot be ionized by the laser, which greatly affects the ionization efficiency of the single particle aerosol, which in turn affects the sensitivity of ionization; and the above-mentioned high-sensitivity aerosol single particle laser ionization device 10 adds a re-reflecting lens 400 And the concave mirror 500, because the concave mirror 500 not only has the function of reflecting the laser light, but also can refocus the reflected light spot on the back of the aerosol single particle, so that the pulse laser emitted by the pulse laser 100 reaches the aerosol single particle. At the same time as the front of the aerosol particle, the back of the aerosol single particle is also ionized by the laser focus, which will greatly improve the ionization efficiency and ionization sensitivity of the aerosol single particle.

The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity, all possible combinations of the technical features in the above-described embodiments are not described. However, as long as there is no contradiction between the combinations of these technical features, All should be regarded as the scope described in this specification.

The above-mentioned embodiments only represent several embodiments of the present invention, and the descriptions thereof are specific and detailed, but should not be construed as a limitation on the scope of the patent of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can also be made, which all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the appended claims.

Claims (10)

1. a high-sensitivity aerosol single-particle laser ionization device, is characterized in that, comprises pulsed laser, ultraviolet laser reflecting lens, focusing lens, re-reflecting lens and concave reflecting mirror; Described pulse laser, described ultraviolet laser reflecting lens, The focusing lens, the re-reflection lens and the concave reflector are sequentially distributed along the advancing direction of the optical path. The pulsed laser is used to generate a pulsed laser to ionize single aerosol particles. In order to reflect the pulsed laser generated by the pulsed laser to the focusing lens, the focusing lens is used to focus the pulsed laser to the front surface of the aerosol single particle, and the re-reflecting mirror is used to reflect the aerosol single particle after focusing on the aerosol single particle. The re-amplified, amplified laser light is reflected to a concave mirror that is used to reflect and refocus the amplified laser light onto the rear surface of the aerosol single particle. 2 . The high-sensitivity aerosol single-particle laser ionization device according to claim 1 , wherein the re-reflection mirror and the plane where the focusing lens is located are at an angle of 45°, and the concave mirror and the The plane where the focusing lens is located is at an included angle of 45°, and the reflective surface of the re-reflection lens and the reflective surface of the concave reflector are arranged opposite to each other. 3 . The high-sensitivity aerosol single-particle laser ionization device according to claim 1 , wherein the high-sensitivity aerosol single-particle laser ionization device further comprises a lens adjustment component, and the lens adjustment component is connected to the focusing device. 4 . a lens, and the lens adjustment assembly is used to adjust the position of the focusing lens. 4 . The high-sensitivity aerosol single-particle laser ionization device according to claim 3 , wherein the lens adjustment assembly can drive the focusing lens to move in a first direction, a second direction and a third direction, wherein, 5 . The first direction, the second direction and the third direction are perpendicular to each other. 5 . The high-sensitivity aerosol single-particle laser ionization device according to claim 3 , wherein the lens adjustment assembly comprises a lens XY moving platform and a lens Y-axis lifting platform, and the focusing lens is connected to the lens XY 5 . A moving platform, the lens XY moving platform is installed on the lens Y-axis lifting platform, and the lens XY moving platform is used to drive the focusing lens to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting and lowering The stage is used to drive the XY moving stage of the lens and the focusing lens to move along the Y-axis direction. 6. The high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1-5, wherein the high-sensitivity aerosol single-particle laser ionization device further comprises a bracket assembly, and the ultraviolet laser reflecting lens mounted on the bracket assembly. 7 . The high-sensitivity aerosol single-particle laser ionization device according to claim 6 , wherein the position of the ultraviolet laser reflecting lens on the bracket assembly is adjustable. 8 . 8 . The high-sensitivity aerosol single-particle laser ionization device according to claim 1 , wherein the pulsed laser is a 266 nm ultraviolet pulsed laser. 9 . 9 . The high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1 to 5 and 7, characterized in that, the ultraviolet laser reflecting sheet is respectively related to the outgoing direction of the pulsed laser, the focusing lens The plane where it is located is at an angle of 45°, and the ultraviolet laser reflecting sheet can reflect the pulsed laser light generated by the pulsed laser to the focusing lens at an angle of 90°. 10. A mass spectrometer, comprising the high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1-9.

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