CN115235959A - A kind of particle size measurement method, device, equipment and readable storage medium - Google Patents

Abstract

The invention provides a method, a device and equipment for measuring particle size and a readable storage medium, which relate to the technical field of particle size measurement and comprise the steps of acquiring first information, wherein the first information comprises an electric signal acquired by an object to be detected through a parallel light velocity acquisition device; carrying out digital processing on the electric signal to obtain a digital signal corresponding to the electric signal; obtaining a waveform diagram corresponding to the digital signal according to the digital signal, wherein the waveform diagram comprises the light scattering intensity of the object to be detected at each moment; the invention converts the electric signal into the digital signal through digital processing, brings basic conditions for processing the digital data, and converts the digital signal into the oscillogram through processing the digital signal, so that the object to be detected can be visually analyzed through the flight time of the parallel light beams and the light scattering intensity of the object to be detected, thereby achieving the purpose of analyzing the particle size.

Description

A kind of particle size measurement method, device, equipment and readable storage medium

technical field

The present invention relates to the technical field of particle size measurement, in particular, to a particle size measurement method, device, equipment and readable storage medium.

Background technique

With the intensification of industrial pollution and frequent occurrence of haze weather, air pollution has seriously affected human health. The detection of air quality has become particularly important. The monitoring, analysis and research of particulate matter in the air is the focus of current environmental protection work. At present, the analytical instruments used to detect particulate matter in the air are mainly aerodynamic particle size spectrometers. However, the existing aerodynamic particle size spectrometer generally determines the aerodynamic diameter of particles through two falling edges (or rising edges) detected by an analog circuit. This acquisition method is susceptible to the interference of overlapping particles, which leads to particle measurement. Particle size is not accurate.

SUMMARY OF THE INVENTION

The purpose of the present invention is to provide a particle size measurement method, device, device and readable storage medium to improve the above problems.

In order to achieve the above purpose, the embodiments of the present application provide the following technical solutions:

On the one hand, the embodiments of the present application provide a method for measuring particle size, the method comprising:

Acquiring first information, where the first information includes electrical signals collected by the object to be detected by the parallel light speed collecting device;

Digitizing the electrical signal to obtain a digital signal corresponding to the electrical signal;

Obtain a waveform diagram corresponding to the digital signal according to the digital signal, and the waveform diagram includes the light scattering intensity of the object to be detected at each moment;

The waveform diagram corresponding to the digital signal is analyzed and processed to obtain a measurement result, where the measurement result includes particle size information of the object to be detected.

In a second aspect, an embodiment of the present application provides a particle size measurement device, the device comprising:

an acquisition module, configured to acquire first information, where the first information includes an electrical signal acquired by the object to be detected by the parallel light velocity acquisition device;

a first processing module, configured to perform digital processing on the electrical signal to obtain a digital signal corresponding to the electrical signal;

a second processing module, configured to obtain a waveform diagram corresponding to the digital signal according to the digital signal, where the waveform diagram includes the light scattering intensity of the object to be detected at each moment;

The analysis module is configured to analyze and process the waveform corresponding to the digital signal to obtain a measurement result, where the measurement result includes particle size information of the object to be detected.

In a third aspect, embodiments of the present application provide a particle size measurement device, the device including a memory and a processor. The memory is used to store a computer program; the processor is used to implement the steps of the above particle size measurement method when executing the computer program.

In a fourth aspect, an embodiment of the present application provides a readable storage medium, where a computer program is stored on the readable storage medium, and when the computer program is executed by a processor, the steps of the above particle size measurement method are implemented.

The beneficial effects of the present invention are:

1. The present invention converts electrical signals into digital signals through digital processing to bring basic conditions for processing digital data. By processing digital signals and converting digital signals into waveforms, the flight time of the object to be detected through the parallel beam can be intuitively processed. And the light scattering intensity of the object to be detected is analyzed.

2. The present invention can realize the dynamic adjustment of the threshold information through the preset third information, so as to replace the solution of setting a fixed threshold in the prior art, and effectively avoid the situation that the digital signal of the small particles is lost when small particles are detected. , In addition, due to the influence of the working environment and the attenuation of the light source, the collected second information changes, and the dynamic adjustment of the threshold information is realized through the preset third information, which is beneficial to ensure the accuracy of the particle size measurement.

3. The present invention realizes the division of the waveforms of the overlapping objects to be detected through the segmentation process, achieves the purpose of correctly solving the overlapping objects to be detected, can distinguish the number of particles, and has the ability to resist aliasing , so that the particle size information obtained by the measurement is more accurate.

Other features and advantages of the present invention will be set forth in the description which follows, and, in part, will be apparent from the description, or may be learned by practice of embodiments of the invention. The objectives and other advantages of the invention may be realized and attained by the structure particularly pointed out in the written description, claims, and drawings.

Description of drawings

In order to illustrate the technical solutions of the embodiments of the present invention more clearly, the following briefly introduces the accompanying drawings used in the embodiments. It should be understood that the following drawings only show some embodiments of the present invention, and therefore do not It should be regarded as a limitation of the scope, and for those of ordinary skill in the art, other related drawings can also be obtained according to these drawings without any creative effort.

FIG. 1 is a schematic flow chart of the method for measuring particle size described in the embodiment of the present invention.

FIG. 2 is a graph showing the corresponding relationship between flight time and particle size described in the embodiment of the present invention.

FIG. 3 is a graph showing the corresponding relationship between the light scattering intensity and particle size of polystyrene and carbon described in the examples of the present invention.

FIG. 4 is a schematic structural diagram of the particle size measuring device described in the embodiment of the present invention.

FIG. 5 is a schematic structural diagram of the particle size measuring device described in the embodiment of the present invention.

In the figure: 901, acquisition module; 902, first processing module; 903, second processing module; 904, analysis module; 9041, first acquisition unit; 9042, first processing unit; 9043, first judgment unit; 9044, 9045, second judgment unit; 9046, segmentation unit; 9047, analysis unit; 90451, first detection unit; 90452, sub-judgment unit; 90461, second acquisition unit; 90462, second detection unit; 90463 904631, the sub-division unit; 904632, the third processing unit; 904633, the fourth processing unit; 904634, the fifth processing unit; 800, the particle size measuring device; 801, the processor; 802, the memory; 803, multimedia component; 804, I/O interface; 805, communication component.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments These are some embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations. Thus, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

It should be noted that like numerals and letters refer to like items in the following figures, so once an item is defined in one figure, it does not require further definition and explanation in subsequent figures. Meanwhile, in the description of the present invention, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

Example 1:

This embodiment provides a method for measuring particle size, which is applied to the scenario of measuring the particle size of particles contained in the air.

As shown in FIG. 1 , this embodiment provides a method for measuring particle size, and the measuring method includes step S1 , step S2 , step S3 and step S4 .

Step S1, acquiring first information, where the first information includes an electrical signal collected by the object to be detected by a parallel light speed collecting device;

It can be understood that, in this step, the electrical signal of the object to be detected passing through the parallel light speed collected by the particle size spectrometer is specifically: the laser light source emits polarized light, and the polarized light is converted into two parallel beams arranged at intervals through the optical path system, and the parallel beams are in The scattered light is generated after being blocked by the sprayed object to be detected, and the scattered light is sent to the detector through a light lens to generate an electrical signal. The object to be detected is a particle in the air, and the optical path system converts the polarized light into two spaced The parallel beam is a technique well known to those skilled in the art, so it is not repeated here.

Step S2, performing digital processing on the electrical signal to obtain a digital signal corresponding to the electrical signal;

It is understandable that, in the prior art, the collected electrical signals are usually data analyzed, and the aerodynamic diameter of particles is determined by two falling edges (or rising edges) detected by an analog circuit, but this method is susceptible to particle overlap. Therefore, in this step, the electrical signal can be digitally processed by the ADC converter to obtain the corresponding digital signal, which brings basic conditions for the FPGA processor to process the digital data. Through the digital information processing, the particle size of the overlapping particles can be realized Take measurements.

Step S3, obtaining a waveform diagram corresponding to the digital signal according to the digital signal, and the waveform diagram includes the light scattering intensity of the object to be detected at each moment;

It can be understood that in this step, the corresponding waveform diagram can be obtained through multiple sets of digital information, wherein the abscissa of the waveform diagram is the time, and the ordinate is the light scattering intensity of the object to be detected. The time-of-flight of the object through the parallel beam and the light scattering intensity of the object to be detected are analyzed.

Step S4 , analyzing and processing the waveform corresponding to the digital signal to obtain a measurement result, where the measurement result includes particle size information of the object to be detected.

It can be understood that the particle size information of the object to be detected includes aerodynamic particle size information and optical particle size information, the aerodynamic particle size information is the particle size obtained by measuring the aerodynamic measurement method, and the optical particle size information is The particle size measured by the light scattering method, the aerodynamic particle size is affected by gravity, the optical particle size is affected by the surface area, and the aerodynamic particle size and optical particle size are output at the same time, which can more accurately determine the particle size of the object to be detected. Characterize.

It can be understood that the step S4 includes step S41, step S42 and step S43 before, wherein:

Step S41, acquiring second information, where the second information includes the average value of at least two consecutive lowest values included in each group of digital signals;

It can be understood that, since there are other light sources that interfere with the detection when detecting particles, the average value of at least two consecutive lowest values included in each group of digital signals is taken as the signal background value to exclude the interference of the background on the detection results. Different light source backgrounds can be adjusted to take the average of different numbers of consecutive lowest values as the signal background.

Step S42, obtaining threshold information according to the second information and the preset third information;

It can be understood that, in the prior art, a higher threshold is usually set as the fixed threshold information, but since the signal background value is easily changed with the working time of the detector itself, the working temperature environment, the attenuation of the light source and other conditions, so The second information plus the preset third information is used as the threshold information, and the dynamic adjustment of the threshold information can be realized by adjusting the preset third information, which effectively avoids the loss of the digital signal of the small particles when detecting small particles. At the same time, the accuracy of particle size detection is also improved.

Step S43, according to the threshold information to determine whether the object to be detected appears in the detection area of the chamber, if at least two consecutive values included in the digital signal are greater than the threshold information, then determine the detection area of the chamber If the at least two consecutive values included in the digital signal are smaller than the threshold information, it is judged that the object to be detected in the detection area of the chamber flies out of the detection area, and the detected Digital signals are stored for analysis.

It can be understood that when the particles fly out of the detection area, the value of the digital signal will decrease, and when it is detected that at least two consecutive values included in the digital signal are smaller than the threshold information, it can be determined that the particles fly out of the detection area.

Step S4 further includes step S44, step S45, step S46 and step S47, wherein:

Step S44, preprocessing the waveform diagram to obtain a preprocessed waveform diagram;

It can be understood that the preprocessing of the waveform diagram in this step is to filter the fluctuations caused by the system noise in the digital signal, so as to reduce the interference of the measurement of the system noise.

Step S45, judging whether the object to be detected overlaps according to the number of peaks and troughs of the preprocessed waveform graph, and obtaining a first judgment result;

It can be understood that in this step, the peak and trough can be judged by the change of the value of △y / △x. When the value of △y / △x changes from positive to negative, it is the peak, and when the value of △y / △x changes from positive to negative, it is the peak. The trough is when the value changes from negative to positive, where Δy is the change in light scattering intensity and Δx is the change in time.

It can be understood that step S45 includes step S451 and step S452, wherein:

Step S451: Detecting the preprocessed waveform diagram to obtain fourth information, where the fourth information includes the number of peaks and troughs existing in the preprocessed waveform diagram;

Step S452: Determine whether the objects to be detected overlap according to the fourth information, wherein, if the preprocessed waveform is greater than three peaks or two troughs, it is determined that the objects to be detected overlap; if the If the preprocessed waveform is less than three peaks or two valleys, it is determined that the object to be detected is a single particle.

It can be understood that in this step, since the particle size spectrometer will emit two parallel beams, when a particle passes through the two parallel beams, its corresponding waveform has at most two peaks or at most one trough. If there are three or more peaks or two or more troughs in the waveform graph, it can be determined that the objects to be detected overlap, that is, the particles in the air overlap.

Step S46, performing segmentation processing on the overlapping waveforms of the object to be detected according to the first judgment result, to obtain a segmented waveform;

It can be understood that step S46 includes step S461, step S462 and step S463, wherein:

Step S461, obtaining an error threshold;

Step S462, detecting the waveforms of the overlapping objects to be detected to obtain fifth information, where the fifth information includes amplitude information of the waveforms;

It can be understood that the difference between the peak heights and the trough heights of the waveform graphs of two different particulate matters can be determined according to the amplitude information of the waveform graphs.

Step S463, according to the fifth information, determine whether the difference in amplitude between the two overlapping objects to be detected is greater than the error threshold, if the difference in amplitude between the two overlapping objects to be detected is greater than all If it is less than the error threshold, it is judged that there is a difference in the amplitudes between the two objects to be detected, and the first segmentation process is used to segment the waveform; , and use the second segmentation process to segment the waveform graph.

It is understandable that in the prior art, it is easy to be interfered by the overlapping of particles. In the detection area, only one particle can be detected normally at a time. When the particles overlap, the information after data calculation is inaccurate, and accurate measurement cannot be achieved. For the purpose of particle size, in this step, by dividing the waveform corresponding to the digital signal, the waveforms of different particles can be divided. When the particles overlap, the specific number of particles can be identified and the data can be corrected. , with anti-aliasing capability.

It can be understood that step S463 includes step S4631, step S4632, step S4633 and step S4634.

Step S4631, dividing the waveform graph of the overlapping object to be detected at the midpoint to obtain a first waveform graph and a second waveform graph, and the first waveform graph is on the left side of the second waveform graph;

Step S4632, horizontally flip the second waveform to the left to obtain a third waveform;

Step S4633, subtracting the first waveform from the third waveform to obtain a fourth waveform;

Step S4634, subtract the first waveform from the fourth waveform to obtain a fifth waveform.

It can be understood that the method in this implementation can realize the segmentation of the waveform diagrams of the overlapping particles with large differences in particle size, and obtain two divided waveform diagrams, that is, the fourth waveform diagram is the digital signal of the small object to be tested. Corresponding waveforms, the fifth waveform is the waveform corresponding to the digital signal of the large object to be tested, and then analyzing the fourth waveform and the fifth waveform respectively can realize the measurement of the particle size of the particles overlapped by the particles. With anti-aliasing ability, the particle size information obtained by measurement is more accurate.

It should be noted that the second segmentation process is specifically: acquiring segmentation point information, where the segmentation point information is the point corresponding to the second trough, and then segmenting the overlapping waveforms of the object to be detected according to the segmentation point information to obtain the segmentation process. waveform diagram.

Step S47 , analyzing the divided waveforms to obtain a measurement result.

It can be understood that the algorithm flow of analyzing the divided waveform is as follows: identifying the number of peaks in the divided waveform, when the number of peaks is 1, the area of the waveform is the optical particle size information; When the number of peaks is 2, the interval between the two peaks is the flight time of the particles, and the area of the waveform graph is the optical particle size information; when the number of peaks is 3, the number of particles is 2, there are two situations: (1) , Two peaks with similar heights and areas are the first particle, the interval between the two peaks is the flight time of the first particle, and the sum of the areas of the waveforms corresponding to these two peaks is the first particle The optical particle size information of the particles, the area of the waveform corresponding to the third peak is the optical particle size information of the second particle; (2) When the heights of the three peaks are the same and the corresponding areas are also the same, press The order in which the peaks appear, the interval between the first two peaks is the flight time of the first particle, the sum of the waveform area corresponding to the two peaks is the optical particle size information of the first particle, and the third The area of the waveform map corresponding to the peak is the optical particle size information of the second particle; when the number of peaks is 4, the number of particles is 2, and there are also two situations: (1), the heights and areas of the two peaks are similar. is the first particle, the interval between the two peaks is the flight time of the first particle, the sum of the waveform area corresponding to the two peaks is the optical particle size information of the first particle; the other two peaks The second particle has a similar height and area. The interval between the two peaks is the flight time of the second particle. The area of the waveform corresponding to the two peaks is the optical particle size information of the second particle. ; (2), the heights of the four peaks are the same and the corresponding areas are also the same, then in the order of time, the first two peaks are the first particles, and the interval between the two peaks is the first particle. The time-of-flight of the first particle is the sum of the waveform area corresponding to the two peaks; the two peaks appearing later are the second particle, and the interval between the two peaks is the second particle. The flight time of the particle, the sum of the waveform area corresponding to the two peaks is the optical particle size information of the second particle; when the number of peaks is 5 or more, an alarm will be processed, and the result is given as The number of particles is 3; no other calculations are performed; it indicates that the concentration of particles is too high, please dilute the sample gas; save the waveform to an invalid database for later manual analysis.

It should be noted that the particle size spectrometer is used to measure standard particles of different sizes to obtain the time-of-flight data and light scattering intensity data of particles of different sizes, and the corresponding relationship curve between flight time and particle size can be fitted, see Figure 2 Fig. 3 shows the fitting relationship between the light scattering intensity and particle size of polystyrene and carbon, respectively. The corresponding relationship curve between time and particle size can determine the functional relationship between flight time and particle size, which is recorded as the first functional relationship; according to the corresponding relationship curve between light scattering intensity and particle size, it can be determined that the functional relationship between light scattering intensity and particle size is recorded as The second functional relationship is to store the first functional relationship and the second functional relationship in the computer, that is, the aerodynamic particle size of the particles can be obtained by an aerodynamic measurement method based on the flight time of the particles, or the optical particle size can be obtained based on the light scattering intensity. The measuring method obtains the optical particle size of the particulate matter.

Example 2:

As shown in FIG. 4 , this embodiment provides a particle size measurement device, the device includes: an acquisition module 901, a first processing module 902, a second processing module 903, and an analysis module 904, wherein:

an acquisition module 901, configured to acquire first information, where the first information includes an electrical signal acquired by the object to be detected by a parallel light speed acquisition device;

a first processing module 902, configured to perform digital processing on the electrical signal to obtain a digital signal corresponding to the electrical signal;

The second processing module 903 is configured to obtain a waveform diagram corresponding to the digital signal according to the digital signal, where the waveform diagram includes the light scattering intensity of the object to be detected at each moment;

The analysis module 904 is configured to analyze and process the waveform corresponding to the digital signal to obtain a measurement result, where the measurement result includes particle size information of the object to be detected.

Specifically, before the analysis module 904, it includes a first acquisition unit 9041, a first processing unit 9042 and a first judgment unit 9043, wherein:

a first obtaining unit 9041, configured to obtain second information, where the second information includes the average value of at least two consecutive lowest values included in each group of digital signals;

a first processing unit 9042, configured to obtain threshold information according to the second information and the preset third information;

The first judging unit 9043 is used for judging whether an object to be detected appears in the detection area of the chamber according to the threshold information, and if at least two consecutive values included in the digital signal are greater than the threshold information, then judge the The object to be detected appears in the detection area of the chamber; if at least two consecutive numerical values included in the digital signal are smaller than the threshold information, it is determined that the object to be detected in the detection area of the chamber has flown out of the detection area, The detected digital signal is stored for analysis.

Specifically, the analysis module 904 includes a second processing unit 9044, a second judgment unit 9045, a segmentation unit 9046 and an analysis unit 9047, wherein:

The second processing unit 9044 is configured to preprocess the waveform diagram to obtain a preprocessed waveform diagram;

The second judging unit 9045 is configured to judge whether the object to be detected overlaps according to the number of peaks and troughs of the preprocessed waveform graph, and obtain a first judgment result;

A segmentation unit 9046, configured to perform segmentation processing on the overlapping waveform graphs of the object to be detected according to the first judgment result, to obtain a segmented waveform graph;

The analyzing unit 9047 is configured to analyze the waveform graph after the segmentation process to obtain a measurement result.

Specifically, the second judgment unit 9045 includes a first detection unit 90451 and a sub-judgment unit 90452, wherein:

a first detection unit 90451, configured to detect the preprocessed waveform diagram to obtain fourth information, where the fourth information includes the number of peaks and troughs existing in the preprocessed waveform diagram;

Sub-judging unit 90452, for judging whether the object to be detected overlaps according to the fourth information, wherein if the preprocessed waveform is greater than three peaks or two troughs, it is determined that the object to be detected overlaps ; If the preprocessed waveform is less than three peaks or two troughs, it is determined that the object to be detected is a single particle.

Specifically, the segmentation unit 9046 includes a second acquisition unit 90461, a second detection unit 90462 and a third judgment unit 90463, wherein:

The second obtaining unit 90461 is used to obtain the error threshold;

The second detection unit 90462 is configured to detect the waveforms of the overlapping objects to be detected to obtain fifth information, where the fifth information includes amplitude information of the waveforms;

The third judging unit 90463 is configured to judge, according to the fifth information, whether the difference between the amplitudes of the two overlapping objects to be detected is greater than the error threshold. If the difference is greater than the error threshold, it is judged that there is a difference in the amplitude between the two objects to be detected, and the first segmentation process is used to segment the waveform; There is no difference in the amplitudes of , and the waveform graph is segmented by the second segmentation process.

Specifically, the third judgment unit 90463 includes a sub-segmentation unit 904631, a third processing unit 904632, a fourth processing unit 904633 and a fifth processing unit 904634, wherein:

a sub-segmentation unit 904631, configured to segment the waveform graph of the overlapping object to be detected at the midpoint to obtain a first waveform graph and a second waveform graph, where the first waveform graph is on the left side of the second waveform graph;

A third processing unit 904632, configured to horizontally flip the second waveform to the left to obtain a third waveform;

a fourth processing unit 904633, configured to subtract the first waveform from the third waveform to obtain a fourth waveform;

A fifth processing unit 904634, configured to subtract the first waveform diagram and the fourth waveform diagram to obtain a fifth waveform diagram.

It should be noted that, with regard to the apparatus in the foregoing embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be described in detail here.

Example 3:

Corresponding to the above method embodiments, this embodiment also provides a particle size measurement device, and a particle diameter measurement device described below and a particle diameter measurement method described above can be referred to each other correspondingly.

FIG. 5 is a block diagram of a particle size measuring device 800 according to an exemplary embodiment. As shown in FIG. 5 , the particle size measuring device 800 may include: a processor 801 and a memory 802 . The particle size measurement device 800 may also include one or more of a multimedia component 803 , an I/O interface 804 , and a communication component 805 .

Wherein, the processor 801 is used to control the overall operation of the particle size measuring device 800, so as to complete all or part of the steps in the above-mentioned particle size measuring method. Memory 802 is used to store various types of data to support operation of the particle size measurement device 800, which data may include, for example, instructions for any application or method operating on the particle size measurement device 800, and Application-related data, such as contact data, messages sent and received, pictures, audio, video, and more. The memory 802 can be implemented by any type of volatile or non-volatile storage device or their combination, such as static random access memory (Static Random Access Memory, SRAM for short), electrically erasable programmable read-only memory ( Electrically Erasable Programmable Read-Only Memory (EEPROM for short), Erasable Programmable Read-Only Memory (EPROM), Programmable Read-Only Memory (PROM), read-only Memory (Read-Only Memory, ROM for short), magnetic memory, flash memory, magnetic disk or optical disk. Multimedia components 803 may include screen and audio components. Wherein the screen can be, for example, a touch screen, and the audio component is used for outputting and/or inputting audio signals. For example, the audio component may include a microphone for receiving external audio signals. The received audio signal may be further stored in memory 802 or transmitted through communication component 805 . The audio assembly also includes at least one speaker for outputting audio signals. The I/O interface 804 provides an interface between the processor 801 and other interface modules, and the above-mentioned other interface modules may be a keyboard, a mouse, a button, and the like. These buttons can be virtual buttons or physical buttons. The communication component 805 is used for wired or wireless communication between the particle size measuring device 800 and other devices. Wireless communication, such as Wi-Fi, Bluetooth, Near Field Communication (NFC for short), 2G, 3G or 4G, or a combination of one or more of them, so the corresponding communication component 805 may include: Wi-Fi -Fi module, bluetooth module, NFC module.

In an exemplary embodiment, the particle size measuring device 800 may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), digital signal processing devices (Digital Signal Processing Device, referred to as DSPD), Programmable Logic Device (Programmable Logic Device, referred to as PLD), Field Programmable Gate Array (Field Programmable Gate Array, referred to as FPGA), controller, microcontroller, microprocessor or other electronic Element implementation for carrying out the above-mentioned particle size measurement method.

In another exemplary embodiment, a computer-readable storage medium comprising program instructions is also provided, and when the program instructions are executed by a processor, the steps of the above-mentioned particle size measurement method are implemented. For example, the computer-readable storage medium can be the above-mentioned memory 802 including program instructions, and the above-mentioned program instructions can be executed by the processor 801 of the particle size measuring device 800 to complete the above-mentioned particle size measuring method.

Example 4:

Corresponding to the above method embodiments, a readable storage medium is also provided in this embodiment, and a readable storage medium described below and a particle size measurement method described above can be referred to each other correspondingly.

A readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, implements the steps of the particle size measurement method in the above method embodiment.

The readable storage medium may specifically be a USB flash drive, a mobile hard disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, etc. that can store program codes. Readable storage medium.

The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited to this. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention. should be included within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims (10)

1. a measuring method of particle diameter, is characterized in that, comprises: Acquiring first information, where the first information includes electrical signals collected by the object to be detected by the parallel light speed collecting device; Digitizing the electrical signal to obtain a digital signal corresponding to the electrical signal; Obtain a waveform diagram corresponding to the digital signal according to the digital signal, and the waveform diagram includes the light scattering intensity of the object to be detected at each moment; The waveform diagram corresponding to the digital signal is analyzed and processed to obtain a measurement result, where the measurement result includes particle size information of the object to be detected. 2. The method for measuring particle size according to claim 1, wherein before the waveform diagram corresponding to the digital signal is analyzed and processed to obtain the measurement result, the method comprises: acquiring second information, the second information including an average value of at least two consecutive lowest values included in each group of digital signals; Obtain threshold information according to the second information and the preset third information; Determine whether the object to be detected appears in the detection area of the chamber according to the threshold information, and if at least two consecutive values included in the digital signal are greater than the threshold information, determine whether the object to be detected appears in the detection area of the chamber detection object; if at least two consecutive values included in the digital signal are smaller than the threshold information, it is determined that the object to be detected in the detection area of the chamber has flown out of the detection area, and the digital signal obtained by the detection is processed. Stored for analysis. 3. The measuring method of particle diameter according to claim 1, is characterized in that, the described waveform diagram corresponding to described digital signal is analyzed and processed to obtain measurement result, comprising: Preprocessing the waveform graph to obtain a preprocessed waveform graph; Determine whether the object to be detected overlaps according to the number of peaks and troughs of the preprocessed waveform, and obtain a first judgment result; Performing segmentation processing on the overlapping waveforms of the object to be detected according to the first judgment result, to obtain the segmented waveforms; A measurement result is obtained by analyzing the waveform diagram after the segmentation process. 4. The method for measuring particle size according to claim 3, characterized in that, according to the first judgment result, the overlapping waveforms of the objects to be detected are segmented to obtain the segmented waveforms, comprising: : Get the error threshold; Detecting the waveforms of the overlapping objects to be detected to obtain fifth information, where the fifth information includes amplitude information of the waveforms; It is determined according to the fifth information whether the difference in amplitude between the two overlapping objects to be detected is greater than the error threshold, if the difference in amplitude between the two overlapping objects to be detected is greater than the error threshold , then it is judged that there is a difference in the amplitudes between the two objects to be detected, and the first segmentation process is used to segment the waveform; The two-division process divides the waveform graph. 5. a measuring device of particle diameter, is characterized in that, comprises: an acquisition module, configured to acquire first information, where the first information includes an electrical signal acquired by the object to be detected by the parallel light velocity acquisition device; a first processing module, configured to perform digital processing on the electrical signal to obtain a digital signal corresponding to the electrical signal; a second processing module, configured to obtain a waveform diagram corresponding to the digital signal according to the digital signal, where the waveform diagram includes the light scattering intensity of the object to be detected at each moment; The analysis module is configured to analyze and process the waveform corresponding to the digital signal to obtain a measurement result, where the measurement result includes particle size information of the object to be detected. 6. The measuring device of particle size according to claim 5, characterized in that, before the analysis module, comprising: a first obtaining unit, configured to obtain second information, where the second information includes an average value of at least two consecutive lowest values included in each group of digital signals; a first processing unit, configured to obtain threshold information according to the second information and the preset third information; a first judging unit for judging whether an object to be detected appears in the detection area of the chamber according to the threshold information, and if at least two consecutive numerical values included in the digital signal are greater than the threshold information, then judging the chamber The object to be detected appears in the detection area of the chamber; if at least two consecutive values included in the digital signal are less than the threshold information, it is determined that the object to be detected in the detection area of the chamber has flown out of the detection area, and The detected digital signal is stored for analysis. 7. The measuring device of particle size according to claim 5, wherein the analysis module comprises: a second processing unit, configured to preprocess the waveform graph to obtain a preprocessed waveform graph; a second judging unit, configured to judge whether the object to be detected overlaps according to the number of peaks and troughs of the preprocessed waveform diagram, and obtain a first judgment result; a segmentation unit, configured to perform segmentation processing on the overlapping waveform diagrams of the object to be detected according to the first judgment result, to obtain a segmented waveform diagram; An analysis unit, configured to analyze the waveform diagram after the segmentation process to obtain a measurement result. 8. The measuring device of particle size according to claim 7, wherein the dividing unit comprises: a second acquisition unit, configured to acquire an error threshold; a second detection unit, configured to detect the waveforms of the overlapping objects to be detected to obtain fifth information, where the fifth information includes amplitude information of the waveforms; a third judging unit, configured to judge, according to the fifth information, whether the difference in amplitude between the two overlapping objects to be detected is greater than the error threshold, if the amplitude between the two overlapping objects to be detected is greater than If the difference is greater than the error threshold, it is judged that there is a difference in the amplitude between the two objects to be detected, and the first segmentation process is used to segment the waveform; There is no difference in amplitude, and the waveform graph is segmented using a second segmentation process. 9. a measuring device of particle diameter, is characterized in that, comprises: memory for storing computer programs; The processor is configured to implement the steps of the method for measuring particle size according to any one of claims 1 to 4 when executing the computer program. 10. A readable storage medium, characterized in that: a computer program is stored on the readable storage medium, and when the computer program is executed by a processor, the measurement of the particle size as described in any one of claims 1 to 4 is realized steps of the method.

Images