CN115167798B - Quantum dot optical simulation method, device, system and computer readable storage medium - Google Patents
Quantum dot optical simulation method, device, system and computer readable storage medium Download PDFInfo
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Abstract
The application discloses a quantum dot optical simulation method, a quantum dot optical simulation device, a quantum dot optical simulation system and a computer readable storage medium, and relates to the technical field of display. The method comprises the steps of obtaining corresponding characteristic parameters of a display module in a darkroom environment, wherein the characteristic parameters comprise color gamut parameters of the display module in each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module in each quantum dot parameter. And determining target quantum dot parameters corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment. According to the method and the device, the characteristic parameters of the display module can be obtained by setting the plurality of quantum dot parameters on the quantum dot color chips, and the target quantum dot parameters of the product can be determined in advance through simulation calculation on the display module according to the demand information and the characteristic parameters, so that the product development period is effectively shortened, and the product development is more efficient.
Description
Technical Field
The present disclosure relates to the field of display technologies, and in particular, to a quantum dot optical simulation method, device, system, and computer readable storage medium.
Background
In the technical field of display, quantum dot display is an important direction of development of various display technical manufacturers due to the performance advantage of high color saturation, so that the technology is also an innovative technology for laying out next-generation novel display. The principle of the quantum dot display technology is mainly that blue light in the backlight module is transmitted through the quantum dot film to realize color conversion.
Currently, in the design process of products based on quantum dot display technology, certain requirements are required for optical specifications, such as parameters of color gamut, brightness, large visual character bias, etc., so that optical measurement needs to be performed on new products developed to confirm whether the optical specifications are met, and if the optical specifications are not met, each parameter needs to be redesigned to meet the required specifications.
Disclosure of Invention
The application provides a quantum dot optical simulation method, a device, a system and a computer readable storage medium, which accurately simulate quantum dot parameters in a quantum dot display product, such as quantum dot concentration or quantum dot thickness, according to different corresponding quantum dot parameters under optical parameters by measuring the optical parameters of a display module, so that the requirements of the quantum dot display product required by customers are met in advance, and the product development period is effectively shortened.
The technical scheme is as follows:
in a first aspect, a quantum dot optical simulation method is provided, including: acquiring corresponding characteristic parameters of a display module in a darkroom environment, wherein the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and determining target quantum dot parameters corresponding to the requirement information from a plurality of different quantum dot parameters according to the requirement information and the characteristic parameters corresponding to the display module in the darkroom environment. According to the method and the device, the setting of the plurality of quantum dot parameters is carried out on the quantum dot color chips, so that the color gamut parameters of the display module under different quantum dot parameters or the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter can be obtained. Because the display module corresponds to one color gamut parameter or optical parameter under each quantum dot parameter in the plurality of quantum dot parameters, the color gamut parameter or optical parameter required by the product can be combined with the color gamut parameter or optical parameter required by the display module under the plurality of quantum dot parameters, and the quantum dot parameter corresponding to the color gamut parameter or optical parameter required by the product is selected, so that the quantum dot parameter of the color gamut parameter or optical parameter required by the product can be determined in advance through analog calculation of the display module, the product development period is effectively shortened, and the product development is more efficient.
Optionally, the display module includes backlight unit from bottom to top in proper order, and is located the last first quantum dot color chip of backlight unit obtains under the darkroom environment the display module is in each of a plurality of different quantum dot parameters the colour gamut parameter under the quantum dot parameter includes:
acquiring first color coordinate parameters of the first quantum dot color chips under different quantum dot parameters in the display module measured by optical measurement equipment;
acquiring a second color coordinate parameter of the backlight module under each quantum dot parameter measured by optical measurement equipment;
and determining the color gamut parameter of the display module under each quantum dot parameter according to the first color coordinate parameter and the second color coordinate parameter.
Optionally, the optical parameters include half-width parameters or spectrum parameters, and obtaining the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter includes:
and acquiring half-peak width parameters or the frequency spectrum parameters of the first quantum dot color chips measured by the optical measurement equipment under each quantum dot parameter.
Optionally, the method further comprises: and determining the scattering particle concentration corresponding to the requirement information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips by taking the target quantum dot parameter as a quantum dot parameter of a second quantum dot color chip, wherein the second quantum dot color chip is the first quantum dot color chip or other quantum dot color chips except the second quantum dot color chip.
Optionally, the determining, by using the target quantum dot parameter as a quantum dot parameter of a second quantum dot color chip, the concentration of the scattering particles corresponding to the requirement information from a plurality of different concentrations of the scattering particles corresponding to the quantum dot color chip includes:
measuring brightness parameters and large visual angle parameters of the second quantum dot color chip under the concentration of a plurality of scattering particles under the condition that the target quantum dot parameters are taken as quantum dot parameters of the second quantum dot color chip;
and determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large visual angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
Optionally, the first quantum dot color chip is a red quantum dot color chip or a green quantum dot color chip, the backlight module is a blue backlight module, and the wavelength range of blue light of the blue backlight module is 440-470 nm.
Optionally, the quantum dot parameter is the quantum dot concentration, or the thickness of the quantum dot color chip.
In a second aspect, there is provided a quantum dot optical simulation apparatus, the apparatus comprising:
the device comprises an acquisition unit, a display module and a display module, wherein the acquisition unit is used for acquiring corresponding characteristic parameters of the display module in a darkroom environment, the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and the determining unit is used for determining target quantum dot parameters corresponding to the requirement information from a plurality of different quantum dot parameters according to the requirement information and the characteristic parameters corresponding to the display module in the darkroom environment.
In a third aspect, there is provided a quantum dot optical simulation system, the system comprising: the optical measurement device is used for measuring optical characteristics, and the optical measurement device runs the quantum dot optical simulation method.
In a fourth aspect, a processing device is provided, the processing device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the quantum dot optical simulation method described above when executing the computer program.
In a fifth aspect, a computer readable storage medium is provided, in which instructions are stored which, when executed, implement the quantum dot optical simulation method described above.
It will be appreciated that the advantages of the second, third, fourth and fifth aspects may be found in the relevant description of the first aspect and are not repeated here.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a quantum dot optical simulation method provided in an embodiment of the present application;
FIG. 2 is a schematic measurement diagram of a display module according to an embodiment of the disclosure;
FIG. 3 is a graph showing the brightness variation of a display module with different scattering particle concentrations according to an embodiment of the present disclosure;
FIG. 4 is a graph showing the color shift of a display module with a large viewing angle at different scattering particle concentrations according to an embodiment of the present disclosure;
fig. 5 is a graph of quantum dot color chip spectra at different scattering particle concentrations provided in an embodiment of the present application.
Fig. 6 is a schematic diagram of a quantum dot optical simulation device according to an embodiment of the present application.
Wherein, the meanings represented by the reference numerals are respectively as follows:
60. a quantum dot optical simulation device;
601. a measuring unit;
602. a determination unit;
603. and an analog unit.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, the embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
It should be understood that reference herein to "a plurality" means two or more. In the description of the present application, "/" means or, unless otherwise indicated, for example, a/B may represent a or B; "and/or" herein is merely an association relationship describing an association object, and means that three relationships may exist, for example, a and/or B may mean: a exists alone, A and B exist together, and B exists alone. In addition, for the purpose of facilitating the clear description of the technical solutions of the present application, the words "first", "second", etc. are used to distinguish between the same item or similar items having substantially the same function and effect. It will be appreciated by those of skill in the art that the words "first," "second," and the like do not limit the amount and order of execution, and that the words "first," "second," and the like do not necessarily differ.
Before explaining the embodiments of the present application in detail, application scenarios of the embodiments of the present application are described.
Quantum dot display is gradually developing as an innovative technology for the next generation of new display because of excellent color performance advantages. The main mode of quantum dot display is to convert red or green quantum dots through a blue backlight source, and the same as a common display product, the quantum dot display product has certain requirements on optical specifications, such as color gamut, color coordinates, brightness, large visual character bias, half-peak width and other optical parameters, which are determined on the basis of quantum dot parameters (such as quantum dot concentration, thickness of a quantum dot color chip and the like), and the developed new quantum dot display product is required to be subjected to optical measurement so as to confirm whether the quantum dot parameters of the quantum dot display product can reach customer specifications. If the specification is not met, redesign and change are needed to meet the requirements.
Therefore, according to the quantum dot optical simulation method provided by the embodiment of the application, the quantum dot display product is accurately simulated, and the quantum dot parameters required by the quantum dot display product are calculated according to the requirements of the quantum dot display product, so that the development period of the quantum dot display product is effectively shortened.
The following explains in detail a quantum dot optical simulation method provided in the embodiment of the present application.
In the embodiment of the present application, the specific structure of the execution body of the quantum dot optical simulation method is not particularly limited as long as communication can be performed by a quantum dot optical simulation method according to the embodiment of the present application by running a program in which a code of the quantum dot optical simulation method of the embodiment of the present application is recorded. For example, the execution body of the quantum dot optical simulation method provided in the embodiments of the present application may be a functional module in a processing device that can call a program and execute the program, or an apparatus, for example, a chip, applied in the processing device. The following embodiments will take an execution subject of a quantum dot optical simulation method as an example of processing equipment.
Fig. 1 is a schematic diagram of a quantum dot optical simulation method according to an embodiment of the present application, where the method includes:
The optical parameter may be a spectrum parameter of the quantum dot color chip, or may be a half-peak width parameter of the quantum dot color chip.
The requirement information is a product specification required by the quantum dot display product, such as a requirement color gamut parameter of the quantum dot display product. The quantum dot parameter may be the concentration of the quantum dot or the thickness of the quantum dot color chip.
According to the method and the device, the setting of the plurality of quantum dot parameters is carried out on the quantum dot color chips, so that the color gamut parameters of the display module under different quantum dot parameters or the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter can be obtained. Because the display module corresponds to one color gamut parameter or optical parameter under each quantum dot parameter in the plurality of quantum dot parameters, the color gamut parameter or optical parameter required by the product can be combined with the color gamut parameter or optical parameter required by the display module under the plurality of quantum dot parameters, and the quantum dot parameter corresponding to the color gamut parameter or optical parameter required by the product is selected, so that the quantum dot parameter of the color gamut parameter or optical parameter required by the product can be determined in advance through analog calculation of the display module, the product development period is effectively shortened, and the product development is more efficient.
The quantum dot optical simulation method provided by the application can be realized in the following two modes:
mode one: the characteristic parameters include color gamut parameters of the display module under each of a plurality of different quantum dot parameters.
The display module is a detection unit for simulating the quantum dot display product, the structure of the display module is the same as that of the quantum dot display product, the quantum dot display product can be completely simulated, and the quantum dot parameters in the display module can represent the quantum dot parameters of the quantum dot display product.
As an example, the processing device may be an optical metrology device. In this case, the optical measurement device may include an acquisition device and a processor for data processing, in which case the optical measurement device may measure the optical parameters of the display module using the acquisition device and directly process the measured data using the processor.
As another example, the processing device may be a device with processing capabilities other than an optical metrology device, in which case the optical metrology device may not include a processor, or in which case the optical metrology device may send the acquired optical parameters to an externally connected processing device for processing.
Optionally, before step 1, the processing device may send a measurement start instruction to the optical measurement device, so as to trigger the optical measurement device to measure a first color coordinate parameter of the quantum dot color chip in the display module under different quantum dot parameters in the darkroom environment, and a second color coordinate parameter of the backlight module under different quantum dot parameters.
As an example, in the embodiment of the present application, the quantum dot parameters of different portions of the same quantum dot color chip are different, so that the optical measurement device may obtain the first color coordinate parameters under the different quantum dot parameters.
As another example, in the embodiment of the present application, a plurality of display modules may be manufactured in advance, and quantum dot parameters of quantum dot color chips in different display modules are different, but backlight modules in different display modules are the same, and at this time, the optical measurement device may respectively obtain first color coordinate parameters under each quantum dot parameter.
Fig. 2 is a schematic structural diagram of a display module according to an embodiment of the present application, and a schematic measurement diagram in a darkroom environment. The quantum dot color chip is attached to the first side of the glass substrate, and the quantum dot color chip is located above the backlight module, in other words, the quantum dot color chip is located between the glass substrate and the backlight module. The optical measurement device is located above the second side of the glass substrate and is used for collecting optical parameters, such as color coordinate parameters, of the display module. It will be appreciated that the second side may be considered to be the front side of the glass substrate and the first side may be considered to be the back side of the glass substrate, i.e. the back side of the glass substrate opposite the optical measuring device.
As an example, the quantum dot parameter may be the quantum dot concentration, or the thickness of the quantum dot color chip. The first color coordinate parameter is a color coordinate parameter of the quantum dot color chip measured by the optical measuring equipment.
It should be noted that, when the processing device is not an optical metrology device, step 101 may be implemented by: the processing equipment acquires first color coordinate parameters of the quantum dot color chips in the display module measured by the optical measurement equipment in the darkroom environment under different quantum dot parameters from the optical measurement equipment. For example, the optical measurement device may actively transmit to the processing device after measurement.
And 2, the processing equipment acquires second color coordinate parameters of the backlight module in the display module measured by the optical measuring equipment in the darkroom environment under each quantum dot parameter.
And 3, the processing equipment determines the color gamut parameter of the display module under each quantum dot parameter according to the first color coordinate parameter and the second color coordinate parameter.
As an example, the backlight module is generally a blue backlight, and the quantum dot color chips are green or red, and after the blue backlight emits blue light, the blue backlight is converted by the red or green quantum dot color chips to form color. The color coordinates of blue light emitted by the blue backlight source, namely the second color coordinate parameter, and the color coordinates of the quantum dot color chips, namely the first color coordinate parameter, are collected through the optical measuring equipment, and are subjected to analog calculation through the processing equipment, so that the color gamut parameters can be obtained.
And 4, the optical measurement equipment determines quantum dot parameters corresponding to the required color gamut parameters according to the required color gamut parameters and the color gamut parameters of the display module under the plurality of quantum dot parameters.
The display module can simulate the quantum dot display product, and according to the color gamut parameters required by the customer or the product and the color gamut parameters under each calculated quantum dot parameter, the quantum dot parameters which accord with the color gamut parameters required by the customer or the product, such as the concentration of the quantum dots or the thickness of the quantum dot color chips, are determined.
In the first embodiment, the backlight module is a MiniBlue light emitting diode backlight or a micropump light emitting diode backlight, the quantum dot color chips are red or green quantum dot color chips, the quantum dot parameters are taken as examples of the quantum dot concentration, and the red or green quantum dot color chips are arranged above the MiniBlue light emitting diode backlight or the micropump light emitting diode backlight to manufacture the display module. The concentration range of the quantum dots on the red or green quantum dot color chips is 5% -20%, namely, different parts of the red or green quantum dot color chips respectively correspond to one quantum dot concentration. Take four quantum dot concentrations of 5%, 10%, 15% and 20% as examples. In one embodiment of the present application, the display module may be opaque and placed in a darkroom environment for measurement. The optical measurement equipment respectively measures the quantum dot color chips and the backlight module to obtain color coordinate parameters of the quantum dot color chips and the backlight module. The processing equipment calculates and processes the two groups of color coordinate parameters to obtain color gamut parameters of the display module at the four quantum dot concentrations of 5%, 10%, 15% and 20% respectively. Such as color gamut parameter a, color gamut parameter B, color gamut parameter C, and color gamut parameter D. When the required color gamut parameter of the quantum dot display product is the color gamut parameter B, the optical measurement equipment analyzes and calculates that the concentration of the conforming quantum dots is 10 percent according to the required color gamut parameter.
Optionally, if the calculated difference between the color gamut parameter X of the display module and the required color gamut parameter is within the preset range, the quantum dot concentration corresponding to the color gamut parameter X may be considered as the quantum dot parameter corresponding to the required color gamut parameter.
Alternatively, when the required color gamut parameter is a range value (interval value), if the calculated color gamut parameter X of the display module is within the numerical range of the required color gamut parameter, the quantum dot density corresponding to the color gamut parameter X within the numerical range may be determined as the quantum dot parameter corresponding to the required color gamut parameter.
In the second embodiment, taking the quantum dot parameter as the thickness of the quantum dot color chip as an example, the thickness of the quantum dot color chip is generally set to be in the range of 0.5nm to 10nm. For example, the thickness of four quantum dot color patches is set: 0.5nm, 2.5nm, 5nm and 10nm. And the optical measurement equipment performs optical measurement on the backlight module and the quantum dot color chips in the display module to obtain color coordinate parameters of the quantum dot color chips and the backlight module. The processing equipment calculates two groups of color coordinate parameters to obtain color gamut parameters of the display module group under the conditions of the thicknesses of the four quantum dot color chips of 0.5nm, 2.5nm, 5nm and 10nm, wherein the color gamut parameters are color gamut parameter A, color gamut parameter B, color gamut parameter C and color gamut parameter D. When the required color gamut parameter of the quantum dot display product is the color gamut parameter C, the optical measurement equipment analyzes and calculates according to the required color gamut parameter to obtain the conforming quantum dot color chip with the thickness of 5nm.
It should be noted that, the foregoing taking the quantum dot parameter as the thickness of the quantum dot color chip or the quantum dot parameter as the quantum dot concentration is an example, and of course, the quantum dot parameter may also be a combination of the thickness of the quantum dot color chip and the quantum dot parameter as the quantum dot concentration, where the processing device may select a quantum dot parameter whose thickness and quantum dot concentration both meet the required color gamut parameter. In one embodiment of the present application, the target quantum dot parameter is used as a quantum dot parameter of a second quantum dot color chip, and the concentration of the scattering particles corresponding to the demand information is determined from a plurality of different scattering particle concentrations corresponding to the quantum dot color chip, where the second quantum dot color chip is the first quantum dot color chip or other quantum dot color chips except the second quantum dot color chip.
Taking a quantum dot parameter meeting the requirement color gamut parameter as a quantum dot parameter X as an example, adding scattering particles into a quantum dot color chip based on the quantum dot parameter X after the quantum dot parameter X is selected, and setting different scattering particle concentrations. Specifically, when different positions of the same quantum dot color chip correspond to one quantum dot parameter, scattering particles with different concentrations are added to the target position. The quantum dot parameter of the target part is quantum dot parameter X. Specifically, in order to facilitate the measurement of the luminance parameter and the large viewing angle parameter of the display module at each scattering particle concentration in the later period, the target region may be divided into different regions, and then the concentrations of the scattering particles added in the different regions are different.
As an example, step 4 determines that the quantum dot concentration of the demand color gamut parameter is 5%, and on the basis of the quantum dot concentration being 5%, scattering particles with different concentrations are added, and the concentration of the scattering particles is generally in the range of 0-20%. And the optical parameters of the display module under each scattering particle concentration, such as brightness parameters, large-viewing-angle color cast parameters and the like, are measured by the optical measurement equipment, and the scattering particle concentration meeting the required color gamut parameters is selected from the measured multiple groups of data.
Optionally, under the condition that the target quantum dot parameter is taken as the quantum dot parameter of the second quantum dot color chip, measuring the brightness parameter and the large visual angle parameter of the second quantum dot color chip under the concentration of a plurality of scattering particles. And determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large visual angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
In one possible implementation manner of the present application, determining, according to a quantum dot parameter corresponding to a required color gamut parameter, a scattering particle concentration corresponding to the required color gamut parameter from a plurality of scattering particle concentrations corresponding to quantum dot color patches includes: under the condition that quantum dot parameters corresponding to the required color gamut parameters are determined, the processing equipment acquires brightness parameters and large visual angle parameters of the display module measured by the optical measuring equipment under the concentration of each scattering particle; and the processing equipment determines the scattering particle concentration corresponding to the required color gamut parameter according to the brightness parameter and the large-viewing-angle color cast parameter under the plurality of scattering particle concentrations.
The quantum dot display product has the optimal value of the luminance parameter and the large-view color cast parameter on the premise of the required color gamut parameter, and the concentration of the scattering particles when the optimal value of the luminance parameter and the large-view color cast parameter exists can be understood to be the concentration of the scattering particles corresponding to the required color gamut parameter. In the third embodiment, taking the quantum dot parameter as the quantum dot concentration as an example, after determining the quantum dot concentration matched with the required color gamut parameter, the scattering particle concentration of the quantum dot color chip is adjusted, that is, scattering particles with different concentrations are set, for example, the concentrations of the scattering particles are respectively: concentration A, concentration B, concentration C, concentration D and concentration E, wherein concentration A < concentration B < concentration C < concentration D < concentration E. The brightness of the display module and the data of the large visual character bias are measured under five concentrations by the optical measuring equipment.
Fig. 3 is a graph showing the brightness change of the display module at different viewing angles with five different scattering particle concentrations. In fig. 3, the concentration a is low, and it can be seen that the brightness of the left and right viewing angles of the display module is asymmetric (i.e. the brightness of the left and right viewing angles is not uniform in attenuation degree and is fast in attenuation), and the light pattern is poor. When the scattering particle concentration is increased to the concentration B, the luminance situation corresponding to the concentration B is slightly improved compared to the luminance situation corresponding to the concentration a. As can be seen from fig. 3, the brightness of the left and right viewing angles of the display module is relatively good when the concentration of the scattering particles is from C to E, that is, the degree of attenuation of the left and right brightness is also small. Alternatively, as can be seen from fig. 3, the display module has symmetric left and right brightness when the concentration is the concentration D, and the degree of attenuation of the left and right brightness is small at a large viewing angle, and the optimal scattering particle concentration can be determined as the concentration D because the brightness is too small at the concentration E.
Fig. 4 shows graphs of the change in apparent angular bias at different scattering particle concentrations. Similar to the brightness parameter, the slower the left-right visual character bias attenuation of the display module is, the better the left-right change is, and the more symmetrical the left-right change is. As can be seen from fig. 4, the display module has the smallest color change under the left and right viewing angles, and the two sides are most symmetrical curves of the concentration D, so that the color bias of the large viewing angle is best when the concentration of the scattering particles is the concentration D.
In one embodiment of the present application, the required color gamut parameter is used to determine a required half-width parameter, and the method provided in the embodiment of the present application may further include: the processing equipment acquires half-peak width parameters of the quantum dot color chips measured by the optical measuring equipment under each quantum dot parameter. And the processing equipment determines the quantum dot parameters corresponding to the required half-peak width parameters according to the required half-peak width parameters and the half-peak width parameters under each quantum dot parameter. The half-width parameter is used for reflecting the performance of the display module.
Mode two: and acquiring optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter. And acquiring half-peak width parameters or the frequency spectrum parameters of the first quantum dot color chips measured by the optical measurement equipment under each quantum dot parameter.
In the fourth embodiment, the smaller the half-width parameter is, the better the performance of the display module. The required color gamut parameters can be converted to obtain the required half-peak width parameters. Taking quantum dot parameters as an example of quantum dot concentration, four quantum dot concentrations of 5%, 10%, 15% and 20% are set. The optical measurement equipment measures the display module to obtain half-width parameters of the display module at the four quantum dot concentrations of 5%, 10%, 15% and 20% respectively. And comparing the half-peak width parameters with the half-peak width parameters obtained by calculation under different concentrations according to the required half-peak width parameters of the product, and selecting the quantum dot concentration when the half-peak width parameters are minimum.
In the fifth embodiment, taking the quantum dot parameter as the concentration of the quantum dots as an example, fig. 5 shows the spectrograms QD-G of the green quantum dot color chip and the spectrograms QD-R of the red quantum dot color chip under different quantum dot concentrations, where the spectrum principle is the same as the half-peak width parameter, and the required color gamut parameter can obtain the required spectrum parameter through conversion. Different quantum dot concentrations are set, for example, the quantum dot concentration is a-d, or the quantum dot concentration is e-h, as shown in fig. 5, the optical measurement device measures the quantum dot color chips, and a spectrum parameter curve of the quantum dot color chips under different quantum dot concentrations is obtained. And according to the spectrum parameters required by the product, comparing the spectrum parameters with the spectrum parameters under different concentrations obtained by calculation, and selecting the quantum dot concentration meeting the required spectrum parameters. In one embodiment of the present application, the quantum dot color chips are red quantum dot color chips, or green quantum dot color chips. The backlight module is a blue backlight module, and the wavelength range of blue light of the blue backlight module is 440-470 nm.
The red quantum dot color chips and the green quantum dot color chips are respectively measured, and the display module is formed by a blue backlight source. The specific wavelength value of the blue light of the blue backlight source is determined according to different quantum absorption spectrums.
Before step 101, the display module performs light-tight processing, including sealing the quantum dot color chips with a black tape. In the measurement schematic diagram of the display module shown in fig. 2 in the darkroom environment, the darkroom environment is light-tight, and besides, the display module itself is light-tight, as shown in fig. 2, the periphery of the quantum dot color chip is sealed by a black adhesive tape.
It should be noted that, the display module in the embodiment of the application is formed by spreading the quantum dot color chip on the glass substrate by coating or ink-jet printing, and exposing, developing and baking the quantum dot color chip and the glass substrate to form the backlight module.
An embodiment of the present application provides a quantum dot optical simulation device 60, as shown in fig. 6, including: the obtaining unit 601 is configured to obtain a characteristic parameter corresponding to the display module in a darkroom environment. The characteristic parameters include color gamut parameters of the display module under each quantum dot parameter of the plurality of different quantum dot parameters, or optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter. The determining unit 602 is configured to determine, according to the requirement information and the characteristic parameters corresponding to the display module in the darkroom environment, a target quantum dot parameter corresponding to the requirement information from a plurality of different quantum dot parameters.
The embodiment of the application provides a quantum dot optical simulation system, which comprises: optical measurement equipment and a display module. The optical measuring device is used for measuring optical parameters. The optical measurement device runs the quantum dot optical simulation method.
The processing device comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the quantum dot optical simulation method is realized when the processor executes the computer program. For example, in the steps 101 to 102, the processing device may be an optical measurement device.
The processor may be a central processing unit (Central Processing Unit, CPU), but may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), off-the-shelf programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. The general purpose processor may be a microprocessor or may be any conventional processor.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. With such understanding, the present application implements all or part of the flow of the above-described method embodiments, and may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and where the computer program, when executed by a processor, may implement the steps of the above-described method embodiments. Wherein the computer program comprises computer program code which may be in the form of source code, object code, executable files or in some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing apparatus/terminal device, recording medium, computer Memory, ROM (Read-Only Memory), RAM (Random Access Memory ), CD-ROM (Compact Disc Read-Only Memory), magnetic tape, floppy disk, optical data storage device, and so forth. The computer readable storage medium mentioned in the present application may be a non-volatile storage medium, in other words, a non-transitory storage medium.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (9)
1. A quantum dot optical simulation method, comprising:
acquiring corresponding characteristic parameters of a display module in a darkroom environment, wherein the display module sequentially comprises a backlight module and a first quantum dot color chip positioned on the backlight module from bottom to top, wherein the first quantum dot color chip is a red quantum dot color chip or a green quantum dot color chip, the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter, and the optical parameters comprise half-peak width parameters or frequency spectrum parameters;
according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment, determining target quantum dot parameters corresponding to the demand information from a plurality of different quantum dot parameters, wherein the quantum dot parameters are quantum dot concentration or thickness of a quantum dot color chip.
2. The method of claim 1, wherein obtaining the color gamut parameter of the display module under each of a plurality of different quantum dot parameters in the darkroom environment comprises:
acquiring first color coordinate parameters of the first quantum dot color chips under different quantum dot parameters in the display module measured by optical measurement equipment;
acquiring a second color coordinate parameter of the backlight module under each quantum dot parameter measured by optical measurement equipment;
and determining the color gamut parameter of the display module under each quantum dot parameter according to the first color coordinate parameter and the second color coordinate parameter.
3. The method of claim 1, wherein obtaining optical parameters of a first quantum dot color chip in the display module at each of the quantum dot parameters comprises:
and acquiring half-peak width parameters or the frequency spectrum parameters of the first quantum dot color chips measured by the optical measurement equipment under each quantum dot parameter.
4. A method according to any one of claims 1 to 3, further comprising:
and determining the scattering particle concentration corresponding to the requirement information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips by taking the target quantum dot parameter as a quantum dot parameter of a second quantum dot color chip, wherein the second quantum dot color chip is the first quantum dot color chip or other quantum dot color chips except the second quantum dot color chip.
5. The method of claim 4, wherein the determining the scattering particle concentration corresponding to the demand information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips with the target quantum dot parameter as a quantum dot parameter of a second quantum dot color chip comprises:
measuring brightness parameters and large visual angle parameters of the second quantum dot color chip under the concentration of a plurality of scattering particles under the condition that the target quantum dot parameters are taken as quantum dot parameters of the second quantum dot color chip;
and determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large visual angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
6. The quantum dot optical simulation method according to any one of claims 1 to 3, wherein the backlight module in the display module is a blue backlight module, and the wavelength of blue light of the blue backlight module ranges from 440 nm to 470nm.
7. A quantum dot optical simulation device, the device comprising:
the device comprises an acquisition unit, a display module and a spectrum display unit, wherein the acquisition unit is used for acquiring corresponding characteristic parameters of the display module in a darkroom environment, the display module sequentially comprises a backlight module and a first quantum dot color chip positioned on the backlight module from bottom to top, the first quantum dot color chip is a red quantum dot color chip or a green quantum dot color chip, the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters, or optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter, and the optical parameters comprise half-peak width parameters or spectrum parameters;
and the determining unit is used for determining target quantum dot parameters corresponding to the requirement information from a plurality of different quantum dot parameters according to the requirement information and the characteristic parameters corresponding to the display module in the darkroom environment, wherein the quantum dot parameters are quantum dot concentration or quantum dot color chip thickness.
8. A quantum dot optical simulation system, the system comprising: the optical measurement device is used for measuring optical characteristics, and the optical measurement device runs the quantum dot optical simulation method according to any one of claims 1-6.
9. A computer readable storage medium having instructions stored therein which, when executed, implement the quantum dot optical simulation method of any one of claims 1-6.
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