CN115129532B - Storage test equipment and hot-swap test device thereof - Google Patents

Abstract

The application discloses a storage test device and a hot plug test device thereof, which are applied to the technical field of product test and comprise: the mainboard to be tested is provided with N slots for connecting N interface cards, a switching circuit and a controller; the hot-plug adapter board is connected with the main board to be tested, the switch circuit is controlled to be in an off state after entering a test mode, and an ith level control signal is sent to the controller when an ith control instruction is received; the switch circuit is in a conducting state when in a default state so as to connect the controller and each slot position; the controller is respectively connected with the N slots, and when the ith level control signal is received, the level state of the target pin of the ith slot is controlled to perform hot plug testing on the ith slot. By applying the scheme of the application, each interface card is not required to be plugged and unplugged, the hot plug function of each interface card can be conveniently and efficiently tested, the test efficiency is improved, and the interface damage caused by repeated plugging and unplugging can be avoided.

Description

Storage test equipment and hot-swap test device thereof

Technical Field

The present invention relates to the technical field of product testing, and in particular to a storage testing device and a hot plug testing apparatus thereof.

Background technique

In the field of large data volume and high-speed storage, massive data transmission requires a large bandwidth and number of interfaces. Under the ultra-high transmission rate, the number and types of interface cards supported by the equipment increase accordingly, and the accompanying problem is how to ensure stable and reliable operation of many boards. Therefore, it is necessary to timely and effectively discover the existing risks and problems in the R&D stage, which means that a large number of tests are needed to ensure the quality of the test while improving work efficiency.

Among them, the "hot-swap function" test of the device's interface card is an important test item. However, since the storage device supports a large number of interface cards, plug-and-unplug testing one by one leads to low work efficiency, which is not conducive to shortening the product test cycle and increases development costs.

In summary, how to test the hot-swap function of each interface card more conveniently and efficiently is a technical problem that those skilled in the art need to solve urgently.

Summary of the invention

The object of the present invention is to provide a storage test device and a hot-plug test apparatus thereof, so as to test the hot-plug function of each interface card more conveniently and efficiently.

In order to solve the above technical problems, the present invention provides the following technical solutions:

A hot-swap test device comprises: a hot-swap adapter board and a mainboard to be tested, wherein the mainboard to be tested is provided with N slots, a switch circuit and a controller;

The N slots are used to connect N interface cards in sequence;

The hot-swap adapter board is connected to the motherboard to be tested, and is used to control the switch circuit to be in an off state after entering the test mode, and send an i-th level control signal to the controller when receiving the i-th control instruction; N and i are both positive integers and 1≤i≤N;

The switch circuit is connected to the N slots and the controller respectively, and is used to: be in a conducting state in a default state, so that the controller is connected to each slot through the switch circuit;

The controller is connected to N slots respectively, and is used to: when receiving the i-th level control signal, control the level state of the target pin of the i-th slot among the N slots, so as to perform a hot plug test on the i-th slot.

Preferably, the mainboard to be tested is provided with a first connector, and the first connector is connected to the controller and the switch circuit respectively; the hot-swap adapter is provided with a second connector and N control buttons;

The second connector is connected to the first connector and is used to: after the hot-swap adapter enters the test mode, control the switch circuit to be in an off state through the first connector; and when receiving an i-th level control signal, send the i-th level control signal to the controller through the first connector;

The N control buttons are used to: when the i-th control button is switched from a default state to a non-default state under a user operation, confirm receipt of the i-th control instruction and send an i-th level control signal to the second connector.

Preferably, the hot-swap adapter board is also provided with N information prompting devices;

N information prompting devices are connected to N control buttons in sequence. When the i-th control button is in a non-default state, the i-th information prompting device connected to the i-th control button outputs prompting information.

Preferably, the hot-swap adapter board is also provided with a display device;

The display device is connected to N control buttons, and when any one or more control buttons are in a non-default state, the numbers of the control buttons currently in the non-default state are displayed.

Preferably, it also includes: N isolating switches, an isolating switch controller, and a self-test device;

The i-th isolation switch is arranged between the second connector and the i-th control button;

The self-test device is used to: detect the state of the hot-swap adapter board after the hot-swap adapter board is powered on, and send a self-test pass signal to the isolation switch controller when the detection passes;

The isolating switch controller is used to control N isolating switches that are in the off state by default to switch to the on state after receiving the self-test pass signal.

Preferably, the N isolation switches are all MOS tubes.

Preferably, the switch circuit is a switch circuit provided with an enable end, and the hot-swap adapter board is specifically used to: after entering the test mode, control the switch circuit to an off state through the enable end of the switch circuit.

Preferably, it also includes:

An electrostatic protection device is arranged between the hot-swap adapter board and the controller.

Preferably, when the mainboard to be tested is provided with a first connector for connecting the hot-swappable adapter board, the electrostatic protection device includes a plurality of electrostatic protection units, and one of the electrostatic protection units is provided on each line between the first connector and the controller.

A storage testing device comprises the hot-swap testing apparatus as described above.

The technical solution provided by the embodiment of the present invention is applied. A hot-swappable adapter board is provided to improve work efficiency. Specifically, when the i-th control instruction is received, the hot-swappable adapter board can send the i-th level control signal to the controller in the motherboard to be tested, and the controller is respectively connected to N slots, and can control the level state of the target pin of the i-th slot among the N slots when the i-th level control signal is received, thereby performing a hot-swappable test on the i-th slot. It can be seen that the solution of the present application does not require the staff to plug and unplug the interface card, but only needs to operate the hot-swappable adapter board so that the hot-swappable adapter board receives the corresponding control instruction, and the controller in the motherboard to be tested can control the level state of the target pin of the corresponding slot among the N slots, that is, the plug-in and unplug operation of the interface card is simulated, and the hot-swappable test of the interface card in the corresponding slot is realized. In addition, the present application takes into account that in some cases, when an interface card is inserted into a slot, if the switch circuit is in the on state, as long as the interface card is not removed, the corresponding pin in the slot will always be pulled low, that is, the controller cannot control the level state of the target pin of the slot according to the requirements of the received level control signal. Therefore, in the scheme of the present application, the hot-swap adapter board is connected to the motherboard to be tested, and after entering the test mode, the switch circuit will be controlled to be in the off state, so that the pins related to plugging and unplugging in each interface card will not be fixedly pulled low, that is, the target pin will not be fixedly pulled low, thereby ensuring that the hot-swap test of the present application can be effectively executed.

To sum up, in the scheme of the present application, the staff does not need to plug and unplug each interface card one by one to test the hot-swap function. Instead, they only need to operate the hot-swap adapter board to conveniently and efficiently test the hot-swap function of each interface card, thereby improving the test efficiency and avoiding interface damage caused by multiple plugging and unplugging.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

FIG1 is a schematic diagram of the structure of a hot-swap test device in the present invention;

FIG2 is a schematic diagram of the structure of a hot-swap test device in a specific embodiment of the present invention;

FIG3 is a schematic diagram of the structure of a hot-swap test device in another specific implementation manner of the present invention.

Detailed ways

The core of the present invention is to provide a hot-swap test device. The staff does not need to plug and unplug each interface card in turn to test the hot-swap function. Instead, they only need to operate the hot-swap adapter board to conveniently and efficiently test the hot-swap function of each interface card, thereby improving the test efficiency and avoiding interface damage caused by multiple plugging and unplugging.

In order to enable those skilled in the art to better understand the scheme of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

Please refer to FIG. 1 , which is a schematic diagram of the structure of a hot-swap test device in the present invention, the hot-swap test device comprising: a hot-swap adapter board 20 and a motherboard to be tested 10, the motherboard to be tested 10 is provided with N slots, a switch circuit 11 and a controller 12;

N slots are used to connect N interface cards in sequence;

The hot-swap adapter board 20 is connected to the motherboard to be tested 10, and is used to control the switch circuit 11 to be in an off state after entering the test mode, and send an i-th level control signal to the controller 12 when receiving the i-th control instruction; N and i are both positive integers and 1≤i≤N;

The switch circuit 11 is connected to the N slots and the controller 12 respectively, and is used to: in a default state, be in an on state, so that the controller 12 is connected to each slot through the switch circuit 11;

The controller 12 is connected to the N slots respectively, and is used to control the level state of the target pin of the i-th slot among the N slots when receiving the i-th level control signal, so as to perform a hot plug test on the i-th slot.

Specifically, in the solution of the present application, a hot-swap adapter board 20 is provided, so that the "hot-swap function" test of the mainboard 10 to be tested can be performed conveniently and efficiently.

The mainboard 10 to be tested is provided with N slots, where N is a positive integer. The specific value can be set as required, and is usually a positive integer not less than 2 in practical applications.

The N slots are respectively connected to N interface cards, and the specific type of each interface card can be set and selected as needed, for example, an OCP (Open Computing Project) interface card that supports protocols such as PCIE (Peripheral Component Interconnect Express, a high-speed serial computer expansion bus standard).

In the scheme of the present application, in order to facilitate hot-swap testing, after the hot-swap adapter board 20 is connected to the motherboard 10 to be tested, the staff only needs to operate the hot-swap adapter board 20. That is, the scheme of the present application does not require plugging and unplugging the interface card, but realizes the simulation of "plugging and unplugging the interface card", thereby improving the test efficiency. And because there is no need to plug and unplug the interface card, in the case of batch testing, interface damage caused by multiple plugging and unplugging can be avoided.

It should be noted that, since the solution of the present application does not require the plugging and unplugging of the interface card, in actual applications, for a certain slot, during the hot-plug test, the slot may not have an interface card inserted in the entire process, or the slot may always have an interface card inserted in the process of the hot-plug test. Of course, in more cases, during the hot-plug test, each slot always has an interface card inserted.

If an interface card is always inserted in a certain slot during the hot-swap test, considering that the hot-swap test of the interface card is usually performed through the PRSNT pin, when the interface card is not inserted into the slot, the PRSNT pin on the slot is in a high level state, on the contrary, when the interface card is inserted into the slot, the pin on the slot will be grounded through the CPLD, that is, it will always be pulled low. Therefore, in order to enable the solution of the present application to still simulate "plugging and unplugging the interface card" when the interface card is always inserted in the slot, the present application sets a switch circuit 11 connected to N slots and the controller 12 respectively.

Taking slot 1 in FIG. 1 as an example, if the switch circuit 11 is not set, after the interface card is inserted into slot 1, the hot-swap test pin PRSNT_1 of slot 1 will be grounded through the controller 12, that is, the pin is pulled low, resulting in the inability to increase the pin level. The switch circuit 11 is in the on state in the default state, so that the controller 12 can be connected to each slot through the switch circuit 11, that is, when the hot-swap test is not performed, the switch circuit 11 is in the default on state, so that it will not affect the original function of the motherboard 10 to be tested, and the corresponding pins of the controller 12 can be normally connected to each slot.

When a hot-swap test is required, that is, after the hot-swap adapter board 20 is connected to the motherboard 10 to be tested, the test mode can be entered, and the switch circuit 11 can be controlled to be in the off state. Since the switch circuit 11 is in the off state, the hot-swap test pin PRSNT_1 of slot 1 in the above example will not be always pulled low, so that the solution of the present application can control the level of the pin to implement the hot-swap test.

When the hot-swap adapter board 20 receives the i-th control instruction, it indicates that the hot-swap test of the i-th slot needs to be performed, and therefore, the i-th level control signal can be sent to the controller 12. Since it is necessary to implement the simulation of the "plug-in interface card", in the scheme of the present application, it is necessary to specially set up relevant lines, that is, it is necessary to connect the controller 12 to the N slots, and it can be understood that, for example, when the controller 12 is connected to the PRSNT_1 pin of slot 1 through pin A, pin A can be connected to a high level or to ground under the control of the controller 12, so that the controller 12 controls the level state of the PRSNT_1 pin of slot 1 through pin A, that is, the controller 12 can control the power-on or power-off of the first slot, thereby implementing the hot-swap test for the first slot.

The controller 12 in the motherboard 10 to be tested of the present application can generally be a CPLD (Compex Programmable Logic Device). When the controller 12 receives the i-th level control signal, it controls the level state of the target pin of the i-th slot to perform a hot plug test on the i-th slot. The target pin is the pin in the i-th slot used to indicate whether the i-th slot is inserted with an interface card. For example, PRSNT_1 and PRSNT_2 shown in FIG. 1 are the target pins of the 1st slot and the 2nd slot, respectively.

When controlling the level state of the target pin of the i-th slot, whether it is controlled to be a high level or a low level can be set as needed, which does not affect the implementation of the present invention. Of course, it is usually controlled to be a high level.

For example, in one case, during the hot-swap test, if an interface card is always inserted in the first slot, when the controller 12 does not perform control, the PRSNT_1 pin is at a low level, and when the controller 12 receives the first level control signal, it will control the PRSNT_1 pin of the first slot to a high level state, that is, simulate the interface card in the first slot to be pulled out, and implement the hot-swap test for the first slot. In another case, during the hot-swap test, if no interface card is always inserted in the first slot, when the controller 12 does not perform control, the PRSNT_1 pin is at a high level state, and when the controller 12 receives the first level control signal, it will control the PRSNT_1 pin of the first slot to a low level state, that is, simulate the interface card in the first slot to be inserted, so as to perform the hot-swap test for the first slot.

In addition, it should be noted that whether the controller 12 receives the i-th level control signal affects the level state of the target pin of the i-th slot, thereby realizing the hot-swap test of the i-th slot. During the hot-swap test, the staff can confirm whether the hot-swap test of the i-th slot is passed by observing the display light on the mainboard, or the display light on the interface card, or by other setting methods. For example, in the above example, the interface card is always inserted in the first slot. When the controller 12 does not control, the PRSNT_1 pin is low level, and the indicator light on the interface card is on. When the controller 12 receives the first level control signal, the PRSNT_1 pin of the first slot is controlled to be high level, that is, the interface card of the first slot is simulated to be pulled out. At this time, the indicator light on the interface card is not on, indicating that the interface card is pulled out, and the mainboard 10 to be tested does not find any abnormality, which means that the hot-swap test of the first slot is passed. On the contrary, after the controller 12 receives the first level control signal, if the staff observes that the indicator light on the interface card is still on, it can be considered that the hot-swap test of the first slot has not passed.

The specific structure of the hot-swap adapter board 20 of the present application can be set according to actual needs, as long as the functions of the hot-swap adapter board 20 of the present application can be realized.

For example, in a specific embodiment of the present invention, referring to FIG. 2 , a first connector is provided in the mainboard 10 to be tested, and the first connector is connected to the controller 12 and the switch circuit 11 respectively; a second connector and N control buttons 21 are provided in the hot-swap adapter board 20;

The second connector is connected to the first connector, and the second connector is used to: after the hot-swap adapter board 20 enters the test mode, control the switch circuit 11 to be in the off state through the first connector; when receiving the i-th level control signal, send the i-th level control signal to the controller 12 through the first connector;

The N control buttons 21 are used to: when the i-th control button 21 is switched from a default state to a non-default state under a user operation, confirm receipt of the i-th control instruction and send an i-th level control signal to the second connector.

In this embodiment, a second connector and N control buttons 21 are provided in the hot-swappable adapter board 20. It can be seen that the i-th control button 21 corresponds to the i-th slot. Each control button 21 can be set as a control button 21 in a pop-up state by default. When the i-th control button 21 is pressed by the user, that is, the i-th control button 21 is switched from the default state to the non-default state under the user's operation, the hot-swappable adapter board 20 at this time can be regarded as receiving the i-th control instruction. At this time, since the i-th control button 21 is pressed by the user, the i-th level control signal will be sent to the first connector in the motherboard 10 to be tested through the second connector, so that the controller 12 receives the i-th level control signal, and then controls the level state of the target pin of the i-th slot to perform a hot-swap test on the i-th slot.

After the hot-swap adapter board 20 enters the test mode, the control of the switch circuit 11 to the off state is also realized by the first connector and the second connector. There can be multiple triggering methods for the hot-swap adapter board 20 to enter the test mode. For example, as long as the hot-swap adapter board 20 is powered on and connected to the motherboard 10 to be tested, the hot-swap adapter board 20 automatically enters the test mode. As long as the hot-swap adapter board 20 is not unplugged, the hot-swap adapter board 20 will control the switch circuit 11 to the off state through the second connector and the first connector.

There are also many ways to control the switch circuit 11 to be in the off state. In practical applications, considering that the control through the enable end is more convenient, the switch circuit 11 can be a switch circuit 11 provided with an enable end. The hot-swap adapter board 20 can control the switch circuit 11 to be in the off state through the enable end of the switch circuit 11 after entering the test mode. BUF_EN shown in FIG. 2 is the enable end of the switch circuit 11.

As described above, the user can determine whether the hot-swap test of the corresponding slot has passed by observing whether the indicator light on the interface card is on. In a specific embodiment of the present invention, considering that the slot or interface card in some occasions may not be provided with an indicator light, in order to enable the staff to easily know the hot-swap test result, N information prompt devices can also be provided in the hot-swap adapter board 20;

The N information prompting devices are connected to the N control buttons 21 in sequence. When the i-th control button 21 is in a non-default state, the i-th information prompting device connected to the i-th control button 21 outputs prompting information.

In this embodiment, N information prompting devices are provided in the hot-swap adapter board 20. Considering the cost and reliability, N LED indicator lights can usually be selected as the N information prompting devices. In this way, when the user presses the i-th control button 21, the i-th information prompting device connected to the i-th control button 21 will light up, prompting the user that the hot-swap test of the i-th slot is being performed. In addition, if the i-th information prompting device lights up normally, it can be explained that the i-th level control signal is successfully sent to the motherboard 10 to be tested, which can be explained that the corresponding circuit is normal. In the embodiment of Figure 2 of the present application, the N information prompting devices are selected as N LEDs 22.

In a specific embodiment of the present invention, a display device is also provided in the hot-swap adapter board 20;

The display device is connected to all N control buttons 21 , and when any one or more control buttons 21 are in a non-default state, the numbers of the control buttons 21 currently in the non-default state are displayed.

In the aforementioned embodiment, N information prompting devices are provided. In this embodiment of the present invention, considering that when the value of N is large, the number of information prompting devices required is large, this embodiment provides a single display device, which can be, for example, a display screen, so that when any one or more control buttons 21 are in a non-default state, the display device can display the numbers of the control buttons 21 that are currently in a non-default state, for example, if the displayed control buttons 21 are numbered 1, 3, 5, it means that the user currently presses the first control button 21, the third control button 21, and the fifth control button 21.

In a specific embodiment of the present invention, referring to FIG. 3 , it may further include: N isolating switches 23 , an isolating switch controller, and a self-test device;

The i-th isolation switch 23 is disposed between the second connector and the i-th control button 21;

The self-test device is used to detect the state of the hot-swap adapter board 20 after the hot-swap adapter board 20 is powered on, and send a self-test pass signal to the isolation switch controller when the detection passes;

The isolating switch controller is used to control N isolating switches 23 that are in the off state by default to switch to the on state after receiving the self-test pass signal.

This implementation takes into account that if the electrical connection between the hot-swap adapter board 20 and the mainboard to be tested 10 is directly opened after the hot-swap adapter board 20 is powered on, the mainboard to be tested 10 may be damaged. For example, a short circuit occurs after the hot-swap adapter board 20 is powered on, thereby damaging the mainboard to be tested 10.

In this regard, in this embodiment, the state of the hot-swappable adapter board 20 is detected by a self-test device. Of course, the specific detection method and detection content of the self-test device can be set and adjusted as needed, and may depend on the specific circuit design of the hot-swappable adapter board 20, which will not be elaborated here.

When the test passes, the self-test device sends a self-test pass signal to the isolating switch controller. When the isolating switch controller receives the self-test pass signal, it indicates that the hot-swappable adapter board 20 has passed the self-test, and the N isolating switches 23 can be controlled to switch to the on state. It can be seen that when the self-test is not completed or the self-test fails, since the default states of the N isolating switches 23 are all off, the i-th isolating switch 23 is set between the second connector and the i-th control button 21, so it can effectively avoid the situation where the mainboard 10 to be tested is damaged by the failure of the hot-swappable adapter board 20, thereby improving the reliability of the present application scheme.

The specific type of the isolating switch 23 can be set and selected as needed. For example, in a specific embodiment of the present invention, the N isolating switches 23 can all be selected as MOS tubes, which have low cost and small size. In addition, in FIG. 3 of the present application, the self-test device and the isolating switch controller connected to the N isolating switches 23 are not shown.

In a specific embodiment of the present invention, it may also include:

An electrostatic protection device is provided between the hot-swap adapter board 20 and the controller 12 .

This implementation takes into account that the hot-swappable adapter board 20 needs to send the corresponding level control signal to the controller 12, and electrostatic interference may exist in this process. Therefore, an electrostatic protection device is provided between the hot-swappable adapter board 20 and the controller 12 to eliminate electrostatic interference and further improve the reliability of the solution of this application.

Of course, the specific type and location of the electrostatic protection device can be set and selected as needed.

For example, in a specific embodiment of the present invention, when the motherboard to be tested 10 is provided with a first connector for connecting the hot-swap adapter board 20, the electrostatic protection device may include a plurality of electrostatic protection units 13, and one electrostatic protection unit 13 is provided on each line between the first connector and the controller 12. Please refer to FIG3, but it should be noted that FIG3 only shows one electrostatic protection unit 13 in this embodiment.

The technical solution provided by the embodiment of the present invention is applied. A hot-swappable adapter board 20 is provided to improve work efficiency. Specifically, when receiving the i-th control instruction, the hot-swappable adapter board 20 can send the i-th level control signal to the controller 12 in the mainboard 10 to be tested, and the controller 12 is respectively connected to N slots, and can control the level state of the target pin of the i-th slot among the N slots when receiving the i-th level control signal, thereby performing a hot-swappable test on the i-th slot. It can be seen that the solution of the present application does not require the staff to plug and unplug the interface card, but only needs to operate the hot-swappable adapter board 20 so that the hot-swappable adapter board 20 receives the corresponding control instruction, and the controller 12 in the mainboard 10 to be tested can control the level state of the target pin of the corresponding slot among the N slots, that is, the plug-in and unplug operation of the interface card is simulated, and the hot-swappable test of the interface card in the corresponding slot is realized. Furthermore, the present application takes into account that, in some cases, when an interface card is inserted into a slot, if the switch circuit 11 is in the on state, as long as the interface card is not unplugged, the corresponding pin in the slot will always be pulled low, that is, the controller 12 cannot control the level state of the target pin of the slot according to the requirements of the received level control signal. Therefore, in the scheme of the present application, the hot-swap adapter board 20 is connected to the motherboard 10 to be tested. After entering the test mode, the switch circuit 11 will be controlled to be in the off state, so that the pins related to plugging and unplugging in each interface card will not be fixedly pulled low, that is, the target pin will not be fixedly pulled low, thereby ensuring that the hot-swap test of the present application can be effectively executed.

To sum up, in the scheme of the present application, the staff does not need to plug and unplug each interface card in turn to test the hot-plug function. Instead, they only need to operate the hot-plug adapter board 20 to conveniently and efficiently test the hot-plug function of each interface card, thereby improving the test efficiency and avoiding interface damage caused by multiple plugging and unplugging.

Corresponding to the above embodiments of the hot-swap test device, an embodiment of the present invention further provides a storage test device, which can be referred to in correspondence with the above. The storage test device may include a hot-swap test device as in any of the above embodiments, which will not be described in detail here.

It should also be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the technical solution and core ideas of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made to the present invention without departing from the principles of the present invention, and these improvements and modifications also fall within the scope of protection of the present invention.

Claims (9)

1. A hot plug testing apparatus, comprising: the hot plug adapter plate and the main board to be tested are provided with N slots, a switch circuit and a controller;

the N slots are used for sequentially connecting N interface cards;

the hot-plug adapter plate is connected with the main board to be tested and is used for controlling the switch circuit to be in an off state after entering a test mode, and sending an ith level control signal to the controller when receiving an ith control instruction; n and i are positive integers, and i is more than or equal to 1 and less than or equal to N;

The switch circuit is respectively connected with the N slots and the controller and is used for: the controller is in a conducting state when in a default state, so that the controller is connected with each slot through the switch circuit;

the controller is connected with the N slots respectively and is used for: when the ith level control signal is received, controlling the level state of a target pin of an ith slot in N slots so as to perform a hot plug test on the ith slot;

the main board to be tested is provided with a first connector which is respectively connected with the controller and the switch circuit; the hot-plug adapter plate is internally provided with a second connector and N control keys;

the second connector is connected with the first connector for: after the hot plug adapter plate enters a test mode, the switch circuit is controlled to be in an off state through the first connector; when an ith level control signal is received, the ith level control signal is sent to the controller through the first connector;

The N control keys are used for: when the ith control button is switched from a default state to a non-default state under the operation of a user, the ith control button confirms that the ith control instruction is received, and sends an ith level control signal to the second connector.

2. The hot plug testing device according to claim 1, wherein N information prompting devices are further provided in the hot plug adapter plate;

The N information prompting devices are sequentially connected with the N control keys, and when the ith control key is in a non-default state, the ith information prompting device connected with the ith control key outputs prompting information.

3. The hot plug testing device according to claim 1, wherein a display device is further provided in the hot plug adapter plate;

the display device is connected with the N control keys, and when any 1 or more control keys are in a non-default state, the numbers of the control keys in the non-default state are displayed.

4. The hot plug testing apparatus of claim 1, further comprising: n isolating switches, an isolating switch controller and a self-checking device;

the ith isolating switch is arranged between the second connector and the ith control key;

the self-checking device is used for: after the hot plug adapter plate is electrified, detecting the state of the hot plug adapter plate, and sending a self-checking passing signal to the isolating switch controller when the detection passes;

The isolating switch controller is used for: and after receiving the self-checking passing signal, controlling the isolating switches with N default states as off states to be switched into on states.

5. The hot plug testing device of claim 4, wherein the N isolation switches are MOS transistors.

6. The hot plug testing device according to claim 1, wherein the switch circuit is a switch circuit provided with an enabling terminal, and the hot plug adapter plate is specifically configured to: after entering a test mode, the switch circuit is controlled to be in an off state through an enabling end of the switch circuit.

7. The hot plug testing apparatus according to any one of claims 1 to 6, further comprising:

And the electrostatic protection device is arranged between the hot plug adapter plate and the controller.

8. The device according to claim 7, wherein when a first connector for connecting the hot plug adapter board is provided in the motherboard to be tested, the electrostatic protection device includes a plurality of electrostatic protection units, and 1 electrostatic protection unit is provided on each line between the first connector and the controller.

9. Storage test apparatus comprising a hot plug test device according to any one of claims 1 to 8.