CN115080404A - Automated Highly Accelerated Stress Screening Test Methods, Apparatus, Systems, Equipment and Media - Google Patents

Abstract

The present disclosure relates to an automatic high-acceleration stress screening test method, apparatus, system, electronic device, and computer readable medium. The method comprises the following steps: generating a test script according to the type of the equipment to be tested; analyzing the test script to generate a plurality of command data; calling a plurality of interfaces corresponding to the types of the plurality of command data; sending the command data to a high acceleration stress screening control box based on the interfaces respectively; and the high-acceleration stress screening control box tests the equipment to be tested according to the command data. The automatic high-acceleration stress screening test method, the device, the system, the electronic equipment and the computer readable medium can automatically carry out automatic high-acceleration stress screening, improve test efficiency and test accuracy, reduce operation complexity and facilitate operation of testers.

Description

Automated highly accelerated stress screening test methods, apparatus, systems, equipment and media

technical field

The present disclosure relates to the field of computer information processing, and in particular, to an automatic high-acceleration stress screening test method, device, system, electronic device, and computer-readable medium.

Background technique

Over the years, with the continuous expansion of the product line of various products and the improvement of production capacity, customers' requirements for product reliability have become more and more stringent. Only relying on traditional testing procedures to check can no longer meet the working state requirements of product reliability under poor conditions. Therefore, optimizing the testing process and introducing more demanding testing links has become a clear requirement to verify and improve product reliability.

The Highly Accelerated Stress Screening (HASS) testing process can optimize the testing process to ensure high product reliability. HASS test mainly includes rapid high and low temperature, vibration, power failure and restart test. Through the combination of changes in the environment, the stability of the device is confirmed by checking the streaming results, and the hardware and software problems are found from it, in order to find the problem before the device leaves the factory. and corrections to improve the purpose of the device.

However, the normal high-acceleration stress screening control box needs manual operation for testing, which takes up a lot of manpower, material resources and time, and the test effect is difficult to guarantee. Therefore, there is a need for a new automated highly accelerated stress screening test method, apparatus, system, electronic device and computer readable medium.

The above information disclosed in this Background section is only for enhancement of understanding of the background of the application and therefore it may contain information that does not form the prior art that is already known to a person of ordinary skill in the art.

SUMMARY OF THE INVENTION

In view of this, the present application provides an automatic high-acceleration stress screening test method, device, system, electronic device and computer-readable medium, which can automatically perform automatic high-acceleration stress screening, improve test efficiency and test accuracy, and reduce operational complexity. , which is convenient for testers to operate.

Other features and advantages of the present application will become apparent from the following detailed description, or be learned in part by practice of the present application.

According to an aspect of the present application, an automatic high-acceleration stress screening test method is proposed. The method includes: generating a test script according to the type of the device to be tested; parsing the test script to generate multiple command data; Multiple interfaces corresponding to the types of command data; based on the multiple interfaces, the multiple command data are respectively sent to the high-acceleration stress screening control box; the high-acceleration stress screening control box tests the device under test according to the command data .

In an exemplary embodiment of the present application, it further includes: during the test process, the high-acceleration stress screening control box generates a return message in real time; based on the return message, the test status display is performed; and/or based on the return message testing report.

In an exemplary embodiment of the present application, generating a test script according to the type of the device to be tested includes: acquiring the type of the device to be tested; acquiring test content to be executed; generating the test script based on the type and the test content test script.

In an exemplary embodiment of the present application, parsing the test script to generate multiple command data includes: reading each line of data in the test script one by one; splitting strings in each line of data; The split character strings are combined in a preset order to generate the plurality of command data.

In an exemplary embodiment of the present application, combining the split character strings in a preset order to generate the plurality of command data includes: extracting command type strings and commands from the split character strings content string; combining the type string and the command content string in a preset order to generate the plurality of command data.

In an exemplary embodiment of the present application, after combining the split character strings according to a preset order to generate the plurality of command data, the method further includes: creating a command data model in a memory; combining the plurality of command data Command data is stored in the command data model.

In an exemplary embodiment of the present application, sending the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces respectively includes: serially connecting the high-acceleration stress screening control box and the server; The server sends the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces, respectively.

In an exemplary embodiment of the present application, the server sends the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces, respectively, including: the server and the high-acceleration stress screening control box are based on A socket is used for communication connection; based on the communication connection, the server sends the plurality of command data to the high-acceleration stress screening control box through broadcasting respectively.

In an exemplary embodiment of the present application, the high-acceleration stress screening control box generates the return message in real time, including: the high-acceleration stress screening control box generates a control instruction according to the command data; the high-acceleration stress screening control box sends the control instruction to the internal multiple devices; the high acceleration stress screening control box generates the return information based on the state of the internal multiple devices.

According to an aspect of the present application, an automatic high-acceleration stress screening test device is proposed. The device includes: a script module for generating a test script according to the type of the device to be tested; a command module for parsing and generating the test script a plurality of command data; an interface module for invoking a plurality of interfaces corresponding to the types of the plurality of command data; a sending module for respectively sending the plurality of command data to the high-acceleration stress screening based on the plurality of interfaces A control box; a test module for the high-acceleration stress screening control box to test the device under test according to the command data.

According to an aspect of the present application, an automatic high-acceleration stress screening test system is proposed. The system includes: a server for generating a test script according to the type of the device to be tested; parsing the test script to generate multiple command data; calling A plurality of interfaces corresponding to the types of the plurality of command data; based on the plurality of interfaces, the plurality of command data are respectively sent to the high-acceleration stress screening control box; the high-acceleration stress screening control box is configured to The device under test is tested.

According to an aspect of the present application, an electronic device is provided, the electronic device comprising: one or more processors; a storage device for storing one or more programs; when the one or more programs are processed by the one or more processors Execution causes one or more processors to implement a method as above.

According to an aspect of the present application, a computer-readable medium is provided, on which a computer program is stored, and when the program is executed by a processor, implements the above method.

According to the automatic high-acceleration stress screening test method, device, system, electronic device and computer-readable medium of the present application, a test script is generated according to the type of the device to be tested; a plurality of command data are generated by parsing the test script; Multiple interfaces corresponding to the types of the multiple command data; based on the multiple interfaces, the multiple command data are respectively sent to the high-acceleration stress screening control box; The test method of the equipment can automatically perform automatic high-acceleration stress screening, improve test efficiency and test accuracy, reduce operation complexity, and facilitate testers to operate.

It is to be understood that the foregoing general description and the following detailed description are exemplary only and do not limit the application.

Description of drawings

The above and other objects, features and advantages of the present application will become more apparent from the detailed description of example embodiments thereof with reference to the accompanying drawings. The drawings described below are only some embodiments of the present application, and for those of ordinary skill in the art, other drawings can also be obtained from these drawings without any creative effort.

FIG. 1 is a block diagram of an automatic high-acceleration stress screening test system according to an exemplary embodiment.

FIG. 2 is a flow chart of an automatic highly accelerated stress screening test method according to an exemplary embodiment.

Fig. 3 is a flow chart of an automatic highly accelerated stress screening test method according to another exemplary embodiment.

FIG. 4 is a flow chart of an automatic highly accelerated stress screening test method according to another exemplary embodiment.

FIG. 5 is a block diagram of an automatic high-acceleration stress screening test device according to an exemplary embodiment.

Fig. 6 is a block diagram of an electronic device according to an exemplary embodiment.

Fig. 7 is a block diagram of a computer-readable medium according to an exemplary embodiment.

Detailed ways

Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this application will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar parts, and thus their repeated descriptions will be omitted.

Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the present application. However, those skilled in the art will appreciate that the technical solutions of the present application may be practiced without one or more of the specific details, or other methods, components, devices, steps, etc. may be employed. In other instances, well-known methods, apparatus, systems, implementations, or operations have not been shown or described in detail to avoid obscuring aspects of the present application.

The block diagrams shown in the figures are merely functional entities and do not necessarily necessarily correspond to physically separate entities. That is, these functional entities may be implemented in software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices entity.

The flowcharts shown in the figures are only exemplary illustrations and do not necessarily include all contents and operations/steps, nor do they have to be performed in the order described. For example, some operations/steps can be decomposed, and some operations/steps can be combined or partially combined, so the actual execution order may be changed according to the actual situation.

It will be understood that, although the terms first, second, third, etc. may be used herein to describe various components, these components should not be limited by these terms. These terms are used to distinguish one component from another. Accordingly, a first component discussed below could be referred to as a second component without departing from the teachings of the concepts herein. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Those skilled in the art can understand that the accompanying drawings are only schematic diagrams of exemplary embodiments, and the modules or processes in the accompanying drawings are not necessarily necessary to implement the present application, and therefore cannot be used to limit the protection scope of the present application.

The technical abbreviations involved in this application are explained as follows:

HALT (Highly Accelerated Life Test): Highly Accelerated Life Test is a process for discovering design defects. It accelerates the exposure of defects and weak points of test samples by setting a step-by-step accelerated environmental stress, and then measures the exposed defects and failures. From the aspects of design, process and materials, to analyze and improve, so as to achieve the purpose of improving reliability. The biggest feature is to set environmental stress higher than the design operating limit of the sample, so that the time from exposure to failure is much shorter than normal reliability. required time under stress conditions.

HASS (Highly Accelerated Stress Screening): Highly Accelerated Stress Screen is a product that is subjected to high-accelerated stress screening on the production line after the operation or failure limit value is obtained through the HALT test. 100% of products are required to participate in the screening. Its purpose is to make the products produced without any hidden defects or at least to find and solve these defects before the products leave the factory. HASS is to find defective products in a short time by accelerating stress and shorten the period of corrective measures. and find a product with the same problem.

HASA (Highly Accelerated Stress Audit): Highly Accelerated Stress Audit is a screening test method using sampling theory in the mass production stage of products. It prevents defective products from being delivered to customers.

The inventor of the present application found that there are two high-accelerated stress screening test methods in the prior art, one is to manually set the temperature value and the temperature change rate, the vibration value and the vibration change rate, the state of the relay, and at different time points according to the needs. Set the response status value, and manually stream the device in the process. There is also a high-acceleration stress screening test method, which is provided by the manufacturer with the function that comes with the software. The test is performed by drawing a profile program (the method of setting the program by drawing), and manual streaming is performed during the process.

The current two methods require manual control of environmental changes or drawing a profile program (programming through drawing) to control the operation of the environment, both of which are cumbersome. Manual streaming configuration is issued, and test results are manually determined, which limits its testing. Efficiency, HASS testing costs are high, liquid nitrogen is consumed for environmental changes to cool down, heating and vibration are very power-hungry, high cost requires higher testing efficiency, and these methods have low testing efficiency and obviously cannot meet the requirements.

The current two methods require too many factors for human control, which will inevitably cause many mistakes, and they are not real-time, and often lead to equipment running under the wrong environmental scheme, and ultimately the expected effect cannot be achieved. Waste Experiment resources and time.

In the current two methods, the profile program needs to be drawn by professional manufacturer personnel, and the testers are not highly professional, so they cannot complete the curve drawing independently according to the environmental curve, and the operation steps are cumbersome and not simple enough, because the streaming test is also required. , for multiple devices under the same test, it is impossible to synchronize and effectively deliver the device configuration, which may easily cause the test to fail.

In view of the technical defects in the prior art, the present invention proposes an automatic high-acceleration stress screening test method, which can improve the test efficiency and test accuracy, and reduce the operation complexity so that it can be better provided to testers for operation. In the technical solution of the present application, the automatic temperature control, vibration amplitude control, relay control, status reading and flow test of the product under extreme environment of the HASS are realized through software, and the test duration of each stage and the time of environmental change can be strictly controlled. point, verify the function and stability of the equipment with maximum efficiency, and can assist the online operator to better complete the test task.

In this application, the automated test software can load and parse the script file, extract the command to be issued under the serial port, and then enter the corresponding view interface to output the maintainable command, parse the HASS controller script call interface and issue it to the HASS chassis The device side judges whether the streaming test result in the current environment succeeds or fails by retrieving the string information printed by the serial port echo. The content of the present application will be described in detail below with the help of specific embodiments.

FIG. 1 is a block diagram of an automatic high-acceleration stress screening test system according to an exemplary embodiment.

As shown in FIG. 1 , the system architecture 10 may include high acceleration stress screening control boxes 101 , 102 , 103 , a network 104 and a server 105 . The network 104 is the medium used to provide the communication link between the high accelerated stress screening control boxes 101 , 102 , 103 and the server 105 . The network 104 may include various connection types, such as wired, wireless communication links, or fiber optic cables, among others.

The user may use the high accelerated stress screening control boxes 101, 102, 103 to interact with the server 105 through the network 104 to receive or send messages and the like. Various testing devices, such as temperature control devices, vibration control devices, data transmission devices, data monitoring devices, etc., may be installed on the high-acceleration stress screening control boxes 101 , 102 , 103 .

The server 105 may, for example, generate a test script according to the type of the device under test; the server 105 may, for example, parse the test script to generate multiple command data; the server 105 may, for example, call multiple interfaces corresponding to the types of the multiple command data The server 105 may send the plurality of command data to the high-acceleration stress screening control boxes 101, 102, 103, for example, based on the plurality of interfaces; the high-acceleration stress screening control boxes 101, 102, 103 may, for example, based on the command data Test the equipment under test.

During the test, the highly accelerated stress screening control boxes 101, 102, 103 may, for example, generate a return message in real time; the server 105 may, for example, perform test status display based on the return message; the server 105 may also generate a test report, for example, based on the return message .

The server 105 may be an entity server, or may be composed of multiple servers. It should be noted that the automatic high-acceleration stress screening test method provided by the embodiment of the present application may be composed of the server 105 and the high-acceleration stress screening control box 101, 102 and 103 are executed jointly. Accordingly, the automatic high-acceleration stress screening test device can be set in the server 105 and the high-acceleration stress screening control boxes 101 , 102 and 103 .

The automatic highly accelerated stress screening test method according to the present application has the following advantages:

(1) Improve efficiency. The automated test solution does not require complicated and cumbersome manual operations to change the environment. The program will communicate with the HASS control box to change the ambient temperature according to the time point set in the script program, and no manual adjustment is required. When the device issues the configuration, the software will issue the streaming configuration autonomously, automatically determine the test results, and improve the test efficiency and stability.

(2) Improve the accuracy, automate the test plan, and perform the operation of changing the environment in strict accordance with the set time point, which is real-time, and avoids the influence of the tester's manual errors on the test results, and can be carried out according to the established test plan. test to get the expected test results.

(3) Breaking through the limitations, the automated test solution only requires the tester to select the script of a specific device, fill in the serial number and serial number of the device under test, and then test directly. The configuration of the device supports asynchronous testing of different devices, and the test results do not affect each other.

FIG. 2 is a flow chart of an automatic highly accelerated stress screening test method according to an exemplary embodiment. The automatic highly accelerated stress screening test method 20 includes at least steps S202 to S210.

As shown in FIG. 2, in S202, a test script is generated according to the type of the device to be tested. For example, the type of the device to be tested is acquired; the test content to be executed is acquired; and the test script is generated based on the type and the test content.

The test interface can be displayed through the WINFORM program, and the test results can be rendered. After the tester fills in the required configuration information in the preset interface, the test script is generated. Configuration information may include device type and test content to be performed, among others.

Different devices require different scripts to verify, the main difference is the streaming (connecting the device ports serially with a network cable to form a loop, and then streaming the streamer to send broadcast messages) The configuration is different, and the startup time is different, which will lead to the overall The duration of the HASS test is different, and the time point for issuing the environment change command is also different, but the same type of devices can be tested using the same script.

In a specific application, the script test can include two loops, and the experimental environment includes:

Stage 1: The normal temperature is 20 degrees, the low temperature is -20 degrees, and the high temperature is 70 degrees;

Stage 2: low temperature -20 degrees flow + vibration 20g, high temperature flow + vibration 20g, normal temperature flow;

During the test, the operation of re-powering the relay after power off for 30s can also be included, mainly to test whether the device can restart and flow without abnormality in the case of abnormal circuit.

The above test content can be configured in the preset interface, so as to automatically generate test scripts.

In S204, the test script is parsed to generate a plurality of command data. For example, each line of data in the test script may be read one by one; the strings in each line of data may be split; and the split strings may be combined in a preset order to generate the plurality of command data.

In S206, multiple interfaces corresponding to the types of the multiple command data are called.

In one embodiment, the corresponding interface can be called according to the type of the command, which mainly includes: an interface for setting temperature and temperature change curve, an interface for setting vibration and vibration change curve, a control interface for powering on and off the relay, and an interface for obtaining the current environmental status. The interface, the interface that has been connected and disconnected from the HASS network, the interface that the HASS control box is turned on and suspended, etc.

In S208, the plurality of command data are respectively sent to the high-acceleration stress screening control box based on the plurality of interfaces. For example, the high-acceleration stress screening control box and the server may be connected in series; the server sends the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces, respectively.

In one embodiment, the server and the high-acceleration stress screening control box perform a communication connection based on sockets; based on the communication connection, the server sends the plurality of command data to the high-acceleration stress by broadcasting respectively. Screening control box.

In a specific application, after calling the interface, the interface will use socket to communicate with HASS. Refer to the API interface documentation provided by the manufacturer, and send different command execution codes to HASS to change the environment according to the needs of environmental changes.

In S210, the high-acceleration stress screening control box tests the device under test according to the command data.

According to the automatic high-acceleration stress screening test method of the present application, a test script is generated according to the type of the device to be tested; a plurality of command data are generated by parsing the test script; and a plurality of command data corresponding to the types of the plurality of command data are called interface; based on the multiple interfaces, the multiple command data are respectively sent to the high-acceleration stress screening control box; the high-acceleration stress screening control box tests the device under test according to the command data, which can automatically perform automatic high acceleration Stress screening improves test efficiency and test accuracy, reduces operational complexity, and facilitates the operation of testers.

It should be clearly understood that this application describes how specific examples may be made and used, but that the principles of this application are not limited to any details of these examples. Rather, these principles can be applied to many other embodiments based on the teachings of the present disclosure.

Fig. 3 is a flow chart of an automatic highly accelerated stress screening test method according to another exemplary embodiment. The process 30 shown in FIG. 3 is a detailed description of S204 "analyzing the test script to generate a plurality of command data" in the process shown in FIG. 2 .

As shown in FIG. 3, in S302, each line of data in the test script is read one by one.

In S304, the character string in each line of data is split.

In S306, the split character strings are combined in a preset order to generate the plurality of command data. For example, the command type character string and the command content character string can be extracted from the split character string; the type character string and the command content character string can be combined in a preset order to generate the plurality of command data.

In S308, the plurality of command data are stored in the command data model. The command data model can be created in memory, for example.

More specifically, the entire script content can be loaded into the memory, each line of script string must have its type first, and the content to be executed after it (combination of command type + command content). Line data, and split the string to obtain the acquisition type and the string of the command to be issued, and then create the command data model for data storage. After all the commands of the script are obtained, call different interfaces for processing according to different types of commands.

FIG. 4 is a flow chart of an automatic highly accelerated stress screening test method according to another exemplary embodiment. The process 40 shown in FIG. 4 is a supplementary description of the process shown in FIG. 2 .

As shown in Figure 4, in S402, during the test process, the high-acceleration stress screening control box generates control instructions according to the command data;

In S404, the high-acceleration stress screening control box sends the control instruction to multiple internal devices;

In a specific embodiment, the test content includes temperature test and vibration test. After receiving the control command, the HASS control box will directly issue the corresponding control command to the temperature control and vibration control devices.

In S406, the high-acceleration stress screening control box generates the return information based on the states of the plurality of devices inside. Status information code of commands returned by devices such as temperature control and vibration control.

In S408, a test status display or a test report is generated based on the returned message. According to the status code, it can automatically confirm whether the command is issued successfully, or whether there is any abnormality. Refresh the interface display information according to the returned test result, and if the test item fails, prompt the tester to confirm the problem in time.

Those skilled in the art can understand that all or part of the steps for implementing the above-described embodiments are implemented as computer programs executed by the CPU. When the computer program is executed by the CPU, the above-mentioned functions defined by the above-mentioned methods provided in this application are executed. The program can be stored in a computer-readable storage medium, which can be a read-only memory, a magnetic disk, an optical disk, or the like.

In addition, it should be noted that the above-mentioned drawings are only schematic illustrations of the processes included in the method according to the exemplary embodiment of the present application, and are not intended to be limiting. It is easy to understand that the processes shown in the above figures do not indicate or limit the chronological order of these processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, for example, in multiple modules.

The following are apparatus embodiments of the present application, which can be used to execute the method embodiments of the present application. For details not disclosed in the device embodiments of the present application, please refer to the method embodiments of the present application.

FIG. 5 is a block diagram of an automatic high-acceleration stress screening test device according to an exemplary embodiment. As shown in FIG. 5 , the automatic high-acceleration stress screening test device 50 includes: a script module 502 , a command module 504 , an interface module 506 , a sending module 508 , and a test module 510 .

The script module 502 is configured to generate a test script according to the type of the device under test; the script module 502 is further configured to obtain the type of the device under test; obtain the test content to be executed; and generate the test script based on the type and the test content.

The command module 504 is used to parse the test script to generate a plurality of command data; the command module 504 is also used to read each line of data in the test script one by one; split the strings in each line of data; split The latter character strings are combined in a preset order to generate the plurality of command data.

The interface module 506 is used to call multiple interfaces corresponding to the types of the multiple command data; the interface module 506 is also used to serially connect the high-acceleration stress screening control box and the server; the server connects all the interfaces based on the multiple interfaces. The multiple command data described above are respectively sent to the high-acceleration stress screening control box.

The sending module 508 is configured to respectively send the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces;

The test module 510 is used for the high-acceleration stress screening control box to test the device under test according to the command data.

According to the automatic high-acceleration stress screening test device of the present application, a test script is generated according to the type of the device to be tested; a plurality of command data are generated by parsing the test script; a plurality of command data corresponding to the types of the plurality of command data are called interface; based on the multiple interfaces, the multiple command data are respectively sent to the high-acceleration stress screening control box; the high-acceleration stress screening control box tests the device under test according to the command data, which can automatically perform automatic high acceleration Stress screening improves test efficiency and test accuracy, reduces operational complexity, and facilitates the operation of testers.

Fig. 6 is a block diagram of an electronic device according to an exemplary embodiment.

The electronic device 600 according to this embodiment of the present application is described below with reference to FIG. 6 . The electronic device 600 shown in FIG. 6 is only an example, and should not impose any limitations on the functions and scope of use of the embodiments of the present application.

As shown in FIG. 6, electronic device 600 takes the form of a general-purpose computing device. Components of the electronic device 600 may include, but are not limited to, at least one processing unit 610, at least one storage unit 620, a bus 630 connecting different system components (including the storage unit 620 and the processing unit 610), a display unit 640, and the like.

The storage unit stores program codes, which can be executed by the processing unit 610, so that the processing unit 610 executes the steps described in this specification according to various exemplary embodiments of the present application. For example, the processing unit 610 may perform the steps shown in FIG. 2 , FIG. 3 , and FIG. 4 .

The storage unit 620 may include a readable medium in the form of a volatile storage unit, such as a random access storage unit (RAM) 6201 and/or a cache storage unit 6202 , and may further include a read only storage unit (ROM) 6203 .

The storage unit 620 may also include a program/utility 6204 having a set (at least one) of program modules 6205 including, but not limited to, an operating system, one or more application programs, other program modules, and programs Data, each or some combination of these examples may include an implementation of a network environment.

The bus 630 may be representative of one or more of several types of bus structures, including a memory cell bus or memory cell controller, a peripheral bus, a graphics acceleration port, a processing unit, or a local area using any of a variety of bus structures bus.

The electronic device 600 may also communicate with one or more external devices 600' (eg, keyboards, pointing devices, Bluetooth devices, etc.) to enable the user to communicate with the device with which the electronic device 600 interacts, and/or the electronic device 600 to communicate with a or any device (eg, router, modem, etc.) that communicates with other computing devices. Such communication may occur through input/output (I/O) interface 650 . Also, the electronic device 600 may communicate with one or more networks (eg, a local area network (LAN), a wide area network (WAN), and/or a public network such as the Internet) through a network adapter 660 . Network adapter 660 may communicate with other modules of electronic device 600 through bus 630 . It should be understood that, although not shown, other hardware and/or software modules may be used in conjunction with electronic device 600, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives and data backup storage systems.

From the description of the above embodiments, those skilled in the art can easily understand that the exemplary embodiments described herein may be implemented by software, or may be implemented by software combined with necessary hardware. Therefore, as shown in FIG. 7 , the technical solution according to the embodiment of the present application can be embodied in the form of a software product, and the software product can be stored in a non-volatile storage medium (which can be a CD-ROM, U disk, mobile hard disk, etc.). etc.) or on the network, including several instructions to cause a computing device (which may be a personal computer, a server, or a network device, etc.) to execute the above-mentioned method according to the embodiment of the present application.

The software product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus or device, or a combination of any of the above. More specific examples (non-exhaustive list) of readable storage media include: electrical connections with one or more wires, portable disks, hard disks, random access memory (RAM), read only memory (ROM), erasable programmable read only memory (EPROM or flash memory), optical fiber, portable compact disk read only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

The computer-readable storage medium may include a data signal propagated in baseband or as part of a carrier wave, carrying readable program code therein. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the foregoing. A readable storage medium can also be any readable medium other than a readable storage medium that can transmit, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. Program code embodied on a readable storage medium may be transmitted using any suitable medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

Program code for performing the operations of the present application may be written in any combination of one or more programming languages, including object-oriented programming languages—such as Java, C++, etc., as well as conventional procedural Programming Language - such as the "C" language or similar programming language. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server execute on. In the case of a remote computing device, the remote computing device may be connected to the user computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (eg, using an Internet service provider business via an Internet connection).

The above-mentioned computer-readable medium carries one or more programs, and when the above-mentioned one or more programs are executed by a device, the computer-readable medium realizes the following functions: generating a test script according to the type of the device to be tested; The test script is parsed to generate multiple command data; multiple interfaces corresponding to the types of the multiple command data are called; based on the multiple interfaces, the multiple command data are respectively sent to the high-acceleration stress screening control box; high acceleration The stress screening control box tests the device under test according to the command data. The computer-readable medium may further implement the following functions: during the test process, the high-acceleration stress screening control box generates a return message in real time; displays the test status based on the return message; and/or generates a test report based on the return message.

Those skilled in the art can understand that the above-mentioned modules may be distributed in the apparatus according to the description of the embodiment, and corresponding changes may also be made in one or more apparatuses that are uniquely different from this embodiment. The modules in the foregoing embodiments may be combined into one module, or may be further split into multiple sub-modules.

From the description of the above embodiments, those skilled in the art can easily understand that the exemplary embodiments described herein may be implemented by software, or may be implemented by software combined with necessary hardware. Therefore, the technical solutions according to the embodiments of the present application may be embodied in the form of software products, and the software products may be stored in a non-volatile storage medium (which may be CD-ROM, U disk, mobile hard disk, etc.) or on the network , including several instructions to cause a computing device (which may be a personal computer, a server, a mobile terminal, or a network device, etc.) to execute the method according to the embodiment of the present application.

Exemplary embodiments of the present application have been specifically shown and described above. It should be understood that this application is not limited to the details of construction, arrangements, or implementations described herein; on the contrary, this application is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

Claims (13)

1. an automatic high acceleration stress screening test method, is characterized in that, comprises: Generate test scripts according to the type of device under test; Analyze the test script to generate multiple command data; calling multiple interfaces corresponding to the types of the multiple command data; Sending the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces respectively; The highly accelerated stress screening control box tests the device under test according to the command data. 2. The method of claim 1, further comprising: During the test, the highly accelerated stress screening control box generates return messages in real time; perform test status display based on the return message; and/or A test report is generated based on the return message. 3. The method of claim 1, wherein a test script is generated according to the type of the device under test, comprising: Get the type of the device under test; Get the test content to be executed; The test script is generated based on the type and the test content. 4. The method of claim 1, wherein the test script is parsed to generate a plurality of command data, comprising: Read each line of data in the test script one by one; Split the strings in each row of data; The split character strings are combined in a preset order to generate the plurality of command data. 5. The method of claim 4, wherein combining the split character strings according to a preset order to generate the plurality of command data, comprising: Extract the command type string and the command content string from the split string; The type string and the command content string are combined in a preset order to generate the plurality of command data. 6. The method of claim 4, wherein after combining the split character strings according to a preset order to generate the plurality of command data, the method further comprises: Create a command data model in memory; The plurality of command data are stored in the command data model. 7. The method of claim 1, wherein sending the plurality of command data to a high-acceleration stress screening control box based on the plurality of interfaces respectively comprises: Connect the high-acceleration stress screening control box and the server in series; The server sends the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces, respectively. 8. The method of claim 7, wherein the server sends the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces, comprising: The server and the high-acceleration stress screening control box communicate based on sockets; Based on the communication connection, the server sends the plurality of command data to the high-acceleration stress screening control box by broadcasting. 9. The method of claim 2, wherein the high-acceleration stress screening control box generates a return message in real time, comprising: The high-acceleration stress screening control box generates control instructions according to the command data; The high-acceleration stress screening control box sends the control instructions to a plurality of internal devices; The high-acceleration stress screening control box generates the return information based on the state of a plurality of devices inside. 10. An automatic high-acceleration stress screening test device, characterized in that, comprising: The script module is used to generate test scripts according to the type of the device under test; The command module is used to parse the test script to generate multiple command data; an interface module for invoking multiple interfaces corresponding to the types of the multiple command data; a sending module, configured to send the plurality of command data to the high-acceleration stress screening control box based on the plurality of interfaces; The test module is used for the high-acceleration stress screening control box to test the device under test according to the command data. 11. An automatic high-acceleration stress screening test system, characterized in that, comprising: The server is configured to generate a test script according to the type of the device to be tested; parse the test script to generate multiple command data; call multiple interfaces corresponding to the types of the multiple command data; The plurality of command data are respectively sent to the high-acceleration stress screening control box; A high-acceleration stress screening control box for testing the device under test according to command data. 12. An electronic device, characterized in that, comprising: one or more processors; a storage device for storing one or more programs; The one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any one of claims 1-9. 13. A computer-readable medium on which a computer program is stored, characterized in that, when the program is executed by a processor, the method according to any one of claims 1-9 is implemented.

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