CN115047316A - Detachable slender probe - Google Patents

Abstract

The invention discloses a detachable elongated probe, comprising a first test probe and a second test probe; the second test probe comprises a first needle tube, and the head end of the first needle tube is provided with a first needle tube. A needle head, the first needle head and the first needle tube are provided with a first spring, and one end of the first spring is pressed against the tail of the first needle head; the second test probe includes a second needle tube, the first The head end of the second needle tube is provided with a second needle head, a second spring is placed in the second needle tube, and one end of the second spring is pressed against the tail of the second needle head; the tail of the first needle tube and the tail of the second needle tube Removably fit together. The detachable slender probe solves the problems that the existing slender probe has a large and thin length, which leads to increased processing difficulty, higher cost and shorter service life.

Description

A detachable elongated probe

technical field

The invention belongs to the technical field of semiconductor detection, in particular to a detachable elongated probe.

Background technique

In the process of producing a printed circuit board, it is necessary to conduct an electrical test on the printed circuit board to determine whether the electrical parameters (such as resistance, capacitance or inductance, etc.) of the components of the printed circuit board meet the standards.

A common test method for printed circuit boards is to set test points on the printed circuit board, print solder paste on the surface of the test points, and use automated testing equipment or online testing equipment to directly touch the solder paste parts of the test points with probes to obtain relevant information. electrical parameters.

At present, there are more and more slender probes used in online testing equipment. Due to their thinness and long length, the slender test probes currently used have difficulties in processing, high cost, poor assembly during use, and short service life. Most of them are purchased from abroad, and the cost is high.

SUMMARY OF THE INVENTION

The purpose of the present invention is to provide a detachable slender probe, which solves the problems that the existing slender probes have large and thin lengths, resulting in increased processing difficulty, higher cost and shorter service life.

In order to achieve the above object, the technical solution adopted in the present invention is: a detachable elongated probe, comprising a first test probe and a second test probe; the second test probe includes a first needle tube, so the The head end of the first needle tube is provided with a first needle, the first needle, the first needle tube is provided with a first spring, and one end of the first spring is pressed against the tail of the first needle; the second test The probe includes a second needle tube, the first end of the second needle tube is provided with a second needle, a second spring is placed in the second needle tube, and one end of the second spring is pressed against the tail of the second needle; the first The tail of the first needle tube is detachably assembled with the tail of the second needle tube.

As a preferred technical solution of the present invention, the tails of the first needle and the second needle are both tapered.

As a preferred technical solution of the present invention, the first and second needles are provided with annular grooves near their tails, and the outer portions of the first and second needles are provided with corresponding annular grooves The pit machining position.

As a preferred technical solution of the present invention, the tail of the first needle tube is provided with a plug, and the plug is inserted into the tail of the second needle tube.

As a preferred technical solution of the present invention, both the first spring and the second spring are compression springs.

The beneficial effects of the present invention are: (1) A detachable slender probe of the present invention can be divided into two sections for assembly respectively, and then the two ends are assembled together, which greatly reduces the cost of the production process. Assembly difficulty; (2) a detachable slender probe of the present invention, when a section of the test probe is damaged, it can be removed and replaced, which greatly prolongs the service life; (3) a detachable slender probe of the present invention The slender probe has the advantages of simple overall structure, low manufacturing cost, and good market promotion and application prospects.

Description of drawings

The accompanying drawings described herein are used to provide further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the attached image:

Fig. 1 is the structural representation of a kind of detachable slender probe of the present invention;

2 is a schematic structural diagram of a first test probe in a detachable elongated probe of the present invention;

3 is an exploded view of a first test probe in a detachable elongated probe of the present invention;

4 is a schematic structural diagram of a second test probe in a detachable elongated probe of the present invention;

FIG. 5 is an exploded view of a second test probe in a detachable elongated probe of the present invention.

In the picture: 1. The first needle tube, 2. The first needle head, 3. The first spring, 4. The plug, 5. The second needle tube, 6. The second plug, 7. The second spring, 8. The pit machining position, 9. Annular groove.

Detailed ways

The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary, only used to explain the present invention, and should not be construed as a limitation of the present invention.

In the description of the present invention, if it is described that the first and the second are only for the purpose of distinguishing technical features, it should not be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The order of the indicated technical features.

In the description of the present invention, unless otherwise clearly defined, words such as setting, installation, connection should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in the present invention in combination with the specific content of the technical solution.

As shown in FIG. 1 , a detachable elongated probe of the present invention includes a first test probe and a second test probe; the first test probe and the second test probe are detachably assembled together.

2 and 3, the first test probe includes a first needle tube 1, the first needle tube 1 is provided with a first needle 2 at the head end, the first needle tube 1 is provided with a first spring 3, and one end of the first spring 3 is provided Press the tail of the first needle 2.

4 and 5, the second test probe includes a second needle tube 5, the head end of the second needle tube 5 is provided with a second needle 6, a second spring 7 is placed in the second needle tube 5, and one end of the second spring 7 Press against the tail of the second needle 6 ; the tail of the first needle tube 1 and the tail of the second needle tube 6 are detachably assembled together.

This design is convenient for us to use the existing processing technology for processing. After being divided into two test needles, the length of a single test needle is half of the length of the slender needle. The two single test pin springs are half the length of the slender, which provides greater stability during testing than long spring test probes.

2 to 5 , in a detachable elongated probe of the present invention, the tails of the first needle 2 and the second needle 6 are both tapered.

Such a design facilitates the formation of a larger contact area between the first needle 2 and the second needle 6 and the first spring 3 and the second spring 7 respectively, so as to form a good contact, so as to ensure better stability during testing.

2 to 5, in a detachable slender probe of the present invention, the first needle 2 and the second needle 6 are provided with annular grooves 9 near their tails, the first needle 1 and the second needle. The outside of 5 is provided with a pit machining position 8 corresponding to the annular groove 9 .

By processing a plurality of riveting points at the pit processing position 8, the first needle head 2 and the second needle head 6 can be restricted in the first needle tube 1 and the second needle tube 5, so as to complete the clearance assembly, so that the first needle head 2 and the second needle head 2 and the second needle head 2 can be limited in the first needle tube 1 and the second needle tube 5 The needle 6 moves back and forth within a certain range.

2 to 5 , in a detachable elongated probe of the present invention, a plug 4 is provided at the tail of the first needle tube 1 , and the plug 4 and the tail of the second needle tube 5 are inserted together.

An insertion hole is designed at the tail of the second needle tube 5, and the plug 4 and the insertion hole are interfered with each other to facilitate assembly.

2 to 5, in a detachable elongated probe of the present invention, the first spring 3 and the second spring 7 are both compression springs, so as to exert elastic force on the first needle 2 and the second needle 6. force to ensure that it makes good contact with the point being measured.

Therefore, compared with the prior art, the detachable elongated probe of the present invention can be divided into two sections for assembly, and then the two ends are assembled together, which greatly reduces the assembly of the production process. difficulty. In addition, a detachable slender probe of the present invention can be disassembled and replaced when a section of the test probe is damaged, which greatly prolongs the service life. Finally, the splittable slender probe of the present invention has a simple overall structure, low manufacturing cost, and good market promotion and application prospects.

The foregoing specification illustrates and describes several preferred embodiments of the invention, but as previously mentioned, it should be understood that the invention is not limited to the form disclosed herein and should not be construed as an exclusion of other embodiments, but may be used in a variety of other Combinations, modifications and environments are possible within the scope of the inventive concepts described herein, from the above teachings or from skill or knowledge in the relevant fields. However, modifications and changes made by those skilled in the art do not depart from the spirit and scope of the invention, and should all fall within the protection scope of the appended claims of the invention.

Claims (5)

1. A detachable elongated probe, characterized in that it comprises a first test probe and a second test probe; the first test probe comprises a first needle tube (1), and the first needle tube ( The head end of 1) is provided with a first needle (2), a first spring (3) is arranged in the first needle tube (1), and one end of the first spring (3) is pressed against the first needle (2). ); the second test probe comprises a second needle tube (5), the head end of the second needle tube (5) is provided with a second needle head (6), and a second needle tube (5) is placed in the second needle tube (5). A spring (7), one end of the second spring (7) is pressed against the tail of the second needle head (6); the tail of the first needle tube (1) and the tail of the second needle tube (6) are detachably assembled together. 2 . The detachable elongated probe according to claim 1 , wherein the tails of the first needle head ( 2 ) and the second needle head ( 6 ) are both tapered. 3 . 3. The detachable elongated probe according to claim 2, wherein the first needle (2) and the second needle (6) are provided with annular grooves (9) near their tails, so The outside of the first needle tube (1) and the second needle tube (5) are provided with concave point processing positions (8) corresponding to the annular grooves (9). 4. The detachable elongated probe according to claim 3, wherein a plug (4) is provided at the tail of the first needle tube (1), and the plug (4) is connected to the second needle tube (5) are plugged together. 5. The detachable elongated probe according to claim 4, characterized in that both the first spring (3) and the second spring (7) are compression springs.

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