CN114974394A - Switching device, testing system and testing method for storage device - Google Patents

Abstract

The application relates to the technical field of storage device testing, and discloses a switching device, a testing system and a testing method of a storage device. The switching device is connected between a testing device and a storage device to be tested so that the testing device tests the storage device to be tested, and the switching device comprises: the voltage regulating circuit is connected with the testing device and the storage device to be tested, and is used for regulating the testing voltage provided by the testing device and outputting the regulated testing voltage to the storage device to be tested; and the current sampling circuit is connected with the testing device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested and sending the working current to the testing device. By the mode, the testing efficiency of the storage device to be tested can be improved.

Description

Switching device, testing system and testing method of storage device

technical field

The present application relates to the technical field of storage device testing, and in particular, to a switching device, a testing system, and a testing method for a storage device.

Background technique

During the production process of the storage device, the storage device needs to be tested to distinguish good and defective products in the storage device.

In the current production of storage devices, in order to find defective products in the storage device, a testing device is often used to test the storage device to find out the defective products.

The disadvantage is that, when performing a stress test on the storage device, the test voltage must be set through BIOS control, and a restart is required after each setting, resulting in low test efficiency.

SUMMARY OF THE INVENTION

The technical problem mainly solved by the present application is to provide a switching device, a testing system and a testing method for a storage device, which can improve the testing efficiency of the storage device to be tested.

A technical solution adopted in the present application is to provide a switching device, the switching device is connected between a testing device and a storage device to be tested, so that the testing device can test the storage device to be tested, and the switching device includes: a voltage regulator The circuit is connected to the test device and the storage device to be tested, and is used to adjust the test voltage provided by the test device, and output the adjusted test voltage to the storage device to be tested; the current sampling circuit is connected to the test device and the storage device to be tested. It is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device.

Wherein, the switching device further includes a control circuit, the control circuit is connected to the test device, the voltage regulation circuit and the current sampling circuit; the control circuit is used to output the test voltage provided by the test device to the voltage regulation circuit, and control the voltage regulation circuit to measure the test voltage and the control circuit is also used for acquiring the working current sampled by the current sampling circuit, and sending the working current to the testing device.

The switching device further includes a programming circuit, which is connected to the control circuit and the storage device to be tested; the control circuit is also used to output the first SPD information provided by the testing device to the programming circuit, and control the programming circuit to The first SPD information is programmed into the SPD chip of the storage device to be tested.

The control circuit is further configured to control the programming circuit to obtain the second SPD information from the SPD chip, and to confirm whether the first SPD information and the second SPD information are consistent.

Wherein, the switching device further includes an indicator light, and the indicator light is connected to the control circuit; the control circuit is also used to control the indicator light to remind abnormality when it is confirmed that the first SPD information and the second SPD information are inconsistent.

Wherein, the switching device further includes a switching circuit, and the switching circuit is connected to the control circuit; the control circuit is used to control the switching circuit to be connected to the programming circuit or the voltage adjustment circuit.

Wherein, the switching device further includes: a first communication interface, connected to the testing device, one end of the voltage regulation circuit and one end of the current sampling circuit, for outputting the test voltage provided by the testing device to the voltage regulation circuit; and sending the working current to the test device; a second communication interface, connected to the storage device to be tested, the other end of the voltage adjustment circuit and the other end of the current sampling circuit, for outputting the test voltage adjusted by the voltage adjustment circuit to the storage device to be tested; and obtaining the storage device to be tested The working current of the test storage device is input to the current sampling circuit.

Wherein, the switching device further comprises: a circuit board, the voltage regulating circuit, the current sampling circuit, the first communication interface and the second communication interface are arranged on the circuit board.

Another technical solution adopted in the present application is to provide a test system, the test system includes: a test device; The device is tested, and the switching device includes: a voltage adjustment circuit, which is connected to the test device and the storage device to be tested, used to adjust the test voltage provided by the test device, and output the adjusted test voltage to the storage device to be tested; current sampling; The circuit is connected to the testing device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device.

Another technical solution adopted in the present application is to provide a method for testing a storage device, which is applied to a switching device, and the switching device is connected between the testing device and the storage device to be tested. The method includes: using the voltage adjustment of the switching device The circuit adjusts the test voltage provided by the test device, and outputs the adjusted test voltage to the storage device to be tested; wherein, the voltage adjustment circuit connects the test device and the storage device to be tested; the current sampling circuit of the switching device is used to store the storage device to be tested. The working current of the device is sampled, and the working current is sent to the testing device, so that the testing device tests the storage device to be tested; wherein, the current sampling circuit connects the testing device and the storage device to be tested.

The beneficial effects of the present application are: different from the situation in the prior art, the transfer device of the present application is connected between the test device and the storage device to be tested, so that the test device tests the storage device to be tested, and the transfer device The connecting device includes: a voltage regulating circuit, connecting the testing device and the storage device to be tested, for adjusting the test voltage provided by the testing device, and outputting the adjusted test voltage to the storage device to be tested; a current sampling circuit, connecting the testing device and the storage device to be tested, for sampling the working current of the storage device to be tested, and sending the working current to the testing device. In the above manner, the voltage adjustment circuit is used to adjust the test voltage and the current sampling circuit to collect the working current of the storage device to be tested based on the adjusted test voltage, without the need to individually set the test voltage for the test device each time, which can improve the storage device to be tested. The test efficiency of the device is improved, and the test device can obtain the working current of the storage device to be tested, so that the test is more comprehensive and the test effect is improved.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present application more clearly, the following briefly introduces the drawings that are used in the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative effort. in:

1 is a schematic structural diagram of an embodiment of a switching device provided by the present application;

2 is a schematic diagram of an application scenario of a switching device provided by the present application;

3 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

4 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

5 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

6 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

7 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

8 is a schematic structural diagram of another embodiment of the switching device provided by the present application;

9 is a schematic structural diagram of an embodiment of a testing system provided by the present application;

10 is a schematic flowchart of an embodiment of a method for testing a storage device provided by the present application;

FIG. 11 is a schematic structural diagram of an embodiment of a computer-readable storage medium provided by the present application.

Detailed ways

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all the structures related to the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes unlisted steps or units, or optionally also includes For other steps or units inherent to these processes, methods, products or devices.

Reference herein to an "embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor a separate or alternative embodiment that is mutually exclusive of other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

Referring to FIG. 1 , FIG. 1 is a schematic structural diagram of an embodiment of a switching device provided by the present application. The switching device 100 is connected between the testing device and the storage device to be tested, so that the testing device can test the storage device to be tested.

The testing device may be a PC (Personal Computer, personal computer). The storage device to be tested may be RAM (random access memory, random access memory), ROM (Read-Only Memory, read-only memory); it may also be a hard disk, such as a mechanical hard disk, a solid-state hard disk, and a mobile hard disk.

Wherein, the switching device 100 includes a voltage regulating circuit 10 and a current sampling circuit 20 .

The voltage adjustment circuit 10 is connected to the test device and the storage device to be tested, and is used to adjust the test voltage provided by the test device, and output the adjusted test voltage to the storage device to be tested.

The current sampling circuit 20 is connected to the testing device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device.

In an application scenario, referring to FIG. 2 , the voltage regulation circuit 10 of the switching device 100 is connected to the testing device 200 and the storage device 300 to be tested. The current sampling circuit 20 of the switching device 100 is connected to the testing device 200 and the storage device 300 to be tested. The test device 200 provides a test voltage to the voltage adjustment circuit 10, and the voltage adjustment circuit 10 adjusts the test voltage. For example, if the test voltage is adjusted up, the test voltage is adjusted down, and the adjusted test voltage is output to the storage device to be tested. 300, so that the storage device 300 to be tested performs a stress test based on the adjusted test voltage. At the same time, the current sampling circuit 20 samples the working current of the storage device 300 to be tested during the stress test, and sends the working current to the testing device 200 . The testing device 200 tests the storage device 300 to be tested based on the operating current. If the working current is abnormal, the testing device 200 determines that the storage device 300 to be tested is abnormal, and can prompt to repair or scrap the storage device 300 to be tested. In this way, the storage particles in the storage device to be tested can be tested in an extremely harsh environment, the abnormality of the storage device to be tested can be quickly detected, and the test efficiency can be improved.

Specifically, the voltage adjustment circuit 10 may adjust the test voltage at least once, and output the test voltage after each adjustment to the storage device 300 to be tested, so that the storage device 300 to be tested performs stress based on the adjusted test voltage each time test. At the same time, the current sampling circuit 20 samples the working current of the storage device 300 to be tested during the stress test, and sends the working current to the testing device 200 . The testing device 200 tests the storage device 300 to be tested based on the operating current. Meanwhile, the voltage adjustment circuit 10 may send the adjusted voltage value to the test device 200 after adjusting the test voltage each time. The testing device 200 determines the current threshold value corresponding to the voltage value based on the voltage value, and after obtaining the operating current sent by the current sampling circuit 20, compares the operating current with the current threshold value, and confirms that the operating current exceeds the current threshold value. The storage device 300 to be tested is abnormal, and the storage device 300 to be tested is a defective product. The operating current is compared with the current threshold, and if the operating current does not exceed the current threshold, it is confirmed that the storage device 300 to be tested has passed the test, and the storage device 300 to be tested is a good product.

In some embodiments, the testing device is further configured to implement, through the switching device 100, both stress testing of the storage device to be tested and functional testing of the storage device to be tested. An abnormality occurs in any one of the stress test and the functional test, indicating that the storage device to be tested is abnormal.

In this embodiment, the switching device 100 is connected between the testing device 200 and the storage device 300 to be tested, so that the testing device 200 tests the storage device 300 to be tested, the switching device 100 includes: a voltage regulating circuit 10, The test device 200 and the storage device to be tested 300 are connected to adjust the test voltage provided by the test device 200, and the adjusted test voltage is output to the storage device to be tested 300; the current sampling circuit 20 is connected to the test device 200 and the storage device to be tested. The test storage device 300 is configured to sample the working current of the storage device 300 to be tested, and send the working current to the test device 200 . In the above manner, the voltage adjustment circuit 10 is used to adjust the test voltage and the current sampling circuit 20 to collect the operating current of the storage device 300 to be tested based on the adjusted test voltage. The test efficiency of the storage device 300 to be tested is improved, and the test device 200 can obtain the working current of the storage device 300 to be tested, so that the test is more comprehensive and the test effect is improved.

Referring to FIG. 3 , FIG. 3 is a schematic structural diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage regulating circuit 10 , a current sampling circuit 20 and a control circuit 30 . The control circuit 30 is connected to the testing device, the voltage adjustment circuit 10 and the current sampling circuit 20 .

The control circuit 30 is used to output the test voltage provided by the test device to the voltage adjustment circuit 10, and to control the voltage adjustment circuit 10 to adjust the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and to The operating current is sent to the test device. In some embodiments, the control circuit 30 may include a control chip, such as an MCU (Microcontroller Unit, micro control unit). The corresponding pins of the control chip are connected to the testing device, the voltage regulating circuit 10 and the current sampling circuit 20 .

In some embodiments, the control circuit 30 is further configured to obtain the voltage value after the voltage adjustment circuit 10 adjusts the test voltage each time, and send the voltage value to the test device. The testing device determines the current threshold value corresponding to the voltage value based on the voltage value. After obtaining the working current sent by the current sampling circuit 20, the working current is compared with the current threshold value. If the working current exceeds the current threshold value, it is confirmed that the The test storage device 300 is abnormal.

In some embodiments, the control circuit 30 can also monitor the real-time test voltage power supply of the test device, monitor its ripple and test voltage stability, and control the voltage regulation circuit 10 to stop providing the test voltage to the storage device to be tested when the test voltage is abnormal. Test voltage to protect the device under test.

In this embodiment, in the above-mentioned manner, the control circuit 30 controls the voltage adjustment circuit 10 to adjust the test voltage and the current sampling circuit 20 collects the operating current of the storage device to be tested based on the adjusted test voltage. Setting the test voltage separately can improve the test efficiency of the storage device to be tested, and enable the test device to obtain the working current of the storage device to be tested, so that the test is more comprehensive and the test effect is improved.

Referring to FIG. 4 , FIG. 4 is a schematic structural diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage adjustment circuit 10 , a current sampling circuit 20 , a control circuit 30 and a programming circuit 40 . The programming circuit 40 is connected to the control circuit 30 and the storage device to be tested.

The control circuit 30 is further configured to output the first SPD (Serial Presence Detect) information provided by the testing device to the programming circuit 40, and control the programming circuit 40 to program the first SPD information to the storage device to be tested in the SPD chip. The first SPD information may be row address number, column address number, error detection/correction, refresh speed, data width, interface standard, serial number of the module, manufacturer code, and the like. In this embodiment, the storage device to be tested is a memory stick, and the memory stick includes an SPD chip. When the memory module is in normal use, it is necessary to read the SPD information in the SPD to set the working parameters of the memory module.

The control circuit 30 is further configured to control the programming circuit 40 to obtain the second SPD information from the SPD chip, and to confirm whether the first SPD information and the second SPD information are consistent. In case of inconsistency, the programming circuit 40 can be controlled again to write the first SPD information into the SPD chip of the storage device to be tested, and the programming circuit 40 can be controlled again to obtain the second SPD information from the SPD chip, and the first SPD information can be confirmed. Whether the information is consistent with the second SPD information. In this way, it can be confirmed whether the SPD information programmed in the SPD chip is correct, so as to avoid abnormality of the storage device to be tested during use.

In other embodiments, in the event of inconsistency, the control circuit 30 may send abnormality information to the testing device, so that the testing device knows that the device to be tested cannot complete the programming based on the abnormality information, and can prompt to repair the storage device to be tested or Scrap processing.

Through the above method, the programming of the SPD information in the SPD chip can be completed when the storage device to be tested is tested. Compared with the prior art, which requires additional programming and confirmation of the SPD information, in this embodiment, no separate programming is required. Burn the SPD information on the storage device to be tested, thereby reducing the burning time of the SPD information. If additional burning equipment is required to burn the SPD information on the storage device to be tested in the prior art, the storage device to be tested needs to be removed from the test device. Take it off, and then connect it with the burning device, which will waste time and improve the testing efficiency and burning efficiency of the storage device to be tested.

In other embodiments, please refer to FIG. 5 , which is a schematic structural diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage regulation circuit 10 , a current sampling circuit 20 , a control circuit 30 , a programming circuit 40 and an indicator light 50 . The indicator light 50 is connected to the control circuit 30 . The control circuit 30 is further configured to control the indicator light 50 to remind the abnormality when it is confirmed that the first SPD information and the second SPD information are inconsistent. For example, during normal programming, the control circuit 30 controls the indicator 50 to display green, and when it is confirmed that the first SPD information and the second SPD information are inconsistent, the control circuit 30 controls the indicator 50 to display red.

In some embodiments, the indicator light 50 may be a three-color light. During normal programming, the control circuit 30 controls the indicator light 50 to display green. When it is confirmed that the first SPD information and the second SPD information are inconsistent, the control circuit 30 controls the indicator light. 50 is displayed in orange, at this time, the control circuit 30 will again control the burning circuit 40 to burn the first SPD information into the SPD chip of the storage device to be tested, and again control the burning circuit 40 to obtain the second SPD information from the SPD chip, And confirm whether the first SPD information and the second SPD information are consistent, if still inconsistent at this time, the control circuit 30 controls the indicator light 50 to display red.

In the above manner, using the indicator light 50 to prompt whether the SPD information is successfully burned can improve the user experience, remind when abnormal, improve the burning efficiency, and improve the testing efficiency of the storage device to be tested.

Referring to FIG. 6 , FIG. 6 is a schematic structural diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage adjustment circuit 10 , a current sampling circuit 20 , a control circuit 30 , a programming circuit 40 and a switching circuit 60 .

Among them, the switching circuit 60 is connected to the control circuit 30 .

The control circuit 30 is used to control the switching circuit 60 to connect to the programming circuit 40 or the voltage adjustment circuit 10 . In some embodiments, the switching circuit 60 may include a SPDT switch, the SPDT switch is composed of a moving terminal and a non-moving terminal, the moving terminal is connected to the control circuit 30, one non-moving terminal is connected to the programming circuit 40, and the other is not connected to the programming circuit 40. The moving terminal is connected to the voltage regulating circuit 10 . The control circuit 30 is used to control the connection between the moving terminal and one of the non-moving terminals.

When the control circuit 30 controls the switching circuit 60 to connect to the programming circuit 40, the control circuit 30 is used to output the first SPD information provided by the testing device to the programming circuit 40, and control the programming circuit 40 to program the first SPD information to the programming circuit 40. in the SPD chip of the storage device to be tested.

When the control circuit 30 controls the switching circuit 60 to connect to the voltage adjustment circuit 10, the control circuit 30 is used to output the test voltage provided by the testing device to the voltage adjustment circuit 10, and control the voltage adjustment circuit 10 to adjust the test voltage; and the control circuit 30 It is also used to obtain the working current sampled by the current sampling circuit 20 and send the working current to the testing device.

In some embodiments, when the switching device 100 is connected between the test device and the storage device to be tested, so that when the test device tests the storage device to be tested, the switching circuit 60 can be controlled to connect to the programming circuit 40 first, so as to complete the adjustment of the storage device to be tested. After the programming of the SPD information of the SPD chip is completed, the switching circuit 60 is controlled to connect to the voltage regulating circuit 10, and the control circuit 30 outputs the test voltage provided by the testing device to the voltage regulating circuit 10, and controls the voltage regulating circuit 10 to The test voltage is adjusted; and the control circuit 30 is also used for acquiring the working current sampled by the current sampling circuit 20 and sending the working current to the test device.

In some embodiments, when the switching device 100 is connected between the testing device and the storage device to be tested, so that when the testing device tests the storage device to be tested, the switching circuit 60 can be controlled to be connected to the voltage regulation circuit 10, and the control circuit 30 can be controlled first. Output the test voltage provided by the test device to the voltage adjustment circuit 10, and control the voltage adjustment circuit 10 to adjust the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and send the working current to the tester device. After the test is completed, the switching circuit 60 is controlled to connect to the programming circuit 40 to complete the programming of the SPD information of the SPD chip.

In the above manner, the switching circuit 60 is used to complete the connection of the voltage regulating circuit 10 or the programming circuit 40, and the function of the switching device 100 is increased, so that the switching device 100 can cooperate with the testing device to complete the test of the storage device to be tested, and realize the The burning of SPD information is successful. The integrated function integration can improve the programming efficiency and testing efficiency.

Referring to FIG. 7 , the switching device 100 includes a voltage regulating circuit 10 , a current sampling circuit 20 , a first communication interface 70 and a second communication interface 80 .

The first communication interface 70 is connected to the test device, one end of the voltage regulation circuit 10 and one end of the current sampling circuit 20, and is used for outputting the test voltage provided by the test device to the voltage regulation circuit 10; and sending the working current to the test device. In some embodiments, the first communication interface 70 may be connected to the test device by means of a data line.

The second communication interface 80 is connected to the storage device to be tested, the other end of the voltage adjustment circuit 10 and the other end of the current sampling circuit 20, and is used for outputting the test voltage adjusted by the voltage adjustment circuit 10 to the storage device to be tested; The operating current of the storage device is input to the current sampling circuit 20 . In some embodiments, the second communication interface 80 may be connected to the storage device to be tested by means of a data line.

The switching device 100 further includes a circuit board (shown in the figure), and the voltage regulating circuit 10 , the current sampling circuit 20 , the first communication interface 70 and the second communication interface 80 are arranged on the circuit board.

In some embodiments, the first communication interface 70 and the second communication interface 80 may include multiple interface types, such as a USB (Universal Serial Bus) interface, a SATA (Serial Advanced Technology Attachment) ) interface, ATA (Advanced Technology Attachment, hard disk interface technology) interface and PCIe (peripheral component interconnect express, high-speed serial computer expansion bus standard) interface, etc., to adapt to the connection between test devices of different interfaces and the storage device to be tested.

8 , the switching device 100 includes a voltage regulation circuit 10 , a current sampling circuit 20 , a control circuit 30 , a programming circuit 40 , an indicator light 50 , a switching circuit 60 , and a first communication interface 70 and a second communication interface 80 .

The first communication interface 70 is connected to the test device and the control circuit 30, and is used for outputting the test voltage provided by the test device to the control circuit 30, and for sending the operating current obtained by the control circuit 30 to the test device.

The control circuit 30 is connected to the indicator light 50 , the switching circuit 60 and the current sampling circuit 20 . The programming circuit 40 and the voltage regulating circuit 10 are connected to the switching circuit 60 . The switching circuit 60 conducts with the programming circuit 40 or the voltage adjusting circuit 10 under the control of the control circuit 30 .

The second communication interface 80 is connected to the storage device to be tested, the voltage adjustment circuit 10 and the current sampling circuit 20, and is used for outputting the test voltage adjusted by the voltage adjustment circuit 10 to the storage device to be tested; and to obtain the operating current input of the storage device to be tested to the current sampling circuit 20 .

It can be understood that the switching device 100 in this embodiment can implement the content described in any of the foregoing embodiments, and details are not described here.

Referring to FIG. 9 , FIG. 9 is a schematic structural diagram of an embodiment of a testing system provided by the present application. The testing system 400 includes: a testing device 200 and a switching device 100 . The switching device 100 is connected between the testing device 200 and the storage device to be tested, so that the testing device 200 can test the storage device to be tested.

In some embodiments, described in conjunction with FIG. 1 , the switching device 100 includes a voltage regulating circuit 10 and a current sampling circuit 20 .

The voltage adjustment circuit 10 is connected to the test device 200 and the storage device to be tested, and is used to adjust the test voltage provided by the test device 200 and output the adjusted test voltage to the storage device to be tested.

The current sampling circuit 20 is connected to the testing device 200 and the storage device to be tested, and is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device 200 .

It can be understood that the switching device 100 in this embodiment, like the switching device 100 in any of the foregoing embodiments, forms a test system 400 with the testing device 200, and can implement the content described in any of the foregoing embodiments, which will not be repeated here.

Referring to FIG. 10 , FIG. 10 is a schematic flowchart of an embodiment of a testing method for a storage device provided by the present application. The method includes:

Step 101 : Adjust the test voltage provided by the test device by using the voltage adjustment circuit of the adapter device, and output the adjusted test voltage to the storage device to be tested.

Wherein, the voltage regulating circuit is connected with the testing device and the storage device to be tested.

Step 102: Use the current sampling circuit of the switching device to sample the working current of the storage device to be tested, and send the working current to the testing device, so that the testing device can test the storage device to be tested.

Wherein, the current sampling circuit is connected to the testing device and the storage device to be tested.

The method is applied to the switching device 100 shown in FIG. 1 , and the switching device 100 is connected between the testing device and the storage device to be tested. Specifically, refer to any of the above-mentioned embodiments, which will not be repeated here.

It can be understood that the method can also be applied to the switching device 100 in any of the above embodiments, and the switching device 100 is connected between the testing device and the storage device to be tested. Specifically, refer to any of the above-mentioned embodiments, which will not be repeated here.

In the above manner, the voltage adjustment circuit is used to adjust the test voltage and the current sampling circuit to collect the working current of the storage device to be tested based on the adjusted test voltage, without the need to individually set the test voltage for the test device each time, which can improve the storage device to be tested. The test efficiency of the device is improved, and the test device can obtain the working current of the storage device to be tested, so that the test is more comprehensive and the test effect is improved.

In this application, the storage device to be tested in any of the above embodiments may be a memory module, and the type of the memory module may be a DIMM (Dual-Inline-Memory-Modules, dual in-line storage modules), or a SIMM (single in-line memory module, single-side contact memory module), or UDIMM (Unbuffered DualIn-Line Memory Modules, unbuffered dual-channel memory module), or SODIMM (Small OutlineDual In-line Memory Module, Small Form Factor Dual Inline Memory Module).

Referring to FIG. 11, FIG. 11 is a schematic structural diagram of an embodiment of a computer-readable storage medium provided by the present application. The computer-readable storage medium 500 is used to store program data 501, and when the program data 501 is executed by a processor, it is used to realize The following method steps:

The test voltage provided by the test device is adjusted by the voltage adjustment circuit of the switching device, and the adjusted test voltage is output to the storage device to be tested; wherein, the voltage adjustment circuit connects the test device and the storage device to be tested; The current sampling circuit samples the working current of the storage device to be tested, and sends the working current to the testing device, so that the testing device tests the storage device to be tested.

It can be understood that the computer-readable storage medium 500 in this embodiment is applied to the switching device 100 in any of the foregoing embodiments, and reference may be made to the foregoing embodiments for the specific implementation, which will not be repeated here.

In the several embodiments provided in this application, it should be understood that the disclosed method and device may be implemented in other manners. For example, the device implementations described above are only illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other divisions. For example, multiple units or components may be Incorporation may either be integrated into another system, or some features may be omitted, or not implemented.

The units described as separate components may or may not be physically separated, and components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution in this implementation manner.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware, or may be implemented in the form of software functional units.

If the integrated units in the other embodiments described above are implemented in the form of software functional units and sold or used as independent products, they may be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the present application can be embodied in the form of software products in essence, or the parts that contribute to the prior art, or all or part of the technical solutions, and the computer software products are stored in a storage medium , including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (processor) to execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: U disk, removable hard disk, Read-Only Memory (ROM, Read-Only Memory), Random Access Memory (RAM, Random Access Memory), magnetic disk or optical disk and other media that can store program codes.

The above description is only an embodiment of the present application, and is not intended to limit the scope of the patent of the present application. Any equivalent structure or equivalent process transformation made by using the contents of the description and drawings of the present application, or directly or indirectly applied to other related technologies Fields are similarly included within the scope of patent protection of this application.

Claims (10)

1. A switching device, characterized in that, the switching device is connected between a testing device and a storage device to be tested, so that the testing device tests the storage device to be tested, and the switching device include: a voltage regulation circuit, connected to the test device and the storage device to be tested, for adjusting the test voltage provided by the test device, and outputting the adjusted test voltage to the storage device to be tested; A current sampling circuit is connected to the testing device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device. 2. The switching device according to claim 1, characterized in that, The switching device further includes a control circuit, the control circuit is connected to the testing device, the voltage regulating circuit and the current sampling circuit; the control circuit is configured to output the test voltage provided by the test device to the voltage adjustment circuit, and control the voltage adjustment circuit to adjust the test voltage; and The control circuit is further configured to acquire the working current sampled by the current sampling circuit, and send the working current to the testing device. 3. The switching device according to claim 2, characterized in that, The switching device further includes a programming circuit, and the programming circuit connects the control circuit and the storage device to be tested; The control circuit is further configured to output the first SPD information provided by the testing device to the programming circuit, and control the programming circuit to program the first SPD information to the storage device to be tested. in the SPD chip. 4. The switching device according to claim 3, characterized in that, The control circuit is further configured to control the programming circuit to acquire second SPD information from the SPD chip, and to confirm whether the first SPD information and the second SPD information are consistent. 5. The switching device according to claim 4, characterized in that, The switching device further includes an indicator light, and the indicator light is connected to the control circuit; The control circuit is further configured to control the indicator light to remind abnormality when it is confirmed that the first SPD information and the second SPD information are inconsistent. 6. The switching device according to claim 3, characterized in that, The switching device further includes a switching circuit, the switching circuit is connected to the control circuit; The control circuit is used for controlling the switching circuit to connect to the programming circuit or the voltage regulating circuit. 7. The switching device according to claim 1, characterized in that, The switching device also includes: a first communication interface, connected to the test device, one end of the voltage regulation circuit, and one end of the current sampling circuit, for outputting the test voltage provided by the test device to the voltage regulation circuit; and The working current is sent to the test device; The second communication interface is connected to the storage device to be tested, the other end of the voltage adjustment circuit and the other end of the current sampling circuit, and is used for outputting the test voltage adjusted by the voltage adjustment circuit to the to-be-tested a storage device; and obtaining the operating current of the storage device to be tested and inputting it to the current sampling circuit. 8. The switching device according to claim 7, characterized in that, The switching device also includes: A circuit board, the voltage regulation circuit, the current sampling circuit, the first communication interface and the second communication interface are arranged on the circuit board. 9. A test system, characterized in that the test system comprises: test device; A switching device, the switching device is connected between the testing device and the storage device to be tested, so that the testing device can test the storage device to be tested, the switching device comprises: a voltage regulation circuit, connected to the test device and the storage device to be tested, for adjusting the test voltage provided by the test device, and outputting the adjusted test voltage to the storage device to be tested; A current sampling circuit is connected to the testing device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested, and sending the working current to the testing device. 10. A method for testing a storage device, characterized in that it is applied to a switching device, and the switching device is connected between the testing device and a storage device to be tested, the method comprising: The test voltage provided by the test device is adjusted by the voltage adjustment circuit of the adapter device, and the adjusted test voltage is output to the storage device to be tested; wherein the voltage adjustment circuit is connected to the test device and the storage device to be tested; The working current of the storage device to be tested is sampled by the current sampling circuit of the switching device, and the working current is sent to the testing device, so that the testing device can measure the storage device to be tested. testing; wherein, the current sampling circuit is connected to the testing device and the storage device to be tested.

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