CN114944127A - Display panel alignment method, display panel gamma debugging method and device - Google Patents

Abstract

The embodiments of the present application provide an alignment method for a display panel, a gamma debugging method and device for the display panel, and a predetermined area of the display panel is controlled to display an alignment pattern adapted to the size of the probe, and the luminance value of the alignment pattern is smaller than the predetermined area. The brightness values of other surrounding areas; control the probe to move along the first direction from the starting position, and collect multiple first brightness values at different positions on the first moving path along the first direction, and obtain the smallest first moving path on the first moving path. A first coordinate corresponding to a brightness value; control the probe to move along the second direction, and collect multiple second brightness values at different positions on the second moving path along the second direction, to obtain the minimum second brightness on the second moving path The second coordinate corresponding to the value; the alignment position is determined according to the first coordinate and the second coordinate. The embodiments of the present application help to achieve precise alignment and automatic alignment between the center of the probe and the center of the alignment pattern.

Description

Alignment method of display panel, gamma debugging method and device of display panel

technical field

The present application belongs to the field of display technology, and in particular, relates to an alignment method for a display panel, a gamma debugging method and device for a display panel.

Background technique

With the rapid development of electronic devices, users have higher and higher requirements for screen-to-body ratio. In order to increase the screen ratio, the design of the under-screen camera has appeared, and the display area of the display panel is divided into a secondary screen area and a main screen area, and the secondary screen area corresponds to a camera and other photosensitive elements.

In order to ensure that the brightness and chromaticity of the secondary screen area are consistent with the brightness and chromaticity of the main screen area, gamma debugging can usually be performed on the secondary screen area and the main screen area respectively. Whether the result of gamma debugging (especially for the secondary screen area) is accurate, the main factor is whether the alignment of the probe of the optical measuring device with the secondary screen area or the main screen area is accurate. However, there is currently a problem of inaccurate alignment between the probe of the optical measuring device and the display panel.

SUMMARY OF THE INVENTION

Embodiments of the present application provide a method for aligning a display panel, a method and a device for gamma debugging of the display panel, which can solve the problem of inaccurate alignment between the probe of an optical measuring device and the display panel.

In the first aspect, an embodiment of the present application provides a method for aligning a display panel. The method for aligning the display panel includes: controlling a predetermined area of the display panel to display an alignment pattern that is adapted to the size of the probe, and the luminance value of the alignment pattern less than the brightness value of other areas around the predetermined area; control the probe to move along the first direction from the starting position, and collect multiple first brightness values at different positions on the first moving path along the first direction, and obtain the first moving path. The first coordinate corresponding to the smallest first brightness value; control the probe to move along the second direction, and collect multiple second brightness values at different positions on the second moving path along the second direction, to obtain the smallest value on the second moving path. For the second coordinate corresponding to the second brightness value, the second direction intersects the first direction; the alignment position is determined according to the first coordinate and the second coordinate.

According to the implementation of the first aspect of the present application, a plurality of first brightness values at different positions on the first moving path along the first direction are collected to obtain the first coordinate corresponding to the smallest first brightness value on the first moving path, specifically It may include: judging whether the first brightness value corresponding to the ith position on the first movement path is greater than the first brightness value corresponding to the ith position on the first movement path, and the ith position is the ith position The previous position of , i is a positive integer; when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the ith position, the coordinates of the ith position are determined as the first coordinates ; Collect a plurality of second brightness values at different positions on the second moving path along the second direction, and obtain the second coordinate corresponding to the smallest second brightness value on the second moving path, which may specifically include: judging the second moving path on the second moving path. Whether the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position on the second movement path, the j-1th position is the previous position of the jth position, and j is a positive integer ; When the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, the coordinates of the j-1th position are determined as the second coordinates.

Since the center of the probe is closer to the center of the alignment pattern, the overlapping area between the probe and the alignment pattern is larger, so the brightness value collected by the probe at a position closer to the center of the alignment pattern is smaller. Therefore, when the brightness value of the current position collected by the probe is larger than the brightness value of the previous position, it means that the center of the probe moves to the center of the alignment pattern, that is, the previous position of the current position is closest to the center of the alignment pattern ( such as coincident with the center of the alignment pattern). In this way, based on the inflection point where the brightness value collected by the probe changes from small to large, the center coordinates of the alignment pattern can be accurately determined.

According to any of the foregoing embodiments of the first aspect of the present application, before determining the coordinates of the i-1th position as the first coordinates, the method for aligning the display panel may further include: the first brightness value corresponding to the ith position If it is greater than the first brightness value corresponding to the i-1th position, determine whether the first brightness values corresponding to the i+1th position to the i+nth position on the first moving path are all greater than those on the first moving path. The first brightness value corresponding to the i-1th position, the i+1th position is the next position of the ith position, the i+nth position is the last n positions of the ith position, and n is a positive integer ; Determine the coordinate of the i-1th position as the first coordinate, which may specifically include: when the first brightness value corresponding to the i+1th position to the i+nth position is greater than the corresponding first brightness value of the i-1th position In the case of the first brightness value, the coordinate of the i-1th position is determined as the first coordinate.

In this way, in the case where the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, the first luminance value corresponding to the i+1-th position to the i+n-th position is passed. The verification of the brightness value can improve the accuracy of the determined first coordinate, thereby improving the accuracy of the center coordinate of the finally determined alignment pattern, and effectively avoid misjudgment.

According to any of the foregoing embodiments of the first aspect of the present application, before controlling the probe to move in the second direction, the method for aligning the display panel may further include: controlling the probe to return to the i-1th position; After the second coordinate corresponding to the second brightness value of , the method for aligning the display panel may further include: controlling the probe to return to the j-1th position.

In this way, while determining the first coordinate and the second coordinate, and performing step-by-step alignment of the probe on the other side, the alignment time of the probe can be shortened and the speed of the alignment process can be improved.

According to any of the foregoing embodiments of the first aspect of the present application, the method for aligning the display panel may further include: controlling the probe to move in reverse along the first direction, and collecting a plurality of third brightness values at different positions on the first reverse movement path , the first reverse movement path is a path of reverse movement along the first direction; determine whether the third brightness value corresponding to the pth position on the first reverse movement path is greater than the p-1th position on the first reverse movement path The third brightness value corresponding to the position, the p-1th position is the previous position of the pth position, and p is a positive integer; when the third brightness value corresponding to the pth position is greater than the p-1th position corresponding to the first position When there are three luminance values, it is judged whether the p-1th position is the same as the i-1th position; when the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1th position, the The coordinates of the i-1th position are determined as the first coordinates, which specifically includes: in the case that the p-1th position is the same as the i-1th position, the coordinates of the i-1th position are determined as the first coordinates; When the p-1 th position and the i-1 th position are different, the average value of the coordinates of the p-1 th position and the coordinates of the i-1 th position is determined as the first coordinate.

In this way, the p-1th position is obtained by controlling the probe to move in the reverse direction along the first direction, and the p-1th position is used to calibrate and verify the i-1th position, which can improve the accuracy of the determined first coordinate. Therefore, the accuracy of the center coordinates of the finally determined alignment pattern is improved, and misjudgment is effectively avoided.

According to any of the foregoing embodiments of the first aspect of the present application, controlling the probe to move from the starting position along the first direction specifically includes: judging the first brightness value corresponding to the xth position on the first moving path and the first brightness value corresponding to the xth position on the first moving path. The size relationship of the first brightness value corresponding to the x-1 position, the x-1th position is the previous position of the xth position, and x is a positive integer; when the first brightness value corresponding to the xth position is equal to the xth position When the first brightness value corresponding to -1 position, control the probe to move in the first direction at the first step value and/or the first moving speed until the first brightness value corresponding to the xth position is less than the x-1th The first brightness value corresponding to the position; when the first brightness value corresponding to the xth position is less than the first brightness value corresponding to the x-1th position, the probe is controlled to move along the edge at the second step value and/or the second moving speed. Move in the first direction until the first coordinate corresponding to the smallest first brightness value on the first moving path is obtained; wherein the first step value is greater than the second step value, and the first moving speed is greater than the second moving speed.

When the first brightness value corresponding to the xth position is equal to the first brightness value corresponding to the x-1th position, it means that the probe has not overlapped with the alignment pattern, that is, the center distance between the probe and the alignment pattern is still far. When the first brightness value corresponding to the xth position is smaller than the first brightness value corresponding to the x-1th position, it means that the probe begins to overlap the alignment pattern, that is, the probe has approached the center of the alignment pattern. In this way, on the one hand, when the probe is far from the center of the alignment pattern, controlling the movement of the probe with a larger first step value and/or a first moving speed can improve the alignment speed and shorten the alignment time; On the other hand, when the probe is closer to the center of the alignment pattern, controlling the movement of the probe with a smaller second step value and/or a second moving speed can improve the alignment accuracy and accurately find the position of the alignment pattern. center.

According to any of the aforementioned embodiments of the first aspect of the present application, the display panel includes a first display area and a second display area, the light transmittance of the second display area is greater than that of the first display area; when the probe size is greater than that of the second display area When the size of the area is determined, the center of the second display area is the center of the alignment pattern, and the alignment pattern is displayed based on the second display area and part of the first display area close to the second display area; when the probe size is smaller than or equal to the second display area When the size of the area is adjusted, the center of the second display area is taken as the center of the alignment pattern, and the alignment pattern is displayed based on the second display area.

In this way, the embodiments of the present application can be adapted to probes of different sizes and second display areas of different shapes/dimensions, that is, adapted to various application scenarios.

According to any of the foregoing embodiments of the first aspect of the present application, the second display area includes a light-transmitting area, the first display area includes a transition area surrounding the light-transmitting area, the transition area is provided with a driving device, and the light-transmitting area is not provided with a driving device; When the size of the probe is smaller than or equal to the size of the light-transmitting area, the center of the light-transmitting area is taken as the center of the alignment pattern, and the alignment pattern is displayed based on the light-transmitting area.

In this way, it can be ensured that the center of the probe is aligned with the center of the light-transmitting area, and the brightness values collected by the probe are all the brightness values of the light-transmitting area. Accuracy of gamma tuning results in the display area.

In a second aspect, an embodiment of the present application provides a gamma adjustment method for a display panel, the display panel includes a first display area and a second display area, and the gamma adjustment method for the display panel includes: controlling a probe to move to the first display area , and perform gamma debugging on the first display area; based on the alignment method of the display panel provided in the first aspect, move the probe to the alignment position, and the alignment pattern is at least partially located in the second display area; area for gamma debugging.

In a third aspect, an embodiment of the present application provides a gamma debugging device for a display panel, which is used to execute the gamma debugging method for a display panel provided in the second aspect. The gamma debugging device includes: a workbench for carrying a display panel a panel; a first conveying part, located on at least one side of the workbench and extending along a first direction; a second conveying part, extending along a second direction and overhanging the workbench, the second conveying part and the first The transmission part is connected, and the second transmission part can move relative to the first transmission part along the first direction; the clamping part is connected with the second transmission part, and the clamping part can move relative to the second transmission part along the second direction; the probe, It is fixedly mounted on the clamping part; the controller is electrically connected with the first transmission part, the second transmission part and the probe.

According to any of the foregoing embodiments of the third aspect of the present application, the worktable is provided with a first groove and a second groove, the first groove is used for placing the display panel, and the second groove is located in the first groove along the first direction The gamma debugging device further includes a light-emitting portion, the light-emitting portion is located in the second groove, and the light-emitting portion is strip-shaped and extends along the second direction.

In this way, by opening the first groove to place the display panel, the positioning of the display panel can be realized and the accuracy of the alignment can be ensured; by opening the second groove on the side of the first groove close to the second display area, The second groove can provide enough space for the movement of the probe to prevent the probe from hitting the edge of the first groove during alignment; by arranging the light-emitting part in the second groove, it can ensure that even if a part of the probe moves Two grooves, the brightness value collected by the probe will also change from small to large, ensuring the smooth progress of the alignment.

According to any of the foregoing embodiments of the third aspect of the present application, the first groove communicates with the second groove.

In this way, the first groove and the second groove can be integrally formed through the same process, which facilitates the simplification of the production process and reduces the production cost of the gamma debugging device of the display panel.

The alignment method for a display panel, the gamma debugging method and device for the display panel according to the embodiments of the present application control a predetermined area of the display panel to display an alignment pattern adapted to the size of the probe, and the luminance value of the alignment pattern is smaller than that around the predetermined area. The brightness values of other areas; control the probe to move along the first direction from the starting position, and collect multiple first brightness values at different positions on the first moving path along the first direction, and obtain the smallest first moving path on the first moving path. The first coordinate corresponding to the brightness value; control the probe to move along the second direction, and collect multiple second brightness values at different positions on the second moving path along the second direction, to obtain the smallest second brightness value on the second moving path The corresponding second coordinate, the second direction intersects the first direction; the alignment position is determined according to the first coordinate and the second coordinate. In this embodiment of the present application, the center coordinates of the alignment pattern can be accurately determined according to the first coordinate corresponding to the smallest first brightness value on the first moving path and the second coordinate corresponding to the smallest second brightness value on the second moving path. , and then can realize the precise alignment of the probe and the alignment pattern, and improve the alignment accuracy. In addition, during the alignment process, the automatic alignment of the probe and the alignment pattern can be realized without human intervention.

Description of drawings

In order to illustrate the technical solutions of the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the embodiments of the present application. For those of ordinary skill in the art, without creative work, the Additional drawings can be obtained from these drawings.

1 is a schematic structural diagram of a display panel;

2 is a schematic top view of an alignment pattern in an alignment method for a display panel provided by an embodiment of the present application;

3 is another schematic top view of an alignment pattern in an alignment method for a display panel provided by an embodiment of the present application;

4 is a schematic flowchart of a method for aligning a display panel according to an embodiment of the present application;

FIG. 5 is an operational schematic diagram of a method for aligning a display panel provided by an embodiment of the present application;

FIG. 6 is a schematic diagram of another operation of the alignment method of the display panel provided by the embodiment of the present application;

FIG. 7 is a schematic diagram of another operation of a display panel alignment method provided by an embodiment of the present application;

FIG. 8 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

FIG. 9 is another schematic flowchart of a method for aligning a display panel provided by an embodiment of the present application;

FIG. 10 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

11 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

12 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

FIG. 13 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

FIG. 14 is a schematic diagram of another operation of the alignment method of the display panel provided by the embodiment of the present application;

FIG. 15 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application;

FIG. 16 is a schematic diagram of another operation of the alignment method of the display panel provided by the embodiment of the present application;

FIG. 17 is a schematic flowchart of another method for aligning a display panel provided by an embodiment of the present application;

FIG. 18 is a schematic diagram of another operation of the display panel alignment method provided by the embodiment of the present application;

FIG. 19 is another schematic flowchart of a method for aligning a display panel provided by an embodiment of the present application;

FIG. 20 is a schematic top view of a display panel provided by an embodiment of the present application;

FIG. 21 is another schematic top view of the display panel provided by the embodiment of the application;

22 is a schematic diagram of an operation of a gamma debugging method for a display panel provided by an embodiment of the present application;

23 is a schematic flowchart of a gamma debugging method for a display panel provided by an embodiment of the present application;

FIG. 24 is a schematic diagram of another operation of a gamma debugging method for a display panel provided by an embodiment of the present application;

25 is a schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application;

26 is another schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application;

FIG. 27 shows a schematic diagram of a hardware structure of an electronic device provided by an embodiment of the present application.

Detailed ways

The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application more clear, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present application, but not to limit the present application. It will be apparent to those skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely to provide a better understanding of the present application by illustrating examples of the present application.

It should be noted that, in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any relationship between these entities or operations. any such actual relationship or sequence exists. Moreover, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device that includes a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element defined by the phrase "comprises" does not preclude the presence of additional identical elements in a process, method, article, or device that includes the element.

It should be understood that the term "and/or" used in this document is only an association relationship to describe the associated objects, indicating that there may be three kinds of relationships, for example, A and/or B, which may indicate that A exists alone, and A and B exist at the same time. B, there are three cases of B alone. In addition, the character "/" in this document generally indicates that the related objects are an "or" relationship.

Before describing the technical solutions provided by the embodiments of the present application, in order to facilitate the understanding of the embodiments of the present application, the present application first specifically describes the problems existing in the prior art:

As shown in Figure 1, the display panel includes a main screen area 01' and a secondary screen area 02', and the secondary screen area 02' can be correspondingly set with photosensitive elements such as under-screen cameras. In order to improve the light transmittance of the secondary screen area 02', the pixel area and/or pixel density of the secondary screen area 02' may be smaller than the pixel area and/or pixel density of the main screen area 01'. Therefore, since the pixel area and/or pixel density of the main screen area 01' and the sub-screen area 02' are different, the gamma debugging result of the main screen area 01' is not suitable for the sub-screen area 02'.

Therefore, in order to ensure that the brightness and chromaticity of the secondary screen area are consistent with the brightness and chromaticity of the main screen area, gamma debugging can usually be performed on the secondary screen area and the main screen area respectively. Whether the result of gamma debugging (especially for the secondary screen area) is accurate, the main factor is whether the alignment of the probe of the optical measuring device with the secondary screen area or the main screen area is accurate.

For ease of understanding, let's take the secondary screen area as an example. The sub-screen area includes a plurality of sub-pixels, and the driving chip (driving IC) provides driving signals for sub-pixels at different positions in the sub-screen area through signal lines, so as to drive the sub-pixels in the sub-screen area to emit light. Since the distances between the sub-pixels in different positions in the sub-screen area and the driver chip are different, the brightness of different positions in the sub-screen area is different due to the influence of the voltage drop (IR-drop) on the signal line, such as the near IC side and the far side. One of the IC terminals is bright and the other is dark. The brightness in the center of the sub-screen area can be regarded as the average value of the brightness of the near IC end in the sub-screen area and the brightness of the far IC end in the sub-screen area. Therefore, the brightness in the center of the sub-screen area can most objectively reflect the average value of the sub-screen area. brightness. Therefore, when performing gamma debugging on the secondary screen area, it is best to align the center of the probe with the center of the secondary screen area, so that the collected brightness values can most objectively reflect the average brightness of the secondary screen area, which is conducive to improving gamma debugging. accuracy.

However, the inventors of the present application have found that there is currently a problem of inaccurate alignment between the probe of the optical measuring device and the display panel. For example, when gamma debugging is performed on the secondary screen area, the center of the probe cannot be accurately aligned with the center of the secondary screen area, resulting in poor final gamma debugging accuracy. For example, in some related technologies, debugging personnel are required to manually adjust the position of the probe and perform manual alignment, resulting in poor alignment accuracy between the probe and the display panel, and the alignment takes a long time.

In view of the above research findings of the inventors, the embodiments of the present application provide a method for aligning a display panel, a method and device for gamma debugging a display panel, which can solve the problem of aligning the probe of an optical measuring device and the display panel in the related art Imprecise technical issues.

The technical idea of the embodiment of the present application is to control a predetermined area of the display panel to display an alignment pattern adapted to the size of the probe, and the luminance value of the alignment pattern is smaller than that of other areas around the predetermined area; control the probe from the starting position along the moving in the first direction, and collecting a plurality of first brightness values at different positions on the first moving path along the first direction to obtain the first coordinate corresponding to the smallest first brightness value on the first moving path; controlling the probe to move along the second moving in the second direction, and collecting a plurality of second brightness values at different positions on the second moving path along the second direction, to obtain the second coordinate corresponding to the smallest second brightness value on the second moving path, the second direction and the first direction Cross; determine the alignment position according to the first coordinate and the second coordinate. In this way, according to the first coordinate corresponding to the smallest first brightness value on the first moving path and the second coordinate corresponding to the smallest second brightness value on the second moving path, the center coordinate of the alignment pattern can be accurately determined, and then the center coordinate of the alignment pattern can be accurately determined. Accurate alignment between the center of the probe and the center of the alignment pattern can be achieved, and the alignment accuracy can be improved.

The following first describes the alignment method of the display panel provided by the embodiment of the present application.

FIG. 2 is a schematic top view of an alignment pattern in an alignment method for a display panel provided by an embodiment of the present application. FIG. 3 is another schematic top view of the alignment pattern in the alignment method of the display panel provided by the embodiment of the present application. FIG. 4 is a schematic flowchart of a method for aligning a display panel according to an embodiment of the present application.

As shown in FIG. 4 , the method for aligning the display panel provided by the embodiment of the present application may include the following steps S101 to S104 .

S101. Control a predetermined area of the display panel to display an alignment pattern adapted to the size of the probe, and the luminance value of the alignment pattern is smaller than that of other areas around the predetermined area.

As shown in FIG. 2 , in this embodiment of the present application, in S101 , a predetermined area of the display panel 10 can be controlled to display an alignment pattern 100 adapted to the size of the probe. Among them, the size of the probe can be understood as the size of the lens (cross-section or lighting surface) of the probe, and the probe is the probe of an optical measuring device (such as a color analyzer). The matching of the alignment pattern 100 with the size of the probe can be understood as: the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 is exactly the same as the size of the probe, or the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 Can be exactly the same size as a portion of the probe's lens. For example, taking the lens of the probe as an example, in the embodiment shown in FIG. 2 , the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 is exactly the same as the size of the probe, that is, the alignment pattern 100 may be the same as the size of the probe. The probes are round with the same size. In the embodiment shown in FIG. 3 , the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 may be exactly the same as that of a part of the lens of the probe, that is, the alignment pattern 100 may be a circle with the same size as the probe. a part of. The predetermined area may be a preset partial area of the display panel 10 , such as a secondary screen of the display panel 10 , or a partial area of the secondary screen and the main screen of the display panel 10 , which is not limited in this embodiment of the present application.

It should be noted that the size of the alignment pattern 100 is the same as the size of the probe, and it can be understood that the size of the alignment pattern 100 is the same as the size of the probe within the allowable error. That is, the difference between the size of the alignment pattern 100 and the size of the probe may be within an allowable error, and the size of the error may be flexibly adjusted according to the actual situation, which is not limited in this embodiment of the present application.

Continuing to refer to FIG. 2 or FIG. 3 , the luminance value of the alignment pattern 100 is smaller than that of other areas around the predetermined area, that is, the luminance value of the alignment pattern 100 is smaller than that of other areas around the alignment pattern 100 on the display panel 10 , so that Subsequently, the center coordinates of the alignment pattern 100 are determined according to the change of brightness and darkness. For example, in some embodiments, a predetermined area of the display panel 10 may display the alignment pattern 100 , and other areas on the display panel 10 other than the predetermined area may display the background image 200 , and the luminance value of the alignment pattern 100 is smaller than that of the background image 200 brightness value. Exemplarily, for example, the background picture 200 is a white picture or another light color picture, and the alignment pattern 100 is a black pattern, a gray pattern or other dark color patterns.

S102. Control the probe to move along the first direction from the starting position, and collect a plurality of first brightness values at different positions on the first moving path along the first direction, and obtain the first brightness value corresponding to the smallest first brightness value on the first moving path. first coordinate.

FIG. 5 is an operation schematic diagram of an alignment method of a display panel provided by an embodiment of the present application. As shown in FIG. 5 , the first direction may be the column direction Y of the display panel 10 , or the first direction may also be the row direction X of the display panel 10 , which is not limited in the comparison of the embodiments of the present application. Taking the first direction as the column direction Y of the display panel 10 as an example, in S101, the probe 500 can be controlled to move from the starting position P along the first direction (eg, the column direction Y), that is, along the first movement shown in FIG. 5 . Path s1 moves. It is easy to understand that at least part of the alignment pattern 100 is located on the first moving path s1 , so that the probe 500 can collect the luminance value of the alignment pattern 100 when moving along the first moving path s1 . In some specific examples, for example, the minimum distance L between the starting position P and the center O of the alignment pattern 100 in the second direction (eg, the row direction X) may be smaller than a preset first distance threshold, so that at least part of The alignment pattern 100 can be located on the first moving path s1. The first distance threshold may be flexibly set according to the actual situation, for example, the first distance threshold may be smaller than the radius of the alignment pattern 100 . In actual operation, the starting position can be simply determined by human eyes.

During the movement of the probe 500 in the first direction, the probe 500 may collect multiple luminance values at different positions on the first movement path s1 along the first direction. For the convenience of distinction, the probe 500 is collected along the first movement path s1 here. The resulting luminance value is referred to as the first luminance value. Exemplarily, for example, when the probe 500 moves a certain distance on the first moving path s1, the luminance value and the coordinate value of the center of the probe 500 are collected once, so as to obtain multiple first luminance values at different positions on the first moving path s1.

FIG. 6 is a schematic diagram of another operation of an alignment method of a display panel provided by an embodiment of the present application. As shown in FIG. 6 , assuming that the coordinates of the center O of the alignment pattern 100 are (x1, y1), the first direction may be the column direction Y of the display panel 10 . Then, when the center O' of the probe 500 moves along the first direction until the ordinate is equal to the ordinate of the center O of the alignment pattern 100, that is, when the center O' of the probe 500 is located on the straight line of y=y1, the probe 500 and the The overlapping area of the alignment pattern 100 is the largest, and the brightness value collected by the probe is the smallest. At this time, the first coordinate (ie, the coordinate of the center O' of the probe 500 ) is (x2, y1). That is, after obtaining the first coordinate corresponding to the smallest first luminance value on the first moving path s1, at least one coordinate (eg, the ordinate y1) of the center O of the alignment pattern 100 can be determined.

S103, controlling the probe to move along the second direction, and collecting a plurality of second luminance values at different positions on the second moving path along the second direction, to obtain the second coordinate corresponding to the smallest second luminance value on the second moving path, The second direction intersects the first direction.

Continuing to refer to FIG. 6 , the second direction may be the row direction X of the display panel 10 , or the first direction may also be the column direction Y of the display panel 10 , which is not limited by the comparison of the embodiments of the present application. Taking the first direction as the column direction Y of the display panel 10 and the second direction as the row direction X of the display panel 10 as an example, in S102, the probe 500 can be controlled to follow the straight line of y=y1 or y=y1±Δy (that is, the first two directions) movement, wherein y1 is the ordinate y1 in the first coordinate, Δy can be flexibly adjusted according to the actual situation, and Δy can be smaller than the radius of the alignment pattern 100 .

During the movement of the probe 500 in the second direction, the probe 500 may collect multiple luminance values at different positions along the second movement path s2 along the second direction. For the convenience of distinction, the probe 500 is collected along the second movement path s2 here. The resulting luminance value is referred to as the second luminance value. Exemplarily, for example, when the probe 500 moves a certain distance on the second moving path s2, the luminance value and the coordinate value of the center of the probe 500 are collected once, so as to obtain a plurality of second luminance values at different positions on the second moving path s2.

FIG. 7 is a schematic diagram of another operation of the display panel alignment method provided by the embodiment of the present application. As shown in FIG. 7 , assuming that the coordinates of the center O of the alignment pattern 100 are (x1, y1), the first direction may be the column direction Y of the display panel 10 , and the second direction may be the row direction X of the display panel 10 . Then, when the center O' of the probe 500 moves along the second direction until the abscissa is equal to the abscissa of the center O of the alignment pattern 100, that is, when the center O' of the probe 500 is located on the straight line of x=x1, the probe 500 and the The overlapping area of the alignment pattern 100 is the largest, and the brightness value collected by the probe is the smallest. At this time, the second coordinate (ie the coordinate of the center O' of the probe 500 ) is (x1, y1) or (x1, y1±Δy). That is, after obtaining the second coordinate corresponding to the smallest second luminance value on the second moving path s2, at least another coordinate (eg, abscissa x1) of the center O of the alignment pattern 100 can be determined.

S104. Determine the alignment position according to the first coordinate and the second coordinate.

Exemplarily, after obtaining the first coordinate (x2, y1) and the second coordinate (x1, y1) or (x1, y1±Δy), for example, the ordinate y1 in the first coordinate and the The abscissa is x1, and the alignment position (x1, y1) is obtained. The alignment position is the center O of the alignment pattern 100 .

In this embodiment of the present application, the center coordinates of the alignment pattern can be accurately determined according to the first coordinate corresponding to the smallest first brightness value on the first moving path and the second coordinate corresponding to the smallest second brightness value on the second moving path. , and then can realize the precise alignment of the probe and the alignment pattern, and improve the alignment accuracy.

FIG. 8 is another schematic flowchart of a method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 8 , according to some embodiments of the present application, optionally, in S102 , a plurality of first luminance values at different positions on the first moving path along the first direction are collected to obtain the minimum value on the first moving path. The first coordinate corresponding to the first brightness value of , may specifically include the following steps S801 and S802.

S801. Determine whether the first luminance value corresponding to the i-th position on the first moving path is greater than the first luminance value corresponding to the i-1-th position on the first moving path. Wherein, the ith position is the previous position (or the previous position) of the ith position, and i is a positive integer greater than 1.

S802. When the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the ith position, determine the coordinates of the ith position as the first coordinates.

It should be noted that the i-th position is any position on the first movement path. That is, every time the center of the probe moves to a position, the position can be regarded as the above-mentioned i-th position, and the above-mentioned steps S801 and S802 are executed.

With reference to FIG. 6 , because the closer the center O' of the probe 500 is to the center O of the alignment pattern 100, the larger the overlapping area of the probe 500 and the alignment pattern 100 is. The smaller the brightness value of the location acquisition. Therefore, when the luminance value of the current position collected by the probe 500 is larger than the luminance value of the previous position, it means that the center O' of the probe 500 is deviated from the center of the alignment pattern 100 from the position closest to the center O of the alignment pattern 100 O moves, that is, the previous position of the current position is closest to the center O of the alignment pattern 100 (eg, coincides with the center O of the alignment pattern 100 ). In this way, based on the inflection point where the brightness value collected by the probe changes from small to large, the first coordinate corresponding to the smallest first brightness value on the first moving path can be accurately determined, and then the center coordinate of the alignment pattern can be accurately determined. .

Similarly, as shown in FIG. 9 , according to some embodiments of the present application, optionally, in S103 , collect multiple second luminance values at different positions on the second movement path along the second direction to obtain the second movement The second coordinate corresponding to the smallest second brightness value on the path may specifically include the following steps S901 and S902.

S901. Determine whether the second brightness value corresponding to the jth position on the second movement path is greater than the second brightness value corresponding to the j-1th position on the second movement path. The j-1th position is the previous position (or the previous position) of the jth position, and j is a positive integer greater than 1.

S902. When the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, determine the coordinates of the j-1th position as the second coordinates.

It should be noted that the jth position is an arbitrary position on the second movement path. That is, every time the center of the probe moves to a position, the position can be regarded as the above jth position, and the above steps S901 and S902 are executed.

As shown in FIG. 7 , since the center O′ of the probe 500 is closer to the center O of the alignment pattern 100 , the overlapping area of the probe 500 and the alignment pattern 100 is larger, so the probe 500 is closer to the center O of the alignment pattern 100 The smaller the brightness value of the location acquisition. Therefore, when the luminance value of the current position collected by the probe 500 is larger than the luminance value of the previous position, it means that the center O' of the probe 500 is deviated from the center of the alignment pattern 100 from the position closest to the center O of the alignment pattern 100 O moves, that is, the previous position of the current position is closest to the center O of the alignment pattern 100 (eg, coincides with the center O of the alignment pattern 100 ). In this way, based on the inflection point at which the brightness value collected by the probe changes from small to large, the second coordinate corresponding to the smallest first brightness value on the second moving path can be accurately determined, and then combined with the first coordinate, the pair can be accurately determined. The coordinates of the center of the bit pattern.

FIG. 10 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 10 , according to some embodiments of the present application, optionally, in S802, when the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, the i-th Before the coordinates of the -1 position are determined as the first coordinates, the alignment method of the display panel may further include the following steps:

S1001. In the case that the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, determine that the i+1-th position to the i+n-th position on the first movement path correspond to Whether the first brightness values of , are all greater than the first brightness value corresponding to the i-1th position on the first moving path. Wherein, the i+1th position is the position after the ith position, the i+nth position is the last n positions of the ith position, and n is a positive integer. Exemplarily, n can be equal to 1 or greater than 1.

Correspondingly, S802 may specifically include the following steps: when the first brightness values corresponding to the i+1th position to the i+nth position are all greater than the first brightness value corresponding to the i-1th position, set the i-th The coordinates of one position are determined as the first coordinates.

In this way, in the case where the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, the first luminance value corresponding to the i+1-th position to the i+n-th position is passed. Verifying the brightness value, that is, verifying the first brightness value corresponding to the i-1th position through the first brightness values of at least two consecutive positions, can improve the accuracy of the determined first coordinate, and then improve the final determination accuracy. The accuracy of the center coordinates of the bit pattern can effectively avoid misjudgment.

Similarly, according to some embodiments of the present application, optionally, in S902, when the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, the j-1th Before the coordinates of the position are determined as the second coordinates, the method for aligning the display panel may further include the following steps:

In the case where the second luminance value corresponding to the jth position is greater than the second luminance value corresponding to the j-1th position, it is determined that the j+1th position to the j+nth position on the second moving path corresponds to the Whether the two brightness values are both greater than the second brightness value corresponding to the j-1th position on the second movement path. Wherein, the j+1th position is the position after the jth position, the j+nth position is the last n positions of the jth position, and n is a positive integer. Illustratively, n may be equal to 1 or may be equal to 1.

Correspondingly, S902 may specifically include the following steps: when the second brightness values corresponding to the j+1th position to the j+nth position are all greater than the second brightness value corresponding to the j-1th position, the j-th The coordinates of one position are determined as the second coordinates.

In this way, in the case where the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, the second brightness value corresponding to the j+1th position to the j+nth position is passed through. The brightness value is verified, that is, the second brightness value corresponding to the j-1th position is verified by the second brightness value of at least two consecutive positions, which can improve the accuracy of the determined second coordinate, thereby improving the final determination of the accuracy. The accuracy of the center coordinates of the bit pattern can effectively avoid misjudgment.

FIG. 11 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 11 , according to some embodiments of the present application, optionally, after the alignment position is determined according to the first coordinates and the second coordinates in S104 , the alignment method of the display panel may further include the following steps: S105 , Control the probe to move to the alignment position. For example, the center of the control probe moves to the center of the alignment pattern, so as to realize alignment.

FIG. 12 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 12 , different from the embodiment shown in FIG. 11 , according to other embodiments of the present application, optionally, the probe may perform step-by-step alignment while determining the first coordinate and the second coordinate.

Specifically, after the coordinates of the i-1th position are determined as the first coordinates, and before the probe is controlled to move in the second direction in S103, the method for aligning the display panel may further include the following steps:

S121, control the probe to return to the i-1th position.

As described above, the position corresponding to the smallest first luminance value on the first moving path is the i-1 th position, and the coordinates of the i-1 th position are the first coordinates. The probe has moved to the i-th position, so the probe can be controlled to return to the i-1-th position again, for example, the center O' of the probe is located on the straight line of y=y1, that is, the ordinate of the center O' of the probe is opposite to The ordinates of the center O of the bit pattern 100 are the same.

Correspondingly, after obtaining the second coordinate corresponding to the smallest second luminance value on the second moving path, the method for aligning the display panel may further include the following steps:

S122, control the probe to return to the j-1th position.

As described above, the position corresponding to the smallest second luminance value on the second movement path is the j-1 th position, and the coordinates of the j-1 th position are the second coordinates. The probe has moved to the jth position, so the probe can be controlled to return to the j-1th position again. In S121, since the center O' of the probe has been moved to the straight line of y=y1, the coordinates of the j-1th position are the coordinates (x1, y1) of the center O of the alignment pattern 100. Then, the center of the probe is moved to the j-1th position, that is, the alignment between the center O' of the probe and the center O of the alignment pattern 100 is realized.

In this way, while determining the first coordinate and the second coordinate, and performing step-by-step alignment of the probe on the other side, the alignment time of the probe can be shortened and the speed of the alignment process can be improved.

FIG. 13 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 13 , according to some embodiments of the present application, optionally, the method for aligning the display panel provided by the embodiments of the present application may further include the following steps S131 to S133 .

S131 . Control the probe to move in the reverse direction along the first direction, and collect a plurality of third brightness values at different positions on the first reverse movement path, where the first reverse movement path is a reverse movement path along the first direction.

During the reverse movement in the first direction, the probe 500 may collect multiple luminance values at different positions on the first reverse movement path s1'. For the convenience of distinction, the probe 500 is taken along the first reverse movement path s1' here. The collected luminance value is called the third luminance value. Exemplarily, for example, each time the probe 500 moves a certain distance on the first reverse movement path s1', the luminance value and the coordinate value of the center of the probe 500 are collected once, so as to obtain the multiplicity of different positions on the first reverse movement path s1'. a third brightness value.

S132: Determine whether the third brightness value corresponding to the pth position on the first reverse movement path is greater than the third brightness value corresponding to the p-1th position on the first reverse movement path. Wherein, the p-1th position is the previous position of the pth position, and p is a positive integer greater than 1.

S133. When the third luminance value corresponding to the p-th position is greater than the third luminance value corresponding to the p-1-th position, determine whether the p-1-th position and the i-1-th position are the same.

It should be noted that, in theory, the p-1th position and the i-1th position should be the same, but in practice, there may also be a certain deviation between the p-1th position and the i-1th position.

Correspondingly, in S802, when the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, determine the coordinates of the i-1-th position as the first coordinates, which may specifically include the following: Steps S134 and S135.

S134. In the case that the p-1 th position is the same as the i-1 th position, determine the coordinates of the i-1 th position as the first coordinates.

S135. In the case where the p-1 th position and the i-1 th position are different, determine the average value of the coordinates of the p-1 th position and the coordinates of the i-1 th position as the first coordinate.

In this way, the p-1th position is obtained by controlling the probe to move in the reverse direction along the first direction, and the p-1th position is used to calibrate and verify the i-1th position, which can improve the accuracy of the determined first coordinate. Therefore, the accuracy of the center coordinates of the finally determined alignment pattern is improved, and misjudgment is effectively avoided.

According to some embodiments of the present application, optionally, in S131 , when the inflection point of brightness increase is found, immediately move in the opposite direction along the first direction. FIG. 14 is a schematic diagram of another operation of the display panel alignment method provided by the embodiment of the present application. As shown in FIG. 14 , taking the first direction as the column direction Y of the display panel 10 as an example, for example, when the first luminance value corresponding to the i-th position is greater than the first luminance value corresponding to the i-1-th position, it is possible to control the The probe 500 moves in the reverse direction of the first direction (ie, the i-th position points to the i-1-th position, and the dashed arrow indicates the direction). That is, when the inflection point of luminance rise is found, it moves in the reverse direction in the first direction.

In this way, when the inflection point of the brightness increase is found, it immediately moves in the reverse direction in the first direction instead of continuing to move in the forward direction in the first direction, so the time used in the alignment process can be reduced and the alignment efficiency can be improved.

According to some embodiments of the present application, optionally, in S131 , when the probe reaches a preset end point, it may move in the opposite direction along the first direction. For example, in some examples, the coordinates of the end point may be preset as (xm, ym), and when the probe reaches the end point (xm, ym), the probe is controlled to move in the reverse direction in the first direction. For example, in other examples, the first distance between the start position and the end point can be preset, and when the probe moves the first distance from the start position along the first direction, it is considered that the probe reaches the preset end point, and then the probe is controlled to move along the first direction. The first direction moves in the opposite direction. In this way, the luminance values between a plurality of adjacent positions between the start position and the end point can be compared to ensure the accuracy of the determined alignment pattern center, thereby ensuring the alignment accuracy.

FIG. 15 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 15 , according to some embodiments of the present application, optionally, the method for aligning the display panel provided by the embodiments of the present application may further include the following steps S151 to S153 .

S151. Control the probe to move in reverse in the second direction, and collect a plurality of fourth brightness values at different positions on a second reverse movement path, where the second reverse movement path is a reverse movement path along the second direction.

Similarly, in S151 , for example, when the inflection point of brightness increase is found, it can immediately move in the opposite direction along the second direction. Alternatively, for example, when the probe reaches the preset end point, the probe may move in the opposite direction along the second direction, which is not limited in this embodiment of the present application. Please refer to the above for the specific implementation process, which will not be repeated here.

FIG. 16 is a schematic diagram of another operation of the alignment method of the display panel provided by the embodiment of the present application. As shown in FIG. 16 , taking the second direction as the row direction X of the display panel 10 as an example, when the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, the probe can be controlled 500 moves in the opposite direction in the second direction (ie, the j-th position points to the j-1-th position, and the dashed arrow indicates the direction).

During the reverse movement along the second direction, the probe 500 can collect multiple luminance values at different positions on the second reverse movement path s2'. For the convenience of distinction, the probe 500 is taken along the second reverse movement path s2' here. The collected luminance value is called the fourth luminance value. Exemplarily, for example, each time the probe 500 moves a certain distance on the second reverse movement path s2', the luminance value and the coordinate value of the center of the probe 500 are collected once, so as to obtain the multiplicity of data at different positions on the second reverse movement path s2'. the fourth brightness value.

S152: Determine whether the fourth brightness value corresponding to the qth position on the second reverse movement path is greater than the fourth brightness value corresponding to the q-1th position on the second reverse movement path. Wherein, the q-1th position is the previous position of the qth position, and q is a positive integer greater than 1.

S153. When the fourth luminance value corresponding to the qth position is greater than the fourth luminance value corresponding to the q-1th position, determine whether the q-1th position is the same as the j-1th position.

It should be noted that, in theory, the q-1th position and the j-1th position should be the same, but in practice, there may also be a certain deviation between the q-1th position and the j-1th position.

Correspondingly, in S902, when the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, determine the coordinates of the j-1th position as the second coordinates, which may specifically include the following: Steps S154 and S155.

S154. In the case that the q-1 th position is the same as the j-1 th position, determine the coordinates of the j-1 th position as the second coordinates.

S155. In the case where the q-1 th position is different from the j-1 th position, determine the average value of the coordinates of the q-1 th position and the j-1 th position as the second coordinate.

In this way, when the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the j-1th position, the q-1th position is obtained by controlling the probe to move in the reverse direction along the second direction, Using the q-1th position to perform calibration verification for the j-1th position can improve the accuracy of the determined second coordinate, thereby improving the accuracy of the center coordinate of the final alignment pattern, effectively avoiding misjudgment.

FIG. 17 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 17 , according to some embodiments of the present application, optionally, S101 , controlling the probe to move along the first direction from the starting position may specifically include the following steps:

S171. Determine the magnitude relationship between the first brightness value corresponding to the xth position on the first movement path and the first brightness value corresponding to the x-1th position on the first movement path. Among them, the x-1th position is the previous position of the xth position, and x is a positive integer.

As shown in FIG. 18 , when the probe 500 has not overlapped with the alignment pattern 100 , such as when the probe 500 is in the area a, the luminance values collected by the probe 500 at different positions are almost unchanged. That is, when the first brightness value corresponding to the xth position is equal to the first brightness value corresponding to the x-1th position, it means that the probe has not overlapped with the alignment pattern, that is, the center distance between the probe 500 and the alignment pattern 100 still far. When the probe 500 begins to overlap the alignment pattern 100, the brightness value collected by the probe 500 will decrease. That is, when the first brightness value corresponding to the xth position is smaller than the first brightness value corresponding to the x-1th position, it means that the probe 500 begins to overlap the alignment pattern 100, that is, the probe has approached the center of the alignment pattern.

S172. When the first brightness value corresponding to the xth position is equal to the first brightness value corresponding to the x-1th position, control the probe to move in the first direction at the first step value and/or the first moving speed until The first brightness value corresponding to the xth position is smaller than the first brightness value corresponding to the x-1th position.

S173. When the first brightness value corresponding to the xth position is smaller than the first brightness value corresponding to the x-1th position, control the probe to move in the first direction at the second step value and/or the second moving speed until The first coordinate corresponding to the smallest first brightness value on the first moving path is obtained.

Wherein, the first step value is greater than the second step value, and the first moving speed is greater than the second moving speed.

In this way, on the one hand, when the probe is far from the center of the alignment pattern, controlling the movement of the probe with a larger first step value and/or a first moving speed can improve the alignment speed and shorten the alignment time; On the other hand, when the probe is closer to the center of the alignment pattern, controlling the movement of the probe with a smaller second step value and/or a second moving speed can improve the alignment accuracy and accurately find the position of the alignment pattern. center.

In some specific examples, optionally, the second step value may decrease as time increases, and/or the second movement speed may decrease as time increases. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value of controlling the movement of the probe and/or the slower the moving speed of the probe.

In this way, since the center of the probe is closer to the center of the alignment pattern, the smaller the step value of controlling the movement of the probe and/or the slower the moving speed of the probe, the accuracy of finding the center of the alignment pattern can be further improved. Effectively avoid the center of the probe skipping/passing the center of the alignment pattern due to large step value or too fast moving speed.

It should be noted that, in other examples of the present application, the second step value may also remain unchanged as time increases, and/or the second moving speed may also remain unchanged as time increases.

FIG. 19 is a schematic flowchart of another method for aligning a display panel according to an embodiment of the present application. As shown in FIG. 19 , similar to the embodiment shown in FIG. 17 , according to some embodiments of the present application, optionally, S102 , controlling the probe to move along the second direction according to the first coordinates, which may specifically include the following steps S191 to S193.

S191. Determine the magnitude relationship between the second luminance value corresponding to the y-th position on the second moving path and the second luminance value corresponding to the y-1-th position on the second moving path. Among them, the y-1th position is the previous position of the yth position, and y is a positive integer.

S192. When the second brightness value corresponding to the yth position is equal to the second brightness value corresponding to the y-1th position, control the probe to move in the second direction at a third step value and/or a third moving speed until The second luminance value corresponding to the y-th position is smaller than the second luminance value corresponding to the y-1-th position.

S193. When the second brightness value corresponding to the yth position is smaller than the second brightness value corresponding to the y-1th position, control the probe to move in the second direction at a fourth step value and/or a fourth moving speed until The second coordinate corresponding to the smallest second brightness value on the second moving path is obtained.

Wherein, the third step value is greater than the fourth step value, and the third moving speed is greater than the fourth moving speed.

In this way, on the one hand, when the probe is far from the center of the alignment pattern, controlling the movement of the probe with a larger third step value and/or a third moving speed can improve the alignment speed and shorten the alignment time; On the other hand, when the probe is closer to the center of the alignment pattern, controlling the movement of the probe with a smaller fourth step value and/or a fourth moving speed can improve the alignment accuracy and accurately find the position of the alignment pattern. center.

In some specific examples, optionally, the fourth step value may decrease as time increases, and/or the fourth movement speed may decrease as time increases. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value of controlling the movement of the probe and/or the slower the moving speed of the probe.

In this way, since the center of the probe is closer to the center of the alignment pattern, the smaller the step value of controlling the movement of the probe and/or the slower the moving speed of the probe, the accuracy of finding the center of the alignment pattern can be further improved. Effectively avoid the center of the probe skipping/passing the center of the alignment pattern due to large step value or too fast moving speed.

It should be noted that, in other examples of the present application, the fourth step value may also remain unchanged as time increases, and/or the fourth moving speed may also remain unchanged as time increases.

FIG. 20 is a schematic top view of a display panel provided by an embodiment of the present application. As shown in FIG. 20, according to some embodiments of the present application, optionally, the display panel 10 may include a first display area A1 and a second display area A2, and the light transmittance of the second display area A2 is greater than that of the first display area A1 of light transmittance. That is, the first display area A1 is the above-mentioned main screen area, and the second display area A2 is the above-mentioned secondary screen area. When the size of the probe is larger than the size of the second display area A2, for example, when a probe with a diameter of 10 mm is used, the center o of the second display area A2 can be used as the center O of the alignment pattern 100, based on the second display area A2 and the proximity of the second display area A2 A part of the first display area A1 of the display area A2 displays the alignment pattern 100 . Exemplarily, the alignment pattern 100 may be a circle with the same size as the probe, or may be a part of the circle (eg, a semicircle, a three-quarter circle) with the same size as the probe.

FIG. 21 is another schematic top view of the display panel provided by the embodiment of the present application. As shown in FIG. 21 , according to some embodiments of the present application, optionally, when the size of the probe is smaller than or equal to the size of the second display area A2, for example, when a probe with a diameter of 2 mm is used, the center of the second display area A2 may be o is the center O of the alignment pattern 100, and the alignment pattern 100 is displayed based on the second display area A2. Exemplarily, the alignment pattern 100 may be a circle with the same size as the probe, or may be a part of the circle (eg, a semicircle, a three-quarter circle) with the same size as the probe.

In this way, the embodiments of the present application can be adapted to probes of different sizes and second display areas of different shapes/dimensions, that is, adapted to various application scenarios.

Continuing to refer to FIG. 21 , according to some embodiments of the present application, optionally, the second display area A2 may include a light-transmitting area 210 , and the first display area A1 may include a transition area 220 surrounding the light-transmitting area 210 , and the light-transmitting area 210 and transition region 220 can be provided with sub-pixels. The transition region 220 is provided with a driving device (such as a transistor), and the light-transmitting region 210 is not provided with a driving device. The center of the light-transmitting area 210 may coincide with the center of the second display area A2, and the transition area 220 may be arranged around the light-transmitting area 210. When the probe size is smaller than or equal to the size of the light-transmitting area 210, the center of the light-transmitting area 210 may be used. o is the center O of the alignment pattern 100 , and the alignment pattern 100 is displayed based on the light-transmitting area 210 .

In this way, it can be ensured that the center of the probe is aligned with the center of the light-transmitting area, and the brightness values collected by the probe are all the brightness values of the light-transmitting area. Accuracy of gamma tuning results in the display area.

As shown in FIG. 21 , optionally, the shape of the light-transmitting area 210 may be a rectangle, and the shape of the second display area A2 may also be a rectangle. In other embodiments, the shape of the light-transmitting area 210 may be circular, and the shape of the second display area A2 may also be circular. Certainly, the shapes of the light-transmitting area 210 and the second display area A2 may also be other shapes, which are not limited in this embodiment of the present application.

Based on the alignment method of the display panel provided by the above embodiment, correspondingly, the embodiment of the present application also provides a gamma debugging method of the display panel.

FIG. 22 is a schematic diagram of an operation of a gamma debugging method for a display panel provided by an embodiment of the present application. FIG. 23 is a schematic flowchart of a gamma debugging method for a display panel provided by an embodiment of the present application. 22 and 23, the display panel 10 includes a first display area A1 and a second display area A2. The light transmittance of the second display area A2 may be greater than that of the first display area A1. That is, the first display area A1 is the above-mentioned main screen area, and the second display area A2 is the above-mentioned secondary screen area.

The gamma debugging method for the display panel provided by the embodiment of the present application may include the following steps S221 to S223.

S221. Control the probe to move to the first display area, and perform gamma debugging on the first display area.

The first display area A1 can display a picture of a target gray scale. The target grayscale may be any preset grayscale. In S221, the probe can be controlled to move to the first display area A1, and the actual brightness value of the first display area A1 can be collected. Then, according to the comparison result between the actual luminance value of the first display area A1 and the target luminance value corresponding to the target gray scale, adjust the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel in the first display area A1, and the At least one of the data voltage values corresponding to the blue sub-pixels until the difference between the actual luminance value of the first display area A1 and the target luminance value corresponding to the target grayscale is smaller than the preset first error threshold. Finally, the adjusted data voltage values corresponding to the red sub-pixels, the data voltage values corresponding to the green sub-pixels, and the data voltage values corresponding to the blue sub-pixels in the first display area A1 are obtained, thereby completing the gamma of the first display area A1 debugging.

It should be noted that, in the gamma debugging of the first display area A1, after completing the gamma debugging of one grayscale, the first display area A1 can switch to display another grayscale picture, and repeat the above process to complete the Another grayscale gamma adjustment. Moreover, during gamma debugging, multiple grayscales can be selected as binding points. For other grayscales other than the binding points, the corresponding red subpixels in the first display area A1 corresponding to other grayscales can be obtained based on a linear interpolation algorithm. The data voltage value, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel.

S222. Based on the alignment method of the display panel provided in the above embodiment, move the probe to the alignment position, and the alignment pattern is at least partially located in the second display area.

As shown in FIG. 20, when the size of the probe is larger than that of the second display area A2, the center o of the second display area A2 can be used as the center O of the alignment pattern 100, based on the second display area A2 and the proximity to the second display area A part of the first display area A1 of A2 displays the alignment pattern 100 . As shown in FIG. 21 , when the size of the probe is smaller than or equal to the size of the second display area A2, the center O of the second display area A2 can be used as the center O of the alignment pattern 100, and the alignment pattern can be displayed based on the second display area A2 100. The alignment position is the center O of the alignment pattern 100, which is located in the second display area A2.

In S222, the center of the probe may be moved to the center O of the alignment pattern 100 based on the alignment method of the display panel provided in the above-mentioned embodiment to complete alignment.

S223. Perform gamma debugging on the second display area.

As shown in FIG. 24 , in some embodiments, when the size of the probe is larger than the size of the second display area A2, the second display area A2 is controlled to display a picture of the target grayscale, while the part close to the second display area A2 is first displayed Area A1 is written in black. For example, the part of the first display area A1 close to the second display area A2 still displays the alignment pattern 100 . In this way, it is possible to effectively prevent the probe from collecting the luminance value of the first display area A1, improve the accuracy of the collected luminance value of the second display area A2, and thus ensure the accuracy of the gamma debugging result.

In other embodiments, when the size of the probe is smaller than the size of the second display area A2, the second display area A2 can be controlled to display the target grayscale image, and the part of the first display area A1 close to the second display area A2 does not need to be written in black .

In S223, after the alignment is completed, the actual brightness value of the first display area A2 can be collected. Then, according to the comparison result between the actual luminance value of the second display area A2 and the target luminance value corresponding to the target grayscale, adjust the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel in the second display area A2 and the At least one of the data voltage values corresponding to the blue sub-pixels, until the difference between the actual luminance value of the second display area A2 and the target luminance value corresponding to the target grayscale is smaller than the preset first error threshold. Finally, the data voltage values corresponding to the red sub-pixels, the data voltage values corresponding to the green sub-pixels, and the data voltage values corresponding to the blue sub-pixels in the adjusted second display area A2 are obtained, thereby completing the gamma of the second display area A2 debugging.

It should be noted that, in the gamma debugging of the second display area A2, after completing the gamma debugging of one grayscale, the second display area A2 can switch to display another grayscale picture, and repeat the above process to complete the Another grayscale gamma adjustment. Moreover, during gamma debugging, multiple grayscales can be selected as binding points. For other grayscales other than the binding points, a linear interpolation algorithm can be used to obtain the corresponding red subpixels in the second display area A2 corresponding to other grayscales. The data voltage value, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel.

In the gamma debugging method for a display panel according to an embodiment of the present application, the display panel displays the alignment pattern by taking the center of the second display area as the center of the alignment pattern, and according to the first coordinate corresponding to the smallest first luminance value on the first moving path The second coordinate corresponding to the smallest second brightness value on the second moving path can accurately determine the center coordinate of the alignment pattern, realize the precise alignment between the probe and the second display area, and improve the alignment between the probe and the second display area. bit accuracy, thereby improving the accuracy of gamma debugging in the second display area. In addition, during the alignment process, the automatic alignment of the probe and the alignment pattern can be realized without human intervention.

Based on the gamma debugging method of the display panel provided by the above embodiments, correspondingly, the embodiment of the present application also provides a specific implementation manner of the gamma debugging device of the display panel.

FIG. 25 is a schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application. The apparatus for gamma debugging of a display panel provided in the embodiments of the present application can be used to execute the gamma debugging method for a display panel provided by the above embodiments. As shown in FIG. 25 , the gamma debugging device 2500 of the display panel provided by the embodiment of the present application may include a worktable 251 , a first transmission part 252 , a second transmission part 253 , a clamping part 254 , and a controller (not shown in the figure) out) and probe 500. The workbench 251 is used for carrying the display panel 10 . The first conveying part 252 is located on at least one side of the table 251 and extends along the first direction (eg, the column direction Y). Exemplarily, the first transfer parts 252 are located on opposite sides of the work table 251 along the second direction (eg, the row direction X). The second conveying portion 253 extends along the second direction and is suspended above the work table 251 . The second conveying portion 253 is connected to the first conveying portion 252 , and the second conveying portion 253 can move relative to the first conveying portion 252 along the first direction, such as When the first conveying part 252 works, the second conveying part 253 is driven to move in the first direction, that is, the up and down movement shown in FIG. 25 . The clamping part 254 is connected with the second conveying part 253, and the clamping part 254 can move relative to the second conveying part 253 along the second direction. 25 to move left and right. The probe 500 is fixedly mounted on the clamping part 254 , that is, the clamping part 254 clamps the probe 500 . The controller is electrically connected to the first transmission part 252 , the second transmission part 253 and the probe.

Specifically, the probe 500 can be placed in the clamping part 254 at an angle perpendicular to the plane where the display panel is located, and the clamping part 254 can clamp the probe 500 . Then, the controller can control the first transmission part 252 and the second transmission part 253 so that the clamping part 254 and the probe 500 can move up, down, left and right. During the movement of the probe 500 , the probe 500 can be controlled to collect luminance values at different positions of the display panel 10 , and to collect the coordinate values of the probe 500 . Then, the alignment of the display panel is completed by the alignment method of the display panel provided in the above-mentioned embodiment. Alternatively, the gamma debugging method of the display panel is completed by the gamma debugging method of the display panel provided by the above embodiments.

In the gamma debugging device for a display panel according to the embodiment of the present application, the display panel displays the alignment pattern with the center of the second display area as the center of the alignment pattern, and according to the first coordinate corresponding to the smallest first luminance value on the first moving path The second coordinate corresponding to the smallest second brightness value on the second moving path can accurately determine the center coordinate of the alignment pattern, realize the precise alignment of the probe and the second display area, and improve the alignment of the probe and the second display area. accuracy, thereby improving the accuracy of gamma debugging in the second display area. In addition, during the alignment process, automatic alignment between the probe center and the alignment pattern can be realized without human intervention.

FIG. 26 is another schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application. As shown in FIG. 26 , according to some embodiments of the present application, optionally, a first groove 261 and a second groove 262 are formed on the worktable 251 . The first groove 261 is used to place the display panel 10, and the second groove 262 is located on one side of the first groove 261 along the first direction. The gamma debugging device 2500 of the display panel provided by the embodiment of the present application may further include a light-emitting portion 263, the light-emitting portion 263 is located in the second groove 262, and the light-emitting portion 263 is strip-shaped and extends along the second direction. Exemplarily, the light-emitting part 263 includes, but is not limited to, lamps, such as LED lamps.

For ease of understanding, the following description will be given in conjunction with the gamma debugging device of the display panel shown in FIG. 26 and the gamma debugging method of the display panel provided by the above embodiments.

Step 1: Control the probe to move to the first display area, and perform gamma debugging on the first display area.

Step 2: The display panel displays the alignment pattern with the center of the second display area as the center of the alignment pattern.

Step 3: The light-emitting part emits light, and controls the probe to move along the first direction from the starting position, and collects a plurality of first brightness values at different positions on the first moving path along the first direction, and obtains the smallest value on the first moving path. The first coordinate corresponding to the first brightness value.

Step 4: Control the probe to move along the second direction, and collect a plurality of second brightness values at different positions on the second moving path along the second direction, to obtain the second coordinate corresponding to the smallest second brightness value on the second moving path .

Step 5: Control the probe to move to the alignment position determined based on the first coordinate and the second coordinate, the light emitting part is turned off, the second display area displays the image of the target gray scale, and the gamma debugging is performed on the second display area.

Step 6. After completing the gamma debugging of the second display area, control the probe to return to the starting position.

In this way, by opening the first groove to place the display panel, the positioning of the display panel can be realized and the accuracy of the alignment can be ensured; by opening the second groove on the side of the first groove close to the second display area, The second groove can provide enough space for the movement of the probe to prevent the probe from hitting the edge of the first groove during alignment; by arranging the light-emitting part in the second groove, it can ensure that even if a part of the probe moves Two grooves, the brightness value collected by the probe will also change from small to large, ensuring the smooth progress of the alignment.

According to some embodiments of the present application, optionally, the first groove 261 and the second groove 262 communicate with each other.

In this way, the first groove and the second groove can be integrally formed through the same process, which facilitates the simplification of the production process and reduces the production cost of the gamma debugging device of the display panel.

Continuing to refer to FIG. 26 , according to some embodiments of the present application, optionally, opposite third grooves 264 and fourth grooves 265 may be opened on the worktable 251 . The third groove 264 and the fourth groove 265 may facilitate the debugging personnel to place the display panel 10 in the first groove 261 , or facilitate the debugging personnel to take out the display panel 10 from the first groove 261 .

According to some embodiments of the present application, optionally, the first conveying part 252 includes, but is not limited to, a combination of a motor (eg, a stepping motor) and a conveying mechanism, or a combination of a guide rail and a movable component (eg, a trolley). The second conveying part 253 includes, but is not limited to, a combination of a motor (eg, a stepping motor) and a transmission mechanism, or a combination of a guide rail and a movable part (eg, a trolley).

Based on the alignment method of the display panel or the gamma debugging method of the display panel provided by the above embodiments, the present application also provides a specific implementation manner of the electronic device accordingly. See the examples below.

FIG. 27 shows a schematic diagram of a hardware structure of an electronic device provided by an embodiment of the present application.

The electronic device may include a processor 2701 and a memory 2702 storing computer program instructions.

Specifically, the above-mentioned processor 2701 may include a central processing unit (Central Processing Unit, CPU), or a specific integrated circuit (Application Specific Integrated Circuit, ASIC), or may be configured as one or more integrated circuits implementing the embodiments of the present application .

Memory 2702 may include mass storage for data or instructions. By way of example and not limitation, memory 2702 may include a Hard Disk Drive (HDD), a floppy disk drive, flash memory, optical disk, magneto-optical disk, magnetic tape, or Universal Serial Bus (USB) drive or two or more A combination of more than one of the above. In one example, the memory 2702 may include removable or non-removable (or fixed) media, or the memory 2702 is non-volatile solid state memory. Memory 2702 may be internal or external to the integrated gateway disaster recovery device.

In one example, the memory 2702 may be a read only memory (ROM). In one example, the ROM may be a mask programmed ROM, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), electrically rewritable ROM (EAROM), or flash memory or both A combination of one or more of the above.

Memory 2702 may include read only memory (ROM), random access memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical or other physical/tangible memory storage devices. Thus, typically, a memory includes one or more tangible (non-transitory) computer-readable storage media (eg, memory devices) encoded with software including computer-executable instructions, and when the software is executed (eg, by a or multiple processors), it is operable to perform the operations described with reference to a method according to an aspect of the present application.

The processor 2701 reads and executes the computer program instructions stored in the memory 2702 to realize the methods/steps in the above-mentioned alignment method of the display panel or the gamma debugging method of the display panel, and achieve the above-mentioned alignment method of the display panel or The corresponding technical effects achieved by performing the method/step of the gamma debugging method of the display panel will not be repeated here for the sake of brevity.

In one example, the electronic device may also include a communication interface 2703 and a bus 2710 . Among them, as shown in FIG. 27 , the processor 2701 , the memory 2702 , and the communication interface 2703 are connected through the bus 2710 and complete the mutual communication.

The communication interface 2703 is mainly used to implement communication between modules, apparatuses, units and/or devices in the embodiments of the present application.

The bus 2710 includes hardware, software, or both, coupling the components of the electronic device to each other. By way of example and not limitation, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Extended Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a hyper Transport (Hyper Transport, HT) interconnect, Industry Standard Architecture (IndustryStandard Architecture, ISA) bus, Infiniband interconnect, low pin count (LPC) bus, memory bus, Micro Channel Architecture (MCA) bus, Peripheral Component Interconnect (PCI) bus, PCI-Express (PCI-X) bus, Serial Advanced Technology Attachment (SATA) bus, Video Electronics Standards Association Local (VLB) bus or other suitable bus or a combination of two or more of these . Bus 2710 may include one or more buses, where appropriate. Although embodiments of this application describe and illustrate a particular bus, this application contemplates any suitable bus or interconnect.

In addition, in combination with the alignment method of the display panel or the gamma debugging method of the display panel in the above embodiments, the embodiments of the present application may provide a computer-readable storage medium for implementation. Computer program instructions are stored on the computer-readable storage medium; when the computer program instructions are executed by the processor, any one of the display panel alignment method or the display panel gamma debugging method in the foregoing embodiments is implemented. Examples of computer-readable storage media include non-transitory computer-readable storage media such as electronic circuits, semiconductor memory devices, ROM, random access memory, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disk.

The functional blocks shown in the above-described structural block diagrams may be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application specific integrated circuit (ASIC), suitable firmware, a plug-in, a function card, and the like. When implemented in software, elements of the present application are programs or code segments used to perform the required tasks. The program or code segments may be stored in a machine-readable medium or transmitted over a transmission medium or communication link by a data signal carried in a carrier wave. A "machine-readable medium" may include any medium that can store or transmit information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, Radio Frequency (RF) links, and the like . The code segments may be downloaded via a computer network such as the Internet, an intranet, or the like.

It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, the present application is not limited to the order of the above steps, that is, the steps may be performed in the order mentioned in the embodiment, or may be different from the order in the embodiment, or several steps may be performed simultaneously.

Aspects of the present application are described above with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the present application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine such that execution of the instructions via the processor of the computer or other programmable data processing apparatus enables the Implementation of the functions/acts specified in one or more blocks of the flowchart and/or block diagrams. Such processors may be, but are not limited to, general purpose processors, special purpose processors, application specific processors, or field programmable logic circuits. It will also be understood that each block of the block diagrams and/or flowchart illustrations, and combinations of blocks in the block diagrams and/or flowchart illustrations, can also be implemented by special purpose hardware for performing the specified functions or actions, or by special purpose hardware and/or A combination of computer instructions is implemented.

The above are only specific implementations of the present application. Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the above-described systems, modules and units may refer to the foregoing method embodiments. The corresponding process in , will not be repeated here. It should be understood that the protection scope of the present application is not limited to this. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should all cover within the scope of protection of this application.

Claims (10)

1. A method for aligning a display panel includes: controlling a set area of a display panel to display a counterpoint pattern matched with the size of the probe, wherein the brightness value of the counterpoint pattern is smaller than that of other areas around the set area;

controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path;

controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction;

and determining the alignment position according to the first coordinate and the second coordinate.

2. The alignment method according to claim 1, wherein the acquiring a plurality of first luminance values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first luminance value on the first moving path includes:

judging whether a first brightness value corresponding to an ith position on the first moving path is larger than a first brightness value corresponding to an ith-1 position on the first moving path, wherein the ith-1 position is a previous position of the ith position, and i is a positive integer;

when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the ith-1 position, determining the coordinate of the ith-1 position as the first coordinate;

the acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to a minimum second brightness value on the second moving path specifically includes:

judging whether a second brightness value corresponding to a jth position on the second moving path is larger than a second brightness value corresponding to a jth position on the second moving path, wherein the jth-1 position is a previous position of the jth position, and j is a positive integer;

and when the second brightness value corresponding to the j-th position is larger than the second brightness value corresponding to the j-1-th position, determining the coordinate of the j-1-th position as the second coordinate.

3. The alignment method according to claim 2, wherein before determining the coordinates of the i-1 th position as the first coordinates, the alignment method further comprises:

when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the i-1 st position, judging whether the first brightness values corresponding to the (i + 1) th to the (i + n) th positions on the first moving path are all larger than the first brightness value corresponding to the i-1 st position on the first moving path, wherein the (i + 1) th position is a position next to the ith position, the (i + n) th position is an n-th position next to the ith position, and n is a positive integer;

the determining the coordinate of the i-1 th position as the first coordinate specifically includes:

when the first brightness value corresponding to the (i + 1) th position to the (i + n) th position is larger than the first brightness value corresponding to the (i-1) th position, determining the coordinate of the (i-1) th position as the first coordinate.

4. The alignment method according to claim 2 or 3, further comprising, before controlling the probe to move in the second direction:

controlling the probe to return to the (i-1) th position;

after the obtaining of the second coordinate corresponding to the minimum second brightness value on the second moving path, the method further includes:

and controlling the probe to return to the j-1 th position.

5. The alignment method according to claim 2, further comprising:

controlling the probe to move reversely along the first direction, and acquiring a plurality of third brightness values at different positions on a first reverse moving path, wherein the first reverse moving path is a path moving reversely along the first direction;

judging whether a third brightness value corresponding to a p-th position on the first reverse moving path is larger than a third brightness value corresponding to a p-1-th position on the first reverse moving path, wherein the p-1-th position is a previous position of the p-th position, and p is a positive integer;

when the third brightness value corresponding to the p-th position is larger than the third brightness value corresponding to the p-1-th position, judging whether the p-1-th position is the same as the i-1-th position;

when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the i-1 st position, determining the coordinate of the i-1 st position as the first coordinate specifically includes:

determining the coordinates of the (i-1) th position as the first coordinates in the case that the (p-1) th position is the same as the (i-1) th position;

and under the condition that the p-1 th position is different from the i-1 th position, determining the average value of the coordinates of the p-1 th position and the i-1 th position as the first coordinate.

6. The alignment method according to claim 1, wherein the controlling the probe to move from the start position in the first direction comprises:

judging the magnitude relation between a first brightness value corresponding to the x-th position on the first moving path and a first brightness value corresponding to the x-1-th position on the first moving path, wherein the x-1-th position is the previous position of the x-th position, and x is a positive integer;

when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1 th position, controlling the probe to move along the first direction at a first step value and/or a first moving speed until the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position;

when the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position, controlling the probe to move along the first direction at a second step value and/or a second moving speed until a first coordinate corresponding to the minimum first brightness value on the first moving path is obtained; wherein the first step value is greater than the second step value, and the first moving speed is greater than the second moving speed.

7. The alignment method according to claim 1, wherein the display panel comprises a first display area and a second display area, and the light transmittance of the second display area is greater than that of the first display area;

when the size of the probe is larger than that of the second display area, taking the center of the second display area as the center of the alignment pattern, and displaying the alignment pattern based on the second display area and a part of the first display area close to the second display area;

when the size of the probe is smaller than or equal to the size of the second display area, taking the center of the second display area as the center of the alignment pattern, and displaying the alignment pattern based on the second display area;

preferably, the second display region includes a light-transmitting region, the first display region includes a transition region surrounding the light-transmitting region, the transition region is provided with a driving device, and the light-transmitting region is not provided with the driving device; and when the size of the probe is smaller than or equal to that of the light-transmitting area, the center of the light-transmitting area is used as the center of the alignment pattern, and the alignment pattern is displayed based on the light-transmitting area.

8. A gamma debugging method for a display panel, the display panel comprising a first display area and a second display area, the method comprising:

controlling the probe to move to the first display area, and performing gamma debugging on the first display area;

moving the probe to the alignment position based on the alignment method of the display panel according to any one of claims 1 to 7, wherein the alignment pattern is at least partially located in the second display region;

and carrying out gamma debugging on the second display area.

9. A gamma debugging apparatus of a display panel for performing the gamma debugging method of the display panel according to claim 8, comprising:

the workbench is used for bearing the display panel;

a first conveying part which is positioned on at least one side of the workbench and extends along a first direction;

the second conveying part extends along a second direction and is suspended above the workbench, the second conveying part is connected with the first conveying part, and the second conveying part can move relative to the first conveying part along the first direction;

the clamping part is connected with the second conveying part and can move along a second direction relative to the second conveying part;

the probe is fixedly arranged on the clamping part;

and a controller connected to the first and second transfer units and the probe.

10. The apparatus of claim 9,

a first groove and a second groove are formed in the workbench, the first groove is used for placing the display panel, and the second groove is located on one side of the first groove along the first direction;

the gamma debugging device further comprises a light emitting part, the light emitting part is located in the second groove, and the light emitting part is strip-shaped and extends along the second direction;

preferably, the first groove communicates with the second groove.

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