CN114915890A - Combined testing machine for 16 channels of silicon wheat - Google Patents
Combined testing machine for 16 channels of silicon wheat Download PDFInfo
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- CN114915890A CN114915890A CN202210452835.5A CN202210452835A CN114915890A CN 114915890 A CN114915890 A CN 114915890A CN 202210452835 A CN202210452835 A CN 202210452835A CN 114915890 A CN114915890 A CN 114915890A
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- 238000012360 testing method Methods 0.000 title claims abstract description 103
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 63
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 63
- 239000010703 silicon Substances 0.000 title claims abstract description 63
- 241000209140 Triticum Species 0.000 title abstract description 49
- 235000021307 Triticum Nutrition 0.000 title abstract description 49
- 239000000463 material Substances 0.000 claims abstract description 63
- 230000007246 mechanism Effects 0.000 claims abstract description 32
- 230000000903 blocking effect Effects 0.000 claims abstract description 23
- 238000003780 insertion Methods 0.000 claims description 11
- 230000037431 insertion Effects 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 5
- 230000008569 process Effects 0.000 abstract description 4
- 239000002699 waste material Substances 0.000 abstract description 2
- 238000010998 test method Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 235000017166 Bambusa arundinacea Nutrition 0.000 description 1
- 235000017491 Bambusa tulda Nutrition 0.000 description 1
- 241001330002 Bambuseae Species 0.000 description 1
- 235000015334 Phyllostachys viridis Nutrition 0.000 description 1
- 239000011425 bamboo Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 210000005069 ears Anatomy 0.000 description 1
- 230000006870 function Effects 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R29/00—Monitoring arrangements; Testing arrangements
- H04R29/004—Monitoring arrangements; Testing arrangements for microphones
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R2201/00—Details of transducers, loudspeakers or microphones covered by H04R1/00 but not provided for in any of its subgroups
- H04R2201/003—Mems transducers or their use
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- General Health & Medical Sciences (AREA)
- Otolaryngology (AREA)
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- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
The invention provides a combined testing machine for 16 channels of silicon wheat, which relates to the technical field of silicon wheat testing machines and comprises a testing table; an L-shaped supporting plate is arranged on the rear side of the upper end face of the test board, and a CCD test assembly is arranged on the L-shaped supporting plate; the middle part of the upper end surface of the test board is fixedly provided with a stock stop mechanism, and the upper end surface of the test board is rotatably connected with a rotary driving part; the rotating part is installed on the upper part of the rotary driving part. According to the invention, through the matching of the rectangular channel opening, the material blocking mechanism and the material guide pipe, qualified silicon wheat can be taken out from the rectangular channel opening without manual work after the silicon wheat is tested and if the product quality is qualified, so that the silicon wheat is more time-saving and labor-saving in the whole testing process; the problem of traditional silicon wheat test machine when using, after the silicon wheat test, need the manual work to take off qualified silicon wheat from the testboard in turn to make the silicon wheat waste time and energy in whole test procedure is solved.
Description
Technical Field
The invention relates to the technical field of silicon wheat testing machines, in particular to a combined testing machine for 16 channels of silicon wheat.
Background
The silicon microphone is an MEMS microphone, namely a microphone manufactured based on the MEMS technology, has a wide application range, and can be applied to: hearing aids, electronic ears, mobile phones, digital cameras, hands-free handsets, notebook computers, and the like, silicon microphones are generally required to be tested after being produced in order to ensure the delivery quality of the silicon microphones, and a tester is generally used when testing the quality of the silicon microphones.
However, when the traditional silicon wheat testing machine is used, the silicon wheat with smaller size is clamped below the CCD assembly by manpower and then is tested, and after the silicon wheat is tested, if the product quality is qualified, the qualified silicon wheat is taken down from the testing table by manpower and then is tested, so that the silicon wheat wastes time and labor in the whole testing process, large-batch testing work is not facilitated, and the flexibility of the testing machine during use is reduced.
Disclosure of Invention
In view of the above, the invention provides a combined testing machine for 16 channels of silicon wheat, which is capable of taking qualified silicon wheat out of a rectangular channel without manual work one by one after the silicon wheat is tested by matching of the rectangular channel opening, a material blocking mechanism and a material guide pipe, so that the silicon wheat is more time-saving and labor-saving in the whole testing process, and the rotary driving part and the rotary part can only rotate in one direction by the arrangement of the driving mechanism, thereby improving the reliability of the testing machine in testing the quality of the silicon wheat.
The invention provides a combined testing machine for 16 channels of silicon wheat, which specifically comprises the following components: a test bench; an L-shaped supporting plate is arranged on the rear side of the upper end face of the test board, and a CCD test assembly is arranged on the L-shaped supporting plate; the middle part of the upper end face of the test board is fixedly provided with a material stop mechanism, the upper end face of the test board is rotatably connected with a rotary driving part, the upper part of the rotary driving part is provided with a rotating part, and the front side of the bottom end face of the test board is provided with a driving mechanism; the bottom of the test board is rotatably connected with a one-way rotating mechanism, and the front part of the left side of the upper end face of the test board is provided with a controller.
Optionally, a support plate is mounted on the rear side of the support at the bottom of the test board, a material receiving box is placed on the upper end face of the support plate, four insertion holes are formed in the upper end face of the support plate, and a limiting insertion column is arranged at each of four corners of the bottom end face of the material receiving box; a square through opening is formed in the rear side of the upper end face of the test board, and a material guide pipe is fixedly mounted in the square through opening.
Optionally, when the material receiving box is placed on the upper end face of the supporting plate, the four limiting inserting columns are respectively inserted into the four inserting holes in the supporting plate.
Optionally, the material blocking mechanism comprises an annular material blocking plate, an electric cylinder a, a material blocking plate block and a rectangular notch, the annular material blocking plate is fixedly installed on the upper end face of the test board, the annular material blocking plate is located outside the rotary driving portion, and the upper end face of the annular material blocking plate and the upper end face of the rotary driving portion are located on the same horizontal plane; a rectangular notch is formed in the rear side of the upper end face of the annular material baffle plate, and strip-shaped sliding grooves are formed in the left side face and the right side face inside the rectangular notch; electronic jar A installs at the testboard rear side, and electronic jar A's telescopic link front end fixedly connected with keeps off the material plate to keep off the material plate left and right sides face and all be equipped with a bar slider, and two bar sliders respectively with two inside bar spout sliding connection of rectangle breach, keep off material plate bottom face and passage upper end contact.
Optionally, the driving mechanism comprises an electric cylinder B, a driving rack and an L-shaped sliding support plate, the electric cylinder B is mounted on the front side of the bottom end face of the test bench, and a telescopic rod of the electric cylinder B is fixedly connected with the driving rack; the bottom end face of the driving rack is provided with a T-shaped sliding chute, the bottom end face of the driving rack is connected with an L-shaped sliding support plate in a sliding mode through the T-shaped sliding chute, and the L-shaped sliding support plate is arranged on the bottom end face of the test board; and the electric cylinder B and the electric cylinder A, CCD test assembly are electrically connected with the controller.
Optionally, a support rotating shaft is fixedly connected to the central part of the bottom end face of the rotary driving part, the support rotating shaft is rotatably connected to the test board, the lower end of the support rotating shaft penetrates through the test board, and a worm wheel is fixedly mounted at the lower end of the support rotating shaft; a rectangle bayonet socket has all been seted up to both sides around the rotation driving portion up end, and rotation driving portion up end personally submits the annular array form and has seted up six location jacks.
Optionally, sixteen rectangular channel ports are formed in the edge of the upper end face of the rotating part in an annular array shape, and six positioning insertion columns are arranged in the bottom end face of the rotating part in an annular array shape; a rectangle opening has all been seted up to rotating part bottom face front and back both sides, and every rectangle opening inside all is equipped with a baffle, and the inside equal sliding connection of every rectangle opening has two elastic buckle, and two elastic buckle are located the baffle left and right sides respectively, and every rectangle opening is inside to be located and all is equipped with the spring between two adjacent elastic buckle.
Optionally, when the rotating part is installed on the upper end face of the rotary driving part, the six positioning insertion posts are inserted into the six positioning insertion holes respectively, and the four elastic buckles are clamped with the two rectangular bayonets respectively.
Optionally, the unidirectional rotation mechanism comprises a worm, a driving disc, a rotation cylinder, a gear, a fixed rotation shaft, a hexagonal plate, a ratchet-shaped groove, a first baffle, a second baffle and an elastic pawl, the worm is rotatably connected to the bottom of the test board, the worm is meshed with the worm wheel, and the transmission ratio of the worm wheel to the worm is one to sixteen; the front end of the worm is fixedly connected with a driving disc, the front end surface of the driving disc is provided with a ratchet-shaped groove, the ratchet-shaped groove is internally and fixedly connected with a fixed rotating shaft, the outside of the fixed rotating shaft is rotatably connected with a rotating cylinder, and the rear end of the rotating cylinder is fixedly connected with a hexagonal plate; the front end face of the hexagonal plate is in an annular array shape and is rotationally connected with three elastic pawls, the front end face of the hexagonal plate is provided with three first baffle plates and three second baffle plates in an annular array shape, and a spring is arranged between each elastic pawl and one adjacent first baffle plate; a gear is fixedly arranged at the front end of the outer part of the rotating cylinder and is meshed with the driving rack; when the telescopic rod of the electric cylinder B extends leftwards, the driving rack drives the gear to rotate clockwise for a circle.
Optionally, the detection head of the CCD test assembly is located above a rectangular channel opening at the rear side.
Advantageous effects
1. Compared with the traditional testing machine, the testing machine of each embodiment of the invention has the advantages that through the matching of the rectangular channel opening, the material blocking mechanism and the material guide pipe, after the silicon wheat in a rectangular channel opening at the rear side is tested, if the silicon wheat is qualified, the controller can control the telescopic rod of the electric cylinder A to retract backwards, thereby driving the material blocking plate to move backwards, so that the opening at the upper end of the material guiding pipe loses the shielding effect, then the silicon wheat in a rectangular passage opening at the rear side falls into the interior of the material guide pipe under the action of gravity, then the silicon wheat slides into the material receiving box through the material guide pipe, so that after the silicon wheat is tested, if the product quality is qualified, qualified silicon wheat can be taken out from the rectangular channel without manual work, therefore, the silicon wheat is more time-saving and labor-saving in the whole testing process, and the testing machine is more beneficial to large-batch testing work, so that the flexibility of the testing machine in use is improved.
2. Through actuating mechanism's setting, when electronic jar B's telescopic link is retracted right, will drive the drive rack and move right, then drive gear anticlockwise rotation round through the drive rack, then drive three elasticity pawl anticlockwise rotation round through a rotation section of thick bamboo and hexagonal plate, then through the cooperation of elasticity pawl and ratchet shape recess, make the driving-disc can not rotate this moment, thereby make rotary drive portion and rotating part can only unidirectional rotation, thereby the reliability of this test machine when testing silicon wheat quality has been improved, and simple structure, therefore, the clothes hanger is strong in practicability.
3. Through be provided with elastic buckle on the rotating part, rectangle channel mouth size on the rotating part corresponds the size of silicon wheat, thereby when meetting not unidimensional silicon wheat, can change rather than assorted rotating part according to the size of silicon wheat, when needs pull down the rotating part from the rotary drive portion, only need pinch the pressure to relative direction through two adjacent elastic buckle manually, thereby make elastic buckle and rectangle bayonet socket lose the joint, thereby make the rotating part lose the fixed action on the rotary drive portion, then easily take off the rotating part from the rotary drive portion, the rotating part that will treat to change at last again install on the rotary drive portion can, whole change in-process, because need not to realize easily through the instrument, thereby the convenience of this test machine when using has been improved greatly.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings of the embodiments will be briefly described below.
The drawings in the following description relate to only some embodiments of the invention and are not intended to limit the invention.
In the drawings:
FIG. 1 shows a schematic diagram of a first perspective of a testing machine according to an embodiment of the invention;
FIG. 2 shows a schematic diagram of a second perspective of a testing machine according to an embodiment of the invention;
FIG. 3 shows a schematic diagram of a tester in a split state, according to an embodiment of the invention;
FIG. 4 is a schematic diagram showing a supporting plate and a material receiving box after being disassembled according to the embodiment of the invention;
fig. 5 shows a schematic view of an annular striker plate and a striker plate block after detachment according to an embodiment of the invention;
FIG. 6 shows a schematic view from the bottom of a rotating part according to an embodiment of the invention;
FIG. 7 shows a schematic diagram at a partial enlargement of FIG. 6 according to an embodiment of the invention;
FIG. 8 shows a schematic view from the top of a rotating part according to an embodiment of the invention;
FIG. 9 shows a schematic view of a drive mechanism, a rotary drive and a unidirectional rotation mechanism according to an embodiment of the invention;
FIG. 10 shows a schematic view of the drive rack and L-shaped slide plate shown disassembled in accordance with an embodiment of the present invention;
fig. 11 shows a schematic view of a rotary cylinder, a gear and a fixed rotary shaft according to an embodiment of the present invention after being disassembled.
List of reference numerals
1. A test bench; 101. a support plate; 102. a material receiving box; 103. a material guide pipe; 104. limiting the inserted column; 2. an L-shaped support plate; 3. a CCD test assembly; 4. a stock stop mechanism; 401. an annular striker plate; 402. an electric cylinder A; 403. a material blocking plate block; 404. a rectangular notch; 5. a rotating part; 501. a rectangular channel opening; 502. positioning the inserted column; 503. a rectangular through opening; 504. an elastic buckle; 505. a partition plate; 6. a drive mechanism; 601. an electric cylinder B; 602. a drive rack; 603. an L-shaped sliding support plate; 7. a rotation driving section; 701. a support shaft; 702. a worm gear; 703. a rectangular bayonet; 704. positioning the jack; 8. a unidirectional rotation mechanism; 801. a worm; 802. a drive disc; 803. a rotating cylinder; 804. a gear; 805. fixing the rotating shaft; 806. a hexagonal plate; 807. a ratchet-shaped groove; 808. a first baffle; 809. a second baffle; 8010. an elastic pawl; 10. and a controller.
Detailed Description
In order to make the objects, aspects and advantages of the embodiments of the present invention more apparent, the embodiments of the present invention will be described in detail with reference to the accompanying drawings. Unless otherwise indicated, terms used herein have the ordinary meaning in the art. Like reference symbols in the various drawings indicate like elements.
Example (b): please refer to fig. 1 to fig. 11:
the invention provides a combined testing machine for 16 channels of silicon wheat, which comprises: a test bench 1; an L-shaped support plate 2 is arranged on the rear side of the upper end face of the test board 1, and a CCD test component 3 is arranged on the L-shaped support plate 2; the middle part of the upper end face of the test board 1 is fixedly provided with a stock stop 4, the upper end face of the test board 1 is rotatably connected with a rotary driving part 7, the upper part of the rotary driving part 7 is provided with a rotating part 5, and the front side of the bottom end face of the test board 1 is provided with a driving mechanism 6; the bottom of the test board 1 is rotatably connected with a one-way rotating mechanism 8, and the front part of the left side of the upper end surface of the test board 1 is provided with a controller 10; a supporting plate 101 is installed on the rear side of a support at the bottom of the test table 1, a material receiving box 102 is placed on the upper end face of the supporting plate 101, four jacks are formed in the upper end face of the supporting plate 101, and a limiting inserting column 104 is arranged at each of four corners of the bottom end face of the material receiving box 102; a square through hole is formed in the rear side of the upper end face of the test board 1, and a material guide pipe 103 is fixedly installed in the square through hole; when the material receiving box 102 is placed on the upper end surface of the supporting plate 101, the four limiting inserting columns 104 are respectively inserted into the four inserting holes in the supporting plate 101, so that the material receiving box 102 can be limited in the horizontal direction when used on the upper end surface of the supporting plate 101.
In addition, according to the embodiment of the invention, as shown in fig. 3 and 5, the striker mechanism 4 includes an annular striker plate 401, an electric cylinder a402, a striker plate block 403 and a rectangular notch 404, the annular striker plate 401 is fixedly installed on the upper end surface of the test table 1, the annular striker plate 401 is located outside the rotary driving portion 7, and the upper end surface of the annular striker plate 401 and the upper end surface of the rotary driving portion 7 are located on the same horizontal plane; a rectangular notch 404 is formed in the rear side of the upper end face of the annular striker plate 401, and strip-shaped sliding grooves are formed in the left side face and the right side face inside the rectangular notch 404; the electric cylinder A402 is installed on the rear side of the test board 1, the front end of the telescopic rod of the electric cylinder A402 is fixedly connected with the material blocking plate 403, the left side surface and the right side surface of the material blocking plate 403 are respectively provided with a strip-shaped sliding block, the two strip-shaped sliding blocks are respectively in sliding connection with the two strip-shaped sliding grooves in the rectangular notch 404, the bottom end face of the material blocking plate 403 is in contact with the upper end of the material guide pipe 103, and the material blocking plate 403 can be driven to move backwards after the quality of silicon wheat is qualified through the arrangement of the material blocking mechanism 4, so that a through hole at the upper end of the material guide pipe 103 is not shielded, the silicon wheat with qualified quality can automatically fall into the material receiving box 102, and the qualified silicon wheat can be taken out of the rectangular channel opening 501 in turn without manual work;
as shown in fig. 1 and 9, the driving mechanism 6 includes an electric cylinder B601, a driving rack 602 and an L-shaped sliding support 603, the electric cylinder B601 is installed on the front side of the bottom end face of the test bench 1, and the telescopic rod of the electric cylinder B601 is fixedly connected with the driving rack 602; a T-shaped sliding groove is formed in the bottom end face of the driving rack 602, an L-shaped sliding support plate 603 is connected to the bottom end face of the driving rack 602 in a sliding mode through the T-shaped sliding groove, and the L-shaped sliding support plate 603 is installed on the bottom end face of the test board 1; the electric cylinder B601, the electric cylinder A402 and the CCD testing component 3 are electrically connected with the controller 10 and are used for driving the unidirectional rotating mechanism 8, the rotary driving part 7 and the rotary part 5 to rotate through the arrangement of the driving mechanism 6;
as shown in fig. 1 and 5, a support shaft 701 is fixedly connected to a central portion of a bottom end surface of the rotary driving portion 7, the support shaft 701 is rotatably connected to the test board 1, a lower end of the support shaft 701 penetrates through the test board 1, and a worm wheel 702 is fixedly mounted at a lower end of the support shaft 701; the front side and the rear side of the upper end surface of the rotary driving part 7 are both provided with a rectangular bayonet 703, the upper end surface of the rotary driving part 7 is provided with six positioning jacks 704 in an annular array shape, and the rotary driving part 7 is used for driving the rotary part 5 to rotate;
as shown in fig. 6 to 8, sixteen rectangular channel openings 501 are formed at the edge of the upper end surface of the rotating portion 5 in an annular array, and six positioning insertion posts 502 are formed at the bottom end surface of the rotating portion 5 in an annular array; a rectangular through hole 503 is formed in each of the front side and the rear side of the bottom end face of the rotating portion 5, a partition plate 505 is arranged on the inner side of each rectangular through hole 503, two elastic buckles 504 are connected to the inner side of each rectangular through hole 503 in a sliding mode, the two elastic buckles 504 are located on the left side and the right side of the partition plate 505 respectively, and a spring is arranged between every two adjacent elastic buckles 504 inside each rectangular through hole 503; when the rotating part 5 is installed on the upper end face of the rotation driving part 7, the six positioning insertion posts 502 are respectively inserted into the six positioning insertion holes 704, and the four elastic buckles 504 are respectively clamped with the two rectangular bayonets 703; the detection head of the CCD test assembly 3 is positioned above a rectangular channel opening 501 on the rear side and is used for driving the silicon wheat to rotate on the upper end face of the annular striker plate 401 through the arrangement of the rotating part 5, so that the test efficiency of the silicon wheat is improved;
as shown in fig. 9, the unidirectional rotation mechanism 8 comprises a worm 801, a driving disc 802, a rotation cylinder 803, a gear 804, a fixed rotation shaft 805, a hexagonal plate 806, a ratchet-shaped groove 807, a first baffle 808, a second baffle 809 and an elastic pawl 8010, the worm 801 is rotatably connected to the bottom of the test bench 1, the worm 801 is meshed with the worm wheel 702, and the transmission ratio of the worm wheel 702 to the worm 801 is one to sixteen; a driving disc 802 is fixedly connected to the front end of the worm 801, a ratchet-shaped groove 807 is formed in the front end face of the driving disc 802, a fixed rotating shaft 805 is fixedly connected to the inside of the ratchet-shaped groove 807, a rotating cylinder 803 is rotatably connected to the outside of the fixed rotating shaft 805, and a hexagonal plate 806 is fixedly connected to the rear end of the rotating cylinder 803; the front end face of the hexagonal plate 806 is connected with three elastic pawls 8010 in an annular array manner, the front end face of the hexagonal plate 806 is provided with three first baffle plates 808 and three second baffle plates 809 in an annular array manner, and a spring is arranged between each elastic pawl 8010 and one adjacent first baffle plate 808; a gear 804 is fixedly arranged at the front end of the outer part of the rotating cylinder 803, and the gear 804 is meshed with the driving rack 602; when the telescopic rod of the electric cylinder B601 extends to the left, the driving rack 602 drives the gear 804 to rotate clockwise for one turn, and through the arrangement of the unidirectional rotating mechanism 8, only unidirectional rotation can be performed when the driving rotary driving part 7 rotates.
The specific use mode and function of the embodiment are as follows: in the invention, when testing silicon wheat, firstly, sixteen silicon wheat are placed in sixteen rectangular channel openings 501, then under the action of gravity, one side surface of the silicon wheat is contacted with the upper end surface of an annular baffle plate 401, then a CCD testing component 3 is started through a controller 10, then the silicon wheat in one rectangular channel opening 501 at the rear side is tested through the CCD testing component 3, after the silicon wheat in one rectangular channel opening 501 at the rear side is tested, if the quality of the silicon wheat is qualified, the controller 10 controls a telescopic rod of an electric cylinder A402 to retract backwards, so that a baffle plate block 403 is driven to move backwards, the upper end of a material guide pipe 103 loses the shielding effect, and then the silicon wheat in one rectangular channel opening 501 at the rear side falls into the material guide pipe 103 under the action of gravity and then slides into a material receiving box 102 through the material guide pipe 103;
the telescopic rod of the electric cylinder A402 is retracted backwards and stops for one second, then the controller 10 controls the telescopic rod of the electric cylinder A402 to extend forwards, so as to drive the material blocking plate block 403 to move forwards, so that the opening at the upper end of the material guiding pipe 103 is blocked again, then the controller 10 controls the telescopic rod of the electric cylinder B601 to extend and retract, when the telescopic rod of the electric cylinder B601 extends leftwards, the driving rack 602 is driven to move leftwards, the driving rack 602 drives the gear 804 to rotate clockwise for one circle, the rotating cylinder 803 and the hexagonal plate 806 drive the three elastic pawls 8010 to rotate clockwise for one circle, then the driving disk 802 drives the worm 801 to rotate clockwise for one circle through the matching of the elastic pawls 8010 and the ratchet-shaped groove 807, so that the worm wheel 702 drives the supporting rotating shaft 701 and the rotary driving part 7 to rotate clockwise for two and five degrees, namely sixteen minutes for one circle, therefore, the next silicon wheat to be tested is driven to the lower part of the CCD testing component 3 by the rotation of the rectangular through hole 503 on the rotating part 5, and then the test is carried out through the CCD testing component 3, and the operation is circulated, so that the testing efficiency of the testing machine is greatly improved;
when the telescopic rod of the electric cylinder B601 retracts rightwards, the driving rack 602 is driven to move rightwards, then the driving rack 602 drives the gear 804 to rotate anticlockwise for one circle, then the rotating cylinder 803 and the hexagonal plate 806 drive the three elastic pawls 8010 to rotate anticlockwise for one circle, and then the driving disc 802 cannot rotate at the moment through the matching of the elastic pawls 8010 and the ratchet-shaped groove 807.
Finally, it should be noted that, when describing the positions of the components and the matching relationship therebetween, the present invention is usually illustrated by one/a pair of components, however, it should be understood by those skilled in the art that such positions, matching relationship, etc. are also applicable to other/other pairs of components.
The above description is intended to be illustrative of the present invention and not to limit the scope of the invention, which is defined by the claims appended hereto.
Claims (10)
1. A combinational tester for a silicon microphone 16 channel, comprising: a test bench (1); an L-shaped support plate (2) is arranged on the rear side of the upper end face of the test board (1), and a CCD test component (3) is arranged on the L-shaped support plate (2); the middle part of the upper end face of the test board (1) is fixedly provided with a stock stop mechanism (4), the upper end face of the test board (1) is rotatably connected with a rotary driving part (7), the upper part of the rotary driving part (7) is provided with a rotating part (5), and the front side of the bottom end face of the test board (1) is provided with a driving mechanism (6); the bottom of the test board (1) is rotatably connected with a one-way rotating mechanism (8), and the front part of the left side of the upper end face of the test board (1) is provided with a controller (10).
2. The combination tester for silicon microphone 16 channels as claimed in claim 1 wherein: a supporting plate (101) is installed on the rear side of a support at the bottom of the test bench (1), a material collecting box (102) is placed on the upper end face of the supporting plate (101), four jacks are formed in the upper end face of the supporting plate (101), and four corners of the bottom end face of the material collecting box (102) are respectively provided with a limiting insert column (104); a square through opening is formed in the rear side of the upper end face of the test board (1), and a material guide pipe (103) is fixedly mounted in the square through opening.
3. The combination tester for silicon microphone 16 channels as claimed in claim 2 wherein: when the material receiving box (102) is placed on the upper end face of the supporting plate (101), the four limiting inserting columns (104) are respectively inserted into the four inserting holes in the supporting plate (101).
4. The combination tester for silicon microphone 16 channels as claimed in claim 2 wherein: the material blocking mechanism (4) comprises an annular material blocking plate (401), an electric cylinder A (402), a material blocking plate block (403) and a rectangular notch (404), the annular material blocking plate (401) is fixedly installed on the upper end face of the test board (1), the annular material blocking plate (401) is located outside the rotary driving part (7), and the upper end face of the annular material blocking plate (401) and the upper end face of the rotary driving part (7) are located on the same horizontal plane; a rectangular notch (404) is formed in the rear side of the upper end face of the annular material baffle (401), and strip-shaped sliding grooves are formed in the left side face and the right side face inside the rectangular notch (404); electronic jar A (402) are installed in testboard (1) rear side, and the telescopic link front end fixedly connected with of electronic jar A (402) keeps off material plate piece (403) to keep off material plate piece (403) left and right sides face and all be equipped with a bar slider, and two bar sliders respectively with two inside bar spout sliding connection of rectangle breach (404), keep off material plate piece (403) bottom end face and passage (103) upper end contact.
5. The combination tester for silicon microphone 16 channels as claimed in claim 4 wherein: the driving mechanism (6) comprises an electric cylinder B (601), a driving rack (602) and an L-shaped sliding support plate (603), the electric cylinder B (601) is installed on the front side of the bottom end face of the test bench (1), and a telescopic rod of the electric cylinder B (601) is fixedly connected with the driving rack (602); the bottom end face of the driving rack (602) is provided with a T-shaped sliding chute, the bottom end face of the driving rack (602) is connected with an L-shaped sliding support plate (603) in a sliding mode through the T-shaped sliding chute, and the L-shaped sliding support plate (603) is installed on the bottom end face of the test board (1); the electric cylinder B (601), the electric cylinder A (402) and the CCD testing assembly (3) are electrically connected with the controller (10).
6. The combination tester for a silicon microphone 16 channel as claimed in claim 5, wherein: the center part of the bottom end face of the rotary driving part (7) is fixedly connected with a supporting rotating shaft (701), the supporting rotating shaft (701) is rotatably connected to the test board (1), the lower end of the supporting rotating shaft (701) penetrates through the test board (1), and a worm wheel (702) is fixedly mounted at the lower end of the supporting rotating shaft (701); a rectangular bayonet (703) is respectively arranged at the front side and the rear side of the upper end face of the rotary driving part (7), and six positioning insertion holes (704) are arranged in an annular array shape on the upper end face of the rotary driving part (7).
7. The combination tester for silicon microphone 16 channels as claimed in claim 6 wherein: sixteen rectangular channel openings (501) are formed in the edge of the upper end face of the rotating portion (5) in an annular array shape, and six positioning inserting columns (502) are arranged in the bottom end face of the rotating portion (5) in an annular array shape; one rectangle opening (503) has all been seted up to both sides around rotating part (5) bottom end face, and every rectangle opening (503) inside all is equipped with one baffle (505), and every rectangle opening (503) inside equal sliding connection has two elasticity buckles (504), and two elasticity buckles (504) are located baffle (505) left and right sides respectively, and every rectangle opening (503) inside is located and all is equipped with the spring between two adjacent elasticity buckles (504).
8. The combination tester for silicon microphone 16 channels as claimed in claim 7 wherein: when the rotating part (5) is installed on the upper end face of the rotating driving part (7), six positioning insertion columns (502) are respectively inserted into six positioning insertion holes (704), and four elastic buckles (504) are respectively clamped with two rectangular bayonets (703).
9. The combination tester for silicon microphone 16 channels as claimed in claim 6 wherein: the unidirectional rotation mechanism (8) comprises a worm (801), a driving disc (802), a rotation cylinder (803), a gear (804), a fixed rotation shaft (805), a hexagonal plate (806), a ratchet-shaped groove (807), a first baffle plate (808), a second baffle plate (809) and an elastic pawl (8010), the worm (801) is rotatably connected to the bottom of the test bench (1), the worm (801) is meshed with a worm wheel (702), and the transmission ratio of the worm wheel (702) to the worm (801) is one to sixteen; a driving disc (802) is fixedly connected to the front end of the worm (801), a ratchet-shaped groove (807) is formed in the front end face of the driving disc (802), a fixed rotating shaft (805) is fixedly connected to the inside of the ratchet-shaped groove (807), a rotating cylinder (803) is rotatably connected to the outside of the fixed rotating shaft (805), and a hexagonal plate (806) is fixedly connected to the rear end of the rotating cylinder (803); the front end face of the hexagonal plate (806) is connected with three elastic pawls (8010) in an annular array manner in a rotating manner, the front end face of the hexagonal plate (806) is provided with three first baffle plates (808) and three second baffle plates (809) in an annular array manner, and a spring is arranged between each elastic pawl (8010) and one adjacent first baffle plate (808); a gear (804) is fixedly mounted at the front end of the outer part of the rotating cylinder (803), and the gear (804) is meshed with the driving rack (602); when the telescopic rod of the electric cylinder B (601) extends leftwards, the driving rack (602) drives the gear (804) to rotate clockwise for one circle.
10. The combination tester for silicon microphone 16 channels as claimed in claim 7 wherein: the detection head of the CCD test assembly (3) is positioned above a rectangular channel opening (501) on the rear side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210452835.5A CN114915890A (en) | 2022-04-27 | 2022-04-27 | Combined testing machine for 16 channels of silicon wheat |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210452835.5A CN114915890A (en) | 2022-04-27 | 2022-04-27 | Combined testing machine for 16 channels of silicon wheat |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114915890A true CN114915890A (en) | 2022-08-16 |
Family
ID=82764082
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210452835.5A Withdrawn CN114915890A (en) | 2022-04-27 | 2022-04-27 | Combined testing machine for 16 channels of silicon wheat |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114915890A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115444019A (en) * | 2022-09-24 | 2022-12-09 | 重庆巴山物语食品加工有限公司 | Sausage filling equipment |
| CN116351951A (en) * | 2023-04-19 | 2023-06-30 | 江苏科力普汽车部件有限公司 | Automobile radiator manufacturing equipment |
| CN118632182A (en) * | 2024-08-14 | 2024-09-10 | 广东鼎创智造科技有限公司 | A speaker testing device |
-
2022
- 2022-04-27 CN CN202210452835.5A patent/CN114915890A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115444019A (en) * | 2022-09-24 | 2022-12-09 | 重庆巴山物语食品加工有限公司 | Sausage filling equipment |
| CN116351951A (en) * | 2023-04-19 | 2023-06-30 | 江苏科力普汽车部件有限公司 | Automobile radiator manufacturing equipment |
| CN118632182A (en) * | 2024-08-14 | 2024-09-10 | 广东鼎创智造科技有限公司 | A speaker testing device |
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Application publication date: 20220816 |
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