[go: up one dir, main page]

CN114812874B - Micro-nano force source device, control method, micro-nano force measuring device and storage medium - Google Patents

Micro-nano force source device, control method, micro-nano force measuring device and storage medium Download PDF

Info

Publication number
CN114812874B
CN114812874B CN202210511711.XA CN202210511711A CN114812874B CN 114812874 B CN114812874 B CN 114812874B CN 202210511711 A CN202210511711 A CN 202210511711A CN 114812874 B CN114812874 B CN 114812874B
Authority
CN
China
Prior art keywords
micro
voltage
nano
electrode
force source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202210511711.XA
Other languages
Chinese (zh)
Other versions
CN114812874A (en
Inventor
王淑香
郑培亮
徐立
徐虎
王婷玉
童军杰
伍徳常
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Maritime University
Original Assignee
Guangzhou Maritime University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangzhou Maritime University filed Critical Guangzhou Maritime University
Priority to CN202210511711.XA priority Critical patent/CN114812874B/en
Publication of CN114812874A publication Critical patent/CN114812874A/en
Application granted granted Critical
Publication of CN114812874B publication Critical patent/CN114812874B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/005Measuring force or stress, in general by electrical means and not provided for in G01L1/06 - G01L1/22
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L11/00Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

本发明公开了一种微纳力源装置、控制方法、微纳力测量设备及存储介质,所述微纳力源装置包括内电极和外电极,所述外电极套设在所述内电极的外部且所述外电极和所述内电极有部分或全部长度相交,所述内电极的外轮廓函数为固定值,且所述外电极的内轮廓函数和所述内电极的外轮廓函数的差的倒数为一次函数。本发明的微纳力源装置能够使微纳力源的输出力值与内外电极的相交长度成线性关系,输出力值调节方便,避免了电压调节方式所造成的不确定度放大,有效保证输出微纳力具有高准确度,且省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。

Figure 202210511711

The invention discloses a micro-nano force source device, a control method, a micro-nano force measuring device, and a storage medium. The micro-nano force source device includes an inner electrode and an outer electrode, and the outer electrode is sleeved on the inner electrode. outside and the outer electrode and the inner electrode have a partial or full length intersection, the outer contour function of the inner electrode is a fixed value, and the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode The reciprocal of is a linear function. The micro-nano force source device of the present invention can make the output force value of the micro-nano force source have a linear relationship with the intersecting length of the inner and outer electrodes. The micro-nano force has high accuracy, and eliminates the need for precise adjustment and control of the loading voltage, and does not need to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly saves the cost of the device and reduces the size of the device.

Figure 202210511711

Description

微纳力源装置、控制方法、微纳力测量设备及存储介质Micro-nano force source device, control method, micro-nano force measuring device and storage medium

技术领域technical field

本发明涉及微纳力测量技术领域,尤其涉及微纳力源装置、控制方法、微纳力测量设备及存储介质。The invention relates to the technical field of micro-nano force measurement, in particular to a micro-nano force source device, a control method, a micro-nano force measurement device and a storage medium.

背景技术Background technique

随着高端装备中传感器件的不断微型化、集成化发展,在高端装备制造中微机电系统(Micro-Electro-Mechanical System,MEMS)器件与微纳加工技术的应用日益广泛,在MEMS技术与微纳加工中,微纳力的测量变得越来越普遍,微纳力测量的准确性和可靠性将直接影响微纳米加工技术的水平与大量MEMS器件的性能,同时微纳加工技术和设备如光刻技术和设备等本身也已成为高端装备制造中的重要方向,因此微纳力的准确测量对提升高端装备的性能、技术含量以及技术创新等都具有重要意义。如在高端装备中大量使用的MEMS传感器其制造过程中所采用的X光深刻精密电铸模造成形(LithographieGaVanoformung Abformung,LIGA)技术,涉及到大量的微纳部件的制造与装配,其中大量涉及到微纳牛量级力反馈控制过程,微纳力测量结果的准确可靠是实现微纳加工技术以及MEMS部件自动化的前提与保障。With the continuous miniaturization and integrated development of sensor devices in high-end equipment, the application of Micro-Electro-Mechanical System (MEMS) devices and micro-nano processing technology in high-end equipment manufacturing is becoming more and more extensive. In nanofabrication, the measurement of micro-nano force is becoming more and more common. The accuracy and reliability of micro-nano force measurement will directly affect the level of micro-nano-fabrication technology and the performance of a large number of MEMS devices. At the same time, micro-nano-fabrication technology and equipment such as Lithography technology and equipment itself have become an important direction in the manufacture of high-end equipment, so the accurate measurement of micro-nano force is of great significance to improve the performance, technical content and technological innovation of high-end equipment. For example, the X-ray deep precision electroforming molding (Lithographie GaVanoformung Abformung, LIGA) technology used in the manufacturing process of MEMS sensors widely used in high-end equipment involves the manufacture and assembly of a large number of micro-nano components, a large number of which involve micro-nanoformung. The nano-scale force feedback control process and the accuracy and reliability of micro-nano force measurement results are the premise and guarantee for the realization of micro-nano processing technology and automation of MEMS components.

在微纳力测量装置中,核心部件为产生微纳牛顿量级力值的力源装置,根据不同测量装置所采用的力源形式的不同可以分为电容式测量装置、电感式测量装置、电阻式测量装置等。目前对于微纳牛顿量级的力的测量和量值溯源装置主要采用的均为电容式测量装置,如美国NIST、英国NPL、德国PTB、中国计量科学研究院(NIM)等研究机构在微纳力测量装置中均是采用电容式力源实现对微纳力的测量。其基本原理是利用微纳力测量装置中电容式力源生成的静电力与待测微纳力之间的平衡来实现力的测量。通过控制电容式力源两极板之间的加载电压,从而改变微纳力测量装置中力源输出的微纳牛顿量级的静电力使其与待测微纳力达到平衡,根据力的平衡原理,待测微纳力与测量装置中力源输出的微纳力大小相等、方向相反、且作用于同一条直线上,此时根据微纳力测量装置中力源输出的平衡静电力的大小即可得到待测力值。电容式微纳力测量装置中力源所产生的微纳静电力计算公式为:

Figure BDA0003636287570000021
由该公式可知,可通过改变微纳力测量装置中力源的电容梯度或者改变加载电压来改变力源输出的微纳牛量级静电力大小。In the micro-nano force measuring device, the core component is the force source device that generates the force value of the micro-nano Newton level. According to the different force source forms used by different measuring devices, it can be divided into capacitive measuring devices, inductive measuring devices, and resistance measuring devices. measuring devices, etc. At present, capacitive measurement devices are mainly used for the measurement and value traceability devices of micro-nano Newton level force, such as NIST in the United States, NPL in the United Kingdom, PTB in Germany, and NIM in China. Capacitive force sources are used in force measuring devices to measure micro-nano forces. The basic principle is to use the balance between the electrostatic force generated by the capacitive force source in the micro-nano force measuring device and the micro-nano force to be measured to realize the force measurement. By controlling the loading voltage between the two plates of the capacitive force source, the electrostatic force of the micro-nano Newton level output by the force source in the micro-nano force measuring device can be changed to achieve balance with the micro-nano force to be measured. According to the force balance principle , the micro-nano force to be measured and the micro-nano force output by the force source in the measuring device are equal in magnitude, opposite in direction, and act on the same straight line. At this time, the magnitude of the balanced electrostatic force output by the force source in the micro-nano force measuring device is The force value to be measured can be obtained. The calculation formula of the micro-nano electrostatic force generated by the force source in the capacitive micro-nano force measuring device is:
Figure BDA0003636287570000021
It can be seen from the formula that the magnitude of the electrostatic force output by the force source can be changed by changing the capacitance gradient of the force source in the micro-nano force measuring device or by changing the loading voltage.

现有的微纳力源装置中,力源输出微纳力值与加载电压的平方成正比,因此微纳力源的输出力值对加载电压的变化十分敏感,由于力源装置的输出微纳力值与加载电压的平方成正比,因此若要精确的改变力源的输出微纳力值,则需要实现对加载电压的精确调节与控制(保持加载电压稳定性的同时,还需要保持加载电压调节时的准确性),整个微纳力测量装置需要配备高准确度的直流稳压电源调节控制装置,极大地增加了微纳力测量装置成本与体积,限制了装置的适用性,非常不利于微纳力测量装置的集成化、小型化。In the existing micro-nano force source device, the output micro-nano force value of the force source is proportional to the square of the applied voltage, so the output force value of the micro-nano force source is very sensitive to the change of the applied voltage. The force value is proportional to the square of the loading voltage, so if you want to accurately change the output micro-nano force value of the force source, you need to achieve precise adjustment and control of the loading voltage (while maintaining the stability of the loading voltage, it is also necessary to maintain the loading voltage Accuracy during adjustment), the entire micro-nano-force measuring device needs to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly increases the cost and volume of the micro-nano-force measuring device, limits the applicability of the device, and is very unfavorable Integration and miniaturization of micro-nano force measuring devices.

发明内容Contents of the invention

有鉴于此,本发明实施例提供了微纳力源装置、控制方法、微纳力测量设备及存储介质,能够简化装置结构、降低装置成本,解决装置小型化、集成化的问题,且有效保证输出微纳力具有高准确度。In view of this, the embodiment of the present invention provides a micro-nano force source device, a control method, a micro-nano force measuring device, and a storage medium, which can simplify the structure of the device, reduce the cost of the device, solve the problem of miniaturization and integration of the device, and effectively ensure The output micro-nano force has high accuracy.

本发明提出的技术方案如下:The technical scheme that the present invention proposes is as follows:

本发明实施例第一方面提供一种微纳力源装置,包括内电极和外电极,所述外电极套设在所述内电极的外部且所述外电极和所述内电极有部分或全部长度相交,所述内电极的外轮廓函数为固定值,且所述外电极的内轮廓函数和所述内电极的外轮廓函数的差的倒数为一次函数。The first aspect of the embodiment of the present invention provides a micro-nano force source device, including an internal electrode and an external electrode, the external electrode is sleeved outside the internal electrode, and the external electrode and the internal electrode have part or all The lengths intersect, the outer contour function of the inner electrode is a fixed value, and the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode is a linear function.

本发明的微纳力源装置中,所述内电极的外轮廓函数为固定值,即内电极的外轮廓为直线,外电极的内轮廓函数和所述内电极的外轮廓函数的差的倒数为一次函数,设内电极外轮廓满足函数f(z+L-zl),外电极内轮廓满足函数g(z),则内外电极间的电容为:

Figure BDA0003636287570000031
已知的,内外电极所组成的力源产生的力值公式为:
Figure BDA0003636287570000032
结合上述公式(2)和公式(3)可得内外电极之间的微纳力为:
Figure BDA0003636287570000033
其中h(z)=g(z)-f(z),因此,当内电极的外轮廓为直线,且外电极的内轮廓函数和所述内电极的外轮廓函数的差的倒数为一次函数,即h(zl)的倒数为一次函数时,微纳力源输出为相交长度zl的一次函数,因此,在内外电极间的加载电压大小固定时,微纳力的大小即微纳力源的输出力值与内外电极的相交长度成线性关系。由此,只需对其内外电极的相交长度进行控制,就能够改变微纳力的输出,由于微纳力源的输出力值与内外电极的相交长度成线性关系,内外电极位置控制所产生的误差也只是呈线性的传递到力源的输出,避免了电压调节方式所造成的不确定度放大,有效保证输出微纳力具有高准确度。采用本发明的微纳力源装置后,输出力值调节方便,且省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。In the micro-nano force source device of the present invention, the outer contour function of the inner electrode is a fixed value, that is, the outer contour of the inner electrode is a straight line, and the reciprocal of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode It is a linear function, assuming that the outer contour of the inner electrode satisfies the function f(z+Lz l ), and the inner contour of the outer electrode satisfies the function g(z), then the capacitance between the inner and outer electrodes is:
Figure BDA0003636287570000031
It is known that the force value formula generated by the force source composed of internal and external electrodes is:
Figure BDA0003636287570000032
Combining the above formula (2) and formula (3), the micro-nano force between the inner and outer electrodes can be obtained as:
Figure BDA0003636287570000033
Wherein h(z)=g(z)-f(z), therefore, when the outer contour of the inner electrode is a straight line, and the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode is a linear function , that is, when the reciprocal of h(z l ) is a linear function, the output of the micro-nano force source is a linear function of the intersection length z l . Therefore, when the applied voltage between the inner and outer electrodes is fixed, the magnitude of the micro-nano force is the micro-nano force The output force value of the source is linear with the intersecting length of the inner and outer electrodes. Therefore, the output of micro-nano force can be changed only by controlling the intersecting length of the inner and outer electrodes. The error is only linearly transmitted to the output of the force source, avoiding the uncertainty amplification caused by the voltage adjustment method, and effectively ensuring the high accuracy of the output micro-nano force. After adopting the micro-nano force source device of the present invention, the output force value can be easily adjusted, and the precise adjustment and control of the loading voltage is omitted, and there is no need to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly saves the cost of the device , Reduced the volume of the device.

根据本发明实施例第一方面提供的微纳力源装置,所述外电极的内轮廓函数为一次分式函数。According to the micro-nano force source device provided in the first aspect of the embodiment of the present invention, the inner contour function of the outer electrode is a first order fractional function.

外电极的内轮廓函数为一次分式函数,便于计算微纳力源装置的输出力值。The inner contour function of the outer electrode is a fractional function, which is convenient for calculating the output force value of the micro-nano force source device.

根据本发明实施例第一方面提供的微纳力源装置,所述一次分式函数为

Figure BDA0003636287570000041
所述内电极的外轮廓函数为f(z)=A,其中A、B、C和D均为常数。According to the micro-nano force source device provided in the first aspect of the embodiment of the present invention, the first-order fractional function is
Figure BDA0003636287570000041
The outer contour function of the inner electrode is f(z)=A, where A, B, C and D are all constants.

两个函数作差后,其倒数为一次函数,根据计算可以得知此时微纳力源装置的输出力值和内外电极的相交长度成线性关系,便于调节微纳力源装置的输出力值。After the difference between the two functions, the reciprocal is a linear function. According to the calculation, it can be known that the output force value of the micro-nano force source device and the intersecting length of the inner and outer electrodes are in a linear relationship, which is convenient for adjusting the output force value of the micro-nano force source device. .

本发明实施例第二方面提供一种微纳力源装置的控制方法,适用于如本发明实施例第一方面任一项所述的微纳力源装置,所述方法包括:通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值。The second aspect of the embodiment of the present invention provides a control method for a micro-nano force source device, which is suitable for the micro-nano force source device described in any one of the first aspects of the embodiment of the present invention, the method includes: by controlling the The intersection length of the outer electrode and the inner electrode adjusts the output force value of the micro-nano force source device.

由于上述微纳力源装置中,微纳力源的输出力值与内外电极的相交长度成线性关系,因此,只需对其内外电极的相交长度进行控制,就能够改变微纳力的输出,内外电极相交长度控制所产生的误差也只是呈线性的传递到力源的输出,避免了电压调节方式所造成的不确定度放大。采用本发明的方法,省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。In the above-mentioned micro-nano force source device, the output force value of the micro-nano force source is in a linear relationship with the intersecting length of the inner and outer electrodes, so the output of the micro-nano force can be changed only by controlling the intersecting length of the inner and outer electrodes. The error generated by the intersecting length control of the inner and outer electrodes is only linearly transmitted to the output of the force source, which avoids the uncertainty amplification caused by the voltage adjustment method. Adopting the method of the present invention saves the precise adjustment and control of the loading voltage, and does not need to be equipped with a high-accuracy DC stabilized power supply adjustment control device, which greatly saves the cost of the device and reduces the volume of the device.

根据本发明实施例第二方面提供的微纳力源装置的控制方法,还包括:判断所述外电极和所述内电极间的加载电压是否低于设定电压,当加载电压低于设定电压时,通过控制加载电压大小调节输出力值,当加载电压不低于设定电压时,通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值。According to the second aspect of the embodiment of the present invention, the control method of the micro-nano force source device further includes: judging whether the loading voltage between the external electrode and the internal electrode is lower than the set voltage, when the loading voltage is lower than the set voltage When the voltage is high, the output force value is adjusted by controlling the applied voltage, and when the applied voltage is not lower than the set voltage, the output force value of the micro-nano force source device is adjusted by controlling the intersecting length of the outer electrode and the inner electrode.

采用两种调节微纳力源输出力值的方式共同工作,在低电压情况下通过电压调节来控制力源的输出,在高电压时通过控制相交长度调节微纳力源装置的输出力值,调节方式灵活。Two methods of adjusting the output force value of the micro-nano force source are used to work together. In the case of low voltage, the output of the force source is controlled by voltage regulation, and the output force value of the micro-nano force source device is adjusted by controlling the intersection length at high voltage. The adjustment method is flexible.

根据本发明实施例第二方面提供的微纳力源装置的控制方法,在通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值前,还包括,建立输出力值的量程段和所述外电极和所述内电极间的加载电压的对应关系,根据输出力值的量程段选择加载电压。According to the control method of the micro-nano force source device provided in the second aspect of the embodiment of the present invention, before adjusting the output force value of the micro-nano force source device by controlling the intersecting length of the outer electrode and the inner electrode, it also includes, establishing The corresponding relationship between the range segment of the output force value and the loading voltage between the outer electrode and the inner electrode, the loading voltage is selected according to the range segment of the output force value.

通过相交长度的调节和加载电压的调节叠加来形成超大输出范围的微纳力源,并且可以选择加载电压档位,使用方便。Through the adjustment of the intersection length and the adjustment and superposition of the loading voltage, a micro-nano force source with a large output range can be formed, and the loading voltage gear can be selected, which is convenient to use.

本发明实施例第三方面提供了一种微纳力测量设备,包括如本发明实施例第一方面任一项所述的微纳力源装置以及长度控制调节装置,所述长度控制调节装置用于控制所述外电极和所述内电极的相交长度。The third aspect of the embodiment of the present invention provides a micro-nano force measuring device, including the micro-nano force source device and the length control adjustment device according to any one of the first aspect of the embodiment of the present invention, and the length control adjustment device is used for for controlling the intersecting length of the outer electrodes and the inner electrodes.

本发明实施例第三方面提供一种微纳力测量设备具有和本发明实施例第二方面的控制方法相同的技术效果,在此不再赘述。The third aspect of the embodiment of the present invention provides a micro-nano force measuring device which has the same technical effect as the control method of the second aspect of the embodiment of the present invention, and will not be repeated here.

根据本发明实施例第三方面提供的微纳力测量设备,还包括电压判断模块和电压调节模块,所述电压判断模块用于判断所述外电极和所述内电极间的加载电压是否低于设定电压,所述电压调节模块用于当加载电压低于设定电压时,通过控制加载电压大小调节输出力值。According to the third aspect of the embodiment of the present invention, the micro-nano force measurement device further includes a voltage judging module and a voltage regulating module, and the voltage judging module is used to judge whether the loading voltage between the outer electrode and the inner electrode is lower than The voltage is set, and the voltage adjustment module is used to adjust the output force value by controlling the magnitude of the loaded voltage when the loaded voltage is lower than the set voltage.

根据本发明实施例第三方面提供的微纳力测量设备,还包括电压档位调节模块,所述电压档位调节模块用于建立输出力值的量程段和所述外电极和所述内电极间的加载电压的对应关系,并根据输出力值的量程段选择加载电压。The micro-nano force measuring device provided according to the third aspect of the embodiment of the present invention further includes a voltage gear adjustment module, and the voltage gear adjustment module is used to establish the range segment of the output force value and the outer electrode and the inner electrode The corresponding relationship between the loading voltage, and select the loading voltage according to the range of the output force value.

本发明实施例第四方面提供一种计算机可读存储介质,所述计算机可读存储介质存储有计算机指令,所述计算机指令用于使所述计算机执行如本发明实施例第二方面任一项所述的控制方法。The fourth aspect of the embodiments of the present invention provides a computer-readable storage medium, the computer-readable storage medium stores computer instructions, and the computer instructions are used to make the computer execute any one of the second aspect of the embodiments of the present invention. the control method described.

本发明实施例第四方面提供一种计算机可读存储介质具有和本发明实施例第二方面的控制方法相同的技术效果,在此不再赘述。The fourth aspect of the embodiments of the present invention provides a computer-readable storage medium that has the same technical effect as that of the control method in the second aspect of the embodiments of the present invention, which will not be repeated here.

附图说明Description of drawings

为了更清楚地表达说明本发明实施例的技术方案,下面将对实施例描述所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to express the technical solutions of the embodiments of the present invention more clearly, the following will briefly introduce the accompanying drawings required for the description of the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For Those of ordinary skill in the art can also obtain other drawings based on these drawings without making creative efforts.

图1为传统的微纳力测量装置中的微纳力源的正剖视图;Fig. 1 is the front sectional view of the micro-nano force source in the traditional micro-nano force measuring device;

图2为传统的微纳力测量装置中的微纳力源的俯视图;Fig. 2 is the top view of the micro-nano force source in the traditional micro-nano force measuring device;

图3为本发明实施例中微纳力源装置的设计结构示意图;3 is a schematic diagram of the design structure of the micro-nano force source device in the embodiment of the present invention;

图4为本发明实施例中一微纳力源装置的结构示意图;Fig. 4 is a schematic structural diagram of a micro-nano force source device in an embodiment of the present invention;

图5为本发明实施例中一输出力源与相交长度的关系示意图Fig. 5 is a schematic diagram of the relationship between an output force source and the intersection length in an embodiment of the present invention

图6为本发明实施例中另一微纳力源装置的结构示意图;Fig. 6 is a schematic structural diagram of another micro-nano force source device in an embodiment of the present invention;

图7为本发明实施例中另一输出力源与相交长度的关系示意图;Fig. 7 is a schematic diagram of the relationship between another output force source and the intersection length in the embodiment of the present invention;

图8为本发明实施例中微纳力源装置的控制方法的流程图;Fig. 8 is a flow chart of the control method of the micro-nano force source device in the embodiment of the present invention;

图9为本发明实施例中微纳力测量设备的模块框图。Fig. 9 is a block diagram of a micro-nano force measuring device in an embodiment of the present invention.

具体实施方式Detailed ways

为了使本技术领域的人员更好地理解本发明方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

实施例1Example 1

本发明实施例提供了一种微纳力源装置,能够解决微纳力源的输出力值调节不方便的问题。The embodiment of the present invention provides a micro-nano force source device, which can solve the problem of inconvenient adjustment of the output force value of the micro-nano force source.

参见图1和图2,传统的微纳力测量装置中的微纳力源由内电极和外电极组成,内电极和外电极均为柱状电容,其输出微纳力值为:

Figure BDA0003636287570000071
Figure BDA0003636287570000072
其中U为内电极和外电极间的加载电压,Di为外电极内径,d0为内电极外径,ε为空气中的介电常数,zl为内电极和外电极相交长度。该式可知,此形状的微纳力源的输出值仅取决于内电极外径d0、外电极内径Di以及加载电压U,一旦内电极和外电极尺寸确定后,其内电极外径d0、外电极内径Di均为常数不可改变,在使用过程中,只能通过调节加载电压U的大小来控制力源的输出力值。Referring to Figure 1 and Figure 2, the micro-nano force source in the traditional micro-nano force measuring device is composed of internal electrodes and external electrodes, both of which are columnar capacitors, and the output micro-nano force value is:
Figure BDA0003636287570000071
Figure BDA0003636287570000072
Where U is the applied voltage between the inner electrode and the outer electrode, Di is the inner diameter of the outer electrode, d 0 is the outer diameter of the inner electrode, ε is the dielectric constant in air, z l is the intersection length of the inner electrode and the outer electrode. It can be seen from the formula that the output value of the micro-nano force source of this shape only depends on the outer diameter of the inner electrode d 0 , the inner diameter of the outer electrode Di and the applied voltage U. Once the size of the inner electrode and the outer electrode is determined, the outer diameter of the inner electrode d 0 The inner diameter Di of the outer electrode and the outer electrode are constant and cannot be changed. During use, the output force value of the force source can only be controlled by adjusting the magnitude of the applied voltage U.

现有的微纳力源装置具有以下缺点:Existing micro-nano force source devices have the following disadvantages:

1、由公式(1)可知,力源输出微纳力值与加载电压的平方成正比,因此微纳力源的输出力值对加载电压的变化十分敏感,由于微纳力源装置的输出微纳力值与加载电压的平方成正比,因此若要精确的改变力源的输出微纳力值,则需要实现对加载电压的精确调节与控制,需要配备高准确度的直流稳压电源调节控制装置,极大地增加了微纳力源装置的体积和成本。1. It can be seen from the formula (1) that the output force value of the force source is proportional to the square of the loading voltage, so the output force value of the micro-nano force source is very sensitive to the change of the loading voltage. The nano-force value is proportional to the square of the loading voltage, so if you want to accurately change the output micro-nano-force value of the force source, you need to achieve precise adjustment and control of the loading voltage, and you need to be equipped with a high-precision DC stabilized power supply adjustment control device, which greatly increases the volume and cost of the micro-nano force source device.

2、在微纳力源标定过程中,由于输出微纳力值随着电压的平方变化,其输出曲线为二次函数曲线,需要标定多个点才能得到微纳力源装置的输出特性曲线,提高了微纳力源标定的时间、影响了力源标定的准确度。2. During the calibration process of the micro-nano force source, since the output micro-nano force value changes with the square of the voltage, its output curve is a quadratic function curve, and multiple points need to be calibrated to obtain the output characteristic curve of the micro-nano force source device. The time for micro-nano force source calibration is improved, and the accuracy of force source calibration is affected.

3、虽然改变微纳力源装置的加载电压比较容易实现,但是为了获得更大范围的输出微纳力值以增加微纳力源装置的输出范围(量程),需要较高的加载电压(许多时候为扩大力源输出范围加载电压需要达到2000V以上),而当加载电压过高时装置中力源的电容极板间很容易发生静电放电击穿现象,造成微纳力源装置的损坏。3. Although it is easier to change the loading voltage of the micro-nano force source device, in order to obtain a wider range of output micro-nano force values to increase the output range (range) of the micro-nano force source device, a higher loading voltage (many In order to expand the output range of the power source, the loading voltage needs to reach more than 2000V), and when the loading voltage is too high, electrostatic discharge breakdown is likely to occur between the capacitive plates of the power source in the device, resulting in damage to the micro-nano power source device.

4、获得稳定的高电压需要庞大的辅助装置,同时直流高电压输入的稳定性本身也难以保证,若直流高压稳定性无法保证,则微纳力源装置输出的微纳力值准确度与稳定性很难保证,从而直接影响到微纳力源装置的准确度与稳定性。4. Obtaining a stable high voltage requires a huge auxiliary device. At the same time, the stability of the DC high voltage input itself is difficult to guarantee. If the stability of the DC high voltage cannot be guaranteed, the accuracy and stability of the micro-nano force value output by the micro-nano force source device It is difficult to guarantee the reliability, which directly affects the accuracy and stability of the micro-nano force source device.

由此,本发明实施例提供一种微纳力源装置,包括内电极和外电极,外电极套设在内电极的外部且外电极和内电极有部分或全部长度相交,内电极的外轮廓函数为固定值,且外电极的内轮廓函数和内电极的外轮廓函数的差的倒数为一次函数。Therefore, an embodiment of the present invention provides a micro-nano force source device, including an inner electrode and an outer electrode, the outer electrode is sleeved outside the inner electrode, and the outer electrode and the inner electrode have a partial or full length intersection, and the outer contour of the inner electrode The function is a fixed value, and the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode is a linear function.

下面结合图3说明本发明实施例微纳力源装置的设计原理。The design principle of the micro-nano force source device of the embodiment of the present invention will be described below with reference to FIG. 3 .

在柱坐标系中,即图中z轴和r轴,设内电极外轮廓满足函数f(z+L-zl),外电极内轮廓满足函数g(z)。外电极长度为L,内外电极相交长度为zl,内电极和外电极构成的电容微分dC=εdedz/[g(z)-f(z+L-zl),则内外电极间的电容为:

Figure BDA0003636287570000091
通常的,内外电极所组成的力源产生的力值公式为:
Figure BDA0003636287570000092
结合公式(2)和公式(3),且内电极外径为直线时(即f(z+L-zl)为固定值时),可得内外电极之间的微纳力为:
Figure BDA0003636287570000093
其中h(z)=g(z)-f(z),其中U是内电极和外电极间的加载电压,即内外电极的电势差,k是一个比例系数,b为常数。由此可见,对于柱状电容式微纳力源装置而言,其输出力值与内电极外轮廓形状和外电极内轮廓形状具有重要关系。若能使内外电极形状满足一定关系,则可以控制力源输出特性。In the cylindrical coordinate system, that is, the z-axis and the r-axis in the figure, it is assumed that the outer contour of the inner electrode satisfies the function f(z+Lz l ), and the inner contour of the outer electrode satisfies the function g(z). The length of the outer electrode is L, the intersecting length of the inner and outer electrodes is z l , and the capacitance differential formed by the inner electrode and the outer electrode dC=εdedz/[g(z)-f(z+Lz l ), then the capacitance between the inner and outer electrodes is:
Figure BDA0003636287570000091
Usually, the force value formula generated by the force source composed of internal and external electrodes is:
Figure BDA0003636287570000092
Combining formula (2) and formula (3), and when the outer diameter of the inner electrode is a straight line (that is, when f(z+Lz l ) is a fixed value), the micro-nano force between the inner and outer electrodes can be obtained as:
Figure BDA0003636287570000093
Where h(z)=g(z)-f(z), where U is the loading voltage between the inner electrode and the outer electrode, that is, the potential difference between the inner and outer electrodes, k is a proportional coefficient, and b is a constant. It can be seen that for the columnar capacitive micro-nano force source device, the output force value has an important relationship with the outer contour shape of the inner electrode and the inner contour shape of the outer electrode. If the shape of the inner and outer electrodes can satisfy a certain relationship, the output characteristics of the force source can be controlled.

具体地,只要使h(zl)代入微纳力公式后得到的函数为相交长度zl的一次函数,就可以使力源的输出微纳力与内外电极相交长度成线性关系。在本发明实施例的微纳力源装置,当内电极的外轮廓函数为固定值,且外电极的内轮廓函数和内电极的外轮廓函数的差的倒数为关于高度z的一次函数时,即h(zl)的倒数为一次函数时,带入公式(4)后,微纳力为相交长度zl的一次函数,因此,在内外电极间的加载电压大小固定时,微纳力的大小即微纳力源的输出力值与内外电极的相交长度成线性关系。Specifically, as long as the function obtained by substituting h(z l ) into the micro-nano force formula is a linear function of the intersection length z l , the output micro-nano force of the force source can be linearly related to the intersection length of the inner and outer electrodes. In the micro-nano force source device of the embodiment of the present invention, when the outer contour function of the inner electrode is a fixed value, and the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode is a linear function with respect to the height z, That is, when the reciprocal of h(z l ) is a linear function, after being brought into formula (4), the micro-nano force is a linear function of the intersecting length z l . Therefore, when the applied voltage between the inner and outer electrodes is fixed, the micro-nano force The size, that is, the output force value of the micro-nano force source is linearly related to the intersecting length of the inner and outer electrodes.

本发明的微纳力源装置,由于微纳力源的输出力值与内外电极的相交长度成线性关系,只需对其内外电极的相交长度进行控制,就能够改变微纳力的输出,内外电极位置控制所产生的误差也只是呈线性的传递到力源的输出,避免了电压调节方式所造成的不确定度放大,有效保证输出微纳力具有高准确度。采用本发明的微纳力源装置后,省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。In the micro-nano force source device of the present invention, since the output force value of the micro-nano force source is in a linear relationship with the intersecting length of the inner and outer electrodes, the output of the micro-nano force can be changed only by controlling the intersecting length of the inner and outer electrodes. The error generated by the electrode position control is only linearly transmitted to the output of the force source, avoiding the uncertainty amplification caused by the voltage adjustment method, and effectively ensuring the high accuracy of the output micro-nano force. After adopting the micro-nano force source device of the present invention, the precise adjustment and control of the loading voltage is omitted, and there is no need to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly saves the cost of the device and reduces the volume of the device .

由此,只需对其内外电极的相交长度进行控制,就能够改变力源的输出,而目前即便是简单廉价的直线丝杠就能将相交长度控制精度控制在0.01mm量级,同时由于微纳力源的输出力值与内外电极的相交长度成线性关系,内外电极相交长度控制所产生的误差也只是呈线性的传递到力源的输出,避免了电压调节方式所造成的不确定度放大。本发明实施例具有以下效果:Therefore, the output of the force source can be changed only by controlling the intersecting length of the inner and outer electrodes. At present, even a simple and cheap linear screw can control the intersecting length control accuracy at the order of 0.01 mm. The output force value of Naliyuan has a linear relationship with the intersecting length of the inner and outer electrodes, and the error generated by the control of the intersecting length of the inner and outer electrodes is only linearly transmitted to the output of the Liyuan, avoiding the uncertainty amplification caused by the voltage adjustment method . Embodiments of the present invention have the following effects:

第一、采用本发明的微纳力源装置后,省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。First, after adopting the micro-nano power source device of the present invention, the precise adjustment and control of the loading voltage is omitted, and there is no need to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly saves the cost of the device and reduces the The volume of the device.

第二、本发明的微纳力源装置由于其输出微纳力值与相交长度呈线性关系,因此在微纳力源标定过程中,无需像标定二次曲线一样复杂,只需标定少量的点就能准确得到装置的输出特性曲线,大幅缩短了微纳力源标定的时间、同时还提高了装置的标定准确度。Second, the micro-nano force source device of the present invention has a linear relationship between the output micro-nano force value and the intersection length, so in the micro-nano force source calibration process, it is not as complicated as calibrating the quadratic curve, only a small number of points need to be calibrated The output characteristic curve of the device can be accurately obtained, the time for calibration of the micro-nano force source is greatly shortened, and the calibration accuracy of the device is also improved.

第三、本发明的微纳力源装置通过控制内外电容相交长度来扩大力源输出范围,避免了传统装置提高电压扩大力源输出范围所导致的电极击穿现象,大幅提高了微纳力源装置的安全性和稳定性。Third, the micro-nano force source device of the present invention expands the output range of the force source by controlling the intersecting length of the internal and external capacitors, avoids the electrode breakdown phenomenon caused by increasing the voltage of the traditional device to expand the output range of the force source, and greatly improves the micro-nano force source. Device safety and stability.

第四、本发明的微纳力源装置由于只需控制内外电极的相交长度来控制输出,与传统装置相比免去了稳态直流高压的获取与精密控制,具有更好地抗电磁干扰能力与环境适应性。Fourth, the micro-nano force source device of the present invention only needs to control the intersecting length of the inner and outer electrodes to control the output. Compared with the traditional device, the acquisition and precise control of steady-state DC high voltage are eliminated, and it has better anti-electromagnetic interference ability Adaptability to the environment.

在一实施例中,外电极的内轮廓函数为一次分式函数,内电极的外轮廓函数为固定值。外电极的内轮廓函数为一次分式函数,便于计算微纳力源装置的输出力值。In one embodiment, the inner contour function of the outer electrode is a first-order fractional function, and the outer contour function of the inner electrode is a fixed value. The inner contour function of the outer electrode is a fractional function, which is convenient for calculating the output force value of the micro-nano force source device.

进一步,一次分式函数为

Figure BDA0003636287570000111
内电极的外轮廓函数为f(z)=A,其中A、B、C和D均为常数。两个函数作差后,其倒数为一次函数,根据公式(4)计算可以得知此时微纳力源装置的输出力值和内外电极的相交长度成线性关系,便于调节微纳力源装置的输出力值。Further, the primary fraction function is
Figure BDA0003636287570000111
The outer contour function of the inner electrode is f(z)=A, where A, B, C and D are all constants. After the difference between the two functions, the reciprocal is a linear function. According to the calculation of formula (4), it can be known that the output force value of the micro-nano force source device and the intersecting length of the inner and outer electrodes are in a linear relationship, which is convenient for adjusting the micro-nano force source device. output force value.

具体地,根据虚功原理,若内外电极间电压保持恒定时,使内电极运动产生位移dz时,所需要做的功为:

Figure BDA0003636287570000112
其中F为作用于内电极的力值,dz为内外电极相对位置的变化,根据公式(5)可以得到,作用于内电极的力值为:
Figure BDA0003636287570000113
在本实施例中f(z)=A,
Figure BDA0003636287570000114
代入公式(2)可以得到
Figure BDA0003636287570000115
将式(7)代入式(6)可得:
Figure BDA0003636287570000116
由此可见,输出力值与相交长度zl成线性关系。Specifically, according to the principle of virtual work, if the voltage between the inner and outer electrodes is kept constant, the work required to make the inner electrode move to generate a displacement dz is:
Figure BDA0003636287570000112
Among them, F is the force value acting on the inner electrode, and dz is the change of the relative position of the inner and outer electrodes. According to formula (5), it can be obtained that the force value acting on the inner electrode is:
Figure BDA0003636287570000113
In this embodiment f(z)=A,
Figure BDA0003636287570000114
Substitute into formula (2) to get
Figure BDA0003636287570000115
Substituting formula (7) into formula (6) can get:
Figure BDA0003636287570000116
It can be seen that the output force value has a linear relationship with the intersection length z l .

需要说明的是,该公式推导是建立在简化模型的基础上得到的,要求内外电极的长度(L)>>电极直径,所以在一些情况下,实际装置的线性输出的微纳力值与按照理论公式

Figure BDA0003636287570000117
计算得到的力值会有所差别,因此在实际应用中,可以在确定内外电极的轮廓形状后,再通过校准(即任意取两个电极相交长度z1的值,并标定此时的输出力值)从而获得线性关系式。(实际上不管是传统的柱状微纳力源还是本发明的微纳力源装置,在实际应用中均需要标定输出特性,不能以理想的公式计算值作为实际的输出特性来使用)It should be noted that the derivation of this formula is based on a simplified model, which requires the length (L) of the inner and outer electrodes>>the diameter of the electrode, so in some cases, the linear output of the actual device The micro-nano force value is the same as that according to theoretical formula
Figure BDA0003636287570000117
The calculated force value will be different, so in practical applications, after determining the contour shape of the inner and outer electrodes, it can be calibrated (that is, the value of the intersection length z 1 of the two electrodes is taken arbitrarily, and the output force at this time is calibrated value) to obtain a linear relationship. (Actually, whether it is the traditional columnar micro-nano force source or the micro-nano force source device of the present invention, the output characteristics need to be calibrated in practical applications, and the calculated value of the ideal formula cannot be used as the actual output characteristics)

具体地,在一实施例中A、B和C分别为2、6.5和1.5。即外电极的内轮廓函数为

Figure BDA0003636287570000121
内电极的外轮廓函数为f(z)=2。内外电极形状如图4所示,内电极的外轮廓为直线,外电极的内轮廓为满足
Figure BDA0003636287570000122
的曲线。此时力源的输出力值为:F=kU2ε(1.5+zl)。Specifically, in one embodiment, A, B, and C are 2, 6.5, and 1.5, respectively. That is, the inner contour function of the outer electrode is
Figure BDA0003636287570000121
The outer contour function of the inner electrode is f(z)=2. The shape of the inner and outer electrodes is shown in Figure 4, the outer contour of the inner electrode is a straight line, and the inner contour of the outer electrode satisfies
Figure BDA0003636287570000122
curve. At this time, the output force value of the force source is: F=kU 2 ε(1.5+z l ).

由此可见,在其他参数不变的条件下,输出力源与内外电极的相交长度zl成线性关系,如图5所示,由此,只需对其内外电极的相交长度进行控制,就能够改变力源的输出。参见图5,可以对本发明实施例设置几个挡位(如100V,200V,500V),根据力源输出量程段需要加载某一定值加载电压(100V,200V,500V),然后控制相交长度来精确控制微纳力源装置的输出。当需要较大的量程时,可以选择较大的加载电压例如500V,当需要较小的量程以提高精度时则可以选择100V加载电压,选择量程后确定加载电压就可以根据相交长度来精确控制微纳力源装置的输出。微纳力源装置由于定值加载电压的获取和稳定性比可调节电压的获取要容易很多,且稳定性也更好,因此可以保证装置电压的稳定性与准确度(具体而言就是如果只需获取100V,200V,500V这三个点的定值加载电压的高稳定性和高准确度是比获取从0V~500V可调节电压的某个值的高准确度和高稳定性是要简单很多的,装置也简单很多)。采用此方法后,本发明不仅可以获得高准确度的输出微纳力,同时还大幅提高了本发明微纳力源装置的输出范围,提高了装置的适用性。It can be seen that, under the condition of other parameters being constant, the output force source has a linear relationship with the intersecting length z l of the inner and outer electrodes, as shown in Fig. Can change the output of the force source. Referring to Fig. 5, several gears (such as 100V, 200V, 500V) can be set for the embodiment of the present invention, and a certain value loading voltage (100V, 200V, 500V) needs to be loaded according to the output range of the force source, and then the intersection length can be controlled to accurately Control the output of the micro-nano force source device. When a larger range is required, a larger loading voltage such as 500V can be selected. When a smaller range is required to improve accuracy, a 100V loading voltage can be selected. After selecting the range, the loading voltage can be determined according to the intersection length. The output of the Naliyuan device. The acquisition and stability of the fixed-value loading voltage of the micro-nano force source device is much easier than that of the adjustable voltage, and the stability is better, so the stability and accuracy of the device voltage can be guaranteed (specifically, if only It is much simpler to obtain the high stability and high accuracy of the fixed-value loading voltage at the three points of 100V, 200V, and 500V than to obtain the high accuracy and high stability of a certain value of the adjustable voltage from 0V to 500V. Yes, the device is also much simpler). After adopting this method, the present invention can not only obtain high-accuracy output micro-nano force, but also greatly increase the output range of the micro-nano force source device of the present invention, and improve the applicability of the device.

在本发明另一示例性实施例中,令外电极的内轮廓函数为

Figure BDA0003636287570000123
内电极的外轮廓函数为f(z)=4,其形状参见图6。根据公式(4)可知此时力源的输出微纳力值为:F=kU2εzl+b,由此可见,在其他参数不变的条件下,输出力值与电容的相交长度zl成线性关系。其相交长度zl和输出力值的关系如图7所示。图7纵坐标F是力源输出微纳力值,横坐标zl是内外电容的相交长度。由图7可明显看出,在本实施例中,力源输出微纳力值与相交长度具有线性关系,其相关系数R2达到0.9973,表明线性关系极好。In another exemplary embodiment of the present invention, let the inner contour function of the outer electrode be
Figure BDA0003636287570000123
The outer contour function of the inner electrode is f(z)=4, and its shape is shown in FIG. 6 . According to the formula (4), it can be known that the output micro-nano force value of the force source at this time is: F=kU 2 εz l +b. It can be seen that under the condition of other parameters unchanged, the intersection length z l of the output force value and the capacitance into a linear relationship. The relationship between the intersection length z l and the output force value is shown in Figure 7. In Fig. 7, the ordinate F is the micro-nano force value output by the force source, and the abscissa z l is the intersecting length of the internal and external capacitors. It can be clearly seen from Fig. 7 that in this embodiment, the output micro-nano force value of the force source has a linear relationship with the intersection length, and its correlation coefficient R2 reaches 0.9973, indicating that the linear relationship is excellent.

在本发明另一示例性实施例中,将内电极的外轮廓函数设为f(z)=4,内电极的外轮廓函数设为

Figure BDA0003636287570000131
同样也可以使输出力值与电容的相交长度zl成线性关系。In another exemplary embodiment of the present invention, the outer contour function of the inner electrode is set as f(z)=4, and the outer contour function of the inner electrode is set as
Figure BDA0003636287570000131
Similarly, the output force value and the intersecting length z l of the capacitor can also be linearly related.

本发明上述实施例中的微纳力源内外电极形状只是其中的一种,只需要满足外电极的内轮廓函数和内电极的外轮廓函数的差的倒数为一次函数,且内电极的外轮廓函数为定值(即内电极为圆柱状电容),则可以使力源的输出微纳力与相交长度成线性关系。The shape of the inner and outer electrodes of the micro-nano force source in the above-mentioned embodiments of the present invention is only one of them. It only needs to satisfy the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode to be a linear function, and the outer contour of the inner electrode If the function is a fixed value (that is, the internal electrode is a cylindrical capacitor), the output micro-nano force of the force source can be linearly related to the intersection length.

实施例2Example 2

本发明实施例还提供一种微纳力源装置的控制方法,适用于如上述的微纳力源装置,参见图8,方法包括:步骤S100、通过控制外电极和内电极的相交长度调节微纳力源装置的输出力值。The embodiment of the present invention also provides a control method for a micro-nano force source device, which is suitable for the above-mentioned micro-nano force source device, see Figure 8, the method includes: step S100, adjusting the micro-nano force source device by controlling the intersection length The output force value of the Naliyuan device.

在如上述的微纳力源装置中,当外电极和内电极间的加载电压一定时,输出力值和相交长度成线性关系。因此,本发明实施例的微纳力源装置的控制方法,只需对其内外电极的相交长度进行控制,就能够改变力源的输出,而目前即便是简单廉价的直线丝杠就能将位置控制精度控制在0.01mm量级,同时由于微纳力源的输出力值与内外电极的相交长度成线性关系,内外电极相交长度控制所产生的误差也只是呈线性的传递到力源的输出,避免了电压调节方式所造成的不确定度放大。采用本发明的方法,省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。In the above-mentioned micro-nano force source device, when the applied voltage between the outer electrode and the inner electrode is constant, the output force value has a linear relationship with the intersection length. Therefore, the control method of the micro-nano force source device in the embodiment of the present invention can change the output of the force source only by controlling the intersecting length of the inner and outer electrodes. At present, even a simple and cheap linear screw can change the position The control accuracy is controlled at the level of 0.01mm. At the same time, since the output force value of the micro-nano force source is linearly related to the intersecting length of the inner and outer electrodes, the error generated by the control of the intersecting length of the inner and outer electrodes is only linearly transmitted to the output of the force source. The uncertainty amplification caused by the voltage regulation method is avoided. Adopting the method of the present invention saves the precise adjustment and control of the loading voltage, and does not need to be equipped with a high-accuracy DC stabilized power supply adjustment control device, which greatly saves the cost of the device and reduces the volume of the device.

在一实施例中,该控制方法还包括:判断外电极和内电极间的加载电压是否低于设定电压,当加载电压低于设定电压时,通过控制加载电压大小调节输出力值,当加载电压不低于设定电压时,通过控制外电极和内电极的相交长度调节微纳力源装置的输出力值。In an embodiment, the control method further includes: judging whether the applied voltage between the outer electrode and the inner electrode is lower than the set voltage, and when the applied voltage is lower than the set voltage, adjusting the output force value by controlling the applied voltage, when When the loading voltage is not lower than the set voltage, the output force value of the micro-nano force source device is adjusted by controlling the intersecting length of the outer electrode and the inner electrode.

例如,在加载电压低于100V时,采用现有的电压控制方法调控输出力值,在加载电压高于100V时,此时不方便调节加载电压,此时采用长度调节输出力值。采用两种调节微纳力源输出力值的方式共同工作,在低电压情况下通过电压调节来控制力源的输出,在高电压时通过控制相交长度调节微纳力源装置的输出力值,调节方式灵活。For example, when the loading voltage is lower than 100V, the existing voltage control method is used to regulate the output force value. When the loading voltage is higher than 100V, it is inconvenient to adjust the loading voltage at this time, and the length is used to adjust the output force value. Two methods of adjusting the output force value of the micro-nano force source are used to work together. In the case of low voltage, the output of the force source is controlled by voltage regulation, and the output force value of the micro-nano force source device is adjusted by controlling the intersection length at high voltage. The adjustment method is flexible.

在一实施例中,该控制方法还包括,在通过控制外电极和内电极的相交长度调节微纳力源装置的输出力值前,还包括,建立输出力值的量程段和外电极和内电极间的加载电压的对应关系,根据输出力值的量程段选择加载电压。In one embodiment, the control method further includes, before adjusting the output force value of the micro-nano force source device by controlling the intersecting length of the external electrode and the internal electrode, further comprising, establishing the range of the output force value and the range of the external electrode and the internal electrode. The corresponding relationship between the loading voltage between the electrodes, the loading voltage is selected according to the range segment of the output force value.

具体地,我们可以对加载电压设置几个挡位(如100V,200V,500V),根据力源输出量程段需要加载某一定值加载电压(100V,200V,500V),然后控制相交长度来精确控制微纳力源装置的输出。当需要较大的量程时,可以选择较大的加载电压例如500V,当需要较小的量程以提高精度时则可以选择100V加载电压,选择量程后确定加载电压就可以根据相交长度来精确控制微纳力源装置的输出。由于定值加载电压的获取和稳定性比可调节电压的获取要容易很多,且稳定性也更好,因此可以保证装置电压的稳定性与准确度。采用此方法后,本发明不仅可以获得高准确度的输出微纳力,同时还大幅提高了本发明微纳力源装置的输出范围,提高了微纳力源装置的适用性。通过相交长度的调节和加载电压的调节叠加来形成超大输出范围的微纳力源,并且可以通过选择加载电压档位选择力源输出量程段,使用方便。Specifically, we can set several gears for the loading voltage (such as 100V, 200V, 500V), load a certain value of loading voltage (100V, 200V, 500V) according to the output range of the force source, and then control the intersection length to precisely control The output of the micro-nano force source device. When a larger range is required, a larger loading voltage such as 500V can be selected. When a smaller range is required to improve accuracy, a 100V loading voltage can be selected. After selecting the range, the loading voltage can be determined according to the intersection length. The output of the Naliyuan device. Since the acquisition and stability of the fixed-value loading voltage is much easier than that of the adjustable voltage, and the stability is better, the stability and accuracy of the device voltage can be guaranteed. After adopting this method, the present invention can not only obtain high-accuracy output micro-nano force, but also greatly increase the output range of the micro-nano force source device of the present invention, and improve the applicability of the micro-nano force source device. Through the adjustment of the intersection length and the adjustment and superposition of the loading voltage, a micro-nano force source with a large output range can be formed, and the output range of the force source can be selected by selecting the loading voltage gear, which is convenient to use.

本发明实施例一方面在低电压情况下通过电压调节来控制力源的输出,另一方面,可以通过相交长度的调节和加载电压的调节叠加来形成超大输出范围的微纳力源。On the one hand, the embodiment of the present invention controls the output of the force source through voltage regulation under low voltage conditions; on the other hand, it can form a micro-nano force source with a super large output range through the superimposition of the adjustment of the intersection length and the adjustment of the loading voltage.

实施例3Example 3

根据本发明实施例还提供一种微纳力测量设备,参见图9,包括如本发明上述实施例中的微纳力源装置以及长度控制调节装置,长度控制调节装置用于控制外电极和内电极的相交长度。具体内容参见上述方法实施例对应部分,在此不再赘述。According to an embodiment of the present invention, there is also provided a micro-nano force measuring device, see FIG. 9, including the micro-nano force source device and the length control and adjustment device as in the above embodiment of the present invention. The length control and adjustment device is used to control the outer electrode and the inner electrode. The intersection length of the electrodes. For specific content, refer to the corresponding part of the foregoing method embodiment, and details are not repeated here.

长度控制调节装置可以采用直线丝杠,位置控制精度控制在0.01mm量级,能够省去了对于加载电压的精确调节与控制,无需配备高准确度的直流稳压电源调节控制装置,极大地节省了装置成本、减小了装置的体积。本发明的微纳力源由于其输出微纳力值与相交长度呈线性关系,因此在微纳力源标定过程中,无需像标定二次曲线一样复杂,只需标定少量的点就能准确得到装置的输出特性曲线,大幅缩短了微纳力源标定的时间、同时还提高了装置的标定准确度。此外,本发明的微纳力源装置通过控制内外电容相交长度来扩大力源输出范围,避免了传统装置提高电压扩大力源输出范围所导致的电极击穿现象,大幅提高了装置的安全性和稳定性。由于只需控制内外电极的交叉长度来控制输出,与传统装置相比免去了稳态直流高压的获取与精密控制,具有更好地抗电磁干扰能力与环境适应性。The length control adjustment device can use a linear screw, and the position control accuracy is controlled at the level of 0.01mm, which can save the precise adjustment and control of the loading voltage, and does not need to be equipped with a high-accuracy DC regulated power supply adjustment control device, which greatly saves The cost of the device is reduced, and the volume of the device is reduced. The micro-nano force source of the present invention has a linear relationship between the output micro-nano force value and the intersection length, so in the calibration process of the micro-nano force source, it does not need to be as complicated as calibrating the quadratic curve, and only a small number of points can be accurately obtained. The output characteristic curve of the device greatly shortens the calibration time of the micro-nano force source, and at the same time improves the calibration accuracy of the device. In addition, the micro-nano force source device of the present invention expands the output range of the force source by controlling the intersecting length of the internal and external capacitors, avoids the electrode breakdown phenomenon caused by increasing the voltage of the traditional device to expand the output range of the force source, and greatly improves the safety and reliability of the device. stability. Since it is only necessary to control the crossing length of the inner and outer electrodes to control the output, compared with traditional devices, the acquisition and precise control of steady-state DC high voltage are eliminated, and it has better anti-electromagnetic interference ability and environmental adaptability.

本发明实施提供的一种微纳力测量设备具有和上述控制方法相同的技术效果,在此不再赘述。A micro-nano-force measuring device provided by the implementation of the present invention has the same technical effect as the above-mentioned control method, and will not be repeated here.

在一实施例中,根据本发明实施例提供的微纳力测量设备,还包括电压判断模块和电压调节模块。In an embodiment, the micro-nano force measuring device provided according to the embodiment of the present invention further includes a voltage judging module and a voltage regulating module.

电压判断模块用于判断外电极和内电极间的加载电压是否低于设定电压。具体内容参见上述方法实施例对应部分,在此不再赘述。The voltage judging module is used to judge whether the loading voltage between the outer electrode and the inner electrode is lower than the set voltage. For specific content, refer to the corresponding part of the foregoing method embodiment, and details are not repeated here.

电压调节模块用于当加载电压低于设定电压时,通过控制加载电压大小调节输出力值。具体内容参见上述方法实施例对应部分,在此不再赘述。The voltage regulation module is used to adjust the output force value by controlling the loading voltage when the loading voltage is lower than the set voltage. For specific content, refer to the corresponding part of the foregoing method embodiment, and details are not repeated here.

在一实施例中,微纳力测量设备还包括电压档位调节模块。In one embodiment, the micro-nano force measuring device further includes a voltage range adjustment module.

电压档位调节模块用于建立输出力值的量程段和加载电压的对应关系,并根据输出力值的量程段选择加载电压。具体内容参见上述方法实施例对应部分,在此不再赘述。The voltage gear adjustment module is used to establish the corresponding relationship between the output force range and the loading voltage, and select the loading voltage according to the output force range. For specific content, refer to the corresponding part of the foregoing method embodiment, and details are not repeated here.

本发明实施例提供的一种微纳力测量设备具有和本发明实施例的控制方法相同的技术效果,在此不再赘述。The micro-nano-force measuring device provided by the embodiment of the present invention has the same technical effect as the control method of the embodiment of the present invention, and will not be repeated here.

实施例4Example 4

本发明实施例还提供一种计算机可读存储介质,其上存储有计算机程序,该指令被处理器执行时实现上述实施例中微纳力源装置的控制方法的步骤。该存储介质上还存储有音视频流数据,特征帧数据、交互请求信令、加密数据以及预设数据大小等。其中,存储介质可为磁碟、光盘、只读存储记忆体(Read-OnlyMemory,ROM)、随机存储记忆体(RandomAccessMemory,RAM)、快闪存储器(FlashMemory)、硬盘(HardDiskDrive,缩写:HDD)或固态硬盘(Solid-StateDrive,SSD)等;所述存储介质还可以包括上述种类的存储器的组合。本领域技术人员可以理解,实现上述实施例方法中的全部或部分流程,是可以通过计算机程序来指令相关的硬件来完成,所述程序可存储于一计算机可读取存储介质中,该程序在执行时,可包括如上述各方法的实施例的流程。其中,所述存储介质可为磁碟、光盘、只读存储记忆体(Read-OnlyMemory,ROM)、随机存储记忆体(RandomAccessMemory,RAM)、快闪存储器(FlashMemory)、硬盘(HardDiskDrive,缩写:HDD)或固态硬盘(Solid-StateDrive,SSD)等;所述存储介质还可以包括上述种类的存储器的组合。An embodiment of the present invention also provides a computer-readable storage medium, on which a computer program is stored, and when the instruction is executed by a processor, the steps of the method for controlling the micro-nanoforce source device in the above-mentioned embodiments are implemented. The storage medium also stores audio and video stream data, feature frame data, interaction request signaling, encrypted data, and preset data sizes. Wherein, the storage medium may be a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a flash memory (FlashMemory), a hard disk (HardDiskDrive, abbreviation: HDD) or A solid-state drive (Solid-State Drive, SSD), etc.; the storage medium may also include a combination of the above-mentioned types of memories. Those skilled in the art can understand that all or part of the processes in the methods of the above-mentioned embodiments can be completed by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium. During execution, it may include the processes of the embodiments of the above-mentioned methods. Wherein, the storage medium may be a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a flash memory (FlashMemory), a hard disk (HardDiskDrive, abbreviation: HDD) ) or a solid-state hard disk (Solid-State Drive, SSD), etc.; the storage medium may also include a combination of the above-mentioned types of memories.

以上,以上实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。Above, the above embodiments are only used to illustrate the technical solutions of the present invention, not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: it can still be applied to the foregoing embodiments The technical solutions described in the examples are modified, or some of the technical features are equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims (10)

1.一种微纳力源装置,其特征在于,包括内电极和外电极,所述外电极套设在所述内电极的外部且所述外电极和所述内电极有部分或全部长度相交,所述内电极的外轮廓函数为固定值,且所述外电极的内轮廓函数和所述内电极的外轮廓函数的差的倒数为一次函数。1. A micro-nano force source device, characterized in that it includes an internal electrode and an external electrode, the external electrode is sleeved outside the internal electrode and the external electrode and the internal electrode have a partial or full length intersecting , the outer contour function of the inner electrode is a fixed value, and the inverse of the difference between the inner contour function of the outer electrode and the outer contour function of the inner electrode is a linear function. 2.根据权利要求1所述的微纳力源装置,其特征在于,所述外电极的内轮廓函数为一次分式函数。2. The micro-nano force source device according to claim 1, wherein the inner contour function of the outer electrode is a first-order fractional function. 3.根据权利要求2所述的微纳力源装置,其特征在于,所述一次分式函数为
Figure FDA0003636287560000011
所述内电极的外轮廓函数为f(z)=A,其中A、B、C和D均为常数。
3. The micro-nano force source device according to claim 2, wherein the first-order fractional function is
Figure FDA0003636287560000011
The outer contour function of the inner electrode is f(z)=A, where A, B, C and D are all constants.
4.一种微纳力源装置的控制方法,其特征在于,适用于权利要求1至3中任一项所述的微纳力源装置,所述方法包括:通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值。4. A control method for a micro-nano force source device, characterized in that it is suitable for the micro-nano force source device described in any one of claims 1 to 3, the method comprising: controlling the external electrode and the The intersecting length of the internal electrodes adjusts the output force value of the micro-nano force source device. 5.根据权利要求4所述的控制方法,其特征在于,还包括:5. The control method according to claim 4, further comprising: 判断所述外电极和所述内电极间的加载电压是否低于设定电压,当加载电压低于设定电压时,通过控制加载电压大小调节输出力值,当加载电压不低于设定电压时,通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值。Judging whether the loading voltage between the outer electrode and the inner electrode is lower than the set voltage, when the loading voltage is lower than the set voltage, adjusting the output force value by controlling the loading voltage, when the loading voltage is not lower than the set voltage , the output force value of the micro-nano force source device is adjusted by controlling the intersecting length of the outer electrode and the inner electrode. 6.根据权利要求4所述的控制方法,其特征在于,6. The control method according to claim 4, characterized in that, 在通过控制所述外电极和所述内电极的相交长度调节微纳力源装置的输出力值前,还包括,建立输出力值的量程段和所述外电极和所述内电极间的加载电压的对应关系,根据输出力值的量程段选择加载电压。Before adjusting the output force value of the micro-nano force source device by controlling the intersecting length of the external electrode and the internal electrode, it also includes establishing the range of the output force value and the loading between the external electrode and the internal electrode According to the corresponding relationship of the voltage, the loading voltage is selected according to the range of the output force value. 7.一种微纳力测量设备,其特征在于,包括如权利要求1至3中任一项所述的微纳力源装置以及长度控制调节装置,所述长度控制调节装置用于控制所述外电极和所述内电极的相交长度。7. A micro-nano force measuring device, characterized in that, comprising the micro-nano force source device and a length control adjustment device as claimed in any one of claims 1 to 3, the length control adjustment device is used to control the The intersection length of the outer electrode and the inner electrode. 8.根据权利要求7所述的微纳力测量设备,其特征在于,还包括电压判断模块和电压调节模块,所述电压判断模块用于判断所述外电极和所述内电极间的加载电压是否低于设定电压,所述电压调节模块用于当加载电压低于设定电压时,通过控制加载电压大小调节输出力值。8. The micro-nano force measuring device according to claim 7, further comprising a voltage judging module and a voltage regulating module, the voltage judging module being used to judge the loading voltage between the outer electrode and the inner electrode Whether it is lower than the set voltage, the voltage regulation module is used to adjust the output force value by controlling the applied voltage when the loaded voltage is lower than the set voltage. 9.根据权利要求7所述的微纳力测量设备,其特征在于,还包括电压档位调节模块,所述电压档位调节模块用于建立输出力值的量程段和所述外电极和所述内电极间的加载电压的对应关系,并根据输出力值的量程段选择加载电压。9. The micro-nano force measuring device according to claim 7, further comprising a voltage gear adjustment module, the voltage gear adjustment module is used to establish the range section of the output force value and the external electrode and the Describe the corresponding relationship of loading voltage between the internal electrodes, and select the loading voltage according to the range segment of the output force value. 10.一种计算机可读存储介质,其特征在于,所述计算机可读存储介质存储有计算机指令,所述计算机指令用于使所述计算机执行如权利要求4-6任一项所述的控制方法。10. A computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to make the computer perform the control according to any one of claims 4-6. method.
CN202210511711.XA 2022-05-10 2022-05-10 Micro-nano force source device, control method, micro-nano force measuring device and storage medium Active CN114812874B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210511711.XA CN114812874B (en) 2022-05-10 2022-05-10 Micro-nano force source device, control method, micro-nano force measuring device and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210511711.XA CN114812874B (en) 2022-05-10 2022-05-10 Micro-nano force source device, control method, micro-nano force measuring device and storage medium

Publications (2)

Publication Number Publication Date
CN114812874A CN114812874A (en) 2022-07-29
CN114812874B true CN114812874B (en) 2022-11-29

Family

ID=82514237

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210511711.XA Active CN114812874B (en) 2022-05-10 2022-05-10 Micro-nano force source device, control method, micro-nano force measuring device and storage medium

Country Status (1)

Country Link
CN (1) CN114812874B (en)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CZ297145B6 (en) * 1997-10-24 2006-09-13 Medipool Treuhand- Und Beteiligungsgesellschaft Für Medizintechnik Gmbh System for automatic adjustment of mutual distance of electrodes for setting spark gap in electrohydraulic systems with impulse wave
DE102008040225A1 (en) * 2008-07-07 2010-01-14 Robert Bosch Gmbh Capacitive device and method for the electrostatic transport of dielectric and ferroelectric fluids
EP2520917A1 (en) * 2011-05-04 2012-11-07 Nxp B.V. MEMS Capacitive Pressure Sensor, Operating Method and Manufacturing Method
EP3002594B1 (en) * 2014-09-30 2019-06-05 3M Innovative Properties Company Voltage sensing device
CN106482886A (en) * 2016-12-19 2017-03-08 天津大学 Traced to the source apparatus and method based on micro- power of dead-weight balanced hinge
CN113418968B (en) * 2021-06-01 2023-02-21 大连海事大学 Cross capacitive sensor, manufacturing method of sensor and oil detection system
CN113532407A (en) * 2021-08-20 2021-10-22 山东理工大学 Micro-hemispherical gyroscope integrating in-plane electrode and out-of-plane electrode

Also Published As

Publication number Publication date
CN114812874A (en) 2022-07-29

Similar Documents

Publication Publication Date Title
CN104053111B (en) For the apparatus and method for the sensitivity for determining capacitance type sensing equipment
JP6676188B2 (en) Reference circuit for measurement system
TWI656425B (en) Semiconductor structures for enhanced transient response in low dropout (ldo) voltage regulators
JP3372635B2 (en) Control device
JP6020711B2 (en) Capacitive sensor and method for correcting nonlinear output
CN106403922A (en) Micro-electromechanical element with electric compensation and reading circuit thereof
CN204101217U (en) A kind of micro-nano force value standard set-up based on electrostatic force principle
Zeng et al. A capacitive sensor for the measurement of departure from the vertical movement
CN114812874B (en) Micro-nano force source device, control method, micro-nano force measuring device and storage medium
CN108008152A (en) Obtain the method and device of the parasitic mismatch capacitance of mems accelerometer
JP2004336992A (en) Controller, ei core electromagnetic system, current controller, method for regulating fluctuation in power output, method for adaptive gain adjustment, and method and system for power output regulation
JP2020085899A (en) Calibration of humidity sensor device
JP2023101612A (en) Charge capacity calculation device and method for energy storage system
JP2000024965A (en) Manufacture of micromechanic component element and micromechanic component element
US20050146377A1 (en) Temperature compensation for floating gate circuits
Vallance et al. Effects of spherical targets on capacitive displacement measurements
US20150054520A1 (en) Micropositioning Device With Multidegrees Of Freedom For Piezoelectric Actuators And Associated Method
CN109668660B (en) Horizontal micro-nano force value generating device and generating method
Hong et al. A method to electrically compensate close approach effect for calculable capacitor
Yin et al. Flow field analysis of lubricating air film in aerostatic restrictor with double U-shaped pressure-equalizing grooves
CN116765423B (en) Method for determining parameters of selective laser melting process
JP2007180222A (en) Method and device of measuring insulating film characteristic
CN113074675B (en) Method for rotating and positioning a plurality of objects to be measured
US11630020B2 (en) Pressure sensor with calibration device and calibration method thereof
CN116625410B (en) Hemispherical resonator gyro excitation electrode gain calibration method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant