CN114765103A - Plasma processing apparatus - Google Patents
Plasma processing apparatus Download PDFInfo
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- CN114765103A CN114765103A CN202110038794.0A CN202110038794A CN114765103A CN 114765103 A CN114765103 A CN 114765103A CN 202110038794 A CN202110038794 A CN 202110038794A CN 114765103 A CN114765103 A CN 114765103A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32899—Multiple chambers, e.g. cluster tools
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
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- H—ELECTRICITY
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- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
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Abstract
Description
技术领域technical field
本发明涉及一种用于制造例如燃料电池用分离器的等离子体处理装置。The present invention relates to a plasma processing apparatus for producing, for example, a separator for a fuel cell.
背景技术Background technique
作为这种等离子体处理装置,专利文献1公开了一种所谓的辊对辊方式的装置,在该装置中,将缠绕在送出辊上的基材送出,通过等离子体处理成膜,并利用卷取辊卷绕成膜后的基材。As such a plasma processing apparatus, Patent Document 1 discloses a so-called roll-to-roll apparatus in which a base material wound around a feed roll is fed out, a film is formed by plasma treatment, and a roll is used for The take-up roll winds the film-formed substrate.
这种辊对辊方式的等离子体处理装置,由于可以进行连续的成膜处理,所以具有处理速度快、制造效率高等优点。Such a roll-to-roll plasma processing apparatus has the advantages of high processing speed and high production efficiency because it can perform continuous film formation processing.
但是,当例如在形成凹凸的基材或厚基材等难以卷绕到辊上的基材上成膜时,难以应用上述的辊对辊方式的装置。However, it is difficult to apply the above-described roll-to-roll apparatus when forming a film on a base material that is difficult to wind on a roll, such as a base material with irregularities or a thick base material.
专利文献1:日本专利公开公报特开2019-117773号。Patent Document 1: Japanese Patent Laid-Open Publication No. 2019-117773.
发明内容SUMMARY OF THE INVENTION
本发明是为了解决上述问题而作出的,其主要目的是实现即使是难以卷绕到辊上的基材也能够连续地进行等离子体处理。The present invention has been made in order to solve the above-mentioned problems, and its main purpose is to realize continuous plasma treatment of even a substrate that is difficult to be wound around a roll.
即,本发明提供一种等离子体处理装置,其包括:多个等离子体处理室,对基材进行等离子体处理;托盘,将所述基材保持为立起状态;以及升降机构,将所述托盘连续地输送到所述多个等离子体处理室。That is, the present invention provides a plasma processing apparatus comprising: a plurality of plasma processing chambers for plasma processing a substrate; a tray for holding the substrate in an upright state; and an elevating mechanism for moving the substrate Trays are continuously delivered to the plurality of plasma processing chambers.
按照这样构成的等离子体处理装置,由于通过升降机构将保持基材的托盘连续地输送到多个等离子体处理室,因此,即使基材难以卷绕在辊上,也可以进行连续的成膜处理。According to the plasma processing apparatus thus constituted, since the tray holding the substrate is continuously conveyed to the plurality of plasma processing chambers by the elevating mechanism, continuous film formation can be performed even if the substrate is difficult to be wound around the roll. .
优选的是,所述多个等离子体处理室相互连通,各个所述等离子体处理室之间设有差动式排气室。Preferably, the plurality of plasma processing chambers are communicated with each other, and a differential exhaust chamber is provided between each of the plasma processing chambers.
按照这种构成,通过使多个等离子体处理室连通,可以实现托盘的连续输送,同时每个等离子体处理室可以保持在所希望的真空度。According to this configuration, by connecting a plurality of plasma processing chambers, continuous conveyance of the trays can be realized, and at the same time, each plasma processing chamber can be maintained at a desired degree of vacuum.
为了使升降机构简单化,优选的是,所述升降机构具有:绳索,横跨所述多个等离子体处理室架设,所述托盘挂在该绳索上;以及驱动源,使所述绳索在所述多个等离子体处理室之间移动。In order to simplify the elevating mechanism, it is preferable that the elevating mechanism includes: a rope spanning the plurality of plasma processing chambers, on which the tray is hung; move between the plurality of plasma processing chambers.
优选的是,等离子体处理装置还包括输送机构,所述输送机构上设置有多个所述托盘,将多个所述托盘依次输送到所述绳索上。Preferably, the plasma processing apparatus further includes a conveying mechanism, a plurality of the trays are arranged on the conveying mechanism, and the multiple trays are sequentially conveyed to the rope.
按照这样的构成,可以自动地依次送出多个托盘,并且可以将保持在多个托盘中的多张基材一举连续成膜,从而进一步提高了效率。According to such a configuration, the plurality of trays can be automatically fed out in sequence, and the plurality of substrates held in the plurality of trays can be continuously formed into a film in one fell swoop, thereby further improving the efficiency.
作为用于实现这种托盘自动送出的方式,可以例举:所述输送机构具有将所述托盘送至所述绳索的环形带,通过所述托盘从所述环形带的边缘部落下,设置在所述托盘上的挂钩部挂在所述绳索上,所述托盘被悬挂在所述绳索上。As a method for realizing the automatic delivery of the trays, for example, the conveying mechanism has an endless belt that sends the trays to the ropes, and the trays are dropped from the edge of the endless belts, and are arranged on the edge of the endless belt. The hook portion on the tray hangs on the rope, and the tray is suspended from the rope.
优选的是,所述等离子体处理室包括:等离子体清洗室,对所述基材进行等离子体清洗;离子注入室,将碳离子注入所述基材;第一成膜室,在所述基材的一个面上形成DLC覆膜;第二成膜室,在所述基材的另一个面上形成DLC覆膜;以及亲水处理室,利用氧等离子体对所述基材进行亲水处理,所述升降机构将所述托盘依次输送到所述等离子体清洗室、所述离子注入室、所述第一成膜室、所述第二成膜室和所述亲水处理室。Preferably, the plasma processing chamber includes: a plasma cleaning chamber, for performing plasma cleaning on the substrate; an ion implantation chamber, for implanting carbon ions into the substrate; and a first film-forming chamber, on the substrate A DLC film is formed on one side of the substrate; a second film-forming chamber is used to form a DLC film on the other side of the substrate; and a hydrophilic treatment chamber is used to perform a hydrophilic treatment on the substrate with oxygen plasma and the lifting mechanism transports the tray to the plasma cleaning chamber, the ion implantation chamber, the first film forming chamber, the second film forming chamber and the hydrophilic treatment chamber in sequence.
按照这种构成,由于将保持有立起状态的基材的托盘输送到等离子体清洗室、离子注入室、第一成膜室、第二成膜室、亲水处理室,因此,在各室中可以对基材的双面进行等离子体处理,因而可以高效地在基材上形成DLC薄膜。According to this configuration, since the tray holding the substrate in the erected state is transported to the plasma cleaning chamber, ion implantation chamber, first film formation chamber, second film formation chamber, and hydrophilic treatment chamber, each chamber Plasma treatment can be performed on both sides of the substrate, so that the DLC thin film can be efficiently formed on the substrate.
作为用于对基材双面进行等离子体处理的更具体的实施方式,可以例举:所述等离子体清洗室、所述离子注入室和所述亲水处理室分别在夹着所述基材的位置上设有使室内产生等离子体的至少一对天线。As a more specific embodiment for performing plasma treatment on both sides of a substrate, the plasma cleaning chamber, the ion implantation chamber, and the hydrophilic treatment chamber are sandwiched between the substrates, respectively. At least one pair of antennas is arranged at the position of the chamber to generate plasma.
发明的效果effect of invention
按照这样构成的本发明,即使是难以卷绕在辊上的基材,也可以连续进行等离子体处理。According to this invention comprised in this way, even if it is a base material which is difficult to wind up on a roll, plasma processing can be performed continuously.
附图说明Description of drawings
图1是表示本实施方式中等离子体处理装置的构成的示意图。FIG. 1 is a schematic diagram showing the configuration of a plasma processing apparatus in this embodiment.
图2是表示本实施方式中等离子体处理装置的构成的示意图。FIG. 2 is a schematic diagram showing the configuration of the plasma processing apparatus in this embodiment.
图3是表示本实施方式中托盘的构成的示意图。FIG. 3 is a schematic diagram showing the structure of the tray in the present embodiment.
图4是表示本实施方式中输送机构的构成的示意图。FIG. 4 is a schematic diagram showing the configuration of the conveying mechanism in the present embodiment.
图5是表示其他实施方式中等离子体处理装置的构成的示意图。FIG. 5 is a schematic diagram showing the configuration of a plasma processing apparatus in another embodiment.
图6是表示其他实施方式中等离子体处理装置的构成的示意图。FIG. 6 is a schematic diagram showing the configuration of a plasma processing apparatus in another embodiment.
附图标记说明Description of reference numerals
100…等离子体处理装置100…Plasma treatment equipment
X…基材X…Substrate
Y…托盘Y...tray
Ya…挂钩部Ya…Hook Department
S1…托盘送出室S1...Pallet delivery room
S2…等离子清洗室S2…plasma cleaning chamber
S3…离子注入室S3...Ion implantation chamber
S4…第一成膜室S4...First film forming chamber
S5…第二成膜室S5...Second film forming chamber
S6…亲水处理室S6…Hydrophilic treatment chamber
S7…托盘收纳室S7…Pallet storage room
S8…差动式排气室S8…differential exhaust chamber
10…升降机构10…Lifting mechanism
P…吸引机构P…attracting agencies
2…天线2…Antenna
3…加热器3…Heater
11…绳索11…Ropes
12…输送机构12…Conveyor mechanism
121…环形带121…Endless Belt
13…辊13…Rolls
具体实施方式Detailed ways
下面将参照附图对本发明的等离子体处理装置的一个实施方式进行说明。An embodiment of the plasma processing apparatus of the present invention will be described below with reference to the accompanying drawings.
本实施方式的等离子体处理装置是一种能够在多张基材上连续成膜的连续成膜装置,以下以在基材上形成具有耐酸碱腐蚀的气体阻隔膜为例进行说明,该气体阻隔膜用于制造燃料电池用分离器等。另外,基材例如是铝基板等,气体阻隔膜例如是具有导电性且抑制引起腐蚀的硫酸水渗透的DLC覆膜。但是,基材和要在该基材上成膜的覆膜并不限于以下的实施方式,可以根据情况进行改变。The plasma processing apparatus of the present embodiment is a continuous film formation apparatus capable of continuously forming films on a plurality of substrates. The following description will be given by taking the formation of a gas barrier film having acid and alkali corrosion resistance on a substrate as an example. Used in the manufacture of separators for fuel cells, etc. In addition, the base material is, for example, an aluminum substrate or the like, and the gas barrier film is, for example, a DLC film that has conductivity and suppresses the permeation of sulfuric acid water that causes corrosion. However, the base material and the film to be formed on the base material are not limited to the following embodiments, and may be changed according to circumstances.
如图1和图2所示,等离子体处理装置100将基材以立起状态保持在托盘Y上,同时将基材X与该托盘Y一起输送到多个等离子体处理室S2至S6。另外,这里所说的立起状态优选是沿铅垂方向的状态,但不一定局限于这种状态,也可以是从铅垂方向倾斜的状态。此外,如图3所示,托盘Y呈框架状,多张基材X被纵横悬挂保持在该框架中。As shown in FIGS. 1 and 2 , the
具体地,如图1和图2所示,等离子体处理装置100具备托盘送出室S1、等离子体清洗室S2、离子注入室S3、第一成膜室S4、第二成膜室S5、亲水处理室S6、托盘收纳室S7、以及用于将基材X与托盘Y一起输送到各室的升降机构10。Specifically, as shown in FIGS. 1 and 2 , the
托盘送出室S1容纳多个托盘Y,是将这些托盘Y依次送出至后述的各处理室的室。该托盘送出室S1由例如真空泵等吸引机构P抽空,并保持在规定的真空度。The tray delivery chamber S1 accommodates a plurality of trays Y, and is a chamber for sequentially delivering these trays Y to each processing chamber described later. This tray delivery chamber S1 is evacuated by suction means P such as a vacuum pump, and is kept at a predetermined degree of vacuum.
与从托盘送出室S1送出的托盘Y一起,保持在该托盘Y上的基材X被送入等离子体清洗室S2,等离子体清洗室S2是对该基材X进行等离子体清洗的处理室。具体地,在等离子体清洗室S2中,在夹着基材X的位置上至少设置有一对天线2,在本实施方式中,这些成对的感应耦合天线2为两组,沿输送方向并排设置。并且,通过整合器(未图示)将来自高频电源(未图示)的高频功率施加到这些天线2上,并向室内供给作为清洁气体的氩气,由此在基材X的表面和背面附近产生包括氩离子在内的感应耦合型的放电等离子体。基材X的一个面(以下简称表面)和另一个面(以下简称背面)被该氩等离子体清洗。Along with the tray Y sent out from the tray sending chamber S1, the substrate X held on the tray Y is sent into the plasma cleaning chamber S2, which is a processing chamber for performing plasma cleaning on the substrate X. Specifically, in the plasma cleaning chamber S2, at least a pair of
与从等离子体清洗室S2送出的托盘Y一起,保持在该托盘Y上的基材X被送入离子注入室S3,离子注入室S3是将碳离子注入该基材X的处理室。这种离子注入是在基材X上形成核(可以说,就像头发的发根一样),以提高后述的DLC覆膜的粘合性。具体地,在离子注入室S3中,在夹着基材X的位置上设置有至少一对天线2,在本实施方式中,这些成对的感应耦合天线2为两组,沿输送方向并排设置。将来自高频电源(未图示)的高频功率通过整合器(未图示)施加到这些天线2上,并向室内供给作为原料气体的甲烷等碳化合物气体,由此,在基材X的表面和背面附近产生包含碳离子的感应耦合型的放电等离子体。然后,在基材X上施加来自偏置电源(未图示)的负的直流电压或负的脉冲电压,将碳离子注入基材X的表面和背面,形成有助于提高DLC覆膜的粘合性的核。Along with the tray Y sent out from the plasma cleaning chamber S2, the substrate X held on the tray Y is sent into the ion implantation chamber S3, which is a processing chamber for implanting carbon ions into the substrate X. This ion implantation forms nuclei (like the roots of hair, so to speak) on the substrate X to improve the adhesiveness of the DLC coating described later. Specifically, in the ion implantation chamber S3, at least one pair of
与从离子注入室S3送出的托盘Y一起,保持在该托盘Y上的基材X被送入第一成膜室S4,第一成膜室S4是在该基材X的一个面(表面)上生成DLC覆膜的处理室。具体地,在第一成膜室S4中,在基材X的表面侧设置有一个或多个天线2,本实施方式中,沿输送方向并排设置有五个感应耦合型天线2。另一方面,在基材X的背面设有加热器3。Together with the tray Y sent out from the ion implantation chamber S3, the substrate X held on the tray Y is sent into the first film-forming chamber S4, which is located on one surface (surface) of the substrate X. The processing chamber where the DLC coating is formed. Specifically, in the first film forming chamber S4, one or
并且,通过整合器(未图示)将来自高频电源(未图示)的高频功率施加到上述天线2,并向室内供给氮气、甲烷、乙炔的混合气体作为原料气体,由此,在基材X的表面附近产生包括碳离子在内的感应耦合型的放电等离子体。此时,为了使DLC覆膜导电,通过上述的加热器3将基材X基体表面加热到例如150~400℃。然后,在基材X上施加来自偏置电源(未图示)的负的直流电压或负的脉冲电压,并且通过利用加热器3或等离子体中的离子能进一步加热基材X,在基材X的表面形成导电的DLC覆膜。Then, by applying high-frequency power from a high-frequency power source (not shown) to the
与从第一成膜室S4送出的托盘Y一起,保持在该托盘Y上的基材X被送入第二成膜室S5,第二成膜室S5是在该基材X的另一面(背面)生成DLC覆膜的处理室。具体地,在第二成膜室S5中,基材X的背面设有一个或多个天线2,本实施方式中,沿输送方向并排设有五个感应耦合型天线2。另一方面,在基材X的表面侧设有加热器3。Along with the tray Y sent out from the first film-forming chamber S4, the substrate X held on the tray Y is sent into the second film-forming chamber S5, which is located on the other side of the substrate X ( Backside) a processing chamber where the DLC film is formed. Specifically, in the second film forming chamber S5, one or
并且,通过整合器(未图示)将来自高频电源(未图示)的高频功率施加到上述的天线2上,并向室内供给例如氮气、甲烷、乙炔的混合气体作为原料气体,由此,在基材X的背面附近产生包含碳离子在内的感应耦合型的放电等离子体。此时,为了使DLC覆膜导电,通过上述的加热器3将基材X基体表面加热到例如150~400℃。然后,在基材X上施加来自偏置电源(未图示)的负的直流电压或负的脉冲电压,并且通过加热器3或等离子体中的离子能进一步加热基材X,在基材X的背面形成导电的DLC覆膜。In addition, a high-frequency power from a high-frequency power supply (not shown) is applied to the above-mentioned
与从第二成膜室S5送出的托盘Y一起,保持在该托盘Y上的基材X被送入亲水处理室S6,亲水处理室S6是对基材X进行亲水处理、赋予基材X亲水性的处理室。具体地,在亲水处理室S6中,在夹着基材X的位置设置有至少一对天线2,本实施方式中,这些成对的感应耦合型天线2设置有一组。并且,通过整合器(未图示)将来自高频电源(未图示)的高频功率施加到这些天线2上,并通过向室内供给氧气气体,在基材X的表面和背面附近产生包含氧离子的感应耦合型的放电等离子体。通过这种氧等离子体,对基材X的一个表面和背面进行亲水处理。Together with the tray Y sent out from the second film-forming chamber S5, the substrate X held on the tray Y is sent into the hydrophilic treatment chamber S6, which performs hydrophilic treatment on the substrate X and imparts a base material. Material X hydrophilic processing chamber. Specifically, in the hydrophilic treatment chamber S6, at least one pair of
与从亲水处理室S6送出的托盘Y一起,保持在该托盘Y上的基材X被送入托盘收纳室S7,托盘收纳室S7是收纳存放它们的室。该托盘收纳室S7通过例如泵等吸引机构P抽空,保持规定的真空度。Along with the tray Y sent out from the hydrophilic treatment chamber S6, the substrates X held on the tray Y are sent into the tray storage chamber S7, which is a chamber for storing them. This tray storage chamber S7 is evacuated by suction means P such as a pump, and a predetermined degree of vacuum is maintained.
这些托盘送出室S1、等离子体清洗室S2、离子注入室S3、第一成膜室S4、第二成膜室S5、亲水处理室S6、托盘收纳室S7之间相互连通,在等离子体清洗室S2与离子注入室S3之间、离子注入室S3与第一成膜室S4之间、以及第二成膜室S5与亲水处理室S6之间,存在着差动式排气室S8,该差动式排气室S8利用例如共同的泵等吸引机构P1排气。并且,所有这些室都通过托盘Y可以通过的缝隙(未示出)连通,由此,等离子体清洗室S2、离子注入室S3、第一成膜室S4、第二成膜室S5和亲水处理室S6被差动式排气。因此,等离子体处理室S2至S6都可以保持在规定的真空度,而不需要在各室之间设置闸阀等。The tray delivery chamber S1, the plasma cleaning chamber S2, the ion implantation chamber S3, the first film formation chamber S4, the second film formation chamber S5, the hydrophilic treatment chamber S6, and the tray storage chamber S7 communicate with each other, and the plasma cleaning A differential exhaust chamber S8 exists between the chamber S2 and the ion implantation chamber S3, between the ion implantation chamber S3 and the first film formation chamber S4, and between the second film formation chamber S5 and the hydrophilic treatment chamber S6. This differential exhaust chamber S8 is exhausted by suction means P1 such as a common pump, for example. And, all these chambers are communicated through a slit (not shown) through which the tray Y can pass, whereby the plasma cleaning chamber S2, the ion implantation chamber S3, the first film formation chamber S4, the second film formation chamber S5 and the hydrophilic The processing chamber S6 is differentially exhausted. Therefore, all of the plasma processing chambers S2 to S6 can be maintained at a predetermined degree of vacuum without providing a gate valve or the like between the chambers.
升降机构10将托盘Y连续地输送到多个等离子体处理室S2至S6中。升降机构10在此将托盘Y依次输送到等离子体清洗室S2、离子注入室S3、第一成膜室S4、第二成膜室S5和亲水处理室S6,更详细地,是从托盘送出室S1输送到托盘收纳室S7。The
具体而言,如图4所示,升降机构10具有横跨多个等离子体处理室S1至S6架设的绳索11、以及在多个等离子体处理室S2至S6之间使绳索11移动的马达(未示出)等驱动源。Specifically, as shown in FIG. 4 , the elevating
在此,如图2和图4所示,本实施方式的托盘Y的用于钩住绳索11的挂钩部Ya设置在例如上端部,能够悬挂在绳索11上。Here, as shown in FIG.2 and FIG.4, the hook part Ya for hooking the
绳索11是托盘Y的挂钩部Ya钩住的绳索,由例如金属、玻璃纤维、碳纤维等制成,这里是不锈钢绳。The
在本实施方式中,绳索11横跨从托盘送出室S1到托盘收纳室S7的各室架设,当在各室的上方从托盘送出室S1移动到的托盘收纳室S7后,再在各室的下方从托盘收纳室S7移动到托盘送出室S1,围绕这些室转动。In the present embodiment, the
进一步地,如图4所示,本实施方式的等离子体处理装置100具有输送机构12,该输送机构12上并排设有多个托盘Y,并将这些托盘Y依次输送到绳索11。Further, as shown in FIG. 4 , the
该输送机构12上放置有多个托盘Y,同时也将这些托盘Y依次输送到绳索11,具体来说,例如具有一对辊13和缠绕在这些滚轮13上的环形带121。A plurality of trays Y are placed on the conveying
输送机构12与上述绳索11之间的相对位置关系设定为,通过托盘Y从环形带121的边缘落下,托盘Y的挂钩部Ya挂在绳索11上,从而托盘Y悬挂在绳索11上。The relative positional relationship between the conveying
若更具体地说明,则当放置在环形带121上并朝向绳索11的托盘Y过了环形带121所卷绕的前方的辊13的顶点时,它开始沿着辊13的表面逐渐下降,成为向前倾斜的倾斜状态。并且,将绳索11和环形带121配置成使托盘Y的挂钩部Ya在托盘Y落下之前挂在绳索11上。To be more specific, when the tray Y placed on the
此外,本实施方式的等离子体处理装置100还设有在成膜处理后依次从绳索上接收托盘Y的运出机构(未示出)。In addition, the
该运出机构具有与图4所示的输送机构12相同的构成,并通过与上述的输送机构12相反的动作,接收托盘Y。This carry-out mechanism has the same structure as that of the
也就是说,这种运出机构具有例如一对辊和缠绕在这些辊上的环形带。并且,通过将绳索11送来的托盘Y置于环形带上而被提起,使托盘Y的挂钩部Ya与绳索11脱离,从而回收该托盘Y。That is, such a carry-out mechanism has, for example, a pair of rollers and an endless belt wound around these rollers. Then, the tray Y sent by the
通过这样的构成,将放置在输送机构12上的多个托盘Y向绳索11送出,并自动地依次移到绳索11上,此后,通过电动机(未图示)等驱动源使绳索11移动,依次自动输送到上述各等离子体处理室S2~S6。With such a configuration, the plurality of trays Y placed on the conveying
并且,在该绳索11上施加来自上述偏置电源(未图示)的负的直流电压或负的脉冲电压(偏置电压),该偏置电压通过绳索11和悬挂在绳索11上的托盘Y施加到基材X上。Then, a negative DC voltage or a negative pulse voltage (bias voltage) from the above-described bias power supply (not shown) is applied to the
按照这样构成的本实施方式的等离子体处理装置100,由于可以通过升降机构10将保持基材X的托盘Y连续地输送到多个等离子体加工室S2~S6,所以即使基材X难以卷起,也可以进行连续的成膜处理。当然,不言而喻,等离子体处理装置100可以应用于不难卷起的基材X。According to the
此外,由于多个等离子体处理室S2~S6相互连通,且各处理室被差动式排气,因此,通过使多个等离子体处理室S2~S6连通,使托盘Y能够连续地输送,同时,可以使各等离子体处理室S2~S6能够保持在所希望的真空度。In addition, since the plurality of plasma processing chambers S2 to S6 are communicated with each other, and each processing chamber is differentially exhausted, by connecting the plurality of plasma processing chambers S2 to S6, the tray Y can be continuously conveyed, and at the same time , the plasma processing chambers S2 to S6 can be maintained at a desired degree of vacuum.
另外,由于升降机构10是利用横跨在多个等离子体处理室S2~S6上架设的绳索11构成,并且托盘Y可以挂在绳索11上,因此可以将升降机构10做成简单的构成。In addition, since the
而且,由于输送机构12将多个托盘Y依次送出到绳索11,因此,可以使多个托盘Y的送出实现自动化,从而保持在多个托盘Y中的多张基材X可以一举连续成膜,进一步提高效率。In addition, since the conveying
并且,由于输送机构12具有将托盘Y送至绳索11的环形带121,利用托盘Y从环形带121的边缘落下,托盘Y上设置的挂钩部Ya挂在绳索11上,从而托盘Y悬挂在绳索11上,所以,通过简单的构成,就可以实现托盘Y的自动送出。In addition, since the conveying
另外,将保持有立起状态的基材X的托盘Y输送到等离子体清洗室S2、离子注入室S3、第一成膜室S4、第二成膜室S5、亲水处理室S6,由于在等离子体清洗室S2、离子注入室S3、亲水处理室S6以将基材X夹在中间的方式设有一对天线2,因此,在每个室中可以对基材X的两面进行等离子体处理,与以前相比,可以更有效地生成DLC覆膜。In addition, the tray Y holding the substrate X in the upright state is transported to the plasma cleaning chamber S2, the ion implantation chamber S3, the first film formation chamber S4, the second film formation chamber S5, and the hydrophilic treatment chamber S6, because the The plasma cleaning chamber S2, the ion implantation chamber S3, and the hydrophilic treatment chamber S6 are provided with a pair of
本发明不限于上述实施方式。The present invention is not limited to the above-described embodiments.
例如,在上述实施方式中,说明的是绳索11为不锈钢绳索,但在该绳索11由金属或碳纤维之类的导电材料制成的情况下,由于通过该绳索11对基材X施加偏置电压,因而可以对分别保持在各托盘Y中的多个基材X同时施加相同大小的偏置电压。For example, in the above-mentioned embodiment, the
相反,绳索11也可以由非导电材料如玻璃绳等制成。在这种情况下,如图5所示,例如,可以在各等离子体处理室S2~S6中预先设置受电弓等导电构件D,并通过导电构件D向基材X施加偏置电压。另外,为了使偏置电压能够在适当的时机施加到基材X上,如图5所示,挂钩部Ya可以沿输送方向为长条状。Conversely, the
按照这样的构成,可以在各等离子体处理室S2至S6中对基片X施加不同大小的偏置电压。由于可以对基材X施加适合各等离子体处理室S2~S6中的处理过程的大小合适的偏置电压,从而可以提高成膜过程的自由度,进而可以形成质量更高的膜。With this configuration, it is possible to apply bias voltages of different magnitudes to the substrate X in each of the plasma processing chambers S2 to S6. Since a bias voltage suitable for the treatment process in each of the plasma treatment chambers S2 to S6 can be applied to the substrate X, the degree of freedom in the film formation process can be improved, and a higher quality film can be formed.
此外,在上述实施方式中,绳索11以通过等离子体处理室S2至S6的上方和下方的方式设置,但绳索11的配置并不限于此,例如,如图6所示,绳索11也可以配置成在等离子体处理室S2至S6的上方在各个等离子体处理室S2至S6之间来回移动。In addition, in the above-described embodiment, the
此外,基材X不限于铝,也可以在如镍(Ni)、铁(Fe)、镁(Mg)、钛(Ti)或含有这些金属的不锈钢等合金之中,具有至少一种金属。In addition, the base material X is not limited to aluminum, and may have at least one metal among alloys such as nickel (Ni), iron (Fe), magnesium (Mg), titanium (Ti), or stainless steel containing these metals.
此外,不仅可以使用上述实施方式中所描述的那些方法来形成气体阻隔膜,还可以使用例如等离子体CVD法、真空蒸镀法、溅射法、离子镀法等。Further, the gas barrier film may be formed using not only those methods described in the above-described embodiments, but also, for example, a plasma CVD method, a vacuum evaporation method, a sputtering method, an ion plating method, and the like.
毋庸置疑,本发明并不限于上述实施方式,在不偏离其发明目的的范围内,还可以有其他各种变化。Needless to say, the present invention is not limited to the above-described embodiments, and various other modifications are possible within a range that does not deviate from the purpose of the invention.
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EP4471823A1 (en) * | 2023-06-02 | 2024-12-04 | Plasma Ion Assist Co., Ltd. | Plasma treatment apparatus |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4261808A (en) * | 1978-10-12 | 1981-04-14 | Leybold-Heraeus Gmbh | Vacuum coating apparatus with continuous or intermittent transport means |
US4894133A (en) * | 1985-11-12 | 1990-01-16 | Virgle L. Hedgcoth | Method and apparatus making magnetic recording disk |
US5215420A (en) * | 1991-09-20 | 1993-06-01 | Intevac, Inc. | Substrate handling and processing system |
JP2005285576A (en) * | 2004-03-30 | 2005-10-13 | Mitsubishi-Hitachi Metals Machinery Inc | Manufacturing device of in-line type organic electroluminescent element |
JP2006032553A (en) * | 2004-07-14 | 2006-02-02 | Mitsubishi Heavy Ind Ltd | Plasma treatment device plasma treatment method |
JP2012084574A (en) * | 2010-10-07 | 2012-04-26 | Samco Inc | Plasma treatment apparatus |
US20180053639A1 (en) * | 2015-03-31 | 2018-02-22 | Coating Plasma Industrie | Apparatus for treating objects with plasma, use of this apparatus and method of using this apparatus |
JP2019117773A (en) * | 2017-12-27 | 2019-07-18 | 株式会社プラズマイオンアシスト | Fuel cell separator manufacturing method and film forming apparatus |
CN110158058A (en) * | 2018-02-16 | 2019-08-23 | 等离子体成膜有限公司 | Plasma processing apparatus |
JP2019143233A (en) * | 2018-02-16 | 2019-08-29 | 株式会社プラズマイオンアシスト | Plasma treatment apparatus |
JP2019165260A (en) * | 2019-06-28 | 2019-09-26 | 村田 正義 | Device for forming semiconductor film on both sides of substrate |
-
2021
- 2021-01-12 CN CN202110038794.0A patent/CN114765103A/en active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4261808A (en) * | 1978-10-12 | 1981-04-14 | Leybold-Heraeus Gmbh | Vacuum coating apparatus with continuous or intermittent transport means |
US4894133A (en) * | 1985-11-12 | 1990-01-16 | Virgle L. Hedgcoth | Method and apparatus making magnetic recording disk |
US5215420A (en) * | 1991-09-20 | 1993-06-01 | Intevac, Inc. | Substrate handling and processing system |
JP2005285576A (en) * | 2004-03-30 | 2005-10-13 | Mitsubishi-Hitachi Metals Machinery Inc | Manufacturing device of in-line type organic electroluminescent element |
JP2006032553A (en) * | 2004-07-14 | 2006-02-02 | Mitsubishi Heavy Ind Ltd | Plasma treatment device plasma treatment method |
JP2012084574A (en) * | 2010-10-07 | 2012-04-26 | Samco Inc | Plasma treatment apparatus |
US20180053639A1 (en) * | 2015-03-31 | 2018-02-22 | Coating Plasma Industrie | Apparatus for treating objects with plasma, use of this apparatus and method of using this apparatus |
JP2019117773A (en) * | 2017-12-27 | 2019-07-18 | 株式会社プラズマイオンアシスト | Fuel cell separator manufacturing method and film forming apparatus |
CN110158058A (en) * | 2018-02-16 | 2019-08-23 | 等离子体成膜有限公司 | Plasma processing apparatus |
JP2019143233A (en) * | 2018-02-16 | 2019-08-29 | 株式会社プラズマイオンアシスト | Plasma treatment apparatus |
JP2019165260A (en) * | 2019-06-28 | 2019-09-26 | 村田 正義 | Device for forming semiconductor film on both sides of substrate |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4471823A1 (en) * | 2023-06-02 | 2024-12-04 | Plasma Ion Assist Co., Ltd. | Plasma treatment apparatus |
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