CN114740919B - Surface mount type screen temperature control method and system - Google Patents
Surface mount type screen temperature control method and system Download PDFInfo
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- 238000013021 overheating Methods 0.000 claims abstract description 23
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Abstract
The invention relates to the technical field of temperature regulation and control, in particular to a surface mount type screen temperature control method and system. The method comprises the following steps: obtaining the extreme working state standard of the patch type screen based on the overheating mitigation evaluation and the extreme light-emitting allowance of the patch type screen in the extreme working state; training a TCN network to predict that the ultimate working state standard of the patch type screen in the current preset time period is compared with the real working state standard of the screen in the current preset time period, obtaining whether the working state of the screen in the current preset time period is normal or not, and judging whether the working temperature of the screen in the current preset time period is normal or not; and if the working temperature of the screen is abnormal within the current preset time period, carrying out temperature regulation on the patch type screen. The invention judges whether the temperature is normal when the screen works according to the changes of the internal and external temperatures and the power of the screen, has higher accuracy, avoids the damage of internal components caused by over-temperature when the patch type screen works, and reduces the probability of the damage of the large patch type screen.
Description
Technical Field
The invention relates to the technical field of temperature regulation and control, in particular to a surface mount type screen temperature control method and system.
Background
The spliced paster-type screen system is widely applied to the fields of monitoring and command centers, industrial production scheduling, advertisements, public propaganda, exhibition and display and the like due to the characteristics of large display breadth, high resolution, fine and smooth pictures and the like. With the rapid development of liquid crystal splicing in recent years, a tiled display system has become the mainstream of terminal display. The display system has the characteristics of large equipment quantity, various types, large number of manufacturers, complex connection, no standard protocol and the like.
However, the patch type screen generates great heat in work, if the heat is not processed in time, the efficiency of working elements can be affected, and the patch type screen can be damaged in severe cases.
Disclosure of Invention
In order to solve the above technical problems, an object of the present invention is to provide a method and a system for controlling a temperature of a surface mount device, wherein the adopted technical scheme is as follows:
in a first aspect, an embodiment of the present invention provides a method for controlling a temperature of a surface mount device: the method comprises the following steps: obtaining the internal temperature change rate of the tiled screen in unit time under the limit working state, and forming a sequence of the internal temperature change rate of the tiled screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a positive correlation relationship;
obtaining a stability evaluation index of the power of the patch type screen in the limit working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; the product of the overheat relief evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period;
obtaining the limit working state standard of the patch type screen in a plurality of preset time periods as a historical limit working state standard; predicting the predicted limit working state standard of the tiled screen in the current preset time period by using the historical limit working state, and simultaneously obtaining the real working state standard of the tiled screen in the current preset time period; and if the real working state standard of the patch type screen in the current time period is greater than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen.
Preferably, the obtaining of the internal temperature change rate of the tiled screen within the preset unit time in the extreme working state includes: acquiring the internal temperature of the patch type screen in unit time, and acquiring the temperature change rate in unit time by using the difference value of the maximum value and the minimum value of the internal temperature of the patch type screen in unit time; and the internal temperature change rate of the patch type screen in unit time forms a sequence of the internal temperature change rate of the patch type screen in a preset time period.
Preferably, the obtaining of the external temperature stability evaluation of the tiled screen within the preset unit time in the extreme working state includes: collecting the external temperature of the surface mount type screen in unit time to form a sequence; and obtaining the stability performance price of the external temperature of the patch type screen in unit time by using the difference value of the adjacent temperatures in the sequence to form an evaluation sequence of the external temperature stability of the patch type screen in a preset time period.
Preferably, the obtaining of the stability evaluation index of the power of the tiled screen in the limit working state within the preset time period and the reliability of the stability evaluation index includes: collecting the power of a surface mount type screen once per unit time, wherein the power corresponding to each unit time forms a power sequence in a preset time period; according to the variance of the power sequence in the preset time period, obtaining a stability evaluation index of the power of the patch type screen in the limit working state in the preset time period; and meanwhile, the reliability of the stability evaluation index of the power of the patch type screen in the preset time period in the limit working state is obtained according to the similarity of the power sequences in the adjacent preset time periods.
Preferably, the limit light-emitting margin of the tiled screen within the preset time period is as follows:
wherein, U represents the limit light-emitting allowance of the patch type screen in the preset time period; l represents the stability evaluation index of the power of the paster type screen in the limit working state within the preset time period; q represents the degree of reliability of the stability evaluation index for the preset time period.
Preferably, the predicting the predicted limit operating state standard of the tile screen in the current preset time period by using the historical limit operating state, and the obtaining the real operating state standard of the tile screen in the current preset time period at the same time includes: obtaining an extreme working state standard under the extreme working state of the patch type screen in a plurality of preset time periods as a training set to train the TCN network; after the network training is finished, inputting a historical working limit state standard, and outputting and predicting a working limit working state standard of the patch type screen in a current preset time period; and meanwhile, the working limit working state standard of the patch type screen in the current preset time period is obtained.
Preferably, the predicting the predicted extreme operating state standard of the tile screen within the current preset time period by using the historical extreme operating state further comprises: calculating the sum of the distances between each sample and other samples in the training set, and obtaining the confidence of each sample by using the sum of the distances; normalizing the confidence degrees of all samples to enable the sum to be a first preset value; the normalized confidence coefficient is the weight lost by each sample.
In a second aspect, another embodiment of the present invention provides a system for controlling a temperature of a surface mount device. The system comprises: the overheating mitigation evaluation acquisition module is used for presetting and acquiring the internal temperature change rate of the patch type screen in unit time under the limit working state to form a sequence of the internal temperature change rate of the patch type screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a positive correlation relationship;
the extreme working state standard acquisition module is used for acquiring a stability evaluation index of the power of the paster type screen in the extreme working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; the product of the overheat relief evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period;
the patch type screen temperature adjusting module is used for acquiring the extreme working state standard of the patch type screen in a plurality of preset time periods as the historical extreme working state standard; predicting the predicted limit working state standard of the tile type screen in the current preset time period by using the historical limit working state, and simultaneously obtaining the real working state standard of the tile type screen in the current preset time period; and if the real working state standard of the patch type screen in the current time period is greater than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen.
Preferably, the overheating mitigation evaluation acquisition module is further configured to acquire an internal temperature of the patch type screen in unit time, and obtain a temperature change rate in unit time by using a difference between a maximum value and a minimum value of the internal temperature of the patch type screen in unit time; and the internal temperature change rate of the patch type screen in unit time forms a sequence of the internal temperature change rate of the patch type screen in a preset time period.
Preferably, the extreme working state standard obtaining module is further configured to collect patch-type screen power once per unit time, and the power corresponding to each unit time forms a power sequence in a preset time period; according to the variance of the power sequence in the preset time period, obtaining a stability evaluation index of the power of the patch type screen in the limit working state in the preset time period; and meanwhile, the reliability of the stability evaluation index of the power of the patch type screen in the preset time period in the limit working state is obtained according to the similarity of the power sequences in the adjacent preset time periods.
The embodiment of the invention at least has the following beneficial effects: the method and the device for judging the extreme working state of the surface mount type screen obtain the extreme working state standard of the surface mount type screen based on the overheat relief evaluation and the extreme light-emitting allowance of the surface mount type screen in the extreme working state; and training the TCN network to predict the ultimate working state standard of the patch type screen in the current preset time period to be compared with the real working state standard of the patch type screen in the current preset time period, and checking whether the working temperature of the screen in the current preset time period is normal or not, thereby regulating the temperature of the patch type screen. The invention judges whether the temperature is normal when the screen works according to the changes of the internal and external temperatures and the power of the screen, has higher accuracy, avoids the damage of internal components caused by over-temperature when the patch type screen works, and reduces the probability of the damage of the large patch type screen.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions and advantages of the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a flow chart of a surface mount device screen temperature control method.
Detailed Description
To further illustrate the technical means and effects of the present invention adopted to achieve the predetermined objects, the following detailed description of the embodiments, structures, features and effects of the method and system for controlling the temperature of a surface mount device according to the present invention will be made with reference to the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" refers to not necessarily the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
The following describes a specific scheme of a method and a system for controlling a temperature of a surface mount device screen in detail with reference to the accompanying drawings.
Example 1
The main application scenarios of the invention are as follows: and comparing the working state standard of the current preset time period of the measured patch type screen with the predicted limit working state standard of the patch type screen in the current preset time period, controlling the working temperature of the patch type screen, and preventing the patch type screen from being damaged due to overhigh working temperature of the patch type screen.
Referring to fig. 1, a flow chart of a method for controlling a temperature of a surface mount device according to an embodiment of the present invention is shown, where the method includes the following steps:
the method comprises the following steps: obtaining the internal temperature change rate of the tiled screen in a preset unit time in an extreme working state, and forming a sequence of the internal temperature change rate of the tiled screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; and obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a negative correlation relationship.
And obtaining the overheat relieving evaluation of the patch type screen by measuring the relation between the internal temperature and the external temperature of the patch type screen in the extreme working state when the patch type screen normally works. In this embodiment, the length of the preset unit time is 1min, the length of the preset time period is 1h, the temperature sensor is placed inside the surface mount screen when the surface mount screen works in the limit working state, the readings of the temperature sensor are collected every 1s, and 60 internal temperatures are obtained
Obtaining the change rate of the internal temperature of the paster type screen in unit time:
wherein,
represents the ith unitThe rate of change of the temperature inside the sticker-type screen within time;
representing the temperature difference inside the patch type screen in unit time; normalizing the temperature change rate in the surface mount type screen to make the temperature change rate in the surface mount type screen in a range of
。
The larger the size is, the smaller the variation of the internal temperature of the sticker type screen in the ith unit time is, and conversely,
the smaller the temperature change in the patch screen per unit time, the larger the temperature change in the patch screen per unit time. Thus, a temperature change rate sequence in the patch type screen under the limit working state in a preset time period is obtained
。
Meanwhile, when the SMD screen normally works in the limit working state within the preset time period, the external temperature of 60 SMD screens in unit time is obtained, and the composition sequence is
And calculating the stability evaluation of the patch type screen in unit time through a sequence:
wherein,
evaluating the stability of the external temperature in the limiting working state of the paster type large screen in the a unit time;
the number of collected external temperatures in a unit time;
the temperature change of the ith second and the previous 1 second in the unit time is expressed,
the temperature change conditions of the ith second and the previous 1 second in unit time are represented; the stability evaluation of the external temperature in unit time is represented by the average value after the temperature change conditions are accumulated, and the external temperature stability evaluation sequence of the surface mount screen in the preset time period is obtained
。
Calculating the similarity between the internal temperature and the external temperature of the patch type screen in a preset time period, and recording as a first similarity:
wherein,
representing the sequence of the temperature change rate inside the patch type screen in the preset time period
Evaluation sequence of stability to external temperature
The similarity of the internal temperature and the external temperature of the patch type screen in the preset time period is obtained;
for internal temperature rate of change sequences
Evaluation sequence of stability to external temperature
Pearson correlation coefficient. Normalizing the first degree of similarity, if approaching 1, means that the external temperature stability sequence and the internal temperature rate of change sequence are similar, otherwise they are not.
Using the first similarity
Obtaining overheat relieving evaluation of the patch type screen in the extreme working state:
wherein the overheat mitigation evaluation X and the first similarity
Is a positive correlation, the more similar the internal and external temperature changes, the better the heat dissipation, that is, the higher the overheat relief evaluation. Conversely, the more dissimilar the internal and external temperature changes, the less good the heat dissipation and the lower the overheat relief evaluation; if the internal and external temperature change conditions are similar, the temperature difference is small, and the heat dissipation condition is good, namely the overheat relief evaluation X of the single screen is high; on the contrary, if the internal and external temperatures are not similar, the temperature difference is larger, which proves that the heat dissipation condition is poor, and the overheat relief evaluation X of the patch-type screen is low.
Step two: obtaining a stability evaluation index of the power of the patch type screen in an extreme working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; and the product of the overheat relief evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period.
Recording the power of the SMD screen in each unit time by using a power meter to obtain a power sequence of the SMD screen in a preset time period
. Based on the obtained power sequence P, calculating the stability evaluation index of the power of the surface mount screen in the limit working state:
wherein, L represents the stability evaluation index of the power of the patch type screen in the limit working state;
is power of
The mean value of (a); the larger the L value is, the more unstable the power is when the patch type screen works, which means that the temperature inside the screen is high. The smaller the L value is, the more stable the power is when the patch type screen works, which means that the temperature inside the screen is low. Therefore, a power stability evaluation index L of the patch type screen in the limit working state is obtained, each patch type screen has the power stability evaluation index when working, and the power stability evaluation index is generally expressed as the reduction of the display brightness of the screen.
Acquiring the power in two adjacent preset time periods, obtaining two adjacent power sequences, and calculating the similarity of the two adjacent power sequences:
wherein,
and
respectively representing two groups of adjacent power sequences;
is a power sequence
And power sequence
The dynamic time between the two is rounded. The larger Q means that the two power sequences are similar, and the smaller Q means that the two power sequences are different. The meaning of Q is to evaluate the error of the stability evaluation index L of the power of the sheet screen in the limit working state caused by different working contents. Therefore, the reliability Q of the power stability evaluation index of the patch type screen in the limit working state within the preset time period is obtained.
Calculating the light-emitting allowance of the patch type screen in the limit working state in the preset time period based on the reliability degree Q of the stability evaluation index of the power of the patch type screen in the limit working state in the preset time period and the stability evaluation index L of the power of the patch type screen in the limit working state:
the method comprises the following steps that U represents a light emitting margin of a surface mount screen in a limit working state within a preset time period;
the method comprises the steps that power stability evaluation indexes of a patch type screen in an extreme working state are expressed under the limitation of reliability degree Q of the power stability evaluation indexes of the patch type screen in the extreme working state in a preset time period; the limit light-emitting allowance of the patch type screen in the limit working state is influenced by the power stability evaluation index of the patch type screen in the limit working state, and the light-emitting allowance is reduced along with the increase of the power stability evaluation index of the patch type screen in the limit working state. The larger the U, the more stable the power, meaning the brighter the screen; on the contrary, the smaller the U is, the lower the power stability of the chip-type screen in the extreme working state is, the unstable power output is, and the screen is also dim.
Based on the obtained overheating mitigation evaluation X of the chip type screen in the limit working state and the luminescence margin U of the chip type screen in the limit working state in the preset time period, the limit working state standard Z of the chip screen in the preset time period can be obtained:
the light emitting margin of the patch type screen is in a negative correlation with the temperature, and the overheating mitigation evaluation is also in a negative correlation with the temperature, namely, the overheating mitigation score is high while the light emitting margin is increased.
Step three: obtaining the limit working state standard of the patch type screen in a plurality of preset time periods as a historical limit working state standard; predicting the predicted limit working state standard of the tile type screen in the current preset time period by using the historical limit working state, and simultaneously obtaining the real working state standard of the tile type screen in the current preset time period; and if the real working state standard of the patch type screen in the current time period is greater than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen.
Measuring the extreme working state standard of the paster type screen in a plurality of preset time periods under the extreme working state to form a training set
Training TCN network, calculating standard training set of extreme working state
Confidence of each element in
：
Wherein,
a confidence for each element in the training set;
is the ith element in the training set, and Z is the whole element of the training set;
meaning the sum of the distances of each element to the whole elements of the training set; confidence level
The higher the confidence of the elements in the training set, and vice versa
The lower the confidence level of the elements in the training set.
Training TCN network by using training set
Inputting into TCN training, training TCN network based on training set, whose LOSS function is mean square error LOSS, and using confidence coefficient for the training set
As a quality score and calculating a confidence
Normalizing, and adding to a first preset value, preferably, the first preset value in this embodiment is 1, and calculating the confidence level
As weights, the loss function is then:
wherein,
is the normalized mass coefficient, as the loss weight,
the loss of each element in the training set.
After TCN network training is finished, obtaining the extreme working state standard of the patch type screen in a plurality of preset time periods as a historical extreme working state standard as an input, and outputting the predicted extreme working state standard of the patch type screen in the current preset time period; simultaneously measuring the real working state standard of the patch type screen in the current preset time period; the method comprises the steps of comparing two data through prediction of the extreme working state standard of each patch type screen and actual measurement of the working state standard of the patch type screen in the current preset time period, if the working state standard of the actual measurement is less than or equal to the extreme working standard of the patch type screen in the current preset time period, changing the screen brightness due to temperature control is not needed, the patch type screen is enabled to keep the current working state standard, if the actually measured data is larger than the predicted data, a part exceeding the predicted data needs to be calculated, the patch type large screen is needed to reduce the preset backlight of the screen, or a heat dissipation device of the patch type screen is checked, so that the temperature of the patch type screen during working can not damage components inside the screen, and the patch type screen can work normally.
Example 2
The present embodiment provides a system embodiment. A surface mount screen temperature control system, the system comprising: the overheating mitigation evaluation acquisition module is used for acquiring the internal temperature change rate of the patch type screen in a preset unit time under the limit working state to form a sequence of the internal temperature change rate of the patch type screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a positive correlation relationship;
the system comprises an extreme working state standard acquisition module, a power control module and a power control module, wherein the extreme working state standard acquisition module is used for acquiring a stability evaluation index of the power of the patch type screen in an extreme working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; the product of the overheat relief evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period;
the patch type screen temperature adjusting module is used for acquiring the extreme working state standard of the patch type screen in a plurality of preset time periods as the historical extreme working state standard; predicting the predicted limit working state standard of the tile type screen in the current preset time period by using the historical limit working state, and simultaneously obtaining the real working state standard of the tile type screen in the current preset time period; and if the real working state standard of the patch type screen in the current time period is greater than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen.
The overheating relief evaluation acquisition module is also used for acquiring the internal temperature of the patch type screen in unit time and acquiring the temperature change rate in unit time by using the difference value of the maximum value and the minimum value of the internal temperature of the patch type screen in unit time; and the internal temperature change rate of the patch type screen in unit time forms a sequence of the internal temperature change rate of the patch type screen in a preset time period.
The extreme working state standard acquisition module is also used for acquiring the power of the surface mount type screen once per unit time, and the power corresponding to each unit time forms a power sequence in a preset time period; according to the variance of the power sequence in the preset time period, obtaining a stability evaluation index of the power of the patch type screen in the limit working state in the preset time period; and meanwhile, the reliability of the stability evaluation index of the power of the patch type screen in the preset time period in the limit working state is obtained according to the similarity of the power sequences in the adjacent preset time periods.
It should be noted that: the precedence order of the above embodiments of the present invention is only for description, and does not represent the merits of the embodiments. And specific embodiments thereof have been described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. A surface mount type screen temperature control method is characterized by comprising the following steps: obtaining the internal temperature change rate of the tiled screen in a preset unit time in an extreme working state, and forming a sequence of the internal temperature change rate of the tiled screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a positive correlation relationship;
obtaining a stability evaluation index of the power of the patch type screen in the limit working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; the product of the overheat relief evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period;
obtaining the limit working state standard of the patch type screen in a plurality of preset time periods as a historical limit working state standard; predicting the predicted limit working state standard of the patch type screen in the current preset time period by using the historical limit working state standard, and simultaneously obtaining the real working state standard of the patch type screen in the current preset time period; if the real working state standard of the patch type screen in the current time period is larger than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen; the internal temperature change rate is:
wherein,
representing the temperature change rate in the patch type screen in the ith unit time; forming a sequence of the internal temperature change rates of the patch type screen in the preset time period by the internal temperature change rates of all unit times in the preset time period;
the external temperature stability was evaluated as:
wherein,
the number of collected external temperatures in a unit time;
the first similarity is:
wherein,
representing the sequence of the temperature change rate inside the patch type screen in the preset time period
Evaluation sequence of stability to external temperature
A first similarity of;
representing a sequence of internal temperature rates of change
Evaluation sequence of stability to external temperature
The pearson correlation coefficient of;
the superheat mitigation evaluations were:
wherein X represents the evaluation of the overheat mitigation;
representing a first similarity;
collecting the power of the surface mount type screen once in each unit time, wherein the power corresponding to each unit time forms a power sequence in a preset time period, and the stability evaluation indexes are as follows:
wherein, L represents the stability evaluation index of the power of the patch type screen in the limit working state;
is the mean of the power sequence;
the reliability of the stability evaluation index is as follows:
wherein Q represents the reliability of the stability evaluation index;
and
respectively representing two powers in adjacent preset time periodsA sequence;
representing a power sequence
And power sequence
The dynamic time between the two is rounded;
the limit light-emitting allowance is as follows:
wherein, U represents the limit light-emitting margin of the tiled screen within a preset time period.
2. The method according to claim 1, wherein the predicting the predicted extreme operating state standard of the tile screen within the current preset time period using the historical extreme operating state standard, and obtaining the true operating state standard of the tile screen within the current preset time period comprises: obtaining an extreme working state standard under the extreme working state of the patch type screen in a plurality of preset time periods as a training set to train the TCN network; after the network training is finished, inputting a historical extreme working state standard, and outputting a prediction extreme working state standard of the patch type screen in a current preset time period; and meanwhile, the real working state standard of the patch type screen in the current preset time period is obtained.
3. The method as claimed in claim 1 or 2, wherein before predicting the predicted extreme operating condition criteria of the tiled screen within the current preset time period using the historical extreme operating condition criteria, the method further comprises: calculating the sum of the distances between each sample and other samples in the training set, and obtaining the confidence of each sample by using the sum of the distances; normalizing the confidence degrees of all samples to enable the sum to be a first preset value; the normalized confidence coefficient is the weight lost by each sample.
4. A surface mount screen temperature control system, comprising: the overheating mitigation evaluation acquisition module is used for acquiring the internal temperature change rate of the patch type screen in a preset unit time under the limit working state to form a sequence of the internal temperature change rate of the patch type screen in a preset time period, wherein the preset time period comprises a plurality of unit times; obtaining the external temperature stability evaluation of the sticker type screen in a preset unit time under the extreme working state to form a sticker type screen external temperature stability evaluation sequence in a preset time period; calculating the similarity of the internal temperature change rate sequence and the external temperature stability evaluation sequence, and recording as a first similarity; obtaining overheating mitigation evaluation of the patch type screen by using the first similarity, wherein the overheating mitigation evaluation and the first similarity are in a positive correlation relationship;
the system comprises an extreme working state standard acquisition module, a power control module and a power control module, wherein the extreme working state standard acquisition module is used for acquiring a stability evaluation index of the power of the patch type screen in an extreme working state within a preset time period and the reliability of the stability evaluation index; obtaining the limit light-emitting allowance of the patch type screen within a preset time period by utilizing the product of the power stability evaluation index and the reliability degree; the product of the overheating mitigation evaluation and the limit light-emitting allowance of the patch type screen in the preset time period is the limit working state standard of the patch type screen in the preset time period;
the patch type screen temperature adjusting module is used for acquiring the extreme working state standard of the patch type screen in a plurality of preset time periods as the historical extreme working state standard; predicting the predicted limit working state standard of the patch type screen in the current preset time period by using the historical limit working state standard, and simultaneously obtaining the real working state standard of the patch type screen in the current preset time period; if the real working state standard of the patch type screen in the current time period is larger than the prediction limit working state standard, adjusting a heat dissipation device of the patch type screen to reduce the working temperature of the patch type screen;
the internal temperature change rate is:
wherein,
representing the temperature change rate in the patch type screen in the ith unit time; forming a sequence of the internal temperature change rates of the patch type screen in the preset time period by the internal temperature change rates of all unit times in the preset time period;
the external temperature stability was evaluated as:
wherein,
the number of collected external temperatures in a unit time;
the first similarity is:
wherein,
representing the sequence of the temperature change rate inside the patch type screen in the preset time period
Evaluation sequence of stability to external temperature
A first similarity of;
representing a sequence of internal temperature rates of change
Evaluation sequence of stability to external temperature
Pearson correlation coefficient of (a);
the superheat mitigation evaluations were:
wherein X represents the evaluation of the overheat mitigation;
representing a first similarity;
collecting the power of the surface mount type screen once in each unit time, wherein the power corresponding to each unit time forms a power sequence in a preset time period, and the stability evaluation indexes are as follows:
wherein, L represents the stability evaluation index of the power of the patch type screen in the limit working state;
is the mean of the power sequence;
the reliability of the stability evaluation index is as follows:
wherein Q represents the reliability of the stability evaluation index;
and
respectively representing two power sequences in adjacent preset time periods;
representing a power sequence
And power sequence
The dynamic time between the two is rounded;
the limit luminescence margin is as follows:
wherein, U represents the limit light-emitting margin of the tiled screen within a preset time period.
5. The system according to claim 4, wherein the overheating mitigation evaluation acquisition module is further configured to acquire an internal temperature of the surface mount screen in unit time, and obtain a temperature change rate in unit time by using a difference between a maximum value and a minimum value of the internal temperature of the surface mount screen in unit time; and the internal temperature change rate of the patch type screen in unit time forms a sequence of the internal temperature change rate of the patch type screen in a preset time period.
6. The system according to claim 4, wherein the extreme operating condition standard obtaining module is further configured to collect patch screen power once per unit time, and power corresponding to each unit time forms a power sequence within a preset time period; according to the variance of the power sequence in the preset time period, obtaining a stability evaluation index of the power of the patch type screen in the limit working state in the preset time period; and meanwhile, the reliability of the stability evaluation index of the power of the patch type screen in the preset time period in the limit working state is obtained according to the similarity of the power sequences in the adjacent preset time periods.
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